JP2022163308A - Abnormality inspection device - Google Patents

Abstract

To provide an abnormality inspection device with which it is possible to accurately inspect abnormality in a linear object.SOLUTION: An abnormality inspection device 1 is designed to inspect abnormality in a cable 100 which is the object to be inspected. This abnormality inspection device 1 comprises an image inspection device 2 and an eddy current flaw detection device 3 including an eddy current flaw detection sensor 31 which are connected to each other by a connecting member 4. The image inspection device 2 includes an imaging unit 23 for acquiring the image data of outer circumferential surface of the cable 100. The eddy current flaw detection device 3 includes an eddy current flaw detection sensor 31 having a base unit 311 in which is formed an insertion hole 311A that accepts insertion of the cable 100 and an inspection coil 312 for generating an eddy current in the cable 100 wound around the base unit 311.SELECTED DRAWING: Figure 1

Description

The present invention relates to an abnormality inspection device for inspecting an abnormality in a linear body such as a diagonal cable.

2. Description of the Related Art A technique using an eddy current flaw detection sensor is known as a technique for inspecting an abnormality such as damage in a linear body such as a stay cable that is stretched diagonally from a main tower of a cable-stayed bridge and supports a bridge girder. An eddy current flaw detection sensor of this type is disclosed in, for example, Patent Document 1.

The eddy current flaw detection sensor disclosed in Patent Document 1 includes a coil bobbin fitted around the linear body to be inspected so as to be movable along the linear body, and an inspection coil wound around the coil bobbin. there is In the eddy current flaw detection sensor, the inspection coil generates an eddy current in the linear body in a state in which the linear body is inserted through the insertion hole of the coil bobbin. If there is an abnormal portion in the linear body, the flow of the eddy current changes at the abnormal portion, so the current of the inspection coil changes.

An eddy current flaw detection sensor can detect anomalies in a linear body based on current changes in an inspection coil. Further, the eddy current flaw detection sensor can continuously detect abnormalities in the axial direction of the linear body by moving the coil bobbin along the linear body.

Japanese Patent No. 4101110

By the way, the inspection of an abnormality in a linear body by an eddy current flaw detection sensor may be affected by the shape of the linear body. For example, if there is a bulge on the outer peripheral surface of the linear body due to accumulation of rust, the gap between the inspection coil and the linear body fluctuates. There is a risk of giving Therefore, there is room for improvement in order to accurately inspect for abnormalities in the linear body.

SUMMARY OF THE INVENTION It is an object of the present invention to provide an abnormality inspection apparatus capable of accurately inspecting an abnormality in a linear body.

An abnormality inspection apparatus according to one aspect of the present invention is an apparatus for inspecting an abnormality in a linear body to be inspected. This abnormality inspection device includes an image inspection device including an imaging unit for acquiring image data of the outer peripheral surface of the linear body, a substrate having an insertion hole through which the linear body is allowed to pass, and a wire wound around the substrate. An eddy current flaw detection device including an eddy current flaw detection sensor having an inspection coil that is rotated to generate an eddy current in the linear body, and a connecting member that connects the image inspection device and the eddy current flaw detection sensor.

According to this abnormality inspection apparatus, the abnormality of the linear body can be inspected using the image inspection device and the eddy current flaw detection sensor which are connected to each other by the connection member. Specifically, the eddy current flaw detection sensor of the eddy current flaw detection device can detect an abnormality in the linear body based on the current change of the inspection coil while the linear body is inserted through the insertion hole of the substrate. Moreover, in the image inspection apparatus, the imaging unit acquires image data of the outer peripheral surface of the linear body. Abnormalities in the outer peripheral surface of the linear body can be detected based on this image data. In the abnormality inspection apparatus, the eddy current flaw detection sensor can mainly detect an abnormality inside the linear body, and the state of the outer peripheral surface of the linear body can be grasped based on the image data obtained by the imaging unit. Thereby, the abnormality inspection device can accurately inspect the abnormality in the linear body.

In the above abnormality inspection apparatus, the eddy current flaw detection sensor has a pedestal that holds the substrate, and the eddy current flaw detection device includes a reference coil that is separate from the inspection coil and fixed to the pedestal. should be included.

In this aspect, the eddy current flaw detection sensor can detect an abnormality in the linear body while eliminating the influence of disturbance based on the difference between the current of the reference coil and the current of the inspection coil. Moreover, since the reference coil is fixed to the pedestal constituting the eddy current flaw detection sensor, the positional relationship between the inspection coil and the reference coil can be kept constant. Therefore, it is possible to improve the detection accuracy of abnormality in the linear body using the reference coil and the inspection coil. The eddy current flaw detector can be made compact while improving the

In the abnormality inspection apparatus described above, it is desirable that the pedestal be made of a non-magnetic material.

In this aspect, since the pedestal that holds the eddy current flaw detection sensor is made of a non-magnetic material, generation of eddy current by the inspection coil in the pedestal is suppressed. As a result, the eddy current flaw detection sensor can accurately detect an abnormality in the linear body.

In the above abnormality inspection apparatus, the eddy current flaw detector preferably includes a flaw detector fixed to the pedestal and outputting a flaw detection signal based on the difference between the current of the reference coil and the current of the inspection coil.

In this aspect, the flaw detection processor outputs a flaw detection signal based on the difference between the current of the reference coil and the current of the inspection coil. Abnormality of the linear body can be inspected based on the flaw detection signal output from the flaw detection processor. Moreover, since the flaw detector is a frame that constitutes the eddy current flaw detector and is fixed to the base to which the reference coil is fixed, the positional relationship between the inspection coil, the reference coil, and the flaw detector is constant. can hold. Therefore, it is possible to further improve the detection accuracy of abnormality in the linear body using the reference coil and the inspection coil, and to make the eddy current flaw detector even more compact.

In the above-described abnormality inspection apparatus, the pedestal includes a gap adjusting section capable of adjusting a gap between the inspection coil and the linear body on the radially inner side of the inspection coil according to the diameter of the linear body. It is desirable to have

In this aspect, the gap adjustment section of the gantry can adjust the gap between the inspection coil and the linear body on the radially inner side of the inspection coil, corresponding to a plurality of types of linear bodies having different diameters. Therefore, the eddy current flaw detector can be used to detect defects in a plurality of types of linear bodies having different diameters.

