JP2013245981A - Fourier transform spectrometer, fourier transform spectroscopy and attachment for fourier transform spectrometer - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a new wavelength calibration technique, more specifically, a Fourier transform spectroscopic technique capable of performing wavelength calibration with higher accuracy.SOLUTION: A Fourier transform spectrometer of the present invention performs wavelength calibration using emission line spectrum, however, center burst position is not easily detected by using only the emission line spectrum. In order to obtain an emission line spectrum, a first spectrum is obtained with respect to emission line light having an emission line spectrum including one or more emission lines and bias light having a continuous spectrum, and a second spectrum with respect to only the bias light is obtained. Then, a difference between the first spectrum and the second spectrum is obtained to thereby obtain the emission line spectrum of the emission line light. The wavelength calibration is performed based on emission line peaks included in the emission line spectrum thus obtained.

Description

  The present invention relates to a Fourier transform spectrometer and a Fourier transform spectroscopic method, and more particularly, to a Fourier transform spectrometer and a Fourier transform spectroscopic method capable of performing wavelength calibration by using an emission line spectrum. And this invention relates to the attachment for Fourier-transform type spectrometers used suitably for this Fourier-transform type spectrometer.

  A spectrometer is a device that measures a spectrum that represents a component (light intensity) of each wavelength (each wave number) in light to be measured, one of which is measuring the interference light of the light to be measured with an interferometer, There is a Fourier transform spectrometer that obtains the spectrum of light to be measured by Fourier transforming the measurement result.

  In this Fourier transform spectrometer, the output of the interferometer is a composite waveform in which light of a plurality of wavelengths included in the light to be measured is interfered at once by the interferometer, and is called an interferogram. The spectrum of the light to be measured is obtained by Fourier transforming the interferogram. This interferogram has a profile that has one or a plurality of steep peaks in a predetermined range and a substantially zero level in the remaining range, and the center peak of the one or more steep peaks has a center burst. Called.

  In a Fourier transform spectrometer, when the spectrum of the light to be measured is obtained by Fourier transforming the interferogram obtained in one measurement, the signal-to-noise ratio is usually poor and results with good accuracy can be obtained. hard. For this reason, in a Fourier transform spectrometer, an interferogram is measured a plurality of times for one measurement object, and the plurality of interferograms are integrated to obtain a spectrum of light to be measured. An interferogram (hereinafter referred to as “integrated interferogram”) is generated. These measurements are usually performed while continuously changing the optical path length of one of the two optical paths of the interferometer.

  In such a spectrometer, which data in the Fourier transform result of the interferogram or the accumulated interferogram represents the data of which wavelength value (for example, the data of the spectrum having a wavelength of 1000 nm is the data of the interferogram or the accumulated interferogram). (Which data in the Fourier transform result) needs to be wavelength calibration, that is, wavelength calibration that associates each data in the Fourier transform result of the interferogram or integrated interferogram with each actual wavelength value. The value of the horizontal axis (wavelength axis) in the Fourier transform spectrometer can be set by. This wavelength calibration is performed, for example, by measuring a standard sample having a known physical property of the wavelength with a spectrometer and comparing the measurement result with the known wavelength.

  For example, wavelength calibration is performed by measuring reference light having a known wavelength with a spectrometer and comparing the measurement result with the known wavelength. Such a technique relating to wavelength calibration is disclosed, for example, in Patent Document 1, in which the reference light for wavelength calibration is an yttrium aluminum garnet doped with neodymium that absorbs at the primary spectral peak. It is generated by combining a (Nd: YAG) crystal filter and a Fabry-Perot etalon filter to narrow the band.

  For example, wavelength calibration is performed by measuring a standard sample with a known absorption peak wavelength with a spectrometer and comparing the measurement result with the known absorption peak wavelength. Such a wavelength calibration technique is disclosed in, for example, Patent Document 2. In this Patent Document 2, there are two distinctions in a standardized liquid composed of water and propanol (3.83 w / w%). Absorption peaks are used.

Japanese Patent No. 3547771 Japanese Patent No. 3694029

  Incidentally, although the reference light disclosed in Patent Document 1 has a narrow band, it has a certain half-value width, and therefore the accuracy of wavelength calibration depends on the size of the half-value width. Therefore, it is limited by the size of the half width. Moreover, in the said patent document 2, the absorption peak of the said standardization liquid is a broad peak shape, and its half value width is comparatively wide. For this reason, it is difficult to perform wavelength calibration with high accuracy by the techniques disclosed in Patent Document 1 and Patent Document 2.

  The present invention has been made in view of the above circumstances, and its purpose is to propose a new wavelength calibration technique, and a Fourier transform spectrometer capable of performing wavelength calibration with higher accuracy and An object of the present invention is to provide a Fourier transform type spectroscopic method and an attachment for a Fourier transform type spectrometer suitably used for the Fourier transform type spectrometer.

  As a result of various studies, the present inventor has found that the above object is achieved by the present invention described below. That is, a Fourier transform spectrometer according to an aspect of the present invention includes a plurality of optical elements that receive predetermined light and form two optical paths between an incident position of the predetermined light and an interference position. The plurality of optical elements include an interferometer including an optical path difference forming optical element that generates an optical path difference between the two optical paths by moving in the optical axis direction, and the predetermined light generated by the interferometer. An interferogram calculation unit for obtaining an integrated interferogram by integrating a plurality of interferograms, and a Fourier transform result obtained by performing a Fourier transform on the integrated interferogram obtained by the interferogram calculation unit and the actual result A wavelength calibration unit that performs wavelength calibration for associating the wavelength value with the wavelength value, and based on a wavelength calibration result by the wavelength calibration unit, A spectrum calculation unit that obtains a spectrum by Fourier transforming the integrated interferogram obtained by the ferrogram calculation unit, wherein the wavelength calibration unit has a bright line light having a bright line spectrum including one or a plurality of bright lines and a continuous spectrum A first spectrum obtained by the spectrum calculation unit by making the bias light having the predetermined light incident on the interferometer, and the spectrum calculation unit by making the bias light incident on the interferometer as the predetermined light. The emission line spectrum of the emission line light is obtained by obtaining a difference from the second spectrum obtained in step 1, and the wavelength calibration is performed based on the emission line peak included in the obtained emission line spectrum.

  The Fourier transform type spectroscopic method according to another aspect of the present invention includes a plurality of optical elements that form two optical paths of predetermined light between an incident position of the predetermined light and an interference position, The plurality of optical elements are generated by the interferometer, an incident step of entering an interferometer including an optical path difference forming optical element that generates an optical path difference between the two optical paths by moving in the optical axis direction, and the interferometer. The interferogram calculating step for obtaining an integrated interferogram by integrating a plurality of interferograms of the predetermined light, and the integrated interferogram obtained by the interferogram calculating step was obtained by Fourier transform A wavelength calibration process for performing wavelength calibration for associating a Fourier transform result with an actual wavelength value, and wavelength calibration results by the wavelength calibration process. And a spectrum calculating step for obtaining a spectrum of the predetermined light by Fourier transforming the integrated interferogram obtained by the interferogram calculating step, wherein the wavelength calibration step includes one or a plurality of bright lines. A first spectrum calculation sub-step for obtaining a first spectrum in the spectrum calculation step by causing a bright-line light having a bright-line spectrum and a bias light having a continuous spectrum to be incident on the interferometer as the predetermined light; and A second spectrum calculation sub-step for obtaining a second spectrum in the spectrum calculation step by entering the interferometer as predetermined light, and the bright line by obtaining a difference between the obtained first spectrum and the second spectrum. Obtain the emission line spectrum of light A bright line spectrum calculating substep, characterized in that it comprises a wavelength calibration substep of performing the wavelength calibration based on the bright line peak included in the bright line spectrum thus determined.

  Since the Fourier transform spectrometer and the Fourier transform spectroscopic method having such a configuration use bright lines as reference light for performing wavelength calibration, wavelength calibration can be performed with higher accuracy than before. The Fourier transform spectrometer having such a configuration can be applied to the optical path difference forming optical element of the interferometer even when a reciprocating vibration type moving mirror that reciprocally vibrates a reflecting mirror in the optical axis direction is used. Since the center burst position can be detected, the integrated interferogram can be appropriately obtained, and therefore wavelength calibration using the bright line is possible.

  In another aspect, the Fourier transform spectrometer described above is a reflection type that obtains a spectrum of reflected light reflected by the sample to be measured, and has a continuous spectrum for irradiating the sample to be measured. A measurement light source unit that emits measurement light is further provided, and the measurement light is also used as the bias light.

  The Fourier transform type spectrometer having such a configuration can be miniaturized because the measurement light source unit is also used as a light source that emits measurement light and bias light, and does not require a separate bias light source unit that emits bias light. And cost reduction.

  Further, in another aspect, the above-described Fourier transform spectrometer further includes an attachment for a Fourier transform spectrometer that is used by being arranged on a sample stage in which an incident aperture for allowing the predetermined light to enter is used, The Fourier transform spectrometer attachment includes an emission line light source that emits emission line light having an emission line spectrum including one or a plurality of emission lines, and a housing that houses the emission line light source. An irradiation opening for irradiating the bright line light emitted from the light source to the outside, and a reflection area formed on the surface of the area adjacent to the irradiation opening and reflecting the light in the wavelength band included in the bias light It is characterized by that.

  An attachment for a Fourier transform spectrometer according to another aspect is disposed on a sample stage in which an incident aperture for allowing the predetermined light is incident in the Fourier transform spectrometer described above, whereby the Fourier transform is performed. An attachment for a Fourier transform spectrometer used in combination with a type spectrometer, an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines, and a housing that houses the emission line light source The casing is formed on the surface of an irradiation opening for irradiating the bright line light emitted from the bright line light source to the outside, and in a region adjacent to the irradiation opening, and the wavelength band included in the bias light And a reflective region that reflects the light of the light.

