JP2023058071A - Inspection system, inspection device, inspection method and inspection program - Google Patents

Abstract

To make it possible to properly inspect an inspection object.SOLUTION: There is provided an inspection system for inspecting an inspection object. A first imaging device images a side surface of the inspection object when an illumination device performs illumination. A second imaging device images an upper surface of the inspection object. An acquisition unit acquires a side surface image obtained by imaging the side surface of the inspection object. A side surface inspection unit specifies the position of the side surface in the side surface image captured by the first imaging device on the basis of the upper surface image captured by the second imaging device, and inspects the side surface by analyzing the image with the first inspection standard at the specified first position and the second inspection standard at the specified second position. Even when the surface shapes of the side surface are the same, the appearances of the side surface in the side surface image are different at the first position and the second position due to the action of illumination.SELECTED DRAWING: Figure 5

Description

The present invention relates to an inspection system, an inspection apparatus, an inspection method, and an inspection program.

In recent years, in the manufacturing process of products such as containers, conforming products and non-conforming products have been sorted out by image inspection or the like. For example, Patent Literature 1 describes an inspection apparatus for inspecting defects in a container having a sealing portion that closes an opening.

JP 2013-068507 A

However, the technique described in Patent Document 1 has a problem that it may not be possible to inspect surfaces with low characteristics in terms of shape and pattern. For example, products using materials such as resin, paper, and frosted glass may transmit or reflect different amounts of light depending on the position of the surface. In this case, the inspection apparatus may not be able to properly inspect the surface of the object to be inspected due to the difference in brightness depending on the position of the surface.

The present disclosure has been made in view of the above points, and provides an inspection system, an inspection apparatus, an inspection method, and an inspection program capable of appropriately inspecting an object to be inspected.

(1) The present disclosure has been made to solve the above problems, and one aspect of the present disclosure is an inspection system that inspects an object to be inspected. a first imaging device for imaging a side surface of the object to be inspected, a second imaging device for imaging an upper surface of the object to be inspected, an acquisition unit for acquiring a side image obtained by imaging the side surface of the object to be inspected; Based on the upper surface image captured by the second imaging device, the position of the side surface in the side image captured by the first imaging device is specified, and at the specified first position, the first inspection standard and the specified second and a side inspection unit that inspects the side surface by analyzing the side image according to a second inspection standard at a position, wherein the surface shape of the side surface is the same at the first position and the second position. However, it is an inspection system in which the appearance of the side surface in the side image differs due to the action of the illumination.

(2) Further, one aspect of the present disclosure includes an acquisition unit that acquires a side image in which a side surface of an object to be inspected is captured while an illumination device is illuminating; inspecting the side surface by analyzing the side image with a first inspection criterion at a first location of the side surface and a second inspection criterion at a second location of the side surface identified based on the top image; and an inspection unit, wherein even if the surface shape of the side surface is the same at the first position and the second position, the appearance of the side surface in the side image differs due to the action of the illumination.

(3) Further, one aspect of the present disclosure is an inspection method for inspecting an object to be inspected, in which an acquisition unit captures a side surface of the object to be inspected while an illumination device is illuminating. In an acquisition process of acquiring an image, a side inspecting unit performs a first inspection reference at a first position of the side surface specified based on a top image in which the top surface of the object to be inspected is captured, and a second inspection reference at a second position of the side surface. a side surface inspection step of inspecting the side surface by analyzing the side surface image with a second inspection standard, and even if the surface shape of the side surface is the same at the first position and the second position, According to the inspection method, the appearance of the side surface in the side image differs depending on the action of the illumination.

(4) In one aspect of the present disclosure, a computer of an inspection system that inspects an object to be inspected acquires a side image in which a side surface of the object to be inspected is captured while an illumination device is illuminating. Acquisition means, the side image with a first inspection reference at a first position of the side surface specified based on the top image in which the top surface of the object to be inspected is captured, and a second inspection reference at a second position of the side surface. By analyzing the side surface inspection means for inspecting the side surface, even if the surface shape of the side surface is the same at the first position and the second position, the side surface image is obtained by the action of the illumination. is an inspection program in which the appearance of the side surface is different.

ADVANTAGE OF THE INVENTION According to this invention, a to-be-tested object can be inspected appropriately.

