JP2022047332A - X-ray imaging control device - Google Patents

Abstract

To enhance accuracy in X-ray control.SOLUTION: An X-ray imaging control device includes a selection section, an acquisition section, a comparison section, and an X-ray control section, so as to control X-ray imaging in an X-ray diagnostic apparatus including: an X-ray generation section for generating an X-ray; an X-ray detection section where detection elements to detect the X-ray and to output a detection signal are arranged in a matrix state; and an image generation section for generating an X-ray image based on the detection signals. The selection section selects a plurality of element arrays where the detection elements are arranged in a row state from the detection elements included in the X-ray detection section. The acquisition section acquires detection signal patterns indicating the patterns of the detection signals for each element array. The comparison section compares the detection signal patterns with a standard signal pattern for each element array. The X-ray control section performs X-ray control based on a comparison result by the comparison section and the detection signals detected in the plurality of element arrays.SELECTED DRAWING: Figure 8B

Description

The embodiments disclosed in the present specification and the like relate to an X-ray imaging control device.

In X-ray photography, it is necessary to appropriately control X-rays in consideration of the exposure dose of the subject and the image quality of the X-ray image. For example, if the X-rays irradiated to the subject are insufficient, the image quality required for image diagnosis cannot be obtained, and it is a burden on the subject to be irradiated with excessive X-rays. In addition, since there are individual differences in the body thickness and internal structure of the subject, it is necessary to control the X-rays individually for each subject.

Japanese Unexamined Patent Publication No. 2005-21514 Japanese Unexamined Patent Publication No. 2013-176544 Japanese Unexamined Patent Publication No. 2012-159497 Japanese Unexamined Patent Publication No. 2005-6196

One of the problems to be solved by the embodiments disclosed in the present specification and the like is to improve the accuracy of X-ray control. However, the problems solved by the embodiments disclosed in the present specification and the like are not limited to the above problems. The problem corresponding to each effect by each configuration shown in the embodiment described later can be positioned as another problem to be solved by the embodiment disclosed in the present specification and the like.

The X-ray imaging control device of the embodiment includes a selection unit, an acquisition unit, a comparison unit, and an X-ray control unit, and includes an X-ray generation unit that generates X-rays and a detection signal that detects the X-rays. Controls X-ray imaging in an X-ray diagnostic apparatus including an X-ray detection unit in which detection elements for outputting the above are arranged in a matrix and an image generation unit that generates an X-ray image based on the detection signal. The selection unit selects a plurality of element rows in which the detection elements are arranged in a row from the detection elements included in the X-ray detection unit. The acquisition unit acquires a detection signal pattern indicating the detection signal pattern for each element row. The comparison unit compares the detected signal pattern and the standard signal pattern for each element sequence. The X-ray control unit controls the X-rays based on the comparison result by the comparison unit and the detection signals detected in the plurality of element trains.

FIG. 1 is a block diagram showing an example of the configuration of the X-ray diagnostic apparatus according to the first embodiment. FIG. 2 is a block diagram showing an example of the configuration of the X-ray imaging control device according to the first embodiment. FIG. 3 is a diagram showing an outline of X-ray photography according to the first embodiment. FIG. 4 is a diagram showing an example of the AEC detector according to the first embodiment. FIG. 5A is a diagram for explaining AEC using the detection signal of the X-ray detector according to the first embodiment. FIG. 5B is a diagram for explaining AEC using the detection signal of the X-ray detector according to the first embodiment. FIG. 5C is a diagram for explaining AEC using the detection signal of the X-ray detector according to the first embodiment. FIG. 6 is a flowchart showing a series of processes of the X-ray imaging control device according to the first embodiment. FIG. 7 is a diagram showing an example of a region of interest and an element sequence according to the first embodiment. FIG. 8A is a diagram for explaining a comparison process between the detected signal pattern and the standard signal pattern according to the first embodiment. FIG. 8B is a diagram for explaining a comparison process between the detected signal pattern and the standard signal pattern according to the first embodiment. FIG. 9 is a diagram showing an example of a region of interest and an element sequence according to the first embodiment. FIG. 10 is a diagram showing an example of a region of interest and an element sequence according to the first embodiment.

Hereinafter, embodiments of the X-ray imaging control device will be described in detail with reference to the drawings.

(First Embodiment)
An X-ray diagnostic apparatus 1 including an X-ray imaging control device 12 will be described as an example. For example, as shown in FIG. 1, the X-ray diagnostic device 1 includes an X-ray high voltage device 11, an X-ray radiography control device 12, an X-ray tube 13, an X-ray filter 14, and an X-ray detector 15. , An input interface 16, a display 17, a memory 18, and a processing circuit 19. FIG. 1 is a block diagram showing an example of the configuration of the X-ray diagnostic apparatus 1 according to the first embodiment.

The X-ray high voltage device 11 is a device that supplies a high voltage to the X-ray tube 13. For example, the X-ray high voltage device 11 has an electric circuit such as a transformer and a rectifier, and the high voltage generator that generates a high voltage applied to the X-ray tube 13 and the X-ray tube 13 irradiate the device. It has a control device that controls an output voltage according to X-rays. The high voltage generator may be a transformer type or an inverter type.

The X-ray imaging control device 12 is a device that controls X-ray imaging in the X-ray diagnostic apparatus 1. For example, the X-ray imaging control device 12 controls the supply of a high voltage from the X-ray high voltage device 11 to the X-ray tube 13 based on the detection signal output from the X-ray detector 15, and turns on the X-ray. Controls / off switching. The details of the X-ray imaging control device 12 will be described later.

The X-ray tube 13 is a vacuum tube having a cathode (filament) that generates thermions and an anode (target) that receives the collision of thermions and generates X-rays. The X-ray tube 13 generates X-rays by irradiating thermions from the cathode toward the anode using the high voltage supplied from the X-ray high voltage device 11. The X-ray tube 13 is an example of an X-ray generating unit.

The X-ray diaphragm 14 has a collimator that narrows down the irradiation range of X-rays and a filter that adjusts the quality and dose of X-rays. For example, the collimator has four sliding diaphragm blades, and by sliding these diaphragm blades, the X-rays generated by the X-ray tube 13 are narrowed down and irradiated to the subject P. Here, the diaphragm blade is a plate-shaped member made of lead or the like, and is provided near the X-ray irradiation port of the X-ray tube 13 in order to adjust the X-ray irradiation range. Further, the filter changes the quality of X-rays transmitted depending on the material and thickness for the purpose of reducing the exposure dose to the subject P and improving the image quality of the X-ray image, and obtains a soft ray component that is easily absorbed by the subject P. It reduces or reduces high-energy components that cause a decrease in contrast of X-ray images. Further, the filter changes the dose and irradiation range of X-rays depending on the material, thickness, position, etc., and attenuates the X-rays so that the X-rays irradiated to the subject P have a predetermined distribution.

