JP2014082257A - Semiconductor laser module - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor laser module capable of emitting a laser beam in a predetermined one direction and changing the emission direction.SOLUTION: A semiconductor laser module 100 comprises a semiconductor laser element 10 and a flat plate condensation element 20. The flat plate condensation element comprises an objective surface 21 on an opposite side to a light emission end surface LES of the semiconductor laser element 10. The objective surface includes a plurality of curved surfaces 21a arranged in parallel to the light emission end surface LES and in parallel to a first direction in which an active layer extends. The curved surfaces are contacted with a plane f vertical to an incoming laser beam. A coordinate axis parallel to the first direction is defined as an X-axis, and each curvature radius of the curved surfaces is based on the following numerical expression (1). Here, n(X) represents a refractive index of the flat plate condensation element at a position X, θ(X) represents an angle to a normal line of the light emission end surface LES of the laser beam emitted at the position X, and frepresents a focal length in an X-axial direction of the flat plate condensation element in the case of θ(X)=0.

Description

  The present invention relates to a semiconductor laser module.

  The present inventors have proposed a semiconductor laser element using a photonic crystal (Patent Document 1, Non-Patent Document 1). Such a surface-emitting type semiconductor laser device has an epoch-making feature that laser beams can be emitted simultaneously in two directions at a time. In addition, by supplying a driving current to the driving electrodes divided into a plurality, it is possible to emit a laser beam in two directions for each driving electrode. If the period of the photonic crystal located directly under each drive electrode is made different, the emission angle of the laser beam pair will be different for each drive electrode. Furthermore, according to Non-Patent Document 1, continuous beam direction control can be performed by providing subdivided drive electrodes, allowing current to flow simultaneously through a plurality of drive electrodes, and changing the current balance.

JP 2009-76900 A

Taketaka Kurosaka et al., “On-Chip beam-steering photonic-crystal lasers”, Nature Photonics, vol. 4, pp.447-450, 2010

  However, practical applications are limited in the case of a semiconductor laser element that simultaneously emits laser beams in two directions. On the other hand, in the case of a semiconductor laser element that emits a laser beam in one predetermined direction, that is, in a structure that can emit a laser beam in one predetermined direction for each drive electrode, the drive current supplied to each drive electrode is switched. Further, the laser beam can be scanned by changing the drive current balance. In this case, the semiconductor laser element can be applied to various conventionally used laser beam deflecting devices. If the number of laser beams is increased, the laser beam deflecting device can constitute a high-definition laser beam scanning device.

  The present invention has been made in view of such a problem, and an object of the present invention is to provide a semiconductor laser module capable of emitting a laser beam in one predetermined direction and changing the emission direction. To do.

  As a result of intensive studies, the present inventors have found that the lower cladding layer, the upper cladding layer, the active layer interposed between the lower cladding layer and the upper cladding layer, the active layer and the upper and lower claddings formed on the substrate. A photonic crystal layer interposed between at least one of the layers, and a plurality of drive electrodes for supplying drive electrodes to the plurality of regions of the active layer, wherein the plurality of regions of the active layer are on the light emitting end face The inventors have conceived of semiconductor laser elements that are parallel and are arranged side by side in the first direction in which the active layer extends, and in which the emission directions of the laser beams emitted from a plurality of regions are different from each other. According to this semiconductor laser element, it is possible to emit a laser beam in one predetermined direction and change the emission direction.

  On the other hand, when irradiating a laser beam onto a plane facing the light emitting end face of the semiconductor laser element, it is necessary to arrange a condensing element in the vicinity of the light emitting end face and adjust the divergence angle of the laser beam. It has been found that there are the following new problems when the semiconductor laser element is combined with a condensing element to form a module. That is, the distance between the light emitting end surface and the plane irradiated with the laser beam varies depending on the laser beam emitting direction of the semiconductor laser element. For this reason, in order to make the divergence angle of the laser beam constant regardless of the laser beam emission direction on the plane irradiated with the laser beam, the refractive power of the condensing element is adjusted according to the laser beam emission direction. There is a need to.

  Therefore, the present inventors have further studied earnestly about the configuration for making the divergence angle of the laser beam constant regardless of the emission direction of the laser beam, and the emitted laser beam is emitted with the direction being a predetermined one direction. The semiconductor laser module has been conceived in which the direction of the laser beam to be switched can be switched and the divergence angle of the laser beam can be made constant regardless of the laser beam emission direction.

に基づいて決定され、数式（式１）において、ｎ（Ｘ）は、位置Ｘにおける平板集光要素の屈折率であり、θ_out（Ｘ）は、位置Ｘにおいて対物面から出射されるレーザビームが光出射端面の法線に対してなす角度であり、ｆ₀は、θ_out（Ｘ）＝０の場合の平板集光要素のＸ軸方向の焦点距離である、ことを特徴とする。 A semiconductor laser module according to the present invention includes an edge-emitting semiconductor laser element and a flat plate concentrating element disposed to face a light emitting end face of the semiconductor laser element, and the semiconductor laser element is disposed on a substrate. The formed lower cladding layer, the upper cladding layer, the active layer interposed between the lower cladding layer and the upper cladding layer, and the photo interposed between the active layer and at least one of the upper and lower cladding layers A nick crystal layer and a plurality of drive electrodes for supplying a drive current to the plurality of regions of the active layer, the plurality of regions being parallel to the light emitting end face and arranged in a first direction in which the active layer extends. The emission directions of the laser beams emitted from the plurality of regions with respect to the light emission end face are different from each other, and the flat plate condensing element has an objective surface on the opposite side to the side facing the light emission end face, , Including a plurality of curved surfaces arranged in a direction parallel to the first direction when viewed from a direction perpendicular to the light emitting end surface, and each of the plurality of curved surfaces is perpendicular to the laser beam incident on the curved surface from the semiconductor laser element The curvature radius r (X of each of the plurality of curved surfaces in the plane parallel to the direction in which the active layer extends at the position X along the X-axis, with the coordinate axis parallel to the first direction as the X-axis. ) Is the formula

Where n (X) is the refractive index of the plate condensing element at position X, and θ _out (X) is the laser beam emitted from the object plane at position X. Is an angle formed with respect to the normal of the light emitting end face, and f ₀ is a focal length in the X-axis direction of the flat plate condensing element when θ _out (X) = 0.

According to the semiconductor laser module of the present invention, the emission direction of the laser beam emitted from the plurality of regions positioned in the active layer in parallel with the first direction in which the active layer extends is parallel to the light emission end surface with respect to the light emission end surface. Each is different. The semiconductor laser module includes a flat plate condensing element disposed to face the light emitting end surface of the semiconductor laser element, and the flat plate condensing element includes an objective surface on the side opposite to the side facing the light emitting end surface. . The objective surface is formed to include a plurality of curved surfaces, and the radius of curvature r (X) of each of the plurality of curved surfaces is determined based on the above mathematical formula (Formula 1). Therefore, the focal length of the flat plate condensing element is f ₀ / cos (for a laser beam emitted from a plurality of regions of the active layer at an angle θ _out (X) with respect to the normal of the light emitting end face. θ _out (X)). Therefore, the distance between the focal point condensed by the flat plate condensing element and the light emitting end face is f ₀ regardless of the value of θ _out (X), and the laser beam is a plane having a distance f ₀ from the light emitting end face. It is focused on. Therefore, the divergence angle of the laser beam can be made constant regardless of the laser beam emission direction.

  Each of the plurality of curved surfaces may be aspherically processed for aberration correction with respect to the radius of curvature determined by the mathematical formula (Formula 1). In this case, the aberration generated in the flat plate condensing element can be corrected.

  The plurality of curved surfaces may have a shorter distance from the light emitting end surface as the curved surface has a larger angle formed by the laser beam incident on the curved surface from the semiconductor laser element with respect to the normal line of the light emitting end surface. In this case, the distance between the curved surface on which the laser beam having a large angle with respect to the normal line of the light emitting end face is incident and the light emitting end face is short. For this reason, it is possible to prevent interference between a laser beam passing through the curved surface and a laser beam passing through another curved surface.

  Each of the plurality of curved surfaces may have a radius of curvature in a direction perpendicular to the direction in which the active layer extends. In this case, the curved surface has a radius of curvature in a direction perpendicular to the direction in which the active layer extends. For this reason, the divergence angle of the laser beam in the direction perpendicular to the direction in which the active layer extends can be adjusted.

