JP2023118304A - Inspection apparatus and inspection method - Google Patents

Abstract

To provide an inspection apparatus and an inspection method that can handle a wide variety of products in small quantities.SOLUTION: An inspection apparatus 100 includes: an imaging device 220; a lighting device 210; an arm driving device 200 that holds the imaging device 220 and the lighting device 210 with an arm 205; a holding device 300 that holds an object to be inspected so as to be movable along and rotationally around a vertical axis; a casing 500 that can accommodate the arm driving device 200 and the holding device 300; a moving device 600 that can move while supporting the casing 500; and a single power supply 400 that supplies power to the imaging device 220, the lighting device 210, the arm driving device 200, and the holding device 300.SELECTED DRAWING: Figure 1

Description

The present invention relates to an inspection apparatus and an inspection method for smoothly inspecting an object to be inspected.

Patent Document 1 (Japanese Patent Application Laid-Open No. 2021-67592) discloses an inspection system capable of inspecting an object to be inspected without omission in consideration of spatial restrictions.
The inspection system described in Patent Document 1 is an inspection system for inspecting an object to be inspected, and includes an imaging device and a rotary table, the imaging device includes a camera and a driving mechanism, and the camera comprises: The rotary table is provided in the drive mechanism and configured to be movable by the drive mechanism so as to photograph the inspection object from different viewpoints and lines of sight, and the rotary table is configured to be rotatable on which the inspection object is placed. It is a thing.

Patent Document 2 (Japanese Patent Application Laid-Open No. 2019-82333) discloses an inspection device with improved abnormality determination accuracy.
The inspection apparatus described in Patent Document 2 includes an illumination unit that illuminates a test object with illumination light having a predetermined pattern, and the illumination light is specularly reflected by the surface of the test object illuminated by the illumination unit. an imaging unit configured to capture a mirror image of the formed pattern, wherein the imaging unit is focused on the surface of the test object and captures the mirror image of the pattern.

In Patent Document 3 (Japanese Patent Application Laid-Open No. 2019-158553), it is necessary to acquire a plurality of images of the inspection object while maintaining the positional relationship between the inspection object and the imaging device while changing only other imaging conditions. 2. Description of the Related Art In image inspection, a technique has been disclosed that enables imaging while changing the position of an inspection target with respect to an imaging device.
The image inspection apparatus described in Patent Document 3 is an image inspection apparatus for inspecting an inspection object with an image, and includes imaging means for imaging the inspection object, and periodically changing the position of the inspection object with respect to the imaging means. and a plurality of images with different imaging conditions are acquired at a plurality of timings at which the inspection object is at a predetermined position with respect to the imaging means, which are periodically repeated by the relative change. and a control means for causing the imaging means to image the inspection object.

Patent Document 4 (Japanese Unexamined Patent Application Publication No. 2016-38204) discloses a sensor unit for inner surface shape inspection and an inner surface shape inspection apparatus that reduces measurement blind spots.
The sensor unit described in Patent Document 4 is a sensor unit for inspecting the inner surface shape of a hole formed in an inspection object, and includes a parallel ring laser light generation unit that emits parallel ring laser light, and the parallel ring laser light and the parallel ring laser beam from the half mirror unit is incident from one end and guided toward the other end, the reflected light from the inner surface of the hole is taken in from the other end, and the half It includes a light guiding section that emits light to a mirror unit, and an imaging section that receives the reflected light that has passed through the half mirror unit.

Patent Document 5 (Japanese Patent Application Laid-Open No. 2017-003415) discloses that defects on the surface of the object are detected with high accuracy compared to the case of inspecting the surface of the object by the light section method using one light source. An inspection device, an inspection method, and an inspection program are disclosed.
The inspection apparatus described in Patent Document 5 extends in a strip shape in a direction crossing the surface of the object in one direction in which the surface of the object moves, irradiates two irradiation regions arranged in the one direction with light individually, and two light sources arranged adjacent to each other in one direction; an imaging unit configured to capture an image between the two irradiation regions or a region where the two irradiation regions overlap; and a generation unit for generating a difference image between the images obtained by the imaging unit while one or the other light source is lit.