1 illustrates an example product associated with embodiments of the present disclosure; FIG. 1 is a top view of an object to be inspected according to this embodiment; FIG. 1 is a schematic diagram of a production line according to this embodiment; FIG. 1 is a schematic diagram showing an inspection system according to an embodiment; FIG. 1 is a schematic block diagram showing the configuration of an inspection apparatus according to this embodiment; FIG. 4 is a schematic diagram showing an example of inspection standard information according to the present embodiment; FIG. It is a figure which shows the relationship of the side image and side position information which concern on this embodiment. It is a flow figure showing an example of processing of an inspection device concerning this embodiment. FIG. 3 is an explanatory diagram for explaining an object to be inspected according to the present embodiment; It is a figure showing the perspective image of the to-be-tested object which concerns on this embodiment. It is a schematic diagram showing an example of inspection standard information concerning a modification of this embodiment.

(embodiment)
Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings.
FIG. 1 is a diagram showing an example of a product related to this embodiment. The product is a disposable beverage container such as a coffee container. The beverage container closes the lid A1 (also called a lid) by fitting the lid A1 against the cup A2.
The lid A1 is integrally formed of resin, and is an object to be inspected (referred to as an “object to be inspected”) in this embodiment. A convex portion T111 and a concave portion T121 are formed on the upper surface of the lid A1.

FIG. 2 is a top view of the inspection object (lid A1) according to this embodiment. A drinking mouth portion T1 is formed on the upper surface of the lid A1. When a person drinks a beverage, the convex portion T111 is pulled up, and a portion of the flap portion T11 is broken along the thin wall and folded back toward the concave portion T121. This reveals a drinking spout (hole). The convex portion T111 is fitted into the concave portion T121 so that the flap portion T11 is fixed while being folded back. The lid A1 is provided with a circular side wall when viewed from above, and a person drinks the beverage by putting his/her lower lip against the side surface of the side wall portion of the mouth portion T1.
Note that the lid A1 may have a different shape, for example, it may have a drinking opening without the flap portion T11. In this case, the drinking spout may be provided on the upper surface of the side wall.

<Production line>
FIG. 3 is a schematic diagram of a production line according to this embodiment. This production line produces the lid A1. This figure is a view of the production line viewed vertically downward from above, with the vertically upward direction being the z-direction.
A cartridge having a plurality (for example, 100) of lids A1 stacked thereon is placed in the cartridge slot P1. The lids A1 are introduced one by one from the cartridge inlet P1 to the conveyor P2. The lids A1 are picked up one by one from the conveyor P2 by the picking robot P3 (picking robot P31 or P32) and placed on the rotation stage St1 (rotation stage St11 or St12) of the inspection stage P4 (inspection stage P41 or P42). be placed.

On the inspection stage P4, the lid A1 is imaged (see FIG. 4) and inspected while being rotated together with the rotation stage St1. That is, the lid A1 is imaged and inspected at a plurality of rotation angles. In this embodiment, the lid A1 is continuously imaged for all rotation angles, but may be imaged only for a plurality of specific rotation angles.
In the inspection, it is judged whether or not the product conforms to the quality (referred to as “conformity judgment”).
A defect detection algorithm that detects defects by image analysis is used for conformity determination.

As a result of the conformity determination, the lid A1 determined to be nonconforming is placed in the nonconforming product storage area P51. On the other hand, the lid A1 determined as conforming as a result of the conformity judgment is placed on the conveyor P6 and transported to the stocker P7 by the picking robot P3. In the stocker P7, a plurality of lids A1 are stacked to form a cartridge. Several cartridges are grouped and packed.

Note that the production line is not limited to the example shown in FIG. 3, and may have other configurations. For example, one lid A1 may be placed in each cartridge input port P1, or the lid A may be input to the conveyor P2 from the conveyor of the preceding process or the like. Also, the lid A may be conveyed from the conveyor P6 to a subsequent conveyor or the like.

<Inspection system>
FIG. 4 is a schematic diagram showing the inspection system Sys according to this embodiment.
The inspection system Sys is installed in a production line and includes cameras C1, C2, C3, lighting L11, L12, L21, L22, L3, a rotating stage St1, and an inspection device 1.

