JP2020057534A - Circuit breaker, and test method of circuit breaker - Google Patents

Abstract

To provide a circuit breaker capable of reducing man-hours required for an operation test.SOLUTION: A circuit breaker 2 includes a pull-out part 24 and a processing part 22. The pull-out part 24 performs a pull-out operation to mechanically shift a contact C1 that is electrically connected to an electric line L1 that connects a power supply and a load from the closed state to the open state. The processing part 22 executes an operation test to test at least the shut-off operation by outputting a pseudo signal S1 when an event occurs. The pseudo signal S1 is a signal for generating a state in a pseudo manner in which the blocking operation to block the electric circuit L1 including pull-out operation is performed.SELECTED DRAWING: Figure 1

Description

  The present disclosure relates generally to switches and test methods for switches. More specifically, the present disclosure relates to a switch for interrupting an electric circuit connecting a power supply and a load, and a test method for the switch.

  Patent Literature 1 discloses an earth leakage breaker. This earth leakage breaker includes a zero-phase current transformer having an AC circuit to be subjected to earth leakage detection as a primary winding, and an earth-leakage detection circuit for determining the presence or absence of earth leakage in the AC circuit based on a secondary output of the zero-phase current transformer. And a unit. Further, the earth leakage breaker includes a test device for supplying a simulated earth leakage current for an earth leakage operation test to a test winding wound around the zero-phase current transformer when a test switch is pressed.

JP-A-2005-032420

  In the earth leakage breaker (switch) described in Patent Literature 1, in order to test the earth leakage operation (interruption operation) of the earth leakage breaker, an operator must go to a place where the earth leakage breaker is located and press a test switch. Therefore, there is a problem that the number of steps required for the operation test increases.

  An object of the present disclosure is to provide a switch and a switch test method that can reduce the number of steps required for an operation test.

  A switch according to an aspect of the present disclosure includes a trip unit and a processing unit. The trip unit performs a trip operation of mechanically shifting a contact electrically connected to an electric path connecting a power supply and a load from a closed state to an open state. When an event occurs, the processing unit outputs an artificial signal to execute an operation test for testing at least a part of the interruption operation. The pseudo signal is a signal for pseudo-generating a state in which a shutoff operation for interrupting the electric circuit including the trip operation is performed.

  A switch test method according to an embodiment of the present disclosure is a switch test method including a trip unit. The trip unit performs a trip operation of mechanically shifting a contact electrically connected to an electric path connecting a power supply and a load from a closed state to an open state. In this test method, when an event occurs, a pseudo signal is output to test at least a part of the interruption operation. The pseudo signal is a signal for pseudo-generating a state in which a shutoff operation for interrupting the electric circuit including the trip operation is performed.

  The present disclosure has an advantage that the number of steps required for an operation test can be reduced.

FIG. 1A is an explanatory diagram illustrating a schematic configuration of a switch (first switch) according to an embodiment of the present disclosure. FIG. 1B is an explanatory diagram illustrating a schematic configuration of the switch (second switch) according to the first embodiment. FIG. 2 is an explanatory diagram showing a schematic configuration of a distribution board using the above switch. FIG. 3 is a flowchart for explaining the operation of the above switch.

(1) Overview As shown in FIGS. 1A to 2, the switch 2 of the present embodiment has a function of interrupting an electric circuit L1 connecting a power supply and a load B1. The “power source” in the present disclosure is a system power source (commercial power source), but may be a distributed power source such as a solar power generation device or a storage battery. In the present embodiment, the switch 2 is a main breaker provided in the distribution board 1. The switch 2 includes a trip unit 24 and a processing unit 22, as shown in FIGS. 1A and 1B.

  The trip unit 24 performs a trip operation of mechanically shifting a contact C1 electrically connected to an electric circuit L1 connecting the power supply and the load B1 from a closed state to an open state. The tripping operation can be performed when the handle provided on the switch 2 is operated and when the electric circuit L1 is in an abnormal state different from the normal state. In the present embodiment, the abnormal state may include a state in which a leakage has occurred and a state in which the neutral line L13 is out of phase. The former state may occur, for example, when the load B1 electrically connected to the electric circuit L1 has failed or short-circuited, or when the insulator has deteriorated. The latter state occurs when the power distribution system to the distribution board 1 is a single-phase three-wire system, for example, when the neutral line L13 is disconnected due to deterioration, or when the connection of the neutral line L13 is defective. obtain. When such an abnormal state occurs, the tripping operation is performed by the tripping unit 24, thereby cutting off the electric circuit L1 and protecting the load B1 electrically connected to the electric circuit L1.

  When an event occurs, the processing unit 22 outputs an artificial signal S1 to execute an operation test for testing at least a part of the interruption operation. In the present embodiment, the interruption operation including the tripping operation is executed by the processing unit 22 executing the operation test. The pseudo signal S1 is a signal for pseudo-generating a state in which a shutoff operation for interrupting the electric circuit L1 including the trip operation is performed.