  The active layer includes a first region and a second region as a plurality of regions, and the plurality of drive electrodes supply a drive current to the first region and a first drive electrode for supplying a drive current to the first region. A longitudinal direction of the first drive electrode is inclined with respect to the normal of the light emitting end face when viewed from the thickness direction of the semiconductor laser element, and the photonic The region corresponding to the first region of the crystal layer has first and second periodic structures in which the arrangement periods of the different refractive index portions having different refractive indices from the surroundings are different from each other. When viewed from the thickness direction of the semiconductor laser element, two or more laser beams forming a predetermined angle with respect to the longitudinal direction of the first drive electrode are generated inside the semiconductor laser element according to the difference between the reciprocal numbers of the respective array periods in FIG. Of these laser beams One toward the end face is set so that the refraction angle is less than 90 degrees with respect to the light exit end face, and at least one other towards the light exit end face is set so as to satisfy the total reflection critical angle condition with respect to the light exit end face. The longitudinal direction of the second drive electrode is inclined with respect to the normal of the light emitting end face when viewed from the thickness direction of the semiconductor laser element, and corresponds to the second region of the photonic crystal layer Has the third and fourth periodic structures in which the arrangement periods of the different refractive index portions having different refractive indices from the surroundings are different from each other, and the difference between the reciprocal numbers of the arrangement periods in the third and fourth periodic structures Accordingly, when viewed from the thickness direction of the semiconductor laser element, two or more laser beams forming a predetermined angle with respect to the longitudinal direction of the second drive electrode are generated inside the semiconductor laser element, At the light exit end Is set so that the refraction angle is less than 90 degrees with respect to the light exit end face, and at least one other towards the light exit end face is set so as to satisfy the total reflection critical angle condition with respect to the light exit end face, The difference between the reciprocal numbers of the respective array periods in the first and second periodic structures may be different from the difference between the reciprocal numbers of the respective array periods in the third and fourth periodic structures.

  In this case, by supplying a drive current to the drive electrode, two or more laser beams are generated inside the semiconductor laser element. One of the generated laser beams toward the light emitting end surface has a refraction angle of less than 90 degrees with respect to the light emitting end surface, and at least one other toward the light emitting end surface satisfies the total reflection critical angle condition with respect to the light emitting end surface. Fulfill. For this reason, the direction of the laser beam emitted simultaneously can be set to a predetermined one direction. The difference between the reciprocal numbers of the respective array periods in the first and second periodic structures is different from the difference between the reciprocal numbers of the respective array periods in the third and fourth periodic structures. Therefore, the laser beam emission direction can be switched depending on which electrode of the plurality of drive electrodes is supplied with the drive current.

  According to the semiconductor laser module according to the aspect of the present invention, it is possible to emit a laser beam in only one predetermined direction and change the emission direction.

It is a top view of a semiconductor laser module and a focal plane. It is a longitudinal cross-sectional view of a semiconductor laser element. It is a top view of a semiconductor laser element. It is a top view inside an element for explaining a progress state of a laser beam inside a semiconductor laser element. It is a top view of the photonic crystal area | region which has a single periodic structure. It is a top view of the photonic crystal area | region which has a single periodic structure. It is a top view of the photonic crystal area | region which has a some periodic structure. It is a top view of a photonic crystal region group having a plurality of photonic crystal layer regions having a plurality of periodic structures. It is a top view of the photonic crystal layer which has a photonic crystal region group. It is a graph which shows the incident angle and outgoing angle of a laser beam with respect to deflection angle (delta) theta from a reference direction (it depends on the difference of the reciprocal of the period in each photonic crystal region). It is a top view of the different refractive index part (structure) of various shapes. It is a figure which shows the structure of a laser beam deflection | deviation apparatus. It is sectional drawing in XY plane of a flat plate condensing element. It is a longitudinal cross-sectional view of a semiconductor laser element. It is a top view inside a semiconductor laser element. A vector from the origin O to the point P (βx, βy) in the xy coordinate system. It is a graph which shows the direction of the main light wave in xy coordinate system. It is a top view inside an element explaining the main light wave in active layer 3B. FIG. 4A is a plan view of a diffraction grating layer 4 ′ having a periodic structure, and FIG. 6B is a cross-sectional view in the XZ plane. It is a graph which shows the relationship between laser beam emission angle (refraction angle) (theta) 3, stripe angle (theta), and period (LAMBDA). It is a chart which shows the data used for a graph. It is sectional drawing of the partial area | region of a semiconductor laser element. It is a top view of a photonic crystal layer.

  Hereinafter, the semiconductor laser module according to the embodiment will be described. In addition, the same code | symbol shall be used for the same element and the overlapping description is abbreviate | omitted.

  FIG. 1 is a plan view of a semiconductor laser module and a focal plane.

  The semiconductor laser module 100 includes a semiconductor laser element 10 and a flat plate condensing element 20. The semiconductor laser element 10 is an edge emitting semiconductor laser. The semiconductor laser element 10 emits a laser beam LB in one predetermined direction from the light emitting end face LES with a configuration described in detail later. The flat plate condensing element 20 condenses the laser beam LB emitted from the semiconductor laser element 10 on the focal plane F.

In the following description, the direction parallel to the light emitting end face LES and extending the active layer of the semiconductor laser element 10 is referred to as a first direction. A coordinate axis parallel to the first direction is taken as an X axis, a direction perpendicular to the light emitting end face LES is taken as a Y axis, and a direction perpendicular to the direction in which the active layer extends is taken as a Z axis. In order to represent the emission direction of the laser beam LB, an angle θ _out formed by the laser beam LB with respect to the normal line N of the light emission end face LES is used. The focal length in the X-axis direction of the flat plate condensing element 20 when θ _out = 0 is assumed to be f ₀ .

  Next, the semiconductor laser element 10 and the laser beam deflection apparatus using the same will be described in detail.

  FIG. 2 is a longitudinal sectional view of the semiconductor laser element, and FIG. 3 is a plan view of the semiconductor laser element.

  The semiconductor laser device 10 includes a lower clad layer 2, a lower light guide layer 3 A, an active layer 3 B, an upper light guide layer 3 C, a photonic crystal layer 4, an upper clad layer 5, and a contact layer 6 that are sequentially formed on a semiconductor substrate 1. It has. On the back side of the semiconductor substrate 1, an electrode E <b> 1 is provided on the entire surface, and on the contact layer 6, a plurality of drive electrodes E <b> 2 are provided. In the drawing, five drive electrodes E <b> 2 are simply shown, but actually more drive electrodes E <b> 2 are provided on the contact layer 6.

The surface on the contact layer 6 other than the formation region of the drive electrode E2 is covered with the insulating film SH. The insulating film SH can be formed from, for example, SiN or SiO ₂ .

The materials / thicknesses of these compound semiconductor layers are as follows. Note that an intrinsic semiconductor having an impurity concentration of 10 ¹⁵ / cm ³ or less has no conductivity type. In addition, the density | concentration when an impurity is added is 10 < ¹⁷ > -10 < ²⁰ > / cm < ³ >. Further, the following is an example of the present embodiment. If the configuration includes the active layer 3B and the photonic crystal layer 4, the material system, film thickness, and layer configuration are flexible. The upper light guide layer 3C includes two layers, an upper layer and a lower layer.
Contact layer 6: P-type GaAs / 50 to 500 nm
Upper clad layer 5: P-type AlGaAs (Al _0.4 Ga _0.6 As) /1.0 to 3.0 μm
Photonic crystal layer 4:
Basic layer 4A: GaAs / 50 to 400 nm
Buried layer (different refractive index portion) 4B: AlGaAs (Al _0.4 Ga _0.6 As) / 50 to 400 nm
Upper light guide layer 3C:
Upper layer: GaAs / 10-200 nm
Lower layer: p-type or intrinsic AlGaAs / 10 to 100 nm
Active layer 3B (multiple quantum well structure):
AlGaAs / InGaAs MQW / 10-100nm
Lower light guide layer 3A: AlGaAs / 0 to 300 nm
Lower clad layer 2: N-type AlGaAs / 1.0 to 3.0 μm
・ Semiconductor substrate 1: N-type GaAs / 80 to 350 μm

  For example, AuGe / Au can be used as the material of the electrode E1, and Cr / Au or Ti / Au can be used as the material of the electrode E2.

  The light guide layer can be omitted.

In the manufacturing method in this case, the growth temperature of AlGaAs by the MOCVD method is 500 ° C. to 850 ° C. In the experiment, 550 to 700 ° C. is adopted, and TMA (trimethylaluminum) is used as the Al raw material during growth and TMG ( Trimethylgallium) and TEG (triethylgallium), AsH _{3 (} arsine) as the As raw material, Si ₂ H ₆ (disilane) as the raw material for N-type impurities, and DEZn (diethylzinc) as the raw material for P-type impurities Can do.

  When a current is passed between the upper and lower electrodes E1, E2, a current flows in a region R immediately below one of the electrodes E2, this region emits light, and the laser beam LB is output at a predetermined angle from the side end surface of the substrate. (See FIG. 3). Which laser beam LB is emitted is determined depending on which of the drive electrodes E2 is supplied with the drive current.

  The planar shape of the semiconductor laser element is a rectangle. When an XYZ three-dimensional orthogonal coordinate system is set, the thickness direction is the Z axis, the width direction is the X axis, and the direction perpendicular to the light emitting end face LES is the Y axis. . In the XY plane, the extending longitudinal direction of each drive electrode E2 forms an angle φ with respect to a straight line parallel to the Y axis. That is, the longitudinal direction of the drive electrode E2 is inclined with respect to the normal line (Y axis) of the light emitting end face LES of the semiconductor laser element when viewed from the thickness direction of the semiconductor laser element. The drive electrode E2 extends from the position of the light emitting end face LES toward the opposite end face, but is interrupted halfway without completely traversing the semiconductor laser element.

  FIG. 4 is a plan view of the inside of the device for explaining the progress of the laser beam inside the semiconductor laser device.

  The laser beam is generated in the active layer 3 </ b> B, but the light that exudes from the active layer 3 </ b> B is affected by the adjacent photonic crystal layer 4. A periodic refractive index distribution structure is formed in the photonic crystal layer 4. As a result of diffraction by this photonic crystal layer, a laser beam indicated by wave number vectors k1 to k4 is generated inside the active layer 3B. The wave vector is a vector whose direction is the normal direction of the wave front (that is, the wave propagation direction) and whose magnitude is the wave number. The laser beams with wave number vectors k1 and k2 are directed toward the light emitting end face LES, and the laser beams with wave number vectors k4 and k3 are directed in the opposite direction.

  The laser beams of the wave number vectors k1 and k2 travel at an angle of ± δθ with respect to the B direction that forms an angle φ with a straight line parallel to the Y axis in the XY plane. The B direction is the direction in which the drive electrode E2 extends. The A direction is a direction perpendicular to the B direction in the XY plane. A coordinate system obtained by rotating the XYZ orthogonal coordinate system by φ around the Z axis is defined as an xyz orthogonal coordinate system. In this case, the A direction coincides with the positive x-axis direction, and the B direction coincides with the negative y-axis direction. The laser beams of the wave number vectors k1 and k2 enter the light emission end face LES and attempt to exit to the outside. The incident angles are θ1 and θ2, respectively. The refraction angle of the laser beam having the wave vector k1 is θ3. θ3 is smaller than 90 degrees. That is, the incident angle θ2 of the laser beam having the wave number vector k2 is equal to or greater than the total reflection critical angle, and total reflection occurs at the light emitting end face LES and is not output to the outside. On the other hand, the incident angle θ1 of the laser beam with the wave vector k1 is less than the total reflection critical angle, and is transmitted to the outside through the light emitting end face LES. Θ4 is an angle formed by the traveling direction of the laser beam totally reflected on the light emitting end face LES and the negative Y-axis direction, and is 90 degrees or more.

  Note that the photonic crystal layer 4 is formed of a plurality of photonic crystal regions 4R.

  FIG. 5 is a plan view of the photonic crystal region 4R having a single periodic structure.

  A photonic crystal is a nanostructure whose refractive index changes periodically, and can strengthen or diffract light of a specific wavelength in a specific direction according to the period. By using this diffraction for light confinement and as a resonator, a laser can be realized. The photonic crystal layer 4 of the present embodiment includes a basic layer 4A and a buried layer (different refractive index portion) 4B periodically embedded in the basic layer 4A.

  In this embodiment, a plurality of holes H are periodically formed in the basic layer 4A made of the first compound semiconductor (GaAs) having the zinc flash structure, and the second compound semiconductor (having the zinc flash structure and having the second compound semiconductor ( The photonic crystal layer 4 is formed by growing a buried layer 4B made of (AlGaAs). Of course, since the photonic crystal is formed, the refractive index of the first compound semiconductor is different from that of the second compound semiconductor. In the present embodiment, the refractive index of the second compound semiconductor is lower than that of the first compound semiconductor. Conversely, the refractive index of the first compound semiconductor may be lower than that of the second compound semiconductor. .

  The different refractive index portions 4B, which are buried layers, are aligned along the A direction and the B direction to form a two-dimensional periodic structure. Here, the pitch between the different refractive index portions 4B in the A direction is a1, and the pitch between the different refractive index portions 4B in the B direction is b1. In addition, a1 = b1 may be sufficient. As a planar shape of each different refractive index portion 4B in the AB plane, a rectangle is shown in the figure, but the planar shape of the different refractive index portion 4B is not limited to this.

  FIG. 6 is a plan view of a photonic crystal region 4R having a single periodic structure different from FIG.

  The different refractive index portions 4B, which are buried layers, are aligned along the A direction and the B direction to form a two-dimensional periodic structure. Here, the pitch between the different refractive index portions 4B in the A direction is a2, and the pitch between the different refractive index portions 4B in the A direction is b2. Note that the relationship of a2> a1 is satisfied. As a planar shape of each different refractive index portion 4B in the AB plane, a rectangle is also shown in the figure, but the planar shape of the different refractive index portion 4B is not limited to this.

  FIG. 7 is a plan view of the photonic crystal region 4R having a plurality of periodic structures.

  That is, the photonic crystal region 4R includes the periodic structure shown in FIG. 5 and the periodic structure shown in FIG. 6 in a single photonic crystal region 4R, and has a period a1 and a period a2. Yes. In addition, the figure shows that both periods in the B direction are set to b2 (= b1).

In the case of such a structure, δθ in FIG. 4 is determined in accordance with the difference between the reciprocal of the period a1 (1 / a1) and the reciprocal of a2 (1 / a2). That is, by determining the periods a1 and a2, it is possible to determine the traveling direction of the laser beam indicated by the wave number vectors k1 and k2. Note that δθ = sin ⁻¹ (δk / k), δk = | π {(1 / a1) − (1 / a2)} |, and k = 2π / λ. λ is the wavelength of the laser light in the semiconductor laser element, and k is the wave number of the laser light in the semiconductor laser element.

In the present embodiment, the inequalities to be satisfied by the parameters θ1 and θ2 and the equivalent refractive index n _dev of light in the semiconductor laser element are as follows.

0 ≦ θ1 <sin ⁻¹ (1 / n _dev )

θ2 ≧ sin ⁻¹ (1 / n _dev )

In consideration of the fact that the entire photonic crystal is tilted as in the present invention, equations to be satisfied by the respective parameters are as follows.
δθ = φ−sin ⁻¹ (sin θ3 / n _dev )
δk = (2π / λ ₀ ) sin {φ−sin ⁻¹ (sin θ3 / n _dev )}
b1 = b2 = b ₀ / √ (1-sin ² δθ)
a1 = 1 / {(δk / 2π) + (1 / b1)}
a2 = 1 / {(1 / b2)-(δk / 2π)}

B ₀ is a reference period with respect to the B direction (the alignment direction of the lattice points (the arrangement direction of the different refractive index portions)), and is, for example, about 290 nm.

That is, φ is the inclination of the arrangement direction (B direction) of the different refractive index portions with respect to the direction perpendicular to the light emitting end face LES, θ3 is the emission angle of the laser beam, n _dev is the equivalent refractive index of light in the semiconductor laser element, When a drive current is supplied to the first and second drive electrodes, the resonance wavelengths of the laser beams generated in the first and second regions of the active layer immediately below the first and second drive electrodes are the same. In the first, second, third, and fourth periodic structures (described later), the period b1, b2 is √ {1-sin ² (φ−sin ⁻¹ ) with respect to one of the directions along the basic translation vector. (Sin θ3 / n _dev ))}. By changing the setting of the cycle, the emission angle θ3 can be changed.

The total reflection critical angle θc when the total reflection condition of the laser beam of the wave vector k2 is satisfied is given by θc = sin ⁻¹ (1 / n _dev ). In this example, φ = 18.5 °, θ2 > Θc = 17.6 °.

  FIG. 8 is a plan view of a photonic crystal region group 4G having a plurality of photonic crystal layer regions 4R having a plurality of periodic structures. The photonic crystal layer regions 4R are arranged in alignment along the A direction.

  The leftmost photonic crystal layer region 4R is the region Δ1, the second photonic crystal layer region 4R is the region Δ2, the second photonic crystal layer region 4R is the region Δ3, and the fourth photonic crystal layer region 4R is The region Δ4 and the fifth photonic crystal layer region 4R are defined as a region Δ5. For convenience, Δ1 to Δ5 also indicate parameters of the reciprocal of the above period.

  In the region Δ1, the different refractive index portions 4B are arranged in the A direction so as to satisfy the cycle a1 and the cycle a2 shown in FIG. 7, and the different refractive index portions 4B are arranged in the B direction at the cycle b2.

  Similarly, in the region Δ2, the different refractive index portions 4B are arranged in the A direction so as to satisfy the cycle a1 and the cycle a3, and the different refractive index portions 4B are arranged in the B direction at the cycle b2.

  In the region Δ3, the different refractive index portions 4B are arranged in the A direction so as to satisfy the cycle a1 and the cycle a4, and the different refractive index portions 4B are arranged in the B direction at the cycle b2.

  In the region Δ4, the different refractive index portions 4B are arranged in the A direction so as to satisfy the period a1 and the period a5, and the different refractive index portions 4B are arranged in the B direction at the period b2.

  In the region Δ5, the different refractive index portions 4B are arranged in the A direction so as to satisfy the cycle a1 and the cycle a6, and the different refractive index portions 4B are arranged in the B direction at the cycle b2. However, the relationship of a1 <a2 <a3 <a4 <a5 <a6 is satisfied.

  If it demonstrates using a general formula, area | region (DELTA) N (N is a natural number) is arranged from left to right in order with small value of N along A direction, and within area | region (DELTA) N, period a1 in A direction, The different refractive index portions 4B are arranged so as to satisfy the cycle a (N + 1), and the different refractive index portions 4B are arranged in the B direction at the cycle b2, so that aN <a (N + 1) is satisfied.

  As a result, the laser beam can be emitted in different directions according to the difference in the reciprocal of the period.

  FIG. 9 is a plan view of a photonic crystal layer having the photonic crystal region group 4G.

  In the photonic crystal layer 4, the regions Δ1 to Δ5 are sequentially arranged along the A direction. The longitudinal direction of each region Δ1 to Δ5 coincides with the B direction (longitudinal direction of the drive electrode E2). When a drive current is selectively supplied to each drive electrode E2 (a drive voltage is applied between the electrode E1 and a specific electrode E2), laser beams are emitted in different directions from the light emission end face LES (FIG. 3).

  FIG. 10 is a graph showing the incident angle and the outgoing angle of the laser beam with respect to the deflection angle δθ from the reference direction (B direction) (depending on the difference in the reciprocal of the period in each photonic crystal region).

When the difference in the reciprocal of the period increases and the angle δθ increases, the incident angles θ1 and θ2 increase, and the refraction angle (emission angle) of the laser beam indicated by the k1 vector decreases from 90 ° to 0 °. φ = 18.5 °, and δθ was changed from 0 ° to 18.5 °. The equivalent refractive index n _dev of light in the semiconductor laser element was 3.3. By adjusting the angle δθ, the target laser beam emission angle can be adjusted in a wide range. On the other hand, in the laser beam indicated by the k2 vector, regardless of the value of δθ, since θ2 always exceeds the total reflection critical angle, total reflection always occurs and is not output to the outside.

  FIG. 11 is a plan view of various refractive index portions (structures) 4B having various shapes.

  In the above, a rectangular (A) shape is shown as the shape in the AB plane (XY plane) of the different refractive index portion 4B, but this may be a square (B), an ellipse or a circle (C), It can also be an isosceles or equilateral triangle (D). In addition to the direction of the triangle (D), the base is parallel to the A direction (D), the base is parallel to the B direction (E), and the triangle shown in (D) is rotated 180 degrees (F) You can also Any figure can be rotated and the ratio of dimensions can be changed. Note that the distance between the centers of gravity of each figure can be used as the arrangement period of these figures.

  Note that, when the two periodic structures are overlapped, a difference in the number of holes due to a difference in the period causes a difference in diffraction intensity between the two periodic structures. In order to reduce this, the shape length in the A direction is multiplied by a1 / b1 for the structure of the period a1, and the shape length in the A direction is multiplied by a2 / b2 (= b1) for the structure of the period a2. It is effective to do.

  In the above-described embodiment, when the number of drive electrodes E2 is one, a semiconductor laser element that can output only a beam in a single direction is configured. As long as the number of drive electrodes E2 is plural, a laser beam deflecting device can be configured.

  Next, the flat plate condensing element 20 will be described in detail with reference to FIG. FIG. 13A is a cross-sectional view showing the semiconductor laser element 10 and the flat plate condensing element 20 cut along a plane parallel to the XY plane. FIG. 13B is an enlarged view of the inside of an ellipse Rb indicated by a dotted line in FIG. FIG. 13C is an enlarged view of the inside of an ellipse Rc indicated by a dotted line in FIG. The semiconductor laser element 10 and the flat plate condensing element 20 extend to the region where the X coordinate is positive, but the shape thereof is the same as the shape in the region where the X coordinate is negative. For this reason, in FIG. 13, portions of the semiconductor laser element 10 and the flat plate condensing element 20 that are located in a region where the X coordinate is positive are omitted.

  The flat plate condensing element 20 is a columnar Fresnel lens extending in the Z-axis direction. The refractive index of the flat plate condensing element 20 changes along the X-axis direction. One surface of the flat plate condensing element 20 is an objective surface 21, and the other surface is a flat surface 22. In the semiconductor laser module 100, the flat plate condensing element 20 is disposed to face the light emitting end face LES of the semiconductor laser element 10. The plane 22 faces the light emitting end surface LES. The plane 22 may be in contact with the light emitting end surface LES, or the plane 22 and the light emitting end surface LES may be separated from each other. FIG. 13 shows a case where the plane 22 and the light emitting end surface LES are separated from each other.

  The objective surface 21 is located on the side opposite to the side facing the light emitting end surface LES. The object surface 21 includes a plurality (N in this case) of curved surfaces 21a1, 21a2, ..., 21aX, ..., 21aN (hereinafter collectively referred to as a curved surface 21a). The objective surface includes a surface 21b that connects adjacent curved surfaces 21a. Although FIG. 13 shows the case where 21b is parallel to the y axis, 21b may not be parallel to the y axis. The plurality of curved surfaces 21a are positioned side by side in the X-axis direction (first direction) when viewed from the Y-axis direction orthogonal to the light emitting end surface LES. Each of the N curved surfaces 21 a is provided so as to correspond to one of the N photonic crystal regions 4 </ b> R of the semiconductor laser element 10. The number of drive electrodes E2 included in the semiconductor laser element matches the number N of curved surfaces 21a.

As shown in FIGS. 13B and 13C, each of the curved surfaces 21 a is in contact with a plane f perpendicular to the laser beam LB incident on the curved surface 21 a from the semiconductor laser element 10. The traveling direction of the laser beam LB incident on each curved surface 21a is different for each curved surface 21a, and the angle formed by the plane f perpendicular to the laser beam LB with respect to the XZ plane is also different for each curved surface 21a. FIG. 13B shows an enlarged curved surface 21a1 arranged at a position where the X coordinate is zero. The laser beam LB emitted from the light emitting end face LES of the semiconductor laser element 10 and traveling through the flat plate condensing element 20 is incident on the curved surface 21a1. The traveling direction of the laser beam LB is parallel to the Y axis. Therefore, the curved surface 21a1 is in contact with a plane f perpendicular to the laser beam LB, that is, a plane parallel to the XZ plane. FIG. 13C shows an enlarged curved surface 21aX in which the X coordinate is located at the X position. The laser beam LB emitted from the light emitting end face LES of the semiconductor laser element 10 and traveling through the flat plate condensing element 20 is incident on the curved surface 21aX. The traveling direction of the laser beam LB is parallel to the XY plane and forms an angle θ _out (X) with respect to the Y axis. Therefore, the curved surface 21aX forms an angle θ _out (X) with respect to the plane f perpendicular to the laser beam LB, that is, the XZ plane, and touches the plane parallel to the Z axis.

The curvature radius r (X) of each of the plurality of curved surfaces 21a in the XY plane parallel to the extending direction of the active layer 3B at the position X along the X axis is the following (Expression 2).

In (Expression 2), n (X) is the refractive index of the flat plate condensing element 20 at the position X. θ _out (X) is an angle formed by the laser beam LB emitted from the object plane 21 at the position X with respect to the normal line N of the light emitting end face LES. f ₀ is the focal length of the flat plate condensing element in the X-axis direction when θ _out (X) = 0.

The derivation process of the above (Formula 2) will be described. For a lens in which one surface is a spherical surface having a radius of curvature r (X), the other surface is a plane, the refractive index is n (X), and the focal length is f (X), the following (formula 3) ) Is known to hold.
r (X) = f (X) · {n (X) −1} (Formula 3)

Referring to FIG. 1, in order to focus the laser beam LB on the focal plane F separated from the object plane 22 by the distance f ₀ regardless of the emission angle θ _out (X) of the laser beam LB, 4) must be established.
f (X) ≈f ₀ / cos (θ _out (X)) (Formula 4)

  By substituting (Equation 4) into (Equation 3), the above (Equation 2) is obtained.

  Each of the curved surfaces 21a does not have a radius of curvature in the Z-axis direction. That is, the line of intersection between the plane parallel to the Z axis and the curved surface 21a is a straight line. For this reason, when the flat plate condensing element 20 is cut along a plane parallel to the XY plane, the cross-sectional shape of the flat plate condensing element 20 is the same regardless of the position of the cut surface.

  As the plurality of curved surfaces 21a are arranged on the negative side of the X axis, the distance from the light emitting end surface LES is shorter. That is, the distance from the light emitting end surface LES is shorter as the curved surface 21a has a larger angle formed by the laser beam LB incident from the semiconductor laser element 10 with respect to the normal line of the light emitting end surface LES, that is, the Y-axis direction.

According to the semiconductor laser module 100 according to the present embodiment, the light of the laser beam LB emitted from a plurality of regions positioned in the active layer 3B parallel to the light emitting end face LES and aligned in the X-axis direction in which the active layer 3B extends. The emission directions with respect to the emission end face LES are different from each other. The semiconductor laser module 100 includes a flat plate condensing element 20 disposed to face the light emitting end face LES of the semiconductor laser element 10, and the flat plate condensing element 20 is opposite to the side facing the light emitting end face LES. An object plane 21 is provided on the side. The objective surface 21 is formed including a plurality of curved surfaces 21a, and the radius of curvature r (X) of each of the plurality of curved surfaces 21a is determined based on the above equation (Equation 2). For this reason, the focal length of the flat plate condensing element LES is f with respect to the laser beam LB emitted from the plurality of regions of the active layer 3B at an angle θ _out (X) with respect to the normal of the light emitting end face LES. ₀ / cos (θ _out (X)). Therefore, the distance between the focal point condensed by the flat plate condensing element LES and the light emission end face LES is f ₀ regardless of the value of θ _out (X), and the laser beam LB is a distance f from the light emission end face LES. It is condensed on a plane F of ₀ . Therefore, the spread angle of the laser beam LB can be made constant regardless of the emission direction of the laser beam LB.

  The curved surface 21a having a larger angle formed by the laser beam LB incident from the semiconductor laser element 10 with respect to the normal line of the light emitting end surface LES has a shorter distance from the light emitting end surface LES. Therefore, interference between the laser beam LB passing through the curved surface 21a and the laser beam LB passing through the other curved surface 21a can be prevented.

  Each of the plurality of curved surfaces 21a may be subjected to aspherical processing for aberration correction with respect to the radius of curvature determined by Expression (Expression 2). In this case, the aberration generated in the flat plate condensing element 20 can be corrected.

  Each of the plurality of curved surfaces 21a may have a radius of curvature in a direction perpendicular to the direction in which the active layer 3B extends. In this case, the curved surface 21a has a radius of curvature in a direction perpendicular to the direction in which the active layer 3B extends. For this reason, the divergence angle of the laser beam LB in the direction perpendicular to the direction in which the active layer 3B extends can be adjusted.

  The number N of the curved surfaces 21a may not match the number of photonic crystal regions 4R of the semiconductor laser element 10. In particular, if the number N of the curved surfaces 21a is larger than the number of the photonic crystal regions 4R, the current is supplied to one of the two drive electrodes E2 by supplying the current to the two adjacent drive electrodes E2 and E2 at the same time. Even when the laser beam LB is emitted in the intermediate direction between the emission direction of the laser beam LB in this case and the emission direction of the laser beam LB when current is supplied to the other drive electrode E2, the flat plate condensing element 20 Can suitably focus the laser beam LB.

  Although the refractive index n (X) of the flat plate condensing element 20 changes along the X-axis direction, the refractive index n (X) may change continuously according to the X coordinate. Alternatively, it may be changed discontinuously at a specific X coordinate position. Alternatively, the entire flat plate condensing element 20 may be made of a single material having a constant refractive index n so that the refractive index n (X) is constant regardless of the X coordinate.

  In addition, although the example using the one photonic crystal layer 4 was demonstrated above, you may comprise this using the two photonic crystal layers 4. FIG.

  FIG. 14 is a longitudinal sectional view of the semiconductor laser device.

  The only difference from that shown in FIG. 2 is that a second photonic crystal layer 4 'is provided between the cladding layer 2 and the light guide layer 3A (active layer 3B). The second photonic crystal layer 4 ′ includes a basic layer 4 A ′ made of the same material as the first photonic crystal layer 4 and a different refractive index portion 4 B ′.

  When the photonic crystal layer 4 shown in FIG. 2 is a first photonic crystal layer, the photonic crystal layer 4 has a refractive index distribution structure having a single periodic structure shown in FIG. The second photonic crystal layer 4 ′ has a refractive index distribution in which the single periodic structure with the period a2 shown in FIG. It has a structure. That is, when the overlap of the photonic crystal layers 4 and 4 ′ is seen from the thickness direction of the semiconductor laser element, the regions Δ1 to Δ5 are aligned along the A direction as shown in FIG. Will be. Even in the case of such a structure, the same effects as the structure shown in FIG. 2 can be obtained by setting each parameter as described above.

  In the case of manufacturing such a structure, after the formation of the clad layer 2, the same manufacturing method as that for the first photonic crystal layer 4 is performed (however, the growth is stopped when the different refractive index portion 4B is formed). Then, after that, each layer after the light guide layer 3A may be manufactured in the same manner as described above.

  Further, the second photonic crystal layer 4 ′ having the same structure as the first photonic crystal layer 4 including two refractive index periodic structures is used in place of the first photonic crystal layer 4. However, the same effect can be obtained.

  As described above, the semiconductor laser element described above is an edge-emitting semiconductor laser element, and includes a lower cladding layer 2, an upper cladding layer 5, a lower cladding layer 2 and an upper surface formed on a substrate 1. Photonic crystal layers 4 and 4 interposed between the active layer 3B (which may include a light guide layer) interposed between the cladding layer 5 and the active layer 3B and at least one of the upper and lower cladding layers. , And a first drive electrode E2 for supplying a drive current to the first region R of the active layer 3B (a region immediately below one drive electrode E2). The longitudinal direction of the first drive electrode E2 is a semiconductor When viewed from the thickness direction of the laser element, it is inclined with respect to the normal line (Y axis) of the light emitting end face LES of this semiconductor laser element and corresponds to the first region R of the photonic crystal layers 4 and 4 ′. Area Δ1 is the surrounding and refraction Have different first and second periodic structures in which the arrangement periods of the different refractive index portions are different from each other, and the difference between the reciprocals of the arrangement periods (a1, a2) in the first and second periodic structures. Accordingly, when viewed from the thickness direction of the semiconductor laser element, two laser beams forming a predetermined angle (δθ) with respect to the longitudinal direction (B direction) of the first drive electrode E2 are generated inside the semiconductor laser element, Only one of these laser beams is set to satisfy the total reflection condition, and the other refraction angle θ3 is set to be less than 90 degrees.

  That is, in the edge-emitting laser element, with respect to light emission by supplying a drive current to the first drive electrode E2, the incident angle θ of one laser beam inside the laser element to the light emitting end face is set to be equal to or greater than the total reflection critical angle. Thus, the laser beam can be prevented from being output to the outside. Since the refraction angle θ3 of the other laser beam is less than 90 degrees, the laser beam can be output to the outside through the light emitting end face.

  The semiconductor laser device according to an aspect of the present invention further includes a second drive electrode E2 for supplying a drive current to the second region R of the active layer 3B (a region immediately below the second drive electrode E2). When viewed from the thickness direction of the semiconductor laser element, the longitudinal direction (B direction) of the second drive electrode E2 is inclined with respect to the normal line (Y axis) of the light emitting end face LES of the semiconductor laser element, The region Δ2 corresponding to the second region of the photonic crystal layer has third and fourth periodic structures in which the arrangement periods of the different refractive index portions having different refractive indices from the surroundings have the third and fourth periodic structures, respectively. According to the difference of the reciprocal of each of the arrangement periods (a1, a3) in the periodic structure of 4, when viewed from the thickness direction of the semiconductor laser element, a predetermined angle δθ is set with respect to the longitudinal direction of the second drive electrode E2. Two laser beams formed are semiconductor lasers Only one of these laser beams generated inside the laser beam is set so as to be totally reflected at the light emitting end face, and the other refraction angle θ3 is set to be less than 90 degrees, and the first and second periods are set. The difference of the reciprocal number of each arrangement period (a1, a2) in the structure is different from the difference of the reciprocal number of each arrangement period (a1, a3) in the third and fourth periodic structures.

  In the edge-emitting laser element, with respect to light emission by supplying a drive current to the second drive electrode E2, the incident angle of the one laser beam inside the laser element to the light emission end face is set to a total reflection critical angle or more. The laser beam can be prevented from being output to the outside. Since the refraction angle of the other laser beam is less than 90 degrees, the laser beam can be output to the outside through the light emitting end face.

  It should be noted that the same effect is obtained with respect to the third and subsequent drive electrodes E2 from the left.

  Here, in the regions within the photonic crystal layers 4 and 4 ′ corresponding to the respective drive electrodes, the difference in the reciprocal of the arrangement period of the different refractive index portions 4 </ b> B (exit direction determining factor) is different. The difference value determines the laser beam emission direction. Therefore, since the value of the difference (exiting direction determining factor) is different in both regions, the emitting direction of the laser beam is the region Δ1 corresponding to the first drive electrode E2 and the region Δ2 corresponding to the second drive electrode E2. So it will be different. One of the pair of laser beams generated in each region is incident on the light emitting end face with a total reflection critical angle or more, and thus is not emitted to the outside. Therefore, by switching the supply of the drive current to each drive electrode, it becomes possible to output only one direction of laser beam in different directions.

  In this embodiment, a photonic crystal having a different period is based on a square lattice having a period (b1, b1) in the A direction and the B direction, and a rectangular lattice having a period (a1, b1) as the first periodic structure. Although the case of a rectangular lattice with a period of (a2, b1) has been described as the second periodic structure, it is of course possible to use a structure in which the periods in the A direction are different from each other based on a triangular lattice.

  FIG. 15 is a plan view of the inside of the element shown by inverting the top and bottom of the plan view shown in FIG. 4 and slightly changing the refraction angle θ3 of the emitted beam. The same applies to FIG.

  The xyz orthogonal coordinate system is a coordinate system obtained by rotating the XYZ orthogonal coordinate system around the Z axis by an angle + φ, and the + x direction coincides with the + A direction and the + y direction coincides with the −B direction. The arrangement of the photonic crystal hole patterns is inclined by an angle φ with respect to the light emitting end face. As shown in the figure, the angle formed by the reflection direction of the wave vector k2 (the laser beam traveling direction of the wave vector k2 ′) and the light emitting end face LES is θ2 ′, and the reflection direction of the laser beam of the wave vector k1 (the laser of the wave vector k1 ′). The angle formed between the beam traveling direction) and the light exit end face LES is defined as θ3 ′.

  In the embodiment described above, the laser beam having the wave number vector k2 is set so as to be totally reflected at the light emitting end face LES so that the number of laser beams emitted from the element is one. However, if the power of the laser beam can be reused inside the device, the energy conversion efficiency from electric energy to the laser beam is considered to increase. Therefore, the conditions under which the reflected laser beam Y2 'can be reused are examined. The laser beams (main light waves) corresponding to the wave number vectors k1, k2, k3, k4, k1 ′, and k2 ′ are Y1, Y2, Y3, Y4, Y1 ′, and Y2 ′, respectively. Also assume that the vector is shown. In addition, an angle formed between the X axis and the main light wave Y4 is θt, and an angle formed between the X axis and the main light wave Y3 is θr.

Each parameter θt, θr, θ2 ′, θ3 ′ satisfies the following relational expression. Β ₀ , β ₁ , and β ₂ mean a basic reciprocal lattice vector in the B direction, a basic reciprocal lattice vector in the A direction of the first periodic structure, and a basic reciprocal lattice vector in the A direction of the second periodic structure, respectively. [Beta] ₀ = 2 [pi] / b1 (= b2), [beta] ₁ = _{2 [} pi] / a1, [beta] ₂ = _{2 [} pi] / a2, [Delta] [beta] = [beta] _{2- [} beta] ₁ , and [alpha] = [beta] ₀ / [Delta] [beta].

The angle θr will be described. As shown in FIG. 16, in the xy coordinate system, a vector from the origin O to the point P (βx, βy) is given by an angle θβ = tan ⁻¹ (βy / βx) formed with the x axis. It is done. Here, [theta] t in θβ, βx = (1/2) × Δβ, as [beta] y = beta _0, since it is the case of adding the angle phi, is given by (Equation 5). The remaining parameters are calculated in the same manner and are given by (Equation 6) to (Equation 8).
θt = tan ⁻¹ (2α) + φ (Formula 5)
θr = 180 ° −tan ⁻¹ (2α) + φ (Expression 6)
θ2 ′ = tan ⁻¹ (2α) −φ (Expression 7)
θ3 ′ = 180 ° −tan ⁻¹ (2α) −φ (Expression 8)

  In the absence of any additional structure, in order for the totally reflected main light wave Y2 ′ to contribute to laser light resonance, the angle θ2 ′ of the main light wave Y2 ′ needs to match the angle θt (θ2 ′). = Θt). In this case, φ = 0. Further, the angle θ3 ′ and the angle θr of the reflected main light wave Y1 ′ need to coincide with each other (θ3 ′ = θr). In this case, φ = 0. On the other hand, in order to totally reflect one of the two main light waves Y1 and Y2, it is necessary that φ ≠ 0. Therefore, when total reflection is performed so that the number of output beams becomes one, the main light wave reflected by the light emitting end face cannot be effectively contributed to the laser light resonance.

  Therefore, an additional structure that can use reflected light is examined.

  FIG. 17 is a graph showing the directions of main light waves in the xy coordinate system. The x axis in the xy coordinate system is rotated by an angle φ with respect to the X axis.

In order to make the main light wave Y2 ′ as reflected light coincide with the main light wave Y4 subjected to resonance, the direction of the light wave Y2 ′ may be rotated by an angle 2φ. The coordinates of the tip P4 of the vector indicating the main light wave Y4 in the xy coordinate system are (Δβ / 2, β ₀ ), and the coordinates of the tip P2 ′ of the vector indicating the main light wave Y2 ′ are coordinates obtained by rotating this by −2φ. It is.

On the other hand, in the XY coordinate system, the coordinates (Δβ / 2, β ₀ ) of the vector Y4 (tip P4) in the xy coordinate system are converted into coordinates (XA, YA) rotated by + φ, and the vector Y2 ′ The coordinates are converted into coordinates (XB, YB) obtained by rotating the coordinates of the vector Y4 in the xy coordinate system by −φ.
(XA, YA) = (Δβ cos φ / 2−β ₀ sin φ, Δβ sin φ / 2 + β ₀ cos φ) (Equation 9)
(XB, YB) = (Δβ cos φ / 2 + β ₀ sin φ, −Δβ sin φ / 2 + β ₀ cos φ) (Equation 10)

If there is a reciprocal lattice vector equal to the vector ΔY, the main light wave Y2 ′ is coupled to the main light wave Y4. That is, the vector Y4 is obtained by adding the vector ΔY to the vector Y2 ′. The vector ΔY is expressed as follows. If a new periodic structure having a reciprocal lattice vector equal to the vector ΔY is additionally employed, the totally reflected light wave Y2 ′ can be contributed to resonance.
ΔY = (XA−XB, YA−YB) = (− 2β ₀ sinφ, Δβsinφ)

  In this new periodic structure, it is preferable that the different refractive index portions are arranged in a stripe shape. The stripe-shaped periodic structure has a high anisotropy of the optical coupling coefficient and can reduce the influence of the resonance state Y1 and Y2.

  FIG. 18 is a plan view of the inside of the element for explaining main light waves in the active layer 3B.

  The line of intersection between the XY plane and the light emitting end face LES coincides with the X axis. When the above-described vector ΔY exists, the wave vector of the light wave Y2 'having the tip at the coordinate P2' is converted into the wave vector of the light wave Y4 having the tip at the coordinate P4. Let L be a straight line perpendicular to the vector ΔY. The new periodic structure may be set so that the light wave travels in a direction perpendicular to the straight line L in the active layer 3B. In order to control the traveling direction of the light wave in the active layer 3B, the pattern of the diffraction grating layer optically coupled thereto is controlled. In FIG. 14 described above, upper and lower photonic crystal layers (diffraction grating layers) 4, 4 'are provided. In the case of such a structure, a photonic crystal layer that achieves the above-described total reflection is produced in the upper diffraction grating layer 4, and the new periodic structure for using reflected light for resonance is formed in the diffraction grating layer 4. (Of course, these periodic structures may be produced by superimposing one or both layers).

  FIG. 19A is a plan view of a diffraction grating layer 4 ′ having a periodic structure that gives the vector ΔY, and FIG. 19B is a cross-sectional view in the XZ plane.

  The diffraction grating layer 4 'includes a basic layer 4A' and a different refractive index portion 4B 'extending in a stripe shape along the straight line L in the XY plane, and these refractive indexes are different. The different refractive index portions 4B 'are periodically embedded in the basic layer 4A'. As a result, a striped periodic refractive index distribution structure is formed in the diffraction grating layer 4 ′, and functions as a diffraction grating layer in which light waves travel in the direction of ΔY. By changing the ratio of the width of the basic layer 4A ′ along the direction perpendicular to the straight line L to the period Λ of the periodic structure, the intensity of diffraction by the stripe-shaped periodic refractive index distribution structure is changed. I can do it. The length L2 of the reciprocal lattice vector of ΔY in the reciprocal lattice space, the period Λ, and the angle θ formed by the straight line L and the X axis are given as follows.

L2 = {(2β ₀ sin φ) ² + (Δβ sin φ) ² } ^1/2 (Expression 11)
Λ = 2π / L2
= 1 / {( ² sin φ / a _y ) ² + ((1 / a _II −1 / a _I ) sin φ) ² } ^1/2 (Expression 12)
θ = θt−φ
= Tan ^-1 (2α)
= Tan ⁻¹ {(2 / a _y ) / (1 / a _II −1 / a _I )} (Formula 13)

Β ₀ = 2π / a _y , β ₁ = 2π / a _I , β ₂ = 2π / a _II , a _y is the period in the B direction, a _I is the period in the A direction of the first periodic structure, a _II shows the period in the A direction of the second periodic structure.