In the abnormality inspection apparatus described above, it is preferable that the gap adjuster can adjust the gap so that the radial center of the inspection coil is positioned on the central axis of the linear body.

In this aspect, the gap adjuster adjusts the gap between the linear body and the test coil so that the radial center of the test coil is positioned on the central axis of the linear body. As a result, in a state in which the linear body is inserted through the insertion hole of the substrate of the eddy current flaw detection sensor, it is possible to suppress uneven distribution of the linear body in the radial direction with respect to the center of the inspection coil. Therefore, the eddy current flaw detection sensor can accurately detect an abnormality in the linear body.

In the above abnormality inspection device, the image inspection device is made of a metal magnetic material and includes a frame member to which the imaging unit is attached, and the eddy current flaw detection device is a coil separate and independent from the inspection coil, The configuration may include a reference coil fixed to the frame member via a support made of a non-magnetic material.

In this aspect, the eddy current flaw detector can detect an abnormality in the linear body while eliminating the influence of disturbance based on the difference between the current of the reference coil and the current of the inspection coil. Moreover, since the reference coil is fixed to the frame member through the support made of a non-magnetic material, the distance between the reference coil and the frame member can be kept constant according to the interposition of the support. can. As a result, when the reference coil is fixed to the frame member made of a metallic magnetic material, it is possible to suppress a decrease in the accuracy of detection of abnormality in the linear body using the reference coil and the inspection coil.

In the above abnormality inspection apparatus, the image inspection device includes a movement mechanism for moving along the linear body, and the eddy current flaw detection device moves along the linear body according to the movement of the image inspection device. It is preferable to move

In this aspect, the image inspection apparatus moves along the linear body by the moving mechanism. Based on the image data acquired by the imaging unit while the image inspection apparatus is moving, the state of the outer peripheral surface of the linear body can be continuously grasped in the axial direction of the linear body. Further, the eddy current flaw detection device moves along the linear body in accordance with the movement of the image inspection device, so that the eddy current flaw detection sensor can continuously detect abnormalities in the axial direction of the linear body.

In the above-described abnormality inspection apparatus, the image inspection device includes a frame member made of a metallic magnetic material and to which the imaging unit is attached, and the connection member is configured to be at least as high as the linear body during inspection by the eddy current flaw detection sensor. The frame member and the eddy current flaw detection sensor are connected so that the separation distance between the inspection coil and the frame member in the axial direction of is stable at a distance of 0.1 times or more the outer diameter of the inspection coil is desirable.

In this aspect, the image inspection apparatus includes a frame member made of a metallic magnetic material. A metallic magnetic material is a material that affects eddy current flaw detection by an eddy current flaw detection sensor. Therefore, when the frame member exists in the vicinity of the inspection coil of the eddy current flaw detection sensor, there is a possibility that the detection accuracy of the abnormality of the linear body by the eddy current flaw detection sensor is lowered. Therefore, in the connecting member, at least during inspection by the eddy current flaw detection sensor, the separation distance between the inspection coil and the frame member in the axial direction of the linear body is stabilized at a distance of 0.1 times or more the outer diameter of the inspection coil. The frame member and the eddy current flaw detection sensor are connected as follows. As a result, it is possible to suppress deterioration in the detection accuracy of the abnormality of the linear body by the eddy current flaw detection sensor due to the frame member.

In the abnormality inspection apparatus described above, the eddy current flaw detection sensor may be attached to the base so as to cover the inspection coil, and may have a shielding material that shields magnetism.

In this aspect, the magnetism generated by the inspection coil can be shielded from leaking out from the shield material. Thereby, it is possible to suppress the influence of magnetism by the inspection coil on the magnetic material arranged outside the shield material. Therefore, it is possible to suppress the occurrence of eddy currents in the magnetic material, thereby suppressing deterioration in the detection accuracy of the abnormality of the linear body by the eddy current flaw detection sensor.

As described above, according to the present invention, it is possible to provide an abnormality inspection apparatus capable of accurately inspecting an abnormality in a linear body.

1 is a side view showing the overall configuration of an abnormality inspection device according to a first embodiment of the present invention; FIG. 1 is a perspective view showing the configuration of an image inspection device provided in an abnormality inspection device according to a first embodiment; FIG. It is a figure which shows the structure of the eddy current flaw detection apparatus with which the abnormality inspection apparatus based on 1st Embodiment is equipped. 5 is a graph showing an example of flaw detection results by an eddy current flaw detector. It is a side view which shows the whole structure of the abnormality inspection apparatus which concerns on 2nd Embodiment of this invention. FIG. 11 is a perspective view showing the configuration of an image inspection device provided in the abnormality inspection device according to the second embodiment; It is a side view which shows the whole structure of the abnormality inspection apparatus which concerns on 3rd Embodiment of this invention. It is a figure which shows the structure of the eddy current flaw detection apparatus with which the abnormality inspection apparatus based on 3rd Embodiment is equipped. It is a side view which shows the whole structure of the abnormality inspection apparatus which concerns on 4th Embodiment of this invention. FIG. 11 is a diagram showing an eddy current flaw detection sensor of an eddy current flaw detection device provided in an abnormality inspection apparatus according to a fourth embodiment; It is a side view which shows the whole structure of the abnormality inspection apparatus which concerns on 5th Embodiment of this invention. FIG. 11 is a diagram showing an eddy current flaw detection sensor of an eddy current flaw detection device provided in an abnormality inspection apparatus according to a fifth embodiment;

An abnormality inspection apparatus according to an embodiment of the present invention will be described below with reference to the drawings.

(First embodiment)
An abnormality inspection device 1 according to a first embodiment will be described with reference to FIGS. 1 to 4. FIG. This abnormality inspection apparatus 1 is an apparatus for inspecting an abnormality in a linear body to be inspected. The linear body includes, for example, a cable 100 such as a stay cable that is stretched diagonally from a main tower of a cable-stayed bridge to support a bridge girder. The cable 100 may have a structure in which a plurality of steel wires 102 are housed inside a cylindrical outer tube 101, as shown in FIG. Moreover, as the steel wire 102, the surface thereof may be plated with zinc plating or the like. The abnormality inspection device 1 inspects abnormalities such as damage to the outer tube 101 forming the outer peripheral surface of the cable 100, thinning of the steel wire 102, rust, consumption of plating, and the like.

