JP2022167195A - Particle image analysis device - Google Patents

Abstract

To provide a particle image analysis device capable of providing information from which it can be determined whether or not setting of a detection range is appropriate.SOLUTION: A particle image analysis device 1 comprises: an analysis processing unit 133 which performs image analysis on a particle image obtained by imaging a liquid sample and calculates evaluation values of a plurality of parameters indicating a shape of a particle of the particle image; a filter processing unit 134 which sets a detection range 150 in coordinates with the evaluation value of an area corresponding diameter and the evaluation value of an aspect ratio defined as variables, and sorts the particles in the particle image into particles positioned inside of the detection range 150 and particles positioned outside of the detection range 150; a distance calculation unit 135 which calculates distances between a reference point in the detection range 150 and the particles of the particle images on the coordinate; a selection unit 136 which detects a particle based on the calculated distances; and a display unit 80 which displays a particle image of the selected particle.SELECTED DRAWING: Figure 1

Description

The present invention relates to a particle image analysis device.

Various techniques are known for analyzing the properties of industrial product powders such as pigments, cosmetic powders, toners, particulate catalysts, abrasives, powdered medicines, synthetic resin powders, and fine ceramic particles. As one of these methods, a method of image-analyzing a particle image obtained by picking up particles and analyzing the shape and the like of the particles based on the result of the image analysis is known (see, for example, Patent Document 1).

JP-A-2003-156427

In particle analysis, useful information may be obtained by referring to captured particle images. However, captured particle images include particles such as scaly particles that vary greatly in size depending on the angle at which the particles are captured, foreign substances such as contaminant particles, and particles in which multiple particles are detected as one particle. may be included. Therefore, the particle image can be checked efficiently by setting a range for filtering the particles and checking the particle image while excluding particles outside the set range. Therefore, there has been a demand for information that enables determination of whether or not the setting of the filtering range is appropriate.

SUMMARY OF THE INVENTION An object of the present invention is to provide a particle image analysis apparatus capable of providing information for determining whether or not the setting of the detection range is appropriate.

A particle image analysis apparatus according to a first aspect of the present invention performs image analysis on a particle image obtained by photographing a liquid sample in which particles are dispersed, and calculates an evaluation value of a plurality of parameters indicating the shape of particles in the particle image. A detection range is set to coordinates having as variables an evaluation value of a first parameter included in the plurality of parameters, and an evaluation value of a second parameter different from the first parameter, and a detection range of the particle image is determined by a value calculation unit. a classification unit that classifies particles into particles positioned within the detection range and particles positioned outside the detection range; a reference point set within the detection range; a distance calculation unit that calculates a distance on coordinates; a selection unit that selects a particle based on the distance calculated by the distance calculation unit; and a display unit that displays a particle image of the particle selected by the selection unit. Prepare.

According to the particle image analysis device according to the first aspect of the present invention, the validity of the set detection range can be determined by visually confirming the particle image of the particles selected based on the distance. It is possible to provide information with which it is possible to determine whether or not the setting of the detection range is appropriate.

It is a figure which shows an example of a structure of a particle image analysis apparatus. FIG. 4 shows particles plotted on coordinates; It is a figure which shows an example of the display screen displayed on a display part. It is a figure which shows an example of the display screen displayed on a display part. It is a flow chart which shows operation of a control device.

Hereinafter, this embodiment will be described with reference to the drawings.

[1. Configuration of particle image analysis device]
FIG. 1 is a diagram showing an example of the configuration of a particle image analysis device 1. As shown in FIG.
The particle image analysis apparatus 1 photographs a sample liquid in which the sample powder is dispersed with a camera, analyzes the photographed image of the sample powder, and analyzes the shape and the like of the particles contained in the sample powder. is. Examples of sample powders include industrial product powders such as pigments, cosmetic powders, toners, particulate catalysts, abrasives, powdered medicines, synthetic resin powders, fine ceramic particles, and metal particles. The sample powder corresponds to the powder of the present invention, and the sample liquid corresponds to the liquid sample of the present invention.

The particle image analysis apparatus 1 includes a flow cell 10, a sample liquid supply mechanism 20, a sample liquid storage container 31, a waste liquid tank 37, an illumination section 40, an imaging section 50, an operation section 70, a display section 80, and a control device 100 .

The flow cell 10 is an optically substantially transparent measurement container, and has a substantially rectangular plate shape. The upper end surface 11 of the flow cell 10 is formed with an inlet 12 for introducing the sample liquid, and the lower end surface 13 of the flow cell 10 is formed with an outlet 14 for discharging the sample liquid. Further, a linear flow path 15 from the inlet 12 to the outlet 14 is formed inside the flow cell 10 . Further, in the flow cell 10, a target for focus adjustment of the telecentric lens 55 provided in the photographing section 50 is provided. Illustration of the target is omitted.

