JP2679399B2 - Beam shape measuring device for color cathode ray tube - Google Patents
Beam shape measuring device for color cathode ray tubeInfo
- Publication number
- JP2679399B2 JP2679399B2 JP2307698A JP30769890A JP2679399B2 JP 2679399 B2 JP2679399 B2 JP 2679399B2 JP 2307698 A JP2307698 A JP 2307698A JP 30769890 A JP30769890 A JP 30769890A JP 2679399 B2 JP2679399 B2 JP 2679399B2
- Authority
- JP
- Japan
- Prior art keywords
- beam spot
- ray tube
- cathode ray
- color cathode
- beam shape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、カラーブラウン管の電子ビーム形状の測定
装置に関し、特に電流密度分布を測定する装置に関す
る。The present invention relates to an apparatus for measuring the electron beam shape of a color cathode ray tube, and more particularly to an apparatus for measuring current density distribution.
従来、この種のカラーブラウン管のビーム形状測定装
置は、ビームスポットをカラーブラウン管に映出させる
手段として、ラスタースキャン方法を用いて行なってい
た。また、シャドウマスク型ブラウン管においては、電
子ビームが第3図に示すように、シャドウマスクにより
一部遮蔽されるので、測定データは、シャドウマスクの
ない部分についてのみ、第3図の従来方法測定データ28
のように得る事ができる。これではデータの1/2ほどが
欠落した形となり、真のビーム形状は把握できない。こ
のため、ビームスポットの電流密度分布、ひいては輝度
分布がガウス分布であるとして計算によりビーム形状を
求めていた。Conventionally, this type of color cathode ray tube beam shape measuring apparatus has used a raster scan method as means for projecting a beam spot on the color cathode ray tube. Further, in the shadow mask type cathode ray tube, the electron beam is partly blocked by the shadow mask as shown in FIG. 3, so that the measurement data is only measured in the conventional method measurement data of FIG. 28
You can get it like. With this, about half of the data is missing, and the true beam shape cannot be grasped. For this reason, the beam shape has been calculated by assuming that the current density distribution of the beam spot, and thus the luminance distribution, is a Gaussian distribution.
〔発明が解決しようとする課題〕 上述した従来のビーム形状測定装置は、電子ビームが
スクリーンに到達する前に、シャドウマスクに当たり、
第4図に示すように、ビーム全体をスクリーンに映出す
ることはできない。この対策として、ガウス分布により
近似計算しているが、ビームの形状はガウスカーブに全
て乗るものではない。このため真の測定はモノクローム
ブラウン管のように、シャドウマスクのないブラウン管
でしかできないという欠点がある。[Problems to be solved by the invention] The above-described conventional beam shape measuring apparatus hits the shadow mask before the electron beam reaches the screen,
As shown in FIG. 4, the entire beam cannot be projected on the screen. As a measure against this, approximate calculation is performed using a Gaussian distribution, but the shape of the beam does not fit on a Gaussian curve. For this reason, there is a drawback that true measurement can be performed only with a cathode ray tube without a shadow mask, such as a monochrome cathode ray tube.
また、ビームスポットを映出しているものの、のこぎ
り波偏向電流でカラーブラウン管上をビームが走査して
いたため、真のビームスポットを映出できず、必ず水平
方向にある幅を持ったビームスポットとなってしまう。
このビームの形状を測定しているため、真のビームスポ
ットとは言えず測定誤差の要因となっている。Also, although the beam spot is projected, the beam scans the color CRT with the sawtooth wave deflection current, so the true beam spot cannot be projected, and the beam spot always has a certain width in the horizontal direction. Will end up.
Since the shape of this beam is measured, it cannot be called a true beam spot and causes a measurement error.
本発明によれば、被測定カラーブラウン管のスクリー
ン面に、単色のビームスポットを直流偏向電源により映
出させる手段と、スクリーン面の縦および横方向に一定
のピッチでビームスポットを移動させる手段と、このビ
ームスポットを撮像し、輝度を測定し、メモリに記憶さ
せ、ビーム形状を出力する手段とを有することを特徴と
するカラーブラウン管のビーム形状測定装置が得られ
る。According to the present invention, a means for projecting a monochromatic beam spot on the screen surface of the color cathode-ray tube to be measured by a DC deflection power source, and means for moving the beam spot at a constant pitch in the vertical and horizontal directions of the screen surface, There is provided a beam shape measuring device for a color cathode ray tube, which is provided with a means for imaging the beam spot, measuring the luminance, storing it in a memory, and outputting the beam shape.
