JP2014016243A - System and method for diagnosis of spectral photometer - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a system capable of easily determining deterioration of a spectral photometer.SOLUTION: This system comprises: a spectral photometer for measuring spectral reflectance of a surface of a measured object; and a computer connected with the spectral photometer. The computer is made to function as: target measurement data importing means for importing all light emitting targets reference measurement data, individual light emitting target reference measurement data, all light emitting targets measurement data which is measured after measurement of the reference data and individual light emitting target measurement data which is measured after measurement of the reference data from an output of the spectral photometer and storing the data in a target measurement data storage section; target measurement data selection means for selecting target measurement data stored in the target measurement data storage section; and data comparison determination means for comparing the target measurement data selected by the target measurement data selection means to determine a comparison state.

Description

  The present invention is a spectrophotometer diagnostic system for detecting and alerting to spectrophotometer abnormalities such as degradation of a light source of a spectrophotometer, failure and inclination of a white reference target to measure the spectral reflectance of the surface of the object to be measured. And a diagnostic method.

In a spectrocolorimeter, the degradation condition of the light receiving element is accurately grasped using a simple method, and an approximate expression is determined by a simple method, so that a correction to a known value can always be made. A colorimeter is conventionally known (for example, see Patent Document 1).
A spectrophotometer including a plurality of LEDs arranged in a circular array is conventionally known (see, for example, Patent Document 2).

JP 2004-157062 A Special table 2010-523984 gazette

In a spectrophotometer that simultaneously emits multiple light sources such as LEDs and uses it as a white light source, a system that easily detects and warns of LED degradation, failure, white reference target tilt, etc. And the spectrophotometer's provision management side.
It is an object of the present invention to provide a spectrophotometer abnormality detection support diagnosis system and method that are convenient for the user and the management side.

In order to achieve the above object, the present invention allows a plurality of light source units to emit light simultaneously, applies this as a white light source to the surface of the object to be measured, and guides the reflected light reflected from the surface to the light receiving unit. A spectrophotometer diagnostic system that supports and warns of the abnormality detection of a spectrophotometer comprising a spectrophotometer for measuring the spectral reflectance of a surface and a computer connected to the spectrophotometer, the computer comprising:
Target measurement data for use as reference data, all light emission target reference measurement data when all of the plurality of light source parts emit light, and target measurement data for use as reference data, each individual light source part being used alone Individual emission target reference measurement data when emitting light, all emission target measurement data measured after the reference measurement data measurement or after update, and individual emission target measurement data measured after or after the reference measurement data measurement Target measurement data capturing means for capturing from the output of the spectrophotometer and storing it in the target measurement data storage unit;
Target measurement data selection means for selecting measurement data stored in the target measurement data storage unit;
The reference measurement data selected by the target measurement data selection means and the measurement data are compared to function as data comparison judgment means for judging the comparison state.
Further, in the present invention, the data comparison judgment means compares the total light emission target reference measurement data with the measured total light emission target measurement data, and the value of the total light emission target measurement data measured with respect to the total light emission reference target measurement data is If it is smaller, it is judged that the target is forgotten to be attached or that the light source is in a deteriorated state.
Further, in the present invention, the data comparison / determination means compares the total light emission target reference measurement data with the measured total light emission target measurement data, and a part of the total light emission target measurement data measured with respect to the total light emission target reference measurement data. When the value of is small, it is determined that one of the light sources is in a deteriorated or failed state.
According to the present invention, the data comparison / determination unit compares the individual light emission target reference measurement data with the measured individual light emission target measurement data corresponding to the individual light emission target reference measurement data, and performs the measurement corresponding to the individual light emission target reference measurement data. When the value of the individual light emission target measurement data is small, it is determined that the individual light source is in a deteriorated or failed state.
Further, the present invention is characterized in that the data comparison judgment means compares the individual light emission target reference measurement data with the measured individual light emission target measurement data corresponding to these, and judges the state in which the target is tilted. To do.
Further, the present invention is characterized in that the computer is further functioned as monitoring means for monitoring a change from the initial state of the target measurement data.
Further, the present invention is characterized in that the data monitored by the monitoring means is displayed as a graph on the display unit by the display means.
In the invention, it is preferable that the plurality of light source units include at least three light source units, and the light source units have predetermined spectral bandwidths having different center wavelengths.
According to the present invention, the target reference measurement data is data created at the time of shipment of a spectrophotometer.
According to the present invention, the plurality of light source units are light emitting diodes.
Further, the present invention is characterized in that the computer is built in the spectrophotometer or directly connected to the spectrophotometer via an input / output interface.
The present invention is also characterized in that the computer is a server connected to the spectrophotometer through a network.
The present invention is characterized in that a plurality of spectrophotometers are connected to the server.
The present invention also allows a plurality of light source parts to emit light simultaneously, applies the light as a white light source to the surface of the object to be measured, guides the reflected light reflected from the surface to the light receiving part, and reflects the spectral reflectance of the surface of the object to be measured. A method for diagnosing a spectrophotometer that measures target emission data to be used as reference data by a computer and emits light from all of a plurality of light sources, and as reference data Target measurement data to be used, and individual light emission target reference measurement data when each light source emits light alone, all light emission target measurement data measured after the reference data measurement or after update, and after the reference data measurement Alternatively, the individual emission target measurement data measured after the update is imported from the output of the spectrophotometer, and the acquired data is the target. Select the measurement data stored in the target measurement data storage unit, compare the selected target reference measurement data with the target measurement data, and check the spectrophotometer for abnormalities depending on the comparison status. Judgment is made.

