JP2021144490A - Setting support device - Google Patents

Abstract

To provide a technique capable of maintaining information in a high frequency band and improving resolution in a low frequency band in frequency response measurement.SOLUTION: A setting support device includes: an input signal generation unit that generates an input signal input to a device based on a set sampling period; a signal measurement unit that measures the input signal and an output signal from the device for the input signal at the sampling period; a frequency response calculation unit that calculates a frequency response of the device based on the input signal and the output signal; an application time setting unit that sets a first application time, which is the time to apply the input signal in first measurement, by setting a first sampling period for the first measurement, and sets a second application time, which is the time to apply the input signal in second measurement, by setting a second sampling period longer than the first sampling period for the second measurement; and a frequency response compositing unit that composites a first frequency response based on the first measurement and a second frequency response based on the second measurement and outputs a composite frequency response.SELECTED DRAWING: Figure 1

Description

The present invention relates to a setting support device.

In order to grasp the vibration characteristics and the like of a mechanical device to be controlled such as a servomotor, the frequency response of the mechanical device is measured. The frequency response is a change in the output signal from the device with respect to the input signal when an input signal containing a specific frequency component is given to a mechanical device or the like to be controlled. The frequency response is expressed as the gain (gain) of the output signal with respect to the input signal and the phase difference for each frequency.

Japanese Unexamined Patent Publication No. 2016-10287 JP-A-2017-167592

When measuring the frequency response of a device to be controlled using an input signal containing multiple frequency components, the shorter the cycle (sampling cycle) for sampling the output signal corresponding to the input signal given to the device to be controlled, the more the measurement. The upper limit of possible frequencies is higher. However, in many cases, the memory for temporarily storing the data of the input signal and the output signal has a limitation, and the number of data points to be acquired cannot be increased. Therefore, the shorter the sampling period, the lower the frequency resolution.

For example, considering the case of adjusting the notch filter based on the frequency response, it is necessary to confirm the response in the high frequency band where the resonance point appears, so that the sampling period needs to be shortened. However, if the sampling cycle is shortened, the frequency resolution is lowered, the response near the control band becomes unclear, and it becomes difficult to confirm the stability of the device. As a coping method, it is conceivable to sample at different sampling cycles in the low frequency band and the high frequency band and check the frequency response. However, when adjusting the gain while observing the frequency response, or when performing data processing such as simulation using the frequency response, the low frequency band and the high frequency band are included in one frequency response and are measured with a high SN ratio. It is desirable to have.

An object of the present invention is to provide a technique capable of improving the resolution of the low frequency band while maintaining the information of the high frequency band in the measurement of the frequency response.

The following means are adopted to solve the above problems.

That is, the setting support device according to the present invention is a setting support device that supports the setting of parameters that control the device, and is an input signal that generates an input signal input to the device based on a set sampling cycle. The generation unit, the signal measurement unit that measures the input signal generated by the input signal generation unit, and the output signal from the apparatus with respect to the input signal in the sampling cycle, and the signal measurement unit that measures the signal. In the first measurement, the frequency response calculation unit that calculates the frequency response of the device based on the input signal and the output signal, and the first sampling cycle for the first measurement by the signal measurement unit are set. In the second measurement, the first application time, which is the time for applying the input signal, is set, and the second sampling cycle larger than the first sampling cycle is set with respect to the second measurement by the signal measuring unit. An application time setting unit that sets a second application time, which is the time for applying the input signal, a first frequency response based on the first measurement by the signal measurement unit, and a second frequency based on the second measurement. It is characterized by including a frequency response synthesizing unit that synthesizes a response and outputs a synthesized frequency response. Further, the input signal may be characterized in that it is a sweep sine wave signal.

Further, the frequency response synthesis unit synthesizes a portion of the first frequency response having a predetermined frequency or higher and a portion of the second frequency response having a frequency lower than the predetermined frequency, and outputs the synthesized frequency response. It may be a feature.

According to the frequency response synthesizer, the first frequency response based on the measurement in the first sampling cycle and the second frequency response based on the measurement in the second sampling cycle larger than the first sampling cycle are combined to synthesize the frequency response. Is output. By performing the measurement in the second sampling cycle larger than the first sampling cycle, it is possible to improve the frequency resolution in the low frequency band while retaining the information in the high frequency band.

Further, the gain and phase difference of at least one of the first frequency response and the second frequency response are interpolated or thinned so that the frequency resolution of the first frequency response and the frequency resolution of the second frequency response match. May be characterized in that the data point adjusting unit for adjusting the number of data points of the gain and the phase difference is provided.

According to the data score adjusting unit, the frequency resolution of the synthesized frequency response after synthesis can be unified in the frequency domain in the synthesized frequency response.

Further, the data point adjusting unit may be characterized in that the data points having a gain and a phase difference of a predetermined frequency or less of the first frequency response and the second frequency response are deleted.

According to the data score adjusting unit, data in a low frequency band having a low SN ratio can be deleted.

Further, the data score adjusting unit adjusts the data score so that the gain of the combined frequency response after synthesis by the frequency response combining unit and the data score of the phase difference are raised to a power of 2. It may be a feature.

According to this configuration, by setting the number of data points of the composite frequency response after synthesis to the power of 2, the fast Fourier transform and the inverse fast Fourier transform can be applied to the composite frequency response. By applying the fast Fourier transform and the inverse fast Fourier transform, it is possible to reduce the calculation time by simulation or the like.

Further, the impulse response calculation unit that calculates the impulse response of the device from the combined frequency response synthesized by the frequency response synthesis unit, and the time response of the device to an arbitrary input signal are the impulse response and the arbitrary input signal. It may be characterized by including a time response calculation unit calculated by the convolution integration process of.

According to such a configuration, the accuracy of the time response can be improved by calculating the time response using the synthetic frequency response.

Further, the input is performed by using the simulation model generation unit that generates a simulation model that simulates the operation of the apparatus based on the combined frequency response synthesized by the frequency response synthesis unit, and the input signal and the simulation model. Based on a test operation instruction unit that simulates the operation of the device with respect to a signal input, a parameter adjustment unit that changes the set value of the parameter that controls the device when simulating the operation, and a result of simulating the operation. The performance index calculation unit that calculates the performance index for evaluating the control of the device for each set value of the parameter, and the performance index calculated by the performance index calculation unit and the set value of the parameter are displayed in association with each other. It may be characterized by having a display unit.

According to such a configuration, by generating the simulation model using the synthetic frequency response, the simulation model can be made highly accurate and the calculated performance index can be made highly accurate.

Further, it may be characterized by including a frequency response analysis unit that analyzes the first frequency response and calculates the second sampling period used in the second measurement.

According to the frequency response analysis unit, the second sampling period can be set according to the first frequency response.

Further, the frequency response analysis unit is also characterized in that the second sampling period is calculated based on the velocity proportional gain which is a parameter for controlling the apparatus and the number of sampling points of one measurement by the signal measurement unit. good.

