JP2015204024A - Examination reception support system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To support so that a medical examinee can perform inspection efficiently.SOLUTION: An examination reception support system comprises: a database 11 in which a reception parameter formed of plural determination ranks to plural inquiry items and/or inspection is associated for plural inspection items, and required inspection time required for inspection of the inspection item corresponding to every reception parameter, is stored; required inspection time acquisition means 13 for referring to the database 11 based on the inspection item of the medical examinee and reception parameter of the medical examinee, and acquiring the required inspection time required for the respective inspection of the medical examinee; inspection standby time acquisition means 14 for determining standby time to the inspection of the respective inspection item based on the required inspection time required for the respective inspection of the medical examinee; and inspection item order determination means 15 for determining an order of the inspection items which the medical examinee receives, based on the inspection items which the medical examinee receives and the standby time to inspection of the respective inspection item.

Description

  The present invention relates to an examination consultation support system that can be introduced into a medical facility that conducts a medical examination such as a medical checkup.

  In Patent Document 1, priority is assigned to the examinee, and for a low-priority examinee, the number of patients waiting for examination is weighted by multiplying by a certain coefficient, and the examinee with higher priority than the low-priority examinee However, a examinee guidance system having a mechanism for guiding to an examination place with a small number of waiting persons is disclosed.

  Patent Document 2 discloses a medical examination support system that constantly determines the degree of congestion in each laboratory with respect to the examination route established according to the examination course, and determines the examination route that shortens the examination time. ing.

JP 2011-008517 A JP 2011-022836 A

  Usually, when examining a patient, the doctor or examination to be inspected based on the interview (subject's symptom, past history, family history, medication status) of the subject patient and the judgment rank of the results of the examination received in the past Engineers have different areas of interest. For this reason, even when the same examination is performed, the examination time for the examinee is not constant, and is often different for each examinee. Therefore, the waiting time for inspection cannot be calculated by a simple expression of (single inspection time × number of people waiting for inspection).

  In patent document 1, it corresponds only by waiting number of people, and the inspection time fluctuation | variation by each individual is not considered. Since the examination time of each examination varies depending on the type and individual examinee, the waiting time itself may be small even when there are many waiting persons.

  In the system of Patent Document 2 above, the examination time at each examination place is set for each medical examination course through a field survey at an actual medical examination facility, but the time varying depending on the individual condition / situation of the individual is considered. The inspection time is not used.

  The present invention has been made in view of the current state of the examination consultation support system as described above, and an object of the present invention is to provide an examination consultation support system that assists the examiner to perform the examination efficiently.

  The examination consultation support system according to the present invention associates a plurality of examination items with a plurality of inquiry items and / or a plurality of determination ranks with respect to the examination, and tests examination items corresponding to each examination parameter. A required time required for acquiring the time required for each examination of the examinee by referring to the database on the basis of the database in which the required time required for the examination is stored, the examination items of the examinee and the examination parameters of the examinee And an examination waiting time acquisition means for obtaining a waiting time for the examination of each examination item based on the examination required time required for each examination of the obtained examinee, the examination item of the examinee to be examined and the examination of each examination item The examination item order determining means for obtaining the order of examination items to be examined by the examinee based on the waiting time for the examination item.

  The examination consultation support system according to the present invention is characterized in that the examination waiting time acquisition means obtains a waiting time for each examination subject including an examination apparatus that performs an examination for each examination item.

  In the examination support system according to the present invention, the examination item order determining means divides the examination items into groups according to priority, and obtains the order of examination items to be examined by the examinee from the examination items of the higher priority group. Features.

  In the examination consultation support system according to the present invention, the examination item order determining means precedes examination items with a short waiting time for a plurality of examination items in the same group.

  In the examination consultation support system according to the present invention, the database includes, for each examination parameter for each of a plurality of examination items, a total examination time obtained by adding the examination required time required by the past examinee, and the accumulated examination time. The number of examinees for each examination required time is stored, and the examination required time is calculated by dividing the total examination time by the number of examinees.

  The examination consultation support system according to the present invention adds the examination required time required by the examinee to the total examination time and increments the number of examinees for the necessary examination parameters of the necessary examination items, and reflects the history in the database. Reflecting means is provided.

  The examination consultation support system according to the present invention includes, for each examination item examined by the examinee, guidance image information creation means for creating guidance image information of a list including at least waiting time and incomplete information on the examination, And display control means for displaying a guide image on the display unit based on the guide image information.