Patent Document 6 (Japanese Patent Application Laid-Open No. 2013-160531) discloses an inspection apparatus that inspects defects in the outer shape of an object to be inspected with high accuracy.
The inspection apparatus described in Patent Document 6 includes an imaging unit that captures an image of an object to be inspected and generates image data that includes an inspection area that is an image area corresponding to an inspection portion of the object to be inspected; a smoothing unit that smoothes the pixel value of each pixel to generate smoothed image data; A difference unit for generating data, and a determination unit for determining whether or not an object to be inspected is a non-defective product based on the degree of similarity between reference image data as an inspection reference for an inspection region and the difference image data. .

JP 2021-67592 A JP 2019-82333 A JP 2019-158553 A JP 2016-38204 A JP 2017-003415 A JP 2013-160531 A

Various researches and developments have been made on inspection devices, and large-sized inspection devices are often fixedly arranged as inspection systems. However, in factories and the like that handle small-lot production of a wide variety of products, the cost of introducing an inspection system is high, so manual inspection is used. There is a current situation where the demand for automation is increasing even in production sites such as these small-lot, high-mix production. In addition, the need for automation is increasing along with the shortage of human resources due to the corona disaster.

SUMMARY OF THE INVENTION A main object of the present invention is to provide an inspection apparatus and an inspection method that can deal with a large variety of products in small quantities.
Another object of the present invention is to provide an inspection apparatus and an inspection method in which the apparatus itself is movable and which can deal with small-lot production of a wide variety of products.

(1)
An inspection apparatus according to one aspect includes an imaging device, an illumination device, an arm driving device that holds the imaging device and the illumination device with arms, a holding device that holds an object to be inspected rotatably along a vertical axis, and an arm driving device. a housing capable of housing the device and the holding device, a moving device capable of moving while supporting the housing, a single power supply section supplying power to the imaging device, the lighting device, the arm driving device, and the holding device; includes.

In this case, the imaging device, lighting device, arm driving device, and holding device in the housing can be easily moved by the moving device. As a result, the inspection apparatus can be easily moved when inspecting a large variety of products in small quantities. In addition, it is possible to perform inspection by taking an image with an imaging device attached to the arm driving device while rotating the object to be inspected around the vertical axis. As a result, omnidirectional inspection can be reliably carried out for a wide variety of products in small quantities. In particular, the length of the arm can be extended by enlarging the arm driving device, but in that case, the size of the inspection device itself becomes large, making it difficult to move. In the present invention, by providing the arm driving device and the holding device, the size of the arm driving device is reduced, and as a result, the size and mobility of the inspection device are increased.
In addition, since all devices can be driven with a single power, it is easy to secure power even when moving.

(2)
An inspection apparatus according to a second aspect of the present invention is an inspection apparatus according to one aspect, further including a holding section, the arm driving device supporting a central portion of the holding section, an imaging device provided on one end side of the holding section, and An illumination device may be provided on the end side, and the holding device may move up and down in the vertical direction while holding the object to be inspected.

In this case, the holding device is vertically movable, the arm driving device supports the central portion of the holding portion, the imaging device is provided at one end of the holding portion, and the lighting device is provided at the other end. Therefore, the weight of the lighting device and the weight of the imaging device are arranged in a well-balanced manner. As a result, a counterweight effect is produced, and when the arm of the arm driving device operates, the moment applied to the arm can be reduced. As a result, the size of the arm driving device can be reduced.

(3)
An inspection apparatus according to a third aspect is the inspection apparatus according to the second aspect, wherein the holding portion is made of resin, the imaging device has a focal length of 20 mm or less, and the lighting device is full or predetermined. You may have a lighting system that allows for percentage lighting.

