JP2614110B2 - Magnetic disk defect inspection method - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetic disk defect inspection system, and more particularly, to inspecting a hard magnetic disk (hereinafter, HD medium) and storing defect inspection data on a flexible disk (hereinafter, FD). The present invention relates to a magnetic disk defect inspection method for a defect inspection apparatus for an HD medium which stores defect information, without having to store defect inspection data using many FDs even if the capacity of the target HD medium is large.

[Related Art] In a defect inspection of an HD medium, a test signal (or a test code) is written to each track, and is read from each track to perform a defect inspection. In this case, the signals read out include signals that are larger or smaller than the standard level. These signals are compared with a certain threshold and a large signal waveform group is regarded as a positive (Pe) error, and a small signal waveform group as compared with another certain threshold is regarded as a negative (Ne) error. Inspection is performed in which missing data is determined as a missing error. In addition, a source error detected by reading from an HD medium on which recording has been erased (erased) is defined as an extra error.

These various errors include errors due to intrinsic defects (medium defects) of the HD media itself, and errors due to media other than the attached dust. Therefore, errors due to defects other than HD media are excluded. Only defects are used as data. Therefore, reading is performed a plurality of times (retrying), and if the number of appearances is small, dust or the like causing an error is not re-detected due to movement and divergence due to the retry, or is detected by invading the track from the middle. Are excluded from the data as data, and those detected more than a certain number of times
A method of determining a medium defect has been adopted.

The HD medium is evaluated on the basis of the error data detected in this way, and is identified as a collect error (error that can be corrected by 1 bit) or an uncorrect error, and an exchange sector or an exchange track is allocated. The quality is improved by feeding back the evaluation defects to the process.

[Problem to be Solved] As a conventional defect inspection technique of this kind, collected error data is stored in an FD. The error data is stored in the FD only when the defect is detected when the defect is detected.Therefore, the storage capacity required for the HD medium to be inspected is not required. Because it can be carried anywhere, the FD collects the defect inspection data and feeds it back to the disk manufacturing process, and the data processing and analysis processing is performed by another device or separately.

However, in recent years, the recording density of HD media has been improved, and it has been shifting from megabytes to gigabytes. When a high-density HD medium of the order of gigabytes is inspected, if a single HD medium is inspected using a conventional defect inspection apparatus, the number of FDs storing defect inspection data is more than ten to several tens. The efficiency of the evaluation process is low, and the handling is troublesome.

In order to avoid such a situation, it is conceivable to change the storage device from a flexible disk device (hereinafter referred to as an FD device) to a hard magnetic disk device (hereinafter referred to as an HD device). If it is recorded and managed in the device, it is necessary to develop the program separately, and the program must be individually loaded and processed according to the capacity of the HD medium to be tested.

The present invention solves such a problem of the conventional technology, and the processing program of the conventional FD can be used even if the HD medium to be inspected has a high density of giga order,
An object of the present invention is to provide a magnetic disk defect inspection method that does not require the use of a large number of FDs for storing error data.

[Means for Solving the Problems] A configuration of a magnetic disk defect inspection system according to the present invention for achieving such an object includes a hard magnetic disk device, and includes a head number, a track number, and a side number of a flexible disk. When the value of each variable is determined, the logical sector number is converted into an inversely convertible logical sector number corresponding to one-to-one correspondence with a linear function having each of the variables as a linear function. Further, the hard disk drive is required to convert the physical address into a physical address that can be inversely converted on a one-to-one basis and store defect inspection data of the hard magnetic disk in a flexible disk that is stored in the hard magnetic disk device. The physical address is a linear function with each variable constituting the physical address as a variable, and one When other variables except for are determined, the remaining one variable value is determined on a one-to-one basis, and each value is converted into a unique logical sector number, and this logical sector number is further converted to a hard magnetic disk. The data is converted into the physical address of the device and the defect inspection data of the hard magnetic disk is stored in the hard magnetic disk device.

