JP2021021644A - Dust detection device - Google Patents

Dust detection device Download PDF

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JP2021021644A
JP2021021644A JP2019138643A JP2019138643A JP2021021644A JP 2021021644 A JP2021021644 A JP 2021021644A JP 2019138643 A JP2019138643 A JP 2019138643A JP 2019138643 A JP2019138643 A JP 2019138643A JP 2021021644 A JP2021021644 A JP 2021021644A
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dust
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JP7321816B2 (en
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圭司 能丸
Keiji Nomaru
圭司 能丸
展之 木村
Nobuyuki Kimura
展之 木村
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Disco Corp
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Disco Abrasive Systems Ltd
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Abstract

To provide a dust detection device capable of identifying a dust generating source and detecting the floating state of dust.SOLUTION: A dust detection device 2 is provided, comprising a light source 4 configured to irradiate at least three types of pulsed light at different times, image capturing means 6 configured to capture images of dust D irradiated with the at least three types of pulsed light emitted from the light source 4, and display means 8 for displaying the images captured by the image capturing means 6.SELECTED DRAWING: Figure 1

Description

本発明は、粉塵を検出する粉塵検出装置に関する。 The present invention relates to a dust detection device that detects dust.

IC、LSI等の複数のデバイスが分割予定ラインによって区画され表面に形成されたウエーハは、ダイシング装置、レーザー加工装置によって個々のデバイスチップに分割され、分割された各デバイスチップは携帯電話、パソコン等の電気機器に利用される。 A wafer in which a plurality of devices such as ICs and LSIs are partitioned by a planned division line and formed on the surface is divided into individual device chips by a dicing device and a laser processing device, and each divided device chip is a mobile phone, a personal computer, etc. Used for electrical equipment in Japan.

ダイシング装置、レーザー加工装置は、ウエーハを吸引保持するチャックテーブルと、チャックテーブルに吸引保持されたウエーハに加工を施す加工手段(ダイシング装置においては、切削水を供給しながらウエーハを切削する切削ブレードを回転可能に備えた切削手段、レーザー加工装置においては、ウエーハにレーザー光線を照射するレーザー光線照射手段)と、チャックテーブルと加工手段とを相対的に加工送りする送り手段と、から概ね構成されていて、ウエーハを高精度に個々のデバイスチップに分割することができる(たとえば特許文献1および2参照)。このようなダイシング装置、レーザー加工装置は粉塵が極めて少ないクリーンルームに設置される。 The dicing device and the laser processing device include a chuck table that sucks and holds the waha and a processing means that processes the waha that is sucked and held by the chuck table (in the dicing device, a cutting blade that cuts the waha while supplying cutting water). It is generally composed of a rotatably prepared cutting means, and in a laser processing apparatus, a laser beam irradiating means for irradiating a wafer with a laser beam) and a feeding means for relatively processing and feeding a chuck table and a processing means. The waha can be divided into individual device chips with high precision (see, for example, Patent Documents 1 and 2). Such a dicing device and a laser processing device are installed in a clean room with extremely little dust.

特開2008−279526号公報Japanese Unexamined Patent Publication No. 2008-279526 特開2007−152355号公報JP-A-2007-152355

しかし、クリーンルームに設置されたダイシング装置、レーザー加工装置を含む加工装置が粉塵を排出してクリーンルーム内を汚染する場合があるものの粉塵発生源の特定が難しいと共に、粉塵の浮遊状態を検出することが困難であるという問題がある。 However, although processing equipment including dicing equipment and laser processing equipment installed in the clean room may discharge dust and contaminate the inside of the clean room, it is difficult to identify the source of the dust and it is possible to detect the floating state of the dust. There is a problem that it is difficult.

上記事実に鑑みてなされた本発明の課題は、粉塵発生源を特定することができると共に粉塵の浮遊状態を検出することができる粉塵検出装置を提供することである。 An object of the present invention made in view of the above facts is to provide a dust detection device capable of identifying a dust generation source and detecting a floating state of dust.

