JP2809555B2 - Frequency adjustment method of dielectric resonator - Google Patents
Frequency adjustment method of dielectric resonatorInfo
- Publication number
- JP2809555B2 JP2809555B2 JP4122426A JP12242692A JP2809555B2 JP 2809555 B2 JP2809555 B2 JP 2809555B2 JP 4122426 A JP4122426 A JP 4122426A JP 12242692 A JP12242692 A JP 12242692A JP 2809555 B2 JP2809555 B2 JP 2809555B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- resonator
- slit
- resonance frequency
- dielectric resonator
- Prior art date
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Description
【０００１】[0001]
【産業上の利用分野】本発明は、高周波帯域で濾波器、
発振器等に使用される誘電体共振器の周波数調整方法に
関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high frequency band filter,
The present invention relates to a method for adjusting the frequency of a dielectric resonator used for an oscillator or the like.
【０００２】[0002]
【従来技術】この種の誘電体共振器としては通常誘電体
材料から成る共振器部を、それと一体的に形成された支
持台を介して密閉ケーシングすなわちキャビティ底壁上
に固着した構造ものが知られている（特開昭59−21101
号公報、特開昭59−97201 号公報、特開昭62−97405 号
公報参照）。このような誘電体共振器の共振周波数の微
調整は、従来、円筒研削盤等の加工機を使用して共振器
部の外径や厚さを研削することにより行われている。2. Description of the Related Art As a dielectric resonator of this kind, there is known a structure in which a resonator portion usually made of a dielectric material is fixed on a closed casing, that is, a bottom wall of a cavity via a support stand integrally formed therewith. (JP-A-59-21101)
JP-A-59-97201 and JP-A-62-97405). Conventionally, such fine adjustment of the resonance frequency of the dielectric resonator has been performed by grinding the outer diameter and thickness of the resonator portion using a processing machine such as a cylindrical grinder.
【０００３】[0003]
【発明が解決しようとする課題】ところで、調整手段と
して従来用いられていた円筒研削盤等の加工機による共
振器部の外径や厚さの研削法では、加工精度のばらつき
や誘電率のばらつきのため800MHz帯で±0.3MHzの公差が
限度である。ところで加工数を増せばその分公差を小さ
くできるが、これにも限度がありしかも反面製造コスト
が高くなるという問題がある。By the way, in the grinding method of the outer diameter and the thickness of the resonator section by a processing machine such as a cylindrical grinder which has been conventionally used as an adjusting means, there is a variation in processing accuracy and a variation in dielectric constant. Therefore, the tolerance of ± 0.3MHz in the 800MHz band is the limit. By the way, if the number of processings is increased, the tolerance can be reduced accordingly.
【０００４】そこで、本発明は、従来の誘電体共振器の
周波数調整法に伴う上記の問題点を解決して、簡単かつ
容易に誘電体共振器の共振周波数を微調整することがで
きる誘電体共振器の周波数調整方法を提供することを目
的としている。Accordingly, the present invention solves the above-mentioned problems associated with the conventional method of adjusting the frequency of a dielectric resonator, and makes it possible to finely adjust the resonance frequency of the dielectric resonator easily and easily. It is an object of the present invention to provide a method for adjusting the frequency of a resonator.
【０００５】[0005]
【課題を解決するための手段】上記の目的を達成するた
めに、共振器部と支持台部とより成る誘電体共振器の周
波数調整方法において、誘電体共振器の共振周波数を測
定し、測定した共振周波数の設定値からのずれより幾分
低い値に相応した幅と深さの周波数調整用スリットを前
記共振器部に設け、その後再度誘電体共振器の共振周波
数を測定して測定した共振周波数の設定値からのずれに
相応した深さまたは幅を選んで、上記スリットの深さま
たは幅を拡張して設定共振周波数からのずれを調整する
ことを特徴としている。本発明の方法が適用される誘電
体共振器の共振器部がリング形状である場合には、周波
数調整用スリットは、共振器部の外周部分または内周部
分に沿って環状に形成され得る。代わりに、周波数調整
用スリットは共振器部にその軸線方向に沿って形成する
こともできる。In order to achieve the above object, in a method of adjusting the frequency of a dielectric resonator comprising a resonator section and a support base, a resonance frequency of the dielectric resonator is measured. A frequency adjusting slit having a width and depth corresponding to a value slightly lower than the deviation from the set value of the resonance frequency is provided in the resonator section, and then the resonance frequency of the dielectric resonator is measured again. The depth or width corresponding to the deviation from the set value of the frequency is selected, and the deviation or deviation from the set resonance frequency is adjusted by expanding the depth or width of the slit. When the resonator portion of the dielectric resonator to which the method of the present invention is applied has a ring shape, the frequency adjusting slit may be formed in an annular shape along an outer peripheral portion or an inner peripheral portion of the resonator portion. Alternatively, the frequency adjusting slit can be formed in the resonator section along the axial direction thereof.
