JP2019211379A - Measuring device and measuring system - Google Patents

Abstract

To suitably generate processed data based on a value of a first processing object data generated in a measuring device and a value of a second processing object data generated in an external device without acquiring a synchronization signal from the external device or supplying a clock signal to the external device.SOLUTION: A measuring system includes: a measurement section 11 for generating measurement value data D1 in a first cycle identified on the basis of a first count value of a first clock; and a data processing section 16 for executing data generation processing for generating measurement value data D3 by acquiring measurement value data D2 generated in a second cycle identified on the basis of a second count value of a second clock in a measuring device 2. The processing section 16 acquires the first and second count values, repeatedly executes difference amount identification processing for identifying difference amounts of both count values, and synchronizes data D1 and D2 according to the difference amounts identified by the difference amount identification processing executed immediately before in the data generation processing.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a measuring device including a processing unit that generates processed data based on first processing target data generated in a measuring unit and second processing target data generated in an external device, and so on. The present invention relates to a measurement system provided with a simple measuring device.

  For example, in the following patent document, the analog signal waveform and the test object are synchronized with the analog signal waveform output from the sensor provided on the test object and the video of the test object image data taken by the high-speed camera is synchronized. An invention of a waveform analyzer configured to be able to display a video of an object on the same screen is disclosed.

  In this waveform analyzer, the test object is photographed by the high-speed camera in parallel with the waveform measurement by the analog signal input unit, and the frame synchronization signal output from the high-speed camera and acquired by the synchronization signal input unit is used. Based on this, a configuration is adopted in which the video of the test object is synchronized with the analog signal waveform. Thus, according to the waveform analysis device disclosed in the patent document, the waveform of the waveform data output from the sensor provided on the test object and the video of the test object taken by the high-speed camera are temporally analyzed. It is possible to display on the same display screen without causing any shift.

Japanese Unexamined Patent Publication No. 2011-7592 (page 4-7, FIG. 1-6)

  However, the waveform analyzer disclosed in the above-mentioned patent document has the following problems. Specifically, in the waveform analysis device disclosed in the above patent document, the waveform waveform of the waveform data and the video of the test object are synchronized based on the frame synchronization signal acquired from the high-speed camera that images the test object. A configuration that allows them to be displayed is adopted. For this reason, in this waveform analyzer, when a camera having a configuration that cannot output a frame synchronization signal is connected, the waveform waveform of the waveform data and the video of the test object cannot be displayed in synchronization. There is a problem.

  In this case, like the waveform analysis device disclosed in the above-mentioned patent document, the measurement value data generated in the measurement unit in the device and the value of the data generated in the external device (for example, the measurement unit in the device). The measurement data generated by the measurement unit of the external measurement device that executes the measurement processing independently of the measurement data, etc. When building a measurement system, use a general-purpose device that is not configured to output a synchronization signal as an external device instead of a specially configured device that can output a synchronization signal. It becomes possible to build in. However, since the waveform analysis device disclosed in the above patent document is configured to acquire and process a frame synchronization signal from an external device as described above, it is difficult to construct a measurement system inexpensively using a general-purpose device. It has become.

  On the other hand, instead of the configuration for acquiring the synchronization signal from the external device, it is generated inside the device without acquiring the synchronization signal from the external device by operating the external device by supplying the clock signal of the operation clock. The value of the data to be processed and the value of the data generated in the external device can be processed in synchronization. However, when such a configuration is adopted, since it is assumed that an external device having a special configuration that operates according to the supplied clock signal is used, it is still difficult to construct a measurement system at low cost. .

  The present invention has been made in view of such problems, and is generated inside the apparatus without acquiring a synchronization signal from the external apparatus or supplying a clock signal of an operation clock to the external apparatus. It is a main object of the present invention to provide a measuring apparatus and a measuring system that can suitably generate processed data based on the value of the first processing target data and the value of the second processing target data generated in the external device.

  In order to achieve the above object, the measurement apparatus according to claim 1, a measurement unit that generates first processing target data in a first period specified based on a first count value of a first clock; In the external device, the second processing target data generated in the second cycle specified based on the second count value of the second clock in the external device is acquired from the external device and the second processing is performed. A processing unit that executes data generation processing for generating processed data based on target data and the first processing target data, wherein the processing unit calculates the first count value and the second count value. The difference amount specifying process for acquiring and specifying the difference amount between the acquired first count value and the second count value is repeatedly executed, and the phase executed immediately before in the data generation process Synchronize the first processing target data and the second processing target data according to the difference amount identified by the amount specification process to generate the processed data.

  The measuring device according to claim 2 is the measuring device according to claim 1, wherein the processing unit is configured such that when the time length of the first period and the time length of the second period are different, A first data complementing process for complementing the second processing target data corresponding to the first cycle based on the second processing target data acquired from the first processing, and the first processing acquired from the measurement unit At least one of a second data complementing process for complementing the first processing target data corresponding to the second cycle based on the target data is executed.

  Furthermore, the measuring device according to claim 3 is the measuring device according to claim 2, wherein the processing unit generates the first processing target data at the time of obtaining the first processing target data from the measuring unit. Obtaining the first count value in the measurement unit, and obtaining the second count value at the time of generation of the second process target data when obtaining the second process target data from the external device. Obtain from an external device.

  Furthermore, a measurement system according to a fourth aspect includes the measurement apparatus according to any one of the first to third aspects and an external measurement apparatus as the external apparatus.

  In the measurement apparatus according to claim 1, the processing unit uses the first count value of the first clock used when the measurement unit generates the first processing target data, and the external device performs the second process. A difference amount specifying process for acquiring a second count value of the second clock used when generating the target data and specifying a difference amount between the acquired first count value and the second count value In addition to repeated execution, in the data generation process, the first processing target data and the second processing target data are synchronized in accordance with the difference amount specified by the difference amount specifying process executed immediately before to generate processed data. According to a fourth aspect of the present invention, there is provided a measuring system comprising the above measuring device and an external measuring device as an external device.

  Therefore, according to the measurement apparatus according to claim 1 and the measurement system according to claim 4, the synchronization signal is acquired from the external apparatus (external measurement apparatus) or from the measurement apparatus to the external apparatus (external measurement apparatus). The first count value of the first clock of the measuring unit specified by the difference amount specifying process and the second of the second clock of the external device (external measuring device) without supplying the clock signal of the operation clock The value of the first processing target data generated in the measurement device and the value of the second processing target data generated in the external device (external measurement device) are accurately synchronized based on the difference from the count value of Can be made. Thereby, according to the measuring apparatus according to claim 1 and the measuring system according to claim 4, during the generation of processed data based on the first processing target data and the second processing target data. The time required for the processing unit to acquire the first processing target data and the time required for the processing unit to acquire the second processing target data vary, or the first count value of the first clock is changed. Even if there is a delay or advance in the progress of the second count value of the second clock relative to the progress, the correct processing has been completed based on the first processing target data and the second processing target data that are accurately synchronized. Data can be generated.

  In the measurement apparatus according to claim 2, when the time length of the first cycle and the time length of the second cycle are different, the processing unit uses the first processing target data acquired from the external device, based on the first processing target data. Complementing the first processing target data corresponding to the second cycle based on the first data complementing processing for complementing the second processing target data corresponding to the cycle and the first processing target data acquired from the measurement unit At least one of the second data complementing processes is executed. Therefore, according to the measuring apparatus according to claim 2 and the measuring system including such a measuring apparatus, the processing is performed based only on the first processing target data and the second processing target data having the same generation timing. Compared to the configuration for generating data, it is possible to provide detailed processed data in which a large number of values whose time intervals are sufficiently short are recorded.

  In the measuring apparatus according to claim 3, the processing unit acquires the first count value at the time of generation of the first processing target data from the measuring unit when acquiring the first processing target data from the measuring unit, and externally When the second processing target data is acquired from the device, the second count value at the time of generation of the second processing target data is acquired from the external device. Therefore, according to the measurement device of claim 3 and the measurement system including such a measurement device, the first count value is acquired at a time different from the acquisition of the first processing target data, Unlike the configuration in which the second count value is acquired at a time different from the acquisition of the second processing target data, the first count value acquired together with the acquired first processing target data, and the second Based on the second count value acquired together with the processing target data, the acquired first processing target data and the second processing target data can be synchronized in substantially real time to generate processed data.

It is a block diagram which shows the structure of measurement system S1. It is explanatory drawing for demonstrating an example of the count value of each clock used in the waveform display apparatus.

  Hereinafter, embodiments of a measurement apparatus and a measurement system will be described with reference to the accompanying drawings.

  The measurement system S1 shown in FIG. 1 is an example of a “measurement system”, a waveform display device 1 that is an example of a “measurement device”, and a measurement device that is an example of an “external measurement device” as an “external device”. 2 is comprised.

  As will be described later, the waveform display device 1 includes measurement value data D1 generated in the device (an example of “first processing target data”) and measurement value data D2 generated in the measurement device 2 (“second processing data”). Measurement value data D3 (an example of “processed data”) is generated based on an example of “processing target data”, and a signal waveform based on the generated measurement value data D3 can be displayed. The waveform display device 1 includes a measurement unit 11, a communication unit 12, a measurement value recording unit 13, an operation unit 14, a display unit 15, a data processing unit 16, and a storage unit 17.

  The measurement unit 11 is an example of a “measurement unit”, and performs measurement processing on an arbitrary measured amount that is defined in advance, and performs measurement values (current value, voltage value, resistance value, power value, phase, temperature). , Humidity, distortion, luminance (luminous intensity), illuminance, rainfall, flow rate, and the like) can be generated. In this case, in the waveform display device 1 of this example, as an example, the measurement unit 11 is configured to be able to measure the current value of the current flowing through the measurement target and generate the measurement value data D1 indicating the current value as the measurement value. ing. The measurement unit 11 includes a clock (not shown) that is an example of a “first clock”. In addition, the measurement unit 11 performs a sampling period (current measurement period: “first period”) specified based on a clock count value (an example of “first count value”) according to a preset measurement condition. In this example, the measurement value data D1 indicating the current value can be generated and output.

  For example, the communication unit 12 transmits and receives various data to and from an external device such as the measurement device 2 connected via the communication cable 3. The measurement value recording unit 13 is generated by the measurement value data D1 output from the measurement unit 11, the measurement value data D2 transmitted from the measurement device 2 and received by the communication unit 12 as will be described later, and the data processing unit 16. The measured value data D3 to be recorded is recorded. The operation unit 14 includes a plurality of operation switches (not shown) for setting operating conditions of the waveform display device 1 and outputs an operation signal corresponding to the switch operation to the data processing unit 16. The display unit 15 includes an operation condition setting screen for setting the operation condition of the waveform display device 1 and a display screen for various measurement results such as a signal waveform based on the measurement value data D3 generated by the data processing unit 16 (all of which are (Not shown) is displayed under the control of the data processor 16.

  The data processing unit 16 controls the waveform display device 1 as a whole. The data processing unit 16 is an example of a “processing unit”. As will be described later, the data processing unit 16 acquires measurement value data D2 generated in the measurement device 2 from the measurement device 2, and based on the measurement value data D1 and D2. A “data generation process” for generating the measurement value data D3 is executed. In addition, the data processing unit 16 causes the measurement value recording unit 13 to record the generated measurement value data D3 and causes the display unit 15 to display a measurement result (signal waveform or the like) based on the measurement value data D3.

  The various processes executed by the data processing unit 16 will be described in detail later with specific examples. In the waveform display device 1 of this example, the clock (first clock) of the measurement unit 11 is used. A clock that operates independently is connected to the data processing unit 16, and the data processing unit 16 performs various processes according to the count value of the clock. The storage unit 17 stores the calculation result of the data processing unit 16 and the like.

  On the other hand, the measurement device 2 is configured to be able to execute an arbitrary measurement process independently of the waveform display device 1 (measurement unit 11). The measuring device 2 includes a measuring unit 21 and a communication unit 22.

  The measurement unit 21 executes measurement processing for an arbitrary measured amount that is specified in advance, and the measurement value (current value, voltage value, resistance value, power value, phase, temperature, humidity, distortion, luminance (luminosity)). , Illuminance, rainfall, flow rate, and the like) are generated so as to be executable. In this case, in the measurement apparatus 2 of this example, as an example, the measurement unit 21 can measure the voltage value of the voltage applied to the measurement target and generate the measurement value data D2 indicating the voltage value as the measurement value. It is configured. The measurement unit 21 includes a clock (not shown) that is an example of a “second clock”. In addition, the measurement unit 21 performs a sampling period (voltage measurement period: “second period”) specified based on a clock count value (an example of “second count value”) in accordance with a preset measurement condition. The measurement value data D2 indicating the voltage value is generated and output in (Example 1).

  As an example, the communication unit 22 transmits and receives various data to and from the waveform display device 1 connected via the communication cable 3. In addition to the measurement unit 21 and the communication unit 22, the actual measurement device 2 can display an operation unit for setting measurement conditions, a measurement value recording unit capable of recording measurement value data D2, and a measurement result. Although it is configured to include a display unit or the like, illustration and detailed description thereof are omitted to facilitate understanding of the configuration of the waveform display device 1 (measurement system S1).

  In this case, in the measurement system S1 of this example, when the measurement unit 11 generates the measurement value data D1, the count value that can specify the time when the measurement value data D1 was generated (the generation time of the measurement value data D1 is specified). A configuration is adopted in which possible information: an example of “first count value”) is included in the measurement value data D1 and output. Therefore, in the measurement system S1 of the present example, the data processing unit 16 of the waveform display device 1 acquires the measurement value data D1 from the measurement unit 11, and thereby based on the count value included in the measurement value data D1. Thus, it is possible to specify the generation time point of the measurement value data D1 (“measure the first count value at the generation time point of the first processing target data when acquiring the first processing target data from the measurement unit. An example of a configuration capable of “acquiring from a copy”).

  Further, in the measurement system S1 of this example, when the measurement unit 21 generates the measurement value data D2, the count value that can specify the time point when the measurement value data D2 is generated (the generation time of the measurement value data D2 can be specified). A configuration is adopted in which information (example of “second count value”) is included in the measurement value data D2 and output. Therefore, in the measurement system S1 of the present example, the data processing unit 16 of the waveform display device 1 acquires the measurement value data D2 from the measurement unit 21, and thus based on the count value included in the measurement value data D2. Thus, it is possible to specify the generation point of the measurement value data D2 (“the second count value at the generation point of the second processing target data when the second processing target data is acquired from the external device is An example of a configuration capable of “acquiring from a device”.

  The measurement system S1 can be used in various applications. As an example, the current value measured by the waveform display device 1 (value of the measured value data D1) and the voltage value measured by the measurement device 2 ( Based on the measured value data D2), the waveform display device 1 generates measured value data D3 indicating an instantaneous value of power consumed in the measurement target, and a signal waveform (current value) based on the generated measured value data D3. , A signal waveform indicating a transition of voltage value and a transition of instantaneous value of electric power) is displayed on the display unit 15 of the waveform display device 1. When using the measurement system S1 for such an application, first, the measurement device 2 (communication unit 22) is connected to the communication unit 12 of the waveform display device 1 via the communication cable 3. Next, a current measurement condition by the waveform display device 1 and a voltage measurement condition by the measurement device 2 are set.

  In this case, the measurement unit 11 uses the clock count cycle used to generate the measurement value data D1, the measurement unit 21 uses the clock count cycle used to generate the measurement value data D2, and the data processing unit 16 uses it for various processes. Since the count cycle of the clock to be performed is very short, the count value of each clock changes greatly in a short time. For this reason, when an actual value is described as an example for the “count value”, “the first period specified based on the first count value of the first clock”, “the first period “First processing target data to be generated”, “second period specified based on first count value of second clock”, and “second processing target data to be generated in second period” May be difficult to understand. Therefore, hereinafter, as illustrated in FIG. 2, it is assumed that various processes are executed based on a “count value” in which the amount of change per unit time is smaller than the actual amount of change.

  In the actual waveform display device 1 and measurement device 2, the count cycle of each clock is different from each other depending on the basic oscillation frequency of each clock and the operating state of the frequency divider. In order to facilitate understanding of the operation of the measuring apparatus 2, the following description will be made assuming that each clock operates with the same count cycle as an example. Further, in the actual waveform display device 1 and the measurement device 2, the reset timing of each clock is different, so that the count value of each clock may be greatly different. However, in order to facilitate the comparison of the count values In the following description, it is assumed that the operation is performed in a state where the clocks are reset almost at the same time (a state in which the count values of the clocks change at the same level).

  In FIG. 2 referred to in the following description, the count value included in the measurement value data D1 and D2 recorded at the measurement value recording unit 13 and the data processing unit 16 generate the measurement value data D3 (signal waveform). With respect to the count values included in the measured value data D1 and D2 at the time of use for the display of the data), the time point of the clock count value of the data processing unit 16 (hereinafter also referred to as “count value of the data processing unit 16”) is used as a reference. These are shown side by side for each time point.

  Specifically, for the clock count value of the measurement unit 11 (hereinafter, also referred to as “measurement unit 11 count value”), a value outside the parentheses was recorded in the measurement value recording unit 13 at that time. The count value included in the measurement value data D1 is indicated, and the value in parentheses indicates the count value included in the measurement value data D1 used to generate the measurement value data D3 corresponding to the time point. As for the count value of the clock of the measurement unit 21 (hereinafter also referred to as “count value of the measurement unit 21”), the value outside the parentheses is measured value data recorded in the measurement value recording unit 13 at that time. The count value included in D2 is indicated, and the value in parentheses indicates the count value included in the measurement value data D3 used to generate the measurement value data D3 corresponding to the time point.

  That is, in the example of the figure, the measurement unit 11 of the waveform display device 1 executes the measurement process at “a period for every 20 counts (an example of“ first period ”)” to generate the measurement value data D1, and The measurement unit 21 of the measurement apparatus 2 is set to generate the measurement value data D2 by executing the measurement process at “a cycle of 40 counts (an example of“ second cycle ”)” (“first Example of “When the time length of the cycle and the time length of the second cycle are different”), the data processing unit 16 is set to execute the generation of the measurement value data D3 and the display of the signal waveform at “cycle every 20 counts”. It is shown that various processing has been performed in the state of being performed.

  On the other hand, when the waveform display device 1 and the measurement device 2 are operated in a state where the measurement conditions are set so as to operate under the conditions as in the example shown in FIG. 2, the count value of the data processing unit 16 is “0050”. The measurement value data D1 generated by the measurement unit 11 at time t1a (measurement value data D1 generated when the count value of the measurement unit 11 is “0040” and below, and the count value of the measurement unit 11 is “N”. The “measurement value data D1” generated at the time is also referred to as “measurement value data D1-N”), and is recorded in the measurement value recording unit 13. In this example, it is assumed that the measurement value data D1-0040 recorded in the measurement value recording unit 13 at the time t1a is the measurement value data D1 first generated by the measurement unit 11.

  At the time t1b when the count value of the data processing unit 16 is “0070”, the measurement value data D1-0060 generated by the measurement unit 11 is recorded in the measurement value recording unit 13, and the count value of the measurement unit 21 is recorded. Measured value data D2 generated at time “0080”: Hereinafter, “measured value data D2” generated when the count value of the measurement unit 21 is “M” is also referred to as “measured value data D2-M”. ) Is output to the data processing unit 16 via the communication units 22 and 12 and recorded in the measurement value recording unit 13. In this example, it is assumed that the measurement value data D2-0080 recorded in the measurement value recording unit 13 at the time t1b is the measurement value data D2 first generated by the measurement unit 21.

  In the above example, at the time t1b when the measurement value data D1-0060 from the measurement unit 11 and the measurement value data D2-0080 from the measurement unit 21 are recorded in the measurement value recording unit 13, the data processing unit 16 performs measurement values. An instantaneous value of power consumption is calculated based on the current value recorded in the data D1-0060 and the voltage value recorded in the measured value data D2-0080, and the measured value data D3 (data processing unit) indicating the calculation result Measurement value data D3 generated when the count value of 16 is “0070”: Hereinafter, “measurement value data D3” generated when the count value of the data processing unit 16 is “L” is referred to as “measurement value data D3”. -L ") and generated and recorded in the measurement value recording unit 13.

  Further, the data processing unit 16 plots one point corresponding to the time point t1b of the current waveform based on the measurement value data D1-0060 on the waveform display screen (not shown) displayed on the display unit 15, and the measurement value data D2- One point corresponding to the time point t1b of the waveform (hereinafter also referred to as “power waveform”) of the power consumption (instantaneous value) based on the measurement value data D3-0070 is plotted. Plot.

  Further, the data processing unit 16 includes the count value of the measurement unit 11 (an example of “first count value”) included in the measurement value data D1-0060 and the measurement value data D2-0080 at the time point t1b. The amount of difference from the count value of the measurement unit 21 (an example of “second count value”) is specified (an example of “difference amount specifying process”).

  Specifically, the data processing unit 16 has its own count value at the time point t1b (in this example, “0070”) and the count value of the measurement unit 11 included in the measurement value data D1-0060 (in this example). , “0060”), it is calculated that the difference between the count value of the data processing unit 16 and the count value of the measurement unit 11 is “−10”. The data processing unit 16 also counts its own count value at the time point t1b (in this example, “0070”) and the count value of the measurement unit 21 included in the measurement value data D2-0080 (in this example, “0080” )), The difference between the count value of the data processing unit 16 and the count value of the measurement unit 21 is calculated to be “10”. Further, the data processing unit 16 calculates the difference between the count value of the measurement unit 11 and the count value of the measurement unit 21 at the time point t1b based on the calculated difference amount (difference amount based on the count value of the measurement unit 11). Is calculated to be “20”, and the calculation result is stored in the storage unit 17.

  On the other hand, at the time t1c when the count value of the data processing unit 16 is “0090”, the measured value data D1-0080 generated by the measuring unit 11 is recorded in the measured value recording unit 13. At this time, since the new measurement value data D2 generated by the measurement unit 21 is not acquired, the data processing unit 16 measures the measurement value data D3 until the new measurement value data D2 is recorded in the measurement value recording unit 13. Generation and signal waveform plotting and “difference amount specifying processing” are not performed. At time t1d when the count value of the data processing unit 16 is “0110”, the measurement value data D1-0100 generated by the measurement unit 11 is recorded in the measurement value recording unit 13 and also generated by the measurement unit 21. The measured value data D2-0120 are output to the data processing unit 16 via the communication units 22 and 12, and recorded in the measured value recording unit 13.

  At this time, the data processing unit 16 corresponds to the time point t1c when the count value of the data processing unit 16 is “0090” based on the measurement value data D2-0080 and D2-0120 recorded in the measurement value recording unit 13. The measurement value data D2 (that is, the measurement value data D2-0100 corresponding to the time point when the count value of the measurement unit 21 is “0100”) is generated (complemented) and stored in the measurement value recording unit 13 (“external device” Example of “first data complementing process for complementing second processing target data corresponding to the first cycle based on the second processing target data acquired from the above”).

  In addition, the data processing unit 16 performs the current value recorded in the measurement value data D1-0080 recorded in the measurement value recording unit 13 and the voltage value of the complemented measurement value data D2-0100 at the time point t1d. Based on the above, the instantaneous value of the power consumption is calculated, and the measurement value data D3-0090 indicating the calculation result is generated and recorded in the measurement value recording unit 13. Further, the data processing unit 16 plots one point corresponding to the time point t1c of the current waveform based on the measured value data D1-0080 in the waveform display screen displayed on the display unit 15, and displays the measured value data D2-0100. One point corresponding to the time t1c of the voltage waveform based is plotted, and one point corresponding to the time t1c of the power waveform based on the measured value data D3-0090 is plotted.

  In addition, the data processing unit 16 records the current value recorded in the measurement value data D1-0100 recorded in the measurement value recording unit 13 and the measurement value data D2-0120 at the time point t1d. An instantaneous value of power consumption is calculated based on the voltage value, and measurement value data D3-0110 indicating the calculation result is generated and recorded in the measurement value recording unit 13. Further, the data processing unit 16 plots one point corresponding to the time point t1d of the current waveform based on the measured value data D1-0100 in the waveform display screen displayed on the display unit 15, and displays the measured value data D2-0120. One point corresponding to the time t1d of the voltage waveform based is plotted, and one point corresponding to the time t1d of the power waveform based on the measured value data D3-0110 is plotted.

  Further, the data processing unit 16 executes the “difference amount specifying process”, and adds the count value (“0100” in this example) of the measurement unit 11 included in the measurement value data D1-0100 to the measurement value data D2-0120. Based on the count value of the measurement unit 21 included (in this example, “0120”) and its own count value (in this example, “0110”), the count value of the measurement unit 11 and the count of the measurement unit 21 at the time point t1d. The difference amount from the value is calculated to be “0020”, and the calculation result is stored in the storage unit 17 (an example in which “difference amount specifying process” is executed every 40 counts of the count value of the data processing unit 16).

  At this time, the data processing unit 16 uses the latest calculation result (in this example, “difference amount = 20”) from the previous calculation result stored in the storage unit 17 regarding the difference amount (in this example, “difference”). It is determined that the change amount of the “difference amount” until “amount = 20”) is “0” count, and the adjustment regarding the synchronization of the measurement value data D1 and the measurement value data D2 is performed when the measurement value data D3 is generated next time. Judge as unnecessary. Thereafter, the data processing unit 16 repeatedly executes each process executed at the above-described time points t1c and t1d.

  In this case, during measurement work by this type of system (apparatus), measurement value data D1 indicating a measurement result by the measurement unit 11 is displayed as a measurement value recording unit according to the operation state of the waveform display device 1 and the operation state of the measurement device 2. 13 and the time required for the measurement value data D2 indicating the measurement result by the measurement unit 21 to be recorded in the measurement value recording unit 13, that is, the data processing unit 16 uses the measurement value data D1, The timing for acquiring D2 may change.

  Specifically, when the load applied to the measurement units 11 and 21 is large, the time required for the encoding process when generating the measurement value data D1 and D2 based on the measurement result is increased, or the measurement value recording is performed. New measurement value data D1 and D2 are recorded in the measurement value recording unit 13 by reading the measurement value data D1 to D3 from the unit 13 and writing the measurement value data D1 to D3 to the measurement value recording unit 13. It takes a long time to be performed, or new measurement value data D2 is transmitted from the measurement device 2 (measurement unit 21) to the waveform display device 1 (data processing) due to transmission / reception of other data between the communication units 22 and 12. It takes a long time to reach part 16). In addition, since the measurement units 11 and 21 each have a clock that operates independently, the measurement unit 11 delays or advances in the progress of the count value of the measurement unit 12 with respect to the progress of the count value of the measurement unit 11. The difference between the count value and the count value of the measurement unit 12 may change over time.

