JP2021056209A - Processing system, method for processing, program, and storage medium - Google Patents

Abstract

To provide a processing system, a method for processing, a program, and a storage medium that can determine whether a detector is in contact with a welding target.SOLUTION: The processing system according to an embodiment has a processor for executing a first determination. In the first determination, if a reflection wave is detected by a detector that includes a plurality of detection elements arranged in a first direction, the detector detecting a reflection wave by sending an ultrasonic wave to a welding target, it is determined whether the detector is in contact with the welding target according to the result of detection.SELECTED DRAWING: Figure 1

Description

Embodiments of the present invention relate to processing systems, processing methods, programs, and storage media.

In welding, a part of two or more members is melted and joined. The welded member is inspected to see if the welded portion (hereinafter referred to as the welded portion) is properly joined. For example, in non-destructive inspection, the person holding the detector (inspector) brings the detector into contact with the weld. Ultrasonic waves are transmitted from the detector to the weld and the presence or absence of bonding is inspected based on the reflected waves.

At the time of inspection, if the detector is not in proper contact with the welded portion, the reflected wave reflecting the state of the welded portion cannot be detected. Therefore, at the time of inspection, it is desirable that the detector is in proper contact with the weld.

JP-A-2019-90727

Akira Ushijima, Masahiro Saito, Makoto Matsumoto (2019) "Spot welding inspection robot that contributes to labor saving and reliability improvement by non-destructive inspection" "Toshiba Review" vol. 74, No. 4, pp. 25-28

An object to be solved by the present invention is to provide a processing system, a processing method, a program, and a storage medium capable of determining whether or not the detector is in contact with a welding object.

The processing system according to the embodiment includes a processing device that executes the first determination. In the first determination, when the reflected wave is detected by a detector that includes a plurality of detecting elements arranged in the first direction and transmits ultrasonic waves toward the welding target to detect the reflected wave, the detection result is obtained. It is determined whether the detector is in contact with the welding target based on the above.

It is a block diagram which shows the structure of the processing system which concerns on embodiment. It is a schematic diagram which shows the state of a non-destructive inspection. It is a schematic diagram which shows the internal structure of the detector tip. It is a flowchart which shows the flow of the contact determination of the detector using the processing system which concerns on embodiment. It is a schematic diagram which shows the state of the exploration by a detector. It is a schematic diagram of the image which shows the detection result of the reflected wave. It is a graph which illustrates the intensity distribution of a reflected wave. This is an example of a user interface displayed on a display device. It is a graph which illustrates the intensity distribution of a reflected wave. It is a graph which illustrates the spectrum. It is a flowchart which shows the flow of inspection using the processing system which concerns on embodiment. It is a graph which illustrates the intensity distribution of the reflected wave in the Z direction in one cross section. It is a graph which illustrates the intensity distribution of the reflected wave in the Z direction. It is a graph which illustrates the result of filtering the intensity distribution of a reflected wave. It is a schematic diagram which illustrates the detection result of the reflected wave. This is an example of the intensity distribution of the reflected wave on the XY plane. It is a schematic diagram which illustrates the detection result of the reflected wave. It is a flowchart which shows the flow of estimation of the range in the processing system which concerns on embodiment. It is an image which illustrates the detection result of the reflected wave. It is a figure for demonstrating the processing by the processing system which concerns on embodiment. This is an example of an image obtained by the processing system according to the embodiment. This is an example of an image obtained by the processing system according to the embodiment. It is a schematic diagram for demonstrating the inspection method by the processing system which concerns on embodiment. It is a schematic diagram which shows the structure of the processing system which concerns on the modification of embodiment. It is a perspective view which shows a part of the processing system which concerns on the modification of embodiment. It is a flowchart which shows the operation of the processing system which concerns on the modification of embodiment. It is a block diagram which shows the hardware composition of a system.

Hereinafter, each embodiment of the present invention will be described with reference to the drawings.
The drawings are schematic or conceptual, and the relationship between the thickness and width of each part, the ratio of the sizes between the parts, etc. are not always the same as the actual ones. Even if the same part is represented, the dimensions and ratios of each may be represented differently depending on the drawing.
In the present specification and each figure, the same elements as those already described are designated by the same reference numerals, and detailed description thereof will be omitted as appropriate.

FIG. 1 is a block diagram showing a configuration of a processing system according to an embodiment.
As shown in FIG. 1, the processing system 100 according to the embodiment includes a processing device 110 and a storage device 120. The storage device 120 stores data related to the welding inspection. The processing device 110 processes data related to the welding inspection.

The processing system 100 shown in FIG. 1 further includes a detector 130, an input device 140, and a display device 150. The detector 130 transmits ultrasonic waves toward the target and detects (receives) the reflected waves. The detector 130 includes, for example, a probe. Hereinafter, the transmission of ultrasonic waves and the detection of reflected waves by the detector 130 will be referred to as exploration (probing).

The processing device 110 executes various processes based on the detected reflected wave. For example, the processing device 110 causes the display device 150 to display the user interface. The user can easily confirm the data obtained by the processing through the user interface displayed on the display device 150. In addition, the user can input data to the processing device 110 via the user interface by the input device 140.

Here, the welding inspection will be specifically described. In the weld inspection, a non-destructive inspection of the welded part is performed.

FIG. 2 is a schematic view showing a state of non-destructive inspection.
The detector 130 includes a plurality of detection elements for inspecting the weld. The detector 130 has a shape that can be grasped by a human hand, for example, as shown in FIG. The person holding the detector 130 brings the tip of the detector 130 into contact with the welded portion 13 to inspect the welded portion 13. Here, an example in which a person holds the detector 130 and executes a welding inspection will be described. Hereinafter, a person (for example, an inspector) who holds the detector 130 and executes a welding inspection is referred to as a user.

FIG. 3 is a schematic view showing the internal structure of the tip of the detector.
As shown in FIG. 3, an element array 131 including a plurality of detection elements 132 is provided inside the tip of the detector 130. The detection element 132 is, for example, a transducer. The element array 131 emits ultrasonic waves having a frequency of, for example, 1 MHz or more and 100 MHz or less. The plurality of detection elements 132 may be arranged linearly in one direction, or may be arranged in a matrix in two directions intersecting with each other. In the example shown in FIG. 3, the plurality of detection elements 132 are arranged in the X direction (first direction) and the Y direction (second direction) orthogonal to each other.

The element array 131 is covered with, for example, a rigid propagation member 133. When the tip of the detector 130 is brought into contact with the welded portion 13, the hard propagation member 133 is located between the element array 131 and the welded portion 13. The hard propagation member 133 is made of a resin material or the like in which ultrasonic waves can easily propagate. By providing the hard propagation member 133 according to the shape of the surface of the welded portion 13, ultrasonic waves can be easily propagated to the inside of the welded portion 13. Further, the hard propagation member 133 can suppress deformation and damage of the element array 131 when the detector 130 comes into contact with the welded portion 13. The hard propagation member 133 has sufficient hardness in order to suppress deformation, damage, etc. at the time of contact with the welded portion 13.

2 and 3 show a state in which the member 10 to be welded is inspected. The member 10 is manufactured by spot-welding a metal plate 11 (first member) and a metal plate 12 (second member) at a welded portion 13. As shown in FIG. 3, in the welded portion 13, a part of the metal plate 11 and a part of the metal plate 12 are melted and mixed to form a solidified portion 14 which is solidified.

At the time of inspection, the coplant 15 is applied to the surface of the object so that the ultrasonic waves can be easily propagated between the object and the detector 130. Each detection element 132 transmits ultrasonic US to the member 10 coated with the coplant 15 and receives the reflected wave RW from the member 10.

Alternatively, instead of the couplant 15, a soft propagation member through which ultrasonic waves can easily propagate may be provided at the tip of the detector 130. This soft propagating member is softer than the hard propagating member 133. When in contact with the welded portion 13, the soft propagating member deforms following the shape of the surface of the welded portion 13. The soft propagation member is composed of, for example, a gel-like resin.