  FIG. 20 is a graph showing the relationship between the laser beam emission angle (refraction angle) θ3, the stripe angle θ, and the period Λ, and FIG. 21 is a chart showing data used in this graph. The vertical axis of the θ (°) data is shown on the left side of the graph, and the vertical axis of the Λ (nm) data is shown on the right side of the graph.

  It can be seen that as the laser beam emission angle θ3 increases, the stripe angle θ increases and the period Λ decreases. In the graph, when the angle θ3 is increased from 0 ° to 70 °, the angle θ increases from 84.27 ° to 89.54 °, and the period Λ decreases from 486.08 nm to 463.43 nm. However, it is within the practically feasible numerical range.

  In FIG. 14, when a periodic pattern for total reflection is formed in both photonic crystal layers 4 and 4 ′, a diffraction grating layer having a new periodic structure that gives the above ΔY separately from these. 4 ″ (the structure is the same as that of the diffraction grating layer 4 ′ in the case of FIG. 19) can be formed between the upper cladding layer 5 and the diffraction grating layer 4 (FIG. 22A). A new diffraction grating layer 4 ″ having the same structure as that of the diffraction grating layer 4 ′ in FIG. 19 may be formed between the lower cladding layer 2 and the diffraction grating layer 4 ′ (FIG. 22). (B)). As described above, in the above example, the diffraction grating structure that contributes to resonance by coupling the laser beam reflected by the light emitting end face with the laser beam that resonates inside the active layer by satisfying the total reflection critical angle condition (see FIG. 19 and the diffraction grating layer of FIG. 22). In this case, energy use efficiency is increased.

  FIG. 23 is a plan view of the photonic crystal layer 4 having various periodic structures. In any photonic crystal layer 4, the different refractive index portions 4B are periodically embedded in the basic layer 4A. 23A shows a square lattice, FIG. 23B shows a rectangular lattice, FIG. 23C shows a triangular lattice, and FIG. 23D shows a face-centered rectangular lattice. As described above, in the photonic crystal layer 4, two periodic structures having different periods are included so as to overlap in one photonic crystal layer 4, or in the two photonic crystal layers 4, 4 ′. A configuration in which each is included and overlapped in plan view is employed. In these figures, examples of each periodic structure before superposition are shown, and two types of periodic structures are arranged so as to overlap each other so that the directions of the respective basic translation vectors (indicated by arrows) coincide.

  Specifically, in the photonic crystal layer 4 of FIG. 23A, the different refractive index portions 4B are arranged at the lattice point positions of the square lattice. A square lattice has a shape in which squares are arranged without gaps, and the length a of one side of a square constituting one lattice is equal to the length b of the other side. In other words, the horizontal arrangement period a of the different refractive index portions 4B is equal to the vertical arrangement period b. Here, the arrow in the figure represents the basic translation vector of the lattice. Even if the pattern is translated by a linear sum of integral multiples of these basic translation vectors, it overlaps the original pattern. That is, this lattice system has a translational symmetry defined by this basic translation vector.

  In the photonic crystal layer 4 of FIG. 23B, the different refractive index portions 4B are arranged at the lattice point positions of the rectangular lattice. The rectangular lattices having different vertical and horizontal lengths are shapes in which rectangles are arranged without gaps, and the length a of one side of a rectangle constituting one lattice is different from the length b of the other side. In other words, the horizontal arrangement period a of the different refractive index portions 4B is different from the vertical arrangement period b. Here, the arrow in the figure represents the basic translation vector of the lattice. Even if the pattern is translated by a linear sum of integral multiples of these basic translation vectors, it overlaps the original pattern. That is, this lattice system has a translational symmetry defined by this basic translation vector.

  In the photonic crystal layer 4 of FIG. 23C, the different refractive index portions 4B are arranged at the lattice point positions of the triangular lattice. The triangular lattice is a shape in which triangles are arranged without gaps, and the length of the bases of the triangles constituting one lattice is a, and the height is b. When the triangle is an equilateral triangle, in other words, the length a of the base is the horizontal arrangement period a of the different refractive index portions 4B, and the vertical arrangement period b is √2 times a. Here, the arrow in the figure represents the basic translation vector of the lattice. Even if the pattern is translated by a linear sum of integral multiples of these basic translation vectors, it overlaps the original pattern. That is, this lattice system has a translational symmetry defined by this basic translation vector.

  In the photonic crystal layer 4 in FIG. 23D, the different refractive index portions 4B are arranged at the lattice point positions of the face-centered rectangular lattice. The face-centered rectangular lattice is a lattice additionally provided with a lattice point at the center position in each lattice of the rectangular lattice, and the rectangular lattice itself is formed by arranging rectangles without gaps. Here, the arrow in the figure represents the basic translation vector of the lattice. Even if the pattern is translated by a linear sum of integral multiples of these basic translation vectors, it overlaps the original pattern. That is, this lattice system has a translational symmetry defined by this basic translation vector.

  As described above, the A axis is inclined with respect to the X axis, and these are not parallel. In other words, the photonic crystal layer 4 described in FIGS. 2 to 12 and FIGS. 14 to 23 has a different refractive index portion in the photonic crystal layer 4 when viewed from the thickness direction of the semiconductor laser element. 4B is arranged at a lattice point position of the lattice structure, and the direction of the basic translation vector (A axis, B axis) of the lattice structure is a direction (X axis) parallel to the light emitting end face LES (see FIG. 4). Is different. In this case, one laser beam can satisfy the total reflection critical angle condition by setting the inclination to a certain value or more.

  The lattice structure of the photonic crystal layer, when viewed from the thickness direction, is a square lattice and a rectangular lattice, a rectangular lattice and a rectangular lattice, a triangular lattice and a face-centered rectangular lattice, a face-centered rectangular lattice and a surface. It can be constituted by a combination of a square lattice, a rectangular lattice, a triangular lattice, or a face-centered rectangular lattice, such as a centered rectangular lattice. That is, it is possible to configure a single grating as described above by combining gratings having different pitches in one direction.

  When the above-described square lattice (FIG. 23A) and the square lattice (FIG. 23B) are overlapped, the photonic crystal layer 4 (or 4, 4 ′) has a tetragonal lattice and a rectangular lattice of crystals. A period of one axial direction of the hole lattice is a1, a period of the axial direction perpendicular to the one axis is b1, a period of one axial direction of the rectangular lattice is a2, When the period in the axial direction orthogonal to one of the axes is b2, a1 = b1, a1 ≠ a2, and b1 = b2 can be satisfied. In this case, a standing wave state is formed in the photonic crystal layer surface by oblique light waves that are not orthogonal to each other, and the angle formed by the oblique light waves changes according to the difference between a1 and a2.

  When two rectangular lattices (FIG. 23B) are overlapped, the photonic crystal layer 4 (or 4, 4 ′) includes the crystal structures of the first and second rectangular lattices. , The period of one axial direction of the first rectangular lattice is a1, the period of the axial direction orthogonal to the one axis is b1, the period of one axial direction of the second rectangular lattice is a2, When the period in the axial direction orthogonal to the axis is b2, a1 ≠ a2 and b1 = b2 can be satisfied. In this case, a standing wave state is formed in the photonic crystal layer surface by oblique light waves that are not orthogonal to each other, and the angle formed by the oblique light waves changes according to the difference between a1 and a2.

  When two face-centered rectangular lattices (FIG. 23D) are superimposed, the photonic crystal layer 4 (or 4, 4 ′) has a crystal structure of the first and second face-centered rectangular lattices. The period of one axial direction of the first face-centered rectangular lattice is a1, the period of the axial direction orthogonal to the one axis is b1, and one axis of the second face-centered rectangular lattice is If the period in the direction is a2 and the period in the axial direction orthogonal to the one axis is b2, a1 ≠ a2 and b1 = b2 can be satisfied. In this case, a standing wave state is formed in the photonic crystal layer surface by oblique light waves that are not orthogonal to each other, and the angle formed by the oblique light waves changes according to the difference between a1 and a2.

  One face-centered rectangular lattice can be a triangular lattice. The triangular lattice is a special case in which the angle formed by the basic translation vectors forming the lattice of the face-centered rectangular lattice is 60 degrees.

  As shown in FIG. 2, the semiconductor laser element 10 includes regions (first region, second region...) R immediately below the drive electrode of the active layer 3B. The different refractive index portion 4B of the photonic crystal layer corresponding to the first region R of the active layer 3B and the different refractive index portion 4B of the photonic crystal layer corresponding to the second region R of the active layer 3B are the first region. The laser beams output from R and the second region R can be set to have different shapes when viewed from the thickness direction of the semiconductor laser element so that the refraction angles of the laser beams are different and the intensities are matched. In other words, the size of the hole (different refractive index portion) is changed so that the diffraction intensities of a plurality of photonic crystals are the same. Since the intensity is the same, it can be easily applied to electronic devices such as laser printers and radars.

  For example, the hole (different refractive index portion) changes the length along the direction along the basic translation vector having a different period. Specifically, in the first region R, the dimension of the different refractive index portion 4B along the direction in which the arrangement periods of the different refractive index portions 4B in the first periodic structure and the second periodic structure are different (for example, the B axis) is In the second region R, the different refractive index portions along the direction in which the arrangement periods of the different refractive index portions 4B in the third and fourth periodic structures are different (for example, the B axis) are different depending on the positions along the different directions. The dimension of 4B changes according to the position along the said different direction. As a result, the diffraction intensities in the first periodic structure and the second periodic structure, or the diffraction intensities in the third periodic structure and the fourth periodic structure can be made uniform, and the oscillation can be stabilized.

  The laser beam deflecting device shown in FIG. 12 includes a semiconductor laser element 10 and a drive current supply circuit 11 that selectively supplies a drive current to the electrode group E2 including the first drive electrode and the second drive electrode. ing. By controlling the supply of the drive current, the emission of the laser beam LB can be controlled. Here, the drive current supply circuit 11 can further include means for changing the ratio of the drive current supplied to each electrode E2 of the electrode group. That is, in FIG. 12, reference numerals SW1 to SW5 indicate amplifiers with switches, and the amplifiers can control the magnitude of the drive current supplied from the power supply circuit 11A. In this case, the control circuit 11B can control the ratio of the drive current supplied to each electrode E2 by controlling the gain of each amplifier.

  In addition, the period along the basic translation vector in the first periodic structure in the first region R can be continuously changed as the third periodic structure in the second region R is approached. In this case, there is an effect that reflection can be prevented from occurring at the interface between the photonic crystals having different periods.

  In the laser beam deflection apparatus shown in FIG. 12, the wavelengths of the laser beams output from the active layer immediately below each electrode E2 are preferably the same. This is because when the laser beam is scanned by a mirror or the like, the wavelengths of the laser beams before and after the deflection are the same. Therefore, when a drive current is supplied to the first and second drive electrodes E2, the resonances of the laser beams generated in the first region R and the second region R of the active layer immediately below the first and second drive electrodes E2, respectively. It is preferable to set so that the wavelengths are the same.

That is, the periodic structure (first periodic structure, second periodic structure) superimposed in the first region R and the periodic structure (third periodic structure, fourth periodic structure) superimposed in the second region R are as follows: Meet the relationship.
For example, when considering a structure composed of a combination of a rectangular lattice and a rectangular lattice, the following relational expression is obtained.
b11 = b21 = b ₀ / √ (1-sin ² δθ1)
δθ1 = φ−sin ⁻¹ (sin θ31 / n _dev )
b12 = b22 = b ₀ / √ (1-sin ² δθ2)
δθ2 = φ−sin ⁻¹ (sin θ32 / n _dev )

  However, the B-axis direction period of the first rectangular lattice superimposed in the first region R is b11, the B-axis direction period of the second rectangular lattice is b21, and the beam emission angle of the first region R is θ31. The period of the first rectangular lattice superimposed in the second region R in the B-axis direction is b12, the period of the second rectangular lattice in the B-axis direction is b22, and the beam emission angle of the second region R is θ32 It was.

  Although the above shows a combination of a rectangular lattice and a rectangular lattice, the same applies to other lattice systems.

  Note that the above-described laser beam deflection apparatus can be miniaturized because the element itself has a deflection function, and high reliability and high speed can be expected. Since it is small in size, it is expected to be used as a laser knife or a photodynamic therapy (PDT) light source incorporated in a portable device or incorporated in a medical capsule endoscope. Of course, the application to the display by a large-sized laser scanning is also considered. Since the stray light of the laser beam is not output to the outside, an improvement in reliability is expected.

  DESCRIPTION OF SYMBOLS 10 ... Semiconductor laser element, 1 ... Semiconductor substrate, 2 ... Lower clad layer, 3A ... Lower light guide layer, 3B ... Active layer, 3C ... Upper light guide layer, 4 ... Photonic crystal layer, 5 ... Upper clad layer, 6 DESCRIPTION OF SYMBOLS ... Contact layer, 20 ... Flat plate condensing element, 21 ... Objective surface, 21a, 21a1 to 21aN ... Curved surface, E2 ... Drive electrode, LES ... Light emission end surface, N ... Normal, f ... Plane.

Claims (5)

An edge emitting semiconductor laser element;
A flat plate concentrating element disposed to face the light emitting end face of the semiconductor laser element,
The semiconductor laser element is
A lower cladding layer formed on the substrate;
An upper cladding layer;
An active layer interposed between the lower cladding layer and the upper cladding layer;
A photonic crystal layer interposed between the active layer and at least one of the upper and lower cladding layers;
A plurality of drive electrodes for supplying a drive current to a plurality of regions of the active layer,
The plurality of regions are positioned parallel to the light emitting end surface and aligned in a first direction in which the active layer extends, and the emission directions of the laser beams emitted from the plurality of regions with respect to the light emitting end surface are different from each other,
The flat plate condensing element is
An object surface is provided on the side opposite to the side facing the light emitting end surface,
The objective surface includes a plurality of curved surfaces arranged in a direction parallel to the first direction when viewed from a direction orthogonal to the light emitting end surface,
Each of the plurality of curved surfaces is in contact with a plane perpendicular to a laser beam incident on the curved surface from the semiconductor laser element,
A radius of curvature r (X) of each of the plurality of curved surfaces in a plane parallel to a direction in which the active layer extends at a position X along the X axis, where the coordinate axis parallel to the first direction is the X axis, Formula

Based on
In the equation (Equation 1), n (X) is the refractive index of the flat plate condensing element at the position X, and θ _out (X) is the laser beam emitted from the object plane at the position X. An angle formed with respect to the normal of the exit end face, and f ₀ is a focal length in the X-axis direction of the flat plate condensing element when θ _out (X) = 0.
A semiconductor laser module. Each of the plurality of curved surfaces is aspherical for correction of aberration with respect to the radius of curvature determined by the mathematical formula (Formula 1).
The semiconductor laser module according to claim 1. The plurality of curved surfaces have a shorter distance from the light emitting end surface as the curved surface having a larger angle formed by the laser beam incident on the curved surface from the semiconductor laser element with respect to the normal line of the light emitting end surface,
3. The semiconductor laser module according to claim 1, wherein the semiconductor laser module is a semiconductor laser module. Each of the plurality of curved surfaces has a radius of curvature in a direction perpendicular to a direction in which the active layer extends.
The semiconductor laser module according to claim 1, wherein: The active layer includes a first region and a second region as the plurality of regions,
The plurality of drive electrodes include a first drive electrode for supplying a drive current to the first region, and a second drive electrode for supplying a drive current to the second region,
The longitudinal direction of the first drive electrode is inclined with respect to the normal of the light emitting end face when viewed from the thickness direction of the semiconductor laser element,
A region corresponding to the first region of the photonic crystal layer has first and second periodic structures in which arrangement periods of different refractive index portions having different refractive indexes from the surroundings are different from each other,
A predetermined angle with respect to the longitudinal direction of the first drive electrode when viewed from the thickness direction of the semiconductor laser element according to the difference between the reciprocals of the arrangement periods of the first and second periodic structures. 2 or more laser beams are generated inside the semiconductor laser element, and one of these laser beams toward the light emitting end face is set to have a refraction angle of less than 90 degrees with respect to the light emitting end face. And at least one further toward the light exit end face is set to satisfy a total reflection critical angle condition with respect to the light exit end face,
The longitudinal direction of the second drive electrode is inclined with respect to the normal of the light emitting end face when viewed from the thickness direction of the semiconductor laser element,
A region corresponding to the second region of the photonic crystal layer has third and fourth periodic structures in which arrangement periods of different refractive index portions having different refractive indexes from the surroundings are different from each other.
A predetermined angle with respect to the longitudinal direction of the second drive electrode when viewed from the thickness direction of the semiconductor laser element according to the difference between the reciprocals of the arrangement periods of the third and fourth periodic structures. 2 or more laser beams are generated inside the semiconductor laser element, and one of these laser beams toward the light emitting end face is set to have a refraction angle of less than 90 degrees with respect to the light emitting end face. And at least one other toward the light exit end face is set so as to satisfy a total reflection critical angle condition with respect to the light exit end face,
The difference between the reciprocal numbers of the array periods in the first and second periodic structures is different from the difference between the reciprocal numbers of the array periods in the third and fourth periodic structures.
The semiconductor laser module according to claim 1, wherein:

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