The sample liquid supply mechanism 20 is a mechanism that feeds a predetermined amount of sample liquid into the flow cell 10 at a time, and includes a liquid feed pump 21 . In this embodiment, an introduction tube 33 extending from a sample liquid storage container 31 that stores the sample liquid to be measured is connected to the introduction port 12 of the flow cell 10 . One end of a discharge pipe 23 is connected to the discharge port 14 , and the other end of the discharge pipe 23 is connected to the suction side of a liquid feed pump 21 . By operating the liquid transfer pump 21 , the sample liquid in the sample liquid storage container 31 flows from the inlet 12 into the channel 15 of the flow cell 10 , passes through the channel 15 and is discharged from the outlet 14 . A waste liquid pipe 35 is connected to the discharge side of the liquid feed pump 21 , and the sample liquid discharged by the liquid feed pump 21 is collected in a waste liquid tank 37 through the waste liquid pipe 35 . The liquid-sending pump 21 may be provided on the introduction pipe 33 side.

The illumination unit 40 includes a light source device 41 that irradiates the flow cell 10 with measurement light 43 . The light source device 41 irradiates the substantially parallel measurement light 43 from a direction substantially orthogonal to the flow channel 15 of the flow cell 10 . The light source device 41 includes a light source having a light emitting element such as an LED (Light Emitting Diode) light source or a laser light source, and a collimating optical system for collimating light emitted from the light source. The light source device 41 may be configured to include a planar light source that emits light planarly, such as a COB (chip-on-board) LED, as a light source.

The photographing unit 50 is arranged at a position facing the illumination unit 40 with the flow cell 10 interposed therebetween, and photographs a portion of the flow cell 10 irradiated with the measurement light 43 . The imaging unit 50 includes a camera 51 , a telecentric microscope 54 and a focus mechanism 56 .

The camera 51 includes an image sensor 52 such as a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor), which is an imaging sensor, and an A/D converter that converts analog image data output from the image sensor 52 into a digital signal. and a signal processing circuit 53 for performing processing such as.

The telecentric microscope 54 is a telecentric optical system that forms an image of the irradiation site in the flow cell 10 on the imaging surface 52A of the imaging device 52, and includes a telecentric lens 55 arranged opposite to the flow cell 10.

The focus mechanism 56 is a mechanism for changing the focal position of the telecentric lens 55 and includes a lens drive mechanism 57 . The lens driving mechanism 57 changes the focus of the telecentric lens 55 by linearly moving the telecentric lens 55 along the optical axis A of the telecentric optical system under the control of the control device 100 . The focus of the telecentric lens 55 is adjusted based on the captured image of the target captured by the control device 100 .

The operation unit 70 includes input devices such as a mouse and a keyboard, and functions as a reception unit that receives user operations.
The display unit 80 includes a display panel such as a liquid crystal panel or an organic EL (Electro Luminescence) panel, and displays a display screen on the display panel under the control of the control device 100 . On this display screen, for example, an image captured by the camera 51 and an analysis result of the sample powder captured in this captured image are displayed.
Moreover, the display unit 80 may be configured by a touch panel including a display panel and a touch sensor. The touch sensor detects the position of the display panel touched by an indicator such as a user's finger or a pointer. A coordinate system is set in advance on the display panel, and the touch sensor outputs coordinate information indicating the position of the display panel touched by the pointer to the control device 100 .

The control device 100 is a computer device that includes an interface section 110 , a storage section 120 and a processor 130 .

The imaging unit 50 and the display unit 80 are connected to the interface unit 110 , and the processor 130 transmits and receives data to and from the imaging unit 50 and the display unit 80 via the interface unit 110 .

The storage unit 120 includes semiconductor memories such as ROM (Read only memory) and RAM (Random Access Memory), and auxiliary storage devices such as HDD (Hard Disk Drive) and SSD (Solid State Drive).
The storage unit 120 stores a control program 121 executed by the processor 130, a particle image 123 that is an image captured by the camera 51, a particle image 125 that is an image obtained by cutting out the range in which particles are captured from the particle image 123, and the like.

The processor 130 is configured by a microcomputer such as a CPU (Central Processing Unit), an MCU (Micro Controller Unit) equipped with a CPU, or an MPU (Micro Processor Unit). Also, the control device 100 may be implemented by an integrated circuit such as an ASIC (Application Specific Integrated Circuit) or an FPGA (Field Programmable Gate Array).

The control device 100 includes an imaging control unit 131, a particle image extraction unit 132, an analysis processing unit 133, a filter processing unit 134, a distance calculation unit 135, a selection unit 136, and a display control unit 137 as functional blocks. These functional blocks indicate the functions of the control device 100 and are implemented by the processor 130 executing the control program 121 stored in the storage unit 120 .

