JP2016109561A - Cure degree measurement device and cure degree measurement method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a cure degree measurement device and a cure degree measurement method that are capable of measuring a cure degree of an adhesive in a non destructive manner, and uses a peak top wavelength of fluorescent light to confirm the cure degree, thereby enabling the measurement of the cure degree to be performed even in a case when the adhesive has variation in a film thickness.SOLUTION: The cure degree measurement device is provided with a peak top wavelength calculation part that calculates a peak top wavelength on the basis of fluorescent spectral data, and a cure degree calculation part that calculates the cure degree on the basis of the peak top wavelength calculated by the peak top wavelength calculation part. The cure degree measurement device uses the peak top wavelength calculation part to calculate a peak top wavelength of a measurement sample before curing with a cure degree of 0% and a peak top wavelength of the measurement sample after complete curing with a cure degree of 100% and uses the cure degree calculation part to obtain a relational expression between each peak top wavelength and the cure degree. The cure degree measurement device introduces, in the relational expression, a peak top wavelength of a cure degree measurement sample with an unknown cure degree to calculate the cure degree of the sample corresponding to the peak top wavelength.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a curing degree measuring apparatus and a curing degree measuring method for measuring the curing degree of a curable adhesive using fluorescence.

  As methods for measuring the degree of cure of the adhesive, methods using FT-IR (Patent Documents 1 to 3) and methods using DSC (Patent Documents 4 and 5) have been proposed.

Japanese Patent Laid-Open No. 62-103540 JP 2007-137041 A JP 2007-248431 A JP 2005-26234 A JP 2012-54582 A JP 2013-160753 A

The methods of Patent Documents 1 to 3 are useful methods that can monitor changes in the chemical structure associated with the curing of the adhesive, but read the FT-IR peak and determine which peak changes for each material. It is necessary to consider.
In addition, when the film is thin like an adhesive, the peak of the base material may be read, and it may be difficult to read the peak of the important adhesive.

  In the methods of Patent Documents 4 and 5, since a 1 mg sample is required even when a highly sensitive DSC is used, the versatility is low. For example, when measuring the degree of cure of an adhesive on a product, a 1 mg sample must be collected from a substrate that is completely adhered, and cannot be easily implemented. In Patent Document 6, ultraviolet rays are irradiated and the degree of cure is measured, but the amount of fluorescence is monitored. However, the amount of fluorescence also depends on the film thickness. Therefore, the film thickness needs to be uniform in order to correctly determine the degree of cure.

  An object of the present invention is to eliminate the uncertainty of reading a substrate peak such as IR, which is a problem of the prior art, further eliminates the need for collecting samples, and measures the degree of cure of the adhesive in a non-destructive manner. Another object of the present invention is to provide a novel degree-of-curing-degree measuring apparatus and degree-of-curing-measuring method capable of measuring the degree of hardening even when there is a variation in the film thickness of the adhesive in order to confirm the degree of hardening at the peak top wavelength of fluorescence.

  Other problems of the present invention will become apparent from the following description.

  The above problems are solved by the following inventions.

［ここで、式中、Ａは未知のサンプルのピークトップ波長（ｎｍ）であり、Ｘ_０％は硬化度０％のサンプルのピークトップ波長（ｎｍ）であり、Ｘ_１００％は硬化度１００％のサンプルのピークトップ波長（ｎｍ）である。］
前記関係式（１）に、硬度が未知の硬化度測定サンプルのピークトップ波長を導入して、該ピークトップ波長に対応する前記サンプルの硬化度を算出することを特徴とする硬化度測定装置。 (Claim 1)
An irradiation part for irradiating ultraviolet rays or visible light to the adhesive part of the sample for measuring the degree of cure;
A probe that receives fluorescence emitted by receiving ultraviolet light or visible light irradiated by the irradiation unit; and
A fluorescence spectrum data reading unit from fluorescence introduced from the probe; and
A peak top wavelength calculation unit for calculating a peak top wavelength from the fluorescence spectrum data read by the reading unit;
A curing degree calculation unit that calculates a curing degree from the peak top wavelength calculated by the peak top wavelength calculation unit,
In the peak top wavelength calculation unit, calculate the peak top wavelength of the measurement sample with a cure degree of 0% before curing and the peak top wavelength of the measurement sample with a cure degree of 100% after complete curing,
In the curing degree calculation unit, the following relational expression (1) between each peak top wavelength and the curing degree is obtained,

[Wherein, A is the peak top wavelength (nm) of an unknown sample, X _0% is the peak top wavelength (nm) of a sample with a cure degree of 0%, and X _100% is the cure degree of 100%. The peak top wavelength (nm) of the sample. ]
A curing degree measuring apparatus that introduces a peak top wavelength of a curing degree measurement sample whose hardness is unknown to the relational expression (1) and calculates a curing degree of the sample corresponding to the peak top wavelength.

