JP2015058693A - Display body for counterfeit prevention capable of being determined authenticity and production method thereof and authenticity determination method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a counterfeit prevention technique which makes copying and imitation impossible by using a self-organization pattern which is irregular and is formed in self-organizational state, which is a display body for counterfeit prevention capable of being determined its authenticity by an extremely fine pattern area, and a production method of the display body and an authenticity determination method are also provided.SOLUTION: Provided is a display body 1A for counterfeit prevention capable of being determined its authenticity and having an irregular self-organization pattern 3 formed in self-organizational state on a base material 2.

Description

  The present invention relates to an anti-counterfeit display capable of determining authenticity, a manufacturing method thereof, and an authenticity determining method.

  Various anti-counterfeiting techniques such as holograms, watermarks, luminescent inks, and latent image patterns are applied to gold vouchers, securities, certification stamps, credit cards, membership cards, expensive items, and the like.

  In recent years, semiconductor components such as microchips have become counterfeit targets. By replacing a microchip incorporated in a communication device or a military device with a counterfeit product, it becomes possible to artificially generate a situation such as leakage of confidential information or a fatal device malfunction. For this reason, it is required to apply anti-counterfeiting technology to very fine parts on the micrometer scale.

  The anti-counterfeiting technology includes an overt type that is visible with the naked eye under natural light, and a covert type that is not visible with the naked eye and can only be confirmed by using a special optical device. Since the covert type is invisible to the naked eye, the covert type is less likely to be noticed that anti-counterfeiting has been applied compared to the overt type, and is less likely to be duplicated or imitated. Therefore, a high anti-counterfeiting effect is expected.

  As an example of the covert type anti-counterfeiting technique, Patent Document 1 proposes a technique using taggant particles that are fine particles having traceable information therein. Taggant particles are known to have letters, numbers, signs, and special colors, and can be identified by magnifying them. Therefore, since the taggant particles themselves are difficult to discriminate and are difficult to duplicate or imitate, the technique of Patent Document 1 is considered to have a high anti-counterfeit effect.

  In addition, as an example of a technique that cannot be visually recognized by the naked eye and difficult to duplicate or imitate due to its high irregularity, Patent Document 2 proposes a technique that uses an irregular ink distribution pattern of transparent ink. Has been. In this technique, a transparent ink that repels the underlying layer is applied to form an ink distribution pattern. Then, an irregularly repelled ink distribution pattern image is measured (read) with a dedicated reader capable of measuring the ink surface temperature distribution at a resolution of 12 dots / mm, and the obtained ink distribution pattern image is uniquely specified in advance. Register as Then, the surface temperature of the determination object is measured by the reader, and the authenticity determination is performed by collating with the registered ink distribution pattern image. This technique is considered to have a high anti-counterfeiting effect due to the invisibility with the naked eye by using transparent ink and the low reproducibility by using “repelling” of ink.

International Publication No. 2012/141212 JP 2012-40834 A

  However, even the anti-counterfeit technology described in Patent Document 1 may be counterfeited. In other words, even when taggant particles are used, if specific information possessed by these particles is revealed, they can be copied or imitated, and as a result, authenticity determination becomes difficult. Note that Patent Document 1 proposes taggant particles that also have second identification information that cannot be identified at a magnification that allows identification of the first identification information, assuming that the first identification information is duplicated. However, even in this case, if the second identification information is also made clear, it can be duplicated or imitated, and it is still difficult to determine the authenticity.

  In addition, since the anti-counterfeiting technique described in Patent Document 2 uses an irregular pattern formed by ink “repelling”, the pattern size and the pattern formation region tend to vary, and the ink pattern size and It is difficult to form an identifiable pattern in a fine area below the resolution. Moreover, even if it is possible to form a pattern that can be identified by a fine area below the ink pattern size or resolution, it is difficult to read an image because an image reader with a resolution of 12 dots / mm is used. It is.

  The present invention has been made in view of these problems, and is an anti-counterfeit technology that makes it impossible to duplicate or imitate by using an irregular self-organized pattern formed in a self-organized manner. An object of the present invention is to provide an anti-counterfeit display body capable of determining authenticity in a simple pattern region, a manufacturing method thereof, and an authenticity determination method.