  The “event” in the present disclosure includes, for example, receiving a test signal including an operation test execution command transmitted from an information terminal 61 such as a smartphone (in other words, an external system 6 different from the switch 2). obtain. The test signal transmission process can be executed by installing a dedicated application on the information terminal 61, for example. Further, the “event” in the present disclosure is a trigger that causes the processing unit 22 to output the pseudo signal S1 as described above. Therefore, pressing the test button 20 provided on the switch 2 is not included in the “event” in the present disclosure because the processing unit 22 is not a trigger for outputting the pseudo signal S1.

  As described above, in the present embodiment, when an event occurs, the processing unit 22 performs an operation test for testing at least a part of the interruption operation. For this reason, in this embodiment, since the operation test of the switch 2 can be performed without the worker going to the place where the switch 2 is located, the step of pressing the test button 20 becomes unnecessary, and the man-hour required for the operation test is eliminated. Can be reduced.

(2) Details Hereinafter, the switch 2 of the present embodiment will be described in detail with reference to FIGS. 1A to 2. In the following description, up and down and left and right of FIG.

(2.1) Distribution board First, the distribution board 1 will be described with reference to FIG. As shown in FIG. 2, the distribution board 1 includes a switch (main breaker) 2, a plurality of branch breakers 3, a measurement adapter 4, a detection unit 5, and a cabinet 10 that houses these. I have. In the present embodiment, a case where the distribution board 1 is installed in a detached house as an example is illustrated, but the invention is not limited to this example. That is, the distribution board 1 may be installed in a facility such as each dwelling unit, an office, a store, a factory, a hospital, or the like, as long as the facility can be installed.

  The switch 2 is arranged inside the cabinet 10. The switch 2 includes a primary terminal 201 and a secondary terminal 202. In the distribution board 1 according to the present embodiment, a single-phase three-wire system is assumed as a power distribution system. Therefore, a single-phase three-wire service line of a system power supply (commercial power supply) is connected to the primary terminal 201 of the switch 2. Connected. A conductive bar of a first voltage pole (L1 phase), a conductive bar of a second voltage pole (L2 phase), and a conductive bar of a neutral pole (N phase) are provided on the secondary terminal 202 of the switch 2. It is connected.

  The plurality of branch breakers 3 are divided into an upper side and a lower side of the conductive bar of the neutral pole, and a plurality of branch breakers 3 are arranged so as to be arranged in the left-right direction. Each branch breaker 3 includes a pair of primary terminals and a pair of secondary terminals. The branch breakers 3 are available for 100V and 200V. A pair of primary terminals of the 100V branch breaker 3 are electrically connected to one of the conductive bar of the first voltage electrode and the conductive bar of the second voltage electrode, and to the conductive bar of the neutral electrode, respectively. You. A pair of primary terminals of the 200V branch breaker 3 are electrically connected to the conductive bar of the first voltage electrode and the conductive bar of the second voltage electrode, respectively. A corresponding wiring is electrically connected to the secondary terminal of the branch breaker 3. The wiring connected to the secondary terminal of each branch breaker 3 is connected to at least one wiring device such as a lighting device, an air conditioner, a television receiver, a hot water supply device, or a wiring device such as a wall switch as a load B1. You.

  The detecting unit 5 is configured to detect a current flowing through the load B1 connected to each of the plurality of branch breakers 3. The detection unit 5 has, for example, a substrate and a plurality of coils 51. The substrate has a plate shape that is long in the left-right direction. A plurality of holes are formed in the substrate. Terminals extending from the conductive bar and connected to the primary terminals of the branch breaker 3 are inserted into the plurality of holes. The coil 51 is, for example, a Rogowski coil and is formed around a hole in the substrate. In the present embodiment, the detection unit 5 detects the current flowing through the load B1 connected to each of the plurality of branch breakers 3 by measuring the current induced in each of the plurality of coils 51.

  The measurement adapter 4 is arranged inside the cabinet 10. The measurement adapter 4 has a measurement function of measuring power passing through at least one of the switch 2 and the branch breaker 3 in the distribution board 1 and a communication function of communicating with a device arranged outside the cabinet 10. I have.

  More specifically, the measurement adapter 4 of the present embodiment is electrically connected to the main detection unit and the detection unit 5 that measure the current flowing through the switch 2. Here, the master detection unit includes a current sensor including, for example, a current transformer (CT). The measurement adapter 4 has a function (measurement function) of converting each of the current values measured by the detection unit 5 and the master detection unit into a power value.

  The measurement adapter 4 has a function (communication function) for communicating with a controller configured to control a device (hereinafter, referred to as a HEMS-compatible device) corresponding to a HEMS (Home Energy Management System). ing. The controller is a device arranged outside the cabinet 10. Here, the HEMS-compatible device includes, for example, a smart meter, a solar power generation device, a power storage device, a fuel cell, an electric vehicle, an air conditioner, a lighting fixture, a hot water supply device, a refrigerator, a television receiver, and the like. Note that the HEMS-compatible device is not limited to these devices.

  Further, the measurement adapter 4 has a function (communication function) for communicating with an information terminal 61 such as a smartphone (ie, an external system 6 different from the switch 2). The information terminal 61 may include, for example, a desktop or laptop personal computer, a tablet terminal, a smart speaker, or the like, in addition to the smartphone.

  The communication method between the measurement adapter 4 and the controller (or the information terminal 61) is, for example, a specific low-power radio station (a radio station that does not require a license) in the 920 MHz band, Wi-Fi (registered trademark), Bluetooth (registered trademark). Wireless communication using radio waves as a medium, which is compliant with communication standards such as the above. Further, the communication method between the measurement adapter 4 and the controller (or the information terminal 61) may be wired communication conforming to a communication standard such as a wired LAN (Local Area Network). Further, as a communication protocol in communication between the measurement adapter 4 and the controller (or the information terminal 61), for example, Ethernet (registered trademark), ECHONET Lite (registered trademark), or the like may be used. In the present embodiment, the communication method between the measurement adapter 4 and the information terminal 61 is, for example, wireless communication via a network N1 such as the Internet.

  In the distribution board 1 of the present embodiment, the measurement adapter 4 receives from the detection unit 5 the current value of each of the plurality of loads B1 measured by the detection unit 5. Further, the measurement adapter 4 receives the current value measured by the main detecting unit from the main detecting unit. The measurement adapter 4 converts each of the current values measured by the detection unit 5 and the master detection unit into a power value (an instantaneous power value). The measurement adapter 4 has a function of calculating power amount data obtained by integrating the collected instantaneous power data over a predetermined time. Therefore, the controller that communicates with the measurement adapter 4 can control the HEMS-compatible device based on the instantaneous power and the amount of power at each of the plurality of loads B1.

  The measurement adapter 4 has a function (communication function) of communicating with at least one of a solar power generation device, a power storage device, and a power conversion device (power conditioner) electrically connected to the electric vehicle. Have. The power converter is used for both charging and discharging of the storage battery of the electric vehicle by performing bidirectional power conversion in addition to power conversion for performing unidirectional charging from the distribution board 1 to the electric vehicle. Configuration may be used. The communication method between the measurement adapter 4 and the photovoltaic power generation device, the power storage device, and the power conversion device is, for example, wired communication conforming to a communication standard such as RS-485.

(2.2) Switch Next, the switch 2 will be described with reference to FIGS. 1A and 1B. As shown in FIGS. 1A and 1B, the switch 2 includes a test button 20 (see FIG. 2), a transmission circuit 21, a processing unit 22, a drive circuit 23, a trip unit 24, and a communication unit 25. And a power supply circuit 26. In addition, the switch 2 includes a switch SW0 that opens and closes an electric path between the processing unit 22 and the drive circuit 23. The switch SW0 is an a contact (normally open contact) and is a semiconductor element such as a thyristor, for example.

  When the switch 2 has a function (first function) of interrupting the electric circuit L1 when a leakage occurs, as shown in FIG. 1A, a zero-phase current transformer (sensor) 27, a switch SW1, a resistor R0, , Is further provided. When the switch 2 has a function (second function) of interrupting the electric circuit L1 when a phase loss of the neutral line L13 occurs, as shown in FIG. 1B, the lead wire 28, the voltage dividing circuit 29, Is further provided.

  In the following description, when distinguishing between the switch 2 shown in FIG. 1A and the switch 2 shown in FIG. 1B, the switch 2 having the first function is referred to as a “first switch 2A”, and the switch having the second function. 2 is referred to as “second switch 2B”. In the following description, the pseudo signal S1 output from the processing unit 22 in the first switch 2A is referred to as a “first pseudo signal S11”, and the pseudo signal S1 output from the processing unit 22 in the second switch 2B is referred to as a “second pseudo signal”. This is referred to as a pseudo signal S12.

  The transmission circuit 21 is an analog circuit (Analog Front End), and has an amplifier, a filter, and an A / D converter. The amplifier amplifies the analog signal (voltage signal) input to the transmission circuit 21. The filter removes a noise component included in the analog signal input to the transmission circuit 21. The A / D converter converts the analog signal input to the transmission circuit 21 into a digital signal, and outputs the converted digital signal to the processing unit 22.

  The processing unit 22 has a computer system having a processor and a memory. The computer system functions as the processing unit 22 when the processor executes an appropriate program. The program may be recorded in a memory in advance, or may be provided through an electric communication line such as the Internet, or recorded in a non-transitory recording medium such as a memory card.

  The processing unit 22 has a function of executing a cutoff process for causing the tripping unit 24 to perform a tripping operation when the state of the electric circuit L1 becomes abnormal. Further, the processing unit 22 has a function of executing an operation test for causing the tripping unit 24 to perform a tripping operation when the test button 20 is pressed or an event occurs. The processing unit 22 monitors the digital signal output from the transmission circuit 21 regardless of whether the interruption processing or the operation test is performed.

  In the cutoff processing, when the signal value (voltage value) of the digital signal output from the transmission circuit 21 exceeds the threshold, the processing unit 22 operates the drive circuit 23 by switching the switch SW0 from off to on. When the drive circuit 23 operates, the trip unit 24 is driven, and the trip operation is performed. The blocking process will be described in detail in “(3.1) Blocking process” described later.

  In the operation test, the processing unit 22 pseudo-generates a state in which the cutoff operation is performed by outputting the pseudo signal S1. Specifically, the processing unit 22 outputs the pseudo signal S <b> 1, and causes the transmission circuit 21 to input an analog signal whose signal value of the digital signal output from the transmission circuit 21 exceeds a threshold value. As a result, the signal value of the digital signal output from the transmission circuit 21 exceeds the threshold, and the processing unit 22 operates the drive circuit 23 by switching the switch SW0 from off to on. When the drive circuit 23 operates, the trip unit 24 is driven, and the trip operation is performed. The operation test will be described in detail in “(3.3) Operation test” described later.

  In the present embodiment, the processing unit 22 has a timer 221. When the time measured by the timer 221 reaches, for example, a predetermined time set by an operator, the processing unit 22 executes an operation test. That is, in the present embodiment, the event includes that the timer 221 measures a predetermined time.

  The drive circuit 23 has an electromagnet device including a coil. The drive circuit 23 is configured so that a current flows through the coil when the switch SW0 switches from off to on. The drive circuit 23 is configured to move a latch member (described later) of the trip unit 24 by an attractive force generated by the electromagnet device when a current flows through the coil.

  The trip unit 24 has an opening and closing mechanism for opening and closing the contact C1, and a latch member for mechanically controlling the opening and closing mechanism so that the contact C1 is kept closed. The opening / closing mechanism urges the contact C1 in a direction from the closed state to the open state. When the latch member is moved by the drive circuit 23 and the latching state of the opening / closing mechanism by the latch member is released, the contact C1 is switched from the closed state to the open state by the opening / closing mechanism, and the trip L24 is cut off. I do. In addition, even when the operator operates the handle provided on the switch 2, the tripping section 24 operates the latch member, and the contact C 1 is switched from the closed state to the open state by the opening / closing mechanism, thereby opening the electric circuit L 1. Cut off. When the contact C1 is in the open state, the operator operates the handle provided on the switch 2 (the operation opposite to the above operation), so that the opening and closing mechanism is in the original state (that is, by the latch member). Contact C1 is latched to maintain the closed state).

  The communication unit 25 has a function of communicating with the measurement adapter 4. The communication method between the communication unit 25 and the measurement adapter 4 is wired communication conforming to a communication standard such as a wired LAN (Local Area Network). The communication unit 25 receives the test signal transmitted from the information terminal 61 (the external system 6) using the measurement adapter 4 as a relay. In addition, the communication unit 25 acquires information (for example, a power value, etc.) included in the measurement adapter 4 by communicating with the measurement adapter 4. Further, the communication unit 25 acquires information (for example, usage status of the HEMS-compatible device) included in the controller by communicating with the controller using the measurement adapter 4 as a relay.

  The power supply circuit 26 supplies operating power to the transmission circuit 21, the processing unit 22, the drive circuit 23, and the communication unit 25. The power supply circuit 26 operates by converting power supplied from a power supply through a service line electrically connected to the switch 2 to predetermined power by an appropriate circuit such as an AC / DC converter. Generate power.

  In the first switch 2A, the zero-phase current transformer 27 is provided in the electric circuit L1. In the present embodiment, the first voltage line L11 is electrically connected to the first voltage electrode, the second voltage line L12 is electrically connected to the second voltage electrode, and is electrically connected to the neutral electrode. Among the neutral lines L13, the second voltage line L12 and the neutral line L13 pass through the zero-phase current transformer 27. The electric wire L4 electrically connected to the processing unit 22 also passes through the zero-phase current transformer 27. The first pseudo signal S11 (current signal) output from the processing unit 22 flows through the electric wire L4. Both ends of the secondary winding wound around the zero-phase current transformer 27 are electrically connected to a pair of input terminals of the transmission circuit 21. Therefore, the voltage induced in the secondary winding of the zero-phase current transformer 27 is input to the transmission circuit 21 as an analog signal.

  In the first switch 2A, the second voltage line L12 and the neutral line L13 are electrically connected via a series circuit of the switch SW1 and the resistor R0. The switch SW1 is an a contact (normally open contact), and is configured to be switched from off to on by an operator pressing the test button 20.

  In the second switch 2 </ b> B, one end of the lead wire 28 electrically connected to the neutral wire L <b> 13 is electrically connected to the first end of the pair of input ends of the transmission circuit 21. Further, a voltage dividing circuit 29 composed of a series circuit of resistors R1 and R2 is electrically connected between the first voltage line L11 and the second voltage line L12. The resistance value of the resistor R1 is the same as the resistance value of the resistor R2. A connection point between the resistors R1 and R2 is electrically connected to a second end of the pair of input ends of the transmission circuit 21 via the switch SW2.

  The switch SW2 is a c-contact, a first state that connects a connection point between the resistors R1 and R2 and an input end (second end) of the transmission circuit 21, and an electric wire L5 that is electrically connected to the processing unit 22. And a second state connecting the input end (second end) of the transmission circuit 21. The switch SW2 is in the first state when the electric circuit L1 is in a normal state. The switch SW2 is switched from the first state to the second state by the control of the processing unit 22 when the test button 20 is pressed or when the processing unit 22 outputs the second pseudo signal S12. .

(3) Operation Hereinafter, the operation of the switch 2 of the present embodiment will be described. In the present embodiment, since the switch 2 is the first switch 2A or the second switch 2B as described above, the operation of each of the first switch 2A and the second switch 2B will be described below.

(3.1) Shutdown Process First, the shutoff process of the processing unit 22 in the first switch 2A will be described with reference to FIG. 1A. The induction voltage of the secondary winding of the zero-phase current transformer 27 is input to a pair of input terminals of the transmission circuit 21. Here, in a state where no electric leakage occurs in the electric circuit L1, a difference occurs in the current flowing through the two electric wires (here, the second voltage line L12 and the neutral line L13) penetrating the zero-phase current transformer 27. Therefore, no induced voltage is generated in the secondary winding of the zero-phase current transformer 27. Therefore, in a state where no electric leakage occurs in the electric circuit L1, a digital signal having a signal value (voltage value) exceeding the threshold value is not input to the processing unit 22, and the processing unit 22 does not execute the cutoff process.

  On the other hand, when a leakage occurs in a part of the electric circuit L1, a difference occurs between currents flowing through the two electric wires passing through the zero-phase current transformer 27. In accordance with the difference between the currents, an induced voltage is generated in the secondary winding of the zero-phase current transformer 27, and the induced voltage is input to the transmission circuit 21 as an analog signal. The analog signal input to the transmission circuit 21 is converted into a digital signal after being processed by the transmission circuit 21, and the converted digital signal is input to the processing unit 22. When the signal value (voltage value) of the input digital signal exceeds the threshold, the processing unit 22 operates the drive circuit 23 by switching the switch SW0 from off to on. When the drive circuit 23 operates, the trip unit 24 is driven, and the trip operation is performed. In this manner, in the first switch 2A, when a leakage occurs in the electric circuit L1, the tripping operation is performed by the trip unit 24, and the electric circuit L1 is cut off.

  Next, a shutoff process of the processing unit 22 in the second switch 2B will be described with reference to FIG. 1B. A pair of input terminals of the transmission circuit 21 has a difference between a potential of a connection point of the resistors R1 and R2 (that is, an intermediate potential between the first voltage pole and the second voltage pole) and a potential of the neutral line L13. Voltage is input. Here, in the state where the open phase of the neutral line L13 does not occur, the voltage of the difference between the potential of the connection point of the resistors R1 and R2 and the potential of the neutral line L13 (hereinafter, referred to as “difference voltage”). Is almost zero. Therefore, in the state where the phase loss of the neutral line L13 does not occur, a digital signal having a signal value (voltage value) exceeding the threshold is not input to the processing unit 22, and the processing unit 22 does not execute the cutoff process.

  On the other hand, when the phase loss of the neutral line L13 occurs, the potential of the neutral line L13 becomes unstable, so that the differential voltage becomes larger than zero. Then, this difference voltage is input to the transmission circuit 21 as an analog signal. The analog signal input to the transmission circuit 21 is converted into a digital signal after being processed by the transmission circuit 21, and the converted digital signal is input to the processing unit 22. When the signal value (voltage value) of the input digital signal exceeds the threshold, the processing unit 22 operates the drive circuit 23 by switching the switch SW0 from off to on. When the drive circuit 23 operates, the trip unit 24 is driven, and the trip operation is performed. In this manner, in the second switch 2B, when the phase loss of the neutral line L13 occurs, the tripping operation is performed by the tripping unit 24, and the electric circuit L1 is cut off.

(3.2) Manual Operation Test by Worker First, a manual operation test by the operator in the first switch 2A will be described with reference to FIG. 1A. When the operator presses the test button 20, the switch SW1 is switched from off to on by being directly or indirectly pressed by the test button 20. As a result, two electric wires (here, the second voltage line L12 and the neutral line L13) penetrating the zero-phase current transformer 27 due to the current flowing through the resistor R0 branching from the second voltage line L12. , A difference is generated in the current flowing therethrough, and an induced voltage is generated in the secondary winding of the zero-phase current transformer 27 according to the difference. That is, when the operator presses the test button 20, a state in which a leakage occurs in a part of the electric circuit L1, that is, a state in which the cutoff operation is performed, occurs in a pseudo manner. Then, when the processing unit 22 drives the drive circuit 23, the tripping operation is performed by the tripping unit 24, and the electric circuit L1 is cut off.

  Next, a manual operation test by an operator in the second switch 2B will be described with reference to FIG. 1B. When the operator presses the test button 20, the switch SW2 is switched from the first state to the second state by being directly or indirectly pressed by the test button 20. Then, the processing unit 22 applies a voltage greater than zero to a pair of input terminals of the transmission circuit 21 by outputting the second pseudo signal S12 (voltage signal) via the switch SW2 in the second state. That is, when the operator presses the test button 20, a state in which the phase loss of the neutral line L13 has occurred, in other words, a state in which the shutoff operation is performed, occurs in a pseudo manner. Then, when the processing unit 22 drives the drive circuit 23, the tripping operation is performed by the tripping unit 24, and the electric circuit L1 is cut off.

(3.3) Operation Test Hereinafter, an operation test by the processing unit 22 will be described with reference to FIGS. 1A and 1B. The processing unit 22 executes an operation test when an event occurs, even if the operator does not press the test button 20. In the present embodiment, the processing unit 22 determines that an event has occurred when the communication unit 25 receives a test signal from the information terminal 61 (external system 6) or when a predetermined time is measured by the timer 221. judge.

  First, an operation test of the processing unit 22 in the first switch 2A will be described with reference to FIG. 1A. When an event occurs, the processing unit 22 outputs a first pseudo signal S11 (current signal). As a result, the current flows through the electric wire L4 passing through the zero-phase current transformer 27, so that three electric wires (here, the second voltage line L12, the neutral line L13, A difference occurs in the current flowing through the electric wire L4), and an induced voltage is generated in the secondary winding of the zero-phase current transformer 27 according to the difference. That is, when an event occurs, a state in which a leakage has occurred in a part of the electric circuit L1, in other words, a state in which the cutoff operation is performed, occurs in a pseudo manner. Then, when the processing unit 22 drives the drive circuit 23, the tripping operation is performed by the tripping unit 24, and the electric circuit L1 is cut off.

  Next, an operation test of the processing unit 22 in the second switch 2B will be described with reference to FIG. 1B. When an event occurs, the switch SW2 switches from the first state to the second state under the control of the processing unit 22. Then, the processing unit 22 applies a voltage greater than zero to a pair of input terminals of the transmission circuit 21 by outputting the second pseudo signal S12 (voltage signal) via the switch SW2 in the second state. That is, when an event occurs, a state in which the phase loss of the neutral line L13 has occurred, in other words, a state in which the shutoff operation is performed, occurs in a pseudo manner. Then, when the processing unit 22 drives the drive circuit 23, the tripping operation is performed by the tripping unit 24, and the electric circuit L1 is cut off.

  That is, the operation test in the switch 2 is performed in a mode as shown in FIG. That is, when the test button 20 is pressed by the operator (S1: Yes), a state in which the shutoff operation is performed occurs in a simulated manner, so that the switchgear 2 performs the shutoff operation (S2). On the other hand, when the test button 20 is not pressed by the operator (S1: No) and the communication unit 25 receives a test signal from the information terminal 61 (the external system 6) (S3: Yes), The processing unit 22 outputs the pseudo signal S1 (S5). Similarly, when the test button 20 is not pressed by the operator (S1: No) and the timer 221 measures a predetermined time (S4: Yes), the processing unit 22 outputs the pseudo signal S1. Output (S5). Then, when the processing unit 22 outputs the pseudo signal S1, a state in which the shutoff operation is performed occurs in a pseudo manner, so that the switch 2 executes the shutoff operation (S2).

  As described above, in the present embodiment, when an event occurs, the processing unit 22 performs an operation test for testing at least a part of the interruption operation. As an example, an operator can perform an operation test of the switch 2 simply by operating the information terminal 61 and transmitting a test signal at a remote place away from the place where the switch 2 is located. Further, as an example, every time the timer 221 measures a predetermined time, an operation test of the switch 2 is automatically performed. For this reason, in this embodiment, since the operation test of the switch 2 can be performed without the worker going to the place where the switch 2 is located, the step of pressing the test button 20 becomes unnecessary, and the man-hour required for the operation test is eliminated. Can be reduced.

(4) Modifications The embodiments described above are merely one of various embodiments of the present disclosure. The above-described embodiment can be variously modified according to the design and the like as long as the object of the present disclosure can be achieved. Further, the same function as the operation test of the switch 2 may be embodied by a test method of the switch 2, a (computer) program, a non-temporary recording medium in which the program is recorded, or the like.

  The test method for the switch 2 according to one embodiment is a test method for the switch 2 including the trip portion 24. The trip unit 24 performs a trip operation of mechanically shifting a contact C1 electrically connected to an electric circuit L1 connecting the power supply and the load B1 from a closed state to an open state. In this test method, when an event occurs, a pseudo signal S1 is output to test at least a part of the interruption operation. The pseudo signal S1 is a signal for pseudo-generating a state in which a shutoff operation for interrupting the electric circuit L1 including the tripping operation is performed.

  Hereinafter, modified examples of the above-described embodiment will be listed. The modifications described below can be applied in appropriate combinations.

  The switch 2 in the present disclosure includes, for example, a computer system in the processing unit 22 and the like. The computer system mainly has a processor and a memory as hardware. The function as the switch 2 in the present disclosure is realized by the processor executing the program recorded in the memory of the computer system. The program may be pre-recorded in the memory of the computer system, may be provided through an electric communication line, or may be recorded in a non-transitory recording medium such as a memory card, an optical disk, or a hard disk drive readable by the computer system. May be provided. A processor of a computer system is composed of one or more electronic circuits including a semiconductor integrated circuit (IC) or a large-scale integrated circuit (LSI). An integrated circuit such as an IC or an LSI referred to here differs depending on the degree of integration, and includes an integrated circuit called a system LSI, a VLSI (Very Large Scale Integration), or a ULSI (Ultra Large Scale Integration). Furthermore, an FPGA (Field-Programmable Gate Array), which is programmed after the manufacture of the LSI, or a logic device capable of reconfiguring the connection relation inside the LSI or reconfiguring the circuit section inside the LSI, is also adopted as a processor. Can be. The plurality of electronic circuits may be integrated on one chip, or may be provided separately on a plurality of chips. The plurality of chips may be integrated in one device, or may be provided separately in a plurality of devices. The computer system includes a microcontroller having one or more processors and one or more memories. Therefore, the microcontroller is also composed of one or more electronic circuits including a semiconductor integrated circuit or a large-scale integrated circuit.

  Further, for example, the fact that a plurality of functions of the processing unit 22 are integrated in one housing is not an essential configuration of the switch 2. That is, the components of the processing unit 22 may be provided separately in a plurality of housings. Further, for example, at least a part of the function of the processing unit 22 may be realized by, for example, a server device and a cloud (cloud computing).

  In the above-described embodiment, when the load B1 is not used, or when the load B1 is used but the power consumed by the load B1 is small, the processing unit 22 performs an operation test on the assumption that an event has occurred. You may. That is, the event may be based on the state of the load B1 electrically connected to the electric circuit L1. Further, the event may include a transition of one or more predetermined loads B1 electrically connected to the electric circuit L1 from the use state to the non-use state.

  As an example, the processing unit 22 acquires a power value based on the current value measured by the master detection unit from the measurement adapter 4 via the communication unit 25, and when the acquired power value falls below a predetermined power value, the event is An operation test may be performed assuming that the occurrence has occurred. Further, as an example, the processing unit 22 acquires a power value based on the current value measured by the detection unit 5 from the measurement adapter 4 via the communication unit 25, and determines that the power value at the predetermined load B1 is the predetermined power value. If it is lower than the above, an operation test may be executed. In addition, for example, the processing unit 22 may execute an operation test when receiving a DR (Demand Response) from a power provider via the communication unit 25 and the controller.

  In the above-described embodiment, if the power conditioner has a configuration for switching between the grid interconnection mode and the independent operation mode, the processing unit 22 determines that an event has occurred when switching to the independent operation mode due to a power failure or the like. An operation test may be performed. That is, the event may be based on the state of the power supply electrically connected to the electric circuit L1. As an example, the processing unit 22 may execute an operation test when receiving information indicating that the mode has been switched to the independent operation mode from the power conditioner via the communication unit 25 and the controller.

  In the above-described embodiment, the processing unit 22 may execute the operation test when there is no person in the facility (here, the detached house). That is, the event may be based on the state of the facility where the switch 2 is installed, or the state of a person belonging to the facility. As an example, when the facility includes a human sensor that detects the presence or absence of a person, the processing unit 22 acquires the detection result of the human sensor from the controller via the communication unit 25, so that no person is present in the facility. And an operation test may be executed.

  In the above-described embodiment, the communication unit 25 has a communication function of communicating with the measurement adapter 4, but is not limited thereto, and directly communicates with the information terminal 61 (the external system 6) and the controller. It may have a communication function of communicating by wireless communication.

  In the above-described embodiment, the content of the operation test may be different from the content of the cutoff process. In other words, the contents of the blocking operation performed when an event occurs and the blocking operation performed when the operator operates the test button 20 may be different. For example, in the operation test, the trip unit 24 may not be operated. In addition, for example, in an operation test, both the drive circuit 23 and the trip unit 24 may not be operated. In this case, even if the operation test is performed, the tripping operation by the trip unit 24 is not performed, so that the power supply from the power supply is not interrupted even after the operation test is performed, so that the load B1 can be used. In this case, the operator goes to the place where the switch 2 is located and operates the handle provided on the switch 2 to return the switch 2 to the original state (the state where the contact C1 is closed). You don't have to.

  In the above-described embodiment, the switch 2 includes the test button 20, but may not include the test button 20. In this embodiment, the switch 2 performs an operation test only when an event occurs.

  In the above-described embodiment, the second voltage line L12 and the neutral line L13 penetrate the zero-phase current transformer 27 of the first switch 2A, but the first voltage line L11 and the neutral line L13 penetrate. It may be.

  The switch 2 does not have to correspond to the occurrence of all the events described in the above-described embodiment and modifications. That is, the switch 2 may be configured to perform the operation test by generating at least one or more of all the above-described events. For example, the switch 2 does not need to include the communication unit 25 as long as the operation test is performed when a predetermined time has been reached.

