JP2018169380A - Inspection device, inspection method, and manufacturing method of film wound body - Google Patents

Abstract

To suppress decline of inspection accuracy caused by thickness of an inspection object.SOLUTION: A defect inspection device (1) includes a radiation source (2) for emitting an electromagnetic wave (R) radially to a separator wound body (10), a TDI sensor (4) for detecting the electromagnetic wave (R) transmitted through the separator wound body (10), and a movement mechanism (3) for moving an inspection region in the separator wound body (10), while keeping each distance from the radiation source (2) to the separator wound body (10) and the TDI sensor (4) in an approximately fixed state.SELECTED DRAWING: Figure 3

Description

  The present invention relates to an inspection apparatus, an inspection method, and a film winding body manufacturing method.

  Inside the lithium ion secondary battery, the positive electrode and the negative electrode are separated by a porous separator. When manufacturing a separator, defects such as adhesion of foreign matter may occur, so it is necessary to inspect the separator for defects. In particular, when the defect is a conductive foreign material such as a metal, there is a risk of causing a short circuit inside the lithium ion secondary battery.

  For example, Patent Document 1 discloses an X-ray foreign object detection device that detects a foreign object by irradiating an inspection object to be conveyed with X-rays.

JP 2004-61479 A (published February 26, 2004)

  Here, according to the size of the lithium ion secondary battery to be used, the separator winding body is formed by slitting (cutting) the separator into a plurality of pieces from one original fabric and winding them around the core. Manufactured.

  When this separator is slit from the raw fabric, metal foreign objects are likely to adhere from the metal blade, and therefore it is preferable to inspect the slit separator for defects. In addition, since the metal foreign matter is also generated from the sliding portion of the transport roll or the like, it is preferable that the defect inspection is performed on the separator wound body after the separator is wound around the core that does not come into contact with the roll.

  However, in the X-ray foreign object detection device described in Patent Document 1, in the case of an inspection object having a relatively large thickness such as a separator wound body, the inspection positions on the front surface and the back surface facing each other in the thickness direction are shifted. Accuracy may be reduced.

  One aspect of the present invention has been made in view of the above-described problems, and an object thereof is to realize an inspection apparatus or the like that can suppress a decrease in inspection accuracy due to the thickness of an inspection object. is there.

  In order to solve the above-described problem, an inspection apparatus according to an aspect of the present invention is directed to an inspection object, a radiation source that emits electromagnetic waves radially from the thickness direction of the inspection object, and the inspection object The TDI sensor that is installed on the opposite side of the radiation source and detects the electromagnetic wave that has passed through the inspection object, and the distance between the radiation source, the inspection object, and the TDI sensor are kept substantially constant, A moving mechanism for moving the inspection area of the inspection object.

  In the above configuration, the electromagnetic wave transmitted through the inspection object while moving the inspection area of the inspection object while keeping the distance between the radiation source and the inspection object and the distance between the radiation source and the TDI sensor substantially constant. Is detected by the TDI sensor, it is possible to improve the error of the detection position of the TDI sensor due to the thickness of the inspection object. Therefore, according to said structure, the test | inspection apparatus which can suppress the fall of the test | inspection precision resulting from the thickness of a test target object is realizable.

  In the inspection apparatus according to one aspect of the present invention, the moving mechanism may move the inspection object along a circular trajectory that is substantially centered on the radiation source.

  In the above configuration, by moving the inspection object along a circular orbit centered about the radiation source, the inspection object is inspected while keeping the distance between the radiation source, the inspection object, and the TDI sensor substantially constant. Move the area. For this reason, since the irradiation angle of the electromagnetic wave to the inspection object is substantially equalized, the detection position error of the TDI sensor due to the thickness of the inspection object is detected by detecting the electromagnetic wave transmitted through the inspection object by the TDI sensor. Can be improved.

  In the inspection apparatus according to one aspect of the present invention, the moving mechanism may reciprocate the inspection object a plurality of times between a first point and a second point located on the circular orbit. .

  In the above configuration, since the inspection object is reciprocated multiple times, the electromagnetic wave transmitted through the inspection object can be detected multiple times by the TDI sensor. Therefore, according to said structure, the tact time required for a test | inspection can be shortened. In addition, for example, when a part of the inspection object is detected by the TDI sensor a plurality of times, the tact time required for the inspection of the entire inspection object can be shortened.

  In the inspection apparatus according to one aspect of the present invention, the TDI sensor detects the electromagnetic wave transmitted through the inspection object while the inspection object moves from the first point toward the second point. May be.

  In the above configuration, the TDI sensor detects the electromagnetic wave transmitted through the inspection object while the inspection object moves from the first point toward the second point. Therefore, according to said structure, the electromagnetic wave which permeate | transmitted the test object which moves to one direction can be detected suitably with a TDI sensor.

  Moreover, in the inspection apparatus according to one aspect of the present invention, the moving mechanism is configured such that the inspection object is substantially centered on an axis extending in the thickness direction while the inspection object moves from the second point to the first point. An object may be rotated.

  In the above configuration, the inspection object is rotated while the inspection object moves from the second point to the first point. Therefore, according to the above configuration, every time the inspection object reciprocates, an electromagnetic wave transmitted through a different region of the inspection object can be detected by the TDI sensor. Further, since the inspection object is rotated while the inspection object moves from the second point to the first point, the tact time required for the inspection can be shortened.

  In the inspection apparatus according to the aspect of the present invention, the TDI sensor may be configured to move the inspection object from the first point toward the second point and from the second point to the first point. The electromagnetic wave transmitted through the inspection object may be detected while the inspection object moves toward the object.

  In the above configuration, the inspection object is both during the movement of the inspection object from the first point to the second point on the circular orbit and during the movement of the inspection object from the second point to the first point. The TDI sensor detects the electromagnetic wave that has passed through the object. Therefore, according to said structure, the electromagnetic waves which permeate | transmitted the test object which moves to both directions can be efficiently detected with a TDI sensor.

  In the inspection apparatus according to the aspect of the present invention, the moving mechanism may be configured such that the inspection object reaches the second point from the first point and the inspection object moves from the second point to the second point. The inspection object may be rotated about an axis extending in the thickness direction when reaching one point.

  In the above configuration, the inspection object is rotated both when the inspection object reaches the second point from the first point and when the inspection object reaches the first point from the second point. Therefore, according to the above configuration, every time the inspection object makes one round trip, the electromagnetic wave transmitted through two different regions of the inspection object can be detected by the TDI sensor, which is necessary for the inspection of the entire inspection object. Tact time can be shortened.

  In the inspection apparatus according to one aspect of the present invention, the inspection object may have a substantially circular outer shape when viewed from the thickness direction.

  The inspection apparatus according to one aspect of the present invention can be suitably used for an inspection object whose outer shape when viewed in the thickness direction is substantially circular.

  Moreover, in the inspection apparatus which concerns on 1 aspect of this invention, the said test target object may be a film winding body provided with the cylindrical core and the film wound around the outer peripheral surface of the said core.

  The inspection apparatus according to one aspect of the present invention is particularly suitable for an inspection object having a relatively large thickness, such as a film winding body including a cylindrical core and a film wound around the outer peripheral surface of the core. It can be preferably used.

  In the inspection apparatus according to one aspect of the present invention, the electromagnetic wave may be an X-ray.

  According to said structure, the test | inspection which used the X-ray with respect to the test object can be performed. Further, it is possible to realize an inspection apparatus that is easy to handle without increasing the cost.

  In order to solve the above-described problem, an inspection method according to an aspect of the present invention includes an emission step of emitting an electromagnetic wave radially from a radiation source from the thickness direction of the inspection object, and the inspection object. A moving step of moving an inspection region in the object, and a detecting step of detecting the electromagnetic wave transmitted through the inspection object by a TDI sensor, and in the moving step, the radiation source, the inspection object, and the TDI sensor The inspection area is moved while maintaining a substantially constant distance.

  In the above method, the electromagnetic wave transmitted through the inspection object while moving the inspection area of the inspection object while keeping the distance between the radiation source and the inspection object and the distance between the radiation source and the TDI sensor substantially constant. Is detected by the TDI sensor, it is possible to improve the error of the detection position of the TDI sensor due to the thickness of the inspection object. Therefore, according to said method, the test | inspection method which can suppress the fall of the test | inspection precision resulting from the thickness of a test target object is realizable.