［ここで、式中、Ａは未知のサンプルのピークトップ波長（ｎｍ）であり、Ｘ_０％は硬化度０％のサンプルのピークトップ波長（ｎｍ）であり、Ｘ_１００％は硬化度１００％のサンプルのピークトップ波長（ｎｍ）である。］
前記関係式（１）に、硬度が未知の硬化度測定サンプルのピークトップ波長を導入して、該ピークトップ波長に対応する前記サンプルの硬化度を算出することを特徴とする硬化度測定方法。 (Claim 2)
Irradiate ultraviolet rays or visible light from the irradiated part to the adhesive part of the sample for measuring the degree of cure,
Next, the probe emits fluorescence that emits light by receiving irradiated ultraviolet light or visible light,
Next, the fluorescence spectrum data is read from the fluorescence introduced from the probe by a reading unit,
Next, the peak top wavelength of the measurement sample with a curing degree of 0% before curing and the peak top wavelength of the measurement sample with a curing degree of 100% after complete curing are calculated by the peak top wavelength calculation unit from the read fluorescence spectrum data. Calculate
The following relational expression (1) between each of the peak top wavelengths and the curing degree is obtained by a curing degree calculation unit,

[Wherein, A is the peak top wavelength (nm) of an unknown sample, X _0% is the peak top wavelength (nm) of a sample with a cure degree of 0%, and X _100% is the cure degree of 100%. The peak top wavelength (nm) of the sample. ]
A curing degree measuring method, wherein a peak top wavelength of a curing degree measurement sample whose hardness is unknown is introduced into the relational expression (1), and a curing degree of the sample corresponding to the peak top wavelength is calculated.

  According to the present invention, the uncertainty of reading a substrate peak such as IR, which is a problem of the prior art, is eliminated, the collection of the sample is unnecessary, the degree of cure of the adhesive can be measured nondestructively, and the adhesive It is possible to provide a novel curing degree measuring device and a curing degree measuring method that do not depend on the thickness of the film.

The figure explaining an example of the hardening degree measuring apparatus for enforcing the hardening degree measuring method of this invention Functional block diagram of a PC according to an embodiment of the present invention The figure which shows the fluorescence spectrum in an Example The figure which shows the FT-IR spectrum in a comparative example

  Below, the form for implementing this invention is demonstrated in detail.

  FIG. 1 is a diagram illustrating an example of a curing degree measuring apparatus for carrying out the curing degree measuring method of the present invention.

  In FIG. 1, reference numeral 1 denotes an irradiation unit, and a laser light source is preferably used as the irradiation unit 1. Lasers can be classified according to the wavelength of the oscillated light. In the present invention, a laser that generates visible light or a laser that generates ultraviolet rays can be used.

  The curable adhesive is not particularly limited, and may be a thermosetting adhesive or a silane coupling agent. As the thermosetting adhesive, for example, a thermosetting phenol resin adhesive, a thermosetting epoxy resin adhesive, or the like can be used. As the silane coupling agent, for example, aminosilane, vinylsilane or the like can be used.

  Excitation light composed of ultraviolet light or visible light emitted from the laser light source 1 propagates to the tip of the probe 3 through the optical fiber 2 and exits. The optical fiber 2 is not limited as long as it can transmit pumping light with low loss.

  The probe 3 is set at an angle of 45 degrees in order to keep the distance from the curable adhesive-coated sample 4 constant, and the corner of the probe needs to be in contact with the curable adhesive-coated sample 4.

  When excitation light is applied to the curable adhesive-coated sample 4 from the optical fiber 2 built in the probe 3, fluorescence is generated from the curable adhesive-coated sample 4. The principle of light emission is, for example, in the case of a thermosetting phenol resin adhesive, due to the structure of a benzene ring, unsaturated carbon, etc., electrons are excited by light irradiation, and emit fluorescence when the electrons return to the ground state.

  This fluorescence is incident on the optical fiber 5 built in the probe 3, but simultaneously takes in the excitation light.

  In order to remove the excitation light, a long bath filter 6 is provided, and only the fluorescence for measuring the degree of cure passes through the optical fiber 7. This fluorescence is introduced into the spectrometer 8.

  The spectroscope 8 disperses the fluorescent light for each wavelength. Although not shown, the spectroscope 8 includes an entrance slit and a diffraction grating.

