JP2022108506A - Temperature test device and temperature test method - Google Patents

Abstract

To provide a temperature test device and a temperature test method that can efficiently make uniform the temperature inside a heat insulating housing in an anechoic box.SOLUTION: A temperature test device comprises: an OTA chamber 50 as an anechoic box; a heat insulating housing 70 that is accommodated in the OTA chamber; and a temperature control device 120 that controls the temperature inside the heat insulating housing. A back plate 74 of the heat insulating housing 70 is provided with an intake port 170 for introducing temperature-controlled air from the temperature control device to the heat insulating housing, and an exhaust port 171 for exhausting the air inside the heat insulating housing, and the area of the exhaust port 171 is smaller than the area of the intake port 170.SELECTED DRAWING: Figure 9

Description

The present invention relates to a temperature testing device and a temperature testing method.

2. Description of the Related Art In recent years, with the development of multimedia, wireless terminals (such as smartphones) equipped with antennas for wireless communication such as cellular and wireless LAN (Local Area Network) have been actively produced. In the future, wireless terminals that transmit and receive wireless signals compatible with IEEE 802.11ad, 5G cellular, and the like, which use broadband signals in the millimeter wave band, will be especially required.

A wireless terminal design and development company or its manufacturing factory measures the output level and reception sensitivity of the transmission radio waves stipulated for each communication standard for the wireless communication antenna equipped with the wireless terminal, and meets the prescribed standards. A performance test is performed to determine whether

With the generation shift from 4G or 4G Advanced to 5G, the test method for the performance test described above is also changing. For example, in a performance test in which a wireless terminal for a 5G NR (New Radio) system is a device under test (DUT (Device Under Test)), the test is conducted in an OTA (Over The Air) environment. . In an OTA test, a DUT and a test antenna are housed in an anechoic box that is not affected by the surrounding radio wave environment, and signals are transmitted and received between the test antenna and the DUT by wireless communication. Specifically, in the anechoic box, transmission of the test signal from the test antenna to the DUT and reception of the signal under test from the DUT that received the test signal by the test antenna are performed by wireless communication (for example, , see Patent Document 1).

In addition, the performance test under the OTA environment requires a temperature test in which the temperature around the DUT is changed between high temperature (eg, 55° C.) and low temperature (eg, −10° C.) in addition to the normal temperature test. In the temperature test, temperature-controlled air is sent to the heat-insulating housing while the DUT is placed in the heat-insulating housing to control the temperature inside the heat-insulating housing (see, for example, Patent Document 2).

Patent application 2019-161850 US2020/0025822

In the test apparatus described in Patent Document 2, an intake port and an exhaust port are provided on the side wall of the heat insulating housing, temperature-controlled air is introduced into the heat insulating housing from the intake port, and the air in the heat insulating housing is discharged from the exhaust port. It is designed to be exhausted. This test apparatus has a structure in which a cable of a temperature sensor provided inside a heat insulating housing is connected to an external temperature control device through an exhaust port of the heat insulating housing.

However, the test apparatus described in Patent Literature 2 does not give any consideration to efficiently equalizing the temperature of the air inside the heat insulating housing.

In addition, there is an assembly type heat insulating case in which a plurality of heat insulating parts are assembled to form a hollow heat insulating container. In the case of a prefabricated heat insulating housing, the introduced air may leak more or less through gaps between parts. If there is an air leak, there is a problem that the temperature control efficiency of the heat insulating housing is lowered.

Further, in order to cope with leakage of internal air from gaps in the heat-insulating housing, it is conceivable to provide an exhaust fan at the exhaust port. However, when the exhaust force of the exhaust fan increases, the residence time of the temperature-controlled air in the heat insulating housing decreases, and there is a problem that the temperature control efficiency of the heat insulating housing decreases.

The present invention has been made to solve such conventional problems, and is a temperature testing apparatus and temperature testing method that can efficiently uniformize the temperature inside the heat insulating housing in the anechoic box. intended to provide

In order to solve the above problems, the temperature testing apparatus according to the present invention includes an anechoic box (50), a heat insulating housing (70) housed in the anechoic box and assembled from a plurality of heat insulating parts, a temperature control device (120) for controlling the temperature in the heat insulating housing, wherein the wall portion of the heat insulating housing is provided with a temperature-controlled gas from the temperature control device to introduce into the heat insulating housing. and an exhaust port (171) for discharging the gas in the heat insulating housing, and the area of the exhaust port is such that the temperature-controlled gas from the temperature control device It is characterized by being smaller than the area of the air inlet in order to increase the residence time in the housing and to efficiently equalize the temperature in the heat insulating housing.

As described above, the walls of the heat insulating housing are provided with an intake port for introducing the temperature-controlled gas from the temperature control device into the heat insulating housing, and an exhaust port for discharging the gas inside the heat insulating housing. is provided, and the area of the exhaust port is smaller than the area of the intake port. With this configuration, the temperature-controlled gas that is supplied stays longer in the heat insulating housing, and the temperature in the heat insulating housing can be made uniform efficiently.

Further, in the temperature testing apparatus according to the present invention, the exhaust flow path passing through the exhaust port forces the air pushed out from the heat insulating housing 70 as the air flows in from the intake port through the exhaust port. The configuration may be such that an exhaust fan (172) for discharging to the outside is provided.

With this configuration, the temperature test apparatus according to the present invention increases the amount of exhaust air discharged from the exhaust port within a limit that does not exceed the amount of intake air, and the gas in the heat insulating housing is released from the gap between the parts constituting the heat insulating housing. It is possible to suppress the amount of leakage.

Further, in the temperature testing apparatus according to the present invention, when the temperature in the heat insulating housing is controlled by the temperature control device, the air pressure in the heat insulating housing is controlled by the air intake port and the air exhaust port. It may be configured to have areas different from each other so that the air pressure is higher than the outside air pressure.

With this configuration, the temperature testing apparatus according to the present invention can prevent the gas outside the heat insulating housing from flowing into the heat insulating housing through the gaps between the parts constituting the heat insulating housing by a simple method. It is possible to increase the exhaust efficiency from the mouth.

Further, in the temperature testing apparatus according to the present invention, the air intake port and the air exhaust port have a smaller amount of exhaust gas discharged from the exhaust port per unit time than an intake air amount introduced from the air intake port per unit time. It may be configured to have areas different from each other.

With this configuration, the temperature test apparatus according to the present invention can increase the time that the supplied temperature-controlled air stays in the heat insulating housing in a simple manner, so that the temperature inside the heat insulating housing can be efficiently uniformed. can do.

Further, in the temperature testing apparatus according to the present invention, the exhaust port of the heat insulating housing may be provided with an opening adjuster (173) for adjusting the size of the exhaust port.

With this configuration, the temperature testing apparatus according to the present invention can easily adjust the displacement by selecting an appropriate opening adjuster.

Further, the temperature test apparatus according to the present invention is provided in the anechoic box and includes a test antenna (6) for transmitting or receiving a wireless signal to or from the object under test, and provided in the anechoic box, Each time the posture of the test object is changed by the posture variable mechanism while the temperature in the heat insulating housing is controlled by the temperature control device and the posture variable mechanism (60) for controlling the posture of the test object. and a measuring device (2) for measuring transmission characteristics or reception characteristics of the test object using the test antenna.

With this configuration, the temperature testing apparatus according to the present invention can measure the temperature dependence and orientation dependence of the transmission characteristics or reception characteristics of the test object.

Further, a temperature testing method according to the present invention is a temperature testing method using the temperature testing device according to any one of the above, and includes a temperature control step (S2) of controlling the temperature in the heat insulating housing to a plurality of predetermined temperatures. an attitude changing step (S4) for sequentially changing the attitude of the test object placed in the heat insulating housing; and with the temperature inside the heat insulating housing being controlled by the temperature controlling step, and a measuring step (S7) of measuring transmission characteristics or reception characteristics of the test object each time the posture of the test object is changed.