For example, as shown in FIG. 3, one detection element 132 transmits ultrasonic US to the welded portion 13. A part of the ultrasonic US is reflected by the upper surface or the lower surface of the member 10. Each of the plurality of detection elements 132 receives (detects) this reflected wave RW. Each detection element 132 sequentially transmits ultrasonic US, and each reflected wave RW is received by the plurality of detection elements 132.

The processing device 110 determines whether or not the detector 130 is in contact with the welding target based on the obtained detection result of the reflected wave. Further, the processing device 110 may calculate the inclination with respect to the welded portion 13 and inspect the welded portion 13 based on the obtained detected result of the reflected wave. For example, the processing device 110 stores the contact determination result, the inclination calculation result, the inspection result of the welded portion 13, and the like in the storage device 120.

Here, the angle between the normal direction of the surface of the welded portion 13 and the direction of the detector 130 is referred to as an inclination. The direction of the detector 130 corresponds to, for example, the Z direction perpendicular to the arrangement direction of the detection elements 132. When the detector 130 is in contact with the surface of the weld 13 perpendicularly, the inclination is zero.

The processing device 110 is connected to the storage device 120, the detector 130, the input device 140, and the display device 150 via wired communication, wireless communication, or a network.

FIG. 4 is a flowchart showing the flow of contact determination of the detector using the processing system according to the embodiment.
First, conditions for determining whether the detector 130 is in contact with the welding target are set (step S1). After setting the conditions, the user moves the detector 130 so that the detector 130 comes into contact with the weld 13. When the user determines that the tip of the detector 130 has come into contact with the welded portion 13, the user executes the search by the detector 130 (step S2). For example, the detector 130 is provided with a button for performing an exploration. The user can execute the search by the detector 130 by operating the button. Alternatively, the user may be able to perform the search by the detector 130 through the user interface displayed on the display device 150.

When the reflected wave is detected by the exploration, the processing device 110 executes the first determination of determining whether the detector 130 is in contact with the welding target (step S3). The processing device 110 executes the first determination based on the detected reflected wave and the conditions set in step S1.

As a result of the first determination, when it is determined that the detector 130 is not in contact with the welding target, the processing device 110 notifies, for example, the user (step S4). The method of notification is arbitrary. The detector 130 may emit sound or light towards the user. The display of the display device 150 may change. For example, an error message may be displayed on the display device 150. When it is determined that the detector 130 is in contact with the welding target, for example, the inclination of the detector 130 is calculated or the welding target is inspected.

If the detector 130 is not in contact with the welding target, a detection result reflecting the state of the welded portion 13 cannot be obtained. If the inclination is calculated or inspected using the detection result when the detector 130 is not in contact, an erroneous result may be output. By executing the first determination, it is possible to suppress the execution of the inclination calculation or inspection using the detection result when the detector 130 is not in contact.

The determination of whether or not the detector 130 is in contact with the welding target is, in other words, the determination of whether or not an appropriate reflected wave detection result is obtained. For example, the detector 130 may not be in direct contact with the object to be welded, but may be in contact via a coplant. In this case, ultrasonic waves are sufficiently propagated between the detector 130 and the object to be welded through the coplant. Therefore, a detection result suitable for the calculation or inspection of the inclination can be obtained. Even if the detector 130 is in direct contact with the object to be welded, if the space between the detector 130 and the object to be welded is not sufficiently filled with the coplant, an appropriate detection result may not be obtained. Here, it is said that the detector 130 is in contact with the welding target when the detection result is determined to be usable for the calculation or inspection of the inclination based on the detection result of the reflected wave.

For example, even if the detector 130 appears to be in contact with the welding target, there may actually be foreign matter such as dust or a residual during processing between the detector 130 and the welding target. .. Further, when the surface of the welding target has a concave portion or a convex portion, a gap may be formed between the detector 130 and the welding target. According to the embodiment, in these cases, when the ultrasonic wave is not sufficiently propagated between the detector 130 and the welding target even through the couplant, the notification to the user is executed. As a result, even in a case where it is difficult to visually determine the contact of the detector 130, the user can know whether the detector 130 is in proper contact with the welding target.

The setting of the condition in step S1 and the first determination in step S3 will be specifically described.
In step S1, the search is executed in a state where the detector 130 is in contact with the member and a state in which the detector 130 is separated from the member. The processing device 110 detects a reflected wave when the detector 130 is in contact with the member (first detection result) and a reflected wave when the detector 130 is away from the member (second detection). Result) and, are used to set the first threshold.

FIG. 5 is a schematic diagram showing the state of exploration by the detector.
When the ultrasonic US is transmitted from the detector 130, as shown in FIG. 5, a part of the ultrasonic US is reflected by the upper surface 11a of the metal plate 11 or the upper surface 13a of the welded portion 13. Another part of the ultrasonic US is incident on the member 10 and reflected by the lower surface 11b of the metal plate 11, the lower surface 13b of the welded portion 13, and the like. The detector 130 detects the intensity of the reflected wave from each surface.

The intensity of the reflected wave may be expressed in any manner. For example, the reflected wave intensity output from the detection element 132 includes a positive value and a negative value depending on the phase. Various processes may be performed based on the reflected wave intensity including positive and negative values. The reflected wave intensity including positive and negative values may be converted to an absolute value. The average value of the reflected wave intensity may be subtracted from the reflected wave intensity at each time. Alternatively, the weighted average value of the reflected wave intensity, the weighted moving average value, and the like may be subtracted from the reflected wave intensity at each time. Even when the result of adding these treatments to the reflected wave intensity is used, the various treatments described here can be executed.

FIG. 6 is a schematic view of an image showing the detection result of the reflected wave.
FIG. 6 shows the detection result when the detector 130 is in contact with the member 10 to be welded, as shown in FIG. FIG. 6 shows the state of the welding target in the XZ cross section.

In FIG. 6, the points where the intensity of the reflected wave is high are shown in white. Here, the intensity of the reflected wave is schematically represented by binarizing it. The position in the Z direction corresponds to the time from when the ultrasonic wave is emitted to when the reflected wave is received. The white line extending along the X or Y direction represents the surface of the member.

In FIG. 6, the plurality of white lines existing in the center in the X direction or the Y direction are based on the reflected waves from the upper surface 13a and the lower surface 13b of the welded portion 13. The plurality of white lines existing on the end side in the X direction or the Y direction are based on the reflected waves from the upper surface 11a of the metal plate 11, the lower surface 11b of the metal plate 11, and the lower surface 12b of the metal plate 12. In FIG. 6, there are three or more white lines in the Z direction. This indicates that, as shown in FIG. 5, the ultrasonic US is multiplely reflected between the upper surface and the lower surface of each part of the member 10.

For example, the white line WL1 is based on the reflected wave from the upper surface 13a of the welded portion 13. The white line WL2 is based on the reflected wave from the lower surface 13b of the welded portion 13. The white line WL3 is based on the multiple reflected wave reflected between the upper surface 13a and the lower surface 13b. Similarly, the white line WL4 is based on the reflected wave from the upper surface 11a of the metal plate 11. The white line WL5 is based on the reflected wave from the lower surface 11b of the metal plate 11. The white line WL6 is based on the multiple reflected wave reflected between the upper surface 11a and the lower surface 11b and the reflected wave from the lower surface 12b of the metal plate 12. Further, the white line WL0 is based on the reflected wave from the surface of the hard propagation member 133.

In the member 10 shown in FIG. 5, the lower surface 11b of the metal plate 11 is in contact with the upper surface 12a of the metal plate 12, and there is no space between these surfaces. Further, the thickness of the metal plate 11 is the same as the thickness of the metal plate 12. Therefore, the detection result shown in FIG. 6 does not include the reflected wave from the upper surface 12a of the metal plate 12. Further, the intervals between the white lines based on the reflected waves from the upper surface 11a, the lower surface 11b, and the lower surface 12b are substantially the same.