【０００６】[0006]
【作用】本発明による周波数調整方法においては、誘電
体共振器の共振器部に形成される周波数調整用スリット
は、スリット幅またはスリット深さを一定としスリット
深さまたはスリット幅に対する共振周波数の変動量を予
め決めておき、周波数調整しようとする誘電体共振器に
おいて測定した所望の共振周波数からのずれ、すなわち
変動量に相応した深さまたは幅に設定される。スリット
の研削においては、最初は、測定した共振周波数の変動
量より幾分低い値に相応したスリット深さまたは幅（ス
リット幅またはスリット深さを一定とした場合）にスリ
ットを形成し、その段階で再び共振周波数の変動量を測
定し、その変動量に相応した深さまたは幅を選んで、最
初に形成したスリットの深さまたは幅を拡張するように
研削することにより行過ぎ量の生じるのを防ぐことがで
きしかも設定共振周波数に対する微調整を容易にかつ正
確に行なうことができるようになる。In the frequency adjusting method according to the present invention, the frequency adjusting slit formed in the resonator portion of the dielectric resonator has a constant slit width or slit depth, and the resonance frequency varies with the slit depth or slit width. The amount is determined in advance, and is set to a depth or width corresponding to a deviation from a desired resonance frequency measured in the dielectric resonator whose frequency is to be adjusted, that is, a fluctuation amount. In the grinding of the slit, first, a slit is formed at a slit depth or width (when the slit width or the slit depth is fixed) corresponding to a value somewhat lower than the fluctuation amount of the measured resonance frequency. Measure the amount of variation in the resonance frequency again, select a depth or width corresponding to the amount of variation, and grind it to extend the depth or width of the slit formed first. Can be prevented, and fine adjustment to the set resonance frequency can be easily and accurately performed.
【０００７】[0007]
【実施例】以下添付図面を参照して本発明の実施例につ
いて説明する。図１には本発明の一実施例を示し、１は
BaO-4TiO2 系等の高誘電率、低損失の誘電体セラミック
材料から成るリング型の共振器部、２は共振器部１と同
一材料より成る支持台部であるが、アルミナ、フォルス
テライト等の他の絶縁材料により構成することもでき
る。本例では共振器部１及び支持台部２は同一材料によ
り一体的にプレス成形した後、同時焼成して製作してい
る。また共振器部１及び支持台部２には共振時に発生す
る熱を速やかに放散して過熱による特性劣下を防止し得
る内孔３が形成されている。こうして得られた誘電体共
振器は、四方を密閉した金属製のケーシング（図示して
ない）内の底壁上に適当な固着手段により固着して収容
される。Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 shows an embodiment of the present invention.
A ring-shaped resonator portion made of a dielectric ceramic material having a high dielectric constant and a low loss such as BaO-4TiO 2 or the like, and 2 is a support base made of the same material as the resonator portion 1, but alumina, forsterite, etc. And other insulating materials. In this example, the resonator section 1 and the support base section 2 are integrally formed by press-molding the same material, followed by simultaneous firing. An inner hole 3 is formed in the resonator unit 1 and the support base 2 so that heat generated at the time of resonance can be quickly dissipated to prevent deterioration of characteristics due to overheating. The dielectric resonator thus obtained is fixed and accommodated on a bottom wall in a metal casing (not shown) closed on all sides by a suitable fixing means.
【０００８】図示実施例では共振器部１の外周面に幅Ａ
及び深さＢの環状の周波数調整用スリット４がダイヤモ
ンド砥石等の適当な研削手段（図示してない）を用いて
設けられる。この場合、幅が１mm、２mm、４mm、６mm、
８mmの研削用砥石を用意し、それぞれの研削用砥石を用
いて深さＢを0.5 から2.5mm まで0.5mm 間隔で変化させ
スリットを形成し、その時の共振周波数の変化量を測定
した。その結果を図２に示す。図２のグラフから認めら
れるようにスリット幅Ａ及びスリット深さＢににより共
振周波数の変化量が決まる。すなわち共振周波数の変化
量に対してスリット幅Ａ及びスリット深さＢを設定でき
ることが認められる。従って、周波数調整しようとする
誘電体共振器において測定した所望の共振周波数からの
ずれ、すなわち変動量に応じて、その変動量が比較的大
きい場合には幅の比較的大きい研削用砥石を用いて深さ
Ｂを順次深く研削ればよく、一方、測定した変動量が比
較的小さい場合には幅の小さい研削用砥石を用いて深さ
Ｂを順次深していけば微調整が可能となる。また図２か
ら認められるように、スリット深さＢを一定にして使用
する研削用砥石を変えてスリット幅Ａを拡げてゆくこと
により、周波数調整を行うこともできる。なお周波数調
整用スリット４を設けることにより共振周波数は高い方
へシフトされることになるので、誘電体共振器は調整前
には所望の共振周波数より低くなるように設計される。In the illustrated embodiment, the outer peripheral surface of the resonator portion 1 has a width A.
