JP2755878B2 - Array type photodetector positioning method and spectrometer - Google Patents

Array type photodetector positioning method and spectrometer

Info

Publication number
JP2755878B2
JP2755878B2 JP22954292A JP22954292A JP2755878B2 JP 2755878 B2 JP2755878 B2 JP 2755878B2 JP 22954292 A JP22954292 A JP 22954292A JP 22954292 A JP22954292 A JP 22954292A JP 2755878 B2 JP2755878 B2 JP 2755878B2
Authority
JP
Japan
Prior art keywords
light
receiving element
array
diffraction grating
adjusting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP22954292A
Other languages
Japanese (ja)
Other versions
JPH0674825A (en
Inventor
良治 鈴木
仁志 石橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP22954292A priority Critical patent/JP2755878B2/en
Publication of JPH0674825A publication Critical patent/JPH0674825A/en
Application granted granted Critical
Publication of JP2755878B2 publication Critical patent/JP2755878B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、分光対象の光線束が入
射される凹面回析格子と、凹面回析格子より回折する回
折光を受光するアレイ型受光素子とを備えた分光分析計
及び、この分光分析計に備えられるアレイ型受光素子の
位置決め方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spectrometer comprising a concave diffraction grating on which a light beam to be split is incident, and an array type light receiving element for receiving diffracted light diffracted from the concave diffraction grating. The present invention also relates to a method for positioning an array type light receiving element provided in the spectrometer.

【0002】[0002]

【従来の技術】従来、この種の分光分析計は図5(イ)
に示すような構成が採用されていた。即ち、分光対象の
光線束が入射されるスリット3、平面鏡5、凹面回析格
子4及びこの凹面回析格子より回折する回折光を受光す
るアレイ型受光素子6とを備えて構成されている。分光
分析計は凹面回析格子によって分光された光が、その焦
点面位置において分光された光線束を受光できる構成と
されており、この焦点面位置にアレイ型受光素子を配設
して検出をおこなう。従って、分光分析計においては、
凹面回析格子に対して適切な位置関係で、アレイ型受光
素子を配設する必要があるが、光学部品間の距離を精度
よく測定するのは困難である。従来、この焦点面合わせ
をおこなう場合は、通常光学的な方法でおこなわれてい
た。即ち、図5(ロ)に示すように、レーザ光を2方向
からスリットを介して分光分析計内に入射し、凹面回析
格子より回折光を得て、受光素子面上で焦点を結ぶよ
う、各部品の位置を調整していた。
2. Description of the Related Art Conventionally, this type of spectrometer is shown in FIG.
The configuration shown in FIG. That is, it is configured to include a slit 3 into which a light beam to be split is incident, a plane mirror 5, a concave diffraction grating 4, and an array-type light receiving element 6 for receiving diffracted light diffracted from the concave diffraction grating. The spectrometer is configured so that the light split by the concave diffraction grating can receive the light beam split at the focal plane position, and an array type light receiving element is arranged at this focal plane position to perform detection. Do it. Therefore, in a spectrometer,
Although it is necessary to dispose the array type light receiving element in an appropriate positional relationship with respect to the concave diffraction grating, it is difficult to accurately measure the distance between the optical components. Conventionally, this focal plane alignment is usually performed by an optical method. That is, as shown in FIG. 5 (b), laser light enters the spectrometer from two directions through a slit, obtains diffracted light from a concave diffraction grating, and focuses on the light receiving element surface. , The position of each part was adjusted.

【0003】[0003]

【発明が解決しようとする課題】しかしながらこの方法
においては、アレイ型受光素子の位置を点でしか確認で
きず、全領域を確認するには、異なる波長を有するレー
ザ光源を準備する必要があり、装置が大掛かりになると
ともに、調整に長時間を要した。さらに、レーザ光の照
射角度を変更して焦点面位置のズレの有無を検出する要
があるが、この場合も、装置系が大掛かりになるととも
に作業性が悪い。従って、簡単にアレイ型受光素子の位
置を適切に設定することが、困難であった。本発明の目
的は、上記の課題を解決することにある。
However, in this method, the position of the array type light receiving element can be confirmed only at a point, and in order to confirm the entire area, it is necessary to prepare laser light sources having different wavelengths. The equipment became large-scale and it took a long time to adjust. Further, it is necessary to change the irradiation angle of the laser beam to detect whether or not the focal plane position is deviated. However, in this case as well, the device system becomes large and workability is poor. Therefore, it has been difficult to easily appropriately set the position of the array type light receiving element. An object of the present invention is to solve the above problems.