本発明は上記課題を解決するために以下の粉塵検出装置を提供する。すなわち、粉塵を検出する粉塵検出装置であって、時間差をつけて少なくとも3種類のパルス光を照射する光源と、該光源から照射された該少なくとも3種類のパルス光で照らされた粉塵を撮像する撮像手段と、該撮像手段が撮像した画像を表示する表示手段と、を備える粉塵検出装置を本発明は提供する。 The present invention provides the following dust detection device in order to solve the above problems. That is, it is a dust detection device that detects dust, and images a light source that irradiates at least three types of pulsed light with a time lag and dust that is illuminated by the at least three types of pulsed light emitted from the light source. The present invention provides a dust detection device including an imaging means and a display means for displaying an image captured by the imaging means.

好ましくは、該少なくとも3種類のパルス光は、少なくとも3種類の色から構成される。該少なくとも3種類のパルス光は、少なくとも3種類の明度から構成されるのが好適である。該光源に隣接して配設され該光源から照射された該少なくとも3種類のパルス光を偏光する第一の偏光フィルターと、該撮像手段に隣接して配設され該第一の偏光フィルターを通過したパルス光を遮蔽するように位置づけられた第二の偏光フィルターと、を備えるのが好都合である。該撮像手段が撮像した画像を記憶する記憶手段を含むのが好ましい。該光源が照射する該少なくとも3種類のパルス光の光軸をX軸とし、該X軸に直交する軸をY軸とし、該X軸と該Y軸とに直交する軸をZ軸とした場合、該撮像手段は、該X軸と該Y軸とで特定されるXY平面を撮像する第一の撮像手段と、該X軸と該Z軸とで特定されるXZ平面を撮像する第二の撮像手段とを備えるのが好適である。 Preferably, the at least three types of pulsed light are composed of at least three types of colors. The at least three types of pulsed light are preferably composed of at least three types of brightness. A first polarizing filter arranged adjacent to the light source to polarize at least three types of pulsed light emitted from the light source, and a first polarizing filter arranged adjacent to the imaging means and passing through the first polarizing filter. It is convenient to include a second polarizing filter, which is positioned to shield the pulsed light. It is preferable to include a storage means for storing the image captured by the imaging means. When the optical axis of the at least three types of pulsed light irradiated by the light source is the X-axis, the axis orthogonal to the X-axis is the Y-axis, and the axis orthogonal to the X-axis and the Y-axis is the Z-axis. The imaging means includes a first imaging means for imaging the XY plane specified by the X-axis and the Y-axis, and a second imaging means for imaging the XZ plane specified by the X-axis and the Z-axis. It is preferable to provide an imaging means.

本発明の粉塵検出装置は、時間差をつけて少なくとも3種類のパルス光を照射する光源と、該光源から照射された該少なくとも3種類のパルス光で照らされた粉塵を撮像する撮像手段と、該撮像手段が撮像した画像を表示する表示手段と、を備えるので、粉塵を撮像した画像における少なくとも3種類のパルス光の順序から粉塵の飛散方向を特定することができると共に、撮像した画像における同じ種類のパルス光の間隔とパルス光の繰り返し周波数とに基づいて粉塵の速度を求めることができる。したがって、本発明の粉塵検出装置によれば、粉塵発生源を特定することができると共に粉塵の浮遊状態を検出することができる。 The dust detection device of the present invention comprises a light source that irradiates at least three types of pulsed light with a time lag, an imaging means that captures images of dust illuminated by the at least three types of pulsed light emitted from the light source, and the like. Since the imaging means includes a display means for displaying the image captured, the dust scattering direction can be specified from the order of at least three types of pulsed light in the image obtained by capturing the dust, and the same type in the captured image can be specified. The speed of dust can be determined based on the interval of the pulsed light and the repetition frequency of the pulsed light. Therefore, according to the dust detection device of the present invention, it is possible to identify the dust generation source and detect the floating state of the dust.