The shooting control unit 131 adjusts the autofocus of the camera 51 and controls the shooting timing of the camera 51 .
The imaging control unit 131 adjusts the focal position of the telecentric microscope 54 based on the captured image of the target provided inside the flow cell 10 . Specifically, the imaging control unit 131 captures an image captured by the camera 51, and determines the shift between the focus of the camera 51 and the target based on the imaging state of the target captured in the captured image. Then, the photographing control unit 131 controls the lens drive mechanism 57 so that the telecentric lens 55 moves to a position where the defocus is eliminated. In this manner, the imaging control unit 131 focuses the camera 51 on the target.
In addition, the imaging control unit 131 causes the camera 51 to photograph the sample liquid at preset imaging intervals. The imaging control unit 131 causes the storage unit 120 to store the particle image 123 generated by imaging by the camera 51 .

The particle image extraction unit 132 reads out the particle image 123 from the storage unit 120 . The particle image extraction unit 132 performs correction processing such as contrast adjustment, brightness adjustment, and contour correction on the read particle image 123 . Next, the particle image cutout unit 132 cuts out an image of the range in which the particles are photographed from the corrected particle image 123 to generate a particle image 125 . For example, the particle image clipping unit 132 clips the particle image 125 from the particle image 123 based on the threshold data. The threshold data is data indicating a threshold for separating the area corresponding to the particle image 125 from the background area in the particle image 123 . For this threshold value, for example, the luminance value or chromaticity of the pixel of the particle image 123, or a combination thereof, is used. Note that an appropriate image processing technique such as contour detection can be used as a method of cutting out the particle image 125 from the particle image 123 based on the threshold data. The particle image extraction unit 132 stores the generated particle image 125 in the storage unit 120 .

The analysis processing unit 133 performs image analysis on the particle image 125 generated by the particle image extraction unit 132 and obtains evaluation values of a plurality of evaluation items indicating the shape of the particles photographed in the particle image 125 . Evaluation items are hereinafter referred to as analysis parameters. Analysis parameters correspond to the parameters of the present invention. Analysis parameters include, for example, equivalent area diameter, area, maximum length (major axis), maximum vertical length (minor axis), perimeter, envelope perimeter, major axis of circumscribed rectangle, minor axis of circumscribed rectangle, degree of circularity, aspect ratio, The degree of unevenness and the like are included.
The analysis processing unit 133 obtains an evaluation value of the analysis parameter for each particle of the particle image 125 and stores the obtained evaluation value in the storage unit 120 in association with the particle image 125 .

The equivalent area diameter corresponds to the first parameter of the present invention and is the diameter of a circle having an area equal to the projected area of the grain. The area is the projected area of the grain, the maximum length (major diameter) is the maximum distance between two points on the projected contour of the grain, and the maximum vertical length (minor diameter) is the two points parallel to the maximum length (major diameter). It is the distance when the particle is sandwiched by the straight line of the book. The perimeter is the length of the projected contour of the particle, and the enveloping perimeter is the shortest perimeter connecting the projections of the particle. The major axis of the circumscribing rectangle is the length of the longest side of the smallest rectangle that can contain the contour of the particle, and the minor axis of the circumscribing rectangle is the length of the short side of the smallest rectangle that can contain the contour of the particle. Circularity is determined by 4π×projected area of particle/perimeter squared. The aspect ratio corresponds to the second parameter of the present invention and is determined by maximum length (major axis)/maximum vertical length (minor axis). Further, the unevenness is obtained by envelope perimeter/periphery.

FIG. 2 is a diagram showing particles plotted on coordinates.
The filter processing section 134 corresponds to the classification section of the present invention. The filter processing unit 134 sets a filter range 150 on coordinates, and performs filter processing to determine whether the particles in the particle image 125 belong to the filter range 150 or not belong to the filter range 150. Run.

A filter range 150 is a range set by the user, and is set to a range of particles whose shape and the like are to be analyzed. Particles to be analyzed by the particle image analysis apparatus 1 include particles whose maximum length (major axis), maximum vertical length (minor axis), aspect ratio, and the like greatly differ depending on the particle imaging angle. In addition, the particle image 123 may include foreign matter such as contaminant particles and particles in which a plurality of particles are detected as one particle. In this embodiment, the filter range 150 is set to an optimum value, and the particle image 123 of particles photographed from an unfavorable photographing direction, contaminant particles, and particles in which multiple particles are detected as one particle are removed from the object. do.

First, the filter processing unit 134 sets coordinates on a memory such as a RAM included in the storage unit 120 . In the present embodiment, the filter processing unit 134 sets coordinates using the area-equivalent diameter and the aspect ratio among the plurality of analysis parameters evaluated by the analysis processing unit 133 as coordinate axes. FIG. 2 shows coordinates with the equivalent area diameter on the X axis and the aspect ratio on the Y axis.