  The counterfeit-preventing display body capable of determining authenticity of the present invention has an irregular self-organized pattern formed in a self-organizing manner on a substrate.

  In the anti-counterfeit display body capable of determining authenticity, the self-assembled pattern is preferably formed by a periodic phase separation structure of an organic polymer.

  In the anti-counterfeit display body capable of determining authenticity, it is preferable that the periodic phase separation structure of the organic polymer forming the self-assembled pattern is a cylinder structure or a lamella structure.

  In the anti-counterfeit display body capable of determining authenticity, a layer of the organic polymer in which the period of the periodic phase separation structure of the organic polymer forming the self-assembled pattern is in the range of 10 to 100 nm. Is preferably in the range of 10 to 100 nm.

  The anti-counterfeit display body capable of determining authenticity preferably has an alignment mark in the same plane as the self-organized pattern.

  The method for producing an anti-counterfeit display body capable of determining authenticity according to the present invention comprises applying an organic polymer capable of forming a periodic phase-separated structure in a self-organizing manner onto a substrate, and then heating the substrate to make it irregular. It is characterized by forming a self-organizing pattern.

  In the method of manufacturing the anti-counterfeit display capable of determining authenticity, it is preferable that the periodic phase separation structure of the organic polymer forming the self-organized pattern is a cylinder structure or a lamella structure.

  In the method for producing a counterfeit-preventing display body capable of determining authenticity, it is preferable to form an alignment mark on the substrate prior to the formation of the self-assembled pattern.

  The authenticity determination method of the present invention is a method for determining the authenticity of an anti-counterfeit display body having an irregular self-organized pattern formed in a self-organizing manner on a base material, the anti-counterfeit display body The genuine phase separation structure in the self-organization pattern is read with an atomic force microscope, and the read phase separation structure is registered as the genuine image data of the counterfeit prevention display body. The phase separation structure in the organized pattern is read with an atomic force microscope, and the read phase separation structure is collated with the genuine image data previously registered.

For example, even when the same organic polymer is used, the same pattern cannot be reproduced as the self-organized pattern formed by the self-organization phenomenon. In addition, since the pattern size is very fine, it is impossible to visually recognize it with the naked eye, it is difficult to recognize that anti-counterfeiting has been performed, and a very expensive process such as lithography technology is used. Even this pattern is difficult to duplicate.
Therefore, according to the anti-counterfeit display body of the present invention, since the self-organization pattern is provided on the substrate, a high anti-counterfeit effect can be exhibited. In addition, since the anti-counterfeiting effect can be exhibited in the fine pattern formation region, the anti-counterfeit function can be imparted to such electronic parts and optical parts by using fine electronic parts and optical parts as the base material. Can do.

It is a figure which shows 1st Embodiment of the display body for forgery prevention which concerns on this invention, (a) is a principal part enlarged plan view, (b) is a principal part enlarged side sectional view. It is a figure which shows 1st Embodiment of the display body for forgery prevention which concerns on this invention, (a) is a principal part enlarged plan view, (b) is a principal part enlarged side sectional view. (A)-(c) is a sectional side view for demonstrating the preparation methods of the display body for forgery prevention shown in FIG. (A), (b) is a sectional side view for demonstrating the preparation methods of the display body for forgery prevention shown in FIG. It is the image of the self-organization pattern obtained by measuring in the phase mode of AFM in the Example.

Hereinafter, the present invention will be described in detail with reference to the drawings.
FIG. 1 is a diagram showing a first embodiment of a counterfeit-preventing display body according to the present invention, in which (a) is a main part enlarged plan view and (b) is a main part enlarged side sectional view. In FIGS. 1A and 1B, reference numeral 1A denotes a forgery prevention display body.
FIGS. 2A and 2B are diagrams showing a second embodiment of the counterfeit-preventing display body according to the present invention, in which FIG. 2A is an enlarged plan view of an essential part, and FIG. In FIGS. 2A and 2B, reference numeral 1B denotes a counterfeit prevention display body.