  In the Fourier transform spectrometer and the attachment for a Fourier transform spectrometer having such a configuration, since the irradiation opening and the reflection area are arranged adjacent to each other, the irradiation opening and the reflection area are simultaneously the An attachment for a Fourier transform spectrometer can be attached to the Fourier transform spectrometer so as to face the entrance aperture. For this reason, the Fourier transform spectrometer and the attachment for a Fourier transform spectrometer having such a configuration cause the measurement light emitted from the measurement light source of the Fourier transform spectrometer to enter the interferometer as bias light. In addition, the bright line light emitted from the bright line light source can be incident on the interferometer. Then, the Fourier transform spectrometer and the Fourier transform spectrometer attachment having such a configuration are adjusted by adjusting the attachment position of the Fourier transform spectrometer attachment, and the opening area of the irradiation opening facing the incident opening The ratio of the reflection area of the reflection region facing the incident aperture can be adjusted, and the amount of bright line light incident on the interferometer from the incident aperture and the bias light incident on the interferometer from the incident aperture The ratio with the amount of light can be adjusted. For this reason, the Fourier transform spectrometer and the attachment for a Fourier transform spectrometer having such a configuration provide an interferogram that can detect the bright line while detecting the center burst position even when the bias light is superimposed on the bright line light. Can be obtained.

  Further, in another aspect, the above-described Fourier transform spectrometer further includes an attachment for a Fourier transform spectrometer that is used by being arranged on a sample stage in which an incident aperture for allowing the predetermined light to enter is used, An attachment for a Fourier transform spectrometer contains an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines, and the emission line light source. The emission line light emitted from the emission line light source is externally transmitted. A reflective member comprising a housing formed with an irradiation opening for irradiating to the light source, a through opening, and a reflection region formed on the surface of a region adjacent to the through opening and reflecting light in a wavelength band included in the bias light It is characterized by providing.

  An attachment for a Fourier transform spectrometer according to another aspect is disposed on a sample stage in which an incident aperture for allowing the predetermined light is incident in the Fourier transform spectrometer described above, whereby the Fourier transform is performed. An attachment for a Fourier transform spectrometer used in combination with a type spectrometer, an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines, the emission line light source, and the emission line Light having a wavelength band included in the bias light that is formed on the surface of the casing that has an irradiation opening for irradiating the emission line light emitted from the light source to the outside, the through opening, and the region adjacent to the through opening And a reflection member including a reflection region that reflects the light.

  In the Fourier transform spectrometer and the Fourier transform spectrometer attachment having such a configuration, since the through opening and the reflection region are disposed adjacent to each other, the through opening and the reflection region are simultaneously provided with the through opening and the reflection region. An attachment for a Fourier transform spectrometer can be attached to the Fourier transform spectrometer so as to face the entrance aperture. For this reason, the Fourier transform spectrometer and the attachment for a Fourier transform spectrometer having such a configuration measure the Fourier transform spectrometer by causing the bright line light emitted through the irradiation aperture to enter the through aperture. The measurement light emitted from the light source unit can be made incident on the interferometer as bias light, and the bright line light emitted from the bright line light source can be made incident on the interferometer. The Fourier transform spectrometer and the Fourier transform spectrometer attachment having such a configuration adjust the mounting position of the reflecting member in the Fourier transform spectrometer attachment so that the through opening facing the incident opening is adjusted. The ratio between the aperture area and the reflection area of the reflection area facing the incident aperture can be adjusted, and the amount of bright line light incident on the interferometer from the incident aperture and incident on the interferometer from the incident aperture. The ratio of the amount of bias light to be adjusted can be adjusted. For this reason, the Fourier transform spectrometer and the attachment for a Fourier transform spectrometer having such a configuration provide an interferogram that can detect the bright line while detecting the center burst position even when the bias light is superimposed on the bright line light. Can be obtained.

  Further, in another aspect, the above-described Fourier transform spectrometer further includes an attachment for a Fourier transform spectrometer that is used by being arranged on a sample stage in which an incident aperture for allowing the predetermined light to enter is used, An attachment for a Fourier transform type spectrometer includes: an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines; a bias light source that emits bias light having a continuous spectrum; and the emission line light source and bias And a housing having an irradiation opening for irradiating the bright line light emitted from the bright line light source and the bias light emitted from the bias light source to the outside.

  An attachment for a Fourier transform spectrometer according to another aspect is disposed on a sample stage in which an incident aperture for allowing the predetermined light is incident in the Fourier transform spectrometer described above, whereby the Fourier transform is performed. Attachment for a Fourier transform spectrometer used in combination with a scanning spectrometer, an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines, and a bias that emits bias light having a continuous spectrum A housing that contains an optical light source, an emission line light source and a bias light source, and an irradiation opening for irradiating the external emission of the bright line light emitted from the bright line light source and the bias light emitted from the bias light source And a body.

  The Fourier transform spectrometer and the attachment for the Fourier transform spectrometer having such a configuration can provide an emission line light source and a bias light source by being externally attached. Therefore, even when the Fourier transform spectrometer does not include a measurement light source, wavelength calibration can be performed. On the other hand, when the Fourier transform spectrometer includes a measurement light source, A suitable light having a continuous spectrum different from the continuous spectrum of the measurement light can be used as the bias light.

  Further, in another aspect, in the above-described Fourier transform spectrometer, the Fourier transform spectrometer attachment is disposed before the irradiation opening from the bright line light source, and is emitted from the bright line light source. It further comprises a condensing optical system that condenses the bright line light.

  Further, in another aspect, in the above-described attachment for a Fourier transform spectrometer, the condensing light that is disposed before the irradiation opening from the bright line light source and collects the bright line light emitted from the bright line light source. An optical system is further provided.

  Since the Fourier transform spectrometer and the Fourier transform spectrometer attachment having such a configuration further include a condensing optical system, a larger amount of bright line light can be incident on the interferometer. It is possible to improve.

  In another aspect, the above-described Fourier transform spectrometer further includes an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines.

  According to this configuration, it is possible to provide a Fourier transform spectrometer equipped with an emission line light source.

  According to another aspect, in the above-described Fourier transform spectrometer, the bright line light source is a low-pressure xenon lamp.

  According to this configuration, a relatively stable emission line can be obtained by using the low-pressure xenon lamp as the emission line light source.

  According to another aspect, in the above-described Fourier transform spectrometer, the predetermined light is near-infrared light of 800 nm or more incident as a measurement target.

  According to this configuration, it is possible to provide a Fourier transform spectrometer capable of measuring near-infrared light of 800 nm or more.

  The Fourier transform spectrometer and the Fourier transform spectrometer according to the present invention can perform wavelength calibration with higher accuracy. And according to this invention, the attachment for Fourier-transform type spectrometers used suitably when performing wavelength calibration is provided.

It is a block diagram which shows the structure of the Fourier-transform type spectrometer in embodiment. It is a figure which mainly shows the structure of the interferometer in the Fourier-transform-type spectrometer of embodiment. It is sectional drawing which shows the structure of the attachment of the 1st aspect in the Fourier-transform-type spectrometer of embodiment. As an example, it is a figure which shows the bright line spectrum of the bright line light in the Fourier-transform-type spectrometer of embodiment. It is a flowchart which shows the operation | movement of wavelength calibration in the Fourier-transform-type spectrometer of embodiment. As an example, it is a figure which shows the interferogram observed when bright line light and bias light inject into an interferometer. As an example, it is a figure which shows the interferogram observed when bias light injects into an interferometer. It is a figure for demonstrating the calculation method of an emission line spectrum. It is sectional drawing which shows the structure of the attachment of a 2nd aspect. It is sectional drawing which shows the structure of the attachment of a 3rd aspect.

  Hereinafter, an embodiment according to the present invention will be described with reference to the drawings. In addition, the structure which attached | subjected the same code | symbol in each figure shows that it is the same structure, The description is abbreviate | omitted suitably.

FIG. 1 is a block diagram illustrating a configuration of a Fourier transform spectrometer according to the embodiment. FIG. 2 is a diagram mainly illustrating a configuration of an interferometer in the Fourier transform spectrometer according to the embodiment. FIG. 3 is a cross-sectional view showing the configuration of the attachment of the first aspect in the Fourier transform spectrometer of the embodiment. FIG. 4 is a diagram illustrating an emission line spectrum of emission line light in the Fourier transform spectrometer according to the embodiment as an example. The horizontal axis in FIG. 4 is the wave number expressed in cm ⁻¹ , and the vertical axis is the relative intensity.

  A Fourier transform spectrometer (hereinafter abbreviated as “FT spectrometer”) D in the embodiment is an apparatus for measuring a spectrum of light to be measured, and measures the light to be measured with an interferometer. This is a device for obtaining the spectrum of the light to be measured by Fourier transforming the waveform (interferogram) of the measured interference light of the light to be measured. Then, in the FT spectrometer D of the present embodiment, in order to improve the S / N ratio and obtain a good accuracy result, the transformation target to be Fourier-transformed to obtain the spectrum of the light to be measured includes the interference. An integrated interferogram obtained by integrating a plurality of interferograms of the light to be measured generated by a meter is used. Such an FT spectrometer D includes, for example, a measurement light source 51 for irradiating measurement light to a sample SM, which is an object to be measured, and measurement reflected by the sample SM, as shown in FIGS. The reflected light of the light is incident as the light to be measured, the interferometer 11 that emits the interference light of the light to be measured, and the interference light of the light to be measured obtained by the interferometer 11 is received and photoelectrically converted. A light reception processing unit 20 that outputs an electrical signal having a waveform of interference light of the measurement light (an electrical signal representing a light intensity change in the interference light of the light to be measured), and a position detection process that detects the position of the movable mirror 115 in the interferometer 11. A unit 30, a control calculation unit 41, an input unit 42, an output unit 43, and the housing 1 are provided.

  The housing 1 is a box that houses the measurement light source 51, the interferometer 11, the light reception processing unit 20, the position detection processing unit 30, the control calculation unit 41, the input unit 42, and the output unit 43. A sample stage 1b for mounting the sample SM is formed. A through-opening is formed in the sample stage 1b as an incident opening 1a for entering the light to be measured. The FT spectrometer D further includes a Fourier transform spectrometer attachment (hereinafter abbreviated as “attachment”) AT used for wavelength calibration. This attachment AT is arranged and used on the sample stage 1b when performing wavelength calibration.

  The measurement light source 51 is a light source device that emits measurement light and irradiates the sample SM with the measurement light in a 45: 0 degree geometry. The measurement light is light having a continuous spectrum in a predetermined wavelength band set in advance. The measurement light is used for measuring the sample SM at the time of measurement, and is used as bias light superimposed on the bright line light having the bright line spectrum including one or a plurality of bright lines at the time of wavelength calibration. Thus, in this embodiment, the measurement light source 51 is also used as a bias light source that emits bias light. In this embodiment, for example, a halogen lamp is used as such a measurement light source 51.

  When measuring the sample SM, the sample SM is arranged on the sample stage 1b so as to cover the incident opening 1a, and the surface of the sample SM facing the incident opening 1a becomes the measurement surface SF. The measurement light emitted from the measurement light source 51 enters the sample SM at an incident angle of 45 degrees and is reflected by the sample SM. The reflected light of the reflected measurement light is measured from the direction of 0 degrees. The That is, the component of the reflected light reflected in the normal direction (0 degree) on the aperture surface of the incident aperture 1a is incident on the interferometer 11 as the measured light. As described above, the FT spectrometer D of the present embodiment is a reflection type in which the reflected light of the measurement light reflected by the sample SM is the light to be measured.

  In this example, the light to be measured is reflected light of the measurement light reflected by the sample SM. However, the light to be measured may be light re-radiated from the sample SM (for example, fluorescence emission) by irradiating the measurement light. In addition, the light may be light emitted by the sample SM without being irradiated with the measurement light. Alternatively, light emitted from another light source may be irradiated, and light may be emitted by reflecting, transmitting, or re-radiating the light (for example, fluorescence emission). The reflective FT spectrometer D can measure not only the reflected light but also such re-radiated light and self-luminous light.

  On the other hand, when performing wavelength calibration, the attachment AT is arranged on the sample stage 1b so as to cover the incident aperture 1a. For example, as shown in FIG. 3, the attachment AT is an attachment ATa of a first aspect including a bright line light source 61 and a casing 62 that accommodates the bright line light source 61.

The bright line light source 61 is a light source device that emits bright line light having a bright line spectrum including one or a plurality of bright lines having known wavelengths. In the present embodiment, the bright line light source 61 is a xenon lamp, and is preferably enclosed because it can emit light having a bright line spectrum including a plurality of bright lines in a relatively stable and reproducible manner. This is a low-pressure xenon lamp with a relatively low gas pressure. More specifically, in the present embodiment, the bright line light source 61 is a pen-type low-pressure xenon lamp. The emission line spectrum of this low-pressure xenon lamp is shown in FIG. In FIG. 4, eleven bright lines are shown as xenon (Xe) bright lines between a wave number of 4000 (cm ⁻¹ ) and a wave number of 8400 (cm ⁻¹ ).

  The housing 62 is a substantially rectangular parallelepiped box, and an accommodation recess 621 into which the bright line light source 61 is fitted is formed on one main surface. The pen-type low-pressure xenon lamp 61 as the bright line light source 61 is fitted into the housing recess 621 so that the pen-type low-pressure xenon lamp 61 is housed in the housing 62, and the opening 622 of the housing recess 621 is formed. The irradiation opening 622 is used to irradiate the bright line light emitted from the pen-type low-pressure xenon lamp 61 to the outside. On the one main surface of the housing 62 where the irradiation opening 622 is formed, a reflection region 623 that reflects light in the wavelength band included in the bias light is provided on at least the surface of the region adjacent to the irradiation opening 622. Is formed. The reflection region 623 is a region for reflecting the measurement light in accordance with the irradiation direction of the bright line light in order to use the measurement light emitted from the measurement light source 51 provided in the FT spectrometer D as the bias light. It is. The reflection region 623 may be formed on one side of the irradiation opening 622, for example, or may be formed on both sides of the irradiation opening 622. For example, the entire surface of the one main surface is the reflection region 623. May be. Note that a cover glass may be disposed in the irradiation opening 622 for dust prevention, for example.

  In the attachment ATa of the first aspect having such a configuration, the bright line light OP3 radiated from the bright line light source 61 is incident through the irradiation opening 622 when arranged on the sample stage 1b for wavelength calibration. The light enters the laser beam 1 a and enters the interferometer 11. In addition, the measurement light OP1 emitted from the measurement light source 51 of the FT spectrometer D is reflected by the reflection region 623 and is incident on the incident aperture 1a as the bias light OP2 in accordance with the irradiation direction of the bright line light. 11 is incident. When the bright line light OP3 and the bias light OP2 are incident on the interferometer 11 as measured light, the bright line light source 61 and the measuring light source 51 are simultaneously turned on, and only the bias light OP2 is interfered with as the measured light. When the light is incident on the total 11, the bright line light source 61 is turned off and the measurement light source 51 is turned on.

  Returning to FIG. 1, the interferometer 11 receives the light to be measured, branches the incident light to be measured into two first and second light to be measured, and the branched first and second light to be measured. Each of the measurement lights travels (propagates) in two different paths, the first and second optical paths, and is merged again. From this branch point (branch position), a merge point (merging position, If there is an optical path difference between the first and second optical paths up to (interference position), a phase difference is generated at the time of merging, so that interference fringes are generated by the merging. As the interferometer 11, for example, an interferometer having various types of first and second optical paths such as a Mach-Zehnder interferometer can be used. In this embodiment, as shown in FIG. It is constituted by.

  More specifically, as shown in FIG. 2, the interferometer 11 includes a semi-transparent mirror (half mirror) 112, a fixed mirror 114, and a moving mirror 115 whose light reflecting surface moves in the optical axis direction as a plurality of optical elements. The fixed mirror 114 and the movable mirror 115 are arranged so that the normals of the mirror surfaces are orthogonal to each other, and the semi-transparent mirror 112 has a normal line corresponding to each of the normal lines of the fixed mirror 114 and the movable mirror 115. Are arranged so as to cross each normal line at an angle of 45 degrees. In the interferometer 11, the light to be measured incident on the interferometer 11 is branched into two first and second light to be measured by the semi-transparent mirror 112. The branched first first measured light is reflected by the semi-transparent mirror 112 and enters the fixed mirror 114. The first light to be measured is reflected by the fixed mirror 114 and returns to the semi-transparent mirror 112 again following the optical path that has come. On the other hand, the other branched second measured light passes through the semi-transparent mirror 112 and enters the movable mirror 115. This second light to be measured is reflected by the movable mirror 115, and reversely follows the optical path that has come to return to the semi-transparent mirror 112 again. The first light to be measured reflected by the fixed mirror 114 and the second light to be measured reflected by the moving mirror 115 are merged with each other by the semi-transparent mirror 112 and interfere with each other. In the Michelson interferometer 11 having such a configuration, the light to be measured is incident on the interferometer 11 along the normal direction on the mirror surface of the movable mirror 115, and the interference light of the light to be measured is reflected on the mirror surface of the fixed mirror 114. The light is emitted from the interferometer 11 along the normal direction.

  In this embodiment, the interferometer 11 is arranged on the reflection side of the semi-transparent mirror 112 reflected by the semi-transparent mirror 112 when the light to be measured is branched into two first and second measured light beams by the semi-transparent mirror 112. A phase compensation plate 113 is further provided. That is, in the present embodiment, the first measured light reflected by the semi-transparent mirror 112 is incident on the fixed mirror 114 via the phase compensation plate 113, and the first measured light reflected by the fixed mirror 114 is phase compensated. The light enters the semi-transparent mirror 112 again through the plate 113. The phase compensation plate 113 is a phase difference between the first measured light and the second measured light, which is caused by the difference in the number of times the first measured light is transmitted through the semi-transparent mirror 112 and the number of times the second measured light is transmitted through the semi-transmissive mirror 112. Is used to compensate for the phase difference.

  Therefore, in the present embodiment, the first measured light is transmitted from the incident position of the measured light through the semi-transparent mirror 112, the phase compensation plate 113, the fixed mirror 114, and the phase compensation plate 113 in this order. Follow the first optical path that leads to again. The second measured light follows a second optical path from the incident position of the measured light to reach the semi-transmissive mirror 112 again through the semi-transmissive mirror 112 and the movable mirror 115 in this order.

  By providing this phase compensation plate 113, the interferometer 11 of the FT spectrometer D generates interference fringes due to the optical path difference generated by the moving mirror 115.

