JP2789821B2 - Charged particle deflector - Google Patents

Charged particle deflector

Info

Publication number
JP2789821B2
JP2789821B2 JP3004513A JP451391A JP2789821B2 JP 2789821 B2 JP2789821 B2 JP 2789821B2 JP 3004513 A JP3004513 A JP 3004513A JP 451391 A JP451391 A JP 451391A JP 2789821 B2 JP2789821 B2 JP 2789821B2
Authority
JP
Japan
Prior art keywords
magnetic field
charged particle
entrance
exit
pole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3004513A
Other languages
Japanese (ja)
Other versions
JPH04262298A (en
Inventor
進 西原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3004513A priority Critical patent/JP2789821B2/en
Publication of JPH04262298A publication Critical patent/JPH04262298A/en
Application granted granted Critical
Publication of JP2789821B2 publication Critical patent/JP2789821B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は例えば荷電粒子をアク
ロマティックに偏向させる荷電粒子偏向装置に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a charged particle deflector for achromatically deflecting charged particles, for example.

【0002】[0002]

【従来の技術】図3は例えばThe Review of Scientific
Instruments,vol.34,number4,April1963 ■Achromatic
Magnetic Mirror for Ion Beams■に示された従来の荷
電粒子偏向装置を示す図である。図3(a)は荷電粒子の
軌道、同図(b)は断面図を示し、図中、1はS極、2は
N極、3はS極1及びN極2を支持するヨーク、4は荷
電粒子が入射又は出射する入出射口、5は荷電粒子であ
る。
2. Description of the Related Art FIG. 3 shows, for example, The Review of Scientific
Instruments, vol.34, number4, April1963Achromatic
It is a figure showing the conventional charged particle deflection device shown in Magnetic Mirror for Ion Beams II. FIG. 3 (a) shows the trajectory of the charged particles, and FIG. 3 (b) shows a cross-sectional view, wherein 1 is an S pole, 2 is an N pole, 3 is a yoke supporting S pole 1 and N pole 2, 4 Denotes an entrance and exit from which charged particles enter or exit, and 5 denotes charged particles.

【0003】次に動作について説明する。ヨーク3に設
けられた入出射口4からx−y平面に角度αで原点Oに
入射した荷電粒子5はy−z平面で入出射口4からの磁
場の漏れがないと仮定するとx−y平面上を図に示すよ
うな軌道を描いて原点Oに再び戻る。また、速度の異な
った荷電粒子5は原点Oに角度αで入射しても例えば破
線のような軌道を描いて再び原点Oに戻り、角度αで出
射する。このようにエネルギーが異なった荷電粒子5は
角度αで入射すればすべて同様に出射される。この場合
α=40.71°のとき、上記のような現象が可能とな
る。このようなシステムをアクロマティックであると言
う。磁極1、2は一般に四極電磁石と呼ばれるものを半
分に分割したものであり、原点Oを0として一定の磁場
包配で磁場が強くなっていく。
Next, the operation will be described. The charged particles 5 incident on the origin O from the entrance / exit port 4 provided in the yoke 3 at the angle α on the xy plane at the angle α are assumed to have no leakage of the magnetic field from the entrance / exit port 4 on the yz plane. A trajectory as shown in the drawing is drawn on the plane, and the plane returns to the origin O again. Further, even if the charged particles 5 having different velocities enter the origin O at an angle α, they return to the origin O again, for example, draw a trajectory like a broken line, and exit at an angle α. As described above, all the charged particles 5 having different energies are emitted similarly if they enter at an angle α. In this case, when α = 40.71 °, the above phenomenon becomes possible. Such a system is said to be achromatic. Each of the magnetic poles 1 and 2 is obtained by dividing a so-called quadrupole electromagnet into halves, and the magnetic field becomes stronger with a fixed magnetic field distribution with the origin O being 0.

【0004】しかし、実際には磁場が原点Oから左側
(ーx方向)に漏れている(図3(c)の破線)ので、図
4に示される破線の軌道のようになり、荷電粒子5は原
点Oに戻らなくなり、ずれた位置を通り、アクロマティ
ックでなくなる。
However, since the magnetic field actually leaks to the left (−x direction) from the origin O (broken line in FIG. 3C), the trajectory is as shown by the broken line in FIG. Does not return to the origin O, passes through the shifted position, and is no longer achromatic.

【0005】[0005]

【発明が解決しようとする課題】従来の荷電粒子偏向装
置は以上のように構成されているため、漏洩磁場の影響
により、所望の偏向が実現されないという問題点があっ
た。
Since the conventional charged particle deflecting device is configured as described above, there is a problem that a desired deflection cannot be realized due to the influence of the leakage magnetic field.

