JP2021148650A - Measurement system and measurement method - Google Patents

Abstract

To provide a measurement system and a measurement method that can perform required calibration with minimum frequency and time even when the number of single measurement devices and measurement paths increase.SOLUTION: A measurement system 1 has: a plurality of measuring instruments 30a, 30b and 30c; and a control device 10 that selectively drives the measuring instruments 30a, 30b and 30c, and performs measurement control regarding a test of a DEVICE UNDER TEST (DUT) 100. The control device 10 comprises: a temperature change detection unit 25 that detects a temperature change within a prescribed period of time of each of the measuring instruments 30a, 30b and 30c on the basis of detection outputs of temperature sensors 31a, 31b and 31c provided in the measuring instruments 30a, 30b and 30c; and a calibration control unit 26 that controls whether calibration accompanied by the temperature change for each of the measuring instruments 30a, 30b and 30c is performed on the basis of the temperature change of each of the measuring instruments 30a, 30b and 30c detected by the temperature change detection unit 25, and threshold temperatures set corresponding to the measuring instruments 30a, 30b and 30c respectively.SELECTED DRAWING: Figure 2

Description

The present invention relates to a measurement system and a measurement method having a plurality of unit measurement devices and having a function of calibrating the unit measurement device and the measurement path according to the temperature environment before measuring the object to be tested.

For example, in a mobile phone system, the wireless communication speed with a wireless base station (hereinafter referred to as a base station) has been increased due to the increasing number of functions of mobile terminals. In recent years, for example, the LTE-Advanced method has been used. Technological development is progressing to shift from 4G (4th generation) services that employ such services to 5G (5th generation) NR (New Radio) services.

As a measurement system for measuring a communication device that performs wireless communication with LTE or 5G NR communication standards, it has a plurality of single measurement devices, and an appropriate single measurement device and measurement path are selected according to the test item to be tested. Some have a system configuration for measuring an object. In addition, many such measurement systems have a function of calibrating the single measurement device according to, for example, a temperature environment, in order to prevent a decrease in measurement accuracy due to passing through a plurality of single measurement devices.

As a conventional measurement system of this type, for example, when calibrating each module or unit in consideration of the temperature environment or the like, a plurality of modules or units are arranged according to the order set by the self-diagnosis function (controller). A technique for proofreading or diagnosing the above is proposed in Patent Document 1 (paragraphs 0032 to 0035, see FIG. 2).

Japanese Unexamined Patent Publication No. 2008-304404

In the conventional system described in Patent Document 1, by changing the order of calibration or diagnosis, the calibration or diagnosis time can be shortened as compared with the case where the conventional system is executed in a predetermined order. However, in this conventional system, since it is premised that all calibrations or diagnoses are performed even if the order is changed, the effect of shortening the calibration or diagnosis time cannot be expected so much.

An example of this type of measurement system that takes a long time to calibrate is the RF conformance test system. The RF conformance test system supports a measurement method that drives a single measuring device in a combination corresponding to various test cases (TC) required for standard conformity testing of the object to be tested, and the number of TCs. As the number increases, a large number of unit measuring devices are required, so it may take a long time to calibrate all the unit measuring devices and measurement paths.

In the case of a system configuration that drives a single measurement device and a measurement path according to the TC, some TCs do not require calibration except for the single measurement device and the measurement path other than the single measurement device that carries out the TC. However, at present, in RF conformance test systems, etc., it is common to calibrate all unit measurement devices and measurement paths, and in the future, unit measurement devices will be based on more advanced measurements of the object to be tested. As the number of instruments and measurement paths is expected to increase (the system is expanded), there is concern that the calibration time will also increase.

The present invention has been made to solve such a conventional problem, and it is possible to carry out the necessary calibration with the minimum frequency and time even when the number of unit measuring devices and measuring paths increases. It is an object of the present invention to provide a measurement system and a measurement method capable of performing the measurement.

In order to solve the above problems, the measurement system according to claim 1 of the present invention selectively drives a plurality of unit measurement devices (30) and the unit measurement device when testing the object to be tested (100). A control unit (10) that controls the measurement of the object to be tested in relation to the test, and the control unit is used for the detection output of the temperature sensor (31) provided in each of the unit measuring devices. Based on this, the temperature change detecting means (25) for detecting the temperature change in the predetermined period of each unit measuring device, the temperature change of each unit measuring device detected by the temperature change detecting means, and the corresponding unit measuring device are supported. It is characterized in that each of the unit measuring devices is provided with a calibration control means (26) for controlling whether or not to perform calibration according to the temperature change based on the threshold temperature set for each.

With this configuration, the measurement system according to claim 1 of the present invention calibrates only the single measuring device whose temperature change exceeds the threshold temperature, and does not calibrate the single measuring device whose temperature change does not exceed the threshold temperature. Therefore, even when the system configuration is expanded, it is possible to always perform the necessary calibration with the minimum frequency and time while suppressing the increase in the frequency and time of calibration.

The measurement system according to claim 2 of the present invention has a first control table (28) in which the threshold temperature is set in association with each of the plurality of unit measuring devices, and the calibration control means is the unit. When the temperature change of the measuring device exceeds the threshold temperature set in the first control table, the calibration is performed on the single measuring device, and when the temperature change does not exceed the threshold temperature, the single measuring device is subjected to the calibration. The configuration may not perform the calibration.

With this configuration, the measurement system according to claim 2 of the present invention has a simple configuration in which a first control table is provided in addition to a temperature sensor for detecting the temperature of each unit measuring device, and unit measurement requiring calibration is required. Calibration can be performed only on the device to reduce the calibration time.

The measuring device according to claim 3 of the present invention has a unit measuring device and a route (paths A, B, C) to be calibrated in association with a plurality of test standards (TC1, TC2, TC3). The calibration control means further comprises 2 control tables (29), and the calibration control means accepts a measurement request in which one of the plurality of test standards is selectively designated and corresponds to the selected and designated test standard. Then, the single-unit measuring device and the path set in the second control table are specified, and among the specified single-unit measuring device and the path, the single-unit measuring device and the single-unit measuring device whose temperature change exceeds the threshold temperature. The unit measuring device that performs the calibration for the path and the temperature change does not exceed the threshold temperature, and the configuration that does not perform the calibration for the path may be used.

With this configuration, the measurement system according to claim 3 of the present invention can significantly reduce the frequency and time of calibration by performing or not performing calibration even by a route corresponding to TC (test standard). can.

The measurement system according to claim 4 of the present invention further has a third control table (29a) in which management information indicating whether or not it is susceptible to or less susceptible to temperature changes is set in association with the path. The calibration control means receives a measurement request selected and specified by one of the plurality of test standards, and is set in the second control table corresponding to the selected and specified test standard. The route is specified, and among the specified routes, the management information indicating that the third control table is susceptible to the temperature change is set, and the temperature change exceeds the threshold temperature. The calibration for the path for which the control information indicating that the temperature change does not exceed the threshold temperature and the third control table is less susceptible to the temperature change is set. The configuration may not perform calibration.

With this configuration, the measurement system according to claim 4 of the present invention is calibrated and not performed in the portion that is easily affected by the temperature change and the portion that is not easily affected by the temperature change even by the path corresponding to TC (test standard). As a result, the frequency and time of calibration can be significantly reduced.

The measurement system according to claim 5 of the present invention stores log information storage means (11b) for storing log information related to the calibration executed by the calibration control means and the log information stored in the log information storage means. The configuration may further include a display control means (24) to be displayed on the display unit (13).

With this configuration, the measurement system according to claim 5 of the present invention can easily confirm the frequency and time of calibration performed in the past while observing the log information displayed on the display unit.

In order to solve the above problems, the measuring method according to claim 6 of the present invention is a measuring method of the object to be tested (100) using the measuring system according to claim 1, wherein each unit measuring device is used. A detection step (S7) for detecting a temperature change in a predetermined period of each unit measuring device based on the detection output of the temperature sensor (31) provided in each of the above, and a temperature of each unit measuring device detected by the detection step. A calibration control step that controls whether or not to perform calibration with the temperature change for each unit measuring device based on the change and the threshold temperature set corresponding to each unit measuring device in the setting step. It is characterized by including (S10) and.

With this configuration, the measuring method according to claim 6 of the present invention calibrates only the single measuring device whose temperature change exceeds the threshold temperature, and does not calibrate the single measuring device whose temperature change does not exceed the threshold temperature. Therefore, even when the system configuration is expanded, it is possible to always perform the necessary calibration with the minimum frequency and time while suppressing the increase in the frequency and time of calibration.