In this case, since the holding portion is made of resin, the size of the arm driving device can be reduced. Also, the resin may be a UV curable resin, a thermoplastic resin, a shape-retaining resin, a resin produced by lamination molding using a 3D printer, or any other resin. Furthermore, the holding portion may be a combination of simple plate shapes, or may be a shape obtained by a topology optimization method.
In addition, since the imaging device has a focal length of 20 mm or less, it is possible to use a small imaging device, thereby reducing the weight and miniaturization of the inspection device. That is, by using a lens with a short focal length, the distance to the object can be set short. As a result, the distance between the robot and the workpiece can be shortened, and as a result, the housing size of the inspection apparatus can be reduced both horizontally and vertically. Furthermore, by shortening the focal length, the arm distance of the arm driving device can also be shortened. As a result, the arm driving device itself can be made smaller, and the inspection device itself can be further reduced in size and weight. Become.
Furthermore, since the lighting device can be turned on at all lights or at a predetermined rate, by emitting light a plurality of times at different predetermined rates and changing the irradiation direction of the light to take an image, defects in the object to be inspected can be reliably detected. can be detected.

(4)
An inspection apparatus according to a fourth invention is the inspection apparatus according to one aspect to the third invention, wherein the housing has a frame structure, and the single power supply unit is a single-phase 100 volt or a single-phase 200 volt. There may be.

In this case, since the housing has a frame structure, it is possible to reduce the size of the mobile device. In addition, since the single power supply section consists of either single-phase 100 volts or single-phase 200 volts, it is easy to secure a power source. Moreover, in the case of the single-phase 100 volt specification, it is possible to reduce the size of all the devices provided in the housing.

(5)
An inspection apparatus according to a fifth aspect is an inspection apparatus according to one aspect to the fourth aspect, wherein the moving device is arranged at the bottom of the housing, has an unmanned transport function, an automatic traveling function, and does not move at a predetermined position. and/or a moving function for moving to a predetermined position.

In this case, since the moving device is arranged in the lower part of the housing, it is possible to easily move the entire housing. In particular, by having an automatic traveling function or an unmanned transportation function, it can automatically travel according to the schedule and move to the inspection place. In addition, it is not limited to these, and it may be movable with casters or a trolley driven by human power, and may further include a collision prevention device or the like. Further, it is more preferable that the moving device has a braking function in order to suppress unintended movement during inspection.

(6)
An inspection apparatus according to a sixth aspect of the invention is an inspection apparatus according to any one of the first to fifth aspects of the invention, wherein the housing further includes a spring balancer, and the spring balancer may hold wiring of the imaging device and the lighting device. .

In this case, by providing the spring balancer, the weight of the cables extending from the imaging device and the lighting device can be borne by the spring balancer without being borne by the arm driving device. As a result, it is possible to reduce the size of the inspection apparatus.

(7)
An inspection apparatus according to a seventh aspect of the invention is the inspection apparatus according to the sixth aspect of the invention, further including an inspection object receiving device, wherein the inspection object receiving device moves the inspection object before inspection to the holding device. At the same time, the object to be inspected after inspection may be taken out.

In this case, by arranging the device for receiving the object to be inspected at each inspection location for small-lot, high-mix products, the inspection device can be moved to carry out the inspection. In addition, since the object to be inspected can be automatically taken out before and after the inspection by the object receiving device, manpower can be reduced.

(8)
An inspection method according to another aspect includes an imaging device for imaging an object to be inspected, an illumination device for irradiating the object to be inspected, an arm driving device for holding and moving the imaging device and the illumination device, and an object for inspection. An inspection method for inspecting an object to be inspected, comprising a holding device for holding an object to be inspected and a single power supply unit for supplying power to each device, comprising: a moving step of moving a housing by a moving device; and a light emission imaging step of emitting light and imaging from all directions of an object to be inspected while holding the illumination device by the arm driving device, and a rotational movement step of rotating the object to be inspected around a vertical axis while holding it by the holding device. includes.

In this case, the imaging device, lighting device, arm driving device, and holding device in the housing can be easily moved by the moving device. As a result, the inspection apparatus can be easily moved when inspecting a large variety of products in small quantities. In addition, it is possible to perform inspection by taking an image with an imaging device attached to the arm driving device while rotating the object to be inspected around the vertical axis. As a result, omnidirectional inspection can be reliably carried out for a wide variety of products in small quantities. In particular, the length of the arm can be extended by enlarging the arm driving device, but in that case, the size of the inspection device itself becomes large, making it difficult to move. In the present invention, by providing the arm driving device and the holding device, the size of the arm driving device is reduced, and as a result, the size and mobility of the inspection device are increased.
In addition, since all the devices can be driven with a single power, it is easy to secure power even when moving.