For example, the X-ray diaphragm 14 has a drive mechanism such as a motor and an actuator, and controls a collimator and a filter by operating the drive mechanism under the control of a processing circuit 19 described later. For example, the X-ray diaphragm 14 adjusts the opening degree of the diaphragm blade of the collimator by applying a drive voltage to the drive mechanism according to the control signal received from the processing circuit 19, and irradiates the subject P with light. The X-ray irradiation range is controlled. Further, for example, the X-ray diaphragm 14 is irradiated to the subject P by adjusting the position of the filter by applying a drive voltage to the drive mechanism according to the control signal received from the processing circuit 19. Control the quality and dose distribution of X-rays.

The X-ray detector 15 is, for example, an X-ray plane detector (Flat Panel Detector: FPD) having detection elements arranged in a matrix. Each detection element in the X-ray detector 15 detects X-rays irradiated from the X-ray tube 13 and transmitted through the subject P, and outputs a detection signal corresponding to the detected X-ray dose. Here, a part of the detection signal output from the detection element of the X-ray detector 15 is used for controlling X-rays by the X-ray imaging control device 12, and the other part is used for generating an X-ray image. To. The X-ray detector 15 may be an indirect conversion type detector having a grid, a scintillator array and an optical sensor array, or a direct conversion type detector having a semiconductor element that converts incident X-rays into an electric signal. It doesn't matter. The X-ray detector 15 is an example of an X-ray detector.

The input interface 16 receives various input operations from the user, converts the received input operations into electric signals, and outputs the received input operations to the processing circuit 19. The user is a doctor or a technician in charge of the subject P. For example, the input interface 16 includes a mouse, a keyboard, a trackball, a switch, a button, a joystick, a touch pad for performing an input operation by touching an operation surface, a touch screen in which a display screen and a touch pad are integrated, and an optical sensor. It is realized by the non-contact input circuit, voice input circuit, etc. used. The input interface 16 may be composed of a tablet terminal or the like capable of wireless communication with the processing circuit 19. Further, the input interface 16 may be a circuit that accepts an input operation from the user by motion capture. As an example, the input interface 16 can accept a user's body movement, line of sight, or the like as an input operation by processing a signal acquired via a tracker or an image collected about the user. Further, the input interface 16 is not limited to the one provided with physical operation parts such as a mouse and a keyboard. For example, an electrical signal processing circuit that receives an electrical signal corresponding to an input operation from an external input device provided separately from the X-ray diagnostic device 1 and outputs the electrical signal to the processing circuit 19 is also an input interface 16. Included in the example.

The display 17 displays various information. For example, the display 17 displays an X-ray image of the subject P. Further, for example, the display 17 displays a GUI (Graphical User Interface) for receiving a user's instruction under the control of the processing circuit 19. For example, the display 17 is a liquid crystal display or a CRT (Cathode Ray Tube) display. The display 17 may be a desktop type, or may be configured by a tablet terminal or the like capable of wireless communication with the processing circuit 19.

Although the X-ray diagnostic apparatus 1 will be described as including the display 17 in FIG. 1, the X-ray diagnostic apparatus 1 may include a projector in place of or in addition to the display 17. Under the control of the processing circuit 19, the projector can project onto a screen, a wall, a floor, a body surface of a subject P, or the like. As an example, the projector can also project onto an arbitrary plane, object, space, etc. by projection mapping.

The memory 18 is realized by, for example, a RAM (Random Access Memory), a semiconductor memory element such as a flash memory, a hard disk, an optical disk, or the like. For example, the memory 18 receives and stores an X-ray image generated by the processing circuit 19. Further, the memory 18 stores programs corresponding to various functions read and executed by the processing circuit 19.

The processing circuit 19 controls the operation of the entire X-ray diagnostic apparatus 1 by executing the control function 191 and the image generation function 192 and the output function 193. For example, the processing circuit 19 reads the program corresponding to the control function 191 from the memory 18 and executes it, and based on various input operations received from the user via the input interface 16, the image generation function 192 and the output function. It controls various functions such as 193.

Further, the control function 191 controls various shooting conditions. For example, the control function 191 adjusts the voltage supplied from the X-ray high voltage device 11 to the X-ray tube 13 to control the X-ray dose. Further, the control function 191 controls the operation of the X-ray diaphragm 14 and adjusts the opening degree of the diaphragm blades of the collimator to control the X-ray irradiation range. Further, the control function 191 controls the operation of the X-ray diaphragm 14 and adjusts the position of the filter to control the distribution of the X-ray dose and the quality of the X-ray.

Further, the processing circuit 19 generates an X-ray image based on the detection signal received from the X-ray detector 15 by reading a program corresponding to the image generation function 192 from the memory 18 and executing the program, and the generated X-rays. The image is stored in the memory 18. Further, the image generation function 192 may perform various image processing on the generated X-ray image. For example, the image generation function 192 executes noise reduction processing and scattered ray correction by an image processing filter on the generated X-ray image.

Further, for example, the processing circuit 19 outputs an X-ray image by reading a program corresponding to the output function 193 from the memory 18 and executing the program. For example, the output function 193 causes the display 17 to display the X-ray image generated by the image generation function 192. Further, for example, the output function 193 transmits the X-ray image generated by the image generation function 192 to the image storage device via the network NW.

The network NW can be configured by a local network. For example, the network NW is an in-hospital LAN (Local Area Network) that is closed in the hospital. Alternatively, the network NW may be a network via the Internet.

In the X-ray diagnostic apparatus 1 shown in FIG. 1, each processing function is stored in the memory 18 in the form of a program that can be executed by a computer. The processing circuit 19 is a processor that realizes a function corresponding to each program by reading a program from the memory 18 and executing the program. In other words, the processing circuit 19 in the state where the program is read has a function corresponding to the read program.

Although it has been described in FIG. 1 that the control function 191 and the image generation function 192 and the output function 193 are realized by a single processing circuit 19, the processing circuit 19 is configured by combining a plurality of independent processors. However, the function may be realized by each processor executing a program. Further, each processing function of the processing circuit 19 may be appropriately distributed or integrated into a single or a plurality of processing circuits.

Further, the processing circuit 19 may realize the function by using the processor of the external device connected via the network NW. For example, the processing circuit 19 reads a program corresponding to each function from the memory 18 and executes it, and also uses a server group (cloud) connected to the X-ray diagnostic device 1 via the network NW as a computational resource. , Each function shown in FIG. 1 is realized.

Next, the X-ray imaging control device 12 will be described with reference to FIG. FIG. 2 is a block diagram showing an example of the configuration of the X-ray imaging control device 12 according to the first embodiment. The X-ray imaging control device 12 has a processing circuit 121 and a memory 122. The processing circuit 121 controls the X-ray imaging in the X-ray diagnostic apparatus 1 by executing the selection function 121a, the acquisition function 121b, the comparison function 121c, and the X-ray control function 121d. The selection function 121a is an example of a selection unit. The acquisition function 121b is an example of an acquisition unit. The comparison function 121c is an example of a comparison unit. The X-ray control function 121d is an example of an X-ray control unit.