In order to solve the above problems, the measuring method according to claim 7 of the present invention is a measuring method of the object to be tested (100) using the measuring system according to claim 3, and is a method of measuring the object to be tested (100). A specific step in which one of the standards accepts a selectively specified measurement request and identifies a unit measuring instrument and a route set in the second control table corresponding to the selected and specified test standard. (S25a), among the unit measuring instruments and paths specified in the specific step, the unit measuring device whose temperature change exceeds the threshold temperature, and the calibration for the path are executed, and the temperature change is the said. The configuration may include the unit measuring device that does not exceed the threshold temperature, and a calibration control step (S25b) that does not perform the calibration for the path.

With this configuration, the measurement method according to claim 7 of the present invention can significantly reduce the frequency and time of calibration by performing or not performing calibration even by a route corresponding to TC (test standard). can.

The present invention can provide a measurement system and a measurement method capable of performing necessary calibration with a minimum frequency and time even when the number of unit measuring devices and measurement paths increases.

It is an overall block diagram of the measurement system which concerns on 1st Embodiment of this invention. It is a block diagram which shows the functional structure of the control device in the measurement system which concerns on 1st Embodiment of this invention. It is a table diagram which shows an example of the calibration control table used in the measurement system which concerns on 1st Embodiment of this invention. It is a flowchart which shows the calibration control operation by the control device of the measurement system which concerns on 1st Embodiment of this invention. It is an overall block diagram of the measurement system which concerns on 2nd Embodiment of this invention. It is a table diagram which shows the structural example of the calibration control table used in the measurement system which concerns on 2nd Embodiment of this invention. It is a table diagram which shows the structural example of the calibration control table for TC used in the measurement system which concerns on 2nd Embodiment of this invention. It is a flowchart which shows the calibration control operation by the control device of the measurement system which concerns on 2nd Embodiment of this invention. It is an overall block diagram of the measurement system which concerns on 3rd Embodiment of this invention. It is a table diagram which shows the structural example of the temperature change influence management table used in the measurement system which concerns on 3rd Embodiment of this invention. It is a flowchart which shows the calibration control operation by the control device of the measurement system which concerns on 3rd Embodiment of this invention.

Hereinafter, embodiments of the measurement system and measurement method according to the present invention will be described with reference to the drawings.

(First Embodiment)
First, the configuration of the measurement system 1 according to the first embodiment of the present invention will be described with reference to FIGS. 1 to 3.

As shown in FIG. 1, the measurement system 1 according to the present embodiment includes a control device 10, a plurality of single measurement devices 30, and a signal unit 40. In the measurement system 1, the control device 10 is communicably connected to the plurality of single measurement devices 30 and the signal unit 40 via a network 15 such as Ethernet (registered trademark). The control device 10 comprehensively controls a plurality of single measuring devices 30 and a signal unit 40 via a network 15. Specifically, the control device 10 selectively drives the unit measuring device 30 according to the test type of the DUT 100, and controls the measurement related to the test type of the DUT 100.

The DUT 100 is a wireless terminal device such as a mobile phone that operates according to various communication standards such as LTE and 5G NR, and a network device such as a router, a switching hub, and a transmission device. The DUT 100 also includes devices such as ICs (integrated circuits) and optical modules of the above communication standards.

The plurality of unit measuring devices 30 measure the DUT 100 that operates according to various standards such as LTE and 5G NR under the control of the control device 10, and each has, for example, an individual measuring function. Examples of the unit measuring device 30 include a signal generator (SG: Signal Generator) that transmits a test signal to the DUT 100, and a signal analyzer (SA: Signal (Spectrum) Analyzer) that analyzes a signal to be measured transmitted from the DUT 100. ), A device in which a signal generator and a signal analysis device are integrated, and the like are used. More specific examples of the unit measuring device 30 include, for example, a W-CDMA signaling tester, a digital mobile radio transmission tester, an error rate measuring device, a synthesized signal generator, a vector signal generator (modulation interfering wave), and a vector. Examples include a signal generator (noise source) and a fading simulator.

FIG. 1 illustrates a configuration in which three measuring instruments 30a, 30b, and 30c are used as the single measuring device 30. However, in the present invention, the number of the unit measuring devices 30 is not limited to three, and the number may be larger or smaller than this.

In the measuring instruments 30a, 30b, 30c, respectively, the temperature sensors 31a, 31b, 31c (hereinafter, the temperature sensors 31a, 31b, 31c, ...) That detect the temperature of the own device may be collectively referred to as the temperature sensor 31. There is). In the measuring instruments 30a, 30b and 30c, it is desirable that the temperature detection target portion by the temperature sensors 31a, 31b and 31c is a portion most susceptible to temperature such as an ALC (automatic level control) unit. The detection outputs of the temperature sensors 31a, 31b, and 31c are transmitted to the control device 10 via the network 15 and used as control data when the measuring instruments 30a, 30b, and 30c are calibrated according to the temperature change.

The signal unit 40 is an interface function for transmitting and receiving RF signals to and from the DUT 100. Examples of the signal unit 40 include an RF switch driver unit, an RF interface unit, an RF combiner unit, a filter unit, and an RF switch unit. The signal unit 40 composed of these various units is selectively (or appropriately combined) driven according to the measurement conditions (test type) together with the plurality of measuring instruments 30a, 30b, and 30c described above.

Next, the configuration of the control device 10 will be described with reference to FIG. The control device 10 is composed of, for example, a computer device such as a personal computer (PC), and functions as a control PC that collectively controls the measuring instruments 30a, 30b, and 30c.

As shown in FIG. 2, the control device 10 includes a control unit 11, an operation unit 12, and a display unit 13. The control unit 11 includes a CPU 11a, a storage unit 11b, and an external interface (I / F) unit 11c. The CPU 11a, for example, executes a program stored in the storage unit 11b to execute a pseudo base station control unit 20, a setting control unit 21, a simulated communication control unit 22, a measurement control unit 23, a display control unit 24, and a temperature change detection. Each functional unit such as the unit 25, the calibration control unit 26, and the virtual connection destination 27 is realized.

The setting control unit 21 sets a scenario for measuring the DUT 100 (including a base station to be simulated and communicated), and performs various setting processes such as simulation parameters. The simulated communication control unit 22 simulates the communication between the measuring instruments 30a, 30b, 30c and the DUT 100 in which the combination for performing the simulated communication is set in advance according to the above scenario according to the simulation parameters. Is to be executed.

The measurement control unit 23 acquires signals transmitted and received between the measuring instruments 30a, 30b, 30c and the DUT 100 during the simulated communication operation, and controls the measurement unit to measure whether or not the DUT 100 operates normally. I do.

The display control unit 24 displays on the display unit 13 each information such as measurement-related information related to the measurement of the DUT 100 based on the signals transmitted and received between the measuring instruments 30a, 30b, 30c and the DUT 100 during the simulated communication operation. Implement control. As will be described later, the display control unit 24 may have a control function for displaying log information related to calibration on the display unit 13.

The temperature change detection unit 25 captures the detection outputs of the temperature sensors 31a, 31b, and 31c to detect the temperatures of the measuring instruments 30a, 30b, and 30c, and based on the detected temperature, each of the measuring instruments 30a, 30b, and 30c is preliminarily used. Control is performed to detect a temperature change in a set predetermined period. The temperature change detection unit 25 inputs the detection result (information indicating the temperature change for each of the measuring instruments 30a, 30b, 30c) to the calibration control unit 26.

The calibration control unit 26 controls the calibration of the measuring instruments 30a, 30b, and 30c. As control related to calibration, the calibration control unit 26 first receives input of each setting item that defines calibration control conditions from, for example, the operation unit 12, and the calibration control table 28 (which defines the calibration control conditions by each input setting item). (See FIG. 3) is set. Further, the calibration control unit 26 acquires information indicating the temperature change of the measuring instruments 30a, 30b, and 30c from the temperature change detecting unit 25, and the measuring instrument is based on the acquired information indicating the temperature change and the calibration control table 28. Control of calibration according to the temperature change for 30a, 30b, and 30c is performed.

The virtual connection destination 27 is a destination that is incorporated inside the control device 10 and can be connected to the DUT 100 under the control of the pseudo base station control unit 20, and includes a virtual base station, a virtual server, a virtual telephone device, a virtual network, and the like. .. The pseudo base station control unit 20 controls the simulated communication operation between the DUT 100 and the virtual connection destination 27 in order to execute a predetermined scenario and perform a communication operation test of the DUT 100. This control is performed by collectively controlling each unit of the setting control unit 21, the simulated communication control unit 22, the measurement control unit 23, the display control unit 24, and the display unit 13 based on the operation information in the operation unit 12. NS.

The storage unit 11b stores various information such as a program required for the CPU 11a to realize each of the above functional units and a calibration control table (see FIG. 3) required for controlling calibration of the measuring instruments 30a, 30b, and 30c. ..

The external interface (I / F) unit 11c serves as an interface function for connecting the control device 10 and the measuring instruments 30a, 30b, 30c or the signal unit 40 via the network 15. The interface function of the external I / F unit 11c also includes a function of sending the detection outputs of the temperature sensors 31a, 31b, and 31c provided in the measuring instruments 30a, 30b, and 30c to the control device 10 via the network 15. ..

