JP2021046538A - Resin composition and thermally cured product - Google Patents
Resin composition and thermally cured product Download PDFInfo
- Publication number
- JP2021046538A JP2021046538A JP2020141643A JP2020141643A JP2021046538A JP 2021046538 A JP2021046538 A JP 2021046538A JP 2020141643 A JP2020141643 A JP 2020141643A JP 2020141643 A JP2020141643 A JP 2020141643A JP 2021046538 A JP2021046538 A JP 2021046538A
- Authority
- JP
- Japan
- Prior art keywords
- hollow particles
- resin composition
- group
- polyamic acid
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 38
- 239000002245 particle Substances 0.000 claims abstract description 113
- 229920005575 poly(amic acid) Polymers 0.000 claims abstract description 44
- 150000001875 compounds Chemical class 0.000 claims abstract description 31
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 36
- 229920001187 thermosetting polymer Polymers 0.000 claims description 24
- 125000004432 carbon atom Chemical group C* 0.000 claims description 21
- 238000004519 manufacturing process Methods 0.000 claims description 19
- 125000005529 alkyleneoxy group Chemical group 0.000 claims description 17
- 125000000217 alkyl group Chemical group 0.000 claims description 7
- 125000003342 alkenyl group Chemical group 0.000 claims description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 239000004925 Acrylic resin Substances 0.000 claims 1
- 229920000178 Acrylic resin Polymers 0.000 claims 1
- 239000011248 coating agent Substances 0.000 abstract description 13
- 238000000576 coating method Methods 0.000 abstract description 13
- 238000009413 insulation Methods 0.000 abstract description 2
- 238000002955 isolation Methods 0.000 abstract 1
- -1 2,3-dicarboxyphenyl Chemical group 0.000 description 45
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 40
- 239000002243 precursor Substances 0.000 description 29
- 239000011347 resin Substances 0.000 description 26
- 229920005989 resin Polymers 0.000 description 26
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 24
- 238000000034 method Methods 0.000 description 24
- 239000004642 Polyimide Substances 0.000 description 23
- 229920001721 polyimide Polymers 0.000 description 23
- 239000004962 Polyamide-imide Substances 0.000 description 20
- 229920002312 polyamide-imide Polymers 0.000 description 20
- 239000002904 solvent Substances 0.000 description 19
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 19
- 150000004985 diamines Chemical class 0.000 description 17
- 239000000377 silicon dioxide Substances 0.000 description 16
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 14
- 238000003756 stirring Methods 0.000 description 14
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 13
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 7
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 7
- 239000004926 polymethyl methacrylate Substances 0.000 description 7
- SRPWOOOHEPICQU-UHFFFAOYSA-N trimellitic anhydride Chemical compound OC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 SRPWOOOHEPICQU-UHFFFAOYSA-N 0.000 description 7
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 6
- 239000002253 acid Substances 0.000 description 6
- 239000013530 defoamer Substances 0.000 description 6
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000000178 monomer Substances 0.000 description 6
- 239000011148 porous material Substances 0.000 description 6
- 125000002723 alicyclic group Chemical group 0.000 description 5
- 125000003118 aryl group Chemical group 0.000 description 5
- 239000002585 base Substances 0.000 description 5
- 230000015556 catabolic process Effects 0.000 description 5
- 125000005442 diisocyanate group Chemical group 0.000 description 5
- 239000002270 dispersing agent Substances 0.000 description 5
- 239000003973 paint Substances 0.000 description 5
- ALSTYHKOOCGGFT-KTKRTIGZSA-N (9Z)-octadecen-1-ol Chemical group CCCCCCCC\C=C/CCCCCCCCO ALSTYHKOOCGGFT-KTKRTIGZSA-N 0.000 description 4
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 4
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 4
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 4
- 150000004984 aromatic diamines Chemical class 0.000 description 4
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000002612 dispersion medium Substances 0.000 description 4
- GAEKPEKOJKCEMS-UHFFFAOYSA-N gamma-valerolactone Chemical compound CC1CCC(=O)O1 GAEKPEKOJKCEMS-UHFFFAOYSA-N 0.000 description 4
- 230000005484 gravity Effects 0.000 description 4
- 229910010272 inorganic material Inorganic materials 0.000 description 4
- 239000011147 inorganic material Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 229940055577 oleyl alcohol Drugs 0.000 description 4
- XMLQWXUVTXCDDL-UHFFFAOYSA-N oleyl alcohol Natural products CCCCCCC=CCCCCCCCCCCO XMLQWXUVTXCDDL-UHFFFAOYSA-N 0.000 description 4
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
- 238000006116 polymerization reaction Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 239000011163 secondary particle Substances 0.000 description 4
- 229920000428 triblock copolymer Polymers 0.000 description 4
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 4
- 229920002554 vinyl polymer Polymers 0.000 description 4
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 3
- WVDDGKGOMKODPV-UHFFFAOYSA-N Benzyl alcohol Chemical compound OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 description 3
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 3
- 239000005977 Ethylene Substances 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 125000001931 aliphatic group Chemical group 0.000 description 3
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- MYRTYDVEIRVNKP-UHFFFAOYSA-N 1,2-Divinylbenzene Chemical compound C=CC1=CC=CC=C1C=C MYRTYDVEIRVNKP-UHFFFAOYSA-N 0.000 description 2
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 2
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 2
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 2
- FYYYKXFEKMGYLZ-UHFFFAOYSA-N 4-(1,3-dioxo-2-benzofuran-5-yl)-2-benzofuran-1,3-dione Chemical compound C=1C=C2C(=O)OC(=O)C2=CC=1C1=CC=CC2=C1C(=O)OC2=O FYYYKXFEKMGYLZ-UHFFFAOYSA-N 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 125000002015 acyclic group Chemical group 0.000 description 2
- 150000001408 amides Chemical class 0.000 description 2
- GCAIEATUVJFSMC-UHFFFAOYSA-N benzene-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1C(O)=O GCAIEATUVJFSMC-UHFFFAOYSA-N 0.000 description 2
- 230000001588 bifunctional effect Effects 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- VHRGRCVQAFMJIZ-UHFFFAOYSA-N cadaverine Chemical compound NCCCCCN VHRGRCVQAFMJIZ-UHFFFAOYSA-N 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- VKIRRGRTJUUZHS-UHFFFAOYSA-N cyclohexane-1,4-diamine Chemical compound NC1CCC(N)CC1 VKIRRGRTJUUZHS-UHFFFAOYSA-N 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- VILAVOFMIJHSJA-UHFFFAOYSA-N dicarbon monoxide Chemical compound [C]=C=O VILAVOFMIJHSJA-UHFFFAOYSA-N 0.000 description 2
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 2
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- HJOVHMDZYOCNQW-UHFFFAOYSA-N isophorone Chemical compound CC1=CC(=O)CC(C)(C)C1 HJOVHMDZYOCNQW-UHFFFAOYSA-N 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 238000007344 nucleophilic reaction Methods 0.000 description 2
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000000951 phenoxy group Chemical group [H]C1=C([H])C([H])=C(O*)C([H])=C1[H] 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000003505 polymerization initiator Substances 0.000 description 2
- 239000001294 propane Substances 0.000 description 2
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
- 238000005979 thermal decomposition reaction Methods 0.000 description 2
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 description 2
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- RTTZISZSHSCFRH-UHFFFAOYSA-N 1,3-bis(isocyanatomethyl)benzene Chemical compound O=C=NCC1=CC=CC(CN=C=O)=C1 RTTZISZSHSCFRH-UHFFFAOYSA-N 0.000 description 1
- VGHSXKTVMPXHNG-UHFFFAOYSA-N 1,3-diisocyanatobenzene Chemical compound O=C=NC1=CC=CC(N=C=O)=C1 VGHSXKTVMPXHNG-UHFFFAOYSA-N 0.000 description 1
- OHLKMGYGBHFODF-UHFFFAOYSA-N 1,4-bis(isocyanatomethyl)benzene Chemical compound O=C=NCC1=CC=C(CN=C=O)C=C1 OHLKMGYGBHFODF-UHFFFAOYSA-N 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- SEYKENDCALELBV-UHFFFAOYSA-N 1-N'-phenyl-2,3-dihydroindene-1,1-diamine Chemical compound NC1(CCC2=CC=CC=C12)NC1=CC=CC=C1 SEYKENDCALELBV-UHFFFAOYSA-N 0.000 description 1
- KGRVJHAUYBGFFP-UHFFFAOYSA-N 2,2'-Methylenebis(4-methyl-6-tert-butylphenol) Chemical compound CC(C)(C)C1=CC(C)=CC(CC=2C(=C(C=C(C)C=2)C(C)(C)C)O)=C1O KGRVJHAUYBGFFP-UHFFFAOYSA-N 0.000 description 1
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 1
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- SMDGQEQWSSYZKX-UHFFFAOYSA-N 3-(2,3-dicarboxyphenoxy)phthalic acid Chemical compound OC(=O)C1=CC=CC(OC=2C(=C(C(O)=O)C=CC=2)C(O)=O)=C1C(O)=O SMDGQEQWSSYZKX-UHFFFAOYSA-N 0.000 description 1
- OLQWMCSSZKNOLQ-UHFFFAOYSA-N 3-(2,5-dioxooxolan-3-yl)oxolane-2,5-dione Chemical compound O=C1OC(=O)CC1C1C(=O)OC(=O)C1 OLQWMCSSZKNOLQ-UHFFFAOYSA-N 0.000 description 1
- RNLHGQLZWXBQNY-UHFFFAOYSA-N 3-(aminomethyl)-3,5,5-trimethylcyclohexan-1-amine Chemical compound CC1(C)CC(N)CC(C)(CN)C1 RNLHGQLZWXBQNY-UHFFFAOYSA-N 0.000 description 1
- UCFMKTNJZCYBBJ-UHFFFAOYSA-N 3-[1-(2,3-dicarboxyphenyl)ethyl]phthalic acid Chemical compound C=1C=CC(C(O)=O)=C(C(O)=O)C=1C(C)C1=CC=CC(C(O)=O)=C1C(O)=O UCFMKTNJZCYBBJ-UHFFFAOYSA-N 0.000 description 1
- UCQABCHSIIXVOY-UHFFFAOYSA-N 3-[4-[4-(3-aminophenoxy)phenyl]phenoxy]aniline Chemical group NC1=CC=CC(OC=2C=CC(=CC=2)C=2C=CC(OC=3C=C(N)C=CC=3)=CC=2)=C1 UCQABCHSIIXVOY-UHFFFAOYSA-N 0.000 description 1
- ITQTTZVARXURQS-UHFFFAOYSA-N 3-methylpyridine Chemical compound CC1=CC=CN=C1 ITQTTZVARXURQS-UHFFFAOYSA-N 0.000 description 1
- LJMPOXUWPWEILS-UHFFFAOYSA-N 3a,4,4a,7a,8,8a-hexahydrofuro[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1C2C(=O)OC(=O)C2CC2C(=O)OC(=O)C21 LJMPOXUWPWEILS-UHFFFAOYSA-N 0.000 description 1
- VFGQLNVWQRKCAU-UHFFFAOYSA-N 4-(2-aminoethyl)cyclohexan-1-amine Chemical compound NCCC1CCC(N)CC1 VFGQLNVWQRKCAU-UHFFFAOYSA-N 0.000 description 1
- AVCOFPOLGHKJQB-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)sulfonylphthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1S(=O)(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1 AVCOFPOLGHKJQB-UHFFFAOYSA-N 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical class C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- IWXCYYWDGDDPAC-UHFFFAOYSA-N 4-[(3,4-dicarboxyphenyl)methyl]phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1CC1=CC=C(C(O)=O)C(C(O)=O)=C1 IWXCYYWDGDDPAC-UHFFFAOYSA-N 0.000 description 1
- DZIHTWJGPDVSGE-UHFFFAOYSA-N 4-[(4-aminocyclohexyl)methyl]cyclohexan-1-amine Chemical compound C1CC(N)CCC1CC1CCC(N)CC1 DZIHTWJGPDVSGE-UHFFFAOYSA-N 0.000 description 1
- VQVIHDPBMFABCQ-UHFFFAOYSA-N 5-(1,3-dioxo-2-benzofuran-5-carbonyl)-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)=O)=C1 VQVIHDPBMFABCQ-UHFFFAOYSA-N 0.000 description 1
- QHHKLPCQTTWFSS-UHFFFAOYSA-N 5-[2-(1,3-dioxo-2-benzofuran-5-yl)-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)(C(F)(F)F)C(F)(F)F)=C1 QHHKLPCQTTWFSS-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- 238000012935 Averaging Methods 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 1
