JP2769897B2 - Exposure equipment - Google Patents

Exposure equipment

Info

Publication number
JP2769897B2
JP2769897B2 JP2010112A JP1011290A JP2769897B2 JP 2769897 B2 JP2769897 B2 JP 2769897B2 JP 2010112 A JP2010112 A JP 2010112A JP 1011290 A JP1011290 A JP 1011290A JP 2769897 B2 JP2769897 B2 JP 2769897B2
Authority
JP
Japan
Prior art keywords
stage
base
exposure apparatus
barrel
projection lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2010112A
Other languages
Japanese (ja)
Other versions
JPH03214721A (en
Inventor
幸夫 徳田
一也 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2010112A priority Critical patent/JP2769897B2/en
Publication of JPH03214721A publication Critical patent/JPH03214721A/en
Application granted granted Critical
Publication of JP2769897B2 publication Critical patent/JP2769897B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression or isolation

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、半導体素子製造等に用いられる露光装置に
関し、詳しくは投影レンズ搭載台を床から支持し、基板
を載置するステージの取付け台を投影レンズ搭載台より
吊り下げる構造を有する露光装置に関するものである。
Description: FIELD OF THE INVENTION The present invention relates to an exposure apparatus used for manufacturing a semiconductor device or the like, and more particularly, to a stage mount for supporting a projection lens mounting base from the floor and mounting a substrate. The present invention relates to an exposure apparatus having a structure for suspending from a projection lens mount.

[従来の技術] 従来、半導体素子製造に用いられる露光装置として、
いわゆるステッパと呼ばれる装置が知られている。この
ステッパは、基板、例えば半導体ウエハを投影レンズ下
でステップ移動させながら、原板、例えばレチクル(ま
たはマスク)上に形成されているパターン像を投影レン
ズで縮小し、1枚のウエハ上の複数箇所に順次露光して
行くものである。
[Prior art] Conventionally, as an exposure apparatus used for manufacturing a semiconductor element,
An apparatus called a so-called stepper is known. This stepper reduces a pattern image formed on an original plate, for example, a reticle (or a mask) with a projection lens while step-moving a substrate, for example, a semiconductor wafer under a projection lens, and reduces the pattern image at a plurality of positions on one wafer. Are sequentially exposed.

ステッパは、解像度および重ね合せ精度の性能面から
これからのアライナ(露光装置)の主流と見られてい
る。
The stepper is considered to be the mainstream of the aligner (exposure apparatus) from the viewpoint of the performance of the resolution and the overlay accuracy.

第3図は、従来のアライナにおける構造体およびXYス
テージの搭載例を示す。
FIG. 3 shows an example of mounting a structure and an XY stage in a conventional aligner.

同図において、1はレチクルパターンを照明する照明
部、2は転写すべきパターンを有するレチクル、3はレ
チクルパターンをウエハ上に投影する投影レンズ、4は
投影レンズ3を支持する鏡筒支持定盤、16aは投影レン
ズ3の焦点とウエハ間の距離を計測するフォーカス検出
部の発光部、16bは同じくフォーカス検出部の受光部、
6はステージの位置を制御するための干渉計、9はトッ
プステージ、10はXステージ、11はYステージ、17はX
ステージ駆動用DCモータ、18はYステージ駆動用DCモー
タ、61は投影レンズ3やXYステージ10、11などの全体を
搭載する支持定盤、62はフレーム、63はサーボマウント
である。
1, reference numeral 1 denotes an illuminating unit for illuminating a reticle pattern, 2 denotes a reticle having a pattern to be transferred, 3 denotes a projection lens for projecting the reticle pattern onto a wafer, and 4 denotes a lens barrel support plate that supports the projection lens 3. , 16a is a light emitting section of a focus detecting section for measuring the distance between the focus of the projection lens 3 and the wafer, 16b is a light receiving section of the focus detecting section,
6 is an interferometer for controlling the position of the stage, 9 is the top stage, 10 is the X stage, 11 is the Y stage, and 17 is the X stage.
Reference numeral 18 denotes a DC motor for driving the stage, reference numeral 18 denotes a DC motor for driving the Y stage, reference numeral 61 denotes a support surface plate on which the entire projection lens 3 and XY stages 10 and 11 are mounted, reference numeral 62 denotes a frame, and reference numeral 63 denotes a servo mount.