The operation unit 12 is composed of, for example, an operation panel such as a switch or a button provided on the front surface of the housing of the control device 10. The operation unit 12 selectively selects various settings necessary for the communication operation test of the DUT 100, including instructions for starting and stopping the communication operation test of the DUT 100 and setting of various information necessary for performing a desired display on the display unit 13. It has a structure that can be executed.

The display unit 13 is composed of a display such as a liquid crystal panel, and displays various information such as test information related to the above-mentioned conformance test (transmission test, reception test, performance test, etc.).

As described above, the measurement system 1 according to the present embodiment is composed of a combination of a plurality of single measurement devices 30, system-dedicated products (signal unit 40, etc.), and various software, and conformance based on a standard such as 3GPP. A performance test system that automatically conducts tests is configured.

Further, the measurement system 1 according to the present embodiment has a function of calibrating the measuring instruments 30a, 30b, and 30c in response to, for example, a temperature change, prior to the conformance test. This calibration control is performed by the calibration control unit 26 provided in the CPU 11a of the control device 10, for example, based on the calibration control table 28 stored in advance in the storage unit 11b.

As shown in FIG. 3, the calibration control table 28 is associated with measuring instrument A (corresponding to measuring instrument 30a), measuring instrument B (corresponding to measuring instrument 30b), and measuring instrument C (corresponding to measuring instrument 30c). It stores data on calibration control conditions according to temperature changes. The calibration control table 28 is provided with columns for each setting item of "threshold value", "temperature change", and "calibration" corresponding to the measuring instruments A, B, and C, respectively. Among these setting items, in the "threshold value" column, the threshold temperature for determining whether or not to execute calibration is set corresponding to the measuring instruments A, B, and C, respectively. In the "Temperature change" column, the temperature changes of the measuring instruments A, B, and C (detected from the detection outputs of the temperature sensors 31a, 31b, and 31c) during the predetermined monitoring period set in advance are the measuring instruments A, It is set (registered) corresponding to B and C respectively. In the "Calibration" column, calibrate according to whether the amount of temperature change set in the "Temperature change" column exceeds the threshold temperature set in the "Threshold" column. The set values of "perform" indicating "do" or "do not perform" indicating that the calibration is not performed are set (registered) corresponding to the measuring instruments A, B, and C, respectively.

In the calibration control table 28 shown in FIG. 3, the threshold value is set to "5 ° C.", the temperature change is set to "+ 7 ° C.", and the calibration is set to "perform" for the measuring instrument A. The threshold value is set to "10 ° C", the temperature change is set to "+ 9 ° C", and the calibration is set to "do not perform". For the measuring instrument C, the threshold value is "10 ° C" and the temperature change is "+11". It indicates the state in which each set value of "° C" and "perform" for calibration is set.

The calibration control unit 26 is based on the amount of temperature change (width) of the measuring instruments A, B, C (measuring instruments 30a, 30b, 30c) detected by the temperature change detecting unit 25 in a predetermined period and the calibration control table 28. Of the measuring instruments 30a, 30b, and 30c, only those satisfying the calibration control conditions, that is, the conditions of the following equation (1) are controlled so as to perform calibration.
Threshold temperature <Temperature change amount ... (1)

Here, the calibration control of the measuring instruments 30a, 30b, and 30c will be described. In the measurement system 1 according to the present embodiment, the control device 10 can be set by switching between the measurement mode and the calibration mode. In the control device 10, the calibration control unit 26 monitors the temperature changes of the measuring instruments 30a, 30b, and 30c during the above-mentioned predetermined period (monitoring period), and the unit measurement in which the temperature change amount satisfies the calibration control condition. If there is a device 30, a calibration mode is set, and the unit measuring device 30 that satisfies the calibration control condition is calibrated.

When the mode shifts to the calibration mode, the calibration control unit 26 sends, for example, a calibration control signal to the signal unit 40 to transmit the calibration test signal to the DUT 100, while the calibration control unit 26 receives the calibration test signal. The unit measuring device 30 is controlled so as to measure the signal (calibration measured signal) transmitted by. Subsequently, the calibration control unit 26 compares the output signal of the unit measuring device 30 with the reference signal for calibration as a measurement result, and outputs the functional unit for transmission / reception of the unit measuring device 30 to match the reference signal. Control that adjusts so that a signal (measurement result) is obtained, that is, control of calibration is performed. After that, the calibration control unit 26 terminates the calibration mode and returns to the measurement mode when the output signal of the unit measuring device 30 matches the reference signal, and drives the plurality of unit measuring devices 30 to measure the DUT 100. Control to start.

In the calibration mode, as an element for adjusting the output signal so as to match the reference signal, various circuit parts composed of semiconductor parts, components (semiconductor parts) of the circuit parts, and the like can be mentioned. As an example of this type of semiconductor circuit, for example, there is an amplifier unit, a semiconductor type RF switch, and the like. Of these, in the amplifier section, if the amplification factor changes according to the temperature change and the path loss changes accordingly, the measurement accuracy is greatly affected. Therefore, in order to maintain the measurement accuracy, it is necessary to measure the path loss before shifting to the measurement mode (before the test) and adjust the path loss so that it corresponds to the reference signal. .. Such adjustment of the path loss (that is, control of calibration) can be realized by adjusting and controlling the amplification factor of the amplifier unit so that the path loss corresponding to the above-mentioned reference signal can be obtained, or by adding a correction to the measured value.

The control related to the above-mentioned calibration is not limited to the single measuring device 30, but the amplifier A (corresponding to the amplifier 33b), the amplifier B (corresponding to the amplifier 33c), etc. arranged in the measurement path (paths A, B, C) and the like. It is also necessary to carry out the electronic component 33 (see FIG. 9) of the above for each frequency using the reference signal. The reason why it is necessary to carry out for each frequency is that, for example, in the measurement of the DUT 100 in which the TC (test standard) described later is specified, the frequency required for each TC changes. Therefore, in the measurement system 1 according to the present embodiment, the path loss due to the temperature change of the path including the electronic component 33 is detected for each frequency using the reference signal, and each electron is canceled so as to cancel the path loss. Controls for adjusting the parameters of the component 33 and adding corrections to the measured values are performed for each frequency.

In order to realize the above-mentioned calibration control, the measurement system 1 according to the present embodiment monitors the temperature change of the unit measuring device 30 during a predetermined period (see “predetermined period” in S5 of FIG. 4), and monitors the temperature. The above-mentioned calibration is performed only for the unit measuring device 30 whose change exceeds the preset threshold temperature. In the measurement system 1 according to the present embodiment, the predetermined period may be a predetermined time (fixed time), or may be a fluid period such as an elapsed time from the previous calibration.

Next, the calibration control by the control device 10 of the measurement system 1 according to the present embodiment will be described with reference to the flowchart shown in FIG. In this control, the calibration control unit 26 first inputs a set value of "threshold value" among the setting items of "threshold value", "temperature change", and "calibration" in the calibration control table 28 (see FIG. 3). The calibration control table 28 is set to the initial state by accepting each of the measuring instruments A, B, and C and writing the input set value in the "threshold value" column for each of the measuring instruments A, B, and C (step S1). .. The input of the above set value can be performed, for example, by operating the operation unit 12.

When the measurement start request is received after the setting of the calibration control table 28 is completed (step S2), the control device 10 controls to start the measurement of the DUT 100 (step S3). Here, in the control device 10, the pseudo base station control unit 20 drives the measuring instruments 30a, 30b, and 30c via the network 15 to execute a simulated communication operation with the DUT 100. This simulated communication operation is performed based on a measurement parameter or the like preset by the setting control unit 21. During the simulated communication operation, the measurement control unit 23 sends out the test signal of the DUT 100 via the signal unit 40, while the measuring device transmits the test signal transmitted by the DUT 100 that has received the test signal via the signal unit 40. It is controlled so that the signals are received by 30a, 30b, and 30c and the signal is measured.

After the measurement of the DUT 100 is started, the control device 10 starts the control for calibration of the measuring devices 30a, 30b, and 30c. When this control is started, the temperature change detection unit 25 first detects the temperature of the measuring instruments 30a, 30b, 30c based on the detection outputs of the temperature sensors 31a, 31b, 31c, and the detected measuring instruments 30a, The temperatures of 30b and 30c are held in a predetermined area of the storage unit 11b (step S4).

