JP2023106251A - Glossiness inspection device and glossiness inspection method - Google Patents

Abstract

To provide a glossiness inspection device and a glossiness inspection method that can quantitatively evaluate the glossiness of an inspection target surface quickly without contacting an inspection target body.SOLUTION: The glossiness inspection device includes: an illumination light source device for emitting illumination light to an inspection target surface; an imaging device for imaging reflection light caused by the illumination light applied on the inspection target surface; and an analyzer for determining the change of the glossiness of the inspection target surface on the basis of the degree of diffusion of the reflection light in a reflection light image of the reflection light imaged by the imaging device.SELECTED DRAWING: Figure 1

Description

The present invention relates to a gloss inspection device and a gloss inspection method.

A member such as a window molding used for the exterior of an automobile protects the automobile body and has the effect of enhancing the aesthetic appearance of the automobile by adding an accent to the design of the automobile. The window molding is made of metal or the like, and is sometimes plated or coated with resin in order to enhance its luster. For example, when bending a component whose surface has been processed to give it a glossy feel, the glossiness of the surface may change due to a whitening phenomenon or the like, and the glossiness may deviate from the reference range. Judgment as to whether or not the glossiness of the window molding satisfies the standard has conventionally been made visually.

JP 2012-107936 A Japanese Patent No. 6431643 JP 2012-141322 A

However, since sensory evaluation by visual observation tends to generate artificial differences, a quantitative evaluation method has been desired. As a quantitative evaluation method, there are an evaluation method using a surface roughness meter, an evaluation method using an AFM microscope, an evaluation method using a laser microscope or an optical microscope, an evaluation method using a gloss meter, and the like. In either method, point measurement or measurement within a very narrow range is performed on the surface to be inspected, and evaluation of the entire part requires an extremely large number of measurements, requiring labor and time. Moreover, either method requires contacting or cutting the part. Contact with the part, not to mention the cutting of the part, may damage the part, which may interfere with the use of the part after evaluation. Further, methods for inspecting surface defects without contacting parts have been disclosed (see Patent Literatures 1 to 3), but none of these methods inspects whether gloss satisfies standards.

In view of the above problems, an object of the present invention is to provide a gloss inspection apparatus and a gloss inspection method that perform quantitative evaluation in a short period of time without contacting a subject.

A first aspect of the present invention includes an irradiation light source device for irradiating a surface to be inspected with irradiation light, an imaging device for imaging reflected light generated by the irradiation light irradiated on the surface to be inspected, and an image captured by the imaging device. The gist of the present invention is to have an analysis device for determining a change in glossiness of a surface to be inspected based on the degree of diffusion of reflected light from a reflected light image of the reflected light.

In the first aspect of the present invention, the imaging device may have a screen section and a camera section, and the camera section may capture reflected light projected on the screen section.

In the first aspect of the present invention, the irradiation light may be laser light.

In the first aspect of the present invention, the degree of diffusion is determined based on the radius of the circular portion, the length of the minor axis, or the length of the major axis of the elliptical portion generated by the projected image of the reflected light projected on the screen portion. may be

In the first aspect of the present invention, the irradiation light source device and the imaging device move with respect to the surface to be inspected at the same speed and in the same direction, take an image of the surface to be inspected at predetermined distances, and analyze the However, it is also possible to synthesize the obtained reflected light images and determine the portion of gloss change and the degree of gloss change on the surface to be inspected.

In the first aspect of the present invention, the degree of diffusion may be determined by measuring the brightness of the projected reflected light with respect to the position on the screen and by the positional distribution of the brightness.

In the first aspect of the present invention, the degree of diffusion may be determined based on the result obtained by applying a line convergence index filter to the projected image of the reflected light generated on the screen.

A second aspect of the present invention includes an illumination light source device that emits illumination light, an imaging device that captures reflected light generated by the illumination light, and a reflected light image of the reflected light captured by the imaging device to diffuse the reflected light. A gloss inspection method for a gloss inspection apparatus having a processor for determining a change in gloss of a surface to be inspected based on the degree of gloss inspection, comprising: an irradiation step of irradiating the surface to be inspected with irradiation light from an irradiation light source device; and a determination step of determining a change in glossiness of the surface to be inspected by the processing device.