As shown in FIG. 1 , the abnormality inspection device 1 includes an image inspection device 2 , an eddy current flaw detection device 3 and a connecting member 4 .

The connecting member 4 connects the image inspection device 2 and the eddy current flaw detection sensor 31 of the eddy current flaw detection device 3 so that the image inspection device 2 and the eddy current flaw detection device 3 are aligned in the axial direction of the cable 100 . The connecting member 4 is made of, for example, a wire rope. Although the connecting member 4 may be made of a metallic magnetic material, it is preferably made of a non-magnetic material, and particularly preferably made of a non-magnetic and electrically insulating material.

The image inspection device 2 is a self-propelled device that runs along the cable 100 mainly for inspecting the damage of the outer tube 101 of the cable 100 . As shown in FIGS. 1 and 2, the image inspection apparatus 2 includes a frame member 21, wheels 22, an imaging unit 23, a control unit 24, a battery 25, a drive motor 26, and an encoder 27. ing.

The frame member 21 is a member that defines a passage through which the cable 100 is passed. The material forming the frame member 21 is not particularly limited, but in this embodiment, the frame member 21 is made of a metallic magnetic material. The frame member 21 includes a pair of annular end defining portions 211 defining both ends in the longitudinal direction along the cable 100, a plurality of wheel support portions 212 protruding inward from each end defining portion 211, and one end. and a connection fixing portion 213 projecting outward from the portion defining portion 211 . Note that the connection member 4 is fixed to the connection fixing portion 213 .

The wheel 22 is rotatably attached to the wheel support portion 212 of the frame member 21 and contacts the outer peripheral surface of the cable 100 in this state. The number of wheels 22 to be installed is not particularly limited.

The drive motor 26 is a drive source that rotates the wheels 22 . A drive motor 26 is attached to the frame member 21 . The wheels 22 and the drive motor 26 constitute a movement mechanism for moving the image inspection apparatus 2 along the cable 100 . That is, the image inspection apparatus 2 moves (self-runs) along the cable 100 by rotating the wheel 22 in contact with the outer peripheral surface of the cable 100 by driving the drive motor 26 .

The encoder 27 detects the rotation of the drive motor 26 to acquire movement distance data indicating the movement distance of the image inspection apparatus 2 along the cable 100 .

The imaging section 23 is attached to the end defining section 211 of the frame member 21 . The imaging unit 23 acquires image data of the outer peripheral surface of the cable 100 . The attachment positions and the number of attachments of the imaging units 23 are set so that the imaging units 23 can acquire the image data of the entire circumferential direction of the outer peripheral surface of the cable 100 .

A battery 25 is attached to the frame member 21 . The battery 25 is a power source that supplies power to the imaging unit 23 and the drive motor 26 .

The controller 24 is attached to the frame member 21 . The control unit 24 inputs an imaging control signal to the imaging unit 23 and inputs a drive control signal to the drive motor 26 . The imaging unit 23 to which the imaging control signal from the control unit 24 is input acquires image data of the outer peripheral surface of the cable 100 according to the imaging control signal. Further, the drive motor 26 to which the drive control signal from the control section 24 is input is rotationally driven according to the drive control signal.

In the image inspection apparatus 2 , the imaging section 23 acquires image data of the outer peripheral surface of the cable 100 . Based on this image data, the state of the outer peripheral surface of the cable 100 can be grasped. Further, the image inspection apparatus 2 moves (self-runs) along the cable 100 according to the rotation of the wheels 22 driven by the drive motor 26 . Based on the image data acquired by the imaging unit 23 while the image inspection apparatus 2 is moving, the state of the outer peripheral surface of the cable 100 can be continuously grasped in the axial direction of the cable 100 .

The eddy current flaw detector 3 is a device mainly for inspecting abnormalities such as thinning, rust, and consumption of plating in the steel wire 102 of the cable 100 . As shown in FIGS. 1 and 3 , the eddy current flaw detector 3 includes an eddy current flaw detector 31 , a reference coil 32 , and a flaw detector 33 .

The eddy current flaw detection sensor 31 has a base 311 formed with an insertion hole 311A through which the cable 100 is inserted, an inspection coil 312 wound around the base 311, and a first base 34A and a second base 34B. is doing.

The base 311 is made of a non-magnetic material such as synthetic resin. The base 311 is composed of a pair of semi-cylindrical half-split members 3111 . A pair of half-split members 3111 are connected via hinges 3112 so as to be openable and closable. The pair of half-split members 3111 are formed with insertion holes 311A through which the cable 100 can be inserted in the closed state. In other words, the pair of half-split members 3111 sandwich the cable 100 in the closed state.

When the cable 100 is inserted through the insertion hole 311</b>A of the base 311 , the cable 100 is arranged radially inside the inspection coil 312 wound around the base 311 . When an alternating current flows through the inspection coil 312 , a magnetic field is generated, and an eddy current is generated in the cable 100 arranged radially inside the inspection coil 312 . In this embodiment, the inspection coil 312 has a structure in which connection terminals 3121 are provided at one end and the other end of a bundle of a plurality of coil wires. 311 constitutes a coil.

If there is an abnormal point in the cable 100, the flow of eddy current changes at the abnormal point, so the current in the inspection coil 312 changes. Therefore, the eddy current flaw detection sensor 31 can detect an abnormality of the cable 100 based on the current change of the inspection coil 312 while the cable 100 is inserted through the insertion hole 311A of the base 311 .

Further, since the eddy current flaw detection sensor 31 is connected to the image inspection device 2 by the connection member 4, the eddy current flaw detection device 3 moves along the cable 100 according to the movement (self-running) of the image inspection device 2. As the eddy current flaw detector 3 moves along the cable 100 in this manner, the eddy current flaw detector 31 can continuously detect an abnormality in the cable 100 in the axial direction.

Here, the results of eddy current flaw detection of the cable 100 by the eddy current flaw detection sensor 31 will be described with reference to the graph of FIG. The graph shown in FIG. 4 shows the relationship between the signal strength (V) of the flaw detection signal indicating the result of eddy current flaw detection by the eddy current flaw detection sensor 31 and the movement distance (mm) of the eddy current flaw detection sensor 31 according to the movement of the eddy current flaw detection device 3. indicates In the cable 100, regions separated by distances D1, D3, and D5 from the origin D0 are normal regions, and regions separated by distances D2, D4, D6, and D7 from the origin D0 are abnormal. is assumed to be the abnormal location where At an abnormal location separated by a distance D2 from the origin D0, the steel wire 102 has an abnormality such as thinning and rust. At an abnormal location separated by a distance D4 from the origin D0, the steel wire 102 has an abnormality of thinning. At an abnormal location separated by a distance D6 from the origin D0, the steel wire 102 has an abnormality such as consumption of plating and rust. At an abnormal point separated by a distance D7 from the origin D0, the steel wire 102 has an abnormality due to consumption of the plating.