本発明に従って構成された粉塵検出装置の斜視図。The perspective view of the dust detection apparatus configured according to this invention. 図1に示す第一の撮像手段によって撮像されたXY平面上における粉塵の軌跡を示す画像の模式図。FIG. 6 is a schematic view of an image showing a trajectory of dust on an XY plane imaged by the first imaging means shown in FIG. 図1に示す第二の撮像手段によって撮像されたXZ平面上における粉塵の軌跡を示す画像の模式図。The schematic diagram of the image which shows the locus of dust on the XZ plane imaged by the 2nd imaging means shown in FIG. 図2および図3に示す画像に基づいて、二個の境界点の座標をYZ平面にプロットした画像の模式図。A schematic view of an image in which the coordinates of two boundary points are plotted on a YZ plane based on the images shown in FIGS. 2 and 3.

以下、本発明に従って構成された粉塵検出装置の好適実施形態について図面を参照しつつ説明する。 Hereinafter, preferred embodiments of the dust detection device configured according to the present invention will be described with reference to the drawings.

図1を参照して説明すると、全体を符号2で示す粉塵検出装置は、時間差をつけて少なくとも3種類のパルス光を照射する光源4と、光源4から照射された少なくとも3種類のパルス光で照らされた粉塵Dを撮像する撮像手段6と、撮像手段6が撮像した画像を表示する表示手段8とを備える。 Explaining with reference to FIG. 1, the dust detection device represented by reference numeral 2 is composed of a light source 4 that irradiates at least three types of pulsed light with a time lag and at least three types of pulsed light emitted from the light source 4. An image pickup means 6 for capturing an image of the illuminated dust D and a display means 8 for displaying an image captured by the image pickup means 6 are provided.

プロジェクタ等から構成され得る光源4は、時間差をつけて少なくとも3種類のパルス光を1種類ずつ照射する。図示の実施形態の光源4は、赤・青・緑の3種類(3色)のパルス光を順番に、それぞれ適宜の繰り返し周波数(たとえば120Hz程度)で照射するようになっている。また、光源4から照射されるパルス光の順番は任意でよいが、図示の実施形態では赤・青・緑の順番で光源4からパルス光が照射される。なお、光源4から照射される少なくとも3種類のパルス光は、少なくとも3種類の明度から構成されていてもよい。 The light source 4, which may be composed of a projector or the like, irradiates at least three types of pulsed light one by one with a time lag. The light source 4 of the illustrated embodiment is adapted to irradiate three types (three colors) of pulsed light of red, blue, and green in order at appropriate repeating frequencies (for example, about 120 Hz). The order of the pulsed light emitted from the light source 4 may be arbitrary, but in the illustrated embodiment, the pulsed light is emitted from the light source 4 in the order of red, blue, and green. The at least three types of pulsed light emitted from the light source 4 may be composed of at least three types of brightness.

図1に示すとおり、図示の実施形態の撮像手段6は、X軸とY軸とで特定されるXY平面を撮像する第一の撮像手段6aと、X軸とZ軸とで特定されるXZ平面を撮像する第二の撮像手段6bとを備える。なお、図示の実施形態では、光源4が照射する少なくとも3種類のパルス光の光軸をX軸とし、X軸に直交する軸をY軸とし、X軸とY軸とに直交する軸をZ軸とする。 As shown in FIG. 1, the imaging means 6 of the illustrated embodiment includes a first imaging means 6a that images an XY plane specified by the X-axis and the Y-axis, and an XZ specified by the X-axis and the Z-axis. A second imaging means 6b for imaging a plane is provided. In the illustrated embodiment, the optical axis of at least three types of pulsed light emitted by the light source 4 is the X-axis, the axis orthogonal to the X-axis is the Y-axis, and the axis orthogonal to the X-axis and the Y-axis is Z. Use as the axis.

第一の撮像手段6aは、3種類のパルス光が照射される任意の領域をZ軸方向に沿って撮像し、第二の撮像手段6bは、第一の撮像手段6aが撮像する領域と同じ領域をY軸方向に沿って撮像するようになっている。したがって、第一の撮像手段6aにより撮像される物体は、第一の撮像手段6aの撮像角度とは異なる撮像角度で第二の撮像手段6bにより撮像される。 The first imaging means 6a images an arbitrary region irradiated with three types of pulsed light along the Z-axis direction, and the second imaging means 6b is the same as the region imaged by the first imaging means 6a. The region is imaged along the Y-axis direction. Therefore, the object imaged by the first imaging means 6a is imaged by the second imaging means 6b at an imaging angle different from the imaging angle of the first imaging means 6a.