In order to solve the above problems, a film winding body manufacturing method according to one aspect of the present invention includes a cylindrical core and a film wound around the outer peripheral surface of the core by the inspection method according to the present invention. A film winding method including a defect inspection step for inspecting defects of the film with respect to a film winding body comprising: According to the above method, a film winding body with less defects such as contamination of foreign matters is manufactured in the film. be able to.

  Moreover, in the manufacturing method of the film winding body which concerns on 1 aspect of this invention, the slit process which slits the said film from the raw material wider than the said film, The said film slit by the said slit process, A film winding step of obtaining the film winding body by winding on a core, and a packaging step of packaging the film winding body manufactured in the film winding step, wherein the defect inspection step is , May be provided after the slitting process and before the packaging process.

  According to said method, the foreign material which generate | occur | produced at the slit process in which a foreign material tends to generate | occur | produce can be efficiently test | inspected by a defect inspection process. Furthermore, it is possible to save the trouble of inspecting the foreign matter adhering to the film in the post-process after packaging the film winding body.

  Moreover, in the manufacturing method of the film winding body which concerns on 1 aspect of this invention, you may test | inspect the presence or absence of a foreign material of 100 micrometers or more in the said defect inspection process.

  According to said method, the film winding body which has few foreign materials of 100 micrometers or more or does not contain a foreign material of 100 micrometers or more can be manufactured.

  In addition, in order to solve said subject, the film winding body which concerns on 1 aspect of this invention may be manufactured by the manufacturing method of the film winding body which concerns on this invention. Thereby, the separator winding body with few defects, such as mixing of a foreign material, can be obtained.

  Moreover, the film winding body according to one embodiment of the present invention is a separator winding body in which a separator used in a battery is wound around a cylindrical core, and the separator wound around the core is It is characterized in that no foreign matter of 100 μm or more is contained. Thereby, the separator winding body with low possibility that a defect generate | occur | produces with the foreign material adhering to a separator can be obtained.

  According to one aspect of the present invention, it is possible to suppress a decrease in inspection accuracy due to the thickness of an inspection object.

(A) And (b) is a schematic diagram which shows schematic structure of the slit apparatus which concerns on Embodiment 1. FIG. (A)-(e) is a schematic diagram for demonstrating schematic structure of the separator winding body which concerns on Embodiment 1. FIG. (A)-(c) is a schematic diagram which shows schematic structure of the defect inspection apparatus which concerns on Embodiment 1. FIG. (A) And (b) is a schematic diagram for demonstrating an example of the defect inspection method performed with the defect inspection apparatus shown by FIG. It is a front view which shows schematic structure of the modification of the defect inspection apparatus shown by FIG. It is a schematic diagram which shows schematic structure of the modification of the moving mechanism shown by FIG. It is a schematic diagram which shows schematic structure of the other modification of the moving mechanism shown by FIG. It is a schematic diagram which shows schematic structure of the defect inspection apparatus which concerns on Embodiment 2. FIG. (A) is a top view which shows the said defect inspection apparatus, (b) is a side view which shows the operation state of the said defect inspection apparatus. (A)-(c) is a schematic diagram for demonstrating the attitude | position change mechanism with which the said defect inspection apparatus is provided. (A) And (b) is a side view which shows the modification of the base with which the said defect inspection apparatus is provided. (A)-(h) is a schematic diagram of schematic structure and operation state of the defect inspection apparatus which concerns on Embodiment 3. FIG. It is a schematic diagram of the modification of the defect inspection apparatus shown by FIG.

Embodiment 1
An embodiment of the present invention will be described below with reference to FIGS. In the present embodiment, an example in which the inspection apparatus according to the present invention is applied to a defect inspection apparatus for inspecting whether or not a foreign substance is mixed in a separator winding body will be described. However, the inspection apparatus according to the present invention is not limited to the separator wound body, and can be suitably applied to various inspection objects having a relatively large thickness.

[Manufacturing process of separator roll]
First, the manufacturing process of the separator winding body (film winding body) which is an inspection object of the defect inspection apparatus (inspection apparatus) according to the present embodiment will be described.

  FIGS. 1A and 1B are schematic views showing a schematic configuration of a slit device 6 that slits a separator. Specifically, FIG. 1A shows a schematic configuration of the entire slit device 6, and FIG. 1B shows a schematic configuration before and after slitting the original fabric.

  The separator 12 is a porous film or a non-woven fabric that separates a cathode and an anode of a lithium ion secondary battery (battery) or the like and allows lithium ions to move between them. The separator 12 includes, for example, polyolefin such as polyethylene and polypropylene as its material.

  The separator 12 may have heat resistance by including a porous film and a heat-resistant layer provided on the surface of the porous film. The heat-resistant layer contains, for example, wholly aromatic polyamide (aramid resin) as the material.

  That is, the separator 12 may be a laminated porous film including a porous film containing polyolefin and a functional layer such as a heat-resistant layer or an adhesive layer. The functional layer includes a resin. Examples of the resin include polyolefins such as polyethylene and polypropylene; fluorine-containing polymers such as polyvinylidene fluoride (PVDF), polytetrafluoroethylene, and a copolymer of vinylidene fluoride-hexafluoropropylene; aromatic polyamide; styrene-butadiene copolymer Polymers and their hydrides, methacrylic acid ester copolymers, acrylonitrile-acrylic acid ester copolymers, rubbers such as styrene-acrylic acid ester copolymers; polymers having a melting point or glass transition temperature of 180 ° C. or higher; polyvinyl And water-soluble polymers such as alcohol, polyethylene glycol, cellulose ether, sodium alginate, polyacrylic acid, polyacrylamide, and polymethacrylic acid. The functional layer may include a filler made of an organic material or an inorganic material. Examples of the inorganic filler include inorganic oxides such as silica, magnesium oxide, alumina, aluminum hydroxide, and boehmite. The alumina has crystal forms such as α, β, γ, and θ, and any of them can be used. As for said resin and filler, only 1 type may be used and 2 or more types may be combined. When the said functional layer contains a filler, content of a filler can be 1 volume% or more and 99 volume% or less of a functional layer.

  Further, the separator 12 should have less moisture contained in the separator 12 in order to reduce the influence on the defect inspection described later. In the defect inspection in the defect inspection process described later, the presence or absence of foreign matter mixed in the separator 12 wound around the core is inspected by transmitting electromagnetic waves such as X-rays through the separator 12. However, since moisture lowers the transmittance of electromagnetic waves such as X-rays, it is not preferable that the separator 12 contains a lot of moisture because the accuracy of defect inspection is lowered.

  The moisture contained in the separator 12 is preferably about 2000 ppm or less. Thereby, in the defect inspection process mentioned later, the defect in the separator 12 wound by the core can be test | inspected accurately, suppressing the fall of the transmittance | permeability of electromagnetic waves, such as X-rays.

  The separator 12 preferably has a width suitable for application products such as lithium ion secondary batteries (hereinafter referred to as “product width”). However, in order to increase productivity, first, the separator 12 is manufactured so that its width is equal to or greater than the product width. And after manufacturing beyond the product width, the separator is cut (slit) to the product width.

  Here, it is preferable that the width (length of TD) of the separator 12 slit in the slit process and wound around the core is, for example, about 30 mm or more and 100 mm or less. If the width of the separator 12 becomes too large, electromagnetic waves such as X-rays are difficult to pass through the separator 12 in the defect inspection in the defect inspection process described later, and the accuracy of the defect inspection is lowered. Therefore, by setting the width of the separator 12 to about 100 mm or less, in the defect inspection process described later, the decrease in the transmittance of electromagnetic waves such as X-rays is suppressed, and the separator 12 wound around the core is accurately placed. Defects can be inspected.

