JP2023163156A - 複数の並列接続された半導体スイッチの監視のための方法および装置 - Google Patents

複数の並列接続された半導体スイッチの監視のための方法および装置 Download PDF

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Publication number
JP2023163156A
JP2023163156A JP2023071401A JP2023071401A JP2023163156A JP 2023163156 A JP2023163156 A JP 2023163156A JP 2023071401 A JP2023071401 A JP 2023071401A JP 2023071401 A JP2023071401 A JP 2023071401A JP 2023163156 A JP2023163156 A JP 2023163156A
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JP
Japan
Prior art keywords
semiconductor switches
time
semiconductor
parallel
monitored
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2023071401A
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English (en)
Japanese (ja)
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JP2023163156A5 (enExample
Inventor
アンドレアス・クライン
Klein Andreas
クリストフ・カンマー
Kammer Christoph
クリストフ・フリードリヒ
Friederich Christoph
マルク・ショーバー
Schober Marc
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Robert Bosch GmbH
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Robert Bosch GmbH
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Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of JP2023163156A publication Critical patent/JP2023163156A/ja
Publication of JP2023163156A5 publication Critical patent/JP2023163156A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/12—Modifications for increasing the maximum permissible switched current
    • H03K17/122—Modifications for increasing the maximum permissible switched current in field-effect transistor switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/18—Modifications for indicating state of switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Power Conversion In General (AREA)
  • Inverter Devices (AREA)
JP2023071401A 2022-04-27 2023-04-25 複数の並列接続された半導体スイッチの監視のための方法および装置 Pending JP2023163156A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102022204075.9 2022-04-27
DE102022204075.9A DE102022204075A1 (de) 2022-04-27 2022-04-27 Verfahren und Vorrichtung zur Überwachung einer Vielzahl parallelgeschalteter Halbleiterschalter

Publications (2)

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JP2023163156A true JP2023163156A (ja) 2023-11-09
JP2023163156A5 JP2023163156A5 (enExample) 2026-05-01

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ID=88306662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023071401A Pending JP2023163156A (ja) 2022-04-27 2023-04-25 複数の並列接続された半導体スイッチの監視のための方法および装置

Country Status (4)

Country Link
US (1) US12235321B2 (enExample)
JP (1) JP2023163156A (enExample)
CN (1) CN116953461A (enExample)
DE (1) DE102022204075A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102024138847B3 (de) * 2024-12-19 2026-03-26 Schaeffler Technologies AG & Co. KG Verfahren zum Überwachen einer Schaltung, Steuerungsvorrichtung und Schaltung
CN121522439A (zh) * 2025-11-24 2026-02-13 滨州市沾化区通达检测有限公司 一种汽车智能化综合性能检测系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015226628A1 (de) 2015-12-23 2017-06-29 Robert Bosch Gmbh Vorrichtung und Verfahren zur Stromüberwachung einer Mehrzahl von Halbleiterschaltern
DE102016223511A1 (de) 2016-11-28 2018-05-30 Robert Bosch Gmbh Verfahren zum Erkennen eines Ausfalls eines parallel geschalteten Halbleiters
DE102018114375B4 (de) * 2018-06-15 2024-06-13 Infineon Technologies Ag Leistungselektronikanordnung

Also Published As

Publication number Publication date
US20230349975A1 (en) 2023-11-02
US12235321B2 (en) 2025-02-25
DE102022204075A1 (de) 2023-11-02
CN116953461A (zh) 2023-10-27

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