【0006】この発明は上記のような問題点を解消する
ためになされたもので、漏洩磁場の影響を打ち消し、所
望の偏向を実現することができる荷電粒子偏向装置を得
ることを目的とする。
The present invention has been made to solve the above problems, and has as its object to obtain a charged particle deflecting device capable of canceling the influence of a stray magnetic field and achieving a desired deflection.

【0007】[0007]

【課題を解決するための手段】この発明にかかる荷電粒
子偏向装置は、入出射口から所定の角度で入射された荷
電粒子が進むにつれて荷電粒子にかかる磁場が線形的に
強くなる磁場空間を有し、磁場空間で荷電粒子を偏向さ
せ入出射口から出射する荷電粒子偏向装置で、入出射口
での磁場を0にするための磁場を発生させる磁場発生装
置を備えたものである。
SUMMARY OF THE INVENTION A charged particle deflector according to the present invention is a charged particle deflecting device which receives light incident at a predetermined angle from an entrance / exit port.
As the charged particle progresses, the magnetic field applied to the charged particle becomes linear
Having a magnetic field space that becomes stronger, the charged particles are deflected in the magnetic field space.
A charged particle deflector that emits light from the input / output port.
Magnetic field generator for generating a magnetic field for reducing the magnetic field at
It is equipped with a device.

【0008】[0008]

【作用】この発明における磁場発生装置は磁気空間から
外部空間に漏洩する磁場を打ち消す。
The magnetic field generator according to the present invention cancels out the magnetic field leaking from the magnetic space to the external space.

【0009】[0009]

【実施例】実施例1. 以下、この発明の一実施例を図について説明する。図1
において1〜3は従来装置と同一であり、6は2極電磁
石、7は2極電磁石6の磁極、9はアルファマグネット
コイルである。
[Embodiment 1] An embodiment of the present invention will be described below with reference to the drawings. FIG.
Are the same as those of the conventional apparatus, 6 is a two-pole electromagnet, 7 is a magnetic pole of the two-pole electromagnet 6, and 9 is an alpha magnet coil.

【0010】次に動作について説明する。従来例におい
て説明したように荷電粒子の入出射口からの漏洩磁場に
よりアクロマティック性が低下する。このため、この漏
洩磁場を打ち消すように図1のように磁極1、2により
形成される磁場と逆方向で荷電粒子の入射方向に垂直な
磁場が働くような2極電磁石を設置する。
Next, the operation will be described. As described in the conventional example, the achromatic property is reduced due to the leakage magnetic field from the entrance and exit of the charged particles. Therefore, as shown in FIG. 1, a dipole electromagnet is installed so that a magnetic field perpendicular to the incident direction of the charged particles acts in a direction opposite to the magnetic field formed by the magnetic poles 1 and 2 so as to cancel the leakage magnetic field.

【0011】また、漏洩磁場は入出射口の磁場空間付近
で大きく、外部空間付近に近づくにしたがって小さくな
るので、図1に示すように磁極7の形を傾斜させて、磁
場空間付近ほど、磁場が強くなるようにすることによ
り、より効率よく漏洩磁場を補正することができる。こ
れは、磁極7の形を変形させることのみならず、磁場の
強さが傾斜していればより高精度な補正が可能となる。
The leakage magnetic field is large near the magnetic field space at the entrance and exit, and becomes smaller as it approaches the external space. Therefore, the shape of the magnetic pole 7 is inclined as shown in FIG. Makes it possible to more efficiently correct the leakage magnetic field. This not only deforms the shape of the magnetic pole 7 but also enables more accurate correction if the strength of the magnetic field is inclined.

【0012】実施例2. なお、上記実施例では入出射口4に2極電磁石を備えた
ものを示したが、図2に示すように補正用コイルを取り
付けてもよい。図中、1〜3は従来装置と同一であり、
8は補正用コイルである。この場合には、補正用コイル
8を図のように巻き、入出射口4のうち磁場空間付近で
大きく、外部空間付近に近づくにしたがって小さくなる
ようにして、漏洩磁場を打ち消すことができる。上記2
つの実施例においては、入出射口4に発生させる磁場の
強さを傾斜させたものを示したが、本発明はこれに限ら
ず、漏洩磁場を打ち消すものであればよい。
Embodiment 2 FIG. In the above embodiment, the input / output port 4 is provided with a dipole electromagnet. However, a correction coil may be attached as shown in FIG. In the figure, 1 to 3 are the same as the conventional device,
Reference numeral 8 denotes a correction coil. In this case, the leakage coil can be canceled out by winding the correction coil 8 as shown in the figure and making it large near the magnetic field space of the entrance / exit opening 4 and becoming smaller as it goes closer to the outside space. 2 above
In one embodiment, the intensity of the magnetic field generated in the entrance / emission port 4 is shown as being inclined. However, the present invention is not limited to this, and any device that cancels the leakage magnetic field may be used.

