JP2744631B2 - Thermal stimulation current measurement method and device - Google Patents

Thermal stimulation current measurement method and device

Info

Publication number
JP2744631B2
JP2744631B2 JP6546789A JP6546789A JP2744631B2 JP 2744631 B2 JP2744631 B2 JP 2744631B2 JP 6546789 A JP6546789 A JP 6546789A JP 6546789 A JP6546789 A JP 6546789A JP 2744631 B2 JP2744631 B2 JP 2744631B2
Authority
JP
Japan
Prior art keywords
electrode
test piece
film
hollow ring
stimulation current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP6546789A
Other languages
Japanese (ja)
Other versions
JPH02245645A (en
Inventor
恭史 段谷
正行 飯嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP6546789A priority Critical patent/JP2744631B2/en
Publication of JPH02245645A publication Critical patent/JPH02245645A/en
Application granted granted Critical
Publication of JP2744631B2 publication Critical patent/JP2744631B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は熱刺激を与えることにより均質内部の結合エ
ネルギ状態を熱刺激電流として測定する技術に関し、特
に静電潜像を形成した電荷保持媒体の熱刺激電流を測定
する熱刺激電流測定方法および測定装置に関するもので
ある。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for measuring a binding energy state in a homogeneous interior by applying a thermal stimulus as a thermal stimulus current, and in particular, a charge holding medium on which an electrostatic latent image is formed. The present invention relates to a method and a device for measuring a thermal stimulation current for measuring a thermal stimulation current.

〔従来の技術〕 従来、物質内部の結合エネルギ状態を測定するため
に、試験片を一定の昇温速度で加熱し、その時流れる熱
刺激電流を測定することが行われている。
[Related Art] Conventionally, in order to measure the binding energy state inside a substance, a test piece is heated at a constant heating rate, and a thermal stimulation current flowing at that time is measured.

第5図は従来の熱刺激電流測定装置の概略構成を示す
図である。
FIG. 5 is a diagram showing a schematic configuration of a conventional thermal stimulation current measuring device.

試験片105の上下面に、直径20mm程度の円板状にアル
ミニウムまたは銀等を真空蒸着するかまたは銀ペースト
を塗布した電極101,103を接触させる。次に温度コント
ローラ110によりヒータ109を駆動し、試験片105の温度
を軟化点付近まで上げ、一定温度に保ってからスイッチ
K1を入れ、電極101,103間に直流の高電圧、例えば0〜4
KVを印加して試験片を分極させる。次に電圧を印加した
まま液体窒素等でマイナス160℃位まで冷却した後、ス
イッチK1を切って、次にスイッチK2を入れ、高感度電流
計107に接続する。
Electrodes 101 and 103 on which aluminum or silver or the like is vacuum-deposited in a disk shape having a diameter of about 20 mm or silver paste is applied are brought into contact with the upper and lower surfaces of the test piece 105. Next, the heater 109 is driven by the temperature controller 110, and the temperature of the test piece 105 is raised to near the softening point.
Put K 1, high voltage direct current between the electrodes 101 and 103, for example, 0-4
The specimen is polarized by applying KV. Next, after cooling to about minus 160 ° C. with liquid nitrogen or the like while applying a voltage, the switch K 1 is turned off, and then the switch K 2 is turned on and connected to the high-sensitivity ammeter 107.

こうして試験片を一定の昇温速度で加熱し、この時流
れる熱刺激電流をレコーダ112で温度の関数として記録
する。この時試験片105は熱により分極の結合エネルギ
が開放され、第6図に示すようにある温度領域でピーク
を示す電流が観測される。
Thus, the test piece is heated at a constant heating rate, and the thermal stimulation current flowing at this time is recorded by the recorder 112 as a function of the temperature. At this time, the binding energy of polarization of the test piece 105 is released by heat, and a current showing a peak in a certain temperature region is observed as shown in FIG.

また、第7図に示すように、電極の一方を試験片から
分離し、熱刺激電流を測定する方法も提案されている。
Further, as shown in FIG. 7, a method has been proposed in which one of the electrodes is separated from the test piece and the heat stimulation current is measured.