As is clear from the graph of FIG. 4, the signal strength (V) of the flaw detection signal from the eddy current flaw detection sensor 31 varies between the normal location and the abnormal location in the cable 100 arranged radially inside the inspection coil 312. Different values are shown depending on the current change of the coil 312 . Moreover, at an abnormal location in the cable 100, the signal strength (V) of the flaw detection signal differs depending on the type of abnormality (thickness reduction, rust, wear of plating). Therefore, the eddy current flaw detection sensor 31 can detect abnormalities such as thinning, rust, and consumption of plating in the steel wire 102 of the cable 100 based on the current change of the inspection coil 312 .

Returning to FIGS. 1 and 3, the reference coil 32 is a coil that is separate and independent from the inspection coil 312 and is a coil wound around a cylindrical support 321 . The support 321 is made of a non-magnetic material such as synthetic resin, like the base 311 of the eddy current flaw detection sensor 31 . In the eddy current testing apparatus 3 having the reference coil 32, the eddy current testing sensor 31 detects an abnormality in the cable 100 based on the difference between the current of the reference coil 32 and the current of the inspection coil 312 while eliminating the influence of disturbance. be able to.

The flaw detection processor 33 includes a display unit 332 , a power supply unit 333 and a processing unit 334 housed in a housing 331 . The power supply unit 333 is a power supply that supplies power to the inspection coil 312 and the reference coil 32 . The processing unit 334 outputs a flaw detection signal based on the difference between the current of the inspection coil 312 and the current of the reference coil 32 . The flaw detection signal output from the processing unit 334 is a signal indicating the result of eddy current flaw detection by the eddy current flaw detection sensor 31 . The flaw detection signal is input to the display section 332 . The display unit 332 displays the waveform of the input flaw detection signal.

The first mount 34A and the second mount 34B are mounts for holding the substrate 311 in the eddy current flaw detection sensor 31 . In the eddy current flaw detection sensor 31, the first pedestal 34A and the second pedestal 34B are arranged to face each other with a predetermined gap in the radial direction of the inspection coil 312. As shown in FIG. In the eddy current flaw detection sensor 31, the base 311 around which the inspection coil 312 is wound is fixed to both the pedestals 34A and 34B while being placed between the first pedestal 34A and the second pedestal 34B. Specifically, in the eddy current flaw detection sensor 31, the base 311 is fixed to the first pedestal 34A and the second pedestal 34B by screw members or the like.

In this embodiment, the reference coil 32 is fixed to the first pedestal 34A. That is, the reference coil 32 is fixed to the pedestal that constitutes the eddy current flaw detection sensor 31 . Thereby, the positional relationship between the inspection coil 312 and the reference coil 32 can be kept constant. Therefore, it is possible not only to improve the detection accuracy of abnormality in the cable 100 using the reference coil 32 and the inspection coil 312, but also to arrange the reference coil 32 and the inspection coil 312 close to each other. , the eddy current flaw detector 3 can be made compact while improving the detection accuracy.

Further, the flaw detector 33 is fixed to the second mount 34B. In other words, the flaw detector 33 is fixed to the pedestal constituting the eddy current flaw detector 31 . Moreover, the flaw detector 33 is fixed to a second mount 34B paired with the first mount 34A to which the reference coil 32 is fixed. Thereby, the positional relationship among the inspection coil 312, the reference coil 32, and the flaw detector 33 can be kept constant. Therefore, it is possible to further improve the detection accuracy of abnormality in the cable 100 using the reference coil 32 and the inspection coil 312, and to make the eddy current flaw detector 3 more compact.

The first mount 34A and the second mount 34B are made of a non-magnetic material. Synthetic resin, non-magnetic stainless steel, and the like can be given as examples of the non-magnetic material that constitutes the first mount 34A and the second mount 34B. Since the first frame 34A and the second frame 34B are made of a non-magnetic material, the inspection coil 312 can perform Eddy current generation is suppressed. Therefore, the eddy current flaw detection sensor 31 can accurately detect the abnormality of the cable 100 .

Each of the first pedestal 34A and the second pedestal 34B includes a pedestal main body 341, a pair of gap support portions 342, and a gap adjusting member 343. As shown in FIG.

The gantry main body 341 configures main body portions of the first gantry 34A and the second gantry 34B. Each of the gantry main bodies 341 of the first gantry 34A and the second gantry 34B has a base fixing portion 3411 to which the base 311 is fixed. A gantry main body 341 of the first gantry 34A has a reference coil fixing portion 3412 to which the reference coil 32 is fixed at a portion located on the opposite side of the base fixing portion 3411, and a connecting fixing portion 3413 to which the connecting member 4 is fixed. have. On the other hand, the gantry main body 341 of the second gantry 34B has a processor fixing portion 3414 to which the flaw detection processor 33 is fixed at a portion located on the opposite side of the base fixing portion 3411 .

The pair of gap support portions 342 are arranged in a direction orthogonal to the radial direction of the inspection coil 312 wound around the substrate 311 fixed to the substrate fixing portion 3411 , that is, in the axial direction of the cable 100 so as to be separated from each other. Mounted on. The pair of gap support parts 342 has long holes 3421 extending in the radial direction of the inspection coil 312 and is attached to the gantry main body 341 by fasteners including bolts 3422 inserted through the long holes 3421 .

The gap adjusting member 343 is a member that is attached to the pair of gap supporting portions 342 and contacts the outer peripheral surface of the cable 100 in this state. The gap adjusting member 343 is made of a non-magnetic and electrically insulating material.