Next, the filter processing unit 134 sets a filter range 150. FIG. In this embodiment, the filter range 150 is set as follows.
X-axis: 5 μm < equivalent area diameter < 10 μm
Y-axis: 0.5 < aspect ratio < 1.0

The filtering unit 134 reads out the evaluation values of the equivalent area diameter and the aspect ratio of each particle from the storage unit 120, and stores the identification of the particle at the coordinate position corresponding to the read evaluation value of the equivalent area diameter and the aspect ratio. Plot information. FIG. 2 shows an example of using alphabets from "a" to "n" as identification information of particles. FIG. 2 shows an example in which 14 particles from particle a to particle n are plotted on coordinates. In the explanation of FIG. 2, the case where the number of particles is 14 from particle a to particle n will be explained, but the number of particles is not limited to 14, and actually more particles are used. Be eligible.
Of the 14 particles from particle a to particle n, filter processing unit 134 filters 6 particles, particle a, particle b, particle d, particle f, particle i, and particle j, within filter range 150. Classify into particles. Also, the filter processing unit 134 classifies eight particles of particle c, particle e, particle g, particle h, particle k, particle l, particle m, and particle n as particles outside the filter range 150 .

The distance calculator 135 obtains the distance from the set reference point to each particle. In this embodiment, the center of the filter range 150 is set as the reference point. In the case of this embodiment, the center of the filter range 150 is the position where the equivalent area diameter on the X axis is 7.5 and the aspect ratio on the Y axis is 0.75, and this position is set as the reference point. .
The distance calculator 135 first calculates the distance in the X-axis direction and the distance in the Y-axis direction from the reference point to each particle. After obtaining the distance in the X-axis direction and the distance in the Y-axis direction, the distance calculation unit 135 normalizes the obtained distance in the X-axis direction and the distance in the Y-axis direction, and converts the distance after normalization into Based on this, the distance to the reference point of each particle is obtained. The reason why the distance in the X-axis direction and the distance in the Y-axis direction are normalized is that the range of numerical values such as the area-equivalent diameter and the number of digits of the aspect ratio have a large effect. There are the following four methods for normalizing the distance in the X-axis direction and the distance in the Y-axis direction.

A first normalization method is a method in which the range widths of the filter range 150 on the X-axis and the Y-axis are set to a distance of 1, respectively.
For example, in the case of the filter range 150 above, the range of the X-axis is 5 μm<equivalent area diameter<10 μm. Therefore, 5 μm obtained by subtracting 5 μm from 10 μm is converted to the distance 1 on the X axis. Similarly, the Y-axis range is 0.5<aspect ratio<1.0. Therefore, the aspect ratio of 0.5 obtained by subtracting 0.5 from 1.0 is converted to the distance of 1 on the Y axis.

A second normalization method is a method in which 1/2 of the range width of the filter range 150 on the X-axis and the Y-axis is set to a distance of 1, respectively.
In the case of the filter range 150 described above, 2.5 μm, which is 1/2 of 5 μm, is converted to the distance 1 on the X axis. Also, 0.25 μm, which is 1/2 of the aspect ratio of 0.5, is converted to the distance of 1 on the Y axis.

In the third normalization method, among the evaluation values of each particle plotted on the coordinates shown in FIG. , and the distance is set to 1 for normalization.
For example, in the case of the example shown in FIG. 2, the minimum value of the equivalent area diameter on the X axis is 6.7 μm for particle b, and the maximum value is 16.2 μm for particle h. Therefore, 9.5 μm obtained by subtracting 6.7 μm from 16.2 μm is converted to the distance 1 on the X axis. The minimum value of the aspect ratio on the Y axis is 0.2 for particle n, and the maximum value is 0.96 for particle a. Therefore, the aspect ratio of 0.76 obtained by subtracting 0.2 from 0.96 is converted to the distance of 1 on the Y axis.

The fourth normalization method is a method of setting the minimum value of the coordinate axis to "0", the maximum value to "1", and setting the distance to "1".
The minimum value of the X-axis of the coordinates shown in FIG. 2 is “0” μm and the maximum value is “20” μm. Therefore, 20 μm obtained by subtracting 0 μm from 20 μm is converted to the distance 1 on the X axis.
Also, the minimum value on the Y-axis of the coordinates shown in FIG. 2 is "0" and the maximum value is "1.2". Therefore, 1.2 obtained by subtracting 0 from 1.2 is converted to the distance 1 on the Y axis.

Table 1 shows the results obtained by normalizing the distances between the 14 particles from particle a to particle n and the reference point using the above-described second normalization method.

