JP2017138125A - Spectral reflectance measurement device, and spectral reflectance measurement method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a spectral reflectance measurement device that measures the spectral reflectance of a resin film having a moving metal film.SOLUTION: Provided is a spectral reflectance measurement device, comprising: a measurement roll 12 for coming in contact with a long resin film 11 having a metal film and conveying the long resin film; a measurement head 13 having a light irradiation part and a reflected light receiving part; movement means 17 for moving the measurement head along the axial direction of the measurement roll; standard reflectors 181, 182 arranged at axial ends of the measurement roll; calibration means for measuring the reflection strength of the standard reflectors and calibrating a coefficient of conversion from reflection strength to spectral reflectance; control means for measuring the spectral reflectance of the long resin film having the metal film that is being conveyed; and a contactless sensor 22 arranged at both or one side of the measurement head. The contactless sensor detects the sensor-to-film distance between the contactless sensor and the long resin film, and the position of the long resin film in the axial direction of the measurement roll.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a spectral reflectance measuring device and a spectral reflectance measuring method.

  The capacitive touch panel converts information on the position of an adjacent object on the panel surface into an electrical signal by detecting a change in electrostatic capacitance caused by the object adjacent to the panel surface. Since the conductive substrate used for the capacitive touch panel is installed on the surface of the display, the material of the conductive layer of the conductive substrate is required to have low reflectance and be difficult to be visually recognized.

  Therefore, as a material for the conductive layer used in the capacitive touch panel, a material having low reflectivity and hardly visible is used, and wiring is formed on a transparent substrate or a transparent film.

  For example, Patent Document 1 discloses a transparent conductive film including a polymer film and a transparent conductive film made of a metal oxide provided thereon by a vapor deposition method. The use of an indium oxide-tin oxide (ITO) film is disclosed.

  By the way, in recent years, the display screen including a touch panel has been increased in screen size. Correspondingly, a conductive substrate such as a transparent conductive film for a touch panel is required to have a large area. However, ITO has a problem that it has a high electric resistance value and causes signal deterioration, which makes it unsuitable for large panels.

  For this reason, for example, as disclosed in Patent Documents 2 and 3, the use of a metal foil such as copper instead of the ITO film has been studied.

  However, when a metal foil such as copper is used, the visibility of the display may be reduced due to the high reflectance of the metal itself. Therefore, Patent Document 4 discloses a structure including a base material, a conductive layer provided on at least one surface of the base material, and a light absorbing layer provided on at least one surface of the conductive layer.

  Moreover, since the conductive substrate for the touch panel is installed on the surface of the display as described above, uniform visibility is required from the viewpoint of improving the visibility of the display. And in order to make a large-area touch panel that requires uniform visibility, it is important that the in-plane distribution of the layer for suppressing reflection formed on the surface of a metal foil such as copper is uniform. is there. For this purpose, it is necessary to have a measuring device and a measuring method that can accurately measure the reflectance distribution of the surface in the web state with respect to the reflectance of the conductive substrate.

  Patent Document 5 discloses a method for measuring the color of a printed web as a related technique for automatically measuring the width direction and the distribution in the conveyance direction of the reflectance of the web being conveyed.

JP 2003-151358 A JP 2011-018194 A JP 2013-0669261 A Special table 2013-540331 German patent invention No. 10023127

  However, in the method disclosed in Patent Document 5, trouble occurs in the conveyance of the web, the web moves in a meandering manner, the position of the web moves, the web comes off the roll, the web and the measurement head interfere, and the measurement head It is not expected that the web or the web will be damaged. For this reason, when a trouble occurred in the conveyance of the web, it could not be appropriately dealt with.

  In view of the above-described problems of the prior art, in one aspect of the present invention, a resin film having a metal film that is being transported can be handled even when a transport trouble occurs, and a spectral reflectance that can stably measure spectral reflectance. An object of the present invention is to provide a reflectance measuring apparatus.

In order to solve the above problems, in one aspect of the present invention,
A spectral reflectance measuring device for measuring the spectral reflectance of a long resin film having a metal film,
A measurement roll that contacts the long resin film having the metal film and conveys the long resin film having the metal film;
A measuring head having a light irradiation unit and a reflected light receiving unit;
Moving means for moving the measuring head along the axial direction of the measuring roll;
A standard reflector disposed at the axial end of the measuring roll;
Calibration means for measuring the reflection intensity of the standard reflector and calibrating the conversion coefficient from the reflection intensity to the spectral reflectance;
Control means for moving the measuring head to a measuring position by the moving means and measuring the spectral reflectance of the long resin film having the metal film conveyed by the measuring roll;
A non-contact sensor disposed on both sides or one side of the measurement head along the moving direction of the measurement head,
The non-contact sensor includes a sensor-film distance between the non-contact sensor and the surface of the long resin film having the metal film, and an axial direction of the measurement roll of the long resin film having the metal film. A spectral reflectance measuring device for detecting a position is provided.

  According to one aspect of the present invention, there is provided a spectral reflectance measuring apparatus that can cope with a transported resin film having a metal film even when a transportation trouble occurs and can stably measure the spectral reflectance. can do.

Explanatory drawing of the spectral reflectance measuring apparatus which concerns on embodiment of this invention. Explanatory drawing of the calculation method of the measurement position conversion coefficient in embodiment of this invention.

Hereinafter, an embodiment of a spectral reflectance measuring apparatus and a spectral reflectance measuring method of the present invention will be described.
[Spectral reflectance measuring device]
The spectral reflectance measuring apparatus of this embodiment can be applied to the measurement of the spectral reflectance of a long resin film having a metal film, and can have the following configuration.
A measurement roll that contacts a long resin film having a metal film and conveys the long resin film.
A measurement head having a light irradiation part and a reflected light receiving part.
Moving means for moving the measuring head along the axial direction of the measuring roll.
A standard reflector placed at the axial end of the measuring roll.
Calibration means that measures the reflection intensity of a standard reflector and calibrates the conversion coefficient from the reflection intensity to the spectral reflectance.
Control means for measuring the spectral reflectance of a long resin film having a metal film conveyed by a measurement roll by moving the measurement head to a measurement position by a moving means.

  A non-contact sensor arranged on both sides or one side of the measuring head along the moving direction of the measuring head.

  The non-contact sensor detects the sensor-film distance between the non-contact sensor and the surface of the long resin film having the metal film, and the axial position of the measurement roll of the long resin film having the metal film. can do.

  Note that the spectral reflectance measured by the spectral reflectance measuring device of the present embodiment means the reflectance measured for light having a wavelength in a predetermined range. At this time, the wavelength range of light used for measurement and the specific wavelength are not particularly limited, and light having a wavelength that requires measurement of the object to be measured can be used.

  For example, when a long resin film having a metal film used for a conductive substrate for a touch panel is an object to be measured, the object to be measured often pays attention to reflectance characteristics in the visible wavelength region. For this reason, when measuring the long resin film which has a metal film used for the conductive substrate for touch panels, the reflectance of the light of the wavelength of a visible wavelength range can be defined as a spectral reflectance, for example. Specifically, for example, a reflectance distribution measured for light having a wavelength in the range of 400 nm to 700 nm can be used as the spectral reflectance.

  Note that when measuring the reflectance of light in the wavelength region of 400 nm to 700 nm, the width (interval) of the wavelength to be measured is not particularly limited, and is selected according to, for example, the characteristics of the light source or the spectroscope. be able to. In addition, the measurement can be performed for light in a wider range than the wavelength of 400 nm to 700 nm.

  Here, first, an object to be measured in the spectral reflectance measuring apparatus of the present embodiment will be described.

  The spectral reflectance measuring apparatus of this embodiment can measure the spectral reflectance of a long resin film having a metal film while conveying the long resin film having a metal film.

