JP2018028452A - Measurement instrument and measurement method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a measurement instrument and a measurement method which are capable of simply obtaining an amount of rotational angle and an amount of displacement.SOLUTION: A measurement instrument 1 comprises: a first reference wall surface S11; a second reference wall surface S12 vertical to the first reference wall surface; and a first measuring device 41, a second measuring device 42 and a third measuring device 43 each of which is mounted on a measurement object OB so as to interlock with the measurement object. When an XYZ rectangular coordinate system with a plane parallel with the first reference wall surface as an XY plane and a plane parallel with the second reference wall surface as a YZ plane is defined, the first measuring device and the second measuring device are configured to measure an amount of displacement or a distance of a position relative to the first reference wall surface in a first measuring direction inclined at a certain angle to a direction in which the first measuring device and the second measuring device are separated from each other, and the third measuring device is configured to measure an amount of displacement or a distance of the position relative to the second reference wall surface in a second measuring direction inclined at a certain angle to the first measuring direction.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a measuring apparatus and a measuring method used for obtaining a rotation angle amount and a displacement amount of an object to be measured.

  Conventionally, for example, spheres fixed to both ends of a mount shaft of an engine mount are irradiated with measurement light from three displacement meters, respectively, and the center axis of the mount shaft is translated using the measurement results of each displacement meter A technique for calculating the amount and the biaxial rotation amount is known (for example, Patent Document 1).

JP 2011-43484 A

  However, the technique disclosed in Patent Document 1 has a problem that the measurement target is limited to a shaft-like object, and the configuration of the measurement apparatus is complicated, resulting in lack of simplicity.

  An object of the present invention is to provide a measuring apparatus and a measuring method that can easily determine the rotation angle amount and the displacement amount of an object to be measured. It is.

The measuring apparatus of the present invention includes a first measuring device, a second reference wall surface perpendicular to the first reference wall surface, a first measuring device attached to the measured object so as to be interlocked with the measured object, When an XYZ orthogonal coordinate system is defined, comprising two measuring devices and a third measuring device, wherein a plane parallel to the first reference wall surface is defined as an XY plane, and a plane parallel to the second reference wall surface is defined as a YZ plane The rotation angle amount of the object to be measured in the XZ plane, the amount of displacement in the X-axis direction, and the amount of displacement in the Z-axis direction from the reference state of the object to be measured are respectively used for obtaining the amount of rotation. The first measuring device and the second measuring device are arranged in a first measuring direction inclined at a constant angle with respect to a separating direction between the first measuring device and the second measuring device. Of the displacement of the position relative to the first reference wall surface, or The third measuring device is configured to measure the distance to the first reference wall surface in one measuring direction, and the third measuring device is a second measuring direction inclined at a constant angle with respect to the first measuring direction. The displacement amount of the position relative to the second reference wall surface is measured, or the distance to the second reference wall surface in the second measurement direction is measured.
According to the measuring apparatus of the present invention, the rotation angle amount and the displacement amount of the object to be measured can be easily obtained.

The measurement apparatus of the present invention provides a first measurement result and a second measurement result obtained from the first measurement device, the second measurement device, and the third measurement device, respectively, when the measured object moves from the reference state. And a calculation unit configured to perform calculation using the third measurement result, and the calculation unit uses the first measurement result and the second measurement result to calculate the object to be measured. The amount of rotation angle in the XZ plane from the reference state is calculated, and the amount of displacement of the measured object in the X-axis direction from the reference state is calculated using the amount of rotation angle and the third measurement result. Preferably, the amount of displacement of the object to be measured in the Z-axis direction from the reference state is calculated using the rotation angle amount, the first measurement result, and the second measurement result.
As a result, the rotation angle amount and the displacement amount of the object to be measured can be obtained more simply.

In the measuring device of the present invention, the object to be measured may be the steel plate in a seismic isolation device having a laminated structure of a plurality of rubber layers and steel plates.
Even in this case, the rotation angle amount and the displacement amount of the object to be measured can be easily obtained.

The measuring method of the present invention includes a first measuring device, a first reference wall surface, a second reference wall surface perpendicular to the first reference wall surface, and a first measuring device attached to the measured object so as to interlock with the measured object. A measuring method using a measuring device including a second measuring device and a third measuring device, wherein a plane parallel to the first reference wall surface is defined as an XY plane, and a plane parallel to the second reference wall surface is defined as When an XYZ Cartesian coordinate system is defined as a YZ plane, when the object to be measured moves from a reference state, the first measuring device and the second measuring device are the first measuring device. And a displacement amount of the position relative to the first reference wall surface in the first measurement direction inclined at a constant angle with respect to the separation direction of the second measuring devices, or the first measurement direction in the first measurement direction. Measure the distance to the reference wall and A step of obtaining a measurement result and a second measurement result, and when the object to be measured moves from the reference state, the third measuring device is inclined at a certain angle with respect to the first measurement direction. Measuring a displacement amount of a position relative to the second reference wall surface in two measurement directions or a distance to the second reference wall surface in the second measurement direction to obtain a third measurement result; and Using the first measurement result and the second measurement result, calculating a rotation angle amount on the XZ plane of the object to be measured from the reference state, the rotation angle amount and the third measurement result And calculating a displacement amount in the X-axis direction from the reference state of the object to be measured, using the rotation angle amount, the first measurement result, and the second measurement result, Z-axis direction from the reference state of the object to be measured It calculates the amount of displacement, comprising the steps, a.
According to the measuring method of the present invention, it is possible to easily obtain the rotation angle amount and the displacement amount of the object to be measured.

In the measurement method of the present invention, the object to be measured may be the steel plate in a seismic isolation device having a laminated structure of a plurality of rubber layers and steel plates.
Even in this case, the rotation angle amount and the displacement amount of the object to be measured can be easily obtained.

  According to the present invention, it is possible to provide a measuring apparatus and a measuring method that make it possible to easily determine the rotation angle amount and the displacement amount of an object to be measured.