  The laser light source, the probe, the long pass filter, and the spectroscope are preferably provided under light shielding conditions, and are preferably installed in a dark box (not shown). When using a laser of class 3B or higher, it is preferable to provide a safety door switch at the sample taking-in / out part (not shown) of the dark box. When the door is opened, the light irradiation is automatically shut off and the operator is safe. Is preferably ensured.

  Next, the fluorescence introduced into the spectroscope 8 is wavelength-dispersed and sent to the PC 9.

  Hereinafter, the configuration of the PC 9 will be described with reference to FIG. FIG. 2 is a functional block diagram of the PC 9 according to the embodiment of the present invention. As shown in FIG. 2, the PC 9 includes a reading unit 91, a peak top wavelength calculation unit 92, and a curing degree calculation unit 93. .

  Next, the reading unit 91 reads fluorescence spectrum data from the wavelength-dispersed fluorescence.

  Next, the peak top wavelength calculation unit 92 calculates the peak top wavelength from the fluorescence spectrum data read by the reading unit 91. Any method may be used for obtaining the peak top, such as obtaining the maximum value or differentiating.

  Specifically, the peak top wavelength calculation unit 92 calculates the peak top wavelength of a measurement sample having a degree of cure of 0% before curing and the peak top wavelength of a measurement sample having a degree of cure of 100% after complete curing.

  Next, the curing degree calculation unit 93 obtains the following relational expression (1) from the calculated two peak top wavelengths and the corresponding curing degrees (0%, 100%). From this, it is possible to determine the degree of cure of an unknown sample.

Here, in the relational expression (1), A is a peak top wavelength (nm) of an unknown sample, X _0% is a peak top wavelength (nm) of a sample having a curing degree of 0%, and X _100% is It is a peak top wavelength (nm) of a sample having a curing degree of 100%. In addition, when the curing does not saturate, it is possible to set a certain wavelength as a curing degree of 100%.
This is illustrated by the examples described below.

  Since a relational expression can be easily created between the peak top wavelength and the degree of cure (%) for a sample with an unknown degree of cure, the degree of cure (%) can be measured if the peak top wavelength can be measured.

  In the present invention, the curable adhesive before baking (that is, the uncured curable adhesive) was used as a sample having a curing degree of 0%, and the curable adhesive that was completely baked (that is, the curing was saturated). The peak top wavelength is calculated for each sample using a curable adhesive or an adhesive cured to a certain degree when the curing does not saturate as a sample having a curing degree of 100%.

  By changing the baking conditions (temperature, time, etc.), the degree of cure (%) can be determined based on the relational expression as long as the peak top wavelength is known.

  According to the curing degree measuring apparatus and the curing degree measuring method of the present invention described above, the degree of cure of the curable adhesive can be measured easily and non-destructively by light irradiation.

  Compared with conventionally used FT-IR and DSC, the fluorescence measurement has an advantage that it can be easily carried out without requiring high expertise such as instrumental analysis.

  Therefore, according to the curing degree measuring apparatus and the curing degree measuring method of the present invention, for example, it can be easily incorporated into a baking process using an adhesive as a curable adhesive, and the curing degree can be easily incorporated in the process. Can be confirmed. The degree of cure of the adhesive can be known from the product after the adhesive has been cured, and it can be judged whether or not the baking has been performed normally.

  According to the present invention, it is possible to suitably perform production management of parts such as automobile parts using a thermosetting adhesive such as an oil seal, a gasket, a valve, and a dust cover.

  Moreover, it is not limited to these, For example, manufacture control can be performed suitably in the wide variety of industries which use thermosetting adhesives, such as a tire, shoes, a belt, a medical-related product, a coating material.

  A known fluorescence measuring device can also be used for acquiring the fluorescence spectrum or the peak top wavelength.

  Examples of the present invention will be described below, but the present invention is not limited to these examples.

Example 1
1. Relational Expression Creation Experiment From the following measurement examples 1 and 8, a relational expression is obtained.

<Measurement Example 1>
In calculating the relational expression, in order to avoid the thermal effect due to the difference in film thickness, a spin coater is used, and a phenol resin adhesive (Chemlock 202A manufactured by Road Far East Co., Ltd. having a solid content concentration of 20 wt%) is applied to the surface of the substrate. After uniformly coating and drying at room temperature (30 ° C.), baking was performed at 250 ° C. for 6.5 minutes.

The peak top wavelength is measured with the degree of cure of the adhesive obtained under such baking conditions as 100% cure.
When a peak top of this peak top wavelength or more is obtained, the degree of cure is 100%.

  Then, the adhesive after baking was irradiated with excitation light of 405 nm using the curing degree measuring apparatus shown in FIG. 1, and the spectrum of the emitted fluorescence was thereby obtained. The result is shown in FIG. The peak top wavelength is shown in Table 1.