As described above, in the temperature testing apparatus used in the temperature testing method according to the present invention, the wall of the heat insulating housing is provided with an air inlet for introducing temperature-controlled gas from the temperature control device into the heat insulating housing. and an exhaust port for discharging the gas in the heat insulating housing are provided, and the area of the exhaust port is smaller than the area of the intake port. With this configuration, in the temperature control step, the supplied temperature-controlled gas stays in the heat insulating housing for a longer time, and the temperature in the heat insulating housing can be made uniform efficiently.

According to the present invention, it is possible to provide a temperature testing device and a temperature testing method that can efficiently equalize the temperature inside the heat insulating housing in the anechoic box.

It is a figure showing a schematic structure of a temperature testing device concerning an embodiment of the present invention. (a) is a front view of a temperature testing device according to an embodiment of the present invention, and (b) is a rear view of the temperature testing device. 1 is a block diagram showing the functional configuration of a temperature testing device according to an embodiment of the present invention; FIG. 3 is a block diagram showing the functional configuration of an integrated control device in the temperature testing device according to the embodiment of the present invention; FIG. 3 is a block diagram showing the functional configuration of the NR system simulator in the temperature testing device according to the embodiment of the invention; FIG. (a) is a schematic diagram for explaining the near field and far field in radio wave propagation between an antenna AT and a wireless terminal, and (b) is a schematic diagram showing how radio waves propagate when a reflector is used. . FIG. 2 is a schematic diagram showing the structure of a reflection-type test antenna used in the temperature testing device according to the embodiment of the present invention; 1 is a perspective view showing a schematic configuration inside a heat insulating housing in a temperature testing device according to an embodiment of the present invention; FIG. FIG. 4 is a schematic diagram for explaining temperature control inside the heat insulating housing by the temperature control device in the temperature testing apparatus according to the embodiment of the present invention; 1 is a perspective view of a heat insulating housing according to an embodiment of the invention; FIG. 4 is an enlarged view showing an intake port and an exhaust port provided in the heat insulating housing; FIG. (a) is a front view of an opening adjuster according to an embodiment of the present invention, and (b) is a cross-sectional view taken along line AA of (a). It is a figure which shows the state which mounted|wore the exhaust port with the opening adjuster. It is a flow chart which shows the outline of the temperature test method performed using the temperature test device concerning the embodiment of the present invention.

A temperature testing apparatus and a temperature testing method according to embodiments of the present invention will be described below with reference to the drawings.

A temperature testing apparatus 1 according to this embodiment measures the temperature dependence of transmission characteristics or reception characteristics of a DUT 100 having an antenna 110 in an OTA environment. For this purpose, as shown in FIG. , and an infrared camera device 140 . The OTA chamber 50 of this embodiment corresponds to the anechoic box of the present invention. Each component will be described below.

[OTA chamber]
The OTA chamber 50 implements an OTA test environment, for example, when performing a performance test of a 5G wireless terminal. The OTA chamber 50 has an internal space 54 that is unaffected by the surrounding radio wave environment. Specifically, as shown in FIG. 1, the OTA chamber 50 is configured by, for example, a rectangular parallelepiped metallic chamber main body 51, and has a rectangular parallelepiped internal space 54 inside the chamber main body 51. . The DUT 100 and the test antenna 6 are housed in the internal space 54 of the OTA chamber 50 in a state of preventing radio waves from entering and radiating to the outside. The test antenna 6 transmits and receives radio signals to and from the antenna 110 of the DUT 100 .

The internal space 54 of the OTA chamber 50 further comprises a reflector 7 for reflecting radio signals emitted from the test antenna 6 toward the antenna 110 of the DUT 100, and a heat insulating material surrounding a spatial region 77 including the quiet zone QZ. A heat insulating housing 70 is accommodated. A radio wave absorber 55 is attached to the entire inner surface of the OTA chamber 50, that is, the entire bottom surface 51a, side surface 51b, and upper surface 51c of the chamber main body 51 facing the internal space 54. is secured, and the function to control the emission of radio waves to the outside is strengthened. Thus, the OTA chamber 50 realizes an anechoic box having an internal space 54 that is not affected by the surrounding radio wave environment. The OTA chamber 50 as an anechoic box used in this embodiment is, for example, of the Anechoic type.

Here, the term "quiet zone" is a concept that represents the range of a spatial region in which the DUT 100 is irradiated with radio waves of substantially uniform amplitude and phase from the test antenna 6 in the OTA chamber 50 that implements the OTA test environment. The shape of the quiet zone is usually spherical. By arranging the DUT 100 in such a quiet zone, it becomes possible to perform an OTA test while suppressing the influence of scattered waves from the surroundings.

The temperature test apparatus 1 is used, for example, with a rack structure 90 having a plurality of racks 90a as shown in FIG. FIG. 1 shows an example in which an integrated control device 10, an NR system simulator 20, a radio communication analyzer 30, and an OTA chamber 50 are mounted on each rack 90a of a rack structure 90, respectively. The temperature control device 120 is provided separately from the rack structure 90 without being accommodated in the rack 90a.

Next, the appearance of the temperature testing device 1 will be described.

FIG. 2(a) is a front view of the temperature testing device 1 according to this embodiment, and FIG. 2(b) is a rear view. As shown in FIG. 2( a ), a door 52 a is provided on the front surface of the chamber main body 51 . The door 52a has a rectangular planar shape and is attached to the chamber main body 51 via a hinge 52b so as to be openable and closable. The user can operate the handle 52c to open the door 52a and perform various operations in the OTA chamber 50, such as setting up the heat insulating housing 70 and the like in the OTA chamber 50. FIG. The door 52 a has a size that allows at least the things to be placed in the OTA chamber 50 , such as the heat-insulating housing 70 , to enter the OTA chamber 50 .

The chamber main body 51 has an access panel 52d on the front in addition to the door 52a described above. The access panel 52 d has a function of electrically connecting internal equipment arranged in the internal space 54 of the chamber main body 51 and external equipment arranged outside the chamber main body 51 . Internal devices connected to the access panel 52d include, for example, the test antenna 6, the drive unit 61 of the posture changing mechanism 60, the infrared camera device 140, and the DUT 100, which will be described later. External devices connected to the access panel 52d include, for example, the integrated control device 10, the NR system simulator 20, the signal processing section 40, and the radio communication analyzer 30. FIG.

As shown in FIG. 2B, the chamber main body 51 is provided with a piping joint 181 and an exhaust fan 172 on the rear side of the chamber. The piping joint 181 connects the air intake path inside the OTA chamber 50 and the air intake path outside the OTA chamber 50 in the air intake path for introducing temperature-controlled gas (air) into the heat insulating housing 70 . The exhaust fan 172 is for exhausting the air inside the heat insulating housing 70 .

[DUT]
The DUT 100 to be tested is, for example, a wireless terminal such as a smart phone. Communication standards for the DUT 100 include cellular (LTE, LTE-A, W-CDMA (registered trademark), GSM (registered trademark), CDMA2000, 1xEV-DO, TD-SCDMA, etc.), wireless LAN (IEEE802.11b/g/ a/n/ac/ad, etc.), Bluetooth®, GNSS (GPS, Galileo, GLONASS, BeiDou, etc.), FM, and digital broadcasting (DVB-H, ISDB-T, etc.). Also, the DUT 100 may be a wireless terminal that transmits and receives millimeter-wave band wireless signals compatible with 5G cellular or the like.

In this embodiment, as an example, the DUT 100 is described as a 5G NR wireless terminal. For 5G NR wireless terminals, the 5G NR standard stipulates that a predetermined frequency band including other frequency bands used in LTE and the like, in addition to the millimeter wave band, shall be the communicable frequency range. In short, the antenna 110 of the DUT 100 transmits or receives radio signals in a predetermined frequency band (5G NR band) for which the transmission or reception characteristics of the DUT 100 are to be measured. The antenna 110 is, for example, an array antenna such as a Massive-MIMO antenna, and corresponds to the antenna under test in the present invention.

In this embodiment, the DUT 100 is adapted to receive test signals and transmit signals under test via the test antenna 6 during transmission and reception measurements within the OTA chamber 50 .

