JP2024001906A - Liquid level meter for liquid hydrogen and liquid level measurement method - Google Patents
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- 239000007788 liquid Substances 0.000 title claims abstract description 192
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 title claims abstract description 103
- 239000001257 hydrogen Substances 0.000 title claims abstract description 99
- 229910052739 hydrogen Inorganic materials 0.000 title claims abstract description 99
- 238000000691 measurement method Methods 0.000 title description 2
- 238000001514 detection method Methods 0.000 claims abstract description 37
- 238000004364 calculation method Methods 0.000 claims abstract description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 29
- 239000001307 helium Substances 0.000 claims description 17
- 229910052734 helium Inorganic materials 0.000 claims description 17
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 17
- 239000007789 gas Substances 0.000 claims description 13
- 229910052757 nitrogen Inorganic materials 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 8
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 5
- 238000011088 calibration curve Methods 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 2
- 239000004973 liquid crystal related substance Substances 0.000 claims 1
- 150000002431 hydrogen Chemical class 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 239000012071 phase Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000007791 liquid phase Substances 0.000 description 3
- 238000009835 boiling Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005381 potential energy Methods 0.000 description 2
- 238000000790 scattering method Methods 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910001562 pearlite Inorganic materials 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Abstract
Description
本発明は、例えば液体水素用に用いて好適な、液面計及び液位測定方法に関する。 The present invention relates to a liquid level gauge and a liquid level measuring method suitable for use, for example, in liquid hydrogen.
クリーンエネルギーである水素の利用が、第６次エネルギー基本計画の基本方針の一つとして盛り込まれた。水素の輸送や貯蔵の際には、気体に比べ密度が１／８００となる液体状態での利用が想定されている。その際、断熱構造を有する容器内にある液体水素の容量を精密に計測し把握することは、水素利用には欠かせない。容量測定には、他の寒剤（窒素、ヘリウムなど）と同様、一般的な液面計を用いている。例えば、液体窒素では簡便なフロート式が用いられている。水素液面計に関しても、超伝導を応用したものが提案されている（例えば、特許文献１～３参照）し、また静電容量式も知られている。 The use of hydrogen, a clean energy source, was included as one of the basic policies of the Sixth Basic Energy Plan. When transporting or storing hydrogen, it is assumed that it will be used in a liquid state, which has a density 1/800 of that of gas. At that time, it is essential for hydrogen utilization to precisely measure and understand the volume of liquid hydrogen in a container with an insulated structure. As with other cryogens (nitrogen, helium, etc.), a general liquid level gauge is used to measure the volume. For example, a simple float type is used for liquid nitrogen. As for hydrogen level gauges, ones that apply superconductivity have been proposed (see, for example, Patent Documents 1 to 3), and capacitance type gauges are also known.
しかしながら、静電容量式では、実験ごとの校正が必要とされ、来るべき水素社会において、５ｔｏｎクラスのプラント用大型タンクから地産地消型を想定した１００ｋｇ程度までの小・中型容器までの個々の容器を対応させることは現実的ではない。
超伝導線を用いた方式においても、常圧下での沸点が４．２ケルビンのヘリウムに比べ、２０ケルビンの水素に対し、利用可能な超伝導材料はＭｇＢ２などに限られる。また、水素下での評価法が確立していないのが現状である。
However, the capacitance type requires calibration for each experiment, and in the coming hydrogen society, it will be necessary to calibrate individual containers ranging from large 5-ton class tanks for plants to small and medium-sized containers of around 100 kg, assuming local production and local consumption. It is not practical to make containers compatible.
Even in methods using superconducting wires, the usable superconducting materials are limited to MgB 2 and the like for hydrogen, which has a boiling point of 20 Kelvin, compared to helium, which has a boiling point of 4.2 Kelvin under normal pressure. Furthermore, at present, an evaluation method under hydrogen has not been established.
また、水素ならではの課題も克服する必要がある。水素自体が可燃性であることから、その安全性も一層求められる。さらに液体水素容器内への液面センサーの導入には、熱流入が不可避であり、貴重なエネルギー源の蒸発につながってしまう。さらに、容器内部への液面センサーの導入は、用いる液面系材料の水素脆化・低温脆化も考慮する必要があるのと同時に、容器の構造を一層複雑にする。容器内部に導入した液面センサーによる溶接・接続部の水素脆化・低温脆化も不可避の懸念となる。 It is also necessary to overcome challenges unique to hydrogen. Since hydrogen itself is flammable, its safety is even more important. Furthermore, the introduction of a liquid level sensor into a liquid hydrogen container inevitably introduces heat, which leads to evaporation of a valuable energy source. Furthermore, the introduction of a liquid level sensor inside the container requires consideration of hydrogen embrittlement and low-temperature embrittlement of the liquid surface material used, and at the same time makes the structure of the container even more complex. Hydrogen embrittlement and low-temperature embrittlement of welds and connections caused by liquid level sensors installed inside the container are also inevitable concerns.