When setting the conditions, the processing apparatus 110 averages or integrates the intensities of at least a part of the detected reflected waves.
Specifically, the processing device 110 averages the intensities of at least a part of the reflected waves included in the first detection result, and calculates the first reference value. The processing device 110 averages the intensities of at least a part of the reflected waves included in the second detection result, and calculates the second reference value. Alternatively, the processing device 110 may integrate the intensities of at least a part of the reflected waves included in the first detection result and calculate the first reference value. The processing device 110 may integrate at least a part of the intensity of the reflected wave included in the second detection result to calculate the second reference value. When averaging or integrating the intensities, the processing device 110 may convert the intensity of the reflected wave into an absolute value. Alternatively, the processing device 110 may apply a predetermined process to each intensity so that the codes of the respective intensities are the same. The processing device 110 sets a value between the first reference value and the second reference value as the first threshold value.

When the detector 130 is away from the object, the reflected wave is weaker than when the detector 130 is in contact with the object. For example, when the stronger the reflected wave, the larger the positive value indicating the intensity, the second reference value is smaller than the first reference value. For example, the processing device 110 sets an intermediate value between the first reference value and the second reference value as the first threshold value. Even if the processing device 110 sets the first threshold value by adding or subtracting a value corresponding to the difference between the first reference value and the second reference value with respect to the first reference value or the second reference value. good.

When the condition (first threshold value) is set in step S1, the processing device 110 stores the condition in the storage device 120. In step S3, the processing device 110 executes the first determination using the conditions. Specifically, the processing device 110 calculates the first determination value using at least a part of the intensity of the reflected wave detected by the exploration in step S2. When calculating the first determination value, the same calculation as when calculating the first reference value and the second reference value is used. That is, when the first reference value and the second reference value are calculated by averaging the intensities, the first determination value is calculated by averaging the intensities in the same manner. When the intensities are integrated to calculate the first reference value and the second reference value, the intensities are integrated to calculate the first determination value.

The processing device 110 compares the first determination value with the first threshold value. For example, when the stronger the reflected wave, the larger the positive value indicating the intensity, the processing device 110 determines whether the first determination value exceeds the first threshold value. When the first determination value exceeds the first threshold value, the processing device 110 determines that the detector 130 is in contact with the welding target. When the first determination value is equal to or less than the first threshold value, the processing device 110 determines that the detector 130 is away from the welding target.

In the calculation of the first determination value, the intensities of all the detected reflected waves may be used, or the intensities of some of the detected reflected waves may be used. In order to reduce the amount of calculation and shorten the time required for determination, it is preferable to calculate the first determination value using only the intensity of a part of the reflected wave. When the first determination value is calculated using only the intensity of a part of the reflected wave, the first reference value and the second reference value are also a part of the reflection included in the first detection result and the second detection result. Each is calculated using the wave intensity.

FIG. 7 is a graph illustrating the intensity distribution of the reflected wave.
In FIG. 7, the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. FIG. 7 shows the intensity distribution of the reflected wave in the Z direction in one XZ cross section. Further, FIG. 7 shows the result of converting the reflected wave intensity into an absolute value.

A plurality of peaks appear in the intensity distribution shown in FIG. The peak Pe0 is based on the reflected wave from the interface between the rigid propagating member 133 and the couplant 15. The peak Pe1 is based on the reflected wave from the upper surface 13a of the welded portion 13. The peak Pe2 is based on the reflected wave from the lower surface 13b of the welded portion 13. The peak Pe3 and a plurality of periodic peaks thereafter are based on the multiple reflected waves between the upper surface 13a and the lower surface 13b. The white lines WL0 to WL3 shown in FIG. 6 correspond to peaks Pe0 to Pe3, respectively. Further, the plurality of peaks having a strength smaller than the peaks Pe0 to Pe3 are based on the reflected wave and the multiple reflected wave from the upper surface and the lower surface of the metal plates 11 and 12 other than the welded portion 13.

The peak Pe0 is based on the reflected wave from the interface between the rigid propagating member 133 and the couplant 15. Therefore, the peak Pe0 is detected regardless of the contact of the detector 130 with the target. Further, the position of the peak Pe0 is constant regardless of the contact of the detector 130 with the target. The intensities other than the peak Pe0 change depending on whether or not the detector 130 is in contact with the welding target. Therefore, when averaging or integrating the intensity of the reflected wave, it is preferable to use the intensity of the reflected wave detected after the peak Pe0.

In particular, in the inspection of the welded portion 13, ultrasonic waves are reflected by the lower surface 13b of the welded portion 13 and are multiplely reflected between the upper surface 13a and the lower surface 13b. The intensity of these reflected waves varies greatly depending on whether or not the detector 130 is in contact with the welding target. As shown in FIG. 7, the processing device 110 detects the intensity at the portion P1 where the reflected wave from the lower surface 13b of the welded portion 13 is detected and the multiple reflected wave between the upper surface 13a and the lower surface 13b. At least one of the intensities of the portion P2 is used for calculating the first determination value. As a result, in the first determination, the contact of the detector 130 with the welding target can be determined more accurately.

The range of the partial P1 and the partial P2 may be preset. The period of peaks other than peak Pe0 depends on the thickness of the welded portion 13. When the thickness of the welded portion 13 is known, the range of the portion P1 and the portion P2 can be set based on the thickness. The partial P2 may be set to include all the peaks after the peak Pe3, or may be set to include only a part of the peaks after the peak Pe3 as shown in FIG. 7.

For example, the processing device 110 extracts a first portion in which the multiple reflected wave is detected from the first detection result, averages or integrates the intensity of the reflected wave in the first portion, and calculates the first reference value. The processing device 110 extracts a second portion in which the multiple reflected wave is detected from the second detection result, averages or integrates the intensity of the reflected wave in the second portion, and calculates a second reference value.

Further, in FIGS. 6 and 7, the detection results in one XZ cross section are illustrated. The first determination value may be calculated based on the intensity distribution in one XZ cross section, or may be calculated based on the intensity distribution in one XZ cross section and one YZ cross section. The processing device 110 may generate an intensity distribution by averaging or integrating the intensities of at least a part of the XY planes at each point in the Z direction, and calculate the first determination value based on this intensity distribution.

For example, when the diameter of the welded portion 13 is known, the processing device 110 may set a range used for calculating the first determination value on the XY plane based on the diameter of the welded portion 13. The diameter of the welded portion 13 is the length of the welded portion 13 in the direction perpendicular to the direction in which the metal plates 11 and 12 are overlapped. The amount of calculation can be reduced by using only a part of the strength of the XY plane.

The user may be able to specify a range of detection results used for calculating the first determination value, the first reference value, and the second reference value through the user interface displayed on the display device 150.

FIG. 8 is an example of a user interface displayed on the display device.
For example, the processing device 110 causes the display device 150 to display the user interface 900 shown in FIG. For example, the user interface 900 displays the first image 910, the second image 920, and the third image 930. The first image 910 to the third image 930 represent the intensity of the reflected wave at each point. The points where the intensity of the reflected wave is high are shown in white. Here, the intensity of the reflected wave is schematically represented by binarizing it.

The first image 910 shows the result of integrating the intensity of the reflected wave in the Z direction at each point on the XY planes. The second image 920 represents the intensity of the reflected wave in the XX cross section at the center of the first image 910 in the Y direction. The third image 930 represents the intensity of the reflected wave in the YY cross section at the center of the first image 910 in the X direction.