By fixing the connecting member 4 to the connecting fixing portion 3413 of the first mount 34A and the connecting fixing portion 213 of the frame member 21 of the image inspection device 2, the image inspection device 2 and the eddy current flaw detection sensor 31 are connected by the connecting member 4. are connected via When the image inspection device 2 moves (self-runs) along the cable 100 in a state in which the image inspection device 2 and the eddy current flaw detection sensor 31 are connected in this way, the eddy currents are generated so as to be pulled by the image inspection device 2 . The entire eddy current flaw detector 3 composed of the flaw detection sensor 31 , the reference coil 32 and the flaw detector 33 moves along the cable 100 . At this time, the gap adjusting member 343 is in contact with the outer peripheral surface of the cable 100 in the first mount 34A and the second mount 34B.

The gap adjusting member 343 contacts the outer peripheral surface of the cable 100 radially inside the inspection coil 312 wound around the substrate 311 fixed to the substrate fixing portions 3411 of the first pedestal 34A and the second pedestal 34B. Thereby, the gap adjusting member 343 has a function of maintaining a constant gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312 .

The position of the gap adjusting member 343 in the radial direction of the inspection coil 312 can be adjusted according to the insertion position of the bolt 3422 into the long hole 3421 when the pair of gap supporting parts 342 are attached to the gantry main body 341 . That is, the gap adjusting member 343 attached to the pair of gap supporting parts 342 functions as a gap adjusting part capable of adjusting the gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312. ing.

For example, the gap adjusting member 343 adjusts the gap between the inspection coil 312 and the cable 100 radially inside the inspection coil 312 according to the diameter of the cable 100 . Thereby, the gap adjusting member 343 can adjust the gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312, corresponding to a plurality of types of cables 100 having different diameters. Therefore, the eddy current flaw detector 3 can be used to detect abnormalities in a plurality of types of cables 100 having different diameters.

Also, the gap adjusting member 343 adjusts the gap between the inspection coil 312 and the cable 100 so that the radial center of the inspection coil 312 is positioned on the central axis of the cable 100 . As a result, the cable 100 is radially unevenly distributed with respect to the center of the inspection coil 312 in a state in which the cable 100 is inserted through the insertion hole 311A of the base 311 of the eddy current flaw detection sensor 31 and arranged inside the inspection coil 312 in the radial direction. can be suppressed. Therefore, the eddy current flaw detection sensor 31 can accurately detect the abnormality of the cable 100 .

As described above, the abnormality inspection device 1 according to this embodiment can inspect the cable 100 for abnormality using the image inspection device 2 and the eddy current flaw detection sensor 31 that are connected to each other by the connection member 4 . Specifically, the eddy current flaw detection sensor 31 of the eddy current flaw detection device 3 can detect an abnormality of the cable 100 based on the current change of the inspection coil 312 while the cable 100 is inserted through the insertion hole 311A of the substrate 311. can. Moreover, in the image inspection apparatus 2 , the imaging section 23 acquires image data of the outer peripheral surface of the cable 100 . Based on this image data, the state of the outer peripheral surface of the cable 100 can be grasped. In the abnormality inspection device 1, the abnormality of the steel wire 102 inside the cable 100 can be mainly detected by the eddy current flaw detection sensor 31, and the outer tube 101 constituting the outer peripheral surface of the cable 100 can be detected based on the image data obtained by the imaging unit 23. status can be grasped. Thereby, the abnormality inspection device 1 can accurately inspect the cable 100 for abnormality.

Here, if a member made of a magnetic material other than the cable 100 to be inspected exists within a range (flaw detection influence range) where the distance from the inspection coil 312 is about twice the outer diameter of the inspection coil 312 or less, The member may affect eddy current flaw detection by the eddy current flaw detection sensor 31 . For this reason, the reference coil 32, the flaw detection processor 33, and the image inspection device 2, which include magnetic materials as constituent elements, are usually arranged so as to be positioned outside the flaw detection influence range. Further, the reference coil 32 needs to be arranged so as to be separated from a member made of a magnetic material other than the cable 100 to be inspected by a distance of about twice the outer diameter of the reference coil 32 or more. Note that the outer diameter of the reference coil 32 is set to a smaller value than the outer diameter of the inspection coil 312 .

In contrast, in the present embodiment, the reference coil 32 is fixed to the first mount 34A so that the separation distance from the inspection coil 312 is 0.1 times or more the outer diameter of the inspection coil 312 . Similarly, the flaw detection processor 33 is fixed to the second mount 34B so that the distance from the inspection coil 312 is 0.1 times or more the outer diameter of the inspection coil 312 . In other words, the reference coil 32 and the flaw detection processor 33 are fixed to the pedestals 34A and 34B so that the separation distance between them and the inspection coil 312 is 0.1 of the outer diameter of the inspection coil 312 within the flaw detection influence range. It is held constant at more than double the distance. As a result, even if the reference coil 32 and the flaw detection processor 33 are arranged within the flaw detection influence range, the detection accuracy of abnormality of the cable 100 by the eddy current flaw detection sensor 31 is lowered due to the reference coil 32 and the flaw detection processor 33. can be suppressed. Further, since the reference coil 32 and the flaw detection processor 33 can be arranged within the flaw detection influence range, the eddy current flaw detector 3 can be made compact while suppressing the deterioration of the detection accuracy of the eddy current flaw detection sensor 31. .

Further, as described above, the image inspection apparatus 2 connected to the eddy current flaw detection sensor 31 via the connecting member 4 includes the frame member 21 made of a metallic magnetic material. When the frame member 21 exists within the flaw detection influence range, there is a possibility that the detection accuracy of abnormality of the cable 100 by the eddy current flaw detection sensor 31 may be lowered. On the other hand, the connecting member 4 connects the image inspection device 2 and the eddy current flaw detection sensor 31 so that the entire eddy current flaw detection device 3 is towed by the image inspection device 2 running along the cable 100 . Since the image inspection device 2 pulls the entire eddy current flaw detector 3 in this manner, the connecting member 4 is pulled at least during the inspection by the eddy current flaw detector 31, and the inspection coil 312 and the frame in the axial direction of the cable 100 are pulled. The separation distance with the member 21 is stabilized. In the connecting member 4, at least during inspection by the eddy current flaw detection sensor 31, the separation distance between the inspection coil 312 and the frame member 21 in the axial direction of the cable 100 is 0.1 times or more the outer diameter of the inspection coil 312. The frame member 21 and the first mount 34A of the eddy current flaw detection sensor 31 are connected so as to be stable. By connecting the image inspection apparatus 2 and the eddy current flaw detection sensor 31 by the connection member 4, the separation distance between the frame member 21 and the inspection coil 312 is the outer diameter of the inspection coil 312 within the flaw detection influence range. It is held constant at distances greater than or equal to 0.1. As a result, even if the frame member 21 is arranged within the flaw detection influence range, it is possible to prevent the frame member 21 from lowering the detection accuracy of the abnormality of the cable 100 by the eddy current flaw detection sensor 31 . In addition, since the image inspection device 2 and the eddy current flaw detection sensor 31 can be connected by the connection member 4 so that the frame member 21 is arranged within the flaw detection influence range, the detection accuracy of the eddy current flaw detection sensor 31 is lowered. The abnormality inspection device 1 can be made compact while suppressing the Moreover, since the image inspection device 2 and the eddy current flaw detection sensor 31 can be arranged close to each other within the flaw detection influence range, the inspection in the axial direction of the cable 100 by the image inspection device 2 and the eddy current flaw detection sensor 31 can be performed. Impossible range can be reduced.