An annular frequency adjusting slit 4 having a depth B is provided using a suitable grinding means (not shown) such as a diamond grindstone. In this case, the width is 1mm, 2mm, 4mm, 6mm,
An 8 mm grinding wheel was prepared, and a slit was formed by changing the depth B from 0.5 to 2.5 mm at intervals of 0.5 mm using each grinding wheel, and the amount of change in the resonance frequency at that time was measured. The result is shown in FIG. As can be seen from the graph of FIG. 2, the amount of change in the resonance frequency is determined by the slit width A and the slit depth B. That is, it is recognized that the slit width A and the slit depth B can be set for the amount of change in the resonance frequency. Therefore, the deviation from the desired resonance frequency measured in the dielectric resonator to be frequency-adjusted, that is, according to the amount of variation, if the amount of variation is relatively large, using a relatively large grinding wheel for width. It is sufficient to grind the depth B sequentially deeper. On the other hand, when the measured variation is relatively small, fine adjustment can be performed by sequentially increasing the depth B using a grinding wheel having a small width. Further, as can be seen from FIG. 2, the frequency can be adjusted by increasing the slit width A by changing the grinding wheel to be used while keeping the slit depth B constant. Since the resonance frequency is shifted to a higher side by providing the frequency adjusting slit 4, the dielectric resonator is designed to be lower than a desired resonance frequency before the adjustment.
【０００９】このように構成された図示実施例における
誘電体共振器の周波数を調整する際には、まず誘電体共
振器を金属製のケーシング（図示してない）内に入れ、
共振周波数を測定し、設定共振周波数からのずれを検出
する。このずれの大きさに応じて使用する研削用砥石を
選定し、まず、ずれに相当した変動量より幾分低いレベ
ルとなる深さに周波数調整用スリット４を形成する。そ
して再び共振周波数を測定し、そのときの変動量に相応
した深さまで再度研削する。このように最初は設定値よ
り幾分低いレベルまで粗調整を行ない、設定値に近付い
た段階でさらにスリットの深さを深く研削することによ
り行き過ぎを伴うことなく微調整が容易となる。これに
より、粗調整から細調整までを容易に行うことができ
る。When adjusting the frequency of the dielectric resonator in the illustrated embodiment configured as described above, the dielectric resonator is first placed in a metal casing (not shown),
The resonance frequency is measured, and a deviation from the set resonance frequency is detected. A grinding wheel to be used is selected according to the magnitude of the shift, and first, the frequency adjusting slit 4 is formed at a depth that is at a level slightly lower than the fluctuation amount corresponding to the shift. Then, the resonance frequency is measured again, and grinding is performed again to a depth corresponding to the fluctuation amount at that time. As described above, the coarse adjustment is first performed to a level slightly lower than the set value, and the depth of the slit is further deepened when the set value is approached, so that the fine adjustment can be easily performed without overshoot. Thereby, it is possible to easily perform from the coarse adjustment to the fine adjustment.
【００１０】ところで、図示実施例では、周波数調整用
スリットを一条設け、その深さまたは幅を順次拡げて設
定値に調整するようにしているが、代わりに周波数調整
用スリットを二つまたはそれ以上順次に設けて調整を行
うこともできる。また、図示実施例では、周波数調整用
スリットは共振器部の外周に設けているが、当然共振器
部の内孔壁すなわち内周に設けることもできる。さら
に、環状の周波数調整用スリットを設ける代わりに、図
３に示すように共振器部の外周（または内周）に軸線方
向に沿ってスリット５を設けてもよい。この場合当然共
振周波数はスリットの長さにも関係して変化するので、
予めスリットの長さに対してその幅及び深さと周波数の
変化との関係を決めておく必要がある。In the illustrated embodiment, a single slit for frequency adjustment is provided and the depth or width thereof is sequentially increased to adjust to a set value. Instead, two or more slits for frequency adjustment are provided. Adjustment can also be performed by providing them sequentially. Further, in the illustrated embodiment, the frequency adjusting slit is provided on the outer periphery of the resonator unit, but may be provided on the inner wall of the resonator unit, that is, on the inner periphery. Further, instead of providing an annular frequency adjusting slit, a slit 5 may be provided along the axial direction on the outer periphery (or inner periphery) of the resonator portion as shown in FIG. In this case, the resonance frequency naturally changes depending on the length of the slit.