次に、本発明について図面を参照して説明する。第1
図は本発明の一実施例のブロック図である。被測定カラ
ーブラウン管1はビームスポット測定時、偏向ヨーク8
に偏向電源切換器21により直流水平電源17と直流垂直電
源19が接続され直流偏向される。また、信号発生器7お
よびCRT試験器6によりスクリーン面上の1点のみが単
色で発光するようにカラーブラウン管1の各電極に電圧
を印加する。一方、カラーブラウン管1に向きあって固
定されたCCDカメラ2はスクリーンに映出されたビーム
スポットをレンズ部3を通して、例えば100倍に拡大し
て撮像する。検出されたデータは例えば水平方向50列、
垂直方向20行のマトリクスとして取り込まれ、あらかじ
め設定されたマトリクス内のデータ取込領域内の総和を
求める。これはノイズを軽減させるため、CCDカメラ2
の1画素のみのデータではなく、複数の画素のデータを
参照するようにしている。但し、データ取込領域はビー
ムスポットの直径に対し、1/10以下と十分小さくしない
と誤差の要因となる。例えばビームスポットの直径が0.
6mmの時、取込領域は60μm以下にしなければならな
い。第4図においてビームスポット29に対し、発光ドッ
ト30よりもさらに小さい第5図のデータ取込領域31を設
定している。Next, the present invention will be described with reference to the drawings. First
The figure is a block diagram of one embodiment of the present invention. The color cathode-ray tube 1 to be measured has a deflection yoke 8 when measuring the beam spot.
Further, a DC horizontal power supply 17 and a DC vertical power supply 19 are connected by a deflection power supply switching device 21 and DC is deflected. Further, a voltage is applied to each electrode of the color CRT 1 by the signal generator 7 and the CRT tester 6 so that only one point on the screen surface emits a single color. On the other hand, the CCD camera 2 fixed to the color cathode-ray tube 1 fixes the beam spot projected on the screen through the lens unit 3 and magnifies the beam spot 100 times, for example. The detected data is, for example, 50 columns in the horizontal direction,
It is acquired as a matrix of 20 rows in the vertical direction, and the sum within the data acquisition area in the preset matrix is calculated. This is to reduce noise, so CCD camera 2
The data of a plurality of pixels is referred to instead of the data of only one pixel. However, if the data acquisition area is not sufficiently smaller than 1/10 of the diameter of the beam spot, it will cause an error. For example, the diameter of the beam spot is 0.
At 6 mm, the capture area must be less than 60 μm. In FIG. 4, the data capture area 31 of FIG. 5 is set for the beam spot 29, which is smaller than the emission dot 30.
次に第1図において、直流水平電源17を決められたス
テップ数、例えば1mAだけ増加させ、再度測定を行な
う。水平方向を規定の回数、例えば50回測定を終了した
ら、次に直流垂直電源19を決められたステップ数、例え
ば0.1mAだけ増加させ、再度測定を行ない、輝度データ
をイメージメモリ14に記憶させる。これを繰返しビーム
スポットの移動および測定を行ない、例えば水平方向50
回、垂直方向50回を測定することより、2500点の輝度デ
ータが得られる。Next, in FIG. 1, the DC horizontal power supply 17 is increased by a predetermined number of steps, for example, 1 mA, and the measurement is performed again. When the measurement in the horizontal direction is completed a predetermined number of times, for example 50 times, the DC vertical power supply 19 is increased by a predetermined number of steps, for example, 0.1 mA, the measurement is performed again, and the brightness data is stored in the image memory 14. Repeating this, the beam spot is moved and measured, for example, in the horizontal direction 50
The luminance data of 2500 points can be obtained by measuring the number of times and 50 times in the vertical direction.
この様子を示したのが第2図であり、シャドーマスク
23で遮蔽されていない部分に撮像系24を設置し、ビーム
スポット22を22a〜22mのように所定のピッチで順次移動
させることにより、撮像系24にビームスポットが近づく
に従い、輝度は増大し、中心部を過ぎて遠ざかるに従い
次第に輝度は減少する。その結果、本方法測定データ25
が得られ、これを水平、垂直の両方向で行るうことによ
り3次元のデータ曲線が得られる。こうして1つのカソ
ード例えば赤のカソードの測定が終了したら次に緑およ
び青のカソードの測定を同様に行なう。This is shown in FIG. 2, which is a shadow mask.
The imaging system 24 is installed in a portion not shielded by 23, and the beam spot 22 is sequentially moved at a predetermined pitch like 22a to 22m, so that the brightness increases as the beam spot approaches the imaging system 24, The brightness gradually decreases as it goes away from the center. As a result, this method measurement data 25
Is obtained, and a three-dimensional data curve is obtained by performing this in both horizontal and vertical directions. When the measurement of one cathode, for example, the red cathode is completed, the measurement of the green and blue cathodes is then performed in the same manner.
以上説明したように本発明によれば、ビームスポット
を走査していないので、カラーブラウン管のスクリーン
には真のビームスポットを映出でき、これを測定するこ
とができる。また、シャドーマスクのないカラーブラウ
ン管はもちろん、シャドーマスクがありビームスポット
を一部遮蔽している場合でも、近似カーブによる誤差を
含まない真のビーム形状を正確に測定することができ
る。As described above, according to the present invention, since the beam spot is not scanned, the true beam spot can be projected on the screen of the color cathode ray tube and can be measured. In addition to a color CRT without a shadow mask, even when a shadow mask is provided and a part of the beam spot is shielded, the true beam shape that does not include an error due to the approximate curve can be accurately measured.