The flaw detector 33 of the eddy current flaw detector 3 is configured to have a communication function for wirelessly communicating with a management device (for example, a management device installed on the ground) different from the abnormality inspection device 1. good too. In this case, the flaw detection processor 33 transmits the flaw detection signal output from the processor 334, which is a signal indicating the result of eddy current flaw detection by the eddy current flaw detection sensor 31, to the management device by wireless communication. As a result, information such as the waveform of the flaw detection signal can be confirmed in real time by the management device on the ground while the eddy current flaw detection sensor 31 is detecting an abnormality in the cable 100 .

A recording medium for recording various data such as image data acquired by the imaging unit 23 and movement distance data acquired by the encoder 27 may be mounted in the control unit 24 of the image inspection apparatus 2 . Alternatively, the control unit 24 may be configured to have a communication function for wirelessly communicating with a management device on the ground. In this case, the control unit 24 transmits various data such as image data and movement distance data to the management device by wireless communication. As a result, various data such as image data and movement distance data can be checked in real time by the management device on the ground during the inspection of abnormality on the outer peripheral surface of the cable 100 by the image inspection device 2 .

Further, the control unit 24 inputs to the imaging unit 23 an imaging control signal to which a flaw detection imaging command for instructing imaging of information displayed on the display unit 332 of the flaw detection processor 33 in the eddy current flaw detection device 3 is added. may be configured. When an imaging control signal to which a flaw detection imaging command is added is input, the imaging unit 23 acquires flaw detection image data indicating image data obtained by imaging the display unit 332 of the flaw detection processor 33 according to the flaw detection imaging command. The flaw detection image data includes information such as the waveform of the flaw detection signal displayed on the display unit 332 . When the imaging unit 23 acquires the flaw detection image data, the control unit 24 transmits the flaw detection image data to the management device by wireless communication. As a result, the flaw detection image data can be confirmed by the management device on the ground.

(Second embodiment)
An abnormality inspection device 1 according to a second embodiment will be described with reference to FIGS. 5 and 6. FIG. Here, components different from the first embodiment will be described, and descriptions of other components will be omitted.

An abnormality inspection device 1 according to the second embodiment includes an image inspection device 2 connected by a connecting member 4 and an eddy current flaw detector 3 including an eddy current flaw detector 31, as in the first embodiment. In the first embodiment, the image inspection apparatus 2 is a self-propelled apparatus that self-propels along the cable 100 according to the rotation of the wheels 22 driven by the drive motor 26 . On the other hand, in the second embodiment, the image inspection apparatus 2 omits the installation of the drive motor 26 and the encoder 27, and is configured to move along the cable 100 by being pulled by the traction device 5. .

The frame member 21 of the image inspection apparatus 2 has a traction fixing portion 214 to which one end of the traction rope 51 is fixed. The other end of the traction rope 51 , one end of which is fixed to the traction fixing portion 214 , is fixed to the traction device 5 . That is, the image inspection device 2 is connected to the traction device 5 via the traction rope 51 .

The traction device 5 pulls the image inspection device 2 so that the image inspection device 2 moves along the cable 100 . The structure of the traction device 5 is not particularly limited. Examples of the towing device 5 include a winch device and an unmanned flying object generally called a “drone”. The traction device 5 constitutes a movement mechanism for moving the image inspection device 2 along the cable 100 .

The image inspection apparatus 2 moves along the cable 100 by being pulled by the traction device 5 and rotating the wheels 22 . Based on the image data acquired by the imaging unit 23 while the image inspection apparatus 2 is moving, the state of the outer peripheral surface of the cable 100 can be continuously grasped in the axial direction of the cable 100 .

Further, since the eddy current flaw detection sensor 31 is connected to the image inspection device 2 by the connection member 4 , the eddy current flaw detection device 3 moves along the cable 100 in accordance with the movement of the image inspection device 2 by being pulled by the traction device 5 . do. As the eddy current flaw detector 3 moves along the cable 100 in this manner, the eddy current flaw detector 31 can continuously detect an abnormality in the cable 100 in the axial direction.

(Third embodiment)
An abnormality inspection apparatus 1 according to a third embodiment will be described with reference to FIGS. 7 and 8. FIG. Here, components different from the first embodiment will be described, and descriptions of other components will be omitted.

An abnormality inspection device 1 according to the third embodiment includes an image inspection device 2 connected by a connecting member 4 and an eddy current flaw detector 3 including an eddy current flaw detector 31, as in the first embodiment. In 1st Embodiment, the connection member 4 is comprised from a wire rope. On the other hand, in the third embodiment, the connecting member 4 includes a rod-shaped first connecting member 41 that connects the frame member 21 of the image inspection apparatus 2 and the first mount 34A of the eddy current flaw detection sensor 31, and and a rod-shaped second connecting member 42 that extends toward the eddy current flaw detection sensor 31 and supports a portion of the eddy current flaw detection sensor 31 on the second pedestal 34B side. The first connecting member 41 passes through the gantry main body 341 of the first gantry 34A, and in this state is fixed to the first gantry 34A by the fixing member 411. As shown in FIG.