[Variable attitude mechanism]
The attitude varying mechanism 60 sequentially changes the attitude of the DUT 100 placed within the quiet zone QZ in the internal space 54 of the OTA chamber 50 . As shown in FIG. 1 , the posture varying mechanism 60 is provided on the bottom surface 51 a of the chamber body 51 of the OTA chamber 50 on the side of the internal space 54 . The attitude variable mechanism 60 is, for example, a two-axis positioner having a rotation mechanism that rotates around each of two axes. The attitude variable mechanism 60 configures an OTA test system (Combined-axes system) that rotates the DUT 100 with rotational freedom around two axes while the test antenna 6 is fixed. Specifically, the posture varying mechanism 60 has a drive section 61, a turntable 62, a support 63, and a DUT placement section 64 as a test subject placement section.

The driving unit 61 is composed of a driving motor such as a stepping motor that generates a rotational driving force, and is installed, for example, on the bottom surface 51a. The turntable 62 is rotated by a predetermined angle around the first of the two orthogonal axes due to the rotational driving force of the drive unit 61 . The post 63 is connected to the turntable 62 , extends from the turntable 62 in the direction of the first axis, and is rotated together with the turntable 62 by the rotational driving force of the driving section 61 . The DUT mounting portion 64 extends from the side surface of the column 63 in the direction of the second of the two axes, and is rotated by a predetermined angle around the second axis by the rotational driving force of the driving portion 61. there is The DUT 100 is placed on the DUT placement section 64 .

The first axis is, for example, an axis (Y-axis in the drawing) extending in a direction perpendicular to the bottom surface 51a. Also, the second axis is, for example, an axis extending horizontally from the side surface of the column 63 . The attitude variable mechanism 60 configured in this way rotates the DUT 100 held on the DUT mounting part 64 in all three-dimensional directions with respect to the test antenna 6 and the reflector 7 with the center of the DUT 100 as the rotation center, for example. The antenna 110 can be rotated so that the attitude can be changed sequentially to the state in which the antenna 110 is directed to the front.

(near field and far field)
Here, the near field and the far field will be explained.

FIG. 6 is a schematic diagram showing how radio waves radiated from the antenna AT propagate toward the wireless terminal 100A. Antenna AT is equivalent to test antenna 6 as a primary radiator, which will be described later. The radio terminal 100A is equivalent to the DUT 100. FIG. In FIG. 6, (a) shows a DFF (Direct Far Field) system in which radio waves are transmitted directly from the antenna AT to the wireless terminal 100A, and (b) shows that the radio waves pass through the reflecting mirror 7A having a paraboloid of revolution from the antenna AT. 1 shows an IFF (Indirect Far Field) system for transmitting to the wireless terminal 100A through the wireless terminal 100A.

As shown in FIG. 6(a), radio waves emitted from the antenna AT as a radiation source have the property of propagating while a plane (wavefront) connecting points of the same phase spreads spherically around the radiation source. At this time, interference waves are also generated due to disturbances such as scattering, refraction, and reflection, as indicated by broken lines. Further, the wavefront is a curved spherical surface (spherical wave) at a short distance from the radiation source, but the wavefront becomes closer to a plane (plane wave) at a distance from the radiation source. In general, the area where the wavefront should be considered spherical is called the Near Field, and the area where the wavefront can be considered as a plane is called the Far Field. In the radio wave propagation shown in FIG. 6(a), it is preferable for the wireless terminal 100A to receive a plane wave rather than a spherical wave for accurate measurement.

In order to receive plane waves, the wireless terminal 100A needs to be placed in the far field. When the position and antenna size of the antenna 110 within the DUT 100 are not known, the far field is the area beyond 2D ² /λ from the antenna AT. Here, D is the maximum linear size of the wireless terminal 100A, and λ is the wavelength of radio waves.

FIG. 6(b) shows a method of arranging a reflecting mirror 7A having a paraboloid of revolution so as to reflect radio waves from the antenna AT and cause the reflected waves to reach the position of the wireless terminal 100A (CATR (Compact Antenna Test Range) method). According to this method, the distance between the antenna AT and the wireless terminal 100A can be shortened, and since the area of the plane wave expands from the distance immediately after the reflection on the mirror surface of the reflector 7A, a propagation loss reduction effect can be expected. The degree of plane waves can be represented by the phase difference between waves in phase. An acceptable phase difference for plane waves is, for example, λ/16. The phase difference can be evaluated with a vector network analyzer (VNA), for example.

[Antenna for testing]
Next, the test antenna 6 will be explained.

The test antenna 6 is accommodated in the internal space 54 of the OTA chamber 50, and transmits or receives radio signals for measuring the transmission characteristics or reception characteristics of the DUT 100 to and from the antenna 110 via the reflector 7. It's like The test antenna 6 has a horizontally polarized antenna 6H and a vertically polarized antenna 6V (see FIG. 3). As the test antenna 6, for example, a directional millimeter wave antenna such as a horn antenna can be used. The reflector 7 has an offset parabola (see FIG. 7) type structure, which will be described later. The reflector 7 is attached to a desired position on the side surface 51b of the OTA chamber 50 using a reflector holder 58, as shown in FIG.

The reflector 7 receives, on its paraboloid of rotation, radio waves of the test signal radiated from the test antenna 6 as a primary radiator arranged at a focal position F determined by the paraboloid of rotation of the reflector 7 , and is held by the attitude varying mechanism 60 . (during transmission). In addition, the reflector 7 receives the radio waves of the signal under test radiated from the antenna 110 by the DUT 100 that has received the test signal with its paraboloid of revolution, and reflects the test signal toward the test antenna 6 that radiated the test signal (at the time of reception). ). That is, the reflector 7 reflects radio waves of radio signals transmitted and received between the test antenna 6 and the antenna 110 via the paraboloid of revolution.

FIG. 7 is a schematic diagram showing the structure of the reflector 7. As shown in FIG. The reflector 7 is of an offset parabolic type and has a mirror surface asymmetrical with respect to the axis of the paraboloid of revolution (a shape obtained by cutting out a part of the paraboloid of revolution of a perfect circular parabola). The test antenna 6 as a primary radiator has its beam axis BS tilted, for example, at an angle α (for example, 30°) with respect to the axis RS of the paraboloid of revolution. It is arranged at the focal position F. In other words, the test antenna 6 is arranged to face the reflector 7 at the elevation angle α, and the receiving surface of the test antenna 6 is held at a right angle to the radio signal beam axis BS.

With this configuration, the radio wave radiated from the test antenna 6 (for example, a test signal for the DUT 100) is reflected by the paraboloid of revolution in a direction parallel to the axial direction of the paraboloid of revolution. A radio wave incident on the paraboloid of revolution in a direction parallel to the direction (for example, a signal under test transmitted from the DUT 100 ) can be reflected by the paraboloid of revolution and guided to the test antenna 6 . Compared to the parabolic type, the offset parabola can make the reflector 7 itself smaller and can be arranged such that the mirror surface is nearly vertical, so that the structure of the OTA chamber 50 can be miniaturized.

Next, the link antenna will be explained.

In the OTA chamber 50, two types of link antennas 5 and 8 for establishing or maintaining a link (call) with the DUT 100 are attached to required positions of the chamber main body 51 by holders 57 and 59, respectively. ing. A link antenna 5 is a link antenna for LTE and is used in a non-standalone mode. On the other hand, the link antenna 8 is a link antenna for 5G and is used for maintaining 5G calls. The link antennas 5 and 8 are held by holders 57 and 59 respectively so as to have directivity with respect to the DUT 100 held by the attitude variable mechanism 60 . Since it is also possible to use the test antenna 6 as a link antenna instead of using the link antennas 5 and 8 described above, the test antenna 6 will be described below as also functioning as a link antenna. do.

[Heat insulation housing]
Next, the heat insulation housing 70 accommodated in the internal space 54 of the OTA chamber 50 will be described.