1 is a schematic block diagram showing an example configuration of an inspection apparatus according to an embodiment; FIG. FIG. 4 is a schematic perspective view showing an example of a tip of an arm of an arm driving device; FIG. 4 is a schematic side view showing an example of a tip of an arm of an arm driving device; It is an internal structure side view which shows an example of an inspection apparatus. It is an internal structure perspective view which shows an example of an inspection apparatus. 4 is a flow chart showing an example of control of the inspection apparatus according to the present embodiment; FIG. 2 is a schematic explanatory diagram showing an example of an inspection device in which an autonomous collaborative robot (AMR) is used as a mobile device;

Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following description, the same reference numerals are given to the same parts. Moreover, in the case of the same reference numerals, their names and functions are also the same. Therefore, detailed description thereof will not be repeated.

[Embodiment]
FIG. 1 is a schematic block diagram showing an example of the configuration of an inspection apparatus 100 according to this embodiment, and FIG. 2 is a schematic perspective view showing an example of a distal end 206 of an arm 205 of an arm driving device 200. 3 is a schematic side view showing an example of the tip 206 of the arm 205 of the arm driving device 200. FIG.

(Inspection device 100)
As shown in FIG. 1, the inspection device 100 mainly includes an arm driving device 200, a holding device 300, a single power supply 400, a housing 500 and a moving device 600. As shown in FIG.

(Arm drive device 200)
In this embodiment, the arm drive device 200 uses a six-axis collaborative robot (universal robot) with an arm 205 length of 350 mm or less. Further, the tip 206 of the arm 205 of the arm driving device 200 is provided with a lighting device 210, an imaging device 220, and a holding portion 250, which will be described later.
The arm driving device 200 can inspect an object to be inspected held by the holding device 300 using the lighting device 210 and the imaging device 220 with the function of a six-axis collaborative robot.
In the present embodiment, a human collaborative robot CVR038A1 manufactured by Denso Wave Co., Ltd. is used as the arm drive device 200 . The weight capacity of the arm drive device 200 according to the present embodiment is 500 grams, and the weight capacity of the present embodiment is designed to be less than that.

(Lighting device 210)
As shown in FIG. 2, lighting device 210 according to the present embodiment has a plurality of LEDs arranged in a ring shape inside. Further, a predetermined number of LEDs among the plurality of LEDs can be individually lit. As a result, the ring-shaped circumference can be divided into 8 sections, each of which can be lit by 1/8. As a result, the object to be inspected can be irradiated with light from different directions. The weight of lighting device 210 in this embodiment is 305 grams.
In the present embodiment, a ring light IMDR-130DWHV-8ch manufactured by Imac Co., Ltd. is used as the lighting device 210 .

(Imaging device 220)
Next, the imaging device 220 used a 5-megapixel camera. Furthermore, the focal length of the lens of the imaging device 220 is preferably 20 mm or less. Also, in this embodiment, a lens with a focal length of 8 mm is used. The imaging device 220 performs imaging of the object to be inspected in synchronization with the light emission of the illumination device 210 . The weight of the imaging device 220 in this embodiment is 120 grams.
In the present embodiment, lighting device 210 and imaging device 220 are used separately, but the present invention is not limited to this, and imaging device 220 integrated with lighting device 210 may be used. good.
In this embodiment, STC-MCS500POE manufactured by Omron Corporation was used as the imaging device 220 .

(Holding device 300)
In addition, the holding device 300 is capable of rotating the object to be inspected around the vertical axis and having a function of being able to drive the object vertically up and down. That is, while rotating the object to be inspected held by the holding device 300, the object to be inspected is inspected from above by the imaging device 220 or the like moved by the arm driving device 200, and the holding device 300 is driven vertically upward. Thus, the object to be inspected is lifted, and the lower side (back surface, etc.) of the object to be inspected can also be inspected by the imaging device 220 or the like.
Further, the holding device 300 can automatically receive an object to be inspected before inspection and discharge the object to be inspected after inspection by means of object receiving devices 910, 920, 930, etc., which will be described later. Note that the holding device 300 is not limited to the object receiving devices 910, 920, and 930, and may receive the object manually.
In the present embodiment, as the main configuration of the holding device 300, an electric actuator capable of rotating vertically and around the vertical axis and a controller for operating the electric actuator are used.