【0004】[0004]

【課題を解決するための手段】この目的を達成するため
の本発明によるアレイ型受光素子の位置決め方法の特徴
手段は、少なくとも2波長にスペクトルのピークを有す
る調整用光線束を、凹面回析格子の第一特定位置に入射
し、その回折光を前記アレイ型受光素子で検出して第一
検出情報を得る第一工程と、調整用光線束を、第一特定
位置とは異なった凹面回析格子の第二特定位置に入射
し、その回折光をアレイ型受光素子で検出して第二検出
情報を得る第二工程とを備え、少なくとも2波長のピー
クを受光する少なくとも一対の素子の位置が、第一検出
情報と第二検出情報間において互いに一致するように、
アレイ型受光素子の位置を調節する位置調整工程を備え
てあることにあり、さらに、分光分析計の特徴構成は、
アレイ型受光素子の位置調整用光源として、少なくとも
2波長にスペクトルのピークを有する調整用光線束を照
射する照射手段と、凹面回析格子の異なった二つの部位
に、照射手段からの調整用光線束を夫々個別に入射させ
る入射光位置調整手段とを備えたことにある。そして、
その作用・効果は次の通りである。
In order to achieve the above object, a method of positioning an array type light receiving element according to the present invention is characterized in that an adjusting light beam having a spectral peak at least at two wavelengths is formed by a concave diffraction grating. A first step of obtaining the first detection information by detecting the diffracted light with the array type light receiving element and diffracted light of the first specific position, and diffusing the adjusting light beam with a concave diffractive surface different from the first specific position. Incident on the second specific position of the grating, the second step of detecting the diffracted light with an array type light receiving element to obtain second detection information, the position of at least a pair of elements that receive peaks of at least two wavelengths So that the first detection information and the second detection information match each other,
It is provided with a position adjusting step of adjusting the position of the array type light receiving element, and further, the characteristic configuration of the spectrometer is
Irradiation means for irradiating an adjustment light beam having a spectral peak at at least two wavelengths as a position adjustment light source of the array type light receiving element, and adjustment light rays from the irradiation means to two different portions of the concave diffraction grating There is provided an incident light position adjusting means for individually entering the bundles. And
The operation and effect are as follows.

【0005】[0005]

【作用】凹面回析格子に固有の焦点面の性質として、回
折格子各部位からの回折光は、受光素子が焦点面位置に
ある場合は、特定スペクトル光が同一の素子番号の素子
に受光される。従って、この特性を本願においては逆に
利用して、特定の調整用光線束を凹面回析格子の異なっ
た二つの部位に照射し、これらの回折光のスペクトルが
特定の同一素子に受光される一連のアレイ型受光素子の
位置を正規の位置とするのである。ここで、スペクトル
が素子の配列方向で一致しているかどうかは、調整用光
線束内に存する少なくとも2つのピーク波長位置を比較
することにより確認される。さて、分光分析計において
は、前述の特定の調整用光線束を照射できる照射光源を
備え、入射光位置調整手段を備えて前述の第一、第二工
程を実行して、アレイ型受光素子の位置決めをおこなう
ことができる。
The characteristic of the focal plane inherent to the concave diffraction grating is that, when the light-receiving element is at the focal plane position, the diffracted light from each part of the diffraction grating is received by the element having the same element number as the specific spectrum light. You. Accordingly, in the present application, this characteristic is used in reverse to irradiate a specific adjusting light beam to two different portions of the concave diffraction grating, and the spectra of these diffracted lights are received by the same specific element. The positions of a series of array-type light receiving elements are set as regular positions. Here, whether or not the spectra match in the arrangement direction of the elements is confirmed by comparing at least two peak wavelength positions existing in the adjustment light beam. By the way, in the spectrometer, the irradiation light source capable of irradiating the above-mentioned specific adjusting light beam is provided, and the first and second steps described above are provided with the incident light position adjusting means, and the array type light receiving element is provided. Positioning can be performed.