  The “separator width” means the length of the separator in a direction substantially perpendicular to the longitudinal direction and the thickness direction of the separator. Hereinafter, the wide separator before being slit is referred to as “original fabric”. Moreover, a slit means cutting | disconnecting a separator along a longitudinal direction (flow direction of the film in manufacture), and a cutting means cutting a separator along a cross direction. The transverse direction means a direction substantially perpendicular to the longitudinal direction and the thickness direction of the separator, and is synonymous with the width direction of the separator.

  The slit device 6 is a device for slitting the original fabric. The slit device 6 includes a cylindrical unwinding roller 61, transport rollers 62 to 69, and a plurality of winding rollers 70U and 70L that are rotatably supported.

  In the slit device 6, a cylindrical core c around which an original fabric is wound is fitted on the unwinding roller 61.

  Then, the original fabric is unwound from the core c to the path U or L. The unwound original fabric is conveyed to the conveyance roller 68 via the conveyance rollers 63 to 67. In the process of transporting from the transport roller 67 to the transport roller 68, the original fabric is slit into the plurality of separators 12 (slit process). A cutting device (not shown) that slits the raw material into the plurality of separators 12 is disposed in the vicinity of the transport roller 68.

  After the slitting process, the separators 12 slit into a plurality of pieces from the original fabric are respectively wound around cylindrical cores u fitted on the winding roller 70U, and the other parts are respectively wound on the winding roller 70L. Is wound around each of the cylindrical cores l fitted into the separator (separator winding step).

  The separator 12 after being slit from the raw fabric is wound around a core (bobbin) in a roll shape and is referred to as a “separator wound body”. In this embodiment, after the separator winding body is manufactured in this separator winding step, it is inspected whether or not foreign matter is mixed in the separator 12 wound around the core in the defect inspection step described later. To do. In the above-described slitting process, for example, a part of a slit blade made of metal is chipped and adheres to the surface of the slit separator 12, and foreign matters are likely to be generated. For this reason, it is preferable to provide a defect inspection process after a slit process. Thereby, the foreign material generated in the slit process in which foreign material is likely to be generated can be efficiently inspected by the defect inspection process.

  Then, a plurality of separator rolls determined as non-defective products in the defect inspection process are packaged and stored / shipped together in the packaging process.

[Configuration of separator winding body]
Next, the structure of the separator winding body (inspection object / film winding body) according to the present embodiment will be described. (A)-(e) of FIG. 2 is a schematic diagram which shows schematic structure of the separator winding body 10 which concerns on this embodiment. 2A shows a state before the separator 12 is unwound from the core 8, FIG. 2B shows the state of FIG. 2A from a different angle, and FIG. (C) of FIG. 2 shows a state where the separator 12 is unwound from the core 8, (d) of FIG. 2 shows the state of (c) of FIG. 2 from another angle, and (e) of FIG. The state of the core 8 after being unwound and removed is shown.

  As shown in FIGS. 2A and 2B, the separator wound body 10 includes a core 8 around which a separator 12 is wound. The separator 12 is slit from the original as described above. Of the separator wound body 10, the outer peripheral surface of the separator 12 wound in a roll shape is referred to as an outer peripheral surface 10a, and one side surface of both side surfaces whose outer shapes facing each other across the outer peripheral surface 10a are substantially circular is defined. The other side surface opposite to the first side surface 10b is referred to as a second side surface 10c.

  The core 8 includes an outer cylindrical member (outer cylindrical member) 81, an inner cylindrical member (inner cylindrical member) 82, and a plurality of ribs 83.

  The outer cylindrical member 81 is a cylindrical member for winding the separator 12 around the outer peripheral surface 81a. The inner cylindrical member 82 is a cylindrical member having a smaller diameter than the outer cylindrical member 81 provided on the inner peripheral surface 81 b side of the outer cylindrical member 81. The rib 83 is a support member that extends between the inner peripheral surface 81b of the outer cylindrical member 81 and the outer peripheral surface 82a of the inner cylindrical member 82 and supports the outer cylindrical member 81 from the inner peripheral surface 81b side. In the present embodiment, a total of eight ribs 83 are provided at equal intervals along the circumferential direction of the core 8.

  The core 8 has a first through hole 8a defined by the inner cylindrical member 82 (the inner peripheral surface 82b of the inner cylindrical member 82) at the approximate center thereof, and the outer cylindrical member 81 and the periphery of the first through hole 8a. A plurality (eight in this embodiment) of second through holes 8b defined by the inner cylindrical member 82 and the ribs 83 are provided.

  As shown in FIGS. 2C and 2D, one end of the separator 12 is attached to the core 8 with an adhesive tape 130. Specifically, one end of the separator 12 is fixed to the outer peripheral surface 81 a of the core 8 (outer cylindrical member 81) by the adhesive tape 130. The means for fixing one end of the separator 12 to the outer peripheral surface 81a may be applied by directly applying an adhesive to one end of the separator 12 in addition to the adhesive tape 130, or may be fixed by a clip.

  As shown in FIG. 2 (e), in the core 8, it is preferable that the center axes of the outer cylindrical member 81 and the inner cylindrical member 82 substantially coincide with each other, but the present invention is not limited to this. Furthermore, the thickness, width, radius, and other dimensions of the outer cylindrical member 81 and the inner cylindrical member 82 can be appropriately designed according to the type or size of the separator 12 to be wound.

  In addition, the ribs 83 are arranged at equal intervals from each other and approximately perpendicular to the outer cylindrical member 81 and the inner cylindrical member 82 at positions obtained by dividing the circumference into eight equal parts. However, the number of ribs 83 and the arrangement interval are not limited thereto.

  The material of the core 8 includes ABS resin. However, the material of the core 8 may include a resin such as a polyethylene resin, a polypropylene resin, a polystyrene resin, and a vinyl chloride resin in addition to the ABS resin. The material of the core 8 is preferably not metal, paper, or fluororesin.

[Configuration of defect inspection equipment]
Next, the configuration of the defect inspection apparatus according to this embodiment will be described. 3A to 3C are schematic views showing a schematic configuration of the defect inspection apparatus 1 according to the present embodiment. Specifically, FIG. 3A is a front view of the defect inspection apparatus 1, FIG. 3B is a top view of the defect inspection apparatus 1, and FIG. FIG.

  The defect inspection apparatus 1 inspects whether or not foreign matter is mixed in the separator 12 wound around the core 8 in the separator wound body 10 (defect inspection step). Specifically, the defect inspection apparatus 1 according to the present embodiment inspects whether or not foreign matter is mixed in the separator 12 by irradiating the separator wound body 10 with electromagnetic waves (electromagnetic radiation).

  The defect inspection apparatus 1 is covered with a wall that is difficult to transmit X-rays or the like containing lead or the like so that electromagnetic waves to be handled do not leak outside.

  As shown in FIGS. 3A to 3C, the defect inspection apparatus 1 includes a radiation source 2, a moving mechanism 3, and a TDI sensor 4. In the present embodiment, the direction parallel to the center line A of the rotation shaft 322 of the moving mechanism 3 is defined as the X-axis direction, the direction perpendicular to the X-axis from the radiation source 2 toward the TDI sensor 4 is defined as the Y-axis direction, A direction perpendicular to the X axis and the Y axis is taken as a Z axis direction.

(Source)
The radiation source 2 emits electromagnetic waves R radially from the thickness direction (Y-axis direction) of the separator winding body 10 to the separator winding body 10. “The thickness direction of the separator wound body” is the same direction as the width direction of the separator 12 wound around the core 8 and intersects the first side face 10b and the second side face 10c of the separator wound body 10 perpendicularly. Means direction.

  In the present embodiment, the defect inspection apparatus 1 includes two radiation sources 2 that emit electromagnetic waves R radially. Each radiation source 2 is arranged on the center line A, respectively. In addition, the distance between the radiation sources 2 (the distance between the centers of the radiation sources 2) is the separator so that the electromagnetic waves R parallel to the Y-axis direction among the electromagnetic waves R emitted radially from the radiation sources 2 are not blocked by the core 8. The diameter is set so as to substantially match the diameter of the core 8 of the rotating body 10. By setting the intervals between the radiation sources 2 in this way, it is possible to prevent the shadow of the core 8 from entering the TDI sensor 4 when the electromagnetic wave R is detected by the TDI sensor 4. Moreover, in order not to mix each electromagnetic wave R, you may select and employ | adopt suitably the methods, such as putting a shield in the vicinity of the radiation source 2, and distributing the irradiation angle of each radiation source 2. FIG.