As shown in FIGS. 1 (a), 1 (b), 2 (a), and 2 (b), the anti-counterfeit display 1A, 1B has a self-organized pattern 3 on a substrate (base material) 2, Furthermore, the alignment mark 4 is provided in the same plane as the self-organizing pattern 3.
As the substrate 2, film base materials such as PET (polyethylene terephthalate), PETG (polyethylene terephthalate copolymer), PVC (polyvinyl chloride), glass, silicon wafer, ITO, etc. are appropriately selected according to the purpose, Used. In particular, when glass, a silicon wafer, ITO, or the like is used as the substrate 2, these may be fine electronic components or optical components.

  The substrate 2 is formed with a concave portion or a convex portion for forming the alignment mark 4. In the example shown in FIGS. 1A and 2A, a cross-shaped concave portion or convex portion as an alignment mark is formed on the substrate 2. Therefore, as will be described later, by providing a self-assembled pattern 3 made of an organic polymer layer on the surface of the substrate 2, the self-assembled pattern 3 can be formed by using the concave portion or the convex portion as a base. Alternatively, a cross-shaped alignment mark 4 having a concave structure or a convex structure is formed following the convex part.

  The alignment mark 4 is for determining the position and measurement range of the authenticity determination pattern, and the shape of the alignment mark 4 can be any mark as long as it can be read by the authenticity determination pattern reader described later. It may be a simple shape. Accordingly, in the example shown in FIGS. 1A and 2A, the cross-shaped mark is formed by the concave structure or the convex structure, but various marks can be adopted without being limited thereto. . In addition, formation of the recessed part with respect to the board | substrate 2 can be performed by the etching etc. according to the material of the board | substrate 2, and formation of a convex part can be performed by depositing an appropriate material with the inkjet method etc. FIG.

  The number of such alignment marks 4 is not particularly limited, but may be formed in two places as shown in FIGS. 1A and 2A, for example. By forming two places, the dimension (size, length) of the pattern can be confirmed from these intervals, and the directionality can also be confirmed.

The self-assembled pattern 3 is formed by a periodic microphase separation structure (phase separation structure) of an organic polymer. That is, the self-assembled pattern 3 is a nanometer-scale periodic pattern formed in a self-organized manner.
As the organic polymer that forms such a self-assembled pattern 3, a block copolymer in which two or more different polymer components having low compatibility with each other are bonded at the terminal is preferably used.

  Depending on the polymer chain length in such a microscopic region, such a block copolymer may be subjected to annealing treatment (heating treatment) at a temperature higher than the glass transition temperature of the copolymer so that polymer components having low compatibility do not cross each other. A periodic phase separation structure is formed in a self-organizing manner. Therefore, the irregular self-assembly pattern 3 composed of the periodic phase separation structure formed by the self-assembly phenomenon as described above cannot reproduce the same pattern even when the same organic polymer is used, for example. . Further, since the pattern size is very fine, it can be visually recognized by the naked eye, and further, it is a pattern that is difficult to duplicate even by using a very expensive process such as a lithography technique. As described above, since the self-organized pattern 3 cannot reproduce the exact same pattern even if the same organic polymer is used, the same self-organized pattern 3 does not have two or more of the same, like the human fingerprint pattern. It becomes a pattern.

  As the block copolymer, there are a copolymer in which each block is connected in series, a star-type block copolymer in which each block is connected at one point, and any block copolymer can be used in the present invention. it can. However, in the present invention, in particular, a diblock copolymer in which two different polymer components are bonded at the end is more preferably used.

  The fine structure formed by phase separation of such a diblock copolymer (microphase separation structure) is a sphere (spherical) structure, a cylinder (columnar) structure, depending on the volume ratio of each polymer constituting the block copolymer, It changes variously with gyroidal structure and lamellar (plate-like) structure. The relationship between the phase separation structure of this block copolymer and the volume fraction of the polymer is known from the phase diagram expressed by the Flory-Haggins interaction parameter χ, the degree of polymerization N of the polymer, and the volume fraction of the polymer component. Yes. In this embodiment, a block copolymer having a volume ratio of polymer components capable of forming a cylinder structure or a lamellar structure is used.