  The material of the long resin film is not particularly limited, but examples of the long resin film include polyethylene terephthalate (PET), polyethersulfone (PES), polyarylate (PAR), polycarbonate (PC), polyolefin (PO), triflate. A single resin film of one or more resin materials selected from acetyl cellulose (TAC), cycloolefin polymer (COP), polyethylene naphthalate (PEN), polyimide, and norbornene can be used. Moreover, as a long resin film, the composite_body | complex of the acrylic organic film which covers the resin film single-piece | unit of one or more types of resin materials selected from the said resin material, and the single side | surface or both surfaces of this single-piece | unit is mentioned.

  In particular, as for norbornene resin materials, representative examples include ZEONOR (trade name) manufactured by ZEON Corporation, Arton (trade name) manufactured by JSR Corporation, and the like.

  The long resin film which has a metal film which is a to-be-measured object of the spectral reflectance measuring apparatus of this embodiment can be used suitably as a conductive substrate for touch panels. For this reason, it is desirable that the long resin film has excellent transparency in the visible wavelength region. That is, a transparent substrate can be suitably used as the long resin film.

  And the long resin film which has a metal film can have a metal film of one layer or multiple layers on the one side or both surfaces of the above-mentioned long resin film.

  Although it does not specifically limit as a metal film, The metal single-piece | unit, the film | membrane of a metal alloy, etc. are mentioned. The metal film may be a film in which one or more kinds selected from oxygen, nitrogen, hydrogen, and carbon are contained in a single metal or a metal alloy.

  When a long resin film having a metal film is used as a conductive substrate for a touch panel, the conductive substrate is, for example, a metal layer that becomes a conductive layer on the resin film, and suppresses reflection of light on the surface of the metal layer. The blackening layer may be provided.

  For this reason, as a metal film of a long resin film having a metal film, for example, a metal film having a high reflectivity such as a metal layer serving as a conductive layer having a metallic luster, or a low reflectivity such as a blackened layer, Examples thereof include a metal light absorption film, that is, a metal absorption film.

  In addition, the thing which formed only the metal layer used as a conductive layer on a long resin film, or the thing which formed only the blackening layer on the long resin film, Furthermore, the metal layer used as a conductive layer on a long resin film And the thing which laminated | stacked the blackening layer can be made into the object of a measurement as a long resin film which has a metal film.

  Although it does not specifically limit as a material of a metal film, For example, Ni single-piece | unit, Ni-type alloy, Cu single-piece | unit, Cu-type alloy etc. are mentioned.

  Examples of the Ni-based alloy include an alloy in which one or more elements selected from Ti, Al, V, W, Ta, Si, Cr, Ag, Mo, and Cu are added to Ni. Examples of the Cu-based alloy include alloys in which one or more elements selected from Ti, Al, V, W, Ta, Si, Cr, Ag, Mo, and Ni are added to Cu.

  The metal film can be formed using, for example, a metal material of any one of Ni simple substance, Ni-based alloy, Cu simple substance, and Cu-based alloy as a film forming material.

  As described above, the metal film can contain components such as oxygen in addition to the metal components. When the metal film contains a component other than a metal such as oxygen, for example, a reactive gas can be introduced into the film formation apparatus during film formation, and the metal film can be formed by a reactive film formation method. When the metal film is formed by the reactive film formation method, magnetron sputtering, ion beam sputtering, vacuum deposition, ion plating, CVD, or the like can be used as the film forming means.

  The reactive gas can be selected according to the composition of the metal film to be formed, and examples thereof include one or more gases selected from oxygen, nitrogen, carbon monoxide, carbon dioxide, water vapor, hydrogen, and the like. be able to. Note that only the reactive gas can be used for the atmosphere during film formation, but the reactive gas can also be mixed with an inert gas such as argon and used for the atmosphere during film formation.

  The optical constants (refractive index and extinction coefficient) of each wavelength of the metal film are greatly influenced by the degree of reaction, for example, the degree of oxidation and the degree of nitridation, and are not determined only by the constituent material of the metal film.

  Next, the spectral reflectance measuring apparatus of this embodiment will be described in detail with reference to FIG.

  In the spectral reflectance measuring device 10 of the present embodiment, the measurement can be performed while the long resin film 11 having the metal film as the object to be measured is conveyed by the measurement roll 12.

  The long resin film 11 having a metal film as the object to be measured can be conveyed by contacting the measurement roll 12 and rotating the measurement roll 12. At this time, the long resin film 11 having the metal film and the measuring roll 12 are in close contact with each other so that wrinkles or the like do not enter the long resin film 11 having the metal film being conveyed. It is preferable. In addition, since the positional relationship between the optical system and the measurement roll 12 is stabilized, the spectral reflectance is measured by a measurement head described later at a position where the long resin film 11 having a metal film and the measurement roll 12 are in close contact with each other. Is preferred.

  In addition, in the spectral reflectance measuring apparatus of this embodiment, the method to convey the elongate resin film which has a metal film is not specifically limited. For example, it can be conveyed by a roll-to-roll system. That is, a long resin film having a metal film wound in a coil shape on a winding roll (feeding roll) is supplied from the winding roll, and is wound by the winding roll. It can be transported between rolls. And various conveyance rolls including the measurement roll 12 can be arranged between the unwinding roll and the winding roll.

  When a long resin film having a metal film is transported by a roll-to-roll method, the installation location of the measurement roll of the spectral reflectance measurement device of the present embodiment is not particularly limited. For example, in a plurality of transport rolls It can be arranged on the unwinding roll side or the winding roll side.

  And the spectral reflectance measuring apparatus 10 of this embodiment is provided with the measurement head 13 which has a light irradiation part and a reflected light light-receiving part.

  The spectral reflectance measurement apparatus 10 of this embodiment includes a light source unit 14 and a spectroscope 15, and the measurement head 13 and the light source unit 14, and the measurement head 13 and the spectroscope 15 can be connected by an optical fiber 16. A bundle fiber can be preferably used as the optical fiber 16.

  The light source unit 14 only needs to be capable of oscillating light in the wavelength region to be measured. For example, a halogen light source can be used. The spectroscope 15 is not particularly limited. For example, a fiber input type multichannel spectroscope or the like can be used.

  Further, as will be described later, the measuring head 13 can be moved along the axial direction of the measuring roll 12 by a moving means. Therefore, in the spectral reflectance measurement apparatus 10 of the present embodiment, the moving means described later can be configured to move the measurement head 13 and the spectroscope 15 along the axial direction of the measurement roll.

  The length of the optical fiber between the measurement head 13 and the spectroscope 15 can be shortened by moving the spectroscope 15 together with the measurement head 13 by the moving means. Further, the optical fiber can be prevented from being damaged. Furthermore, since the change of the reflection intensity can be prevented by preventing the bending of the optical fiber 16 between the measuring head 13 and the spectroscope 15, stable measurement with high reproducibility becomes possible.

  In addition to the moving means for moving the measuring head 13, a not-shown spectroscope moving means for moving the spectroscope 15 along the axial direction of the measuring roll 12 can be provided in conjunction with the movement of the measuring head 13. . However, as described above, it is possible to obtain a simpler apparatus configuration in which the measuring head 13 and the spectroscope 15 are moved by one moving means, and the measuring head 13 and the spectroscope 15 are configured. It is preferable because the length of the optical fiber between the two can be shortened.

  The spectral reflectance measuring apparatus 10 includes moving means 17 that moves the measuring head 13 along the direction of the axis 121 of the measuring roll 12, that is, along the double-headed arrow A in the drawing. By having the moving means 17, the spectral reflectance can be measured at an arbitrary position in the width direction of the long resin film 11 having the metal film being conveyed. Further, as will be described later, a standard reflector can be provided at the end of the measuring roll 12 in the axial direction so that the measuring head 13 can be automatically moved to a position facing the standard reflector by the moving means 17. With this configuration, the conversion coefficient from the reflection intensity to the spectral reflectance can be calibrated at an arbitrary timing.