  As the electromagnetic wave R emitted from the radiation source 2, for example, electromagnetic radiation such as X-rays and γ-rays can be preferably used. In particular, by using X-rays as the electromagnetic wave R, it is possible to realize the defect inspection apparatus 1 that is easy to handle without increasing the cost. However, the type of the electromagnetic wave R can be appropriately selected according to the type or size of the inspection object.

  The radiation source 2 may irradiate the separator wound body 10 with the electromagnetic wave R so that not only the separator 12 wound around the core 8 but also the core 8 is irradiated.

(Movement mechanism)
The moving mechanism 3 moves the separator winding body 10. The moving mechanism 3 includes a pedestal 31 that holds the separator winding body 10 and a drive unit 32 that rotates the pedestal 31.

  The pedestal 31 includes a frame 311, a support plate 312, a holding mechanism 313, and a connecting rod 314. The frame 311 is a substantially rectangular frame member. Support plates 312 are bridged on the inner surfaces of two opposite sides (two sides opposite in the Z-axis direction) of the frame 311. Further, on two opposite sides (two sides facing in the X-axis direction) of the frame 311, connecting rods 314 are projected from the outer surfaces thereof.

  The support plate 312 is a plate-like member for supporting the holding mechanism 313. The support plate 312 includes a long side extending in the Z-axis direction and a short side extending in the X-axis direction, and the length of the short side (the width of the support plate 312) is set to be less than the diameter of the core 8. In this way, by setting the length of the short side of the support plate 312 to be less than the diameter of the core 8, the shadow of the support plate 312 is prevented from entering the TDI sensor 4 when the electromagnetic wave R is detected by the TDI sensor 4. can do.

  The holding mechanism 313 is a shaft member that holds the separator winding body 10 rotatably. The holding mechanism 313 protrudes from the center of the support plate 312 and is fitted into the first through hole 8 a of the core 8 of the separator winding body 10.

  The holding mechanism 313 can rotate clockwise or counterclockwise. For this reason, as the holding mechanism 313 rotates, the separator winding body 10 can be rotated about the holding mechanism 313 extending in the thickness direction of the separator winding body 10.

  In the present embodiment, the holding mechanism 313 is inserted into the first through hole 8 a of the core 8 from the first side surface 10 b side of the separator winding body 10 and holds the separator winding body 10. Thereby, the separator winding body 10 is between the radiation source 2 and the TDI sensor 4, with the first side surface 10b side facing the radiation source 2 side and the second side surface 10c side facing the TDI sensor 4 side. The separator 12 wound around the core 8 is set in the defect inspection apparatus 1 so that at least a part of the separator 12 is interposed.

  The connecting rod 314 is a rod-shaped member for connecting the frame 311 to the drive unit 32. Two connecting rods 314 protrude in parallel from each other on the outer surfaces of two opposite sides (two sides opposite in the X-axis direction) of the frame 311.

  The drive unit 32 rotates the pedestal 31 about the center line A. The drive unit 32 is connected to two opposite sides (two sides opposite to the X-axis direction) of the frame 311 one by one via a connecting rod 314.

  The drive unit 32 includes a rotating roll 321 and a rotating shaft 322. The rotating roll 321 is a cylindrical member having a connecting rod 314 fixed to the outer peripheral surface thereof. A rotation shaft 322 is fitted on the inner peripheral surface of the rotation roll 321.

  The rotation shaft 322 is a shaft member that can be rotated clockwise and counterclockwise about a center line A by a motor (not shown) or the like. The drive unit 32 rotates the rotation roll 321 by rotating the rotation shafts 322 in conjunction with each other.

  According to the moving mechanism 3, the separator winding body 10 held by the pedestal 31 is moved along a circular orbit centered about the radiation source 2 (center line A) by controlling the operation of the drive unit 32. Can be made.

(TDI sensor)
The TDI (Time Delay Integration) sensor 4 is a detector that can detect the electromagnetic wave R that has passed through the separator 12. The TDI sensor 4 may be a detector capable of detecting X-rays when the source 2 emits X-rays, and may be a detector capable of detecting γ-rays when the source 2 emits γ-rays. That's fine.

  The TDI sensor 4 is installed on the side opposite to the radiation source 2 with respect to the separator wound body 10. The TDI sensor 4 has a plurality of cells (sensor elements) arranged in a direction (X-axis direction) perpendicular to a movement (rotation) direction of the separator winding body 10 and a direction parallel to the Z-axis direction (Z-axis direction). This is the configuration. That is, the TDI sensor 4 has a configuration in which a plurality of unit line sensors are arranged in the Z-axis direction.

  When the TDI sensor 4 detects the electromagnetic wave R emitted from the radiation source 2, the TDI sensor 4 outputs an electrical signal corresponding to the intensity of the detected electromagnetic wave R to an image processing unit (not shown), and is output from the TDI sensor 4 in the image processing unit. A captured image is generated based on the electrical signal.

[Defect inspection method]
Next, an example of a defect inspection method (defect inspection process) performed by the defect inspection apparatus 1 according to the present embodiment will be described. 4A and 4B are schematic diagrams for explaining an example of the defect inspection method in the defect inspection apparatus 1 shown in FIG. Specifically, FIG. 4A is a side view showing a moving state of the separator winding body 10 in the defect inspection apparatus 1, and FIG. 4B shows an imaged area of the separator winding body 10. FIG. FIG. For convenience of explanation, the moving mechanism 3 is omitted in FIG.

  In the defect inspection apparatus 1, the inspection area in the separator winding body 10 is moved while the distance between the radiation source 2 and the separator winding body 10 and the distance between the radiation source 2 and the TDI sensor 4 are kept substantially constant. The electromagnetic wave R transmitted through the separator winding body 10 is detected by a TDI sensor. Specifically, in this embodiment, as shown in FIG. 4A, when viewed from the X-axis direction, the separator wound body 10 is not moved in parallel (linearly moved), but the source 2 is substantially centered. The electromagnetic wave R transmitted through the separator 12 is detected by the TDI sensor 4 while moving (circular movement) along the circular orbit C. For this reason, since the irradiation angle of the electromagnetic wave R with respect to the separator winding body 10 is substantially equalized compared to the configuration in which the separator winding body 10 is moved in parallel, the TDI sensor 4 caused by the thickness of the separator winding body 10 The error of the detection position can be improved.

  In the present embodiment, the moving mechanism 3 is configured to move the separator winding body 10 along the circular path C. However, the distance between the radiation source 2 and the separator winding body 10 and the TDI sensor 4 is substantially constant. Other configurations may be adopted as long as it is possible to move the inspection region in the separator wound body 10 while keeping it.

  The TDI sensor 4 may be curved so as to be substantially parallel to the circular orbit C. As a result, the electromagnetic wave R emitted radially from the radiation source 2 can be suitably detected by the TDI sensor 4, and the incident angle of the electromagnetic wave R with respect to the TDI sensor 4 is substantially equalized, so the detection accuracy of the TDI sensor 4 Can be improved.

  In the present embodiment, the defect inspection apparatus 1 causes the separator winding body 10 to reciprocate a plurality of times (single pendulum motion) between the first point P1 and the second point P2 located on the circular orbit C. And while the separator winding body 10 moves toward the 2nd point P2 from the 1st point P1, the captured image of the separator 12 whole is produced | generated by image | photographing a part of separator 12 each.

  Specifically, the defect inspection apparatus 1 irradiates the electromagnetic wave R from the side of the first side face 10b of the separator wound body 10 by the radiation source 2 (outgoing process), and moves the first point by the moving mechanism 3 (drive unit 32). The separator winding body 10 is moved from P1 toward the second point P2 (moving step).