(single power supply 400)
Next, as shown in FIG. 1, a single power supply 400 is a device that receives single phase 100 volt power and converts it to either 24 volts DC, 12 volts DC or 5 volts DC. It should be noted that it may be a device that converts into a plurality of numbers. The single power supply unit 400 supplies the converted DC voltage to all of the arm driving device 200, lighting device 210, imaging device 220, and holding device 300. FIG.
Note that the single power supply unit 400 may be a device that receives single-phase 200 volt power used in a factory or the like and converts it to either DC 24 volts, DC 12 volts, or DC 5 volts.
Since the inspection apparatus 100 according to the present embodiment is movable, by using one of the single power supply units 400 as a device that receives power, it is possible to easily obtain power after movement. That is, there is an advantage that power can be supplied to the inspection apparatus 100 with a single touch.
In addition, when the single power supply unit 400 is compatible with single-phase 100 volts, all of the arm driving device 200, lighting device 210, imaging device 220, and holding device 300 are compared with the case where they are compatible with single-phase 200 volts. can be made smaller.
On the other hand, when the single power supply unit 400 is compatible with single-phase 200 volts, the arm driving device 200 and the holding device 300 are increased in size compared to the case of single-phase 100 volts, and can be handled even if the size of is large.
Also, although not shown, the single power supply 400 may have an outlet cable on the lower side of the housing 500 that can be connected to a single-phase 100 volt power source within the facility.

(Case 500)
The external shape of housing 500 according to the present embodiment is 1600 mm or less in height, 750 mm or less in width, and 900 mm or less in depth. Further, the housing 500 is mainly composed of a frame for weight reduction. In this embodiment, a panel made of resin may be attached to the frame other than the receiving or discharging portion of the object to be inspected.
In this embodiment, a LAN connector that can be connected to a personal computer or the like for collecting test results and an emergency stop button that stops all the functions of each device in an emergency are provided on the outer surface of the housing 500. .

(Moving device 600)
Subsequently, for the moving device 600, casters were arranged in the lower part of the housing 500 for cost reduction. Further, the moving device 600 according to this embodiment has a horizontal adjustment function. That is, it has a function that allows the inspection apparatus 100 to maintain a horizontal state. An example of using an automatic guided vehicle (AGV) or an autonomous collaborative robot (AMR) instead of casters as the moving device 600 will be described later.

(Distal end 206 of arm 205)
Further, in the present embodiment, as shown in FIGS. 1, 2, and 3, arm drive device 200 has illumination device 210, imaging device 220, and holding portion 250 at tip 206 of arm 205. As shown in FIGS. As shown in FIG. 3, the holding portion 250 is made of a substantially T-shaped resin member. Also, the illumination device 210 is provided on one end side of the holding portion 250 , and the imaging device 220 is provided on the other end side of the holding portion 250 . The holding portion 250 is lightened by providing a plurality of holes. In particular, the holding part 250 weighs 23 grams when the generative design is used, and the weight is reduced to 49 grams when the T shape of the present embodiment is used. In addition, it is preferable that the weight is within 500 grams including fixing tools such as screws.

(Relationship among illumination device 210, imaging device 220, and holding unit 250)
Further, the distal end portion 206 of the arm 205 of the arm driving device 200 is fixed between the illumination device 210 and the imaging device 220 . As shown in FIG. 3, with the tip 206 of the arm 205 as a reference, the center of gravity of the illumination device 210 is located at a distance L1, and the center of gravity of the imaging device 220 is located at a distance L2.
A force F21 from the center of gravity of the lighting device 210 is applied downward, and a force F22 from the center of gravity of the imaging device 220 is applied downward. On the other hand, the supporting force F206 of the tip 206 of the arm 205 is applied upward. As a result, the force F21 and the force F22 have a counterweight relationship.
In this embodiment, the distance L1 is 27 mm and the distance L2 is 36 mm. Further, as will be described later, in the present embodiment, lighting device 210 and imaging device 220 are both lightweight, but are driven by arm driving device 200 capable of operating with power from single-phase 100 volts. Therefore, it is necessary to have a structure that can withstand the rotational moment during driving.