The camera C1 takes an image of the lid A1 illuminated by the lights L11 and L12 vertically downward from above. Camera C1 images the upper surface of lid A1. An image captured by the camera C1 is referred to as a top image.
The camera C2 captures an image of the lid A1 illuminated by the lights L21 and L22 from obliquely upward and vertically obliquely downward. The camera C2 images the upper surface of the lid A1 from an oblique direction, that is, from a direction different from that of the camera C1. An image captured by the camera C2 is referred to as a perspective image.
Camera C3 is a line scan camera. An image of the lid A1 illuminated by the illumination L3 is taken in the horizontal direction. The optical axis of the camera C1 and the optical axis of the camera C3 are orthogonal, or orthogonal when projected onto the yz plane. The camera C3 continuously captures images of the side surface of the rotating lid A1 during one rotation, capturing images of the entire circumference of the side surface. An image captured by the camera C3 is called a side image.

Note that the camera C3 may be an area camera. Also, the lights L11, L12, L21, L22, and L3 are not limited to the example shown in FIG. More specifically, the illumination L3 in FIG. 4 emits light in the positive direction of the x-axis to illuminate the lid A1. However, instead of or in addition to the illumination L3 in FIG. 4, the illumination L3 may emit light in the negative direction of the x-axis to illuminate the lid A1. The illumination L3 may emit light in the positive or negative direction of the y-axis to illuminate the lid A1, or may emit light in a direction having at least two components of the x-axis, the y-axis, or the z-axis. Light may be applied to illuminate the lid A1. Further, the lighting L3 may be a plurality of lighting devices with different arrangements and angles, or may emit light from the inside of the lid A1, for example, from the rotating stage.

The rotary stage St1 rotates around an axis along the z-axis. As a result, the lid A1 placed on the rotating stage St1 also rotates together with the rotating stage St1.
The inspection apparatus 1 analyzes the top view image, the perspective image, and the side view image captured by the cameras C1 to C3, respectively, and performs suitability determination. Here, the inspection device 1 identifies the position of the side surface of the lid A1 in the side image from the top image. The inspection apparatus 1 analyzes the side image according to different inspection standards according to the position of the side surface, and performs conformity determination.

<Inspection device>
FIG. 5 is a schematic block diagram showing the configuration of the inspection apparatus 1 according to this embodiment.
The inspection device 1 includes an input/output unit I1, a storage unit M1, and a processing unit PR1.

The input/output unit I2 includes a first image acquisition unit 111, a second image acquisition unit 112, a third image acquisition unit 113, an input unit 114, and an output unit 115. FIG.
The first image acquisition unit 111 acquires a top image from the camera C1.
A second image acquisition unit 112 acquires a perspective image from the camera C2.
The third image acquisition unit 113 acquires a side image (line scan image: see FIG. 7) from the camera C3.
The input unit 114 receives user operations such as key operations by the user (manager of the production line).
The output unit 115 is a communication chip that communicates with an external device and a display that displays a screen or the like.

The storage unit M<b>1 includes an orientation information storage unit 121 , an inspection criteria storage unit 122 and an inspection history storage unit 123 .
The orientation information storage unit 121 stores orientation information of the lid A1. The orientation information is an image of the upper surface of the lid A1 (also referred to as a "reference image"), and the rotation angle of the lid A1 is associated with the reference image. For example, the image in FIG. 2 (the image in which the spout T1 is at the bottom: see FIG. 2) is associated with the rotation angle "0 degree" of the lid A1. With the position of this image as a reference, a positive angle is obtained when the image is rotated clockwise, and a negative angle is obtained when the image is rotated counterclockwise.

The inspection standard storage unit 122 stores inspection standard information used for conformity determination. In the inspection standard information, the rotation angle of the lid A1 is associated with the side inspection standard (see FIG. 6). The inspection standard may be a threshold for judging compliance or non-compliance, an inspection algorithm, or an image that serves as a standard for inspection.
The inspection history storage unit 123 stores inspection history information including a top image, a perspective image, a side image, a position (rotational angle of the lid A1) at which conformity determination was performed, and a result of conformity determination. The inspection history information may include inspection date and time, inspection line (lot number), or identification information of the lid A1.

The processing unit PR1 includes a setting unit 131, a rotation control unit 132, an inspection unit 133, and a robot control unit .
The setting unit 131 sets the inspection apparatus 1 based on user operations. For example, the setting unit 131 receives the reference image of the lid A1 according to the rotation angle of the lid A1. The setting unit 131 associates the rotation angle of the lid A1 with the reference image to generate orientation information of the lid A1, and causes the orientation information storage unit 121 to store the orientation information. The setting unit 131 receives inspection criteria according to the rotation angle of the lid A1. The setting unit 131 associates the rotation angle of the lid A1 with the inspection standard, generates inspection standard information, and stores the inspection standard information in the inspection standard storage unit 122 .
The rotation control unit 132 controls rotation of the rotation stage St1. The rotation control unit 132 rotates the rotation stage St1 one turn or more in the inspection of one lid A1.

The inspection unit 133 performs suitability determination using a defect detection algorithm on the top image and the oblique image. The inspection unit 133 specifies the position of the side surface in the side image based on the top surface image, and analyzes the side surface image with different inspection criteria according to the position of the side surface, thereby determining whether the side surface conforms. The inspection unit 133 generates inspection history information and stores it in the inspection history storage unit 123 .
When the lid A1 is determined to be suitable as a result of the suitability determination, the robot control unit 134 instructs the picking robot P3 to place the lid A1 on the conveyor P6 (also referred to as "suitability processing"). On the other hand, if the lid A1 is determined to be nonconforming, the robot control unit 134 instructs the picking robot P3 to place the lid A1 in the nonconforming product storage area P51 (also referred to as "nonconforming processing").

FIG. 6 is a schematic diagram showing an example of inspection standard information according to the present embodiment.
The inspection standard information includes each item of an object to be inspected, side position information, and inspection standard. The object to be inspected is identification information of the object to be inspected. The side position information represents the rotation angle of the object to be inspected. For example, when the rotation angle of the lid A1 is 0 degrees, the camera C captures the side surface of the mouthpiece T11.
For example, when the side position information is 0 degrees, the first inspection standard is applied in the conformity determination, and when the side position information is 90 degrees, 180 degrees, and -90 degrees, Indicates that the second inspection criterion is applied. The first inspection standard is, for example, a standard that is adapted when the luminance of the object to be inspected is higher than when the second inspection standard is applied. For example, the first inspection standard is set to have a threshold value of luminance higher than that of the second inspection standard, which is used as a criterion for binarization and defect determination.

FIG. 7 is a diagram showing the relationship between the side image and the side position according to this embodiment.
In this figure, the side image G1 is an image line-scanned by the camera C3 while the rotation angle of the rotary stage St1 is rotated from 0 degrees (before rotation) to 360 degrees. When the rotation angle of the rotation stage St1 is 0 degrees, the rotation angle of the lid A1 corresponds to -160 degrees. For example, when the rotation angle of the rotation stage St1 is rotated by 160 degrees, the rotation angle of the lid A1 becomes 0 degrees and the side surface of the spout portion T1 faces the camera C.

Processing of the inspection unit 133 will be described for the case where the rotation angle of the lid A1 is as shown in FIG.
The inspection unit 133 rotates the reference image and calculates an angle that matches (the highest degree of similarity) with the upper surface image captured before the rotation of the rotation stage St1 (the rotation angle of the rotation stage St1 is 0 degree). The calculated angle is called a relative angle (simply "relative angle") between the lid A1 and the rotation stage St1. Here, the inspection unit 133 sets a negative angle when the reference image is rotated to the left, and sets a positive angle when the reference image is rotated to the right. In the example of FIG. 7, -160 degrees is calculated as the relative angle.
The inspection unit 133 sets the angle obtained by adding the relative angle to the rotation angle of the rotary stage St1 as the rotation angle of the lid A1, that is, the side position.

In the case of the inspection standard information of FIG. 6, the inspection unit 133 performs conformity determination according to the first inspection standard at the side position where the rotation angle of the lid A1 is 0 degrees (the rotation angle of the rotation stage St1 is 160 degrees). In addition, the inspection unit 133 performs suitability determination according to the second inspection standard at the side positions where the rotation angles of the lid A1 are 90 degrees, 180 degrees, and -90 degrees.
As shown in the side image G1, at the side position where the rotation angle of the lid A1 is 0 degrees, the brightness of the side surface of the lid A1 is higher in the portion marked with P11 than at the other side positions. If conformity determination is performed on the side image G1 based on the same inspection criteria, the accuracy of the determination may be lowered depending on the side position.
In the present embodiment, the inspection unit 133 changes the inspection criteria according to the position of the side surface, so even if the brightness of the side surface of the lid A1 varies depending on the position, it is possible to appropriately determine conformity.

FIG. 8 is a flowchart showing an example of processing of the inspection apparatus 1 according to this embodiment.
(Step S101) The first image acquisition unit 111 and the second image acquisition unit 112 respectively acquire a top view image and a perspective image according to the rotation angle of the rotation stage St1. The third image acquisition unit 113 acquires a side image from camera C3.
(Step S102) The inspection unit 133 inspects the upper surface of the lid A1 by making conformance determination on the upper surface image.

(Step S103) The inspection unit 133 detects the side position of the lid A1 by calculating the relative angle based on the top image and the reference image at a predetermined rotation angle of the rotary stage St1.
(Step S104) The inspection unit 133 inspects the side surface of the lid A1 by performing conformity determination using different inspection criteria for each side surface position detected in step S103 in the side image.
(Step S105) The inspection unit 133 inspects the upper surface of the lid A1 by making conformity determination in the perspective image. Here, the inspection unit 133 inspects a portion that does not appear on the top image or a portion that is difficult to determine from the top image using the oblique image.

(Step S106) The inspection unit 133 determines whether all of steps S102, S104, and S105 are judged to be conforming. The inspection unit 133 performs the process of step S107 when all of steps S102, S104, and S105 are determined to be conforming (YES). On the other hand, if it is determined as nonconforming in at least one of steps S102, S104, or S105 (NO), the inspection unit 133 performs the process of step S108.

(Step S107) The inspection unit 133 performs matching processing. The lid A1 is thereby placed on the conveyor P6.
(Step S108) The inspection unit 133 performs nonconforming processing. As a result, the lid A1 is placed on the nonconforming product storage site P51.
(Step S109) The inspection unit 133 generates inspection history information based on the image acquired in step S101 and the inspection results in steps S102, S104, or S105, and causes the inspection history storage unit 123 to store the inspection history information.

As described above, in the present embodiment, the third image acquisition unit 113 (an example of the acquisition unit) acquires a side image in which the side surface of the inspection object (for example, lid A1) is captured. The inspection unit 133 (an example of the side surface inspection unit) inspects the side surface by analyzing the side image using inspection criteria that differ according to the side surface position.
As a result, the inspection system Sys changes the inspection standard according to the position of the side surface, so even if the brightness of the side surface of the object to be inspected differs depending on the position, it is possible to appropriately determine conformity.

FIG. 9 is an explanatory diagram for explaining the object to be inspected according to this embodiment.
This figure is a top view of the lid A1, with the angle of rotation of the lid A1. At the position where the rotation angle of the lid A1 is 0 degrees, the sidewall is thinner than at the positions where the rotation angle of the lid A1 is 90 degrees, 180 degrees, and -90 degrees (see FIG. 1). For example, when the rotation angle of the lid A1 is 0 degrees, the sidewall thickness is W1, and when the rotation angle of the lid A1 is 180 degrees, the sidewall thickness is W2, where W1 is smaller than W2. The reason for this is that, for example, when a person puts his or her mouth on the mouthpiece, the side wall of the mouthpiece portion T11 is formed thin.
Compared to the thick portion, the thin portion of the side wall has a large amount of transmitted light passing through the side surface toward the camera C3, and thus the brightness of the side surface is high. Also, depending on the arrangement or direction of the lighting L3, when the amount of reflected light reflected from the side toward the camera C3 increases, the brightness of the side may increase. As a result, as in the side image G1 in FIG. 8, the side surface of the portion marked with P11 has higher brightness than the other side surface positions.

As described above, in products made of materials that transmit or reflect light, the brightness at the side surface may vary depending on the thickness of the side wall and the shape of the top surface.
Since the inspection system Sys changes the inspection standard according to the position of the side surface, it is possible to appropriately determine conformity even when the brightness of the side surface of the object to be inspected differs depending on the position.
Note that the thickness of the sidewall is also the distance between the opposing side surfaces of the sidewall. Moreover, although the side wall is hollow with a resin-formed surface, the inside may be resin-formed. Moreover, the difference in the amount of light may be due to differences in the position and direction of the lighting device or the illumination light, the shape and material of the surfaces other than the side surfaces, the reflection angle and refraction of the light, holes, and the like, regardless of the factors.

The inspection unit 133 inspects the side surface of the lid A with a rotation angle of 0 degrees (in the example of FIG. 8, the rotation angle of the rotation stage is 160 degrees), using the first inspection standard, and inspects the side surface of the lid A with a rotation angle of 90 degrees. , 180 degrees and -90 degrees are inspected according to the second inspection standard. Lid A has the same surface shape for these rotation angle sides. For example, the side position (the rotation angle of the lid A) can be identified only from the side image, or there is no easily identifiable pattern. Also, the lid A is reflected differently in the side image due to the action of the illumination L3 at the side position where the rotation angle of the lid A is 0 degrees and at the side positions where the rotation angle is 0 degrees, 180 degrees, and -90 degrees. different. For example, since the amount of transmitted light or reflected light is different at these side positions, the appearance of the side is different (see FIG. 8).
Since the inspection system Sys changes the inspection standard according to the position of the side surface, even if the surface shape of the side surface of the object to be inspected is the same and the luminance differs due to the difference in the amount of transmitted light or reflected light, it is possible to appropriately determine conformity. It can be carried out.

Further, in this embodiment, the inspection system Sys includes a camera C3 that captures an image of the side surface of the inspection object when the illumination L3 is illuminating, and a camera C1 that captures an image of the top surface of the inspection object. The inspection unit 133 identifies the side position in the side image captured by the camera C3 based on the top surface image captured by the camera C1. The inspection unit 133 inspects the side surface by analyzing the side image with different inspection criteria depending on the specified side surface position.
As a result, the inspection system Sys can identify the side position in the side image based on the top image, even if the position cannot be identified in the side image or is difficult to identify. Also, for example, the inspection system Sys may determine the side position in the side image when the accuracy of specifying the side position is higher, the processing load is lighter, or the processing speed is higher than the side image, when the top image is higher than the side image. can be specified.
Note that the inspection system Sys may use both the top image and the side image to specify the side position, or alternatively or additionally, specify the side position in the side image based on the perspective image. good too.

Further, in the present embodiment, the inspection unit 133 identifies the side position in the side image based on the shape indicating the direction of the drinking mouth in the top image, and analyzes the side image with different inspection criteria according to the side position. and inspect the sides. In the lid of the beverage container, the mouthpiece is usually provided at one edge portion of the upper surface of the lid. Therefore, by detecting the mouthpiece, the inspection system Sys can specify the side position. In addition, since the lip portion may have a different shape from other portions in order to improve the taste, the detection system Sys can identify the side position by detecting the lip.
Note that if the upper surface of the object to be inspected has a pattern, the inspection unit 133 may specify the side position in the side image based on the pattern in the upper surface image.

Further, in this embodiment, the inspection unit 133 inspects the upper surface by analyzing the upper surface image. That is, the inspection unit 133 uses the top image to inspect the top surface and also specifies the side position. This allows the inspection system Sys to use the top image to specify both the top image and the side position.

Further, in this embodiment, the inspection system Sys includes a camera C2 that captures an image of the upper surface of the object to be inspected from a direction different from that of the camera C1. The inspection unit 133 identifies the position of the top surface in the perspective image (an example of the second top image) captured by the camera C2 based on the top surface image (an example of the first top image) captured by the camera C1, and obtains the perspective image. By analyzing, the upper surface is inspected.
This allows the inspection system Sys to inspect the upper surface from an angle different from that of the camera C1. For example, since the inspection system Sys can capture an image of a blind spot of the object to be inspected with the camera C1 with the camera C2, by analyzing the oblique image, it is possible to determine conformity even with respect to the location that cannot be determined with the top image. It can be carried out.

FIG. 10 is a diagram showing a perspective image of an object to be inspected according to this embodiment.
A perspective image G21 is a perspective image captured by the camera C2 when the rotation angle of the lid A is 90 degrees, and a perspective image G22 is a perspective image captured by the camera C2 when the rotation angle of the lid A is 0 degrees. It is an image. Defects (foreign matter) are detected at positions P21 and P22 in the perspective image G21. Since these defects exist on the sidewalls of the irregularities on the upper surface, they are blind spots in the upper surface image and the side surface image, and are not captured. Since the inspection system Sys takes images with the camera C2 from an angle different from that of the camera C1, these defects can also be detected, and in the case of the oblique image G21, for example, it can be determined as unsuitable. Further, since the perspective image G21 is captured by the camera C2 at a plurality of rotation angles, it is possible to detect defects such as foreign matter, defects, deformation, dirt, etc. in the blind spots in the perspective image G21.

(Modification)
In the above-described embodiment, the inspection unit 133 may change the side inspection criteria for each range of side positions, for example. Further, for example, the inspection unit 133 may change the side inspection criteria for each area or position in the height direction of the side. Also, for example, three or more criteria may be set as the inspection criteria.

FIG. 11 is a schematic diagram showing an example of inspection standard information according to a modification of the present embodiment.
The inspection standard information includes each item of an object to be inspected, side position information, height, and inspection standard. A range of rotation angles of the object to be inspected is set in the side position information. Also, as the height, the range of the height of the side surface is set. For example, in the inspection of the side surface of the lid A1, for example, in the inspection of the side surface of the lid A1, for the side image, when the rotation angle of the lid A1 is in the range of "-30 degrees" to "30 degrees", in the range of the height A pixel or more, " The "first inspection standard" is applied, and the "second inspection standard" is applied in the range lower than the height A pixels.
A plurality of objects to be inspected may be set in the inspection standard information, and the inspection unit 133 may apply different inspection standards for each object to be inspected and each side position.

In the above-described embodiments, the test object may be paper, glass, or the like, the side surfaces of which transmit or reflect light. Also, the object to be inspected may be other than the lid, and for example, the thickness of the side wall or the internal structure (reflection of light) may vary depending on the side position. Also, the lid may be a lid provided with an insertion opening for a straw.

The inspection system Sys may use both the camera C1 and the camera C2, and the inspection unit 133 may perform inspection using a top surface image and a perspective image for an object to be inspected that has an uneven upper surface, not limited to the lid. good. At that time, the inspection using the lateral image may or may not be performed. As a result, the inspection system Sys may be able to detect defects from the oblique image even in places that are blind spots in the top image. At this time, the inspection unit 133 may inspect the top surface and specify the oblique position using the top image. This allows the inspection system Sys to use the top image to specify both the orientation of the object in the top image and the oblique image.

In the above embodiment, the rotation control unit 132 may rotate the rotation stage St1 using the top image so that the rotation angle of the rotation stage St1 and the rotation angle of the lid A are the same. For example, before the camera C3 starts imaging each lid A1, the rotation control unit 132 uses the top image so that the position facing the camera C3 is the position where the rotation angle of the lid A is 0 degrees. The rotation stage St1 may be rotated.

In the above-described embodiment, the inspection system Sys may rotate the camera C3 around the rotation stage St1 while facing the center of the rotation stage St1 without rotating the rotation stage St1.
A plurality of cameras C3 may be installed around the rotation stage St1 facing the center of the rotation stage St1. In this case, since the side images captured by the respective cameras C3 have different side positions, the inspection unit 133 applies different inspection criteria to the side images captured by the respective cameras C3 to determine conformity. good too. In this case, the rotation stage St1 may rotate. For example, the rotation control unit 132 may use the top image to rotate the rotation stage St1 so that one of the cameras C3 is at a position where the rotation angle of the lid A is 0 degrees.

The upper surface may be a surface viewed toward the object to be inspected in the rotation axis direction when the object to be inspected is rotated during inspection. The side surface may be a surface viewed toward the rotation axis (object to be inspected) in the radial direction when the object to be inspected is rotated during inspection.

Also, the setting unit 131 of the inspection apparatus 1 may generate an inspection algorithm by machine learning. For example, the teacher data is generated by adding an additional inspection result by a person or the like to the inspection history information. The setting unit 131 performs machine learning using the top image, the perspective image, the side image, and the position at which the conformity determination is performed as explanatory variables, and using the given additional inspection result as the objective variable. The inspection unit 133 performs conformance judgment by outputting a conformance judgment result with respect to the input of the explanatory variables input in the inspection, using the learned model generated by this machine learning.
In this case, the setting unit 131 may also use the shape, type, or identification information of the object to be inspected, and lighting information such as the light intensity and direction of the lighting as explanatory variables.

The storage unit M1 is realized by one or more computer-readable recording media. The processing unit PR1 is implemented by one or more processors and memories. The inspection device 1 may be composed of a plurality of devices.

A part of the inspection apparatus 1 in the above-described embodiment may be realized by a computer. In that case, a program for realizing this control function may be recorded in a computer-readable recording medium, and the program recorded in this recording medium may be read into a computer system and executed. The "computer system" here is a computer system built into the inspection apparatus 1, and includes hardware such as an OS and peripheral devices. The term "computer-readable recording medium" refers to portable media such as flexible discs, magneto-optical discs, ROMs and CD-ROMs, and storage devices such as hard discs incorporated in computer systems. Furthermore, "computer-readable recording medium" means a medium that dynamically stores a program for a short period of time, such as a communication line for transmitting a program via a network such as the Internet or a communication line such as a telephone line. It may also include a volatile memory inside a computer system that serves as a server or client in that case, which holds the program for a certain period of time. Further, the program may be for realizing part of the functions described above, or may be capable of realizing the functions described above in combination with a program already recorded in the computer system.
Also, part or all of the inspection apparatus 1 in the above-described embodiment may be implemented as an integrated circuit such as an LSI (Large Scale Integration). Each functional block of the inspection apparatus 1 may be individually processorized, or may be partially or entirely integrated into a processor. Also, the method of circuit integration is not limited to LSI, but may be realized by a dedicated circuit or a general-purpose processor. In addition, when an integration circuit technology that replaces LSI appears due to advances in semiconductor technology, an integrated circuit based on this technology may be used.

Although one embodiment of the present invention has been described in detail above with reference to the drawings, the specific configuration is not limited to the above, and various design changes, etc., can be made without departing from the gist of the present invention. It is possible to

Sys Inspection system 1 Inspection apparatus C1, C2, C3 Cameras L11, L12, L21, L22, L3 Lighting St1, St11, St12 Rotating stages P3, P31, P32 Picking robot I1 Input/output unit 111 First image acquisition unit 112 Second image Acquisition unit 113 Third image acquisition unit 114 Input unit 115 Output unit M1 Storage unit 121 Orientation information storage unit 122 Inspection standard storage unit 123 Inspection history storage unit PR1 Processing unit 131 Setting unit 132 Rotation control unit 133 Inspection unit 134 Robot control unit

Claims (7)

An inspection system for inspecting an object to be inspected,
a first imaging device that captures an image of the side surface of the object to be inspected when the illumination device is illuminating;
a second imaging device for imaging the upper surface of the object to be inspected;
an acquisition unit that acquires a side image in which the side surface of the object to be inspected is captured;
Based on the upper surface image captured by the second imaging device, the position of the side surface in the side image captured by the first imaging device is specified, and at the specified first position, the first inspection standard and the specified second a side inspection unit that inspects the side surface by analyzing the side image with a second inspection criterion at a position;
with
Even if the surface shape of the side surface is the same at the first position and the second position, the appearance of the side surface in the side image differs due to the action of the illumination. The object to be inspected is a lid having a drinking spout,
A rotating stage that rotates the lid on the stage,
The first imaging device images the side surface of the lid at different rotation angles,
The second imaging device images an upper surface of the lid,
The inspection system according to claim 1, wherein the side inspection unit specifies the position of the side in the side image based on a shape or pattern indicating the direction of the drinking mouth in the top image. a top surface inspection unit that inspects the top surface by analyzing the top surface image;
3. The inspection system of claim 2, comprising: A third imaging device that images the upper surface of the object to be inspected from a direction different from that of the second imaging device,
The top surface inspection unit identifies a position of the top surface in a second top surface image captured by a third imaging device based on the first top surface image captured by the second imaging device, and analyzes the second top surface image. 4. The inspection system according to claim 3, wherein the upper surface is inspected at a. an acquisition unit that acquires a side image obtained by imaging the side surface of an object to be inspected while the illumination device is illuminating;
Analyzing the side image with a first inspection criterion at a first position on the side surface and a second inspection criterion at a second position on the side surface specified based on the top image obtained by imaging the top surface of the object to be inspected. By doing so, a side inspection unit that inspects the side surface,
with
Even if the surface shape of the side surface is the same at the first position and the second position, the appearance of the side surface in the side image differs due to the action of the illumination. An inspection method for inspecting an object to be inspected,
an acquisition process in which the acquisition unit acquires a side image in which the side surface of the object to be inspected is captured while the illumination device is illuminating;
The side inspection unit uses a first inspection standard at a first position on the side surface and a second inspection standard at a second position on the side surface specified based on an upper surface image of the upper surface of the object to be inspected, A side inspection process of inspecting the side by analyzing a side image;
has
Even if the surface shape of the side surface is the same at the first position and the second position, the appearance of the side surface in the side image differs due to the action of the illumination. In the computer of the inspection system that inspects the object to be inspected,
Acquisition means for acquiring a side image in which the side surface of the object to be inspected is captured while the illumination device is illuminating;
Analyzing the side image with a first inspection criterion at a first position on the side surface and a second inspection criterion at a second position on the side surface specified based on the top image obtained by imaging the top surface of the object to be inspected. By doing so, side inspection means for inspecting the side surface,
and
Even if the surface shape of the side surface is the same at the first position and the second position, the appearance of the side surface in the side image differs due to the action of the illumination.

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