For example, the user can operate the pointer 901 using the input device 140 to draw a border F1 or F2 on the second image 920 or the third image 930. For example, when one of the frame lines F1 and F2 is set, the other of the frame lines F1 and F2 is automatically set at the same position in the Z direction as one of the frame lines F1 and F2. The size of the frame line F1, the position of the frame line F1 in the X direction, the size of the frame line F2, and the position of the frame line F2 in the Y direction can be freely set by the user. Alternatively, the center of the frame line F1 in the X direction may be fixed to the center of the second image 920 in the X direction, and the center of the frame line F2 in the Y direction may be fixed to the center of the third image 930 in the Y direction. .. For example, when the user changes the size of one of the borders F1 and F2, the size of the other of the borders F1 and F2 may change accordingly.

For example, the user can adjust the size of the borders F1 and F2 by operating the pointer 901 and dragging and dropping the borders F1 and F2. When the sizes of the frame lines F1 and F2 are changed, the processing device 110 stores the positions of the changed frame lines F1 and F2. The processing device 110 calculates the first reference value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the first detection result. The processing device 110 calculates the second reference value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the second detection result. The processing device 110 calculates the first determination value based on the intensity of the reflected wave included in the frame lines F1 and F2 in the detection result obtained by the exploration in step S2.

The processing device 110 may set the first range based on the first reference value and the second reference value. The processing device 110 may set a first threshold value in addition to the first range. The lower limit value and the upper limit value of the first range are set between the first reference value and the second reference value. When the stronger the reflected wave, the larger the positive value indicating the intensity, the lower limit value and the upper limit value of the first range are larger than the second reference value and smaller than the first reference value. For example, the processing device 110 calculates the first intermediate value between the first reference value and the second reference value. The processing device 110 sets an intermediate value between the first intermediate value and the first reference value as an upper limit value of the first range. The processing device 110 sets an intermediate value between the first intermediate value and the second reference value as the lower limit value of the first range.

For example, the processing device 110 sets an intermediate value between the first intermediate value and the first reference value as the first threshold value. The first threshold may be set outside the first range. The processing device 110 stores the set first threshold value and the first range in the storage device 120.

When the first threshold value and the first range are set, the processing device 110 determines whether the first determination value is within the first range when the first determination value is equal to or less than the first threshold value. When the first determination value is outside the first range (less than the lower limit value of the first range), the processing device 110 determines that the detector 130 is away from the target. When the first determination value is equal to or greater than the lower limit value and equal to or less than the upper limit value of the first range, the processing device 110 determines that the state of the detector 130 cannot be specified.

When it is determined in step S3 that the detector 130 is away from the target or the state of the detector 130 cannot be specified, the processing device 110 notifies the user in step S4.

FIG. 9 is a graph illustrating the intensity distribution of the reflected wave.
9 (a) and 9 (b) show the intensity of the reflected wave at each point in the Z direction in one XZ cross section, as in FIG. 7. The processing apparatus 110 may set a condition regarding the period or position of the peak in step S1.

In step S1, a member 10 having the same structure as the object to be actually inspected is used. The detector 130 is brought into contact with the weld 13 to perform exploration. The processing device 110 generates an intensity distribution of the reflected wave in the Z direction from the detection result obtained when the detector 130 is in contact with the welded portion 13. The processing device 110 detects a peak existing in the intensity distribution. The processing device 110 extracts peaks Pe0 to Pe4 that exceed a preset threshold value TH1 from the detected peaks, for example, as shown in FIG. 9A. The processing device 110 removes the first peak Pe0 in the Z direction, leaving only the peaks Pe1 to Pe4 caused by the reflected wave from the member 10. The threshold value TH1 may be preset by the user, or may be set based on an average value in at least a part of the intensity distribution.

For example, the processing apparatus 110 calculates the average of the periods In1 to In3 between the peaks Pe1 to Pe4, as shown in FIG. 9A. The processing device 110 sets a condition regarding the peak period based on the average value. Alternatively, the processing device 110 may set conditions relating to the peak positions based on the respective positions of the peaks Pe1 to Pe4. For example, as shown in FIG. 9B, the processing apparatus 110 sets the peak ranges PRa1 to PRa4 based on the peaks Pe1 to Pe4. For example, the position of the center of the ranges PRa1 to PRa4 corresponds to the position of the maximum intensity of the peaks Pe1 to Pe4, respectively. The size of the peak range may be preset by the user, or may be set based on the full width at half maximum of the detected peak or the like. The processing device 110 stores the condition regarding the period or position of the peak in the storage device 120.

In the first determination, the processing device 110 extracts a peak having an intensity equal to or higher than the threshold value TH1 from the intensity distribution of the detected reflected wave.
The processing device 110 determines whether the period of the extracted peak satisfies the condition regarding the period of the peak set in step S1. For example, when the period of the extracted peak is (1-x) times or more (1 + x) times or less of the average value AVG of the peak period calculated in step S1, the processing apparatus 110 determines that the condition is satisfied. To do. x is preset by the user. Alternatively, x may be set based on the standard deviation of the peak period or the like.

Alternatively, the processing device 110 determines whether the extracted peak position satisfies the condition regarding the peak position set in step S1. For example, the processing device 110 determines whether the extracted peaks are located in the ranges PRa1 to PRa4 set in step S1. In the first determination, when the peak is located in the ranges PRa1 to PRa4, the processing apparatus 110 determines that the condition is satisfied.

The processing apparatus 110 may execute the first determination using both the condition regarding the peak period and the condition regarding the peak position.

Alternatively, the processing device 110 may determine the contact of the detector 130 based on the spectrum of the reflected wave intensity. In step S1, a member 10 having the same structure as the object to be actually inspected is used. The detector 130 is brought into contact with the weld 13 to perform exploration. The processing device 110 generates an intensity distribution of the reflected wave in the Z direction from the detection result obtained when the detector 130 is in contact with the welded portion 13. The processing device 110 spectrally analyzes the intensity distribution and generates a spectrum showing the relationship between the reciprocal of the thickness (mm) of the member and the reflected wave intensity. The Fourier transform is used for the spectrum analysis.

FIG. 10 is a graph illustrating the spectrum.
In FIG. 10, the horizontal axis represents the reciprocal of the thickness (mm) of the member, and the vertical axis represents the intensity of the reflected wave corresponding to each component of the horizontal axis. As shown in FIG. 5, ultrasonic waves are multiplely reflected at the metal plate 11, the metal plate 12, or the welded portion 13. Therefore, the intensity of the reflected wave has periodicity according to the thickness of the metal plate 11, the thickness of the metal plate 12, and the thickness of the welded portion 13. For example, when the thickness of the metal plate 11 and the thickness of the metal plate 12 are the same, the peak of the strength is the reciprocal of the thickness of the metal plates 11 and 12 and the reciprocal of the thickness of the welded portion 13 as shown in FIG. appear.

When the processing device 110 generates the spectrum in step S1, as shown in FIG. 10, the processing device 110 extracts a peak having an intensity equal to or higher than the threshold value TH2. The processing device 110 sets the conditions based on the reciprocal value V1 of the thickness at which each peak appears. After that, when the processing device 110 generates the spectrum in the first determination, the processing device 110 extracts a peak having an intensity of the threshold value TH2 or more. The processing device 110 determines whether the reciprocal value V2 of the thickness at which each peak appears satisfies the condition. For example, when the value V2, which is the reciprocal of the thickness at which each peak appears, is (1-y) times or more (1 + y) times or less the value V1, the processing apparatus 110 determines that the condition is satisfied. y is preset by the user. Alternatively, y may be set based on the standard deviation of the period or the like.

The peak period, peak position, or peak position in the spectrum is a value specific to the object to be welded. By using these values as the conditions for the first determination, it is possible to more accurately determine whether or not the detector 130 is in contact.

When the processing system 100 determines that the detector 130 is in contact with the welding target, the processing system 100 may calculate the inclination of the detector 130 or inspect the welded portion 13. Further, the processing system 100 may set a range of detection results used for calculating the inclination.