According to such a configuration, the second sampling period can be determined based on the speed proportional gain and the number of sampling points in one measurement.

Further, the frequency response analysis unit may be characterized in that the second sampling period is determined based on the frequency at which the gain of the first frequency response is closest to -3 dB.

According to such a configuration, the second sampling period can be determined based on the control band of the device to be controlled.

Further, the frequency response analysis unit determines the frequency at which the frequency differential value of the gain of the first frequency response is closest to 0 in the frequency band higher than the frequency at which the gain of the first frequency response is closest to -3 dB. , The second sampling period may be determined based on the resonance frequency or the anti-resonance frequency, which is detected as the resonance frequency or the anti-resonance frequency.

According to such a configuration, the second sampling period can be determined based on the resonance frequency or the antiresonance frequency of the device to be controlled.

Further, the frequency response analysis unit determines the second sampling period based on the phase inversion frequency, with the frequency at which the phase difference of the first frequency response is closest to −180 ° as the phase inversion frequency. It may be a feature.

According to such a configuration, the second sampling period can be determined based on the phase inversion frequency.

Further, the application time setting unit is also characterized in that the user is made to select the upper limit frequency of the frequency band for increasing the frequency resolution, and the second sampling cycle is set based on the selected upper limit frequency. good.

According to such a configuration, the second sampling period can be determined based on the frequency of the upper limit of the frequency band that raises the frequency resolution selected by the user.

Further, the application time setting unit may be characterized in that the user is allowed to select the sampling cycle of the second measurement, and the selected sampling cycle is set as the second sampling cycle.

According to such a configuration, the user can directly set the second sampling period.

The aspect of disclosure may be realized by executing the program by an information processing device. That is, the structure of the disclosure can be specified as a program for causing the information processing apparatus to execute the process executed by each means in the above-described embodiment, or as a computer-readable recording medium on which the program is recorded. Further, the configuration of the disclosure may be specified by a method in which the information processing apparatus executes the processing executed by each of the above-mentioned means. The configuration of the disclosure may be specified as a system including an information processing device that performs processing executed by each of the above means.

According to the present invention, in the measurement of the frequency response, the resolution of the low frequency band can be improved while maintaining the information of the high frequency band.

FIG. 1 is a diagram showing a configuration example of the control system of the embodiment. FIG. 2 is a diagram showing an example of a functional block of the setting device 100. FIG. 3 is a diagram showing an example of an operation flow of frequency response synthesis in the setting device. FIG. 4 is a diagram showing an example of a first frequency response based on the first measurement of the signal measuring unit 102. FIG. 5 is a diagram showing an example of a second frequency response based on the second measurement of the signal measuring unit 102. FIG. 6 is a diagram showing a specific example of the synthesized frequency response synthesized by the frequency response synthesis unit 105. FIG. 7 is a diagram showing an example of the combined frequency response when the frequency responses of FIGS. 4 and 5 are combined with the boundary frequency f = 250 Hz. FIG. 8 is a diagram showing an example in which the frequency resolution of the first frequency response of FIG. 4 is set to 0.244 Hz and the frequency resolution of the first frequency response of FIG. 4 is combined with the second frequency response of FIG. FIG. 9 is a diagram showing an example of synthesis in which the frequency resolution of the frequency response of FIGS. 4 and 5 is 0.488 Hz. FIG. 10 is a diagram showing an example of an operation flow of a simulation of the operation of the device to be controlled. FIG. 11 is a diagram showing a display example of a performance index displayed on the display unit 114 based on the first frequency response. FIG. 12 is a diagram showing a display example of a performance index displayed on the display unit 114 based on the combined frequency response obtained by combining the first frequency response and the second frequency response. FIG. 13 is a diagram showing an example of designation of the frequency domain.

Hereinafter, embodiments will be described with reference to the drawings. The configuration of the embodiment is an example, and the configuration of the invention is not limited to the specific configuration of the disclosed embodiment. In carrying out the invention, a specific configuration according to the embodiment may be appropriately adopted.

[Embodiment]
(Configuration example)
FIG. 1 is a diagram showing a configuration example of the control system of the present embodiment. The control system 10 of the present embodiment includes a setting device 100, a servo driver 200, a motor 300, and a load device 400. The setting device 100 adjusts and controls the servo driver 200. The setting device 100 measures the response state of the servo driver 200, presents the response state of the servo driver 200 to the user, and the user gives the servo driver control parameters (position gain, speed gain, filter cutoff frequency, etc.). Accepts the settings of. Further, the setting device 100 executes the simulation of the servo driver 200, presents the simulation result to the user, and receives the control parameter of the servo driver from the user. The servo driver 200 controls the motor 300 based on the set control parameters. The motor 300 drives the load device 400. The load device 400 is, for example, various mechanical devices. The motor 300 and the load device 400 are referred to as devices to be controlled. The setting device 100 is an example of a setting support device.

The setting device 100 is a device for setting the control parameters of the servo driver 200, and includes adjustment software. The setting device 100 adjusts the setting parameters of the servo driver 200 so that the response state of the servo driver 200 is optimized by using the adjustment software. The adjustment software has a function of measuring the response state of the servo driver 200 and a function of simulating the response of the servo driver 200. The setting device 100 is realized by a computer having an arithmetic unit, a memory, or the like, and the computer functions as the setting device 100 by executing a program (adjustment software) stored in the computer. Further, the setting device 100 has a function of simulating the response of the device to be controlled by the servo driver 200 by the adjustment software. With this simulation function, the setting device 100 can calculate the response of the device to be controlled when a predetermined control parameter is set in the servo driver 200.

The user sets and adjusts the control parameters of the servo driver 200 by using the setting device 100. The user sets the control parameters of the servo driver 200 by using the adjustment software that operates in the setting device 100, and adjusts the response state of the servo driver 200 so as to be optimum. The user confirms the response status of the device to be controlled and adjusts the control parameters by using the measurement result of the frequency response, the simulation result, and the like.

The servo driver 200 drives the motor 300 and operates the load device 400 according to the control parameters set and adjusted by the setting device 100. The servo driver 200 is connected to the setting device 100 and the motor 300 so as to be able to communicate with each other by wire or wirelessly.

FIG. 2 is a diagram showing an example of a functional block of the setting device 100. The setting device 100 includes an input signal generation unit 101, a signal measurement unit 102, a frequency response calculation unit 103, an application time setting unit 104, a frequency response synthesis unit 105, and a data score adjustment unit 106. Further, the setting device 100 includes an impulse response calculation unit 107, a time response calculation unit 108, a simulation model generation unit 109, a test operation instruction unit 110, a parameter adjustment unit 111, a performance index calculation unit 112, a frequency response analysis unit 113, and a display unit. Includes 114.