For example, the processing circuit 121 reads a program corresponding to the selection function 121a from the memory 122 and executes it to select an element sequence in which the detection elements are arranged in a row from the detection elements included in the X-ray detector 15. Select multiple. Further, the processing circuit 121 acquires a detection signal pattern indicating a detection signal pattern for each element string by reading a program corresponding to the acquisition function 121b from the memory 122 and executing the program. Further, the processing circuit 121 reads the program corresponding to the comparison function 121c from the memory 122 and executes the program to compare the detected signal pattern and the standard signal pattern for each element sequence. Further, the processing circuit 121 reads a program corresponding to the X-ray control function 121d from the memory 122 and executes it, based on the comparison result by the comparison function 121c and the detection signals detected in the plurality of element trains. Controls X-rays. The details of each function of the processing circuit 121 will be described later.

The memory 122 is realized by, for example, a semiconductor memory element such as a RAM or a flash memory, a hard disk, an optical disk, or the like. For example, the memory 122 stores a weighting function and a standard signal pattern, which will be described later. Further, the memory 122 stores programs corresponding to various functions read and executed by the processing circuit 121.

In the X-ray imaging control device 12 shown in FIG. 2, each processing function is stored in the memory 122 in the form of a program that can be executed by a computer. The processing circuit 121 is a processor that realizes a function corresponding to each program by reading a program from the memory 122 and executing the program. In other words, the processing circuit 121 in the state where the program is read has a function corresponding to the read program.

In FIG. 2, it has been described that the selection function 121a, the acquisition function 121b, the comparison function 121c, and the X-ray control function 121d are realized by a single processing circuit 121, but a plurality of independent processors are combined. The processing circuit 121 may be configured and the function may be realized by each processor executing a program. Further, each processing function of the processing circuit 121 may be appropriately distributed or integrated into a single or a plurality of processing circuits.

Further, the processing circuit 121 may realize the function by using the processor of the external device connected via the network NW. For example, the processing circuit 121 reads a program corresponding to each function from the memory 122 and executes it, and also uses a server group (cloud) connected to the X-ray imaging control device 12 via the network NW as a computational resource. As a result, each function shown in FIG. 2 is realized.

The overall configuration of the X-ray diagnostic apparatus 1 including the X-ray imaging control device 12 has been described above. Next, the outline of the X-ray imaging in the X-ray diagnostic apparatus 1 will be described with reference to FIG.

The X-ray imaging control device 12 controls the supply of a high voltage from the X-ray high voltage device 11 to the X-ray tube 13, and switches the X-ray on / off. When the X-ray imaging control device 12 turns the X-ray "on", imaging is started. Further, while the X-ray imaging control device 12 controls the X-rays to be “on”, the X-ray tube 13 irradiates the subject P with X-rays and allows the subject P to pass through. X-rays are detected by the X-ray detector 15. Further, when the X-ray imaging control device 12 turns the X-ray "off", the imaging is completed. That is, the X-ray imaging control device 12 controls the imaging time by controlling the switching of X-rays on / off. Although not shown in FIG. 3, the control function 191 controls various imaging conditions such as the X-ray dose and the irradiation range by controlling the operation of the X-ray high voltage device 11 and the X-ray diaphragm 14.

In the X-ray detector 15, the detection elements are arranged in a matrix to form a photographing region. For example, in the X-ray detector 15, the detection elements in the "n" row in the vertical direction and the "m" column in the horizontal direction are arranged in the vertical direction of FIG. The X-ray detector 15 realizes X-ray detection by the operation of the drive circuit and the read circuit.

For example, while the X-ray imaging control device 12 controls the X-rays to be “on”, each detection element accumulates a charge corresponding to the irradiated X-ray dose. Also, after the X-rays are turned "off" by the X-ray imaging control device 12, the control circuit operates the drive circuit and the read circuit by the electric power supplied from the power source. The drive circuit sequentially transmits a read signal (G1-Gn). For example, the drive circuit transmits a read signal G1 to the detection element on the first line, a read signal G2 to the detection element on the second line, and a read signal Gn to the detection element on the nth line. To send. The detection element that has received the read signal reads out the electric charge, and the detection signal is output to the read circuit. For example, when the read signal G1 is transmitted, the detection signals P (G1, 1) -P (G1, m) are read from each of the detection elements on the first line. Then, the read signal (G1-Gn) is sequentially transmitted from the drive circuit, so that the read circuit has the detection signals P (G1, 1) -P (G1, m) to P (Gn, 1) -P (Gn). , M) is acquired. The signal processing circuit performs various preprocessing on the detection signal read by the reading circuit. For example, the signal processing circuit performs amplification processing, A / D conversion, and the like on the detected signal. The preprocessed detection signal is transmitted to the processing circuit 19 via the wireless communication circuit of the X-ray detector 15 and the like. The image generation function 192 of the processing circuit 19 generates an X-ray image based on the detection signal transmitted from the X-ray detector 15.

Here, the X-ray imaging control device 12 automatically determines the timing at which the X-ray is turned "off". That is, the X-ray imaging control device 12 automatically controls the imaging time. Such an automatic control technique is also referred to as automatic exposure control (AEC).

The AEC can be realized, for example, by further using the AEC detector shown in FIG. The AEC detector is provided with a region of interest (ROI). The position and size of the ROI in the AEC detector is empirically determined for each imaging site. For example, the AEC detector is provided with ROIs (I-III) at three locations. The AEC detector is arranged between the subject P and the X-ray detector 15 and detects the X-rays that have passed through the subject P. Then, AEC can be realized by turning off the X-rays when the X-ray detected by the AEC detector exceeds the threshold value.

However, there is a cost in using the AEC detector in addition to the X-ray diagnostic apparatus 1. Further, the ROI in the AEC detector is arranged at a predetermined position, and it is necessary to prepare a different AEC detector for each imaging site. Furthermore, the shape and size of the imaging site may vary from person to person depending on the age and physique of the subject P, and the ROI in the AEC detector cannot be optimized for each imaging, so the imaging time may not be controlled appropriately. be.

Further, a method for realizing AEC without using an AEC detector has also been proposed. Specifically, it is possible to execute AEC by using a part of the detection signal detected by the X-ray detector 15 for AEC instead of as image information. Here, if a large number of detection elements are used for AEC, the image information is reduced, the image quality is affected, and the calculation load related to AEC is increased. Therefore, the number of detection elements that can be used for AEC is limited, and it is necessary to treat the detection results of the limited number of detection elements as representative values.

Hereinafter, a case where AEC is executed using the detection signal of the X-ray detector 15 will be described with reference to FIGS. 5A to 5B. For example, as shown in FIG. 5A, the X-ray imaging control device 12 selects an element to be used for AEC from the detection elements of the X-ray detector 15. Specifically, the X-ray imaging control device 12 selects not all the elements included in the ROI but a part of the elements included in the ROI as the detection elements used in the AEC. More specifically, as shown in the upper figure of FIG. 5B, the X-ray imaging control device 12 has the elements in the G2 row among the seven rows of detection elements from G1 to G7 included in the ROI (region of interest). , G4 row element, and G6 row element are selected as detection elements to be used for AEC.

A signal is read out from each detection element as shown in FIG. 5C. Specifically, after the preparation and waiting period, shooting is started and AEC (automatic exposure control) is started. Next, the detection signal is read out at time t after the start of imaging. In the following, the detection signal read from the element on the xth line at time t will be referred to as a signal P (Gx, t). For example, the detection signal read from the element in the row G2 at time t is described as signal P (G2, t) as shown in the upper figure of FIG. 5B.