In this embodiment, in order to provide a structure capable of withstanding the rotational moment during driving, the center of gravity of lighting device 210 is placed on one end side of holding portion 250 using holding portion 250 with respect to the support position of tip 206 of arm 205 . , and the center of gravity of the imaging device 220 is arranged on the other end side. As a result, compared to the case where the illumination device 210 and the imaging device 220 are arranged at the tip 206 of the arm 205, the rotational moment can be reduced by about 53%. It is preferable to reduce the rotational moment by 40% or more, preferably 50% or more.
In this embodiment, as shown in FIGS. 3 and 4, the holding portion 250 is a T-shaped member, but is not limited to this, and may be shaped by a topology optimization method. That is, the holding portion 250 may be formed by a three-dimensional printer.

(Internal structure of inspection device 100)
Next, FIG. 4 is a side view of the internal structure showing an example of the inspection device 100, and FIG. 5 is a perspective view of the internal structure showing an example of the inspection device 100. As shown in FIG.

As shown in FIGS. 4 and 5, the housing 500 is formed in the shape of a rectangular parallelepiped, and the frame is formed by a rectangular framework. A spring balancer 550 is provided on the upper frame of the housing 500 .
A spring balancer 550 is provided to hold wiring of the imaging device 220 , the lighting device 210 and the arm driving device 200 . Here, the spring balancer 550 is a mechanism that maintains the weight of each wire, which is an object to be suspended, by changing the torque of the spring to a tapered drum. and a device for preventing the weight of the wiring of the imaging device 220 from being applied to the arm 205 .

As a result, the arm driving device 200 can move the illumination device 210 and the imaging device 220 provided at the tip 206 of the arm 205 without applying extra force (weight and moment of wiring) to the arm 205 .
At the same time as the movement, the holding device 300 can move the object to be inspected in the vertical direction and rotate it around the vertical axis. .
Specifically, several images are captured in one direction by the imaging device 220, and by changing the irradiation direction (applying method) of the light from the illumination device 210 in each case of capturing the several images, An examination of the specimen can be performed.

Next, FIG. 6 is a flow chart showing an example of control of the inspection apparatus 100 in this embodiment.

As shown in FIG. 6, the inspection apparatus 100 first turns on the power by turning the power ON/OFF (step S1).
Next, the inspection device 100 checks whether an abnormality has occurred (step S2). If no abnormality has occurred, the process proceeds to step S4. On the other hand, if an abnormality has occurred, it is determined whether or not the abnormality has been reset (step S3), and before the reset, the processes from step S1 to step S3 are repeated. If the abnormality is not reset even after repeating the process a predetermined number of times, the power may be turned off.

Next, as shown in FIG. 6, the inspection apparatus 100 starts returning to origin (step S5) when there is a request to return to origin (step S4). to process.

After starting the origin return, it is determined whether or not the origin return is completed (step S6), and if it is determined that the origin return is not completed or the origin return cannot be performed, the inspection apparatus 100 judges that an abnormality has occurred and determines that the origin return is not possible. Return to the process of S2 and repeat the process.

On the other hand, when it is determined that the origin return has been performed, the inspection device 100 determines whether the holding device 300 and the arm driving device 200 for inspection are operable (step S7), and determines that they are operable. If so, the operation is started (step S8). That is, an inspection process, which will be described later, is performed.
On the other hand, when it is determined that the holding device 300 and the arm driving device 200 for inspection are inoperable, it is assumed that an abnormality has occurred, and the process returns to step S2 to repeat the process.

Finally, the inspection apparatus 100 completes the operation when the inspection process is finished (step S9). Then, the inspection apparatus 100 returns to the process of step S3 and repeats the process.
On the other hand, if the inspection process is not completed or cannot be completed, it is determined that the operation is not completed and an abnormality has occurred, and the process returns to step S2 to repeat the process.