このような構成のアライナで処理される半導体ウエハ
については、半導体素子の大面積化およびコスト低減を
図るために、大口径・大サイズの半導体ウエハを用いる
傾向にある。現在、ウエハサイズはφ6′(φ150mm)
が主流であるが、1990年以降にはφ8′(φ200mm)が
主流となるものと見込まれる。
Semiconductor wafers processed by the aligner having such a configuration tend to use large-diameter and large-sized semiconductor wafers in order to increase the area and cost of semiconductor elements. Currently, the wafer size is φ6 '(φ150mm)
Is the mainstream, but from 1990, φ8 '(φ200mm) is expected to become the mainstream.

一方、半導体素子(特にDRAM)は4M(メガ)ビット時
代から16M(メガ)ビット時代へと高集積化が進み、線
巾も微細化している。したがって、より高精度の位置合
せ、高精度のXYステージ、高スループット等が切望され
ている。
On the other hand, semiconductor devices (especially DRAMs) have been highly integrated from the 4M (mega) bit era to the 16M (mega) bit era, and the line width has also become finer. Therefore, there is a strong demand for higher-precision alignment, a higher-precision XY stage, higher throughput, and the like.

[発明が解決しようとする課題] しかしながら、従来のφ3′〜φ6′用露光装置を単
にφ8′用にサイズアップしXYステージを第3図の支持
定盤61に直接固定する従来のステッパの構造によれば以
下のような問題点が生じる。
[Problems to be Solved by the Invention] However, the conventional stepper structure in which the conventional exposure apparatus for φ3 ′ to φ6 ′ is simply increased in size to φ8 ′ and the XY stage is directly fixed to the support surface plate 61 in FIG. According to this, the following problems occur.

a)XYステージ9、10、11のストロークアップのため、
ステージの精度としてストロークアップ前のものと同じ
精度またはそれ以上の精度を保証するためには、ガイド
剛性を上げる必要がある。また、前記した高精度ステー
ジの要求を満たすために、ステージ重量は単にストロー
クアップによる重量増加分よりさらに増大せざるを得な
い。そのため、ステージ移動の加速度による加振力の増
大と、投影レンズの重量の増加によるレンズ支持の構造
体の相対剛性ダウンによる振動問題が生じ、そのために
以下のような問題点が発生する。
a) To increase the stroke of the XY stages 9, 10, and 11,
In order to guarantee the same or higher precision as that of the stage before the stroke up, it is necessary to increase the guide rigidity. Further, in order to satisfy the requirement of the high-precision stage described above, the stage weight has to be further increased more than simply the weight increase due to the stroke up. As a result, an increase in the excitation force due to the acceleration of the stage movement, and a decrease in the relative rigidity of the lens-supporting structure due to an increase in the weight of the projection lens causes a vibration problem, which causes the following problems.

構造体強化による装置の大型化およびコストアップが
生じる。
The reinforcement of the structure increases the size and cost of the device.

構造体制振まで露光およびアライメント動作を行なえ
ないため、生産性がダウンする。
Since the exposure and alignment operations cannot be performed until the structural system is shaken, productivity is reduced.

b)一方、ステージの重量増は静的には移動荷重の増大
となり、XYステージのポジションにより装置の姿勢が変
化するという問題が生じる。そのため、以下のような問
題点が発生する。
b) On the other hand, an increase in the weight of the stage statically increases the moving load, which causes a problem that the attitude of the apparatus changes depending on the position of the XY stage. Therefore, the following problems occur.

アライメント精度が劣化する。The alignment accuracy deteriorates.

生産性のダウンを防止するため、装置姿勢を瞬時に一
定姿勢にする必要がある。そのために第3図の従来構成
においてサーボマウント能力を向上する必要があり、コ
ストアップにつながる。
In order to prevent a decrease in productivity, it is necessary to instantaneously set the apparatus attitude to a constant attitude. Therefore, it is necessary to improve the servo mounting ability in the conventional configuration shown in FIG. 3, which leads to an increase in cost.

重量増大した装置全体を一定姿勢にするため制御機構
が大型化・複雑化するとともに高精度な姿勢制御が困難
になる。
The control mechanism becomes large and complicated in order to make the entire apparatus having the increased weight have a constant attitude, and it becomes difficult to perform high-precision attitude control.

等の問題が発生する。And other problems occur.