The input signal generation unit 101 generates an input signal for measuring the frequency response of the device to be controlled. A Swept Sine signal (swept sine wave signal) is used as the input signal. The input signal is input to the motor 300 via the servo driver 200. The input signal is a control parameter (speed proportional gain, speed integral gain, etc.) that controls the device to be controlled.
It may be set by the position-proportional gain, the cutoff frequency of the low-pass filter, etc.). A random signal or the like may be used as the input signal.

The swept sign signal x (t) is expressed, for example, as x (t) = sin (2π × fs × L × exp (t / L)) and L = T / (ln (fe / fs)). Here, fs is the initial frequency, fe is the final frequency, and T is the length of the swept sign signal (signal application time).

The signal measuring unit 102 measures the input signal input to the device to be controlled and the output signal from the device for the input signal. At the time of measurement, the signal measurement unit 102 acquires data of a predetermined number of sampling points in a designated sampling cycle. Here, the number of sampling points is twice the number of data points for removing aliasing noise. Further, it is assumed that the number of sampling points in one measurement is constant.

The frequency response calculation unit 103 calculates the frequency response of the device based on the input signal and the output signal measured by the signal measurement unit 102. The frequency response P (complex number array) is calculated as P = O / I from the complex number array I in which the input signal is Fourier transformed and the complex number array O in which the output signal is Fourier transformed. The frequency response P is also referred to as a frequency response function. The frequency response is expressed as the gain (gain) of the output signal with respect to the input signal and the phase difference for each frequency. That is, the frequency response is expressed as a gain as a function of frequency and a phase difference as a function of frequency.

The application time setting unit 104 sets the application time of the input signal by setting the sampling period for the measurement by the signal measurement unit 102. The sampling period and application time are set for each measurement. The application time is calculated by multiplying the sampling period by the number of sampling points. The application time setting unit 104 may cause the user to input the upper limit frequency of the frequency band for increasing the frequency resolution, set the second sampling cycle based on the input upper limit frequency, and set the application time. .. The application time setting unit 104 causes the user to select the sampling cycle of the second measurement, sets the selected sampling cycle as the second sampling cycle, and sets the second application time, which is the application time of the second measurement. You may. Further, the application time setting unit 104 may set the application time using the sampling period calculated by the frequency response analysis unit 113 or the like as the sampling period for the measurement.

The frequency response synthesis unit 105 synthesizes frequency responses based on a plurality of measurements by the signal measurement unit 102, and outputs the combined frequency response. The frequency response synthesis unit 105 is, for example, among a portion of the first frequency response based on the first measurement by the signal measurement unit 102 and above a predetermined frequency and a second frequency response based on the second measurement by the signal measurement unit 102. The combined frequency response is output by synthesizing the portion below the predetermined frequency.

The data score adjusting unit 106 adjusts the number of data points of the gain and phase difference of the frequency response by interpolating or thinning out the gain and phase difference of at least one of the frequency responses based on the measurement by the signal measuring unit 102.

The impulse response calculation unit 107 calculates the impulse response of the device from the combined frequency response synthesized by the frequency response synthesis unit 105.

The time response calculation unit 108 calculates the time response of the device to an arbitrary input signal by the convolution integration process of the impulse response and the input signal.

The simulation model generation unit 109 generates a simulation model that simulates the operation of the apparatus based on the combined frequency response synthesized by the frequency response synthesis unit 105.

The test operation instruction unit 110 uses the input signal and the simulation model to simulate the operation of the device to be controlled with respect to the input of the input signal.

The parameter adjustment unit 111 changes the set value of the parameter that controls the device to be controlled when simulating the operation.

The performance index calculation unit 112 calculates a performance index for evaluating the control of the device to be controlled for each parameter set value based on the result of simulating the operation. The performance index is an index showing responsiveness such as control stability and settling time.

The frequency response analysis unit 113 analyzes the first frequency response based on the first measurement, and calculates the second sampling period set at the time of the second measurement. Further, the frequency response analysis unit 113 calculates the second sampling cycle based on the velocity proportional gain, which is a parameter for controlling the device, and the number of sampling points of one measurement by the signal measurement unit 102. Further, the frequency response analysis unit 113 determines the second sampling period based on the phase inversion frequency, with the frequency at which the phase difference of the first frequency response is closest to −180 ° as the phase inversion frequency.

The display unit 114 associates the frequency response calculated by the frequency response calculation unit 103, the combined frequency response synthesized by the frequency response synthesis unit 105, the performance index calculated by the performance index calculation unit 112, and the set value of the parameter. Display figures and the like. The display unit 114 is realized by a display device such as a liquid crystal display. The display unit 114 does not have to be built in the setting device 100, and may be realized by a display device connected to the setting device 100.

The input unit 115 receives input of information (such as a set value of a control parameter) used by the setting device 100. The input unit 115 is realized by an input device such as a keyboard, a pointing device, and a touch panel. The input unit 115 does not have to be built in the setting device 100, and may be realized by an input device connected to the setting device 100.

(Operation example of frequency response synthesis)
FIG. 3 is a diagram showing an example of an operation flow of frequency response synthesis in the setting device 100. The setting device 100 generates an input signal for measuring the frequency response of the device to be controlled, inputs the input signal to the servo driver 200, and receives the response of the input signal input from the servo driver 200 to the device to be controlled. Measure an output signal. The setting device 100 changes the sampling cycle and performs measurement a plurality of times. The setting device 100 calculates and synthesizes the frequency response of the device to be controlled based on the measurement result.

In S101, the input signal generation unit 101 of the setting device 100 generates an input signal for the first measurement for measuring the frequency response of the device to be controlled. The input signal for the first measurement is a swept sign signal. The start frequency fs of the swept sign signal is (1 / first sampling period) × (1 / number of sampling points), and the final frequency fe is (1 / first sampling period) × (1/2). The first sampling cycle is a sampling cycle for the first measurement set by the application time setting unit 104. The input signal for the first measurement includes a plurality of frequency components depending on the measurement conditions. Here, for example, assuming that the first sampling period is 125 μs and the number of sampling points is 4096, fs = 1.9351 Hz and fe = 4000 Hz.

In S102, the setting device 100 makes the first measurement. The input signal generation unit 101 inputs the input signal generated in S101 to the servo driver 200. Further, the signal measuring unit 102 measures the input signal in the first sampling cycle for the first measurement set by the application time setting unit 104. The servo driver 200 to which the input signal is input inputs the input signal to the device to be controlled. Further, the servo driver 200 acquires an output signal, which is a response to the input signal, from the device to be controlled. The servo driver 200 outputs the acquired output signal to the setting device 100. The signal measuring unit 102 measures the output signal from the servo driver 200 in the first sampling cycle.