Next, the temperature change detection unit 25 determines whether or not a predetermined predetermined period (period for monitoring the temperature change) has elapsed (step S5). Here, if it is determined that the predetermined period has not elapsed (NO in step S5), the temperature change detection unit 25 continues the progress monitoring process for the predetermined period in step S5. On the other hand, when it is determined that the predetermined period has elapsed (YES in step S5), the temperature change detection unit 25 determines the measuring instruments 30a, 30b, 30c based on the detection outputs of the temperature sensors 31a, 31b, 31c. (Step S6). Further, the temperature change detection unit 25 calculates the temperature change (changed temperature range) from the previous monitoring timing of the measuring instruments 30a, 30b, and 30c based on the measurement results in steps S4 and S6 (step S7). ).

Subsequently, the calibration control unit 26 updates the calibration control table 28 based on the value of the temperature change from the previous monitoring timing of the measuring instruments 30a, 30b, and 30c calculated in step S7 (step S8). Specifically, the calibration control unit 26 updates the calibration control table 28 so as to have the data contents shown in FIG. 3, for example. According to the example of FIG. 3, for the measuring instruments 30a, 30b, and 30c, the "temperature change" column is updated to the values of "+ 7 ° C", "+ 9 ° C", and "+ 11 ° C", respectively, and the "calibration" column. Has been updated to the values of "perform", "do not perform", and "perform" respectively.

Further, the calibration control unit 26 refers to the calibration control table 28 updated in step S8, and determines whether or not there is a single measuring device 30 that satisfies the calibration control condition (step S9). Specifically, in the calibration control table 28, the value in the "temperature change" column exceeds the set value in the "threshold" column, and the "calibration" column is the set value of "perform". It is determined whether or not the measuring device 30 exists.

If it is determined that the unit measuring device 30 satisfying the calibration control condition does not exist (NO in step S9), the calibration control unit 26 proceeds to step S11. On the other hand, when it is determined that the single measuring device 30 satisfying the calibration control condition exists (YES in step S9), the calibration control unit 26 calibrates the single measuring device 30 satisfying the calibration control condition. (Step S10), and then proceed to step S11.

In step S11, the calibration control unit 26 determines whether or not the measurement end request of the DUT 100 has been accepted. If it is determined that the measurement end request is not accepted (NO in step S11), the calibration control unit 26 repeatedly executes the processes from step S5 to step S11 at the predetermined period described above. On the other hand, when it is determined that the measurement end request has been accepted (YES in step S11), the calibration control unit 26 ends a series of controls related to the calibration shown in FIG.

In the series of controls described above, regarding the calibration control in step S10, during the period when the calibration control table 28 is in the set state of the data contents shown in FIG. 3, for example, the measuring instrument A (measuring instrument 30a) and the measurement. Calibration is performed on the instrument C (measuring instrument 30c). This is because, during the period, the measuring instrument A and the measuring instrument C have undergone a temperature change exceeding a preset threshold temperature. On the other hand, at this time, the measuring instrument B (measuring instrument 30b) in which the temperature change that does not exceed the preset threshold temperature is controlled so as not to be calibrated.

In the present embodiment, the control device 10 stores log information related to the calibration executed by the calibration control unit 26 in, for example, a storage unit 11b, and the user responds to a display request operation from, for example, the operation unit 12. The display control unit 24 may have a configuration in which a control function for reading the log information and displaying the log information on the display unit 13 is added. Such a configuration can be obtained in each of the following embodiments as well.

As described above, the measuring system 1 according to the first embodiment selectively drives the measuring instruments 30a, 30b, 30c as the single measuring device 30 and the measuring instruments 30a, 30b, 30c in the test of the DUT 100. It has a control device 10 that controls the DUT100 measurement related to the above test, and the control device 10 has the measurement devices 30a, 30b, respectively, based on the detection output of the temperature sensors 31 provided in the measurement devices 30a, 30b, 30c, respectively. Corresponds to the temperature change detection unit 25 that detects the temperature change in the predetermined period of 30c, the temperature change of each of the measuring instruments 30a, 30b, 30c detected by the temperature change detecting unit 25, and the measuring instruments 30a, 30b, 30c. A calibration control unit 26 for controlling whether or not to perform calibration according to a temperature change is provided for each of the measuring instruments 30a, 30b, and 30c based on the threshold temperature set respectively.

With this configuration, the measurement system 1 according to the first embodiment calibrates only the unit measuring device 30 in which the temperature change exceeds the threshold temperature, and calibrates the unit measuring device 30 in which the temperature change does not exceed the threshold temperature. Since it is not executed, the necessary calibration can always be performed with the minimum frequency and time while suppressing the increase in the frequency and time of calibration even when the system configuration is expanded.

Further, the measurement system 1 according to the first embodiment has a calibration control table 28 (see FIG. 3) in which a threshold temperature is set in association with the measuring instruments 30a, 30b, and 30c, respectively, and the calibration control unit 26 has a calibration control unit 26. If the temperature change of the measuring instruments 30a, 30b, 30c exceeds the threshold temperature set in the calibration control table 28, the calibration is performed for the measuring instruments 30a, 30b, 30c, and if the temperature does not exceed the threshold temperature, the calibration is performed. It has a configuration that does not calibrate the measuring instruments 30a, 30b, and 30c.

With this configuration, the measurement system 1 according to the first embodiment has a simple configuration in which a calibration control table 28 is provided in addition to the temperature sensor 31 that detects the temperature of each unit measuring device 30, and is a unit that requires calibration. Calibration can be performed only on the measuring device 30 to shorten the calibration time.

Further, the measurement system 1 according to the first embodiment displays the log information stored in the storage unit 11b and the storage unit 11b for storing the log information related to the calibration executed by the calibration control unit 26 on the display unit 13. It is configured to further include a display control unit 24. With this configuration, the measurement system 1 according to the first embodiment can easily confirm the frequency and time of calibration performed in the past while observing the log information displayed on the display unit 13.

The measurement method according to the first embodiment is a measurement method of the DUT 100 using the measurement system 1 having the above configuration, and is a detection output of the temperature sensor 31 provided in each of the measuring instruments 30a, 30b, and 30c, respectively. A detection step (S7) for detecting a temperature change in each of the measuring instruments 30a, 30b, 30c in a predetermined period based on the above, a temperature change of each measuring instrument 30a, 30b, 30c detected by the detection step, and each measuring instrument 30a. , A calibration control step (S10) for controlling whether or not to perform calibration according to a temperature change for each of the measuring instruments 30a, 30b, and 30c based on the threshold temperature set corresponding to each of the 30b and 30c. It is a configuration that includes.

With this configuration, in the measurement method according to the first embodiment, only the unit measuring device 30 whose temperature change exceeds the threshold temperature is calibrated, and the unit measuring device 30 whose temperature change does not exceed the threshold temperature is calibrated. Therefore, even if the system configuration is expanded, the necessary calibration can always be performed with the minimum frequency and time while suppressing the increase in the frequency and time of calibration.

(Second Embodiment)
Next, the configuration of the measurement system 1A according to the second embodiment of the present invention will be described with reference to FIGS. 5 to 7. The measurement system 1A according to the present embodiment has the configuration shown in FIG. 5 as a whole. In FIG. 5, the same functional unit as each functional unit in the measurement system 1 according to the first embodiment is designated by the same reference numeral.

As shown in FIG. 5, the measurement system 1A according to the present embodiment has measuring instruments 30d, 30e, and a changeover switch 41 as configurations that the measurement system 1 according to the first embodiment does not have. The measuring instruments 30d and 30e are provided with temperature sensors 31 (31b and 31e) for detecting their respective temperatures.

The measuring instrument 30d is a switching box for appropriately switching the measurement paths (hereinafter, paths) A, B, and C between the measuring instruments 30a, 30b, 30c and the measuring instrument 30e according to the test case (TC). It fulfills the function as.

Although the switching box that performs the path switching function according to the TC does not have the measuring functions such as the measuring instruments 30a, 30b, and 30c, the signal related to the measurement of the DUT 100 is transmitted and received, and the signal changes in temperature. In this embodiment, the same as the measuring instruments 30a, 30b, 30c, and 30e, from the viewpoints that the measurement accuracy is affected by the fluctuation depending on the measurement accuracy and that the calibration due to the temperature change is required to maintain the measurement accuracy. , Dare to classify as a measuring instrument that requires calibration due to temperature changes.

In the calibration of the measuring system 1A shown in FIG. 5, the path A includes the measuring instrument A, the measuring instrument E, and the connection path between the measuring instrument A and the measuring instrument E in the measuring instrument D. The path B includes the measuring instrument B, the measuring instrument E, and the connection path between the measuring instrument B and the measuring instrument E in the measuring instrument D. The path C includes a measuring instrument C, a measuring instrument E, and a connection path between the measuring instrument C and the measuring instrument E in the measuring instrument D.

The measuring instrument 30e receives the test signal transmitted by the DUT 100, which has received the test signal transmitted from the measuring instruments 30a, 30b, and 30c via the paths A, B, C, the changeover switch 41, and the signal unit 40, respectively. It has a measurement function for measuring the signal corresponding to the TC.