本発明は、上述の従来技術の問題点に鑑み、コンパク
トな構成で装置の振動防止を実現し、安価かつ高精度で
高スループットの露光装置を構成することを目的とす
る。
The present invention has been made in view of the above-described problems of the related art, and has as its object to realize an inexpensive, high-accuracy, high-throughput exposure apparatus that realizes prevention of apparatus vibration with a compact configuration.

[課題を解決するための手段及び作用] 前記目的を達成するため、本発明に係る露光装置の本
体構造体の構造は、XYステージ定盤を鏡筒定盤より吊り
下げ、本体マウントは鏡筒定盤を支持する構造を特徴と
する。
[Means and Actions for Solving the Problems] In order to achieve the above object, in the structure of the main body structure of the exposure apparatus according to the present invention, the XY stage base is hung from the barrel base, and the main body mount is a barrel. It features a structure that supports the surface plate.

本構成により、第1にマウント位置を本体重心点付近
に配置でき、ステージ移動による本体振動に対する減衰
性能の向上が図られる。また床等外部からの振動に対す
る除振性能も向上する。さらに、本体振動における回転
中心が本体重心点付近に来ることから別置の露光用光源
(例:エキシマレーザ)にとって、その入射位置を本体
回転中心に配置しやすくなるため、露光光学系に有利と
なる。また、第二の作用効果としてステージ定盤と鏡筒
定盤の相対振動に関して、被振動物が鏡筒定盤からステ
ージ定盤に代わったことで重量が軽減し、2つの定盤連
結部材の動剛性が上がることによって相対振動の減衰性
能が向上する。
With this configuration, first, the mount position can be arranged near the center of gravity of the main body, and the damping performance against the vibration of the main body due to the movement of the stage is improved. Also, the vibration isolation performance against vibration from the outside such as the floor is improved. Furthermore, since the center of rotation in the vibration of the main body is near the center of gravity of the main body, it is easy for the separate exposure light source (eg, excimer laser) to arrange the incident position at the center of rotation of the main body, which is advantageous for the exposure optical system. Become. As a second effect, the relative vibration between the stage base and the barrel base is reduced by the fact that the object to be vibrated is replaced by the stage base from the barrel base, which reduces the weight of the two base connection members. By increasing the dynamic rigidity, the relative vibration damping performance is improved.

以上のことから、スループットを犠牲にすることなく
アライメント精度、焼き付け精度の向上が図られる。
From the above, the alignment accuracy and the printing accuracy can be improved without sacrificing the throughput.

[実施例] 以下、図面を用いて本発明の実施例を説明する。Embodiment An embodiment of the present invention will be described below with reference to the drawings.

第1図は本発明の第1の実施例の側面図(一部は透視
して表わしている)である。同図において、1はレチク
ルを照明する照明部、2は転写すべきパターンを有する
レチクル、3はレチクル上に形成されたパターンをウエ
ハ上に投影する投影レンズ、4は投影レンズを支持する
鏡筒定盤、5は鏡筒定盤4を支持するマウント、6はY
方向に移動可能なYステージ、7はX方向に移動可能な
Xステージ、8はXステージ7上に取り付けられたZ方
向、θ方向、αおよびβ方向に移動および回転する機能
を有するトップステージである。9は各ステージ6〜8
を支持するステージベース、10はステージベース9を支
持するステージ定盤である。なお、マウント5として
は、通常のエアーマウントまたはアクティブマウントを
用いることができる。11はXYステージの位置を検出する
レーザ干渉計、12はYステージ6を駆動するDCサーボモ
ータ、13はXステージ7を駆動するDCサーボモータであ
る。なお、ここでは、吊り下げ部材を鏡筒定盤と一体物
として、高剛性化を図っている。
FIG. 1 is a side view (partially shown) of a first embodiment of the present invention. In FIG. 1, reference numeral 1 denotes an illumination unit for illuminating a reticle, 2 denotes a reticle having a pattern to be transferred, 3 denotes a projection lens for projecting a pattern formed on the reticle onto a wafer, and 4 denotes a lens barrel that supports the projection lens. Surface plate 5, mount for supporting lens barrel surface plate 4, 6 for Y
Y stage movable in the X direction, 7 is an X stage movable in the X direction, 8 is a top stage mounted on the X stage 7 and capable of moving and rotating in the Z, θ, α and β directions. is there. 9 is each stage 6-8
A stage base 10 supports the stage base 9. As the mount 5, a normal air mount or active mount can be used. 11 is a laser interferometer for detecting the position of the XY stage, 12 is a DC servo motor for driving the Y stage 6, and 13 is a DC servo motor for driving the X stage 7. Here, the suspension member is integrated with the lens barrel base to achieve high rigidity.