[Operation] As described above, the defect inspection data of the HD medium is managed as the recording data of the physical address of the FD, and is stored in the FD.
Since the logical sector is converted into a logical sector in a one-to-one linear relationship, and the logical sector is further associated with the storage address of the HD device on a one-to-one basis, defect inspection data is stored in the HD device. Can be handled as an FD device, and a program to be recorded on a conventional FD device can be used as it is.

As a result, even if the capacity of the HD medium to be inspected becomes large, the defect data can be stored and managed as FD recording data in the HD device, and can be taken out and processed as FD data at any time by reverse conversion. Therefore, the number of FDs storing the defect inspection data does not need to be more than ten, the handling is easy, and there is no need to develop a special program for recording and managing the defect inspection data in the HD.

Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram of an HD medium defect inspection apparatus according to an embodiment to which a magnetic disk defect inspection method according to the present invention is applied, and FIG. 2 is a diagram showing a logical sector conversion function and a logical sector of a HD sector address. It is explanatory drawing which shows the relationship to convert as a table.

In FIG. 1, reference numeral 10 denotes a hard magnetic disk drive (hereinafter referred to as an HD drive) for driving an HD medium on which an HD medium to be inspected is mounted. , A magnetic head 3, a read circuit 4, and the like. The head access mechanism and the like are not shown.

Here, a test signal (or a test code, hereinafter the same) is first applied to each track of the HD medium 1 to be inspected mounted on the HD drive device 10 by the magnetic head 3 for each track (for each sector of the track). Written, then HD drive
Test signals are read from the ten HD media 1, and the read test signals are adjusted to an appropriate level by the read circuit 4 and input to the defect detection circuit 5.

The defect detection circuit 5 includes an error type identification circuit 6 and a sector /
A signal from the readout circuit 4 is input to an error type identification circuit 6 to detect an error, identify an error type, and output an error detection signal for each type. Occur.
Note that such error identification and detection processing is a conventionally performed method. The type of error may be checked by designating the type of error or by providing each detection circuit in parallel, and can be processed inside the defect detection circuit 5. Processing is independent of the type of error. Further, since the situation is the same for retries, the relationship between the type of error and the retry will be omitted below for convenience of explanation.

When an error is detected, the byte / count address of the sector is sent from the sector / byte counter 7 to the error memory 8 and stored. The sector / byte counter 7 counts sector marks provided between the test signals sequentially read out,
To update the sector number stored in the error memory 8. As a result, the sector number and the byte position where the error has occurred are stored in the error memory 8, and when the sector number is updated, the previous sector number and the byte position where the error has occurred are stored in the error data (defective data). examination data)
Is sent to the defect data processing device 11, and then the stored data (error data) at the byte position where the error has occurred is cleared.

The defect data processing device 11 converts the error data into an FD device number, a head number, a track number, a side number,
Management is performed according to the sector number. The defect data processing device 11 has a microprocessor 12, a memory 13, and a disk control interface 14 connected to each other via a bus 15, and further has an HD device 16 and an FD device 17 via a disk control interface 14. Are connected to the bus 15.

Memory 13 has FD physical address / logical sector conversion function
13a and logical sector / HD physical address conversion program
13b, an error data FD writing processing program 13c, an error data HD writing processing program 13d, an FD physical address return processing program 13e, an HD medium evaluation processing program 13f, and the like.

Using these processing programs and functions, the defect data processing device 11 converts error data collected for the FD into physical addresses corresponding to the physical addresses of the FD into physical addresses of the HD medium without breaking the system, and performs error data processing. Is stored in the HD device.

Next, the operation will be described. First, according to the error data FD writing processing program 13c, the HD medium 1
For each track, a device number, a head number, a track number, a side number, and a sector number are generated as physical addresses of an FD device to be recorded in correspondence with error data obtained from the error detection circuit 5 in logical sector units. I do. This is generated according to a data format as shown in FIG. 2A, assuming that the FD to be recorded is 2DD.