The changeover switch 41 is a functional unit that switches the connection between the paths A, B, and C and the measuring instrument 30e or the signal unit 40 under the control of the control device 10A. When, for example, the changeover switch 41 transmits a test signal or the like to the DUT 100, any of the paths A, B, and C is connected to the signal unit 40 according to the TC at that time, and the signal to the DUT 100 is transmitted. While forming a transmission path, when receiving a signal to be measured transmitted by the DUT 100 that has received a test signal or a noise signal, any of the paths A, B, and C is connected to the measuring device 30e to the DUT 100. Form a signal reception path.

Here, the relationship between TC and routes A, B, and C will be described. As is well known, the test of the DUT 100 is, for example, a normal test in a state where the signal used by the DUT 100 is generated, a test in a state where an interfering wave is generated for the signal used by the DUT 100, and a test with the DUT 100. A test to confirm whether the DUT 100 is outputting radio waves while transmitting and receiving signals between them, and a test to confirm whether the DUT 100 is outputting radio waves without transmitting and receiving signals to and from the DUT 100. Etc., it is carried out assuming an extremely large number of types of TC.

In the above test form, it is common that the unit measuring device 30 (measuring instruments 30a, 30b, 30c, 30d, 30e, etc.) used for each TC (test standard) is different. Therefore, in order to perform a test corresponding to all TCs, a route (paths A, B, C, etc.) via the unit measuring device 30 to be used is preliminarily set for the control device 10A corresponding to each TC. Must be set to. As a result, the control device 10A receives the measurement start request specifying the desired TC, establishes a route to and from the measuring device 30e via the single measuring device 30 corresponding to the TC at this time, and establishes the path of the DUT 100. It is possible to perform measurements corresponding to TC.

As described above, the measurement system 1A according to the present embodiment is premised on the configuration in which the TC is designated, the route via the unit measuring device 30 corresponding to the TC is established, and the DUT100 test is performed. Also, it can be carried out in TC units and for the unit measuring device 30 and the route.

The configuration of the control device 10A in the measurement system 1A is basically the same as that of the control device 10 (see FIG. 3) of the measurement system 1 according to the first embodiment. Therefore, the configuration shown in FIG. 3 shall be incorporated for the operation description of the calibration control by the control device 10A described below.

On the other hand, the control program (software) mounted on the control device 10A for performing calibration according to the temperature change is different from the measurement system 1 according to the first embodiment. In the measurement system 1A, the control device 10A implements a control program for calibrating the path and the single measurement device 30 in TC units (see FIG. 8).

In order to calibrate the unit measuring device 30 and the route in TC units by the above control program, in the measurement system 1A according to the present embodiment, for example, the calibration control table 28a shown in FIG. 6 and the calibration for TC shown in FIG. 7 are performed. It has a control table 29. The calibration control table 28a and the TC calibration control table 29 need to be stored (set) in advance in, for example, a storage unit 11b of the control device 10 before the start of the test (measurement) of the DUT 100 designated by TC.

The calibration control table 28a has the configuration shown in FIG. 6, for example, and the calibration control table 28 according to the first embodiment (FIG. 6) except that the calibration control conditions corresponding to the measuring instruments 30d and 30e are newly added. 3) is equivalent. Specifically, in the calibration control table 28a shown in FIG. 6, “7 ° C.” is set for the measuring instrument 30d and “8 ° C.” is set for the measuring instrument 30e as the “threshold value”. Further, in FIG. 6, in the calibration control table 28a, at a certain timing during the measurement of the DUT 100, the set values of the “temperature change” and “calibration” columns are set to (“+ 6 ° C.” and “implementation”, respectively. It is shown that the data contents can be updated to "No") and ("+ 9 ° C", "Implement").

As shown in FIG. 7, the TC calibration control table 29 is associated with a plurality of different TCs (TC1, TC2, TC3 in this example), and the unit measuring device 30 and the unit measuring device for carrying out the TC are associated with each other. Route information indicating the connection path between the 30s and the measurement path inside the single measuring device 30, and the need for calibration for each of the measuring instruments 30a, 30b, 30c, 30d, 30e, path A, path B, and path C in each measurement path. Information indicating no is set. The set value of the information indicating the necessity of calibration is "calibration" when calibration is required (when calibration is required), and is left blank when calibration is not required (when calibration is not required). It has become. As the set value of the information indicating the necessity of calibration, another set value different from "calibration" and the blank may be used as long as the necessity of calibration can be distinguished.

Specifically, in the TC calibration control table 29 shown in FIG. 7, it is set that the TC1 is calibrated for the measuring instruments 30a, 30d, 30e, and the path A. Further, for TC2, the measuring instruments 30b, 30d, 30e and the path B are set to be calibrated, and for TC3, the measuring instruments 30c, 30d, 30e and the path C are set to be calibrated. It has been done.

In the measurement system 1A having the above-described configuration, the control device 10A uses the calibration control table 28a and the TC calibration control table 29, and executes the calibration control according to the flowchart shown in FIG. 8 by the above control program.

When this calibration control is started, the control device 10A inputs the set value of the “threshold value” among the setting items in the calibration control table 28a (see FIG. 6) to the measuring instruments A, B, C, D, and so on. The calibration control table 28a is set by accepting each E and writing the input set value in the “threshold value” column for each of the measuring instruments A, B, C, D, and E (step S21). It should be noted that this "threshold value" does not have to be set every time the calibration control is executed unless the configuration of the measurement system 1A is changed. Further, the control device 10A is associated with, for example, three types of TC1, TC2, and TC3, and information indicating the necessity of calibration for each of the measuring instruments 30a, 30b, 30c, 30d, 30e, route A, route B, and route C. Is set, and for example, the TC calibration control table 29 having the data content as shown in FIG. 7 is set (step S21). If there is no change in the data content, the TC calibration control table 29 does not have to be set every time the calibration control is executed.

After the settings of the calibration control table 28a and the calibration control table 29 for TC are completed, when a measurement start request (measurement start request based on TC) specifying any one of TC1, TC2, and TC3 is accepted (step S22), The control device 10A controls to start the measurement of the DUT 100 based on the designated TC (step S23). At this time, in the pseudo base station control unit 20 of the control device 10A, the simulated communication control unit 22 selectively drives the measuring instruments 30a, 30d and the path A corresponding to the designated, for example, TC1, to simulate with the DUT 100. The communication operation is executed, and the measurement control unit 23 controls to start the measurement operation in which the signal transmitted by the DUT 100 is measured by the measuring device 30e during the simulated communication operation.

After the measurement of the DUT 100 based on, for example, TC1 in step S23 is started, the control device 10A starts the calibration control for the measuring instruments 30a, 30d, 30e, and the path A set corresponding to the TC1. The control for this calibration includes a control for updating the calibration control table 28a (step S24) and a calibration control for the measuring instruments 30a, 30d, and 30e based on the updated calibration control table 28a and the TC calibration control table 29 (step). S25) and is included.

The update control of the calibration control table 28a in step S24 is performed on the measuring instruments 30a, 30d, 30e, and the path A set corresponding to TC1, and is, for example, the same control as in steps S4 to S8 in FIG. Can be realized by. Specifically, the calibration control unit 26 cooperates with the temperature change detection unit 25 to update the calibration control table 28a so as to have the setting contents shown in FIG. 6, for example. According to the example of FIG. 6, for the measuring instruments 30a, 30d, and 30e set corresponding to TC1, the columns of "temperature change" are set to the values of "+ 7 ° C", "+ 6 ° C", and "+ 9 ° C", respectively. It has been updated, and the "Calibration" column has been updated to the values of "Perform", "Do not perform", and "Perform", respectively.

When the update control of the calibration control table 28a in step S24 is completed, the calibration control unit 26 then executes the calibration control based on the updated calibration control table 28a and the TC calibration control table 29 (step S25).

In the calibration control in step S25, the calibration control unit 26 first refers to the calibration control table 29 for TC, and the measuring instruments 30a, 30d, 30e, and the path A set corresponding to TC1 specified in step S22. (Step S25a).

Next, the calibration control unit 26 refers to the calibration control table 28a updated in step S24, and performs calibration for the measuring instruments 30a, 30d, 30e, and the path A specified in step S25a that satisfy the calibration control conditions. It is carried out (step S25b).

Here, in the calibration control table 28a, the calibration control unit 26 has a value in the "temperature change" column exceeding the set value in the "threshold value" column and a "calibration" column in the "calibration" column for the measuring instruments 30a, 30d, and 30e. It is determined whether or not the set value is "to carry out". Then, if it is the above set value, it is calibrated, and if it is not the above set value, it is controlled not to calibrate. As a specific example, when the calibration control table 28a is in the set state shown in FIG. 6, the calibration control unit 26 calibrates the measuring instrument 30a and the measuring instrument 30e, while calibrating the measuring instrument 30d. Control not to implement. At this time, as a result of calibrating the measuring instrument 30a and the measuring instrument 30e, the path A passing through them is also calibrated.