In S103, the input signal generation unit 101 of the setting device 100 generates an input signal for a second measurement for measuring the frequency response of the device to be controlled. The input signal for the second measurement is a swept sign signal. The start frequency fs of the swept sign signal is (1 / sampling period) × (1 / number of sampling points), and the final frequency fe is (1 / second sampling period) × (1/2). The second sampling cycle is a sampling cycle for the second measurement set by the application time setting unit 104. The input signal for the second measurement includes a plurality of frequency components depending on the measurement conditions. Here, for example, assuming that the second sampling period is 1000 μs and the number of sampling points is 4096, fs = 0.2441 Hz and fe = 500 Hz.

In S104, the setting device 100 makes a second measurement. The input signal generation unit 101 inputs the input signal generated in S103 to the servo driver 200. Further, the signal measuring unit 102 measures the input signal in the second sampling cycle for the second measurement set by the application time setting unit 104. The second sampling cycle is different from the first sampling cycle. The second sampling cycle is larger than the first sampling cycle. The servo driver 200 to which the input signal is input inputs the input signal to the device to be controlled. Further, the servo driver 200 acquires an output signal, which is a response to the input signal, from the device to be controlled. The servo driver 200 outputs the acquired output signal to the setting device 100. The signal measuring unit 102 measures the output signal from the servo driver 200 in the second sampling cycle.

Here, the number of sampling points for sampling in one measurement by the signal measuring unit 102 is predetermined. That is, the number of sampling points in the first measurement and the number of sampling points in the second measurement are the same. Therefore, the shorter the sampling cycle, the shorter the signal sampling time (measurement time) in the signal measurement unit 102. Therefore, the shorter the sampling time, the higher the frequency response in the high frequency range can be obtained, but the lower the frequency resolution in the low frequency range becomes coarser. That is, since the second sampling cycle is larger than the first sampling cycle, the frequency resolution of the low frequency band is higher in the second measurement than in the first measurement.

In S105, the setting device 100 calculates the frequency response from the measurement result and synthesizes the frequency response. The frequency response calculation unit 103 calculates the first frequency response from the input signal and the output signal in the first measurement. Further, the frequency response calculation unit 103 calculates the second frequency response from the input signal and the output signal in the second measurement. The frequency response synthesis unit 105 synthesizes the first frequency response and the second frequency response to generate a combined frequency response. Here, the frequency response synthesis unit 105 synthesizes a portion of the first frequency response having a predetermined frequency or higher and a portion of the second frequency response having a frequency lower than the predetermined frequency to generate a composite frequency response. At this time, the frequency response synthesis unit 105 may set the value of the predetermined frequency in the synthesized frequency response as the average value of the value of the predetermined frequency in the first frequency response and the value of the predetermined frequency in the second frequency response. By using the average value of the two frequency responses at the frequency of the boundary between the two frequency responses at the time of synthesis, it is possible to prevent the combined frequency response from becoming discontinuous at a predetermined frequency of the boundary. Further, the frequency response synthesis unit 105 may generate a composite frequency response by performing window processing in a frequency section including a predetermined frequency at the time of synthesis. By performing the window processing, it is possible to further suppress the composite frequency response from becoming discontinuous at a predetermined frequency.

The frequency response synthesizer 105 combines the high frequency band side of the frequency response measured with a smaller sampling cycle and the low frequency band side of the frequency response measured with a larger sampling cycle into one composite frequency response. be able to.

(Specific example 1 of frequency response synthesis)
4 and 5 are diagrams showing a specific example 1 of the frequency response calculated by the frequency response calculation unit 103. FIG. 4 is a first frequency response based on the first measurement of the signal measuring unit 102. FIG. 5 is a second frequency response based on the second measurement of the signal measuring unit 102. In FIGS. 4 (a) and 5 (a), the horizontal axis represents frequency and the vertical axis represents gain. In FIGS. 4 (b) and 5 (b), the horizontal axis represents the frequency and the vertical axis represents the phase difference. In the first measurement of FIG. 4, the number of data points is 2048 (the number of sampling points is 4096), the first sampling period is 125 μs, and the first application time is 512 ms. In the second measurement of FIG. 5, the number of data points is 2048 (the number of sampling points is 4096), the second sampling period is 1000 μs, and the second application time is 4096 ms.

The second sampling cycle is larger than the first sampling cycle. Therefore, in the first measurement, the measurable frequency band is wider than in the second measurement, but the frequency resolution is coarse. Therefore, in FIG. 4A, it seems that there is no peak gain near 10 Hz, which is the control band of the device to be controlled. Further, in FIG. 4A, a resonance point can be seen near 600 Hz. If the sampling period is small, the frequency resolution becomes coarse, and it may be difficult to confirm the stability of the frequency response in the vicinity of 10 Hz, which is the control band of the device to be controlled. On the other hand, in the second measurement, the measurable frequency band is narrower than that in the first measurement, but the frequency resolution is improved. Therefore, in FIG. 5A, the peak gain can be seen in the vicinity of 10 Hz, which is the control band of the device to be controlled. However, in FIG. 5A, the resonance point near 600 Hz cannot be confirmed.

FIG. 6 is a diagram showing a specific example of the synthesized frequency response synthesized by the frequency response synthesis unit 105. In the combined frequency response of FIG. 6, the portion of the first frequency response of FIG. 4 having a frequency of 500 Hz or higher and the portion of the second frequency response of FIG. 5 having a frequency of less than 500 Hz are combined. In FIG. 6A, the horizontal axis represents frequency and the vertical axis represents gain. In FIG. 6B, the horizontal axis represents frequency and the vertical axis represents phase difference. Further, in FIG. 6A, a resonance point can be seen in the vicinity of 600 Hz, and a peak gain can be seen in the vicinity of 10 Hz, which is the control band of the device to be controlled. Here, the frequency response synthesis unit 105 synthesizes two frequency responses, but the signal measurement unit 102 may perform three or more measurements and synthesize three or more frequency responses.

When setting the control parameters of the device to be controlled, it is desirable to confirm the stability of the frequency response in the low frequency band (for example, around 10 Hz) which is the control band of the device to be controlled. Further, when adjusting the notch filter based on the frequency response of the device to be controlled, it is desirable to confirm the frequency response (particularly the resonance point) in the high frequency band (for example, 500 Hz or higher). According to the combined frequency response synthesized by the frequency response synthesis unit 105, it is possible to confirm both the frequency response in the low frequency band with high resolution and the frequency response in the high frequency band.

(Specific example 2 of frequency response synthesis)
Here, a specific example 1 of frequency response synthesis is shown. In the measurement using the swept sign signal as the input signal, the SN ratio of the frequency response on the high frequency band side tends to decrease. Therefore, the frequency response on the high frequency band side (500 Hz before in the example of FIG. 5) of the second frequency response having a large sampling frequency tends to be oscillating. Therefore, when synthesizing with the first frequency response, unnatural vibration may be seen near the boundary frequency. Here, the boundary frequency (predetermined frequency) at the time of synthesis is determined based on the first sampling period and the second sampling period.