  In the present embodiment, the angle (feed angle) formed by the separator winding body 10 at the first point P1 and the separator winding body 10 at the second point P2 is set to about 30 degrees. In other words, in this embodiment, the pendulum angle θ of the separator winding body 10 is set to about 15 degrees. The pendulum angle θ of the separator winding body 10 can be appropriately set according to the size of the separator winding body 10 and the TDI sensor 4, but the pendulum angle θ is preferably 60 degrees or less. When the pendulum angle θ exceeds 60 degrees, the irradiation angle of the electromagnetic wave R with respect to the separator winding body 10 becomes small, and the transmission length when the electromagnetic wave R passes through the separator winding body 10 (that is, in the separator winding body 10). The path length of the electromagnetic wave R) increases. For this reason, the intensity | strength of the electromagnetic wave R detected by the TDI sensor 4 falls, and there exists a possibility that a foreign material cannot be detected appropriately. Therefore, the pendulum angle θ is preferably 60 degrees or less, and more preferably 40 degrees or less.

  While the separator wound body 10 moves from the first point P1 toward the second point P2, the defect inspection apparatus 1 detects the electromagnetic wave R transmitted through the separator 12 by the TDI sensor 4 to remove a part of the separator 12. Take a picture (detection process). In the present embodiment, the defect inspection apparatus 1 includes a captured image of the separator 12 when the separator winding body 10 is positioned at a third point P3 that is an intermediate position between the first point P1 and the second point P2. The separator 12 is photographed by the TDI sensor 4.

  When the separator winding body 10 reaches the second point P2, the defect inspection apparatus 1 moves the separator winding body 10 from the second point P2 toward the first point P1 by the moving mechanism 3 (drive unit 32). . While the separator winding body 10 moves from the second point P2 to the first point P1, the defect inspection apparatus 1 does not detect the electromagnetic wave R by the TDI sensor 4, and the separator winding is performed by the moving mechanism 3 (holding mechanism 313). The body 10 is rotated by a predetermined angle.

  By repeating such an operation, the defect inspection apparatus 1 causes the TDI sensor 4 to change different regions of the separator 12 each time the separator winding body 10 reciprocates between the first point P1 and the second point P2. You can shoot. For example, as shown in FIG. 4B, the defect inspection apparatus 1 captures the first region R1 by the first image capture, captures the second region R2 of the separator 12 by the second capture, and the third time. The third region R3 can be photographed by photographing.

  Therefore, every time the reciprocating operation is performed, when the separator winding body 10 is rotated about 14 degrees by the moving mechanism 3 (holding mechanism 313) and the image is taken, the entire separator 12 can be imaged by a total of 13 times. . Note that the angle (predetermined angle) at which the separator winding body 10 is rotated every time it reciprocates can be appropriately set according to the size of the separator winding body 10 and the TDI sensor 4.

  It should be noted that the number of seconds for each imaging can be appropriately adjusted according to the time required for the examination, the sensitivity of the TDI sensor 4, the number of processed samples, and the like. For example, photographing can be performed within 4 seconds, and the shorter the photographing time per time, the shorter the tact time required for the inspection of each separator wound body 10 is preferable.

  Further, depending on the time required for the inspection of each separator wound body 10, the sensor sensitivity of the TDI sensor 4, the number of processed samples (the number of separator wound bodies 10 to be inspected), etc., for example, a plurality of separator wound bodies The plurality of separator winding bodies 10 may be inspected at the same time by overlapping 10 and photographing simultaneously, or arranging a plurality of separator winding bodies 10 and photographing simultaneously.

  Furthermore, before and after the separator wound body 10 moves relative to the radiation source 2, the irradiation of the electromagnetic wave R may be turned on / off, or the detection by the TDI sensor 4 may be turned on / off. That is, the detection of the TDI sensor 4 may be switched in a state where the electromagnetic wave R is continuously irradiated. Thereby, the picked-up image of a different area | region of the separator 12 can be obtained similarly to the case where the electromagnetic wave R is irradiated in pieces. Note that it is preferable to switch the detection of the TDI sensor 4 before and after the separator wound body 10 moves relatively. This is because if the radiation source 2 is frequently turned ON / OFF, the irradiated electromagnetic wave R is not stabilized, and there is a risk that a malfunction such as shortening the life of the radiation source 2 may occur.

  The defect inspection apparatus 1 generates a captured image of the entire annular separator 12 by extracting necessary regions from the partially captured images thus obtained and connecting them. Then, the generated image of the entire separator 12 is analyzed to inspect whether or not a foreign substance is mixed in the separator 12.

  By connecting a plurality of photographed images in this way, it is possible to specify the position of the three-dimensional foreign matter. Further, it is possible to detect a thin foreign object without leakage.

  In addition, although the material of the foreign material which the defect inspection apparatus 1 can detect can consider various things, For example, a metal, carbon, etc. can be mentioned. In addition, various sizes of the foreign matter that can be detected by the defect inspection apparatus 1 are conceivable. As an example, a size having a size of about 100 μm and a thickness of about 50 μm can be given. In the present specification, when the size or the like of the foreign matter is not specified, that is, when only the length of 100 μm or the like is described, the length means the diameter of the circumscribed sphere of the foreign matter. .

  A foreign substance that is a defect to be detected tends to be detected up to a smaller size when the specific gravity is larger. When the defect to be detected is a metal foreign object, for example, when a metal having a specific gravity of about 6 can be detected to about 100 μm under a certain inspection condition, a metal having a specific gravity of about 2 can be detected to about 300 μm. In the defect inspection apparatus 1, the size of the foreign object to be detected may be set as appropriate depending on the type (that is, specific gravity) of the metallic foreign object to be detected.

  In the defect inspection apparatus 1, if the time required for the inspection is extended by extending the exposure time or photographing the same region of the separator wound body 10 a plurality of times, a foreign substance having a small size can be detected. For this reason, the relationship between the specific gravity and the size of the metal foreign object to be detected as described above is a relationship when the time required for the inspection is the same.

  As specific gravity of typical metals, Fe: about 7.8, Al: about 2.7, Zn: about 7.1, SUS 7.7, Cu 8.5, brass 8.5, etc. are exemplified. This is not the case.

  For example, the defect inspection apparatus 1 is set so as to detect foreign matters of 100 μm or more, and the defect inspection apparatus 1 performs defect inspection of the separator winding body 10, thereby manufacturing the separator winding body 10 in the manufacturing process. From the various separator winding bodies 10 containing (or possibly including) foreign substances of various sizes, only the separator winding body 10 containing foreign matters of 100 μm or more can be selected.

  Then, by removing the separator wound body 10 in which foreign matter of 100 μm or more is detected by the defect inspection apparatus 1 from the manufacturing process, various separators containing various sizes of foreign matter (possibly included) The separator roll 10 can be selected from the roll 10 so that there is little foreign matter of 100 μm or more or no foreign matter of 100 μm or more is contained.

  In other words, in the manufacturing process of the separator winding body 10, various separator winding bodies that include (possibly include) foreign substances of various sizes by incorporating a defect inspection process using the defect inspection apparatus 1. From 10, the separator wound body 10 can be manufactured with little foreign matter of 100 μm or more or no foreign matter of 100 μm or more.

  In particular, the separator wound body 10 with few foreign matters of 100 μm or more can reduce the possibility of occurrence of defects due to the foreign matter attached to the separator 12.

  In this manner, by incorporating a defect inspection process using the defect inspection apparatus 1 in the manufacturing process of the separator wound body 10, it is possible to manufacture a separator wound body with few defects such as contamination of foreign matters.

  Further, as described above, the defect inspection process is preferably provided after the slit process and before the packaging process in the manufacturing process of the separator wound body 10. Thereby, the foreign material generated in the slit process can be efficiently inspected.

  Further, by providing a defect inspection step in the manufacturing process of the separator winding body 10, in the manufacturing process of assembling the battery using the separator 12 wound around the core 8 after the packaging process of the separator winding body 10, the separator 12. It is possible to save the trouble of inspecting the presence or absence of foreign matter adhering to the surface.

  Moreover, it is preferable that the inspection of the presence or absence of defects in the separator 12 wound around the core 8 using the defect inspection apparatus 1 is performed in a clean environment by arranging the defect inspection apparatus 1 in a clean room. As a clean environment, for example, a class of 100,000 or less is preferable. By performing in such an environment, it is possible to reduce the possibility of foreign matter newly adhering during and after the inspection. Furthermore, it is preferable that a region surrounded by a wall of lead or the like inside or outside the defect inspection apparatus 1 is also in such a clean environment. Thereby, it is possible to accurately inspect for the presence or absence of defects in the separator 12 wound around the core 8 using the defect inspection apparatus 1.