The first connecting member 41 and the second connecting member 42 are made of a non-magnetic rigid material. The first connecting member 41 and the second connecting member 42 can more reliably keep the separation distance between the inspection coil 312 and the frame member 21 in the axial direction of the cable 100 constant compared to wire ropes, for example. can be done. Specifically, in the first connecting member 41 and the second connecting member 42, the separation distance between the inspection coil 312 and the frame member 21 in the axial direction of the cable 100 is 0.1 times or more the outer diameter of the inspection coil 312. The frame member 21 and the first mount 34A are connected so as to be stable at a distance of . As a result, it is possible to more reliably suppress deterioration in detection accuracy of abnormality of the cable 100 by the eddy current flaw detection sensor 31 due to the frame member 21 made of a metallic magnetic material.

Further, in the first embodiment, the first pedestal 34A and the second pedestal 34B are configured including a pedestal main body 341, a pair of gap support portions 342, and a gap adjusting member 343. As shown in FIG. In contrast, in the third embodiment, the first pedestal 34A and the second pedestal 34B do not include the pair of gap support portions 342 and the gap adjusting member 343 attached thereto, and the pedestal main body 341 and the gap adjusting member 343 are not provided. The member 35 is included.

The substrate 311 of the eddy current flaw detection sensor 31 is fixed to the substrate fixing portion 3411 of the pedestal body 341 of the first pedestal 34A and the second pedestal 34B. The reference coil 32 is fixed to the reference coil fixing portion 3412 in the gantry main body 341 of the first gantry 34A. The flaw detection processor 33 is fixed to the processor fixing portion 3414 in the pedestal body 341 of the second pedestal 34B.

In this embodiment, the first mount 34A to which the base 311 of the eddy current flaw detection sensor 31 is fixed is connected to the frame member 21 by the rigid first connecting member 41, and the second mount 34B side of the eddy current flaw detection sensor 31 is connected to the frame member 21 by the rigid first connection member 41. A portion is supported by a second connecting member 42 having rigidity. Therefore, the gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312 can be kept constant by the first connecting member 41 and the second connecting member 42 .

The gap adjusting member 35 is a member for adjusting the gap between the inspection coil 312 and the cable 100 radially inside the inspection coil 312 . The gap adjusting member 35 is made of a non-magnetic and electrically insulating material. The gap adjusting member 35 more reliably maintains a constant gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312 . Also, the gap adjusting member 35 adjusts the gap between the inspection coil 312 and the cable 100 so that the radial center of the inspection coil 312 is positioned on the central axis of the cable 100 . As a result, the cable 100 is radially unevenly distributed with respect to the center of the inspection coil 312 in a state in which the cable 100 is inserted through the insertion hole 311A of the base 311 of the eddy current flaw detection sensor 31 and arranged inside the inspection coil 312 in the radial direction. can be suppressed. Therefore, the eddy current flaw detection sensor 31 can accurately detect the abnormality of the cable 100 .

(Fourth embodiment)
An abnormality inspection apparatus 1 according to a fourth embodiment will be described with reference to FIGS. 9 and 10. FIG. Here, components different from the first embodiment will be described, and descriptions of other components will be omitted.

An abnormality inspection device 1 according to the fourth embodiment includes an image inspection device 2 connected by a connecting member 4 and an eddy current flaw detector 3 including an eddy current flaw detector 31, as in the first embodiment. In the first embodiment, the eddy current flaw detection sensor 31, the reference coil 32, and the flaw detection processor 33, which constitute the eddy current flaw detection device 3, are fixed to the first base 34A and the second base 34B. On the other hand, in the fourth embodiment, the eddy current flaw detector 3 does not have the first pedestal 34A and the second pedestal 34B. In the eddy current flaw detector 3, the base 311 of the eddy current flaw detector 31 is connected to the frame member 21 of the image inspection device 2 via the connecting member 4, and the reference coil 32 and the flaw detector 33 are fixed to the frame member 21. ing.

In the connecting member 4, at least during inspection by the eddy current flaw detection sensor 31, the separation distance between the inspection coil 312 and the frame member 21 in the axial direction of the cable 100 is 0.1 times or more the outer diameter of the inspection coil 312. The frame member 21 and the base body 311 of the eddy current flaw detection sensor 31 are connected so as to be stable. As a result, even if the frame member 21 and the eddy current flaw detection sensor 31 are arranged close to each other, it is possible to prevent the frame member 21 from lowering the detection accuracy of the abnormality of the cable 100 by the eddy current flaw detection sensor 31 .

The reference coil 32 is fixed to the frame member 21 via a support 321 made of non-magnetic material. Specifically, the reference coil 32 is fixed to the frame member 21 via the support 321 so as to be separated from the frame member 21 by a distance equal to or greater than 0.1 times the outer diameter of the reference coil 32 . In other words, the reference coil 32 is fixed to the frame member 21 via the support 321 so that the separation distance between the reference coil 32 and the frame member 21 becomes 0.00% of the outer diameter of the reference coil 32 depending on the interposition of the support 321 . It is held constant at a distance of 1 or more. As a result, when the reference coil 32 is fixed to the frame member 21 made of a metal magnetic material, it is possible to suppress deterioration in accuracy in detecting an abnormality in the cable 100 using the reference coil 32 and the inspection coil 312 .

In the eddy current flaw detection sensor 31 , the gap between the inspection coil 312 and the cable 100 on the radially inner side of the inspection coil 312 is adjusted by a plurality of gap adjusting members 35 . The plurality of gap adjusting members 35 are made of non-magnetic and electrically insulating material. The plurality of gap adjusting members 35 are arranged between the inspection coil 312 and the cable 100 so that the center of the inspection coil 312 in the radial direction is positioned on the central axis of the cable 100 when in contact with the outer peripheral surface of the cable 100 . Adjust the gap between

The eddy current flaw detection sensor 31 moves along the cable 100 so as to be pulled by the image inspection device 2 when the image inspection device 2 moves along the cable 100 . The eddy current flaw detection sensor 31 is electrically connected to a flaw detection processor 33 fixed to the frame member 21 of the image inspection device 2 via a connection line 36 .

On the frame member 21 of the image inspection apparatus 2 , the reference coil 32 is electrically connected to the flaw detector 33 via a connection line 36 . The reference coil 32 and the flaw detector 33 are fixed to the frame member 21 and move along the cable 100 according to the movement of the image inspection apparatus 2 .