In the calibration control for the measuring instruments 30a, 30d, 30e, and the path A corresponding to TC1 in step S25b, the collection of the detection outputs of the temperature sensors 31a, 31d, 31e of the measuring instruments 30a, 30d, 30e is, for example, , It is designed to be carried out at the same interval (predetermined period) as in the first embodiment.

After executing the calibration control for the measuring instruments 30a, 30d, 30e, and the path A set corresponding to the TC1 in step S25b, the calibration control unit 26 subsequently accepts the measurement end request based on the TC1 of the DUT100. It is determined whether or not (step S26). If it is determined that the measurement end request is not accepted (NO in step S26), the calibration control unit 26 repeatedly executes the processes from step S24 to step S26 at the predetermined period described above. If it is determined that the measurement end request based on TC1 has been received during this period (YES in step S26), the calibration control unit 26 ends a series of controls related to calibration at the time of measurement based on TC shown in FIG.

In the series of controls shown in FIG. 8, even when the measurement start request based on TC2 or TC3 is received in step S22, the processing of steps S24, S25a and S25b is the case where the measurement start request based on TC1 is received. Proceed in the same way as. Then, in step S25b, the calibration control unit 26 sets the measuring instruments 30b, 30d, 30e corresponding to TC2, and the measuring instruments 30c, 30d, 30e, and the measuring instruments 30c, 30d, 30e set corresponding to the path B or TC3. Whether or not the path C (see FIG. 7) satisfies the calibration control condition is determined with reference to the calibration control table 28a.

Here, assuming that the calibration control table 28a is in the setting state shown in FIG. 6, in the step S25b, the calibration control unit 26 is among the measuring instruments 30b, 30d, 30e and the path B at the time of measurement based on TC2. Calibration is performed on the measuring instruments 30e in which the temperature change exceeding the preset threshold temperature occurs, and the calibration is not performed on the measuring instruments 30b and 30d in which the temperature change exceeding the threshold temperature does not occur. Further, the calibration control unit 26 calibrates the measuring instruments 30c, 30d, 30e, and the measuring instruments 30c, 30e in which the temperature changes exceeding the threshold temperature, among the measuring instruments 30c, 30d, 30e, and the path C, at the time of measurement based on TC3. , It is controlled not to perform the calibration for the measuring instrument 30d in which the temperature change exceeding the threshold temperature does not occur.

As described above, the measuring system 1A according to the second embodiment has the calibration control table 28 (see FIG. 6) and the measuring instruments 30a, 30b, 30c, which are to be calibrated in association with the plurality of TC1, TC2, TC3. It has a calibration control table 29 for TC (see FIG. 7) in which 30d, 30e and paths A, B, and C are set, and the calibration control unit 26 is selected by one TC among a plurality of TC1, TC2, and TC3. Of the measuring instruments 30a, 30b, 30c, 30d, 30e and the paths A, B, C set in the calibration control table 29 for TC corresponding to the selected and designated TC in response to the designated measurement request. Calibrate for measuring instruments such as 30a and 30e whose temperature change exceeds the threshold temperature and path A, and do not calibrate for measuring instruments such as 30d whose temperature change does not exceed the threshold temperature. It has become.

With this configuration, the measurement system 1A according to the second embodiment has an effect of temperature change in the paths A, B, and C corresponding to TC in addition to the action and effect of the measurement system 1 according to the first embodiment. It has the effect of being able to perform lean calibration considering whether it is easy to receive or difficult to receive.

(Third Embodiment)
Next, the configuration of the measurement system 1B according to the third embodiment of the present invention will be described with reference to FIGS. 9 and 10.

The measurement system 1B according to the present embodiment has the configuration shown in FIG. 9 as a whole. In FIG. 9, the same functional parts as the functional parts in the measurement system 1A according to the second embodiment are designated by the same reference numerals.

As an example of the measurement system 1B according to the present embodiment in FIG. 9, the path portions inside the measuring instrument 30d of the paths A, B, and C are the pattern filter 33a, the amplifier 33b (amplifier A), and the amplifier 33c (amplifier, respectively). The configuration including the electronic component 33 such as B) is shown.

Among these electronic components 33, the pattern filter 33a has a property of being less affected by temperature than the amplifiers 33b and 33c. Therefore, in the measurement system 1B, the pattern filter 33a is excluded from the target of calibration due to temperature change.

On the other hand, the amplifiers 33b and 33c are composed of, for example, a circuit (semiconductor circuit) using a semiconductor element, and have a property of being easily affected by a temperature change in terms of operating performance. Specifically, the amplification factor tends to fluctuate due to temperature changes, and when the amplification factor exceeds a certain level, the path loss of the paths A and B including the amplifiers 33b and 33c, respectively, is increased, which affects the measurement accuracy. May affect. Therefore, in the measurement system 1B, the amplifiers 33b and 33c are subject to calibration due to temperature changes, and temperature sensors 31f and 31g for detecting their respective temperatures are provided.

In the measurement system 1B (see FIG. 9) according to the present embodiment, the path A is a path including only the pattern filter 33a, the path B is a path including the amplifier 33b, and the path C is a path including the amplifier 33c. , Paths B and C are the same as the measurement system 1A (see FIG. 5) according to the second embodiment, except that the temperature sensors 31 (31f, 31g) for detecting the temperatures of the amplifiers 33b and 33c are provided. Is.

The configuration of the control device 10B in the measurement system 1B is basically the same as that of the control device 10 (see FIG. 3) of the measurement system 1 according to the first embodiment, as in the measurement system 1A according to the second embodiment. be. Therefore, the configuration shown in FIG. 3 shall be incorporated into the operation description of the calibration control by the control device 10B described below.

On the other hand, the control program (software) mounted on the control device 10B for performing calibration according to the temperature change is different from the measurement system 1A according to the second embodiment. In the measurement system 1B, the control device 10B separates the path in TC units and the calibration of the single measurement device 30 (see the second embodiment), and for the paths A, B, and C, the electronic components in the path. A control program is implemented to conditionally perform calibration in consideration of the influence of the temperature of 33, that is, when the threshold temperature is exceeded (see FIG. 11).

In order to conditionally calibrate the path on the premise that the path and the unit measuring device 30 are calibrated in TC units by the above control program, in the measurement system 1B, for example, the calibration control table 28a (FIG. In addition to the TC calibration control table 29 (see FIG. 7), the route calibration control table 29a shown in FIG. 10 is further provided. The calibration control table 28a, the TC calibration control table 29, and the route calibration control table 29a need to be stored in advance in the storage unit 11b of the control device 10B before the start of the test (measurement) of the DUT 100 designated by TC. be.

In the present embodiment, the calibration control table 28a and the TC calibration control table 29 may be the same as those used in the measurement system 1A according to the second embodiment (see FIGS. 6 and 7), respectively. can.

As shown in FIG. 10, for example, the path calibration control table 29a corresponds to the paths A, B, and C set in the TC calibration control table 29, and has "effect of temperature change", "threshold value", and so on. There are columns for each setting item of "temperature change" and "calibration". Of these setting items, in the "Effect of temperature change" column, it is set according to each of the paths A, B, and C whether the paths A, B, and C are susceptible to or not easily affected by the temperature change. Will be done. In the "threshold value" column, a threshold temperature for determining whether or not to execute calibration is set corresponding to the paths B and C, respectively. In the "Temperature change" column, the amount of temperature change of paths B and C (detected from the detection outputs of the temperature sensors 31f and 31g) during a predetermined monitoring period set in advance corresponds to the paths B and C, respectively. Is set. In the "Calibration" column, calibrate according to whether the amount of temperature change set in the "Temperature change" column exceeds the threshold temperature set in the "Threshold" column. The set values of "perform" indicating "do" or "do not perform" indicating that the calibration is not performed are set corresponding to the routes B and C, respectively.

Specifically, in the path calibration control table 29a shown in FIG. 10, regarding the path A, since the electronic component 33 constituting the path A is a pattern filter 33a that is not easily affected by the temperature change, "the influence of the temperature change". The column "" is set to "difficult to receive", and the columns "threshold", "temperature change" and "calibration" are set to not perform calibration (blank or "do not perform"). ing.

Further, in the path calibration control table 29a, with respect to the path B, since the electronic component 33 constituting the path B is an amplifier 33b which is easily affected by the temperature, the column "affected by the temperature change" is "susceptible". In the "threshold value" column, a specific threshold temperature of 5 ° C. is set.

Similarly, with respect to the path C, since the electronic component 33 constituting the path C is an amplifier 33c that is easily affected by temperature, the column of "effect of temperature change" is set to be "susceptible". In the "threshold value" column, a specific threshold temperature of 10 ° C. is set.

