JP2595368B2 - Vibration test method and apparatus for electronic components - Google Patents

Description

Description: FIELD OF THE INVENTION The present invention relates to a vibration test method and a vibration test apparatus for an electronic component, and more particularly to a vibration test for an electronic component capable of performing a vibration test in a wide frequency range over an ultrasonic range. The present invention relates to techniques that are effective when applied to test methods and apparatuses.

[Prior Art] Conventionally, as a technique relating to a vibration test, for example, a method described in literature such as Seikodo Shinkosha Co., Ltd., published on May 20, 1969, “Vibration Engineering” P892 to P895, etc. Vibration testing devices are known.

As shown in FIG. 4, for example, a vibration table 2 on which an electronic component 1 to be tested is placed, and a vibration table 2
A coil spring 3 configured to be elastically supported so as to be movable in only one direction, a rotary disk 5 fixed to the vibrating table 2 so as to be rotatable, and an eccentric mass 4 fixed thereto; An electric motor 7 rotates the disk 5 through a flexible joint 6, and one end of the electric motor 7 and one end of the coil spring 3 are fixed to a base 8.

The vibration test apparatus configured as described above rotates the rotating disk 5 by driving the electric motor 7, for example.
Centrifugal force is exerted in the radial direction by the eccentric mass 4 fixed to the rotating disk 5. Therefore, the elastically supported vibrating table 2 is moved in the vertical direction by, for example, the coil spring 3 that can move only in one direction limited in the vertical direction, and the electronic component 1 is moved in the vertical direction in conjunction with this. Let it.

As described above, the conventional vibration test method is performed by mechanically moving, ie, vibrating, the test object placed on the vibration table 2 in the vertical direction.

[Problems to be Solved by the Invention] However, in the above-described prior art, since a method of mechanically applying vibration is adopted, the frequency of vibration that can be applied is limited by the mass of the vibrating portion and the like,
A frequency of about 2 to 5 kHz is the limit.

Therefore, in ten vibration test devices, for example, 10 kHz
There is a problem that a vibration test cannot be performed in the frequency range of the ultrasonic range of z or 20 kHz or more.

Further, even when an ultrasonic vibrator or the like is used, a test using only a fixed frequency in the ultrasonic region is enabled, but a vibration test in a wide range cannot be performed by arbitrarily changing the frequency. There is a problem.

Accordingly, an object of the present invention is to provide a vibration test method and apparatus for an electronic component that enables a vibration test in which the frequency can be arbitrarily changed in a wide frequency range over an ultrasonic range.

The above and other objects and novel features of the present invention are as follows.
It will be apparent from the description of this specification and the accompanying drawings.

[Means for Solving the Problems] Of the inventions disclosed in the present application, the outline of a representative one will be briefly described as follows.

That is, the vibration test method and apparatus for an electronic component of the present invention is a vibration test method and apparatus for an electronic component having internal wiring, wherein the internal wiring is vibrated by an electromagnetic force to notify a mechanical weak point. Things.

Also, in this case, the electronic components are arranged in a DC magnetic field,
An alternating current is applied to the electronic component to vibrate the internal wiring.

Further, a direct current is applied to the electronic component, and an alternating magnetic field is applied to the electronic component by an alternating current to vibrate the internal wiring.

In addition, the amplitude and frequency of the alternating current are automatically changed to detect a change in the characteristics of the electronic component.

[Operation] According to the vibration test method and apparatus for an electronic component described above, by vibrating the internal wiring of the electronic component with an electromagnetic force, vibration of a wide range of frequencies over an ultrasonic range is applied without being limited by the frequency. can do.

In this case, by arranging the electronic component in a DC magnetic field and passing an alternating current through the electronic component, the internal wiring of the electronic component can be vibrated at a wide range of frequencies. Thereby, the mechanical weak point due to the vibration of the electronic component can be known in the frequency range over the ultrasonic range.

In addition, by applying a direct current to the electronic component and applying an alternating magnetic field to the electronic component, the internal wiring of the electronic component is vibrated at a wide range of frequencies in the same manner as described above, and the mechanical weakness in the frequency range over the ultrasonic range. You can know.

Further, by automatically changing the amplitude and frequency of the alternating current, a change in the characteristics of the electronic component can be detected. This makes it possible to automate the vibration test.

Embodiment 1 FIG. 1 is a schematic configuration diagram showing a vibration test apparatus for an electronic component according to an embodiment of the present invention.