本発明は、上記従来技術の問題点を解決したもので、容器内部の液体水素とは非接触で液面の液位を測定できる液面計及び液位測定方法を提供することを目的とする。 The present invention solves the problems of the prior art described above, and aims to provide a liquid level meter and a liquid level measuring method that can measure the liquid level without contacting the liquid hydrogen inside the container. .
〔１〕本発明の液面計は、例えば図１に示すように、液体水素用タンク１０の中心軸に向けて液面と平行な方向に所定のエネルギーのＸ線を照射するＸ線照射装置２０と、前記Ｘ線によって前記中心軸の近傍で生じた後方散乱Ｘ線を検出するＸ線検出装置３２と、前記後方散乱Ｘ線の一部を前記Ｘ線検出装置の手前で遮蔽する遮蔽部材３０と、検出した後方散乱Ｘ線に基づいて前記中心軸での液位を算出する算出装置３４とを備えた液面計であって、Ｘ線照射装置２０を液体水素用タンク１０の上下方向に移動して、前記Ｘ線の照射軸の液体水素用タンク１０における高さを調整する上下方向駆動機構２２を有し、遮蔽部材３０は、液体水素用タンク１０の上下方向に一定間隔で設けられたスリットを有し、前記スリットを通過したＸ線がＸ線検出装置３２に入射し、Ｘ線検出装置３２は、後方散乱Ｘ線を検出すると共に、当該後方散乱Ｘ線のＸ線線量及びエネルギー量を測定し、算出装置３４は、検出した後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量に基づいて液体水素用タンク１０の液体水素と水素ガスの境界面の液位を求めるものである。 [1] As shown in FIG. 1, for example, the liquid level gauge of the present invention includes an X-ray irradiation device that irradiates X-rays with a predetermined energy in a direction parallel to the liquid level toward the central axis of the liquid hydrogen tank 10. 20, an X-ray detection device 32 that detects backscattered X-rays generated near the central axis by the X-rays, and a shielding member that blocks part of the backscattered X-rays in front of the X-ray detection device. 30 and a calculation device 34 that calculates the liquid level at the central axis based on the detected backscattered X-rays, the It has a vertical drive mechanism 22 that moves to adjust the height of the X-ray irradiation axis in the liquid hydrogen tank 10, and the shielding members 30 are provided at regular intervals in the vertical direction of the liquid hydrogen tank 10. The X-rays passing through the slit enter the X-ray detection device 32, and the X-ray detection device 32 detects the backscattered X-rays and determines the X-ray dose and amount of the backscattered X-rays. The calculation device 34 measures the energy amount and determines the liquid level at the interface between liquid hydrogen and hydrogen gas in the liquid hydrogen tank 10 based on the X-ray dose at a specific energy of the detected backscattered X-rays. .
〔２〕本発明の液面計〔１〕において、好ましくは、算出装置３４は、前記中心軸の近傍と同等の材料よりなる試験体に向けて照射された前記所定のエネルギーのＸ線によって生じる後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量と当該液体水素用タンク内での液体水素の既知の液位との関係を示す検量線データを有し、前記検出した後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量と前記検量線データとに基づいて前記液位を求めるものであるとよい。
〔３〕本発明の液面計〔１〕又は〔２〕において、好ましくは、Ｘ線照射装置２０は、前記Ｘ線を照射するＸ線焦点の近傍に一端が取り付けられ他端が液体水素用タンク１０の壁面近傍に位置する遮蔽筒体と、前記遮蔽筒体の前記他端に設けられ且つ１カ所に開口を有するコリメーターとをさらに備えるとよい。
〔４〕本発明の液面計〔３〕において、好ましくは、前記コリメーターは、前記液面と平行な方向に摺動可能であり、前記Ｘ線検出装置３２は、前記コリメーターの摺動方向に直交する方向に移動可能であり、
算出装置３４は、前記中心軸の近傍の所定範囲における走査情報を生成する走査情報生成部を有するとよい。
〔５〕本発明の液面計〔１〕乃至〔４〕において、好ましくは、前記Ｘ線は、液体水素用タンク１０の壁面近傍に入射する際のビーム直径が１０ｍｍ以下であるとよい。
〔６〕本発明の液面計〔１〕乃至〔５〕において、例えば、Ｘ線検出装置３２は、Ｘ線の検出方向軸が前記照射軸に対し３０～１６５°で交差するように配向するとよい。
〔７〕本発明の液面計〔１〕乃至〔６〕において、前記液体水素用タンクに代えて、液体ヘリウム用タンク、液体空気用タンク、液体窒素用タンク、若しくは他の寒剤保存用タンクに用いられ、Ｘ線検出装置は、液体水素と水素ガスに代えて、液体ヘリウムとヘリウムガス、液体空気と空気、液体窒素と窒素ガス、若しくは他の寒剤で生ずる液体相とガス相の境界の検出に用いられるものでもよい。
[2] In the liquid level gauge [1] of the present invention, preferably, the calculation device 34 calculates the amount of energy generated by the X-rays of the predetermined energy irradiated toward the test specimen made of the same material as the vicinity of the central axis. It has calibration curve data showing the relationship between the X-ray dose at a specific energy of the backscattered X-rays and the known liquid level of liquid hydrogen in the liquid hydrogen tank, and Preferably, the liquid level is determined based on the X-ray dose at energy and the calibration curve data.