ADVANTAGE OF THE INVENTION According to this invention, the gloss inspection apparatus and gloss inspection method which perform quantitative evaluation of the gloss of a to-be-tested object surface in a short time, without contacting a to-be-tested object can be provided.

1 is a schematic diagram of an example of a gloss inspection device according to a first embodiment of the present invention; FIG. FIGS. 2A and 2B are diagrams for explaining an inspection method by the gloss inspection apparatus according to the first embodiment, FIG. It is a figure when glossiness is falling. 1 is a schematic diagram of a part of a gloss inspection apparatus according to a first embodiment and a plating mold as an object; FIG. 4A and 4B are diagrams showing images projected by the gloss inspection apparatus according to the first embodiment, in which FIG. It is a figure when it is falling. 5 is a graph showing changes in brightness of the projection image shown in FIG. 4 with respect to positions in the horizontal direction in the drawing; FIG. 6 is a diagram showing the result of performing LCF processing on the inspection result shown in FIG. 4, FIG. FIG. 10 is a diagram showing a case where the degree is lowered; 4 is a flowchart for explaining a gloss inspection method using the gloss inspection apparatus according to the first embodiment; It is a schematic diagram of an example of a gloss inspection apparatus according to a second embodiment. It is a figure which shows a mode that the installation part of the glossiness inspection apparatus which concerns on this embodiment is attached to the robot arm. It is a figure explaining the inspection method which measures for every predetermined distance on a test object with the glossiness inspection apparatus which concerns on 2nd Embodiment.

Next, embodiments of the present invention will be described with reference to the drawings. In the description of the drawings according to the embodiments, the same or similar parts are denoted by the same or similar reference numerals. However, it should be noted that the drawings are schematic, and the relationship with planar dimensions and the like are different from the actual ones. Therefore, specific dimensions should be determined with reference to the following description. In addition, it is a matter of course that there are portions with different dimensional relationships and ratios between the drawings.

Further, the embodiments illustrate devices and methods for embodying the technical idea of the present invention. It does not specify anything. Various modifications can be made to the technical idea of the present invention within the technical scope defined by the claims.

(First embodiment)
FIG. 1 shows a schematic diagram of an example of the gloss inspection apparatus according to the first embodiment of the present invention. A gloss inspection apparatus 10 shown in FIG.

The irradiation light source device 101 irradiates the subject 106 with the irradiation light 105 . Irradiation light 105 is reflected at an irradiation area 108 on the surface of the subject 106 and reflected light 107 is projected onto the screen 102 . A projected image 109 of the reflected light 107 projected on the screen 102 is captured by the camera 103 . The captured projection images are sent to the processing device 104 . The projected image is used to determine gloss changes in the illuminated area 108 of the subject 106 in the processor 104 . The subject 106 referred to here is a glossy metal member such as stainless steel, for example, a member such as a window molding.

The irradiation light 105 may be any kind of light as long as the beam width is constant in the traveling direction of the irradiation light 105 . In this embodiment, the irradiation light 105 is assumed to be laser light. The processing device 104 is a variety of electronic computers (computational resources) such as personal computers (PCs), mainframes, workstations, cloud computing systems, and the like. The illustrated processing unit 104 is a personal computer to which a display for displaying inspection results, a keyboard for input, a mouse, and the like are connected. Assume that the subject 106 has been processed to have a glossy surface.

A gloss inspection method using the gloss inspection apparatus according to the present embodiment will be described with reference to FIG. In both FIGS. 2(a) and 2(b), subjects 201 and 202 are irradiated with illumination light 203 from an illumination light source device (not shown), and reflected lights 204 and 205 from the subjects 201 and 202 are projected onto a screen. A state of projection onto 206 and 207 is shown.

A test object 201 shown in FIG. 2A and a test object 202 shown in FIG. 2B are manufactured so that their surfaces have approximately the same degree of glossiness. Irradiation regions 208 and 209 are regions on the surfaces of the subjects 201 and 202, respectively, which are irradiated with the irradiation light 203. FIG. The irradiated region 209 is processed so as to cause whitening by, for example, bending so as to exceed the yield point. It is assumed that an abnormality such as whitening that changes glossiness does not occur in the irradiation area 208 of the object 201 .