(Summary)
As described above, the switch (2) according to the first aspect includes the trip unit (24) and the processing unit (22). The trip unit (24) performs a trip operation of mechanically shifting a contact (C1) electrically connected to an electric circuit (L1) connecting the power supply and the load (B1) from a closed state to an open state. When an event occurs, the processing section (22) outputs an artificial signal (S1) to execute an operation test for testing at least a part of the cutoff operation. The dummy signal (S1) is a signal for artificially generating a state in which a shutoff operation for interrupting the electric circuit (L1) including the tripping operation is performed.

  According to this aspect, there is an advantage that the number of steps required for the operation test can be reduced.

  In the switch (2) according to the second aspect, in the first aspect, the event is a test signal including an operation test execution command transmitted from an external system (6) different from the switch (2). Including receiving.

  According to this aspect, the operator can execute the operation test of the switch (2) at a location away from the switch (2) at his / her will, thereby improving the convenience. There is an advantage.

  In the switch (2) according to the third aspect, in the first or second aspect, the processing unit (22) includes a timer (221). The event includes that the timer (221) measures a predetermined time.

  According to this aspect, when the timer (221) measures a predetermined time, the operation test of the switch (2) is performed, so that the operator does not need to perform the operation test of the switch (2) by himself / herself. Is improved.

  In the switch (2) according to the fourth aspect, in any one of the first to third aspects, the event is based on a state of a load (B1) electrically connected to the electric circuit (L1).

  According to this aspect, since the operation test of the switch (2) is performed according to the state of the load (B1), the operator does not need to perform the operation test of the switch (2) by himself, and the convenience is improved. There is an advantage of doing.

  In the switch (2) according to the fifth aspect, in the fourth aspect, the event is that one or more predetermined loads (B1) electrically connected to the electric circuit (L1) are changed from a use state to a non-use state. It is to move.

  According to this aspect, the operation test of the switch (2) is performed when the predetermined load (B1) is in the non-use state. Therefore, even when the electric circuit (L1) is cut off by the operation test, the predetermined load is not changed. There is an advantage that the influence on (B1) is small.

  In the switch (2) according to the sixth aspect, in any one of the first to fifth aspects, the event is based on a state of a power supply electrically connected to the electric circuit (L1).

  According to this aspect, since the operation test of the switch (2) is performed according to the state of the power supply, the operator does not need to perform the operation test of the switch (2) by himself, and the convenience is improved. There are advantages.

  In the switch (2) according to the seventh aspect, in any one of the first to sixth aspects, the event is based on a state of a facility where the switch (2) is installed or a state of a person belonging to the facility. ing.

  According to this aspect, since the operation test of the switch (2) is performed according to the state of the facility or the state of the person belonging to the facility, the operator does not need to perform the operation test of the switch (2) by himself / herself. There is an advantage that convenience is improved.

  The test method of the switch (2) according to the eighth aspect is a test method of the switch (2) including the trip portion (24). The trip unit (24) performs a trip operation of mechanically shifting a contact (C1) electrically connected to an electric circuit (L1) connecting the power supply and the load (B1) from a closed state to an open state. In this test method, when an event occurs, a pseudo signal (S1) is output to test at least a part of the interruption operation. The dummy signal (S1) is a signal for artificially generating a state in which a shutoff operation for interrupting the electric circuit (L1) including the tripping operation is performed.

  According to this aspect, there is an advantage that the number of steps required for the operation test can be reduced.

  The configurations according to the second to seventh aspects are not essential configurations for the switch (2), and can be omitted as appropriate.

2 Switch 22 Processing part 221 Timer 24 Tripping part B1 Load C1 Contact L1 Electric circuit S1 Pseudo signal

Claims (8)

A trip unit that performs a trip operation of mechanically shifting a contact electrically connected to an electric circuit connecting the power supply and the load from a closed state to an open state;
When an event occurs, at least a part of the operation of the interrupting operation is tested by outputting a pseudo signal for artificially generating a state in which an interrupting operation for interrupting the electric circuit including the tripping operation is performed. A processing unit for performing an operation test,
Switch. The event includes receiving a test signal including a command to execute the operation test, which is transmitted from an external system different from the switch.
The switch according to claim 1. The processing unit has a timer,
The event includes that the timer measures a predetermined time.
The switch according to claim 1. The event is based on a state of a load electrically connected to the electric circuit,
The switch according to claim 1. The event is that one or more predetermined loads electrically connected to the electric circuit shift from a use state to a non-use state.
The switch according to claim 4. The event is based on a state of a power supply electrically connected to the electric circuit,
The switch according to any one of claims 1 to 5. The event is based on a state of a facility where the switch is installed, or a state of a person belonging to the facility,
The switch according to any one of claims 1 to 6. A test method for a switch including a trip unit that performs a trip operation of mechanically shifting a contact electrically connected to an electric circuit connecting a power supply and a load from a closed state to an open state,
When an event occurs, at least a part of the operation of the interrupting operation is tested by outputting a pseudo signal for artificially generating a state in which an interrupting operation for interrupting the electric circuit including the tripping operation is performed. ,
Test method for switchgear.

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