In the path calibration control table 29a, the set values in the "temperature change" and "calibration" columns corresponding to the paths B and C are sequentially updated during the measurement of the DUT 100 (see step S35 in FIG. 11). ). In the path calibration control table 29a, the set value in the "effect of temperature change" column set corresponding to the paths B and C shall be hereinafter referred to as management information for temperature change management.

In the measurement system 1B having the above-described configuration, the control device 10B uses the calibration control table 28a, the TC calibration control table 29, and the path calibration control table 29a, and is calibrated by the above control program according to the flowchart shown in FIG. Take control.

When this calibration control is started, the control device 10B first displays the calibration control table 28a (see FIG. 6), the TC calibration control table 29 (see FIG. 7), and the path calibration control table 29a (see FIG. 10). Control to set is performed (step S31). As the calibration control table 28a (see FIG. 6) and the TC calibration control table 29 (see FIG. 7), for example, those equivalent to the measurement system 1A according to the second embodiment can be used (step 8). See S21). Further, the control device 10B inputs the above-mentioned set values regarding the “effect of temperature change” and the “threshold value” corresponding to the paths A, B, and C, respectively, from the operation unit 12, for example, with respect to the path calibration control table 29a. By accepting and writing each of the input set values in the "effect of temperature change" column and the "threshold value" column of the paths A, B, and C, for example, the setting contents shown in FIG. 10 are set. If there is no change in the data contents, it is not necessary to set the calibration control table 28a, the TC calibration control table 29, and the path calibration control table 29a each time when the calibration control is executed.

After the settings of the calibration control table 28a, the TC calibration control table 29, and the path calibration control table 29a are completed, a measurement start request (measurement start request based on TC) specifying any one of TC1, TC2, and TC3 is made. Upon acceptance (step S32), the control device 10B controls to start the measurement of the DUT 100 based on the designated TC (step S33). At this time, in the pseudo base station control unit 20 of the control device 10B, the simulated communication control unit 22 selectively drives the measuring instruments 30a, 30d and the path A corresponding to the designated, for example, TC1, to simulate with the DUT 100. The communication operation is executed, and the measurement control unit 23 controls to start the measurement operation in which the signal transmitted by the DUT 100 is measured by the measuring device 30e during the simulated communication operation.

After the measurement of the DUT 100 based on the TC1 is started in step S33, the control device 10B starts the calibration control (step S34) for the measuring instruments 30a, 30d, 30e and the path A set corresponding to the TC1. do. The control for calibration (step S34) includes a control for updating the calibration control table 28a (step S35) and a calibration control for the unit measuring device 30 based on the updated calibration control table 28a and the TC calibration control table 29 (step S34). Step S36) and calibration control (step S37) for the path based on the path calibration control table 29a are included.

The update control of the calibration control table 28a in step S35 is performed on the measuring instruments 30a, 30d, and 30e set corresponding to TC1, and can be realized by, for example, the same control as in step S24 in FIG. Specifically, the calibration control unit 26 updates the calibration control table 28a so as to have the setting contents shown in FIG. 6, for example. According to the example of FIG. 6, for the measuring instruments 30a, 30d, and 30e set corresponding to TC1, the columns of "temperature change" are set to the values of "+ 7 ° C", "+ 6 ° C", and "+ 9 ° C", respectively. It has been updated, and the "Calibration" column has been updated to the values of "Perform", "Do not perform", and "Perform", respectively.

When the update control of the calibration control table 28a in step S35 is completed, the calibration control unit 26 then executes the calibration control for the unit measuring device 30 based on the updated calibration control table 28a and the TC calibration control table 29 (step S36). ).

The calibration control in step S36 includes steps S36a and S36b. First, in step S36a, the calibration control unit 26 refers to the TC calibration control table 29 and identifies the measuring instruments 30a, 30d, 30e, and the path A set corresponding to TC1 specified in step S32. (Step S36a).

Next, the calibration control unit 26 refers to the calibration control table 28a updated in step S35, and performs calibration for the measuring instruments 30a, 30d, and 30e identified in step S36a that satisfy the calibration control conditions ( Step S36b). Here, in the calibration control table 28a, the calibration control unit 26 has a value in the "temperature change" column exceeding the set value in the "threshold value" column and a "calibration" column in the "calibration" column for the measuring instruments 30a, 30d, and 30e. It is determined whether or not the set value is "to carry out". Then, if it is the above set value, it is calibrated, and if it is not the above set value, it is controlled not to calibrate. As a specific example, when the calibration control table 28a is in the set state shown in FIG. 6, the calibration control unit 26 calibrates the measuring instrument 30a and the measuring instrument 30e, while calibrating the measuring instrument 30d. Control not to implement.

Following the calibration control for the measuring device 30a and the measuring device 30e in step S36b, the calibration control unit 26 performs calibration control for the path based on the path calibration control table 29a (step S37).

Control of calibration for the path in step S37 includes steps S37a, S37b and S37c. As a result, in step S37a, the calibration control unit 26 first obtains the management information set corresponding to the path A specified in step S36a from the path calibration control table 29a (see the column of "effect of temperature change"). Acquire (step S37a). In the following step S37b, the calibration control unit 26 determines whether or not the path A is susceptible to the temperature change from the management information acquired in the step S37a (step S37b).

Here, when it is determined that the path A is not easily affected by the temperature change (NO in step S37b), the calibration control unit 26 proceeds to step S38. On the other hand, when it is determined that the path A is susceptible to the temperature change (YES in step S37b), in the subsequent step S37c, the calibration control unit 26 performs calibration for the path A (step S37c). As an example, here, the calibration control unit 26 controls the path A so that the path A is not calibrated when the path calibration control table 29a is in the set state shown in FIG. 10, for example.

After the control in step S37b is completed, the calibration control unit 26 proceeds to step S38. In the present embodiment, step S36b is followed by step S36b, and then step S37 is performed. However, step S36a may be followed by step S37 first, and then step S36b.

In step S38, the calibration control unit 26 determines whether or not the measurement end request based on the TC of the DUT 100 has been accepted. If it is determined that the measurement end request is not accepted (NO in step S38), the calibration control unit 26 repeatedly executes the processes from step S35 to step S38 at the predetermined period described above. If it is determined that the measurement end request has been received during this period (YES in step S38), the calibration control unit 26 ends a series of controls related to calibration shown in FIG.

According to the calibration control shown in FIG. 11, when the measurement start request based on TC1 is received in step S32, in step S36b, the measuring instrument A set in the TC calibration control table 29 corresponding to the TC1. , Measuring instrument D and measuring instrument E, the calibration is performed only for those whose setting value in the column of "calibration" of the calibration control table 28a is set to the value of "perform". Further, at this time, in step S39c, for the path A set in the TC calibration control table 29 corresponding to the TC1, the set value in the “effect of temperature change” column of the path calibration control table 29a. Is set to "difficult to receive" and is not calibrated.

Further, according to the calibration control shown in FIG. 11, when the measurement start request based on TC2 is received in step S32, in step S36b, the measuring instrument set in the TC calibration control table 29 corresponding to the TC2. Of B, measuring instrument D, and measuring instrument E, calibration is performed only for those in which the set value in the “calibration” column of the calibration control table 28a is set to the value of “perform”. Further, at this time, in step S37c, for the path B set in the TC calibration control table 29 corresponding to the TC2, the set value in the “effect of temperature change” column of the path calibration control table 29a. After confirming that is the setting value of "easy to receive", calibrate only when the setting value of the "calibration" column is the setting value of "perform", but in the "calibration" column If the set value is a set value of "do not perform", calibration is not performed. In the calibration here, the measured value is corrected instead of the control for adjusting the amplification factor of the amplifier A (amplifier 33b) in the path B so that a signal output matching the reference signal can be obtained and the adjustment of the amplification factor. Things will be carried out.

Similarly, when the measurement start request based on TC3 is received in step S32, in step S36b, among the measuring instruments C, measuring instruments D and E set in the TC calibration control table 29 corresponding to the TC3. Calibration is performed only for those in which the set value in the "calibration" column of the calibration control table 28a is set to the value of "perform". Further, at this time, in step S37c, for the path C set in the TC calibration control table 29 corresponding to the TC3, the set value in the “effect of temperature change” column of the path calibration control table 29a. After confirming that is the setting value of "easy to receive", calibrate only when the setting value of the "calibration" column is the setting value of "perform", but in the "calibration" column If the set value is a set value of "do not perform", calibration is not performed. In the calibration here, the measured value is corrected instead of the control for adjusting the amplification factor of the amplifier B (amplifier 33c) in the path C so that a signal output matching the reference signal can be obtained and the adjustment of the amplification factor. Things will be carried out.