- JLTDJTHDQAWBAV-UHFFFAOYSA-N N,N-dimethylaniline Chemical compound CN(C)C1=CC=CC=C1 JLTDJTHDQAWBAV-UHFFFAOYSA-N 0.000 description 1
- WWEXBGFSEVKZNE-UHFFFAOYSA-N N=C=O.N=C=O.C1=CC=CC2=CC=CC=C21 Chemical compound N=C=O.N=C=O.C1=CC=CC2=CC=CC=C21 WWEXBGFSEVKZNE-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 229920004738 ULTEM® Polymers 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- QLBRROYTTDFLDX-UHFFFAOYSA-N [3-(aminomethyl)cyclohexyl]methanamine Chemical compound NCC1CCCC(CN)C1 QLBRROYTTDFLDX-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 125000004018 acid anhydride group Chemical group 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000002280 amphoteric surfactant Substances 0.000 description 1
- 239000003945 anionic surfactant Substances 0.000 description 1
- MRSWDOKCESOYBI-UHFFFAOYSA-N anthracene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C=C(C(C(=O)O)=C3)C(O)=O)C3=CC2=C1 MRSWDOKCESOYBI-UHFFFAOYSA-N 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 125000001204 arachidyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002511 behenyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical group C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 description 1
- 235000019445 benzyl alcohol Nutrition 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 239000004566 building material Substances 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- RZIPTXDCNDIINL-UHFFFAOYSA-N cyclohexane-1,1,2,2-tetracarboxylic acid Chemical compound OC(=O)C1(C(O)=O)CCCCC1(C(O)=O)C(O)=O RZIPTXDCNDIINL-UHFFFAOYSA-N 0.000 description 1
- SSJXIUAHEKJCMH-UHFFFAOYSA-N cyclohexane-1,2-diamine Chemical compound NC1CCCCC1N SSJXIUAHEKJCMH-UHFFFAOYSA-N 0.000 description 1
- STZIXLPVKZUAMV-UHFFFAOYSA-N cyclopentane-1,1,2,2-tetracarboxylic acid Chemical compound OC(=O)C1(C(O)=O)CCCC1(C(O)=O)C(O)=O STZIXLPVKZUAMV-UHFFFAOYSA-N 0.000 description 1
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- CZZYITDELCSZES-UHFFFAOYSA-N diphenylmethane Chemical compound C=1C=CC=CC=1CC1=CC=CC=C1 CZZYITDELCSZES-UHFFFAOYSA-N 0.000 description 1
- SDIXRDNYIMOKSG-UHFFFAOYSA-L disodium methyl arsenate Chemical compound [Na+].[Na+].C[As]([O-])([O-])=O SDIXRDNYIMOKSG-UHFFFAOYSA-L 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000002305 electric material Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000010556 emulsion polymerization method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- GBASTSRAHRGUAB-UHFFFAOYSA-N ethylenetetracarboxylic dianhydride Chemical compound O=C1OC(=O)C2=C1C(=O)OC2=O GBASTSRAHRGUAB-UHFFFAOYSA-N 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 125000000755 henicosyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- PWSKHLMYTZNYKO-UHFFFAOYSA-N heptane-1,7-diamine Chemical compound NCCCCCCCN PWSKHLMYTZNYKO-UHFFFAOYSA-N 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- AWJUIBRHMBBTKR-UHFFFAOYSA-N isoquinoline Chemical compound C1=NC=CC2=CC=CC=C21 AWJUIBRHMBBTKR-UHFFFAOYSA-N 0.000 description 1
- 238000002356 laser light scattering Methods 0.000 description 1
- 125000002463 lignoceryl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002960 margaryl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- 239000000693 micelle Substances 0.000 description 1
- 239000004005 microsphere Substances 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- OBKARQMATMRWQZ-UHFFFAOYSA-N naphthalene-1,2,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 OBKARQMATMRWQZ-UHFFFAOYSA-N 0.000 description 1
- NTNWKDHZTDQSST-UHFFFAOYSA-N naphthalene-1,2-diamine Chemical compound C1=CC=CC2=C(N)C(N)=CC=C21 NTNWKDHZTDQSST-UHFFFAOYSA-N 0.000 description 1
- DOBFTMLCEYUAQC-UHFFFAOYSA-N naphthalene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 DOBFTMLCEYUAQC-UHFFFAOYSA-N 0.000 description 1
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001117 oleyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])/C([H])=C([H])\C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 description 1
- 125000002958 pentadecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- UMSVUULWTOXCQY-UHFFFAOYSA-N phenanthrene-1,2,7,8-tetracarboxylic acid Chemical compound OC(=O)C1=CC=C2C3=CC=C(C(=O)O)C(C(O)=O)=C3C=CC2=C1C(O)=O UMSVUULWTOXCQY-UHFFFAOYSA-N 0.000 description 1
- RCIBIGQXGCBBCT-UHFFFAOYSA-N phenyl isocyanide Chemical compound [C-]#[N+]C1=CC=CC=C1 RCIBIGQXGCBBCT-UHFFFAOYSA-N 0.000 description 1
- XNGIFLGASWRNHJ-UHFFFAOYSA-L phthalate(2-) Chemical compound [O-]C(=O)C1=CC=CC=C1C([O-])=O XNGIFLGASWRNHJ-UHFFFAOYSA-L 0.000 description 1
- CLYVDMAATCIVBF-UHFFFAOYSA-N pigment red 224 Chemical compound C=12C3=CC=C(C(OC4=O)=O)C2=C4C=CC=1C1=CC=C2C(=O)OC(=O)C4=CC=C3C1=C42 CLYVDMAATCIVBF-UHFFFAOYSA-N 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920001983 poloxamer Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920005553 polystyrene-acrylate Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- USHAGKDGDHPEEY-UHFFFAOYSA-L potassium persulfate Chemical compound [K+].[K+].[O-]S(=O)(=O)OOS([O-])(=O)=O USHAGKDGDHPEEY-UHFFFAOYSA-L 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 238000007363 ring formation reaction Methods 0.000 description 1
- 229910001927 ruthenium tetroxide Inorganic materials 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000007764 slot die coating Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 150000000000 tetracarboxylic acids Chemical class 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- 125000002469 tricosyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- NJMOHBDCGXJLNJ-UHFFFAOYSA-N trimellitic anhydride chloride Chemical compound ClC(=O)C1=CC=C2C(=O)OC(=O)C2=C1 NJMOHBDCGXJLNJ-UHFFFAOYSA-N 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
Abstract
Description
本発明は、樹脂組成物及び熱硬化物に関する。 The present invention relates to resin compositions and thermosetting products.
電気機器における部分放電は、電線・ケーブル等の絶縁体中あるいは線間に微小な空隙があると、その部分に電界が集中し、微弱な放電が発生することで生じる。部分放電が発生すると、局部的な温度上昇やイオンの発生等が引き起こされ、早期に電線・ケーブル等の絶縁破壊を生じ、絶縁電線や電気機器の寿命が短くなる。 Partial discharge in electrical equipment occurs when there are minute gaps in or between wires in an insulator such as an electric wire or cable, the electric field concentrates on that part, and a weak discharge occurs. When a partial discharge occurs, a local temperature rise and generation of ions are caused, causing dielectric breakdown of electric wires and cables at an early stage, shortening the life of insulated electric wires and electrical equipment.
モータやトランス等のコイルに用いられる巻線、特に導体上に樹脂塗料を塗布し、焼付けして絶縁皮膜を形成する絶縁電線においては、部分放電は主に絶縁材料の内部欠損や微小な空洞、異物などによって発生し、荷電粒子の衝突による樹脂皮膜の分子鎖切断や発熱等によって皮膜の侵食が進行し、絶縁破壊に至る。 In the windings used for coils such as motors and transformers, especially in insulated wires where resin paint is applied on conductors and baked to form an insulating film, partial discharge is mainly caused by internal defects in the insulating material or minute cavities. It is generated by foreign matter, and erosion of the film progresses due to molecular chain breakage of the resin film due to collision of charged particles, heat generation, etc., leading to dielectric breakdown.
また、近年、省エネ、可変速のために用いるインバータのモータ等を駆動させるシステムにおいて、インバータサージ(急峻な過電圧)が発生し、絶縁破壊を引き起こすケースが多くなっている。この絶縁破壊は、インバータサージによる過電圧が部分放電を引き起こされることに起因することが判っている。 Further, in recent years, in a system for driving an inverter motor or the like used for energy saving and variable speed, an inverter surge (steep overvoltage) occurs in many cases, causing dielectric breakdown. It is known that this dielectric breakdown is caused by the overvoltage caused by the inverter surge causing partial discharge.
モータやトランス等のコイルに用いられる絶縁電線の寿命を向上させる方法として無機材料を充填させた樹脂塗料を用いて絶縁皮膜を形成することにより、部分放電による絶縁皮膜の浸食を抑制する方法や絶縁被膜の誘電率を低下させることにより、部分放電の発生を抑制する方法等がある。 As a method of improving the life of insulated wires used for coils of motors and transformers, a method of suppressing erosion of the insulating film due to partial discharge and insulation by forming an insulating film using a resin paint filled with an inorganic material. There is a method of suppressing the occurrence of partial discharge by lowering the dielectric constant of the coating film.
無機材料のうち、シリカ微粒子を樹脂溶液に分散させる方法として、シリカ粒子の粉末を樹脂溶液に添加分散する方法や樹脂塗料とオルガノシリカゾルを混合する方法等が知られている(特許文献1、2)。シリカ粒子やオルガノシリカゾルを用いると、シリカが分散した塗料が得られるとともに、可撓性、柔軟性、巻き付け性、及び伸張性等の特性の良い絶縁電線が得られるが、シリカゾルと樹脂溶液との相溶性が良いものを用いる必要がある。 Among the inorganic materials, as a method of dispersing silica fine particles in a resin solution, a method of adding and dispersing silica particle powder in a resin solution, a method of mixing a resin paint and an organosilica sol, and the like are known (Patent Documents 1 and 2). ). When silica particles or organosilica sol are used, a paint in which silica is dispersed can be obtained, and an insulated wire having good characteristics such as flexibility, flexibility, wrapability, and extensibility can be obtained. It is necessary to use one with good compatibility.
絶縁被膜の誘電率を低下させる方法としては、絶縁皮膜を多孔質化する方法があり、塗膜構成樹脂と、この塗膜構成樹脂の焼付温度よりも低い温度で分解する熱分解性樹脂とを含む絶縁ワニスにより絶皮膜を形成する方法等が知られている(特許文献3)。この絶縁電線は、熱分解樹脂が塗膜構成樹脂の焼き付け時に熱分解して、気孔を形成することにより多孔質化された絶縁皮膜を得ている。 As a method of reducing the dielectric constant of the insulating film, there is a method of making the insulating film porous, and the coating resin and the thermally decomposable resin which decomposes at a temperature lower than the baking temperature of the coating resin are separated. A method of forming an exfoliated film with an insulating varnish containing the resin is known (Patent Document 3). In this insulated wire, the thermally decomposed resin is thermally decomposed at the time of baking the coating film constituent resin to form pores, thereby obtaining a porous insulating film.
しかしながら、特許文献1及び2に記載の無機材料を使用した場合、一般に無機材料の誘電率は有機材料より高いため、部分放電自体の抑制が困難であり、また、特許文献3に記載の熱分解性樹脂を使用した場合、粒子同士の凝集により気孔が局在化や気孔の大きさにばらつきが発生し、連続気孔が生じやすくなり、絶縁皮膜の強度が低下し、早期に絶縁破壊を生じるといった問題がある。 However, when the inorganic materials described in Patent Documents 1 and 2 are used, the dielectric constant of the inorganic material is generally higher than that of the organic material, so that it is difficult to suppress the partial discharge itself, and the thermal decomposition described in Patent Document 3 is used. When a sex resin is used, pores are localized and the size of the pores varies due to aggregation of particles, continuous pores are likely to occur, the strength of the insulating film is reduced, and dielectric breakdown occurs at an early stage. There's a problem.
本発明の樹脂組成物及び熱硬化物は、中空粒子を均一分散させることで絶縁層の強度の低下を抑制しつつ絶縁被膜を低誘電率化し、部分放電開始電圧を向上させることを目的とする。 The purpose of the resin composition and the thermosetting product of the present invention is to reduce the dielectric constant of the insulating coating and improve the partial discharge starting voltage while suppressing the decrease in the strength of the insulating layer by uniformly dispersing the hollow particles. ..
本発明は、ポリアミド酸(A)と、数平均粒子径が0.1〜30μmである中空粒子(B)と、下記一般式(1)又は(3)で表される化合物(C)とを含有する樹脂組成物であり、前記中空粒子(B)の体積割合(vol%)が前記ポリアミド酸(A)及び前記中空粒子(B)の合計体積に対して10〜40である樹脂組成物に関する。 The present invention comprises a polyamic acid (A), hollow particles (B) having a number average particle diameter of 0.1 to 30 μm, and a compound (C) represented by the following general formula (1) or (3). The resin composition contained therein, wherein the volume ratio (vol%) of the hollow particles (B) is 10 to 40 with respect to the total volume of the polyamic acid (A) and the hollow particles (B). ..