First, the configuration of the vibration test apparatus of the present embodiment will be described with reference to FIG.

The vibration test apparatus according to the present embodiment is, for example, a vibration test apparatus 11 that applies an alternating current to an electronic component to vibrate an internal wiring, and a fuse 12 as an example of the electronic component, and an alternating current that applies an alternating current to the fuse 12. Power supply 13, power amplifier 1
4. An AC circuit having an ammeter 15 and a resistor 16. The fuse 12 is disposed in a DC magnetic field generated by a magnet 17.

The fuse 12 has, for example, a thin internal wiring 12a built therein, and the internal wiring 12a is formed of an alloy material mainly composed of zinc, lead or the like having a low melting temperature.

The AC power supply 13 is, for example, an oscillator that oscillates a sine wave waveform, and is capable of varying a wide range of frequency over an ultrasonic range, for example, a frequency of about 1 kHz to 100 kHz.

In the power amplifier 14, the output voltage from the AC power supply 13 is amplified, and is set to an arbitrary AC current by checking with an ammeter 15 via a current adjusting resistor 16.

The magnet 17 is a permanent magnet to which a magnetic field of, for example, 0.5 T can be applied.

 Next, the operation of the present embodiment will be described.

First, the output of the AC power supply 13 is amplified and adjusted by the power amplifier 14 under the confirmation of the ammeter 15, and an arbitrary AC current is supplied to the fuse 12. Then, the fuse 12 is disposed in a DC magnetic field generated by the magnet 17, and the internal wiring 12a of the fuse 12 is vibrated by an electromagnetic force.

In this case, when a current flows through the fuse 12 provided vertically in the magnetic field, a force is applied to the internal wiring 12a of the fuse 12 in a direction perpendicular to both the direction of the magnetic field and the direction of the current. This is known as Fleming's left-hand rule.

That is, if the current of the internal wiring 12a is I (A), the magnetic flux density of the magnetic field is B (T), the force is F (N), and the effective length of the internal wiring 12a in the magnetic field is 1 (m), then F = BlI (N) (1)

If the mass of the internal wiring 12a is m (kg), the acceleration α (m / s ² ) acting on the internal wiring 12a is as follows: α = F / m = BlI / m (m / s ² ) 2)

According to the above equation (2), the internal wiring having the mass m and the effective length l
An arbitrary acceleration α can be applied to 12a by changing the magnetic flux density B or the current I.

For example, a commercially available 0.5 (T) magnet 17 is used, and the length of the internal wiring 12a is 5 (mm) and the mass is 100 (μg).
Then, when a current of 1 (A) is passed, an acceleration of 25000 (m / s ² ), that is, a vibration of about 2500 G can be obtained.

Further, as can be seen from the above equation (2), since there is no relation to the frequency, there is basically no limitation on the frequency, and vibrations in a very wide range of frequencies can be applied.

For example, in this case, only the AC power supply 13 and the power amplifier 14 limit the frequency, and it is possible to apply a broadband vibration at least about 100 times or more as compared with a conventional mechanical method.

Thereby, an arbitrary current can be applied to the fuse 12 to apply vibration with an arbitrary acceleration, and by changing the frequency of the AC power supply 13, the acceleration at an arbitrary frequency can be applied to the internal wiring 12a of the fuse 12. Can be applied.

Therefore, the fuse (electronic component) 12 can be changed arbitrarily in a wide frequency range over the ultrasonic range.
Vibration test can be performed.

Embodiment 2 FIG. 2 is a schematic configuration diagram showing a vibration test apparatus for an electronic component according to another embodiment of the present invention.

As shown in FIG. 2, the vibration test apparatus of this embodiment is, for example, a vibration test apparatus 11 for causing a direct current to flow through an electronic component to vibrate an internal wiring.
And a DC circuit having a DC power supply 18 for applying a DC current to the fuse 12 and a resistor 19,
Reference numeral 12 denotes an AC power source, a power amplifier 14, an ammeter 15, a resistor 16, and an electromagnet 20 arranged in an AC magnetic field.

That is, the vibration test apparatus 11 of the second embodiment is different from the first embodiment in that a direct current flows through the fuse 12 and the fuse 12 is disposed in an alternating magnetic field.

Therefore, in the vibration test apparatus 11 of the present embodiment, the output of the DC power supply 18 flows through the fuse 12 as a predetermined DC current via the resistor 19. Then, the fuse 12 is disposed in an AC magnetic field generated by the electromagnet 20, and the internal wiring 12a of the fuse 12 is provided.
Is vibrated by electromagnetic force.

This AC magnetic field applies the output of the AC power supply 13 to the power amplifier 14
The electric current is amplified and adjusted based on the confirmation by the ammeter 15 so that an arbitrary AC magnetic field is generated through the electromagnet 20.

Thereby, also in the vibration test apparatus 11 of the present embodiment,
As in the first embodiment, an arbitrary current can be applied to the electromagnet 20 to apply an arbitrary acceleration vibration to the fuse 12, and by changing the frequency of the AC power supply 13, an arbitrary frequency acceleration can be applied. The fuse 12 internal wiring
12a can be applied.

Therefore, the fuse (electronic component) 12 can be changed arbitrarily in a wide frequency range over the ultrasonic range.
Vibration test can be performed.

[Embodiment 3] Fig. 3 is a schematic configuration diagram showing a vibration test apparatus for an electronic component according to still another embodiment of the present invention.

As shown in FIG. 3, the vibration test apparatus according to the present embodiment includes, as shown in FIG. 3, a vibration test apparatus 11 for flowing an AC current through an electronic component, automatically changing the amplitude and frequency of the AC power supply, and automating the vibration test. Fuses 12
In addition to an AC circuit having a frequency sweep type AC power supply 21 for applying an AC current to the fuse 12, a power amplifier 14, and a resistor 16, a current detection circuit 22, a control processor 23, and an output device 24 It is composed of
And the AC power supply 21 is a frequency sweep type oscillator,
The frequency of this frequency sweep oscillator is controlled by the control processor.
Controlled by 23.

That is, the vibration test apparatus 11 of the third embodiment differs from that of the first embodiment in that the amplitude and frequency of the AC current from the AC power supply 21 are automatically changed, thereby detecting the characteristic change of the fuse 12. Is a point.

Therefore, in the vibration test apparatus 11 of the present embodiment, the control processor 23 as a control means controls the AC power supply 21 of the frequency sweep type oscillator to change the frequency, and controls the power amplifier 14 to change the amplitude. Let it.

Further, a current flowing through the resistor 16 is detected by a current detection circuit 22 serving as a detection unit, and is fed back to the control processor 23. Further, the whole is controlled by the control processor 23 to determine which frequency and amplitude of the fuse 12 is disconnected, and outputs the result to the output device 24.

Thereby, in the vibration test apparatus 11 of the present embodiment,
The amplitude and frequency of the AC power supply 21 are automatically changed by the control processor 23, and the frequency and amplitude at which the fuse 12 is disconnected can be confirmed.

Therefore, the vibration test can be automated, and a change in the characteristics of the fuse (electronic component) 12 can be detected.

As described above, the invention made by the inventor is described in Examples 1 to 3.
Although the present invention has been described in detail, it is needless to say that the present invention is not limited to the above embodiments, and various changes can be made without departing from the gist of the present invention.

For example, with respect to the vibration test apparatuses 11 of the first to third embodiments, the case of performing the vibration test of the fuse 12 as an example of the electronic component has been described. However, the present invention is not limited to the above-described respective embodiments. As the electronic component, it can be widely applied to electronic components such as transistors and semiconductor integrated circuits. Particularly, it can be favorably applied to an electronic component having a thin and short internal wiring 12a.

Further, in the vibration test apparatus 11 of each of the above-described embodiments, the case where the AC power supplies 13 and 21 are oscillators that oscillate a sine wave waveform has been described. The present invention is also applied to an oscillator having a waveform. In this case, a resonance point, that is, a disconnection frequency at a mechanical weak point can be easily known.

Further, in the vibration test apparatus 11 according to the first and third embodiments, the case where the DC magnetic field is formed by the magnet 17 has been described. This is also applicable to the case where

[Effects of the Invention] Of the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows.

(1). In a method and an apparatus for testing the vibration of an electronic component having internal wiring, by vibrating the internal wiring with an electromagnetic force, the vibration due to the electromagnetic force is not limited to a frequency, so that vibrations of a wide range of frequencies over an ultrasonic range are provided. Can be applied to the electronic component.

(2). Since the electronic components are arranged in a DC magnetic field and an alternating current is passed through the electronic components, the internal wiring of the electronic components can be vibrated at a wide range of frequencies.
The mechanical weakness due to the vibration of the electronic component can be known in a frequency range over the ultrasonic range.

(3). By applying a direct current to the electronic component and applying an alternating magnetic field to the electronic component, the internal wiring of the electronic component is vibrated at a wide range of frequencies in the same manner as in the above (2), and the mechanical weak point in the frequency range over the ultrasonic range. You can know.

(4). Since the alternating current has an arbitrary waveform of a sine wave, a triangular wave, or a square wave, vibration of an arbitrary waveform can be applied, so that the mechanical weak point of the electronic component can be easily known.

(5). By automatically changing the amplitude and frequency of the alternating current, a change in the characteristics of the electronic component can be detected, so that the vibration test can be automated.

(6). According to the above (1) to (5), a vibration test in a wide frequency range over the ultrasonic range can be performed, and the frequency can be arbitrarily changed. In particular, since there is no mechanically movable part as in the related art, It is possible to obtain a method and an apparatus for testing vibration of electronic components, which are safe and can be made extremely simple and compact test equipment.

[Brief description of the drawings]

FIG. 1 is a schematic configuration diagram showing an electronic component vibration test apparatus according to Embodiment 1 of the present invention, FIG. 2 is a schematic configuration diagram showing an electronic component vibration test apparatus according to Embodiment 2 of the present invention, FIG. 4 is a schematic configuration diagram showing a vibration test apparatus for an electronic component according to a third embodiment of the present invention, and FIG. 4 is a schematic configuration diagram showing a conventional vibration test device for an electronic component. 1 ... electronic parts, 2 ... vibration table, 3 ... coil spring, 4
... Eccentric mass, 5 ... Rotating disk, 6 ... Flexible joint, 7 ... Electric motor, 8 ... Base, 11 ... Vibration test equipment,
12 …… Fuse (electronic parts), 12a …… Internal wiring, 13…
... AC power supply, 14 ... Power amplifier, 15 ... Ammeter, 16 ...
... Resistance, 17 ... Magnet, 18 ... DC power supply, 19 ... Resistance, 20
... electromagnet, 21 ... AC power supply, 22 ... current detection circuit, 23
... Control processor, 24 ... Output device.

 ──────────────────────────────────────────────────続 き Continuing from the front page (72) Inventor Toshio Sato 1 Horiyamashita, Hadano-shi, Kanagawa Prefecture Inside Hitachi, Ltd. Kanagawa Factory (72) Inventor Fumio Okamura 1-Horiyamashita, Hadano-shi, Kanagawa Hitachi, Ltd. Kanagawa Factory, Ltd. (72) Inventor Hiroshi Hioki 1 Horiyamashita, Hadano-shi, Kanagawa Prefecture Inside Hitachi, Ltd.Kanagawa Plant (72) Inventor Toshiaki Fujie 1-Horiyamashita, Hatano-shi, Kanagawa Prefecture Inside Hitachi, Ltd.Kanagawa Plant (56) References JP-A-53-19087 (JP, A) JP-A-61-196133 (JP, A)

Claims (7)

(57) [Claims] 1. A vibration test method for an electronic component provided with internal wiring, wherein the internal wiring is vibrated by an electromagnetic force to notify a mechanical weak point. 2. The method according to claim 1, wherein the electronic component is disposed in a DC magnetic field, and an alternating current is applied to the electronic component to vibrate the internal wiring. 3. The method for testing vibration of an electronic component according to claim 1, wherein a direct current is applied to said electronic component, and an internal magnetic field is applied to said electronic component by applying an alternating magnetic field to oscillate the internal wiring. 4. The method according to claim 2, wherein the alternating current has one of a sine wave, a triangular wave, and a square wave. 5. The vibration test method for an electronic component according to claim 2, wherein the amplitude and frequency of the alternating current are automatically changed to detect a change in the characteristic of the electronic component. 6. An apparatus for testing the vibration of an electronic component having an internal wiring, comprising: means for applying a magnetic field to the electronic component; and means for applying a current to the internal wiring. A vibration test apparatus for an electronic component, wherein the internal wiring is vibrated by an electromagnetic force generated from the relationship with the electronic component to notify a mechanical weak point. 7. The means for applying a magnetic field is a magnet for generating a DC magnetic field, the means for applying a current is an AC power supply for generating an AC current, and the electronic component is arranged in a DC magnetic field by the magnet. 7. The vibration test apparatus for an electronic component according to claim 6, wherein an AC current from the AC power supply is supplied to the electronic component to vibrate the internal wiring.