JP2020044265A - X-ray diagnosis apparatus - Google Patents

Abstract

To enable a grid to be used appropriately according to a procedure.SOLUTION: An X-ray diagnosis apparatus according to the embodiment includes an X-ray generation unit, an X-ray diaphragm, an X-ray detection unit, a grid, a setting unit, and a grid movement control unit. The X-ray generation unit generates X-rays. The X-ray diaphragm narrows generated X-rays and the X-rays are projected onto a subject therethrough. The X-ray detection unit detects X-rays transmitted through the subject. The grid is movable relative to the X-ray detection unit and eliminates the scattered ray component of the X-rays transmitted through the subject. The grid movement control unit controls, based on the configuration of the mechanical system, controls at least one of the amount and direction of displacement of the grid from the X-ray detection unit.SELECTED DRAWING: Figure 1

Description

  Embodiments of the present invention relate to an X-ray diagnostic apparatus.

  The X-ray diagnostic apparatus includes a grid for removing scattered X-ray components transmitted through the subject in order to improve the image quality of the collected X-ray image data. Here, scattered radiation hardly occurs depending on the procedure, and a grid may not be necessary. However, it is not easy to attach and detach the grid for each procedure.

JP 2009-011488 A

  The problem to be solved by the present invention is to enable the proper use of a grid depending on the procedure.

  The X-ray diagnostic apparatus according to the embodiment includes an X-ray generation unit, an X-ray aperture, an X-ray detection unit, a grid, a setting unit, and a grid movement control unit. The X-ray generator generates X-rays. The X-ray diaphragm narrows the generated X-rays and irradiates the X-ray to the subject. The X-ray detector detects the X-ray transmitted through the subject. The grid is movable with respect to the X-ray detection unit, and removes a scattered radiation component of the X-ray transmitted through the subject. The grid movement control unit controls at least one of the amount and direction of projection of the grid from the X-ray detection unit based on the arrangement of the mechanical system.

FIG. 1 is a block diagram illustrating an example of a configuration of the X-ray diagnostic apparatus according to the first embodiment. FIG. 2A is a diagram illustrating an example of the X-ray detector according to the first embodiment. FIG. 2B is a diagram illustrating an example of the X-ray detector according to the first embodiment. FIG. 2C is a diagram illustrating an example of an X-ray detector and a grid according to the first embodiment. FIG. 2D is a diagram illustrating an example of an X-ray detector and a grid according to the first embodiment. FIG. 2E is a diagram illustrating an example of an X-ray detector and a grid according to the first embodiment. FIG. 3 is a diagram for explaining the amount of protrusion of the grid according to the first embodiment. FIG. 4A is a diagram for describing a change in arrangement of the mechanical system according to the first embodiment. FIG. 4B is a diagram for describing a change in arrangement of the mechanical system according to the first embodiment. FIG. 5 is a flowchart for explaining a series of processing flows of the X-ray diagnostic apparatus according to the first embodiment. FIG. 6A is a diagram for describing a settable X-ray irradiation range according to the second embodiment. FIG. 6B is a diagram for describing a settable X-ray irradiation range according to the second embodiment.

  Hereinafter, an embodiment of an X-ray diagnostic apparatus will be described in detail with reference to the drawings.

(First embodiment)
First, an X-ray diagnostic apparatus 1 according to the first embodiment will be described with reference to FIG. FIG. 1 is a block diagram illustrating an example of a configuration of the X-ray diagnostic apparatus 1 according to the first embodiment. As shown in FIG. 1, the X-ray diagnostic apparatus 1 includes an X-ray high-voltage device 11, an X-ray tube 12, an X-ray diaphragm 13, a top 14, a C arm 15, and an X-ray detector 16. , A grid 17, a memory 18, a display 19, an input interface 20, and a processing circuit 21.

  The X-ray high voltage device 11 supplies a high voltage to the X-ray tube 12 under the control of the processing circuit 21. For example, the X-ray high voltage device 11 has an electric circuit such as a transformer (transformer) and a rectifier, and emits a high voltage to generate a high voltage to be applied to the X-ray tube 12 and the X-ray tube 12. An X-ray control device that controls the output voltage according to the X-rays. Note that the high voltage generator may be a transformer type or an inverter type.

  The X-ray tube 12 is a vacuum tube having a cathode (filament) that generates thermoelectrons, and an anode (target) that generates X-rays upon collision of thermoelectrons. The X-ray tube 12 generates X-rays by irradiating thermoelectrons from the cathode to the anode using the high voltage supplied from the X-ray high voltage device 11. The X-ray tube 12 is an example of an X-ray generator.

  The X-ray diaphragm 13 has a collimator that narrows the irradiation range of the X-rays generated by the X-ray tube 12. That is, the X-ray diaphragm 13 narrows the X-rays generated by the X-ray tube 12 and irradiates the subject P with the X-rays. Further, the X-ray diaphragm 13 has a filter for adjusting the X-rays generated by the X-ray tube 12. The X-ray diaphragm 13 is an example of an X-ray diaphragm.

  The collimator in the X-ray diaphragm 13 has, for example, four slidable diaphragm blades. The collimator squeezes the X-rays generated by the X-ray tube 12 and irradiates the subject P by sliding the aperture blades. Here, the aperture blade is a plate-shaped member made of lead or the like, and is provided near the X-ray irradiation port of the X-ray tube 12 to adjust the X-ray irradiation range.

  The filter in the X-ray diaphragm 13 changes the quality of the transmitted X-rays depending on the material and thickness thereof and absorbs the same to the subject P for the purpose of reducing the exposure dose to the subject P and improving the image quality of the X-ray image data. A soft-line component that is likely to be reduced or a high-energy component that causes a decrease in contrast of X-ray image data is reduced. Further, the filter changes the dose and irradiation range of the X-ray according to its material, thickness, position, etc., so that the X-ray emitted from the X-ray tube 12 to the subject P has a predetermined distribution. Attenuate.

  For example, the X-ray diaphragm 13 has a driving mechanism such as a motor and an actuator, and controls the irradiation of X-rays by operating the driving mechanism under the control of a processing circuit 21 described later. For example, the X-ray aperture device 13 adjusts the aperture of the aperture blade of the collimator by applying a drive voltage to the drive mechanism in accordance with the control signal received from the processing circuit 21 to irradiate the subject P X-ray irradiation range is controlled. Further, for example, the X-ray diaphragm 13 irradiates the subject P by adjusting the position of the filter by adding a drive voltage to the drive mechanism in accordance with the control signal received from the processing circuit 21. X-ray dose distribution is controlled.

  The top plate 14 is a bed on which the subject P is placed, and is arranged on a bed driving device (not shown). Note that the subject P is not included in the X-ray diagnostic apparatus 1. For example, the couch driving device has a driving mechanism such as a motor and an actuator, and controls the movement and inclination of the top board 14 by operating the driving mechanism under the control of a processing circuit 21 described later. For example, the couch driving device moves or tilts the couchtop 14 by applying a driving voltage to the driving mechanism according to a control signal received from the processing circuit 21. Hereinafter, the device on which the subject P is placed is also referred to as a bed. The bed includes, for example, the top board 14 and a bed driving device.

  The C-arm 15 holds the X-ray tube 12 and the X-ray diaphragm 13 and the X-ray detector 16 and the grid 17 so as to face each other with the subject P interposed therebetween. For example, the C-arm 15 has a driving mechanism such as a motor and an actuator, and rotates and moves by operating the driving mechanism under the control of a processing circuit 21 described later. For example, the C-arm 15 adds a drive voltage to the drive mechanism in accordance with a control signal received from the processing circuit 21, thereby allowing the X-ray tube 12 and the X-ray diaphragm 13, the X-ray detector 16 and the grid 17, Is rotated and moved with respect to the subject P to control the X-ray irradiation position and irradiation angle. Although FIG. 1 illustrates an example in which the X-ray diagnostic apparatus 1 is a single plane, the embodiment is not limited to this and may be a biplane. The C arm 15 is an example of a holding device.

  The X-ray detector 16 is, for example, an X-ray flat panel detector (FPD) having detection elements arranged in a matrix. The X-ray detector 16 detects X-rays emitted from the X-ray tube 12 and transmitted through the subject P, and outputs a detection signal corresponding to the detected X-ray dose to the processing circuit 21. The X-ray detector 16 is an example of an X-ray detector.

  Here, the X-ray detector 16 includes a first detection area for detecting X-rays by the plurality of first detection elements and a second detection area for detecting X-rays by the plurality of second detection elements finer than the first detection element. Region. That is, the X-ray detector 16 is a hybrid detector having a first detection region having a normal density and a second detection region having a high definition. Here, the first detection region and the second detection region may overlap. For example, a part of the first detection area may be the second detection area. The configuration of the X-ray detector 16 will be described later in detail.

  The grid 17 removes scattered X-ray components transmitted through the subject P. For example, the grid 17 is disposed between the subject P and the X-ray detector 16, and removes a scattered ray component from X-rays transmitted through the grid 17.