  Further, the photographing of one separator winding body 10 is finished, and before the next separator winding body 10 starts photographing (after the end of one photographing cycle), the separator winding body 10 is moved for photographing. It is preferable to return each part (holding mechanism 313 etc.) to the initial state. As a result, it is possible to prevent inspection omissions and duplicate inspections, and to prevent malfunction such as entering the next shooting during shooting. Note that it is also preferable for each defect inspection apparatus described in the second and subsequent embodiments that it is preferable to return each unit to the initial state after the end of one imaging cycle.

[Summary of defect inspection equipment]
As described above, the defect inspection apparatus 1 according to the present embodiment includes the radiation source 2 that radiates the electromagnetic wave R radially from the thickness direction of the separator winding body 10 and the separator winding body 10. And a TDI sensor 4 that is installed on the side opposite to the radiation source 2 with respect to the separator winding body 10 and detects the electromagnetic wave R that has passed through the separator 12. The separator winding body 10 is moved along a circular orbit C centered on the source 2.

  In the defect inspection apparatus 1, the electromagnetic wave R transmitted through the separator 12 is detected by the TDI sensor 4 while the separator winding body 10 is moved along the circular orbit C having the radiation source 2 substantially at the center. For this reason, since the irradiation angle of the electromagnetic wave R with respect to the separator 12 is substantially equalized, the error of the detection position of the TDI sensor 4 resulting from the thickness of the separator winding body 10 can be improved.

  Therefore, according to the present embodiment, it is possible to realize the defect inspection apparatus 1 that can suppress a decrease in inspection accuracy due to the thickness of the separator wound body 10.

[Deformation of defect inspection system]
(Modification 1)
In the above description, the defect inspection apparatus 1 has described the configuration in which the separator winding body 10 is photographed once every time the separator winding body 10 makes a round trip between the first point P1 and the second point P2. . However, the present invention is not limited to this configuration. The defect inspection apparatus 1 may have a configuration in which the separator winding body 10 is imaged twice each time the separator winding body 10 makes a round trip between the first point P1 and the second point P2.

  Specifically, the defect inspection apparatus 1 includes the separator winding body while the separator winding body 10 moves from the first point P1 toward the second point P2 and from the second point P2 toward the first point P1. The separator 12 is photographed when the TDI sensor detects the electromagnetic wave R transmitted through the separator 12 both during the movement of the separator 10.

  In this case, the separator winding body 10 is moved by a predetermined angle both when the separator winding body 10 reaches the second point P2 from the first point P1 and when the separator winding body 10 reaches the first point P1 from the second point P2. Rotate.

  Thereby, the defect inspection apparatus 1 can image two different areas of the separator winding body 10 each time the separator winding body 10 makes a round trip between the first point P1 and the second point P2. Therefore, the tact time required for the inspection of the separator separator 10 as a whole can be shortened.

(Modification 2)
In the above description, the defect inspection apparatus 1 has been described as having two radiation sources 2. However, the present invention is not limited to this configuration. For example, the defect inspection apparatus 1 may have a configuration having one radiation source 2 or a configuration having three or more radiation sources 2. That is, the number of the radiation sources 2 to be used is appropriately changed according to the type, shape, size, etc. of the inspection object.

  FIG. 5 is a front view showing a schematic configuration of a modified example of the defect inspection apparatus 1 shown in FIG. As shown in FIG. 5, the defect inspection apparatus 1 may have a configuration having one radiation source 2. Even in such a configuration, the irradiation angle of the electromagnetic wave R on the separator winding body 10 is substantially equalized by moving the separator winding body 10 along the circular orbit C centered about the radiation source 2. The error of the detection position of the TDI sensor 4 due to the thickness of the separator winding body 10 can be improved.

  However, when the number of the radiation sources 2 is one, the shadow of the core 8 enters the TDI sensor 4 when the electromagnetic wave R is detected by the TDI sensor 4. For this reason, when the inspection object is the separator wound body 10 as in the present embodiment, the number of the radiation sources 2 is preferably two or more.

(Modification 3)
In the above description, the moving mechanism 3 including the pedestal 31 that rotatably holds the separator winding body 10 and the drive unit 32 that rotates the pedestal 31 has been described. However, the moving mechanism according to the present invention is not limited to this configuration. The moving mechanism should just be the structure which can move the separator winding body 10 along the circular track | orbit centering the radiation source 2 in the center.

  FIG. 6 is a schematic diagram showing a schematic configuration of a modified example of the moving mechanism 3 shown in FIGS. Specifically, FIG. 6A is a front view of the moving mechanism 3a, FIG. 6B is a top view of the moving mechanism 3a, and FIG. 6C is a side view of the moving mechanism 3a. It is.

  FIGS. 6A to 6C show an example in which the moving mechanism 3a is configured using a robot arm. As shown in FIGS. 6A to 6C, the moving mechanism 3 a includes a holding mechanism 313 that rotatably holds the separator winding body 10, and an arm 315 that supports the holding mechanism 313.

  The arm 315 has a rotation shaft 316 at the tip thereof, and a holding mechanism 313 is connected to the rotation shaft 316. For this reason, the holding mechanism 313 is rotatable about the center line A of the rotation shaft 316 as a substantial center. Therefore, by disposing the radiation source 2 on the center line A of the rotation shaft 316, the separator winding body 10 is moved (circular motion) along a circular orbit centered on the radiation source 2 while the separator 12 is moved. Can be detected by the TDI sensor 4.

  Thus, by configuring the moving mechanism 3a using the robot arm, it is possible to carry the separator wound body 10 and perform defect inspection using the moving mechanism 3a. Therefore, the tact time required for the defect inspection of the separator wound body 10 can be shortened.

  FIG. 7 is a schematic diagram showing a schematic configuration of another modified example of the moving mechanism 3 shown in FIGS. Specifically, FIG. 7A is a front view of the moving mechanism 3b, FIG. 7B is a top view of the moving mechanism 3b, and FIG. 7C is a side view of the moving mechanism 3b. is there.

  As shown in FIGS. 7A to 7C, the moving mechanism 3b includes a holding mechanism 313 that rotatably holds the separator winding body 10, and a rotating shaft 316 that rotatably supports the holding mechanism 313. It has. Even in the moving mechanism 3b having such a configuration, the separator winding body 10 is arranged along a circular orbit centered on the radiation source 2 by arranging the radiation source 2 on the center line A of the rotation shaft 316. The electromagnetic wave R transmitted through the separator 12 can be detected by the TDI sensor 4 while moving (circular movement).

[Embodiment 2]
The following will describe another embodiment of the present invention with reference to FIGS. For convenience of explanation, members having the same functions as those described in the embodiment are given the same reference numerals, and descriptions thereof are omitted.

[Configuration of defect inspection equipment]
FIG. 8 is a schematic diagram showing a schematic configuration of the defect inspection apparatus 11 according to the present embodiment. The defect inspection apparatus 11 according to the present embodiment inspects whether or not foreign matter is mixed in the separator 12 while moving the separator wound body 10 in one direction by the moving mechanism 13 including the chain conveyor 33. .

  Specifically, the defect inspection apparatus 11 passes through the separator 12 when the separator winding body 10 passes through the inspection positions D1 to D4 set on the transport path (outward path) from the loading position S to the extraction position E. The detected electromagnetic wave R is detected by the TDI sensor 4. Moreover, the defect inspection apparatus 11 rotates the separator winding body 10 about 45 degrees in the attitude | position change position C1-C3 set on the conveyance path | route. Accordingly, different regions of the separator 12 are photographed at the inspection positions D1 to D4, and these photographed images are analyzed to inspect whether or not foreign matter is mixed in the separator 12.

  On the transport path of the separator winding body 10, the posture change position C1 is set between the inspection position D1 and the inspection position D2, and the posture change position C2 is set between the inspection position D2 and the inspection position D3. A posture change position C3 is set between the position D3 and the inspection position D4. On the return path (return path) from the take-out position E to the input position S, the posture change position C4 is set.