本発明の樹脂組成物及び熱硬化物は、中空粒子を均一分散させることで絶縁層の強度の低下を抑制しつつ絶縁被膜を低誘電率化し、部分放電開始電圧を向上させることができる。 In the resin composition and the thermosetting product of the present invention, the hollow particles are uniformly dispersed to suppress a decrease in the strength of the insulating layer, reduce the dielectric constant of the insulating coating, and improve the partial discharge starting voltage.
本発明の樹脂組成物は、ポリアミド酸(A)と、数平均粒子径が0.1〜30μmである中空粒子(B)と、上記一般式(1)又は(3)で表される化合物(C)とを含有する。 The resin composition of the present invention comprises a polyamic acid (A), hollow particles (B) having a number average particle diameter of 0.1 to 30 μm, and a compound represented by the above general formula (1) or (3). C) and.
<ポリアミド酸(A)>
ポリアミド酸(A)としては、テトラカルボン酸二無水物とジアミンとを重合して得られるものが、特に限定されることなく使用できる。
<Polyamic acid (A)>
As the polyamic acid (A), one obtained by polymerizing tetracarboxylic dianhydride and diamine can be used without particular limitation.
テトラカルボン酸二無水物は、芳香族テトラカルボン酸二無水物であっても、脂肪族テトラカルボン酸二無水物(非環式脂肪族テトラカルボン酸二無水物及び脂環式テトラカルボン酸二無水物等を含む)であってもよいが、得られるポリイミドの耐熱性の点から、芳香族テトラカルボン酸二無水物又は脂環式テトラカルボン酸二無水物を使用することが好ましい。テトラカルボン酸二無水物は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。 Even if the tetracarboxylic dianhydride is an aromatic tetracarboxylic dianhydride, it is an aliphatic tetracarboxylic dianhydride (acyclic aliphatic tetracarboxylic dianhydride and an alicyclic tetracarboxylic dianhydride). However, from the viewpoint of the heat resistance of the obtained polyimide, it is preferable to use an aromatic tetracarboxylic dianhydride or an alicyclic tetracarboxylic dianhydride. As the tetracarboxylic dianhydride, one type may be used alone, or two or more types may be used in combination.
芳香族テトラカルボン酸二無水物の好適ものとしては、ピロメリット酸二無水物、1,1−ビス(2,3−ジカルボキシフェニル)エタン二無水物、ビス(2,3−ジカルボキシフェニル)メタン二無水物、ビス(3,4−ジカルボキシフェニル)メタン二無水物、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物、2,3,3’,4’−ビフェニルテトラカルボン酸二無水物、2,2,6,6−ビフェニルテトラカルボン酸二無水物、2,2−ビス(3,4−ジカルボキシフェニル)プロパン二無水物、2,2−ビス(2,3−ジカルボキシフェニル)プロパン二無水物、2,2−ビス(3,4−ジカルボキシフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン二無水物、2,2−ビス(2,3−ジカルボキシフェニル)−1,1,1,3,3,3−ヘキサフルオロプロパン二無水物、3,3’,4,4’−ベンゾフェノンテトラカルボン酸二無水物、ビス(3,4−ジカルボキシフェニル)エーテル二無水物、ビス(2,3−ジカルボキシフェニル)エーテル二無水物、2,2’,3,3’−ベンゾフェノンテトラカルボン酸二無水物、4,4−(p−フェニレンジオキシ)ジフタル酸二無水物、4,4−(m−フェニレンジオキシ)ジフタル酸二無水物、1,2,5,6−ナフタレンテトラカルボン二無水物、1,4,5,8−ナフタレンテトラカルボン酸二無水物、2,3,6,7−ナフタレンテトラカルボン酸二無水物、1,2,3,4−ベンゼンテトラカルボン酸二無水物、3,4,9,10−ペリレンテトラカルボン酸二無水物、2,3,6,7−アントラセンテトラカルボン酸二無水物、1,2,7,8−フェナントレンテトラカルボン酸二無水物、9,9−ビス無水フタル酸フルオレン、3,3’,4,4’−ジフェニルスルホンテトラカルボン酸二無水物、4,4’−ビス(3,4−ジカルボキシフェノキシ)ジフェニルエーテル二無水物、4,4’−ビス(2,3−ジカルボキシフェノキシ)ジフェニルエーテル酸二無水物及び、4−(2,3−ジカルボキシフェノキシ)−4’−(3,4−ジカルボキシフェノキシ)ジフェニルエーテル酸二無水物等が挙げられる。 Suitable aromatic tetracarboxylic dianhydrides include pyromellitic dianhydride, 1,1-bis (2,3-dicarboxyphenyl) ethane dianhydride, and bis (2,3-dicarboxyphenyl). Methan dianhydride, bis (3,4-dicarboxyphenyl) methane dianhydride, 3,3', 4,4'-biphenyltetracarboxylic acid dianhydride, 2,3,3', 4'-biphenyltetra Carboxyl dianhydride, 2,2,6,6-biphenyltetracarboxylic hydride, 2,2-bis (3,4-dicarboxyphenyl) propane hydride, 2,2-bis (2,3) -Dicarboxyphenyl) propane dianhydride, 2,2-bis (3,4-dicarboxyphenyl) -1,1,1,3,3,3-hexafluoropropane dianhydride, 2,2-bis (3,4-dicarboxyphenyl) 2,3-Dicarboxyphenyl) -1,1,1,3,3,3-hexafluoropropane dianhydride, 3,3', 4,4'-benzophenone tetracarboxylic acid dianhydride, bis (3,3) 4-Dicarboxyphenyl) ether dianhydride, bis (2,3-dicarboxyphenyl) ether dianhydride, 2,2', 3,3'-benzophenone tetracarboxylic acid dianhydride, 4,4- (p. -Phenylenedioxy) diphthalic acid dianhydride, 4,4- (m-phenylenedioxy) diphthalic acid dianhydride, 1,2,5,6-naphthalenetetracarboxylic dianhydride, 1,4,5,8 -Naphthalenetetracarboxylic acid dianhydride, 2,3,6,7-naphthalenetetracarboxylic acid dianhydride, 1,2,3,4-benzenetetracarboxylic acid dianhydride, 3,4,9,10-perylene Tetracarboxylic acid dianhydride, 2,3,6,7-anthracene tetracarboxylic acid dianhydride, 1,2,7,8-phenanthrene tetracarboxylic acid dianhydride, 9,9-bisfluorene phthalate, 3 , 3', 4,4'-diphenylsulfone tetracarboxylic acid dianhydride, 4,4'-bis (3,4-dicarboxyphenoxy) diphenyl ether dianhydride, 4,4'-bis (2,3-di) Examples thereof include carboxyphenoxy) diphenyl ether acid dianhydride and 4- (2,3-dicarboxyphenoxy) -4'-(3,4-dicarboxyphenoxy) diphenyl ether acid dianhydride.
芳香族テトラカルボン酸二無水物としては、耐熱性及び成膜性の観点から、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物及びピロメリット酸二無水物が好ましい。 As the aromatic tetracarboxylic dianhydride, 3,3', 4,4'-biphenyltetracarboxylic dianhydride and pyromellitic dianhydride are preferable from the viewpoint of heat resistance and film forming property.
脂肪族テトラカルボン酸二無水物のうち、非環式脂肪族テトラカルボン酸二無水物としては、エチレンテトラカルボン酸二無水物、及びブタンテトラカルボン酸二無水物等が挙げられ、脂環式テトラカルボン酸二無水物としては、シクロペンタンテトラカルボン酸二無水物、シクロヘキサンテトラカルボン酸二無水物、1,2,4,5−シクロヘキサンテトラカルボン酸二無水物及び1,2,3,4−シクロヘキサンテトラカルボン酸二無水物等が挙げられる。 Among the aliphatic tetracarboxylic dianhydrides, examples of the acyclic aliphatic tetracarboxylic dianhydride include ethylenetetracarboxylic dianhydride and butanetetracarboxylic dianhydride, and the alicyclic tetracarboxylic dianhydride. Examples of the carboxylic acid dianhydride include cyclopentanetetracarboxylic dianhydride, cyclohexanetetracarboxylic dianhydride, 1,2,4,5-cyclohexanetetracarboxylic dianhydride and 1,2,3,4-cyclohexane. Examples thereof include tetracarboxylic dianhydride.
ジアミンは、従来からポリアミド酸の合成原料として使用されているジアミンから適宜選択することができる。ジアミンは、得られるポリイミドの耐熱性等の観点から、芳香族ジアミン及び脂肪族ジアミン(非環式脂肪族ジアミン及び脂環式ジアミン等を含む)が好ましく、芳香族ジアミン及び脂環式ジアミンが更に好ましい。ジアミンは、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。 The diamine can be appropriately selected from diamines conventionally used as a synthetic raw material for polyamic acid. As the diamine, aromatic diamines and aliphatic diamines (including acyclic aliphatic diamines and alicyclic diamines) are preferable from the viewpoint of heat resistance of the obtained polyimide, and aromatic diamines and alicyclic diamines are further preferable. preferable. One type of diamine may be used alone, or two or more types may be used in combination.
芳香族ジアミンとしては、フェニル基が1個又は2〜10個が結合したジアミノ化合物を挙げることができる。具体的には、フェニレンジアミン及びその誘導体、ジアミノビフェニル化合物及びその誘導体、ジアミノジフェニル化合物及びその誘導体、ジアミノトリフェニル化合物及びその誘導体、ジアミノナフタレン及びその誘導体、アミノフェニルアミノインダン及びその誘導体、ジアミノテトラフェニル化合物及びその誘導体、ジアミノヘキサフェニル化合物及びその誘導体、カルド型フルオレンジアミン誘導体、ジアミノジフェニルエーテル化合物及びその誘導体である。 Examples of the aromatic diamine include a diamino compound having one or 2 to 10 phenyl groups bonded thereto. Specifically, phenylenediamine and its derivatives, diaminobiphenyl compounds and their derivatives, diaminodiphenyl compounds and their derivatives, diaminotriphenyl compounds and their derivatives, diaminonaphthalene and its derivatives, aminophenylaminoindane and its derivatives, diaminotetraphenyl. Compounds and derivatives thereof, diaminohexaphenyl compounds and derivatives thereof, cardo-type fluorangeamine derivatives, diaminodiphenyl ether compounds and derivatives thereof.
脂肪族ジアミンの炭素原子数は、可撓性等の観点から、2〜15が好ましい。このうち、非環式脂肪族ジアミンとしては、ペンタメチレンジアミン、ヘキサメチレンジアミン及びヘプタメチレンジアミン等が挙げられる。
脂環式ジアミンとしては、1,4−シクロヘキサンジアミン、1,2−シクロヘキサンジアミン、4,4‘−メチレンビス(シクロヘキシルアミン)、4−(2−アミノエチル)シクロヘキシルアミン、4,4’メチレンビス(2−メチルシクロヘキシルアミン)、イソホロンジアミン、1,3−ビス(アミノメチル)シクロヘキサン等が挙げられる。
The number of carbon atoms of the aliphatic diamine is preferably 2 to 15 from the viewpoint of flexibility and the like. Among these, examples of the acyclic aliphatic diamine include pentamethylenediamine, hexamethylenediamine and heptamethylenediamine.
Examples of the alicyclic diamine include 1,4-cyclohexanediamine, 1,2-cyclohexanediamine, 4,4'-methylenebis (cyclohexylamine), 4- (2-aminoethyl) cyclohexylamine, and 4,4'methylenebis (2). -Methylcyclohexylamine), isophoronediamine, 1,3-bis (aminomethyl) cyclohexane and the like.
これらのジアミンの水素原子がハロゲン原子、メチル基、メトキシ基、シアノ基及びフェニル基等の群より選択される少なくとも1種の置換基により置換された化合物であってもよい。 The hydrogen atom of these diamines may be a compound substituted with at least one substituent selected from the group such as a halogen atom, a methyl group, a methoxy group, a cyano group and a phenyl group.
ジアミンとしては、耐熱性および熱硬化物の機械強度の観点からパラフェニレンジアミンや4,4’−ビス(3−アミノフェノキシ)ビフェニルを用いることが好ましい。 As the diamine, it is preferable to use para-phenylenediamine or 4,4'-bis (3-aminophenoxy) biphenyl from the viewpoint of heat resistance and mechanical strength of the thermosetting product.
