JP2020518787A5 - - Google Patents

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Publication number
JP2020518787A5
JP2020518787A5 JP2019534412A JP2019534412A JP2020518787A5 JP 2020518787 A5 JP2020518787 A5 JP 2020518787A5 JP 2019534412 A JP2019534412 A JP 2019534412A JP 2019534412 A JP2019534412 A JP 2019534412A JP 2020518787 A5 JP2020518787 A5 JP 2020518787A5
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JP
Japan
Prior art keywords
hotspot
wavelength
time window
infrared
signal
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Application number
JP2019534412A
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English (en)
Japanese (ja)
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JP7248575B2 (ja
JP2020518787A (ja
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Priority claimed from FR1663273A external-priority patent/FR3061289B1/fr
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Publication of JP2020518787A publication Critical patent/JP2020518787A/ja
Publication of JP2020518787A5 publication Critical patent/JP2020518787A5/ja
Application granted granted Critical
Publication of JP7248575B2 publication Critical patent/JP7248575B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2019534412A 2016-12-23 2017-12-21 赤外線検出装置 Active JP7248575B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1663273A FR3061289B1 (fr) 2016-12-23 2016-12-23 Dispositif de detection infrarouge.
FR1663273 2016-12-23
PCT/FR2017/053799 WO2018115778A1 (fr) 2016-12-23 2017-12-21 Dispositif de detection infrarouge

Publications (3)

Publication Number Publication Date
JP2020518787A JP2020518787A (ja) 2020-06-25
JP2020518787A5 true JP2020518787A5 (cg-RX-API-DMAC10.html) 2022-07-20
JP7248575B2 JP7248575B2 (ja) 2023-03-29

Family

ID=59070716

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019534412A Active JP7248575B2 (ja) 2016-12-23 2017-12-21 赤外線検出装置

Country Status (5)

Country Link
US (1) US11499929B2 (cg-RX-API-DMAC10.html)
EP (1) EP3559644B1 (cg-RX-API-DMAC10.html)
JP (1) JP7248575B2 (cg-RX-API-DMAC10.html)
FR (1) FR3061289B1 (cg-RX-API-DMAC10.html)
WO (1) WO2018115778A1 (cg-RX-API-DMAC10.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU101529B1 (de) * 2019-12-12 2021-06-15 Aim Systems Gmbh Vorrichtung und Verfahren zur Bestimmung einer Materialeigenschaft eines Prüfkörpers in einem oberflächennahen Prüfkörperbereich
FR3107118A1 (fr) * 2020-02-10 2021-08-13 Universite de Bordeaux Appareil et procédé de profilométrie par thermographie infrarouge
CN116698780A (zh) * 2023-06-16 2023-09-05 复旦大学义乌研究院 一种双波段锁相红外显微镜系统

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4947034A (en) 1989-04-28 1990-08-07 International Business Machines Corporation Apertureless near field optical microscope
US5093580A (en) 1990-03-02 1992-03-03 Spectra-Tech, Inc. ATR objective and method for sample analyzation using an ATR crystal
JP3414122B2 (ja) * 1996-04-25 2003-06-09 横河電機株式会社 近赤外分光器
DE10228123B4 (de) 2002-06-24 2011-09-15 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen
JP4119385B2 (ja) 2004-03-10 2008-07-16 株式会社神戸製鋼所 光熱変換測定装置
JP4496191B2 (ja) 2006-09-29 2010-07-07 株式会社東芝 光学式プロセスモニタ装置、光学式プロセスモニタ方法及び半導体装置の製造方法
JP2008089395A (ja) 2006-10-02 2008-04-17 Honda Instrument Service Co Ltd 光触媒計及び光能力測定方法並びにそれに用いるセンサヘッド
ES2611996T3 (es) * 2006-11-20 2017-05-11 Nanotemper Technologies Gmbh Caracterización termo-óptica rápida de partículas
US8001830B2 (en) 2007-05-15 2011-08-23 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
US7977636B2 (en) 2008-08-12 2011-07-12 Anasys Instruments, Inc. Infrared imaging using thermal radiation from a scanning probe tip
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb
US9220415B2 (en) * 2011-10-25 2015-12-29 Andreas Mandelis Systems and methods for frequency-domain photoacoustic phased array imaging
US9091594B2 (en) * 2011-11-25 2015-07-28 The United States Of America, As Represented By The Secretary Of The Navy Chemical mapping using thermal microscopy at the micro and nano scales
US10260953B2 (en) * 2016-08-11 2019-04-16 The Boeing Company Applique and method for thermographic inspection

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