The boundary frequency f is _{expressed as f = (fs2} / 2) × α. Here, α = 1/2. f _s2 is the sampling frequency (= 1 / T _s2 ) of the second measurement. For example, using the frequency responses of FIGS. 4 and 5, assuming that α = 1/2, the boundary frequency f at the time of synthesis is 250 Hz.

The coefficient α = 1/2 defines the upper limit of the boundary frequency. That is, if it is equal to or less than this value, the gain information of the target signal can be accurately restored in the second frequency response, and the SN ratio of the combined frequency response can be improved. For example, when sampling at a period twice the signal period, the sampling theorem is satisfied, but it is difficult to obtain signal gain information. On the other hand, gain information can be acquired when sampling is performed at a period four times the signal period. By setting α = 1/2, it is possible to acquire a signal sampled at a period four times or more the signal period.

FIG. 7 is a diagram showing an example of the combined frequency response when the frequency responses of FIGS. 4 and 5 are combined with the boundary frequency f = 250 Hz. In the combined frequency response of FIG. 7, the portion of the first frequency response of FIG. 4 having a frequency of 250 Hz or higher and the portion of the second frequency response of FIG. 5 having a frequency of less than 250 Hz are combined. In FIG. 6A, the horizontal axis represents frequency and the vertical axis represents gain. In FIG. 6B, the horizontal axis represents frequency and the vertical axis represents phase difference. In the composite frequency response of FIG. 7, it can be seen that the vibrational frequency response from 250 Hz to 500 Hz is improved as compared with the composite frequency response of FIG.

(Specific example 3 of frequency response synthesis)
Here, the number of data points of the frequency response is adjusted before synthesizing the frequency response. When the frequency response is combined as described above, the frequency resolution of the combined frequency response after synthesis becomes inconsistent. Therefore, the data score adjusting unit 106 adjusts the number of data points of the frequency response calculated by the frequency response calculating unit 103. The data score adjusting unit 106 interpolates (interpolates) and thins out (decimates) the frequency response calculated by the frequency response calculation unit 103 by a well-known method such as first-order linear interpolation or the minimum square method. Adjust so that the frequency interval (frequency resolution) of the response becomes a predetermined value.

For example, in the first frequency response of FIG. 4, the number of data points is 1792 and the frequency resolution is 1.953 Hz. Further, in the second frequency response of FIG. 5, the number of data points is 2048 and the frequency resolution is 0.244 Hz. Here, the data score adjusting unit 106 interpolates (interpolates) the data of the first frequency response, sets the number of data points to 14336 points, and sets the frequency resolution to 0.244 Hz. As a result, the frequency resolution of the first frequency response and the frequency resolution of the second frequency response match. The frequency response synthesis unit 105 synthesizes the frequency response by using the frequency response adjusted by the data score adjustment unit 106.

FIG. 8 is a diagram showing an example in which the frequency resolution of the first frequency response of FIG. 4 is set to 0.244 Hz and the frequency resolution of the first frequency response of FIG. 4 is combined with the second frequency response of FIG. In FIG. 8A, the horizontal axis represents frequency and the vertical axis represents gain. In FIG. 8B, the horizontal axis represents the frequency and the vertical axis represents the phase difference.

Further, from the viewpoint of reducing the number of data points, the data point adjusting unit 106 may interpolate (interpolate) the data of the first frequency response and thin out (decimate) the number of data points of the second frequency response. Here, the data score adjusting unit 106 interpolates (interpolates) the data of the first frequency response, sets the number of data points to 7168, sets the frequency resolution to 0.488 Hz, and thins out the data of the second frequency response. (Decimation), the number of data points is 1024, and the frequency resolution is 0.488 Hz. Here, the decimation ratio is set to 1/2 because it is sufficient if the peak gain in the low frequency band can be reproduced. As a result, the frequency resolution of the first frequency response and the frequency resolution of the second frequency response match.

FIG. 9 is a diagram showing an example of synthesis in which the frequency resolution of the frequency response of FIGS. 4 and 5 is 0.488 Hz. In FIG. 9A, the horizontal axis represents frequency and the vertical axis represents gain. In FIG. 9B, the horizontal axis represents the frequency and the vertical axis represents the phase difference.

Further, the data score adjusting unit 106 may delete data in a specific section of the first frequency response and the second frequency response (for example, a low frequency band below a predetermined frequency). This is because the SN ratio in the low frequency band is low even in the second frequency response in which the sampling cycle is lengthened, and it may be better to delete the data in the low frequency band.

(Specific example 4 of frequency response synthesis)
Here, when adjusting the number of data points, the number of data points of the combined frequency response after synthesis is adjusted to be a power of 2. By setting the number of data points of the composite frequency response to the power of 2, the fast Fourier transform and the inverse fast Fourier transform can be applied to the composite frequency response. Therefore, the data score adjusting unit 106 adjusts the number of data points of the frequency response calculated by the frequency response calculating unit 103 so that the number of data points of the combined frequency response is a power of 2. The data score adjusting unit 106 interpolates (interpolates) and thins out (decimates) the frequency response calculated by the frequency response calculation unit 103 by a well-known method such as first-order linear interpolation or the least squares method. Adjust the score. Specifically, the frequency resolution of the composite frequency response can be obtained by determining the number of data points to the power of 2 and dividing the width of the frequency range (for example, 1 Hz to 4000 Hz) of the composite frequency response by the number of data points. By obtaining the frequency resolution, the number of data points of each frequency response before synthesis can be obtained. The data score adjusting unit 106 can obtain a frequency response in which the data score is adjusted by interpolating and thinning each frequency response based on the obtained data score. The number of data points after synthesis becomes a power of 2, and the frequency resolution of the composite frequency response is unified, so that the fast Fourier transform and the inverse fast Fourier transform can be applied to the composite frequency response. By being able to apply the fast Fourier transform and the inverse fast Fourier transform, the calculation time can be shortened.

(Calculation of impulse response and time response of the device to be controlled)
Here, the calculation of the impulse response and the time response of the device to be controlled will be described. The impulse response calculation unit 107 calculates the impulse response using the combined frequency response synthesized by the frequency response synthesis unit 105. The impulse response calculation unit 107 performs an inverse fast Fourier transform on the composite frequency response and calculates the impulse response of the device to be controlled. Further, the time response calculation unit 108 convolves and integrates the impulse response calculated by the impulse response calculation unit 107 and an arbitrary input signal, and calculates the time response of the device to be controlled with respect to the arbitrary input signal. Well-known methods can be used for the calculation of the impulse response and the calculation of the time response.

By using the composite frequency response synthesized by the frequency response synthesis unit 105 when calculating the impulse response, the accuracy of the calculated impulse response and the time response calculated using the impulse response is improved.