[3] In the liquid level gauge [1] or [2] of the present invention, preferably, the X-ray irradiation device 20 has one end attached near the X-ray focal point for irradiating the X-rays and the other end attached to the liquid hydrogen It is preferable to further include a shielding cylindrical body located near the wall surface of the tank 10, and a collimator provided at the other end of the shielding cylindrical body and having an opening at one location.
[4] In the liquid level gauge [3] of the present invention, preferably, the collimator is slidable in a direction parallel to the liquid level, and the X-ray detection device 32 is configured to It is movable in a direction perpendicular to the direction,
The calculation device 34 preferably includes a scanning information generation section that generates scanning information in a predetermined range near the central axis.
[5] In the liquid level gauges [1] to [4] of the present invention, preferably, the beam diameter of the X-rays when incident near the wall surface of the liquid hydrogen tank 10 is 10 mm or less.
[6] In the liquid level gauges [1] to [5] of the present invention, for example, if the X-ray detection device 32 is oriented such that the X-ray detection direction axis intersects the irradiation axis at an angle of 30 to 165 degrees. good.
[7] In the liquid level gauges [1] to [6] of the present invention, instead of the liquid hydrogen tank, a liquid helium tank, a liquid air tank, a liquid nitrogen tank, or another cryogen storage tank is used. X-ray detection equipment can be used to detect boundaries between liquid and gas phases that occur with liquid helium and helium gas, liquid air and air, liquid nitrogen and nitrogen gas, or other cryogens instead of liquid hydrogen and hydrogen gas. It may also be used for.
〔８〕本発明の液位測定方法は、例えば図１に示すように、液体水素用タンク１０の中心軸に向けて液面と平行な方向に所定のエネルギーのＸ線を照射するＸ線照射装置２０と、前記Ｘ線によって前記中心軸の近傍で生じた後方散乱Ｘ線を検出するＸ線検出装置３２と、前記後方散乱Ｘ線の一部を前記Ｘ線検出装置の手前で遮蔽する遮蔽部材３０と、検出した後方散乱Ｘ線に基づいて前記中心軸での液位を算出する算出装置３４とを備えた液面計を用いた液位測定方法であって、遮蔽部材３０は、液体水素用タンク１０の上下方向に一定間隔で設けられたスリットを有し、前記スリットを通過したＸ線が前記Ｘ線検出装置に入射するように構成され、Ｘ線照射装置２０を液体水素用タンク１０の上下方向に移動して、前記中心軸の近傍に向けてＸ線を照射し、前記中心軸の近傍で生じた後方散乱Ｘ線を検出すると共に、当該後方散乱Ｘ線のＸ線線量及びエネルギー量を測定し、検出した後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量に基づいて液体水素用タンク１０の液体水素と水素ガスの境界面の液位を求めるものである。
〔９〕本発明の液位測定方法〔８〕において、好ましくは、前記液体水素用タンクに代えて、液体ヘリウム用タンク、液体空気用タンク、液体窒素用タンク、若しくは他の寒剤保存用タンクに用いられ、Ｘ線検出装置は、液体水素と水素ガスに代えて、液体ヘリウムとヘリウムガス、液体空気と空気、液体窒素と窒素ガス、若しくは他の寒剤で生ずる液体相とガス相の境界の検出に用いられるものでもよい。
[8] The liquid level measurement method of the present invention includes, for example, as shown in FIG. an X-ray detection device 32 that detects backscattered X-rays generated near the central axis by the X-rays; and a shield that blocks part of the backscattered X-rays in front of the X-ray detection device. A liquid level measuring method using a liquid level gauge including a member 30 and a calculation device 34 that calculates the liquid level at the central axis based on detected backscattered X-rays, the shielding member 30 The hydrogen tank 10 has slits provided at regular intervals in the vertical direction, and is configured such that X-rays passing through the slits enter the X-ray detection device, and the X-ray irradiation device 20 is connected to the liquid hydrogen tank. 10 in the vertical direction, irradiates X-rays toward the vicinity of the central axis, detects backscattered X-rays generated near the central axis, and detects the X-ray dose and amount of the backscattered X-rays. The amount of energy is measured, and the liquid level at the interface between liquid hydrogen and hydrogen gas in the liquid hydrogen tank 10 is determined based on the amount of X-rays at a specific energy of the detected backscattered X-rays.
