JP2023548191A - 化学プラントにおける動作ポイントを判定するためのシステム - Google Patents

化学プラントにおける動作ポイントを判定するためのシステム Download PDF

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Publication number
JP2023548191A
JP2023548191A JP2023527039A JP2023527039A JP2023548191A JP 2023548191 A JP2023548191 A JP 2023548191A JP 2023527039 A JP2023527039 A JP 2023527039A JP 2023527039 A JP2023527039 A JP 2023527039A JP 2023548191 A JP2023548191 A JP 2023548191A
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Japan
Prior art keywords
time series
signal time
plant
determining
score
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Pending
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JP2023527039A
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Japanese (ja)
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JP2023548191A5 (https=
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パック，ロベルト
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BASF SE
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BASF SE
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Publication of JP2023548191A publication Critical patent/JP2023548191A/ja
Publication of JP2023548191A5 publication Critical patent/JP2023548191A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2023527039A 2020-11-06 2021-11-08 化学プラントにおける動作ポイントを判定するためのシステム Pending JP2023548191A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20206291.5 2020-11-06
EP20206291 2020-11-06
PCT/EP2021/080986 WO2022096728A1 (en) 2020-11-06 2021-11-08 System for determining operating points in a chemical plant

Publications (2)

Publication Number Publication Date
JP2023548191A true JP2023548191A (ja) 2023-11-15
JP2023548191A5 JP2023548191A5 (https=) 2024-11-15

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ID=73172608

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JP2023527039A Pending JP2023548191A (ja) 2020-11-06 2021-11-08 化学プラントにおける動作ポイントを判定するためのシステム

Country Status (5)

Country Link
US (1) US20230418272A1 (https=)
EP (1) EP4241144A1 (https=)
JP (1) JP2023548191A (https=)
CN (1) CN116547620A (https=)
WO (1) WO2022096728A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12411484B2 (en) * 2021-12-28 2025-09-09 AO Kaspersky Lab System and method for diagnostics and monitoring of anomalies of a cyber-physical system
CN118331202A (zh) * 2024-04-19 2024-07-12 重庆市弘鼎圣科技有限公司 一种智慧工厂数据的管理方法及管理系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009076056A (ja) * 2007-07-27 2009-04-09 General Electric Co <Ge> 異常集約方法
JP2010537282A (ja) * 2007-08-14 2010-12-02 シエル・インターナシヨナル・リサーチ・マートスハツペイ・ベー・ヴエー 化学プラントや精製所の連続オンラインモニタリング用のシステムおよび方法
JP2013218725A (ja) * 2013-06-19 2013-10-24 Hitachi Ltd 異常検知方法及び異常検知システム
WO2018073960A1 (ja) * 2016-10-21 2018-04-26 日本電気株式会社 表示方法、表示装置、および、プログラム
US20190227504A1 (en) * 2016-07-07 2019-07-25 Aspen Technology, Inc. Computer System And Method For Monitoring Key Performance Indicators (KPIs) Online Using Time Series Pattern Model

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3200037A1 (en) * 2016-01-26 2017-08-02 Basf Se System and method for risk based control of a process performed by production equipment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009076056A (ja) * 2007-07-27 2009-04-09 General Electric Co <Ge> 異常集約方法
JP2010537282A (ja) * 2007-08-14 2010-12-02 シエル・インターナシヨナル・リサーチ・マートスハツペイ・ベー・ヴエー 化学プラントや精製所の連続オンラインモニタリング用のシステムおよび方法
JP2013218725A (ja) * 2013-06-19 2013-10-24 Hitachi Ltd 異常検知方法及び異常検知システム
US20190227504A1 (en) * 2016-07-07 2019-07-25 Aspen Technology, Inc. Computer System And Method For Monitoring Key Performance Indicators (KPIs) Online Using Time Series Pattern Model
WO2018073960A1 (ja) * 2016-10-21 2018-04-26 日本電気株式会社 表示方法、表示装置、および、プログラム

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Publication number Publication date
US20230418272A1 (en) 2023-12-28
WO2022096728A1 (en) 2022-05-12
CN116547620A (zh) 2023-08-04
EP4241144A1 (en) 2023-09-13

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