(Simulation of controlled device)
A simulation of the operation of the device to be controlled will be described. When the control target device is actually driven and the control parameter is set in order to appropriately control the control target device, the response of the control target device is measured every time the control parameter is set. Therefore, it takes a lot of time to adjust. In addition, if inappropriate control parameters are set, the device to be controlled may be damaged. Therefore, by simulating the operation of the device to be controlled by using a simulation model that simulates the operation of the device to be controlled, it is possible to suppress the actual driving of the device to be controlled. Further, the simulation can be made highly accurate by generating a simulation model using the synthesized frequency response obtained by synthesizing the first frequency response and the second frequency response.

FIG. 10 is a diagram showing an example of an operation flow of a simulation of the operation of the device to be controlled.

In S201, the simulation model generation unit 109 generates a simulation model that simulates the operation of the device to be controlled from the combined frequency response synthesized by the frequency response synthesis unit 105. The simulation model simulates the operation of the controlled device with respect to the input signal. The simulation model can be obtained as a frequency transfer function such as a closed loop, an open loop, or a time response by multiplying the composite frequency response by a frequency transfer function as a characteristic of the device to be controlled, for example. The operation of the device to be controlled by the simulation model is output as, for example, a closed loop characteristic, an open loop characteristic, and a time response characteristic.

In S202, the parameter adjusting unit 111 sets the set value of the parameter (control parameter) for controlling the device to be controlled used in the simulation (simulation) of the operation of the device to be controlled. Examples of control parameters include velocity-proportional gain, velocity-integrated gain, position-proportional gain, and low-pass filter cutoff frequency. The control parameters are not limited to these. The set values of the control parameters are sequentially changed for each simulation (simulation). The set value of the control parameter may be changed according to the value of another control parameter. The set values of some control parameters may be fixed values. The range of the set values of the control parameters used in the simulation, the step width of the change, and the like may be specified in advance by the user or the like.

In S203, the test operation instruction unit 110 generates an input signal based on the set value of the control parameter of the device to be controlled set by the parameter adjustment unit 111. The test operation instruction unit 110 simulates the operation of the device to be controlled by using the simulation model generated by the simulation model generation unit 109 and the generated input signal. The test operation instruction unit 110 stores the result of simulating the operation of the device to be controlled (closed loop characteristic, open loop characteristic, time response characteristic, etc.) in the storage means together with the set value of the control parameter.

In S204, the parameter adjusting unit 111 confirms whether or not the simulation of the operation of the device to be controlled has been completed for all the predetermined set values of the control parameters. When finished (S204; YES), the process proceeds to S204. If it is not completed (S204; NO), the process returns to S202, and a new set value of the control parameter is set.

In S205, the performance index calculation unit 112 calculates a performance index for evaluating control of the device to be controlled for each set value of the control parameter based on the result of simulating the operation of the device to be controlled. Performance indexes are "peak gain" and "control band" of closed loop characteristics, "gain margin" and "phase margin" of open loop characteristics, "delay time", "rise time", "setting time" and "overshoot amount" of time response characteristics. Is.

The peak gain is the value of the gain that peaks in the closed loop characteristic. The control band is a band in which the gain is -3 dB in the closed loop characteristic. The gain margin indicates how much the gain has a margin up to 1 time (0 dB) when the phase delay of the gain becomes 180 degrees in the open loop characteristic. The gain margin is the value of the gain when the phase delay is 180 degrees. The phase margin indicates how much the phase lag can be up to 180 degrees when the gain is multiplied by 1 (0 dB) in the open loop characteristic. The phase margin is the difference between the phase lag and 180 degrees when the gain is 0 dB.

The delay time is the time required for the response to reach 50% of the steady state in terms of time response characteristics. The rise time is the time during which the response reaches 10% to 90% of the steady state in terms of time response characteristics. The peak time is the time required for the response to reach the first peak in the time response characteristics. The settling time is, in terms of time response characteristics, the time from when the response enters the permissible range until it does not come out of the permissible range. The amount of overshoot is the difference between the peak value of the response and the steady state value in the time response characteristic. The performance indicators shown here are examples and are not limited to those described here.

In S206, the display unit 114 displays the performance index calculated by the performance index calculation unit 112 together with the set value of the control parameter.

11 and 12 are diagrams showing a display example of the performance index displayed on the display unit 114. The horizontal axis of FIGS. 11 and 12 shows the speed proportional gain, and the vertical axis shows the speed integral gain. In addition, each cell shows the magnitude of the peak gain of the speed closed loop in color. The white circles in FIGS. 11 and 12 represent the points between the selected speed proportional gain and the speed integrated gain (the same points in FIGS. 11 and 12). FIG. 11 shows the result by the simulation model based on the first frequency response, and FIG. 12 shows the result by the simulation model based on the synthetic frequency response.

Comparing FIGS. 11 and 12, it can be seen that the stable region is smaller in FIG. This is because, in FIG. 12, the peak gain in the low frequency band is reproduced by synthesizing the first frequency response and the second frequency response. That is, the result of FIG. 12 shows that the simulation is more accurate than the result of FIG. For example, it is assumed that the required specification for gain adjustment is to make the speed proportional gain as high as possible when the peak gain of the speed closed loop is 3 dB or less. At this time, the peak gain at the point of the white circle, which is a selectable (satisfying the required specifications) value (about 2.5 dB) in FIG. 11, becomes an unstable value (about 4.5 dB) in FIG. It can be seen that the required specifications are not met.

(Setting of the second sampling cycle)
In the above, the second sampling period in the second measurement has been set in advance, but here, a method of determining the second sampling period based on the first frequency response will be described. Here, the frequency response analysis unit 113 sets the second sampling period to the speed proportional gain, the control band of the first frequency response, the frequency that becomes the resonance point or the antiresonance point (resonance frequency or antiresonance frequency), and the phase inversion frequency. Determine based on either. The application time setting unit 104 sets the second sampling cycle calculated by the frequency response analysis unit 113 as the second sampling cycle used in the second measurement.

<When based on speed proportional gain>
The frequency response analysis unit 113 acquires the set value of the velocity proportional gain Kvp used in the first measurement, the number of data points n, and the first sampling period Ts1. The frequency response analysis unit 113 is the second
The sampling period Ts2 is calculated as Ts2 = ceil ((1/10 ^{α + W} ) / Tc) · Tc. Here, α is log ₁₀ (Kbp), W is (1/2) log (2n), and Tc is the control cycle. Further, the function ceil is a function that calculates the smallest integer equal to or greater than the argument. (1/10 ^{α + W} ) represents the upper limit of the frequency band defined with reference to Kvp. By using the function ceil, the minimum sampling period that covers this value can be calculated.

For example, when Kbp = 10 Hz, n = 4096, Tc = 125 μs, and Ts1 = 125 μs, Ts2 = 1.125 ms is calculated.