The heat insulating housing 70 keeps the ambient temperature of the DUT 100 constant at each set temperature when the temperature test is performed by sequentially changing the ambient temperature of the DUT 100 to a plurality of set temperatures. As shown in FIGS. 1 and 8, the heat insulating housing 70 is housed in the internal space 54 of the OTA chamber 50, and is made of a heat insulating material that hermetically surrounds a spatial region 77 including at least the quiet zone QZ. . This spatial region 77 accommodates the DUT 100 , the DUT mounting portion 64 , and part of the support 63 .

As shown in FIG. 8, in the region of the heat insulating housing 70 through which the radio waves of the radio signal transmitted from the test antenna 6 pass before entering the quiet zone QZ, the radio waves of the radio signal entering the quiet zone QZ travel. A plate-like portion (front side plate 75) that is perpendicular to the direction and has a uniform thickness is formed. This flat plate portion (front side plate 75) is the portion of the heat insulating housing 70 through which the radio wave of the test signal, which can be regarded as a plane wave that is transmitted from the test antenna 6 and is incident on the heat insulating housing 70, passes before entering the quiet zone QZ. is provided in

The heat insulating material forming the heat insulating housing 70 is desirably a material with a dielectric constant close to that of air and a low dielectric loss. PTFE) can be used.

Furthermore, in a state in which the heat insulating housing 70 is installed in the internal space 54 of the OTA chamber 50, the attitude varying mechanism 60 on which the DUT 100 is mounted is rotatable. configured to That is, the heat insulating housing 70 has a through hole 72a through which a part of the column 63 passes, a disk-shaped rotating portion 72b that rotates together with the turntable 62 and the column 63, and an inner diameter approximately equal to the outer diameter of the rotating portion 72b. and a hole portion 72c that slidably and rotatably accommodates the rotating portion 72b. For example, by cutting out a portion of a heat insulating housing made of a heat insulating material into a disc shape, the rotating portion 72b and the hole portion 72c having an inner diameter approximately equal to the outer diameter of the rotating portion 72b can be easily formed. .

In the temperature test apparatus 1 of this embodiment, it is important to rotate the posture variable mechanism 60 on which the DUT 100 is mounted while preventing the air in the space area 77 inside the heat insulating housing 70 from leaking to the outside as much as possible. At this time, there arises a problem that the durability of the heat-insulating casing 70 made of a heat-insulating material deteriorates due to friction between the rotating portion 72b rotating together with the attitude varying mechanism 60 and the hole portion 72c. In order to solve this problem, the side wall surface of the rotating portion 72b facing the hole 72c and the inner wall surface of the hole portion 72c facing the rotating portion 72b are each provided with a friction reducer to reduce the friction between the side wall surface and the inner wall surface. It is desirable to provide a friction reducing member to reduce friction.

Such a friction reducing member is desirably made of a material having a small friction coefficient and high self-lubricating property. For example, a film or sheet made of polyacetal (POM), PTFE, ultra high molecular weight polyethylene (UHPE), etc. can be used. can.

Next, the structure of the heat insulating housing 70 will be described.

FIG. 10 is an assembly drawing of the heat insulating housing 70 of the temperature testing device 1 according to this embodiment. As shown in FIG. 10, the heat insulating housing 70 includes a plurality of plate parts made of heat insulating material, specifically, a top plate 71, a base plate 72, a front plate 73, a rear plate 74, a front side plate 75, and a rear side plate 76. It can be disassembled and assembled.

As shown in FIGS. 1 and 10 , the top plate 71 is arranged above (ceiling side) the internal space 54 of the OTA chamber 50 , and the bottom plate 72 is arranged below the top plate 71 . there is The front plate 73 is arranged on the side of the door 52 a of the OTA chamber 50 and can be opened and closed, and the rear plate 74 is arranged at a position facing the front plate 73 . The front side plate 75 is arranged at a position that intersects the radio signal propagation path, and the rear side plate 76 is arranged at a position facing the front side plate 75 .

Specifically, the front side plate 75 is arranged so as to be openable and closable on the propagation path of radio signals transmitted and received between the test antenna 6 and the DUT 100 . With this configuration, the heat-insulating housing 70 is formed to keep the space area 77 at a constant temperature by closing the front side plate 75 arranged in the radio signal propagation path during the temperature test. On the other hand, during tests other than the temperature test, the front side plate 75 can be opened so that the radio signal reaches the DUT 100 directly without passing through the front side plate 75 . As a result, it is possible to perform a temperature test for measuring the temperature dependence of the transmission/reception characteristics of the DUT 100 by changing the temperature, and to perform a test for measuring the transmission/reception characteristics of the DUT 100 at room temperature without disturbance (deterioration of quiet zone performance) caused by the heat insulating housing. It is possible to easily cope with implementation in an environment that avoids

Further, the front plate 73 is arranged on the side of the door 52a of the OTA chamber 50 so as to be freely opened and closed. With this configuration, the user can easily perform operations such as arranging the DUT 100 in the heat insulating housing 70 by opening the door 52 a of the OTA chamber 50 to open the front plate 73 .

[Peephole]
Next, the viewing window 160 will be described.

As shown in FIG. 10 , the viewing window 160 is provided on the top plate 71 of the heat insulating housing 70 and is used to monitor the posture and state of the DUT 100 placed inside the heat insulating housing 70 .

The viewing window 160 has a window plate 162 made of transparent glass covering a rectangular opening 161 formed through a top plate 71 that is a wall portion of the heat insulating housing 70 . The window plate 162 may be composed of one window plate, or may have a structure in which a plurality of window plates are laminated. When a plurality of window plates are laminated, an air layer may be formed between the two window plates by leaving an interval between adjacent window plates.

In the present embodiment, the viewing window 160 is provided on the top plate 71 of the heat insulating housing 70, but is not limited to this. You may make it provide in other board parts which carry out. Moreover, although the window plate 162 has a rectangular shape in this embodiment, it is not limited to this, and may have any other shape such as a square, a circle, an oval, or the like.

[Camera device]
Next, the infrared camera device 140 will be described.

As shown in FIG. 10, the infrared camera device 140 is attached to the outer surface of the top plate 71 of the heat insulating housing 70, and photographs the DUT 100 placed inside the heat insulating housing 70 through the viewing window 160. . An image of the DUT 100 captured by the infrared camera device 140 is displayed on the display section 13 .

[Temperature controller]
Next, the temperature control device 120 will be explained.

FIG. 9 is a schematic diagram for explaining temperature control of the gas (for example, air) inside the heat insulating housing 70 by the temperature control device 120. As shown in FIG. In the following description, the gas is assumed to be air, but other gases may be used. The temperature control device 120 can control the temperature of the air in the spatial region 77 inside the heat insulating housing 70 to a desired predetermined temperature. To this end, the temperature control device 120 is adapted to generate temperature-controlled (heated or cooled) air and supply it to the insulating housing 70 .

The back plate 74 of the heat insulating housing 70 is provided with an intake port 170 and an exhaust port 171 penetrating the back plate 74 . The temperature control device 120 and the intake port 170 of the heat insulating housing 70 are connected by an intake path 130 such as a hose, pipe, or duct that forms a flow path for temperature-controlled air. As a result, the air whose temperature is controlled by the temperature control device 120 is supplied from the intake port 170 to the inside of the heat insulating housing 70 through the intake path 130 .

An exhaust passage 131 , such as a hose, pipe, or duct, is connected to the exhaust fan 172 at the chamber rear surface 511 of the OTA chamber 50 . As a result, the air pushed out from the inside of the heat insulating housing 70 as the air flows in from the intake port 170 is forcibly discharged to the outside of the OTA chamber 50 from the exhaust port 171 via the exhaust fan 172 . ing.

A temperature sensor 124 for monitoring the temperature of the air in the space area 77 is provided inside the heat insulating housing 70 . A temperature sensor 124 is connected to the temperature controller 120 .

The temperature control device 120, for example, adjusts the heated or cooled air so that the temperature indicated by the temperature sensor 124 matches the temperature set value input by the user through the operation of the operation unit 12 (see FIG. 4). Generate. In this way, the temperature control device 120 sends air of any temperature in the range of -40°C to 80°C into the heat insulation casing 70, thereby increasing the temperature inside the heat insulation casing 70 to -10°C to 55°C, for example. It is designed to be controlled in the range of °C.