It is sectional drawing which follows the AA line of FIG. 2 which shows one Embodiment of the measuring apparatus of this invention with a partial block diagram. It is a side view which shows the measuring apparatus of FIG. 1 in the reference | standard state before a to-be-measured object moves. It is a side view which shows the measuring apparatus of FIG. 1 in the state after the to-be-measured object moved from the reference state. It is a side view which shows the measuring apparatus of FIG. 1 in the same state as FIG. It is a side view which shows the modification of the measuring apparatus of this invention in the reference | standard state before a to-be-measured object moves. FIG. 6 is a side view showing the measurement apparatus of FIG. 5 in a state after an object to be measured has moved from a reference state. It is a side view which shows the measuring apparatus of FIG. 5 in the same state as FIG.

  Hereinafter, embodiments of a measuring apparatus and a measuring method according to the present invention will be described with reference to the drawings.

With reference to FIGS. 1-4, one Embodiment of the measuring apparatus and measuring method of this invention is described. The measuring apparatus 1 of the present embodiment has a predetermined XYZ Cartesian coordinate system, the amount of rotation angle in the XZ plane when the measured object OB moves, the amount of displacement in the X-axis direction, and the displacement in the Z-axis direction. Each is used to determine the quantity.
Here, the “rotational angle amount in the XZ plane”, the “displacement amount in the X-axis direction”, and the “displacement amount in the Z-axis direction” when the measured object OB moves are determined in the measured object OB. Assume that a predetermined reference point (for example, center point C) is used as a reference, respectively. The object to be measured OB may be any object, but in this example, it is a single steel plate in the seismic isolation device 30 for a building structure.
The measuring device 1 of this example is, for example, in a research site for a seismic isolation device, when a specific load (in the size and direction) is applied to the seismic isolation device 30, and the rotation angle amount and displacement of the steel plate of the seismic isolation device 30 Used to determine the quantity. Thereby, it becomes possible to accurately evaluate the performance of the seismic isolation device.

  FIG. 1 is a cross-sectional view showing the measuring apparatus 1 of the present embodiment along the line AA in FIG. FIG. 2 is a side view showing the measuring apparatus 1 of FIG. 1 in a reference state before the object to be measured OB moves, and shows a state when viewed from the lower side of FIG. 3 and 4 are side views showing the measuring apparatus 1 of FIG. 1 in a state after the object to be measured OB has moved from the reference state. In FIGS. 3 and 4, the state of the object to be measured OB is the same, and for convenience of explanation, separate drawings are used.

The seismic isolation device 30 has a central axis extending in the vertical direction. In this specification, “upper” and “lower” refer to upper and lower in the vertical direction (direction of gravity), respectively.
The seismic isolation device 30 includes flanges 31 and 32 provided at upper and lower ends of the seismic isolation device 30 and a laminated structure portion that connects the flanges 31 and 32 to each other. The laminated structure portion has a structure in which a plurality (two in the illustrated example) rubber layers 33 and one or a plurality (one in the illustrated example) steel plates are alternately laminated in the vertical direction. In the example shown in the figure, one steel plate constituting the laminated structure portion is a measured object OB. The steel plate, which is the object to be measured OB, is configured to have a larger diameter than each rubber layer 33, and thus protrudes to the outer peripheral side from each rubber layer 33.

  The upper flange 31 of the seismic isolation device 30 is fixed to the upper panel 51, and the lower flange 32 of the seismic isolation device 30 is fixed to the lower panel 52. The upper board 51 and the lower board 52 each extend in the horizontal direction (direction perpendicular to the vertical direction) and face each other. The upper board 51 is connected to a testing machine (not shown). This testing machine is configured to be able to move the upper board 51 relative to the lower board 52 in a substantially horizontal direction while applying a downward load to the upper board 51. The lower board 52 is fixed to a floor or the ground, for example.

  In this example, the “reference state” of the measured object OB is the measured object OB when the seismic isolation device 30 is in an undeformed state that is not deformed by the action of the test machine, as shown in FIG. Refers to the state. When the measured object OB is in the reference state, the measured object OB extends in the horizontal direction.

  Note that when the upper flange 31 of the seismic isolation device 30 moves relative to the lower flange 32 in a substantially horizontal direction, the object to be measured OB shown in FIG. 3 is viewed by the action of the rubber layer 33 in the laminated structure portion. As can be seen, not only horizontal displacement occurs in the steel plates in the laminated structure, but also vertical displacement and rotation. At present, it is difficult to accurately obtain the displacement amount and the rotation angle amount of the steel plate in such a laminated structure by calculation such as analysis based on the relative displacement amount between the upper and lower flanges 31 and 32. However, according to the measuring apparatus 1 and the measuring method of this embodiment, the displacement amount and the rotation angle amount of the steel plate in the laminated structure can be easily obtained.

  The measuring device 1 includes a pair of measuring units 80 and 180, a recorder 60, and a computer device 70. For convenience, the recorder 60 and the computer device 70 are shown in a block diagram in FIG. 1, and are not shown in FIGS. 2 to 4.

As shown in FIG. 1, the pair of measurement units 80 and 180 are disposed to face each other in the diameter direction of the seismic isolation device 30 with the seismic isolation device 30 interposed therebetween.
One measuring unit 80 includes a first reference wall surface S11, a second reference wall surface S12, a first measuring device 41, a second measuring device 42, and a third measuring device 43.
The other measurement unit 180 includes a first reference wall surface S111, a second reference wall surface S112, a first measurement device 141, a second measurement device 142, and a third measurement device 143.
Since the pair of measurement units 80 and 180 have the same configuration, the configuration and operation of one measurement unit 80 will be mainly described below, and detailed description of the configuration and operation of the other measurement unit 180 is omitted. To do.
The first reference wall surfaces S11 and S111 of the measuring units 80 and 180 extend in the horizontal direction, and are composed of upper surfaces of the first reference walls 11 and 111 fixed to the common lower plate 52, respectively.
The second reference wall surface S12 is perpendicular to the first reference wall surface S11. The second reference wall surface S12 is on the side facing the first to third measuring devices 41 to 43 in the second reference wall 12 whose position is fixed to the first reference wall 11 perpendicular to the first reference wall 11. Consists of faces.
In this example, the first reference wall 11 and the second reference wall 12 are each made of a laser reflector.