  According to the present invention, a plurality of examination items are associated with a plurality of inquiry items and / or examination parameters composed of a plurality of determination ranks for examinations, and the examination time required for examination of the examination items corresponding to each of the examination parameters. Is used to refer to the database based on the consultation parameters, to obtain the examination time required for each examination of the examinee, based on the obtained examination time required for each examination of the examinee, The waiting time for the examination of each examination item is obtained, and the order of the examination items to be examined by the examinee is obtained based on the examination items of the examinee to be examined and the waiting time for the examination of each examination item. The error of examination required time and waiting time due to the individual condition of the examinee can be reduced, and the examinee can perform the examination efficiently A.

The block diagram which shows embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the examination time acquisition table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the log | history data table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the last determination rank table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the inquiry table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the implementation status table used in embodiment of the examination consultation support system which concerns on this invention. The figure which shows an example of the examination waiting queue table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the priority table used in embodiment of the examination consultation assistance system which concerns on this invention. The figure which shows an example of the guidance image displayed in embodiment of the examination consultation assistance system which concerns on this invention. The flowchart for demonstrating operation | movement of embodiment of the examination consultation assistance system which concerns on this invention.

  Hereinafter, an examination consultation support system according to an embodiment of the present invention will be described with reference to the accompanying drawings. In the drawings, the same components are denoted by the same reference numerals and redundant description is omitted. FIG. 1 is a configuration diagram of an examination consultation support system according to an embodiment. The examination consultation support system has a configuration in which a database server 10 and terminal devices 20-1 to 20-n are connected by a network 30. Each of the terminal devices 20-1 to 20-n includes a terminal central control unit configured by a display unit that displays information, an input unit that inputs information, a CPU, and the like. The network 30 may be wireless or wired. In addition to the terminal devices 20-1 to 20-n, the network 30 includes inspection items to be inspected with history data described later, personal information of the examinee, examination items for the examinee, and examination items relating to past examinations. For example, there may be provided a terminal device for inputting a guide image information creation request for all examination examinees on a certain day according to the determination rank in FIG. Further, this creation request may be input from the terminal devices 20-1 to 20-n.

  The database server 10 includes a database 11. The database 11 is associated with a plurality of examination items and / or consultation parameters consisting of a plurality of determination ranks for the examination for each of the plurality of examination items, and the time required for the examination required for examination of the examination item corresponding to each examination parameter. A stored examination time acquisition table is provided. This table can be configured as shown in FIG. 2, for example. Each examination item # 1 to #N (integer) is configured to set a total examination time, a total number of examinees, and a required examination time. Each examination item indicates examination contents such as blood sampling, electrocardiograph, chest X-ray and the like.

  The examination time acquisition table is configured in a matrix and has a plurality of inquiry items # 1 to #M (integer) and a judgment rank (A judgment, B judgment,. Judgment) is set. The number of determination ranks is an example, and there is no particular limitation. The inquiry items can be items such as subjective symptoms, past illnesses, family composition, and medication status. The inspection results are classified into ranks. For example, the closer to ABC.

  In the examination time acquisition table, the time and the number of people are written in the blanks. For example, the blank at the intersection of the examination item # 1 and the interview item # 1 is the sum of the examination time when the examinee of the examination item # 1 has undergone the examination of the examination item # 1 The total number of patients is written in the column for the total number of examinees below, and the time obtained by dividing the total examination time by the number of total examinees is written in the column for the required examination time. It is.

  For example, in the blank at the intersection of the cumulative inspection time of inspection item # 1 and the A determination, the inspection when the examinee previously determined to be A determination for inspection item # 1 has undergone inspection of inspection item # 1 The accumulated time is written, the cumulative number of patients below is written in the column of the total number of examinees below, and the total examination time is shown as the total number of examinees in the time required for examination below. The divided time is written.

  For the database 11, the history reflecting means 12 reflects the history with the history data input from the terminal devices 20-1 to 20-n or the like. The following history data is input from the terminal devices 20-1 to 20-n. For example, “examination time when the examinee of inquiry item # 1 has undergone the inspection of inspection item # 1” or “examiner who has been determined to have A determination in the past for inspection item # 1 performs the inspection of inspection item # 1. "Inspection time when receiving". The input history data is stored in the history data table in the database 11 as shown in FIG. The history reflecting means 12 refers to the history data table at a predetermined timing, adds the time required for examination required by the examinee to the total examination time in the examination time acquisition table for the necessary examination parameters of the necessary examination items, and receives the examination. The number of persons is incremented and the history is reflected in the examination time acquisition table of the database 11.