次に動作を説明する。 Next, the operation will be described.

本体の振動の中で最も減衰が悪いものは、一般的に
α、βの回転運動を主に、X、Y、Zの平行運動を含む
連成振動である(ロッキングと呼ばれている)。ステー
ジがステップ移動した場合、このロッキングが顕著に現
われる。例えば、ステージがXステップした場合の投影
レンズのX方向加速度を見ると、従来技術では、第2図
(a)の実線グラフのようになる。しかしながら、本発
明により本体重心点付近を支持することで、本体振動の
減衰性能は向上し、第2図(b)のようになる。
Among the vibrations of the main body, the one with the worst damping is generally a coupled vibration mainly including a rotational motion of α and β and a parallel motion of X, Y and Z (referred to as rocking). If the stage moves step by step, this locking will be noticeable. For example, looking at the acceleration in the X direction of the projection lens when the stage makes X steps, the conventional technique is as shown by a solid line graph in FIG. 2 (a). However, by supporting the vicinity of the center of the body weight according to the present invention, the damping performance of the main body vibration is improved, as shown in FIG. 2 (b).

第4図は本発明の他の実施例を示す図で、1はレチク
ル2を照明する照明部、2は転写すべきパターンを有す
るレチクル、3はレチクル上に形成されたパターンをウ
エハ上に投影するための投影レンズ、4は投影レンズを
支持する鏡筒定盤、5は装置全体を支持するエアーマウ
ントまたはアクティブダンパー、6はY方向に移動可能
なYステージ、7はYステージ6に支持され、かつX方
向に移動可能なXステージ、8はXステージ7上に取り
付けられたZ方向、θ方向、αおよびβ方向に移動およ
び回転する機能を有するトップステージ、9は各ステー
ジ6〜8を支持するステージベース、10はマウント5に
より支持され、ステージベース9を支持するステージ定
盤、11はXYステージの位置を検出するレーザー干渉計、
12、13はYステージ6、Xステージ7を駆動するDCサー
ボモーターである。なおここでは鏡筒定盤4、ステージ
定盤10ともマウント5により支持される構造を有してい
る。
FIG. 4 is a view showing another embodiment of the present invention, wherein 1 is an illuminating section for illuminating a reticle 2, 2 is a reticle having a pattern to be transferred, and 3 is a pattern projected on a reticle onto a wafer. 4 is a lens barrel base that supports the projection lens, 5 is an air mount or active damper that supports the entire apparatus, 6 is a Y stage movable in the Y direction, and 7 is supported by the Y stage 6. And an X stage movable in the X direction, 8 is a top stage mounted on the X stage 7 and having a function of moving and rotating in the Z, θ, α and β directions, and 9 is a stage 6 to 8 A stage base for supporting, 10 is a stage base supported by the mount 5 and supporting the stage base 9, 11 is a laser interferometer for detecting the position of the XY stage,
Reference numerals 12 and 13 denote DC servo motors for driving the Y stage 6 and the X stage 7, respectively. Here, both the lens barrel base 4 and the stage base 10 have a structure supported by the mount 5.

動作及び効果は前記実施例と同等であるが、第4図実
施例では第1図の実施例に比べ、XYステージ移動に伴な
う変荷重をステージ定盤10が受けるため、鏡筒定盤の投
影レンズ搭載面の変形を小さくできる。また、組立性の
向上を図ることができる。
The operation and effects are the same as those of the above-described embodiment. However, in the embodiment of FIG. 4, the stage base 10 receives a variable load accompanying the movement of the XY stage compared to the embodiment of FIG. Of the projection lens mounting surface can be reduced. In addition, the assemblability can be improved.

