JP2017026522A5 - - Google Patents
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- JP2017026522A5 JP2017026522A5 JP2015146963A JP2015146963A JP2017026522A5 JP 2017026522 A5 JP2017026522 A5 JP 2017026522A5 JP 2015146963 A JP2015146963 A JP 2015146963A JP 2015146963 A JP2015146963 A JP 2015146963A JP 2017026522 A5 JP2017026522 A5 JP 2017026522A5
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- 238000004458 analytical method Methods 0.000 claims 4
- 238000001816 cooling Methods 0.000 claims 3
- 230000001276 controlling effect Effects 0.000 claims 2
- 230000000875 corresponding Effects 0.000 claims 2
- 239000012295 chemical reaction liquid Substances 0.000 claims 1
- 239000003153 chemical reaction reagent Substances 0.000 claims 1
Claims (13)
温度監視領域の近くに位置し、第１の測定温度を出力する第１の温度センサと、
前記第１の温度センサとは異なる位置において、第２の測定温度を出力する第２の温度センサと、
各処理時点における前記第１の測定温度と目標温度との差分値に比例する第１の差分値ΔＴＡと、前記各処理時点における前記第１の測定温度と前記第２の測定温度との間の第２の差分値ΔＴＢとに基づいて前記熱源の出力熱量を制御する制御部と
を有する自動分析装置。 A heat source capable of changing or switching the output heat amount, and
A first temperature sensor located near the temperature monitoring region and outputting a first measured temperature;
A second temperature sensor that outputs a second measured temperature at a position different from the first temperature sensor;
Between the first difference value ΔTA proportional to the difference value between the first measured temperature and the target temperature at each processing time, and between the first measured temperature and the second measured temperature at each processing time A control unit that controls the amount of heat output from the heat source based on the second difference value ΔTB.
前記第２の温度センサは、前記熱源と前記第１の温度センサとの中間に位置する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The second temperature sensor is positioned between the heat source and the first temperature sensor. The automatic analyzer.
前記制御部は、ロジック回路である
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The automatic analysis apparatus, wherein the control unit is a logic circuit.
前記制御部は、
前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢを比較し、
前記第１の差分値ΔＴＡが前記第２の差分値ΔＴＢより大きいとき、前記熱源をオン制御し、
前記第１の差分値ΔＴＡが前記第２の差分値ΔＴＢより小さいとき、前記熱源をオフ制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The controller is
Comparing the first difference value ΔTA and the second difference value ΔTB;
When the first difference value ΔTA is larger than the second difference value ΔTB, the heat source is turned on,
When the first difference value ΔTA is smaller than the second difference value ΔTB, the heat source is controlled to be off.
冷却源を更に有し、
前記制御部は、
前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢを比較し、
前記第１の差分値ΔＴＡが前記第２の差分値ΔＴＢより大きいとき、前記熱源をオン制御すると共に、前記冷却源をオフ制御し、
前記第１の差分値ΔＴＡが前記第２の差分値ΔＴＢより小さいとき、前記冷却源をオン制御すると共に、前記熱源をオフ制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
A cooling source,
The controller is
Comparing the first difference value ΔTA and the second difference value ΔTB;
When the first difference value ΔTA is larger than the second difference value ΔTB, the heat source is turned on and the cooling source is turned off,
When the first difference value ΔTA is smaller than the second difference value ΔTB, the cooling source is turned on and the heat source is turned off. The automatic analyzer.
前記制御部は、
前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢとの偏差（＝ΔＴＡ−ΔＴＢ）を計算し、
前記各処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）に比例係数を乗算して第１の値を計算し、
前記各処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）に積分係数を乗算した値を積分することにより第２の値を計算し、
前記第１の値と前記第２の値の加算値により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The controller is
Calculating a deviation (= ΔTA−ΔTB) between the first difference value ΔTA and the second difference value ΔTB;
A first value is calculated by multiplying the deviation (= ΔTA−ΔTB) at each processing time by a proportional coefficient,
A second value is calculated by integrating a value obtained by multiplying the deviation (= ΔTA−ΔTB) at each processing time by an integration coefficient,
The automatic analysis apparatus, wherein the heat source is controlled by an added value of the first value and the second value.
前記制御部は、
前記各処理時点に、前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢとの偏差（＝ΔＴＡ−ΔＴＢ）を計算し、
前記各処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）に比例係数を乗算して第１の値を計算し、
前記各処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）に積分係数を乗算した値を積分することにより第２の値を計算し、
前回の前記処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）と現在の前記処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）との差分値に微分係数を乗算して第３の値を計算し、
前記第１の値、前記第２の値及び前記第３の値の加算値により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The controller is
At each processing time point, a deviation (= ΔTA−ΔTB) between the first difference value ΔTA and the second difference value ΔTB is calculated,
A first value is calculated by multiplying the deviation (= ΔTA−ΔTB) at each processing time by a proportional coefficient,
A second value is calculated by integrating a value obtained by multiplying the deviation (= ΔTA−ΔTB) at each processing time by an integration coefficient,
A difference value between the deviation at the previous processing time (= ΔTA−ΔTB) and the current current processing time (= ΔTA−ΔTB) is multiplied by a differential coefficient to calculate a third value;
The automatic analysis apparatus, wherein the heat source is controlled by an added value of the first value, the second value, and the third value.