<When based on the control band of the first frequency response>
The frequency response analysis unit 113 acquires the first frequency response based on the first measurement. The frequency response analysis unit 113 determines the frequency when the gain of the first frequency response is closest to -3 dB.
Detect as control band. The frequency response analysis unit 113 sets the shortest sampling period covering the frequency from 2 to 3 times the detected control band as the second sampling period. Specifically, the second sampling period Ts2 is calculated as Ts2 = 4 / (β × f1). Here, β is a coefficient such that 2 ≦ β ≦ 3, and f1 is the frequency of the control band. It is possible to detect frequencies from 2 to 3 times the control band so that the frequency around the control band is a high-resolution region. The frequency response analysis unit 113 can determine the second sampling period based on the control band. Further, the frequency response analysis unit 113 can calculate the second application time by multiplying the second sampling period by the number of sampling points.

<When based on the frequency of the resonance point or antiresonance point>
The frequency response analysis unit 113 acquires the first frequency response based on the first measurement. The frequency response analysis unit 113 detects the frequency when the gain of the first frequency response is closest to -3 dB (when the difference between the gain of the first frequency response and -3 dB is the smallest) as the control band. The frequency response analysis unit 113 sets the frequency at which the gain of the first frequency response is higher than the frequency of the control band and the frequency differentiation of the gain is closest to 0 as the frequency of the resonance point or the antiresonance point. ,To detect. The frequency response analysis unit 113 sets the shortest sampling period covering the detected resonance point or anti-resonance point frequency as the second sampling period. Specifically, the second sampling period Ts2 is calculated as Ts2 = 4 / f2. Here, f2 is the frequency of the resonance point or the antiresonance point. The frequency response analysis unit 113 can determine the second sampling period based on the frequency of the resonance point or the antiresonance point. Further, the frequency response analysis unit 113 can calculate the second application time by multiplying the second sampling period by the number of sampling points.

<When based on the frequency of the resonance point or antiresonance point>
The frequency response analysis unit 113 acquires the first frequency response based on the first measurement. The frequency response analysis unit 113 reverses the frequency when the phase difference of the first frequency response is closest to −180 ° (when the difference between the phase difference of the first frequency response and −180 ° is the smallest). Detect as frequency. The frequency response analysis unit 113 sets the shortest sampling period that covers the detected phase inversion frequency as the second sampling period. Specifically, the second sampling period Ts2 is calculated as Ts2 = 4 / f3. Here, f3 is the phase inversion frequency. The frequency response analysis unit 113 can determine the second sampling period based on the phase inversion frequency. Further, the frequency response analysis unit 113 can calculate the second application time by multiplying the second sampling period by the number of sampling points.

(Setting of the second sampling cycle by the user)
<Setting by specifying the frequency domain>
Here, the setting of the second sampling cycle by the user will be described. After the first measurement by the signal measurement unit 102, the frequency response calculation unit 103 calculates the first frequency response based on the first measurement. The display unit 114 displays the first frequency response calculated by the frequency response calculation unit 103. Further, the display unit 114 displays a mark on at least one of the graphs of the gain and the phase difference of the first frequency response to specify the frequency region for which the resolution is to be increased. The user moves the mark for designating the frequency domain displayed on the display unit 114 by the input from the input unit 115, and specifies the frequency region for which the resolution is desired to be increased (the upper limit frequency of the frequency region for which the resolution is desired to be increased). The application time setting unit 104 determines the second sampling period based on the designated upper limit frequency. Specifically, the second sampling period Ts2 is calculated as Ts2 = 4 / f4.
Here, f4 is a designated upper limit frequency.

A user who does not understand the relationship between the sampling period and the frequency resolution by displaying the first frequency response, letting the user specify the frequency domain for which the resolution is desired to be increased, and determining the second sampling period. However, the second sampling period can be set appropriately. Further, since the measurement is suppressed by trial and error, it is possible to reduce the damage to the device to be controlled.

FIG. 13 is a diagram showing an example of designation of the frequency domain. In FIG. 13, a graph of the gain of the first frequency response by the first measurement (upper figure) and a graph of the phase difference (lower figure) are displayed. The horizontal axis of the upper figure of FIG. 13 is the frequency, and the vertical axis is the gain. The horizontal axis of the lower figure of FIG. 13 is the frequency, and the vertical axis is the phase difference. Further, in the upper figure and the lower figure, the horizontal frequency axes are aligned. Further, in each figure, a mark (dotted line) for designating the frequency domain (upper limit frequency) for which the common resolution is desired to be increased is displayed. Here, the mark is a dotted line, but the mark is not limited to the dotted line. The user can intuitively specify the upper limit frequency of the frequency domain in which the common resolution is desired to be increased by moving the mark left and right by using the pointing device of the input unit 115, the cursor keys of the keyboard, or the like.

<Setting by specifying the second sampling period>
Here, the display unit 114 of the setting device 100 displays a display prompting the user to input the second sampling cycle. The user inputs a desired second sampling cycle by the input unit 115 according to the display of the display unit 114. The application time setting unit 104 sets the input second sampling cycle as the second sampling cycle of the second measurement. Even if the display prompting the input of the second sampling is performed before the first measurement by the signal measuring unit 102, the first frequency response based on the first measurement is displayed on the display unit 114 after the first measurement. It may be done later. This allows the user to directly specify the second sampling period.

(Computer readable recording medium)
A program that enables a computer or other machine or device (hereinafter, computer or the like) to realize any of the above functions can be recorded on a recording medium that can be read by the computer or the like. Then, the function can be provided by causing a computer or the like to read and execute the program of this recording medium.

Here, a recording medium that can be read by a computer or the like is a recording medium that can store information such as data and programs by electrical, magnetic, optical, mechanical, or chemical action and can be read from the computer or the like. To say. In such a recording medium, elements constituting a computer such as a CPU and a memory may be provided, and the CPU may execute a program.

Further, among such recording media, those that can be removed from a computer or the like include, for example, a flexible disk, a magneto-optical disk, a CD-ROM, a CD-R / W, a DVD, a DAT, an 8 mm tape, a memory card, and the like.

In addition, there are hard disks, ROMs, and the like as recording media fixed to computers and the like.

(others)
Although the embodiments of the present invention have been described above, these are merely examples, and the present invention is not limited thereto, and as long as the gist of the claims is not deviated, the combination of each configuration and the like, etc. Various changes can be made based on the knowledge of those skilled in the art.