テトラカルボン酸二無水物とジアミンとの重合反応は、溶剤中でテトラカルボン酸二無水物とジアミンとを混合し、混合物を加熱して行うことができる。テトラカルボン酸二無水物とジアミンとの反応に使用される溶剤は、テトラカルボン酸二無水物及びジアミンを溶解させることができ、テトラカルボン酸二無水物及びジアミンと反応しないものであれば特に限定されない。溶剤は1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。 The polymerization reaction of the tetracarboxylic dianhydride and the diamine can be carried out by mixing the tetracarboxylic dianhydride and the diamine in a solvent and heating the mixture. The solvent used for the reaction between the tetracarboxylic dianhydride and the diamine is particularly limited as long as it can dissolve the tetracarboxylic dianhydride and the diamine and does not react with the tetracarboxylic dianhydride and the diamine. Not done. One type of solvent may be used alone, or two or more types may be used in combination.
ポリアミド酸(A)の製造において、テトラカルボン酸二無水物とジアミンとの反応に用いる溶剤の例としては、N−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、γ−ブチロラクトン、γ−バレロラクトン、ε−カプロラクトン、ジメチルスルホキシド、アセトニトリル、ジエチレングリコールジエチルエーテル、ジオキサン、テトラヒドロフラン及び水等が挙げられる。溶剤へのテトラカルボン酸二無水物とジアミンとの溶解性の観点から、好ましくはN,N−ジメチルホルムアミド、N−メチル−2−ピロリドンである。 Examples of solvents used in the reaction of tetracarboxylic acid dianhydride with diamine in the production of polyamic acid (A) include N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, and the like. Examples thereof include γ-butyrolactone, γ-valerolactone, ε-caprolactone, dimethyl sulfoxide, acetonitrile, diethylene glycol diethyl ether, dioxane, tetrahydrofuran and water. From the viewpoint of solubility of tetracarboxylic dianhydride and diamine in a solvent, N, N-dimethylformamide and N-methyl-2-pyrrolidone are preferable.
重合温度は−10〜120℃、製造安定性の観点から好ましくは5〜30℃である。120℃を超える温度で反応させる場合、分子量が重合時の温度履歴に依存して変動し、また熱によりイミド化が進行することから、ポリイミド前駆体を安定して製造できなくなる可能性がある。重合時間は使用する原料組成により異なるが、3〜24時間が好ましい。ポリアミド酸は、1種を単独で用いてもよく、2種以上を組み合わせて用いてもよい。 The polymerization temperature is −10 to 120 ° C., preferably 5 to 30 ° C. from the viewpoint of production stability. When the reaction is carried out at a temperature exceeding 120 ° C., the molecular weight fluctuates depending on the temperature history at the time of polymerization, and imidization proceeds due to heat, so that the polyimide precursor may not be stably produced. The polymerization time varies depending on the raw material composition used, but is preferably 3 to 24 hours. As the polyamic acid, one type may be used alone, or two or more types may be used in combination.
本発明で用いることが好ましいポリアミド酸としては、芳香族ポリアミド酸(芳香族テトラカルボン酸二無水物及び芳香族ジアミンの少なくとも一方を原料としたポリアミド酸)や脂環式ポリアミド酸(脂環式テトラカルボン酸二無水物及び脂環式ジアミンの少なくとも一方を原料としたポリアミド酸)といったポリアミド酸等が挙げられる。ポリアミド酸は、1種又は2種以上を使用することができる。市販品としては、ユピアーシリーズ(宇部興産社製)、スピクセリアシリーズ(ソマール社製)、HCIシリーズ(日立化成社製)、HPCシリーズ(日立化成社製)、Uイミド(ユニチカ社製)、オーラム(三井化学社製)、ウルテム(GEプラスチック社製)及びNeoheat(東特塗料社製)等が挙げられる。 Preferred polyamic acids used in the present invention include aromatic polyamic acid (polyamic acid made from at least one of aromatic tetracarboxylic acid dianhydride and aromatic diamine) and alicyclic polyamic acid (alicyclic tetra). Examples thereof include polyamic acids (polyamic acids made from at least one of a carboxylic acid dianhydride and an alicyclic diamine). As the polyamic acid, one kind or two or more kinds can be used. Commercially available products include Upia series (made by Ube Industries), Spixeria series (made by Somar), HCI series (made by Hitachi Kasei), HPC series (made by Hitachi Kasei), Uimide (made by Unitika), Aurum (manufactured by Mitsui Kagaku Co., Ltd.), Ultem (manufactured by GE Plastic Co., Ltd.), Neoheat (manufactured by Totoku Toryo Co., Ltd.) and the like can be mentioned.
<中空粒子(B)>
中空粒子(B)としては、数平均粒子径が0.1〜30μmの中空粒子である。前記粒子径は、誘電率の観点から好ましくは0.1〜10μm、更に好ましくは0.3〜1μmである。
前記数平均粒子径は、レーザー光散乱法で求められる粒度の個数基準分布において、算術平均粒径である。レーザー回折/散乱式粒子径分布測定装置(LA−920(HORIBA製))を用いて測定して得られた値である。測定の手順は以下のとおりである。N−メチル−2−ピロリドン(NMP)又は水の重量に対して中空粒子(B)を1重量%、分散剤を0.1重量%加え、超音波で5分間分散させてサンプルを調製できる。中空粒子(D)としてシリカ中空粒子を用いる場合、分散媒がNMP、分散剤としてはエチレンオキシド(EO)とプロピレンオキシド(PO)のブロック共重合体(三洋化成工業株式会社製:ニューポールPE−68又はPE−64)等のプルロニック型の分散剤を、PMMA中空粒子を用いる場合には、分散媒が水、分散剤としてはオレイルアルコールEO付加物(三洋化成工業株式会社製:エマルミンV−100)等の長鎖アルキル基を含む分散剤を用いることが好ましい。数平均粒子径が30μmを超える場合には、絶縁性の観点で好ましくない。
<Hollow particles (B)>
The hollow particles (B) are hollow particles having a number average particle diameter of 0.1 to 30 μm. The particle size is preferably 0.1 to 10 μm, more preferably 0.3 to 1 μm from the viewpoint of dielectric constant.
The number average particle size is an arithmetic mean particle size in the number-based distribution of the particle size obtained by the laser light scattering method. It is a value obtained by measuring using a laser diffraction / scattering type particle size distribution measuring device (LA-920 (manufactured by HORIBA)). The measurement procedure is as follows. A sample can be prepared by adding 1% by weight of hollow particles (B) and 0.1% by weight of a dispersant based on the weight of N-methyl-2-pyrrolidone (NMP) or water and dispersing the particles by ultrasonic waves for 5 minutes. When silica hollow particles are used as the hollow particles (D), the dispersion medium is NMP, and the dispersant is a block copolymer of ethylene oxide (EO) and propylene oxide (PO) (manufactured by Sanyo Kasei Kogyo Co., Ltd .: New Pole PE-68). Alternatively, when PMMA hollow particles are used as a pluronic type dispersant such as PE-64), the dispersion medium is water, and the dispersant is an oleyl alcohol EO adduct (manufactured by Sanyo Kasei Kogyo Co., Ltd .: Emalmin V-100). It is preferable to use a dispersant containing a long-chain alkyl group such as. When the number average particle size exceeds 30 μm, it is not preferable from the viewpoint of insulating property.
中空粒子の材質としては、特に制限はなく、目的に応じて適宜選択することができ、例えば、無機中空粒子や有機中空粒子が挙げられシリカ中空粒子や樹脂中空粒子等を用いることが好ましい。 The material of the hollow particles is not particularly limited and may be appropriately selected depending on the intended purpose. Examples thereof include inorganic hollow particles and organic hollow particles, and silica hollow particles, resin hollow particles and the like are preferably used.
シリカ中空粒子は、主成分がケイ素酸化物であり、非晶質であるシリカからなる中空粒子である。 The silica hollow particles are hollow particles composed of silica whose main component is silicon oxide and which is amorphous.
シリカ中空粒子をエポキシ樹脂に混練し、硬化した後、試料を割断した。そして、電界放射型走査電子顕微鏡(日立製作所社製S−4000)を用いて、割断面のSEM写真を撮影する。この写真に撮影された任意の100個以上の粒子の粒子径及び内径を観察する。この時、粒子の5箇所以上の粒子径及び内径を測定し、平均値を算出することで、平均粒子径、平均内径を求めることができる。更に、(平均内径)3/(平均粒子径)3×100の式より、中空粒子の中空率を求める。
前記シリカ中空粒子の中空率が比誘電率の観点から40vol%以上であることが好ましく、40vol%以上80vol%以下であることがより好ましい。
The silica hollow particles were kneaded with an epoxy resin and cured, and then the sample was cut. Then, an SEM photograph of the fractured surface is taken using a field emission scanning electron microscope (S-4000 manufactured by Hitachi, Ltd.). Observe the particle size and inner diameter of any 100 or more particles taken in this picture. At this time, the average particle diameter and the average inner diameter can be obtained by measuring the particle diameter and the inner diameter of five or more particles and calculating the average value. Further, the hollow ratio of the hollow particles is obtained from the formula (average inner diameter) 3 / (average particle diameter) 3 × 100.
From the viewpoint of the relative permittivity, the hollow ratio of the silica hollow particles is preferably 40 vol% or more, and more preferably 40 vol% or more and 80 vol% or less.
シリカ中空粒子の市販品としては、シリナックス(日鉄鉱業社製)、ゴッドボールシリーズ(鈴木油脂工業社製)及びTHRULA(日揮触媒化成社製)等が挙げられる。 Examples of commercially available silica hollow particles include Sirinax (manufactured by Nittetsu Mining Co., Ltd.), Godball series (manufactured by Suzuki Yushi Kogyo Co., Ltd.), THRULA (manufactured by JGC Catalysts and Chemicals Co., Ltd.), and the like.
樹脂中空粒子は、メチルメタクリレートに由来する構造単位を有する樹脂からなる中空粒子であることが好ましい。 The resin hollow particles are preferably hollow particles made of a resin having a structural unit derived from methyl methacrylate.
メチルメタクリレートに由来する構造単位を有する樹脂中空粒子の合成方法としては、特に制限はなく、目的に応じて適宜選択することができるが、例えば、ビニルモノマー、界面活性剤、重合開始剤、及び水系分散媒を窒素雰囲気下で加熱しながら撹拌することにより中空粒子エマルジョンを形成する、いわゆる乳化重合法が好ましく、特開2007−270096等に記載の方法等を用いることができる。 The method for synthesizing the resin hollow particles having a structural unit derived from methyl methacrylate is not particularly limited and may be appropriately selected depending on the intended purpose. For example, a vinyl monomer, a surfactant, a polymerization initiator, and an aqueous system are used. A so-called emulsion polymerization method in which a hollow particle emulsion is formed by stirring the dispersion medium while heating it in a nitrogen atmosphere is preferable, and the method described in JP-A-2007-27096 or the like can be used.
ビニルモノマーとしては、非イオン性単官能エチレン不飽和モノマーや二官能ビニルモノマー等が挙げられる。これらは、1種単独で使用してもよく、2種以上を併用してもよい。 Examples of the vinyl monomer include a nonionic monofunctional ethylene unsaturated monomer and a bifunctional vinyl monomer. These may be used alone or in combination of two or more.
非イオン性単官能エチレン不飽和モノマーとしては、スチレン、ビニルトルエン、エチレン、ビニルアセテート、塩化ビニル、塩化ビニリデン、アクリロニトリル、(メタ)アクリルアミド及び(メタ)アクリル酸エステル等が挙げられる。これらは、1種単独で使用してもよく、2種以上を併用してもよい。 Examples of the nonionic monofunctional ethylene unsaturated monomer include styrene, vinyltoluene, ethylene, vinyl acetate, vinyl chloride, vinylidene chloride, acrylonitrile, (meth) acrylamide, and (meth) acrylic acid ester. These may be used alone or in combination of two or more.
前記(メタ)アクリル酸エステルとしては、メチル(メタ)アクリレート、エチル(メタ)アクリレート、ブチル(メタ)アクリレート、2−ヒドロキシエチル(メタ)アクリレート、2−エチルヘキシル(メタ)アクリレート、ベンジル(メタ)アクリレート、ラウリル(メタ)アクリレート、オレイル(メタ)アクリレート、パルミチル(メタ)アクリレート及びステアリル(メタ)アクリレート等が挙げられる。 Examples of the (meth) acrylic acid ester include methyl (meth) acrylate, ethyl (meth) acrylate, butyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, and benzyl (meth) acrylate. , Lauryl (meth) acrylate, oleyl (meth) acrylate, palmityl (meth) acrylate, stearyl (meth) acrylate and the like.
前記二官能ビニルモノマーとしては、ジビニルベンゼン、アリル(メタ)アクリレート、エチレングリコールジ(メタ)アクリレート、1,5−ブタンジオールジ(メタ)アクリレート及びジエチレングリコールジ(メタ)アクリレート等が挙げられる。 Examples of the bifunctional vinyl monomer include divinylbenzene, allyl (meth) acrylate, ethylene glycol di (meth) acrylate, 1,5-butanediol di (meth) acrylate and diethylene glycol di (meth) acrylate.