  For example, the grid 17 is a parallel grid configured by arranging a plurality of metal plates (such as lead foil) that absorb X-rays in parallel with a gap. In this case, by arranging the grid 17 so that each metal plate and the X-ray irradiation direction are parallel to each other, the scattered radiation is absorbed by the metal plate and X-rays other than the scattered radiation (irradiated from the X-ray tube 12 X-rays) are detected by the X-ray detector 16 through the gap between the metal plates.

  The grid 17 is not limited to a parallel grid. For example, the grid 17 may be a focusing grid in which a plurality of metal plates are arranged so as to be inclined toward the X-ray focal point. Further, the grid 17 may be filled with an intermediate substance having little X-ray absorption, instead of providing a gap between the plurality of metal plates. That is, the grid 17 may be configured by alternately arranging a metal plate that absorbs X-rays and an intermediate substance that absorbs less X-rays.

  The memory 18 is realized by a semiconductor memory element such as a RAM (Random Access Memory) and a flash memory, a hard disk, an optical disk, and the like. For example, the memory 18 receives and stores the X-ray image data collected by the processing circuit 21. The memory 18 stores programs corresponding to various functions that are read and executed by the processing circuit 21. The memory 18 may be realized by a server group (cloud) connected to the X-ray diagnostic apparatus 1 via a network.

  The display 19 displays various information. For example, the display 19 displays a GUI (Graphical User Interface) for receiving an instruction from the operator and various X-ray images under the control of the processing circuit 21. For example, the display 19 is a liquid crystal display or a CRT (Cathode Ray Tube) display. Note that the display 19 may be a desktop type, or may be configured by a tablet terminal or the like that can wirelessly communicate with the processing circuit 21.

  The input interface 20 receives various input operations from the operator, converts the received input operations into electric signals, and outputs the electric signals to the processing circuit 21. For example, the input interface 20 includes a mouse, a keyboard, a trackball, a switch, a button, a joystick, a touchpad for performing an input operation by touching an operation surface, a touch screen on which a display screen and a touchpad are integrated, and an optical sensor. It is realized by the non-contact input circuit, the voice input circuit and the like used. Note that the input interface 20 may be configured by a tablet terminal or the like that can wirelessly communicate with the processing circuit 21. In addition, the input interface 20 is not limited to one having physical operation components such as a mouse and a keyboard. For example, an electric signal processing circuit that receives an electric signal corresponding to an input operation from an external input device provided separately from the X-ray diagnostic apparatus 1 and outputs the electric signal to the processing circuit 21 is also connected to the input interface 20. Included in the example.

  The processing circuit 21 controls the entire operation of the X-ray diagnostic apparatus 1 by executing the control function 211, the setting function 212, the collection function 213, the grid movement control function 214, and the display control function 215. Here, the grid movement control function 214 is an example of a grid movement control unit.

  For example, the processing circuit 21 reads a program corresponding to the control function 211 from the memory 18 and executes the program, thereby controlling various functions of the processing circuit 21 based on an input operation received from the operator via the input interface 20. I do. Further, the control function 211 controls transmission and reception of data between the X-ray diagnostic apparatus 1 and another apparatus. For example, the control function 211 transmits the collected X-ray image data to an image storage device (not shown).

  In addition, the processing circuit 21 sets an X-ray irradiation area on the subject P by reading and executing a program corresponding to the setting function 212 from the memory 18. For example, the setting function 212 sets an X-ray irradiation area on the subject P according to the inspection target site of the subject P. Here, the setting function 212 may automatically acquire the inspection target site of the subject P from a system such as a HIS (Hospital Information System), or may receive an input operation of the inspection target site from the operator. The setting function 212 may set the X-ray irradiation area by receiving an input operation of the X-ray irradiation area from the operator. The X-ray irradiation area is also described as FOV (Field of View).

  Further, the processing circuit 21 collects X-ray image data by reading out and executing a program corresponding to the acquisition function 213 from the memory 18. For example, the acquisition function 213 controls the X-ray high voltage device 11 and adjusts the voltage supplied to the X-ray tube 12 to control the X-ray dose applied to the subject P and on / off.

  The collection function 213 controls the mechanism system of the X-ray diagnostic apparatus 10 according to the X-ray irradiation area set by the setting function 212. Here, the mechanical system of the X-ray diagnostic apparatus 10 includes, for example, the X-ray diaphragm 13, the C-arm 15, a bed, and the like. For example, the collection function 213 controls the operation of the X-ray aperture device 13 and adjusts the aperture of the aperture blade of the collimator to narrow the irradiation range of the X-ray generated by the X-ray tube 12. Further, the collection function 213 controls the operation of the X-ray diaphragm 13 and controls the distribution of the X-ray dose by adjusting the position of the filter. The collection function 213 controls the operation of the C-arm 15 to rotate or move the C-arm 15. In addition, for example, the collection function 213 moves or tilts the top board 14 by controlling the operation of the bed.

  Further, the acquisition function 213 generates X-ray image data based on the detection signal received from the X-ray detector 16 and stores the generated X-ray image data in the memory 18. Further, the acquisition function 213 may perform various types of image processing on the X-ray image data stored in the memory 18. For example, the collection function 213 executes noise reduction processing using an image processing filter and scattered radiation correction on the X-ray image data.

  Further, the processing circuit 21 reads out a program corresponding to the grid movement control function 214 from the memory 18 and executes the program to determine whether or not to retreat the grid 17. When it is determined that the grid 17 is to be retracted, the grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the arrangement of the mechanical system. The processing by the grid movement control function 214 will be described later in detail. Further, the processing circuit 21 reads a program corresponding to the display control function 215 from the memory 18 and executes the same, thereby causing the display 19 to display a GUI or an X-ray image.

  In the X-ray diagnostic apparatus 1 shown in FIG. 1, each processing function is stored in the memory 18 in the form of a program executable by a computer. The processing circuit 21 is a processor that reads out programs from the memory 18 and executes the programs to realize functions corresponding to the programs. In other words, the processing circuit 21 that has read each program has a function corresponding to the read program. FIG. 1 shows a case where each processing function of the control function 211, the setting function 212, the collection function 213, the grid movement control function 214, and the display control function 215 is realized by a single processing circuit 21, Embodiments are not limited to this. For example, the processing circuit 21 may be configured by combining a plurality of independent processors, and each processor may execute each program to realize each processing function. Further, each processing function of the processing circuit 21 may be realized by being appropriately distributed or integrated in a single or a plurality of processing circuits.

  The term “processor” used in the above description is, for example, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), or an application specific integrated circuit (ASIC), a programmable logic device (for example, It means a circuit such as a Simple Programmable Logic Device (SPLD), a Complex Programmable Logic Device (CPLD), and a Field Programmable Gate Array (FPGA). The processor realizes the functions by reading and executing the program stored in the memory 18.

  Also, in FIG. 1, a single memory 18 has been described as storing programs corresponding to each processing function. However, a configuration in which the plurality of memories 18 are arranged in a distributed manner and the processing circuit 21 reads a corresponding program from the individual memories 18 may be employed. Instead of storing the program in the memory 18, the program may be directly incorporated into the circuit of the processor. In this case, the processor realizes a function by reading and executing a program incorporated in the circuit.

  Further, the processing circuit 21 may realize a function using a processor of an external device connected via a network. For example, the processing circuit 21 reads a program corresponding to each function from the memory 18, executes the program, and uses a server group (cloud) connected to the X-ray diagnostic apparatus 1 via a network as a calculation resource. The functions shown in FIG. 1 are realized.

  Next, an example of the X-ray detector 16 will be described with reference to FIG. 2A. FIG. 2A is a diagram illustrating an example of the X-ray detector 16 according to the first embodiment. As shown in FIG. 2A, the X-ray detector 16 has a first photodetector 161, a second photodetector 162, and a scintillator 163. The first photodetector 161 and the scintillator 163 form a first detector 164. The second photodetector 162 and the scintillator 163 constitute a second detector 165. In FIG. 2A, a direction perpendicular to the detection surface of the X-ray detector 16 is defined as a Z direction, and directions orthogonal to each other on the detection surface are defined as an X direction and a Y direction.

  The scintillator 163 converts X-rays emitted from the X-ray tube 12 into light. For example, the X-ray tube 12 emits X-rays in the + Z direction, and the scintillator 163 converts the X-rays transmitted through the first photodetector 161 into light.

  The first photodetector 161 includes, for example, a two-dimensional image sensor that employs a TFT (Thin Film Transistor) array formed of amorphous silicon, detects light converted by the scintillator 163, and outputs a detection signal (electric signal). Signal). The second photodetector 162 includes, for example, a two-dimensional image sensor using a complementary metal oxide semiconductor (CMOS) transistor, detects the light converted by the scintillator 163, and outputs a detection signal. That is, the scintillator 163 is shared by the first detector 164 and the second detector 165.

  In addition, the first photodetector 161 and the second photodetector 162 each include a plurality of detection elements. Each of these detection elements detects the light converted by the scintillator 163 and outputs a detection signal. Note that, hereinafter, the detection element configuring the first photodetector 161 is also referred to as a first detection element. In the following, the detection element configuring the second photodetector 162 is also referred to as a second detection element. As shown in FIG. 2A, the second detection element constituting the second photodetector 162 is finer than the first detection element constituting the first photodetector 161. That is, the second detector 165 is a detector with higher definition than the first detector 164.

  Further, as shown in FIG. 2A, the X-ray detector 16 has a first detection region R1 and a second detection region R2. The first detection region R1 is a region in the field of view of the first detector 164 where X-rays can be detected by a plurality of first detection elements. In addition, the second detection region R2 is a field of view of the second detector 165, and is a region where a plurality of second detection elements can detect X-rays.

  Here, the first detection region R1 is a rectangular region corresponding to substantially the entire detection surface of the X-ray detector 16, as shown in FIG. 2B. The second detection region R2 is a rectangular region corresponding to a part of the center of the detection surface of the X-ray detector 16, as shown in FIG. 2B. FIG. 2B is a diagram illustrating an example of the X-ray detector 16 according to the first embodiment. Hereinafter, a case where the first detection region R1 is a region wider than the second detection region R2 as shown in FIGS. 2A and 2B will be described.

  Next, the arrangement of the grid 17 with respect to the X-ray detector 16 will be described with reference to FIG. 2C. FIG. 2C shows a case where the grid 17 is arranged such that the grid 17 overlaps the entire surface of the X-ray detector 16. For example, after the grid 17 is arranged as shown in FIG. 2C, the X-ray tube 12 emits X-rays in the + Z direction. In this case, the X-rays emitted from the X-ray tube 12 are narrowed down by the X-ray diaphragm 13, transmitted through the subject P, and the scattered radiation component is removed by the grid 17, and then detected by the X-ray detector 16. Is done. FIG. 2C is a diagram illustrating an example of the X-ray detector 16 and the grid 17 according to the first embodiment.

  Here, the grid 17 is configured to be movable with respect to the X-ray detector 16. As an example, the grid 17 is held by a rail so as to be slidable in parallel to the detection surface of the X-ray detector 16 and includes a mechanism for sliding. Here, as an example of the mechanism for the slide movement, for example, as shown in FIG. 2D, a rack and pinion is used. FIG. 2D is a diagram illustrating an example of the X-ray detector 16 and the grid 17 according to the first embodiment. FIG. 2D shows a state where the grid 17 protrudes from the X-ray detector 16 in the −X direction.

  Specifically, in the case shown in FIG. 2D, the grid 17 has a circular gear as a pinion, and has a motor and the like for rotating the pinion. In the case shown in FIG. 2D, the grid 17 has two pinions. These two pinions may be rotated by one motor or the like, or may be rotated by a motor or the like provided for each pinion.

  The X-ray detector 16 has a rack that fits into a pinion of the grid 17. In this case, the grid 17 moves with respect to the X-ray detector 16 by the rotation of the pinion under the control of the processing circuit 21. For example, the grid 17 moves in the + X direction with respect to the X-ray detector 16 by rotating the pinion clockwise (clockwise).

  As an example, the grid 17 is moved in the −X direction with respect to the X-ray detector 16 by rotating the pinion counterclockwise from the state shown in FIG. 2C (the state in which the grid 17 does not protrude from the X-ray detector 16). Move to the position of FIG. 2D. Further, the grid 17 moves in the + X direction with respect to the X-ray detector 16 by the clockwise rotation of the pinion, and moves to the position shown in FIG. FIG. 2E is a diagram illustrating an example of the X-ray detector 16 and the grid 17 according to the first embodiment.

  The rack and the pinion described above may be provided on only one side of the X-ray detector 16 and the grid 17, respectively, or may be provided on two opposite sides. Further, the rack may be provided on the grid 17 and the pinion may be provided on the X-ray detector 16. The mechanism for sliding the grid 17 is not limited to the rack and pinion, and any mechanism capable of sliding the grid 17 with respect to the X-ray detector 16 can be employed. .

  Also, the grid 17 has been described as being slid with respect to the X-ray detector 16, but the embodiment is not limited to this. For example, the grid 17 may be configured to be rotatable about an axis perpendicular to the detection surface of the X-ray detector 16 and passing through the ends of the X-ray detector 16 and the grid 17 as a rotation axis. Further, for example, the grid 17 may be held by an arm and configured to be movable in an arbitrary direction with respect to the X-ray detector 16.

  Note that the X-ray diagnostic apparatus 1 may further include a cap (a sterilization cap or the like) that covers the X-ray detector 16 and the grid 17. For example, when the grid 17 moves with respect to the X-ray detector 16 and the grid 17 protrudes from the X-ray detector 16, the cap is configured to be expandable and contractable so that the grid 17 can protrude. You. Further, for example, the cap has a pocket for storing the grid 17 protruding from the X-ray detector 16 when the grid 17 protrudes from the X-ray detector 16.

  The configuration of the X-ray diagnostic apparatus 1 has been described above. With such a configuration, the X-ray diagnostic apparatus 1 enables appropriate use of the grid 17 according to the procedure.

  First, the setting function 212 sets an X-ray irradiation area for the subject P. For example, the setting function 212 sets an X-ray irradiation area on the subject P according to the inspection target site of the subject P. Further, for example, the setting function 212 sets the X-ray irradiation area by receiving an input operation of the X-ray irradiation area from the operator.

  Here, depending on the technique, scattered radiation is unlikely to occur, and the grid 17 may not be necessary. For example, when the X-ray irradiation area is small, the X-ray diaphragm 13 narrows the X-rays to reduce scattered radiation, and X-ray image data of sufficient image quality may be obtained without using the grid 17. As an example, when the inspection target site of the subject P is small, the setting function 212 sets the X-ray irradiation area to a narrow range according to the size of the inspection target site. As another example, when collecting high-definition X-ray image data using the second detector 165, the setting function 212 sets the X-ray irradiation area according to the size of the second detection area R2. Set to a narrow range.

  Further, for example, when the subject P is a child or when the body thickness is sufficiently thin, X-rays are hardly scattered when transmitting through the subject P, and X-ray image data having sufficient image quality without using the grid 17. May be obtained. Further, for example, when the thickness of the inspection target site is small, such as in the case of inspection of the hand or foot of the subject P, X-rays are hardly scattered when transmitting through the inspection target site, and the grid 17 can be used without using the grid 17. In some cases, X-ray image data with sufficient image quality can be obtained.

  If the grid 17 is an unnecessary procedure, the grid movement control function 214 determines that the grid 17 is retracted from the X-ray irradiation area. In the following, the X-ray irradiation area is set so that the second detection area R2 is irradiated with X-rays, and the grid movement control function 214 determines that the grid 17 is to be retracted from the X-ray irradiation area. Will be described.

  Next, the grid movement control function 214 moves the grid 17 with respect to the X-ray detector 16 and retracts the grid 17 from the X-ray irradiation area. For example, the grid movement control function 214 slides the grid 17 with respect to the X-ray detector 16 by rotating the pinion shown in FIGS. 2D and 2E, and retracts the grid 17 from the second detection region R2. Let it. Here, the grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the arrangement of the mechanical system.

  Specifically, first, the grid movement control function 214 acquires the arrangement of the mechanical system. For example, the grid movement control function 214 acquires the arrangement of the C arm 15 from the collection function 213 that controls the movement and rotation of the C arm 15. Here, the arrangement of the C-arm 15 is information indicating the position and angle of the C-arm 15 in a reference coordinate system based on, for example, the floor of a room where the X-ray diagnostic apparatus 1 is installed. The grid movement control function 214 acquires the arrangement of the top 14 from the collection function 213 that controls the movement and inclination of the top 14. The arrangement of the top 14 is, for example, information indicating the position and angle of the top 14 in the reference coordinate system.

  Next, the grid movement control function 214 acquires the arrangement of the X-ray detector 16 held by the C arm 15 based on the arrangement of the C arm 15. Here, the arrangement of the X-ray detector 16 is, for example, information indicating the position and angle of the X-ray detector 16 in the reference coordinate system. Further, the grid movement control function 214 acquires the arrangement of the grid 17 based on the arrangement of the X-ray detector 16 and the amount and direction of the projection of the grid 17 from the X-ray detector 16. Here, the arrangement of the grid 17 is, for example, information indicating the position and angle of the grid 17 in the reference coordinate system.

  Further, the grid movement control function 214 acquires the arrangement of the subject P placed on the top 14 based on the arrangement of the top 14. Here, the arrangement of the subject P is, for example, information indicating the position and the angle of the subject P in the reference coordinate system. For example, the grid movement control function 214 acquires a position at a predetermined height from the upper surface of the top 14 as the position of the subject P, and acquires the angle of the top 14 as the angle of the subject P.

  Next, the grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the acquired arrangement of the mechanical system. For example, the grid movement control function 214 moves the grid 17 based on the arrangement of the mechanical system so that the grid 17 does not come into contact with other components in the X-ray diagnostic apparatus 1 and the subject P, and 17 is retracted from the X-ray irradiation area.

  First, a case in which the direction of protrusion of the grid 17 is controlled will be described. For example, the grid movement control function 214 controls the direction in which the grid 17 projects from the X-ray detector 16 so that the grid 17 does not come into contact with other components in the X-ray diagnostic apparatus 1 and the subject P. I do.

  As an example, first, the grid movement control function 214 calculates the arrangement of the grid 17 when the grid 17 protrudes from the X-ray detector 16 in the + X direction in the reference coordinate system. That is, the grid movement control function 214 calculates the arrangement of the grid 17 projecting in the + X direction in the reference coordinate system, assuming that the grid 17 projects in the + X direction from the X-ray detector 16. Next, the grid movement control function 214 calculates an area occupied by the grid 17 protruding in the + X direction in the reference coordinate system.

  Further, the grid movement control function 214 calculates an area occupied by the C arm 15 in the reference coordinate system based on the arrangement of the C arm 15. Further, the grid movement control function 214 calculates an area occupied by the bed in the reference coordinate system based on the arrangement of the top board 14. That is, the grid movement control function 214 calculates an area occupied by the top board 14 and a non-movable part (such as a bed driving device) of the bed other than the top board 14 in the reference coordinate system.

  The grid movement control function 214 calculates an area occupied by the subject P in the reference coordinate system based on the arrangement of the subject P. For example, the grid movement control function 214 calculates an area occupied by a simple model (such as a semi-cylindrical cylinder of a predetermined size) representing the object P as an area occupied by the object P. Further, for example, the grid movement control function 214 acquires a patient model that matches the body type of the subject P based on the patient information (for example, age, gender, weight, and height) of the subject P, and acquires the acquired patient model. Is calculated as a region occupied by the subject P. The patient model is generated in advance for each combination of parameters relating to physique such as age, gender, weight, and height, and stored in the memory 18. In this case, the grid movement control function 214 can acquire, from the memory 18, a patient model that matches the body type of the subject P based on the patient information of the subject P. Note that the grid movement control function 214 may automatically acquire the patient information of the subject P from a system such as the HIS, or may receive an input operation of the patient information from the operator.

  Next, the grid movement control function 214 determines whether or not the area occupied by the C arm 15, the couch, and the subject P overlaps with the area occupied by the grid 17 protruding in the + X direction. Here, when an overlap occurs, the grid movement control function 214 determines that the grid 17 protruding in the + X direction comes into contact with the C arm 15, the bed, and the subject P. On the other hand, when no overlap occurs, the grid movement control function 214 determines that the grid 17 protruding in the + X direction does not come into contact with the C arm 15, the couch, and the subject P. Similarly, the grid movement control function 214 determines whether the grid 17 protruding in the −X direction comes into contact with the C arm 15, the bed, and the subject P.

  Then, the grid movement control function 214 controls the direction in which the grid 17 projects from the X-ray detector 16 based on the result of the determination, and retracts the grid 17 from the X-ray irradiation area. For example, when it is determined that the grid 17 that protrudes in the + X direction makes contact with the C arm 15, the bed, and the subject P, and the grid 17 that protrudes in the -X direction does not make contact, the grid movement control function 214 Retracts the grid 17 so that the grid 17 protrudes from the X-ray detector 16 in the −X direction. Here, with respect to the amount of the grid 17 projecting from the X-ray detector 16, a mechanism (rack) capable of retracting the grid 17 from the X-ray irradiation area and moving the grid 17 with respect to the X-ray detector 16. And the like can be selected.

  Next, a case where the amount of protrusion of the grid 17 is controlled will be described. For example, the grid movement control function 214 controls the amount of projection of the grid 17 from the X-ray detector 16 so that the grid 17 does not come into contact with other components in the X-ray diagnostic apparatus 1 and the subject P. I do.

  For example, first, the grid movement control function 214 calculates the arrangement of the grid 17 when the grid 17 protrudes from the X-ray detector 16 by the length “L1” in the + X direction in the reference coordinate system. That is, the grid movement control function 214 calculates the arrangement of the grid 17 protruding by the length “L1” in the reference coordinate system, assuming that the grid 17 protrudes by the length “L1” from the X-ray detector 16. I do. In the following, the length of the portion of the grid 17 that protrudes from the X-ray detector 16 is also described as the protruding length. The protrusion length is an example of the amount of protrusion of the grid 17.

  Here, the length “L1” is an example of the protrusion length, and is a minimum value necessary for retracting the grid 17 from the X-ray irradiation area. For example, as shown in FIG. 3, the length “L1” is such that the grid 17 is moved to a position where the second detection region R2 and the grid 17 do not overlap and the second detection region R2 and the grid 17 are close to each other. This is the protruding length in the case where it is caused to occur. FIG. 3 is a diagram for explaining the amount of protrusion of the grid 17 according to the first embodiment.

  Next, the grid movement control function 214 calculates, in the reference coordinate system, an area occupied by the grid 17 protruding by the length “L1” in the + X direction. Similarly, the grid movement control function 214 calculates an area occupied by the grid 17 in the reference coordinate system for each of the grids 17 protruding by the lengths “L2”, “L3”,..., “LN” in the + X direction. Here, the lengths “L2”, “L3”,..., “LN” are examples of the protrusion length. For example, the lengths “L1”, “L2”, “L3”,. The length “LN” is a maximum value at which the grid 17 can protrude from the X-ray detector 16. For example, the length “LN” is a maximum value that can be realized by a mechanism (such as a rack and pinion) that moves the grid 17 with respect to the X-ray detector 16. The grid movement control function 214 calculates the area occupied by each of the C arm 15, the couch, and the subject P in the reference coordinate system.

  Next, the grid movement control function 214 determines whether or not the area occupied by the C arm 15, the couch, and the subject P and the area occupied by the grid 17 overlap for each projection length. That is, the grid movement control function 214 determines whether the C-arm 15, the couch, and the subject P are in each of the grids 17 protruding by the lengths “L1”, “L2”, “L3”,. It is determined whether or not the occupied area and the area occupied by the grid 17 overlap. Accordingly, the grid movement control function 214 determines whether the grid 17 contacts the C arm 15, the couch, and the subject P for each of the lengths “L1”, “L2”, “L3”,. It is determined whether it occurs.

  For example, the grid movement control function 214 determines that contact with the C arm 15, the couch, and the subject P occurs for each of the grids 17 protruding by the lengths "L3" to "LN". That is, the grid movement control function 214 determines that the grid 17 comes into contact with the C arm 15, the bed, and the subject P when the protrusion length is equal to or longer than “L3”. Then, the grid movement control function 214 determines the amount of protrusion of the grid 17 from the X-ray detector 16 based on the result of the determination.

  If there are a plurality of protrusion lengths for which it is determined that no contact occurs between the grid 17 and the C-arm 15, the couch, and the subject P, the grid movement control function 214 accepts a selection operation from the operator, for example. , The amount of protrusion of the grid 17 is determined. For example, when it is determined that neither the grid 17 protruded by the length “L1” nor the grid 17 protruded by the length “L2” makes contact, the grid movement control function 214 determines the length “L1”. And the operation of selecting one of the length “L2” and the amount of protrusion of the grid 17 is determined. Alternatively, the grid movement control function 214 may automatically determine, as the amount of protrusion of the grid 17, a maximum value or the like of the protrusion length determined not to cause contact.

  Then, the grid movement control function 214 controls the amount of projection of the grid 17 from the X-ray detector 16 and retracts the grid 17 from the X-ray irradiation area. For example, when the length “L2” is determined as the amount of protrusion of the grid 17, the grid movement control function 214 retracts the grid 17 so that the grid 17 protrudes from the X-ray detector 16 by the length “L2”. .

  The case where the direction of the projection of the grid 17 from the X-ray detector 16 is controlled and the case where the amount of the projection of the grid 17 from the X-ray detector 16 is controlled have been described. However, the grid movement control function 214 may control both the amount of protrusion of the grid 17 from the X-ray detector 16 and the direction of protrusion of the grid 17 from the X-ray detector 16.

  For example, the grid movement control function 214 determines whether the C-arm 15, the couch, and the subject P are in each of the grids 17 protruding by the lengths “L1”, “L2”, “L3”,. It is determined whether or not contact occurs. Further, the grid movement control function 214 performs the C-arm 15, the couch, and the subject P for each of the grids 17 protruding by the lengths “L1”, “L2”, “L3”,. It is determined whether or not contact will occur. Here, for example, when it is determined that no contact occurs only in the grid 17 that has protruded by the length “L1” in the −X direction, the grid movement control function 214 determines the −X direction as the direction in which the grid 17 protrudes, The length “L1” is determined as the amount of protrusion of the grid 17. Then, the grid movement control function 214 retracts the grid 17 so that the grid 17 protrudes from the X-ray detector 16 by the length “L1” in the −X direction.

  After the grid movement control function 214 retracts the grid 17, the collection function 213 generates X-rays from the X-ray tube 12 and collects X-ray image data. Here, the X-rays generated from the X-ray tube 12 are narrowed down by the X-ray diaphragm 13 and irradiated to the subject P. The X-ray transmitted through the subject P is detected by the second detector 165 without transmitting through the grid 17. Here, although the detected X-rays have not been subjected to the removal of the scattered radiation component by the grid 17, the scattered radiation component is reduced by being narrowed down by the X-ray diaphragm 13. Further, the acquisition function 213 generates X-ray image data based on the detection signal output from the second detector 165, and stores the generated X-ray image data in the memory 18. Here, the generated X-ray image data is high-definition X-ray image data based on the detection signal detected by the second detector 165.

  It is also conceivable to collect X-ray image data without retracting the grid 17. However, in this case, the grid 17 may appear in the acquired X-ray image data. That is, artifacts due to the grid 17 may occur in the collected X-ray image data. In particular, in the high-definition X-ray image data collected using the second detector 165, artifacts due to the grid 17 are likely to occur. On the other hand, miniaturizing the structure of the grid 17 to such an extent that the grid 17 does not cause artifacts may cause an increase in manufacturing cost and a decrease in strength. On the other hand, the grid movement control function 214 sets the grid 17 to the X-ray irradiation area under conditions where scattered radiation is unlikely to occur, such as when acquiring high-definition X-ray image data using the second detector 165. , The occurrence of artifacts due to the grid 17 can be avoided.

  Here, after the grid 17 is retracted, the arrangement of the mechanical system may change. For example, after collecting the first X-ray image data in the arrangement shown in FIG. 4A, the arrangement may be changed as shown in FIG. 4B to collect the second X-ray image data. In this case, the grid movement control function 214 changes at least one of the amount and direction of the protrusion of the grid 17 according to the change in the arrangement. FIGS. 4A and 4B are diagrams for explaining a change in arrangement of the mechanical system according to the first embodiment.

  Specifically, the acquisition function 213 first generates X-rays from the X-ray tube 12 with the grid 17 retracted in the −X direction, as shown in FIG. 4A, and converts the first X-ray image data. collect. Next, the collection function 213 rotates the C-arm 15. Thus, as shown in FIG. 4B, the X-ray tube 12, the X-ray diaphragm 13, the X-ray detector 16, and the grid 17 held by the C-arm 15 move and move with respect to the subject P and the top plate 14. Rotate. In addition, by the movement and rotation of the X-ray tube 12, the X-ray irradiation area changes as shown in FIG. 4B.

  Here, when the C-arm 15 is rotated while maintaining the amount and direction of the projection of the grid 17 during the collection of the first X-ray image data, as shown in FIG. Contact may occur. Therefore, the grid movement control function 214 avoids contact between the grid 17 and the subject P and the bed by changing at least one of the amount and direction of the projection of the grid 17 according to the change in the arrangement. For example, the grid movement control function 214 moves the grid 17 in the direction indicated by the arrow in FIG. 4B (+ X direction), and changes the direction of the projection of the grid 17 from the −X direction to the + X direction, so that the grid 17 Avoid contact with the subject P and the bed.

  For example, after the first X-ray image data is collected in the arrangement shown in FIG. 4A and before the arrangement of the mechanical system changes, the grid movement control function 214 determines that the amount of protrusion of the grid 17 is minimal. Control so that For example, the grid movement control function 214 controls the grid 17 to be in a state shown in FIG. 2C (a state not protruding from the X-ray detector 16) before the arrangement of the mechanical system changes. Accordingly, the grid movement control function 214 can avoid the contact between the grid 17 protruding from the X-ray detector 16 and the subject P and the bed while the arrangement of the mechanical system is changing.

  Next, the collection function 213 changes the arrangement of the mechanism system. For example, the collection function 213 rotates the C-arm 15 to change the arrangement of the mechanism from the state shown in FIG. 4A to the state shown in FIG. 4B. Then, after the arrangement of the mechanical system has changed, the grid movement control function 214 controls so that the amount of protrusion of the grid 17 increases. For example, after the arrangement of the mechanical system is changed, the grid movement control function 214 moves the grid 17 that has not protruded from the X-ray detector 16 in the + X direction and retracts it to the position shown in FIG. 4B. Thereby, the grid movement control function 214 avoids the contact between the grid 17 and the subject P and the bed, and when collecting the second X-ray image data in the arrangement shown in FIG. Can be withdrawn from the grid 17.

  As another example, the grid movement control function 214 moves the grid 17 after the first X-ray image data is collected in the arrangement shown in FIG. 4A and while the arrangement of the mechanical system is changing. . That is, the grid movement control function 214 changes at least one of the amount and direction of the protrusion of the grid 17 while the arrangement of the mechanical system is changing.

  For example, the grid movement control function 214 moves the grid 17 in a direction (+ X direction) indicated by an arrow in FIG. 4B in parallel with the rotation of the C arm 15 by the collection function 213. Here, the grid movement control function 214 sequentially acquires the sequentially changing arrangement of the C-arm 15. The grid movement control function 214 sequentially calculates the arrangement of the X-ray detectors 16 held by the C arm 15 based on the arrangement of the C arm 15. The grid movement control function 214 sequentially calculates the arrangement of the grid 17 based on the arrangement of the X-ray detector 16 and the amount and direction of the projection of the grid 17 from the X-ray detector 16. That is, the grid movement control function 214 sequentially calculates the current arrangement of the grid 17.

  The grid movement control function 214 sequentially calculates the distance between the grid 17 and the subject P and the bed based on the sequentially calculated arrangement of the grid 17. That is, the grid movement control function 214 sequentially calculates the current distance between the grid 17, the subject P, and the bed based on the current arrangement of the grid 17. Hereinafter, the current distance between the grid 17 and the subject P and the bed is referred to as a distance y1. More specifically, the distance y1 is the shortest distance among the distances between the positions on the grid 17 and the positions on the subject P and the bed. Note that the distance y1 is a value that changes due to a change in the arrangement of the mechanical system and the movement of the grid 17.

  Then, the grid movement control function 214 changes at least one of the amount and direction of the protrusion of the grid 17 based on the calculated distance y1. For example, the grid movement control function 214 compares the distance y1 with the threshold value T1 and the threshold value T2 that is smaller than the threshold value T1, and according to the comparison result, determines at least one of the amount and direction of the protrusion of the grid 17. Change one.

  Specifically, the grid movement control function 214 sequentially calculates the distance y1 while the collection function 213 is rotating the C-arm 15. Here, when the distance y1 is larger than the threshold value T1, the grid movement control function 214 moves the grid 17 in the + X direction. On the other hand, when the distance y1 is equal to or smaller than the threshold value T1, the grid movement control function 214 reduces the moving speed of the grid 17. Here, when the distance y1 becomes larger than the threshold T1 again, the grid movement control function 214 increases the moving speed of the grid 17. When the distance y1 is equal to or less than the threshold value T2, the grid movement control function 214 stops the movement of the grid 17 or moves the grid 17 in the −X direction. Here, when the distance y1 becomes larger than the threshold value T2 again, the grid movement control function 214 moves the grid 17 in the + X direction.

  As described above, the grid movement control function 214 changes the moving speed and the moving direction of the grid 17 in accordance with the distance y1 while the arrangement of the mechanical system is changing, so that the grid 17 and the subject P Avoid contact with the couch. For example, the grid movement control function 214 moves the grid 17 to the position shown in FIG. 4B while changing the moving speed and the moving direction of the grid 17 according to the distance y1. Thereby, the grid movement control function 214 avoids the contact between the grid 17 and the subject P and the bed, and when collecting the second X-ray image data in the arrangement shown in FIG. Can be withdrawn from the grid 17.

  Further, as described above, the grid movement control function 214 changes at least one of the amount and direction of the protrusion of the grid 17 while the arrangement of the mechanical system is changing. Thus, the grid movement control function 214 can complete a part or all of the movement of the grid 17 while the arrangement of the mechanical system is changing. That is, the grid movement control function 214 can reduce the time required to retract the grid 17 from the X-ray irradiation area.

  Next, an example of a procedure of a process performed by the X-ray diagnostic apparatus 1 will be described with reference to FIG. FIG. 5 is a flowchart for explaining a series of processing flows of the X-ray diagnostic apparatus 1 according to the first embodiment. Step S101, step S102, step S103, and step S104 are steps corresponding to the grid movement control function 214. Steps S105 and S106 are steps corresponding to the collection function 213. Note that FIG. 5 illustrates a process from the acquisition of the first X-ray image data to the acquisition of the second X-ray image data.

  First, the processing circuit 21 collects the first X-ray image data with the grid 17 retracted from the X-ray irradiation area, and then determines whether to change the arrangement of the mechanical system (step S101). . Here, when the arrangement is changed (Yes at Step S101), the processing circuit 21 determines whether the change in the arrangement causes contact between the grid 17, the subject P, and the bed (Step S102). .

  Here, when it is determined that contact occurs (Yes at Step S102), the processing circuit 21 controls the grid 17 and controls the arrangement of the mechanical system (Step S103). For example, the processing circuit 21 controls so that the amount of protrusion of the grid 17 is minimized, and after changing the arrangement of the mechanical system, controls the amount of protrusion of the grid 17 to increase. Further, for example, the processing circuit 21 changes at least one of the amount and direction of the protrusion of the grid 17 while changing the arrangement of the mechanical system. Accordingly, the processing circuit 21 retracts the grid 17 from the X-ray irradiation area while avoiding contact between the grid 17 and the subject P and the bed.

  On the other hand, when it is determined that no contact occurs (No at Step S102), the processing circuit 21 controls the arrangement of the mechanical system (Step S104). That is, the processing circuit 21 changes only the arrangement of the mechanical system without changing the amount and direction of the protrusion of the grid 17. As a result, the processing circuit 21 maintains the grid 17 in a state of being retracted from the X-ray irradiation area.

  When the arrangement of the mechanical system is not changed (No at Step S101), or after Step S103 or Step S104, the processing circuit 21 irradiates the subject P with X-rays (Step S105). Then, the processing circuit 21 generates X-ray image data based on the detection signal output from the X-ray detector 16 (Step S106), and ends the processing.

  As described above, according to the first embodiment, the X-ray tube 12 generates X-rays. Further, the X-ray diaphragm 13 narrows down the generated X-rays and irradiates the subject P with the X-rays. The X-ray detector 16 detects X-rays transmitted through the subject P. The grid 17 is movable with respect to the X-ray detector 16 and removes scattered X-ray components transmitted through the subject P. The grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the arrangement of the mechanical system. Therefore, the X-ray diagnostic apparatus 1 according to the first embodiment can appropriately use the grid 17 according to the procedure.

  That is, the X-ray diagnostic apparatus 1 retreats the grid 17 from the X-ray irradiation region based on the arrangement of the mechanical system in a procedure in which scattered radiation is unlikely to occur. Thereby, the X-ray diagnostic apparatus 1 can avoid occurrence of an artifact due to the grid 17 in collected X-ray image data while avoiding contact between the grid 17 and other components and the subject P.

  In addition, comparing the case where the grid 17 is not retracted and the case where the grid 17 is retracted with the X-ray dose generated by the X-ray tube 12 being constant, when the grid 17 is not retracted, the amount of X-rays absorbed by the grid 17 is reduced. However, the amount of X-rays incident on the X-ray detector 16 decreases, and the image quality of the X-ray image data decreases. Alternatively, comparing the case where the grid 17 is not retracted and the case where the grid 17 is retracted with the X-ray dose incident on the X-ray detector 16 being constant, when the grid 17 is not retracted, the X-ray absorbed by the grid 17 The exposure amount of the subject P increases by the amount. On the other hand, the X-ray diagnostic apparatus 1 improves the image quality of X-ray image data by increasing the amount of X-rays incident on the X-ray detector 16 by retracting the grid 17 in a procedure in which scattered radiation is unlikely to occur. Alternatively, the exposure dose of the subject P can be reduced by reducing the X-ray dose generated by the X-ray tube 12.

  Further, an upper limit may be set for the X-ray dose generated by the X-ray tube 12. Here, if the grid 17 is not retracted, the X-ray dose incident on the X-ray detector 16 may be insufficient. That is, when the grid 17 is not retracted, the amount of X-rays incident on the X-ray detector 16 is reduced by the amount of X-rays absorbed by the grid 17, and X-ray image data with sufficient image quality may not be obtained. In particular, when collecting high-definition X-ray image data using the second detector 165, the incident X-ray dose tends to be insufficient because the size of each of the second detection elements is small. On the other hand, the X-ray diagnostic apparatus 1 can prevent the X-ray amount incident on the X-ray detector 16 from becoming insufficient by retracting the grid 17 in a procedure in which scattered radiation is unlikely to occur.

  On the other hand, the X-ray diagnostic apparatus 1 collects X-ray image data using the grid 17 without retracting the grid 17 from the X-ray irradiation area in a technique in which scattered radiation is likely to occur. That is, the X-ray diagnostic apparatus 1 can reduce the influence of the scattered radiation by using the grid 17 and improve the image quality of the X-ray image data in the procedure in which the scattered radiation is likely to occur. In other words, the X-ray diagnostic apparatus 1 can realize an appropriate use state of the grid 17 according to the procedure.

  Further, as described above, the X-ray diagnostic apparatus 1 according to the first embodiment controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the arrangement of the mechanical system. I do. That is, the X-ray diagnostic apparatus 1 can retreat the grid 17 based on the arrangement of the mechanical system without performing an operation for retreating the grid 17 by the operator.

  For example, after the X-ray irradiation area is set by the operator, the X-ray diagnostic apparatus 1 automatically retracts the grid 17 based on the arrangement of the mechanical system. That is, the operator can easily set the X-ray irradiation area and retract the grid 17 using a single user interface (UI). Alternatively, when the X-ray diagnostic apparatus 1 sets the X-ray irradiation area based on the inspection target site or the like of the subject P, the X-ray diagnostic apparatus 1 performs an operation related to setting the X-ray irradiation area and retracting the grid 17. The operation of the user can be omitted.

  Further, as described above, the X-ray diagnostic apparatus 1 according to the first embodiment changes at least one of the amount and direction of the projection of the grid 17 according to the change in the arrangement of the mechanical system. Therefore, the X-ray diagnostic apparatus 1 can appropriately use the grid 17 by changing the use state of the grid 17 as needed even when the X-ray image data is collected a plurality of times.

  Further, as described above, the X-ray diagnostic apparatus 1 according to the first embodiment changes at least one of the amount and direction of the projection of the grid 17 while the arrangement of the mechanical system is changing. Therefore, the X-ray diagnostic apparatus 1 completes a part or all of the movement of the grid 17 while the arrangement of the mechanical system is changing, and reduces the time required to retract the grid 17 from the X-ray irradiation area. Can be shortened.

  Heretofore, a case has been described in which at least one of the amount and direction of the protrusion of the grid 17 is controlled so that the C arm 15, the bed, and the subject P do not contact the grid 17. However, embodiments are not limited to this.

  For example, the X-ray diagnostic apparatus 1 includes, in addition to an imaging system (hereinafter, a first imaging system) including the X-ray tube 12, the X-ray diaphragm 13, the X-ray detector 16, and the grid 17 in FIG. An imaging system different from the first imaging system (hereinafter, a second imaging system) is further provided. In this case, the grid movement control function 214 controls at least one of the amount and direction of protrusion of the grid 17 so that the second imaging system does not contact the grid 17.

  For example, the X-ray diagnostic apparatus 1 may be a biplane. For example, the X-ray diagnostic apparatus 1 further includes an X-ray tube 12a, an X-ray diaphragm 13a, a C-arm 15a, an X-ray detector 16a, and a grid 17a (not shown) as a second imaging system. The C-arm 15a holds the X-ray tube 12a and the X-ray diaphragm 13a, and the X-ray detector 16a and the grid 17a so as to face each other with the subject P interposed therebetween. In this case, the grid movement control function 214 determines the amount of projection of the grid 17 so that the grid 17 does not contact the X-ray tube 12a, the X-ray diaphragm 13a, the C-arm 15a, the X-ray detector 16a, and the grid 17a. And at least one of the directions. Here, the first imaging system may be an imaging system on the F (Frontal) side and the second imaging system may be an imaging system on the L (Lateral) side, or the first imaging system may be an L-side imaging system. In this case, the second imaging system may be an F-side imaging system. The arm in the imaging system on the L (Lateral) side is also called an Ω arm.

  As another example, the X-ray diagnostic apparatus 1 may be a dual plane. For example, the X-ray diagnostic apparatus 1 further includes, as a second imaging system, an X-ray tube 12b, an X-ray diaphragm 13b, a C-arm 15b, an X-ray detector 16b, and a grid 17b (not shown). For example, the first imaging system includes a large-field X-ray detector 16 for examining a circulatory organ, and the second imaging system includes a small-field X-ray detector 16 for examining a head. In this case, the grid movement control function 214 determines the amount of projection of the grid 17 so that the X-ray tube 12b, the X-ray diaphragm 13b, the C-arm 15b, the X-ray detector 16b, and the grid 17b do not contact the grid 17. And at least one of the directions.

  To give another example, the X-ray diagnostic apparatus 1 further includes a second imaging system that collects medical image data other than X-ray image data, in addition to the first imaging system that collects X-ray image data. You may. For example, the X-ray diagnostic apparatus 1 may be an Angio-CT apparatus in which an angiographic apparatus and an X-ray CT (Computed Tomography) apparatus are integrated. In this case, the grid movement control function 214 controls at least one of the amount and direction of protrusion of the grid 17 so that the gantry for performing the CT scan does not contact the grid 17.

(Second embodiment)
In the first embodiment described above, the X-ray irradiation region is set, and the amount and direction of the protrusion of the grid 17 from the X-ray detector 16 are set so as to retract the grid 17 from the set X-ray irradiation region. The case where at least one is controlled has been described. On the other hand, in the second embodiment, at least one of the amount and direction of protrusion of the grid 17 is controlled before setting the X-ray irradiation area, and at least one of the amount and direction of protrusion of the grid 17 after control is controlled. A case in which a settable X-ray irradiation area is specified based on one of them will be described.

  The X-ray diagnostic apparatus 1 according to the second embodiment has the same configuration as the X-ray diagnostic apparatus 1 according to the first embodiment shown in FIG. Are different. Components having the same configuration as the configuration described in the first embodiment are denoted by the same reference numerals as those in FIG. 1, and description thereof will be omitted.

  First, the grid movement control function 214 determines whether to use the grid 17 in collecting X-ray image data. For example, the grid movement control function 214 performs an input operation indicating that the grid 17 is not used when the subject P is a child, when the body thickness of the subject P is sufficiently thin, or when the thickness of the inspection target site is small. It is determined that X-ray image data is to be collected without using the grid 17, for example, when received from the operator.

  Next, the grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the arrangement of the mechanical system. For example, the grid movement control function 214 controls the X-ray detector 16 so that the amount of protrusion of the grid 17 is maximized in the other configuration of the X-ray diagnostic apparatus 1 and in a range not in contact with the subject P. 17 is moved.

  Next, the grid movement control function 214 specifies a settable X-ray irradiation area based on at least one of the amount and direction of the projection of the grid 17 after the control. That is, in order to collect X-ray image data without using the grid 17, an area where the grid 17 and the X-ray detector 16 overlap cannot be set as an X-ray irradiation area. The X-ray irradiation area that can be set varies according to the amount and direction of the X-ray irradiation. For example, when the grid 17 protrudes from the X-ray detector 16 by the length “11” in the −X direction, the X-ray irradiation area that can be set is a shaded area in FIG. 6A. When the grid 17 protrudes from the X-ray detector 16 by the length “12” in the −X direction, the settable X-ray irradiation area is an area indicated by oblique lines in FIG. 6B. FIGS. 6A and 6B are diagrams for explaining a settable X-ray irradiation range according to the second embodiment.

  For example, the grid movement control function 214 calculates a settable X-ray irradiation area based on the amount and direction of the projection of the grid 17. For example, the grid movement control function 214 reads a settable X-ray irradiation area from the table D1 in which the X-ray irradiation area is associated with the amount and direction of the projection of the grid 17. The table D1 is generated in advance by, for example, the X-ray diagnostic apparatus 1 or another apparatus, and stored in the memory 18.

  Next, the display control function 215 causes the display 19 to display the settable X-ray irradiation area. As an example, the display control function 215 causes the display 19 to display an image indicating the positional relationship between the X-ray detector 16 and the grid 17, as shown in FIGS. 6A and 6B. As another example, the display control function 215 is configured to generate an image indicating the positional relationship between the X-ray detector 16 and the grid 17 and an image indicating the subject P (such as an X-ray image of the subject P). The superimposed image is displayed on the display 19.

  Then, the setting function 212 sets an X-ray irradiation area for the subject P. For example, the setting function 212 sets an X-ray irradiation area by receiving an operation of designating a part or all of the settable X-ray irradiation areas from an operator who refers to the settable X-ray irradiation area. . The collection function 213 irradiates the set X-ray irradiation area with X-rays to collect X-ray image data.

  As described above, the grid movement control function 214 according to the second embodiment controls at least one of the amount and direction of protrusion of the grid 17 based on the arrangement of the mechanical system, and controls the amount of protrusion of the grid 17 after control. A settable X-ray irradiation region is specified based on at least one of the amount and the direction. Therefore, the X-ray diagnostic apparatus 1 according to the second embodiment can support the setting of the X-ray irradiation area by retreating the grid 17 and presenting the settable X-ray irradiation area to the operator. .

(Third embodiment)
In the above-described second embodiment, a case has been described in which, after the grid 17 is moved, a settable X-ray irradiation area is specified based on at least one of the amount and direction of protrusion of the grid 17. On the other hand, in the third embodiment, before the grid 17 is moved, an X-ray irradiation area that can be set for each combination of the amount and direction of the projection of the grid 17 is specified, and based on the specified X-ray irradiation area. A case will be described in which one of the combinations is selected and the amount and direction of projection of the grid 17 from the X-ray detector 16 are controlled based on the selected combination.

  The X-ray diagnostic apparatus 1 according to the third embodiment has the same configuration as the X-ray diagnostic apparatus 1 according to the first embodiment shown in FIG. Are different. Components having the same configuration as the configuration described in the first embodiment are denoted by the same reference numerals as those in FIG. 1, and description thereof will be omitted.

  First, the grid movement control function 214 determines whether to use the grid 17 in collecting X-ray image data. For example, the grid movement control function 214 performs an input operation indicating that the grid 17 is not used when the subject P is a child, when the body thickness of the subject P is sufficiently thin, or when the thickness of the inspection target site is small. It is determined that X-ray image data is to be collected without using the grid 17, for example, when received from the operator.

  Next, the grid movement control function 214 specifies a settable X-ray irradiation area for each combination of the amount and direction of protrusion of the grid 17. That is, in order to collect X-ray image data without using the grid 17, an area where the grid 17 and the X-ray detector 16 overlap cannot be set as an X-ray irradiation area. The X-ray irradiation area that can be set varies according to the amount and direction of the X-ray irradiation. For example, when the grid 17 protrudes from the X-ray detector 16 by the length “11” in the −X direction, the X-ray irradiation area that can be set is a shaded area in FIG. 6A. When the grid 17 protrudes from the X-ray detector 16 by the length “12” in the −X direction, the settable X-ray irradiation region is a region indicated by oblique lines in FIG. 6B.

  For example, the grid movement control function 214 includes a plurality of combinations including the combination of FIG. 6A (combination of −X direction and length “l1”) and the combination of FIG. 6B (combination of −X direction and length “l2”). The settable X-ray irradiation area is specified for each of the combinations. As an example, the grid movement control function 214 calculates a settable X-ray irradiation area for each combination that can be realized by a mechanism (rack and pinion or the like) that moves the grid 17 with respect to the X-ray detector 16. I do. As another example, the grid movement control function 214 sets the X-ray irradiation area that can be set from the above-described table D1 for each of the combinations that can be realized by the mechanism that moves the grid 17 with respect to the X-ray detector 16. read out.

  Next, the grid movement control function 214 selects one of a plurality of combinations based on the specified X-ray irradiation area and the arrangement of the mechanical system. For example, the grid movement control function 214 first determines whether contact between the grid 17 and other components (C arm 15, bed, etc.) in the X-ray diagnostic apparatus 1 and the subject P occur based on the arrangement of the mechanical system. Determine whether or not. That is, when the grid 17 is moved in accordance with each combination of the amount and direction of the projection of the grid 17, the grid movement control function 214 makes contact between the grid 17 and other components and the subject P. It is determined whether or not.

  Next, the grid movement control function 214 selects any one of a plurality of combinations determined that no contact occurs. For example, the grid movement control function 214 selects a combination by receiving from the operator an operation of selecting one of the X-ray irradiation regions specified for each of the plurality of combinations.

  For example, first, the display control function 215 causes the display 19 to display the X-ray irradiation area. As an example, the display control function 215 causes the display 19 to display an image indicating the positional relationship between the X-ray detector 16 and the grid 17, as shown in FIGS. 6A and 6B. As another example, the display control function 215 causes the display 19 to display a superimposed image of an image indicating the positional relationship between the X-ray detector 16 and the grid 17 and an image indicating the subject P.

  Next, the operator inputs an operation for selecting any of the displayed X-ray irradiation regions via the input interface 20. As an example, when acquiring high-definition X-ray image data using the second detector 165, the operator selects an X-ray irradiation region including the second detection region R2 as shown in FIG. 6B. .

  The operator may not select any of the displayed X-ray irradiation regions. For example, when collecting high-definition X-ray image data using the second detector 165, if the X-ray irradiation region including the second detection region R2 is not displayed, the operator can display the displayed X-ray. An input operation for not selecting any of the line irradiation areas is performed. Further, the operator changes the arrangement of the mechanical system such as the C-arm 15 and changes the X-ray irradiation position and irradiation angle on the subject P. Thereafter, the grid movement control function 214 specifies again the X-ray irradiation area that can be set for each combination of the amount of projection and the direction of the grid 17 based on the changed arrangement of the mechanical system. Further, the display control function 215 causes the display 19 to display the settable X-ray irradiation area again.