第一および第二の撮像手段6a、6bのそれぞれの露光時間は、光源4から照射される3種類のパルス光のそれぞれの繰り返し周期(たとえば1/120秒)よりも十分長い時間に設定されている。このため、第一および第二の撮像手段6a、6bの撮像領域に粉塵Dが浮遊していると、光源4から照射された3種類のパルス光が粉塵Dによって順次散乱し、図2および図3に示すとおり、赤色部分Tr・青色部分Tb・緑色部分Tgの繰り返し模様で構成される粉塵Dの軌跡Tが第一および第二の撮像手段6a、6bによって撮像される。そして、第一および第二の撮像手段6a、6bによって撮像された画像は表示手段8に送られる。 The exposure times of the first and second imaging means 6a and 6b are set to be sufficiently longer than the repetition period (for example, 1/120 second) of each of the three types of pulsed light emitted from the light source 4. There is. Therefore, when the dust D is suspended in the imaging regions of the first and second imaging means 6a and 6b, the three types of pulsed light emitted from the light source 4 are sequentially scattered by the dust D, and FIGS. As shown in 3, the locus T of the dust D composed of the repeating pattern of the red portion Tr, the blue portion Tb, and the green portion Tg is imaged by the first and second imaging means 6a and 6b. Then, the images captured by the first and second imaging means 6a and 6b are sent to the display means 8.

図示の実施形態の粉塵検出装置2は、さらに、光源4に隣接して配設され光源4から照射された少なくとも3種類のパルス光を偏光する第一の偏光フィルター10と、撮像手段6に隣接して配設され第一の偏光フィルター10を通過したパルス光を遮蔽するように位置づけられた第二の偏光フィルター12とを備えている。図1に示すとおり、第二の偏光フィルター12は、第一の撮像手段6aに隣接して配設された第一の撮像手段用フィルター12aと、第二の撮像手段6bに隣接して配設された第二の撮像手段用フィルター12bとを有する。 The dust detection device 2 of the illustrated embodiment is further arranged adjacent to the light source 4 and is adjacent to a first polarizing filter 10 for polarizing at least three types of pulsed light emitted from the light source 4 and an imaging means 6. A second polarizing filter 12 is provided so as to shield the pulsed light that has passed through the first polarizing filter 10. As shown in FIG. 1, the second polarizing filter 12 is arranged adjacent to the first imaging means filter 12a and the second imaging means 6b arranged adjacent to the first imaging means 6a. It has a second filter for imaging means 12b.

第一および第二の撮像手段用フィルター12a、12bの偏光方向は、第一の偏光フィルター10の偏光方向に対して直交している。したがって、第一および第二の撮像手段6a、6bの撮像領域に粉塵Dが存在しないと、光源4から照射され第一の偏光フィルター10を通過したパルス光は第一および第二の撮像手段用フィルター12a、12bによって遮蔽され、第一および第二の撮像手段6a、6bに入射することがない。 The polarization directions of the first and second imaging means filters 12a and 12b are orthogonal to the polarization directions of the first polarizing filter 10. Therefore, if dust D is not present in the imaging regions of the first and second imaging means 6a and 6b, the pulsed light emitted from the light source 4 and passed through the first polarizing filter 10 is used for the first and second imaging means. It is shielded by the filters 12a and 12b so that it does not enter the first and second imaging means 6a and 6b.

一方、第一および第二の撮像手段6a、6bの撮像領域に粉塵Dが存在すると、光源4から照射され第一の偏光フィルター10を通過したパルス光は粉塵Dによって散乱し、散乱したパルス光は、第一および第二の撮像手段用フィルター12a、12bによって遮蔽されず、第一および第二の撮像手段6a、6bによって粉塵Dの軌跡Tとして撮像される。また、第一および第二の偏光フィルター10、12が配設されている場合には、第一および第二の撮像手段6a、6bによって撮像される画像のコントラストが大きくなり、粉塵Dの軌跡Tがより明確に撮像される。 On the other hand, when dust D is present in the imaging regions of the first and second imaging means 6a and 6b, the pulsed light emitted from the light source 4 and passed through the first polarizing filter 10 is scattered by the dust D and scattered pulsed light. Is not shielded by the first and second imaging means filters 12a and 12b, and is imaged as the trajectory T of the dust D by the first and second imaging means 6a and 6b. Further, when the first and second polarizing filters 10 and 12 are arranged, the contrast of the images captured by the first and second imaging means 6a and 6b becomes large, and the trajectory T of the dust D becomes large. Is imaged more clearly.

