JP2014071062A - Method and system for supporting design of radiation inspection apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method and system for supporting design of an X-ray inspection apparatus, capable of advancing the due date of design of the X-ray inspection apparatus, improving the apparatus quality and responding to various needs.SOLUTION: A method for supporting design of an X-ray inspection apparatus 11 supports design of the X-ray inspection apparatus 11 including a camera 26. Each of specifications required for plural functions of the camera 26 is set on the basis of performance required for the X-ray inspection apparatus 11. A list including at least each function of the camera 26, a specification required for each function and an evaluation condition for the specification is created and presented to a designer.

Description

  FIELD Embodiments described herein relate generally to a radiation inspection apparatus design support method and a radiation inspection apparatus design support system that support the design of a radiation inspection apparatus including functional parts.

  Conventionally, an X-ray inspection apparatus as a radiation inspection apparatus has been used, for example, for medical use or non-destructive inspection. The X-ray tube is irradiated with X-rays from the X-ray tube to the inspection object and transmitted through the inspection object. An X-ray image is converted into a visible light image by an X-ray image tube, and this visible light image is captured in a video or processing system such as a monitor or a personal computer using an imaging system such as a camera, and monitoring, processing, inspection, Make a diagnosis. In the X-ray image tube, X-rays incident on the input surface are converted into electrons on the input photocathode, and the electrons are accelerated and focused by a focusing electrode located in the middle and supplied with a high-voltage power source. A visible light image is formed.

JP 2007-192574 A

  However, in the case of the above-described X-ray inspection apparatus, a camera having a CCD element is generally used as the camera. Although X-ray image tubes use medical or industrial cameras, medical cameras in particular have many required functions, and various statutory regulations such as IEC standards and legal requirements must be satisfied. Don't be.

  In general, a CCD, which is the most important part when creating an image as a camera, provides data and algorithms for creating an image for each element, but for industrial non-destructive inspection or medical diagnosis or treatment. Such data and algorithms alone are insufficient to obtain image quality (surface quality) for use. Therefore, it is necessary to incorporate image processing or noise processing.

  On the other hand, especially in medical applications, signals related to control of X-ray irradiation conditions such as Automatic Brightness Control (ABC) or Automatic Exposure Control (AEC) are also output from the camera. Reliability is very important.

  In the conventional case, it is common that these specifications are presented vaguely. For this reason, there are many cases of going back and forth between development and evaluation, which may hinder short delivery and high quality.

  In addition, many of these functions were left to the camera manufacturer's know-how, and there were vague specifications, making it easier to leave it to the camera manufacturer, and it could not be said that it was not always meeting market needs. Such a difference between the camera specifications and the market needs has to be dealt with by adjustment on the device side.

  The present invention has been made in view of the above points. A design support method and a radiation inspection apparatus for a radiation inspection apparatus capable of shortening the design delivery time, improving the quality of the radiation inspection apparatus, and responding to various needs. The purpose is to provide a design support system.

  The design support method of the radiation inspection apparatus according to the embodiment is a design support method of the radiation inspection apparatus that supports the design of the radiation inspection apparatus including the functional parts. Then, specifications required for a plurality of functions of the functional parts are set based on the required performance of the radiation inspection apparatus. Furthermore, a list including at least each function of the functional parts, specifications required for them, and evaluation conditions for each of these specifications is created and presented to the designer.

It is explanatory drawing which shows typically the radiation inspection apparatus designed with the design assistance method of the radiation inspection apparatus of one Embodiment. It is a table | surface which shows an example of the list produced by the design support method of a radiation inspection apparatus same as the above.

  The configuration of one embodiment will be described below with reference to the drawings.

  As shown in FIG. 1, an X-ray inspection apparatus 11 as a radiation inspection apparatus inspects an object 12 such as a person or an object. The X-ray inspection apparatus 11 corresponds to the X-ray generation means 13 for irradiating the inspection object 12 with X-ray pulses, and the X-ray image of the inspection object 12 irradiated with pulses from the X-ray generation means 13. A photographing unit 14 for detecting an image; a personal computer 16 having an image capturing unit for capturing an image detected by the photographing unit 14; and a display means connected to the personal computer 16 to display an image or the like. A monitor 17 is provided.

  The X-ray generation means 13 includes an X-ray generation unit 21 having an X-ray tube that generates X-rays, and an X-ray control unit 22 that controls the X-ray generation unit 21 to irradiate X-rays at a predetermined timing. It has. The X-ray control unit 22 is configured so that the X-ray control unit 22 irradiates the X-ray pulse by the X-ray generation unit 21 in accordance with an X-ray irradiation signal from the personal computer 16 side.

  The imaging unit 14 also functions as an X-ray image tube 25 that converts an X-ray image transmitted through the inspection object 12 into a visible light image, and a visible light image converted by the X-ray image tube 25, for example. The camera 26 is a camera means such as a CCD camera as a part.

  The X-ray image tube 25 has an input surface that converts incident X-rays into electrons and outputs them, and an output surface that converts electrons output from the input surfaces and accelerated and focused by the focusing electrode into a visible light image. An output phosphor that converts electrons into a visible light image is used on the output surface. A high voltage power supply 28 is disposed outside the X-ray image tube 25. The X-ray image tube 25 adjusts the value of the acceleration voltage, which is the driving power supplied from the high voltage power supply 28 to the focusing electrode, with the acceleration voltage control signal from the personal computer 16 side, and is visible by this acceleration voltage value. The brightness of the light image can be automatically adjusted.

  Although not shown, the camera 26 includes an optical system including a lens and a diaphragm, and an imaging device such as a CCD. The aperture can be adjusted by applying a voltage to a general electric aperture adjusting mechanism, and if the aperture is opened too much, the resolution of the peripheral portion of the image is lowered. The camera 26 can automatically adjust the aperture of the aperture with an aperture control signal from the personal computer 16 side.

  In addition, for example, a general-purpose capture board is used as the image capturing unit of the personal computer 16. The personal computer 16 outputs an X-ray irradiation signal to the X-ray generation means 13 and causes the X-ray generation means 13 to pulse-irradiate the X-rays so that an image corresponding to the X-ray image is taken by the imaging unit 14. A pulse shooting function that outputs a video signal to the image capturing unit and captures an image by the image capturing unit; and a function that acquires the luminance information of the image by inputting the video signal to be displayed on the monitor 17 The acceleration voltage of the X-ray image tube 25 and the aperture of the camera 26 can be adjusted, the luminance information of the image output from the monitor 17 is acquired to determine whether the luminance is excessive or insufficient. It has a function of adjusting mainly the increase in the acceleration voltage of the image tube 25 and adjusting mainly the reduction of the aperture of the camera 26 when the luminance is excessive. More specifically, the luminance information of the image output on the monitor 17 is acquired to determine whether the luminance is excessive or insufficient. When the luminance is insufficient, the acceleration voltage of the X-ray image tube 25 increases, the aperture of the camera 26 opens. And the function of adjusting in the order of decreasing the aperture of the camera 26 and decreasing the acceleration voltage of the X-ray image tube 25 when the luminance is excessive.

  Next, a design support method for the X-ray inspection apparatus 11 will be described.

  The X-ray inspection apparatus 11 is necessary depending on, for example, when performing a medical inspection on the inspection object 12 such as a human or when performing a nondestructive inspection on the inspection object 12 such as an object. The required performance and the reliability required for implementation are different. Therefore, an evaluator who is a design supporter of the X-ray inspection apparatus 11 first has a plurality of functional components, that is, a plurality of cameras 26 in this embodiment, based on the performance required for the use of the X-ray inspection apparatus 11. Set the specifications required for the function. Specifically, in the case of the camera 26, for example, imaging capability, that is, functions such as the number of effective pixels and resolution, and static characteristics, such as spatial frequency, sensitivity characteristics, S / N ratio, dynamic range, and image quality, that is, surface quality. Each function requires a predetermined specification. Furthermore, when the X-ray inspection apparatus 11 is used for medical purposes, requirements such as various laws and regulations must be satisfied, so these laws and regulations are also set as functions.

  Next, the evaluator summarizes the set functions for each item and creates a list L (FIG. 2). At this time, the evaluator summarizes the evaluation conditions (evaluation method) of each function, the judgment standard value, the basis of the evaluation, the examination contents at the time of design, and the like for each function, and writes them in the above list L. For example, with regard to surface quality, with the recent digitization, the variation in pixel values within the screen is specified, or the maximum and minimum variations with respect to the average value are specified, and the design specifications and evaluation conditions, or judgment standard values And so on in the list L.

  Then, the created list L is presented to a designer (developer) such as a manufacturer as paper or electronic data.

  As a result, the evaluator side and the designer side share the necessary functions (important functions) and the criteria such as the evaluation conditions, so that a platform can be realized. Therefore, traffic between the evaluator side and the designer side is suppressed, development lead time can be shortened, design delivery time can be shortened and costs can be reduced, and design and product quality can be improved (stable) And an X-ray inspection apparatus 11 corresponding to various needs can be provided.

  In addition, since requirements such as market reliability and various laws and regulations are shared by the evaluator side and the designer side by the list L, omission of conformity to these requirements can be eliminated.

  In particular, since the evaluator side and the designer (camera manufacturer) side share the necessary functions (important functions) and the evaluation conditions for the camera 26, the design left to the camera manufacturer's know-how can be suppressed. Therefore, it is possible to design a camera 26 that meets the market needs and is suitable for the use conditions of the X-ray inspection apparatus 11. Therefore, it is not necessary to adjust the difference between the specifications of the camera 26 and the market needs on the X-ray inspection apparatus 11 side, and the quality can be further improved.

  In the above embodiment, a camera control unit may be interposed between the personal computer 16 and the camera 26, and various control signals may be output from the camera control unit to the camera 26.

  In addition to the camera 26, for example, design support may be provided for any functional component such as the high-voltage power supply 28 of the X-ray image tube 25, or design support may be provided for a plurality of different functional components. Also good.

  Further, for example, a computer such as a personal computer having functions of setting means and list creating means is used, and various functions of functional parts of the X-ray inspection apparatus are stored in this computer in advance as a database. The specification of each function of the functional parts required by inputting the items of functions required for the X-ray inspection apparatus is set by the computer, and a list including at least these functions, the specifications of these functions and their evaluation conditions is set by the computer. A design support system to be created may be constructed.

  Although one embodiment of the present invention has been described, this embodiment is presented as an example and is not intended to limit the scope of the invention. The novel embodiment can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the scope of the invention. This embodiment and its modifications are included in the scope and gist of the invention, and are included in the invention described in the claims and the equivalents thereof.

11 X-ray inspection equipment as a radiation inspection equipment
26 Cameras that are camera means as functional parts L List

Claims (4)

A design support method for a radiation inspection apparatus that supports the design of a radiation inspection apparatus with functional parts,
Each of the specifications required for a plurality of functions of the functional component based on the required performance of the radiation inspection apparatus,
A design support method for a radiation examination apparatus, characterized in that a list including at least each function of the functional parts, specifications required for them and evaluation conditions for each of these specifications is created and presented to a designer. 2. The design support method for a radiation inspection apparatus according to claim 1, wherein the functional component is a camera unit that detects an image corresponding to a radiation image of the inspection object. A design support system for a radiation inspection apparatus that supports the design of a radiation inspection apparatus with functional parts,
Setting means for setting specifications required for a plurality of functions of the functional component based on required performance of the radiation inspection apparatus;
A radiographic examination comprising: a list creating means for creating a list to be presented to a designer including at least each function of the functional parts, specifications required for them, and evaluation conditions for each of these specifications. Equipment design support system. 4. The design support system for a radiation inspection apparatus according to claim 3, wherein the functional component is camera means for detecting an image corresponding to a radiation image of the inspection object.

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