That is, in the first embodiment shown in FIGS. 1A and 1B, the periodic microphase separation structure of the organic polymer in the self-assembled pattern 3 is a cylinder (columnar) structure, and FIG. In the second embodiment shown in a) and (b), the periodic microphase separation structure of the organic polymer has a lamellar (plate-like) structure.
The repetitive pattern size (periodic pattern size) of the microphase separation structure depends on the molecular weight of the diblock copolymer. Therefore, by appropriately selecting the molecular weight of the diblock copolymer, the size of the periodic pattern, that is, the size of the periodic phase separation structure can be adjusted to the target size.

  The diblock copolymer used in the present embodiment is not particularly limited, but polystyrene-polylactic acid, polystyrene-poly-2-vinylpyridine, polystyrene-poly-4-vinylpyridine, polystyrene-polydimethylsiloxane, polystyrene- Poly-N, N-dimethylacrylamide, polybutadiene-4-vinylpyridine, polystyrene-ferrocenyldimethylsilane, polybutadiene-methyl methacrylate, polybutadiene-poly-t-butyl methacrylate, polybutadiene-t-butyl acrylate, polybutadiene-polydimethylsiloxane , Poly-t-butyl methacrylate-poly-4-vinyl pyridine, polyethylene-polymethyl methacrylate, poly-t-butyl methacrylate-poly-2-vinyl pyridine, polyethylene-poly-2- Nylpyridine, polyethylene-poly-4-vinylpyridine, polyisoprene-poly-2-vinylpyridine, polymethyl methacrylate-polystyrene, poly-t-butyl methacrylate-polystyrene, polymethyl acrylate-polystyrene, polybutadiene-polystyrene, polyisoprene-polystyrene , Polybutadiene-sodium polyacrylate, polybutadiene-polyethylene oxide, poly-t-butyl methacrylate-polyethylene oxide, polystyrene-polyacrylic acid, polystyrene-polymethacrylic acid, and the like.

  The self-assembled pattern 3 obtained from such a diblock copolymer is formed by microdomains (cylinder domain 5a, lamella domain 5b) and a continuous phase 6 disposed between the microdomains. In particular, as the self-assembled pattern 3, as shown in FIG. 1A, a cylinder domain 5a of a cylinder structure (columnar structure) which is a microphase separation structure of a diblock copolymer has an in-plane direction of the substrate 2, In other words, it is preferable that the structure is irregularly oriented in the direction along the surface of the substrate 2, and the cylinder domain (microdomain) 5 a is desirably exposed on the surface of the self-organized pattern 3. .

  The pattern period of the cylinder domain 5a, that is, the period of the periodic phase separation structure of the organic polymer (block copolymer) forming the self-assembled pattern 3 is preferably 10 to 100 nm. The self-organization of the block copolymer is induced by annealing (heating) above the phase transition temperature, but the phase separation behavior becomes dull as the molecular weight of the block copolymer increases. Is difficult to form. In general, in order to form a microphase-separated structure having a period exceeding 100 nm, a very long annealing process (heating process) is required. Therefore, in this embodiment, it is desirable to use an organic polymer (block copolymer) having a molecular weight with a cylinder pattern period of 10 to 100 nm.

  The microphase separation structure of the block copolymer shown in FIG. 2B is a structure in which a lamellar structure (plate-like structure) is oriented in a direction perpendicular to the substrate 2, and its lamellar domain (microdomain) 5b. Is exposed on the surface of the self-assembled pattern 3. The pattern period of the lamellar domain 5b (lamella structure), that is, the period of the periodic phase separation structure of the organic polymer (block copolymer) forming the self-assembled pattern 3 is also the same as in the case of the cylinder domain 5a. It is desirable to set it as 10-100 nm.

  Further, in the counterfeit prevention display bodies 1A and 1B, the thickness of the self-assembled pattern 3 made of an organic polymer, that is, the thickness of the organic polymer layer forming the self-assembled pattern 3 is uniformly formed in the plane. Thus, it is desirable to match the period of the microphase separation structure. The film thickness of the organic polymer layer after the formation of the microphase separation takes a discrete value that matches the period of the microphase separation. Therefore, when the film thickness at the time of film formation does not coincide with the period of the microphase separation structure, the organic polymer layer has a region that coincides with a different period depending on the location, resulting in a step, resulting in a phase separation structure. An error may occur when reading the pattern.

  In order to manufacture the anti-counterfeit display bodies 1A and 1B having such a self-organized pattern 3, first, a cross-shaped concave portion or convex portion as a base of the alignment mark 4 is formed on the substrate 2, and thereafter As shown in FIG. 3 (a) and FIG. 4 (a), a block copolymer (organic polymer) is applied onto the substrate 2 by a known method such as spin coating, bar coating, spray coating, or casting. Then, the organic polymer layer 7 is formed. As the coating solution, it is desirable to use a solution diluted with a good solvent for both polymers constituting the block copolymer.

  Next, the organic polymer layer 7 applied on the substrate 2 is annealed (heated) at a temperature equal to or higher than the phase transition temperature of the block copolymer as the component, and then cooled to return to room temperature. Thereby, as shown in FIG. 3B and FIG. 4B, a micro phase separation structure composed of the micro domain (cylinder domain 5a, lamella domain 5b) and the continuous layer 6 is formed. Some polymers constituting the block copolymer may undergo crosslinking or decomposition due to the presence of oxygen in the annealing atmosphere. Therefore, it is desirable that the annealing process be performed in a vacuum or in an inert atmosphere (for example, in an atmosphere of nitrogen or argon).

As shown in FIG. 4B, by forming a microphase-separated structure composed of the lamellar domain 5b and the continuous layer 6, that is, the self-organized pattern 3, the first structure shown in FIGS. The counterfeit prevention display body 1B according to the second embodiment can be manufactured.
On the other hand, as shown in FIG. 3B, in the micro phase separation structure composed of the cylinder domain 5a and the continuous layer 6, the pattern composed of such a micro phase separation structure can be read. The cylinder domain 5a is exposed on the surface of the organic polymer layer 7 as shown in FIG.

  As a method of exposing the cylinder domain 5a, the surface layer of the organic polymer layer 7 is removed by a thickness corresponding to half the period of the microphase separation structure, or a solvent is selectively introduced into the cylinder domain 5a, and the cylinder A method of swelling the domain 5a to rupture the portion of the continuous phase 6 covering the cylinder domain 5a and exposing the cylinder domain 5a is employed.

  A dry etching method such as oxygen plasma etching, argon cluster etching, or reactive ion etching can be used as a method for removing the organic polymer layer 7 by a thickness of a half cycle.

  As a method of selectively introducing a solvent into the cylinder domain 5a and exposing it by swelling, the polymer component that forms the cylinder domain 5a is a good solvent and the polymer component that forms the continuous layer 6 On the other hand, the organic polymer layer 7 is immersed in a solvent that becomes a poor solvent. Thereby, a solvent can be selectively introduced into the cylinder domain 5a. As a result, the cylinder domain 5a introduced with the solvent swells to expand its volume, and the continuous phase 6 on the surface of the organic polymer layer 7 is ruptured to expose the cylinder domain 5a. As a result, a microphase separation structure composed of the cylinder domain 5a and the continuous layer 6, that is, a self-assembled pattern 3, can be formed, and the forgery prevention according to the first embodiment shown in FIGS. Display body 1A can be produced.

  In order to read the self-organization pattern 3 in order to perform the authenticity determination of the anti-counterfeit display bodies 1A and 1B shown in FIGS. 1 and 2 produced in this way, an AFM (atomic force microscope): atomic force microscope ) Is preferably used. The microphase separation structure of the block copolymer is formed by different types of polymers. Therefore, the micro phase separation structure can be acquired as an image by using the phase mode of AFM that can measure the distribution by polymer type by measuring the difference in viscoelasticity and adsorptivity inherent to each polymer. Can do.

  Therefore, in the forgery prevention display object authenticity determination method according to the present embodiment, an irregular self-organization pattern 3 formed by self-organization of a block copolymer (organic polymer) using this measurement technique. By reading, it is possible to determine the authenticity of the forgery prevention display bodies 1A and 1B.