[Inlet and exhaust]
Next, the intake port 170 and the exhaust port 171 of the heat insulating housing 70 will be described.

10 is a perspective view of the heat insulating housing 70, and FIG. 11 is an enlarged view of the intake port 170 and the exhaust port 171. FIG. As shown in FIG. 10, the back plate 74 of the heat insulating housing 70 is formed with an intake port 170 and an exhaust port 171 penetrating through the back plate 74 . The air whose temperature has been controlled by the temperature control device 120 is sent from the air inlet 170 into the heat insulating housing 70 through the air intake path 130 as shown in FIG. On the other hand, the air in the heat insulating housing 70 is discharged from the OTA chamber 50 by the exhaust fan 172 through the exhaust port 171 and the exhaust path 131 . The air in the heat insulating housing 70 may be sent from the exhaust port 171 to the temperature control device 120 and discharged from the temperature control device 120 to the outside.

As shown in FIG. 11, the intake port 170 and the exhaust port 171 are circular openings, and the diameter D2 of the opening of the exhaust port 171 is smaller than the diameter D1 of the opening of the intake port 170 . The diameter ratio (D2/D1) of the exhaust port 171 to the intake port 170 is, for example, about 5/8, but the diameter ratio can be arbitrarily set in consideration of various conditions.

Area S2 of the opening of exhaust port 171 is smaller than area S1 of the opening of intake port 170 . That is, S2<S1. The area ratio (S2/S1) of the exhaust port 171 to the intake port 170 is, for example, approximately 2/5, although it depends on the volume of the space inside the heat insulating housing 70 and the amount of intake air. This area ratio can also be arbitrarily set in consideration of various conditions like the diameter ratio. This area ratio (S2/S1) is preferably in the range of 1/10 to 9/10, more preferably in the range of 3/10 to 7/10, still more preferably in the range of 4/10 to 6/10. in the range of

Due to such a configuration, compared to the introduction of air into the heat insulating housing 70, the air inside the heat insulating housing 70 is physically less likely to be discharged. As a result, the supplied temperature-controlled air stays longer in the heat-insulating housing 70, and the temperature inside the heat-insulating housing 70 can be made uniform efficiently. Note that the shapes of the intake port 170 and the exhaust port 171 are not limited to a circle, and any shape such as an ellipse or a rectangle may be adopted, and the shapes of the intake port 170 and the exhaust port 171 may be different.

As shown in FIG. 9 , an exhaust fan 172 is provided at the end of the exhaust path 131 connected to the exhaust port 171 . Specifically, exhaust fan 172 is attached to chamber rear surface 511 of OTA chamber 50 . By providing the exhaust fan 172, the amount of exhaust air discharged from the exhaust port 171 is increased within a limit that does not exceed the amount of intake air, and the gap between the plate parts that constitute the assembled heat insulating case 70 is removed from the heat insulating case 70. It is possible to suppress the amount of leakage of the air inside.

When the temperature inside the heat insulating housing 70 is controlled by the temperature control device 120, the air pressure P1 inside the heat insulating housing 70 becomes higher than the air pressure P2 outside the heat insulating housing 70. They have areas S1 and S2 that are different from each other. That is, the area S1 of the intake port 170 and the area S2 of the exhaust port 171 are set such that P1>P2. With this configuration, by a simple method, the air outside the heat insulating housing 70 is prevented from flowing into the heat insulating housing 70 from the gaps between the parts constituting the heat insulating housing 70, and the exhaust from the exhaust port 171 is prevented. Efficiency can be increased.

In addition, considering the leakage of air from the gaps between the parts that make up the assembly type heat insulating housing 70, the intake port 170 and the exhaust port 171 are designed so that the amount of air exhausted from the exhaust port 171 per unit time is equal to the intake air. They have areas S1 and S2 that are different from each other so as to be smaller than the amount of intake air introduced from the port 170 per unit time. With this configuration, the supplied temperature-controlled air stays longer in the heat insulating housing 70 by a simple method, and the temperature inside the heat insulating housing can be made uniform efficiently. In addition, by setting the exhaust amount in this way, the air pressure P1 inside the heat insulating housing 70 becomes higher than the air pressure P2 outside the heat insulating housing 70, so that the gap between the parts constituting the heat insulating housing 70 of the assembly type is exhausted. It is also possible to prevent air outside the heat insulating housing 70 from flowing into the heat insulating housing 70 .

An opening adjuster 173 for adjusting the size of the opening of the exhaust port 171 may be provided at the exhaust port 171 of the heat insulating housing 70 . FIG. 12(a) is a front view of the opening adjuster 173, and (b) is a sectional view taken along the line AA of (a). As shown in FIG. 12, the opening adjuster 173 is composed of a circular ring-shaped heat insulating material having a circular through-hole 173b formed in the center. In this embodiment, the material of the opening adjuster 173 is the same as the material of the heat insulating housing 70, but the material may be different.

Specifically, the opening adjuster 173 has a circular ring shape with an outer diameter D4 and an inner diameter D3, and the area of the through hole 173b is S3. The thickness t of the opening adjuster 173 is the same as the thickness of the rear plate 74 of the heat insulating housing 70, but may be thicker or thinner than the thickness of the rear plate 74. FIG. An outer peripheral surface 173a of the opening adjuster 173 is tapered in the thickness direction.

FIG. 12 is a diagram showing a state in which the opening adjuster 173 is detachably fitted into the exhaust port 171. As shown in FIG. In this embodiment, the inner peripheral surface 171a of the exhaust port 171 is tapered outward in the thickness direction, similarly to the tapered shape of the outer peripheral surface 173a of the opening adjuster 173 . As a result, when the opening adjuster 173 is fitted into the exhaust port 171 from the inside of the heat insulating housing 70 , the opening adjuster 173 does not drop out of the heat insulating housing 70 .

When the inner peripheral surface 171a of the exhaust port 171 is tapered outward in the thickness direction, the diameter D2 of the exhaust port 171 is the diameter on the outer side in the thickness direction (diameter at the narrowest point). The area S2 is the area of a circle determined from its diameter.

Any drop-off prevention means can be employed instead of the tapered shape. For example, on the inner peripheral surface 171 a of the exhaust port 171 of the heat insulating housing 70 , a projecting stopper may be provided near the outer surface of the heat insulating housing 70 , or on the outer peripheral surface 173 a of the opening adjuster 173 . A convex stopper may be provided in the vicinity of the inner surface of 70 .

It is preferable to prepare a plurality of opening adjusters having through holes 173b with different diameters. Accordingly, by selecting an appropriate opening adjuster, the exhaust amount from the exhaust port 171 can be easily adjusted.

Although the opening adjuster 173 fitted to the exhaust port 171 has been described, for the intake port 170 as well, a plurality of opening adjusters having the same or similar configuration are prepared, and an opening adjuster selected from among them is attached to the intake port 170. Thus, the amount of intake air from the intake port 170 may be adjusted.

[Integrated control device]
The integrated control device 10 performs control to measure transmission characteristics or reception characteristics of the DUT 100 each time the attitude of the DUT 100 is changed by the attitude varying mechanism 60 while the temperature of the spatial region 77 is controlled by the temperature control device 120 . to run. Specifically, the integrated control device 10 comprehensively controls the NR system simulator 20, the attitude varying mechanism 60, and the temperature control device 120, as described below. For this purpose, the integrated control device 10 is connected to the NR system simulator 20, the attitude varying mechanism 60, and the temperature control device 120 so as to be able to communicate with each other via a network 19 such as Ethernet (registered trademark).

FIG. 4 is a block diagram showing the functional configuration of the integrated control device 10. As shown in FIG. As shown in FIG. 4 , the integrated control device 10 has a control section 11 , an operation section 12 and a display section 13 . The control unit 11 is configured by, for example, a computer device. For example, as shown in FIG. 4, this computer device includes a CPU (Central Processing Unit) 11a, a ROM (Read Only Memory) 11b, a RAM (Random Access Memory) 11c, and an external interface (I/F) section 11d. , a non-volatile storage medium such as a hard disk device (not shown), and various input/output ports.