〔発明が解決すべき課題〕[Problems to be solved by the invention]

しかしながら、第5図に示す熱刺激電流測定装置にお
いては、試験片に直接電極を接触させるため、例えば静
電潜像を形成した電荷保持媒体の熱刺激電流を測定しよ
うとすると、電荷保持媒体には表面に蓄積電荷が形成さ
れているため、これに電極が直接接触することになり、
電荷の蓄積状態が乱されてしまい正確な熱刺激電流を測
定することができない。
However, in the thermal stimulus current measuring device shown in FIG. 5, since the electrode is brought into direct contact with the test piece, if the thermal stimulus current of the charge storage medium on which an electrostatic latent image is formed is to be measured, for example, Has accumulated charge on the surface, and the electrode comes into direct contact with it,
The state of charge accumulation is disturbed, making it impossible to measure an accurate thermal stimulation current.

一方、第7図に示すような電極の一方を表面から離し
て測定しようとすると、測定する熱刺激電流が10-12Aオ
ーダーと極く微弱な値であるため、僅かな電極と試験片
との間隔の変化等が影響してしまい、これを常に一定に
保つことは極めて困難である。また、極く薄い試験片の
場合、加熱により変形を生じて同様に電極と試験片との
間隔が変化してしまうという問題があった。
On the other hand, if one of the electrodes as shown in FIG. 7 is to be measured away from the surface, the thermal stimulation current to be measured is a very weak value of the order of 10 -12 A. Changes in the distance between the two, and it is extremely difficult to keep this constant. Further, in the case of an extremely thin test piece, there is a problem that the deformation is caused by heating and the distance between the electrode and the test piece is similarly changed.

本発明は上記問題点を解決するためのもので、一方の
電極を試験片に対して非接触とし、かつ試験片と電極と
の間隔を常に一定に保つと共に、温度上昇を伴う試験片
の伸縮による変形を防止するようにして、正確に熱刺激
電流を測定することが可能な熱刺激電流測定方法および
装置を提供することを目的とする。
The present invention has been made to solve the above problems, and one of the electrodes is kept out of contact with the test piece, and the distance between the test piece and the electrode is always kept constant, and the expansion and contraction of the test piece accompanied by a temperature rise. It is an object of the present invention to provide a thermal stimulation current measuring method and apparatus capable of accurately measuring a thermal stimulation current while preventing deformation due to heat.

〔課題を解決するための手段〕[Means for solving the problem]

そのために本発明は、試験片を一方の電極上に載せ、
他方の電極を試験片と離して対向配置し、試験片を昇温
させながら電極間回路に流れる熱刺激電流を測定する方
法において、試験片と電極間の間隔を一定に保つと共
に、試験片の周辺部を押さえるスペーサを設けた熱刺激
電流測定方法、及び第1の環状中空リングと、該中空リ
ングの内径に外径がほぼ等しい第2の環状中空リングと
を嵌合させ、第1の中空リングおよび第2の中空リング
間にフィルム状試験片を挟持すると共に、第2の中空リ
ングの内径にほぼ等しい外径を有する第1の電極上に設
置してフィルム状試験片に接触させると共に、フィルム
状試験片に空隙を介して第2の電極を対向配置し、第1
の電極と第2の電極間に流れる熱刺激電流を測定する熱
刺激電流測装置を特徴としている。
For this purpose, the present invention puts a test piece on one electrode,
In the method of measuring the thermal stimulation current flowing in the interelectrode circuit while raising the temperature of the test piece while maintaining the distance between the test piece and the electrode constant, A method for measuring a heat stimulation current provided with a spacer for holding a peripheral portion, and a method in which a first annular hollow ring is fitted to a second annular hollow ring having an outer diameter substantially equal to the inner diameter of the hollow ring, and the first hollow A film-shaped test piece is sandwiched between the ring and the second hollow ring, and is placed on a first electrode having an outer diameter substantially equal to the inner diameter of the second hollow ring to be brought into contact with the film-shaped test piece, A second electrode is disposed opposite to the film-like test piece via a gap,
It is characterized by a thermal stimulation current measuring device for measuring a thermal stimulation current flowing between the first electrode and the second electrode.

〔作用〕[Action]

本発明は試験片と空隙を介して対向配置した電極と、
試験片との間に両者を固定するスペーサーを設け、ある
いは試験片がフィルム状である場合には、対向電極と試
験片との間隔を一定に保つと共にさらに試験片を互いに
嵌合する中空リング間にフィルムの周辺を挟持させて固
定し、さらに真空引きあるいは加圧により温度変化によ
るフィルム状試験片の変形を防止することにより、常に
正確に熱刺激電流を測定することが可能となる。
The present invention is an electrode disposed opposite to the test piece via a gap,
Provide a spacer between the test piece and the spacer, or if the test piece is in the form of a film, keep the distance between the counter electrode and the test piece constant, and furthermore, between the hollow rings where the test pieces fit together. By holding the periphery of the film and fixing it, and preventing deformation of the film-like test piece due to temperature change by evacuation or pressurization, it is possible to always accurately measure the thermal stimulation current.