【0006】[0006]

【発明の効果】従って、2波長を備えたレーザー光源を
用意する必要はないとともに、素子位置が、面として配
設される状態で位置確認されるため、調整作業が容易に
行えるとともに、装置系の非常に簡単な構成ですむよう
になる。ここで、分光分析計の焦点面のズレが全波長領
域にわたって把握できるため、受光素子をどの方向に動
かせばよいかがすぐ分かる。従って、光軸調整が簡単に
迅速に行えるとともに、自動調整も容易にできるように
なる。
Therefore, it is not necessary to prepare a laser light source having two wavelengths, and since the element position can be confirmed in a state where it is arranged as a surface, the adjustment work can be easily performed and the apparatus system can be easily controlled. A very simple configuration is required. Here, since the shift of the focal plane of the spectrometer can be grasped over the entire wavelength range, it is immediately known in which direction the light receiving element should be moved. Therefore, the optical axis can be easily and quickly adjusted, and the automatic adjustment can be easily performed.

【0007】[0007]

【実施例】本願の実施例を図面に基づいて説明する。図
1には分光分析計1の構成が、さらに図2にはこの分光
分析計1に備えられる窓付遮蔽板2を入射側から見た図
(a−a方向視図)が示されている。
An embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows the configuration of the spectrometer 1, and FIG. 2 shows a view (a-a direction view) of the shielding plate 2 with a window provided in the spectrometer 1 as viewed from the incident side. .

【0008】先ず、分光分析計1の概略構成から説明す
る。分光分析計1は、分光対象の光線束が入射されるス
リット3と、このスリット3を通過した光線束を凹面回
析格子4へ導く平面反射鏡5と、凹面回析格子4、及び
凹面回析格子4より回折する回折光を受光するアレイ型
受光素子6とを備えて構成される。そして、前述の凹面
回析格子4の前面側に窓付遮蔽板2が備えられている。
この窓付遮蔽板2は、図1、図2に示すように、回折格
子4の受光面よりも小さな面積の開口2aを備えてお
り、この窓付遮蔽板2が凹面回析格子4に沿って摺動自
在(b方向)に構成されている。従って、窓付遮蔽板2
を摺動させることにより、凹面回析格子4に入射する光
線束とこれから回折してアレイ型素子6に受光される回
折光との部位が限定、選択される。この窓付遮蔽板2を
入射光位置調整手段と呼ぶ。一方、アレイ型受光素子6
に位置決めに必要となる装置として、白色光線束を照射
する白色光源7と、この白色光線束を透過させることに
より、2波長にスペクトルのピークを有する調整用光線
束を得る調整用フィルター8が備えられている。ここ
で、この白色光源7は一般的な光源であり、白色光線束
は指向性の高くないブロードな光線束である。
First, the schematic configuration of the spectrometer 1 will be described. The spectrometer 1 includes a slit 3 into which a light beam to be split is incident, a plane reflecting mirror 5 for guiding the light beam passing through the slit 3 to a concave diffraction grating 4, a concave diffraction grating 4, and a concave diffraction grating. And an array type light receiving element 6 for receiving the diffracted light diffracted from the diffraction grating 4. The windowed shielding plate 2 is provided on the front side of the concave diffraction grating 4.
As shown in FIGS. 1 and 2, the window-equipped shielding plate 2 has an opening 2 a having an area smaller than the light receiving surface of the diffraction grating 4, and the window-equipped shielding plate 2 extends along the concave diffraction grating 4. Slidably (direction b). Therefore, the shielding plate with window 2
Is moved, the portions of the light beam incident on the concave diffraction grating 4 and the diffracted light diffracted therefrom and received by the array-type element 6 are limited and selected. The window-equipped shielding plate 2 is referred to as incident light position adjusting means. On the other hand, the array type light receiving element 6
A device necessary for positioning includes a white light source 7 for irradiating a white light beam, and an adjustment filter 8 for transmitting the white light beam to obtain an adjustment light beam having a spectral peak at two wavelengths. Have been. Here, the white light source 7 is a general light source, and the white light beam is a broad light beam with low directivity.