The CPU 11a performs predetermined information processing for realizing various functions of the temperature test device 1 (for example, the function of the posture changing mechanism 60) and overall control of the temperature control device 120 and the NR system simulator 20. It has become. The ROM 11b stores an OS (Operating System) for booting the CPU 11a, other programs, control parameters, and the like. The RAM 11c stores the OS and application execution codes and data used by the CPU 11a. The external I/F section 11d has an input interface function for inputting a predetermined signal and an output interface function for outputting a predetermined signal.

The external I/F section 11 d is communicably connected to the NR system simulator 20 via the network 19 . The external I/F section 11 d is also connected to the temperature control device 120 and the posture varying mechanism 60 via the network 19 . An operation unit 12 and a display unit 13 are connected to the input/output port. The operation unit 12 is a functional unit for inputting various information such as commands, and the display unit 13 is a functional unit for displaying various information such as an input screen for the various information and measurement results.

The computer device described above functions as the control unit 11 by executing the program stored in the ROM 11b by the CPU 11a using the RAM 11c as a work area. As shown in FIG. 4, the control unit 11 has a call connection control unit 14a, a signal transmission/reception control unit 14b, a DUT attitude control unit 14c, a temperature control unit 14d, a camera control unit 14e, and an attitude determination unit 14f. The call connection control unit 14a, the signal transmission/reception control unit 14b, the DUT attitude control unit 14c, the temperature control unit 14d, the camera control unit 14e, and the attitude determination unit 14f are also executed by the CPU 11a executing predetermined programs stored in the ROM 11b in the work area of the RAM 11c. It is realized by executing.

The call connection control unit 14a drives the test antenna 6 to transmit/receive a control signal (radio signal) to/from the DUT 100, thereby establishing a call (radio signal capable of transmitting/receiving) between the NR system simulator 20 and the DUT 100. state).

The signal transmission/reception control unit 14b monitors the user's operation on the operation unit 12, and when the user performs a predetermined measurement start operation related to the measurement of the transmission characteristics and reception characteristics of the DUT 100, the temperature control unit 14d A signal transmission command is transmitted to the NR system simulator 20 through temperature control and call connection control in the call connection control unit 14a. Specifically, the signal transmission/reception control unit 14b controls the NR system simulator 20 to transmit a test signal via the test antenna 6, transmits a signal reception command to the NR system simulator 20, and performs the test. control to receive the signal under measurement via the antenna 6 for the measurement.

The DUT attitude control section 14c controls the attitude of the DUT 100 held by the attitude varying mechanism 60 during measurement. To implement this control, for example, the ROM 11b stores in advance a DUT attitude control table 17a. For example, when a stepping motor is employed as the driving unit 61, the DUT attitude control table 17a stores the number of driving pulses (the number of operating pulses) for determining the rotational driving of the stepping motor as control data.

The DUT attitude control unit 14c develops the DUT attitude control table 17a in the work area of the RAM 11c, and based on the DUT attitude control table 17a, the DUT 100 is moved so that the antenna 110 is sequentially oriented in all three-dimensional directions as described above. It controls the driving of the attitude variable mechanism 60 so as to change the attitude.

The temperature control unit 14d monitors the user's operation on the operation unit 12, and transmits a temperature control command to the temperature control device 120 when the user performs a measurement start operation.

The camera control unit 14e activates the infrared camera device 140 and causes the data of the image of the DUT 100 photographed by the infrared camera device 140 to be transmitted to the control unit 11 via the cable 18 (for example, a USB cable) and the USB port 11d1. Control.

Based on the image captured by the infrared camera device 140, the posture determination unit 14f determines whether the posture of the DUT 100 is appropriate.

[NR system simulator]
Next, the NR system simulator 20 will be explained.

As shown in FIG. 5, the NR system simulator 20 has a signal measurement section 21, a control section 22, an operation section 23, and a display section 24. FIG. The signal measurement section 21 has a signal generation function section and a signal analysis function section. The signal generation function section of the signal measurement section 21 is composed of a signal generation section 21a, a digital/analog converter (DAC) 21b, a modulation section 21c, and a transmission section 21e of an RF section 21d. The signal analysis function section of the signal measuring section 21 is composed of a receiving section 21f of the RF section 21d, an analog/digital converter (ADC) 21g, and an analysis processing section 21h.

In the signal generation function unit of the signal measurement unit 21, the signal generation unit 21a generates waveform data having a reference waveform, specifically, for example, an I-component baseband signal and a Q-component baseband signal that is a quadrature component signal thereof. Generate. The DAC 21b converts the waveform data (I-component baseband signal and Q-component baseband signal) having the reference waveform output from the signal generator 21a from a digital signal to an analog signal, and outputs the analog signal to the modulator 21c.

The modulation unit 21c mixes the local signal with each of the I component baseband signal and the Q component baseband signal, further combines the two, and performs modulation processing of outputting a digital modulated signal. The RF section 21d generates a test signal corresponding to the frequency of each communication standard from the digital modulated signal output from the modulation section 21c, and the transmission section 21e transmits the generated test signal to the transmission signal processing section 40a, the test antenna 6, and output toward the DUT 100 via the reflector 7 .

Further, in the signal analysis function unit of the signal measurement unit 21, the RF unit 21d receives the test signal from the antenna 110 and transmits the signal under test transmitted from the DUT 100 to the reception unit 21f via the reception signal processing unit 40b. , the signal under measurement is mixed with the local signal to convert it into an intermediate frequency band signal (IF signal). The ADC 21g converts the signal under measurement, which has been converted into an IF signal by the receiving section 21f of the RF section 21d, from an analog signal into a digital signal, and outputs the digital signal to the analysis processing section 21h.

The analysis processing unit 21h digitally processes the signal under measurement, which is a digital signal output from the ADC 21g, to generate waveform data corresponding to the I component baseband signal and the Q component baseband signal, respectively, and converts the waveform data to A process for analyzing the I-component baseband signal and the Q-component baseband signal is performed based on . In measuring the transmission characteristics of the DUT 100, the analysis processing unit 21h measures, for example, equivalent isotropically radiated power (EIRP), total radiated power (TRP), spurious radiation, modulation accuracy (EVM), Transmission power, constellation, spectrum, etc. can be measured. In addition, the analysis processing unit 21h can measure, for example, reception sensitivity, bit error rate (BER), packet error rate (PER), etc. in measuring the reception characteristics of the DUT 100. FIG. where EIRP is the radio signal strength in the main beam direction of the antenna under test. TRP is the total power radiated into space from the antenna under test.

Like the control unit 11 of the integrated control device 10 described above, the control unit 22 is configured by a computer device including, for example, a CPU, a RAM, a ROM, and various input/output interfaces. The CPU performs predetermined information processing and control for realizing each function of the signal generation function section, the signal analysis function section, the operation section 23 and the display section 24 .

The operation unit 23 and the display unit 24 are connected to the input/output interface of the computer device. The operation unit 23 is a functional unit for inputting various information such as commands, and the display unit 24 is a functional unit for displaying various information such as an input screen for the various information and measurement results.

In this embodiment, the integrated control device 10 and the NR system simulator 20 are separate devices, but they may be configured as one device. In this case, the control section 11 of the integrated control device 10 and the control section 22 of the NR system simulator 20 may be integrated into one computer device.

[Signal processing unit]
Next, the signal processing section 40 will be described.

As shown in FIG. 5, the signal processing section 40 is provided between the NR system simulator 20 and the test antenna 6, and includes a transmission signal processing section 40a and a reception signal processing section 40b.

The transmission signal processing section 40a is provided between the transmission section 21e of the NR system simulator 20 and the test antenna 6, and is composed of an upconverter, an amplifier, a frequency filter, and the like. The transmission signal processing section 40a performs frequency conversion (up-conversion), amplification, and frequency selection on the test signal to be output to the test antenna 6. FIG.