FIG. 11 is a flowchart showing the flow of inspection using the processing system according to the embodiment.
Steps S1 to S4 are executed in the same manner as the flowchart shown in FIG. When it is determined in step S3 that the detector 130 is in contact with the welding target, the processing device 110 determines in the detection result whether the range corresponding to the reflected wave from the welded portion 13 has been estimated (step S5). ). If the range has not yet been estimated, the processor 110 estimates the range (step S6).

For example, as shown in FIGS. 5, 6 and 8, ultrasonic waves are reflected from surfaces other than the welded portion 13. The processing device 110 estimates a range corresponding to the reflected wave from the welded portion 13, and calculates the subsequent inclination based on the reflected wave included in this range. As a result, the required amount of calculation can be reduced. In addition, the accuracy of the calculated inclination can be improved.

The processing device 110 calculates the inclination of the detector 130 based on the detection result of the reflected wave within the estimated range (step S7). It is determined whether the calculated slope is within the permissible range (step S8). The determination may be executed by the user or may be executed by the processing device 110. When the processing device 110 determines, the permissible range may be preset by the user or may be set based on the history of past inspection results.

For example, when the processing device 110 executes the inspection of the welded portion 13, the processing device 110 also measures the diameter of the welded portion 13 based on the detection result. The diameter of the welded portion 13 corresponds to the length of the portion where the reflected wave from the upper surface and the lower surface of the welded portion 13 is detected in the X direction and the Y direction. For example, if the inclination of the detector 130 is too large, the diameter of the welded portion 13 is calculated to be smaller than the actual diameter. As the inclination of the detector 130 becomes smaller, the calculated diameter of the welded portion 13 becomes larger. When the inclination of the detector 130 becomes sufficiently small, the calculated diameter of the welded portion 13 hardly changes. The storage device 120 stores the relationship between the inclination of the detector 130 calculated in the past and the diameter of the welded portion 13. Based on the data stored in the storage device 120, the processing device 110 determines a boundary value at which the change in the diameter of the welded portion 13 becomes smaller with respect to the change in the inclination of the detector 130. The processing device 110 sets the size of the allowable range based on this boundary value. For example, the processing device 110 sets the boundary value as the size of the allowable range. Alternatively, in order to further improve the accuracy of the inspection, the processing device 110 may set a smaller value calculated based on the boundary value as an allowable range.

When performing steps S6 and S7, the search by the detector 130 may be performed again. Preferably, when executing steps S6 and S7, the detection result used in the first determination in step S3 is used. As a result, the number of times the exploration is executed can be reduced, and the amount of calculation in the processing device 110 and the detector 130 can be reduced.

When the tilt is not within the permissible range, the user adjusts the tilt of the detector 130 (step S9). When the processing device 110 executes step S8, the user may be notified that the inclination is not within the allowable range. After step S9, step S2 is executed again with the tilt after adjustment. As a result, even after adjusting the inclination, it is determined again whether the detector 130 is in contact with the welding target. As a result, after adjusting the inclination, it is possible to prevent the inclination from being calculated again by using the detection result when the detector 130 is not in contact with the detector 130.

Alternatively, after adjusting the inclination and executing the search in step S2, step S3 may be omitted. In step S3 before adjusting the inclination, it is determined that the detector 130 is in contact with the welding target. Therefore, it is unlikely that the detector 130 is separated from the weld target after adjusting the tilt. By omitting step S3, the amount of calculation of the processing device 110 can be reduced.

When the tilt is within the permissible range, the inspection is performed (step S10). When the user compares the tilt with the tolerance, the user causes the processor 110 to perform the inspection when the tilt is within the tolerance. When the processing device 110 compares the tilt with the permissible range, the processing device 110 automatically performs the inspection when the tilt is within the permissible range. The processing device 110 outputs the inspection result to the display device 150 (step S11). The inspection result includes information indicating whether or not the weld is welded, the diameter of the welded portion, the minimum diameter of the welded portion, the maximum diameter of the welded portion, and the like.

An example of specific processing for range estimation, slope calculation, and inspection will be described below.

(Estimation of range)
Step S6 will be specifically described with reference to FIGS. 12 to 19.
For example, in FIG. 6, the detection result of the reflected wave is represented two-dimensionally. The detected result of the reflected wave may be represented three-dimensionally. For example, the member 10 is represented by a plurality of voxels. Coordinates in the X, Y, and Z directions are set for each voxel. Based on the reflected wave detection result, the reflected wave intensity is associated with each voxel. The processing device 110 estimates a range (a group of voxels) corresponding to the welded portion 13 in a plurality of voxels.

The number of voxels to be set and the size of each voxel may be automatically determined or may be set by the user through the user interface 900.

12 (a) and 12 (b) are graphs illustrating the intensity distribution of the reflected wave in the Z direction in one cross section.
FIG. 13 is a graph illustrating the intensity distribution of the reflected wave in the Z direction.
The processing device 110 generates an intensity distribution of the reflected wave in the Z direction based on the detection result of the reflected wave. 12 (a) and 12 (b) are examples thereof. If an intensity distribution has already been generated when determining the contact of the detector 130, that intensity distribution may be used. In FIGS. 12 (a) and 12 (b), the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. FIG. 12A illustrates the intensity distribution of the reflected wave in the Z direction in one XZ cross section. FIG. 12B illustrates the intensity distribution of the reflected wave in the Z direction in one YZ cross section. 12 (a) and 12 (b) show the result of converting the reflected wave intensity into an absolute value.

Alternatively, the processing device 110 may add up the reflected wave intensities in the XY planes at each point in the Z direction to generate an intensity distribution of the reflected waves in the Z direction. FIG. 13 is an example thereof. In FIG. 13, the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. FIG. 13 shows the result of converting the reflected wave intensity into an absolute value and subtracting the average value of the reflected wave intensity from the reflected wave intensity at each point in the Z direction.

The intensity distribution of the reflected wave in the Z direction includes a component reflected on the upper surface 13a and the lower surface 13b of the welded portion 13 and a component reflected on the upper surface and the lower surface of the other portion. The processing device 110 extracts only the components reflected by the upper surface 13a and the lower surface 13b of the welded portion 13 from the intensity distribution of the reflected wave by filtering. For example, a value corresponding to an integral multiple of half the thickness of the welded portion 13 in the Z direction (distance between the upper surface 13a and the lower surface 13b) is set in advance. The processing device 110 refers to the value and extracts only the periodic component of the value.

As the filtering, a bandpass filter, a zero phase filter, a lowpass filter, a highpass filter, a threshold value determination for the intensity after the filter, or the like can be used.

FIG. 14 is a graph illustrating the result of filtering the intensity distribution of the reflected wave.
In FIG. 14, the horizontal axis represents the position in the Z direction, and the vertical axis represents the intensity of the reflected wave. As shown in FIG. 14, as a result of filtering, only the components reflected on the upper surface and the lower surface of the welded portion are extracted.

The processing device 110 estimates the range of the welded portion in the Z direction based on the extraction result. For example, the processing device 110 detects a peak included in the extraction result. The processing device 110 detects the position of the first peak in the Z direction and the position of the second peak in the Z direction. Based on these positions, the processing apparatus 110 estimates, for example, the range Ra1 shown in FIG. 14 as the range of the welded portion in the Z direction.

Depending on the structure of the welded portion, the configuration of the element array 131, etc., the sign of the reflected wave intensity from the upper surface of the welded portion (positive or negative) and the sign of the reflected wave intensity from the lower surface of the welded portion may be reversed from each other. is there. In this case, the processing apparatus 110 may detect one of the positive and negative peaks and the other positive and negative peaks. The processing device 110 estimates the range of the welded portion in the Z direction with reference to the positions of these peaks. Further, depending on the processing to the reflected wave intensity, the reflected wave intensity may be represented by only one of a positive value and a negative value. In this case, the range of the weld in the Z direction may be estimated based on the positions of the plurality of peaks, the positions of the peaks and the bottoms, or the positions of the plurality of bottoms. It may be estimated. That is, the processing device 110 estimates the range of the reflected wave intensity after filtering in the Z direction of the welded portion based on the positions of a plurality of extreme values.