  A single axis robot is preferably used as the moving means 17 for moving the measuring head 13 in the axial direction. Since the movement may be difficult in a large optical system, the measurement head 13 preferably uses a fiber light source as a light irradiating unit and a fiber sensor as a reflected light receiving unit.

  The standard reflectors 181 and 182 can be provided on the end side in the axial direction of the measurement roll 12. Although either one of the standard reflectors 181 and 182 may be provided, it is preferable that the standard reflectors 181 and 182 are respectively provided on both end sides in the axial direction of the measurement roll 12 as shown in FIG.

  Since the spectral reflectance of the standard reflectors 181 and 182 is known, the calibration means moves the measuring head 13 to a position facing the standard reflectors 181 and 182 to measure the reflection intensity of the standard reflectors 181 and 182. The conversion coefficient when converting from the measured reflection intensity to the spectral reflectance can be calculated. The calibration unit can calibrate the conversion coefficient to the calculated conversion coefficient.

  Thus, the calibration means calibrates the conversion coefficient from the reflection intensity to the spectral reflectance, thereby converting the reflection intensity measured for the long resin film having the metal film as the object to be measured into the spectral reflectance. It becomes possible to carry out more accurately. That is, the spectral reflectance can be measured with high accuracy.

  The calibration means may be included in the control means described later. The timing at which the calibration unit calibrates the conversion coefficient is not particularly limited, and can be performed at an arbitrary timing. However, particularly from the viewpoint of increasing the measurement accuracy, the measurement head 13 is reciprocated along the axial direction of the measurement roll 12 in order to measure the object to be measured, and the measurement head 13 is one of the axial directions of the measurement roll 12. It is preferable to measure the standard reflector every time it reaches the end and correct the conversion coefficient.

  The standard reflectors 181 and 182 are not particularly limited, and for example, any of a standard white plate, a mirror, and a reflector with a known reflectance can be suitably used.

  Further, as the standard reflectors 181 and 182, a resin film having the same metal film as the long resin film having a metal film as a measurement object can be used. In addition, the resin film which has a metal film used as a standard reflector can have the same structure as the long resin film which has a metal film which is a measurement object, and a part of the manufactured long resin film which has a metal film Is preferably cut into a size suitable for a standard reflector.

  In this case, the resin film having the same metal film as the object to be measured, which is used as the standard reflector, can be used as a reflector with a known reflectance by measuring the spectral reflectance in advance.

  When a resin film having the same metal film as the measurement object is used as the standard reflection object, the reflectance of the standard reflection object and the reflectance of the long resin film 11 having the metal film as the measurement object are close to each other. It becomes. Moreover, compared with the case where a mirror is used as a standard reflector, the irradiation light source intensity | strength at the time of measuring a standard reflector can be raised. For this reason, when measuring the spectral reflectance of a long resin film having a metal film having a low reflectance, measurement with high accuracy is possible, which is preferable.

  Up to this point, the example in which the standard reflectors 181 and 182 are provided on both end sides of the measurement roll 12 of the spectral reflectance measurement apparatus 10 so as to be separated from the measurement roll 12 has been described. However, the present invention is not limited to such a configuration. .

  For example, the standard reflector can be fixed to the entire circumferential surface of both ends of the measurement roll 12. That is, as shown in the spectral reflectance measuring apparatus 10 of FIG. 1, standard reflectors 191 and 192 can be installed. In this case, either one of the standard reflectors 191 and 192 may be provided, but it is preferable that the standard reflectors 191 and 192 are respectively provided at both ends of the measurement roll 12.

  Since the long resin film 11 having a metal film is in contact with the measurement roll 12 and being conveyed, the spectral reflectance measurement surface has the same shape as the surface of the measurement roll 12 and is a curved surface. On the other hand, when a plate-like object such as a mirror is used as the standard reflectors 181 and 182, the surface of the standard reflector is flat.

  Then, the difference in surface shape between the standard reflector and the object to be measured may affect the absolute value of the spectral reflectance to be measured. Therefore, in order to measure the spectral reflectance more accurately, it is preferable that the surface shape of the standard reflector and the surface shape of the object to be measured have the same curved surface shape. For this reason, as described above, it is preferable to use the standard reflector fixed to the surface of the measurement roll 12 along the peripheral surfaces of both ends.

  However, when the standard reflector is fixed to the surface of the measuring roll 12 along the peripheral surface of both ends, the standard reflector 191 and 192 can be bent along the peripheral surface of the measuring roll. It is required to be a thing. For this reason, as the standard reflectors 191 and 192, it is particularly preferable to use a resin film having the same metal film as the object to be measured that can be easily bent along the peripheral surface of the measurement roll 12 like the object to be measured. it can.

  In this case, as described above, the irradiation light source intensity when measuring the spectral reflectance of the resin film having the same metal film as the object to be measured which is a standard reflector, when a mirror or the like is used as the standard reflector Than can be raised. In addition, the spectral reflectance of the object to be measured is close to the spectral reflectance of the standard reflector. Furthermore, the surface shape of the standard reflector and the surface shape of the object to be measured can be set to the same curved surface shape. For this reason, spectral reflectance can be measured with particularly high accuracy, which is preferable.

  Moreover, the surface itself of the measurement roll 12 can be used as the standard reflector without providing the standard reflector separately from the measurement roll 12. Specifically, for example, the surfaces of both ends of the measurement roll 12 can be used as the standard reflectors 201 and 202. This case is also preferable because the surface shapes of the standard reflector and the object to be measured can be made similar, and the influence on the absolute value of the spectral reflectance to be measured can be suppressed. When measuring the spectral reflectance of the standard reflector, the measuring roll 12 is normally rotated, so that the entire circumference along the peripheral surfaces at both ends can be used as the standard reflector.

Here, a configuration example of a calibration method using a standard reflector will be described.
(First calibration method example)
As shown in FIG. 1, the spectral reflectance measuring apparatus 10 of the present embodiment moves a measuring head 13 to a measuring position by a moving unit 17 and is conveyed by a measuring roll 12 and is a metal film that is an object to be measured. Spectral reflectance can be measured for the long resin film 11 having

  The moving unit 17 can move the measuring head 13 along the axial direction of the measuring roll 12. However, when the parallelism between the axis 121 of the measuring roll 12 and the movement line of the measuring head 13 by the moving unit 17 changes. There is a risk of affecting the measured value of the spectral reflectance.

  Thus, first, one standard reflector can be arranged at each end of the measuring roll 12 in the direction of the axis 121. As the standard reflector, for example, standard reflectors 181 and 182 provided on both ends of the measurement roll 12 and separated from the measurement roll 12 can be used. Alternatively, standard reflectors 191 and 192 provided at both ends of the measurement roll 12 or standard reflectors 201 and 202 that are surfaces of both ends of the measurement roll 12 may be used.

  The calibration unit can further include a measurement position conversion coefficient calculation unit. Here, the measurement position conversion coefficient calculating means calculates the end conversion coefficient to the spectral reflectance at both ends in the axial direction of the measurement roll from the reflection intensities measured for the two standard reflectors, and the end conversion coefficient Means for calculating a measurement position conversion coefficient at the measurement position by interpolation.

  That is, the measurement position conversion coefficient calculation means first calculates the reflection intensity of the standard reflector from the reflection intensity measured for the two standard reflectors and the known spectral reflectance of the standard reflector at the position of the measurement head 13. End conversion coefficients a1 and a2 to spectral reflectance are calculated. Then, from the end conversion coefficients a1 and a2 and the measurement head positions A1 and A2 when the respective standard reflectors are measured, the conversion coefficients for the measurement head position are interpolated as shown in FIG. Can be calculated. Since there are two standard reflectors, the function of the measurement head position and the conversion coefficient calculated here is a relational expression of a linear function as shown in FIG.