The explanation will be continued by returning to FIG. 5C. After the start of imaging, the detection signal is repeatedly read from each detection element selected as the detection element used for AEC. For example, at the time "t = 1", the signal P (G2, 1) is read from the element in the row G2, the signal P (G4, 1) is read out from the element in the row G4, and the signal P (G4, 1) is read out from the element in the row G6. The signal P (G6, 1) is read from the element. Further, at the time "t = 2", the signal P (G2, 2) is read from the element in the row G2, the signal P (G4, 2) is read out from the element in the row G4, and the signal P (G4, 2) is read out from the element in the row G6. The signal P (G6, 2) is read from the element. Further, at the time "t = 3", the signal P (G2,3) is read from the element in the G2 row, the signal P (G4,3) is read from the element in the G4 row, and the signal P (G4,3) is read from the element in the G6 row. The signal P (G6,3) is read from the element. Also, the read signal is compared with the threshold.

For example, the X-ray imaging control device 12 compares the signal P (G2, 1) read from the element in the row G2 at the time “t = 1” with the threshold value, as shown in the lower figure of FIG. 5B. The signal P (G2, 1) can be shown as a pattern in which the detection signal read from each element in the row of G2 is associated with a position in the region of interest.

Next, the X-ray imaging control device 12 integrates the signal P (G2, 2) read from the element in the row of G2 at the time “t = 2”, and the signal “P (G2, 1) + P (G2,” 2) ”is compared with the threshold. Next, the X-ray imaging control device 12 integrates the signal P (G2, 3) read from the element in the row of G2 at the time “t = 3”, and the signal “P (G2, 1) + P (G2,” 2) + P (G2,3) ”is compared with the threshold. Next, the X-ray imaging control device 12 integrates the signal P (G2, 4) read from the element in the row G2 at the time “t = 4”, and the signal “P (G2, 1) + P (G2,” 2) + P (G2,3) +P (G2,4) ”is compared with the threshold value. Next, the X-ray imaging control device 12 integrates the signal P (G2, 5) read from the element in the row of G2 at the time “t = 5”, and the signal “P (G2, 1) + P (G2,” 2) + P (G2,3) +P (G2,4) +P (G2,5) ”is compared with the threshold value. Then, the X-ray imaging control device 12 ends imaging when the integrated value of the signal exceeds the threshold value, and turns off the X-ray.

In the detection elements (elements in the G1 row, elements in the G3 row, elements in the G5 row, and elements in the G7 row) that are not used in AEC, charge accumulation occurs from the start to the end of imaging. Will be continued. As shown in FIG. 5C, the charges accumulated in these detection elements are read out as pixel signals after the X-rays (radiation) are turned off and used to generate an X-ray image.

As described above, it is possible to execute AEC using the detection signal of the X-ray detector 15. However, in this case, since it is necessary to use the detection results of a limited number of detection elements for comparison with the threshold value, the imaging time may be affected by a slight positional deviation with respect to the subject P. For example, when the lung field is the imaging site, the signal value may differ depending on whether the detection element used for AEC overlaps the bone or the soft tissue, and the imaging time may change.

Therefore, the X-ray imaging control device 12 improves the accuracy of X-ray control by the following processing without using an AEC detector additionally. Hereinafter, the processing performed by the X-ray imaging control device 12 will be described with reference to the flowchart of FIG.

First, the selection function 121a acquires the test information of the subject P (step S101). The examination information includes, for example, patient information and an imaging site. For example, the selection function 121a can automatically acquire examination information from a system such as a hospital information system (HIS: Hospital Information System) or a radiological information system (RIS: Radiological Information System). Alternatively, the selection function 121a can also acquire inspection information based on an input operation from the user.

Next, the selection function 121a acquires various information from the memory 122 based on the inspection information (step S102). For example, the selection function 121a acquires information on the number and position of ROIs that can be set on the detection surface of the X-ray detector 15. For example, the selection function 121a acquires an imaged portion in step S101, and acquires information on the number and position of ROIs corresponding to the imaged portion. As an example, when the imaging site is the "lung", the selection function 121a performs "three" ROIs corresponding to the intermediate positions of the right lung, the left lung, and both lungs together with the position information of each ROI. get. Further, the selection function 121a acquires a weighting function and a standard signal pattern corresponding to each ROI. The weighting function and standard signal pattern will be described later.

Further, the selection function 121a determines whether or not there has been a past test for the subject P (step S103), and if there is a past test (step S103 affirmative), acquires the past test information of the subject P. (Step S104). The past inspection information includes, for example, the imaged part targeted in the past inspection, the image information collected in the past inspection, and the number and position information of the ROI used in the past inspection. For example, the selection function 121a can automatically acquire past inspection information from a system such as HIS, RIS, or PACS (Picture Archiving and Communication System). The order in which steps S102 and S103 are performed is arbitrary, and may be performed in parallel.

Next, the selection function 121a sets the ROI and selects a plurality of element trains in the ROI (step S105). For example, the selection function 121a sets the ROI by displaying the ROI acquired in step S102 on the display 17 and accepting an input operation from the user. Here, the selection function 121a may accept an operation of increasing or decreasing the number of ROIs or an operation of adjusting the position of the ROIs from the user. For example, the user adjusts the position of the ROI in consideration of the age, physique, and the like of the subject P. Further, the selection function 121a selects the weighting function corresponding to the ROI set in step S105 from the weighting functions acquired in step S102 as the weighting function used in step S110 described later.

If there is a past test for the subject P, the selection function 121a sets the ROI in consideration of the past test information. For example, if it is clear from the image information collected in the past examination that the subject P does not have the right lung, the selection function 121a corresponds to the right lung from the three ROIs acquired in step S102. Exclude ROI. Further, the selection function 121a may set the ROI according to the reception information when the subject P visits the hospital and the result of the hearing from the subject P, instead of the past examination information.

After setting the ROI, the selection function 121a selects a plurality of element trains in the ROI. For example, the selection function 121a intermittently selects a plurality of element sequences from the detection elements included in the ROI, as in the case shown in FIG. 5B. Further, when a plurality of ROIs are set, the selection function 121a selects a plurality of element trains for each ROI. The detection signal detected in the element train selected in step S105 will be used for AEC, not as image information.

Next, the X-ray control function 121d starts photographing and AEC (step S106).
Specifically, the X-ray control function 121d starts supplying a high voltage from the X-ray high voltage device 11 to the X-ray tube 13 to turn on the X-rays, and also starts various processes after step S107. ..

The acquisition function 121b acquires the detection signal of the element train in the ROI (step S107). Specifically, the acquisition function 121b acquires a detection signal pattern indicating a detection signal pattern for each element sequence. As for the detection signal pattern of each element sequence, the detection signal read from each element in the element sequence is associated with the position in the region of interest, similarly to the signal P (G2, 1) shown in FIG. 5B. It can be shown as a pattern. In other words, the detection signal pattern shows the change of the detection signal along the element sequence.