When the intensity distribution of the reflected wave in each of the XZ cross section and the YZ cross section is generated, the range in the Z direction based on the intensity distribution in the XZ cross section and the Z direction based on the intensity distribution in the YZ cross section. The range and is estimated. For example, the processing device 110 calculates an average, a weighted average, a weighted moving average, and the like for these plurality of estimation results, and estimates the calculation result as a range in the Z direction of the entire welded portion.

Alternatively, the processing device 110 estimates the range of the welded portion in the Z direction based on the intensity distribution of the reflected wave in one of the XZ cross section and the YZ cross section, and estimates the range in the Z direction of the entire welded portion in the Z direction. It may be regarded as the range in. The processing device 110 estimates the range of the welded portion in the Z direction based on the intensity distribution of the reflected wave in a part of the X direction and a part of the Y direction, and estimates the range of the estimated result in the Z direction of the entire welded portion. It may be regarded as. According to these processes, the amount of calculation required to generate the intensity distribution of the reflected wave can be reduced.

In the example of FIG. 14, the position of the lower limit of the range Ra1 in the Z direction is set to a value obtained by subtracting a predetermined value from the position of the first peak in the Z direction. The position of the upper limit of the range Ra1 in the Z direction is set to a value obtained by adding a predetermined value from the position of the second peak in the Z direction. By doing so, when the upper surface and the lower surface of the welded portion are tilted with respect to the arrangement direction of the detection elements 132, the second peak is in the Z direction at any point on the XY plane of the welded portion. It is possible to suppress the deviation from the range of.

After estimating the Z-direction range of the weld, the processing apparatus 110 estimates the X-direction range and the Y-direction range of the weld.
15 and 17 are schematic views illustrating the detection result of the reflected wave.
In FIGS. 15 and 17, the region R represents the entire region where the detection result of the reflected wave is obtained by the element array 131. One cross section of the region R includes reflected wave components on the upper and lower surfaces of the welded portion and reflected wave components on the upper and lower surfaces of the other portions.

The processing device 110 generates an intensity distribution of the reflected wave on the XY planes at each point in the Z direction. The processing device 110 may generate an intensity distribution within a preset range in the Z direction. As a result, the amount of calculation can be reduced. Alternatively, the processing apparatus 110 may generate an intensity distribution within the estimated range in the Z direction. As a result, it is possible to prevent the reflected wave component from coming off from the lower surface of the welded portion when generating the intensity distribution of the reflected wave on the XY plane while reducing the amount of calculation.

16 (a) to 16 (c) are examples of the intensity distribution of the reflected wave on the XY plane. FIG. 16A shows the intensity distribution of the reflected wave on the XY plane at the coordinates Z = 1. FIG. 16B shows the intensity distribution of the reflected wave on the XY plane at the coordinates Z = 2. FIG. 16C shows the intensity distribution of the reflected wave on the XY plane at the coordinates Z = 350. In FIGS. 15, 16 (a) to 16 (c), and FIG. 17, the intensity of the reflected wave is schematically represented by binarization.

The processing device 110 calculates the position of the center of gravity of the intensity distribution of the reflected wave on the XY plane at each point in the Z direction. Here, the position of the center of gravity of the intensity distribution is obtained by calculating the position of the center of gravity of the image showing the intensity distribution. For example, as shown in FIGS. 16A to 16C, the processing device 110 calculates the positions C1 to C350 of the center of gravity in each image. In FIG. 17, the line segment L represents the result of connecting all the positions of the center of gravity from Z = 0 to Z = 350.

The processing device 110 averages the position of the center of gravity from Z = 0 to Z = 350. As a result, the average position of the center of gravity in the X direction and the average position of the center of gravity in the Y direction can be obtained. In FIG. 17, the average position AP represents the average position of the center of gravity in the X direction and the average position of the center of gravity in the Y direction. The processing device 110 sets a predetermined range in each of the X direction and the Y direction about the average position AP as the range Ra2 in the X direction of the welded portion and the range Ra3 in the Y direction of the welded portion.

For example, in order to estimate the range Ra2 and the range Ra3, a value V indicating the diameter of the detector 130 (element array 131) is preset. The processing device 110 sets AP-V / 2 to AP + V / 2 as a range Ra2 and a range Ra3, respectively, in the X direction and the Y direction. In this case, the estimated range on the XY plane is rectangular. Not limited to this example, the estimated range on the XY plane may be a polygonal shape or a circular shape having five or more angles. The shape of the estimated range on the XY plane can be appropriately changed according to the shape of the welded portion.

The range Ra2 and the range Ra3 may be determined using another value based on the value V. Instead of the value indicating the diameter of the detector 130, a value indicating the diameter of the welded portion may be set in advance. This is because the diameter of the welded portion corresponds to the diameter of the detector 130. The value indicating the diameter of the welded portion can be substantially regarded as the value indicating the diameter of the detector 130.

By the above processing, the range Ra1 in the Z direction, the range Ra2 in the X direction, and the range Ra3 in the Y direction of the welded portion are estimated. After the range is estimated, step S7 shown in FIG. 11 is executed based on the detection result of the reflected wave in the estimated range.

FIG. 18 is a flowchart showing a flow of range estimation in the processing system according to the embodiment.
The processing device 110 generates an intensity distribution of the reflected wave in the Z direction based on the detection result of the reflected wave by the detector 130 (step S601). The processing device 110 filters the strength distribution based on the value of the thickness of the weld (step S602). As a result, only the reflected wave component in the welded portion 13 is extracted from the intensity distribution. The processing apparatus 110 estimates the range of the welded portion in the Z direction based on the extraction result (step S603). The processing device 110 calculates the position of the center of gravity of the reflected wave intensity on the XY plane at each point in the Z direction (step S604). The processing device 110 calculates the average position by averaging the calculated positions of the plurality of centers of gravity (step S605). The processing apparatus 110 estimates the respective ranges in the X direction and the Y direction based on the average position and the diameter of the detector 130 (step S606).

The estimation of the range in the Z direction may be executed after the estimation of the range in the X direction and the Y direction. For example, in the flowchart shown in FIG. 18, steps S601 to S603 may be executed after steps S604 to S606. In this case, the processing device 110 may calculate the intensity distribution of the reflected wave in the Z direction based on the estimated range of the X direction and the Y direction. As a result, the amount of calculation can be reduced.

(Calculation of slope)
FIG. 19 is an image illustrating the detection result of the reflected wave.
In FIG. 19, the whiter the color, the higher the intensity of the reflected wave at that point. The processing device 110 executes the operation shown in FIG. 18 with respect to the detection result shown in FIG. As a result, the range Ra is estimated.

Hereinafter, a specific example of the method of calculating the slope in the range Ra will be described.
FIG. 20 is a diagram for explaining processing by the processing system according to the embodiment.
21 and 22 are examples of images obtained by the processing system according to the embodiment.

FIG. 21 is three-dimensional volume data drawn based on the detection result of the reflected wave. FIG. 22A shows the surface of the welded portion 13 in the volume data shown in FIG. FIG. 22B shows a YY cross section in the vicinity of the welded portion 13 in the volume data shown in FIG. 21. FIG. 22 (c) shows an XX cross section in the vicinity of the welded portion 13 in the volume data shown in FIG. 21. In FIGS. 22 (b) and 22 (c), the upper side is the surface of the welded portion, and the data in the depth direction is shown downward. The portion having high brightness is the portion having high reflection intensity of ultrasonic waves. The ultrasonic waves are strongly reflected by the bottom surface of the welded portion 13, the surface between the unjoined members, and the like.