〔実施例〕〔Example〕

以下、実施例を図面を参照して説明する。 Hereinafter, embodiments will be described with reference to the drawings.

第1図は本発明の一実施例を示す図で、図中100は測
定室、101,103は電極、105は電荷保持媒体、107は高感
度電流計、109はヒータ、111はスペーサである。
FIG. 1 is a view showing an embodiment of the present invention, in which 100 is a measurement chamber, 101 and 103 are electrodes, 105 is a charge holding medium, 107 is a high-sensitivity ammeter, 109 is a heater, and 111 is a spacer.

測定室100は図示しない温度コントローラで駆動され
るヒータ109により加熱可能になっている。電極103はリ
ング状で、この上に電荷保持媒体105が載置されてい
る。電極101は電荷保持媒体105に対して一定の間隙を設
けて対向配置されている。スペーサ111は中空リング状
となっており、電極101とネジで嵌合するかあるいは固
定されると共に、試験片の周辺を押さえるようにして電
極と試験片との間隔が一定になるようにしている。この
スペーサの材料としてはPTEP等の絶縁材料を使用すると
よい。
The measurement chamber 100 can be heated by a heater 109 driven by a temperature controller (not shown). The electrode 103 has a ring shape, and the charge holding medium 105 is placed thereon. The electrode 101 is opposed to the charge holding medium 105 with a certain gap. The spacer 111 has a hollow ring shape and is fitted or fixed to the electrode 101 with a screw, and presses the periphery of the test piece so that the distance between the electrode and the test piece is constant. . As a material for the spacer, an insulating material such as PTEP may be used.

このような構成において、予め表面あるいは内部に電
荷が蓄積された電荷保持媒体105を電極103とスペーサ11
1により押さえた状態で、ヒータ109により昇温させなが
ら、熱刺激電流を測定する。電荷保持媒体105は数百ボ
ルトの電圧印加状態で電荷蓄積が行われており、その蓄
積エネルギがある温度状態において解放され、その時の
電流が電流計107により検出される。
In such a configuration, the electric charge holding medium 105 in which electric charges are accumulated on the surface or in
While being pressed by 1, the heat stimulation current is measured while the temperature is raised by the heater 109. The charge storage medium 105 stores charges under a voltage applied state of several hundred volts. The stored energy is released in a certain temperature state, and the current at that time is detected by the ammeter 107.

この場合、スペーサ111を電極101と固定状態としてお
くことにより、常に電極と電荷保持媒体との間隔を一定
に保つことが可能となり、距離の変化に伴う測定誤差を
除くことができる。
In this case, by keeping the spacer 111 in a fixed state with the electrode 101, the distance between the electrode and the charge holding medium can be kept constant, and a measurement error due to a change in distance can be eliminated.

第2図は本発明の他の実施例を示す図で、第1図と同
一番号は同一内容を示している。
FIG. 2 is a diagram showing another embodiment of the present invention, and the same numbers as those in FIG. 1 indicate the same contents.

本実施例は電荷保持媒体がフィルム状のものである場
合であり、中空のリング115と113とでフィルム状電荷保
持媒体105を挟持して固定するようにしている。即ち、
中空リング113の外径は中空リング115の内径にほぼ等し
く、両者間にフィルムを挟んで嵌合させることによりフ
ィルムを固定する。さらに中空リング113をその内径に
ほぼ等しい外径を有する電極103上に設置し、その面が
フィルム105に接触する状態に固定する。こうしておい
て、フィルムに対向させて電極101を対向設置する。も
ちろんこの場合、電極101とフィルム間とは、例えば第
1図に示すような方法により間隔を固定するようにする
が、これについては図示を省略している。
In this embodiment, the charge holding medium is in the form of a film, and the film-like charge holding medium 105 is sandwiched and fixed between the hollow rings 115 and 113. That is,
The outer diameter of the hollow ring 113 is substantially equal to the inner diameter of the hollow ring 115, and the film is fixed by sandwiching and fitting the film between the two. Further, the hollow ring 113 is placed on the electrode 103 having an outer diameter substantially equal to the inner diameter of the hollow ring 113, and is fixed so that its surface is in contact with the film 105. In this way, the electrode 101 is opposed to the film. Of course, in this case, the distance between the electrode 101 and the film is fixed by, for example, a method as shown in FIG. 1, but this is not shown.