<< Additional notes >>
A setting support device (100) that supports the setting of parameters that control the device.
An input signal generation unit (101) that generates an input signal input to the device based on a set sampling period, and
A signal measuring unit (102) that measures the input signal generated by the input signal generating unit (101) and an output signal from the apparatus with respect to the input signal in the sampling cycle.
A frequency response calculation unit (103) that calculates the frequency response of the device based on the input signal and the output signal measured by the signal measurement unit (102).
By setting the first sampling cycle for the first measurement by the signal measuring unit (102), the first application time, which is the time for applying the input signal in the first measurement, is set, and the signal measuring unit. By setting a second sampling cycle larger than the first sampling cycle with respect to the second measurement according to (102), an application time for setting a second application time, which is a time for applying the input signal in the second measurement. Setting unit (104) and
The frequency response synthesis unit (105) that synthesizes the first frequency response based on the first measurement by the signal measurement unit (102) and the second frequency response based on the second measurement and outputs the combined frequency response. And with
Setting support device (100).

100: Setting device 101: Input signal generation unit 102: Signal measurement unit 103: Frequency response calculation unit 104: Application time setting unit 105: Frequency response synthesis unit 106: Data score adjustment unit 107: Impulse response calculation unit 108: Time response calculation Unit 109: Simulation model generation unit 110: Test operation instruction unit 111: Parameter adjustment unit 112: Performance index calculation unit 113: Frequency response analysis unit 114: Display unit 115: Input unit 200: Servo driver 300: Motor 400: Load device

Claims (17)

It is a setting support device that supports the setting of parameters that control the device.
An input signal generator that generates an input signal input to the device based on a set sampling period,
A signal measuring unit that measures the input signal generated by the input signal generating unit and an output signal from the apparatus with respect to the input signal in the sampling cycle.
A frequency response calculation unit that calculates the frequency response of the device based on the input signal and the output signal measured by the signal measurement unit.
By setting the first sampling cycle with respect to the first measurement by the signal measuring unit, the first application time, which is the time for applying the input signal in the first measurement, is set, and the second application time by the signal measuring unit is set. By setting a second sampling cycle larger than the first sampling cycle with respect to the measurement of the above, an application time setting unit for setting a second application time, which is a time for applying the input signal in the second measurement,
A frequency response synthesis unit that synthesizes a first frequency response based on the first measurement by the signal measurement unit and a second frequency response based on the second measurement and outputs a combined frequency response is provided.
Setting support device. The input signal is a sweep sine wave signal.
The setting support device according to claim 1. The frequency response synthesis unit synthesizes a portion of the first frequency response having a predetermined frequency or higher and a portion of the second frequency response having a frequency lower than the predetermined frequency, and outputs the synthesized frequency response.
The setting support device according to claim 1 or 2. The gain and phase difference of at least one of the first frequency response and the second frequency response are interpolated or thinned so that the frequency resolution of the first frequency response and the frequency resolution of the second frequency response match. A data point adjusting unit for adjusting the number of data points of the gain and the phase difference is provided.
The setting support device according to any one of claims 1 to 3. The data point adjusting unit deletes data points having a gain and a phase difference of a predetermined frequency or less of the first frequency response and the second frequency response.
The setting support device according to claim 4. The data score adjusting unit adjusts the data score so that the gain of the combined frequency response after synthesis by the frequency response compositing unit and the data score of the phase difference are raised to a power of 2.
The setting support device according to claim 4 or 5. An impulse response calculation unit that calculates the impulse response of the device from the combined frequency response synthesized by the frequency response synthesis unit, and an impulse response calculation unit.
It is provided with a time response calculation unit that calculates the time response of the device to an arbitrary input signal by a convolution integration process of the impulse response and the arbitrary input signal.
The setting support device according to any one of claims 1 to 6. A simulation model generation unit that generates a simulation model that simulates the operation of the device based on the combined frequency response synthesized by the frequency response synthesis unit.
Using the input signal and the simulation model, a test operation instruction unit that simulates the operation of the device with respect to the input of the input signal, and a test operation instruction unit.
A parameter adjusting unit that changes the set value of the parameter that controls the device when simulating the operation, and a parameter adjusting unit.
Based on the result of simulating the operation, a performance index calculation unit that calculates a performance index for evaluating control of the device for each set value of the parameter, and a performance index calculation unit.
It is provided with a display unit that displays the performance index calculated by the performance index calculation unit in association with the set value of the parameter.
The setting support device according to any one of claims 1 to 7. A frequency response analysis unit for calculating the second application time to be used in the second measurement based on the first frequency response is provided.
The setting support device according to any one of claims 1 to 8. The frequency response analysis unit calculates the second application time based on the velocity proportional gain, which is a parameter for controlling the device, and the number of sampling points of one measurement by the signal measurement unit.
The setting support device according to claim 9. The frequency response analysis unit determines the second application time based on the frequency at which the gain of the first frequency response is closest to -3 dB.
The setting support device according to claim 9. The frequency response analysis unit resonates the frequency at which the frequency differential value of the gain of the first frequency response is closest to 0 in the frequency band higher than the frequency at which the gain of the first frequency response is closest to -3 dB. The second application time is determined based on the resonance frequency or the anti-resonance frequency, which is detected as a frequency or an anti-resonance frequency.
The setting support device according to claim 10. The frequency response analysis unit determines the second application time based on the phase inversion frequency, with the frequency at which the phase difference of the first frequency response is closest to −180 ° as the phase inversion frequency.
The setting support device according to claim 9. The application time setting unit causes the user to select the upper limit frequency of the frequency band for increasing the frequency resolution, and sets the second application time based on the selected upper limit frequency.
The setting support device according to any one of claims 1 to 13. The application time setting unit causes the user to select the sampling cycle of the second measurement, and sets the selected sampling cycle as the second sampling cycle.
The setting support device according to any one of claims 1 to 13. A setting support device that supports the setting of parameters that control the device
The input signal input to the device is generated based on the set sampling period, and is generated.
The generated input signal and the output signal from the apparatus with respect to the input signal are measured in the sampling cycle.
Based on the measured input signal and output signal, the frequency response of the device is calculated.
By setting the first sampling cycle for the first measurement in the measurement of the output signal, the first application time, which is the time for applying the input signal in the first measurement, is set.
By setting a second sampling cycle larger than the first sampling cycle with respect to the second measurement in the measurement of the output signal, the second application time, which is the time for applying the input signal in the second measurement, is set. ,
The first frequency response based on the first measurement and the second frequency response based on the second measurement are combined, and the combined frequency response is output.
Setting support method to do that. For setting support devices that support the setting of parameters that control the device,
The input signal input to the device is generated based on the set sampling period, and is generated.
The generated input signal and the output signal from the apparatus with respect to the input signal are measured in the sampling cycle.
Based on the measured input signal and output signal, the frequency response of the device is calculated.
By setting the first sampling cycle for the first measurement in the measurement of the output signal, the first application time, which is the time for applying the input signal in the first measurement, is set, and in the measurement of the output signal, the first application time is set. By setting a second sampling cycle larger than the first sampling cycle for the second measurement, the second application time, which is the time for applying the input signal in the second measurement, is set.
The first frequency response based on the first measurement and the second frequency response based on the second measurement are combined, and the combined frequency response is output.
A setting support program that lets you do things.

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