The selection unit 136 first rearranges the particles according to the distance calculated by the distance calculation unit 135 . Table 2 is a table in which all particles from particle a to particle n are rearranged in descending order of distance from the reference point. Furthermore, Table 3 is a table in which the particles classified within the filter range 150 are sorted in descending order of distance from the reference point. Table 4 is a table in which the particles classified outside the filter range 150 are rearranged in descending order of distance from the reference point. Hereinafter, a group including all particles from particle a to particle n shown in Table 2 is referred to as a first group. A group of particles classified within the filter range 150 shown in Table 3 is called a second group. A group of particles classified outside the filter range 150 shown in Table 4 is called a third group.

After rearranging the particles in each of the first group, the second group, and the third group, the selection unit 136 selects the particles for which the particle image 125 is to be displayed. For example, a case will be described in which three particles are selected from each of the first group, the second group, and the third group, and the particle images 125 of the selected particles are displayed on the display unit 80 .

For the first group, the number of particles included in the first group is 14, and dividing 14 by 3, the number of particles to be selected, gives 4.67. Therefore, after the decimal point is rounded up, one out of five particles, that is, every four particles, is extracted. In the case of the arrangement order of the particles shown in Table 2, the selection unit 136 selects the particle f, the particle j, and the particle k as the three particles. "Every four pieces" corresponds to the number interval of the present invention.

In the case of the second group, the number of particles included in the second group is 6, and the value obtained by dividing 6 by 3, which is the number of particles selected, is 2. Therefore, in the case of the second group, one out of two particles, that is, every other particle is extracted. In the case of the arrangement order of the particles shown in Table 3, the selection unit 136 selects the particle f, the particle i, and the particle a as the three particles. "Every other piece" corresponds to the number interval of the present invention.

In the case of the third group, the number of particles included in the third group is 8, and the value obtained by dividing 8 by 3, which is the number of particles selected, is 2.67. For this reason, after the decimal point is rounded up, one out of three particles, that is, every two particles is extracted. In the case of the arrangement order of the particles shown in Table 4, the selection unit 136 selects the particles g, the particles n, and the particles h as the three particles. "Every two pieces" corresponds to the number interval of the present invention.

3 and 4 are diagrams showing examples of display screens displayed on the display unit 80. FIG.
The display control unit 137 generates a display screen and causes the display unit 80 to display it.
A display column 81, a display column 82, and a display column 83 are displayed on the display screen shown in FIG.
The display field 81 displays the distances of three particles f, j and k selected from the first group, and thumbnail images.
The display field 82 displays the distances of the three particles f, particle i, and particle a selected from the second group, and thumbnail images.
The display field 83 displays the distances and thumbnail images of three particles g, n and h selected from the third group.
In this way, in the present embodiment, from particles with a short distance to the reference point to particles with a long distance to the reference point are uniformly selected, and thumbnail images of the selected particles are displayed on the display unit 80. can be done. The user can refer to the thumbnail image displayed on the display unit 80 to determine whether the set detection range is appropriate.

On the display screen shown in FIG. 4, a display column 84 is displayed in addition to the display column 81, the display column 81, and the display column 83. FIG.
In the display column 84, the thumbnail images of the particles of the third group, that is, the particles classified outside the filter range 150, are displayed in order of decreasing distance from the reference point.
By arranging and displaying thumbnail images of particles in descending order of distance from a reference point, it is possible to easily visually confirm particle images slightly outside the filter range 150, and examine the validity of the filter range 150. - 特許庁It can be used as information when

[2. Operation of Particle Image Analysis Device]
FIG. 5 is a flow chart showing the operation of the control device 100. As shown in FIG. The operation of the control device 100 will be described with reference to the flowchart shown in FIG.
First, the control device 100 operates the liquid transfer pump 21 . By operating the liquid-sending pump 21 , the sample liquid in the sample liquid storage container 31 flows from the inlet 12 into the channel 15 of the flow cell 10 , passes through the channel 15 , and is discharged from the outlet 14 . Next, the control device 100 instructs the camera 51 to perform photographing (step S2). The camera 51 shoots at predetermined shooting intervals and outputs a particle image 123 obtained by shooting to the control device 100 . The control device 100 stores the input particle image 123 in the storage unit 120 (step S3).

Next, the control device 100 determines whether or not the liquid transfer of the sample liquid stored in the sample liquid storage container 31 has been completed (step S4). The controller 100 continues the operation of the liquid-sending pump 21 and the photographing of the camera 51 when the sample liquid has not been completely sent (step S4/NO).

Further, when the sample liquid stored in the sample liquid storage container 31 is completely sent (step S4/YES), the control device 100 reads the particle image 123 from the storage unit 120, and converts the read particle image 123 to the particle image 125. is cut out (step S5). The control device 100 cuts out the particle image 125 from the particle image 123 by a technique such as contour detection using threshold data (step S5). The clipped particle image 125 is stored in the storage unit 120 together with identification information for identifying the particle image 125 .