第1図は本発明の一実施例のブロック図、第2図は本発
明による測定方法を説明する図、第3図は従来の測定方
法を説明する図、第4図は蛍光体とビームスポットの直
径を示す図、第5図は蛍光体と測定領域を示す図であ
る。 1……被測定カラーブラウン管、2……CCDカメラ、3
……レンズ部、4……カメラモニタ、5……パソコン、
6……CRT試験器、7……信号発生器、8……偏向ヨー
ク、9……出力モニタ、10……X・Yステージ、11……
X軸モーター、12……Y軸モーター、13……パルスモー
ターコントローラー、14……イメージメモリ、15……通
信コントローラー、16……IOコントローラー、17……直
流水平電源、18……水平偏向電源、19……直流垂直電
源、20……垂直偏向電源、21……偏向電源切換器、22…
…ビームスポット、23……シャドウマスク、24……撮像
系、25……本方法測定データ、26……ビームスポット、
27……撮像系、28……従来方法測定データ、29……ビー
ムスポット、30……発光ドット、31……データ取込領
域、32……非発光ドット。FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a diagram illustrating a measuring method according to the present invention, FIG. 3 is a diagram illustrating a conventional measuring method, and FIG. 4 is a phosphor and a beam spot. Fig. 5 is a diagram showing the diameter of Fig. 5, and Fig. 5 is a diagram showing the phosphor and the measurement region. 1 ... Color cathode ray tube to be measured, 2 ... CCD camera, 3
…… Lens section, 4 …… Camera monitor, 5 …… Computer,
6 ... CRT tester, 7 ... signal generator, 8 ... deflection yoke, 9 ... output monitor, 10 ... XY stage, 11 ...
X-axis motor, 12 …… Y-axis motor, 13 …… Pulse motor controller, 14 …… Image memory, 15 …… Communication controller, 16 …… IO controller, 17 …… DC horizontal power supply, 18 …… Horizontal deflection power supply, 19 ... DC vertical power supply, 20 ... vertical deflection power supply, 21 ... deflection power supply switching device, 22 ...
… Beam spot, 23 …… Shadow mask, 24 …… Imaging system, 25 …… Measuring data of this method, 26 …… Beam spot,
27 …… Imaging system, 28 …… Conventional method measurement data, 29 …… Beam spot, 30 …… Emitting dot, 31 …… Data acquisition area, 32 …… Non-emitting dot.
Claims (1)
に、単色のビームスポットを直流偏向電源による映出す
る手段と、スクリーン面の縦および横方向に一定のピッ
チでビームスポットを移動させる手段と、このビームス
ポットを撮像し、輝度を測定し、メモリに記憶させ、ビ
ーム形状を出力する手段とを具備し、前記ビームスポッ
トを移動させる手段は前記直流偏向電源を決められたス
テップ数だけ変化させ、それによりビームスポットを所
定ピッチで順次移動させることを特徴とするカラーブラ
ウン管のビーム形状測定装置。1. A means for projecting a monochromatic beam spot on a screen surface of a color cathode ray tube to be measured by a direct current deflection power source, and a means for moving the beam spot at a constant pitch in the vertical and horizontal directions of the screen surface. Means for imaging the beam spot, measuring the brightness, storing it in a memory and outputting the beam shape, the means for moving the beam spot changing the DC deflection power supply by a predetermined number of steps, A beam shape measuring device for a color cathode ray tube, wherein the beam spot is sequentially moved at a predetermined pitch by means of.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2307698A JP2679399B2 (en) | 1990-11-14 | 1990-11-14 | Beam shape measuring device for color cathode ray tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2307698A JP2679399B2 (en) | 1990-11-14 | 1990-11-14 | Beam shape measuring device for color cathode ray tube |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04181631A JPH04181631A (en) | 1992-06-29 |
JP2679399B2 true JP2679399B2 (en) | 1997-11-19 |
Family
ID=17972155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2307698A Expired - Lifetime JP2679399B2 (en) | 1990-11-14 | 1990-11-14 | Beam shape measuring device for color cathode ray tube |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2679399B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3091529B2 (en) * | 1991-07-24 | 2000-09-25 | 三菱電機株式会社 | Beam spot emission distribution measuring apparatus and method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0646543B2 (en) * | 1985-05-31 | 1994-06-15 | ソニー株式会社 | How to measure the convergence of a picture tube |
JPS63308844A (en) * | 1987-06-11 | 1988-12-16 | Matsushita Electric Ind Co Ltd | Image evaluator |
-
1990
- 1990-11-14 JP JP2307698A patent/JP2679399B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH04181631A (en) | 1992-06-29 |
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