For example, among the eddy current flaw detection sensor 31, the reference coil 32, and the flaw detection processor 33 that constitute the eddy current flaw detection device 3, only the eddy current flaw detection sensor 31 is moved along the cable 100 according to the movement of the image inspection device 2, and the reference coil 32 and the flaw detector 33 are assumed to be arranged on the ground and not moved. In this case, not only does the length of the connection line 36 electrically connecting the flaw detector 33 and the eddy current flaw detection sensor 31 increase, but also the movement of the eddy current flaw detection sensor 31 along the cable 100 is restricted. There is fear. In this case, it becomes difficult to detect an abnormality in cable 100 over the entire axial length of cable 100 .

On the other hand, in this embodiment, the eddy current flaw detection sensor 31 moves along the cable 100 so as to be pulled by the image inspection device 2, and the reference coil 32 and the flaw detection processor 33 are fixed to the frame member 21. It moves along the cable 100 thereby. That is, the eddy current flaw detection sensor 31 , the reference coil 32 and the flaw detection processor 33 that constitute the eddy current flaw detection device 3 all move along the cable 100 in accordance with the movement of the image inspection device 2 . As the eddy current flaw detector 3 moves along the cable 100 in this manner, the eddy current flaw detector 31 can continuously detect an abnormality in the cable 100 in the axial direction.

(Fifth embodiment)
An abnormality inspection apparatus 1 according to a fifth embodiment will be described with reference to FIGS. 11 and 12. FIG. Here, components different from the fourth embodiment will be described, and descriptions of other components will be omitted.

In the fifth embodiment, the eddy current flaw detection sensor 31 has a shield material 313 in addition to the base 311 and inspection coil 312 . The abnormality inspection apparatus 1 according to the fifth embodiment differs from the fourth embodiment in that the eddy current flaw detection sensor 31 has a shield material 313, and the other components are the same as those of the fourth embodiment. .

A shield material 313 is attached to the base 311 so as to cover the inspection coil 312 and shields the magnetism of the inspection coil 312 . The material constituting the shield material 313 is not particularly limited as long as it can shield magnetism, but for example, a material having magnetic permeability such as SUS430 can be used.

In the eddy current flaw detection sensor 31 configured such that the inspection coil 312 is covered with the shield material 313 , the magnetism generated by the inspection coil 312 can be shielded from leaking from the shield material 313 to the outside. As a result, the frame member 21 of the image inspection apparatus 2 connected to the eddy current flaw detection sensor 31 via the connection member 4 can be prevented from being affected by the magnetism of the inspection coil 312 . Therefore, it is possible to suppress the generation of eddy currents in the frame member 21 made of a metallic magnetic material. As a result, even if the distance between the frame member 21 and the eddy current flaw detection sensor 31 that are connected to each other via the connection member 4 is short, the abnormality of the cable 100 due to the eddy current flaw detection sensor 31 due to the frame member 21 can be detected. It is possible to suppress the decrease in the detection accuracy of

The eddy current flaw detection sensor 31 configured to cover the inspection coil 312 with the shield material 313 can also be applied to the abnormality inspection devices 1 according to the first, second, and third embodiments.

Although the abnormality inspection device 1 according to the embodiment of the present invention has been described above, the present invention is not limited to this, and for example, the following modified embodiments can be adopted.

In the above-described embodiment, a case has been described in which a stay cable supporting a bridge girder of a cable-stayed bridge or the like is inspected, but the present invention is not limited to this. An object to be inspected may be a linear body made of a magnetic material, and may be, for example, a cable applied to an elevator device or a cable applied to a crane device.

REFERENCE SIGNS LIST 1 abnormality inspection device 2 image inspection device 21 frame member 22 wheel 23 imaging unit 26 drive motor (moving mechanism)
3 eddy current flaw detector 31 eddy current flaw detector 311 substrate 311A insertion hole 312 inspection coil 313 shield material 32 reference coil 321 support 33 flaw detector 34A first mount 34B second mount 343 gap adjusting member (gap adjusting portion)
35 gap adjusting member (gap adjusting portion)
4 connecting member 5 traction device (moving mechanism)
100 cable (linear body)

Claims (10)

An abnormality inspection device for inspecting an abnormality in a linear body to be inspected,
an image inspection device including an imaging unit that acquires image data of the outer peripheral surface of the linear body;
an eddy current flaw detection apparatus including an eddy current flaw detection sensor having a substrate having an insertion hole formed therein for allowing the linear body to pass therethrough, and an inspection coil wound around the substrate and generating an eddy current in the linear body;
and a connection member that connects the image inspection device and the eddy current flaw detection sensor. The eddy current flaw detection sensor has a pedestal that holds the base,
2. The abnormality inspection apparatus according to claim 1, wherein said eddy current inspection apparatus includes a reference coil that is independent of said inspection coil and fixed to said pedestal. 3. The abnormality inspection device according to claim 2, wherein said pedestal is made of a non-magnetic material. 4. The abnormality inspection device according to claim 2, wherein said eddy current inspection device includes a flaw detection processor fixed to said pedestal and outputting a flaw detection signal based on a difference between a current of said reference coil and a current of said inspection coil. . Claims 2 to 4, wherein the pedestal has a gap adjuster capable of adjusting a gap between the inspection coil and the linear body on the radially inner side of the inspection coil according to the diameter of the linear body. Abnormality inspection device according to any one of the. 6. The abnormality inspection device according to claim 5, wherein said gap adjustment unit is capable of adjusting said gap so that the center of said inspection coil in the radial direction is located on the central axis of said linear body. The image inspection device includes a frame member made of a metal magnetic material and to which the imaging unit is attached,
2. The anomaly of claim 1, wherein the eddy current flaw detector includes a reference coil, separate from the inspection coil, fixed to the frame member via a support constructed of a non-magnetic material. inspection equipment. The image inspection device includes a moving mechanism for moving along the linear body,
The abnormality inspection device according to any one of claims 1 to 7, wherein said eddy current flaw detector moves along said linear body in accordance with movement of said image inspection device. The image inspection device includes a frame member made of a metal magnetic material and to which the imaging unit is attached,
In the connecting member, at least during inspection by the eddy current flaw detection sensor, the separation distance between the inspection coil and the frame member in the axial direction of the linear body is 0.1 times or more the outer diameter of the inspection coil. The abnormality inspection device according to any one of claims 1 to 8, wherein the frame member and the eddy current flaw detection sensor are connected so as to be stable over a distance. The abnormality inspection device according to any one of claims 1 to 9, wherein said eddy current flaw detection sensor is attached to said base so as to cover said inspection coil, and has a shield material for shielding magnetism.

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