The inclination of the detector 130 corresponds to the angle between the direction 13d perpendicular to the weld 13 and the direction 130a of the detector 130 shown in FIG. This angle is represented by an angle θx around the X direction and an angle θy around the Y direction. The direction 130a of the detector 130 is perpendicular to the arrangement direction of the detection elements 132.

The angle θx is calculated based on the detection result in the YY cross section as shown in FIG. 22 (b). The angle θy is calculated based on the detection result in the XZ cross section as shown in FIG. 22 (c). The processing device 110 calculates the average of the three-dimensional luminance gradients as angles θx and θy for each cross section. The processing device 110 stores the calculated angles θx and θy in the storage device 120 as the inclination of the detector 130. The processing device 110 may display the calculated inclination on the display device 150.

(Inspection)
FIG. 23 is a schematic diagram for explaining an inspection method by the processing system according to the embodiment.
As shown in FIG. 23A, a part of the ultrasonic US is reflected by the upper surface 11a of the metal plate 11 or the upper surface 13a of the welded portion 13. Another part of the ultrasonic US is incident on the member 10 and reflected by the lower surface 11b of the metal plate 11 or the lower surface 13b of the welded portion 13.

The positions of the upper surface 11a, the upper surface 13a, the lower surface 11b, and the lower surface 13b in the Z direction are different from each other. That is, the distances between these surfaces and the detection element 132 in the Z direction are different from each other. When the detection element 132 receives the reflected wave from these surfaces, the peak of the intensity of the reflected wave is detected. By calculating the time until each peak is detected after transmitting the ultrasonic US, it is possible to investigate on which surface the ultrasonic US is reflected.

23 (b) and 23 (c) are graphs illustrating the relationship between the time after the ultrasonic US is transmitted and the intensity of the reflected wave RW. In FIGS. 23 (b) and 23 (c), the vertical axis represents the elapsed time after the ultrasonic US is transmitted. The horizontal axis represents the intensity of the detected reflected wave RW. Here, the intensity of the reflected wave RW is represented by an absolute value. The graph of FIG. 23B illustrates the detection result of the reflected wave RW from the upper surface 11a and the lower surface 11b of the metal plate 11. The graph of FIG. 23C illustrates the detection result of the reflected wave RW from the upper surface 13a and the lower surface 13b of the welded portion 13.

In the graph of FIG. 23B, the first peak Pe11 is based on the reflected wave RW from the upper surface 11a. The second peak Pe12 is based on the reflected wave RW from the lower surface 11b. The times when the peak Pe11 and the peak Pe12 are detected correspond to the positions of the upper surface 11a and the lower surface 11b of the metal plate 11 in the Z direction, respectively. The time difference TD1 between the time when the peak Pe11 is detected and the time when the peak Pe12 is detected corresponds to the distance Di1 in the Z direction between the upper surface 11a and the lower surface 11b.

Similarly, in the graph of FIG. 23 (c), the first peak Pe13 is based on the reflected wave RW from the upper surface 13a. The second peak Pe14 is based on the reflected wave RW from the lower surface 13b. The time at which the peak Pe13 and the peak Pe14 are detected correspond to the positions of the upper surface 13a and the lower surface 13b of the welded portion 13 in the Z direction, respectively. The time difference TD2 between the time when the peak Pe13 is detected and the time when the peak Pe14 is detected corresponds to the distance Di2 in the Z direction between the upper surface 13a and the lower surface 13b.

The processing apparatus 110 determines whether the time difference between the peaks corresponds to the thickness of the welded portion 13 at each point in the XY plane. If it is determined that the time difference between the peaks corresponds to the thickness of the welded portion 13, it is determined that the weld is welded at that point. The set of points determined to be welded corresponds to the welded portion 13. Therefore, the diameter of the welded portion 13 can be calculated based on the size of the set of points. For example, the processing device 110 compares the calculated diameter of the welded portion 13 with a preset threshold value to determine the quality of welding.

Further, the upper surface 13a and the lower surface 13b of the welded portion 13 may be inclined with respect to the upper surface 11a of the metal plate 11. This is based on the fact that the welded portion 13 includes the solidified portion 14, and that the shape is deformed during the welding process. In this case, it is desirable that the ultrasonic US is transmitted along a direction that is averagely perpendicular to the upper surface 13a or the lower surface 13b. As a result, ultrasonic waves are more strongly reflected on the upper surface 13a and the lower surface 13b, and the accuracy of the inspection can be improved.

(Modification example)
The inspection of the welded portion described above may be automatically performed by the robot.
FIG. 24 is a schematic diagram showing a configuration of a processing system according to a modified example of the embodiment.
FIG. 25 is a perspective view showing a part of the processing system according to the modified example of the embodiment.

The processing system 100a shown in FIG. 24 includes a processing device 110 and a robot 160. The robot 160 includes a detector 130, an image pickup device 161, a coating device 162, an arm 163, and a control device 164.

The image pickup apparatus 161 photographs the welded member and acquires an image. The image pickup apparatus 161 extracts the welding mark from the image and detects the approximate position of the welded portion 13. The coating device 162 coats the coplant on the upper surface of the welded portion 13.

The detector 130, the imaging device 161 and the coating device 162 are provided at the tip of the arm 163 as shown in FIG. 25. Arm 163 is, for example, a 6-DOF vertical articulated robot that includes multiple links and multiple axes of rotation. The arm 163 includes a plurality of actuators (eg, a motor). Each of the plurality of actuators operates a plurality of rotation axes. By driving the arm 163, the detector 130, the image pickup device 161 and the coating device 162 can be displaced. The control device 164 controls the operation of each component (detector 130, image pickup device 161, coating device 162, arm 163) of the robot 160.

FIG. 26 is a flowchart showing the operation of the processing system according to the modified example of the embodiment.
First, before the operation of the processing system 100a, the conditions for determining the contact of the detector 130 with the welding target are set in advance. The condition setting method is as described above. After setting the conditions, the processing device 110 transmits the coordinates of the welded portion 13 stored in the storage device 120 to the control device 164. The control device 164 drives the arm 163 and moves the tip of the arm toward the received coordinates (step S21). When the detector 130 is moved to the vicinity of the received coordinates, the image pickup apparatus 161 photographs the member 10 and detects the detailed position of the welded portion 13 from the acquired image (step S22). The control device 164 drives the arm 163 to move the coating device 162 to the vicinity of the detected position (step S23). The coating device 162 applies the coplant to the welded portion 13 (step S24). The control device 164 drives the arm 163 and moves the detector 130 so that the tip of the detector 130 comes into contact with the welded portion 13 coated with the couplant (step S25). After that, steps S2 to S11 are executed in the same manner as steps S2 to S11 in the flowchart shown in FIG.

When it is determined that the detector 130 is not in contact with the welding target as a result of the first determination in step S3, the processing system 100a may execute an operation other than the notification. For example, the processing system 100a may further move the tip of the detector 130 toward the weld imaged in step S22. Depending on the shape of the light hitting the weld at the time of shooting, the position of the weld may be erroneously detected. By moving the tip of the detector 130, the tip of the detector 130 may come into proper contact with the weld. Alternatively, the processing system 100a may execute step S22 again. At this time, the processing system 100a may change the image processing conditions, the welding portion position detection conditions, and the like from the immediately preceding conditions. This allows the position of the weld to be detected more accurately. After detecting the position of the welded portion, for example, step S23 and subsequent steps are executed again. In addition to these operations, the processing system 100a may further perform notification.