図示の実施形態の粉塵検出装置2は、さらに、撮像手段6が撮像した画像を記憶する記憶手段14を備えている。第一および第二の撮像手段6a、6bによって撮像された各画像は、表示手段8に表示されると共に記憶手段14に記憶される。 The dust detection device 2 of the illustrated embodiment further includes a storage means 14 for storing an image captured by the image pickup means 6. Each image captured by the first and second imaging means 6a and 6b is displayed on the display means 8 and stored in the storage means 14.

上述したとおりの粉塵検出装置2によって粉塵Dを検出する際は、光源4から時間差をつけて3種類のパルス光を1種類ずつ順番に、それぞれ適宜の繰り返し周波数で照射する。そして、第一および第二の撮像手段6a、6bの撮像領域に粉塵Dが浮遊していると、光源4から照射された3種類(3色)のパルス光が粉塵Dによって順次散乱し、図2および図3に示すとおり、赤色部分Tr・青色部分Tb・緑色部分Tgの繰り返し模様で構成される粉塵Dの軌跡Tが第一および第二の撮像手段6a、6bによって撮像される。 When the dust D is detected by the dust detection device 2 as described above, three types of pulsed light are irradiated one by one in order from the light source 4 at an appropriate repeating frequency with a time lag. Then, when the dust D is suspended in the imaging regions of the first and second imaging means 6a and 6b, the three types (three colors) of pulsed light emitted from the light source 4 are sequentially scattered by the dust D, and the figure shows the figure. As shown in 2 and FIG. 3, the locus T of the dust D composed of the repeating pattern of the red portion Tr, the blue portion Tb, and the green portion Tg is imaged by the first and second imaging means 6a and 6b.

第一および第二の撮像手段6a、6bによって撮像された粉塵Dの軌跡Tの画像から、粉塵Dの飛散方向および粉塵Dの速度を求めることができる。 From the images of the trajectory T of the dust D captured by the first and second imaging means 6a and 6b, the scattering direction of the dust D and the speed of the dust D can be obtained.

まず、粉塵Dの飛散方向について図2ないし図4を参照して説明する。上述のとおり、図示の実施形態の光源4は赤・青・緑の順番で3種類のパルス光を照射している。このため、粉塵Dは赤・青・緑の順番でパルス光を散乱することになる。図2を参照すると、軌跡Tは、図2の左上から右下に向かって赤色部分Tr・青色部分Tb・緑色部分Tgの順番で繰り返し模様となっているため、XY平面上における粉塵Dの飛散方向は矢印Axyで示す方向である。図3を参照すると、軌跡Tは、図3の左下から右上に向かって赤色部分Tr・青色部分Tb・緑色部分Tgの順番で繰り返し模様となっているため、XZ平面上における粉塵Dの飛散方向は矢印Axzで示す方向である。 First, the scattering direction of the dust D will be described with reference to FIGS. 2 to 4. As described above, the light source 4 of the illustrated embodiment irradiates three types of pulsed light in the order of red, blue, and green. Therefore, the dust D scatters the pulsed light in the order of red, blue, and green. With reference to FIG. 2, since the locus T has a repeating pattern in the order of the red portion Tr, the blue portion Tb, and the green portion Tg from the upper left to the lower right of FIG. 2, the dust D is scattered on the XY plane. The direction is the direction indicated by the arrow Axy. With reference to FIG. 3, since the locus T has a repeating pattern in the order of the red portion Tr, the blue portion Tb, and the green portion Tg from the lower left to the upper right of FIG. 3, the scattering direction of the dust D on the XZ plane. Is the direction indicated by the arrow Axz.