重合開始剤としては、水に可溶な公知の化合物を用いることができ、過酸化水素や過硫酸カリウム等が挙げられる。これらは、1種単独で使用してもよく、2種以上を併用してもよい。 As the polymerization initiator, a known compound that is soluble in water can be used, and examples thereof include hydrogen peroxide and potassium persulfate. These may be used alone or in combination of two or more.
界面活性剤としては、水中でミセル等の分子集合体を形成するものであればよく、アニオン界面活性剤、ノニオン界面活性剤、カチオン界面活性剤及び両性界面活性剤等が挙げられる。これらは、1種単独で使用してもよく、2種以上を併用してもよい。 The surfactant may be any one that forms molecular aggregates such as micelles in water, and examples thereof include anionic surfactants, nonionic surfactants, cationic surfactants, and amphoteric surfactants. These may be used alone or in combination of two or more.
水系分散媒としては、水及び親水性有機溶剤を含有する水等が挙げられる。 Examples of the aqueous dispersion medium include water and water containing a hydrophilic organic solvent.
樹脂中空粒子に用いられる樹脂としては、熱分解性の観点から好ましくはポリスチレン、ポリメチルメタクリレート、ポリウレタン及びエチルアクリレートが挙げられ、更に好ましくはポリスチレン及びポリメチルメタクリレート、特に好ましくはポリメチルメタクリレートである。 Examples of the resin used for the resin hollow particles are preferably polystyrene, polymethylmethacrylate, polyurethane and ethylacrylate from the viewpoint of thermal decomposability, more preferably polystyrene and polymethylmethacrylate, and particularly preferably polymethylmethacrylate.
樹脂中空粒子の市販品としては、テクポリマーシリーズ(積水化成品工業社製)等が挙げられる。 Examples of commercially available resin hollow particles include the Techpolymer series (manufactured by Sekisui Plastics Co., Ltd.).
樹脂中空粒子を、透過型電子顕微鏡(日立ハイテクノロジーズ社製H−7600)を用いて、加速電圧80kVの条件下でTEM写真を撮影する。このとき四酸化ルテニウム染色などを用いることによって、より明確に粒子を確認することができる。この写真に撮影された任意の100個以上の粒子の粒子径及び内径を観察する。この時、粒子の中心を通るように5箇所以上の粒子径及び内径を測定、平均することで、平均粒子径、平均内径とする。更に、(平均内径)3/(平均粒子径)3×100の式より、中空粒子の中空率を求める。前記微粒子の中空率が熱分解性の観点から20vol%以上であることが好ましく、20vol%以上60vol%以下であることがより好ましい。 TEM photographs of the resin hollow particles are taken under the condition of an acceleration voltage of 80 kV using a transmission electron microscope (H-7600 manufactured by Hitachi High-Technologies Corporation). At this time, the particles can be confirmed more clearly by using ruthenium tetroxide staining or the like. Observe the particle size and inner diameter of any 100 or more particles taken in this picture. At this time, the average particle diameter and the average inner diameter are obtained by measuring and averaging the particle diameters and inner diameters of five or more points so as to pass through the center of the particles. Further, the hollow ratio of the hollow particles is obtained from the formula (average inner diameter) 3 / (average particle diameter) 3 × 100. From the viewpoint of thermal decomposition, the hollow ratio of the fine particles is preferably 20 vol% or more, and more preferably 20 vol% or more and 60 vol% or less.
<化合物(C)>
本発明の樹脂組成物は、下記一般式(1)又は(3)で表される化合物(C)を含有する。
<Compound (C)>
The resin composition of the present invention contains the compound (C) represented by the following general formula (1) or (3).
一般式(1)で表される化合物としては、Rは炭素数1〜24であるアルキル基又はアルケニル基を表す。具体的には、炭素数1〜24のアルキル基としては、メチル基、エチル基、n−プロピル基、イソプロピル基、n−ブチル基、イソブチル基、sec−ブチル基、tert−ブチル基、直鎖又は分枝ペンチル基、直鎖又は分枝ヘキシル基、直鎖又は分枝ヘプチル基、直鎖又は分枝オクチル基、直鎖又は分枝ノニル基、直鎖又は分枝デシル基、直鎖又は分枝ウンデシル基、直鎖又は分枝ドデシル基、直鎖又は分枝トリデシル基、直鎖又は分枝テトラデシル基、直鎖又は分枝ペンタデシル基、直鎖又は分枝ヘキサデシル基、直鎖又は分枝ヘプタデシル基、直鎖又は分枝オクタデシル基、直鎖又は分枝ノナデシル基、直鎖又は分枝イコシル基、直鎖又は分枝ヘンイコシル基、直鎖又は分枝ドコシル基、直鎖又は分枝トリコシル基及び直鎖又は分枝テトラコシル基等が挙げられる。中空粒子の分散性の観点から、好ましくは炭素数14〜24のアルキル基又はアルケニル基である。更に好ましくは、炭素数16〜22のアルキル基又はアルケニル基である。 As the compound represented by the general formula (1), R represents an alkyl group or an alkenyl group having 1 to 24 carbon atoms. Specifically, the alkyl groups having 1 to 24 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, sec-butyl group, tert-butyl group and linear chain. Or a branched pentyl group, a linear or branched hexyl group, a linear or branched heptyl group, a linear or branched octyl group, a linear or branched nonyl group, a linear or branched decyl group, a linear or branched group. Branched undecyl group, linear or branched dodecyl group, linear or branched tridecyl group, linear or branched tetradecyl group, linear or branched pentadecyl group, linear or branched hexadecyl group, linear or branched heptadecyl Group, linear or branched octadecyl group, linear or branched nonadesyl group, linear or branched icosyl group, linear or branched henicosyl group, linear or branched docosyl group, linear or branched tricosyl group and Examples thereof include a linear or branched tetracosyl group. From the viewpoint of dispersibility of the hollow particles, an alkyl group or an alkenyl group having 14 to 24 carbon atoms is preferable. More preferably, it is an alkyl group or an alkenyl group having 16 to 22 carbon atoms.
一般式(1)中のA1Oは炭素数2〜6のアルキレンオキシ基から選ばれる少なくとも1種の基である。炭素数2〜6のアルキレンオキシ基としては、エチレンオキシ基、1,2−プロピレンオキシ基、1,3−プロピレンオキシ基、ブチレンオキシ基及びへキシレンオキシ基等が挙げられる。ポリアミド酸(A)に含まれる溶剤に対する化合物(C)の溶解性の観点で好ましくはエチレンオキシド基である。 A 1 O in the general formula (1) is at least one group selected from alkyleneoxy groups having 2 to 6 carbon atoms. Examples of the alkyleneoxy group having 2 to 6 carbon atoms include an ethyleneoxy group, a 1,2-propyleneoxy group, a 1,3-propyleneoxy group, a butyleneoxy group and a hexyleneoxy group. From the viewpoint of solubility of the compound (C) in the solvent contained in the polyamic acid (A), an ethylene oxide group is preferable.
一般式(1)中のeは1以上100以下の整数である。溶剤への溶解性の観点で、eは30以上90以下の整数が好ましい。eが2以上の場合、複数あるA1Oは同一でも異なっていてもよい。 E in the general formula (1) is an integer of 1 or more and 100 or less. From the viewpoint of solubility in a solvent, e is preferably an integer of 30 or more and 90 or less. If e is 2 or more, a plurality of A 1 O may be the same or different.
一般式(1)中の−(A1O)e−Hは下記一般式(2)で表される末端基を有する。 -(A 1 O) e- H in the general formula (1) has a terminal group represented by the following general formula (2).
A2Oは炭素数2〜6のアルキレンオキシ基から選ばれる1種であり、炭素数2〜6のアルキレンオキシ基としては、エチレンオキシ基、1,2−プロピレンオキシ基、1,3−プロピレンオキシ基、ブチレンオキシ基及びへキシレンオキシ基等が挙げられる。溶剤への溶解性の観点で好ましくはエチレンキシ基、1,2−プロピレンオキシ基及び1,3−プロピレンオキシ基であり、更に好ましくはエチレンオキシ基である。 A 2 O is one selected from alkyleneoxy groups having 2 to 6 carbon atoms, and the alkyleneoxy groups having 2 to 6 carbon atoms include ethyleneoxy groups, 1,2-propyleneoxy groups, and 1,3-propylene. Examples thereof include an oxy group, a butyleneoxy group and a hexyleneoxy group. From the viewpoint of solubility in a solvent, an ethylenexi group, a 1,2-propyleneoxy group and a 1,3-propyleneoxy group are preferable, and an ethyleneoxy group is more preferable.
一般式(2)で表される基に含まれるgは1以上100以下の整数であり、溶剤への溶解性の観点で、gは30以上90以下の整数が好ましい。 The g contained in the group represented by the general formula (2) is an integer of 1 or more and 100 or less, and g is preferably an integer of 30 or more and 90 or less from the viewpoint of solubility in a solvent.
一般式(3)で表される化合物におけるA3O、A4O及びA5Oはそれぞれ炭素数2〜6のアルキレンオキシ基から選ばれる1種であり、炭素数2〜6のアルキレンオキシ基としては、エチレンオキシ基、1,2−プロピレンオキシ基、1,3−プロピレンオキシ基、ブチレンオキシ基及びへキシレンオキシ基等が挙げられる。粒子の分散性の観点で好ましくは1,2−プロピレンオキシ基、1,3−プロピレンオキシ基、ブチレンオキシ基であり、更に好ましくは1,2−プロピレンオキシ基及び/又は1,3−プロピレンオキシ基である。互いに隣り合うA3OとA4O、A4OとA5Oは互いに異なる炭素数のアルキレンオキシ基であり、A3OとA5Oとは同じ炭素数のアルキレンオキシ基であってもよい。 A 3 O, A 4 O and A 5 O in the compound represented by the general formula (3) are one selected from alkyleneoxy groups having 2 to 6 carbon atoms, respectively, and are alkyleneoxy groups having 2 to 6 carbon atoms. Examples thereof include ethyleneoxy group, 1,2-propyleneoxy group, 1,3-propyleneoxy group, butyleneoxy group and hexyleneoxy group. From the viewpoint of particle dispersibility, 1,2-propyleneoxy group, 1,3-propyleneoxy group and butyleneoxy group are preferable, and 1,2-propyleneoxy group and / or 1,3-propyleneoxy group are more preferable. Is the basis. Adjacent to each other, A 3 O and A 4 O, A 4 O and A 5 O are alkyleneoxy groups having different carbon numbers, and A 3 O and A 5 O are alkyleneoxy groups having the same carbon number. Good.
一般式(3)で表される化合物におけるh、i及びjはそれぞれ1以上150以下の整数であり、溶剤への溶解性及び粒子の分散性の観点から30以上140以下の整数である。h+i+jは3以上250以下の整数であり、溶剤への溶解性の観点から好ましくは50以上230以下の整数である。 H, i and j in the compound represented by the general formula (3) are integers of 1 or more and 150 or less, respectively, and are integers of 30 or more and 140 or less from the viewpoint of solubility in a solvent and dispersibility of particles. h + i + j is an integer of 3 or more and 250 or less, and is preferably an integer of 50 or more and 230 or less from the viewpoint of solubility in a solvent.
本発明の中空粒子(B)のポリアミド酸(A)及び中空粒子(B)の合計体積に対する体積割合(vol%)は10〜40であり、絶縁被膜の強度の観点から好ましくは20〜35である。 The volume ratio (vol%) of the hollow particles (B) of the present invention to the total volume of the polyamic acid (A) and the hollow particles (B) is 10 to 40, preferably 20 to 35 from the viewpoint of the strength of the insulating coating. is there.
前記体積割合(vol%)は、中空粒子(B)、ポリアミド酸(A)それぞれの重量をそれぞれの比重で割ることで導き出した体積を用いて、以下の式で計算できる。
中空粒子(B)の体積割合(vol%)= 中空粒子(B)の体積/ポリアミド酸(A)及び中空粒子(B)の合計体積×100
同じように、ポリアミド酸(A)体積割合(vol%)は、以下の式で計算できる。
ポリアミド酸(A)の体積割合(vol%)=
ポリアミド酸(A)の体積/ポリアミド酸(A)及び中空粒子(B)の合計体積×100
なお、前記比重は、例えば、JISZ8807における固体比重測定方法のうち比重ビンによる測定方法によって測定することができる。
The volume ratio (vol%) can be calculated by the following formula using the volume derived by dividing the weights of the hollow particles (B) and the polyamic acid (A) by their respective specific gravities.