[9] In the liquid level measuring method [8] of the present invention, preferably a liquid helium tank, a liquid air tank, a liquid nitrogen tank, or another cryogen storage tank is used instead of the liquid hydrogen tank. X-ray detection equipment can be used to detect boundaries between liquid and gas phases that occur with liquid helium and helium gas, liquid air and air, liquid nitrogen and nitrogen gas, or other cryogens instead of liquid hydrogen and hydrogen gas. It may also be used for.
本発明の液面計によれば、容器外部から計測のためのセンサー類などを、容器内部に導入する必要がない。これは、従来型の延長といえる超伝導線を容器内部に導入した液面計などと比較し、熱流入の抑制、水素脆化・低温脆化の懸念がない、容器の大きさに依存しない、容器の構造が簡素化し、水素を扱う上での安全性の向上、精密計測が可能、という利点を有する。 According to the liquid level gauge of the present invention, there is no need to introduce sensors for measurement from outside the container into the inside of the container. Compared to liquid level gauges that use superconducting wires inside the container, which can be considered an extension of conventional methods, this technology suppresses heat inflow, eliminates concerns about hydrogen embrittlement and low-temperature embrittlement, and is independent of the size of the container. This has the advantage of simplifying the structure of the container, improving safety when handling hydrogen, and enabling precise measurement.
以下図面を用いて本発明を説明する。
図１Ａは、本発明の一実施例を示す液面計の説明図で、液体水素タンク外部に装着した状態を示している。図１Ｂは、図１Ａに示す液体水素タンクに装着した状態を上から見た配置図を示している。
図において、液体水素容器１０は、液体水素容器外壁１０ａと液体水素容器内壁１０ｂの二重壁構造となっており、両者の間隙に断熱層１２が設けられている。液体水素容器外壁１０ａと液体水素容器内壁１０ｂは、水素脆化などをクリアしたＳＵＳ（３０４、３０４Ｌ、３１６、３１６Ｌ、３１７）の５種類が構造材として用いられる。断熱層１２は、真空やパーライト材が用いられる。液体水素容器内壁１０ｂには、液面の上側が水素ガス１４であり、下側が液体水素１６となっている。
The present invention will be explained below using the drawings.
FIG. 1A is an explanatory diagram of a liquid level gauge showing an embodiment of the present invention, and shows a state where it is attached to the outside of a liquid hydrogen tank. FIG. 1B shows a top view of the device installed in the liquid hydrogen tank shown in FIG. 1A.
In the figure, the liquid hydrogen container 10 has a double-walled structure consisting of an outer wall 10a of the liquid hydrogen container and an inner wall 10b of the liquid hydrogen container, and a heat insulating layer 12 is provided in the gap between the two. For the outer wall 10a of the liquid hydrogen container and the inner wall 10b of the liquid hydrogen container, five types of SUS (304, 304L, 316, 316L, 317), which have cleared hydrogen embrittlement, are used as structural materials. For the heat insulating layer 12, vacuum or pearlite material is used. On the inner wall 10b of the liquid hydrogen container, the upper side of the liquid surface is hydrogen gas 14, and the lower side is liquid hydrogen 16.
Ｘ線源２０は、Ｘ線を液体水素容器１０の液面方向に照射するものである。照射したＸ線は液面方向に対して上下方向に各々７－８度程度にわたり広がって伝搬する。Ｘ線源上下駆動機構２２は、Ｘ線源２０を液体水素容器１０の上下方向に駆動する機構で、汎用的な昇降機構が用いられる。 The X-ray source 20 irradiates X-rays in the direction of the liquid surface of the liquid hydrogen container 10. The irradiated X-rays spread and propagate by about 7 to 8 degrees in the vertical direction with respect to the liquid surface direction. The X-ray source vertical drive mechanism 22 is a mechanism that drives the X-ray source 20 in the vertical direction of the liquid hydrogen container 10, and a general-purpose lifting mechanism is used.