In this example, an XYZ orthogonal coordinate system is defined in which a plane parallel to the first reference wall surface S11 is an XY plane and a plane parallel to the second reference wall surface S12 is a YZ plane.
Note that the first reference wall surface S11 may be inclined with respect to the horizontal direction.
Further, as shown in FIG. 1, in this example, the X-axis direction is parallel to the longitudinal direction of the first reference wall surface S11, and the Y-axis direction is a direction in which the pair of measuring units 80 and 180 face each other. .
In this specification, “tilt” includes a case where the tilt angle is vertical (90 °).

The first to third measuring instruments 41 to 43 are attached to the measured object OB by the holding unit 40. Thereby, the positions of the first to third measuring instruments 41 to 43 are fixed with respect to the measured object OB and with respect to each other. Specifically, in the present example, the first to third measuring instruments 41 to 43 are disposed on the portion of the steel sheet that is the object to be measured OB that protrudes to the outer peripheral side from the rubber layer 33 via the holding unit 40. Is attached. The specific configuration of the holding unit 40 is arbitrary.
In this example, the first to third measuring devices 41 to 43 are laser displacement meters, respectively, but may be other displacement meters.

The first measuring device 41 and the second measuring device 42 are directed so as to irradiate the first reference wall surface S11 with laser light (measurement light) in directions parallel to each other. More specifically, the first measuring device 41 and the second measuring device 42 are separated from each other between the first measuring device 41 and the second measuring device 42 (in this example, the v-axis direction shown in FIGS. 2 to 4). Are directed to irradiate in a first measurement direction (the u-axis direction shown in FIGS. 2 to 4) inclined at a constant angle (90 ° in this example).
Here, the “separating direction between the first measuring device 41 and the second measuring device 42” means the direction of a straight line connecting the starting point of the measuring light of the first measuring device 41 and the starting point of the measuring light of the second measuring device 42. Point to. Further, the “constant angle” is an angle that does not change even when the object to be measured OB moves. That is, the first measurement direction changes in conjunction with the measured object OB when viewed in the XYZ orthogonal coordinate system.
As shown in FIG. 2, in the present example, the first measurement direction when the measured object OB is in the reference state is parallel to the Z-axis direction.
And the 1st measuring device 41 and the 2nd measuring device 42 are each comprised so that the displacement amount of the position with respect to 1st reference wall surface S11 in the said 1st measurement direction may be measured. In this example, the first measuring device 41 and the second measuring device 42 output the measured values to the recorder 60 at any time during the measurement.

Here, for convenience of explanation, the measurement values output from the first measuring device 41 and the second measuring device 42 are represented by Rdisp _NE and Rdisp _NW , respectively. The measured values Rdisp _NE and Rdisp _NW of the first measuring device 41 and the second measuring device 42 are as shown in FIG. 2 when the measured object OB is in the reference state (when the seismic isolation device 30 is in the undeformed state). ) Takes a value of 0 (zero), and takes a positive (plus) value when the object to be measured OB moves as the seismic isolation device 30 is compressed and deformed by the action of the testing machine.
Note that the measured values of the first measuring instrument 141 and the second measuring instrument 142 of the measuring unit 180 on the other side are Rdisp _SE and Rdisp _SW , respectively.
In this specification, “moving” refers to the motion of an object and is a concept including translational motion and rotational motion.

  As shown in FIG. 2, in this example, the first measuring instrument 41 and the second measuring instrument 42 pass through the center point C of the measured object OB and parallel to the YZ plane when the measured object OB is in the reference state. The distance to the virtual plane in the X-axis direction is the same. In this example, the first measuring instrument 41 and the second measuring instrument 42 have the same Z coordinate and Y coordinate when the measured object OB is in the reference state. In this example, the center point C of the measured object OB, which is used as a reference point when obtaining the rotation angle amount and the displacement amount, is the center point in the thickness direction of the circular steel plate that is the measured object OB. is there.

The third measuring device 43 measures laser light (measurement light) in a second measurement direction (the v-axis direction shown in FIGS. 2 to 4) inclined at a constant angle (90 ° in this example) with respect to the first measurement direction. ) Is directed to the second reference wall surface S12. More specifically, the third measuring instrument 43 is configured to measure the displacement amount of the position with respect to the second reference wall surface S12 in the second measurement direction.
As shown in FIG. 2, in this example, the second measurement direction when the measured object OB is in the reference state is parallel to the X-axis direction. The “constant angle” is an angle that does not change even when the object to be measured OB moves.

For convenience of explanation, the measurement value output from the third measuring instrument 43, represented by HDISP _N. The measured value Hdisp _N of the third measuring instrument 43 is obtained when the seismic isolation device 30 is in a reference state as shown in FIG. 2 (when the seismic isolation device 30 is in an undeformed state). The value of 0 (zero) is assumed, and the center point C of the object OB to be measured is compared with that in the reference state as shown in FIGS. When the seismic isolation device 30 is deformed so as to move away from the wall surface S12, a negative value is taken.
Note that the measurement value of the third measuring device 143 of the measurement unit 180 on the other side is Hdisp _S.

  The recorder 60 is composed of, for example, a data logger. The recorder 60 is communicably connected to each of the first to third measuring devices 41 to 43 via wired or wireless communication means. The recorder 60 is first to third during at least the time when the seismic isolation device 30 is deformed by the action of the testing machine (and thus the measured object OB moves (also referred to as “during measurement period” in this specification)). The measured values of the measuring instruments 41 to 43 are read at any time or periodically (for example, at regular time intervals) and recorded therein, and the recorder 60 is used for the first to the first measurement period or after the measurement period. The measurement values of the third measuring devices 41 to 43 are transmitted to the computer device 70 via wired or wireless communication means, or the first to third measuring devices 41 to 43 from the recorder 60 to the computer device 70. The transmission of the measured value may be realized via an external memory (SD card or USB memory).

The computer device 70 includes a calculation unit 71, a storage unit 72, an input unit 74, and a display unit 75.
In FIG. 1, the computer 70 is only schematically illustrated by functional blocks, and the hardware configuration of the computer 70 includes an arithmetic unit 71, a storage unit 72, an input unit 74, and a display unit 75. Any function may be adopted as long as each function is realized. For example, when viewing the hardware configuration of the computer 70, the computer 70 may be configured by one device or a plurality of devices.

The computing unit 71 includes, for example, one or a plurality of CPUs, and includes a storage unit 72, an input unit 74, and a display unit 75 by executing various programs stored in the storage unit 72. Various processes are executed while controlling the entire apparatus 70.
In addition, the calculation unit 71 executes the calculation program 73 stored in the storage unit 72, so that when the measured object OB moves from the reference state, the first measurement device, the second measurement device, and the third measurement device The calculation is performed using the first measurement result, the second measurement result, and the third measurement result respectively obtained.
In this example, the first measurement result, the second measurement result, and the third measurement result are the first when the measured object OB is in the state after moving from the reference state (the state in FIGS. 3 and 4). The measured values Rdisp _NE , Rdisp _NW , and Hdisp _N output from the measuring device 41, the second measuring device 42, and the third measuring device 43, respectively.
The operating section 71 includes a first measurement result (rdisp _NE) and the second measurement result using the (rdisp _NW), and calculates the rotation angle in the XZ plane from the reference state of the measured object OB. Further, the calculation unit 71 calculates the amount of displacement in the X-axis direction from the reference state of the measured object OB using the calculated rotation angle amount and the third measurement result (Hdisp _N ). Further, the calculation unit 71 uses the rotation angle amount, the first measurement result (Rdisp _NE ), and the second measurement result (Rdisp _NW ), and the amount of displacement in the Z-axis direction from the reference state of the measured object OB. Is calculated.
The calculation method of the rotation angle amount in the XZ plane, the displacement amount in the X-axis direction, and the displacement amount in the Z-axis direction will be described in more detail later.

  The storage unit 72 includes, for example, one or a plurality of ROMs and / or RAMs, and various programs (calculation program 73 and the like) for the calculation unit 71 to execute, a first measurement device, a second measurement device, and a second measurement device. Various information such as a first measurement result, a second measurement result, and a third measurement result respectively obtained from the three measuring devices is stored.

The input unit 74 includes, for example, a keyboard, a mouse, and / or a push button, and receives input from the user.
The display unit 75 is composed of a liquid crystal panel, for example, and displays various information such as a rotation angle amount in the XZ plane, a displacement amount in the X-axis direction, and a calculation result of the displacement amount in the Z-axis direction.

  Next, with reference to FIG. 3 and FIG. 4, the amount of rotation angle in the XZ plane from the reference state of the object OB to be measured to the state after moving, the amount of displacement in the X-axis direction, and the amount in the Z-axis direction An example of a method for calculating the displacement amount will be described in order. In the following example, the amount of rotation angle in the XY plane and the YZ plane from the reference state to the state after the object to be measured OB moves is 0 (zero), and the displacement in the Y-axis direction Assume that the amount was 0 (zero).

式（１）、（２）において、ベクトルV_E、V_Wは、それぞれ第１測定器４１、第２測定器４２の光線（又は、その延長線）上にあり、被測定物体ＯＢの中心点Ｃを通るとともにｖ軸方向に延びる仮想線を起点とし、第１基準壁面Ｓ１１を終点とする。V₀は、図２に示すように、被測定物体ＯＢの初期状態での、ベクトルV_E、V_Wの大きさである。
すると、回転角度量θは、つぎの式（３）で求められる。

式（３）において、ΔＸは、図３に示すように、第１測定器４１の中心点と第２測定器４２の中心点までの、ｖ軸方向の距離である。このように、第１測定結果（Rdisp_NE）及び第２測定結果（Rdisp_NW）を用いて、被測定物体ＯＢの基準状態からのＸＺ平面内での回転角度量θを算出できる。
なお、上述したように、第１測定器４１と第２測定器４２は、第１測定器４１及び第２測定器４２どうしの離間方向（本例では、図２〜図４に示すｖ軸方向）に対して一定の角度（本例では、９０°）で傾斜した第１測定方向（図２〜図４に示すｕ軸方向）に、それぞれレーザ光（測定光）を照射するように指向されている。すなわち、第１測定器４１及び第２測定器４２どうしの離間方向が第１測定方向と同じではなく、また、第１測定器４１と第２測定器４２はそれぞれ測定光を照射する方向（第１測定方向）が互いに平行である。このように第１測定器４１と第２測定器４２を配置することにより、式（３）を用いてＸＺ平面内での回転角度量θを求めることが可能となる。 (Rotation angle amount in XZ plane)
First, an example of a method for calculating the rotation angle amount in the XZ plane from the reference state of the measured object OB to the state after moving will be described with reference to FIG. In this example, the calculation unit 71 obtains the rotation angle amount by the method described below, but may obtain it by another method.
The rotation angle amount in the XZ plane from the reference state of the measured object OB to the state after moving is represented by “θ”. This rotation angle amount θ is a rotation angle in the XZ plane around the center point C of the object OB to be measured, and a counterclockwise rotation when viewing the + Y direction is positive.
In formulas (1) to (12) in this specification, bold indicates a vector or matrix, and thin indicates a scalar. For example, the letters V _E , V _W , L ₁ , L ₂ , and L ₃ may be represented in bold or thin in these formulas, but they are represented in bold. Represents a vector, and if it is represented in fine letters, it represents the size of each vector.
Here, the following expressions (1) and (2) are established for the magnitudes of the vectors V _E and V _W.

In Expressions (1) and (2), vectors V _E and V _W are on the light beams (or extensions thereof) of the first measuring device 41 and the second measuring device 42, respectively, and are the center points of the measured object OB. An imaginary line passing through C and extending in the v-axis direction is a starting point, and the first reference wall surface S11 is an ending point. As shown in FIG. 2, V ₀ is the magnitude of the vectors V _E and V _{W in} the initial state of the object to be measured OB.
Then, the rotation angle amount θ is obtained by the following equation (3).