  Next, the measurement position conversion coefficient b1 at the measurement position B1 of the measurement head 13 when actually measuring the object to be measured can be calculated from the function.

  Here, only one point is shown as the measurement position, but since the function of the position of the measurement head and the conversion coefficient can be derived as shown in FIG. 2, the measurement position conversion coefficient at an arbitrary measurement position is obtained. Can be calculated, and the score is not particularly limited.

  And the calibration means can calibrate the conversion coefficient by the measurement position conversion coefficient.

Thus, by calculating the measurement position conversion coefficient with respect to the position of the measurement head and calibrating the conversion coefficient using the measurement position conversion coefficient, the measurement accuracy can be particularly improved.
(Second calibration method example)
As the standard reflector, a mirror or the like can be used as described above, but as the standard reflector, a long resin having a metal film with a spectral reflectance as high as about 90% is used. When the spectral reflectance of the film is 10% or less, both spectral reflectances are greatly different.

  The amount of light emitted from the light source unit to the object to be measured via the light irradiation unit is set and used so as to be a maximum value that can be detected by a standard reflector, for example. For this reason, when the spectral reflectance is smaller in the measured object than in the standard reflective object, the reflection intensity signal of the long resin film having the metal film as the measured object becomes small and is easily affected by noise.

  Therefore, the spectral reflectance measurement apparatus 10 can include, for example, a first standard reflector and a second standard reflector as standard reflectors. At this time, the first standard reflector has an average spectral reflectance of 80 to 100% at a wavelength of 400 nm to 700 nm, and the second standard reflector has a spectral reflectance of a wavelength of 400 to 700 nm. A standard reflector having an average of 0.01% or more and 5% or less can be used.

  The arrangement of the first standard reflector and the second standard reflector in the spectral reflectance measurement apparatus 10 is not particularly limited, but can be arranged at the end of the measurement roll 12 in the axial direction. . Therefore, for example, the first standard reflector can be disposed as the standard reflector 181, and the second standard reflector can be disposed as the standard reflector 182. Further, the other standard reflectors 191 and 192 may be the first standard reflector or the second standard reflector.

  The calibration unit can further include a measured reflectance conversion coefficient calculation unit. The measured reflectance conversion coefficient calculating means is a long resin film having a metal film by an interpolation method or an extrapolation method from the reflection intensity measured for the first standard reflector and the second standard reflector. Means means for calculating a measured reflectance conversion coefficient to spectral reflectance in the spectral reflectance.

  That is, the measured reflectance conversion coefficient calculation means first calculates the first standard reflection from the reflection intensity measured for the first standard reflector and the second standard reflector and the known spectral reflectance for each standard reflector. A conversion coefficient corresponding to each of the object and the second standard reflector is calculated. Then, the conversion coefficient for the first standard reflector, the conversion coefficient for the second standard reflector, and the known spectral reflectance of each standard reflector are interpolated or extrapolated by interpolation or extrapolation. A function of the spectral reflectance of the measurement object and the conversion coefficient can be calculated.

  Here, since there are two standard reflectors, the function of the spectral reflectance of the measured object and the conversion coefficient calculated here is a relational expression of a linear function.

  Next, the measured reflectance conversion coefficient in the spectral reflectance assumed for the object to be actually measured, that is, the long resin film having the metal film, can be calculated from the function.

  And the calibration means can calibrate the conversion coefficient by the measured reflectance conversion coefficient.

  As described above, by using the conversion coefficient corresponding to the spectral reflectance of the object to be measured, it becomes possible to measure the spectral reflectance more accurately.

Here, the case where two types of standard reflectors having different spectral reflectances are used has been described as an example. However, using three or more types of standard reflectors having different spectral reflectances, the spectral reflectance, conversion coefficient, and It is also possible to derive a function of Also in this case, the measured reflectance conversion coefficient can be calculated and calibrated based on the derived function. When three or more types of standard reflectors are used, the arrangement of the standard reflectors is not particularly limited, and can be arranged at any position at the end of the measurement roll 12.
(Third calibration method example)
As described in the second calibration method example, when an object having a spectral reflectance of about 90% such as a mirror is used as a standard reflector, the spectral reflectance of the long resin film having a metal film is 10% or less. In this case, the spectral reflectances of the two are greatly different.

  Then, the amount of light emitted from the light source unit to the object to be measured through the light irradiation unit of the measurement head is set and used so as to be a maximum value that can be detected by a standard reflector, for example. For this reason, when the spectral reflectance is smaller in the measured object than in the standard reflective object, the reflection intensity signal of the long resin film having the metal film as the measured object becomes small and is easily affected by noise.

  Therefore, in order to reduce the influence of noise, the exposure time at the time of measuring the standard reflection object is made shorter than the exposure time at the time of measuring a long resin film having a metal film as the measurement object. The amount of light when measuring can be increased.

  Specifically, the calibration means first has a reflection intensity of the standard reflector that is shorter than the exposure time when measuring the spectral reflectance of the long resin film having the metal film, and has two or more different exposure times. Measurements can be made with exposure time.

  The calibration unit can further include an exposure time conversion coefficient calculation unit. The exposure time conversion coefficient calculation means is based on the exposure time when measuring the spectral reflectance of the long resin film having a metal film by extrapolation from the reflection intensity of the standard reflector measured at two or more types of exposure time. Means means for calculating an exposure time conversion coefficient to spectral reflectance.

  That is, the exposure time conversion coefficient calculation means calculates the reflection intensity measured for two or more types of exposure times that are shorter than those for measuring the object to be measured and the known spectral values for each standard reflector. A conversion coefficient for each exposure time is calculated from the reflectance. Then, a function of the exposure time and the conversion coefficient can be calculated by extrapolation from the exposure time and the conversion coefficient for each exposure time.

  Next, the exposure time conversion coefficient in the exposure time when measuring the spectral reflectance of the object to be actually measured, that is, the long resin film having the metal film, can be calculated from the function.

  The calibration means can calibrate the conversion coefficient by the exposure time conversion coefficient.

  By changing the exposure time between the standard reflector and the object to be measured, noise when measuring the spectral reflectance of the object to be measured can be reduced. Even if the exposure time is different, the spectral reflectance of the object to be measured can be measured with high accuracy by using the corresponding conversion coefficient.

  Up to this point, examples of conversion coefficient calibration methods in the spectral reflectance measurement apparatus of the present embodiment have been described. However, these calibration methods can be used only with the respective calibration methods, or a combination of calibration methods may be used. it can. When a plurality of calibration methods are used in combination, the spectral reflectance measurement apparatus 10 can have a plurality of, for example, four or more standard reflectors as necessary.

  And the spectral reflectance measuring apparatus 10 of this embodiment moves the measuring head 13 to a measurement position by the moving means 17, and calculates the spectral reflectance of the long resin film 11 having the metal film conveyed by the measuring roll 12. Control means (not shown) for measuring may be further included. The control means is connected so as to be able to transmit signals to, for example, the moving means 17, the measurement roll 12, the measurement head 13, the light source unit 14, the spectroscope 15, the calculation means 21, and a non-contact sensor 22 described later. I can keep it. And a control means can control operation | movement of each apparatus, etc. based on the signal from these connected apparatuses. As described above, the calibration means and the like can also be included in the control means.

  When the measuring head 13 is moved to an arbitrary measurement position by the moving means 17, the measurement position is not particularly limited. However, according to the spectral reflectance measuring apparatus 10 of the present embodiment, since the long resin film having the metal film being conveyed can be measured at any point in the width direction, the long resin film having the metal film can be measured. It is preferable to perform measurement at a plurality of arbitrary measurement points (measurement positions) in the width direction.