このようにフィルム状電荷保持媒体を固定した状態で
同様にヒータ109で一定の昇温速度で加熱することによ
り熱刺激電流を測定する。なお、加熱の過程において、
フィルム105は温度の影響により伸縮する可能性があ
り、そのため電極上のフィルム片が波打つて電極101と
の間隔が変化する可能性がある。その場合には第3図に
示すように、電極103に貫通孔121を設け、これを通して
ポンプ123により真空引きにすることにより、フィルム
状電荷保持媒体105の変形を防ぐことができる。もちろ
ん真空引きにするための貫通孔121は1つでなく、複数
設けてもよく、あるいは環状にしてしもよい。
In this manner, the heat stimulation current is measured by heating the film-like charge holding medium at a constant temperature rising rate by the heater 109 in the same manner. In the process of heating,
The film 105 may expand and contract under the influence of temperature, and therefore, a film piece on the electrode may undulate, and the distance between the film and the electrode 101 may change. In this case, as shown in FIG. 3, the through-hole 121 is provided in the electrode 103, and a vacuum is drawn by the pump 123 through the through-hole 121, whereby the deformation of the film-like charge holding medium 105 can be prevented. Needless to say, the number of the through holes 121 for evacuating is not one, and a plurality of through holes 121 may be provided, or an annular shape may be provided.

また、第4図に示すように測定室100内にポンプ127に
より加圧エアを導入し、内部を加圧状態としてフィルム
状電荷保持媒体105の変形を防ぐようにしてもよい。
In addition, as shown in FIG. 4, pressurized air may be introduced into the measurement chamber 100 by a pump 127 so that the inside of the measurement chamber 100 is pressurized to prevent deformation of the film-shaped charge holding medium 105.

〔発明の効果〕〔The invention's effect〕

以上のように本発明によれば、極めて微弱な電流を測
定する熱刺激電流測定において、試験片と電極との間隔
を一定に保つと共に、かつ試験片の変形を防止すること
ができるので、極めて高精度な熱刺激電流の測定を行う
ことが可能となる。
As described above, according to the present invention, in the thermal stimulation current measurement for measuring a very weak current, the distance between the test piece and the electrode can be kept constant, and the deformation of the test piece can be prevented. It is possible to measure the heat stimulation current with high accuracy.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明の一実施例を示す図、第2図は本発明の
他の実施例を示す図、第3図は第2図において真空引き
した例を示す図、第4図は第2図において加圧した例を
示す図、第5図は従来の熱刺激電流測定装置の概略構成
を示す図、第6図は熱刺激電流の測定例を示す図、第7
図は試験片から電極の一方を分離した従来の例を示す図
である。 100……測定室、101,103……電極、105……電荷保持媒
体、107……高感度電流計、109……ヒータ、111……ス
ペーサ。
FIG. 1 is a view showing one embodiment of the present invention, FIG. 2 is a view showing another embodiment of the present invention, FIG. 3 is a view showing an example in which vacuum is drawn in FIG. 2, and FIG. FIG. 2 is a diagram showing an example of pressurization, FIG. 5 is a diagram showing a schematic configuration of a conventional thermal stimulation current measuring device, FIG. 6 is a diagram showing an example of measuring a thermal stimulation current, and FIG.
The figure shows a conventional example in which one of the electrodes is separated from the test piece. 100: measuring chamber, 101, 103: electrodes, 105: charge holding medium, 107: high-sensitivity ammeter, 109: heater, 111: spacer.