In Expression (3), ΔX is the distance in the v-axis direction from the center point of the first measuring device 41 to the center point of the second measuring device 42, as shown in FIG. As described above, the rotation angle amount θ in the XZ plane from the reference state of the measured object OB can be calculated using the first measurement result (Rdisp _NE ) and the second measurement result (Rdisp _NW ).
Note that, as described above, the first measuring instrument 41 and the second measuring instrument 42 are separated from each other between the first measuring instrument 41 and the second measuring instrument 42 (in this example, the v-axis direction shown in FIGS. 2 to 4). ) With respect to the first measurement direction (the u-axis direction shown in FIGS. 2 to 4) inclined at a certain angle (90 ° in this example). ing. That is, the separation direction between the first measuring instrument 41 and the second measuring instrument 42 is not the same as the first measuring direction, and the first measuring instrument 41 and the second measuring instrument 42 each irradiate measurement light (first 1 measuring direction) are parallel to each other. By disposing the first measuring device 41 and the second measuring device 42 in this way, it is possible to obtain the rotation angle amount θ in the XZ plane using the equation (3).

Equation (3) is calculated using the first measurement result (Rdisp _NE ) and the second measurement result (Rdisp _NW ) of the measurement unit 80 on one side in the Y-axis direction with respect to the seismic isolation device 30. Seeking. However, in order to improve accuracy, the rotation angle amount obtained separately using the first measurement result (Rdisp _SE ) and the second measurement result (Rdisp _SW ) of the measurement unit 180 on the other side as in the following equation (4). It is even better to take the average with θ.

式（５）において、ベクトルL₁は、図４に示すように、ｕ軸方向に平行であり、被測定物体ＯＢの中心点Ｃを起点とし、第３測定器４３の光線（又は、その延長線）との交点を終点とする。ベクトルL₂+L₃は、第３測定器４３の光線（又は、その延長線）上にあり、ベクトルL₁の終点を起点とし、第２基準壁面Ｓ１２を終点とする。図２に示すように、ベクトルL₂の大きさ（L₂）は、被測定物体ＯＢが動いても一定であり、また、被測定物体ＯＢの基準状態でのベクトルL₃の大きさは、０（ゼロ）である。θは、式（３）又は（４）で求めた回転角度量θである。
そして、被測定物体ＯＢの基準状態からのＸ軸方向での変位量は、次の式（６）により求めることができる。

式（６）において、ベクトルL_1,0、L_2,0、L_3,0は、それぞれ、被測定物体ＯＢの基準状態でのベクトルL₁、L₂、L₃（ひいては、ベクトルL₁、L₂、L₃の初期値）に相当する。また、ベクトルe_xは、Ｘ軸方向の単位ベクトルである。
このように、式（３）又は（４）で求めた回転角度量θと、第３測定結果（Hdisp_N）とを用いて、被測定物体ＯＢの基準状態からのＸ軸方向での変位量を算出できる。なお、第３測定結果（Hdisp_N）の値は、図２に示す被測定物体ＯＢの初期状態では０（ゼロ）であり、図４に示す被測定物体ＯＢが動いた後の状態においては、負（マイナス）となる。
なお、第３測定器４３自体は被測定物体ＯＢの中心点Ｃから離れているが、Ｘ軸方向での変位量を算出するにあたっては、式（６）において、被測定物体ＯＢの中心点Ｃを起点とするベクトルL₁、L_1,0を用いているので、被測定物体ＯＢの中心点ＣのＸ軸方向での変位量を正確に求めることが可能である。 (Displacement in the X-axis direction)
Next, an example of a method for calculating the amount of displacement in the X-axis direction from the reference state of the measured object OB to the state after moving will be described with reference to FIG. In this example, the calculation unit 71 obtains the displacement amount in the X-axis direction by the method described below, but may obtain it by another method.
The amount of displacement in the X-axis direction from the reference state of the measured object OB is the amount of displacement in the X-axis direction of the center point C of the measured object OB from the reference state of the measured object OB to the state after moving. Is defined as
Here, the following equation (5) holds for the vectors L ₁ , L ₂ , and L ₃ .

In Expression (5), as shown in FIG. 4, the vector L ₁ is parallel to the u-axis direction and starts from the center point C of the measured object OB. The point of intersection with the line is the end point. The vector L ₂ + L ₃ is on the light beam (or an extension thereof) of the third measuring device 43, and has an end point of the vector L ₁ as a starting point and a second reference wall surface S12 as an end point. As shown in FIG. 2, the magnitude of the vector L ₂ (L ₂ ) is constant even when the measured object OB moves, and the magnitude of the vector L _{3 in} the reference state of the measured object OB is 0 (zero). θ is the rotation angle amount θ obtained by the equation (3) or (4).
Then, the displacement amount in the X-axis direction from the reference state of the object to be measured OB can be obtained by the following equation (6).

In the equation (6), the vectors L _1,0 , L _2,0 , L _3,0 are the vectors L ₁ , L ₂ , L ₃ (and thus the vectors L ₁ , L ₃ ) in the reference state of the measured object OB. Corresponds to the initial values of L ₂ and L ₃ . The vector e _x is a unit vector in the X-axis direction.
As described above, the amount of displacement in the X-axis direction from the reference state of the object OB to be measured using the rotation angle amount θ obtained by the expression (3) or (4) and the third measurement result (Hdisp _N ). Can be calculated. Note that the value of the third measurement result (Hdisp _N ) is 0 (zero) in the initial state of the measured object OB shown in FIG. 2, and in the state after the measured object OB shown in FIG. Negative (minus).
The third measuring instrument 43 itself is away from the center point C of the measured object OB. However, in calculating the displacement amount in the X-axis direction, the center point C of the measured object OB is calculated in Equation (6). Since the vectors L ₁ and L _1,0 are used as starting points, it is possible to accurately determine the amount of displacement in the X-axis direction of the center point C of the measured object OB.

Note that equation (6) is seeking a displacement amount in the X-axis direction using the third measurement result of the measuring unit 80 in the Y-axis direction one side against the seismic isolation device 30 (HDISP _N). However, in order to improve accuracy, the average of the displacement amount in the X-axis direction obtained separately using the third measurement result (Hdisp _S ) of the measurement unit 180 on the other side as the value of the following equation (7). If you take it, it's even better.