【0009】以下に、アレイ型受光素子6の位置決め時
に採用される調整原理について説明する。図3には、窓
付遮蔽板2が異なった位置関係にある場合の、調整用光
線束の回折光のピーク位置(波長λ1 λ2 )結像方向
が、実線と破線で示されている。さらに、図4(イ)、
(ロ)には、これらの状態におけるスペクトル分布が示
されている(凹面回析格子4のA部よりの回折像が実線
で、B部からの回折像が破線で示されている)。図の関
係からもわかるように、アレイ型受光素子6が焦点面に
一致している場合は、異なった凹面回析格子4の部分
(A及びB)から回折してくる回折光のスペクトルは受
光素子6上で一致する(図4(ロ)に示す)。一方、図
3に示すように、アレイ型受光素子6が焦点面から外れ
ていると、二つのスペクトルがずれることとなる(図4
(イ)に示す)。従って、焦点面との一致の確認のため
にはアレイ型素子のピーク位置P1,P2が同一の素子
により検出されるようにアレイ型受光素子6を位置調整
すればよい。
The adjustment principle employed when positioning the array type light receiving element 6 will be described below. In FIG. 3, the solid line and the broken line show the peak position (wavelength λ 1 λ 2 ) image forming direction of the diffracted light of the adjusting light beam when the shielding plate with window 2 has a different positional relationship. . Furthermore, FIG.
(B) shows the spectrum distribution in these states (the diffraction image from the A portion of the concave diffraction grating 4 is shown by a solid line, and the diffraction image from the B portion is shown by a broken line). As can be seen from the relationship in the figure, when the array type light receiving element 6 coincides with the focal plane, the spectrum of the diffracted light diffracted from the different portions (A and B) of the concave diffraction grating 4 is received. They match on the element 6 (shown in FIG. 4B). On the other hand, as shown in FIG. 3, when the array-type light receiving element 6 is out of the focal plane, the two spectra are shifted (FIG. 4).
(Shown in (a)). Therefore, in order to confirm the coincidence with the focal plane, the position of the array-type light receiving element 6 may be adjusted so that the peak positions P1 and P2 of the array-type elements are detected by the same element.

【0010】以下に、アレイ型受光素子6の位置決め手
順について説明する。 1)白色光源7の前に調整用フィルター8を配設し、こ
の調整用フィルター8を透過した調整用光線束を分光分
析計1内に入射させる。 2)窓付遮蔽板2を第一位置に設定し、調整用光線束を
凹面回析格子の第一特定位置Aに入射し、その回折光を
アレイ型受光素子6で検出して第一検出情報を得る。こ
の工程を第一工程と呼ぶ。 3)窓付遮蔽板2を第一位置とは異なった第二位置に設
定し、調整用光線束を、凹面回析格子の第二特定位置B
に入射し、その回折光をアレイ型受光素子6で検出して
第二検出情報を得る。この工程を第二工程と呼ぶ。 4)2波長のピークを受光する一対の素子の位置が、第
一検出情報と第二検出情報間において互いに一致するよ
うに、アレイ型受光素子の位置を調節する。この工程を
位置調整工程と呼ぶ。
The procedure for positioning the array type light receiving element 6 will be described below. 1) An adjustment filter 8 is provided in front of the white light source 7, and an adjustment light beam transmitted through the adjustment filter 8 is made to enter the spectrometer 1. 2) The shielding plate with window 2 is set at the first position, the light beam for adjustment is incident on the first specific position A of the concave diffraction grating, and the diffracted light is detected by the array-type light receiving element 6 for the first detection. get information. This step is called a first step. 3) The shielding plate with window 2 is set at a second position different from the first position, and the adjusting light beam is transmitted to the second specific position B of the concave diffraction grating.
And the diffracted light is detected by the array type light receiving element 6 to obtain second detection information. This step is called a second step. 4) The position of the array-type light receiving element is adjusted such that the positions of the pair of elements that receive the peaks of the two wavelengths match each other between the first detection information and the second detection information. This step is called a position adjustment step.