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】試験片を一方の電極上に載せ、他方の電極
を試験片と離して対向配置し、試験片を昇温させながら
電極間に流れる熱刺激電流を測定する方法において、試
験片と電極間の間隔を一定に保つと共に、試験片の周辺
部を押さえるスペーサを設けたことを特徴とする熱刺激
電流測定方法。
1. A method for measuring a thermal stimulation current flowing between electrodes while placing a test piece on one electrode and disposing the other electrode at a distance from the test piece and increasing the temperature of the test piece. A method for measuring a heat stimulation current, comprising: maintaining a constant distance between the electrode and the electrode; and providing a spacer for pressing a peripheral portion of the test piece.
【請求項2】第1の環状中空リングと、該中空リングの
内径に外径がほぼ等しい第2の環状中空リングとを嵌合
させ、第1の中空リングおよび第2の中空リング間にフ
ィルム状試験片を挟持すると共に、第2の中空リングの
内径にほぼ等しい外径を有する第1の電極上に設置して
フィルム状試験片に接触させると共に、フィルム状試験
片に空隙を介して第2の電極を対向配置し、第1の電極
と第2の電極間回路に流れる熱刺激電流を測定すること
を特徴とする熱刺激電流測装置。
2. A first annular hollow ring and a second annular hollow ring having an outer diameter substantially equal to the inner diameter of the hollow ring are fitted to each other, and a film is interposed between the first hollow ring and the second hollow ring. While holding the film-shaped test piece, it is placed on a first electrode having an outer diameter substantially equal to the inner diameter of the second hollow ring, and is brought into contact with the film-shaped test piece. A thermal stimulus current measuring device comprising two electrodes arranged opposite to each other and measuring a thermal stimulus current flowing through a circuit between the first electrode and the second electrode.
【請求項3】第1の電極に少なくとも1つ以上の貫通孔
を設け、該貫通孔を通して真空引きしたことを特徴とす
る請求項2記載の測定装置。
3. The measuring device according to claim 2, wherein at least one or more through-holes are provided in the first electrode, and a vacuum is drawn through the through-holes.
【請求項4】フィルム状試験片が存在する空間部分を加
圧状態とし、フィルム状試験片を第1の電極面に押圧す
ることを特徴とする請求項2記載の測定装置。
4. The measuring apparatus according to claim 2, wherein the space where the film-shaped test piece exists is pressurized, and the film-shaped test piece is pressed against the first electrode surface.
JP6546789A 1989-03-17 1989-03-17 Thermal stimulation current measurement method and device Expired - Fee Related JP2744631B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6546789A JP2744631B2 (en) 1989-03-17 1989-03-17 Thermal stimulation current measurement method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6546789A JP2744631B2 (en) 1989-03-17 1989-03-17 Thermal stimulation current measurement method and device

Publications (2)

Publication Number Publication Date
JPH02245645A JPH02245645A (en) 1990-10-01
JP2744631B2 true JP2744631B2 (en) 1998-04-28

Family

ID=13287953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6546789A Expired - Fee Related JP2744631B2 (en) 1989-03-17 1989-03-17 Thermal stimulation current measurement method and device

Country Status (1)

Country Link
JP (1) JP2744631B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69425184T2 (en) * 1993-04-26 2001-03-22 Dai Nippon Printing Co., Ltd. Photoelectric sensor, recording system, and method for data recording and reprography
CN104237288B (en) * 2014-09-29 2016-09-28 国家电网公司 Transformer insulated thermal aging test method and device based on circular current heating
CN108760818B (en) * 2018-05-18 2020-09-11 哈尔滨理工大学 Novel thermal stimulation current measuring device

Also Published As

Publication number Publication date
JPH02245645A (en) 1990-10-01

Similar Documents

Publication Publication Date Title
US4262532A (en) Pressure and temperature sensor
SE8106102L (en) RESISTANSMETARE
EP0244326A3 (en) Method for detecting and/or identifying a biological substance in a liquid medium with the aid of electrical measurements, and apparatus for carrying out this method
JP2744631B2 (en) Thermal stimulation current measurement method and device
US3652932A (en) Method and apparatus for measurement of surface charge of an electret
US3544889A (en) Method and apparatus for measuring the electrostatic properties of plastic materials including means for rotating the materials past a charging electrode and a measurement probe
US3234462A (en) Polymeric testing by dipole orientation
US2694128A (en) Conductive device with variable electric resistance
US3787764A (en) Solid dielectric capacitance gauge for measuring fluid pressure having temperature compensation and guard electrode
GB2217017A (en) Detector for use in the capacitative measurement of pressure in gases
US2834202A (en) Apparatus for measuring hardness
CA1107533A (en) Apparatus for measuring temperature
Gilchrist et al. Rapid low-temperature dielectric studies
US3496461A (en) Method of measuring the volume resistivity of thin,solid dielectric material utilizing the decay rates of a number of measured decay intervals
JP2591570B2 (en) Thermal analysis method and apparatus using temperature wave
GB1585549A (en) Temperature and stress compensated sensing apparatus
McGhie et al. Thermally stimulated conductivity of poly (vinyl fluoride)
US3217537A (en) Method and apparatus for determining specific heat
CN108051476B (en) Independent type 3 omega thermophysical property measuring device and method based on sapphire substrate
US3317822A (en) Method and apparatus for measurement of high voltage
US3203228A (en) Melt indicating method and apparatus
Freedman et al. An Apparatus for the Study of Electrets
JPH08122385A (en) Space charge measuring apparatus
US4365161A (en) Detector for responding to a two-dimensional pattern of X-radiation
JPS56104076A (en) Evaluation method for color-development property of thermal recording body

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees