JP2022528346A - Fuse status diagnosis with and without load operability - Google Patents

Abstract

In various embodiments, an electrical failure indicator, such as a light emitting diode (LED), generally causes a load failure, such as an excessive load, a load short circuit, or a load open circuit, when an electrical failure occurs in the circuit. It is intended to ensure that it remains active, even at times. Various circuit settings are provided, but not limited to, a fuse connected between two circuit points, one or more conductive paths that share a common node with the fuse, and a common node with the fuse. 1) and i) share a common node with the fuse and the first circuit element, or ii) share another common node different from the common node between the fuse and the first circuit element with the first circuit element. Achieve this effect, including circuits that include electrical fault indicators.

Description

The present disclosure relates generally to the field of circuit protection devices, and more specifically to maintaining the operability of electrical fault indicators during electrical faults.

Fuse is commonly used as a circuit protection device and is usually installed between a power source and a component in the circuit to be protected. Conventional fuses include a pair of conductive terminals connected to each other by a fusible element extending through an electrically insulating housing. In the event of a fault condition, such as an overcurrent condition, the fusible element melts, cuts, or is otherwise separated, blocking the flow of current between the power source and the protected component. Thereby, the fuse prevents or mitigates electrical damage to the power supply and protected components that would have different consequences if the overcurrent condition is sustainable.

If the fuse's fusible element melts during an overcurrent condition or other failure, it is desirable for an observer, such as a repair technician, to be able to visually determine that the fusible element has melted. .. To that end, an electrical fault indicator, such as a light emitting diode (LED), can be connected to a fuse protected circuit and is configured to activate (ie, emit) when the fuse's fusible element in the circuit melts. Can be done. Therefore, the reliable operation of the electrical fault indicator is important in making it possible for the observer to reliably determine the state of the fuse protected circuit.

It is in these and other considerations that this improvement can be useful.

This overview is provided to introduce in a simplified form the selection of concepts further described below in the detailed description. This overview is not intended to identify the material or essential features of the claimed subject matter and is intended to assist in determining the scope of the claimed subject matter. It's not something to do.

One aspect of the present disclosure comprises a circuit that maintains proper operation of an electrically faulty device regardless of load status. The circuit consists of a fuse connected between two circuit points located between the voltage source and the load, one or more conductive paths that share at least one common node with the fuse, and at least one common with the fuse. A first circuit element that shares a node and an electrical failure indicator that i) shares at least one common node with the fuse and the first circuit element, or ii) at least between the fuse and the first circuit element. It includes an electrical failure indicator that shares another common node different from one common node with the first circuit element, where the observer observes that an electrical failure has occurred if the fuse is blown as a result of the electrical failure. Sufficient current flows through the electrical fault indicator, where the common node connection to the first circuit element creates a separate discharge loop for a current flow that is different from any path connection terminated by the load. do.

In various embodiments, the circuit may exist such that the electrical fault indicator shares at least one common node with the fuse and the first circuit element, where the first circuit element is the first resistor, where. The one or more conductive paths consist of a single conductive path including an electrical failure indicator in series with the second resistor, where the single conductive path is in parallel with the fuse. In various embodiments, if i) the load is disconnected from the circuit as a result of a load failure condition and ii) the fuse is opened as a result of an electrical failure, the first resistor, second resistor and electrical failure indicator will It is in series. In various embodiments, the electrical fault indicator is a light emitting diode (LED), where the electrical and load faults are different from each other.

In various embodiments, the circuit may exist such that the electrical fault indicator shares another common node with the first circuit element, where the first circuit element is the first diode, where one or more. The conductive path includes a conductive path including a second diode in series with the gate of the transistor, where the circuit further comprises a resistor in series with the electrical fault indicator and a drain or source of the transistor. In various embodiments, the electrical fault indicator is a light emitting diode (LED), where the electrical and load faults are different from each other.

In various embodiments, the circuit may exist such that the electrical fault indicator shares another common node with the first circuit element, where the first circuit element is the first resistor, where one or more. The conductive path includes a second resistor in series with the gate of the transistor, where the circuit further comprises a third resistor in series with the electrical fault indicator and a drain or source of the transistor. In various embodiments, the electrical fault indicator is a light emitting diode (LED), where the electrical and load faults are different from each other.

In various embodiments, the circuit may exist such that the electrical fault indicator shares another common node with the first circuit element, where the first circuit element is the first resistor, where one or more. The conductive path includes a conductive path including a second resistor in series with the gate of the transistor, where the circuit further comprises a third resistor in series with the electrical fault indicator and a drain or source of the transistor. In various embodiments, the electrical fault indicator is a light emitting diode (LED), where the electrical and load faults are different from each other.

In various embodiments, the circuit may exist such that the electrical fault indicator shares another common node with the first circuit element, where the electrical fault indicator shares another common node with the first circuit element. Here, the first circuit element is a first resistor, where one or more conductive paths are i) a first conductive path including a second resistor, and ii) a second conductive path including a diode. , Iii) Including a third conductive path containing a transistor, where the second resistor has a fuse and a diode in parallel, where the circuit further includes a third resistor in series with the electrical fault indicator and a transistor. Includes drain or source. In various embodiments, a common node is a connection point that includes a diode, fuse, and second resistor connection, and yet another common node is the source or drain of the fuse, second resistor, diode, and transistor. Yet another connection point, including one of the connections. In various embodiments, the diode is a Zener diode and the transistor is a field effect transistor (FET).

Another aspect of the present disclosure comprises connecting a circuit that maintains proper operation of an electrically faulty device regardless of load status. The method provides a fuse connected between two points located between the voltage source and the load of the circuit, the fuse, the first circuit element, the electrical fault indicator, and one of the circuits. When multiple conductive paths are connected at a common node and, as a result, the fuse is opened as a result of an electrical failure, sufficient current flows through the electrical failure indicator to indicate to the user that an electrical failure has occurred. Where the common node connection to the first circuit element creates a separate discharge loop for a current flow that is different from any path connection terminated by the load. In various embodiments, the first circuit element is a first resistor and one or more conductive paths are configured with a single conductive path including an electrical fault indicator in series with the second resistor. In parallel with the fuse, i) if the load is disconnected from the circuit as a result of a load failure condition and ii) the fuse is opened as a result of an electrical failure, the first resistor, second resistor and electrical failure indicator will It is in series. In various embodiments, the electrical fault indicator is a light emitting diode (LED), where the electrical and load faults are different from each other.

Yet another aspect of the present disclosure includes another circuit that maintains proper operation of the electrically faulty device regardless of load status. The circuit is at least one conductive path including a fuse connected between two circuit points located between the voltage source and the load, and a switch in series with the resistor and electrical fault indicator. The switch includes at least one conductive path that shares a node with the fuse and a relay device connected to the fuse via another node, and if the fuse is operating normally, the relay device will be the first. If the switch is energized according to the state, causes the switch to generate an open circuit for at least one conductive path, turns off the electrical failure indicator, and the fuse is blown as a result of the electrical failure, the relay device is powered off according to the second state. The electrical fault indicator is turned on to create a separate discharge loop for any circuit current flow that differs from any path connection terminated by the load.

FIG. 6 is a schematic circuit diagram comprising at least one circuit element for maintaining the operability of an electrical fault indicator during a load fault according to at least one embodiment of the present disclosure.

FIG. 3 is a schematic circuit diagram showing one or more features of the circuit of FIG. 1A during a load fault according to at least one embodiment of the present disclosure.

FIG. 6 is a schematic circuit diagram comprising at least one circuit element for maintaining the operability of an electrical fault indicator during a load fault according to at least one embodiment of the present disclosure.

FIG. 3 is a schematic circuit diagram showing one or more features of the circuit of FIG. 2A during a load fault according to at least one embodiment of the present disclosure.

FIG. 6 is a schematic circuit diagram comprising at least one circuit element for maintaining the operability of an electrical fault indicator during a load fault according to at least one embodiment of the present disclosure.

FIG. 3 is a schematic circuit diagram showing one or more features of the circuit of FIG. 3A during a load fault according to at least one embodiment of the present disclosure.

FIG. 6 is a schematic circuit diagram comprising at least one circuit element for maintaining the operability of an electrical fault indicator during a load fault according to at least one embodiment of the present disclosure.

FIG. 6 is a schematic circuit diagram showing one or more features of the circuit of FIG. 4A during a load fault according to at least one embodiment of the present disclosure.

In general, the present disclosure indicates to the observer that the fuse has tripped, eg, the fusible element in the fuse has melted, cut or otherwise opened as a result of an electrical failure in the circuit to which the fuse was connected. Provided are embodiments of various circuits adapted to maintain the operability of electrical fault indicators such as light emitting diodes (LEDs) that are intended to be used. In various embodiments of the present disclosure, the voltage source is an electrical failure indicator in the circuit, even when the load attached to the circuit is associated with, for example, excessive resistance or impedance and / or short circuit failure. Can supply current to. Whereas many prior arts require the presence of appropriate conditions in the load to ensure the proper functioning of the electrical fault indicator, the various embodiments of the present disclosure are electrical in that path. It provides an independent discharge path for the circuit loop containing the fault indicator, thus allowing the proper functioning of the fault indicator even in the presence of load fault conditions.

Various schematics are described below with reference to energy sources, currents, voltages, conductive paths and circuit elements. Not all conductive paths are labeled and described with reference to schematics of the circuit, and not all currents, voltages, circuit elements or other circuit values may be described or labeled. This is not intended to limit the unique features or features provided by the various circuit settings and embodiments of the present disclosure. Specific voltage sources, current values and circuit elements are labeled, while other currents or voltages that may be present in the circuit, eg, depending on the design choices selected for the labeled circuit element. Not labeled. This is not intended as a limitation to embodiments consistent with the present disclosure, including figures, but is merely intended to provide a concise description of the various embodiments associated with the present disclosure.

The various circuits and embodiments provided in the present disclosure are useful in a variety of applications, one of which prevents and / or detects electrical failures associated with vehicle operation and causes failures. It can be a fuse box associated with a vehicle that can be useful to provide a method of observing that to a vehicle user or a technician inspecting the vehicle for various purposes such as repair.

FIG. 1A shows a schematic circuit diagram of circuit 100A useful for maintaining the operability of the electrical failure indicator 12 if the fuse 10a trips or blows as a result of an electrical failure. In various embodiments, the electrical fault indicator 12 can be a light emitting diode (LED). Circuit 100A is shown with the fuse 10a in a standard, non-tripped or seamless condition. As shown, the fuse 10a (and the electrical fault indicator 12) is located between two points P1 and P2 in the circuit, where P1 corresponds to the connection with the positive terminal of the voltage source V1 and P2. Functions as a connection point to the first resistor R1 and the load L1. As shown, the voltage source is a DC source, but other embodiments where the voltage is an AC source are conceivable and consistent with the present disclosure.

In various embodiments, as shown, P1 and P2 correspond to nodes N1 and N2, respectively, which are described in more detail herein. The electrical fault indicator 12 is part of a conductive path 20 that includes a second resistor R2 that begins at the positive terminal of the voltage source V1 and is in series with the electrical fault indicator 12. The fuse 10a is in normal operation and is part of the conductive path 15. The conductive path 15 and the conductive path 20 are connected by nodes N2 and N1, and N2 and N1 correspond to points P1 and P2 in various embodiments. The connection between the conductive paths 15 and 20 is such that the series connection between R2 and the electrical failure indicator 12 is in parallel with the fuse 10a. Conductive paths 15 and 20 are connected at node N2, which provides a common connection node for the electrical fault indicator 12, fuse 10a, resistor R1 and load L1. (In various embodiments, the resistor R2 may be omitted and the terminal of the voltage source V1 may be directly connected to the electrical fault indicator 12 depending on the application.) The resistor R1 connects nodes N1 to N3. Connected, it provides a separate discharge path or loop for closing the circuit in case of load failure (discussed in more detail with reference to FIG. 1B). In various embodiments, node N3 may correspond to grounding.

As shown in FIG. 1A, the current I2 is at a minimum or zero value and the fuse 10a is operating in a normal state, so that the fuse 10a is a circuit element having a minimum or zero impedance and / or resistance, such as a short circuit. Functions as. Therefore, most or all of the current flow generated by the voltage source V1 can flow through the conductive path 15 and can be split between the load L1 and the resistor R1. The current I1 refers to the portion of the current that can flow to the load L1 and the current flowing through R1 is not clearly shown. The current distribution is a design choice issue and depends on the values of the resistor R1 and the load L1. Depending on the application, values may be selected to ensure proper functioning of circuit 100A during standard operation or operation (and assuming anomalies).

FIG. 1B shows a circuit 100A in which an electrical failure and a load failure occur, resulting in a circuit 100B. In various embodiments, electrical and load failures can be different, and in various embodiments, load and electrical failures can be the same. As shown, a malfunction in circuit 100A, such as overcurrent or other electrical failure, trips or blows the fuse 10a, resulting in a tripped or blown fuse 10b. In this state, the fuse 10b can operate as a circuit element, eg, an open circuit, having very high resistance or impedance for most or all of the current associated with the voltage source V1 flowing through the conductive path 20. Therefore, the current I2 can have a large value as opposed to the normal operation of the circuit 100A.

The current I2 can flow through the resistor R2, which can generate a voltage drop that can activate the electrical fault indicator 12, eg, in one embodiment where the electrical fault indicator 12 is an LED, forward bias to the electrical fault indicator 12. A voltage that can be applied can be applied. The specific values and settings of the R2 and the electrical fault indicator 12, such as the threshold voltage of the LED and / or the resistance value of the R2, are a matter of design choice and are subject to change depending on the particular application sought. In various embodiments, the resistor R2 may be omitted and the terminal of the voltage source V1 may be directly connected to the electrical fault indicator 12. In various embodiments, the value of the resistor R2 is to ensure that excessive current does not flow through the electrical fault indicator 12, for example, if a large voltage source V1 is required for normal operation of the circuit 100A. , Can be selected.

As mentioned above, most of the current can flow through the conductive path 20 in view of the tripped or blown fuse 10b. Thus, the current I2 flows through the resistor R2 and the electrical fault indicator 12, for example when the electrical fault indicator 12 is in the active state, and the electrical fault indicator 12 is forward biased, for example when the electrical fault indicator 12 is an LED. It can obtain, emit light, and thus indicate to an observer, such as a technician, that an electrical failure has occurred.

In various embodiments, the resistor R1 nodes N3 a separate discharge path or loop if the load L1 has an excessively high resistance or a load fault such as an open circuit LF1a, or if the load L1 has a load short circuit LF1b. To provide to. Area 50 defines an area where load failures can occur at any location in the circuit, while other areas are believed to be potentially associated with load failures consistent with the present disclosure. In various embodiments, with respect to FIG. 1B and with respect to any other embodiment and associated figures or figures, the term "load fault" has performed a different function than the load actually intended for it. It can mean experiencing a fault that causes, where the fault can be different from an electrical fault that trips or blows the fuse 10b. In another embodiment, the term "load fault" means that the load in normal operation and condition that does not have to be affected by the electrical fault in which the fuse 10a is blown or tripped to activate the electrical fault indicator 12 is the fuse 10a. In the case of a tripped or cut state, for example a tripped or blown fuse 10b, it can mean that it cannot operate as a current discharge path. Regardless of which scenario is applied, the inclusion of the resistor R1 provides a discharge path through the conductive path 22 to the node N3, resulting in an electrical failure indicator 12 even when the load cannot function as a discharge path. Can work properly. In various embodiments, without a resistor R1 (or another suitable circuit element to provide a path), a load failure, such as LF1a or LF1b, has occurred, and a tripped or blown fuse 10b has occurred. If so, the electrical fault indicator 12 may be uncontrollable.

Therefore, the setting of the circuit 100A including the resistor R1 enables the proper operation of the electrical failure indicator 12 even when the load condition is bad. The resistance value of the resistor R1 may be adjusted or adjusted to be preferable in a particular application, for example considering the specific operational needs of the circuit 100A and also considering the requirements for the proper functioning of the electrical fault indicator 12. Can be selected.

FIG. 2A shows a schematic circuit diagram of another circuit 200A useful for maintaining the operability of the electrical failure indicator 12 if the fuse 10a trips or blows as a result of an electrical failure. It should be noted in advance that the circuit 200A includes the MOSFET transistor Q1, more specifically the P-FET transistor Q1. Depending on the application, different MOSFETs, such as n-FETs, or different transistor devices, such as PNPs, BJTs, etc., may be collectively used in place of FET devices and are consistent with the teachings of the present disclosure. Appropriate adjustments are made to the rest of the circuit 200A that has been made to ensure proper functioning with respect to them.

In various embodiments, the circuit 200A comprises a fuse 10a connected between two points P1 and P2, where the fuse 10a is placed between two points P1 and P2 in the circuit. Here, P1 corresponds to the connection with the positive terminal of the voltage source V1, and P2 functions as a connection point to the first resistance R1 and the load L1. In various embodiments, as shown, P1 and P2 correspond to nodes N1 and N2, respectively, which are described in more detail herein. As shown, the voltage source V1 is a DC source, but other embodiments where the voltage is an AC source are conceivable and consistent with the present disclosure.

In various embodiments, as shown, P1 and P2 correspond to nodes N1 and N2, respectively, which are described in more detail herein. The fuse 10a is a part of the conductive path 30 and is connected to the conductive paths 35, 37 and 40 in the node N2 and the conductive paths 35, 37, 40, 23 and the load L1 in the node N1. The node N1 provides a common connection node for the fuse 10a, the resistor R3, the Zener diode Z1 and the load L1. The conductive path 35 includes a resistor R3 in parallel with the Zener diode Z1, where the Zener diode Z1 is part of the conductive path 37. In various embodiments, the conductive path 37 and the Zener diode Z1 can be removed from the circuit 200A (and from the expansion circuit 200B described below). In various embodiments, the conductive path 35, including the resistor R3, can be removed from the circuit 200A (and by the expansion circuit 200B described below). In various embodiments, the conductive path 37 and the conductive path 35 can be removed from the circuit 200A (and by the extension circuit 200B described below).

The P-FET transistor Q1 is associated with the conductive path 40 and, as shown, here the source of the transistor Q1 is connected to the resistor R3, the fuse 10a and the Zener diode Z1 at node N2, where. The gate of the transistor Q1 is a part of the conductive path 40, and the source of the transistor Q1 is connected to the Zener diode Z1, the resistor R3, the resistor R1, the fuse 10a, and the load L1 at the node N1. The drain of the transistor Q1 is connected to the conductive path 27 (described in more detail herein). The conductive path 23 includes a resistor R1 and is connected to the Zener diode Z1, the resistor R3, and the fuse 10a at the node N1 and is connected to the circuit element described above and shown in FIG. 2A at the nodes N1 and N3. Thereby providing a discharge loop in the event of a load fault L1 where the node N3 corresponds to grounding in various embodiments.

In various embodiments, as described above, the transistor Q1 can be a different type of FET, eg n-FET, where source / drain and gate changes are made in addition to other circuit changes. It may be done to ensure the operability of the circuit 200A so as to be consistent with the disclosed teachings. In various embodiments, the transistor Q1 can be a non-FET device, where circuit modifications consistent with the teachings of the present disclosure can be made to ensure the operability of the circuit 200A.

The conductive path 27 begins at the drain of the transistor Q1 and the conductive path 27 includes a resistor R2 in series with an electrical fault indicator 12 such as an LED, where the electrical fault indicator 12 is with a load L1 and a resistor R1. It is connected at the node N3 that shares the common connection.

FIG. 2A shows the normal operation of the circuit 200A in which the fuse 10a is in a complete and non-trip state. Thus, since most or all of the current flow associated with the voltage source V1 flows through the fuse 10a in a low resistance or impedance state, the current I2 may have a minimum or zero value and I1 to the load L1. It is part of the current that flows, where the rest of the current (not shown) can flow through the resistor R1 and be split, for example, between the load L1 and the resistor R1. In various embodiments where one or both of the Zener diode Z1 and the resistor R3 are included in the circuit 200A, the transistor Q1 is protected from the voltage and / or current surge of the circuit, which is described in more detail with respect to FIG. 2B. ..

FIG. 2B shows a circuit 200A in which an electrical failure and a load failure occur, resulting in a circuit 200B. In various embodiments, electrical and load failures can be different, and in various embodiments, load and electrical failures can be the same. As shown, a malfunction in circuit 200A, such as overcurrent or other electrical failure, trips or blows the fuse 10a, resulting in a tripped or blown fuse 10b. In this state, the fuse 10b is a circuit having very high resistance or impedance for most or all of the current associated with the voltage source V1 flowing through the conductive path other than the conductive path 30, such as the conductive path 35. It can operate as an element, eg, an open circuit. Therefore, the current I2 has a large value as opposed to the normal operation of the circuit 200A.

A portion of the current I2 can flow through the resistor R3 and the resistor R1, for example the voltage input V1 (and the associated current I2) can be split between the resistor R3 and the resistor R1. The resistor R1 is associated with the gate of transistor Q1 and the resistance of R3 is associated with the source of transistor Q1 where the difference between the gate voltage and the source voltage is transistor Q1 (as shown, P-. If it is less than the threshold voltage associated with), then transistor Q1 is activated. Activation of transistor Q1 can result in current flowing from the drain of transistor Q1 through resistor R2 and extension of electrical fault indicator 12 to activate electrical fault indicator 12, eg, electrical fault indicator 12 with LED. At one point, it can be forward biased and can emit light. In a scenario where the difference between the gate voltage and the source is greater than the threshold voltage of transistor Q1, including during normal operation of circuit 200A, transistor Q1 is then inactive and the electrical fault indicator 12 is also inactive.

In various embodiments, the values of the resistors R1 and R3 may be selected to achieve various purposes of the particular application circuit 200B, including consideration of the threshold voltage associated with the transistor Q1. If different transistor devices with different thresholds and / or activation characteristics are utilized, the values of V1 and the resistors R2 and R1 (and other circuit elements) may also be adjusted.

In various embodiments, the resistor R3 acts as a protection to the transistor Q1 by splitting the input voltage V1 and the current associated with the other circuit element, in addition to other functions of interest. If the voltage V1 is too high (or another overvoltage or overcurrent condition occurs), it prevents the transistor Q1 from being damaged. Similarly, the Zener diode Z1 is an alternative current path for movement in which the Zener diode Z1 is biased if the voltage at the source and / or gate (depending on the particular setting used) is too high. By ensuring that the transistor Q1 can function as, it operates to protect the transistor Q1 from overvoltage or overcurrent conditions and avoids damage to the transistor Q1. The characteristics of the Zener diode Z1 may be adjusted according to the specific application and / or other values of the circuit element of the circuit 200A, including the threshold voltage.

In various embodiments, inclusion of transistor Q1 provides better control and stabilization in terms of activating the electrical fault indicator 12, except for certain conditions such as sudden voltage changes. May provide larger values in applications that are more common than those in. In various embodiments, the inclusion of one or more of both the Zener diode Z1 and the resistor R3 includes protecting the transistor Q1 from the effects of overvoltage or overcurrent, at least for the reasons described herein. And further enhance this stabilization.

In various embodiments, the resistor R1 nodes N3 a separate discharge path or loop if the load L1 has an excessively high resistance or a load fault such as an open circuit LF1a, or if the load L1 has a load short circuit LF1b. To provide to. Area 50 defines an area where load failures can occur at any location in the circuit, while other areas are believed to be potentially associated with load failures consistent with the present disclosure. The inclusion of the resistor R1 provides the node N3 with a discharge path through the conductive path 23 so that the electrical fault indicator 12 can function properly. Without a resistor R1 (or another suitable circuit element to provide a path), if a load failure such as LF1a or LF1b occurs, and if the fuse 10b trips or blows, the electrical failure indicator 12 steers. It can be impossible.

Therefore, the setting of the circuit 200A including the resistor R1 enables the proper operation of the electrical failure indicator 12 even when the load condition is bad. The resistance value of the resistor R1 may be adjusted or adjusted to be preferable in a particular application, for example considering the specific operational needs of the circuit 200A and also considering the requirements for the proper functioning of the electrical fault indicator 12. Can be selected.

FIG. 3A shows a schematic circuit diagram of another circuit 300A useful for maintaining the operability of the electrical failure indicator 12 if the fuse 10a trips or blows as a result of an electrical failure. It should be noted in advance that the circuit 300A includes the MOSFET transistor Q1, more specifically the P-FET transistor Q1. Depending on the application, different MOSFETs, such as n-FETs, or different transistor devices, such as PNPs, BJTs, etc., may be collectively used in place of FET devices and are consistent with the teachings of the present disclosure. Appropriate adjustments are made to the rest of the circuit 300A that has been made to ensure proper functioning with respect to them.

In various embodiments, the circuit 300A comprises a fuse 10a connected between two points P1 and P2, where the fuse 10a is placed between two points P1 and P2 in the circuit. Here, P1 corresponds to the connection with the positive terminal of the voltage source V1, and P2 functions as a connection point to the first diode D1 and the load L1. In various embodiments, as shown, P1 and P2 correspond to nodes N1 and N2, respectively, which are described in more detail herein. As shown, the voltage source V1 is a DC source, but other embodiments where the voltage is an AC source are conceivable and consistent with the present disclosure.

In various embodiments, as shown, P1 and P2 correspond to nodes N1 and N2, respectively, which are described in more detail herein. The fuse 10a is part of a conductive path 42 and is connected to the source of transistor Q1 in N2, which includes connecting the fuse 10a to the anode of diode D2 and the cathode of diode D1 in node N1. It is connected to the conductive paths 45 and 49 in the above and provides a common connection point for the fuse 10a and the diode D1 to the load L1. In various embodiments, although not shown, the diode D1 and the diode D2 can be replaced by one or more resistors or resistance elements, respectively.

The P-FET transistor Q1 is associated with a conductive path 42 as shown, where the source of the transistor Q1 is connected to a resistor R3 and a Zener diode Z1 at node N2, where the gate of transistor Q1 is conductive. The anode of the diode D2, which is a part of the path 45 and is connected to the cathode of the diode D2, and here is also a part of the conductive path 45, is connected to the cathode of the diode D1 and the load L1 at the node N1. The conductive path 49 includes a diode D1, where the diode D1 is connected to the nodes N1 and N3 along the conductive path 49 and is connected to the circuit elements described above and shown in FIG. 3A at the nodes N1 and N3. Provides a discharge loop in the event of a load fault L1 due to, where in various embodiments the node N3 corresponds to grounding. The conductive path 47 begins at the drain of the transistor Q1, which includes a resistor R1 in series with an electrical fault indicator 12 such as an LED, where the electrical fault indicator 12 is common with the load L1 and the diode D1. It is connected at the node N3 that shares the connection.

In various embodiments, as described above, the transistor Q1 can be a different type of FET, eg n-FET, where source / drain and gate changes are made in addition to other circuit changes. It may be done to ensure the operability of the circuit 300A so as to be consistent with the disclosed teachings. In various embodiments, the transistor Q1 can be a non-FET device, where circuit modifications consistent with the teachings of the present disclosure can be made to ensure the operability of the circuit 300A.

FIG. 3A shows the normal operation of the circuit 300A in which the fuse 10a is in a complete and non-trip state. Thus, most or all of the current flow associated with the voltage source V1 can flow through the fuse 10a, where the fuse 10a is in a low resistance or low impedance state and I1 is part of the current flowing through the load L1. .. In various embodiments, the current I1 is the value of the voltage V1 with respect to the threshold voltage of the resistors of the transistor Q1, the diode D1, the diode D2, the load L1 and other circuit values such as the transistor Q1, the diode D1, the diode D2 and the load L1. Depending on the characteristics selected for, all, part or most of the current generated by the voltage V1 may be shown. In various embodiments, under normal operating conditions, for example when the fuse 10 is in a non-trip state, the gate voltage of Q1 and the source voltage of transistor Q1 are equivalent as a result of diode settings for diodes D1 and D2. Transistor Q1 is turned off and therefore the threshold condition for (P-FET) transistor Q1 is that the difference between the gate voltage and the source voltage must be less than the threshold voltage at which transistor Q1 is activated, resulting in electricity. The failure indicator 12 is also turned off.

FIG. 3B shows a circuit 300A in which an electrical failure and a load failure occur, resulting in a circuit 300B. In various embodiments, electrical and load failures can be different, and in various embodiments, load and electrical failures can be the same. As shown, a malfunction in circuit 300A, such as an overcurrent or other electrical failure, trips or blows the fuse 10a, resulting in a tripped or blown fuse 10b, where the area 50 has one or more load failures. For example, it defines an area that may contain a load with excessively high resistance or a load with open circuit LF1a and / or a short LF1b. As a result of electrical failure (which can be different from load failure as described above), the fuse 10b can operate as a circuit element with very high resistance or impedance, eg, an open circuit. Therefore, the current does not have to move through the tripped fuse 10b.

When the fuse 10b is tripped, blown or otherwise open, the diode D1 drives the gate voltage of the (P-FET) transistor Q1 to a sufficiently low level, resulting in a gate voltage and The difference between the voltage of the transistor Q1 and the source of the voltage becomes smaller than the threshold voltage of the transistor Q1, and then the transistor Q1 can be in the active state. Then, in various embodiments, current can be supplied, for example, to the resistor R1 and the electrical fault indicator 12, for example when the electrical fault indicator 12 is an LED, it can be forward biased at the drain of transistor Q1 and emit light. It may activate the electrical fault indicator 12. In a scenario where the difference between the gate voltage and the source is greater than the threshold voltage of transistor Q1, including during normal operation of circuit 300A, transistor Q1 is then inactive and the electrical fault indicator 12 is also inactive.

In various embodiments, the characteristics of the diodes D1 and D2, such as the threshold voltage, may be selected to achieve various purposes of the particular application circuit 300B, including consideration of the threshold voltage associated with the transistor Q1. If different transistor devices with different thresholds and / or activation characteristics are utilized, the values of the characteristics of V1 and the diodes D1 and D2 (and other circuit elements) may also be adjusted. In various embodiments, the resistor sets the diode D1 and the diode D2 to the appropriate resistance values selected to achieve the required bias in various devices, such as the transistor Q1, of the circuits 300A and 300B. It can be replaced according to other requirements required for a particular application.

In various embodiments, the diode D1 circuit to nodes N1, N2 and N3 if the load L1 has an excessively high resistance or a load fault such as an open circuit LF1a, or if the load L1 has a load short circuit LF1b. Provide a separate discharge path or mechanism to complete. Area 50 defines an area where load failures can occur at any location in the circuit, while other areas are believed to be potentially associated with load failures consistent with the present disclosure. Without the diode D1 (or another suitable circuit element to provide the path), in the event of a load failure, such as LF1a or LF1b, and in the event of a tripped or blown fuse 10b, the electrical failure indicator 12 It can be uncontrollable.

In various embodiments, inclusion of transistor Q1 provides better control and stabilization in terms of activating the electrical fault indicator 12, except for certain conditions such as sudden voltage changes. May provide larger values in applications that are more common than those in. In various embodiments, controlling the voltage spike in relation to the date of transistor Q1 by including one or more of both diodes D1 and D2 and for other reasons obvious to those of skill in the art. Further enhance stabilization.

Therefore, the settings of the circuit 300A, including the diode D1, allow proper operation of the electrical fault indicator 12 even when the load condition is poor, and the characteristics of the diode D1 are, for example, the specific operation of the circuit 300A. It is tuned or selected as a potential preference for a particular application, taking into account the above needs and also taking into account the requirements for the proper functioning of the electrical fault indicator 12.

FIG. 4A shows a schematic circuit diagram of circuit 400A useful for maintaining the operability of the electrical failure indicator 12 if the fuse 10a trips or blows as a result of an electrical failure. In various embodiments, the electrical fault indicator 12 can be a light emitting diode (LED). Circuit 400A is shown with the fuse 10a in a standard, non-tripped or seamless condition. As shown, the fuse 10a is located between two points P1 and P2 in the circuit, where P1 corresponds to the connection with the positive terminal of the voltage source V1 and P2 is the first resistance R1 and the load. It functions as a connection point to L1. As shown, the voltage source is a DC source, but other embodiments where the voltage is an AC source are conceivable and consistent with the present disclosure.

As shown in FIG. 4A, at least two conductive paths, a conductive path 52 and a conductive path 55, are shown. The conductive path 52 includes a switch s1 in series with a resistor R1 and an electrical failure indicator 12 such as an LED. The conductive path 55 includes a relay device K1 that controls the switch s1. The fuse 10a is connected to the conductive path 52 at N2, the fuse is connected to the conductive path 55 at node N1, where both conductive paths are terminated at node N3, where, in various embodiments, node N3 is grounded. Corresponds to. The node N1 provides a common connection node for the relay device K1, the load L1 and the fuse 10a.

Circuit 400A shows the normal operation of circuit 400 in which the fuse 10a operates normally and therefore it operates in low resistance and low impedance conditions. A portion of the current (not explicitly shown) generated by the voltage source V1 may charge the relay device K1 and a portion of the current I1 may move to the load L1. During normal operation, the relay device K1 is fully charged to open the switch s1 to prevent current from moving down the conductive path 52 and disable activation of the electrical fault indicator 12. Therefore, the current I2 can be a minimum value or a zero value.

FIG. 4B shows a circuit 400A in which an electrical failure and a load failure occur, resulting in a circuit 400B. In various embodiments, electrical and load failures can be different, and in various embodiments, load and electrical failures can be the same. As shown, a malfunction in circuit 400A, such as an overcurrent or other electrical failure, trips or blows the fuse 10a, resulting in a tripped or blown fuse 10b, where the area 50 has one or more load failures. For example, an area that may include a load having an excessive resistance LF1a and / or a load having a short circuit LF1b is defined. As a result of electrical failure (which can be different from load failure as described above), the fuse 10b can operate as a circuit element with very high resistance or impedance, eg, an open circuit. Thus, no current or only minimal current may flow through the tripped or blown fuse 10b, and the current I1 may have a minimum or zero value. Similarly, no current or only minimal current can flow through the relay device K1 to cause it to be discharged and thus the switch s1 can be closed. When the switch s1 is closed, the current I2 can be all or most of the current generated by the voltage V1, which can, for example, generate a voltage drop in the resistor R1 to activate the electrical fault indicator 12, eg. When the electrical fault indicator 12 is an LED, it can be forward biased and can emit light. Therefore, the electrical fault indicator 12 may be in the activated state regardless of the state of the load L1 and whether or not there is a load fault with an excessive resistance LF1a or a load fault such as a load short circuit LF1b. This is because when the fuse 10b is blown or tripped, the conductive path 52 is not affected by the load state due to the switch s1 separating the conductive path 52 from the rest of the circuit.

Similar to the other embodiments described herein, the specific values and settings of the circuit elements 400A and 400B are adjusted according to the design selection and need of the specific application in which the circuit 400A and / or the circuit 400B is mounted. Can be done.

Therefore, the configuration of the circuit 400A including the scheme of the switch s1 and the relay device K1 allows the electrical fault indicator 12 to operate properly even when the load condition is bad, which is the relay device K1 and the relay device K1. This is because the switch s1 provides a separate path for activating the electrical fault indicator 12, regardless of the load condition.

As used herein, references to "one embodiment", "one implementation", "one example" and / or equivalents exclude the existence of additional embodiments that also incorporate the described features. It is not intended to be interpreted.

Although this disclosure has referred to a particular embodiment, as defined in the appended claims, numerous modifications, modifications and modifications to the embodiments described without departing from the realm and scope of the current embodiment. Is possible. Accordingly, the present disclosure is not limited to the embodiments described, but rather has the entire scope as defined by the following claims and their equivalents.

Claims (20)

A fuse connected between two circuit points located between the voltage source and the load,
With one or more conductive paths sharing at least one common node with the fuse,
A first circuit element that shares the fuse with the at least one common node,
An electrical failure indicator that i) shares the at least one common node with the fuse and the first circuit element, or ii) the at least one common node between the fuse and the first circuit element. It has an electrical failure indicator that shares another common node with the first circuit element.
If the fuse is opened as a result of an electrical failure, sufficient current will flow through the electrical failure indicator to indicate to the observer that the electrical failure has occurred, and the common node connection to the first circuit element is the said. A circuit that creates a separate discharge loop for said current flow that is different from any path connection terminated by a load. The electrical failure indicator shares at least one common node with the fuse and the first circuit element, the first circuit element is a first resistor, and the one or more conductive paths are with a second resistor. The circuit according to claim 1, wherein the single conductive path is configured in series with the single conductive path including the electrical fault indicator, and the single conductive path is in parallel with the fuse. i) When the load is disconnected from the circuit as a result of a load failure condition and ii) the fuse is opened as a result of the electrical failure, the first resistor, the second resistor and the electrical failure indicator. The circuit according to claim 2, wherein is in series. The circuit of claim 3, wherein the electrical fault indicator is a light emitting diode (LED), wherein the electrical fault and the load fault are different from each other. The electrical fault indicator shares the other common node with the first circuit element, the first circuit element is a first diode, and the one or more conductive paths are in series with the gate of a transistor. The circuit according to any one of claims 1 to 4, wherein the circuit comprises a conductive path comprising, further comprising a resistor in series with the electrical failure indicator and a drain or source of the transistor. The circuit according to claim 5, wherein the electrical failure indicator is a light emitting diode (LED) and the transistor is a field effect transistor (FET). The electrical fault indicator shares the other common node with the first circuit element, the first circuit element is a first resistor, and the one or more conductive paths are in series with the gate of the transistor. 13. Circuit. The circuit according to claim 7, wherein the electrical failure indicator is a light emitting diode (LED) and the transistor is a field effect transistor (FET). The electrical failure indicator shares the other common node with the first circuit element, the first circuit element is a first resistor, and the one or more conductive paths are i) only a second resistor. It includes a first conductive path including and ii) a second conductive path containing only a transistor device, the second resistor is in parallel with the fuse, and the second resistor shares a common node with the gate of the transistor. 1. Sharing a common node with either the source or drain of the transistor, the circuit further comprises a third resistor in series with the electrical failure indicator and the drain or source of the transistor. The circuit according to any one of 8 to 8. 9. The circuit of claim 9, wherein the electrical fault indicator is a light emitting diode (LED) and the transistor is a field effect transistor (FET). The electrical failure indicator shares the other common node with the first circuit element, the first circuit element is a first resistor, and the one or more conductive paths include i) a second resistor. It has a first conductive path, a second conductive path including an ii) diode, and a third conductive path including an ii) transistor, the second resistor, the fuse and the diode are in parallel, and the circuit is The circuit according to any one of claims 1 to 10, further comprising a third resistor in series with the electrical failure indicator and a drain or source of the transistor. The common node is a connection point comprising the connection of the diode, the fuse and the second resistor, and yet another common node is the fuse, the second resistor, the diode, and the source of the transistor or the transistor. 11. The circuit of claim 11, which is yet another connection point comprising any connection of the drain. 12. The circuit of claim 12, wherein the diode is a Zener diode and the transistor is a field effect transistor (FET). The stage of providing a fuse connected between two points located between the voltage source and the load of the circuit, and
When a fuse, a first circuit element, an electrical failure indicator, and one or more conductive paths in the circuit are connected at a common node and the fuse is opened as a result of an electrical failure, the user is told. With a stage in which sufficient current flows through the electrical fault indicator to indicate that an electrical fault has occurred.
A method in which a common node connection to the first circuit element creates a separate discharge loop for the current flow that is different from any path connection terminated by the load. The method according to claim 14, wherein the first circuit element is a first resistor. 15. The method of claim 15, wherein the one or more conductive paths are composed of a single conductive path including the electrical fault indicator in series with a second resistor. 16. The method of claim 16, wherein the single conductive path is in parallel with the fuse. i) When the load is disconnected from the circuit as a result of a load failure condition and ii) the fuse is opened as a result of the electrical failure, the first resistor, the second resistor and the electrical failure indicator. 17 is the method of claim 17. 18. The method of claim 18, wherein the electrical fault indicator is a light emitting diode (LED), wherein the electrical fault and the load fault are different from each other. A fuse connected between two circuit points located between the voltage source and the load,
At least one conductor that includes a switch in series with a resistor and an electrical fault indicator, and that the switch shares a common node with the fuse.
With a relay device connected to the fuse via another node,
Equipped with
When the fuse is operating in the normal state, the relay device is energized according to the first state, causing the switch to generate an open circuit for the at least one conductive path, turning off the electrical fault indicator.
If the fuse is opened as a result of an electrical failure, the relay device is powered off according to a second state, the electrical failure indicator is turned on, and the circuit current is different from any path connection terminated by the load. A circuit that creates a separate discharge loop for the flow.

Images