<Measurement Example 8>
In Measurement Example 1, baking was not performed after room temperature drying (30 ° C.). That is, the curing degree in this case is set to 0%.

  Thereafter, as in Measurement Example 1, the adhesive was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

From the above measurement examples 1 and 8, X _0% and X _{100% of} the relational expression (1) are obtained.

2. Measurement and calculation of unknown degree of cure (%) <Measurement Example 2>
The condition of Measurement Example 1 was changed to baking at 230 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 100% from the peak top wavelength of Measurement Example 2.

<Measurement Example 3>
The condition of Measurement Example 1 was changed to baking at 210 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 58% from the peak top wavelength of Measurement Example 3.

<Measurement Example 4>
The condition in Measurement Example 1 was changed to baking at 190 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 48% from the peak top wavelength of Measurement Example 4.

<Measurement Example 5>
The condition of Measurement Example 1 was changed to baking at 170 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 44% from the peak top wavelength of Measurement Example 5.

<Measurement Example 6>
The condition of Measurement Example 1 was changed to baking at 150 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 39% from the peak top wavelength of Measurement Example 6.

<Measurement Example 7>
The condition of Measurement Example 1 was changed to baking at 130 ° C. for 6.5 minutes after drying at room temperature.

  Thereafter, as in Measurement Example 1, the adhesive after baking was irradiated with excitation light to obtain a fluorescence spectrum. The result is shown in FIG. The peak top wavelength is shown in Table 1.

  From the relational expression (1), the curing degree is 27% from the peak top wavelength of Measurement Example 7.

Comparative Example 1
About each adhesive sample of the measurement examples 1-8, it replaced with the cure degree measurement of this invention, and performed the FT-IR measurement, and obtained the spectrum. The result is shown in FIG.

In the case of a phenol resin, a change was observed at 1650 cm ⁻¹ in the FT-IR spectrum, but no change was observed at the baking temperature of 150 ° C. or lower in Measurement Examples 6 to 8, and the degree of cure could not be measured correctly. .

1: Laser light source 2: Optical fiber 3: Probe 4: Curing type adhesive coating sample 5: Optical fiber 6: Long pass filter 7: Optical fiber 8: Spectrometer 9: PC
91: Reading unit 92: Peak top wavelength calculating unit 93: Curing degree calculating unit

Claims (2)

An irradiation part for irradiating ultraviolet rays or visible light to the adhesive part of the sample for measuring the degree of cure;
A probe that receives fluorescence emitted by receiving ultraviolet light or visible light irradiated by the irradiation unit; and
A fluorescence spectrum data reading unit from fluorescence introduced from the probe; and
A peak top wavelength calculation unit for calculating a peak top wavelength from the fluorescence spectrum data read by the reading unit;
A curing degree calculation unit that calculates a curing degree from the peak top wavelength calculated by the peak top wavelength calculation unit,
In the peak top wavelength calculation unit, calculate the peak top wavelength of the measurement sample with a cure degree of 0% before curing and the peak top wavelength of the measurement sample with a cure degree of 100% after complete curing,
In the curing degree calculation unit, the following relational expression (1) between each peak top wavelength and the curing degree is obtained,

[Wherein, A is the peak top wavelength (nm) of an unknown sample, X _0% is the peak top wavelength (nm) of a sample with a cure degree of 0%, and X _100% is the cure degree of 100%. The peak top wavelength (nm) of the sample. ]
A curing degree measuring apparatus that introduces a peak top wavelength of a curing degree measurement sample whose hardness is unknown to the relational expression (1) and calculates a curing degree of the sample corresponding to the peak top wavelength. Irradiate ultraviolet rays or visible light from the irradiated part to the adhesive part of the sample for measuring the degree of cure,
Next, the probe emits fluorescence that emits light by receiving irradiated ultraviolet light or visible light,
Next, the fluorescence spectrum data is read from the fluorescence introduced from the probe by a reading unit,
Next, the peak top wavelength of the measurement sample with a curing degree of 0% before curing and the peak top wavelength of the measurement sample with a curing degree of 100% after complete curing are calculated by the peak top wavelength calculation unit from the read fluorescence spectrum data. Calculate
The following relational expression (1) between each of the peak top wavelengths and the curing degree is obtained by a curing degree calculation unit,

[Wherein, A is the peak top wavelength (nm) of an unknown sample, X _0% is the peak top wavelength (nm) of a sample with a cure degree of 0%, and X _100% is the cure degree of 100%. The peak top wavelength (nm) of the sample. ]
A curing degree measuring method, wherein a peak top wavelength of a curing degree measurement sample whose hardness is unknown is introduced into the relational expression (1), and a curing degree of the sample corresponding to the peak top wavelength is calculated.

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