  In measurement, the measuring head 13 is moved to the measuring point by the moving means 17 and stopped. After the measurement at the measuring point is finished, the measuring head 13 is moved again to the next measuring point by the moving means 17 and stopped. In addition, measurement can be performed at the measurement point. By repeatedly performing such movement, stop, and measurement of the measurement head 13, measurement can be performed at a plurality of arbitrary measurement points in the width direction of the long resin film having the metal film.

  Then, the reflection intensity can be detected by the spectroscope 15 connected to the measurement head 13. The spectroscope 15 can be connected to a calculation means 21 such as a personal computer, and the spectral reflectance can be calculated from the reflection intensity detected by the spectroscope 15 using the conversion coefficient calibrated by the calibration means. .

The computing means 21 can further comprise color space computing means for calculating L ^* , a ^* , b ^* color space from the spectral reflectance.

In this case, in addition to the spectral reflectance, the L ^* , a ^* , b ^* color space can also be calculated.

  The spectral reflectance measurement apparatus 10 according to the present embodiment can have the non-contact sensor 22 arranged on both sides or one side of the measurement head 13 along the moving direction of the measurement head 13. That is, the non-contact sensor 22 can be disposed adjacent to the measurement head 13 along the moving direction of the measurement head 13.

  FIG. 1 shows an example in which a non-contact sensor 22 a is provided on the left side of the measurement head 13 and a non-contact sensor 22 b is provided on the right side of the measurement head 13 along the moving direction of the measurement head 13. It is not limited to. As described above, only one of the non-contact sensor 22a and the non-contact sensor 22b may be used.

  When the non-contact sensor 22a and the non-contact sensor 22b are provided, for example, an average value of detection values of both sensors can be used as a detection value detected by the non-contact sensor. Moreover, both or either one of the values detected by each sensor can be used as the detection value.

  As will be described later, the non-contact sensor 22 is, for example, a measurement roll 12 of the distance between the long resin film 11 having a metal film and the non-contact sensor 22 or the long resin film 11 having a metal film being conveyed. Any means that can measure the position in the axial direction, the distance between the measurement roll 12 and the non-contact sensor 22, and the distance between the standard reflector and the non-contact sensor may be used. For example, a displacement meter laser or the like may be used. it can. Further, the non-contact sensor 22 can be arranged adjacent to the measurement head 13 as described above, and can be configured to move together with the measurement head 13 by the moving means 17.

  When wrinkles or sagging occur in the long resin film 11 having a metal film due to a conveyance trouble, a gap is generated between the long resin film 11 having the metal film and the measurement roll 12, and the long film having the metal film is long. The distance between the scale resin film 11 and the measuring head is suddenly shorter than normal. For this reason, the long resin film which has a metal film by a conveyance trouble by detecting the distance between sensor-film which is the distance between the non-contact sensor 22 and the surface of the long resin film 11 which has a metal film. When wrinkles or sagging occur in the head 11, this can be detected, for example, the movement of the measuring head 13 can be stopped. And generation | occurrence | production of the interference with the long resin film 11 which has a metal film, and the measurement head 13 can be suppressed, and a spectral reflectance can be measured stably.

  When the non-contact sensors 22a and 22b are provided as the non-contact sensor 22, for example, the detection value detected by one of the sensors or the average of the detection values of both sensors is used as the sensor-film distance. Can do. Further, the detection value of each sensor may be the sensor-film distance, that is, the detection value of both sensors may be the sensor-film distance. In this case, for example, when either one becomes less than a specified value, the movement of the measuring head 13 can be stopped.

  Further, by detecting the position in the axial direction of the measurement roll 12 of the long resin film 11 having a metal film, a conveyance trouble such as meandering occurs in the long resin film 11 having a metal film, and the axis of the measurement roll 12 Even when a positional deviation occurs in the direction, occurrence of such meandering can be detected. For this reason, it becomes possible to correct | amend about the positional information of the axial direction of the measurement roll 12 on the elongate resin film 11 which has a metal film which measured the spectral reflectance, and measures a spectral reflectance stably and correctly. Can be implemented.

  Specifically, the position of the long resin film 11 having a metal film in the axial direction of the measurement roll 12, particularly the edge position (end position) of the long resin film 11 having the metal film on the measurement roll 12 serving as a reference. ) Can be detected. Then, by combining the measurement time stored at the time of measurement, the measured value of the spectral reflectance, and the distance from the edge position on the long resin film 11 having the metal film, the spectral reflectance is measured. It can correct | amend so that a spectral reflectance and the measurement position of this spectral reflectance on the elongate resin film 11 which has a metal film may respond | correspond correctly. For this reason, it is possible to increase the measurement accuracy of the spectral reflectance, which is preferable.

  In addition, when non-contact sensors 22a and 22b are provided as the non-contact sensor 22, for example, a long resin film having a metal film is used as an average of detection values detected by one of the sensors or detection values of both sensors. 11 in the axial direction of the measurement roll 12, particularly the edge position of the long resin film 11 having a metal film on the measurement roll 12.

  The spectral reflectance measuring apparatus 10 according to the present embodiment further stops the movement of the measuring head 13 by the moving unit 17 when the sensor-film distance detected by the non-contact sensor 22 is less than a specified value, for example. It is preferable to have a stopping means. By providing the stop means in this manner, the movement of the measuring head 13 can be automatically stopped when a conveyance trouble occurs in which the long resin film 11 having a metal film causes wrinkles or sagging. For this reason, generation | occurrence | production of interference with the long resin film 11 which has a metal film, and the measurement head 13 can be suppressed automatically, and a spectral reflectance can be measured stably.

  The configuration of the stopping means is not particularly limited, but can be provided, for example, in the control means described above. And it can comprise so that a stop signal may be sent with respect to the moving means 17 based on the signal from the non-contact sensor 22. FIG.

  The specified value of the distance between the sensor and the film here is not particularly limited because it differs depending on the distance between the measuring head 13 and the measuring roll 12 in the spectral reflectance measuring device 10 and the like. It can be arbitrarily set according to the configuration.

  Moreover, the spectral reflectance measuring apparatus 10 of this embodiment has a metal film based on the edge position in the axial direction of the measurement roll 12 of the long resin film 11 having the metal film detected by the non-contact sensor 22. It is possible to have correction means for correcting the edge position information of the long resin film 11.

  The edge position in the axial direction of the measurement roll 12 of the long resin film 11 having the metal film being conveyed can be used as a reference for the position in the width direction of the long resin film 11 having the metal film. Specifically, for example, the position in the width direction of the long resin film 11 having the metal film, that is, the position in the axial direction of the measuring roll 12 is represented by the distance from the edge position of the long resin film 11 having the metal film. Can do.

  However, if the long resin film 11 having a metal film meanders and the edge position in the axial direction of the measuring roll 12 is shifted, the reference may lose accuracy. Therefore, as described above, the edge position in the axial direction of the measurement roll 12 of the long resin film having the metal film is detected by the non-contact sensor, and the long resin film 11 having the metal film is detected based on the edge position. It is preferable to have correction means for correcting the information on the edge position.

  The correcting means can also be provided in the control means described above. The information corrected by the correction means can be stored in the temporary storage means by providing a temporary storage means in the control means, or can be recorded in a recording means to be described later.

  Further, the non-contact sensor 22 includes a sensor-roll distance between the non-contact sensor 22 and the surface of the measurement roll 12, a sensor-standard reflector distance between the non-contact sensor 22 and the standard reflector, It can also comprise so that it may detect also about.