式（８）において、ベクトルVは、図３に示すように、ｕ軸方向に平行であり、被測定物体ＯＢの中心点Ｃを起点とし、第１基準壁面Ｓ１１を終点とする。ベクトルV_E、V_Wは、上述のとおり、それぞれ第１測定器４１、第２測定器４２の光線上にあり、被測定物体ＯＢの中心点Ｃを通るとともにｖ軸方向に延びる仮想線を起点とし、第１基準壁面Ｓ１１を終点とする。
そして、式（５）に示した行列Ｒと、Ｚ軸方向の単位ベクトルe_zを用いて、ベクトルV_E、V_Wは、次の式（９）、（１０）のように表すことができる。

式（９）、（１０）において、V₀は、図２に示すように、被測定物体ＯＢの初期状態での、ベクトルV_E、V_Wの大きさである。
そして、被測定物体ＯＢの基準状態からのＺ軸方向での変位量は、次の式（１１）により求めることができる。

式（１１）において、ベクトルV_o、V_E,0、V_W,0は、それぞれ、被測定物体ＯＢの基準状態でのベクトルV、V_E、V_W（ひいては、ベクトルV、V_E、V_Wの初期値）に相当する。
このように、式（３）又は（４）で求めた回転角度量θと、第１測定結果（Rdisp_NE）及び第２測定結果（Rdisp_NW）とを用いて、被測定物体ＯＢの基準状態からのＺ軸方向での変位量を算出できる。
なお、第１測定器４１及び第２測定器４２自体は被測定物体ＯＢの中心点Ｃから離れているが、Ｚ軸方向での変位量を算出するにあたっては、式（１１）において、被測定物体ＯＢの中心点Ｃを起点とするベクトルV、V_oを用いているので、被測定物体ＯＢの中心点ＣのＺ軸方向での変位量を正確に求めることが可能である。 (Displacement in the Z-axis direction)
Next, an example of a method for calculating the amount of displacement in the Z-axis direction from the reference state of the measured object OB to the state after moving will be described with reference to FIG. In this example, the computing unit 71 obtains the amount of displacement in the Z-axis direction by the method described below, but may obtain it by another method.
The amount of displacement in the Z-axis direction from the reference state of the measured object OB is the amount of displacement in the Z-axis direction of the center point C of the measured object OB from the reference state of the measured object OB to the state after moving. Is defined as
Here, for the vector V, the following equation (8) holds.

In Expression (8), as shown in FIG. 3, the vector V is parallel to the u-axis direction, has a center point C of the measured object OB as a starting point, and has a first reference wall surface S11 as an end point. As described above, the vectors V _E and V _W are on the rays of the first measuring device 41 and the second measuring device 42, respectively, and start from virtual lines that pass through the center point C of the measured object OB and extend in the v-axis direction. The first reference wall surface S11 is the end point.
Then, a matrix R shown in equation (5), using the unit vector e _z of the Z-axis direction, the vector V _E, V _W, the following equation (9) can be expressed as (10) .

In equations (9) and (10), V ₀ is the magnitude of the vectors V _E and V _{W in} the initial state of the measured object OB, as shown in FIG.
Then, the displacement amount in the Z-axis direction from the reference state of the object to be measured OB can be obtained by the following equation (11).

In the equation (11), the vectors V _o , V _{E, 0} , V _{W, 0} are the vectors V, V _E , V _{W in} the reference state of the measured object OB (and thus the vectors V, V _E , V Equivalent to the initial value of _W ).
As described above, the reference state of the object OB to be measured is obtained by using the rotation angle amount θ obtained by the expression (3) or (4) and the first measurement result (Rdisp _NE ) and the second measurement result (Rdisp _NW ). The amount of displacement in the Z-axis direction can be calculated.
The first measuring instrument 41 and the second measuring instrument 42 themselves are separated from the center point C of the measured object OB. However, in calculating the displacement amount in the Z-axis direction, vector V originating the center point C of the object OB, because of the use of V _o, it is possible to determine accurately the amount of displacement in the Z axis direction of the center point C of the measured object OB.

Equation (11) is expressed in the Z-axis direction using the first measurement result (Rdisp _NE ) and the second measurement result (Rdisp _NW ) of the measurement unit 80 on one side in the Y-axis direction with respect to the seismic isolation device 30. The amount of displacement is obtained. However, in order to improve accuracy, the Z obtained separately using the first measurement result (Rdisp _SE ) and the second measurement result (Rdisp _SW ) of the measurement unit 180 on the other side as the value of the following equation (12). It is better to take the average of the amount of displacement in the axial direction.

Even when the object to be measured OB is displaced in the Y-axis direction from the reference state to the state after moving, the XZ plane is obtained by the method described using the above formulas (1) to (12). The amount of rotation angle inside, the amount of displacement in the X-axis direction, and the amount of displacement in the Z-axis direction can be calculated.
On the other hand, when there is a rotation angle amount in the XY plane and / or the YZ plane from the reference state to the state after the object to be measured OB moves, the rotation angle amount in the XZ plane, X The equations for calculating the displacement amount in the axial direction and the displacement amount in the Z-axis direction are different from the above equations (1) to (12).

  According to the measurement apparatus 1 and the measurement method of the example described above, since it can be used for the measurement object OB having various shapes and structures, high versatility and convenience can be obtained. Moreover, as a structure of the measuring apparatus 1, since it is only necessary to prepare at least two reference wall surfaces S11 and S12 and three measuring devices 41 to 43, the structure can be simplified. Therefore, the rotation angle amount and displacement amount of the object to be measured can be easily obtained.

Note that the present invention is not limited to the above example, and various modifications can be made to the measurement apparatus and the measurement method of the present invention.
5 to 7 show a modified example of the measuring apparatus 1. In this modification, the first measuring instrument 41 and the second measuring instrument 42 each measure and output the distance (not displacement) to the first reference wall surface S11 in the first measuring direction (u-axis direction). The third measuring instrument 43 is configured to measure and output the distance (not displacement) to the second reference wall surface S12 in the second measurement direction (v-axis direction). Only the points differ from the example described above with reference to FIGS. The 1st-3rd measuring devices 41-43 are good to comprise from a laser distance meter, for example. FIG. 5 shows the measuring apparatus 1 according to this modification in a reference state before the object to be measured OB moves. 6 and 7 show the measuring apparatus 1 of FIG. 5 in a state after the object to be measured OB has moved from the reference state. 6 and 7, the state of the object to be measured OB is the same, and for the convenience of explanation, separate drawings are used.