Both of the irradiated regions 208 and 209 have fine unevenness on the surface, but the irradiated region 209, which is a surface where whitening occurs, is more uneven than the irradiated region 208, which is a surface where whitening does not occur. The depth of the unevenness is greater than that of the unevenness, and the area of the unevenness is also wide. Therefore, the degree of diffusion of the reflected light 205 generated by irradiating the irradiation area 209 with the irradiation light 203 is greater than the degree of diffusion of the reflected light 204 .

The angle of incidence of the irradiation light 203 on the irradiation region 208 and the angle of incidence of the irradiation light 203 on the irradiation region 209 are the same, and the distance between the irradiation region 208 and the screen 206 and the irradiation region 209 The subjects 201 and 202, the irradiation light source device, and the screens 206 and 207 are arranged so that the distances between them and the screen 207 are the same. Reflected lights 204 and 205 are projected onto screens 206 and 207 respectively, and projected onto screens 206 and 207 as projection images 210 and 211 . If the cross section of the irradiation light 203 is circular, the irradiation regions 208 and 209 are flat, and the surfaces of the screens 206 and 207 are set perpendicular to the traveling direction of the reflected lights 204 and 205, The projected images 210, 211 are circular. The radii of the circular projected images 210 and 211 change according to the degree of diffusion of the reflected lights 204 and 205 . That is, by measuring the radii of the projected images 210 and 211, it is possible to obtain changes in the degree of diffusion of the reflected light. From the degree of diffusion of the reflected light, it can be determined whether or not the degree of gloss has changed.

The degree of diffusion of reflected light may be measured by any method as long as the intensity distribution of the cross section of reflected light can be detected. In this embodiment, the camera 103 captures a projection image of the reflected light 107 projected on the screen 102 and transmits the captured projection image to the processing device 104 . In the processing device 104, it is determined whether or not there is a change in glossiness in the irradiation area 108 by the luminance distribution of the projected image shown in FIG. .

3 and 4, the results of actual inspection by the gloss inspection apparatus according to the present embodiment using a window molding as an object will be described. FIG. 3 shows a schematic diagram of a window molding 301, which is an object, and a part of the gloss inspection apparatus according to this embodiment. A window molding 301 shown in FIG. 3 has an L-shaped columnar cross section 302 . The surface is processed to make it glossy. The window molding shown in FIG. 3 is first manufactured to have a plate-like shape with an I-shaped cross section. The shape shown in FIG. 3 is formed by bending the ridge portion 303, which is a portion. Since the ridge portion 303 is bent, the glossiness of the ridge portion 303 often changes due to whitening or the like.

In FIG. 3 , irradiation light 304 is irradiated onto an irradiation area 308 of a ridge portion 303 and reflected light 305 is projected onto a screen 306 . The ridge portion 303 is curved in the xy plane of FIG. 3 and is not curved in the z-axis direction. Irradiate toward the ridge portion 303 . The surface of the screen 306 is installed so as to be perpendicular to the traveling direction of the reflected light 305 . Assuming that the cross section of the light of the irradiation light 304 is circular, the projection 307 of the reflected light 305 projected onto the screen 306 due to the curved shape of the ridge portion 303 is an ellipse having a major axis in the direction perpendicular to the z-axis. becomes.

Since the ridge 303 is not curved in the z-axis direction, the length of the minor axis of the elliptical projection 307 is not considered to be affected by the curved shape of the ridge 303 . However, when there is a change in glossiness in the illuminated area 308, the degree of diffusion of the reflected light is changed, and the length of the short axis of the ellipse in the projected image 307 is changed. Therefore, in this case, by measuring the change in the length of the minor axis of the elliptical projection 307, the change in glossiness occurs in the irradiation area 308 without considering the influence of the curved shape of the ridge portion 303. You can check if there is

The length of the major axis of the elliptical projection 307 is affected by both the curved shape of the ridge portion 303 and the degree of gloss in the illuminated area 308 . Therefore, for example, if a plurality of regions on the surface of the ridge portion 303 have the same curved shape, by measuring the difference in the length of the major axis of the elliptical projection 307, the degree of glossiness can be determined to be the same. You can check if there is

FIG. 4 shows an image projected by the gloss inspection apparatus according to this embodiment shown in FIG. FIG. 4A shows a case where the glossiness of the irradiated portion of the subject is within the reference range, and FIG. 4B shows a case where the glossiness of the irradiated portion of the subject is low. Both of the projected images shown in FIGS. 4A and 4B are ellipsoids having a major axis in the vertical direction of FIG. Compared with the projection image shown in FIG. 4(a), the projection image shown in FIG. 4(b) is seen to spread in the minor axis direction of the ellipse. It can also be confirmed by visually observing FIG.