  For example, the time required for recording the measured value data D2 in the measured value recording unit 13 is compared with the time points t1b and t1d when the measured value data D2-0080 and D2-0120 are recorded in the measured value recording unit 13. In a state where the count value of the measurement unit 21 is longer by 10 counts, for example, the measurement value data D2 to be recorded in the measurement value recording unit 13 at the time t2c when the count value of the data processing unit 16 is “1070”. −1080 is recorded in the measured value recording unit 13 at time t2d when the count value of the data processing unit 16 is “1080”.

  At this time, the time required for recording the measurement value data D1 in the measurement value recording unit 13 is approximately the same as the time points t1b and t1d (the state in which the timing for acquiring the measurement value data D1 has not changed from the time points t1b and t1d). ), When the measurement value data D2-1080 is handled as data corresponding to the time point t2d without considering the delay of 10 counts related to the acquisition of the measurement value data D2-1080, at the time point t2c The calculation result of the corresponding power consumption (instantaneous value) becomes an incorrect value. Therefore, in the measurement system S1 (waveform display device 1) of the present example, as described above, the amount of change of the “difference amount” calculated by the “difference amount specifying process” repeatedly executed every 40 counts by the data processing unit 16. Accordingly, a process of suitably synchronizing the value (current value) of the measured value data D1 and the value (voltage value) of the measured value data D2 is executed.

  Specifically, when the time required for recording the measurement value data D2 in the measurement value recording unit 13 is delayed by 10 counts of the count value of the data processing unit 16, the count value of the data processing unit 16 is “1030”. By the “difference amount specifying process” executed corresponding to the time point t2a, the change amount of the “difference amount” (change amount based on the count value of the measurement unit 11) is calculated to be “−10” count. .

  More specifically, the data processing unit 16 has its own count value at the time point t2a (in this example, “1030”) and the count value of the measurement unit 11 included in the measurement value data D1-1020 (in this example). Then, based on “1020”), the difference between the count value of the data processing unit 16 and the count value of the measurement unit 11 is calculated to be “−10”. On the other hand, since the new measurement value data D2-1040 is not recorded in the measurement value recording unit 13 at the time point t2a, the data processing unit 16 records the measurement value data D2-1040 in the measurement value recording unit 13. At the time t2b, based on its own count value (in this example, “1040”) and the count value of the measurement unit 21 included in the measurement value data D2-1040 (in this example, “1040”), It is calculated that the difference between the count value of the data processing unit 16 and the count value of the measurement unit 21 is “0”.

  Further, the data processing unit 16 determines the difference between the count value of the measurement unit 11 calculated at the time t2a and the count value of the data processing unit 16, and the count value of the measurement unit 21 calculated at the time t2b. Based on the difference from the count value, the difference between the count value of the measurement unit 11 and the count value of the measurement unit 21 at time t2b is calculated as “10”, and the calculation result is stored in the storage unit 17. As a result, the “difference amount (“ 20 ”in the above example)” calculated by the “difference amount specifying process” executed at the time points t1b and t1d and the “difference amount (in this example,“ 20 ”) 10 ")" is specified as "-10".

  Therefore, the data processing unit 16 uses the measured value data D2-1080 recorded in the measured value recording unit 13 at the time t2d in the above example, 10 counts before its own count value according to the specified change amount. Treated as measured value data D2 at the time. As a result, the measurement value data D2-1080 recorded in the measurement value recording unit 13 at the time point t2d is used as the measurement value data D2 corresponding to the time point t2c when the count value of the data processing unit 16 is “1070”. Measurement value data D3-1070 based on the value data D1-1060 and the measurement value data D2-1080 are generated.

  In addition, although the description which illustrates a concrete count value is abbreviate | omitted, in the waveform display apparatus 1 of this example, time required to record the measured value data D2 in the measured value recording unit 13 as in the above example. When the time required for recording the measured value data D1 in the measured value recording unit 13 becomes longer as well as when the measured value data D1 becomes longer, the time required for recording the measured value data D1 in the measured value recording unit 13 becomes shorter. And when the time required for recording the measured value data D2 in the measured value recording unit 13 is shortened, the measured value data is changed according to the change of the “difference amount” repeatedly specified by the “difference amount specifying process”. The measured value data D3 is generated by synchronizing the value of D1 and the value of the measured value data D2 (“the first process target data and the second data are determined according to the difference amount specified by the difference amount specifying process executed immediately before. Processed data An example of a data generation process "for generating processed data by synchronizing).

  Specifically, when the time required for recording the measurement value data D1 in the measurement value recording unit 13 becomes long, the change amount of the “difference amount” specified by the “difference amount specifying process” executed immediately before is measured. The measured value data D1 is treated as the measured value data D1 before the amount of change from the time when the measured value data D1 is actually recorded in the measured value recording unit 13 (the time when the data processing unit 16 acquires the measured value data D1). D3 is generated. Further, when the time required for recording the measurement value data D1 and D2 in the measurement value recording unit 13 becomes short, according to the change amount of the “difference amount” specified by the “difference amount specification process” executed immediately before. Measured value data that precedes (follows) the change amount from the time when the measured value data D1 and D2 are actually recorded in the measured value recording unit 13 (the time when the data processing unit 16 acquires the measured value data D1 and D2). The measured value data D3 is generated by treating as D1 and D2.