Next, the control device 100 calculates evaluation values of a plurality of analysis parameters for each particle photographed in the extracted particle image 125 (step S6). The control device 100 stores the calculated evaluation value in the storage unit 120 in association with the identification information of the corresponding particle image 125 .
Next, the control device 100 sets, in a memory such as a RAM provided in the storage unit 120, coordinates with the equivalent area diameter on the X axis and the aspect ratio on the Y axis, and sets the filter range 150 on the set coordinates (step S7).

Next, the control device 100 selects target particles to be filtered (step S8). When the target particles are selected, the control device 100 acquires the evaluation values of the equivalent area diameter and the aspect ratio of the selected target particles from the storage unit 120 . The control device 100 executes filtering based on the acquired evaluation values of the equivalent area diameter and the aspect ratio. Specifically, the control device 100 determines whether the coordinate position determined by the evaluation values of the area-equivalent diameter and aspect ratio of the target particle is within the filter range 150 or outside the filter range 150. . If the coordinate position of the target particle determined based on the evaluation value is within the filter range 150, the control device 100 classifies the target particle into the second group. Further, when the coordinate position of the target particle determined based on the evaluation value is outside the filter range 150, the control device 100 classifies the target particle into the third group.

Next, the control device 100 determines whether or not all particles have been selected as target particles (step S10). If all particles have not been selected as target particles (step S10/NO), control device 100 returns to the process of step S8 and selects the next target particle. If all particles have been selected as target particles (step S10/YES), the control device 100 proceeds to the next process.

Next, the control device 100 calculates the distance between each particle and the reference point. First, the control device 100 selects target particles for distance calculation (step S11). Next, the control device 100 calculates the distance between the selected target particle and the reference point (step S12). Specifically, the control device 100 acquires the evaluation values of the equivalent area diameter and the aspect ratio of the target particles. Next, the control device 100 obtains the coordinate position determined by the obtained evaluation values of the equivalent area diameter and the aspect ratio, the distance to the reference point in the X-axis direction, and the distance in the Y-axis direction. Next, the control device 100 normalizes the obtained distance in the X-axis direction and the distance in the Y-axis direction, and calculates the distance from the target particle to the reference point based on the normalized distance in the X-axis direction and the distance in the Y-axis direction. Calculate the distance.

Next, the control device 100 determines whether or not all particles have been selected as target particles (step S13). If all particles have not been selected as target particles (step S13/NO), the control device 100 returns to the process of step S11 and selects the next target particle. If all particles have been selected as target particles (step S13/YES), the control device 100 proceeds to the process of step S14.

The control device 100 selects particles for which thumbnail images of the particle images 125 are to be displayed for each group of the first group, the second group, and the third group (step S14).
Specifically, first, the control device 100 creates a particle train for each group of the first group, the second group, and the third group. This particle string is created by rearranging the particles classified into each group in descending order of distance from the reference point.
Next, control device 100 selects particles for which thumbnail images are to be displayed, based on the number of particles classified into groups and the number of particles selected as display particles from the groups. For example, if the number of particles included in the second group is 100 and the number of particles to be selected as display particles is 10, the control device 100 selects particles at intervals of 10 from the particle row arranged in descending order of distance. select. The control device 100 executes this process for all the first, second and third groups.

Next, the control device 100 generates a thumbnail image of each particle selected from each of the first, second and third groups. Next, as shown in FIG. 4, the control device 100 sets the identification information of the display particles, the distance to the reference point, and the thumbnail image for each of the first group, the second group, and the third group. They are displayed in association with each other (step S15).

Next, control device 100 determines whether or not an operation to change filter range 150 has been received (step S16). When receiving an operation to change the filter range 150 (step S16/YES), the control device 100 returns to the process of step S7 and sets the filter range 150 again. If the control device 100 has not received an operation to change the filter range 150 (step S16/NO), the processing flow ends.

[3. mode and effect]
It will be appreciated by those skilled in the art that the above-described embodiments are specific examples of the following aspects.

(Section 1)
A particle image analysis apparatus according to a first aspect includes an evaluation value calculation unit that performs image analysis on a particle image obtained by photographing a liquid sample in which particles are dispersed, and calculates evaluation values of a plurality of parameters that indicate the shape of particles in the particle image. and the evaluation value of the first parameter included in the plurality of parameters and the evaluation value of the second parameter different from the first parameter are used as variables to set a detection range to coordinates, and the particles of the particle image are set to: a classification unit that classifies particles positioned within the detection range and particles positioned outside the detection range; a reference point set within the detection range; a distance calculation unit that calculates the distance of , a selection unit that selects a particle based on the distance calculated by the distance calculation unit, and a display unit that displays a particle image of the particle selected by the selection unit.

According to the particle image analysis device of the first aspect, a particle is selected based on the distance from the reference point within the detection range, and the particle image of the selected particle is displayed. Therefore, by visually confirming the particle image of the particles selected based on the distance, it is possible to determine the validity of the set detection range. Therefore, it is possible to provide information that enables determination of whether or not the setting of the detection range is appropriate.