Next, the comparison function 121c compares the standard signal pattern acquired in step S102 with the detection signal pattern for each element sequence, and determines whether or not there is a difference (step S108). When there is a difference between the standard signal pattern and the detection signal pattern (affirmation in step S108), the comparison function 121c ignores the element sequence having the difference as an abnormal element sequence (step S109). On the other hand, when there is no difference between the standard signal pattern and the detection signal pattern (negation in step S108), the X-ray control function 121d applies a weighting function to each detection signal (step S110). If the abnormal element sequence is ignored in step S109, the X-ray control function 121d corrects the detection signal of the remaining element sequence (step S111). Next, the X-ray control function 121d performs the weighting process of step S110, and integrates each detection signal after the correction process of step S111 for each ROI (step S112). Next, the X-ray control function 121d determines whether or not there is a difference between the ROIs in the integrated value calculated in step S112 (step S113), and if there is a difference (step S113 affirmative), the abnormal ROI. Ignores the detection signal as (step S114). If the abnormal ROI detection signal is ignored in step S114, the X-ray control function 121d corrects the remaining ROI detection signal (step S115). Next, the X-ray control function 121d sums up all the ROI integrated values (step S116), determines whether or not it is above the threshold value (step S117), and if it is below the threshold value (step S117 negation), again. The process proceeds to step S107. On the other hand, when the ROI integrated value exceeds the threshold value (step S117 affirmative), the X-ray control function 121d ends the photographing (step S118) and starts the reading operation of the X-ray detector 15 (step S119). Further, the image generation function 192 generates an X-ray image based on the detection signal read in step S119, and the output function 193 displays the X-ray image on the display 17 (step S120).

Hereinafter, the details of the processing from step S108 to step S120 will be described with reference to FIGS. 7, 8A, and 8B. For example, when the three regions of interest R11, the region of interest R12, and the region of interest R13 of FIG. 7 are set, the selection function 121a selects a plurality of element sequences for each region of interest. For example, the selection function 121a selects three element sequences for the region of interest R13, as shown in FIG. 8A.

The acquisition function 121b acquires a detection signal pattern for each of the three element sequences. In FIG. 8A, the detection signal pattern is shown by a solid line graph. The horizontal axis of the graph indicates the lateral position coordinates in the region of interest R13, and the vertical axis indicates the intensity of the detection signal output from the detection element at each position.

The comparison function 121c compares the detected signal pattern and the standard signal pattern for each element sequence. In FIG. 8A, the standard signal pattern is shown by a broken line graph. Further, FIG. 8A shows a case where there is no difference between the detected signal pattern and the standard signal pattern in any of the three element sequences. That is, the case where there is no difference between the detected signal pattern and the standard signal pattern is not limited to the case where the detected signal pattern and the standard signal pattern exactly match, but also includes the case where they generally match. As an example, the comparison function 121c calculates KL divergence (Kullback-Leibler Divergence) between the detected signal pattern and the standard signal pattern, compares it with the threshold value, and if it does not exceed the threshold value, it is combined with the detected signal pattern. It is judged that there is no difference from the standard signal pattern.

The standard signal pattern is, for example, preset for each ROI and stored in the memory 122. For example, if the AEC was performed in the past using the same number and location of interest regions as in FIG. 7, and the X-rays were properly controlled by the AEC, the comparison function 121c is actually collected in the AEC. The detected signal pattern can be stored in the memory 122 as a standard signal pattern. Further, the standard signal pattern may be manually set by the user.

Next, the X-ray control function 121d applies a weighting function to each detection signal included in the detection signal pattern. In FIG. 8A, the weighted detection signal is shown by a thick line graph.

The weighting function is set so that the more effective the position, the larger the weight. For example, in the case shown in FIG. 7, the weighting function is set so that the closer to the heart, the smaller the weight. This is because the detection signal collected from the vicinity of the heart may be affected by the pulsation, and the detection signal collected at a position far from the heart is more reliable. Further, for example, the weighting function is set so that the weight becomes larger toward the center of the ROI. This is because, for example, in the region of interest R11 and the region of interest R13, the central portion is unlikely to overlap the bone and has high reliability. The weighting function may be automatically set by the X-ray control function 121d based on the past inspection, or may be set manually by the user.

Next, the X-ray control function 121d integrates the weighted detection signals for each element sequence. In the case shown in FIG. 8A, the X-ray control function 121d integrates the detection signals after being weighted for each of the three element sequences, and calculates the three integrated values. Further, the X-ray control function 121d integrates three element sequences. That is, as described in step S112 of FIG. 6, the X-ray control function 121d integrates each detection signal for each ROI and calculates the integrated value for each ROI.

Next, a case where there is a difference between the detected signal pattern and the standard signal pattern will be described with reference to FIG. 8B. FIG. 8B shows a case where there is a difference between the detection signal pattern of the upper element array and the standard signal pattern among the three element sequences selected for the region of interest R13. For example, the comparison function 121c can specify an element sequence having a difference between the detected signal pattern and the standard signal pattern by calculating the KL divergence between the detected signal pattern and the standard signal pattern and comparing it with the threshold value. can. In such a case, the X-ray control function 121d ignores the detection signal of the element sequence specified by the comparison function 121c as an abnormal element sequence, as described in step S109 of FIG. In other words, the X-ray control function 121d controls X-rays based on the detection signal detected in the element sequence excluding the element sequence specified by the comparison function 121c.

Next, the X-ray control function 121d applies a weighting function to each detection signal included in the detection signal pattern. In the case shown in FIG. 8B, the X-ray control function 121d applies a weighting function to each of the two element sequences excluding the element sequence specified by the comparison function 121c. Next, the X-ray control function 121d integrates the weighted detection signals for each element sequence. In the case shown in FIG. 8B, the X-ray control function 121d integrates the detection signals after being weighted for each of the two element sequences, and calculates the two integrated values.

Further, the X-ray control function 121d corrects the detection signal of the remaining element train as described in step S111 of FIG. That is, when calculating the integrated value for each ROI, the detection signals of the three element trains in the region of interest R13 are used in the case of FIG. 8A, whereas the two in the region of interest R13 in the case of FIG. 8B. Since only the detection signal of the element train is used, the integrated value is reduced to about "2/3". In order to compensate for such a decrease in the signal, the X-ray control function 121d corrects the detection signal of the remaining element sequence according to the number of ignored element sequences. For example, in the case shown in FIG. 8B, the X-ray control function 121d integrates two element sequences and multiplies the integrated value by "3/2". That is, as described in steps S111 and S112 of FIG. 6, the X-ray control function 121d corrects the detection signal and then integrates the signals to calculate the integrated value for each ROI.