Next, an example of an inspection method according to this embodiment will be described. First, an object to be inspected is imaged by changing the irradiation of light from the illumination device 210 four times from above, and rotated by the holding device 300 by 90 degrees around the vertical axis. The imaged result is transmitted to a personal computer (not shown) and checked for flaws or defects. Note that the angle and the number of times described above may be arbitrarily changed according to the number of pixels of the imaging device 220, the imaging range, and the focal length.

Subsequently, the holding device 300 raises the object to be inspected vertically upward. Then, the object to be inspected is imaged by changing the irradiation of light from the illumination device 210 four times from the lower surface, and the object to be inspected is rotated by the holding device 300 by 90 degrees around the vertical axis.
The imaging result is transmitted to a personal computer (not shown), and checked for flaws or defects. Based on these results, it is determined whether the object to be inspected is a non-defective product or a defective product.
Through the steps described above, an inspection can be performed based on the imaging result of the imaging device 220 .

Next, FIG. 7 is a schematic explanatory diagram showing an example of the inspection device 100 when the mobile device 600 is an autonomous collaborative robot (AMR).

As shown in FIG. 7, the case where the inspection apparatus 100 is used in a predetermined factory will be described. In this embodiment, the mobile device 600 is an autonomous collaborative robot and has either a battery, a storage battery, or a generator, and is designed to supply power to each device. .

First, the inspection apparatus 100 moves to an inspection place of the object A to be inspected by an autonomous collaborative robot (AMR). Then, the object to be inspected A is transferred to the holding device 300 by the object to be inspected receiving device 910 . The inspection apparatus 100 inspects an object A to be inspected.
Next, when the inspection of the object to be inspected A is completed, the object to be inspected A is taken out from the holding device 300 by the object receiving device 910 to be inspected. If there are a plurality of objects A to be inspected before inspection, the processing is repeated. As a matter of course, the inspection object receiving device 910 takes out the good inspection object A and the defective inspection object A, and then stores them in different positions.

Next, the inspection apparatus 100 automatically moves from the inspection location for the object A to the inspection location for the object B by an autonomous collaborative robot (AMR).
Then, the object to be inspected B is transferred to the holding device 300 by the object to be inspected receiving device 920 . The inspection apparatus 100 inspects the object B to be inspected.
Next, when the inspection of the object to be inspected B is completed, the object to be inspected B is taken out from the holding device 300 by the object receiving device 920 to be inspected. If there are a plurality of objects B to be inspected before inspection, the processing is repeated. As a matter of course, the inspection object receiving device 920 takes out the good inspection object B and the defective inspection object B, and then stores them in different positions.

Next, the inspection apparatus 100 automatically moves from the inspection location for the object B to the inspection location for the object C by an autonomous collaborative robot (AMR).
Then, the object to be inspected C is transferred to the holding device 300 by the object to be inspected receiving device 930 . The inspection apparatus 100 inspects the object C to be inspected.
Next, when the inspection of the object to be inspected C is completed, the object to be inspected C is taken out from the holding device 300 by the object receiving device 930 to be inspected. When there are a plurality of objects C to be inspected before inspection, the processing is repeated. Similarly, the inspection object receiving device 930 takes out the good inspection object C and the defective inspection object C, and then stores them in different positions.

In this way, when the mobile device 600 is composed of an automatic guided vehicle (AGV) or an autonomous collaborative robot (AMR), the number of inspection objects A, B, and C or predetermined inspection data is received. In this case, the moving device 600 may be made to input a program for moving to the inspection place of the next object to be inspected. Further, in the present embodiment, the inspection objects A, B, and C may be conveyed by a belt conveyor and received by the holding device 300 of the inspection apparatus 100 by the inspection object receiving device.

As described above, the inspection apparatus 100 according to the present invention can deal with small-lot, high-mix production. In addition, the movable inspection apparatus 100 can be easily moved by a moving device 600 such as a caster, and can be easily inspected by a single power supply unit 400 when manually operated. Furthermore, the movable inspection device 100 does not require human power when it is based on an autonomous collaborative robot (AMR) or an automatic guided vehicle (AGV), and human resources can be used effectively.