  At this time, the image area for authenticity verification can be specified with reference to the alignment mark 4 shown in FIGS. 1A and 2A, and the measurement range is measured by AFM. Can be specified by parameters. This measurement range depends on the measurement limit of the AFM used. The wider the measurement range, the more complicated the self-organization pattern 3 becomes, and it becomes difficult to use it for authenticity determination. In addition, if the measurement range is widened, the measurement time increases accordingly, so that it takes a long time to determine the authenticity. On the other hand, when the measurement range is narrower than 10 nm square, the image size is equal to or smaller than the size of one cycle of the self-organized pattern 3, and thus the self-organized pattern 3 cannot be measured accurately. Authenticity determination becomes difficult.

  In order to determine the authenticity of the counterfeit prevention display bodies 1A and 1B shown in FIGS. 1 and 2 using the AFM, first, in the self-organization pattern 3 of the authentic product of the counterfeit prevention display body 1A (1B) The phase separation structure is read in a preset phase mode of the AFM, and the read phase separation structure is registered as genuine image data of the counterfeit prevention display body 1A (1B). The authentic image data registered in this way is preferably stored in a database so that it can be read out when authenticity determination is necessary. In addition, it is desirable to add information such as a measurement range, a pattern period, and an organic polymer used to the data to be registered.

  In order to determine the authenticity of a display object to be determined, first, in order to acquire a pattern image of the display object, the measurement region is specified using the alignment mark 4. Then, measurement is performed in the AFM phase mode by designating a measurement range, and an image of the phase separation structure in the self-organized pattern is read and acquired.

  Thereafter, the acquired image of the phase separation structure in the self-organization pattern of the display object to be determined is compared with the genuine image data registered in advance. If the image to be determined and the genuine image data completely match, it is determined to be “authentic”, and if they do not match, it is determined to be “counterfeit”. Thereby, the authenticity determination can be performed about the display body used as determination object.

  According to the anti-counterfeit display bodies 1A and 1B of the present embodiment, even if the same organic polymer is used, the exact same pattern cannot be reproduced, and the pattern size is very fine and is visually recognized by the naked eye. It is impossible to recognize that the anti-counterfeiting process has been performed, and the self-organized pattern 3 that is difficult to be duplicated even by using a very expensive process such as a lithography technique is formed on the substrate 2. Therefore, a high anti-counterfeiting effect can be exhibited. In addition, since the anti-counterfeiting effect can be exhibited in the fine pattern formation region, the anti-counterfeiting function is also applied to such electronic parts and optical parts by using fine electronic parts and optical parts as the base material (substrate). Can be granted.

  Further, since the self-assembled pattern 3 is formed by the periodic phase separation structure of the organic polymer, the same pattern cannot be reproduced as described above, and the pattern size is very fine, Thus, it is possible to form the self-organized pattern 3 that is difficult to replicate even by using a very expensive process such as lithography technology.

  In addition, since the periodic phase separation structure of the organic polymer forming the self-assembled pattern 3 is a cylinder structure or a lamella structure, the same pattern as described above cannot be reproduced, and the pattern size is very large. The self-organized pattern 3 that is fine and difficult to replicate can be formed better.

  In addition, since the period of the periodic phase separation structure of the organic polymer forming the self-assembled pattern 3 is in the range of 10 to 100 nm and the thickness of the layer made of the organic polymer is in the range of 10 to 100 nm, The separation structure can be manufactured by a relatively short annealing process (heating process), and reading errors when reading the self-assembled pattern 3 by AFM can be prevented.

  In addition, since the alignment mark 4 is provided in the same plane as the self-organized pattern 3, the measurement region can be easily specified by using the alignment mark 4, and therefore the counterfeit prevention display 1A, 1B authenticity determination can be facilitated.

In addition, according to the method for producing a forgery-preventing display body of the present embodiment, it is possible to easily produce a forgery-preventing display body that exhibits the above-described excellent effects.
Furthermore, according to the authenticity determination method of the present embodiment, the authenticity of the forgery prevention display bodies 1A and 1B can be determined easily and accurately.