FIG. 5 shows a graph showing changes in brightness of the projection image of FIG. 4 with respect to the position in the horizontal direction of the drawing. Data A in FIG. 5 indicates changes in brightness along line a in FIG. 4A, and data B in FIG. 5 indicates changes in brightness along line b in FIG. 4B. As compared with data A in FIG. 5, data B in FIG. 5 shows spread in luminance distribution with respect to position. 5, the spread of the luminance distribution of the projection image of FIG. 4 can be expressed numerically, and therefore the degree of change in gloss can be numerically expressed.

FIG. 6 is an image processed by the line convergence degree filter. A line concentration filter (LCF) process was performed on the projected image shown in FIG. 4 above. The LCF processing is an image processing that displays an image in such a way that it becomes whiter as the luminance gradient increases. FIG. 6 shows the result of performing LCF processing on the projection image shown in FIG. The LCF processing in FIG. 6 is performed on the luminance gradient in the horizontal direction within the screen in FIG. Compared with the LCF-processed projection image shown in FIG. 6A, the LCF-processed projection image shown in FIG. Compared with the difference between the projection images shown in FIGS. 4A and 4B, the difference between the LCF-processed projection images shown in FIGS. 6A and 6B is remarkable. I know there is.

A gloss inspection method according to this embodiment will be described with reference to the flowchart of FIG. In step S701, the surface to be inspected is irradiated with irradiation light by the irradiation light source device.

In step S702, an imaging device captures an image of reflected light from the surface to be inspected.

In step S703, the reflected light image of the reflected light captured by the imaging device is used to determine the change in glossiness of the surface to be inspected based on the degree of diffusion of the reflected light.

As described above, when the surface to be inspected is irradiated with irradiation light, the change in glossiness of the surface to be inspected can be confirmed from the spread of the luminance distribution of the reflected light image of the reflected light. The spread of the luminance distribution of the reflected light image can be visually confirmed. By expressing the luminance distribution of the reflected light image by numerical values, it is possible to confirm the change in glossiness based on the numerical values. Furthermore, by performing line concentration filter processing on the reflected light image, it is possible to more clearly confirm the change in gloss.

(Second embodiment)
FIG. 8 shows a schematic diagram of an example of the gloss inspection apparatus according to the second embodiment. A gloss inspection apparatus 80 shown in FIG. Further, FIG. 9 shows how the installation section 805 of the gloss inspection apparatus according to this embodiment is attached to the robot arm 901 .

The illumination light source device 801, the screen 802, and the camera 803 are attached to the installation portion 805, and the distance and angle between the illumination light source device 801, the screen 802, and the camera 803 are fixed. . The installation unit 805 is attached to the tip of the robot arm 901, as shown in FIG. 805 is moved. The irradiation light source device 801, the camera 803, and the robot arm 901 are connected to a processing device 804. The processing device 804 determines the irradiation timing of the irradiation light 806 by the irradiation light source device 801, the timing of photographing by the camera 803, and the setting unit. Translation and rotation movement of 805 are controlled.

First, an irradiation light source device 801 irradiates a desired position on the surface of a subject 807 with irradiation light 806, reflected light 808 is projected onto a screen 802, and a projected image 809 projected onto the screen 802 is photographed by a camera 803. The installation portion 805 is translated and rotated as much as possible. Next, the subject 807 is irradiated with irradiation light 806 by the irradiation light source device 801 . Irradiation light 806 is reflected at an irradiation area 810 on the surface of a subject 807 and reflected light 808 is projected onto a screen 802 . A projected image 809 of reflected light 808 projected onto a screen 802 is captured by a camera 803 . The captured projection image 809 is sent to the processing unit 804 . The projection image 809 is used to determine the change in gloss on the surface of the subject 807 in the processing device 804 .