[発明の効果] 以上説明したように、本発明によれば、ステージ定盤
を鏡筒定盤から吊り下げ、鏡筒定盤をマウントするとい
う簡単な構造転換により、本体振動の減衰性能を向上さ
せることができる。また、構造上ステージ定盤と鏡筒定
盤の距離を短かくできるため、吊り下げ部材を鏡筒定盤
と一体化した場合、高剛性化が可能となり、焼付け精度
が向上する。
[Effect of the Invention] As described above, according to the present invention, the damping performance of the main body vibration is improved by a simple structural change in which the stage base is suspended from the barrel base and the barrel base is mounted. Can be done. In addition, since the distance between the stage base and the barrel base can be shortened structurally, when the hanging member is integrated with the barrel base, high rigidity can be achieved, and the printing accuracy is improved.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の実施例の全体構成図、 第2図(a)、(b)は各々従来構造および本発明構造
における振動減衰特性を示す変位応答図、 第3図は従来の露光装置の全体構成図、 第4図は本発明の他の実施例の全体構成図である。 1:照明部、2:レチクル、3:投影レンズ、4:鏡筒定盤、5:
マウント、6:Yステージ、7:Xステージ、8:トップステー
ジ、10:ステージ定盤。
1 is an overall configuration diagram of an embodiment of the present invention, FIGS. 2 (a) and 2 (b) are displacement response diagrams showing vibration damping characteristics in a conventional structure and the structure of the present invention, respectively, and FIG. 3 is a conventional exposure apparatus. FIG. 4 is an overall configuration diagram of another embodiment of the present invention. 1: Lighting unit, 2: Reticle, 3: Projection lens, 4: Barrel platen, 5:
Mount, 6: Y stage, 7: X stage, 8: Top stage, 10: Stage surface plate.

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】投影光学系を支持する鏡筒定盤と、露光す
べき基板を搭載して移動するステージと、該ステージを
支持するステージ定盤と、該鏡筒定盤を設置床上に支持
するマウント手段とを備え、前記ステージ定盤を前記鏡
筒定盤から吊り下げて支持するように構成したことを特
徴とする露光装置。
1. A lens barrel base for supporting a projection optical system, a stage for mounting and moving a substrate to be exposed, a stage base for supporting the stage, and a support for the lens barrel on an installation floor. An exposure apparatus, comprising: a mounting means for mounting the stage base, and suspending and supporting the stage base from the barrel base.
【請求項2】前記ステージ定盤の重量を前記鏡筒定盤で
支え、該鏡筒定盤を介して前記ステージ定盤を間接的に
前記マウント手段に支持させたことを特徴とする請求項
1記載の露光装置。
2. The apparatus according to claim 1, wherein the weight of said stage base is supported by said barrel base, and said stage base is indirectly supported by said mounting means via said barrel base. 2. The exposure apparatus according to 1.
【請求項3】前記ステージ定盤を前記鏡筒定盤とともに
実質上直接前記マウント手段に支持させたことを特徴と
する請求項1記載の露光装置。
3. An exposure apparatus according to claim 1, wherein said stage base is supported by said mounting means substantially directly together with said lens barrel base.
【請求項4】前記マウント手段と前記鏡筒定盤との結合
部が、前記ステージ定盤よりも高い位置にあることを特
徴とする請求項1記載の露光装置。
4. An exposure apparatus according to claim 1, wherein a connecting portion between said mounting means and said lens barrel base is located at a position higher than said stage base.
JP2010112A 1990-01-19 1990-01-19 Exposure equipment Expired - Lifetime JP2769897B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010112A JP2769897B2 (en) 1990-01-19 1990-01-19 Exposure equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010112A JP2769897B2 (en) 1990-01-19 1990-01-19 Exposure equipment

Publications (2)

Publication Number Publication Date
JPH03214721A JPH03214721A (en) 1991-09-19
JP2769897B2 true JP2769897B2 (en) 1998-06-25

Family

ID=11741232

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010112A Expired - Lifetime JP2769897B2 (en) 1990-01-19 1990-01-19 Exposure equipment

Country Status (1)

Country Link
JP (1) JP2769897B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002289515A (en) * 2000-12-28 2002-10-04 Nikon Corp Method for manufacturing product, method for manufacturing aligner, aligner, and method for manufacturing device
KR20060009957A (en) * 2003-05-27 2006-02-01 가부시키가이샤 니콘 Exposure apparatus and device-producing method
GB2442805B (en) * 2006-10-12 2009-04-08 Vistec Lithography Ltd Reduction in stage movement reaction force in an electron beam lithography machine

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63199417A (en) * 1987-02-14 1988-08-17 Canon Inc Exposure device

Also Published As

Publication number Publication date
JPH03214721A (en) 1991-09-19

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