【0011】上記の実施例においては、異なった時間に
夫々の部位からの回折光を受光してこれらのスペクトル
の位置を比較するものとしたが、窓付遮蔽板に複数の開
口を設けておき、入射段階において複数のピークを有す
る調整用光線束を入射させて、これと同数のピークがア
レイ型受光素子において検出する場合に、素子が焦点面
に位置されると判断するようにしてもよい。
In the above embodiment, the positions of these spectra are compared by receiving the diffracted lights from the respective portions at different times, but a plurality of openings are provided in the shielding plate with windows. In the incident stage, an adjusting light beam having a plurality of peaks may be made incident, and when the same number of peaks are detected in the array type light receiving element, it may be determined that the element is located on the focal plane. .

【0012】尚、特許請求の範囲の項に図面との対照を
便利にするために符号を記すが、該記入により本発明は
添付図面の構成に限定されるものではない。
In the claims, reference numerals are provided for convenience of comparison with the drawings, but the present invention is not limited to the configuration shown in the accompanying drawings.

【図面の簡単な説明】[Brief description of the drawings]

【図1】分光分析計の構成を示す図FIG. 1 shows a configuration of a spectrometer.

【図2】窓板の構成を示すa−a方向視図FIG. 2 is an aa direction view showing a configuration of a window plate.

【図3】異なった凹面回折格子部位からの回折光と受光
素子の関係を示す図
FIG. 3 is a diagram showing a relationship between diffracted light from different concave diffraction grating portions and a light receiving element.

【図4】受光素子が焦点面から外れている場合及び合致
している場合のスペクトル分布を示す図
FIG. 4 is a diagram showing a spectrum distribution when the light receiving element is out of the focal plane and when the light receiving element is in agreement with the focal plane;

【図5】従来の分光分析計の構成と、その受光素子の位
置決め状況を示す図
FIG. 5 is a diagram showing a configuration of a conventional spectrometer and a positioning state of a light receiving element thereof.

【符号の説明】[Explanation of symbols]

1 分光分析計 2 入射光位置調整手段 4 凹面回折格子 6 アレイ型受光素子 7 照射手段 8 照射手段 A 第一特定位置 B 第二特定位置 DESCRIPTION OF SYMBOLS 1 Spectrometer 2 Incident light position adjusting means 4 Concave diffraction grating 6 Array type light receiving element 7 Irradiating means 8 Irradiating means A First specified position B Second specified position

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) G01J 3/36 G01J 3/02──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) G01J 3/36 G01J 3/02

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 分光対象の光線束が入射される凹面回析
格子(4)と、前記凹面回析格子(4)より回折する回
折光を受光するアレイ型受光素子(6)とを備えた分光
分析計(1)のアレイ型受光素子の位置決め方法であっ
て、 少なくとも2波長にスペクトルのピークを有する調整用
光線束を、前記凹面回析格子(4)の第一特定位置
(A)に入射し、その回折光を前記アレイ型受光素子
(6)で検出して第一検出情報を得る第一工程と、 前記調整用光線束を、前記第一特定位置(A)とは異な
った前記凹面回析格子の第二特定位置(B)に入射し、
その回折光を前記アレイ型受光素子(6)で検出して第
二検出情報を得る第二工程とを備え、 前記少なくとも2波長のピークを受光する少なくとも一
対の素子の位置が、前記第一検出情報と前記第二検出情
報間において互いに一致するように、前記アレイ型受光
素子(6)の位置を調節する位置調整工程を備えたアレ
イ型受光素子の位置決め方法。
1. A concave diffraction grating (4) on which a light beam to be split is incident, and an array type light receiving element (6) for receiving diffracted light diffracted by the concave diffraction grating (4). A method for positioning an array-type light receiving element of a spectrometer (1), comprising: adjusting an adjusting light beam having a spectrum peak at least at two wavelengths to a first specific position (A) of the concave diffraction grating (4). A first step of receiving the diffracted light and detecting the diffracted light with the array-type light receiving element (6) to obtain first detection information; and adjusting the adjustment light beam different from the first specific position (A). Incident on the second specific position (B) of the concave diffraction grating,
A second step of detecting the diffracted light with the array-type light receiving element (6) to obtain second detection information, wherein the position of at least one pair of elements that receive the peaks of at least two wavelengths is the first detection. A method for positioning an array-type light-receiving element, comprising a position adjusting step of adjusting the position of the array-type light-receiving element (6) so that information and the second detection information match each other.
【請求項2】 分光対象の光線束が入射される凹面回析
格子(4)と、前記凹面回析格子(4)より回折する回
折光を受光するアレイ型受光素子(6)とを備えた分光
分析計であって、 前記アレイ型受光素子の位置調整用光源として、少なく
とも2波長にスペクトルのピークを有する調整用光線束
を照射する照射手段(7),(8)と、 前記凹面回析格子(4)の異なった二つの部位に、前記
照射手段(7),(8)からの調整用光線束を夫々個別に
入射させる入射光位置調整手段(2)とを備えた分光分
析計。
2. A device comprising: a concave diffraction grating (4) on which a light beam to be split is incident; and an array-type light receiving element (6) for receiving diffracted light diffracted from the concave diffraction grating (4). Irradiating means (7), (8) for irradiating an adjusting light beam having a spectrum peak at least at two wavelengths as a position adjusting light source of said array type light receiving element; A spectrometer provided with incident light position adjusting means (2) for individually entering the adjusting light beams from the irradiation means (7) and (8) into two different portions of the grating (4).
JP22954292A 1992-08-28 1992-08-28 Array type photodetector positioning method and spectrometer Expired - Fee Related JP2755878B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22954292A JP2755878B2 (en) 1992-08-28 1992-08-28 Array type photodetector positioning method and spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22954292A JP2755878B2 (en) 1992-08-28 1992-08-28 Array type photodetector positioning method and spectrometer