  In the above example, the measurement value data D1 is generated with a period of time length of 20 counts in the count value of the measurement unit 11, and the measurement value data with a period of time length of 40 counts in the count value of the measurement unit 21. D2 is generated, and two measurements are actually output from the measurement device 2 as the measurement value data D2 that is insufficient to generate the measurement value data D3 in the cycle of the time length of 20 counts in the count value of the data processing unit 16 Complementary processing is performed based on the value data D2 and D2, but, for example, the measurement value data D1 is generated with a period of 40 counts in the count value of the measurement unit 11, and the count value of the measurement unit 21 20 counts in the count value of the data processing unit 16 in a state where the measurement value data D2 is generated with a period of time length of 20 counts When the measurement value data D3 is generated with a period of the time length of, a process of complementing the insufficient measurement value data D1 based on the two measurement value data D1 and D1 actually output from the measurement device 2 is performed. (Example of “second data complementing process for complementing the first processing target data corresponding to the second period based on the first processing target data acquired from the measurement unit”).

  Moreover, the generation timing of the measurement value data D1 and the measurement value regardless of whether the generation cycle of the measurement value data D1 by the measurement unit 11 and the generation cycle of the measurement value data D2 by the measurement unit 21 are different or coincide. A period that is different from both the generation period of the measurement value data D1 and the generation period of the measurement value data D2 when the measurement units 11 and 21 are operating in a state where there is a period that does not match the generation timing of the data D2. When the measurement value data D3 is generated, a process of complementing at least one of the insufficient measurement value data D1 and D2 in accordance with the other generation timing is performed.

  In this case, in order to easily understand the outline of each process by the waveform display device 1 and the measurement system S1, a simple numerical example different from the actual transition of the “count value” has been described. Since the above-described series of processing is executed based on the “count value” that greatly changes in a short time, the synchronization of the measurement value data D1 and D2 (generation of the measurement value data D3) is performed as follows.

  First, the “correction coefficient x” is calculated from the ratio between the “count value” of the data processing unit 16 at the time when the measurement value data D1 is acquired and the count value of the measurement unit 11 included in the measurement value data D1. To do. Further, the “correction coefficient y” is calculated from the ratio between the “count value” of the data processing unit 16 at the time when the measurement value data D2 is acquired and the count value of the measurement unit 21 included in the measurement value data D2. To do. The calculation of the correction coefficients x and y is repeatedly executed at a constant cycle.

  Further, when generating the measurement value data D3, the count value of the measurement unit 11 included in the measurement value data D1 is multiplied by the correction coefficient x to make the measurement value data D1 correspond (the measurement value data D1 The count value of the data processing unit 16 to be matched) is corrected to the original time point (count value), and the measured value is obtained by multiplying the count value of the measuring unit 21 included in the measured value data D2 by the correction coefficient y. The time point at which the data D2 should be associated (the count value of the data processing unit 16 to which the measured value data D2 should be associated) is corrected to the original time point (count value).

  As a result, during the generation of the measurement value data D3 based on the measurement value data D1 and D2 and the display of the signal waveform by the measurement system S1, the measurement value data D1 is recorded in the measurement value recording unit 13. (Time when the data processing unit 16 acquires the measurement value data D1) and time required for the measurement value data D2 to be recorded in the measurement value recording unit 13 (the data processing unit 16 acquires the measurement value data D2) Even if one or both of them change, the measured value data D1 and D2 are accurately synchronized according to the state of the change to generate the measured value data D3.

  Thus, in this waveform display device 1, the data processing unit 16 uses the “first count value” of the “first clock” used when the measurement unit 11 generates the measurement value data D1, and The “second count value” of the “second clock” used when the measurement apparatus 2 generates the measurement value data D2 is acquired, and the acquired “first count value” and “second count value” are acquired. The “difference amount specifying process” for specifying the difference amount of the “count value” is repeatedly executed, and in the “data generation process”, the measured value data D1 according to the difference amount specified by the “difference amount specifying process” executed immediately before. , D2 are synchronized to generate “processed data”. The measurement system S1 includes the waveform display device 1 and a measurement device 2 that is an example of an “external measurement device” as an “external device”.

  Therefore, according to the waveform display device 1 and the measurement system S1, without acquiring a synchronization signal from the measurement device 2 or supplying a clock signal of the operation clock from the waveform display device 1 to the measurement device 2, A measurement value generated in the waveform display device 1 based on a difference amount between the clock count value of the measurement unit 11 specified by the “difference amount specifying process” and the clock count value of the measurement device 2 (measurement unit 21). The value of the data D1 and the value of the measurement value data D2 generated in the measuring device 2 can be accurately synchronized. As a result, the time required for the data processing unit 16 to acquire the measurement value data D1 during the generation of the measurement value data D3 based on the measurement value data D1 and D2, and the data processing unit 16 measures the measurement value data. Even if the time required to acquire D2 changes or the progress of the count value of the clock of the measurement unit 12 with respect to the progress of the count value of the clock of the measurement unit 11 is delayed or advanced, it is accurately synchronized. Based on the measurement value data D1 and D2, accurate measurement value data D3 can be generated.