遮蔽部材３０は液体水素容器１０の上下方向に位置するもので、例えばＸ線の照射方向に対して直交する方向に設けられる。遮蔽部材３０は、タンタルやタングステンの板材よりなるもので、スリット３１が例えば１ｍｍ間隔で設けられている。スリット３１の間隔は、液位計測の分解能（１ｍｍ程度）を定める。
半導体検出器３２は、スリット３１を通過した平行光束のＸ線を検出する。
算出装置３４は、検出した後方散乱Ｘ線に基づいて中心軸での液位を算出する。Ｘ線強度モニタ３６は、半導体検出器３２で検出されたＸ線強度を可視化するもので、例えばバーグラフ表示器が用いられる。
なお、遮蔽部材３０をＸ線の照射方向に対して直交する方向に設けると、Ｘ線検出装置は、Ｘ線の検出方向軸が照射軸に対し９０°で交差するように配向されることとなる。しかし、前記直交する方向は設置作業の便宜のために定めたものであり、散乱Ｘ線の強度が強く検出が容易となる角度に設置すれば良い。例えばＸ線検出装置は、Ｘ線の検出方向軸が照射軸に対し、３０～１６５°の間で交差するように遮蔽部材３０を設置しても良く、また可能であれば１０～１７０°で交差するように遮蔽部材３０を設置しても良い。Ｘ線の検出方向軸が照射軸に対し１０°未満で交差すると、弾性散乱Ｘ線と液面測定に必要な散乱Ｘ線との分離が困難になるという不都合がある。また、Ｘ線の検出方向軸が照射軸に対し１７０°を超えた角度で交差すると、Ｘ線照射源と検出器の設置が重なるという不都合がある。
The shielding member 30 is located in the vertical direction of the liquid hydrogen container 10, and is provided, for example, in a direction perpendicular to the direction of X-ray irradiation. The shielding member 30 is made of a plate material of tantalum or tungsten, and has slits 31 provided at intervals of, for example, 1 mm. The interval between the slits 31 determines the resolution (about 1 mm) of liquid level measurement.
The semiconductor detector 32 detects the parallel beam of X-rays that has passed through the slit 31.
The calculation device 34 calculates the liquid level at the central axis based on the detected backscattered X-rays. The X-ray intensity monitor 36 visualizes the X-ray intensity detected by the semiconductor detector 32, and uses, for example, a bar graph display.
Note that when the shielding member 30 is provided in a direction perpendicular to the X-ray irradiation direction, the X-ray detection device is oriented so that the X-ray detection direction axis intersects the irradiation axis at 90 degrees. Become. However, the orthogonal directions are determined for convenience of installation work, and it is sufficient to install at an angle where the intensity of scattered X-rays is strong and detection is easy. For example, in the X-ray detection device, the shielding member 30 may be installed so that the X-ray detection direction axis intersects the irradiation axis at an angle of 30 to 165 degrees, and if possible, an angle of 10 to 170 degrees. The shielding members 30 may be installed so as to intersect with each other. If the X-ray detection direction axis intersects the irradiation axis at an angle of less than 10°, there is a disadvantage that it becomes difficult to separate the elastically scattered X-rays from the scattered X-rays necessary for liquid level measurement. Further, if the X-ray detection direction axis intersects the irradiation axis at an angle of more than 170°, there is a problem that the X-ray irradiation source and the detector are installed in the same direction.
このように構成された液面計の動作を次に説明する。
図２は、Ｘ線コンプトン散乱の説明図で、１個のＸ線光子が物質中の１個の電子に衝突し、散乱された場面を表している。コンプトン効果とは、光子のエネルギーが大きくて電子と衝突した後でも光子として残って散乱し、散乱Ｘ線の波長が入射Ｘ線の波長より長くなる現象である。照射されたＸ線の振動数をωｉ［Ｈｚ］、散乱Ｘ線の振動数をωｆ［Ｈｚ］、入射方向と散乱方向とのなす角（散乱角）をθ、電子の質量をｍ［ｋｇ］、衝突前の電子のポテンシャルエネルギーをＶｉ［Ｊ］、散乱された電子のポテンシャルエネルギーをＶｆ［Ｊ］、衝突前の電子の運動量をｐｉ［ｋｇ・ｍ／ｓ］、散乱された電子の運動量をｐｆ［ｋｇ・ｍ／ｓ］、プランク定数をｈ［Ｊ・ｓ］とすると、次式で表される。
The operation of the liquid level gauge configured in this way will be explained next.