For convenience of explanation, in the reference state of the measured object OB shown in FIG. 5, the first measuring device 41, the second measuring instrument 42, and a measurement value output from the third measuring device 43, respectively DI _1, Represented by DI ₂ and DI ₃ . 6 and FIG. 7, the measured values output from the first measuring instrument 41, the second measuring instrument 42, and the third measuring instrument 43 in the state after the object to be measured OB has moved are DA _1. , represented by DA _2, DA _3.

式（１３）において、ΔＸは、図６に示すように、第１測定器４１の中心点と第２測定器４２の中心点までの、ｖ軸方向の距離である。このように、被測定物体ＯＢの動いた後の状態における第１測定結果（DA₁）及び第２測定結果（DA₂）を用いて、被測定物体ＯＢの基準状態からのＸＺ平面内での回転角度量θを算出できる。 In this modification, the rotation angle amount θ in the XZ plane from the reference state of the measured object OB to the state after moving is obtained by, for example, the following equation (13).

In Expression (13), ΔX is the distance in the v-axis direction from the center point of the first measuring device 41 to the center point of the second measuring device 42, as shown in FIG. In this way, using the first measurement result (DA ₁ ) and the second measurement result (DA ₂ ) in the state after the object to be measured OB moves, in the XZ plane from the reference state of the object to be measured OB. The rotation angle amount θ can be calculated.

式（１４）において、距離L₁は、図５に示すように、被測定物体ＯＢの中心点Ｃから、第３測定器４３の光線（又は、その延長線）までの、ｕ軸方向の距離である。距離L₄は、図５及び図７に示すように、被測定物体ＯＢの中心点Ｃから、第３測定器４３の光線の始点までの、ｖ軸方向の距離である。距離L₂は、図５に示すように、被測定物体ＯＢの初期状態における、被測定物体ＯＢの中心点Ｃから、第２基準壁面Ｓ１２までの、Ｘ軸方向の距離である。
式（１４）に示すように、式（１３）で求めた回転角度量θと、被測定物体ＯＢの動いた後の状態における第３測定結果（DA₃）とを用いて、被測定物体ＯＢの基準状態からのＸ軸方向での変位量を算出できる。
なお、被測定物体ＯＢの初期状態において、図５に示すように、L₂=L₄+DI₃であるから、式（１４）は、つぎの式（１５）に変換できる。

式（１５）に示すように、式（１３）で求めた回転角度量θと、被測定物体ＯＢの初期状態及び動いた後の状態における第３測定結果（DI₃、DA₃）とを用いて、被測定物体ＯＢの基準状態からのＸ軸方向での変位量を算出することもできる。 Further, in this modified example, the amount of displacement in the X-axis direction from the reference state of the measured object OB is the X-axis direction from the second reference wall surface S12 of the center point C of the measured object OB in the moved state. Since the distance in the X-axis direction from the second reference wall surface S12 of the center point C of the measured object OB in the initial state can be subtracted from the distance, the following equation (14) can be obtained.

In the equation (14), the distance L ₁ is the distance in the u-axis direction from the center point C of the measured object OB to the light beam (or an extension thereof) of the third measuring instrument 43 as shown in FIG. It is. The distance L ₄ is a distance in the v-axis direction from the center point C of the measured object OB to the start point of the light beam of the third measuring instrument 43 as shown in FIGS. As shown in FIG. 5, the distance L ₂ is a distance in the X-axis direction from the center point C of the measured object OB to the second reference wall surface S12 in the initial state of the measured object OB.
As shown in the equation (14), the measured object OB is obtained by using the rotation angle amount θ obtained in the equation (13) and the third measurement result (DA ₃ ) in the state after the measured object OB moves. The amount of displacement in the X-axis direction from the reference state can be calculated.
Since L ₂ = L ₄ + DI ₃ in the initial state of the object to be measured OB, as shown in FIG. 5, Expression (14) can be converted into the following Expression (15).

As shown in the equation (15), the rotation angle amount θ obtained in the equation (13) and the third measurement result (DI ₃ , DA ₃ ) in the initial state and the moved state of the object OB to be measured are used. Thus, the displacement amount in the X-axis direction from the reference state of the measured object OB can also be calculated.

式（１６）において、距離L₅は、図５及び図６に示すように、被測定物体ＯＢの中心点Ｃから、第１測定器４１及び第２測定器４２の光線の始点までの、ｕ軸方向の距離である。距離V₀は、図５に示すように、被測定物体ＯＢの初期状態における、被測定物体ＯＢの中心点Ｃから、第１基準壁面Ｓ１１までの、Ｚ軸方向の距離である。
式（１６）に示すように、式（１３）で求めた回転角度量θと、被測定物体ＯＢの動いた後の状態における第１測定結果（DA₁）及び第２測定結果（DA₂）とを用いて、被測定物体ＯＢの基準状態からのＺ軸方向での変位量を算出できる。
なお、被測定物体ＯＢの初期状態において、図５に示すように、V₀=L₅+DI₁=L₅+DI₂であるから、式（１６）は、つぎの式（１７）や式（１８）に変換できる。

式（１７）、式（１８）に示すように、式（１３）で求めた回転角度量θと、被測定物体ＯＢの初期状態における第１測定結果（DI₁）又は第２測定結果（DI₂）と、被測定物体ＯＢの動いた後の状態における第１測定結果（DA₁）及び第２測定結果（DA₂）とを用いて、被測定物体ＯＢの基準状態からのＺ軸方向での変位量を算出することもできる。 Further, in this modification, the amount of displacement in the Z-axis direction from the reference state of the measured object OB is the Z-axis direction from the first reference wall surface S11 of the center point C of the measured object OB in the state after moving. Can be obtained by subtracting the distance in the Z-axis direction from the first reference wall surface S11 of the center point C of the measured object OB in the initial state, for example, the following equation (16).