The received signal processing section 40b is provided between the receiving section 21f of the NR system simulator 20 and the test antenna 6, and is composed of a down converter, an amplifier, a frequency filter, and the like. The received signal processing unit 40b performs frequency conversion (down-conversion), amplification, and frequency selection on the signal under measurement input from the test antenna 6. FIG.

[Temperature test method]
Next, the temperature test method will be explained.

FIG. 14 is a diagram showing a flowchart of a temperature testing method for measuring the temperature dependence of the transmission characteristics and reception characteristics of the DUT 100 using the temperature testing apparatus 1 according to this embodiment. As shown in FIG. 14, first, the user sets the DUT 100 to be tested on the DUT placement section 64 of the attitude varying mechanism 60 provided inside the heat insulating housing 70 in the OTA chamber 50 (step S1). .

Next, the temperature controller 14 d included in the controller 11 of the integrated controller 10 transmits a temperature control command to the temperature controller 120 . Based on the received temperature control command, the temperature control device 120 performs temperature control so that the temperature of the air in the spatial region 77 inside the heat insulating housing 70 reaches the set temperature set by the user (step S2). The set temperature may be input in advance by the user via the operation unit 12 of the integrated control device 10 . Normally, a plurality of set temperatures are set, and measurements are performed while sequentially changing the set temperatures to examine the temperature dependence of transmission characteristics and reception characteristics.

Next, the call connection control unit 14a of the control unit 11 uses the test antenna 6 to perform call connection control by transmitting and receiving control signals (radio signals) to and from the DUT 100 (step S3). Specifically, the NR system simulator 20 wirelessly transmits a control signal (call connection request signal) having a predetermined frequency to the DUT 100 via the test antenna 6 . On the other hand, the DUT 100 that has received the call connection request signal sets the requested frequency and returns a control signal (call connection response signal). The NR system simulator 20 receives this call connection response signal and confirms that the response was made normally. A series of these processes is call connection control. This call connection control establishes a state in which radio signals of a predetermined frequency can be transmitted and received between the NR system simulator 20 and the DUT 100 via the test antenna 6 .

The process of receiving the radio signal sent from the NR system simulator 20 via the test antenna 6 and the reflector 7 by the DUT 100 is called downlink (DL) process. Conversely, the process of transmitting radio signals by DUT 100 through reflector 7 and test antenna 6 to NR system simulator 20 is referred to as uplink (UL) process. The test antenna 6 is used to establish a link (call) process, and downlink (DL) and uplink (UL) processes after link establishment, and also functions as a link antenna. there is

After the call connection is established in step S3, the DUT attitude control section 14c of the integrated control device 10 causes the attitude varying mechanism 60 to change the attitude of the DUT 100 set on the DUT placement section 64 to a predetermined attitude within the quiet zone QZ. control (step S4).

The infrared camera device 140 takes an image of the DUT 100 placed inside the heat insulating housing 70 through the viewing window 160 (step S5). At the time of photographing, an infrared LED as a light source may irradiate the DUT 100 with infrared rays, and the infrared rays reflected from the DUT 100 may be detected by the light receiving sensor of the infrared camera device 140 .

The display unit 13 of the integrated control device 10 displays an image (moving or still image) of the DUT 100 captured by the infrared camera device 140 (step S6). Thereby, the user can see the image of the DUT 100 displayed on the display unit 13 and confirm whether or not the posture of the DUT 100 is appropriate. Alternatively, the control unit 11 of the integrated control device 10 may be provided with an attitude determination unit 14f that determines whether the attitude of the DUT 100 is appropriate. The posture determination unit 14f applies a known image recognition technology to the image of the DUT 100 captured by the infrared camera device 140, and compares the recognized posture of the DUT 100 with a normal posture acquired in advance. The appropriateness of the posture of the DUT 100 may be determined by the following.

If the attitude of the DUT 100 is not appropriate (NO in step S7), the process returns to step S4 and controls the attitude of the DUT 100 again, or the test may be interrupted and the test restarted from the beginning or from the middle. If the posture of the DUT 100 is appropriate (YES in step S7), the process proceeds to step S8.

In step S<b>8 , the signal transmission/reception control section 14 b of the integrated control device 10 transmits a signal transmission command to the NR system simulator 20 . The NR system simulator 20 transmits the test signal to the DUT 100 via the test antenna 6 based on the received signal transmission command.

Specifically, transmission of the test signal by the NR system simulator 20 is performed as follows. In the NR system simulator 20 (see FIG. 5), the signal generating section 21a generates a signal for generating the test signal under the control of the control section 22 which receives the signal transmission command. Next, the DAC 21b digital/analog converts the signal generated by the signal generator 21a. Next, the modulation section 21c modulates the analog signal obtained by the digital/analog conversion. Next, the RF section 21d generates a test signal corresponding to the frequency of each communication standard from the modulated signal, and the transmission section 21e sends this test signal (DL data) to the transmission signal processing section 40a.

The transmission signal processing unit 40 a performs signal processing such as frequency conversion (up-conversion), amplification, and frequency selection on the test signal, and sends the signal to the test antenna 6 . output to the DUT 100.

Note that the signal transmission/reception control unit 14b controls transmission of the test signal at an appropriate timing until the measurement of the transmission characteristics and reception characteristics of the DUT 100 is completed after the test signal transmission control is started in step S8. .

On the other hand, the DUT 100 receives the test signal (DL data) sent via the test antenna 6 and the reflector 7 through the antenna 110, and transmits the signal under measurement as a response signal to the test signal.

Under the control of the signal transmission/reception control section 14b, reception processing of the signal under measurement transmitted from the DUT 100 is performed (step S9). Specifically, the test antenna 6 receives the signal under measurement transmitted from the DUT 100 and outputs it to the received signal processing section 40b. The received signal processing unit 40b performs signal processing such as frequency conversion (down-conversion), amplification, and frequency selection on the signal under measurement, and outputs the processed signal to the NR system simulator 20. FIG.

The NR system simulator 20 executes measurement processing for measuring the signal under measurement that has been frequency-converted by the received signal processing section 40b (step S10).

Specifically, the receiving section 21f of the RF section 21d of the NR system simulator 20 inputs the signal under measurement that has undergone signal processing by the received signal processing section 40b. Under the control of the control section 22, the RF section 21d converts the signal under measurement input to the receiving section 21f into an IF signal with a lower frequency. Next, under the control of the control section 22, the ADC 21g converts the IF signal from an analog signal to a digital signal and outputs the digital signal to the analysis processing section 21h. The analysis processing unit 21h generates waveform data respectively corresponding to the I component baseband signal and the Q component baseband signal. Furthermore, under the control of the control section 22, the analysis processing section 21h analyzes the signal under measurement based on the generated waveform data described above.

More specifically, in the NR system simulator 20, the analysis processing section 21h measures the transmission characteristics and reception characteristics of the DUT 100 under the control of the control section 22 based on the analysis results of the signal under measurement.

For example, the transmission characteristics of the DUT 100 are determined as follows. First, under the control of the control unit 22, the NR system simulator 20 transmits a request frame for uplink signal transmission as a test signal. The DUT 100 transmits an uplink signal frame to the NR system simulator 20 as a signal under measurement in response to the uplink signal transmission request frame. The analysis processing unit 21h performs processing for evaluating transmission characteristics of the DUT 100 based on this uplink signal frame.

Also, the reception characteristics of the DUT 100 are determined, for example, as follows. Under the control of the control unit 22, the analysis processing unit 21h calculates the number of transmissions of measurement frames transmitted as test signals from the NR system simulator 20, and ACKs and NACKs transmitted as signals under measurement from the DUT 100 in response to the measurement frames. is calculated as the error rate (PER).

In step S10, under the control of the control unit 22, the analysis processing unit 21h displays the measurement results of the transmission characteristics and reception characteristics of the DUT 100 in association with the temperature controlled in step S2 and the attitude controlled in step S4. The data is stored in a storage area such as RAM.

Next, the control unit 11 of the integrated control device 10 determines whether or not the measurement of the transmission characteristics and reception characteristics of the DUT 100 has been completed for all desired postures (step S11). Here, if it is determined that the measurement has not ended (NO in step S11), the process returns to step S4 to continue the process.