FIG. 2 is an explanatory diagram of X-ray Compton scattering, showing a scene in which one X-ray photon collides with one electron in a substance and is scattered. The Compton effect is a phenomenon in which a photon has so much energy that even after colliding with an electron, it remains as a photon and is scattered, making the wavelength of the scattered X-rays longer than the wavelength of the incident X-rays. The frequency of the irradiated X-rays is ωi [Hz], the frequency of the scattered X-rays is ωf [Hz], the angle between the incident direction and the scattering direction (scattering angle) is θ, and the mass of the electron is m [kg]. , the potential energy of the electron before collision is Vi [J], the potential energy of the scattered electron is Vf [J], the momentum of the electron before collision is pi [kg・m/s], the momentum of the scattered electron is When pf [kg·m/s] and Planck's constant are h [J·s], it is expressed by the following formula.
液体水素用タンク内の液体水素下の環境では、気体－液面境界面で水素分子密度が不連続的に変化することから、コンプトン散乱の特徴を生かして、水素貯蔵容器であるステンレス鋼や断熱材で囲まれた容器内の水素の液面位置を検出できる。入射Ｘ線と、反射Ｘ線の検出器の幾何学的配置は任意であり、状況に応じて適切な散乱角度（θ）を設定できる。入射Ｘ線装置・検出器ともに水素容器の外に設置されるため、入射・検出装置自体の水素脆化・低温脆化の問題は生じない。 In the liquid hydrogen environment inside a liquid hydrogen tank, the density of hydrogen molecules changes discontinuously at the gas-liquid interface. It is possible to detect the position of the hydrogen liquid level in a container surrounded by material. The geometrical arrangement of the detectors for incident X-rays and reflected X-rays is arbitrary, and an appropriate scattering angle (θ) can be set depending on the situation. Since both the incident X-ray device and the detector are installed outside the hydrogen container, there is no problem of hydrogen embrittlement or low-temperature embrittlement of the incident/detection device itself.
また、散乱Ｘ線を検出する半導体素子も既存の市販品を使えるため、測定コストは低い。液面の高さの検出精度は、検出器内部の素子やスリットの配置に依存するものの、１ｍｍ以下の精度も実現可能である。この精度は、現在用いられている寒剤容器の液面計の精度以上にできる。 Furthermore, since existing commercially available semiconductor elements for detecting scattered X-rays can be used, the measurement cost is low. The detection accuracy of the liquid level height depends on the arrangement of elements and slits inside the detector, but it is possible to achieve an accuracy of 1 mm or less. This accuracy is higher than that of the liquid level gauges currently used in cryogen containers.
次に、超伝導線を用いた方式と比較した、本発明の液面計の効果を列記する。
（１）容器内部にセンサー類を導入しないですみ、センサー類を介した熱流入、センサー類の水素脆化・低温脆化を防ぐことができる。
（２）Ｘ線コンプトン散乱によれば、液体水素用タンクの材料に用いられるステンレス鋼や断熱材を透過して、その内部にある液体水素の残留量を把握できる。
（３）容器外部から内部に向けて照射されたＸ線は、タンク内の水素中の電子により散乱される。その際の散乱強度は気相・液相で異なり、密度の大きな液相の散乱強度が強くなる。その強度の違いを気相・液相境界として液面位置の判定が精密にできる。
Next, the effects of the liquid level gauge of the present invention will be listed in comparison with a system using a superconducting wire.
(1) There is no need to introduce sensors inside the container, and it is possible to prevent heat inflow through the sensors and hydrogen embrittlement and low-temperature embrittlement of the sensors.
(2) According to X-ray Compton scattering, the amount of liquid hydrogen remaining inside can be determined by transmitting through the stainless steel and heat insulating materials used in liquid hydrogen tanks.
(3) X-rays irradiated from the outside of the container toward the inside are scattered by electrons in the hydrogen inside the tank. The scattering intensity at this time differs between the gas phase and the liquid phase, and the scattering intensity is stronger in the liquid phase, which has a higher density. The difference in strength can be used as the boundary between the gas and liquid phases to accurately determine the position of the liquid level.
水素などの軽元素では、同時に放出される蛍光Ｘ線に対して相対的にコンプトン散乱強度が強くなる。さらに、高エネルギーＸ線を用いるため透過性も高く、非破壊非接触で測定できることも大きな特徴である。 In light elements such as hydrogen, the Compton scattering intensity becomes stronger relative to the simultaneously emitted fluorescent X-rays. Furthermore, since it uses high-energy X-rays, it has high transparency, and its ability to perform non-destructive and non-contact measurements is also a major feature.