前記制御部は、
前記各処理時点に、前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢとの偏差（＝ΔＴＡ−ΔＴＢ）を計算し、
前回の前記処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）と現在の前記処理時点における前記偏差（＝ΔＴＡ−ΔＴＢ）との差分値に微分係数を乗算した値により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The controller is
At each processing time point, a deviation (= ΔTA−ΔTB) between the first difference value ΔTA and the second difference value ΔTB is calculated,
The heat source is controlled by a value obtained by multiplying a difference value between the deviation at the previous processing time (= ΔTA−ΔTB) and the current deviation at the current processing time (= ΔTA−ΔTB) by a differential coefficient. Automatic analyzer to do.
前記熱源と、前記第１の温度センサと、前記第２の温度センサで構成される組を複数有し、
前記制御部は、
第１の組について、各処理時点における前記第１の測定温度と目標温度との差分値に比例する第１の差分値ΔＴＡと、前記各処理時点における前記第１の測定温度と前記第２の測定温度との間の第２の差分値ΔＴＢとの差分（＝ΔＴＡ−ΔＴＢ）から計算される第１の出力熱量によって前記熱源を制御し、
前記第１の組とは異なる第２の組について、前記各処理時点における前記第１の測定温度と目標温度との差分値に比例する前記第１の差分値ΔＴＡと、前記各処理時点における前記第１の測定温度と前記第２の測定温度との間の第２の差分値ΔＴＢとの差分（＝ΔＴＡ−ΔＴＢ）から計算される第１の出力熱量を、前記第１の組における前記第１の測定温度と前記第２の組における前記第１の測定温度との差分から計算される第２の出力熱量によって補正し、補正後の出力熱量により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
Having a plurality of sets composed of the heat source, the first temperature sensor, and the second temperature sensor;
The controller is
For the first set, the first difference value ΔTA proportional to the difference value between the first measured temperature and the target temperature at each processing time point, the first measured temperature at the respective processing time points, and the second The heat source is controlled by a first output heat amount calculated from a difference (= ΔTA−ΔTB) with a second difference value ΔTB between the measured temperature and
For the second set different from the first set, the first difference value ΔTA proportional to the difference value between the first measured temperature and the target temperature at each processing time point, and the above-mentioned at each processing time point The first output heat amount calculated from the difference (= ΔTA−ΔTB) between the second measured value and the second difference value ΔTB between the first measured temperature and the second measured temperature is the first output heat amount in the first set. Correcting by the second output heat amount calculated from the difference between the first measured temperature and the first measured temperature in the second set, and controlling the heat source by the corrected output heat amount Analysis equipment.
前記熱源と、前記第１の温度センサと、前記第２の温度センサで構成される組を複数有し、
前記制御部は、
第１の組について、各処理時点における前記第１の測定温度と目標温度との差分値に比例する第１の差分値ΔＴＡと、前記各処理時点における前記第１の測定温度と前記第２の測定温度との間の第２の差分値ΔＴＢとの差分（＝ΔＴＡ−ΔＴＢ）から計算される第１の出力熱量によって前記熱源を制御し、
前記第１の組とは異なる第２の組について、前記各処理時点における前記第１の組に対応する前記第１の測定温度と前記第２の組に対応する前記第１の測定温度との差分値から計算される第２の出力熱量によって、前記第１の出力熱量を補正し、
補正後の出力熱量により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
Having a plurality of sets composed of the heat source, the first temperature sensor, and the second temperature sensor;
The controller is
For the first set, the first difference value ΔTA proportional to the difference value between the first measured temperature and the target temperature at each processing time point, the first measured temperature at the respective processing time points, and the second The heat source is controlled by a first output heat amount calculated from a difference (= ΔTA−ΔTB) with a second difference value ΔTB between the measured temperature and
For a second set different from the first set, the first measured temperature corresponding to the first set at each processing time point and the first measured temperature corresponding to the second set. The first output heat amount is corrected by the second output heat amount calculated from the difference value ,
An automatic analyzer that controls the heat source according to the corrected output heat quantity.