In the processing system 100a according to the modified example, another movable mechanism having two or more degrees of freedom including an actuator may be provided instead of the arm 163. The detector 130 is attached to a movable mechanism. For example, the movable mechanism includes at least one selected from a 6-DOF parallel link mechanism, a 6-DOF horizontal articulated mechanism, and a 2-DOF Gonio head. The control device 164 controls and drives the movable mechanism. When the movable mechanism operates, the inclination of the detector 130 changes. When the degree of freedom of the movable mechanism is less than 6 degrees of freedom, it is preferable that the member 10 is conveyed so as to come into contact with the detector 130 by a transfer mechanism (not shown). The operation of the transport mechanism may be controlled based on the result of the first determination.

FIG. 27 is a block diagram showing the hardware configuration of the system.
For example, the processing device 110 of the processing system 100 according to the embodiment is a computer, and is a ROM (Read Only Memory) 111, a RAM (Random Access Memory) 112, a CPU (Central Processing Unit) 113, and an HDD (Hard Disk Drive). It has 114.

The ROM 111 stores a program that controls the operation of the computer. The ROM 111 stores a program necessary for the computer to realize each of the above-described processes.

The RAM 112 functions as a storage area in which the program stored in the ROM 111 is expanded. The CPU 113 includes a processing circuit. The CPU 113 reads the control program stored in the ROM 111 and controls the operation of the computer according to the control program. Further, the CPU 113 expands various data obtained by the operation of the computer into the RAM 112. The HDD 114 stores data necessary for reading and data obtained in the process of reading. The HDD 114 functions as, for example, the storage device 120 shown in FIG.

The processing device 110 may have an eMMC (embedded Multi Media Card), an SSD (Solid State Drive), an SSHD (Solid State Hybrid Drive), or the like instead of the HDD 114.

Each process and function of the processing device 110 may be realized by the cooperation of more computers.

The input device 140 includes at least one of a mouse, a keyboard, and a touchpad. The display device 150 includes at least one of a monitor and a projector. A device that functions as both an input device 140 and a display device 150, such as a touch panel, may be used.

In the above, an example of inspecting the welded portion 13 spot-welded by the processing system 100 or 100a has been described. Not limited to this example, the processing system 100 or 100a may inspect the members welded by other methods. For example, the processing system 100 or 100a may inspect arc welded, laser welded, or seam welded members. Non-destructive inspection using the detector 130 is also possible for the members welded by these methods.

By using the processing system and processing method according to the embodiment described above, the contact of the detector with the welding target can be determined more accurately. By executing the contact determination of the detector with the welding target, it is possible to improve the accuracy of the inclination calculation or inspection executed thereafter. Further, the same effect can be obtained by using a program for operating the computer as a processing system.

The above-mentioned various data processing can be performed by a computer as a program that can be executed by a magnetic disk (flexible disk, hard disk, etc.), an optical disk (CD-ROM, CD-R, CD-RW, DVD-ROM, DVD ± R). , DVD ± RW, etc.), semiconductor memory, or other recording medium.

For example, the data recorded on the recording medium can be read by a computer (or an embedded system). In the recording medium, the recording format (storage format) is arbitrary. For example, the computer reads a program from the recording medium and causes the CPU to execute the instructions described in the program based on the program. In the computer, the acquisition (or reading) of the program may be performed through the network.

Although some embodiments of the present invention have been illustrated above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other embodiments, and various omissions, replacements, changes, etc. can be made without departing from the gist of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are also included in the scope of the invention described in the claims and the equivalent scope thereof. Moreover, each of the above-described embodiments can be implemented in combination with each other.

10 members, 11 metal plate, 11a upper surface, 11b lower surface, 12 metal plate, 12a upper surface, 12b lower surface, 13 welded part, 13a upper surface, 13b lower surface, 14 solidification part, 15 pump plant, 100, 100a processing system, 110 processing equipment 120 storage device, 130 detector, 131 element array, 132 detection element, 133 rigid propagation member, 140 input device, 150 display device, 160 robot, 161 imaging device, 162 coating device, 163 arm, 164 control device, 900 user interface , 901 pointer, 910 first image, 920 second image, 930 third image, RW reflected wave

Claims (20)

When the reflected wave is detected by a detector that includes a plurality of detecting elements arranged in the first direction and transmits ultrasonic waves toward the welding target to detect the reflected wave, the detector is based on the detection result. A processing system including a processing device that executes a first determination for determining whether or not is in contact with the welding target. When the processing device determines that the detector is in contact with the welding target, the processing device calculates the inclination of the detector with respect to the welding target or inspects the welding target based on the detection result. Item 1. The processing system according to item 1. When the processing device determines that the detector is in contact with the welding target, the processing device calculates the inclination of the detector with respect to the welding target or the welding based on the detection result used in the first determination. The processing system according to claim 1, wherein the target inspection is performed. The processing apparatus is any one of claims 1 to 3 that extracts a portion where a multiple reflected wave is detected from the detection result and executes the first determination based on the reflected wave in the extracted portion. The processing system described in. 4. The processing apparatus executes the first determination by comparing the first determination value obtained by integrating or averaging the intensities of the reflected waves in the extracted portion with a preset first threshold value. The processing system described. The processing device is
From the first detection result of the reflected wave when the detector is brought into contact with the member, the first portion where the multiple reflected wave is detected is extracted, and the intensity of the reflected wave in the first portion is averaged or integrated. Calculate the first reference value
From the second detection result of the reflected wave when the member and the detector are separated, a second portion in which the multiple reflected wave is detected is extracted, and the intensity of the reflected wave in the second portion is averaged or integrated. Calculate the second reference value
The first threshold value is set between the first reference value and the second reference value.
The processing system according to claim 5. Claim 1 that the processing apparatus executes the first determination by comparing the peak period, peak position, or spectrum position of the reflected wave included in the detection result with preset conditions. The processing system according to any one of 3 to 3. The processing system according to any one of claims 1 to 7, wherein the processing device notifies the user when it is determined that the detector is not in contact with the welding target. With the detector
A movable mechanism that includes an actuator and to which the detector is attached,
A control device that controls the detector and the movable mechanism, and
The processing system according to any one of claims 1 to 8, further comprising. The processing system according to any one of claims 1 to 9, further comprising a display device for displaying a user interface including an image showing the detection result. The processing device is
In the user interface, the specification of the range input by the user for the image is accepted.
The first determination is executed by comparing the first determination value obtained by integrating or averaging the intensities of the reflected waves in the designated range with a preset first threshold value.
The processing system according to claim 10. When the reflected wave is detected by a detector that includes a plurality of detecting elements arranged in the first direction and transmits ultrasonic waves toward the welding target to detect the reflected wave, the detector is based on the detection result. A processing method for executing a first determination for determining whether or not is in contact with the welding target. The process according to claim 12, wherein when it is determined that the detector is in contact with the welding target, the inclination of the detector with respect to the welding target is calculated or the welding target is inspected based on the detection result. Method. The processing method according to claim 12 or 13, wherein a portion where a multiple reflected wave is detected is extracted from the detection result, and the first determination is executed based on the reflected wave in the extracted portion. The 12 or 13 claim, wherein the first determination is executed by comparing the peak period, the peak position, or the spectral position of the reflected wave included in the detection result with a preset condition. Processing method. On the computer
When the reflected wave is detected by a detector that includes a plurality of detecting elements arranged in the first direction and transmits ultrasonic waves toward the welding target to detect the reflected wave, the detector is based on the detection result. Is made to execute the first determination of determining whether or not is in contact with the welding target.
program. When it is determined that the detector is in contact with the welding target, a request is made to cause the computer to calculate the inclination of the detector with respect to the welding target or inspect the welding target based on the detection result. Item 16. The program according to item 16. On the computer
The part where the multiple reflected wave is detected is extracted from the detection result, and the part is extracted.
The first determination is executed based on the reflected wave in the extracted portion.
The program according to claim 16 or 17. 16. The first determination is executed by having the computer compare the peak period, the peak position, or the spectral position of the reflected wave included in the detection result with a preset condition. The program according to 17. A storage medium that stores the program according to any one of claims 16 to 19.

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