なお、上記の実施の形態では、液体水素用タンクを例に液体水素と水素ガスの境界面をＸ線コンプトン散乱を用いて検出する場合を説明しているが、本発明はこれに限定されるものではない。例えば、液体水素用タンクに代えて、液体ヘリウム用タンク、液体空気用タンク、液体窒素用タンク、若しくは他の寒剤保存用タンクに用いられ、Ｘ線検出装置によって、液体水素と水素ガスに代えて、液体ヘリウムとヘリウムガス、液体空気と空気、液体窒素と窒素ガス、若しくは他の寒剤で生ずる液体相とガス相の境界の検出に用いるものでもよい。 Note that in the above embodiment, a case has been described in which the interface between liquid hydrogen and hydrogen gas is detected using X-ray Compton scattering using a liquid hydrogen tank as an example, but the present invention is limited to this. It's not a thing. For example, instead of a liquid hydrogen tank, it can be used as a liquid helium tank, liquid air tank, liquid nitrogen tank, or other cryogen storage tank, and an X-ray detection device can replace liquid hydrogen and hydrogen gas. , liquid helium and helium gas, liquid air and air, liquid nitrogen and nitrogen gas, or other cryogens.
本発明の液面計によれば、クリーンエネルギーである水素の大量利用に対し、容器内の液体水素の容量について、Ｘ線コンプトン散乱法を用いている。Ｘ線コンプトン散乱法では、容器外部から内部に入射されたＸ線に対し、内部にある寒剤の液相・気相からの反射がそれぞれの密度の違いとして判別でき、その境界から液面の位置が判定できる。この方法では容器外部から計測のためのセンサー類などを、容器内部に導入する必要がない。
これは、従来型の延長といえる超伝導線を容器内部に導入した液面計などと比較し、熱流入の抑制、水素脆化・低温脆化の懸念がない、容器の大きさに依存しない、容器の構造が簡素化され、精密計測が可能、という利点を有する。
According to the liquid level gauge of the present invention, the X-ray Compton scattering method is used to determine the volume of liquid hydrogen in the container for the large-scale use of hydrogen, which is clean energy. In the X-ray Compton scattering method, the reflection from the liquid and gas phases of the cryogen inside the container can be determined as the difference in density of X-rays incident from outside the container into the inside, and the position of the liquid surface can be determined from the boundary. can be determined. With this method, there is no need to introduce sensors or the like into the container for measurement from outside the container.
Compared to liquid level gauges that introduce superconducting wires into the container, which can be considered an extension of conventional methods, this technology suppresses heat inflow, eliminates concerns about hydrogen embrittlement and low-temperature embrittlement, and is independent of the size of the container. This has the advantage that the structure of the container is simplified and precise measurement is possible.
１０ 液体水素容器（液体水素用タンク）
１０ａ 液体水素容器外壁
１０ｂ 液体水素容器内壁
１２ 断熱層
１４ 水素ガス
１６ 液体水素
２０ Ｘ線源（Ｘ線照射装置）
２２ Ｘ線源上下駆動機構
３０ 遮蔽部材
３１ スリット
３２ 半導体検出器（Ｘ線検出装置）
３４ 算出装置
３６ Ｘ線強度モニタ
10 Liquid hydrogen container (liquid hydrogen tank)
10a Liquid hydrogen container outer wall 10b Liquid hydrogen container inner wall 12 Heat insulation layer 14 Hydrogen gas 16 Liquid hydrogen 20 X-ray source (X-ray irradiation device)
22 X-ray source vertical drive mechanism 30 Shielding member 31 Slit 32 Semiconductor detector (X-ray detection device)
34 Calculation device 36 X-ray intensity monitor
Claims (9)
前記Ｘ線照射装置を前記液体水素用タンクの上下方向に移動して、前記Ｘ線の照射軸の前記水素用タンクにおける高さを調整する上下方向駆動手段を有し、
前記遮蔽部材は、前記液体水素用タンクの上下方向に一定間隔で設けられたスリットを有し、前記スリットを通過したＸ線が前記Ｘ線検出装置に入射し、
前記Ｘ線検出装置は、後方散乱Ｘ線を検出すると共に、当該後方散乱Ｘ線のＸ線線量及びエネルギー量を測定し、
前記算出装置は、検出した後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量に基づいて前記液体水素用タンクの液体水素と水素ガスの境界面の液位を求める液面計。 An X-ray irradiation device that irradiates X-rays of a predetermined energy in a direction parallel to the liquid surface toward the central axis of a liquid hydrogen tank, and detects backscattered X-rays generated near the central axis by the X-rays. a shielding member that shields a portion of the backscattered X-rays in front of the X-ray detector; and a calculation that calculates the liquid level at the central axis based on the detected backscattered X-rays. A liquid level gauge comprising a device,
comprising a vertical drive means for moving the X-ray irradiation device in the vertical direction of the liquid hydrogen tank to adjust the height of the X-ray irradiation axis in the hydrogen tank;
The shielding member has slits provided at regular intervals in the vertical direction of the liquid hydrogen tank, and the X-rays passing through the slits enter the X-ray detection device,
The X-ray detection device detects backscattered X-rays and measures the X-ray dose and energy amount of the backscattered X-rays,
The calculation device is a liquid level meter that calculates the liquid level at the interface between liquid hydrogen and hydrogen gas in the liquid hydrogen tank based on the X-ray dose at a specific energy of the detected backscattered X-rays.