Volume ratio of hollow particles (B) (vol%) = Volume of hollow particles (B) / Total volume of polyamic acid (A) and hollow particles (B) x 100
Similarly, the polyamic acid (A) volume ratio (vol%) can be calculated by the following formula.
Volume ratio of polyamic acid (A) (vol%) =
Volume of polyamic acid (A) / Total volume of polyamic acid (A) and hollow particles (B) x 100
The specific gravity can be measured by, for example, the measurement method using a specific gravity bin among the solid specific gravity measuring methods in JISZ8807.
本発明の化合物(C)のポリアミド酸(A)と、中空粒子(B)と、化合物(C)との合計重量に対する重量割合(wt%)は、絶縁性の観点から0.001〜1であることが好ましく、更に好ましくは0.01〜0.1である。 The weight ratio (wt%) of the polyamic acid (A) of the compound (C) of the present invention to the total weight of the hollow particles (B) and the compound (C) is 0.001 to 1 from the viewpoint of insulating properties. It is preferably 0.01 to 0.1.
化合物(C)の溶解度パラメーター(cal/cm3)1/2(以下、SP値と略記)は、ポリアミド酸(A)を調整する際の溶剤として水を用いる場合は、ポリアミド酸(A)に含まれる水に対する化合物(C)の溶解性及び中空粒子(B)の分散安定性の観点から、9.2〜12.5であることが好ましく、更に好ましくは9.5〜12.0、特に好ましくは10.0〜11.5である。ポリアミド酸(A)を調整する際の溶剤としてNMPを用いる場合は、ポリアミド酸(A)に含まれるNMPに対する化合物(C)の溶解性の観点から、8.5〜12.0であることが好ましく、更に好ましくは8.7〜11.5、特に好ましくは8.9〜11.2である。
なお、本発明におけるSP値は、Polymer Engineeringand Science,Feburuary,1974,Vol.14,No.2,147−154に記載のFedors法によって計算される値であり、次式により算出される。
SP値=(ΔH/V)1/2
式中、ΔHはモル蒸発熱(cal)を、Vはモル体積(cm3)を表す。
The solubility parameter (cal / cm 3 ) 1/2 (hereinafter abbreviated as SP value) of the compound (C) is set to the polyamic acid (A) when water is used as the solvent for adjusting the polyamic acid (A). From the viewpoint of the solubility of the compound (C) in the contained water and the dispersion stability of the hollow particles (B), it is preferably 9.2 to 12.5, more preferably 9.5 to 12.0, and particularly preferably 9.5 to 12.0. It is preferably 10.0 to 11.5. When NMP is used as the solvent for adjusting the polyamic acid (A), it may be 8.5 to 12.0 from the viewpoint of the solubility of the compound (C) in the NMP contained in the polyamic acid (A). It is preferable, more preferably 8.7 to 11.5, and particularly preferably 8.9 to 11.2.
The SP value in the present invention is described in Polymer Engineering and Science, February, 1974, Vol. 14, No. It is a value calculated by the Fedors method described in 2,147-154, and is calculated by the following equation.
SP value = (ΔH / V) 1/2
In the formula, ΔH represents the molar heat of vaporization (cal) and V represents the molar volume (cm 3 ).
<熱硬化樹脂(D)>
ポリアミド酸(A)を原料として、ポリアミドイミド及びポリイミド等の熱硬化樹脂(D)を合成することができる。熱硬化樹脂(D)として好ましくは、耐熱性の観点によりポリイミドである。
<Thermosetting resin (D)>
A thermosetting resin (D) such as polyamide-imide and polyimide can be synthesized from the polyamic acid (A) as a raw material. The thermosetting resin (D) is preferably polyimide from the viewpoint of heat resistance.
ポリイミドを製造する方法としては、同種又は異種のポリアミド酸を化学イミド化又は熱イミド化することにより、ポリアミド酸分子内のアミド窒素とカルボキシル基のカルボニル炭素とが求核反応し、その後脱水反応が生じることによりイミド化させるといった方法を用いることができる。 As a method for producing polyimide, by chemically imidizing or thermally imidizing the same or different polyamic acids, the amide nitrogen in the polyamic acid molecule and the carbonyl carbon of the carboxyl group undergo a nucleophilic reaction, followed by a dehydration reaction. A method such as imidization by occurrence can be used.
上記ポリイミドを製造する際に用いる環化触媒(イミド化触媒)の具体例としては、トリメチルアミン、トリエチレンジアミン等の脂肪族第3級アミン、ジメチルアニリン等の芳香族第3級アミン、及びイソキノリン、ピリジン及びβ−ピコリン等の複素環式第3級アミン等が挙げられ、これらは単独で又は2種以上を併用できる。なかでも複素環式第3級アミンを少なくとも一種以上使用する態様が好ましい。 Specific examples of the cyclization catalyst (imidization catalyst) used in producing the above-mentioned polyimide include aliphatic tertiary amines such as trimethylamine and triethylenediamine, aromatic tertiary amines such as dimethylaniline, and isoquinolin and pyridine. And heterocyclic tertiary amines such as β-picoline, etc., which can be used alone or in combination of two or more. Among them, it is preferable to use at least one heterocyclic tertiary amine.
本発明で用いられるポリアミド酸は、ジイソシアネートやジアミンと反応させることで、ポリアミドイミドを製造する原料として用いることができる。 The polyamic acid used in the present invention can be used as a raw material for producing polyamide-imide by reacting with diisocyanate or diamine.
ポリアミドイミドを製造する方法としては、(i)無水トリメリット酸等の1分子中にカルボキシル基と酸無水物基とを有する酸とジイソシアネートとを反応させる方法、(ii)無水トリメリット酸クロライド等の上記酸の反応性誘導体とジアミンとの反応により得られる前駆体ポリマー(ポリアミドイミド前駆体であるポリアミド酸)において、分子内のアミド窒素とカルボキシル基のカルボニル炭素とが求核反応し、その後脱水縮合反応が生じることによりイミド化する方法等、公知の手法を用いることができる。 Examples of the method for producing polyamideimide include (i) a method of reacting an acid having a carboxyl group and an acid anhydride group in one molecule such as trimellitic anhydride with diisocyanate, and (ii) trimellitic anhydride chloride. In the precursor polymer (polyamellitic acid, which is a polyamideimide precursor) obtained by the reaction of the above-mentioned acid-reactive derivative with diamine, the amide nitrogen in the molecule and the carbonyl carbon of the carboxyl group undergo a nucleophilic reaction, and then dehydration occurs. A known method such as a method of imidizing by causing a condensation reaction can be used.
上記ポリアミドイミドの製造で用いられる酸又はその反応性誘導体としては、無水トリメリット酸、無水トリメリット酸クロライド等の無水トリメリット酸ハロゲン化物及び無水トリメリット酸エステル等が挙げられる。 Examples of the acid or its reactive derivative used in the production of the polyamide-imide include trimellitic anhydride, trimellitic anhydride such as trimellitic anhydride, and trimellitic anhydride ester.
上記ポリアミドイミドの製造で用いられるジイソシアネートとしては、特に限定されず、任意のジアミンに対応するジイソシアネート化合物等が挙げられ、具体的には、メタフェニレンジイソシアネート、p−フェニレンジイソシアネート、o−トリジンジイソシアネート、p−フェニレンジイソシアネート、m−フェニレンジイソシアネート、4,4’−オキシビス(フェニルイソシアネート)、4,4’−ジイソシアネートジフェニルメタン、ビス[4−(4−イソシアネートフェノキシ)フェニル]スルホン、2,2’−ビス[4−(4−イソシアネートフェノキシ)フェニル]プロパン、2,4−トリレンジイソシアネート、2,6−トリレンジイソシアネート、4,4’−ジフェニルメタンジイソシアネート、3,3’−ジメチルジフェニル−4,4’−ジイソシアネート、3,3’−ジエチルジフェニル−4,4’−ジイソシアネート、イソホロンジイソシアネート、ヘキサメチレンジイソシアネート、4,4’−ジシクロヘキシルメタンジイソシアネート、m−キシレンジイソシアネート、p−キシレンジイソシアネート及びナフタレンジイソシアネート等が挙げられる。 The diisocyanate used in the production of the above polyamide diis is not particularly limited, and examples thereof include diisocyanide compounds corresponding to any diamine. Specific examples thereof include metaphenylene diisocyanate, p-phenylenediocyanis, o-trizine diisocyanate, and p. -Phenylene diisocyanate, m-phenylenedi isocyanate, 4,4'-oxybis (phenylisocyanide), 4,4'-diisocyanide diphenylmethane, bis [4- (4-isocyanene phenoxy) phenyl] sulfone, 2,2'-bis [4 -(4-Isylene phenoxy) phenyl] propane, 2,4-tolylene diisocyanate, 2,6-tolylene diisocyanate, 4,4'-diphenylmethane diisocyanate, 3,3'-dimethyldiphenyl-4,4'-diisocyanate, Examples thereof include 3,3'-diethyldiphenyl-4,4'-diisocyanis, isophorone diisocyanis, hexamethylene diisocyanate, 4,4'-dicyclohexylmethane diisocyanate, m-xylene diisocyanate, p-xylene diisocyanate and naphthalenedi isocyanate.
本発明の樹脂組成物は、ポリアミド酸(A)と、中空粒子(B)と、化合物(C)の他に溶剤、消泡剤、レベリング剤、難燃剤、酸化防止剤、紫外線防止剤、光安定剤及び可塑剤等を含むことができる。
前記溶剤としては、特に限定されないが、例えば、本発明で用いられるポリアミドイミド前駆体やポリイミド前駆体の製造時に用いられる溶剤に由来するものを含むことができる。前記溶剤としては、N−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、γ−ブチロラクトン、γ−バレロラクトン、ε−カプロラクトン、ジメチルスルホキシド、アセトニトリル、ジエチレングリコールジエチルエーテル、ジオキサン、テトラヒドロフラン及び水等が挙げられる。ポリイミドやポリアミド酸が可溶な他の溶剤から選択される1種又は2種以上等を使用することができる。
In addition to the polyamic acid (A), the hollow particles (B), and the compound (C), the resin composition of the present invention contains a solvent, a defoaming agent, a leveling agent, a flame retardant, an antioxidant, an ultraviolet inhibitor, and light. Stabilizers, plasticizers and the like can be included.
The solvent is not particularly limited, and may include, for example, a polyamide-imide precursor used in the present invention or a solvent derived from a solvent used in the production of the polyimide precursor. Examples of the solvent include N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, γ-butyrolactone, γ-valerolactone, ε-caprolactone, dimethyl sulfoxide, acetonitrile, diethylene glycol diethyl ether, and dioxane. , Tetrahydrofuran, water and the like. One or more selected from other solvents in which polyimide or polyamic acid is soluble can be used.
<熱硬化物>
本発明の熱硬化物は、樹脂組成物の熱硬化物である。
熱硬化物の成型方法は、例えば、樹脂組成物を塗工基材上にスピンコート、スリットコート、スロットダイコート及びブレードコート等の公知の方法で塗工して、その後焼き付けをして、樹脂組成物中に含まれる前記ポリアミド酸(A)を縮合反応させる工程により、樹脂組成物を硬化させる方法が挙げられる。塗工基材としては、銅や銅合金線、アルミニウム線等の金属導体が用いられる。基材の径やその断面形状は特に限定しないが、基材径が0.4mm〜3.0mmのもの等が好ましく使用できる。
<Thermosetting product>
The thermosetting product of the present invention is a thermosetting product of a resin composition.
As a method for molding a thermosetting product, for example, a resin composition is coated on a coated base material by a known method such as spin coating, slit coating, slot die coating and blade coating, and then baked to form a resin composition. Examples thereof include a method of curing the resin composition by a step of condensing the polyamic acid (A) contained in the substance. As the coating base material, a metal conductor such as copper, a copper alloy wire, or an aluminum wire is used. The diameter of the base material and its cross-sectional shape are not particularly limited, but those having a base material diameter of 0.4 mm to 3.0 mm and the like can be preferably used.
本発明の樹脂組成物を前記金属導体の表面に塗布し、焼付けにより絶縁被膜である熱硬化物を形成することが好ましい。塗布、焼付けは、公知の絶縁電線の絶縁被膜の形成と同様の方法、条件により行うことができる。塗布、焼付け処理を2回以上繰り返してもよい。また、本発明の樹脂組成物は、本発明の趣旨を損なわない範囲で、他の樹脂塗料とブレンドして用いることも可能である。 It is preferable that the resin composition of the present invention is applied to the surface of the metal conductor and baked to form a thermosetting product which is an insulating film. The coating and baking can be carried out by the same method and conditions as those for forming the insulating film of the known insulated electric wire. The coating and baking treatment may be repeated twice or more. Further, the resin composition of the present invention can be used by blending with other resin paints as long as the gist of the present invention is not impaired.
