JP2024515686A - 深度データ測定ヘッド、計算装置及びその対応方法 - Google Patents

深度データ測定ヘッド、計算装置及びその対応方法 Download PDF

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Publication number
JP2024515686A
JP2024515686A JP2023564228A JP2023564228A JP2024515686A JP 2024515686 A JP2024515686 A JP 2024515686A JP 2023564228 A JP2023564228 A JP 2023564228A JP 2023564228 A JP2023564228 A JP 2023564228A JP 2024515686 A JP2024515686 A JP 2024515686A
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Japan
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sub
image
image sensor
structured light
imaging
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Pending
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JP2023564228A
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English (en)
Japanese (ja)
Inventor
王敏捷
梁雨時
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Shanghai Percipio Technology Ltd
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Shanghai Percipio Technology Ltd
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Publication of JP2024515686A publication Critical patent/JP2024515686A/ja
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/521Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/22Measuring arrangements characterised by the use of optical techniques for measuring depth
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2527Projection by scanning of the object with phase change by in-plane movement of the patern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2023564228A 2021-04-20 2021-12-14 深度データ測定ヘッド、計算装置及びその対応方法 Pending JP2024515686A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN202110423508.2 2021-04-20
CN202110423508.2A CN115218812A (zh) 2021-04-20 2021-04-20 深度数据测量头、计算装置及其对应方法
PCT/CN2021/137791 WO2022222497A1 (zh) 2021-04-20 2021-12-14 深度数据测量头、计算装置及其对应方法

Publications (1)

Publication Number Publication Date
JP2024515686A true JP2024515686A (ja) 2024-04-10

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ID=83604367

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Application Number Title Priority Date Filing Date
JP2023564228A Pending JP2024515686A (ja) 2021-04-20 2021-12-14 深度データ測定ヘッド、計算装置及びその対応方法

Country Status (5)

Country Link
US (1) US20240169570A1 (zh)
EP (1) EP4328542A1 (zh)
JP (1) JP2024515686A (zh)
CN (1) CN115218812A (zh)
WO (1) WO2022222497A1 (zh)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003105289A2 (en) * 2002-06-07 2003-12-18 University Of North Carolina At Chapel Hill Methods and systems for laser based real-time structured light depth extraction
CN103581625A (zh) * 2013-10-28 2014-02-12 华中科技大学 一种分时并行图像采集装置及其标定方法
CN103780844A (zh) * 2013-12-30 2014-05-07 华中科技大学 一种分时二路图像采集装置及其标定方法
CN108650447B (zh) * 2018-07-06 2024-03-05 上海图漾信息科技有限公司 图像传感器、深度数据测量头及测量系统
CN109889690B (zh) * 2019-03-04 2022-08-16 青岛小鸟看看科技有限公司 一种提高深度图像帧率的方法和深度相机组
CN111829449B (zh) * 2019-04-23 2022-04-12 上海图漾信息科技有限公司 深度数据测量头、测量装置和测量方法

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Publication number Publication date
EP4328542A4 (en) 2024-02-28
CN115218812A (zh) 2022-10-21
EP4328542A1 (en) 2024-02-28
WO2022222497A1 (zh) 2022-10-27
US20240169570A1 (en) 2024-05-23

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