In addition, the inspection apparatus 100 according to the present invention can detect any defects such as dirt, scratches, foreign matter, defects, attachment positions of parts, inclination of parts, orientation of parts, dents, nameplates, chips, uneven coating, etc. of the object to be inspected. can be inspected. In particular, the inspection apparatus 100 can easily deal with a small-lot, high-variety inspection object with a complicated shape.

In the present invention, the inspection device 100 corresponds to the "inspection device", the imaging device 220 corresponds to the "imaging device", the illumination device 210 corresponds to the "illumination device", the arm 205 corresponds to the "arm", The arm driving device 200 corresponds to the “arm driving device”, the objects A, B, and C to the “inspected objects”, the holding device 300 to the “holding device”, and the housing 500 to the “housing device”. The moving device 600 corresponds to the “moving device”, the single power supply unit 400 corresponds to the “single power supply unit”, the holding unit 250 corresponds to the “holding unit”, and the spring balancer 550 corresponds to a "spring balancer", device receiving devices 910, 920, and 930 correspond to "devices to be tested", a method using the inspection device 100 corresponds to an "inspection method", and moving device The process of moving 600 corresponds to the "moving process", the method using the illumination device 210 and the imaging device 220 corresponds to the "light emission imaging process", and the holding device 300 rotates around the vertical axis while holding the object to be inspected. The step of moving corresponds to the “rotational movement step”.

Although one preferred embodiment of the invention is described above, the invention is not so limited. It is understood that various other embodiments can be made without departing from the spirit and scope of the invention. Furthermore, in this embodiment, the actions and effects of the configuration of the present invention are described, but these actions and effects are examples and do not limit the present invention.

REFERENCE SIGNS LIST 100 inspection device 200 arm driving device 205 arm 210 lighting device 220 imaging device 250 holding section 300 holding device 400 single power supply section 500 housing 600 moving device 550 spring balancer 910, 920, 930 object receiving device A, B, C object to be inspected

Claims (8)

an imaging device;
a lighting device;
an arm driving device that holds the imaging device and the lighting device with an arm;
a holding device that holds an object to be inspected rotatably along a vertical axis; a housing that can accommodate the arm driving device and the holding device;
a moving device capable of moving while supporting the housing;
and a single power supply that provides power to the imaging device, the illumination device, the arm drive, and the holding device. further comprising a holding part;
The arm driving device supports a central portion of the holding portion,
The imaging device is provided on one end side of the holding portion, and the lighting device is provided on the other end side,
2. The inspection apparatus according to claim 1, wherein said holding device is vertically movable while holding said object to be inspected. 3. The apparatus according to claim 2, wherein said holding portion is made of resin, said imaging device has a focal length of 20 mm or less, and said lighting device has a lighting system capable of lighting all lights or a predetermined ratio of lighting. inspection equipment. 4. The inspection apparatus according to any one of claims 1 to 3, wherein the housing has a frame structure, and the single power supply is single phase 100 volts or single phase 200 volts. The moving device is arranged in the lower part of the housing and includes at least one of an unmanned transport function, an automatic traveling function, a braking function for preventing movement at a predetermined position, and a moving function for moving to a predetermined position. Item 5. The inspection device according to any one of Items 1 to 4. the housing further includes a spring balancer;
The inspection apparatus according to any one of claims 1 to 5, wherein the spring balancer holds wiring of the imaging device and the lighting device. further comprising a device for receiving an object to be inspected;
7. The inspection apparatus according to any one of claims 1 to 6, wherein said inspection object receiving device moves said inspection object before inspection to said holding device and takes out said inspection object after inspection. An imaging device for imaging an object to be inspected, an illumination device for irradiating the object to be inspected, an arm driving device for holding and moving the imaging device and the illumination device, and holding the object to be inspected in a housing provided with a moving device and a single power supply unit for supplying power to each device, the inspection method for inspecting the object to be inspected,
a moving step of moving the housing by the moving device;
a light emission imaging step of emitting light and capturing images from all directions of the object to be inspected while holding the imaging device and the lighting device by the arm driving device;
and a rotational movement step of rotating the object to be inspected around a vertical axis while holding the object by the holding device.