If the control unit 11 determines that the measurement has been completed for all orientations (YES in step S11), the control unit 11 determines whether the measurement of the transmission characteristics and reception characteristics of the DUT 100 has been completed for all temperatures preset by the user. It is determined whether or not (step S12).

When it is determined that the measurement of all temperatures has not been completed (NO in step S12), the control unit 11 returns to step S2 and continues the process. When it is determined that the measurement has been completed for all temperatures (YES in step S12), the control unit 11 ends the test.

(action/effect)
Next, functions and effects will be described.

The temperature testing apparatus 1 according to the present embodiment includes an air inlet 170 for introducing temperature-controlled gas from the temperature control device 120 into the heat-insulating housing 70, and an air-insulating housing 70. An exhaust port 171 for discharging the gas inside 70 is provided, and the area S2 of the exhaust port 171 is smaller than the area S1 of the intake port 170 . With this configuration, the supplied temperature-controlled gas stays longer in the heat insulating housing 70, and the temperature inside the heat insulating housing 70 can be made uniform efficiently.

Further, in the temperature testing apparatus 1 according to this embodiment, an exhaust fan 172 is provided in the exhaust passage 131 passing through the exhaust port 171 . With this configuration, the amount of exhaust air discharged from the exhaust port 171 is increased within a limit that does not exceed the amount of intake air, and the air in the heat insulating housing 70 leaks from the gaps between the parts that constitute the assembled heat insulating housing 70. You can control the amount you do.

In addition, in the temperature testing apparatus 1 according to the present embodiment, the intake port 170 and the exhaust port 171 are configured such that when the temperature inside the heat insulating housing 70 is controlled by the temperature control device 120, the atmospheric pressure P1 inside the heat insulating housing 70 is , and have areas S1 and S2 that are different from each other so as to be higher than the air pressure P2 outside the heat insulating housing 70 . With this configuration, by a simple method, the air outside the heat insulating housing 70 is prevented from flowing into the heat insulating housing 70 from the gaps between the parts constituting the heat insulating housing 70, and the exhaust from the exhaust port 171 is prevented. Efficiency can be increased.

Further, in the temperature testing apparatus 1 according to the present embodiment, the intake port 170 and the exhaust port 171 are such that the exhaust amount per unit time discharged from the exhaust port 171 is equal to the intake air amount introduced from the intake port 170 per unit time. They have areas S1 and S2 that are different from each other so as to be smaller. With this configuration, the supplied temperature-controlled gas stays longer in the heat insulating housing 70 by a simple method, and the temperature inside the heat insulating housing 70 can be made uniform efficiently.

Further, in the temperature testing apparatus 1 according to the present embodiment, the exhaust port 171 of the heat insulating housing 70 may be provided with an opening adjuster 173 for adjusting the size of the exhaust port 171 . With this configuration, the exhaust amount can be easily adjusted by selecting an appropriate opening adjuster 173 .

The present invention can be applied not only to an anechoic chamber but also to an anechoic chamber. In addition, in the above embodiment, the OTA chamber 50 is a chamber that employs the CATR method, but the present invention is not limited to this, and the OTA chamber 50 employs the direct far-field method shown in FIG. It may be the chamber employed.

INDUSTRIAL APPLICABILITY As described above, the present invention has the effect of increasing the efficiency of temperature control within the heat insulating housing by efficiently equalizing the temperature of the air within the heat insulating housing. Useful for all equipment and temperature test methods.

REFERENCE SIGNS LIST 1 temperature test device 54 internal space 2 measuring device 55 radio wave absorber 5, 8 link antenna 57, 59 holder 6 test antenna 58 reflector holder 7 reflector 60 attitude varying mechanism 7A reflector 61 drive section 10 integrated control device 62 turn Table 11, 22 Control Unit 63 Support 11a CPU 64 DUT Placement Unit 11b ROM 70 Heat Insulation Case 11c RAM 71 Top Board 11d External Interface Unit 72 Base Board 11d1 USB Port 72a Through Hole 12, 23 Operation Unit 72b Rotating Unit 13, 24 Display Portion 72c Hole 14a Call connection control unit 73 Front plate 14b Signal transmission/reception control unit 74 Rear plate 14c DUT attitude control unit 75 Front side plate 14d Temperature control unit 76 Rear side plate 14e Camera control unit 77 Spatial area 14f Attitude determination unit 90 Rack structure 17a DUT attitude control table 90a rack 18 cable 100 DUT (object to be tested)
19 network 100A wireless terminal 20 NR system simulator 110 antenna (antenna under test)
21 signal measurement section 120 temperature control device 21a signal generation section 124 temperature sensor 21b DAC 130 intake path 21c modulation section 131 exhaust path 21d RF section 140 infrared camera device 21e transmission section 160 viewing window 21f reception section 161 opening 21g ADC 162 window plate 21h Analysis processing unit 170 Intake port 30 Wireless communication analyzer 171 Exhaust port 40 Signal processing unit 171a Inner peripheral surface 40a Transmission signal processing unit 172 Exhaust fan 40b Reception signal processing unit 173 Opening adjuster 50 OTA chamber (anechoic box) 173a Outer peripheral surface 51 Chamber Main body 173b Through hole 511 Chamber back surface 181 Piping joint 51a Bottom surface F Focus position of reflector 51b Side surface QZ Quiet zone 51c Top surface 52a Door 52b Hinge 52c Handle 52d Access panel

Claims (7)

an anechoic box (50);
a heat insulating housing (70) housed in the anechoic box and assembled from a plurality of heat insulating parts;
A temperature control device (120) that controls the temperature in the heat insulating housing,
The walls of the heat insulating housing are provided with an intake port (170) for introducing temperature-controlled gas from the temperature control device into the heat insulating housing, and an exhaust port (170) for discharging the gas within the heat insulating housing. A port (171) is provided, and the area of the exhaust port is such that the temperature-controlled gas from the temperature control device stays longer in the heat-insulating housing, effectively uniforming the temperature inside the heat-insulating housing. A temperature testing device characterized in that the area of the air inlet is smaller than the area of the air inlet in order to An exhaust fan (172) is provided in the exhaust flow path passing through the exhaust port to forcibly discharge the air pushed out from the heat insulating housing 70 as the air flows in from the intake port to the outside through the exhaust port. The temperature test device of claim 1, wherein the temperature test device is The intake port and the exhaust port have areas different from each other such that the air pressure inside the heat insulating housing is higher than the air pressure outside the heat insulating housing when the temperature inside the heat insulating housing is controlled by the temperature control device. 3. The temperature test device according to claim 1 or 2, comprising: The intake port and the exhaust port have areas different from each other such that the amount of exhaust gas discharged from the exhaust port per unit time is smaller than the intake amount introduced from the intake port per unit time. The temperature testing device according to any one of claims 1-3. The temperature test apparatus according to any one of claims 1 to 4, wherein the exhaust port of the heat insulating housing is provided with an opening adjuster (173) for adjusting the size of the exhaust port. a test antenna (6) provided in the anechoic box for transmitting or receiving a radio signal to/from the test object;
an attitude varying mechanism (60) provided in the anechoic box for controlling the attitude of the test object;
transmission characteristics of the test object using the test antenna each time the posture of the test object is changed by the posture changing mechanism while the temperature in the heat insulating housing is controlled by the temperature control device; Or a measuring device (2) for measuring reception characteristics,
The temperature test device according to any one of claims 1 to 5, further comprising: A temperature testing method using the temperature testing device according to any one of claims 1 to 6,
a temperature control step (S2) of controlling the temperature in the heat insulating housing to a plurality of predetermined temperatures;
an attitude changing step (S4) for sequentially changing the attitude of the test object placed in the heat insulating housing;
In a state in which the temperature inside the heat insulating housing is controlled by the temperature control step, the transmission characteristics or reception characteristics of the test object are measured each time the posture of the test object is changed by the posture changing step. a measuring step (S7);
A temperature test method comprising:

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