Although the region of interest R13 has been described in FIGS. 8A and 8B, the X-ray control function 121d similarly calculates the integrated value for each ROI for the region of interest R11 and the region of interest R12. Further, as described in steps S113 to S115 of FIG. 6, after calculating the integrated value for each ROI, the X-ray control function 121d determines whether or not there is a difference between the ROIs, and if there is a difference, Ignores the abnormal ROI detection signal and corrects the remaining ROI detection signal. For example, the X-ray control function 121d compares the integrated values of the region of interest R11, the region of interest R12, and the region of interest R13, and determines the presence or absence of an abnormal ROI. For example, when the integrated value is the same between the region of interest R12 and the region of interest R13 and only the integrated value of the region of interest R11 is significantly different, the X-ray control function 121d integrates the region of interest R11. It is determined that the ROI is abnormal ROI that caused the difference in value, and the detection signals of the remaining region of interest R12 and region R13 are corrected. For example, when the region of interest R11 is ignored as an abnormal ROI, the X-ray control function 121d integrates the two element sequences and multiplies the integrated value by "3/2".

In FIGS. 8A and 8B, it is assumed that there is no abnormal ROI. In this case, the X-ray control function 121d integrates the three ROIs and compares them with the threshold value. That is, as described in step S116 and step S117 of FIG. 6, the X-ray control function 121d adds up all the ROI integrated values and compares them with the threshold value. Here, if the threshold value is exceeded, the X-ray control function 121d stops (ends) shooting.

On the other hand, as shown in FIG. 6, if the threshold value is not exceeded, the acquisition function 121b proceeds to step S107 again to acquire the detection signal. The detection signal acquired by shifting to step S107 again is used after being integrated with the detection signals acquired so far. For example, when the process proceeds to step S107 again, the acquisition function 121b integrates the detection signals for each detection element and reacquires the detection signal pattern for each element sequence. That is, as in the case shown in the lower figure of FIG. 5B, the detection signals are repeatedly collected and integrated until the threshold value is exceeded.

As described above, according to the first embodiment, the selection function 121a selects a plurality of element sequences in which the detection elements are arranged in a row from the detection elements included in the X-ray detector 15. The acquisition function 121b acquires a detection signal pattern indicating a detection signal pattern for each element sequence. The comparison function 121c compares the detected signal pattern and the standard signal pattern for each element sequence. The X-ray control function 121d controls X-rays based on the comparison result by the comparison function 121c and the detection signals detected in the plurality of element trains. Therefore, the X-ray imaging control device 12 according to the first embodiment can improve the accuracy of X-ray control without using the AEC detector.

Specifically, when the detection signal in the X-ray detector 15 is used for AEC, it is not possible to use a number of detection elements corresponding to the ROI of the AEC detector for AEC from the viewpoint of the image quality of the X-ray image and the calculation load. difficult. Further, when AEC is executed based on the detection results of a limited number of detection elements, the shooting time is affected by the position of the selected detection elements. On the other hand, the X-ray imaging control device 12 can appropriately control the imaging time by excluding the influence of the detection element whose position is not appropriate by comparing the detection signal pattern and the standard signal pattern at any time. In other words, the X-ray imaging control device 12 can improve the stability of the AEC by cutting the abnormal detection signal in real time.

Further, it is preferable that the determination of whether to continue or end the shooting is repeated in the shortest possible cycle. This makes it possible to control X-rays with high time accuracy and optimize the exposure dose of the subject P and the image quality of the X-ray image. On the other hand, the X-ray imaging control device 12 can cut an abnormal detection signal without adding a process having a large calculation load. That is, the X-ray imaging control device 12 can guarantee the time accuracy.

In particular, depending on the shooting method, the shooting time is extremely short, and even a slight difference in shooting time may cause a large change in the exposure dose and image quality. For example, when chest X-ray imaging is performed with the lung field as the imaging site, the imaging time is about 10 msec, and X-ray control in msec units is required. On the other hand, the X-ray imaging control device 12 can realize high time accuracy and appropriately control the imaging time.

Further, the X-ray imaging control device 12 realizes highly accurate AEC without using an AEC detector in addition to the X-ray diagnostic device 1. That is, the X-ray imaging control device 12 can reduce the cost for realizing AEC.

Further, the X-ray imaging control device 12 sets an area of interest at an arbitrary position on the detection surface of the X-ray detector 15. That is, the X-ray imaging control device 12 can optimize the region of interest for each imaging in consideration of the age, physique, and the like of the subject P. Therefore, the X-ray imaging control device 12 can further improve the accuracy of the X-ray control as compared with the case where the position of the region of interest is fixed.

Alternatively, the X-ray imaging control device 12 can adjust the region of interest during imaging. For example, the selection function 121a determines whether or not the ROI set in step S105 is appropriate based on the detection signal pattern first acquired in step S107 after the start of shooting, and corrects if it is not appropriate. To do. Further, the selection function 121a selects the element sequence again based on the corrected ROI. Then, when the transition from step S117 to step S107 is performed again, the acquisition function 121b acquires the detection signal pattern for the element sequence based on the corrected ROI.

In FIG. 6, a series of processes from step S107 to step S117 are described as looping until the threshold value is exceeded. That is, in FIG. 6, the detected signal pattern and the standard signal pattern are compared each time the loop is performed, and an abnormal element sequence is specified. Further, in FIG. 6, it is determined whether or not there is a difference between the ROIs for each loop, and an abnormal ROI is identified. However, the embodiment is not limited to this, and the identification of the abnormal element sequence or ROI may be performed only in the first loop.

Here, it is assumed that there are several factors that cause an abnormal element sequence and ROI. For example, a medical device is embedded at a position corresponding to the region R131 in FIG. 8B, and it is conceivable that a difference between the detected signal pattern and the standard signal pattern may occur due to this medical device. To give another example, it is conceivable that noise may occur due to a malfunction in the detection element at the position corresponding to the region R131 in the X-ray detector 15, and a difference between the detection signal pattern and the standard signal pattern may occur. ..

When an abnormal element sequence or ROI is generated due to a medical device embedded in the subject P, the abnormal element sequence or ROI is determined every time a series of processes from step S107 to step S117 are looped. There is little need to do. That is, it is appropriate to treat the element sequence or ROI once determined to be abnormal as an abnormal element sequence or ROI thereafter. Then, by omitting the determination of the abnormal element sequence and ROI, the X-ray imaging control device 12 can reduce the amount of calculation per loop. Specifically, when the X-ray imaging control device 12 performs the transition from step S117 to step S107 once, the element sequence and ROI once determined to be abnormal are still treated as abnormal, and steps S108 and step S108. The processing of S109, step S113, and step S114 may be omitted.

As described above, it is preferable that the determination of whether to continue or end the shooting is performed in the shortest possible cycle. Here, the X-ray imaging control device 12 reduces the amount of calculation by treating the element sequence or ROI once determined to be abnormal as an abnormal element sequence or ROI, and repeats the determination in step S117 in a short cycle. This can be done to improve the time accuracy of X-ray control.

On the other hand, when an abnormal element sequence or ROI is generated due to noise, it is preferable to determine the abnormal element sequence or ROI every time a series of processes from step S107 to step S117 are looped. This is because it is assumed that even if the element sequence or ROI is once determined to be abnormal, it will not be determined to be abnormal thereafter. Then, by re-determining the element sequence and ROI that have been once determined to be abnormal, the X-ray imaging control device 12 reduces the element sequence and ROI that are ignored as abnormal, and improves the accuracy of X-ray control. Can be made to. Further, the design can be simplified by unifying the processing contents between the first loop and the second and subsequent loops.