  The present invention can easily detect and warn of an abnormality of a spectrophotometer including a plurality of light source units.

It is a flowchart which shows operation | movement of this system. It is sectional explanatory drawing of the spectrophotometer concerning this invention. It is a top view of a lens. It is bottom face explanatory drawing of the circuit board of a spectrophotometer. 1 is an overall block diagram of a system according to the present invention. It is a graph which shows the measurement data of a spectrophotometer. It is a graph which shows the measurement data of a spectrophotometer. It is a block explanatory view of the present invention.

Hereinafter, the configuration of the present invention will be described in detail with reference to the accompanying drawings.
FIG. 2 is an explanatory diagram of the internal structure of the spectrophotometer 2 in which the spectrophotometer according to the present invention is used for a colorimeter. The circuit board 14 on which the CPU 4, the memory 6, the input / output interface 8, the light source unit driver 10, and the light receiving unit driver 12 are formed is provided with light source units 16a, 16b, 16c, 16d, 16e, 16f made of light emitting diodes (LEDs). , 16g, and 16h are arranged at equal intervals on the circumference as shown in FIG.

A plurality of light source sections 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h are provided in the present embodiment, and are respectively disposed in the cover 18 so as to protrude downward toward the object 20 to be measured. , Respectively, are connected to the corresponding driver 10 of the circuit board 14. A condensing lens 22 having a cavity 22a formed at the center is disposed below the light source sections 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h. The lens 22 is disposed on the circuit board 14. It is held on the outer periphery of the attached cylindrical light shielding partition 24. The lower ends of the light source units 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h are in contact with the lens 22. The light source unit and the lens 22 may be arranged to face each other with an appropriate distance.
In this embodiment, the lens 22 is a Fresnel lens.

A light-shielding partition 24 for shielding light from the light sources 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h is positioned on the optical path of the light reflected from the object 20 to be measured. A geometry converter 28 with 26 is arranged. In addition, a light receiving portion including a spectrum sensor 30 is disposed inside the light shielding partition 24, and the light receiving portion is electrically connected to the receiving circuit 12 of the circuit board 14 as shown in FIG. The spectrum sensor 30 is attached to the circuit board 14, and the geometry converter 28 is held by the light shielding partition 24. The geometry converter 28 and the spectrum sensor 30 are configured not to be affected by the light from the light source unit by the light shielding partition 24.