  The defect inspection apparatus 11 is covered with a wall through which X-rays and the like containing lead are difficult to transmit so that the electromagnetic wave R to be handled does not leak to the outside.

  As shown in FIG. 8, the defect inspection apparatus 11 includes a radiation source 2, a moving mechanism 13, and a TDI sensor 4. The radiation source 2 and the TDI sensor 4 are arranged at the inspection positions D1 to D4, respectively. When the separator winding body 10 that is moved by the moving mechanism 13 passes through the inspection positions D1 to D4, the radiation source 2 and the TDI sensor 4 can detect the electromagnetic wave R from the radiation source 2 that has passed through the separator 12 by the TDI sensor. It is arranged in the position.

(Movement mechanism 13)
The moving mechanism 13 includes a pedestal 31 that holds the separator winding body 10 and a chain conveyor 33 that moves the pedestal 31. The chain conveyor 33 includes two chains 331 and a plurality of gears (sprockets) 332. The pedestal 31 is connected to the chain 331 by a spring or the like. The moving mechanism 13 moves the separator winding body 10 held by the base 31 by driving the gear 332 and rotating the chain 331.

  9A is a top view showing the defect inspection apparatus 11, and FIG. 9B is a side view showing an operating state of the moving mechanism 13 at the inspection position D1. Hereinafter, the operation state of the moving mechanism 13 at the inspection position D1 will be described, but the same applies to the inspection positions D2 to D4.

  As shown in FIG. 9A, at the inspection position D1, two circular transport rolls 34 are arranged inside each gear 332 so as to face each other. In addition, at the inspection position D1, the two radiation sources 2 that emit the electromagnetic waves R radially are arranged on the center line A of the circular transport roll 34, respectively.

  As shown in FIG. 9B, when the connecting rod 314 of the pedestal 31 moved to the inspection position D1 contacts the outer peripheral surface of the circular transport roll 34, the circular transport roll 34 rotates about the center line A. . For this reason, the electromagnetic wave R transmitted through the separator 12 is detected by the TDI sensor 4 while moving the separator winding body 10 (circular movement) along the circular orbit centered about the radiation source 2 at the inspection position D1. Can do. Thereby, since the irradiation angle of the electromagnetic wave R with respect to the separator winding body 10 is substantially equalized, the error of the detection position of the TDI sensor 4 resulting from the thickness of the separator winding body 10 can be improved.

  FIGS. 10A to 10C are schematic views for explaining the rotation holding mechanism 35 provided in the defect inspection apparatus 11. Specifically, FIG. 10A is a side view showing a schematic configuration of the rotation holding mechanism 35 provided on the support plate 312 of the base 31, and FIG. 10B is a posture change position C1 to C3. FIG. 10C is a top view showing the posture change of the rotary plate 351 at the posture change position C4.

  As shown in FIG. 10A, in the defect inspection apparatus 11, a rotation holding mechanism 35 that rotatably holds the separator winding body 10 is provided on the support plate 312 of the base 31. The rotation holding mechanism 35 is provided on a rotation plate 351 provided on the support plate 312 so as to be rotatable about a rotation shaft 351a, and protrudes from the upper surface of the rotation plate 351 to hold the separator winding body 10. And a plurality of posture changing rods 353a to 353d protruding from the lower surface of the rotating plate 351.

  Posture change rods 353a to 353d are shorter in the order of posture change rod 353b, posture change rod 353c, posture change rods 353a and 353d, and posture change rod 353a and posture change rod 353d have the same length. is there.

  As shown in FIG. 10B, a first rail r1 that is in contact with the posture changing rod 353b is provided in a substantially square shape at the posture changing position C1 set on the downstream side of the inspection position D1. . When the posture changing rod 353b comes into contact with the first rail r1, the rotating plate 351 rotates about 45 °. Thereby, the attitude | position of the separator winding body 10 can be changed by the rotation angle of about 45 degrees from the attitude | position at the time of inspection position D1 passage (namely, initial position in the injection | pouring position S), and it can introduce into the subsequent inspection position D2. .

  In addition, at the posture change position C2 set on the downstream side of the inspection position D2, a second rail r2 that comes into contact with the posture change rod 353c is provided in a substantially square shape. When the posture changing rod 353c comes into contact with the second rail r2, the rotating plate 351 further rotates about 45 °. Thereby, the attitude | position of the separator winding body 10 can be changed by the rotation angle of about 45 degrees from the attitude | position at the time of the test | inspection position D2, and it can introduce | transduce into the subsequent test | inspection position D3.

  In addition, at the posture change position C3 set on the downstream side of the inspection position D3, a third rail r3 that comes into contact with the posture change rod 353d is provided in a substantially square shape. When the posture changing rod 353d comes into contact with the third rail r3, the rotating plate 351 further rotates by about 45 °. Thereby, the attitude | position of the separator winding body 10 can be changed by the rotation angle of about 45 degrees from the attitude | position at the time of the test | inspection position D3 passage, and it can introduce into the subsequent test | inspection position D4.

  Thus, in the defect inspection apparatus 11, the separator winding body 10 is rotated about 45 degrees at posture change position C1-C3. As a result, different regions of the separator 12 are photographed four times at the inspection positions D1 to D4, and it is possible to inspect whether or not foreign matter is mixed in the separator 12 by analyzing these photographed images. .

  Further, as shown in FIG. 10C, the fourth rail r4 that contacts the posture changing rod 353b is located at the posture changing position C4 set on the return path (return path) from the take-out position E to the loading position S. The fifth rail r5 that contacts the posture changing rod 353a is provided in a substantially square shape. When the posture changing rod 353b comes into contact with the fourth rail r4 and the posture changing rod 353a comes into contact with the fifth rail r5, the rotating plate 351 rotates reversely by about 135 °. As a result, the rotating plate 351 can be returned to the initial posture and introduced into the closing position S. Thus, by adjusting the length of the posture changing rod and the height and arrangement of the rail, the rails are set so as to contact only the specific posture changing rod.

  In the present embodiment, the configuration has been described in which different regions of the separator 12 are imaged in four times at the inspection positions D1 to D4. However, the present invention is not limited to this configuration. The defect inspection apparatus 11 may shoot different areas of the separator 12 by dividing them into three times or less or five times or more. In this case, the inspection position and the position change position may be set according to the number of times of imaging, and the imaging range at each inspection position and the posture change angle at each position change position may be adjusted.

[Summary of defect inspection equipment]
As described above, the defect inspection apparatus 11 according to this embodiment includes the moving mechanism 13 including the chain conveyor 33, and foreign substances are mixed into the separator 12 while moving the separator winding body 10 in one direction by the chain conveyor 33. Inspect whether or not

  Therefore, according to the present embodiment, it is possible to realize the defect inspection apparatus 11 that can shorten the tact time required for defect inspection.

[Deformation of defect inspection system]
FIGS. 11A and 11B are side views showing a modification of the pedestal 31 provided in the defect inspection apparatus 11. Specifically, FIG. 11A shows a state where the separator winding body 10 is in the lowered position, and FIG. 11B shows a state where the separator winding body 10 is in the raised position.

  As shown in FIGS. 11A and 11B, the pedestal 31 may include a height adjusting mechanism 36 that switches the position of the separator winding body 10 to the lowered position or the raised position. Thereby, the rotational radius of the circular orbit along which the separator winding body 10 moves can be changed. By changing the distance from the radiation source 2 to the separator 12 by the height adjustment mechanism 36, the magnification of the captured image by the TDI sensor 4 can be changed.

[Embodiment 3]
The following will describe another embodiment of the present invention with reference to FIG. 12 and FIG. For convenience of explanation, members having the same functions as those described in the embodiment are given the same reference numerals, and descriptions thereof are omitted.

[Configuration of defect inspection equipment]
12A to 12H are schematic diagrams illustrating a schematic configuration and an operation state of the defect inspection apparatus 21 according to the third embodiment. The defect inspection apparatus 21 according to the present embodiment includes a first pedestal 31a and a second pedestal 31b, and sequentially inspects whether or not foreign substances are mixed in the separator 12 by sliding them.

