JP2018005612A5 - - Google Patents
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- JP2018005612A5 JP2018005612A5 JP2016132530A JP2016132530A JP2018005612A5 JP 2018005612 A5 JP2018005612 A5 JP 2018005612A5 JP 2016132530 A JP2016132530 A JP 2016132530A JP 2016132530 A JP2016132530 A JP 2016132530A JP 2018005612 A5 JP2018005612 A5 JP 2018005612A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016132530A JP6765877B2 (ja) | 2016-07-04 | 2016-07-04 | 画像処理装置、画像処理方法およびプログラム |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016132530A JP6765877B2 (ja) | 2016-07-04 | 2016-07-04 | 画像処理装置、画像処理方法およびプログラム |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2018005612A JP2018005612A (ja) | 2018-01-11 |
JP2018005612A5 true JP2018005612A5 (es) | 2019-08-15 |
JP6765877B2 JP6765877B2 (ja) | 2020-10-07 |
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ID=60947958
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016132530A Active JP6765877B2 (ja) | 2016-07-04 | 2016-07-04 | 画像処理装置、画像処理方法およびプログラム |
Country Status (1)
Country | Link |
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JP (1) | JP6765877B2 (es) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109975321A (zh) * | 2019-03-29 | 2019-07-05 | 深圳市派科斯科技有限公司 | 一种用于fpc的缺陷检测方法和装置 |
JP7401478B2 (ja) * | 2021-03-12 | 2023-12-19 | キヤノン株式会社 | 情報処理装置、情報処理方法、及びプログラム |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012049503A (ja) * | 2010-07-27 | 2012-03-08 | Fujitsu Semiconductor Ltd | 半導体装置の検査装置及び半導体装置の検査方法 |
JP5751630B2 (ja) * | 2011-12-27 | 2015-07-22 | Kddi株式会社 | 検査補助装置及び方法 |
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2016
- 2016-07-04 JP JP2016132530A patent/JP6765877B2/ja active Active
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