  In addition to the history reflecting means 12, the server central control unit (CPU) of the database server 10 includes an inspection required time acquisition means 13, an inspection waiting time acquisition means 14, an inspection item order determination means 15, and a guide image information creation means 16. It has been. The examination required time acquisition means 13 refers to the database 11 based on the examination items of the examinee and the examination parameters of the examinee, and obtains the examination required time required for each examination of the examinee. For example, when the examinee X who performs the examination visits the patient X, the inquiry item is determined, and when the inquiry item is determined and the inspection item of the examinee X is determined as the inspection item # 1, the patient number of the examinee X For example, a personal information such as an examination item, an inquiry item, and a request for creating guided image information are input from a terminal device (not shown). The database 11 includes a previous determination rank table shown in FIG. 4 and an inquiry table shown in FIG. When the inquiry item is input, the server central control unit stores the examinee number and the corresponding / non-applicable information in the corresponding column of the inquiry table in FIG.

  The previous determination rank table shown in FIG. 4 corresponds to each examination item # 1 to #N (integer), for each examinee number (identification information) of the examinee, the determination rank (examination parameter) as each examination result. Is stored after the determination by the previous inspection. As shown in FIG. 4, the determination rank is described as A / B / C / D1 / D2 / E, and one of the determination ranks is stored.

  Further, the server central control unit stores the examinee number and any information of the target / complete / non-target in the implementation status table of FIG. 6 provided in the database 11 corresponding to the input of the examination item. I do. Here, it is assumed that the inquiry item which is a consultation parameter regarding the examinee X is the inquiry item # 1, and the examinee X has a determination rank (examination parameter) of A determination in the examination of the examination item # 1 last time. In the case of this examinee X, the examination required time acquisition means 13 refers to the database 11 and obtains the examination required time (T1) in the intersection position column between the examination item # 1 and the inquiry item # 1, and the examination. The inspection required time (T2) in the intersection position column between item # 1 and A determination is obtained.

  The required inspection time acquisition unit 13 acquires the required inspection time required for the inspection of the inspection item # 1 from the required inspection time (T1) and the required inspection time (T2) using a predetermined rule. Here, the rule may be, for example, either an average value, a time required for examination (T1) obtained from an inquiry item, or a time required for examination (T2) obtained from a determination rank. . Here, it is assumed that the average required inspection time (T3) is obtained. When there are other examination items of the examinee, the time required for the examination is obtained in the same manner.

  The inspection waiting time acquisition means 14 obtains the waiting time for the inspection of each inspection item based on the required inspection time required for each inspection of the examinee. Here, the inspection waiting time acquisition unit 14 obtains a waiting time for each inspection subject including an inspection apparatus that performs inspection for each inspection item. The term “inspection body” means an inspection device or an inspector who performs the inspection, and one inspection body can inspect a single examinee. Therefore, if there are two subjects, it indicates that two examinees can be examined simultaneously. In the inspection waiting queue table of FIG. 7, the inspection item # 1 has one inspection subject # 11 and the inspection item # 2 has two inspection subjects # 21 and # 22. The following inspection items are inspection subjects. Indicates one case.

  For each of the examination subject # 11 and the examination subjects # 21 and # 22, the information of the identification information of the examinee and the time required for the examination are enqueued into vacant entries in ascending order of entry numbers. The total required inspection time enqueued in the inspection wait queue table is the total waiting time for each inspection subject. The examination is performed in ascending order of the entry numbers. When the examination is completed, the identification information of the examinee and the time required for examination are dequeued from the examination waiting queue table, and the remaining queue is shifted to the left.

  The examination item order determination means 15 obtains the order of examination items received by the examinee based on the examination items of the examinee receiving the examination and the waiting time for the examination of each examination item. Here, the examination item order determination means 15 groups the examination items according to the priority order, and obtains the order of the examination items that the examinee receives from the examination items of the group having a higher priority.

  FIG. 8 shows a priority table used by the inspection item order determination means 15. The numbers stored in the inspection group column are priorities, and the higher the priorities, the smaller the numbers. The examination item order determination means 15 takes out the examination items for which the examinee is to be examined from all the examination items in the priority order table and arranges them according to the priority order. Here, it is assumed that the examinee receives inspections of all inspection items in the priority order table shown in FIG.

  Next, the inspection item order determining means 15 refers to the inspection waiting queue table of FIG. 7 and selects the inspection item (inspection subject) with the shortest waiting time from among the inspection items having the priority “1” and waits for the inspection. Enqueue in the queue table. At this time, the guide image information creating means 16 creates guide image information of a list including at least waiting time and incomplete information on the test for each test item to be examined by the examinee. The created guide image information is transmitted to, for example, one of the terminal devices 20-1 to 20-n, and is displayed on the display unit by the display control means of the terminal device.

  FIG. 9 shows an example of the guidance image displayed on the display unit of the terminal. For each inspection item, information on the inspection group, the planned number of inspections, and the number of persons who have been performed is displayed in addition to the information on waiting time and incomplete inspection. Further, a special display such as a color change is performed on one horizontal column including the inspection item (inspection subject) to be inspected next. Viewing this image, the examinee can go to the inspection place of the inspection item (inspection subject) to be inspected next.