Referring to FIG. 10, a description will be given of an inspection method in which measurements are performed at predetermined distances on a subject using the gloss inspection apparatus according to the second embodiment. FIG. 10 shows how the surface of the object 1001 is inspected by the gloss inspection device at predetermined distances. 1003-n, only screen 1004 is shown. A subject 1001 is the same as the window mall shown in FIG. Along the ridge portion 1002 of the subject 1001, irradiation of the irradiation light 806 and photographing by the camera 803 are performed at predetermined distances, and projected images 1003-1 to 1003- on the screen 1004 by the reflected light reflected in each irradiation area. get n.

The installation portion 805 is moved parallel to the ridge portion 1002 at a constant speed. Each irradiation area is photographed by the camera 803 at predetermined time intervals so that the distance between the irradiation areas becomes a desired distance. The irradiation timing of the irradiation light 806 from the irradiation light source device 801 and the timing of photographing by the camera 803 may be synchronized, and the irradiation light 806 may be irradiated in accordance with the photographing timing of the camera 803, or the photographing timing of the camera 803. The irradiation may be always turned on without synchronizing with . In this embodiment, the irradiation of the irradiation light 806 from the irradiation light source device 801 is always on.

The length of each minor axis of the projection images 1003-1 to 1003-n is calculated. The calculated short axis lengths of the projected images 1003-1 to 1003-n are 2, 1, 2, and 4, respectively. distribution can be detected.

As described above, the present invention naturally includes various embodiments and the like that are not described here. Therefore, the technical scope of the present invention is defined only by the matters specifying the invention according to the valid scope of claims based on the above description.

10, 80 Gloss inspection device 101, 801 Irradiation light source device 102, 206, 207, 306, 802, 1004 Screen 103, 803 Camera 104, 804 Processing device 105, 203, 304, 806 Irradiation light 106, 201, 202, 807 , 1001 Subject 107, 204, 205, 305, 808 Reflected light 108, 208, 209, 308, 810 Irradiation area 109, 210, 211, 307, 809, 1003-1 to 1003-n Projected image 301 Window mall 302 Cross section 303, 1002 ridge portion 805 installation portion 901 robot arm

Claims (8)

an irradiation light source device for irradiating the surface to be inspected with irradiation light;
an imaging device for imaging reflected light generated by the irradiation light applied to the surface to be inspected;
and an analysis device that determines a change in glossiness of the surface to be inspected based on the degree of diffusion of the reflected light from the reflected light image captured by the imaging device. The imaging device is
having a screen section and a camera section,
2. The gloss inspection apparatus according to claim 1, wherein the reflected light projected onto the screen is photographed by the camera. 3. A gloss inspection apparatus according to claim 1, wherein said irradiation light is laser light. The degree of diffusion is determined based on the radius of a circular portion, the length of the minor axis of the elliptical portion, or the length of the major axis of the projected image of the reflected light projected onto the screen. The gloss inspection device according to claim 2. The irradiation light source device and the imaging device move with respect to the surface to be inspected at the same speed and in the same direction, and capture images of the surface to be inspected at predetermined distances, and the analysis device is obtained. 3. A gloss inspection apparatus according to claim 2, wherein said reflected light images are image-synthesized to determine the portion of gloss change and the degree of gloss change on said surface to be inspected. 6. The gloss according to any one of claims 2 to 5, wherein the degree of diffusion is determined by measuring the brightness of the projected reflected light with respect to the position on the screen and by the positional distribution of the brightness. inspection equipment. 7. The gloss inspection apparatus according to claim 6, wherein the degree of diffusion is determined based on a result obtained by applying a line concentration degree filter to the projected image of the reflected light generated on the screen. an irradiation light source device that emits irradiation light;
an imaging device that captures reflected light generated by the irradiation light;
A gloss inspection method in a gloss inspection device, comprising: a processing device that determines a change in gloss of the surface to be inspected based on a degree of diffusion of the reflected light from a reflected light image of the reflected light captured by the imaging device; ,
an irradiation step of irradiating the surface to be inspected with the irradiation light from the irradiation light source device;
an imaging step of imaging the reflected light with the imaging device;
and a determination step of determining a change in gloss of the surface to be inspected by the processing device.

Images