また、YZ平面上における粉塵Dの飛散方向を求める際は、まず、図2および図3に示すとおり、粉塵Dの軌跡Tにおいて、緑色部分Tgと赤色部分Trとの任意の境界点をPとし、Pよりも下流側の緑色部分Tgと赤色部分Trとの境界点をPとする。次いで、図2に示す画像から、PのX座標およびY座標(X、Y)と、PのX座標およびY座標(X、Y)とを特定する。また、図3に示す画像から、PのX座標およびZ座標(X、Z)と、PのX座標およびZ座標(X、Z)とを特定する。 Further, when determining the scattering direction of the dust D on the YZ plane, first, as shown in FIGS. 2 and 3, P 1 is set at an arbitrary boundary point between the green portion Tg and the red portion Tr in the trajectory T of the dust D. Let P 2 be the boundary point between the green portion Tg and the red portion Tr on the downstream side of P 1 . Then, the image shown in FIG. 2, to identify the X and Y coordinates of P 1 (X 1, Y 1 ), an X-coordinate and Y-coordinate of P 2 (X 2, Y 2). Further, the image shown in FIG. 3, is identified as X and Z coordinates of P 1 (X 1, Z 1 ), and X and Z coordinates of P 2 (X 2, Z 2 ).

次いで、図4に示すとおり、図2および図3に示す画像から特定したPのY座標およびZ座標(Y、Z)ならびにPのY座標およびZ座標(Y、Z)をYZ平面上にプロットする。そして、粉塵DはPからPに向かって飛散していることから、図4に矢印Ayzで示す方向がYZ平面上における粉塵Dの飛散方向であると求めることができる。このようにして、粉塵Dを撮像した画像における3種類のパルス光の順序から粉塵Dの飛散方向(Axy、Axz、Ayz)を求めることができる。なお、PおよびPは緑色部分Tgと赤色部分Trとの境界点に限定されるものではない。 Then, as shown in FIG. 4, Y-coordinate and Z-coordinate (Y 1, Z 1) of P 1 identified from the image shown in FIGS. 2 and 3 as well as P 2 Y-coordinate and Z-coordinate (Y 2, Z 2) Is plotted on the YZ plane. Since the dust D is scattered from P 1 to P 2 , it can be determined that the direction indicated by the arrow Ayz in FIG. 4 is the scattering direction of the dust D on the YZ plane. In this way, the scattering directions (Axy, Ax, Ayz) of the dust D can be obtained from the order of the three types of pulsed light in the image obtained by capturing the dust D. Note that P 1 and P 2 are not limited to the boundary point between the green portion Tg and the red portion Tr.

次に、撮像した画像における同じ種類のパルス光の間隔と、パルス光の繰り返し周波数とに基づいて、粉塵Dの速度を求めることついて図2ないし図4を参照して説明する。なお、図示の実施形態では、パルス光の繰り返し周波数が120Hzに設定されているものとする。 Next, determining the speed of the dust D based on the interval of the same type of pulsed light in the captured image and the repetition frequency of the pulsed light will be described with reference to FIGS. 2 to 4. In the illustrated embodiment, it is assumed that the repetition frequency of the pulsed light is set to 120 Hz.

まず、XY平面上での粉塵Dの速度Vxyについては、図2に示すとおり、PからPまでの長さ(撮像した画像における同じ種類のパルス光の間隔)が30mmであったとすると、
Vxy=30(mm)×120(Hz)
=3600(mm/s)
となる。
First, regarding the velocity Vxy of the dust D on the XY plane, assuming that the length from P 1 to P 2 (interval between pulsed lights of the same type in the captured image) is 30 mm as shown in FIG.
Vxy = 30 (mm) x 120 (Hz)
= 3600 (mm / s)
Will be.

XZ平面上での粉塵Dの速度Vxzについては、図3に示すとおり、PからPまでの長さが32mmであったとすると、
Vxz=32(mm)×120(Hz)
=3840(mm/s)
となる。
Regarding the velocity Vxz of the dust D on the XZ plane, assuming that the length from P 1 to P 2 is 32 mm as shown in FIG.
Vxz = 32 (mm) x 120 (Hz)
= 3840 (mm / s)
Will be.