In (a) of the figure, in the R / W column 21, information indicating the type of reader / write is stored as a flag, and in the FD device number column 22, the number of devices on which error data can be recorded ( Alternatively, the number is recorded, for example, about 0 to 23. The side column 23 is a column for storing information on the side of the FD to be recorded, and is either side 0 or side 1.
The track column 24 specifies a track to be recorded on the FD or read from the FD, and is 0 to 76. The sector field 25 is recorded on the FD. Alternatively, a sector to be read from the FD is designated, and is 0 to 26. Logical sector number field
26 is a column for recording the inspected logical sector of the HD to be inspected. The error data column 27 is a column for sequentially recording byte positions where an error has actually occurred.

When the error data FD writing processing program 13c generates such data, next, the generated head number and
Track number, side number and sector number as variables
The logical sector number R is obtained by the following function. In this case, the device number (or FD number) is “0”.

When the track number is "0", the side is front (side 0)
In the case of R = (sector number + 1) / 2−1... When the track number is “0” and the side is back (side 1)
R = sector number + 12 ... When the track number is other than "0", R = (track number-1) * 52 + side number * 26 + sector number + 38 ... head number, track number, side number This is an example in which each value of a variable and a logical sector number R are associated with each other in a one-to-one correspondence with a linear function having a sector number as a variable, and converted into a logical sector number R.
This is one specific example of the logical sector conversion function 13. This function can be different from the above depending on the storage capacity of the FD device (one FD) that stores the error data. Note that the function is such that the logical sector number R and each variable value correspond to each other, and when each variable value is determined, one logical sector number R is determined, and when one logical sector number R is determined, each logical sector number R is determined. The variable values are managed in an inverse-transformable relationship to be determined.
FIG. 2 (b) shows this correspondence as a table. Note that the formula is provided according to JIS because the outermost side 0 of the 2DD FD has a single density.

In this way, the head number, the track number, the side number, and the sector number are converted into the logical sector number R corresponding to each variable value. And about the device number (FD number)
In accordance with the device number (FD number), the capacity corresponding to the total number of logical sectors for one FD, for example, the last numerical value 39 shown in FIG.
The FD logical sector number R of another device number (FD number) is calculated by the following equation by adding +1 to 90 and 3991 × the device number, so that the logical sector number R does not overlap in each device.

Logical sector R = logical sector R of device number zero + device number × 3991... Here, it is assumed that the device numbers of the FDs are sequentially numbered sequentially from zero.

In this way, the error data developed in the plurality of FD devices or the plurality of FDs is converted into different logical sector numbers R corresponding to the physical addresses of the FD.

Next, the logical sector number R is obtained according to the logical sector / HD physical address conversion processing program 13b to obtain an HD logical address, further converted into an HD physical address, and stored in the HD device 16. The conversion process is based on the following equation.

RT = R / 32 quotient HS = R / 32−HR where 32 is the number of physical sectors of one HD track, RT is the logical track number of HD, and HS is the physical sector number of HD. And corresponds to the remainder obtained by dividing the logical sector number R by 32. A table showing the reverse conversion correspondence between the logical sector and the HD logical track and physical sector is shown in FIG.
It is (c) of a figure.

Then, a track number (cylinder number) N and a head number M, which are HD physical addresses, are obtained from the following equations.

N = RT / 4 quotient + 11 M = RT / 4− (N−11) where 11 is the number of tracks of management information for writing exchange track information and the like, and 4 is the total number of heads. Here, the HD device 16 uses two HD media and has four heads. Thus, M corresponds to the remainder of dividing the logical track of the HD device by four. FIG. 2D shows a table showing the relationship between the logical track and the track number and the head number which can be inversely converted. Incidentally, in (d) of the same figure, 28 stores information of the exchange truck.
It is an area for 11 tracks.