An anti-counterfeit display according to the present invention was produced as follows.
First, as shown in FIG. 3A, the organic polymer layer 7 was formed using a silicon wafer having an alignment mark cut into a 1 cm square as the substrate 2. As an organic polymer, a block copolymer of polystyrene-2-polyvinylpyridine (Mn = 44000-b-18500, Mw / Mn = 1.07) was used, and the mixture was prepared with toluene so that the weight concentration became 1%. . Film formation was performed at a rotational speed of 1000 rpm using a spin coating method.

  Next, the substrate 2 on which the organic polymer layer 7 is formed is annealed (heated) for 24 hours at 230 ° C. using a vacuum oven to form a microphase separation structure as shown in FIG. did. When the film thickness of the organic polymer layer 7 was measured using AFM after the annealing treatment, it was 48 nm.

  Next, a 1% HCl aqueous solution was dropped on the entire surface of the organic polymer layer 7 so as to cover it, and allowed to stand at room temperature for 3 hours. Thereby, as shown in FIG.3 (c), the display body 1A for anti-counterfeit which the micro domain of 2-polyvinylpyridine exposed on the surface of the organic polymer layer 7, and formed the self-organization pattern 3 was produced.

  The surface of the self-assembly pattern 3 (organic polymer layer 7) of the obtained counterfeit-preventing display 1A was measured in the AFM phase mode. The measurement area was specified using alignment marks, and the measurement range was 1 μm square. An image obtained by the measurement is shown in FIG. The obtained image had a curved and irregular self-organized pattern, and was obtained as a clear pattern image. The period of the line pattern was 44 nm as calculated from AFM phase mode data.

The obtained image data was registered as genuine image data. And as a process which performs authenticity determination, the measurement area | region was again specified for the same sample using the alignment mark, and the image was acquired in the same measurement range.
After that, when it was compared with registered genuine image data, the acquired image matched the genuine image data. Therefore, it was confirmed that the same determination target as the genuine product is determined to be the genuine product.

  INDUSTRIAL APPLICABILITY The present invention can be used for authenticity determination applications such as gold vouchers, securities, certification stamps, credit cards, membership cards, expensive articles, or very fine semiconductor-related parts.

1A, 1B ... Counterfeit prevention display body 2 ... Substrate (base material)
3 ... Self-assembled pattern 4 ... Alignment mark 5a ... Cylinder domain 5b ... Lamella domain 6 ... Continuous phase 7 ... Organic polymer layer

Claims (9)

  An anti-counterfeit display capable of authenticity determination, comprising an irregular self-organized pattern formed on a substrate.   2. The forgery prevention display body according to claim 1, wherein the self-assembled pattern is formed by a periodic phase separation structure of an organic polymer.   The counterfeit-preventing display body according to claim 2, wherein the periodic phase separation structure of the organic polymer forming the self-organizing pattern is a cylinder structure or a lamellar structure. The period of the periodic phase separation structure of the organic polymer that forms the self-assembled pattern is in the range of 10 to 100 nm,
The counterfeit prevention display body according to claim 2 or 3, wherein a thickness of the organic polymer layer is in a range of 10 to 100 nm.   The counterfeit prevention display body according to any one of claims 1 to 4, further comprising an alignment mark in the same plane as the self-organization pattern.   An organic polymer capable of forming a periodic phase-separated structure in a self-organizing manner is applied onto a substrate, and then an irregular self-organizing pattern is formed by heating, and the authenticity can be determined. A method for producing a counterfeit-proof display.   The method for producing a counterfeit-preventing display body capable of authenticity determination according to claim 6, wherein the periodic phase separation structure of the organic polymer forming the self-organized pattern is a cylinder structure or a lamellar structure.   8. The method for producing an anti-counterfeit display body capable of determining authenticity according to claim 6, wherein an alignment mark is formed on the substrate prior to the formation of the self-organizing pattern. A method for determining the authenticity of a counterfeit-preventing display body having an irregular self-organized pattern formed on a substrate on a base material,
Read the phase separation structure in the self-organization pattern of the authentic product of the anti-counterfeit display body with an atomic force microscope, and register the read phase separation structure as the authentic image data of the anti-counterfeit display body,
A true / false determination method, wherein a phase separation structure in a self-organized pattern of a display object to be determined is read with an atomic force microscope, and the read phase separation structure is collated with the previously registered genuine image data.