  In the present embodiment, the movable mirror 115 is an example of an optical path difference forming optical element, and is an optical element that generates an optical path difference between the two first and second optical paths by using resonance vibration. The movable mirror 115 reciprocates twice or more in the optical axis direction in order to generate a plurality of interferograms of the light to be measured. Examples of such a movable mirror 115 include a light reflecting mechanism disclosed in Japanese Patent Application Laid-Open Nos. 2011-80854 and 2012-42257. The light reflecting mechanism is disposed between the first and second leaf spring portions disposed opposite to each other and the first and second leaf spring portions spaced apart from each other. The first and second supports connected to the second leaf spring portion, and the second support relative to the first support in the opposing direction of the first and second leaf spring portions. And a drive unit that translates the body. In this light reflecting mechanism, in the movement direction of the second support, the thickness of the first and second supports is thicker than that of the first and second leaf springs. A reflection film is formed on one end surface of the support body 2 perpendicular to the moving direction, and the second support body is formed with the first and second leaf spring portions so that the reflection film is exposed. It is connected. Such a light reflection mechanism reciprocates the reflection film by resonance vibration, and is manufactured by, for example, a MEMS (Micro Electro Mechanical Systems) technique.

  Here, when the absolute position of the movable mirror 115 can be detected, the center burst position is not required when obtaining the integrated interferogram, but in the case of the movable mirror 115 using such resonance. When the integrated interferogram is obtained, the center burst position is required as a reference position for integration for superimposing the interferograms obtained in the respective measurements. The detection of the absolute position of the movable mirror 115 includes, for example, a detection error due to the position fluctuation of the sample SM and is difficult to detect with high accuracy. However, the detection of the center burst position is superior in this respect. There is.

  Further, in the present embodiment, for example, a collimator lens 111 is disposed as an incident optical system at an appropriate position between the sample surface SF and the semi-transparent mirror 112 in order to make the light to be measured incident on the semi-transparent mirror 112 as parallel light. In order to collect the interference light of the light to be measured generated by combining the first and second light to be measured with the semi-transparent mirror 112 and causing them to interfere with each other, For example, a condensing lens 116 is further disposed as an emission optical system at an appropriate position between the light receiving unit 21 and the light receiving unit 21.

  Returning to FIG. 1, the light reception processing unit 20 includes, for example, a first light reception unit 21, an amplification unit 22, and an analog-digital conversion unit (hereinafter referred to as “AD conversion unit”) 23. . The first light receiving unit 21 is a circuit that outputs an electric signal corresponding to the light intensity in the interference light of the measurement light by receiving and photoelectrically converting the interference light of the measurement light obtained by the interferometer 11. . The FT spectrometer D according to the present embodiment is, for example, a specification for measuring near infrared light with a wavelength of 800 nm or more, more specifically, near infrared light with a wavelength of 1200 nm to 2500 nm. Therefore, the first light receiving unit 21 is, for example, an infrared sensor configured by including an InGaAs photodiode and its peripheral circuit. The amplifying unit 22 is an amplifier that amplifies the output of the first light receiving unit 21 with a predetermined amplification factor set in advance. The AD conversion unit 23 is a circuit that converts the output of the amplification unit 22 from an analog signal to a digital signal (AD conversion). The AD conversion timing (sampling timing) is executed at the zero cross timing input from the zero cross detector 37 described later.

  The position detection processing unit 30 includes, for example, a position measurement light source 31, a second light receiving unit 36, and a zero cross detection unit 37. Then, the position detection processing unit 30 obtains the interference light of the laser light emitted from the position measuring light source 31 with the interferometer 11, as shown in FIG. The optical demultiplexer 34 and the condenser lens 35 are further provided.

  The position measuring light source 31 is a light source device that emits monochromatic laser light. In FIG. 2, a collimator lens 32 and an optical multiplexer 33 are incident optical systems for causing the laser light emitted from the position measuring light source 31 to enter the interferometer 11 as parallel light. The optical multiplexer 33 is, for example, a dichroic mirror that reflects laser light and transmits measured light, and a collimator so that the normal line intersects the normal line (optical axis) of the movable mirror 115 at 45 degrees. It is disposed between the lens 111 and the semi-transparent mirror 112. The collimator lens 32 is, for example, a biconvex lens, and the laser beam emitted from the position measuring light source 31 is incident on the optical multiplexer 33 arranged in this manner at an incident angle of 45 degrees as appropriate. It is arranged in the position. The optical demultiplexer 34 and the condensing lens 35 are emission optical systems for taking out the interference light of the laser light generated by the interferometer 11 from the interferometer 11. The optical demultiplexer 34 is, for example, a dichroic mirror that reflects the interference light of the laser light and transmits the interference light of the light to be measured, and its normal line is 45 degrees with respect to the normal line (optical axis) of the fixed mirror 114. Are arranged between the semi-transparent mirror 112 and the condenser lens 116 so as to intersect each other. The condensing lens 35 is, for example, a biconvex lens, and condenses the interference light of the laser beam emitted at an emission angle of 45 degrees in the optical demultiplexer 34 arranged in this manner, thereby the second light receiving unit 36. To enter.

  When the optical elements such as the collimator lens 32, the optical multiplexer 33, the optical demultiplexer 34, and the condenser lens 35 are arranged in this way, the monochromatic laser light emitted from the position measuring light source 31 is converted into the collimator lens 32. The optical path is bent by about 90 degrees by the dichroic mirror 33 of the optical multiplexer 33 and travels along the optical axis of the interferometer 11 (normal direction on the mirror surface of the movable mirror 115). . Therefore, this laser light travels in the interferometer 11 as with the light to be measured, and the interferometer 11 generates the interference light. Then, the interference light of this laser light is bent by about 90 degrees by the dichroic mirror 34 of the optical demultiplexer 34, taken out from the interferometer 11, collected by the condenser lens 35, and condensed by the second light receiving unit 36. Is received.

  Returning to FIG. 1, the second light receiving unit 36 receives the interference light of the laser light obtained by the interferometer 11 and photoelectrically converts it, thereby outputting an electric signal corresponding to the light intensity of the interference light of the laser light. It is a circuit to do. The second light receiving unit 36 is, for example, a light receiving sensor including a silicon photodiode (SPD) and its peripheral circuit. The second light receiving unit 36 outputs an electrical signal corresponding to the light intensity of the interference light of the laser light to the zero cross detection unit 37.

  The zero cross detection unit 37 is a circuit that detects a timing (zero cross timing) at which the electric signal corresponding to the light intensity of the interference light of the laser beam input from the second light receiving unit 36 becomes zero. Zero cross timing is a position on the time axis at which the electrical signal becomes zero. When the movable mirror 115 of the interferometer 11 is moved in the optical axis direction, the movable mirror 115 is moved from the semi-transparent mirror 112 to the phase of the laser light that has returned from the semi-transparent mirror 112 to the semi-transparent mirror via the fixed mirror 114. Since the phase of the laser light that has returned to the semi-transparent mirror is shifted again, the interference light of the laser light becomes strong and weak in a sine wave shape according to the amount of movement. When the movable mirror 115 of the interferometer 11 moves by a length that is ½ of the wavelength of the laser light, the phase of the laser light that has returned from the semi-transparent mirror 112 to the semi-transparent mirror through the movable mirror 115 is There is a 2π shift before and after. For this reason, the interference light of the laser light repeats the intensity in a sine wave shape as the movable mirror 115 moves. The zero cross detector 37 detects the zero cross of the electrical signal that repeats the strength in a sine wave form. The zero-cross detection unit 37 outputs the detected zero-cross timing to the AD conversion unit 23, and the AD conversion unit 23 outputs the interference light of the measured light input from the first light receiving unit 21 at the zero-cross timing. An electrical signal corresponding to the light intensity is sampled and AD converted.

  The control calculation unit 41 controls each part of the FT spectrometer D according to the function of each part in order to obtain the spectrum of the light to be measured. The control calculation unit 41 is, for example, a CPU (Central Processing Unit), a ROM (Read Only Memory) or an EEPROM (Electrically Erasable Programmable Read Only) that stores various programs executed by the CPU and data necessary for the execution in advance. The microcomputer includes a nonvolatile memory element such as a memory, a volatile memory element such as a RAM (Random Access Memory) serving as a so-called working memory of the CPU, and peripheral circuits thereof. The control calculation unit 41 may further include a relatively large capacity storage device such as a hard disk, for example, in order to store data output from the AD conversion unit 23. The control calculation unit 41 is functionally executed by executing a program, such as a sampling data storage unit 411, a center burst position calculation unit 412, an interferogram calculation unit 413, a spectrum calculation unit 414, a wavelength calibration unit 415, and A storage unit 416 is configured.

  The sampling data storage unit 411 stores measurement data related to the interference light of the light to be measured output from the AD conversion unit 23. As described above, the measurement data is obtained by sampling the electrical signal corresponding to the light intensity in the interference light of the light to be measured by the AD conversion unit 23 at the zero cross timing detected by the zero cross detection unit 37. More specifically, in the wavelength calibration, the sampling data storage unit 411 stores measurement data related to interference light with respect to the wavelength calibration light output from the AD conversion unit 23, and the sampling data storage unit 411 stores the sample SM. In the measurement, measurement data relating to interference light with respect to the light of the sample SM output from the AD conversion unit 23 is stored. The wavelength calibration light is, as described above, the bright line light and the bias light as the light to be measured, and only the bias light as the light to be measured, and the light of the sample SM is as described above. Measurement light reflected light, re-radiated light, and self-luminous light.

