JP2017136213A5 - - Google Patents

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JP2017136213A5
JP2017136213A5 JP2016019365A JP2016019365A JP2017136213A5 JP 2017136213 A5 JP2017136213 A5 JP 2017136213A5 JP 2016019365 A JP2016019365 A JP 2016019365A JP 2016019365 A JP2016019365 A JP 2016019365A JP 2017136213 A5 JP2017136213 A5 JP 2017136213A5
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Japan
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dimensional oct
oct data
analysis
eye
data generated
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JP2016019365A
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Japanese (ja)
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JP6880550B2 (ja
JP2017136213A (ja
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Priority to US15/422,866 priority patent/US10238281B2/en
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JP2016019365A 2016-02-03 2016-02-03 光干渉断層計 Active JP6880550B2 (ja)

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Application Number Priority Date Filing Date Title
JP2016019365A JP6880550B2 (ja) 2016-02-03 2016-02-03 光干渉断層計
US15/422,866 US10238281B2 (en) 2016-02-03 2017-02-02 Optical coherence tomography device

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Application Number Priority Date Filing Date Title
JP2016019365A JP6880550B2 (ja) 2016-02-03 2016-02-03 光干渉断層計

Publications (3)

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JP2017136213A JP2017136213A (ja) 2017-08-10
JP2017136213A5 true JP2017136213A5 (enrdf_load_stackoverflow) 2019-03-07
JP6880550B2 JP6880550B2 (ja) 2021-06-02

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JP2016019365A Active JP6880550B2 (ja) 2016-02-03 2016-02-03 光干渉断層計

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JP (1) JP6880550B2 (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7297133B2 (ja) * 2017-08-02 2023-06-23 株式会社トプコン 眼科情報処理装置及び眼科撮影装置
JP2019042264A (ja) * 2017-09-05 2019-03-22 株式会社トプコン 眼科撮影装置及び眼科情報処理装置
JP6976818B2 (ja) * 2017-10-30 2021-12-08 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
JP7135346B2 (ja) * 2018-03-06 2022-09-13 株式会社ニデック Ｏｃｔデータ処理装置およびｏｃｔデータ処理プログラム
JP7453406B2 (ja) * 2020-03-24 2024-03-19 ライカ インストゥルメンツ （シンガポール） プライヴェット リミテッド 手術用顕微鏡システムならびに手術用顕微鏡システムのためのシステム、方法およびコンピュータプログラム
JP2022159135A (ja) * 2021-03-31 2022-10-17 株式会社ニデック Ｏｃｔ装置、ｏｃｔデータ処理方法、プログラム、および記録媒体

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012156187A (ja) * 2011-01-24 2012-08-16 Canon Inc 光源装置及びこれを用いた撮像装置
JP2015134132A (ja) * 2014-01-20 2015-07-27 日立アロカメディカル株式会社 超音波診断装置
US11071452B2 (en) * 2014-06-30 2021-07-27 Nidek Co., Ltd. Optical coherence tomography device, optical coherence tomography calculation method, and optical coherence tomography calculation program
JP6535985B2 (ja) * 2014-06-30 2019-07-03 株式会社ニデック 光コヒーレンストモグラフィ装置、光コヒーレンストモグラフィ演算方法及び光コヒーレンストモグラフィ演算プログラム

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