JP2019045446A5 - - Google Patents

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Publication number
JP2019045446A5
JP2019045446A5 JP2017171940A JP2017171940A JP2019045446A5 JP 2019045446 A5 JP2019045446 A5 JP 2019045446A5 JP 2017171940 A JP2017171940 A JP 2017171940A JP 2017171940 A JP2017171940 A JP 2017171940A JP 2019045446 A5 JP2019045446 A5 JP 2019045446A5
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JP
Japan
Prior art keywords
recommended replacement
time
less
amount
reagents
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JP2017171940A
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Japanese (ja)
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JP2019045446A (en
JP6879871B2 (en
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Priority to JP2017171940A priority Critical patent/JP6879871B2/en
Priority claimed from JP2017171940A external-priority patent/JP6879871B2/en
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Publication of JP2019045446A5 publication Critical patent/JP2019045446A5/ja
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Claims (2)

請求項１において、
前記複数の試薬または消耗品のそれぞれについて交換推奨残量が設定されており、
前記予測演算部は、予測した前記当日の稼働状況に基づき検体分析が実施されていない空き時間のうち、前記複数の試薬または消耗品のいずれかが前記交換推奨残量以下となった空き時間を前記交換推奨時間帯として設定する自動分析装置。
In claim 1,
A recommended replacement remaining amount is set for each of the plurality of reagents or consumables,
The prediction computation unit, among the idle time predicted sample analysis based on the operational status of the day has not been performed, the idle time of one of said plurality of reagents or consumables becomes less than the Recommended Replacement remaining An automatic analyzer set as the recommended replacement time zone.
請求項３において、
前記予測演算部は、前記複数の試薬または消耗品のいずれかが不足する前に前記交換推奨残量以下となる空き時間が求められない場合、複数の選択肢を提示し、
前記複数の選択肢として、前記交換推奨残量以下となっていない空き時間を選択する、再通知する、所定の時間よりも短いが前記交換推奨残量以下となる空き時間を探索する、または残量優先の少なくともいずれかを含む自動分析装置。
In claim 3,
The prediction computation unit, when the Recommended Replacement remaining below the free time made before any of the plurality of reagent or consumable is insufficient is not required, presenting a plurality of options,
As the plurality of options, select an empty time that is not less than the recommended replacement amount, notify again, search for an available time shorter than a predetermined time but equal to or less than the recommended replacement amount, or An automatic analyzer that includes at least one of the priorities.
JP2017171940A 2017-09-07 2017-09-07 Automatic analyzer Active JP6879871B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2017171940A JP6879871B2 (en) 2017-09-07 2017-09-07 Automatic analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017171940A JP6879871B2 (en) 2017-09-07 2017-09-07 Automatic analyzer

Publications (3)

Publication Number Publication Date
JP2019045446A JP2019045446A (en) 2019-03-22
JP2019045446A5 true JP2019045446A5 (en) 2020-01-30
JP6879871B2 JP6879871B2 (en) 2021-06-02

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JP2017171940A Active JP6879871B2 (en) 2017-09-07 2017-09-07 Automatic analyzer

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JP (1) JP6879871B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021014697A1 (en) * 2019-07-23 2021-01-28 富士フイルム株式会社 Specimen inspection device, operation method of specimen inspection apparatus, and operation program of specimen inspection apparatus
JP7306948B2 (en) * 2019-10-09 2023-07-11 株式会社日立ハイテク automatic analyzer
CN115088000A (en) * 2020-03-05 2022-09-20 株式会社日立高新技术 Management apparatus and request method
WO2023013250A1 (en) 2021-08-04 2023-02-09 株式会社日立ハイテク Function recommendation system and function recommendation method
WO2023013311A1 (en) * 2021-08-05 2023-02-09 株式会社日立ハイテク Task assistance system and program

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3610345B2 (en) * 2002-04-24 2005-01-12 オリンパス株式会社 Analysis equipment
JP2008180640A (en) * 2007-01-25 2008-08-07 Olympus Corp Automatic analyzer, and order management system and method
JP4934449B2 (en) * 2007-02-02 2012-05-16 ベックマン コールター， インコーポレイテッド Analysis equipment
JP2008209329A (en) * 2007-02-28 2008-09-11 Hitachi High-Technologies Corp Automatic analyzer
JP5203141B2 (en) * 2008-10-31 2013-06-05 シスメックス株式会社 Sample analyzer, method for displaying reagent information in sample analyzer, and computer program
JP5286134B2 (en) * 2009-03-31 2013-09-11 株式会社日立ハイテクノロジーズ Specimen test system and operation method of apparatus management server
JP5097804B2 (en) * 2010-07-09 2012-12-12 株式会社日立ハイテクノロジーズ Automatic analyzer
JP5806902B2 (en) * 2011-04-28 2015-11-10 シスメックス株式会社 Sample analyzer and computer program
JP5930027B2 (en) * 2012-05-11 2016-06-08 株式会社島津製作所 Reagent preparation support apparatus, program for realizing the same, and computer-readable recording medium storing the program

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