前記Ｘ線検出装置は、前記コリメーターの摺動方向に直交する方向に移動可能であり、
前記算出装置は、前記中心軸の近傍の所定範囲における走査情報を生成する走査情報生成部を有する請求項３記載の液面計。 The collimator is slidable in a direction parallel to the liquid level,
The X-ray detection device is movable in a direction perpendicular to the sliding direction of the collimator,
4. The liquid level gauge according to claim 3, wherein the calculation device includes a scanning information generation section that generates scanning information in a predetermined range near the central axis.
Ｘ線検出装置は、液体水素と水素ガスに代えて、液体ヘリウムとヘリウムガス、液体空気と空気、液体窒素と窒素ガス、若しくは他の寒剤で生ずる液体相とガス相の境界の検出に用いられる、
請求項１～６のいずれかに記載の液面計。 Instead of the liquid hydrogen tank, it is used as a liquid helium tank, liquid air tank, liquid nitrogen tank, or other cryogen storage tank,
X-ray detection equipment is used to detect boundaries between liquid and gas phases that occur in liquid helium and helium gas, liquid air and air, liquid nitrogen and nitrogen gas, or other cryogens instead of liquid hydrogen and hydrogen gas. ,
The liquid level gauge according to any one of claims 1 to 6.
前記遮蔽部材は、前記液体水素用タンクの上下方向に一定間隔で設けられたスリットを有し、前記スリットを通過したＸ線が前記Ｘ線検出装置に入射するように構成され、
前記Ｘ線照射装置を前記液体水素用タンクの上下方向に移動して、前記中心軸の近傍に向けてＸ線を照射し、
前記中心軸の近傍で生じた後方散乱Ｘ線を検出すると共に、当該後方散乱Ｘ線のＸ線線量及びエネルギー量を測定し、
検出した後方散乱Ｘ線の特定のエネルギーにおけるＸ線線量に基づいて前記液体水素用タンクの液体水素と水素ガスの境界面の液位を求める液位測定方法。 An X-ray irradiation device that irradiates X-rays with a predetermined energy in a direction parallel to the liquid surface near the liquid surface of a liquid hydrogen tank, and backscattered X-rays generated near the central axis by the X-rays. An X-ray detection device for detecting, a shielding member for shielding a portion of the backscattered X-rays in front of the X-ray detection device, and a liquid level near the central axis based on the detected backscattered X-rays. A liquid level measuring method using a liquid level gauge equipped with a calculating device,
The shielding member has slits provided at regular intervals in the vertical direction of the liquid hydrogen tank, and is configured such that X-rays passing through the slits enter the X-ray detection device,
moving the X-ray irradiation device in the vertical direction of the liquid hydrogen tank and irradiating X-rays toward the vicinity of the central axis;
Detecting backscattered X-rays generated near the central axis and measuring the X-ray dose and energy amount of the backscattered X-rays,
A liquid level measuring method for determining the liquid level at the interface between liquid hydrogen and hydrogen gas in the liquid hydrogen tank based on the X-ray dose at a specific energy of the detected backscattered X-rays.
前記Ｘ線検出装置は、液体水素と水素ガスに代えて、液体ヘリウムとヘリウムガス、液体空気と空気、液体窒素と窒素ガス、若しくは他の寒剤で生ずる液体相とガス相の境界の検出に用いられる、
請求項８に記載の液位測定方法。
Instead of the liquid hydrogen tank, it is used as a liquid helium tank, liquid air tank, liquid nitrogen tank, or other cryogen storage tank,
The X-ray detection device is used to detect boundaries between liquid and gas phases that occur in liquid helium and helium gas, liquid air and air, liquid nitrogen and nitrogen gas, or other cryogens instead of liquid hydrogen and hydrogen gas. be able to,
The liquid level measuring method according to claim 8.
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