YZ平面上での粉塵Dの速度Vyzについては、図4に示すとおり、PからPまでの長さが19mmであったとすると、
Vyz=19(mm)×120(Hz)
=2280(mm/s)
となる。
Regarding the velocity Vyz of the dust D on the YZ plane, assuming that the length from P 1 to P 2 is 19 mm as shown in FIG.
Vyz = 19 (mm) x 120 (Hz)
= 2280 (mm / s)
Will be.

また、Pの座標とPの座標との関係について、三平方の定理を用いると図2ないし図4に示す画像から下記式1〜式3が導き出される。
式1 (X−X+(Y―Y=30
式2 (X−X+(Z―Z=32
式3 (Y―Y+(Z―Z=19
Further, regarding the relationship between the coordinates of P 1 and the coordinates of P 2 , the following equations 1 to 3 are derived from the images shown in FIGS. 2 to 4 by using the three-square theorem.
Equation 1 (X 2- X 1 ) 2 + (Y 2- Y 1 ) 2 = 30 2
Equation 2 (X 2- X 1 ) 2 + (Z 2- Z 1 ) 2 = 32 2
Equation 3 (Y 2 -Y 1) 2 + (Z 2 -Z 1) 2 = 19 2

3次元空間でのPからPまでの距離は
L={(X−X+(Y―Y+(Z―Z1/2
であり、3次元空間での粉塵Dの速度Vは上記距離Lと繰り返し周波数(120Hz)とを用いて、
V=L(mm)×120(Hz)
={(X−X+(Y―Y+(Z―Z1/2×120
と表すことができる。ここで、上記式1ないし式3を用いると、
V={(30+32+19)/2}1/2×120
=33.8×120
=4056(mm/s)
となる。このようにして、粉塵Dを撮像した画像における同じ種類のパルス光の間隔とパルス光の繰り返し周波数とに基づいて粉塵Dの速度(V、Vxy、Vxz、Vyz)を求めることができる。
The distance from P 1 to P 2 in three-dimensional space is L = {(X 2- X 1 ) 2 + (Y 2- Y 1 ) 2 + (Z 2- Z 1 ) 2 } 1/2
The velocity V of the dust D in the three-dimensional space is the above distance L and the repetition frequency (120 Hz).
V = L (mm) x 120 (Hz)
= {(X 2- X 1 ) 2 + (Y 2- Y 1 ) 2 + (Z 2- Z 1 ) 2 } 1/2 x 120
It can be expressed as. Here, when the above equations 1 to 3 are used,
V = {(30 2 +32 2 +19 2) / 2} 1/2 × 120
= 33.8 × 120
= 4056 (mm / s)
Will be. In this way, the velocity (V, Vxy, Vxz, Vyz) of the dust D can be obtained based on the interval of the same type of pulsed light and the repetition frequency of the pulsed light in the image obtained by capturing the dust D.

以上のとおりであり、図示の実施形態の粉塵検出装置2においては、少なくとも3種類のパルス光で照らされた粉塵Dを撮像することにより、撮像した画像における少なくとも3種類のパルス光の順序から粉塵Dの飛散方向を特定することができると共に、パルス光の繰り返し周波数と、撮像した画像における同じ種類のパルス光の間隔とに基づいて、粉塵Dの速度Vを求めることができる。したがって、図示の実施形態の粉塵検出装置2によれば、粉塵発生源を特定することができると共に粉塵Dの浮遊状態を検出することができる。 As described above, in the dust detection device 2 of the illustrated embodiment, by imaging the dust D illuminated by at least three types of pulsed light, the dust is dusted from the order of at least three types of pulsed light in the captured image. The scattering direction of D can be specified, and the speed V of dust D can be obtained based on the repetition frequency of the pulsed light and the interval of the pulsed light of the same type in the captured image. Therefore, according to the dust detection device 2 of the illustrated embodiment, the dust generation source can be specified and the floating state of the dust D can be detected.