(Section 2)
2. In the particle image analysis device according to claim 1, the selection unit generates a row of particles arranged in descending order of distance from the reference point, and based on the total number of particles and the number of particles to be selected. and determining a number interval for selecting particles from the particle array, and selecting particles for each of the determined number intervals from the particle array.

According to the particle image analysis device according to the second aspect, from the particle array arranged in order of distance from the reference point, for each number interval determined based on the total number of particles and the number of selections for selecting particles particles are selected for Therefore, it is possible to prevent the selection of only particles with a short distance to the reference point or the selection of only particles with a long distance to the reference point. In addition, it is possible to uniformly select particles ranging from particles with a short distance to the reference point to particles with a long distance to the reference point, and it is possible to determine whether or not the set detection range is appropriate.

(Section 3)
In the particle image analysis device according to item 1 or item 2, the selection unit selects the particles within the range determined by the classification unit to be particles located within the detection range in order of decreasing distance from the reference point. aligning and generating a particle train, determining a number interval for selecting particles from the particle train based on the total number of particles within the range and the number of selections for selecting particles from the within-range particles; Particles are selected for each of the determined number intervals.

According to the particle image analysis device according to item 3, the total number of particles within the range from the particle array in which the particles within the range are arranged in order of decreasing distance from the reference point, and the selection of selecting particles from the particles within the range Particles are selected for each number interval determined based on the number of particles. Therefore, within-range particles within the detection range can be uniformly selected from particles with a short distance to the reference point to particles with a long distance to the reference point.

(Section 4)
4. In the particle image analysis apparatus according to any one of items 1 to 3, the selection unit selects out-of-range particles determined by the classification unit as particles located outside the detection range from the reference point. are arranged in descending order of distance to generate a particle string, and the number interval for selecting particles from the particle string is determined based on the total number of out-of-range particles and the number of selections for selecting particles from the out-of-range particles. , select particles for each of the number intervals determined from the particle train.

According to the particle image analysis device according to item 4, the total number of out-of-range particles and the selection of selecting particles from out-of-range particles from a particle row in which out-of-range particles are arranged in order of decreasing distance from the reference point Particles are selected for each number interval determined based on the number of particles. Therefore, out-of-range particles outside the detection range can be uniformly selected from particles with a short distance to the reference point to particles with a long distance to the reference point.

(Section 5)
In the particle image analysis device according to any one of items 1 to 4, the distance calculation unit uses the evaluation value of the first parameter as a variable as the distance between the particle in the particle image and the reference point. and a second distance on the second coordinate axis with the evaluation value of the second parameter as a variable, and the calculated first distance and the second distance are normalized and calculate the distance between the particle in the particle image and the reference point based on the first distance after normalization and the second distance after normalization.

According to the particle image analysis device of item 5, the distance between the particle in the particle image and the reference point is calculated based on the normalized first distance and the normalized second distance. Therefore, it is possible to reduce the influence of the number of digits of the evaluation values of the first parameter and the second parameter.

(Section 6)
In the particle image analysis device according to any one of items 1 to 5, the first parameter is the equivalent area diameter, and the second parameter is the aspect ratio of the particles.

According to the particle image analysis apparatus of the sixth aspect, the particle detection range can be set based on the evaluation values of the equivalent area diameter and the aspect ratio of the particles.

[4. Other embodiments]
The particle image analysis apparatus 1 according to this embodiment is merely an example of the particle image analysis apparatus according to the present invention, and can be arbitrarily modified and applied without departing from the gist of the present invention.
For example, in the above-described embodiment, the center of the filter range 150 is set as the reference point. That is, the sum of the coordinate values of the X coordinates of the particles included in the filter range 150 is obtained, and the obtained coordinate values of the X coordinates are divided by the number of particles included in the filter range 150 to obtain the average value of the X coordinates. . Similarly, the sum of the coordinate values of the Y coordinates of the particles contained within the filter range 150 is obtained, and the obtained coordinate values of the Y coordinates are divided by the number of particles contained within the filter range 150 to obtain the average value of the Y coordinates. Ask. The calculated average value of the X coordinates and the average value of the Y coordinates are used as the coordinates of the reference point.
Also, the reference point may be set on the boundary line of the filter range 150 . For example, the reference point may be set at the position where the line segment connecting the particle and the center of the filter range 150 intersects the boundary line of the filter range 150 .

Further, in the present embodiment, the control device 100 of the particle image analysis apparatus 1 includes an imaging control unit 131, a particle image extraction unit 132, an analysis processing unit 133, a filter processing unit 134, a distance calculation unit 135, a selection unit 136, and a display unit. Although the controller 137 is provided, the present invention is not limited to this. For example, the control device 100 of the particle image analysis device 1 includes the imaging control unit 131 and the storage unit 120, and the control device configured by a personal computer or the like separate from the particle image analysis device 1 is the particle image extraction unit. 132 , an analysis processor 133 , a filter processor 134 , a distance calculator 135 , a selector 136 and a display controller 137 .