In the equation (16), as shown in FIGS. 5 and 6, the distance L ₅ is u from the center point C of the measured object OB to the start points of the light beams of the first measuring device 41 and the second measuring device 42. Axial distance. As shown in FIG. 5, the distance V ₀ is a distance in the Z-axis direction from the center point C of the measured object OB to the first reference wall surface S11 in the initial state of the measured object OB.
As shown in the equation (16), the rotation angle amount θ obtained in the equation (13) and the first measurement result (DA ₁ ) and the second measurement result (DA ₂ ) in the state after the measured object OB moves. Can be used to calculate the amount of displacement in the Z-axis direction from the reference state of the measured object OB.
Since V ₀ = L ₅ + DI ₁ = L ₅ + DI ₂ as shown in FIG. 5 in the initial state of the object to be measured OB, Expression (16) can be expressed by the following Expression (17) or Expression (18).

As shown in the equations (17) and (18), the rotation angle amount θ obtained in the equation (13) and the first measurement result (DI ₁ ) or the second measurement result (DI in the initial state of the object to be measured OB) ₂ ) and the first measurement result (DA ₁ ) and the second measurement result (DA ₂ ) in the state after the measured object OB is moved, in the Z-axis direction from the reference state of the measured object OB. The amount of displacement can also be calculated.

In each example described above, the measuring apparatus 1 does not have to include the computer device 70. In that case, for example, the user acquires the first to third measurement results from the first to third measuring devices 41 to 43 or the recorder 60 and uses the first to third measurement results to describe the above. In this way, the rotation angle amount in the XZ plane, the displacement amount in the X-axis direction, and the displacement amount in the Z-axis direction may be calculated by themselves.
Further, the measuring apparatus 1 may not include the recorder 60. In that case, for example, the respective measurement values may be recorded in the first measuring devices 41 to 43, or the respective measurement values of the first measuring devices 41 to 43 are transmitted to the computer device 70. You may be made to do.

In the example described above with reference to FIGS. 1 to 4, the measuring apparatus 1 includes two measuring units 80 and 180 from the viewpoint of accuracy improvement, but only one measuring unit or 3 You may have more than one.
Further, the flanges 31 and 32 of the seismic isolation device 30 may be the object to be measured OB.
Moreover, the seismic isolation device 30 may have a laminated structure in which a plurality of rubber layers 33 and a plurality of steel plates are laminated with each other.

  The measuring apparatus and measuring method according to the present invention can be used to determine the rotation angle amount and displacement amount of an arbitrary object to be measured.

  1: Measurement device 11, 111: First reference wall 12, 112: Second reference wall 30: Seismic isolation device 31, 32: Flange 33: Rubber layer 40, 140: Holding part 41, 141 : First measuring instrument 42, 142: Second measuring instrument 43, 143: Third measuring instrument 51: Upper board 52: Lower board 60: Recorder 70: Computer device 71: Computing unit 72 : Storage unit, 73: calculation program, 74: input unit, 75: display unit, 80, 180: measurement unit, C: center of measured object, OB: measured object, S11, S111: first reference wall surface, S12 , S112: Second reference wall surface

Claims (5)

A first reference wall;
A second reference wall surface perpendicular to the first reference wall surface;
A first measuring device, a second measuring device, and a third measuring device, each of which is attached to the measured object so as to interlock with the measured object;
With
When an XYZ Cartesian coordinate system is defined in which a plane parallel to the first reference wall surface is an XY plane and a plane parallel to the second reference wall surface is a YZ plane, the object to be measured from the reference state is measured. A measuring device used to obtain a rotation angle amount of a measurement object in an XZ plane, a displacement amount in an X-axis direction, and a displacement amount in a Z-axis direction,
The first measuring device and the second measuring device are relative to the first reference wall surface in a first measuring direction inclined at a constant angle with respect to a separating direction of the first measuring device and the second measuring device. A displacement amount of a position, or a distance to the first reference wall surface in the first measurement direction, is configured to respectively measure;
The third measuring device may calculate a displacement amount of the position relative to the second reference wall surface in the second measurement direction inclined at a constant angle with respect to the first measurement direction, or the second measurement direction. A measuring device configured to measure a distance to a second reference wall surface. Using the first measurement result, the second measurement result, and the third measurement result obtained from the first measurement device, the second measurement device, and the third measurement device, respectively, when the measured object moves from the reference state. And an arithmetic unit configured to perform an arithmetic operation,
The computing unit is
Using the first measurement result and the second measurement result, a rotation angle amount in the XY plane from the reference state of the measured object is calculated,
Using the rotation angle amount and the third measurement result, a displacement amount in the X-axis direction from the reference state of the measured object is calculated,
The measuring apparatus according to claim 1, wherein a displacement amount in the Z-axis direction from the reference state of the object to be measured is calculated using the rotation angle amount, the first measurement result, and the second measurement result. .   The measuring device according to claim 1, wherein the object to be measured is the steel plate in a seismic isolation device having a laminated structure of a plurality of rubber layers and steel plates. A first reference wall;
A second reference wall surface perpendicular to the first reference wall surface;
A first measuring device, a second measuring device, and a third measuring device, each of which is attached to the measured object so as to interlock with the measured object;
A measuring method using a measuring device comprising:
When an XYZ orthogonal coordinate system is defined in which a plane parallel to the first reference wall surface is an XY plane and a plane parallel to the second reference wall surface is a YZ plane,
The measurement method is:
When the object to be measured is moved from the reference state, the first measuring device and the second measuring device are inclined at a certain angle with respect to the separating direction of the first measuring device and the second measuring device. A displacement amount of the position with respect to the first reference wall surface in the first measurement direction or a distance to the first reference wall surface in the first measurement direction is measured, respectively. 2 obtaining measurement results, and
The position of the third measuring device relative to the second reference wall surface in the second measurement direction inclined at a constant angle with respect to the first measurement direction when the measured object moves from the reference state. Measuring the amount of displacement or the distance to the second reference wall surface in the second measurement direction to obtain a third measurement result;
Using the first measurement result and the second measurement result to calculate a rotation angle amount of the object to be measured in the XZ plane from the reference state;
Using the rotation angle amount and the third measurement result, calculating a displacement amount of the object to be measured in the X-axis direction from the reference state;
Calculating a displacement amount in the Z-axis direction of the object to be measured from the reference state using the rotation angle amount and the first measurement result and the second measurement result; and
Including a measuring method. The measurement method according to claim 4, wherein the object to be measured is the steel plate in a seismic isolation device having a laminated structure of a plurality of rubber layers and steel plates.

Images