Further, in FIG. 6, it has been described that all the ROI integrated values are added up in step S116 and compared with the threshold value. However, the embodiment is not limited to this.

For example, in step S116, the X-ray control function 121d adds up all the ROI integrated values, divides them by the number of ROIs, and then compares them with the threshold value. That is, the X-ray control function 121d compares the average value of the ROI integrated values with the threshold value. In this case, the amount of calculation increases at the point where the step for calculating the average value is added, but the correction process in step S115 can be omitted, so that the process may be speeded up.

Alternatively, step S116 may be omitted. In this case, the X-ray control function 121d compares with the threshold value for each ROI and determines whether or not to end the photographing. For example, the X-ray control function 121d compares the integrated value and the threshold value in the region of interest R11, compares the integrated value and the threshold value in the region of interest R12, and compares the integrated value and the threshold value in the region of interest R13. Then, the X-ray control function 121d ends shooting when the integrated value exceeds the threshold value in any ROI or when the integrated value exceeds the threshold value in all ROIs. When comparing with the threshold value for each ROI, the amount of calculation increases because it is necessary to perform a plurality of processes according to the number of ROIs in parallel, but the process is faster because the summation process in step S116 can be omitted. There is a possibility of becoming.

Further, in FIG. 6, in step S112, the detection signal is described as being integrated for each ROI. However, the embodiment is not limited to this.

For example, in step S112, the X-ray control function 121d integrates the detection signals for each ROI and further divides by the number of detection elements. That is, the X-ray control function 121d calculates the average value of the detected signals for each ROI. In this case, the amount of calculation increases at the point where the step for calculating the average value is added, but the correction process in step S111 can be omitted, so that the process may be speeded up.

Alternatively, step S112 may be omitted. For example, the X-ray control function 121d may not compare the integrated value with the threshold value, but may compare the detected signal pattern with the threshold value in the same manner as shown in the lower figure of FIG. 5B. That is, the X-ray control function 121d may perform comparison with the threshold value for each detection element. Then, the X-ray control function 121d ends the photographing when the threshold value is exceeded in the ROI of the detection element or when the threshold value is exceeded in all the detection elements. When comparing with the threshold value for each detection element, the amount of calculation increases in that a plurality of processes according to the number of detection elements need to be performed in parallel, but the integration process in step S112 can be omitted. May speed up.

Further, in step S109 of FIG. 6, the abnormal element sequence is described as ignoring the entire element array. However, the embodiment is not limited to this. For example, the comparison function 121c identifies a portion of the element sequence in which there is a difference between the detected signal pattern and the standard signal pattern, which is the cause of the difference. For example, in the case shown in FIG. 8B, the comparison function 121c identifies the upper element sequence among the three element sequences selected for the region of interest R13 as an abnormal element sequence. Further, the comparison function 121c identifies a portion of the specified element sequence included in the region R131 as a portion that causes a difference between the detected signal pattern and the standard signal pattern. Then, the X-ray control function 121d controls X-rays based on the detection signal detected in the portion other than the portion specified by the comparison function 121c among the three element sequences selected for the region of interest R13. Do it.

Further, in the above-described embodiment, the region of interest is set on the detection surface of the X-ray detector 15, and a plurality of element sequences are selected from the detection elements included in the region of interest. However, the embodiment is not limited to this, and the step of setting the region of interest may be omitted. For example, the number and position of the element strings may be set in advance with respect to the imaging portion, and the selection function 121a may select a predetermined element sequence. Further, for example, the selection function 121a may select the element sequence according to the input operation from the user without setting the region of interest.

Further, in the above-described embodiment, the detection signal in the element sequence selected by the selection function 121a has been described as being used only for AEC, but it may be used as image information at the same time.

For example, while the X-ray is being irradiated, each detection element in the element sequence selected by the selection function 121a outputs a detection signal while retaining the accumulated charge. That is, the X-ray detector 15 performs non-destructive reading. Further, the acquisition function 121b acquires a detection signal pattern indicating a detection signal pattern for each element sequence. Further, the comparison function 121c compares the detected signal pattern and the standard signal pattern for each element sequence. Further, the X-ray control function 121d controls X-rays based on the comparison result by the comparison function 121c and the detection signals detected in the plurality of element trains. Further, the image generation function 192 reads a detection signal from all the detection elements of the X-ray detector 15 including the element sequence selected by the selection function 121a, and generates an X-ray image.

When non-destructive readout is performed, the image quality is not affected even if a large number of detection elements are used for AEC. However, since the calculation load related to AEC increases and the time accuracy decreases, the number of detection elements that can be used for AEC is limited. That is, the X-ray imaging control device 12 can improve the accuracy of X-ray control even when the non-destructive readable X-ray detector 15 is used.

Further, in the above-described embodiment, the case where the imaging site is the lung field has been described as an example, but the application can be similarly applied to other imaging sites. For example, in the case of a imaging site or the cervical spine, the selection function 121a sets the region of interest R21 shown in FIG. 9 and selects a plurality of element sequences from the detection elements included in the region of interest R21. Further, the acquisition function 121b acquires a detection signal pattern indicating a detection signal pattern for each element sequence. Further, the comparison function 121c compares the detected signal pattern and the standard signal pattern for each element sequence. Then, the X-ray control function 121d controls X-rays based on the comparison result by the comparison function 121c and the detection signals detected in the plurality of element trains. Even in the case shown in FIG. 9, the X-ray control function 121d may apply a weighting function to the detection signals detected in the plurality of element trains. For example, the weighting function is set so that the weight becomes larger toward the center of the ROI. This is because, for example, the peripheral portion of the region of interest R21 is more likely to deviate from the cervical spine, and the central portion is more reliable.

Further, in FIG. 1, an apparatus for photographing a standing subject P as an X-ray diagnostic apparatus 1 has been described, but the type of the X-ray diagnostic apparatus 1 is not particularly limited. For example, the X-ray diagnostic device 1 may be an X-ray angio device or a mammography device further provided with a C-arm for holding the X-ray tube 13 and the X-ray detector 15.

For example, when the X-ray diagnostic apparatus 1 is a mammography apparatus, it is possible to take an image of the breast of the subject P. In this case, the selection function 121a sets the region of interest R31 shown in FIG. 10 and selects a plurality of element trains from the detection elements included in the region of interest R31. Further, the acquisition function 121b acquires a detection signal pattern indicating a detection signal pattern for each element sequence. Further, the comparison function 121c compares the detected signal pattern and the standard signal pattern for each element sequence. Then, the X-ray control function 121d controls X-rays based on the comparison result by the comparison function 121c and the detection signals detected in the plurality of element trains. Even in the case shown in FIG. 10, the X-ray control function 121d may apply a weighting function to the detection signals detected in the plurality of element trains. For example, the weighting function is set so that the weight becomes larger toward the center of the ROI and becomes larger toward the chest wall side.

Although the element rows arranged in the horizontal direction are shown in FIGS. 7, 9 and 10, the direction of the element rows is not particularly limited. That is, the selection function 121a selects a plurality of element sequences in which the detection elements are arranged in a row along an arbitrary direction from the detection elements included in the X-ray detector 15.