本発明の樹脂組成物の焼付は、前記樹脂組成物に含まれるポリアミド酸(A)の種類に応じて温度条件と加熱条件を適宜決めることができる。ポリアミド酸(A)としてトリメリット酸無水物、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物、及び2,3,3’,4’−ビフェニルテトラカルボン酸二無水物を用いてポリアミドイミド、ポリイミドを製造する場合、炉の形状等に左右されるが、およそ5mの自然対流式の竪型炉であれば、300〜500℃にて通過時間を2〜4分間に設定することにより行うことが好ましい。 In the baking of the resin composition of the present invention, the temperature condition and the heating condition can be appropriately determined according to the type of the polyamic acid (A) contained in the resin composition. Trimellitic acid anhydride, 3,3', 4,4'-biphenyltetracarboxylic dianhydride, and 2,3,3', 4'-biphenyltetracarboxylic dianhydride were used as the polyamic acid (A). When producing polyamide-imide or polyimide, the transit time is set to 2 to 4 minutes at 300 to 500 ° C. for a natural convection vertical furnace of about 5 m, although it depends on the shape of the furnace. It is preferable to carry out this.
絶縁被膜である熱硬化物の厚みは、基材を保護する観点から、1−200μmが好ましく、より好ましくは10−100μmである。絶縁被膜が分厚くなりすぎると、絶縁電線の外径が大きくなり、ひいては絶縁電線を捲線したコイルの占積率が低下する傾向があるからである。 The thickness of the thermosetting product, which is the insulating film, is preferably 1 to 200 μm, more preferably 10 to 100 μm, from the viewpoint of protecting the base material. This is because if the insulating film becomes too thick, the outer diameter of the insulated wire tends to increase, and the space factor of the coil wound with the insulated wire tends to decrease.
次に本発明を実施例によって具体的に説明するが、本発明の主旨を逸脱しない限り本発明は実施例に限定されるものではない。なお、特記しない限り部は重量部、%は重量%を意味する。 Next, the present invention will be specifically described with reference to Examples, but the present invention is not limited to the Examples as long as the gist of the present invention is not deviated. Unless otherwise specified, parts mean parts by weight and% means% by weight.
[製造例1]
攪拌機、窒素流入管、温度計、冷却管を取り付けたフラスコを用意し、第一段目の合成反応として、トリメリット酸無水物(TMA)526部、メタノール9部をN−メチル−2−ピロリドン(NMP、SP値11.2)1167部に溶解させ、60℃で2時間反応させた。その後、4,4’−ジフェニルメタンジイソシアネート(MDI)を699部投入し、140℃で2時間、150℃で1時間、さらに160℃で1時間反応させた。反応終了後、反応液を冷却し、ベンジルアルコール30部、N,N−ジメチルホルムアミド(DMF)292部を加え、ポリアミド酸としてポリアミドイミド前駆体(A−1)を得た。
[Manufacturing Example 1]
Prepare a flask equipped with a stirrer, nitrogen inflow tube, thermometer, and cooling tube, and as the first-stage synthetic reaction, add 526 parts of trimellitic acid anhydride (TMA) and 9 parts of methanol to N-methyl-2-pyrrolidone. It was dissolved in 1167 parts (NMP, SP value 11.2) and reacted at 60 ° C. for 2 hours. Then, 699 parts of 4,4'-diphenylmethane diisocyanate (MDI) was added and reacted at 140 ° C. for 2 hours, 150 ° C. for 1 hour, and 160 ° C. for 1 hour. After completion of the reaction, the reaction solution was cooled, and 30 parts of benzyl alcohol and 292 parts of N, N-dimethylformamide (DMF) were added to obtain a polyamide-imide precursor (A-1) as a polyamic acid.
[製造例2]
攪拌機、窒素流入管、温度計、冷却管を取り付けたフラスコを用意し、トランス−1,4−ジアミノシクロヘキサン30部を窒素雰囲気下にてNMP524部に溶解した。次に、3,3’,4,4’−ビフェニルテトラカルボン酸二無水物62部、2,3,3’,4’−ビフェニルテトラカルボン酸二無水物16部を添加し、40℃で溶解するまで攪拌した。その後8時間撹拌し、ポリアミド酸としてポリイミド前駆体(A−2)を得た。
[Manufacturing Example 2]
A flask equipped with a stirrer, a nitrogen inflow tube, a thermometer, and a cooling tube was prepared, and 30 parts of trans-1,4-diaminocyclohexane was dissolved in 524 parts of NMP under a nitrogen atmosphere. Next, 62 parts of 3,3', 4,4'-biphenyltetracarboxylic dianhydride and 16 parts of 2,3,3', 4'-biphenyltetracarboxylic dianhydride were added and dissolved at 40 ° C. Stirred until Then, the mixture was stirred for 8 hours to obtain a polyimide precursor (A-2) as a polyamic acid.
[実施例1]
製造例1で得られたポリアミドイミド前駆体(A−1)100部に対して中空シリカ(鈴木油脂工業製ゴッドボールB6−C数平均粒径3μm、中空率80vol%)(B−1)8.9部と化合物(C)としてニューポールPE−68(三洋化成工業製、EO−PO−EOトリブロック共重合体)(SP値9.9)(C−1)を0.5部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリアミドイミド前駆体を含む樹脂組成物(S−1)を得た。
[Example 1]
Hollow silica (Godball B6-C number average particle size 3 μm manufactured by Suzuki Yushi Kogyo Co., Ltd., hollow ratio 80 vol%) (B-1) 8 with respect to 100 parts of the polyamide-imide precursor (A-1) obtained in Production Example 1. .9 parts and 0.5 parts of New Pole PE-68 (EO-PO-EO triblock copolymer manufactured by Sanyo Kasei Kogyo Co., Ltd.) (SP value 9.9) (C-1) were added as compound (C). A resin composition (S-1) containing a hollow particle-dispersed polyamide-imide precursor is obtained by stirring for 5 minutes with a stirring defoamer (Sinky Co., Ltd., Awatori Rentaro AR-360M, rotation 600 rpm, revolution 2000 rpm). It was.
[実施例2]
製造例2で得られたポリイミド前駆体(A−2)100部に対して中空シリカ(ポッターズ・バロティーニ製Sphericelー110P8数平均粒径12μm、中空率50vol%)(B−2)3.81部と化合物(C)としてニューポールPE−68(三洋化成工業製、EO−PO−EOトリブロック共重合体)(SP値9.9)(C−1)を0.2部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリイミド前駆体を含む樹脂組成物(S−2)を得た。
[Example 2]
Hollow silica (Polyethylene-110P8 number average particle size 12 μm, hollow ratio 50 vol%) (B-2) 3.81 with respect to 100 parts of the polyimide precursor (A-2) obtained in Production Example 2. Add 0.2 parts of New Pole PE-68 (EO-PO-EO triblock copolymer manufactured by Sanyo Kasei Kogyo Co., Ltd.) (SP value 9.9) (C-1) as part and compound (C), and stir off. A resin composition (S-2) containing a hollow particle-dispersed polyimide precursor was obtained by stirring with a foaming machine (manufactured by Shinky Co., Ltd., Awatori Rentaro AR-360M, rotation 600 rpm, revolution 2000 rpm) for 5 minutes.
[実施例3]
製造例1で得られたポリアミドイミド前駆体(A−1)100部に対してPMMA架橋中空粒子(松本油脂工業製、マツモトマイクロスフィアMHB−R、数平均粒径12μm、中空率60vol%)(B−4)5.25部と化合物(C)としてエマルミンV−100(三洋化成工業製、オレイルアルコールEO付加物)(C−2)を0.3部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリアミドイミド前駆体を含む樹脂組成物(S−3)を得た。
[Example 3]
PMMA cross-linked hollow particles (manufactured by Matsumoto Yushi Kogyo Co., Ltd., Matsumoto Microsphere MHB-R, number average particle size 12 μm, hollow ratio 60 vol%) with respect to 100 parts of the polyamide-imide precursor (A-1) obtained in Production Example 1 ( B-4) 5.25 parts and 0.3 part of Emulmin V-100 (manufactured by Sanyo Kasei Kogyo Co., Ltd., oleyl alcohol EO adduct) (C-2) as compound (C) were added, and a stirring defoamer (Shinky Co., Ltd.) Awatori Rentaro AR-360M (manufactured by Awatori Rentaro AR-360M, rotation 600 rpm, revolution 2000 rpm) was stirred for 5 minutes to obtain a resin composition (S-3) containing a hollow particle-dispersed polyamide-imide precursor.
[実施例4]
製造例2で得られたポリイミド前駆体(A−2)100部に対してPMMA架橋中空粒子(積水化学工業製テクポリマーMBX−3、数平均粒径3μm、中空率40vol%)(B−5)2.68部と化合物(C)としてエマルミンV−100(三洋化成工業製、オレイルアルコールEO付加物)(C−2)を0.2部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリイミド前駆体を含む樹脂組成物(S−4)を得た。
[Example 4]
PMMA crosslinked hollow particles (Techpolymer MBX-3 manufactured by Sekisui Chemical Co., Ltd., number average particle size 3 μm, hollow ratio 40 vol%) (B-5) with respect to 100 parts of the polyimide precursor (A-2) obtained in Production Example 2. ) 2.68 parts and 0.2 parts of Emulmin V-100 (manufactured by Sanyo Kasei Kogyo Co., Ltd., oleyl alcohol EO adduct) (C-2) as compound (C) were added, and a stirring defoamer (manufactured by Shinky Co., Ltd., Awa) A resin composition (S-4) containing a hollow particle-dispersed polyimide precursor was obtained by stirring with Tori Rentaro AR-360M (rotation 600 rpm, revolution 2000 rpm) for 5 minutes.
[実施例5]
製造例2で得られたポリイミド前駆体(A−2)100部に対してPMMA架橋中空粒子(三水製中空ポリマー粒子、数平均粒径0.9μm、中空率60vol%)(B−6)2.69部と化合物(C)としてエマルミンV−100(三洋化成工業製、オレイルアルコールEO付加物)(C−2)を0.2部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリイミド前駆体を含む樹脂組成物(S−5)を得た。
[Example 5]
PMMA crosslinked hollow particles (three-water hollow polymer particles, number average particle size 0.9 μm, hollow ratio 60 vol%) with respect to 100 parts of the polyimide precursor (A-2) obtained in Production Example 2 (B-6). 2.69 parts and 0.2 parts of Emulmin V-100 (manufactured by Sanyo Kasei Kogyo Co., Ltd., oleyl alcohol EO adduct) (C-2) were added as compound (C), and a stirring defoamer (manufactured by Shinky Co., Ltd., Awatori) was added. A resin composition (S-5) containing a hollow particle-dispersed polyimide precursor was obtained by stirring with Rentaro AR-360M (rotation 600 rpm, revolution 2000 rpm) for 5 minutes.
[実施例6]
製造例1で得られたポリアミドイミド前駆体(A−1)100部に対して中空シリカ(電気化学工業製BS―0340平均粒径3μm、中空率40vol%)(B−3)9.96部と化合物(C)としてニューポールPE−68(三洋化成工業製、EO−PO−EOトリブロック共重合体)(SP値9.9)(C−1)を0.5部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリアミドイミド前駆体を含む樹脂組成物(S−6)を得た。
[Example 6]
9.96 parts of hollow silica (BS-0340 average particle size 3 μm, hollow ratio 40 vol%) (B-3) with respect to 100 parts of the polyamide-imide precursor (A-1) obtained in Production Example 1. And 0.5 part of New Pole PE-68 (EO-PO-EO triblock copolymer manufactured by Sanyo Kasei Kogyo Co., Ltd.) (SP value 9.9) (C-1) was added as compound (C), and the mixture was stirred and defoamed. A resin composition (S-6) containing a hollow particle-dispersed polyamide-imide precursor was obtained by stirring with a machine (manufactured by Shinky Co., Ltd., Awatori Rentaro AR-360M, rotation 600 rpm, revolution 2000 rpm) for 5 minutes.
[実施例7]
製造例2で得られたポリイミド前駆体(A−2)100部に対して中空シリカ(電気化学工業製BS―0340平均粒径3μm、中空率40vol%)(B−3)3.82部と化合物(C)としてニューポールPE−68(三洋化成工業製、EO−PO−EOトリブロック共重合体)(SP値9.9)(C−1)を0.2部加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリアミドイミド前駆体を含む樹脂組成物(S−7)を得た。
[Example 7]
Hollow silica (BS-0340 average particle size 3 μm, hollow ratio 40 vol%) (B-3) 3.82 parts with respect to 100 parts of the polyimide precursor (A-2) obtained in Production Example 2. 0.2 part of New Pole PE-68 (EO-PO-EO triblock copolymer manufactured by Sanyo Kasei Kogyo Co., Ltd.) (SP value 9.9) (C-1) was added as compound (C), and a stirring defoamer A resin composition (S-7) containing a hollow particle-dispersed polyamide-imide precursor was obtained by stirring for 5 minutes at (Awatori Rentaro AR-360M, manufactured by Shinky Co., Ltd., rotation 600 rpm, revolution 2000 rpm).