  In the waveform display device 1, the data processing unit 16 uses the measurement value data D <b> 2 acquired from the measurement device 2 when the time length of the “first cycle” is different from the time length of the “second cycle”. Based on the “first data complementing process” for complementing the measurement value data D2 corresponding to the “first period” based on the measurement value data D1 acquired from the measurement unit 11 and corresponding to the “second period”. At least one of the “second data complementing process” for complementing the measured value data D1 is executed. Therefore, according to the waveform display device 1 and the measurement system S1, the time interval is sufficiently larger than the configuration in which the measurement value data D3 is generated based only on the measurement value data D1 and D2 having the same generation timing. It is possible to provide detailed measurement data D3 in which a large number of short values are recorded.

  Further, in the waveform display device 1, the data processing unit 16 acquires the “first count value” at the time of generation of the measurement value data D 1 from the measurement unit 11 when acquiring the measurement value data D 1 from the measurement unit 11. In addition, when the measurement value data D2 is acquired from the measurement device 2, the “second count value” at the time of generation of the measurement value data D2 is acquired from the measurement device 2. Therefore, according to the waveform display device 1 and the measurement system S1, the “first count value” is acquired at a time point different from the acquisition of the measurement value data D1, or the time point different from the acquisition of the measurement value data D2. Unlike the configuration in which the “second count value” is acquired, the “first count value” acquired together with the acquired measurement value data D1 (in this example, included in the measurement value data D1). And “measured value data D1 obtained on the basis of“ second count value ”(in this example,“ count value ”included in the measured value data D2) acquired together with the measured value data D2. , D2 can be synchronized almost in real time to generate measurement value data D3.

  Note that the configurations of the “measurement device” and the “measurement system” are not limited to the configuration examples of the waveform display device 1 and the measurement system S1 described above.

  For example, an operation example in which the generation period (first period) of the measurement value data D1 by the measurement unit 11 and the generation period (second period) of the measurement value data D2 by the measurement apparatus 2 (measurement unit 21) are different is given. However, even when the operation is performed so that the “first period” and the “second period” are the same period, the same effect as in the above example can be obtained. In addition, the operation example of generating the measurement value data D3 with the same cycle as the generation cycle of the measurement value data D1 by the measurement unit 11 has been described, but the generation cycle of the “processed data” is “first cycle” and “It may be a period different from both of the second periods.

  Further, the configuration for specifying the “difference amount” based on the count value of the measurement unit 11 included in the measurement value data D1 and the count value of the measurement unit 21 included in the measurement value data D2 has been described as an example. The generation point of the measurement value data D1 can be specified. The data of the count value generated separately from the measurement value data D1 (another example of “first count value”) and the generation point of the measurement value data D2 are specified. It is also possible to adopt a configuration in which the count value data (another example of the “second count value”) generated separately from the measurement value data D2 is obtained and the “difference amount” is specified.

  In this case, the “first count value” and the “second count value” are not limited to the data automatically generated and output by the “measurement unit” or “external device”. The “first count value” of the “first clock” being used is read by the “processing section” (requesting output of data of such a count value), or used by the “external device”. The “second count value” of the “second clock” may be read by the “processing unit” (requesting data output of such a count value).

  In addition, the waveform display device 1 having the configuration in which the measurement unit 11 and the data processing unit 16 of the waveform display device 1 operate based on the count value of the clock that operates independently is described as an example. A configuration in which the “measurement unit” and the “processing unit” of the “device” operate according to a common clock count value (first count value of the first clock) may be employed.

  Further, measurement value data D2 that is an example of “second processing target data” is acquired from the measurement device 2 that is an example of an “external measurement device” as an “external device”, and a measurement value that is “processed data” The configuration for generating the data D3 has been described as an example. However, the “external device” constituting the “measurement system” is not limited to the “external measurement device”, and the “second processing” used by the “measurement device” is used. The “target data” is not limited to “measured value data”. Specifically, “imaging device” as “external device” is adopted, and “imaging data” as “second processing target data” is synchronized with “first processing target data (measurement value data)”. “Processed data” can also be generated.

S1 measurement system 1 waveform display device 2 measurement device 3 communication cable 11, 21 measurement unit 12, 22 communication unit 13 measurement value recording unit 14 operation unit 15 display unit 16 data processing unit 17 storage unit D1 to D3 measurement value data

Claims (4)

A measurement unit that generates first processing target data in a first period specified based on a first count value of a first clock;
In the external device, the second processing target data generated in the second cycle specified based on the second count value of the second clock in the external device is acquired from the external device and the second processing is performed. A processing unit that executes data generation processing for generating processed data based on the target data and the first processing target data;
The processing unit obtains the first count value and the second count value, and repeats a difference amount specifying process for specifying a difference amount between the acquired first count value and the second count value. And executing the data generation process by synchronizing the first processing target data and the second processing target data in accordance with the difference amount specified by the difference amount specifying process executed immediately before. A measuring device that generates data.   The processing unit corresponds to the first cycle based on the second processing target data acquired from the external device when the time length of the first cycle and the time length of the second cycle are different. First data complement processing for complementing the second processing target data to be performed, and the first processing target data corresponding to the second cycle based on the first processing target data acquired from the measurement unit. The measurement apparatus according to claim 1, wherein at least one of a second data complementing process for complementing is executed.   The processing unit acquires the first count value from the measurement unit at the time of generation of the first processing target data when the first processing target data is acquired from the measurement unit, and from the external device The measurement apparatus according to claim 1, wherein the second count value at the time of generation of the second processing target data is acquired from the external device when the second processing target data is acquired.   A measurement system comprising the measurement device according to claim 1 and an external measurement device as the external device.

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