Moreover, each functional unit shown in FIG. 1 shows a functional configuration, and a specific implementation form is not particularly limited. In other words, it is not always necessary to implement hardware corresponding to each functional unit individually, and it is of course possible to adopt a configuration in which one processor 130 executes a program to realize the functions of a plurality of functional units. . Further, part of the functions realized by software in the above embodiments may be realized by hardware, or part of the functions realized by hardware may be realized by software.

In addition, the processing unit of the flowchart shown in FIG. 5 is divided according to the main processing contents in order to facilitate understanding of the processing of the control device 100 . It is not limited by the division method or name of the processing unit shown in the flow chart of FIG. can also be split to include Also, the processing order of the above flowchart is not limited to the illustrated example.

The control program 121 to be executed by the processor 130 of the control device 100 can also be recorded in a computer-readable recording medium. A magnetic or optical recording medium or a semiconductor memory device can be used as the recording medium. Specifically, flexible disks, HDDs, CD-ROMs (Compact Disk Read Only Memory), DVDs, Blu-ray (registered trademark) Discs, magneto-optical disks, flash memories, card-type recording media, and other portable or fixed recording medium of the formula. Alternatively, the control program 121 may be stored in a server device or the like, and the control program 121 may be downloaded from the server device to the particle image analysis apparatus 1 .

Reference Signs List 1 particle image analyzer 10 flow cell 11 upper end surface 12 inlet 13 lower end surface 14 outlet 15 flow path 20 sample liquid supply mechanism 21 liquid pump 23 outlet tube 31 sample liquid storage container 33 inlet tube 35 waste liquid tube 37 waste liquid tank 40 illumination unit 41 light source device 43 measurement light 50 photographing section 51 camera 52 image sensor 52A imaging surface 53 signal processing circuit 54 telecentric microscope 55 telecentric lens 56 focus mechanism 57 lens drive mechanism 70 operation section 80 display section 100 control device 110 interface section 120 storage section 121 Control program 123 Particle image 125 Particle image 130 Processor 131 Imaging control unit 132 Particle image extraction unit 133 Analysis processing unit 134 Filter processing unit 135 Distance calculation unit 136 Selection unit 150 Filter range

Claims (6)

an evaluation value calculation unit that performs image analysis on a particle image obtained by photographing a liquid sample in which particles are dispersed, and calculates evaluation values of a plurality of parameters indicating the shape of particles in the particle image;
A detection range is set to coordinates having an evaluation value of a first parameter included in the plurality of parameters and an evaluation value of a second parameter different from the first parameter as variables, and particles in the particle image are detected by the detection. a classifying unit that classifies particles located within the detection range and particles located outside the detection range;
a distance calculation unit that calculates a distance on the coordinates between a reference point set within the detection range and particles of the particle image;
a selection unit that selects particles based on the distance calculated by the distance calculation unit;
and a display unit for displaying a particle image of the particles selected by the selection unit. The selection unit generates a row of particles by arranging them in descending order of distance from the reference point,
determining a number interval for selecting particles from the particle train based on the total number of particles and the number of selections for selecting particles;
2. The particle image analysis apparatus according to claim 1, wherein particles are selected for each of said number intervals determined from said particle train. The selecting unit arranges the particles within the range determined by the classifying unit to be particles located within the detection range in descending order of distance from the reference point to generate a particle string,
determining a number interval for selecting particles from the particle array based on the total number of particles within the range and the number of selections for selecting particles from the particles within the range;
3. The particle image analysis apparatus according to claim 1, wherein particles are selected for each of said number intervals determined from said particle train. The selecting unit arranges the out-of-range particles determined by the classifying unit to be outside the detection range in order of decreasing distance from the reference point to generate a particle string,
determining a number interval for selecting particles from the particle array based on the total number of out-of-range particles and the number of selections for selecting particles from the out-of-range particles;
The particle image analysis apparatus according to any one of claims 1 to 3, wherein particles are selected for each number interval determined from the particle train. The distance calculation unit uses the first distance on the first coordinate axis with the evaluation value of the first parameter as the variable and the evaluation value of the second parameter as the distance between the particle of the particle image and the reference point. A second distance on the second coordinate axis is calculated, and the calculated first distance and the second distance are normalized, and the first distance after normalization and the second distance after normalization The particle image analysis device according to any one of claims 1 to 4, wherein the distance between the particle in the particle image and the reference point is calculated based on. The particle image analysis apparatus according to any one of claims 1 to 5, wherein the first parameter is an equivalent area diameter and the second parameter is an aspect ratio of particles.

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