  Thus, by detecting the distance between the sensor and the roll and the distance between the sensor and the standard reflector, the distance between the measurement head 13 and the measurement roll 12 and the distance between the measurement head 13 and the standard reflector are constant. You can check if there is.

  The standard reflector can be installed at a position that coincides with the surface of the measuring roll 12, for example. If the standard reflector is misaligned due to some cause, for example, loosening of the fixing screw of the standard reflector, the calibration cannot be performed correctly and accurate measurement cannot be performed. For this reason, this abnormality can be detected by measuring the distance between the sensor and the standard reflector using a non-contact sensor. For example, if the distance fluctuates by 0.5 mm or more, it is recognized that the measurement apparatus needs to be maintained.

  An abnormality in the distance between the measuring head 13 and the standard reflector can be detected from a difference between one of the sensor-film distance and the sensor-roll distance and the sensor-standard reflector distance. it can. For this reason, the difference between any one of the sensor-film distance and the sensor-roll distance and the sensor-standard reflector distance is detected, and the standard reflection is detected when the difference exceeds a specified value. It is preferable to be configured so as to warn of the displacement of the object.

  Therefore, in the spectral reflectance measuring apparatus 10 of the present embodiment, the absolute value of the difference between one of the sensor-film distance and the sensor-roll distance and the sensor-standard reflector distance is a specified value. In such a case, it is possible to have an alarm output means for warning the positional deviation of the standard reflector.

  When the non-contact sensors 22a and 22b are provided as the non-contact sensor 22, for example, the detection value detected by one of the sensors, or the average of the detection values of both sensors, the sensor-film distance, the sensor- The distance between the rolls and the distance between the sensor and the standard reflector can be used.

  When using the detection value of any one sensor, it is preferable to detect each parameter using the same sensor. And it is preferable to select the sensor used so that the moving distance by a moving means may be shortened.

  Specifically, for example, the non-contact sensor 22a is used for measuring the distance between the standard reflector 182 on the left side of the measurement roll 12 and the non-contact sensor in FIG. The difference between the sensor-film distance or the sensor-roll distance measured by the non-contact sensor 22a can be calculated.

  Further, the non-contact sensor 22b is used to measure the sensor-standard reflector distance between the standard reflector 181 and the non-contact sensor. Similarly, the sensor-film distance measured by the non-contact sensor 22b or the sensor -The difference with the distance between rolls can be calculated.

  In addition, the sensor-film distance, the sensor-roll distance, and the sensor-standard reflector distance can also be obtained using the detection values of the sensors. That is, for example, the difference between any one of the sensor-film distance and the sensor-roll distance detected by using each sensor and the sensor-standard reflector distance is detected by any one of the sensors. The alarm output means can also be configured to warn when the value of the value exceeds a specified value.

  Also, the specified value here is not particularly limited because it varies depending on the configuration of the spectral reflectance measuring apparatus, and can be arbitrarily set according to the configuration of the apparatus.

  The spectral reflectance measuring apparatus 10 of the present embodiment can have arbitrary devices and means other than the devices described so far. For example, it can have a recording means for recording the measured spectral reflectance. In addition to the spectral reflectance, the recording means can also record, for example, the position of the measurement head at the time of measurement, the reflection intensity before conversion into the spectral reflectance, the conversion coefficient used, and the like. In some cases, the position in the axial direction of the measuring roll 12 of the long resin film 11 having a metal film, which is measured by the non-contact sensor 22, can also be recorded.

  The recording unit can include an electronic storage unit such as a hard disk or a memory.

  The recording means can be configured to record necessary data by being connected to, for example, the control means, the calculating means 21 and the like. In addition, the recording unit can be configured to continuously record while moving the measurement head and performing the measurement. For example, the recording unit starts and stops recording in response to a command from the control unit. It can also be configured as follows.

  According to the spectral reflectance measuring apparatus of the present embodiment described above, the sensor-film distance and the axial position of the measurement roll of the long resin film having a metal film are detected by the non-contact sensor. It is configured.

  For this reason, when wrinkles or sagging occur in the long resin film having the metal film due to a conveyance trouble, this can be detected, for example, the movement of the measuring head can be stopped, and the long resin having the metal film The occurrence of interference between the film and the measuring head can be suppressed.

  In addition, even when a long-sided resin film having a metal film has a conveyance trouble such as meandering, and a positional deviation occurs in the axial direction of the measurement roll, the occurrence of such a meandering can be detected, and the long resin film having a metal film It is possible to correct the position of the measuring roll in the axial direction.

  As described above, according to the spectral reflectance measuring apparatus of the present embodiment, the transported resin film having a metal film can be dealt with even when a transportation trouble occurs, and the spectral reflectance is stably measured. it can.

  Moreover, according to the spectral reflectance measuring apparatus of this embodiment, the calibration of the conversion coefficient when converting the measured reflection intensity into the spectral reflection intensity can be performed at any timing by the calibration means. For this reason, the measurement of the spectral reflectance of the long resin film which has the metal film currently conveyed can be implemented with high precision.

Furthermore, the resin having the metal film being transported fully automatically and with high accuracy by predefining the conditions for calibrating the conversion coefficient, the conditions such as the measurement points to be measured, and controlling the calibration means, etc. The spectral reflectance of the film can be measured.
[Spectral reflectance measurement method]
Next, a configuration example of the spectral reflectance measurement method of the present embodiment will be described. In addition, since the spectral reflectance measuring method of this embodiment can be implemented using the above-described spectral reflectance measuring apparatus, a part of the overlapping portions will not be described.

  The spectral reflectance measuring method of the present embodiment is a spectral reflectance measuring method using the above-described spectral reflectance measuring device, and can include the following steps.

When the long resin film 11 having a metal film is transported by the measurement roll 12 and the distance between the sensor and the film is equal to or greater than a specified value, the measuring head 13 is moved by the moving means 17 to move the metal film. A measurement step of measuring and recording the spectral reflectance of the long resin film 11 having the same.
When the conveyance of the long resin film 11 having the metal film by the measuring roll 12 is stopped, or when the distance between the sensor and the film is less than the specified value, the movement of the measuring head 13 is stopped, and the long resin having the metal film A stop step for stopping the measurement and recording of the spectral reflectance of the film 11.

  Before the start of measurement, the movement of the measuring head 13 can be stopped and waited (standby step).

  Next, when the measurement roll 12 starts to convey the long resin film 11 having the metal film, the long resin film 11 having the metal film is conveyed, and the distance between the sensor and the film is equal to or greater than the specified value. In addition, for example, the movement of the measuring head 13 can be started by the moving means 17 in accordance with a command from the control means. And the spectral reflectance of the long resin film 11 which has a metal film can be measured and recorded (measurement step).

  The sensor-film distance can be detected by the non-contact sensor 22 as described above.

  During the measurement step, the non-contact sensor 22 allows the long resin film 11 having a metal film to be positioned in the axial direction of the measurement roll 12, particularly the long resin film 11 having a metal film. Edge positions can be detected. And based on the detected information, the position of the measurement resin 12 in the axial direction of the long resin film 11 having a metal film, particularly the axial direction of the measurement roller 12 in the long resin film 11 having a metal film is corrected by the correcting means. It is also possible to correct the edge position information.

  And when conveyance of the long resin film 11 which has the metal film by the measurement roll 12 is stopped, or when the distance between sensor-films is less than a regulation value, the movement of the measurement head 13 is stopped, and the length which has a metal film Measurement and recording of the spectral reflectance of the length resin film 11 can be stopped (stop step).

  When the conveyance of the long resin film 11 having the metal film by the measurement roll 12 is stopped, the supply of the object to be measured is stopped, so that the measurement and recording of the spectral reflectance can be stopped as described above. When the distance between the sensor and the film is less than the specified value, wrinkles or sagging occurs in the long resin film 11 having a metal film due to a conveyance trouble, the long resin film 11 having the metal film, and the measurement head. This means that the distance between and has become shorter than usual. For this reason, by stopping the movement of the measurement head 13, it is possible to suppress the occurrence of interference between the long resin film 11 having a metal film and the measurement head 13.