  The grid movement control function 214 controls at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 based on the combination corresponding to the X-ray irradiation area selected by the operator. For example, when the operator selects the X-ray irradiation area shown in FIG. 6B, the grid movement control function 214 sets the grid 17 so that the grid 17 protrudes from the X-ray detector 16 in the −X direction by the length “l2”. 17 is moved. After the grid movement control function 214 retracts the grid 17, the collection function 213 generates X-rays from the X-ray tube 12 and collects X-ray image data.

  As described above, the grid movement control function 214 according to the third embodiment specifies an X-ray irradiation area that can be set for each combination of the amount and direction of the projection of the grid 17, and specifies the specified X-ray irradiation area, One of the combinations is selected based on the arrangement of the mechanical system, and at least one of the amount and direction of the projection of the grid 17 from the X-ray detector 16 is controlled based on the selected combination. Therefore, the X-ray diagnostic apparatus 1 according to the third embodiment can specify an X-ray irradiation area that can be set in consideration of retracting the grid 17 and support setting of the X-ray irradiation area.

(Fourth embodiment)
The first to third embodiments have been described above, but may be implemented in various different forms other than the first to third embodiments.

  In the above-described embodiment, the case where the grid 17 is movable in two directions (+ X direction and −X direction) with respect to the X-ray detector 16 has been described. However, the embodiment is not limited to this, and the grid 17 may be movable in three or more directions with respect to the X-ray detector 16.

  Further, the X-ray detector 16 and the grid 17 may be configured to be integrally rotatable about an axis (Z-axis) perpendicular to the detection surface of the X-ray detector 16 as a rotation axis. In this case, the grid movement control function 214 can control the direction of projection of the grid 17 by integrally rotating the X-ray detector 16 and the grid 17. For example, the grid movement control function 214 changes the direction of projection of the grid 17 by integrally rotating the X-ray detector 16 and the grid 17, thereby allowing the grid 17 to move between the grid 17 and other components and the subject P. Contact can be avoided.

  For example, the shape of the detection surface of the X-ray detector 16 is rectangular, and the grid 17 can move only in the + X direction with respect to the X-ray detector 16. When the contact with the configuration and the subject P occurs, the grid movement control function 214 rotates the X-ray detector 16 and the grid 17 by “180 °”. Accordingly, the grid movement control function 214 can change the direction in which the grid 17 is retracted, and can avoid contact with other components and the subject P. Note that, when the X-ray detector 16 and the grid 17 rotate by “180 °”, the X-ray image data collected by the collection function 213 also rotates by “180 °”. Here, the acquisition function 213 can align the directions of the X-ray image data acquired before and after the rotation of the X-ray detector 16 and the grid 17 by image processing.

  As another example, when the detection surface of the X-ray detector 16 has a square shape, the grid 17 can move only in the + X direction with respect to the X-ray detector 16, and when the grid 17 is retracted in the + X direction. In a case where the contact with the subject P occurs in another configuration, the grid movement control function 214 rotates the X-ray detector 16 and the grid 17 by “90 °”. Accordingly, the grid movement control function 214 can change the direction in which the grid 17 is retracted by “90 °”, and can avoid contact with another configuration and the subject P. Note that, when the X-ray detector 16 and the grid 17 rotate by “90 °”, the X-ray image data collected by the collection function 213 also rotates by “90 °”. Here, the acquisition function 213 can align the directions of the X-ray image data acquired before and after the rotation of the X-ray detector 16 and the grid 17 by image processing. Similarly, the grid movement control function 214 may change the retreat direction of the grid 17 by “180 °” or may change the retreat direction of the grid 17 by “270 °”.

  In the above-described embodiment, as an example of the X-ray aperture, the collimator for narrowing the irradiation range of the X-ray generated by the X-ray tube 12 and the filter for adjusting the X-ray generated by the X-ray tube 12 are provided. The X-ray diaphragm 13 has been described. However, embodiments are not limited to this. For example, the X-ray diagnostic apparatus 1 may include a collimator as an X-ray diaphragm.

  In the above-described embodiment, the X-ray detector 16 including the first photodetector 161, the second photodetector 162, and the scintillator 163 has been described as an example of the X-ray detector. That is, in the above-described embodiment, as an example of the X-ray detection unit, the hybrid detector including the first detection region R1 having a normal density and the second detection region R2 having a high definition has been described. However, embodiments are not limited to this. For example, the X-ray diagnostic apparatus 1 may include a first detector 164 including a first photodetector 161 and a scintillator 163 as an X-ray detector. Further, for example, the X-ray diagnostic apparatus 1 may include a second detector 165 including a second photodetector 162 and a scintillator 163 as an X-ray detector. Further, for example, the X-ray diagnostic apparatus 1 may include, as an X-ray detection unit, a direct conversion type detector having a semiconductor element that converts incident X-rays into an electric signal.

  Each component of each device according to the above-described embodiment is functionally conceptual and does not necessarily need to be physically configured as illustrated. That is, the specific form of distribution / integration of each device is not limited to the illustrated one, and all or a part thereof may be functionally or physically distributed / arranged in an arbitrary unit according to various loads and usage conditions. Can be integrated and configured. Furthermore, all or any part of each processing function performed by each device can be realized by a CPU and a program analyzed and executed by the CPU, or can be realized as hardware by wired logic.

  Further, the control method described in the above-described embodiment can be realized by executing a control program prepared in advance on a computer such as a personal computer or a workstation. This control program can be distributed via a network such as the Internet. The control program is recorded on a non-transitory computer-readable recording medium such as a hard disk, a flexible disk (FD), a CD-ROM, an MO, and a DVD, and is executed by being read from the recording medium by the computer. You can also.

  According to at least one embodiment described above, it is possible to appropriately use a grid according to a procedure.

  Although several embodiments of the present invention have been described, these embodiments are provided by way of example and are not intended to limit the scope of the invention. These embodiments can be implemented in other various forms, and various omissions, replacements, and changes can be made without departing from the spirit of the invention. These embodiments and their modifications are included in the scope and gist of the invention, and are also included in the invention described in the claims and equivalents thereof.

DESCRIPTION OF SYMBOLS 1 X-ray diagnostic apparatus 12 X-ray tube 13 X-ray diaphragm 16 X-ray detector 17 Grid 21 Processing circuit 211 Control function 212 Setting function 213 Collection function 214 Grid movement control function 215 Display control function

Claims (11)

An X-ray generation unit that generates X-rays,
An X-ray aperture that narrows the generated X-rays and irradiates the subject with the X-ray;
An X-ray detector that detects X-rays transmitted through the subject;
A grid movable with respect to the X-ray detection unit, for removing a scattered ray component of the X-ray transmitted through the subject;
A grid movement control unit that controls at least one of an amount and a direction of projection of the grid from the X-ray detection unit based on an arrangement of a mechanical system.   2. The X-ray diagnostic apparatus according to claim 1, wherein the grid movement control unit controls at least one of an amount and a direction of protrusion of the grid so that the subject does not contact the grid. A second imaging system different from the first imaging system including the X-ray generation unit, the X-ray aperture, the X-ray detection unit, and the grid;
3. The X-ray diagnosis according to claim 1, wherein the grid movement control unit controls at least one of an amount and a direction of projection of the grid so that the second imaging system does not contact the grid. 4. apparatus.   The grid movement control unit controls at least one of an amount and a direction of projection of the grid so that the bed on which the subject is placed and the grid do not come into contact with each other. The X-ray diagnostic apparatus according to claim 1.   The grid movement control unit, a holding device that holds the X-ray generation unit and the X-ray detection unit, so that the grid does not contact, controls at least one of the amount and direction of projection of the grid, The X-ray diagnostic apparatus according to claim 1.   The X-ray diagnostic apparatus according to any one of claims 1 to 5, wherein the grid movement control unit changes at least one of an amount and a direction of protrusion of the grid according to the change in the arrangement.   The X-ray diagnostic apparatus according to claim 6, wherein the grid movement control unit changes at least one of an amount and a direction of protrusion of the grid while the arrangement is changing.   The grid movement control unit controls the amount of protrusion of the grid to be minimized before the arrangement changes, and controls the amount of protrusion of the grid to increase after the arrangement changes. Item 7. An X-ray diagnostic apparatus according to Item 6.   The grid movement control unit controls at least one of the amount and direction of protrusion of the grid based on the arrangement of a mechanical system, and sets based on at least one of the amount and direction of protrusion of the grid after control. The X-ray diagnostic apparatus according to claim 1, wherein a possible X-ray irradiation area is specified.   The grid movement control unit specifies an X-ray irradiation area that can be set for each combination of the amount and direction of projection of the grid, and selects one of the combinations based on the X-ray irradiation area and the arrangement. The X-ray diagnostic apparatus according to any one of claims 1 to 8, wherein at least one of an amount and a direction of protrusion of the grid is controlled based on the selected combination.   The grid movement control unit controls the direction of projection of the grid by integrally rotating the X-ray detection unit and the grid with an axis perpendicular to a detection surface in the X-ray detection unit as a rotation axis, The X-ray diagnostic apparatus according to any one of claims 1 to 10.

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