JP2019105541A - 誘電体材料の定数測定装置 - Google Patents
誘電体材料の定数測定装置 Download PDFInfo
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- JP2019105541A JP2019105541A JP2017238362A JP2017238362A JP2019105541A JP 2019105541 A JP2019105541 A JP 2019105541A JP 2017238362 A JP2017238362 A JP 2017238362A JP 2017238362 A JP2017238362 A JP 2017238362A JP 2019105541 A JP2019105541 A JP 2019105541A
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- dielectric material
- constant
- circular waveguide
- network analyzer
- dielectric
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Abstract
Description
fmin≒35.1GHz〜fmax≒45.9GHz
の周波数範囲を測定可能である。
に選ばれ、次式から計算される。
(あ)矩形導波管Wb=2.845mm(WR−22)かつ隙間0.1mmの場合
(い)円形導波管φDc=5mmかつ隙間0.04mmの場合
で測定したときの比誘電率εrの誤差を、非特許文献2に示された換算式から計算すると、
(あ)の矩形導波管の場合は、εr=2.7367(測定誤差3.8%)
(い)の円形導波管の場合は、εr=2.7856(測定誤差0.5%)
となり、大幅に比誘電率測定精度が改善できることが分かる。
11 第1のポート
12 第2のポート
20、30 トランスジューサ
21、31 装置本体
22、32 ポート
23、33 張出し部
40 円形導波管
41 管本体
42 張出し部
50 ショート板
60 オフセット板
Claims (3)
- 誘電体材料の定数をネットワークアナライザで測定する誘電体材料の定数測定装置において、
前記誘電体材料で作られた円柱状の試験片が挿入されて前記ネットワークアナライザのトランスジューサの間に取り付けられる筒状の円形導波管を備える、
ことを特徴とする誘電体材料の定数測定装置。 - 前記円形導波管の内壁面と前記試験片の外壁面とは旋盤加工で切削されて作られている、
ことを特徴とする請求項1に記載の誘電体材料の定数測定装置。 - 前記ネットワークアナライザはTRL校正時に前記各トランスジューサに接続可能な円板状のショート板とオフセット板とを用いる、
ことを特徴とする請求項1または2に記載の誘電体材料の定数測定装置。
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7370060B2 (ja) | 2020-03-25 | 2023-10-27 | 国立研究開発法人産業技術総合研究所 | 誘電体材料の評価方法、評価装置及び評価システム |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4996489A (en) * | 1989-03-31 | 1991-02-26 | Halliburton Logging Services, Inc. | Laboratory technique for measuring complex dielectric constant of rock core samples |
JPH11118733A (ja) * | 1997-10-17 | 1999-04-30 | Toshiba Corp | 電波濃度計 |
JP2007127606A (ja) * | 2005-11-07 | 2007-05-24 | National Institute Of Information & Communication Technology | 複素誘電率測定装置及び方法 |
JP2009055237A (ja) * | 2007-08-24 | 2009-03-12 | National Institutes Of Natural Sciences | コルゲートホーンの製造方法 |
WO2016163932A1 (en) * | 2015-04-08 | 2016-10-13 | Gapwaves Ab | A calibration arrangement and a method for a microwave analyzing or measuring instrument |
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2017
- 2017-12-13 JP JP2017238362A patent/JP2019105541A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4996489A (en) * | 1989-03-31 | 1991-02-26 | Halliburton Logging Services, Inc. | Laboratory technique for measuring complex dielectric constant of rock core samples |
JPH11118733A (ja) * | 1997-10-17 | 1999-04-30 | Toshiba Corp | 電波濃度計 |
JP2007127606A (ja) * | 2005-11-07 | 2007-05-24 | National Institute Of Information & Communication Technology | 複素誘電率測定装置及び方法 |
JP2009055237A (ja) * | 2007-08-24 | 2009-03-12 | National Institutes Of Natural Sciences | コルゲートホーンの製造方法 |
WO2016163932A1 (en) * | 2015-04-08 | 2016-10-13 | Gapwaves Ab | A calibration arrangement and a method for a microwave analyzing or measuring instrument |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7370060B2 (ja) | 2020-03-25 | 2023-10-27 | 国立研究開発法人産業技術総合研究所 | 誘電体材料の評価方法、評価装置及び評価システム |
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