  The stop step can be performed by the control means or the stop means provided in the control means based on the sensor-film distance detected by the non-contact sensor 22, for example.

  In addition, when conveyance of the long resin film 11 which has a metal film by the measurement roll 12 is started again, and the distance between sensor-films is more than a regulation value, a measurement step can also be implemented again. That is, the measurement step and the stop step can be repeatedly performed when the conditions of each step are satisfied.

  Further, the spectral reflectance measurement method of the present embodiment is not limited to the measurement step and the stop step, and can further include arbitrary steps.

  For example, at any timing, the calibration step of measuring the reflection intensity of the standard reflector by the calibration means and calibrating the conversion coefficient from the reflection intensity to the spectral reflectance can be performed. Since the calibration method has already been described, the description thereof is omitted here. Further, since the measuring head is also moved when the calibration step is performed, the non-contact sensor 22 makes the distance between the sensor and the film before the calibration step is performed and, in some cases, further. It is preferable to confirm that is equal to or greater than the specified value.

  For example, the non-contact sensor 22 can detect the sensor-roll distance and the sensor-standard reflector distance at any timing. When the absolute value of the difference between one of the sensor-film distance and the sensor-roll distance and the sensor-standard reflector distance exceeds a specified value, the alarm output means It is also possible to have a warning step for warning the positional deviation of the reflector.

  By having the warning step in this way, the position of the standard reflector can be kept appropriate, and the conversion coefficient from the reflection intensity to the spectral reflectance can be accurately configured. Note that when a warning is given in the warning step, it is possible not only to warn of the positional deviation of the standard reflector, but also to implement a stop step, for example.

  According to the spectral reflectance measurement method of the present embodiment described above, the sensor-film distance is detected by the non-contact sensor in the measurement step.

  For this reason, when wrinkles or sagging occur in the long resin film having the metal film due to a conveyance trouble, this can be detected, for example, the movement of the measuring head can be stopped, and the long resin having the metal film The occurrence of interference between the film and the measuring head can be suppressed.

  Thus, according to the spectral reflectance measurement method of the present embodiment, the transported resin film having a metal film can be dealt with even when a transportation trouble occurs, and the spectral reflectance is stably measured. it can.

Specific examples and comparative examples will be described below, but the present invention is not limited to these examples.
[Example 1]
As a long resin film having a metal film, a 0.3 μm copper film and a Ni—Cr film having a thickness of about 50 nm are formed on the PET film by sputtering, and the reflectance of the surface is A 20% long resin film having a metal film was prepared in advance.

  Then, a long resin film having a metal film is supplied by a roll-to-roll method, that is, from a winding roll obtained by winding the long resin film having the metal film in a coil shape, and wound by a winding roll. By this, the long resin film which has a metal film was conveyed. At this time, the spectral reflectance measuring device 10 shown in FIG. 1 was disposed on the take-up roll side on the transport path, and the spectral reflectance was measured for the long resin film having the metal film.

  The configuration of the spectral reflectance measurement apparatus 10 will be described.

  The spectral reflectance measuring apparatus 10 has a measuring roll 12 having a diameter of 98φ, and the measuring roll 12 is provided on the transport path of the long resin film 11 having the metal film described above, and has a metal film. It is in contact with the long resin film 11 and conveyed.

  The long resin film 11 having a metal film is conveyed so that the long resin film is in direct contact with the measurement roll 12 and the metal film is directly opposed to the measurement head 13.

  Further, in the vicinity of the measuring roll 12, the measuring head 13 can be moved along the direction of the axis 121 of the measuring roll 12, and a moving means 17 having a moving distance of 650 mm is provided.

  The measuring head 13 having a light irradiating part and a reflected light receiving part has a light source part 14 that is a halogen light source and a spectrum having a CCD array sensor by a bundle fiber in which a light irradiating fiber and a reflected light detecting fiber are incorporated. Connected to the vessel 15. The spectroscope 15 is a fiber input type multi-channel spectroscope capable of measuring a spectral spectrum in a wavelength range of 200 nm to 1100 nm with an exposure time of about 0.01 to 0.1 seconds.

  And the measurement head 13 and the moving means 17 keep the distance between the front-end | tip part by the side of the measurement roll 12 of the measurement head 13 with the long resin film 11 which has the metal film conveyed by the measurement roll 12 at 10 mm. It is installed as follows. The measuring head 13 is arranged so that the tip thereof is directed to the center of the measuring roll 12 and is perpendicular to the direction of the axis 121 of the measuring roll 12.

  Further, as the standard reflectors 181 and 182, flat mirrors having a spectral reflectance of 90% were provided at both ends of the measurement roll 12. Specifically, the standard reflectors 181 and 182 are arranged next to the end surface of the measurement roll 12 so that the distance from the tip of the measurement head 13 is 10 mm. The intensity of the halogen light oscillated from the light source unit 14 was set so that the reflection intensity from the standard reflectors 181 and 182 was within the measurement range of the spectrometer 15.

  Further, non-contact sensors 22 a and 22 b are arranged on both sides of the measurement head 13 along the moving direction of the measurement head 13. The non-contact sensors 22a and 22b are configured to be moved together with the measuring head 13 by the moving means 17.

  As the non-contact sensors 22a and 22b, laser displacement meters having a measurement range (measurement distance) of 25 mm to 35 mm and a repetition accuracy of 10 μm were used.

And the spectral reflectance of the long resin film which has the said metal film was evaluated as follows.
(Waiting step)
While setting the unwinding roll etc. which wound the long resin film which has a metal film in coil shape, the movement of the measurement head 13 was stopped and it was made to stand by.

And by supplying the long resin film which has a metal film from the unwinding roll which wound up the long resin film which has a metal film in the shape of a coil, winding up with a winding roll, and rotating the measurement roll 12, The conveyance of the long resin film having a metal film was started.
(Calibration step)
Next, first, based on a command from the calibration means, the moving means 17 moves the measuring head 13 to a position facing the standard reflector 181 or the standard reflector 182, and the reflection intensity in the wavelength range of 200 nm to 1200 nm, respectively. Was measured. And the conversion coefficient to the known spectral reflectance was computed from the measured value of the reflection intensity in the wavelength range of the wavelength 200 nm or more and 1200 nm or less with a standard reflector.

  The conversion coefficient was calculated by the equation: (conversion coefficient) = (known spectral reflectance of standard reflector) / (reflection intensity of standard reflector).

In addition, before carrying out the calibration step, it is confirmed that the long resin film having the metal film is being conveyed, and the non-contact sensors 22a and 22b make the distance between the sensor and the film equal to or greater than the specified value. I confirmed. When comparing the sensor-film distance and the specified value, the determination is performed by comparing the detected values individually measured by the non-contact sensors 22a and 22b with the specified values. The same applies to the following measurement steps and stop steps.
(Measurement step)
In carrying out the measurement step, first, it is confirmed that a long resin film having a metal film is being transported, and the non-contact sensors 22a and 22b have a sensor-film distance that is equal to or greater than a specified value. It was confirmed.

  Therefore, in response to a command from the control means, the moving head moves the measuring head to the measuring position, and then stops at the measuring position, and the long resin film having the metal film being conveyed has a wavelength of 200 nm to 1100 nm. The reflection intensity was measured in the area. Then, the reflection intensity in the wavelength range from 200 nm to 1100 nm was obtained, and the spectral reflectance at the measurement point was measured by the calculation means 21 using the conversion coefficient obtained from the standard reflector.