Further, in the above-described embodiment, the imaging conditions such as the X-ray dose and the irradiation range have been described as being controlled by the control function 191. However, these imaging conditions may also be controlled by the X-ray imaging control device 12. For example, the X-ray control function 121d switches the X-ray on / off to control the shooting time, and also controls the operation of the X-ray high voltage device 11 and the X-ray diaphragm 14, so that the X-ray dose and irradiation can be performed. Control various shooting conditions such as range.

Further, in the above-described embodiment, the generation and display of the X-ray image have been described as being performed by the processing circuit 19, but the X-ray imaging control device 12 may be used. For example, the processing circuit 121 in the X-ray imaging control device 12 further has a function corresponding to the image generation function 192, and generates an X-ray image based on the detection signal output from each detection element of the X-ray detector 15. do. Further, for example, the processing circuit 121 in the X-ray imaging control device 12 further has a function corresponding to the output function 193, and displays an X-ray image on the display 17.

Further, in FIG. 1, the X-ray imaging control device 12 has been described as being included in the X-ray diagnostic device 1, but the embodiment is not limited to this. For example, the X-ray imaging control device 12 may be a separate device that can be connected to the X-ray diagnostic device 1.

The word "processor" used in the above description is, for example, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), an integrated circuit for a specific application (Application Specific Integrated Circuit: ASIC), a programmable logic device (for example, a simple programmable logic device). A circuit such as a logical device (Single Program Logic Device: SPLD), a composite programmable logic device (Complex Programmable Logic Device: CPLD), and a field programmable gate array (Field Programmable Gate Array: FPGA). When the processor is, for example, a CPU, the processor realizes a function by reading and executing a program stored in a storage circuit. On the other hand, when the processor is, for example, an ASIC, the function is directly incorporated as a logic circuit in the circuit of the processor instead of storing the program in the storage circuit. It should be noted that each processor of the embodiment is not limited to the case where each processor is configured as a single circuit, and a plurality of independent circuits may be combined to form one processor to realize its function. .. Further, a plurality of components in each figure may be integrated into one processor to realize the function.

Further, in FIG. 1, a single memory 18 has been described as storing a program corresponding to each processing function of the processing circuit 19. Further, in FIG. 2, it has been described that a single memory 122 stores a program corresponding to each processing function of the processing circuit 121. However, the embodiments are not limited to this. For example, a plurality of memories 18 may be distributed and arranged, and the processing circuit 19 may be configured to read a corresponding program from the individual memories 18. Similarly, a plurality of memories 122 may be distributed and arranged, and the processing circuit 121 may be configured to read a corresponding program from the individual memories 122. Further, instead of storing the program in the memory 18 or the memory 122, the program may be configured to be directly incorporated in the circuit of the processor. In this case, the processor realizes the function by reading and executing the program embedded in the circuit.

Each component of each device according to the above-described embodiment is a functional concept, and does not necessarily have to be physically configured as shown in the figure. That is, the specific form of distribution / integration of each device is not limited to the one shown in the figure, and all or part of them may be functionally or physically distributed / physically in arbitrary units according to various loads and usage conditions. Can be integrated and configured. Further, each processing function performed by each device may be realized by a CPU and a program analyzed and executed by the CPU, or may be realized as hardware by wired logic.

Further, the control method described in the above-described embodiment can be realized by executing a program prepared in advance on a computer such as a personal computer or a workstation. This program can be distributed via a network such as the Internet. Further, this program is recorded on a non-transient recording medium such as a hard disk, a flexible disk (FD), a CD-ROM, an MO, or a DVD that can be read by a computer, and is executed by being read from the recording medium by the computer. You can also do it.

According to at least one embodiment described above, the accuracy of X-ray control can be improved.

Although some embodiments have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other embodiments, and various omissions, replacements, changes, and combinations of embodiments can be made without departing from the gist of the invention. These embodiments and variations thereof are included in the scope of the invention described in the claims and the equivalent scope thereof, as are included in the scope and gist of the invention.

1 X-ray diagnostic device 12 X-ray imaging control device 121 Processing circuit 121a Selection function 121b Acquisition function 121c Comparison function 121d X-ray control function 13 X-ray tube 15 X-ray detector 19 Processing circuit 191 Control function 192 Image generation function 193 Output function

Claims (10)

An X-ray generation unit that generates X-rays, an X-ray detection unit in which detection elements that detect the X-rays and output a detection signal are arranged in a matrix, and an X-ray image is generated based on the detection signals. An X-ray imaging control device that controls X-ray imaging in an X-ray diagnostic apparatus equipped with an image generation unit.
A selection unit that selects a plurality of element sequences in which the detection elements are arranged in a row from the detection elements included in the X-ray detection unit.
An acquisition unit that acquires a detection signal pattern indicating the detection signal pattern for each element sequence, and
A comparison unit that compares the detected signal pattern and the standard signal pattern for each element sequence, and
An X-ray imaging control device including an X-ray control unit that controls X-rays based on a comparison result by the comparison unit and the detection signals detected in a plurality of the element trains. The X-ray control unit applies a weighting function to the detection signals detected in the plurality of element trains, and is based on the comparison result by the comparison unit and the detection signal after the weighting function is applied. The X-ray imaging control device according to claim 1, wherein the X-ray is controlled. The comparison unit identifies the element sequence having a difference between the detection signal pattern and the standard signal pattern.
The X-ray control unit according to claim 1 or 2, wherein the X-ray control unit controls the X-rays based on the detection signal detected in the element train excluding the element train specified by the comparison unit. Radiographic control device. The X-ray control unit performs correction processing for the detection signal detected in the element row excluding the element row specified by the comparison unit among the plurality of element rows, and the detection after the correction processing. The X-ray imaging control device according to claim 3, which controls the X-rays based on a signal. Any one of claims 1 to 4, wherein the selection unit sets an area of interest on the detection surface of the X-ray detection unit, and selects a plurality of the element trains from the detection elements included in the area of interest. The X-ray imaging control device according to item 1. The X-ray imaging control device according to claim 5, wherein the selection unit sets the region of interest in consideration of the past examination information of the subject. The X-ray imaging control device according to claim 5 or 6, wherein the selection unit sets a plurality of the regions of interest and selects a plurality of the element trains for each of the plurality of regions of interest. The X-ray control unit calculates an integrated value obtained by integrating the detection signals for each region of interest, compares the integrated values between the regions of interest, determines whether or not there is a difference, and there is a difference. In this case, the X-ray imaging control device according to claim 7, wherein the X-ray is controlled based on the detection signal detected in the region of interest excluding the region of interest that caused the difference. .. The X-ray control unit performs correction processing for the detection signal detected in the area of interest excluding the area of interest that causes the difference in the integrated value among the plurality of areas of interest, and the correction is performed. The X-ray imaging control device according to claim 8, which controls the X-rays based on the detected signal after processing. The X-ray imaging control device according to any one of claims 1 to 9, wherein the X-ray control unit controls switching on / off of the X-ray.

Images