As described above, the measuring system 1B according to the third embodiment has the temperature of the electronic components 33 (pattern filter 33a, amplifier 33b, amplifier 33c, etc.) constituting the single measuring device 30 (particularly, the measuring instrument 30d). A temperature sensor 31 (temperature sensor 31f, 31g) is attached to an electronic component 33 such as an amplifier 33b or an amplifier 33c, which is easily affected, and the temperature is monitored for each electronic component 33 unit based on the detection output of the temperature sensor 31, and the temperature is determined in advance. Only when the set threshold value is exceeded, the path including the electronic component 33 is calibrated.

Specifically, in the measurement system 1B according to the third embodiment, in addition to the calibration control table 28 (see FIG. 6), the measuring instruments 30a and 30b to be calibrated in association with a plurality of TC1, TC2 and TC3. , 30c, 30d, 30e and the TC calibration control table 29 (see FIG. 7) in which the paths A, B, and C are set, and the paths A, B, and C are easily affected or less susceptible to temperature changes. It further has a calibration control table 29a (see FIG. 10) for a route in which management information indicating the above is set.

Then, the calibration control unit 26 receives the measurement request selected and designated by one of the plurality of TC1, TC2, and TC3, and sets the TC calibration control table 29 in response to the selected and designated TC. Among the measuring instruments 30a, 30b, 30c, 30d, 30e and the paths A, B, C, the measuring instruments whose temperature change exceeds the threshold temperature, for example, 30b, 30c, 30d, 30e, and the calibration control table for the path. Management information indicating that the 29a is susceptible to temperature changes is set, and calibration is performed for the electronic component 33 in the path B (or the electronic component 33 in the path C) in which the temperature change exceeds the threshold temperature. , The measuring instrument 30a whose temperature change does not exceed the threshold temperature, and the path calibration control table 29a for which control information indicating that the temperature change is not easily affected is set. It is designed not to run.

With this configuration, the measurement system 1B according to the third embodiment is calibrated and not performed in the portion that is easily affected by the temperature change and the portion that is not easily affected by the paths A, B, and C corresponding to the TC. As a result, the frequency and time of calibration can be significantly reduced.

Further, the measurement system 1B according to the third embodiment has a path B in which management information indicating that it is easily affected by a temperature change is set, and the electronic component 33 in the path C is an amplifier 33b composed of a semiconductor element and an amplifier. 33c, the calibration control unit 26 is adapted to correct the measured value instead of adjusting the amplification factor of the amplifier 33b and the amplifier 33c and adjusting the amplification factor when performing the calibration.

With this configuration, the measurement system 1B according to the present embodiment has a structure in which amplifiers 33b and 33c that are easily affected by temperature changes are arranged in the paths B and C corresponding to TC, but the amplifiers 33b, High-precision calibration can be performed by adjusting the amplification factor of 33c or by adding a correction to the measured value instead of adjusting the amplification factor, and high-precision measurement of the DUT 100 can be performed.

Further, the measurement method according to the third embodiment is a measurement method of the DUT 100 using the measurement system 1B having the above configuration, and the measurement in which one TC among a plurality of TC1, TC2, and TC3 is selectively designated. A specific step of accepting the request and identifying the measuring instruments 30a, 30b, 30c, 30d, 30e and the paths A, B, C set in the TC calibration control table 29 corresponding to the selected and specified TC ( Of S36a), the measuring instruments 30a, 30b, 30c, 30d, 30e and the paths A, B, C specified in the specific step, the measuring instruments whose temperature change exceeds the threshold temperature, for example, 30b, 30c, 30d, 30e, And the electronic component 33 in the path B (or the electronic component 33 in the path C) in which the control information indicating that the path calibration control table 29a is susceptible to the temperature change is set and the temperature change exceeds the threshold temperature. ) Is executed, and the measuring instrument 30a whose temperature change does not exceed the threshold temperature and the path calibration control table 29a are set with management information indicating that they are not easily affected by the temperature change. The configuration includes a calibration control step (S36b, S37c) that does not perform calibration for the electronic component 33.

With this configuration, the measurement method according to the third embodiment calibrates the portion that is easily affected by the temperature change and the portion that is not easily affected by the temperature change depending on the path corresponding to the TC. The time can be significantly reduced.

In each of the first to third embodiments, examples in which the control devices 10, 10A, and 10B are configured by independent control PCs are given, but the present invention is not limited to this, and in the present invention, the control device 10, A control function unit having a control function equivalent to that of the 10A and 10B may be provided in the control unit of each unit measuring device 30.

As described above, the measurement system and measurement method according to the present invention have the effect that necessary calibration can be performed with the minimum frequency and time even when the number of single measurement devices and measurement paths increases. Measurement of communication terminals using LTE and NR wireless communication standards is performed using a plurality of single measurement devices, and all measurement systems and measurement methods have a function of calibrating the single measurement devices prior to measurement. It is useful for.

1,1A, 1B measurement system 10, 10A, 10B control device (control unit)
25 Temperature change detection unit (Temperature change detection means)
26 Calibration control unit (calibration control means)
28 Calibration control table (first control table)
29 TC calibration control table (second control table)
29a Path calibration control table (third control table)
30 Single measuring device 30a, 30b, 30c, 30d, 30e Measuring device (single measuring device)
31, 31a, 31b, 31c, 31d, 31e, 31f, 31g Temperature sensor 32a Path A (path)
32b Route B (Route)
32c Route C (Route)
33 Electronic components 33a Pattern filter (electronic components)
33b Amplifier A (electronic component)
33c Amplifier B (electronic component)
100 Object to be tested (DUT)
TC1, TC2, TC3 measurement standards

Claims (7)

Multiple single measuring devices (30) and
It has a control unit (10) that selectively drives the unit measuring device when testing the object to be tested (100) and controls the measurement of the object to be tested in relation to the test.
The control unit
A temperature change detecting means (25) for detecting a temperature change in a predetermined period of each unit measuring device based on a detection output of a temperature sensor (31) provided in each unit measuring device.
Based on the temperature change of each unit measuring device detected by the temperature change detecting means and the threshold temperature set corresponding to each unit measuring device, each unit measuring device is accompanied by the temperature change. A calibration control means (26) that controls whether or not to perform calibration, and
A measurement system characterized by being equipped with. It has a first control table (28) in which the threshold temperature is set in association with each of the plurality of single measuring devices.
When the temperature change of the single measuring device exceeds the threshold temperature set in the first control table, the calibration control means executes the calibration for the single measuring device and exceeds the threshold temperature. The measuring system according to claim 1, wherein the calibration is not performed on the single measuring device if there is no such device. A second control table (29) in which a single measuring device and a route (paths A, B, C) to be calibrated are set in association with a plurality of test standards (TC1, TC2, TC3).
Have more
The calibration control means receives a measurement request selected and specified by one of the plurality of test standards, and is set in the second control table corresponding to the selected and specified test standard. The unit measuring device and the path are specified, and among the specified unit measuring device and the path, the unit measuring device whose temperature change exceeds the threshold temperature and the calibration for the path are executed, and the temperature change is performed. The measuring system according to claim 2, wherein the unit measuring device does not exceed the threshold temperature, and the calibration is not performed on the path. A third control table (29a) in which management information indicating whether or not it is susceptible to temperature changes is set in association with the path.
Have more
The calibration control means receives a measurement request selected and specified by one of the plurality of test standards, and is set in the second control table corresponding to the selected and specified test standard. The route is specified, and among the specified routes, the management information indicating that the third control table is susceptible to the temperature change is set, and the temperature change exceeds the threshold temperature. The calibration for the path in which the temperature change does not exceed the threshold temperature and the management information indicating that the third control table is less susceptible to the temperature change is set. The measurement system according to claim 3, wherein no calibration is performed. A log information storage means (11b) for storing log information related to the calibration executed by the calibration control means, and a log information storage means (11b).
The measurement system according to any one of claims 1 to 4, further comprising a display control means (24) for displaying the log information stored in the log information storage means on the display unit (13). .. A method for measuring an object to be tested (100) using the measurement system according to claim 1.
A detection step (S7) for detecting a temperature change in a predetermined period of each unit measuring device based on the detection output of the temperature sensor (31) provided in each unit measuring device.
The temperature change for each unit measuring device is based on the temperature change of each unit measuring device detected by the detection step and the threshold temperature set corresponding to each unit measuring device in the setting step. A measurement method comprising a calibration control step (S10) for controlling whether or not to perform calibration according to the above. A method for measuring an object to be tested (100) using the measurement system according to claim 3.
One of the plurality of test standards accepts a selection-designated measurement request, and a unit measuring instrument and a route set in the second control table corresponding to the selection-designated test standard. Specific step (S25a) to identify
Among the unit measuring instruments and paths specified in the specific step, the unit measuring device whose temperature change exceeds the threshold temperature and the calibration for the path are executed, and the temperature change exceeds the threshold temperature. A measuring method comprising the single measuring device and a calibration control step (S25b) that does not perform the calibration for the path.

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