  In the embodiment of the examination consultation support system configured as described above, each unit operates based on the program of the flowchart shown in FIG. The operation of the embodiment of the examination consultation support system will be described below. The examinee who has visited the examination receives the inquiry and determines the inquiry item and the examination item (S11).

  Subsequently, a system administrator or the like inputs personal information such as a visitor number (identification information), an inquiry item, and an inspection item to the database server 10 (S12). Next, as described with reference to FIG. 5, the inquiry items are stored in the inquiry table (S13).

Further, the inspection time acquisition means 13 refers to the inspection time acquisition table and acquires the inspection time of each inspection item based on the inquiry item in the inquiry table and the determination rank in the previous determination rank table (S14).

  Next, the inspection waiting time acquisition means 14 refers to the inspection waiting queue table in FIG. 7, and the inspection item (inspection subject) having the smallest waiting time among the inspection items (inspection subject) in the inspection group of the priority table in FIG. ) Is detected (S15). Further, enqueue (store the examinee number and waiting time) in the inspection item (inspection subject) of the detected waiting queue table (S16).

  Next, guide image information is created based on the priority order table of FIG. 8, the enqueued information and the information on the end of the examination, and displayed on the terminal device (S17). When the examinee performs an examination according to the displayed guidance image, and the determination rank that is the end or examination result is obtained and inputted, the history reflection means 12 creates a history data table (S18), and the history data table Based on the information, the information is reflected in the examination time acquisition table (S19), and the process ends. In addition, step S15 to step S19 surrounded by a broken line in FIG. 10 are repeated every time one inspection is completed, and all the inspections are completed and the end.

  In the present embodiment, the time required for the examination is totaled in the system and the examination time of the database 11 is obtained for the examination person who has obtained the inquiry item corresponding to the examination or for the examination person who has been given a judgment rank in the examination. The database 11 is updated so that it can be stored in a table and the expected examination time of the waiting patient can be determined from the examination time acquisition table of the database 11. Using the examination time acquisition table of the database 11, the waiting time for each of a plurality of examination items is obtained, and it is derived and displayed as to which examination it is appropriate to guide the examinee.

  In this embodiment, management of medical check-ups at medical check-up facilities and inspection work, registration of results and findings after inspection, determination based on reference values, and generation of guidance words for medical check-ups based on the determined contents Can be part of the inspection system. It can be said that it is a system for guiding the examinee to the examination place so that the examination can be performed efficiently.

DESCRIPTION OF SYMBOLS 10 Database server 11 Database 12 History reflection means 13 Inspection required time acquisition means 14 Inspection waiting time acquisition means 15 Inspection item order determination means 16 Guide image information creation means 20-1 to 20-n Terminal device 30 Network

Claims (7)

A database in which a plurality of examination items and / or examination parameters including a plurality of determination ranks for examinations are associated with each examination item, and an examination required time required for examination of the examination item corresponding to each examination parameter is stored; ,
Examination time acquisition means for referring to the database based on the examination items of the examinee and the examination parameters of the examinee, and obtaining the examination required time required for each examination of the examinee,
Examination waiting time obtaining means for obtaining a waiting time for the examination of each examination item based on the examination required time required for each examination of the obtained examinee,
Examination examination support characterized by comprising examination item order determination means for determining the order of examination items to be examined by the examinee based on examination items of the examinees to be examined and waiting times for examinations of the respective examination items system. Inspection waiting time acquisition means
2. The examination consultation support system according to claim 1, wherein a waiting time is obtained for each examination subject including an examination apparatus that performs an examination for each examination item. Inspection item order determination means
3. The examination consultation support system according to claim 1 or 2, wherein the examination items are grouped according to priority, and the order of examination items received by the examinee is obtained from the examination items of a group having a high priority. Inspection item order determination means
4. The examination support system according to claim 3, wherein a plurality of examination items in the same group are preceded by an examination item with a low waiting time. The database includes the total examination time for each examination parameter for each of the examination items plus the examination time required by the past examinees, and the number of examinees for each examination duration included in this cumulative examination time. Is remembered,
6. The examination consultation support system according to claim 1, wherein the examination duration is calculated by dividing the total examination time by the number of examinees.   With respect to the required consultation parameters of the required examination items, the apparatus includes a history reflecting means for adding the examination required time required by the examinee to the accumulated examination time and incrementing the number of examinees to reflect the history in the database. The examination support system according to claim 5. Guide image information creating means for creating guide image information of a list including at least waiting time and incomplete information of the test for each test item to be examined by the examinee,
The examination support system according to any one of claims 1 to 6, further comprising display control means for displaying a guide image on a display unit based on the guide image information.