It is necessary to determine in advance the relationship between the width and depth of the slit and the change in frequency with respect to the length of the slit.
【００１１】[0011]
【発明の効果】以上説明してきたように、本発明による
周波数調整方法においては、誘電体共振器の共振周波数
のずれを測定し、そのずれ分に応じて幅及び（または）
深さを調整しながら周波数調整用スリットを共振器部に
設けて周波数調整を行うように構成しているので、容易
にしかも正確に誘電体共振器の共振周波数の調整を行な
うことができる。そしてスリットの幅及び（または）深
さを順次変えて行くことにより粗調整から微調整まで任
意に容易に行なうことができるようになる。また、共振
器部に形成される周波数調整用スリットの幅及び深さと
周波数の変動量との関係を予め求めておけば、測定した
変動量に対してスリットの寸法をどの程度にすべきかの
目安が容易につき、種々の寸法の研削工具を用意するだ
けで正確に調整作業を行うことができるようになる。As described above, in the frequency adjusting method according to the present invention, the deviation of the resonance frequency of the dielectric resonator is measured, and the width and / or the deviation are determined according to the deviation.
Since the frequency adjustment is performed by providing the frequency adjustment slit in the resonator section while adjusting the depth, the resonance frequency of the dielectric resonator can be easily and accurately adjusted. Then, by sequentially changing the width and / or depth of the slit, it is possible to arbitrarily and easily perform from coarse adjustment to fine adjustment. In addition, if the relationship between the width and depth of the frequency adjusting slit formed in the resonator unit and the amount of variation in frequency is determined in advance, it is possible to estimate the size of the slit with respect to the measured amount of variation. Therefore, the adjustment can be performed accurately only by preparing grinding tools of various sizes.
【図１】 本発明の一実施例を示す要部の概略部分断面
図。FIG. 1 is a schematic partial sectional view of a main part showing an embodiment of the present invention.
【図２】 周波数調整用スリット幅及び深さと共振周波
数の変化量との関係を示すグラフ。FIG. 2 is a graph showing the relationship between the width and depth of a frequency adjustment slit and the amount of change in resonance frequency.
【図３】 本発明の別の実施例を示す概略斜視図。FIG. 3 is a schematic perspective view showing another embodiment of the present invention.
１：共振器部 ２：支持台部 ３：内孔 ４：周波数調整用スリッ
ト ５：周波数調整用スリット1: resonator part 2: support base part 3: inner hole 4: frequency adjustment slit 5: frequency adjustment slit
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平５−102714（ＪＰ，Ａ) 特開 平３−280603（ＪＰ，Ａ) 特開 平３−214904（ＪＰ，Ａ) 特開 平３−278601（ＪＰ，Ａ) 特開 平１−130603（ＪＰ，Ａ) 特開 昭63−299604（ＪＰ，Ａ) 特開 昭62−299103（ＪＰ，Ａ) 特開 昭60−123106（ＪＰ，Ａ) 実開 昭60−153006（ＪＰ，Ｕ) (58)調査した分野(Int.Cl.6，ＤＢ名) H01P 11/00 H01P 7/10────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-5-102714 (JP, A) JP-A-3-280603 (JP, A) JP-A-3-214904 (JP, A) JP-A-3-302904 278601 (JP, A) JP-A-1-130603 (JP, A) JP-A-63-299604 (JP, A) JP-A-62-299103 (JP, A) JP-A-60-123106 (JP, A) 60-153006 (JP, U) (58) Field surveyed (Int. Cl. 6 , DB name) H01P 11/00 H01P 7/10
Claims (4)
器の周波数調整方法において、誘電体共振器の共振周波
数を測定し、測定した共振周波数の設定値からのずれよ
り幾分低い値に相応した幅と深さの周波数調整用スリッ
トを前記共振器部に設け、その後再度誘電体共振器の共
振周波数を測定して測定した共振周波数の設定値からの
ずれに相応した深さまたは幅を選んで、上記スリットの
深さまたは幅を拡張して設定共振周波数からのずれを調
整することを特徴とする誘電体共振器の周波数調整方
法。In a method for adjusting the frequency of a dielectric resonator comprising a resonator section and a support base, a resonance frequency of the dielectric resonator is measured, and the measured resonance frequency is somewhat lower than a deviation from a set value. A slit for frequency adjustment of width and depth corresponding to the value is provided in the resonator section, and then the resonance frequency of the dielectric resonator is measured again, and the depth or the depth corresponding to the deviation from the set value of the measured resonance frequency is measured. A frequency adjustment method for a dielectric resonator, comprising selecting a width and expanding a depth or a width of the slit to adjust a deviation from a set resonance frequency.