  As shown in FIGS. 12A to 12H, the defect inspection apparatus 21 includes a radiation source 2, a moving mechanism 23, and a TDI sensor 4.

  The radiation source 2 and the TDI sensor 4 are disposed at the inspection position D11. In the defect inspection apparatus 21, at the inspection position D <b> 11, while the separator winding body 10 reciprocates a plurality of times (single pendulum motion) around the radiation source 2 by the driving unit 32, different regions of the separator 12 are moved a plurality of times. Take a picture. Then, by analyzing these captured images, it is inspected whether foreign matter is mixed in the separator 12 or not.

  In the defect inspection apparatus 21, as shown in FIG. 12A, in the initial state where the first pedestal 31a is located at the first loading / unloading position C11 and the second pedestal 31b is located at the inspection position D11, The separator winding body 10 before the inspection is set on one pedestal 31a.

  Next, as shown in FIG. 12B, the first pedestal 31a and the second pedestal 31b are slid. As a result, the first pedestal 31a moves to the inspection position D11, and the second pedestal 31b moves to the second loading / unloading position C12. And the test | inspection of the separator winding body 10 set to the 1st base 31a is started.

  Next, as shown in FIG. 12C, during the inspection of the separator winding body 10 set on the first pedestal 31a, the separator winding body 10 before the inspection is set on the second pedestal 31b.

  Next, as shown in FIG. 12D, when the inspection of the separator wound body 10 set on the first pedestal 31a is completed, the first pedestal 31a and the second pedestal 31b are slid. Accordingly, the first pedestal 31a moves to the first loading / unloading position C11, and the second pedestal 31b moves to the inspection position D11. And the test | inspection of the separator winding body 10 set to the 2nd base 31b is started.

  Next, as shown in FIG. 12E, during the inspection of the separator winding body 10 set on the second pedestal 31b, the separator winding body 10 after inspection set on the first pedestal 31a is removed. .

  Next, as shown in FIG. 12 (f), during the inspection of the separator winding body 10 set on the second pedestal 31b, the separator winding body 10 before the inspection is set on the first pedestal 31a.

  Next, as shown in FIG. 12G, when the inspection of the separator wound body 10 set on the second pedestal 31b is completed, the first pedestal 31a and the second pedestal 31b are slid. As a result, the first pedestal 31a moves to the inspection position D11, and the second pedestal 31b moves to the second loading / unloading position C12.

  Next, as shown in FIG. 12 (h), the separator winding body 10 set on the second pedestal 31b is removed during the inspection of the separator winding body 10 set on the first pedestal 31a. Thereafter, by repeating the operations shown in FIG. 12C to FIG. 12H, it is possible to sequentially inspect whether or not foreign matter is mixed in the separator 12.

[Summary of defect inspection equipment]
As described above, the defect inspection apparatus 21 according to this embodiment includes the moving mechanism 23 that slides the first pedestal 31a and the second pedestal 31b.

  Therefore, according to the present embodiment, it is possible to realize the defect inspection apparatus 21 that can shorten the tact time required for defect inspection.

(Modification of defect inspection equipment)
FIG. 13 is a side view showing a modification of the defect inspection apparatus 21. As shown in FIG. 13, the defect inspection apparatus 21 a includes a moving mechanism 38 including four pedestals 31 and a chain conveyor 37 that moves each pedestal 31. The chain conveyor 37 includes a chain 331 and a plurality of gears (sprockets) 332.

  In this defect inspection apparatus 11, first, the separator winding body 10 before inspection is set on the base 31 at the loading position S11.

  Next, the chain conveyor 37 is moved forward, and the separator winding body 10 at the loading position S11 is moved to the inspection position D11.

  Next, by moving the chain conveyor 37 back and forth, the separator winding body 10 is reciprocated a plurality of times (single pendulum motion) about the radiation source 2 as a center. In addition, the separator winding body 10 is rotated by a predetermined angle every time it reciprocates once. Thus, different regions of the separator 12 are photographed a plurality of times, and these photographed images are analyzed to inspect whether or not foreign matter is mixed in the separator 12.

  Next, while the separator winding body 10 is inspected at the inspection position D11, the separator winding body 10 before inspection is set on the pedestal 31 at the loading position S11.

  Next, when the inspection of the separator wound body 10 is completed at the inspection position D11, the chain conveyor 37 is advanced. Thereby, the separator winding body 10 after an inspection moves to the taking-out position E11, and the separator winding body 10 before an inspection moves to the inspection position D11. And while removing the separator winding body 10 after the inspection set to the base 31 located in the extraction position E11, the separator winding body 10 before the inspection is set to the base 31 at the loading position S11.

  By repeating the above operation, it is possible to sequentially inspect whether or not foreign material is mixed in the separator 12.

  The present invention is not limited to the above-described embodiments, and various modifications are possible within the scope shown in the claims, and embodiments obtained by appropriately combining technical means disclosed in different embodiments. Is also included in the technical scope of the present invention.

1 Defect inspection equipment (inspection equipment)
2 Radiation source 3, 3a, 3b, 13, 23, 38 Movement mechanism 4 TDI sensor 8 Core 10 Separator winding body (inspection object / film winding body)
C Circular orbit 12 Separator (film)
P1 First point P2 Second point R Electromagnetic wave (X-ray)

Claims (14)

For the inspection object, a radiation source that emits electromagnetic waves radially from the thickness direction of the inspection object;
A TDI sensor which is installed on the opposite side of the radiation source with respect to the inspection object and detects the electromagnetic wave transmitted through the inspection object;
A moving mechanism for moving an inspection region in the inspection object while keeping the distance between the radiation source, the inspection object and the TDI sensor substantially constant;
An inspection apparatus comprising:   The inspection apparatus according to claim 1, wherein the moving mechanism moves the inspection object along a circular orbit centered about the radiation source.   The inspection apparatus according to claim 2, wherein the moving mechanism reciprocates the inspection object a plurality of times between a first point and a second point located on the circular orbit.   The inspection apparatus according to claim 3, wherein the TDI sensor detects the electromagnetic wave transmitted through the inspection object while the inspection object moves from the first point toward the second point.   The inspection apparatus according to claim 4, wherein the moving mechanism rotates the inspection object about an axis extending in the thickness direction while the inspection object moves from the second point to the first point.   The TDI sensor detects the inspection while the inspection object moves from the first point toward the second point and while the inspection object moves from the second point toward the first point. The inspection apparatus according to claim 3, wherein the electromagnetic wave transmitted through the object is detected.   The moving mechanism is an axis extending in the thickness direction when the inspection object reaches the second point from the first point and when the inspection object reaches the first point from the second point. The inspection apparatus according to claim 6, wherein the inspection object is rotated about the center.   The inspection apparatus according to claim 1, wherein the inspection object has a substantially circular outer shape when viewed from the thickness direction.   The inspection apparatus according to claim 8, wherein the inspection object is a film winding body including a cylindrical core and a film wound around an outer peripheral surface of the core.   The inspection apparatus according to claim 1, wherein the electromagnetic wave is an X-ray. For the inspection object, an emission step of emitting electromagnetic waves radially from the radiation source from the thickness direction of the inspection object;
A moving step of moving the inspection area in the inspection object;
Detecting the electromagnetic wave transmitted through the inspection object with a TDI sensor,
An inspection method for moving the inspection region while maintaining a substantially constant distance between the radiation source, the inspection object, and the TDI sensor in the moving step.   A film including a defect inspection step of inspecting a defect of the film with respect to a film winding body including a cylindrical core and a film wound around an outer peripheral surface of the core by the inspection method according to claim 11. A method of manufacturing a wound body. A slitting process for slitting the film from a raw material wider than the film,
A film winding step of obtaining the film winding body by winding the film slit in the slit step on the core;
A packaging step of packaging the film winding body manufactured in the film winding step,
The manufacturing method of the film winding body of Claim 12 with which the said defect inspection process is provided before the said packaging process after the said slit process.   The method for producing a film winding body according to claim 12 or 13, wherein in the defect inspection step, the presence or absence of a foreign matter of 100 µm or more is inspected.

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