JP2018500544A - 顕微鏡用の検出装置 - Google Patents
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Abstract
Description
Claims (14)
- 顕微鏡(100)用の検出装置(113)であって、
前記検出装置は、前記顕微鏡(100)の標本領域(112)からの光のスペクトル部分(401)を選択的に検出するように構成され、
前記検出装置(113)は、
前記光のビーム経路(290)内に配置された分散要素(211)と、
前記光の前記ビーム経路(290)から前記光の前記スペクトル部分(401)のビーム経路(291)を分離するように、前記光の前記ビーム経路(290)内の前記分散要素(211)の下流に配置された選択要素(212)と、
前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記選択要素(212)の下流に配置され、前記光の前記スペクトル部分(401)の前記ビーム経路(291)を、センサ(214)上に集束するように構成された集束光学ユニット(213)と、
前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記集束光学ユニット(213)の下流に配置された前記センサ(214)とを含む、
検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内に配置された横方向色収差補正要素(311)を含み、
前記選択要素(212)は、少なくとも1つのくさび形プリズム(212−1,212−2)を含み、
前記横方向色収差補正要素(311)は、少なくとも1つのくさび形プリズム(311−1,311−2)を含み、
前記選択要素(212)及び前記横方向色収差補正要素(311)は、前記選択要素(212)の前記少なくとも1つのくさび形プリズム(212−1,212−2)の横方向色収差が、前記横方向色収差補正要素(311)の前記少なくとも1つのくさび形プリズム(311−1,311−2)のさらなる横方向色収差を打ち消すように、互いに対して配置され得る、
請求項1に記載の検出装置(113)。 - 前記選択要素(212)の前記少なくとも1つのくさび形プリズム(212−1,212−2)及び前記横方向色収差補正要素(311)の前記少なくとも1つのくさび形プリズム(311−1,311−2)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)に関して、互いに相補的に配置される、
請求項2に記載の検出装置(113)。 - 前記選択要素(212)の前記少なくとも1つのプリズム(212−1,212−2)の材料は、前記横方向色収差補正要素(311)の前記少なくとも1つのプリズム(311−1,311−2)の材料に対応し、
前記選択要素(212)の前記少なくとも1つのプリズム(212−1,212−2)のくさび角は、前記横方向色収差補正要素(311)の前記少なくとも1つのプリズム(311−1,311−2)のくさび角に対応する、
請求項3に記載の検出装置(113)。 - 前記検出装置(113)は、前記光の前記ビーム経路(290)内に変位可能に配置された前記選択要素(212)の位置を決めるように構成され、かつ、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内に変位可能に配置された前記横方向色収差補正要素(311)の位置を決めるようにさらに構成された駆動ユニットをさらに含み、
前記駆動ユニットは、前記選択要素(212)及び前記横方向色収差補正要素(311)を、結合された態様で位置決めするように構成される、
請求項2乃至4のいずれか一項に記載の検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)内の前記センサ(214)の上流に配置された収集要素(312)を含み、
前記分散要素(211)は、プリズム及び格子の少なくとも一方であり、
前記収集要素(312)は、プリズム及び格子の少なくとも一方であり、
前記分散要素(211)は、前記光の前記ビーム経路(290)のスペクトル分解をもたらし、
前記収集要素(312)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)のスペクトル統一をもたらす、
請求項1乃至5のいずれか一項に記載の検出装置(113)。 - 前記検出装置(113)は、少なくとも部分的に、前記光の前記ビーム経路(290)内及び前記光の前記スペクトル部分(401)の前記ビーム経路(291)内における前記分散要素(211)と前記収集要素(312)との間に配置された結像光学系(703,704,901,902)をさらに含み、
前記結像光学系(703,704,901,902)は、前記収集要素(312)上に前記分散要素(211)の光画像を得るように構成される、
請求項6に記載の検出装置(113)。 - 前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)の非点収差を低減するように構成された非点収差補正ユニットを含む、
請求項1乃至7のいずれか一項に記載の検出装置(113)。 - 前記選択要素(212)は、前記光の前記ビーム経路(290)から前記光のさらなるスペクトル部分(402)のビーム経路(292)を分離するように、前記光のビーム経路(290)内に配置され、
前記検出装置(113)は、
前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)内の前記選択要素(212)の下流に配置され、前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)をさらなるセンサ上に集束させるように構成された、さらなる集束光学ユニットと、
前記光の前記さらなるスペクトル部分(402)の前記ビーム経路(292)内の前記さらなる集光光学ユニットの下流に配置された、前記さらなるセンサとを含む、
請求項1乃至8のいずれか一項に記載の検出装置(113)。 - 前記センサ(214)は、0.1mm2より小さく、好ましくは1mm2より小さく、特に好ましくは100mm2より小さい感知領域を有し、
前記集束光学ユニット(213)は、前記光の前記スペクトル部分(401)の前記ビーム経路(291)を前記センサ(214)の前記感知領域上に集束させるように構成される、
請求項1乃至9のいずれか一項に記載の検出装置(113)。 - 前記センサ(214)は、複数の画素を含む、
請求項1乃至10のいずれか一項に記載の検出装置(113)。 - 前記選択要素(212)は、少なくとも1つの傾斜ミラーを含む、
請求項1乃至11のいずれか一項に記載の検出装置(113)。 - 請求項1乃至12のいずれか一項に記載の検出装置(113)を含む顕微鏡(100)。
- 前記顕微鏡(100)は共焦点顕微鏡である、
請求項13に記載の顕微鏡(100)。
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PCT/EP2015/075811 WO2016078925A1 (de) | 2014-11-17 | 2015-11-05 | Detektorvorrichtung zur detektion eines spektralen teilbereichs für ein mikroskop |
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DE102014116782A1 (de) * | 2014-11-17 | 2016-05-19 | Carl Zeiss Microscopy Gmbh | Detektorvorrichtung für ein Mikroskop |
DE102015109674A1 (de) * | 2015-06-17 | 2016-12-22 | Carl Zeiss Microscopy Gmbh | Verfahren zur Bestimmung und Kompensation geometrischer Abbildungsfehler |
JP7184752B2 (ja) | 2016-08-02 | 2022-12-06 | ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 顕微鏡特に光シート顕微鏡または共焦点顕微鏡および顕微鏡用レトロフィットキット |
DE102016119730A1 (de) * | 2016-10-17 | 2018-04-19 | Carl Zeiss Microscopy Gmbh | Optikgruppe für Detektionslicht für ein Mikroskop, Verfahren zur Mikroskopie und Mikroskop |
DE102016120308A1 (de) | 2016-10-25 | 2018-04-26 | Carl Zeiss Microscopy Gmbh | Optische Anordnung, Multispot-Scanning-Mikroskop und Verfahren zum Betreiben eines Mikroskops |
US11506877B2 (en) | 2016-11-10 | 2022-11-22 | The Trustees Of Columbia University In The City Of New York | Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees |
US10277842B1 (en) * | 2016-11-29 | 2019-04-30 | X Development Llc | Dynamic range for depth sensing |
CN106969710B (zh) * | 2017-05-26 | 2023-05-19 | 四川瑞丰锻造有限公司 | 便于检测的稳定型分光器 |
US10571687B2 (en) * | 2018-02-05 | 2020-02-25 | Goodrich Corporation | Imaging systems and methods |
DE102020120114A1 (de) | 2020-07-30 | 2022-02-03 | Abberior Instruments Gmbh | Detektionseinrichtung für ein Laserscanning-Mikroskop |
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US10371574B2 (en) | 2019-08-06 |
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JP2019144570A (ja) | 2019-08-29 |
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