2:粉塵検出装置
4:光源
6:撮像手段
6a:第一の撮像手段
6b:第二の撮像手段
8:表示手段
10:第一の偏光フィルター
12:第二の偏光フィルター
12a:第一の撮像手段用フィルター
12b:第二の撮像手段用フィルター
14:記憶手段
D:粉塵
2: Dust detection device 4: Light source 6: Imaging means 6a: First imaging means 6b: Second imaging means 8: Display means 10: First polarizing filter 12: Second polarizing filter 12a: First imaging Means filter 12b: Second imaging means filter 14: Storage means D: Dust

Claims (6)

粉塵を検出する粉塵検出装置であって、
時間差をつけて少なくとも3種類のパルス光を照射する光源と、該光源から照射された該少なくとも3種類のパルス光で照らされた粉塵を撮像する撮像手段と、該撮像手段が撮像した画像を表示する表示手段と、を備える粉塵検出装置。
It is a dust detection device that detects dust.
A light source that irradiates at least three types of pulsed light with a time lag, an imaging means that captures dust illuminated by the at least three types of pulsed light emitted from the light source, and an image captured by the imaging means are displayed. A dust detection device comprising a display means to be used.
該少なくとも3種類のパルス光は、少なくとも3種類の色から構成される請求項1記載の粉塵検出装置。 The dust detection device according to claim 1, wherein the at least three types of pulsed light are composed of at least three types of colors. 該少なくとも3種類のパルス光は、少なくとも3種類の明度から構成される請求項1記載の粉塵検出装置。 The dust detection device according to claim 1, wherein the at least three types of pulsed light are composed of at least three types of brightness. 該光源に隣接して配設され該光源から照射された該少なくとも3種類のパルス光を偏光する第一の偏光フィルターと、該撮像手段に隣接して配設され該第一の偏光フィルターを通過したパルス光を遮蔽するように位置づけられた第二の偏光フィルターと、を備える請求項1記載の粉塵検出装置。 A first polarizing filter arranged adjacent to the light source to polarize at least three types of pulsed light emitted from the light source, and a first polarizing filter arranged adjacent to the imaging means and passing through the first polarizing filter. The dust detection device according to claim 1, further comprising a second polarizing filter positioned so as to shield the pulsed light. 該撮像手段が撮像した画像を記憶する記憶手段を含む請求項1記載の粉塵検出装置。 The dust detection device according to claim 1, further comprising a storage means for storing an image captured by the image pickup means. 該光源が照射する該少なくとも3種類のパルス光の光軸をX軸とし、該X軸に直交する軸をY軸とし、該X軸と該Y軸とに直交する軸をZ軸とした場合、該撮像手段は、該X軸と該Y軸とで特定されるXY平面を撮像する第一の撮像手段と、該X軸と該Z軸とで特定されるXZ平面を撮像する第二の撮像手段とを備える請求項1記載の粉塵検出装置。 When the optical axis of the at least three types of pulsed light emitted by the light source is the X-axis, the axis orthogonal to the X-axis is the Y-axis, and the axis orthogonal to the X-axis and the Y-axis is the Z-axis. The imaging means includes a first imaging means for imaging the XY plane specified by the X-axis and the Y-axis, and a second imaging means for imaging the XZ plane specified by the X-axis and the Z-axis. The dust detection device according to claim 1, further comprising an imaging means.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63298065A (en) * 1987-05-28 1988-12-05 Babcock Hitachi Kk Speed measuring instrument for body
JPH1019919A (en) * 1996-06-28 1998-01-23 Matsushita Electric Ind Co Ltd Method and apparatus for measuring streamline
JP2008064697A (en) * 2006-09-11 2008-03-21 Tokyo Institute Of Technology Laser sheet formation device, particle measuring device, laser sheet formation method, and particle measuring method
WO2008156022A1 (en) * 2007-06-18 2008-12-24 Yasunori Onozuka Object measuring method and device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63298065A (en) * 1987-05-28 1988-12-05 Babcock Hitachi Kk Speed measuring instrument for body
JPH1019919A (en) * 1996-06-28 1998-01-23 Matsushita Electric Ind Co Ltd Method and apparatus for measuring streamline
JP2008064697A (en) * 2006-09-11 2008-03-21 Tokyo Institute Of Technology Laser sheet formation device, particle measuring device, laser sheet formation method, and particle measuring method
WO2008156022A1 (en) * 2007-06-18 2008-12-24 Yasunori Onozuka Object measuring method and device

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