前記制御部は、
（ａ）現在の前記処理時点における前記第１の測定温度と前記目標温度との偏差量に、所定の勾配係数と制御周期間隔とを乗算して求められる値と、（ｂ）前回の前記処理時点における前記第１の測定温度と現在の前記処理時点における前記第１の測定温度との間の変化量と、から計算される第１の出力熱量を、
前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢに基づいて計算される第２の出力熱量で補正し、
補正後の出力熱量により前記熱源を制御する
ことを特徴とする自動分析装置。 The automatic analyzer according to claim 1,
The controller is
(A) a value obtained by multiplying a deviation amount between the first measured temperature and the target temperature at the current processing time by a predetermined gradient coefficient and a control cycle interval; and (b) the previous processing. A first output heat amount calculated from the amount of change between the first measured temperature at a time point and the first measured temperature at the current processing time point,
Correct with the second output heat amount calculated based on the first difference value ΔTA and the second difference value ΔTB,
An automatic analyzer that controls the heat source according to the corrected output heat quantity.
前記温調ブロックに与える出力熱量を可変又は切り替えることが可能な熱源と、
温度監視領域の近くに位置し、第１の測定温度を出力する第１の温度センサと、
前記第１の温度センサとは異なる位置において、第２の測定温度を出力する第２の温度センサと、
各処理時点における前記第１の測定温度と目標温度との差分値に比例する第１の差分値ΔＴＡと、前記各処理時点における前記第１の測定温度と前記第２の測定温度との第２の差分値ΔＴＢとに基づいて前記熱源の出力熱量を制御する制御部と
を有する遺伝子検査装置。 A temperature control block for holding at least one reaction vessel containing a reaction liquid in which a sample and a reagent are mixed;
A heat source capable of changing or switching the amount of output heat given to the temperature control block;
A first temperature sensor located near the temperature monitoring region and outputting a first measured temperature;
A second temperature sensor that outputs a second measured temperature at a position different from the first temperature sensor;
A first difference value ΔTA that is proportional to a difference value between the first measured temperature and the target temperature at each processing time point, and a second of the first measured temperature and the second measured temperature at each processing time point. And a control unit that controls the amount of output heat of the heat source based on the difference value ΔTB.
前記制御部は、
各処理時点における前記第１の測定温度と目標温度との差分値に比例する第１の差分値ΔＴＡを計算し、
前記各処理時点における前記第１の測定温度と前記第２の測定温度との第２の差分値ΔＴＢを計算し、
前記第１の差分値ΔＴＡと前記第２の差分値ΔＴＢに基づいて前記熱源の出力熱量を制御する
ことを特徴とする温度制御方法。
At a position different from the first temperature sensor, a heat source capable of changing or switching the output heat amount, a first temperature sensor located near the temperature monitoring region and outputting the first measured temperature, In a temperature control method in an automatic analyzer having a second temperature sensor that outputs a measured temperature of 2 and a control unit that controls an output heat amount of the heat source,
The controller is
Calculating a first difference value ΔTA proportional to the difference value between the first measured temperature and the target temperature at each processing time point;
Calculating a second difference value ΔTB between the first measured temperature and the second measured temperature at each processing time point;
A temperature control method characterized by controlling an output heat amount of the heat source based on the first difference value ΔTA and the second difference value ΔTB.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015146963A JP6505538B2 (en) | 2015-07-24 | 2015-07-24 | Automatic analyzer, genetic testing apparatus and temperature control method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015146963A JP6505538B2 (en) | 2015-07-24 | 2015-07-24 | Automatic analyzer, genetic testing apparatus and temperature control method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017026522A JP2017026522A (en) | 2017-02-02 |
| JP2017026522A5 true JP2017026522A5 (en) | 2018-04-26 |
| JP6505538B2 JP6505538B2 (en) | 2019-04-24 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021149465A1 (en) * | 2020-01-22 | 2021-07-29 | 富士フイルム株式会社 | Processing device and measurement system |
| EP4123309A4 (en) | 2020-03-17 | 2024-04-10 | Hitachi High Tech Corp | Automatic analysis device |
| CN117043605A (en) * | 2021-03-31 | 2023-11-10 | 积水医疗株式会社 | Temperature regulating system of automatic analysis device |
| JP2023013159A (en) * | 2021-07-15 | 2023-01-26 | 株式会社日立ハイテク | automatic analyzer |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5862565A (en) * | 1981-10-09 | 1983-04-14 | Sekonitsuku:Kk | Control of liquid temperature |
| US9364833B2 (en) * | 2012-08-17 | 2016-06-14 | Lexmark International, Inc. | Micro-fluidic modules on a chip for diagnostic applications |
| JP6078346B2 (en) * | 2013-01-07 | 2017-02-08 | 株式会社日立ハイテクノロジーズ | Nucleic acid amplification apparatus, temperature control method, and temperature control apparatus |
| JP6030490B2 (en) * | 2013-03-29 | 2016-11-24 | 株式会社日立ハイテクノロジーズ | Nucleic acid analyzer and temperature control method thereof |
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