  The spectral reflectance of a long resin film having a metal film is expressed by the formula (spectral reflectance of a long resin film having a metal film) = (conversion coefficient) × (reflection intensity of a long resin film having a metal film). Calculated.

  The spectral reflectance of the long resin film having a metal film is measured at five points along the width direction of the long resin film having the metal film, and the measurement points are measured so that the distances between the measurement points are equal. I decided the position.

  During the measurement step, the sensor-film distance is continuously measured in real time by the non-contact sensors 22a and 22b, and when the sensor-film distance exceeds a specified value as will be described later. Is set in the program of the stop means provided in the control means so as to implement the stop step described later.

  In addition, during the measurement step, the non-contact sensors 22a and 22b are used to determine the position of the long resin film 11 having a metal film in the axial direction of the measurement roll 12, particularly the edge position of the long resin film 11 having a metal film. Measurements were performed continuously in real time. Then, by combining the measurement time recorded in the recording means at the time of measurement, the measured value of the spectral reflectance, and the distance from the edge position on the long resin film 11 having the metal film with the measured spectral reflectance, the data The correct measurement position was corrected during analysis.

  In addition, when meandering of the long resin film 11 having a metal film is detected from the axial position of the measuring roll 12 of the long resin film 11 having a metal film, the correction means has the metal film. It was set in the program of the control means so as to correct the information on the edge position of the long resin film 11.

  At this time, the axial position of the measurement roll 12 of the long resin film 11 having the metal film and the edge position of the long resin film 11 having the metal film were measured by the non-contact sensors 22a and 22b, respectively. The average value is used.

  And (1) measurement of reflection intensity with standard reflector, calculation of conversion coefficient, and (2) measurement of reflection intensity at each of five measurement points along the width direction of the long resin film having a metal film, Spectral reflectance calculation and calculation were alternately repeated. That is, the calibration step and the measurement step were alternately repeated.

During the measurement, the long resin film having the metal film is continuously conveyed. Moreover, since the thing of the same characteristic is provided as the standard reflectors 181 and 182 at both ends of the measuring roll 12, the standard reflector 181 is used when the number of cycles is odd, and the number of cycles is even. A conversion coefficient was constructed using a standard reflector 182.
(Stop step)
When the conveyance of the long resin film 11 having the metal film by the measuring roll 12 is stopped, or when the distance between the sensor and the film is less than the specified value, the movement of the measuring head 13 is stopped, and the long resin having the metal film A stop step for stopping the measurement and recording of the spectral reflectance of the film 11 was set in the program of the stop means provided in the control means.

The movement of the measuring head 13 is stopped during the stopping step. For example, after removing slack or the like generated in the long resin film 11 having a metal film, the calibration step and the measuring step described above are performed again. Repeatedly.
(Warning step)
While repeatedly performing the calibration step and the measurement step, the non-contact sensor 22 continuously detects the sensor-roll distance and the sensor-standard reflector distance in real time. When the absolute value of the difference between the sensor-roll distance and the sensor-standard reflector distance exceeds a specified value, the alarm output means is connected to the control means for the positional deviation of the standard reflector. Is set in the program of the control means so that a warning step for warning is executed.

  For the sensor-roll distance and the sensor-standard reflector distance, values detected by either one of the non-contact sensors 22a and 22b are used. Specifically, for example, the non-contact sensor 22a is used to measure the sensor-standard reflector distance between the standard reflector 182 and the non-contact sensor. Similarly, the sensor-roller distance measured by the non-contact sensor 22a is used. The difference from the distance was calculated. The non-contact sensor 22b is used to measure the sensor-standard reflector distance between the standard reflector 181 and the non-contact sensor. Similarly, the difference between the sensor-roll distance measured by the non-contact sensor 22b. Was calculated.

  As described above, a long resin film having 5 lots of metal films was transported, and the spectral reflectance was measured by alternately repeating the measurement step and the calibration step. When measuring the spectral reflectance, sagging occurred in the long resin film having the metal film due to a conveyance trouble, and the stop step was performed several times. However, since the movement of the measurement head 13 was stopped at the stop step, the long resin film having the metal film and the measurement head 13 were not wrinkled by interference.

Also, no warning step occurred.
[Comparative Example 1]
Except that the non-contact sensor 22 is not provided, using the same spectral reflectance measuring apparatus as in the case of Example 1, a long resin film having 5 lots of metal film is conveyed, and a measurement step and a calibration step And were repeated alternately.

  However, in this comparative example, since the non-contact sensor is not provided as described above, the sensor-film distance, the axial position of the measurement roll 12 of the long resin film 11 having a metal film, the sensor roll The distance between sensors and the distance between sensor and standard reflector are not measured. For this reason, the stop step was performed only when the conveyance of the long resin film 11 having the metal film by the measurement roll 12 was stopped. Further, the warning step is not set in the program of the spectral reflectance measuring apparatus.

  As a result, sagging occurs in the long resin film having the metal film due to conveyance trouble, and the long resin film having the metal film and interference with the measurement head 13 cause wrinkles in the long resin film having the metal film. It was.

DESCRIPTION OF SYMBOLS 11 Long resin film which has a metal film 12 Measuring roll 13 Measuring head 14 Light source part 15 Spectrometer 16 Optical fiber 17 Moving means 181,182,191,192,201,202 Standard reflector 22,22a, 22b Non-contact sensor

Claims (5)

A spectral reflectance measuring device for measuring the spectral reflectance of a long resin film having a metal film,
A measurement roll that contacts the long resin film having the metal film and conveys the long resin film having the metal film;
A measuring head having a light irradiation unit and a reflected light receiving unit;
Moving means for moving the measuring head along the axial direction of the measuring roll;
A standard reflector disposed at the axial end of the measuring roll;
Calibration means for measuring the reflection intensity of the standard reflector and calibrating the conversion coefficient from the reflection intensity to the spectral reflectance;
Control means for moving the measuring head to a measuring position by the moving means and measuring the spectral reflectance of the long resin film having the metal film conveyed by the measuring roll;
A non-contact sensor disposed on both sides or one side of the measurement head along the moving direction of the measurement head,
The non-contact sensor includes a sensor-film distance between the non-contact sensor and the surface of the long resin film having the metal film, and an axial direction of the measurement roll of the long resin film having the metal film. Spectral reflectance measuring device that detects the position.   2. The spectral reflectance according to claim 1, further comprising a stopping unit that stops the movement of the measuring head by the moving unit when the sensor-film distance detected by the non-contact sensor becomes less than a predetermined value. measuring device.   Correction for correcting the edge position information of the long resin film having the metal film based on the edge position in the axial direction of the measurement roll of the long resin film having the metal film detected by the non-contact sensor. The spectral reflectance measuring device according to claim 1 or 2, further comprising means. The non-contact sensor is
A sensor-roll distance between the non-contact sensor and the surface of the measuring roll;
The sensor-standard reflector distance between the non-contact sensor and the standard reflector is also detected,
When the absolute value of the difference between one of the sensor-film distance and the sensor-roll distance and the sensor-standard reflector distance exceeds a specified value, the standard reflector The spectral reflectance measuring device according to any one of claims 1 to 3, further comprising an alarm output unit that warns of a positional deviation. A spectral reflectance measurement method using the spectral reflectance measurement device according to any one of claims 1 to 4,
When the long resin film having the metal film is conveyed by the measurement roll and the distance between the sensor and the film is equal to or greater than a specified value, the measurement head is moved by the moving means, and the metal A measurement step of measuring and recording the spectral reflectance of the long resin film having a film;
When the conveyance of the long resin film having the metal film by the measurement roll is stopped, or when the distance between the sensor and the film is less than a specified value, the movement of the measurement head is stopped, and the length having the metal film A spectral reflectance measurement method comprising: measuring spectral reflectance of a scale resin film; and stopping the recording.

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