把持部１５、１６における溝部１５ａ、１６ａの形状は様々に変形可能である。以下、図５〜図９により、探針用ピンセットの変形例について説明する。
図５は本発明の他の実施例による探針用ピンセット１０Ｂの外観斜視図、図６（ａ）はこの探針用ピンセット１０Ｂにおける把持部の外観平面図、図６（ｂ）は探針の基部を把持した状態の把持部の外観図、図６（ｃ）は把持部の対向面の平面図である。
The shapes of the groove portions 15a and 16a in the grip portions 15 and 16 can be variously deformed. Hereinafter, modified examples of the probe tweezers will be described with reference to FIGS.
Figure 5 is an external perspective view of the needle tweezers 10B probe according to another embodiment of the present invention, FIG. 6 (a) outer Mitaira view of the grip portion in the tip tweezers 10B, FIG. 6 (b) probe FIG. 6C is an external view of the gripping portion in a state where the base portion of the needle is gripped, and FIG. 6C is a plan view of the facing surface of the gripping portion.
この例では、一対のアーム１１、１２の先端に設けられている把持部２５、２６に形成されている溝部の形状は図３に示した例と同じであるが、各面それぞれ、二つの溝部２５ａ、２５ｂ、又は２６ａ、２６ｂがアーム１１、１２の延伸方向に並べて配置されている。この構成では、図６（ｂ）中に点線（符号１０６ｂ’）で示すように、先端側の溝部２５ｂ、２６ｂにより探針１０６の基部１０６ｂを挟持することもできるし、図６（ｂ）中に実線（符号１０６ｂ）で示すように、手元側の溝部２５ａ、２６ａにより探針１０６の基部１０６ｂを挟持することもできる。即ち、並設された二つ溝部２５ａ、２５ｂ、又は２６ａ、２６ｂのいずれでも探針１０６の基部１０６ｂを把持することができるため、基部１０６ｂを把持しようとする際の該基部１０６ｂと溝部２５ａ、２５ｂ、又は２６ａ、２６ｂとの位置合わせが容易になり、作業者が探針１０６の基部１０６ｂを掴めないという状況を減らすことができる。
In this example, the shape of the groove formed in the gripping portions 25 and 26 provided at the tips of the pair of arms 11 and 12 is the same as the example shown in FIG. 3, but each surface has two groove portions. 25a, 25b or 26a, 26b are arranged side by side in the extending direction of the arms 11, 12. In this configuration, as indicated by a dotted line (reference numeral 106 b ′) in FIG. 6B, the base portion 106 b of the probe 106 can be held by the grooves 25 b and 26 b on the distal end side, or FIG. As indicated by the solid line (reference numeral 106 b ), the base portion 106 b of the probe 106 can be held between the groove portions 25 a and 26 a on the proximal side. That is, since the base 106b of the probe 106 can be gripped by any of the two grooves 25a, 25b or 26a, 26b arranged side by side, the base 106b and the groove 25a, Alignment with 25b or 26a, 26b is facilitated, and the situation where the operator cannot grasp the base portion 106b of the probe 106 can be reduced.
図８（ａ）は本発明のさらに他の実施例による探針用ピンセット１０Ｄにおける把持部４５、４６の外観平面図、図８（ｂ）は探針１０６の基部１０６ｂを把持した状態の把持部４５、４６の外観平面図である。
この例では、図７の例と同様に溝部４５ａ、４６ａは断面矩形状であるが、ここではその溝幅は探針１０６の基部１０６ｂの外径Ｄよりも十分に大きい。そのため、把持部４５、４６の間に探針１０６が挟持されるとき、図８（ｂ）に示すように、探針１０６の基部１０６ｂは各溝部４５ａ、４６ａに嵌る。また、各溝部４５ａ、４６ａの内壁面の上縁部と溝底面との２箇所で、その内壁面と探針１０６の基部１０６ｂの周面とが接触する。これによって、上記実施例の装置と同様に、探針１０６の基部１０６ｂは確実に把持される。
FIG. 8A is an external plan view of the grip portions 45 and 46 in the probe tweezers 10D according to still another embodiment of the present invention, and FIG. It is an external appearance top view of 45 and 46. FIG.
In this example, the groove portions 45a and 46a are rectangular in cross section as in the example of FIG. 7 , but here the groove width is sufficiently larger than the outer diameter D of the base portion 106b of the probe 106. Therefore, when the probe 106 is held between the gripping portions 45 and 46, as shown in FIG. 8B, the base portion 106b of the probe 106 fits into the groove portions 45a and 46a. In addition, the inner wall surface and the peripheral surface of the base portion 106b of the probe 106 are in contact with each other at two locations of the upper edge portion of the inner wall surface of each groove portion 45a, 46a and the groove bottom surface. As a result, the base 106b of the probe 106 is securely gripped in the same manner as in the apparatus of the above embodiment.
図９（ａ）は本発明のさらに他の実施例による探針用ピンセット１０Ｅにおける把持部５５、５６の外観平面図、図９（ｂ）は探針１０６の基部１０６ｂを把持した状態の把持部５５、５６の外観平面図である。
この例では、溝部５５ａ、５６ａは断面部分楕円形状であるが、その溝幅は探針１０６の基部１０６ｂの外径Ｄよりも大きい。そのため、把持部５５、５６の間に探針１０６が挟持されるとき、図９（ｂ）に示すように、探針１０６の基部１０６ｂは各溝部５５ａ、５６ａに嵌る。また、各溝部５５ａ、５６ａの内壁面と探針１０６の基部１０６ｂの外周面とは断面内においてその周方向に所定長さの線状に接触する。即ち、溝部５５ａ、５６ａの内壁面と探針１０６の基部１０６ｂの周面とは或る程度の面積を有する面で接触する。これによって、上記実施例の装置と同様に、探針１０６の基部１０６ｂは確実に把持され、探針１０６は脱落しにくくなる。
FIG. 9A is an external plan view of the gripping portions 55 and 56 in the probe tweezers 10E according to still another embodiment of the present invention, and FIG. It is an external appearance top view of 55,56.
In this example, the groove portions 55 a and 56 a have an oval cross-sectional shape, but the groove width is larger than the outer diameter D of the base portion 106 b of the probe 106. Therefore, when the probe 106 is sandwiched between the gripping portions 55 and 56 , as shown in FIG. 9B, the base portion 106b of the probe 106 fits into the groove portions 55a and 56a. Further, the inner wall surface of each of the grooves 55a and 56a and the outer peripheral surface of the base portion 106b of the probe 106 are in contact with each other in a linear shape having a predetermined length in the circumferential direction in the cross section. That is, the inner wall surfaces of the grooves 55a and 56a and the peripheral surface of the base portion 106b of the probe 106 are in contact with each other on a surface having a certain area. As a result, similar to the apparatus of the above-described embodiment, the base portion 106b of the probe 106 is securely gripped, and the probe 106 is difficult to drop off.