  The center burst position calculation unit 412 obtains the position of the center burst from the measurement data stored in the sampling data storage unit 411 by a known conventional method. More specifically, in the wavelength calibration, the center burst position calculation unit 412 obtains the center burst position from the measurement data related to the interference light with respect to the wavelength calibration light stored in the sampling data storage unit 411, and the center burst position In the measurement of the sample SM, the calculation unit 412 obtains the position of the center burst from the measurement data related to the interference light with respect to the light of the sample SM stored in the sampling data storage unit 411.

  The interferogram calculation unit 413 performs integration while aligning a plurality of interferograms obtained by measuring the measured light a plurality of times at each center burst position obtained by the center burst position calculation unit 412. By doing so, an integrated interferogram is obtained. More specifically, in the wavelength calibration, the interferogram calculation unit 413 obtains a plurality of interferograms related to the interference light with respect to the wavelength calibration light obtained by measuring the wavelength calibration light a plurality of times. While performing alignment at each center burst position obtained by the center burst position calculation unit 412, an integration interferogram (integration interferogram for wavelength calibration) is obtained by integration, and the interferogram calculation unit 413 includes: In the measurement of the sample SM, a plurality of interferograms related to interference light with respect to the light of the sample SM obtained by measuring the light of the sample SM a plurality of times are obtained as the center burst positions calculated by the center burst position calculation unit 412. While performing alignment with Over obtaining the interferogram (integrated interferogram of the sample SM).

  The wavelength calibration unit 415 performs a Fourier transform result obtained by performing Fourier transform on the integrated interferogram for wavelength calibration obtained by the interferogram calculation unit 413 in the measurement for wavelength calibration, and an actual wavelength value. Corresponding wavelength calibration is performed.

  The storage unit 416 stores data of the wavelength calibration result obtained by the wavelength calibration unit 415. The wavelength calibration unit 415 stores the obtained wavelength calibration result data in the storage unit 416.

  The spectrum calculation unit 414 obtains a spectrum by Fourier-transforming an integrated interferogram obtained by integrating a plurality of interferograms by the interferogram calculation unit 413. More specifically, in the wavelength calibration, the spectrum calculation unit 414 performs the wavelength calibration by Fourier-transforming the integrated interferogram for wavelength calibration obtained by the interferogram calculation unit 413 in the measurement for wavelength calibration. The spectrum calculation unit 414 obtains a spectrum for the sample SM and measures the sample SM based on the wavelength calibration result obtained by the wavelength calibration unit 415 and stored in the storage unit 416. A spectrum in the light of the sample SM is obtained by performing Fourier transform on the integrated interferogram of the sample SM obtained by the ferrogram calculating unit 413.

  Here, in the present embodiment, the wavelength calibration unit 415 obtains the spectrum calculation unit 414 by causing the emission line light having one or more emission lines and the bias light having the continuous spectrum to enter the interferometer 11. The emission line spectrum of the emission line light is obtained by obtaining a difference between the obtained first spectrum and the second spectrum obtained by the spectrum calculation unit 414 by causing the bias light to enter the interferometer 11, and obtaining the obtained line spectrum. The wavelength calibration is performed based on the bright line peak included in the bright line spectrum.

  The input unit 42 is, for example, various commands such as a command for instructing wavelength calibration and a command for instructing the start of measurement of the sample SM, and a window function used at the time of input of an identifier or Fourier transform, for example, in the sample SM to be measured. Is a device for inputting various data necessary for measuring a spectrum such as a selection input to the Fourier transform spectrometer D, such as a keyboard and a mouse. The output unit 43 is a device that outputs the command and data input from the input unit 42 and the spectrum of the light to be measured measured by the FT spectrometer D. For example, the output unit 43 is a CRT display, LCD, organic EL display, and plasma. A display device such as a display, or a printing device such as a printer.

  Next, the operation of this embodiment will be described. FIG. 5 is a flowchart showing the wavelength calibration operation in the Fourier transform spectrometer of the embodiment. FIG. 6 is a diagram showing an interferogram observed when bright line light and bias light are incident on the interferometer as an example. FIG. 7 is a diagram illustrating an interferogram observed when bias light is incident on an interferometer as an example. 6 (A) and FIG. 7 (A) are general views showing the whole, and FIG. 6 (B) and FIG. 7 (B) are partially enlarged views in which the vicinity of the center burst position is enlarged. FIG. 6C and FIG. 7C are partially enlarged views in which the portion excluding the center burst position is enlarged. In these figures, the horizontal axis represents time (zero cross count value), and the vertical axis represents intensity (AD conversion count value). FIG. 8 is a diagram for explaining a method of calculating an emission line spectrum.

  In FIG. 5, when performing wavelength calibration, first, a first integrated interferogram for bright line light and bias light is obtained (S11), and a first spectrum for bright line light and bias light is obtained (S12).

  More specifically, the attachment ATa is arranged on the sample stage 1b so that a part or all of the irradiation opening 622 and part or all of the reflection region 623 of the attachment ATa face the incident opening 1a at the same time. Then, the bright line light source 61 of the attachment ATa is turned on by operating a lighting switch (not shown). When an instruction to start wavelength calibration is input from the input unit 42, the wavelength calibration unit 415 of the control calculation unit 41 in the FT spectrometer D turns on the measurement light source 51 to emit bias light. .

  Thus, the bright line light OP3 emitted from the bright line light source 61 enters the incident opening 1a through the irradiation opening 622 and enters the interferometer 11. Then, the measurement light OP1 radiated from the measurement light source 51 is reflected by the reflection region 623, is incident on the incident aperture 1a as the bias light OP2 in accordance with the irradiation direction of the bright line light, and is incident on the interferometer 11. Thus, the bright line light OP3 and the bias light OP2 (measurement light OP1) are incident on the interferometer 11 as light to be measured.

  The measured light of the bright line light and the bias light incident on the interferometer 11 is received by the first light receiving unit 21 as interference light of the measured light by the interferometer 11. More specifically, the light to be measured is converted into parallel light by the collimator lens 111, and is reflected and transmitted by the semi-transparent mirror 112 through the optical multiplexer 33, thereby being branched into the first and second light to be measured. The first light to be measured branched by being reflected by the semi-transparent mirror 112 is incident on the fixed mirror 114 via the phase compensation plate 113, reflected by the fixed mirror 114, and traces the optical path that has come in reverse, and again the semi-transparent mirror 112. Return to. On the other hand, the second light to be measured branched by passing through the semi-transparent mirror 112 is incident on the movable mirror 115, reflected by the movable mirror 115, and returns to the semi-transparent mirror 112 by tracing back the optical path that has come. The first light to be measured reflected by the fixed mirror 114 and the second light to be measured reflected by the moving mirror 115 are merged with each other by the semi-transparent mirror 112 and interfere with each other. The interference light of the light to be measured is emitted from the interferometer 11 to the first light receiving unit 21. The first light receiving unit 21 photoelectrically converts the incident interference light of the measurement light, and outputs an electrical signal corresponding to the light intensity in the interference light of the measurement light to the amplification unit 22. The amplifying unit 22 amplifies the electric signal corresponding to the interference light of the light to be measured with a predetermined amplification factor, and outputs it to the AD converting unit 23.

  On the other hand, the FT spectrometer D also captures monochromatic laser light emitted from the position measurement light source 31. This laser light is incident on the interferometer 11 via the optical multiplexer 33, interferes with the interferometer 11 in the same manner as described above, becomes interference light of the laser light, and passes through the optical demultiplexer 34 to the second light receiving unit. Light is received at 36. The second light receiving unit 36 photoelectrically converts the incident interference light of the laser beam, and outputs an electrical signal corresponding to the light intensity in the interference light of the laser beam to the zero cross detection unit 37. The zero cross detection unit 37 detects a timing at which the electric signal corresponding to the interference light of the laser beam becomes zero as a zero cross timing, and outputs the zero cross timing to the AD conversion unit 23 as a sampling timing (AD conversion timing).

  While such measured light and laser light are respectively taken into the interferometer 11, the movable mirror 115 of the interferometer 11 is moved along the optical axis direction under the control of the control calculation unit 41.

  The AD conversion unit 23 samples the electrical signal output from the amplification unit 22 according to the light intensity in the interference light of the light to be measured at the zero cross timing input from the zero cross detection unit 37, and converts the electrical signal from an analog signal to a digital signal. AD conversion is performed, and the electric signal of the digital signal subjected to the AD conversion is output to the control calculation unit 41.

  By operating in this way, measurement data in the interferogram of the bright line light and the bias light is output from the AD conversion unit 23 to the control calculation unit 41 and stored in the sampling data storage unit 411. An example of the interferogram of bright line light and bias light measured in this way is shown in FIG. With the bright line light alone, the center burst does not appear because the spectrum of the bright line light is a discontinuous spectrum, but since bias light having a continuous spectrum is superimposed on the bright line light, as shown in FIG. A center burst appears. Then, in order to improve the SN ratio and obtain a result with good accuracy, the interferograms of such bright line light and bias light are similarly measured a plurality of times, and each measurement data of these interferograms is obtained. It is stored in the sampling data storage unit 411.

  Next, the center burst position calculation unit 412 obtains the position of the center burst in the interferogram of the bright line light and the bias light for each measurement data of each interferogram stored in the sampling data storage unit 411.

  Next, the interferogram calculation unit 413 positions a plurality of interferograms of the bright line light and the bias light obtained by measuring a plurality of times at each center burst position obtained by the center burst position calculation unit 412. A first integrated interferogram for wavelength calibration with respect to the bright line light and the bias light is obtained by performing integration while matching.

  Next, the spectrum calculation unit 414 obtains the first spectrum of the bright line light and the bias light by performing Fourier transform on the first integrated interferogram obtained by the interferogram calculation unit 413.

The calculation of this spectrum will be described more specifically. First, the interferogram F _m (x _i ) in the m-th measurement has an optical path difference x _i , a wave number ν _j , and a wave number ν _j spectrum. When the amplitude is B (ν _j ), the position of the optical path difference 0 is X _0, and the phase at the position of the optical path difference 0 of the wave number ν _j is φ (ν _j ), it is expressed by Expression 1. Note that m represents the measurement result of the mth measurement.

Therefore, the integrated interferogram F (x _i ) is expressed by Equation 2.

  When the integrated interferogram is obtained by the interferogram calculating unit 413 in this way, the spectrum calculating unit 414 obtains the spectrum of the light to be measured by, for example, fast Fourier transform (FFT) of the integrated interferogram.

More specifically, when fast Fourier transform is performed, in order to reduce the occurrence of side lobes, a window function A _window (x _i ) that is symmetric about the center burst position is multiplied (Formula 3). ), Fast Fourier Transform is performed, and the amplitude | B _window (ν _j ) |

Examples of the window function A _window (x _i ) can include various appropriate functions. For example, the window function A _window (x _i ) is a function represented by Expression 5-1 to Expression 5-3. Equation 5-1 is called a Hanning Window function, Equation 5-2 is called a Hamming Window function, and Equation 5-3 is called a Blackman Window function. .

  As described above, once the first spectrum is obtained, the second integrated interferogram for the bias light is obtained (S13), and the second spectrum for the bias light is obtained (S14).

  More specifically, first, the bright line light source 61 of the attachment ATa is turned off by operating a lighting switch (not shown). Here, the attachment ATa is arranged on the sample stage 1b as it is. Whether or not the first spectrum has been obtained may be displayed on the output unit 43, for example, indicating that the first spectrum has been obtained.

  As a result, only the bias light OP <b> 2 that has entered the incident aperture 1 a due to the measurement light OP <b> 1 emitted from the measurement light source 51 being reflected by the reflection region 623 is incident on the interferometer 11. Thus, only the bias light OP2 (measurement light OP1) is incident on the interferometer 11 as the measurement light.

  Then, the measured light of only the bias light incident on the interferometer 11 is received by the first light receiving unit 21 as interference light of the measured light by the interferometer 11, and is biased by the operation substantially similar to the above. Measurement data in the optical interferogram is output from the AD conversion unit 23 to the control calculation unit 41 and stored in the sampling data storage unit 411. An example of the interferogram of the bias light measured in this way is shown in FIG. As shown in FIG. 7, since the bias light has this continuous spectrum, a center burst appears in the interferogram of the bias light. In order to improve the S / N ratio and obtain a good accuracy result, the interferogram of such a bias light is measured a plurality of times in the same manner, and each measurement data of each interferogram is stored as sampling data. Stored in the unit 411.

  Next, the center burst position calculation unit 412 obtains the position of the center burst in the interferogram of bias light for each measurement data of each interferogram stored in the sampling data storage unit 411.

  Next, the interferogram calculation unit 413 aligns the plurality of bias light interferograms obtained by measuring a plurality of times at each center burst position obtained by the center burst position calculation unit 412. While integrating, a second integrated interferogram for wavelength calibration with respect to the bias light is obtained.

  Next, the spectrum calculation unit 414 obtains the second spectrum of the bias light by performing a Fourier transform on the second integrated interferogram obtained by the interferogram calculation unit 413.

  Next, the wavelength calibration unit 415 obtains a spectrum for the bright line light from the first and second spectra (S15). More specifically, as shown in FIG. 8A, the wavelength calibration unit 415 obtains the spectrum for the bright line light by subtracting the second spectrum for the bias light from the first spectrum for the bright line light and the bias light. . Thus, by obtaining the difference between the first spectrum and the second spectrum, the component for the bias light in the first spectrum is removed, and the spectrum for the bright line light is obtained.

  And the wavelength calibration part 415 calculates | requires the wavelength calibration data for performing wavelength calibration from the spectrum with respect to this bright line light (S16).

  More specifically, the wavelength calibration unit 415 first obtains the peak position (peak wavelength, peak wave number) of the bright line from the spectrum with respect to the bright line light. The peak position of the bright line to be obtained may be one, but it is preferable to have a plurality of peak positions in order to perform wavelength calibration with higher accuracy.

This peak position may be the position (wavelength, wave number) itself of the bright line (maximum value) in the difference between the first and second spectra. However, since the position of the bright line (maximum value) in the difference between the first and second spectra is not necessarily a true position, in order to detect the peak position with higher accuracy, FIG. As shown, the bright line (maximum value) is first approximated by a function having a single maximum value and a convex profile, for example, a Gaussian function, and the peak position of the approximated Gaussian function is The peak position. The Gaussian function is generally expressed as a × exp (− (x−b) ² / (2c ² )) (a, b, and c are parameters determined by the approximation).

  Since the peak position of the bright line thus obtained is known, the wavelength calibration unit 415 performs wavelength calibration by, for example, pricing the peak position of the bright line thus obtained with this known value. In addition, for example, when the price has already been set, the wavelength calibration unit 415 obtains correction data for compensating (resolving) the deviation between the peak position of the obtained bright line and the already priced value, Perform wavelength calibration. For example, when the value already priced as Wa is obtained as Wb, the correction data is Wa / Wb as the correction magnification.

  When there are a plurality of bright line peak positions, it is necessary to specify which of the known values each peak position of each of the plurality of bright lines corresponds to. In this case, for example, as shown in FIG. 4, there is a predetermined pattern in the interval (wavelength interval, wave number interval) of each emission line spectrum, and therefore, from the obtained peak positions of each emission line. By performing pattern matching between the obtained bright line interval pattern and the bright line interval pattern obtained from a known bright line spectrum, it is possible to specify which of the known values each peak position of each obtained bright line corresponds to. Further, for example, as can be seen from FIG. 4, since there is a predetermined pattern in the relative intensity of each bright line of the bright line spectrum, it is obtained from the bright line intensity pattern obtained from each peak intensity of the obtained bright lines and the known bright line spectrum. By performing pattern matching with the bright line intensity pattern, it is possible to specify which of the known values each peak position of each bright line corresponds to.

When peak positions of a plurality of emission lines are used, all emission lines generated in a predetermined wavelength band may be used. However, an emission line having a relatively low relative intensity may not be detected by noise, for example, or may be noise, for example. Therefore, it is preferable to use a bright line having a relatively large relative intensity. For example, in the case of a low-pressure xenon lamp, as a bright line having a relatively large relative intensity, a wavelength of 1262.3391 nm (wave number 7921.18017 cm ⁻¹ ), a wavelength of 1365.7055 nm (wave number 7322.2228 cm ⁻¹ ), a wavelength of 1473.2806 nm (wave number 6787) 5733 cm ⁻¹ ), a wavelength of 1541.8394 nm (wave number 64855.7598 cm ⁻¹ ), and a wavelength of 2026.2242 nm (wave number 49355.2880 cm ⁻¹ ).

  Then, the wavelength calibration unit 415 stores the obtained wavelength calibration data in the storage unit 416 so that the wavelength calibration data can be used when obtaining the spectrum of the sample SM.

  By operating in this way, the FT spectrometer D of the present embodiment and the FT spectrometer installed in the FT spectrometer can perform wavelength calibration. The FT conversion spectrometer D and the FT spectroscopic method of the present embodiment have a very reproducibility because the wavelength is physically determined and a single wavelength emission line is used as the reference light for wavelength calibration. Since it is high and the half width is extremely narrow, wavelength calibration can be performed with higher accuracy than in the past. The FT spectrometer D and the FT spectrometer of the present embodiment as described above are a reciprocating vibration type movable mirror 115 that reciprocally vibrates a so-called reflecting mirror in the optical axis direction as an optical path difference forming optical element of the interferometer 11. Even if is used, since the center burst position can be detected by the bias light, the integrated interferogram can be obtained appropriately, and therefore wavelength calibration using the bright line becomes possible.

  Here, compared with the technique disclosed in Patent Document 1 described above, in Patent Document 1, since a Fabry-Perot etalon filter is used for narrowing the band, the interference effect between the opposing reflecting surfaces causes a specific wavelength. From the principle of intensifying light and transmitting light of a specific wavelength, high-precision polishing technology, coating technology, inter-interference distance adjustment technology, parallelism adjustment technology, etc. are required, and the manufacturing difficulty is high. Since the transmission wavelength of the Fabry-Perot etalon filter changes greatly according to the incident angle, the Fabry-Perot etalon is incident on the spectrometer in order to allow light having a desired transmission wavelength to enter the spectrometer. When incorporating a filter, advanced built-in adjustment technology is also required. Furthermore, since the transmission wavelength of the Fabry-Perot etalon filter changes due to a change in optical path length due to a temperature change or a change in refractive index due to a pressure change, it is necessary to consider the usage environment. However, the FT spectrometer D of the present embodiment uses the bright line light source 61, more specifically, for example, a low-pressure xenon lamp, and uses the bright line light emitted from the bright line light source 61. Is not particularly needed.

  On the other hand, compared with the technique disclosed in Patent Document 2 described above, in Patent Document 2, a standardized liquid is used, and the absorption peak of the standardized liquid changes due to a temperature change. There is a need. However, since the FT spectrometer D of the present embodiment uses the bright line light emitted from the bright line light source 61, the wavelength of the bright line does not change depending on the use environment due to the bright line generation mechanism. There is no need to take into account changes in the usage environment.

  Further, the FT spectrometer D of the present embodiment does not require a separate bias light source that emits bias light because the measurement light source 51 is also used as a light source that emits measurement light and bias light. And cost reduction.

  In addition, since the FT spectrometer D of the present embodiment includes the attachment ATa of the first aspect, the irradiation opening 622 and the reflection area 623 are disposed adjacent to each other. It is possible to attach the attachment ATa to the FT spectrometer D so as to face the incident aperture 1a at the same time. Therefore, the FT spectrometer D and the attachment ATa can cause the measurement light emitted from the measurement light source 51 of the FT spectrometer D to be incident on the interferometer 11 as bias light, and the bright line light source. The bright line light emitted from 61 can be incident on the interferometer 11. The FT spectrometer D and the attachment ATa have the opening area of the irradiation opening 622 facing the incident opening 1a and the reflection area of the reflecting region 623 facing the incident opening 1a by adjusting the attachment position of the attachment ATa. The ratio of the amount of bright line light incident on the interferometer 11 from the incident aperture 1a and the amount of bias light incident on the interferometer 11 from the incident aperture 1a can be adjusted. . Therefore, such an FT spectrometer D and attachment ATa can obtain an interferogram capable of detecting the bright line while detecting the center burst position even when the bias light is superimposed on the bright line light. In addition, in order to adjust the ratio between the light amount of the bright line light incident on the interferometer 11 and the light amount of the bias light, the surface treatment or material of the reflection region 623 is used instead of the position adjustment or in combination with the position adjustment. Etc. may be appropriately selected.

  FIG. 9 is a cross-sectional view showing the configuration of the attachment of the second aspect. FIG. 10 is a cross-sectional view showing the configuration of the attachment of the third aspect.

  In the above-described embodiment, the attachment ATa of the first aspect shown in FIG. 3 is used. However, the attachment AT is not limited to this, and other aspects are possible.

  The attachment ATb of the second aspect is an apparatus that is disposed and used on the sample stage 1b in which the incident aperture 1a for allowing predetermined light to enter is incident when the wavelength of the FT spectrometer D is calibrated. The attachment ATa according to the first aspect has the reflection region 623 provided on one main surface of the casing 62 that accommodates the bright line light source 61, but the attachment ATb according to the second aspect is different from the casing that accommodates the bright line light source. The body is provided with a reflection member including a reflection region that reflects measurement light as bias light. Such an attachment ATb of the second aspect includes, for example, as shown in FIG. 9, an emission line light source 71, a casing 72, and a reflection member 74, and in the example shown in FIG. 9, the emission line light source. A condensing optical system 73 that condenses the bright line light emitted from 71 is provided.

  The bright line light source 71 is a light source device that is similar to the bright line light source 61 and emits bright line light having a bright line spectrum including one or a plurality of bright lines having known wavelengths. In the present embodiment, the bright line light source 71 is, for example, a pen-type low-pressure xenon lamp, similarly to the bright line light source 61.

  The casing 72 is a substantially rectangular parallelepiped box that houses the bright line light source 71 and the condensing optical system 73. A housing recess 721 into which the bright line light source 71 is fitted is formed in the housing 72. The pen-type low-pressure xenon lamp 71 serving as the bright line light source 71 is fitted into the housing recess 721 so that the pen-type low-pressure xenon lamp 71 is housed in the housing 72. One main surface of the casing 72 is irradiated with bright line light emitted from the pen-type low-pressure xenon lamp 71 so as to face the opening of the housing recess 721 (so as to coincide with the opening position of the housing recess 721). An irradiation opening 722 is formed. A condensing optical system 73 is disposed at an appropriate position in a space 723 between the pen-type low-pressure xenon lamp 71 and the irradiation opening 722 formed in the housing 72. The condensing optical system 73 includes one or more lenses such as a biconvex positive lens.

  The reflection member 74 is a member for reflecting the measurement light in accordance with the irradiation direction of the bright line light in order to use the measurement light emitted from the measurement light source provided in the FT spectrometer D as the bias light. . The reflection member 74 includes a through-opening 741 for transmitting the bright line light, and a reflection region 742 that is formed at least on the surface of the region adjacent to the through-opening 741 and reflects light in the wavelength band included in the bias light. For example, the reflective region 742 may be formed on one side of the through-opening 741, for example, may be formed on both sides of the through-opening 741, and, for example, the entire surface of the one main surface is the reflective region 742. May be. In the reflecting member 74, the irradiation opening 722 and the through opening 741 of the housing 72 partially or entirely coincide between the housing 72 and the sample stage 1 b in which the entrance opening 1 a in the FT spectrometer D is formed. Arranged. With this arrangement, the bright line light emitted from the bright line light source 71 is incident on the incident opening 1 a via the condensing optical system 73, the irradiation opening 722, and the through opening 741, and is reflected by the reflection region 742. The measurement light emitted from the measurement light source provided in the FT spectrometer D is used as the bias light, the measurement light is reflected in accordance with the irradiation direction of the bright line light, and the measurement light as the bias light is incident on the incident aperture 1a. Incident.

  In addition, a cover glass may be arrange | positioned in the irradiation opening 722 and / or the through-opening 741 for dust prevention, for example. Here, A and / or B means at least one of A and B.

  In the attachment ATb of the second mode having such a configuration, the bright line light emitted from the bright line light source 71 is incident on the incident opening 1a via the condensing optical system 73, the irradiation opening 722, and the through opening 741, and the FT. The measurement light OP1 emitted from the measurement light source of the type spectrometer D is reflected by the reflection region 742, and enters the incident aperture 1a as the bias light OP2 in accordance with the emission direction of the bright line light.

  Therefore, in the FT spectrometer D including the attachment ATb of the second aspect as described above, since the through opening 741 and the reflection region 742 are disposed adjacent to each other, the through opening 741 and the reflection region 742 are simultaneously incident. The attachment ATb can be attached to the FT spectrometer D so as to face the opening 1a. For this reason, the FT spectrometer D and the attachment ATb are radiated from the measurement light source of the FT spectrometer D by causing the bright line light emitted through the irradiation opening 722 to enter the through opening 741. The measurement light can be incident on the interferometer 11 as bias light, and the bright line light emitted from the bright line light source 71 can be incident on the interferometer 11. The FT spectrometer D and the attachment ATb have an opening area of the through-opening 741 facing the incident opening 1a and a reflecting region facing the incident opening 1a by adjusting the mounting position of the reflecting member 74 of the attachment ATb. The ratio of the reflection area of 742 can be adjusted, and the ratio of the amount of bright line light incident on the interferometer 11 from the incident aperture 1a and the amount of bias light incident on the interferometer 11 from the incident aperture 1a is adjusted. can do. Therefore, the FT spectrometer and the attachment ATb having such a configuration can obtain an interferogram capable of detecting the bright line while detecting the center burst even when the bias light is superimposed on the bright line light.

  Since the attachment ATb of the second aspect includes the condensing optical system 73, it is possible to make the bright line light with a larger amount of light incident on the interferometer 11, and to improve the SN ratio.

  Further, the attachment ATc of the third aspect is an apparatus that is used by being disposed on the sample stage 1b in which the incident aperture 1a for allowing predetermined light to enter is incident when the wavelength of the FT spectrometer D is calibrated. The attachments ATa and ATb of the first and second modes used the measurement light of the FT spectrometer D as the bias light, but the attachment ATc of the third mode is a bias that emits not only the bright line light source but also the bias light. A light source is also provided. Such an attachment ATc of the third aspect includes, for example, an emission line light source 81, a bias light source 82, a superimposing optical system 83, and a housing 84 as shown in FIG.

  The bright line light source 81 is the same as the bright line light source 61, and is a light source device that emits bright line light having a bright line spectrum including one or a plurality of bright lines with known wavelengths. In the present embodiment, the bright line light source 81 is, for example, a pen-type low-pressure xenon lamp, similarly to the bright line light source 61.

  The bias light source 82 is a light source device that emits bias light having a continuous spectrum. As the bias light source 82, an appropriate lamp that emits light in a wavelength band used as bias light is used. For example, in the present embodiment, a halogen lamp is used.

  The superimposing optical system 83 is an optical system for superimposing the bright line light emitted from the bright line light source 81 and the bias light emitted from the bias light source 82 on each other. In the present embodiment, the bright line light source 81 and the bias light source 82 are respectively disposed in the casing 84 so that the optical axes are orthogonal to each other. For this reason, the superimposing optical system 83 includes, for example, A semi-transparent mirror (half mirror) 83 is arranged so that the bright line light and the bias light are incident at an incident angle of 45 degrees at a position where the respective optical axes intersect at right angles.

  The housing 84 is a substantially rectangular parallelepiped box that houses the bright line light source 81, the bias light source 82, and the superimposing optical system 83. On one main surface of the housing 84, an irradiation opening 841 for irradiating the bright line light emitted from the bright line light source 81 and the bias light emitted from the bias light source 82 superimposed on the superimposing optical system 83 to the outside. Is formed.

  In such an attachment ATc of the third aspect, the bright line light OP3 emitted from the bright line light source 81 passes through the semi-transparent mirror 83, enters the incident opening 1a through the irradiation opening 722, and from the bias light source 82. The emitted bias light OP2 is reflected by the semi-transparent mirror 83 so that the optical path thereof is bent in the irradiation direction of the bright line light OP3, and enters the incident opening 1a through the irradiation opening 722 in accordance with the irradiation direction of the bright line light OP3. .

  Such an attachment ATc of the third aspect can provide the bright line light source 81 and the bias light source 82 by being externally attached. Therefore, even when the FT spectrometer does not include the measurement light source, wavelength calibration can be performed. On the other hand, when the FT spectrometer includes the measurement light source, it is suitable for the emission line spectrum of the emission line light. The light having a continuous spectrum different from the continuous spectrum of the measurement light can be used as the bias light. For example, the bias light preferably has a continuous spectrum in which the intensity at a position (wavelength, wave number) corresponding to the position (wavelength, wave number) of the bright line in the bright line light is relatively small.

  Note that the attachment TAa of the first aspect and the attachment TAc of the third aspect are also arranged before the irradiation opening 622 from the pen-type low-pressure xenon lamp 61 as the bright line light source 61, similarly to the attachment ATb of the second aspect shown in FIG. In addition, a condensing optical system that condenses the bright line light emitted from the pen-type low-pressure xenon lamp 61 may be further provided.

  In the above description, the FT spectrometer D is a reflection type that obtains the spectrum of reflected light reflected by the sample SM to be measured, but is a transmission type that obtains the spectrum of transmitted light that has passed through the sample SM to be measured. There may be. In such a transmission-type FT spectrometer, the measurement light source is disposed at a position facing the entrance opening, and the sample SM is disposed on the sample stage between the measurement light source and the entrance opening. Therefore, when performing wavelength calibration, if the attachment AT is placed on the sample stage between the measurement light source and the incident aperture instead of the sample SM, the measurement light from the measurement light source may not enter the incident aperture. There is. Even in such a case, since the attachment ATc of the third mode shown in FIG. 10 includes the bias light source 82, wavelength calibration can be performed, which is suitable for the transmission type FT spectrometer.

  In the above description, the bright line light sources 61, 71, 81 are provided in the attachments ATa, ATb, ATc in the FT spectrometer D, but may be provided in the housing 1 of the FT spectrometer D. .

  In order to express the present invention, the present invention has been properly and fully described through the embodiments with reference to the drawings. However, those skilled in the art can easily change and / or improve the above-described embodiments. It should be recognized that this is possible. Therefore, unless the modifications or improvements implemented by those skilled in the art are at a level that departs from the scope of the claims recited in the claims, the modifications or improvements are not covered by the claims. To be construed as inclusive.

D Fourier transform spectrometer SM Samples ATa, ATb, ATc Attachment for Fourier transform spectrometer 11 Interferometer 41 Control calculation section 411 Sampling data storage section 412 Center burst position calculation section 413 Interferogram calculation section 414 Spectrum calculation section 415 Wavelength Calibration unit 416 Storage unit

Claims (14)

A plurality of optical elements that form two optical paths between the incident position of the predetermined light and the interference position, and the plurality of optical elements move in the optical axis direction by moving in the optical axis direction; An interferometer including an optical path difference forming optical element that generates an optical path difference between two optical paths;
An interferogram calculating unit for obtaining an integrated interferogram by integrating a plurality of interferograms of the predetermined light generated by the interferometer;
A wavelength calibration unit that performs wavelength calibration for associating a Fourier transform result obtained by Fourier transforming the integrated interferogram obtained by the interferogram calculation unit with an actual wavelength value;
Based on the wavelength calibration result by the wavelength calibration unit, comprising a spectrum calculation unit for obtaining a spectrum by Fourier transforming the integrated interferogram obtained by the interferogram calculation unit,
The wavelength calibration unit includes a first spectrum obtained by the spectrum calculation unit by causing a bright line light having a bright line spectrum including one or a plurality of bright lines and a bias light having a continuous spectrum to enter the interferometer as the predetermined light. And obtaining the emission line spectrum of the emission line light by obtaining a difference from the second spectrum obtained by the spectrum calculation unit by making the bias light incident on the interferometer as the predetermined light, and obtaining the obtained A Fourier transform spectrometer characterized by performing the wavelength calibration based on a bright line peak included in a bright line spectrum. The Fourier transform spectrometer according to claim 1 is a reflection type for obtaining a spectrum of reflected light reflected by the sample to be measured,
A measurement light source unit that emits measurement light having a continuous spectrum for irradiating the sample to be measured;
The Fourier transform spectrometer, wherein the measurement light is also used as the bias light. The Fourier transform spectrometer according to claim 2,
Further comprising an attachment for a Fourier transform spectrometer used by being placed on a sample stage in which an incident aperture for allowing the predetermined light to enter is used,
The Fourier transform spectrometer attachment is:
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A housing for accommodating the bright line light source,
The casing is formed on the surface of an irradiation opening for irradiating the emission line light emitted from the emission line light source to the outside, and in a region adjacent to the irradiation opening, and emits light in a wavelength band included in the bias light. A Fourier transform spectrometer characterized by comprising a reflective region for reflection. The Fourier transform spectrometer according to claim 2,
Further comprising an attachment for a Fourier transform spectrometer used by being placed on a sample stage in which an incident aperture for allowing the predetermined light to enter is used,
The Fourier transform spectrometer attachment is:
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A housing in which the emission line light source is housed and an irradiation opening for irradiating the emission line light emitted from the emission line light source to the outside is formed;
A Fourier transform spectrometer comprising: a through-opening; and a reflecting member that is formed on a surface of a region adjacent to the through-opening and includes a reflective region that reflects light in a wavelength band included in the bias light. The Fourier transform spectrometer according to claim 1,
Further comprising an attachment for a Fourier transform spectrometer used by being placed on a sample stage in which an incident aperture for allowing the predetermined light to enter is used,
The Fourier transform spectrometer attachment is:
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A bias light source that emits a bias light having a continuous spectrum;
A housing that accommodates the bright line light source and the bias light source, and that has an emission opening for radiating the bright line light emitted from the bright line light source and the bias light emitted from the bias light source to the outside; This is a Fourier transform spectrometer. In the Fourier transform spectrometer according to any one of claims 3 to 5,
The Fourier transform spectrometer attachment is:
A Fourier transform spectrometer, further comprising a condensing optical system that is disposed before the irradiation opening from the bright line light source and collects the bright line light emitted from the bright line light source. In the Fourier transform spectrometer according to claim 1 or 2,
A Fourier transform spectrometer, further comprising: an emission line light source that emits emission line light having an emission line spectrum including one or more emission lines. The Fourier transform spectrometer according to any one of claims 3 to 7,
The bright line light source is a low-pressure xenon lamp. The Fourier transform spectrometer according to any one of claims 1 to 8,
The Fourier transform spectrometer according to claim 1, wherein the predetermined light is near-infrared light having a wavelength of 800 nm or more incident as a measurement target. A Fourier transform spectrometer used in combination with the Fourier transform spectrometer by being disposed on a sample stage in which an incident aperture for allowing the predetermined light to enter is provided in the Fourier transform spectrometer according to claim 2. Attachment for
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A housing for accommodating the bright line light source,
The casing is formed on the surface of an irradiation opening for irradiating the emission line light emitted from the emission line light source to the outside, and in a region adjacent to the irradiation opening, and emits light in a wavelength band included in the bias light. An attachment for a Fourier transform spectrometer, comprising a reflective region for reflection. A Fourier transform spectrometer used in combination with the Fourier transform spectrometer by being disposed on a sample stage in which an incident aperture for allowing the predetermined light to enter is provided in the Fourier transform spectrometer according to claim 2. Attachment for
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A housing in which the emission line light source is housed and an irradiation opening for irradiating the emission line light emitted from the emission line light source to the outside is formed;
A Fourier transform spectrometer comprising: a through-opening; and a reflective member that is formed on a surface of a region adjacent to the through-opening and includes a reflective region that reflects light in a wavelength band included in the bias light. attachment. A Fourier transform spectrometer used in combination with the Fourier transform spectrometer by being arranged on a sample stage in which an incident aperture for allowing the predetermined light to enter is arranged in the Fourier transform spectrometer according to claim 1. Attachment for
An emission line light source that emits emission line light having an emission line spectrum including one or more emission lines;
A bias light source that emits a bias light having a continuous spectrum;
A housing that accommodates the bright line light source and the bias light source, and that has an emission opening for radiating the bright line light emitted from the bright line light source and the bias light emitted from the bias light source to the outside; An attachment for a Fourier transform spectrometer. The attachment for a Fourier transform spectrometer according to any one of claims 10 to 12,
The Fourier transform spectrometer attachment, further comprising a condensing optical system that is disposed before the irradiation opening from the bright line light source and collects the bright line light emitted from the bright line light source. A plurality of optical elements that form two optical paths between predetermined light incident positions and interference positions are provided, and the plurality of optical elements are moved in the optical axis direction to move the two light elements. An incident step of entering an interferometer including an optical path difference forming optical element that generates an optical path difference between the optical paths of
An interferogram calculating step for obtaining an integrated interferogram by integrating a plurality of interferograms of the predetermined light generated by the interferometer;
A wavelength calibration step for performing wavelength calibration for associating a Fourier transform result obtained by Fourier transforming the integrated interferogram obtained by the interferogram calculation step with an actual wavelength value;
A spectrum calculation step for obtaining a spectrum of the predetermined light by Fourier transforming an integrated interferogram obtained by the interferogram calculation step based on a wavelength calibration result by the wavelength calibration step;
In the wavelength calibration step, a first spectrum is obtained in the spectrum calculation step by causing a bright line light having a bright line spectrum including one or a plurality of bright lines and a bias light having a continuous spectrum to enter the interferometer as the predetermined light. A first spectrum calculation sub-step; a second spectrum calculation sub-step of obtaining a second spectrum in the spectrum calculation step by causing the bias light to be incident on the interferometer as the predetermined light; and A bright line spectrum calculation sub-step for obtaining the bright line spectrum of the bright line light by obtaining a difference from the second spectrum, and a wavelength calibration sub-step for performing the wavelength calibration based on a bright line peak included in the obtained bright line spectrum; A Fourier transform type spectroscopic method characterized by comprising:

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