Publications (2)

Publication Number Publication Date
JPH0674825A JPH0674825A (en) 1994-03-18
JP2755878B2 true JP2755878B2 (en) 1998-05-25

Family

ID=16893802

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22954292A Expired - Fee Related JP2755878B2 (en) 1992-08-28 1992-08-28 Array type photodetector positioning method and spectrometer

Country Status (1)

Country Link
JP (1) JP2755878B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6507685B1 (en) * 2001-09-20 2003-01-14 Capella Photonics, Inc. Method and apparatus for servo-based spectral array alignment in optical systems

Also Published As

Publication number Publication date
JPH0674825A (en) 1994-03-18

Similar Documents

Publication Publication Date Title
US3927944A (en) Spectrophotometer
US4060327A (en) Wide band grating spectrometer
JP3385164B2 (en) How to operate the spectrometer
JP2755878B2 (en) Array type photodetector positioning method and spectrometer
KR101850573B1 (en) Minute rotary type image spectrum device
US4289401A (en) Optical system for spectral devices
JPH1090008A (en) Apparatus for detecting origin position of encoder
JPH11142240A (en) Spectroscope
US20050175362A1 (en) Optical spectrometer and method
US5495331A (en) Dual-beam polychromator
US4140399A (en) Monochromator for simultaneous selection and utilization of two wave-lengths
CN201166743Y (en) Apparatus for adjusting spatial filter light path collimation
JP3308326B2 (en) Spectroscope
JP2001091357A (en) Simultaneous analysis method of multiple optical spectrum
JPS61266925A (en) Double luminous flux measurement system using photoelectric converting element array
CN104698545A (en) Optical filter with spectrum analysis function and implementation method thereof
WO1989000280A1 (en) Improvements in and relating to spectrophotometers
JP2001183294A (en) Infrared spectroscopic device
JPH0674823A (en) Wave length calibration method for spectroscopic analyzer
US4995725A (en) Monochromator arrangement
JP2550650B2 (en) Optical spectrum analyzer
JPS63502215A (en) spectrometer equipment
US5438407A (en) Spectrometer and apparatus including the spectrometer
GB2207253A (en) Monochromator
JP3323670B2 (en) Radiation spectrometer

Legal Events

Date Code Title Description
FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 11

Free format text: PAYMENT UNTIL: 20090306

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 11

Free format text: PAYMENT UNTIL: 20090306

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100306

Year of fee payment: 12

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 12

Free format text: PAYMENT UNTIL: 20100306

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 13

Free format text: PAYMENT UNTIL: 20110306

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110306

Year of fee payment: 13

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120306

Year of fee payment: 14

LAPS Cancellation because of no payment of annual fees