【0013】[0013]

【発明の効果】以上のように、この発明にかかる荷電粒
子偏向装置は、入出射口から所定の角度で入射された荷
電粒子が進むにつれて荷電粒子にかかる磁場が線形的に
強くなる磁場空間を有し、磁場空間で荷電粒子を偏向さ
せ入出射口から出射する荷電粒子偏向装置で、入出射口
での磁場を0にするための磁場を発生させる磁場発生装
置を備えたものであり、入出射口からの磁場の漏れをな
くすため、この荷電粒子装置に入射された荷電粒子をア
クロマティックに偏向をさせることができる。
As described above, the charged particle deflecting device according to the present invention can be applied to a charged particle deflecting device which is incident at a predetermined angle from an entrance / exit port.
As the charged particle progresses, the magnetic field applied to the charged particle becomes linear
Having a magnetic field space that becomes stronger, the charged particles are deflected in the magnetic field space.
A charged particle deflector that emits light from the input / output port.
Magnetic field generator for generating a magnetic field for reducing the magnetic field at
It is equipped with a device to prevent leakage of the magnetic field from the entrance and exit.
Charged particles incident on this charged particle device are
It can be chromatically deflected.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の一実施例による荷電粒子偏向装置を
示す断面図である。
FIG. 1 is a sectional view showing a charged particle deflector according to one embodiment of the present invention.

【図2】この発明の他の実施例を示す荷電粒子偏向装置
を示す断面図である。
FIG. 2 is a sectional view showing a charged particle deflector according to another embodiment of the present invention.

【図3】従来の荷電粒子偏向装置を示す説明図である。FIG. 3 is an explanatory diagram showing a conventional charged particle deflection device.

【図4】従来の荷電粒子偏向装置における荷電粒子の軌
道を示す説明図である。
FIG. 4 is an explanatory diagram showing a trajectory of a charged particle in a conventional charged particle deflection device.

【符号の説明】[Explanation of symbols]

1 S極 2 N極 3 ヨーク 4 入出射口 5 荷電粒子 6 2極電磁石 7 磁極 8 補正用コイル 9 アルファマグネットコイル DESCRIPTION OF SYMBOLS 1 S pole 2 N pole 3 Yoke 4 Input / output port 5 Charged particle 6 2-pole electromagnet 7 Magnetic pole 8 Correction coil 9 Alpha magnet coil

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 入出射口から所定の角度で入射された荷
電粒子が進むにつれて上記荷電粒子にかかる磁場が線形
的に強くなる磁場空間を有し、上記磁場空間で上記荷電
粒子を偏向させ上記入出射口から出射する荷電粒子偏向
装置で、 上記入出射口での磁場を0にするための 磁場を発生させ
る磁場発生装置を備えたことを特徴とする荷電粒子偏向
装置。
1. A load incident at a predetermined angle from an entrance / exit port.
As the charged particle progresses, the magnetic field applied to the charged particle becomes linear
The magnetic field space that becomes stronger in the
Deflection of charged particles that deflect particles and exit from the entrance
In the apparatus, the charged particle deflection apparatus characterized by comprising a magnetic field generator for generating a magnetic field to the magnetic field at the upper entry exit port to 0.
JP3004513A 1991-01-18 1991-01-18 Charged particle deflector Expired - Fee Related JP2789821B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3004513A JP2789821B2 (en) 1991-01-18 1991-01-18 Charged particle deflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3004513A JP2789821B2 (en) 1991-01-18 1991-01-18 Charged particle deflector

Publications (2)

Publication Number Publication Date
JPH04262298A JPH04262298A (en) 1992-09-17
JP2789821B2 true JP2789821B2 (en) 1998-08-27

Family

ID=11586138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3004513A Expired - Fee Related JP2789821B2 (en) 1991-01-18 1991-01-18 Charged particle deflector

Country Status (1)

Country Link
JP (1) JP2789821B2 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01186746A (en) * 1988-01-19 1989-07-26 Ishikawajima Harima Heavy Ind Co Ltd Deflection magnetic field generator

Also Published As

Publication number Publication date
JPH04262298A (en) 1992-09-17

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