The geometry converter 28 is designed so as to direct and converge the light that has entered the cover 18 and constitutes a reflected light path geometric shape conversion unit. The light that has passed through the geometry converter 28 becomes a thin line that matches the surface area of the spectrum sensor 30. The spectrum sensor 30 serves as a “digital prism” that converts multicolored or “white” light into the spectrum that composes it, the spectrum having a visible spectrum (VIS) of wavelengths between 350 nm and 750 nm. Included are white light, near infrared (NIR) light at wavelengths between 750 nm and 1500 nm, far infrared light (IR) above 1500 nm wavelengths, and ultraviolet (UV) light below 350 nm wavelengths.

The assembly constituting the spectrum sensor 30 incorporates the following three major sub-components. One is an array of photosensitive photodiodes 34 that coincide with the wavelength region of interest, with a linear array, or rows of photodetector sites forming major axes and columns forming minor axes. It consists of a plurality of photodetector sites arranged in a substantially rectangular group. In addition to the photodiode 34, a phototransistor or other similar photodetection circuit may be used.

The second is applied so that the thickness of the synthetic interference coating layer varies from edge to edge and a wedge-like shape is formed on a submicron scale along the long axis of the photodetector array. The etalon 36 is formed of a large number of bandpass filter coating layers. In the etalon 36, since the center wavelength of each passband is a function of the coating thickness, the peak wavelength transmitted through a given point of the filter varies substantially linearly in the direction of the filter coating wedge, i.e., the long axis of the sensor.

The third is an array of optically clear plastic or glass optical fiber elements with a diameter of 5 microns to 100 microns, the same center-to-center spacing, and a low numerical aperture. A similar monolithic plate of light-absorbing material, such as an EMA type material, provided in combination with an absorptive (EMA) material, having a diameter of 5 to 100 microns and the same center-to-center spacing A collimating faceplate 38 comprising a plate in which an array of holes or capillaries is etched, drilled, or otherwise cut into the light absorbing plate.

In the collimating faceplate 38, whether it is an optical fiber or capillary array design, the purpose of the faceplate 38 is to collimate the light incident on the interference filter coating so that the incident angle is greater than 20 degrees relative to the coated surface. A series of cones that reject light and have a half-width of 20 degrees or less overlap so that the overlap area is sufficient to provide a generally uniform illumination level over the entire area of the coating layer that is superimposed on the array of photodetectors. It is to appear in the form. The pulse output of the driver 10 that drives the light sources 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h is configured to be controlled by a pulse width modulation circuit.

  In the configuration described above, the light from the light source parts 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h passes through the lens 22, where it is condensed in the direction of arrow A and exits the opening of the cover 18. Then, it hits the surface of the object 20 to be measured. The reflected light that hits the surface of the object to be measured 20 and is generated in the direction of the arrow B passes through the geometry converter 28, where the reflected light is focused and enters the spectrum sensor 30 to enter the surface of the object to be measured 20. Are detected.

FIG. 5 is a block diagram showing the overall configuration of the system according to the present invention.
A computer comprising a CPU 4 and a memory 6 incorporated in the circuit board 14 of the spectrophotometer 2 main body comprising a spectrophotometer can be connected to a network to which a computer 40 such as an external server is connected via an input / output interface 8. It is configured. A spectrophotometer abnormality determination program 44 is stored in the memory 42 of the external computer 40. In the spectrophotometer 2, when performing colorimetry, a white reference (white standard) is corrected using a white reference target provided in the apparatus to determine a reference level. Specifically, when a white reference target is prepared and measured when necessary, or in a device that automatically reads with a printer, the spectrophotometer 2 is attached to the head, and a predetermined place in the device In some cases, there is a place to read the target for white reference and to go there for reading. In that case, there are a case where the white reference target provided is read as it is, and a case where it is read after being attached to the target when necessary. At this time, the following problems can be considered.

(1) Contamination of white reference target (2) Forgetting to install white reference target (3) Light source part dimming (4) Light source part failure (5) Light receiving part failure (6) Failure or attachment error of each part The spectrophotometer abnormality determination program supports the confirmation of whether these are normal, thereby enabling stable and accurate measurement.

As shown in FIG. 8, the spectrophotometer abnormality determination program 44 stored in the memory 42 of the computer 40 is stored in the target measurement data storage unit 48 by the target measurement data fetching means 46 as reference data at the time of product shipment. Target reference measurement data value when the light source is emitted, and target reference measurement data when each of the light source units 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h is independently emitted at a predetermined set value. Is stored as initial reference data.

In the subsequent measurement of the white reference target (hereinafter referred to as the target) during normal times, the target measurement data is checked when the entire light source emits light and when each individual light source unit emits light alone with a predetermined set value. It is stored in the target measurement data storage unit 48 for use. Here, the predetermined set value is a normal value when light is emitted with 100% light source driving power set in the driver.
Note that the term “light emission” as used herein refers to light emission of everything necessary for measurement, and since this case actually uses only 7 of 8 LEDs, 1 is used. Although it is not done, the whole in this case is the seven things used.

In the normal measurement of the white reference target, when a plurality of light sources are provided, all the light sources necessary for the measurement are emitted. As a result, the level of the reflected light from the target is measured. The graph value of the measurement data is stored so that the correlation between the wavelength and the luminous intensity can be understood, and the data comparison / determination means 51 stores in advance in the memory 6 of the spectrophotometer 2. By comparing the recorded measurement data of the target with the reference level data, (2) forgetting to attach the white reference target can be detected in many cases. In this comparison, if you forget to set the target, all the values will be extremely low, so the data is compared and the size is compared and judged in the device, and the display means that the target is forgotten. In order to make it easy to see and understand visually, the graph creation means 53 is provided with a function of converting the reference data and the measured data into a graph, and the graph of the measurement data is converted into a graph. This is performed by displaying on the display unit of the computer 40 by the display means 50.

However, since the reflection level from the target recorded in advance is that of the jig at the time of shipment from the factory, it may be different from the target attached to the printer main body. This does not pose a problem because it is within a certain range, but it is desirable to store target data attached to the printer body. Therefore, the spectrophotometer abnormality determination program of the computer 40 on the network allows the monitor unit 52 to monitor the change from the initial state by storing the measured target data in the target measurement data storage unit 48 while allowing the printer body to be specified. Monitor. The operator can detect the contamination of the target by observing the graph of the measured data of the target displayed on the display unit, and can warn the user of the contamination of the target provided in the printer body. It becomes.

In addition, if the physical dimensions of the entire system, such as the distance from the target when the spectrophotometer is attached to the printer body, change due to impact, etc. after delivery, this is also regarded as a change in the reflection level of the spectrophotometer. Since this is possible, a warning can be given to the user. As a specific method for detecting an abnormality in a spectrophotometer, there are a method of lighting all of a plurality of light sources, and a method of lighting individual or plural light sources with a predetermined set value. When all the light sources are turned on, there is a possibility that a decrease in the light amount of a specific light source cannot be detected due to an optical problem or the like.

For this reason, by storing the data measured by individually lighting the spectrophotometer 2 in the target measurement data storage unit 48 while allowing the spectrophotometer 2 to be specified, it is possible to detect a change in the amount of light due to a change with time. Further, by causing the light to emit in this way, it is possible to detect a failure of the system including the light source unit, the reference target, and the light receiving unit. In particular, when the target is contaminated with a specific color, only the reflected light in a certain wavelength range is attenuated. In such a case, it is expected that detection is not possible if all the light sources emit light.

In such a case, the measurement data is measured individually, or a plurality of light is emitted and stored in the target measurement storage unit 48, and these data are selected by the target measurement data selection means 54 and displayed on the display unit. Detection can be facilitated. By comparing the display when the entire LED emits light and the comparison when each LED 1 to 8 (7 is not used) is selected and made to emit light, where is the problem? Easy to understand. When a plurality of light source units are arranged concentrically with respect to the light receiving unit 32 as a configuration of the light source, it is possible to detect the oblique mounting of the white reference target by causing the individual or plural light source units to emit light. This is because the distances from the plurality of light source units to the target are different, and the reflection levels from the respective light source units are relatively different, so that the inclination can be estimated.

In this case, detection can be easily performed by simultaneously emitting light sources arranged far away or light sources having different wavelengths. In particular, in the case of a light source part with a distant wavelength, there is no difference in level compared to the case of single light emission because there is no interference. For this reason, even if it makes it light-emit alone, it becomes possible to detect from the relative comparison of light quantity. For example, when the light source unit 16a and the light source unit 16e emit light individually and the data are compared, there is a possibility that the light source unit 16a is inclined when the value of the light source unit 16a is large and the value of the light source unit 16e is small. Since a failure of either LED is conceivable in one combination, the accuracy is improved by comparing and displaying using a combination of a plurality of LEDs.

The target measurement data fetching means 46 is connected to the target measurement data W.W. for all the light sources shown in FIG. 7 from the computer of the spectrophotometer 2 via the input / output interface 56 of the computer 40. Ref and the target measurement data LED1, LED2, LED3, LED4, LED5, LED6, LED8, and LED4 + 8 of the individual light source unit lighting shown in FIG. 6 are acquired and stored in the target measurement data storage unit 48. Further, initial target measurement data (not shown) at the time of product shipment is acquired and stored in the data storage unit 48.

In FIG. 6, LED1 to LED6 correspond to the light source units 16a, 16b, 16c, 16d, 16e, and 16f, and the LED 8 corresponds to the light source unit 16h. LEDs 4 + 8 are target measurement data when the light sources 16d and 16h emit light simultaneously. In the present embodiment, the light source unit 16g is not used among the eight light source units. Further, the same light source units 16d and 16h are used. The wavelength of each light source part is as follows.

Light source unit 16a: 490 nm
Light source unit 16b: 405 nm
Light source unit 16c: 670 nm
Light sources 16d and 16h: White
Light source unit 16e: Pink
Light source unit 16f: 415 nm
Light source unit 16g: The unused light source units 16d, 16h, and 16e have a plurality of peaks. In this case, the light source unit is expressed by color instead of wavelength.

In the above embodiment, the light source includes a plurality of LEDs arranged in an array, and each LED is individually energized in an adjustable manner by a pulse width modulation signal in order to change the output intensity of the LED. It is configured.
Each LED also has a predetermined spectral bandwidth with a different center wavelength, and the spectral bandwidths of all LEDs produce white light when combined. This white light is used to illuminate the object to be measured for the purpose of color measurement. A spectrophotometer that uses various LEDs as a light source, the state of fluorescence in other materials such as printing media and colorants, by making at least one of the light source LEDs emit ultraviolet radiation. Can be used to inspect.
Also, a plurality of LEDs having different wavelength ranges are individually selected, and can be used for analysis according to the purpose of measurement if they are combined in different wavelength ranges.

The target measurement data by individual lighting shown in FIG. 6 is displayed on the display unit by the display means 50 as a waveform graph.
FIG. 7 is a simulation graph for finding the failure state of the light source unit 16a. This graph shows a normal graph when the LED 1 is defective (failure or decay) and is fully lit in that state. This is what is displayed on the display unit in what state the graph will be compared to Ref.

W. Ref is a target measurement waveform of the light source fully lit as a reference stored in the target measurement data storage unit 48, LED1Half is a target measurement waveform of the light source fully lit when the light intensity of the LED1 is half, and LED1 little bit is The target measurement waveform when the light source is fully turned on when the light intensity of the LED 1 is reduced by about 10%, and W / OLED1 is the target measurement waveform when the LED 1 is turned off and the light source is fully turned on. The horizontal axis in FIGS. 6 to 7 indicates the wavelength by the number of the photodiode array, where the wavelength should be expressed as unit nm.

The numerical value on the vertical axis is a value obtained by A / D converting the detection output of the spectrum sensor, indicates the intensity of reflected light, and is shown as a relative value.
The target contamination is determined by monitoring the target reference measurement data in the initial state and the target measurement data of the measured target with the monitor unit 50, and then changing the measurement data of the target from the initial state displayed by the display unit 50 to the operator. Determine the contamination of the target. The judgment of forgetting to attach the target is made when the operator displays the target when the waveform of the value of all light source lighting target measurement data displayed by the display means 50 is smaller than the waveform of the initial target reference measurement data or the updated target reference measurement data. Determine if you forgot to install. Also, if you forget to attach it, if you make the upper surface part where the white reference target is attached with a large amount of reflection like a mirror, if you forget to attach it, the amount of reflection will be too large and the reading sensor output will be It is possible to saturate, so it is possible to judge forgetting to install.

The light source unit dimming determination and the light source unit failure determination are smaller than the reference value stored first in the individual lighting of the light source units 16a, 16b, 16c, 16d, 16e, 16f, 16g, and 16h. In the case where the waveform after conversion into the graph is smaller than the reference value, it is determined whether the light source unit is dimmed or the light source unit is deteriorated or malfunctioned. In order to determine the failure of the light receiving part, in addition to the light receiving part that receives the reflected light, provide another light receiving part at the place where the reflected light enters, and store and compare the data of both light receiving parts to find one of the faults Is also possible.
The target inclination is determined by comparing the values of the plurality of light source unit lighting target measurement data. The determination of the failure of each part of the spectrophotometer 2 compares based on the value of the individual lighting target measurement data, and detects the failure of the system composed of the light source unit, the target, and the light receiving unit.

In this embodiment, the spectrophotometer abnormality determination program is stored in a specially prepared server on the network. However, the spectrophotometer abnormality determination program may be stored in a spectrophotometer computer. Moreover, it is good also as a structure which connects a some spectrophotometer to the server on a network, and a server performs abnormality discovery management of a some spectrophotometer.
If the output is somewhat reduced, it can be corrected so that it operates normally if each LED is adjusted and corrected according to the measurement data.

Next, the processing operation of this system will be described with reference to FIG.
The computer turns on all LEDs individually and individually (step 1), and stores the reference target measurement data in the data storage unit (step 2). On the other hand, when the product (spectrophotometer) is shipped or when the reference data is updated, the LEDs are all turned on and individually turned on (step 3), and the reference target measurement data is stored in the data storage unit for reference (step 4). . At this stage, the data is graphed (step 5) and displayed on the monitor (step 6). On the other hand, the computer proceeds to data comparison processing determination (step 7). In the data determination process, when the measured value of all lighting is smaller than the reference value of all lighting, forgetting to attach the target and determining the deterioration of the LED. In addition, when a part of the measured value of all lighting is smaller than the reference value of all lighting, it is determined whether some of the LEDs are deteriorated or failed. Moreover, when the corresponding measured value is small with respect to the reference value of individual lighting, the deterioration or failure of individual LEDs is determined. Further, when the measured value (one side) of the diagonal is smaller than the reference value for individual lighting, it is determined that the target is inclined (step 8).
The computer predicts a malfunction of the spectrophotometer from these determination data and displays it on the monitor (step 9). Next, the system user confirms and responds to the problem (processing step 10), and completes the spectrophotometer abnormality determination process.

2 Spectrophotometer 4 CPU
6 Memory 8 Input / output interface 10 Light source unit driver 12 Reception circuit 14 Circuit board 16a Light source unit 16b Light source unit 16c Light source unit 16d Light source unit 16e Light source unit 16f Light source unit 16g Light source unit 16h Light source unit 18 Cover 20 Device to be measured 22a Cavity 22 Lens 24 Holder 26 Filter 28 Geometry converter 30 Spectrum sensor 32 Light receiver 34 Photo diode 36 Etalon 38 Face plate 40 Computer 42 Memory 44 Spectrophotometer abnormality determination program 56 Input / output interface

Claims (14)

A spectrophotometer that simultaneously emits light from a plurality of light sources, applies the light as a white light source to the surface of the object to be measured, and guides the reflected light reflected from the surface to the light receiving part to measure the spectral reflectance of the surface of the object to be measured. A spectrophotometer diagnostic system for assisting and warning the detection of abnormality of a spectrophotometer comprising a meter and a computer connected to the spectrophotometer, the computer comprising:
Target measurement data for use as reference data, all light emission target reference measurement data when all of the plurality of light source parts emit light, and target measurement data for use as reference data, each individual light source part being used alone Individual emission target reference measurement data when emitting light, all emission target measurement data measured after the reference measurement data measurement or after update, and individual emission target measurement data measured after or after the reference measurement data measurement Target measurement data capturing means for capturing from the output of the spectrophotometer and storing it in the target measurement data storage unit;
Target measurement data selection means for selecting measurement data stored in the target measurement data storage unit;
A spectrophotometer diagnostic system, characterized by functioning as a data comparison / determination unit that compares the reference measurement data selected by the target measurement data selection unit and the measurement data to determine a comparison state. The data comparison judgment means compares the total light emission target reference measurement data with the measured total light emission target measurement data, and when the value of the total light emission target measurement data measured with respect to the total light emission reference target measurement data is small, 2. The spectrophotometer diagnosis system according to claim 1, wherein it is determined whether the light source has been forgotten or the light source is in a deteriorated state. The data comparison judgment means compares the total light emission target reference measurement data with the measured total light emission target measurement data, and the value of a part of the total light emission target measurement data measured with respect to the total light emission target reference measurement data is small 2. The spectrophotometer diagnosis system according to claim 1, wherein one of the light sources is determined to be in a deteriorated or failed state. The data comparison judgment means compares the individual light emission target reference measurement data with the measured individual light emission target measurement data corresponding thereto, and measures the individual light emission target reference measurement data and the corresponding individual light emission target measurement data corresponding thereto. 2. The spectrophotometer diagnosis system according to claim 1, wherein when the data value is small, it is determined that an individual light source is in a deteriorated or failed state. The said data comparison judgment means compares the individual light emission target reference | standard measurement data with the measured individual light emission target measurement data corresponding to these, and judged the state which the target inclined. The spectrophotometer diagnostic system described. The spectrophotometer diagnosis system according to claim 1, wherein the computer is further caused to function as a monitoring unit that monitors a change from an initial state of the target measurement data. 2. The spectrophotometer diagnosis system according to claim 1, wherein the data monitored by the monitor means is displayed as a graph on the display unit by the display means. The spectrophotometer according to claim 1, wherein the plurality of light source units include at least three light source units, and the light source units have predetermined spectral bandwidths having different center wavelengths. Total diagnostic system. The spectrophotometer diagnosis system according to claim 1, wherein the target reference measurement data is data created at the time of shipment of the spectrophotometer. The spectrophotometer diagnosis system according to claim 8, wherein the plurality of light source units are light emitting diodes. The spectrophotometer diagnosis system according to claim 1, wherein the computer is a computer built in the spectrophotometer or directly connected to the spectrophotometer via an input / output interface. The spectrophotometer diagnosis system according to claim 1, wherein the computer is a server connected to the spectrophotometer through a network. The spectrophotometer diagnosis system according to claim 8, wherein a plurality of spectrophotometers are connected to the server. A spectrophotometer that simultaneously emits light from a plurality of light sources, applies the light as a white light source to the surface of the object to be measured, and guides the reflected light reflected from the surface to the light receiving part to measure the spectral reflectance of the surface of the object to be measured. This is a diagnostic method for a meter, which is target measurement data to be used as reference data by a computer, and all light emission target reference measurement data when all of a plurality of light sources emit light, and target measurement to be used as reference data Data, individual emission target reference measurement data when each light source is lit alone, all emission target measurement data measured after the reference data measurement or update, and measurement after the reference data measurement or update Individual emission target measurement data is captured from the output of the spectrophotometer, and the captured data is converted into target measurement data. Save the data in the storage unit, select the measurement data stored in the target measurement data storage unit, compare the selected target reference measurement data with the target measurement data, and judge the spectrophotometer abnormality according to the comparison state Spectrophotometer diagnostic method.

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