線方向に沿って形成する請求項１に記載の誘電体共振器
の周波数調整方法。2. The method for adjusting the frequency of a dielectric resonator according to claim 1, wherein the slit for frequency adjustment is formed in the resonator along the axial direction.
り成る誘電体共振器の周波数調整方法において、誘電体
共振器の共振周波数を測定し、測定した共振周波数の設
定値からのずれに応じて、そのずれを補償する予め設定
した幅と深さの周波数調整用スリットを前記共振器部の
外周部分に沿って環状に設け、設定共振周波数からのず
れを調整することを特徴とする誘電体共振器の周波数調
整方法。3. A method for adjusting the frequency of a dielectric resonator comprising a ring-shaped resonator section and a support base, wherein the resonance frequency of the dielectric resonator is measured, and the measured resonance frequency deviates from a set value. A slit for frequency adjustment of a preset width and depth that compensates for the deviation is provided annularly along the outer peripheral portion of the resonator unit, and the deviation from the set resonance frequency is adjusted. A method for adjusting the frequency of a dielectric resonator.
り成る誘電体共振器の周波数調整方法において、誘電体
共振器の共振周波数を測定し、測定した共振周波数の設
定値からのずれに応じて、そのずれを補償する予め設定
した幅と深さの周波数調整用スリットを前記共振器部の
内周部分に沿って環状に設け、設定共振周波数からのず
れを調整することを特徴とする誘電体共振器の周波数調
整方法。4. A method for adjusting the frequency of a dielectric resonator comprising a resonator section having a ring shape and a support base, wherein the resonance frequency of the dielectric resonator is measured, and the measured resonance frequency deviates from a set value. In accordance with the above, a frequency adjusting slit of a preset width and depth that compensates for the deviation is provided in an annular shape along the inner peripheral portion of the resonator unit, and the deviation from the set resonance frequency is adjusted. To adjust the frequency of a dielectric resonator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4122426A JP2809555B2 (en) | 1992-05-15 | 1992-05-15 | Frequency adjustment method of dielectric resonator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4122426A JP2809555B2 (en) | 1992-05-15 | 1992-05-15 | Frequency adjustment method of dielectric resonator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05327324A JPH05327324A (en) | 1993-12-10 |
| JP2809555B2 true JP2809555B2 (en) | 1998-10-08 |
Family
ID=14835546
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4122426A Expired - Fee Related JP2809555B2 (en) | 1992-05-15 | 1992-05-15 | Frequency adjustment method of dielectric resonator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2809555B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11312910A (en) * | 1998-04-28 | 1999-11-09 | Murata Mfg Co Ltd | Dielectric resonator, dielectric filter, dielectric duplexer, communication equipment and manufacturing method for dielectric resonator |
| IT1320543B1 (en) | 2000-07-20 | 2003-12-10 | Cselt Centro Studi Lab Telecom | DIELECTRICALLY CHARGED CAVITY FOR HIGH FREQUENCY FILTERS. |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153006U (en) * | 1984-03-19 | 1985-10-12 | 株式会社村田製作所 | dielectric resonator |
| JPS62299103A (en) * | 1986-06-18 | 1987-12-26 | Sharp Corp | Dielectric resonator |
| JPS63299604A (en) * | 1987-05-29 | 1988-12-07 | Murata Mfg Co Ltd | Dielectric resonator device |
| JP2510137B2 (en) * | 1987-11-17 | 1996-06-26 | 株式会社村田製作所 | Dielectric resonator |
| JPH03214904A (en) * | 1990-01-19 | 1991-09-20 | Matsushita Electric Ind Co Ltd | Trimming device for adjusting resonance frequency of dielectric resonator |
| JPH03278601A (en) * | 1990-03-27 | 1991-12-10 | Murata Mfg Co Ltd | Dielectric resonator |
| JPH03280603A (en) * | 1990-03-29 | 1991-12-11 | Anritsu Corp | Automatic trimming device for electronic component |
| JP3151873B2 (en) * | 1991-10-08 | 2001-04-03 | 株式会社村田製作所 | Adjustment method of resonance frequency of dielectric resonator device |
-
1992
- 1992-05-15 JP JP4122426A patent/JP2809555B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05327324A (en) | 1993-12-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |