JP2503950B2 - Control device for material testing machine - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION <Field of Industrial Application> The present invention relates to a control device for a material testing machine.

<Prior Art> In recent years, a computer has been widely used for controlling a material testing machine. In such a material testing machine, a slave computer that directly controls the body of the material testing machine,
Many are equipped with a master computer that manages a control system including this slave computer and that processes the detected data of various physical quantities transmitted from the slave computer.

In a material testing machine, generally, it is necessary to detect a load at least every moment by a load cell while continuously applying a load to the test piece by moving a crosshead holding one end of the test piece.

In the control device that combines the slave computer and the master computer described above, the slave computer is usually incorporated in the operation panel for operating the material testing machine, and the key group for setting the moving speed of the crosshead and the load cell are used. A group of keys for setting the test conditions by the material testing machine, such as a key group for setting the range of the amplifier for amplifying the load detection value, or a start key for giving a test start command to this slave computer. They are arranged as function keys, and the control conditions of the material testing machine are immediately set or the test is started by operating these key groups. Also,
This slave computer takes in the momentary output from various detectors including the load cell mounted on the material testing machine, and supplies the momentary control signal to the load mechanism including the crosshead according to the result. Directly control the material testing machine.

On the other hand, the master computer receives the data from the various detectors that are incorporated into the slave computer every moment and records it on the floppy disk, or based on the data, displays the load-elongation curve etc. on the CRT to detect various data. A general-purpose keyboard, which mainly plays a role of processing data and gives instructions regarding how to process the data and how to display on the CRT, is connected. By operating the above-mentioned function keys provided in the slave computer, the control conditions of the material testing machine are immediately set as described above, and at the same time, the setting contents are transmitted to the master computer and the floppy disk data is sent together with the data from various detectors. Stored on disk. In addition, the master computer is transmitted with the state of the control system of the entire material testing machine including the slave computer during the test, for example, the magnitude of the control signal at every moment, and the momentary transmission result and the previous transmission. Based on the control conditions that exist, the presence or absence of abnormalities during the test is monitored, and commands are sent to the slave computer as needed.

<Problems to be Solved by the Invention> In the control device of the conventional material testing machine including the slave computer and the master computer as described above,
The control condition of the material testing machine is first changed by the key operation of the slave computer, and the information is transmitted to the master computer after the change, so the master computer cannot completely manage the control system including the slave computer. .

In other words, in the conventional material testing machine control device that employs this type of system, after starting the test under the control conditions set by the slave computer, if there is an abnormality, the operation of the testing machine is stopped. However, the management operation is only ex post facto after the start of the test, and it cannot be said that the entire system is completely managed.

The present invention has been made in view of such circumstances, and an object of the present invention is to provide a control device for a material testing machine capable of more completely managing the entire system including the setting contents of control conditions by a master computer. .

<Means for Solving Problems> The configuration of the present invention will be described based on the basic conceptual diagram shown in FIG.

The slave computer 1 inputs the outputs of various detectors mounted on the material testing machine body 2 and gives control signals to the servo system of the load mechanism. A function key group 11 for setting control conditions of the material testing machine is connected to the slave computer 1.

The master computer 3 is connected to the slave computer 1 through the bidirectional transmission path 4, receives data from the above-mentioned detector through the slave computer 1, performs data processing, and includes the slave computer 1 as a material. Manages the system of the tester 1.

When operating the function key group 11 of the slave computer 1, the key information transmitting means a first transmits the information to the master computer 3. In the master computer 3, the key operation determination means b determines the transmitted key information, and the key operation determination result transmission means c transmits the determination result to the slave computer 1.
The slave computer 1, based on this determination result,
The control conditions of the material testing machine 1 are set.

<Function> Function key group for condition setting of slave computer 1 11
Even if is operated, the condition setting of the material testing machine 2 is not made immediately, but the master computer 3 discriminates the key operation, transmits the result to the slave computer 1, and executes the condition setting for the first time. Therefore, the master computer 3 can monitor the operation of the function key group of the slave computer 1, and the master computer 3
Can completely manage the control system of the material testing machine 1 including the slave computer 1.

<Example> An example of the present invention will be described below with reference to the drawings.

FIG. 2 is a block diagram showing the configuration of the embodiment of the present invention.

The slave computer 1 outputs the outputs of various detector groups such as load cells and displacement meters mounted on the material testing machine 2,
Input through the respective amplifiers 8 ... 8 and AD converter 5. In addition, an operation signal is supplied to the servo amplifier 7 of the load mechanism such as the crosshead via the DA converter 6. The slave computer 1 includes various function key groups for setting control conditions of the material testing machine 2, such as a crosshead speed setting key group and a range setting key group of the amplifiers 8 ...
11 is connected.

The master computer 3 is composed of, for example, a 16-bit personal computer, and has a general-purpose keyboard 31, C
RT32, floppy disk 33, printer 34, etc. are connected. The master computer 3 is connected to the slave computer 1 by a bidirectional transmission line 4, for example, GPIB. Like the conventional device, this master computer 1 is based on the data processing method set by the operation of the keyboard 31 or the display method on the CRT 32, and various detectors transmitted via the bidirectional transmission path 4. The data from can be processed and written to the floppy disk 34, and the test result can be displayed every moment on the CRT 32. Based on the data processing result, the slave computer 1 can be instructed as necessary. In addition, the setting contents of the control conditions by the slave computer 1 can be monitored as shown below. That is,
Slave and master computers 1 and 3 are shown in FIG.
As shown in the flowchart, the program of the slave computer 1 does not have a routine for discriminating the operation when the function key 11 is operated, but has a routine for immediately transmitting the information to the master computer 3. When the slave computer 1 transmits operation information of the function key group 11, for example, a code preset for each function key, to the program of the master computer 3, a routine for discriminating the operation, It has a routine for judging whether or not to send the judgment result to the slave computer 1 in consideration of the system management condition set in advance and transmitting the judged result to the slave computer 1. That is, when the operator operates the function key group 11 provided in the slave computer 1 to set the crosshead speed of the material testing machine 2 and the range of the amplifiers 8 ... 8 for various detectors, the slave computer 1 The operation information is directly transmitted to the master computer 3 without identifying the operation content. The master computer 3 knows the setting content of the control condition of the material testing machine 2 by discriminating (recognizing) which key has been operated from the transmitted operation information of the function key group 11. And the content is
For example, an amplifier 8 for each detector including a load cell
... 8 Mutual range relation, or mutual relation between loadle output gain and crosshead speed, and further relation between load cell output gain and printer 34 or CRT32 display scale. It is preset in relation to balance. It is determined whether or not the system management condition is within the allowable range, and only the allowable result of the operation content of the function key group 11 is transmitted to the slave computer 1. Then, the slave computer 1 executes the condition setting of the material testing machine 2 for the first time when the key operation determination result is transmitted from the master computer 3. Then, the master computer 3 rewrites the previously set condition to the condition set this time and executes the subsequent data processing.

When a control condition is set by the function key group 11 for setting the control condition of the slave computer 1 that does not satisfy the range permitted by the system management condition, specifically, for example, the function key for setting the control condition of the slave computer 1 Group 11
When the amplification factor of the load cell output is large enough to overscale the display by the display 32 or the printer 34 among the setting contents of each range of the amplifiers 8 for various detectors by 8 ..., the setting contents are set by the slave computer 1.
The test start is not executed even if the test start command is given. This saves the waste of performing useless tests and storing unanalyzable data, and the operator knows that the control conditions set by him / her are out of balance.

<Effect> According to the present invention, the operation of the condition setting function key group 11 attached to the slave computer 1 for supplying various control commands to the material testing machine 2 is discriminated by the master computer 3, and the discrimination result is shown. The master computer 3 completely manages the control system of the material testing machine 2 including the slave computer 1 because the condition setting of the material testing machine 2 is actually performed only after the transmission to the slave computer 1 and the transmission. Is possible, and, for example, when there is an erroneous key operation, if the management conditions are not met, the execution thereof is prohibited, and the effect is great.

[Brief description of drawings]

FIG. 1 is a basic conceptual diagram showing the configuration of the present invention, FIG. 2 is a block diagram showing the configuration of an embodiment of the present invention, and FIG. 3 is a flow chart showing programs written in the slave computer 1 and the master computer 3. is there. 1 …… Slave computer 2 …… Material testing machine 3 …… Master computer 4 …… Bidirectional transmission path 11 …… Function keys

Claims (1)

(57) [Claims] 1. A control condition for a crosshead speed setting key group, a load amplifier range setting key group, etc. while inputting outputs of various detectors mounted on a material testing machine and giving a control signal to a load mechanism. A slave computer equipped with a group of keys for setting, and a slave computer connected to the slave computer by a bidirectional transmission path, inputting data from the detector via the slave computer and performing data processing, and In an apparatus comprising a master computer for managing the material testing machine system including the slave computer, the slave computer, when operating a key group of the slave computer, key operation for transmitting control information set by the slave computer to the master computer. The master computer is provided with an information transmission means. The key operation determination means for determining the key operation information transmitted from the computer and the key operation determination result transmission means for transmitting the determination result to the slave computer are provided, and the operation of the key group of the slave computer is determined by the master computer. Then, based on the determination result, it is configured to set the control conditions of the material testing machine by the slave computer,
Material testing machine control device.