If the error data managed by the physical address recorded on the FD is converted to the corresponding intermediate logical sector in this way and converted to the HD physical address, the error data of the HD Without breaking the physical address system of FD without using a write processing program
It can be stored as error data in HD.

In this case, the logical sector has a one-to-one inversely convertible functional relationship with the physical address of the FD.
Since the logical sector and the HD physical address have a one-to-one reverse conversion correspondence, the conversion to the FD error data simply requires the reverse conversion. This inverse conversion can be performed by, for example, the FD physical address return processing program 13e with reference to the above-described tables, obtains the logical sector number R from the physical address of the HD, and obtains the logical sector number R from the FD head number, track number, Expand to side numbers and sector numbers. Then, the error data subjected to the inverse conversion can be stored in the FD via the FD device 17. In addition, it can be easily evaluated as conventional FD data by the HD medium evaluation processing program 13f.

By doing so, it is not necessary to store a large amount of error data of the FD, and efficient and efficient HD evaluation can be performed using a conventional program.

As described above, in the embodiment, the FD device is
Although only one is provided, it goes without saying that a plurality of units may be provided.

[Effects of the Invention] As can be understood from the above description, according to the present invention, a one-to-one primary for managing defect inspection data of an HD medium as recording data of a physical address of an FD and storing the data in the FD. Since it is functionally converted to a logical sector and this logical sector is further associated with the storage address of the HD device on a one-to-one basis, defect inspection data is stored in the HD device.
An HD device can be handled as an FD device, and a program recorded on a conventional FD device can be used as it is.

As a result, even if the capacity of the HD medium to be inspected becomes large, the defect data can be stored and managed as FD recording data in the HD device, and can be taken out and processed as FD data at any time by reverse conversion. Therefore, the number of FDs storing the defect inspection data does not need to be more than ten, the handling is easy, and there is no need to develop a special program for recording and managing the defect inspection data in the HD.

[Brief description of the drawings]

FIG. 1 is a block diagram of an HD medium defect inspection apparatus according to one embodiment to which a magnetic disk defect inspection method according to the present invention is applied;
FIG. 2 shows the logical sector conversion function and the logical sector
FIG. 4 is an explanatory diagram showing, as a table, a relationship of converting to a physical address. 1 ... Hard magnetic disk (HD medium), 2 ... HD rotary drive, 3 ... Magnetic head, 4 ... Readout circuit, 5 ...
Defect detection circuit, 6 ... Error type identification circuit, 7 ... Sector / byte counter, 8 ... Error memory, 10 ... HD drive device, 11 ... Defect data processing device, 12 ... Microprocessor, 13 ... Memory, 14: Disk control interface, 15: Bus, 16: Hard magnetic disk (H
D), 17 ... FD drive.

Claims (2)

(57) [Claims] 1. A magnetic disk defect inspection apparatus which develops recording of defect inspection data of a hard magnetic disk into physical addresses of a flexible disk composed of a head number, a track number, a side number, and a sector number and records the data on the flexible disk. A hard magnetic disk device, wherein the head number, track number, side number, and sector number of the flexible disk are linear functions with each of them as a variable, and when the value of each variable is determined, one pair 1 and converts the logical sector number into a reverse-convertible physical address corresponding to the hard magnetic disk device on a one-to-one basis, thereby inspecting the hard magnetic disk for defects. Storing data in the hard magnetic disk drive. Disk defect inspection system. 2. A hard disk drive in addition to a flexible disk drive, wherein a logical sector number is converted into a logical address which can be inversely converted in a one-to-one correspondence with the hard magnetic disk drive. The hard magnetic disk drive converts the physical address into a one-to-one corresponding reverse-convertible physical address, stores defect inspection data in the hard magnetic disk, and stores the defect inspection data stored in the hard magnetic disk drive in the hard magnetic disk. 2. The magnetic disk defect inspection system according to claim 1, wherein the data is transferred from the device to the flexible disk device and stored in the flexible disk.