[比較例1]
製造例1でポリアミドイミド前駆体(A−1)100部に対して中空シリカ(電気化学工業製BS―0340平均粒径3μm、中空率40vol%)(B−3)9.96部を加え、攪拌脱泡機(株式会社シンキー製、あわとり錬太郎AR−360M、自転600rpm、公転2000rpm)にて5分間攪拌して中空粒子分散ポリアミドイミド前駆体を含む樹脂組成物(S’−1)を得た。
[Comparative Example 1]
In Production Example 1, 9.96 parts of hollow silica (BS-0340 average particle size 3 μm, hollow ratio 40 vol%) (B-3) manufactured by Denki Kagaku Kogyo Co., Ltd. was added to 100 parts of the polyamide-imide precursor (A-1). A resin composition (S'-1) containing a hollow particle-dispersed polyamide-imide precursor was stirred for 5 minutes with a stirring defoamer (Sinky Co., Ltd., Awatori Rentaro AR-360M, rotation 600 rpm, revolution 2000 rpm). Obtained.
<樹脂組成物中における分散性評価>
樹脂組成物(S−1)〜(S−7)中における中空粒子の分散性を評価し、表1に記載した。分散性の評価はレーザー回折/散乱式粒子径分布測定装置(LA−920(HORIBA製)を用いてNMPの屈折率1.47、シリカの屈折率1.44として、樹脂組成物中における中空粒子の凝集粒子(二次粒子)の数平均粒子径を測定し、解析を行った。中空粒子の粒子径に対して10倍以上の大きさの凝集粒子が、樹脂組成物中の全中空粒子(二次粒子も含む)の個数に対して10%以上含まれる場合は、分散性が好ましくないと判断される。分散性が悪い場合、熱硬化物の強度が低下し、耐電圧寿命が短くなる。
<Evaluation of dispersibility in resin composition>
The dispersibility of the hollow particles in the resin compositions (S-1) to (S-7) was evaluated and shown in Table 1. The dispersibility was evaluated by using a laser diffraction / scattering particle size distribution measuring device (LA-920 (manufactured by HORIBA)) to set the refractive index of NMP to 1.47 and the refractive index of silica to 1.44. The number average particle size of the agglomerated particles (secondary particles) was measured and analyzed. The agglomerated particles having a size of 10 times or more the particle size of the hollow particles are all hollow particles in the resin composition. If it is contained in an amount of 10% or more with respect to the number of secondary particles), it is judged that the dispersibility is not preferable. ..
<熱硬化物中における分散性評価>
熱硬化物中での中空粒子の分散性を評価した。熱硬化物のフィルム(厚み50〜200μm)から、走査電子顕微鏡であるウルトラミクロトームUC7(日本電子株式会社)を用いて厚さ300nmの超薄切片を切り出した試料を試料台に載せて、蒸着器を用いて試料にPtを蒸着して観察した。走査電子顕微鏡に染色された試料を入れ、10μA、15kV、5,000倍に拡大して、無機中空粒子(二次粒子も含む)の観察あるいは、樹脂中空粒子が融解することで生じた空孔の観察を行い、その中から前記粒子又は前記空孔を任意に100個選び、各々の長径を測定し、その数平均値を計算して、数平均粒子径とする。電子顕微鏡の画像に附属した画像解析装置で長径の数平均粒子径を計算しても良い、あるいは画像から直接粒子の長径を100個測定し、その数平均値を求めることができる。中空粒子の粒子径に対して10倍以上の大きさの凝集粒子が、熱硬化物中の全中空粒子(二次粒子も含む)の個数に対して10%以上含まれる場合は、分散性が好ましくないと判断される。分散性が悪い場合、熱硬化物の強度が低下し、耐電圧寿命が短くなる。
<Evaluation of dispersibility in thermosetting products>
The dispersibility of hollow particles in the thermosetting product was evaluated. A sample obtained by cutting out an ultrathin section having a thickness of 300 nm from a thermocured film (thickness 50 to 200 μm) using an ultramicrotome UC7 (JEOL Ltd.), which is a scanning electron microscope, is placed on a sample table and a vapor deposition apparatus. Pt was vapor-deposited on the sample and observed. Place the stained sample in a scanning electron microscope and magnify it at 10 μA, 15 kV, 5,000 times to observe inorganic hollow particles (including secondary particles) or pores created by melting resin hollow particles. Are observed, 100 of the particles or the pores are arbitrarily selected, the major axis of each is measured, and the number average value is calculated to obtain the number average particle size. The number average particle diameter of the major axis may be calculated by an image analyzer attached to the image of the electron microscope, or 100 major axes of the particles can be measured directly from the image and the number average value can be obtained. Dispersibility is achieved when agglomerated particles having a size 10 times or more the particle size of the hollow particles are contained in an amount of 10% or more based on the total number of hollow particles (including secondary particles) in the thermosetting product. It is judged to be unfavorable. If the dispersibility is poor, the strength of the thermosetting product is reduced and the withstand voltage life is shortened.
<硬化条件>
得られたポリアミドイミド前駆体を含む樹脂組成物{(S−1)、(S−3)、(S−6)、(S’−1)}をガラス基板に塗布し、180℃で30分間、300℃で30分間焼成してポリイミドを含む熱硬化物{(T−1)、(T−3)、(T−6)、(T’−1)}を得た。
また、得られたポリイミド前駆体を含む樹脂組成物{(S−2)、(S−4)、(S−5)、(S−7)}をガラス基板に塗布し、120℃で1時間、150℃で30分、200℃で30分、300℃で20分昇温して、ポリイミドを含む熱硬化物{(T−2)、(T−4)、(T−5)、(T−7)}を得た。
<Curing conditions>
The obtained resin composition containing the polyamide-imide precursor {(S-1), (S-3), (S-6), (S'-1)} was applied to a glass substrate, and the temperature was 180 ° C. for 30 minutes. , 300 ° C. for 30 minutes to obtain thermosetting products containing polyimide {(T-1), (T-3), (T-6), (T'-1)}.
Further, the obtained resin composition containing the polyimide precursor {(S-2), (S-4), (S-5), (S-7)} was applied to a glass substrate, and the temperature was 120 ° C. for 1 hour. , 150 ° C. for 30 minutes, 200 ° C. for 30 minutes, 300 ° C. for 20 minutes, thermosetting products containing polyimide {(T-2), (T-4), (T-5), (T) -7)} was obtained.
<比誘電率>
実施例及び比較例において作製したポリアミドイミド前駆体又はポリイミド前駆体を含む樹脂組成物をフィルム状に成型し得られた熱硬化物である、2mm×100mmの試験短冊片を、空洞共振器摂動法(C8720ES;アジレント製)を用いて周波数10GHzにおける誘電率を測定した。結果を表1にまとめて記載した。
<Relative permittivity>
A 2 mm × 100 mm test strip, which is a thermosetting product obtained by molding a polyamide-imide precursor or a resin composition containing a polyimide precursor produced in Examples and Comparative Examples into a film, is subjected to a cavity resonator perturbation method. (C8720ES; manufactured by Azilent) was used to measure the dielectric constant at a frequency of 10 GHz. The results are summarized in Table 1.
<部分放電電圧>
実施例及び比較例において作製したポリアミドイミド前駆体又はポリイミド前駆体を含む樹脂組成物を厚さ100μmで成型し得られた熱硬化物である、黄銅製平行平板電極(直径30mm)で挟み、交流電圧を0.5kV/minで昇圧して課電し、最初に放電電流が検出される時点の電圧値を測定した。結果を表1にまとめて記載した。
<Partial discharge voltage>
The polyamide-imide precursor or the resin composition containing the polyimide precursor produced in Examples and Comparative Examples is sandwiched between brass parallel plate electrodes (diameter 30 mm), which is a thermosetting product obtained by molding to a thickness of 100 μm, and alternating current. The voltage was boosted at 0.5 kV / min to charge electricity, and the voltage value at the time when the discharge current was first detected was measured. The results are summarized in Table 1.
<耐電圧寿命>
実施例及び比較例において作製した熱硬化物をフィルム状に成型し、を黄銅製平行平板電極(直径30mm)で挟み、初期荷電1kVから0.5kV/minで3kVまで昇圧して荷電し、短絡するまでの時間を測定した。結果を表1にまとめて記載した。
<Withstand voltage life>
The thermosetting products produced in Examples and Comparative Examples were molded into a film, sandwiched between brass parallel plate electrodes (diameter 30 mm), boosted from an initial charge of 1 kV to 3 kV at 0.5 kV / min, charged, and short-circuited. The time to complete was measured. The results are summarized in Table 1.
本発明の熱硬化物は、絶縁被膜による誘電率の低減を図ることができ、従来の絶縁電線で且つ適用電圧が高い機器に用いられる絶縁電線、家電製品、電気及び電子材料、建材、プリント基板用銅配線工程で好適に利用することができる。 The heat-cured product of the present invention can reduce the dielectric constant by an insulating film, and is an insulated wire, a household appliance, an electric and electronic material, a building material, a printed circuit board, which is a conventional insulated wire and is used for equipment having a high applicable voltage. It can be suitably used in the copper wiring process.
Claims (4)
The method for producing a thermosetting product according to claim 3, which comprises a step of dehydrating and condensing the polyamic acid (A) contained in the resin composition according to claim 1 or 2.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019166020 | 2019-09-12 | ||
JP2019166020 | 2019-09-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021046538A true JP2021046538A (en) | 2021-03-25 |
Family
ID=74877863
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020141643A Pending JP2021046538A (en) | 2019-09-12 | 2020-08-25 | Resin composition and thermally cured product |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2021046538A (en) |
-
2020
- 2020-08-25 JP JP2020141643A patent/JP2021046538A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5375597B2 (en) | Polyimide resin aqueous solution, polyimide resin aqueous solution, polyazole resin aqueous solution | |
JP5708778B1 (en) | Method for producing polyimide precursor composition | |
JP2006302835A (en) | Polyamideimide resin insulating coating, insulated electric wire, and manufacturing method of those | |
US11286576B2 (en) | Electrodeposition solution and method for producing conductor with insulating film using same | |
CN105315665A (en) | Polyimide precursor composition, method for preparing polyimide precursor, polyimide molded article, and method for preparing polyimide molded article | |
JP2016121295A (en) | Polyimide precursor composition, polyimide molded article, and method for preparing polyimide molded article | |
JP2012184416A (en) | Polyamideimide resin insulation coating and insulated electric wire formed by using the same | |
JP2015178541A (en) | Polyimide precursor composition, method for manufacturing polyimide molded body, and polyimide molded body | |
US20210198521A1 (en) | Polyimide varnish comprising aromatic carboxylic acid for conductor coating and manufacturing method therefor | |
JP5733355B2 (en) | Polyimide resin aqueous solution | |
US20220282088A1 (en) | Polyamic acid composition, method for preparing polyamic acid composition and polyimide comprising the same | |
JP2021046538A (en) | Resin composition and thermally cured product | |
CN105295374A (en) | Polyimide precursor composition, method for preparing polyimide precursor, polyimide molded article, and method for preparing polyimide molded article | |
JP5768926B2 (en) | Polyimide precursor composition, method for producing polyimide precursor composition, method for producing polyimide molded body, polyimide molded body, liquid crystal alignment film, passivation film, wire coating material, and adhesive film | |
JP7206911B2 (en) | Resins, resin compositions, nonwoven fabrics, textile products, separators, secondary batteries, electric double layer capacitors and nonwoven fabrics using these | |
JP7367760B2 (en) | Electrical insulating resin composition and electrical insulator | |
JP2019131747A (en) | Porous polyimide film roll, production method thereof, and composition | |
JP2022108653A (en) | Electro-deposition liquid, and production method of insulation film | |
TW202134317A (en) | Polyamide precursor, resin composition, and flexible substrate | |
JP5712661B2 (en) | Polyamideimide resin insulating paint and insulated wire using the same | |
TWI496816B (en) | Polyimide precursor aqueous composition and method for preparing the same | |
CN108503831B (en) | Composition for forming polyimide, polyimide and polyimide film | |
JP7367759B2 (en) | Electrical insulating resin composition and electrical insulator | |
JP5804314B2 (en) | Polyamideimide resin for insulated wires, insulating paint for insulated wires, and insulated wires using the same | |
JP6863161B2 (en) | Varnish manufacturing method, enamel wire manufacturing method, coil manufacturing method and electrical parts manufacturing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230425 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20240124 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240130 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20240723 |