JP2013235251A - Resist composition and method for producing resist pattern - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a resist composition for producing a resist pattern with excellent focus margin (DOF).SOLUTION: A resist composition includes (A) resin which is insoluble or poorly soluble in alkali aqueous solution but becomes soluble in the alkali aqueous solution by the action of acid, (B) an acid generator represented by formula (II) and (D) a compound represented by formula (I), where Rand Rrepresent a hydrocarbon group, an alkoxy group, an acyl group, an acyloxy group, an alkoxycarbonyl group, a nitro group or a halogen atom respectively; m' and n' represent an integer of 0-4 respectively; Rand Rrepresent a fluorine atom or a perfluoroalkyl group respectively; Lrepresents a divalent saturated hydrocarbon group; a ring Wrepresents a heterocycle; Rrepresents a hydrogen atom or a hydrocarbon group; Rrepresents a hydrocarbon group; s represents an integer of 0-6; and Zrepresents an organic cation.

Description

  The present invention relates to a resist composition, a method for producing a resist pattern using the resist composition, and the like.

  Patent Document 1 describes a resist composition comprising a resin, an acid generator, a quencher composed of 2,6-diisopropylaniline, and a solvent.

JP 2006-257078 A

  Conventional resist compositions may not always satisfy the focus margin (DOF) at the time of producing a resist pattern.

［式（Ｉ）中、
Ｒ^Ｄ１及びＲ^Ｄ２は、それぞれ独立に、炭素数１〜１２の炭化水素基、炭素数１〜６のアルコキシ基、炭素数２〜７のアシル基、炭素数２〜７のアシルオキシ基、炭素数２〜７のアルコキシカルボニル基、ニトロ基又はハロゲン原子を表す。
ｍ’及びｎ’は、それぞれ独立に、０〜４の整数を表し、ｍ’が２以上の場合、複数のＲ^Ｄ１は同一又は互いに相異なり、ｎ’が２以上の場合、複数のＲ^Ｄ２は同一又は互いに相異なる。］

［式（ＩＩ）中、
Ｒ^ｂ１及びＲ^ｂ２は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^ｂ１は、炭素数１〜１７の２価の飽和炭化水素基を表し、該２価の飽和炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
環Ｗ^ｂ１は、炭素数２〜３６の複素環を表す。
Ｒ^ｂ３は、水素原子又は炭素数１〜１２の炭化水素基を表し、該炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
Ｒ^ｂ４は、炭素数１〜６の炭化水素基を表し、該炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
ｓは、０〜６の整数を表し、ｓが２以上の場合、複数のＲ^ｂ４は同一又は相異なる。
Ｚ１^＋は、有機カチオンを表す。］
［２］Ｌ^ｂ１が、式（Ｌ１−１）で表される基である［１］記載のレジスト組成物。

［式（Ｌ１−１）中、Ｌ^ｂ２は、単結合又は炭素数１〜１５の２価の飽和炭化水素基を表す。＊は−Ｃ（Ｒ^ｂ１）（Ｒ^ｂ２）−との結合手を表す。］
［３］さらに溶剤を含有する［１］又は［２］記載のレジスト組成物。
［４］（１）［１］〜［３］のいずれか記載のレジスト組成物を基板上に塗布する工程、
（２）塗布後の組成物を乾燥させて組成物層を形成する工程、
（３）組成物層を露光する工程、
（４）露光後の組成物層を加熱する工程及び
（５）加熱後の組成物層を現像する工程を含むレジストパターンの製造方法。 The present invention includes the following inventions.
[1] (A) a resin having an acid labile group,
(B) A resist composition containing an acid generator represented by formula (II) and (D) a compound represented by formula (I).

[In the formula (I),
R ^D1 and R ^D2 are each independently a hydrocarbon group having 1 to 12 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 7 carbon atoms, an acyloxy group having 2 to 7 carbon atoms, or a carbon number Represents 2 to 7 alkoxycarbonyl groups, nitro groups or halogen atoms.
m ′ and n ′ each independently represents an integer of 0 to 4. When m ′ is 2 or more, a plurality of R ^D1 are the same or different from each other, and when n ′ is 2 or more, a plurality of R ^D2 Are the same or different from each other. ]

[In the formula (II),
R ^b1 and R ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and —CH ₂ — contained in the divalent saturated hydrocarbon group may be replaced by —O— or —CO—. .
Ring ^{W b1} represents a heterocycle of the C 2 to C 36.
R ^b3 represents a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
R ^b4 represents a hydrocarbon group having 1 to 6 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
s represents an integer of 0 to 6, and when s is 2 or more, the plurality of R ^b4 are the same or different.
Z1 ⁺ represents an organic cation. ]
[2] The resist composition according to [1], wherein L ^b1 is a group represented by the formula (L1-1).

[In Formula (L1-1), L ^b2 represents a single bond or a divalent saturated hydrocarbon group having 1 to 15 carbon atoms. * Represents a bond with —C (R ^b1 ) (R ^b2 ) —. ]
[3] The resist composition according to [1] or [2], further containing a solvent.
[4] (1) A step of applying the resist composition according to any one of [1] to [3] on a substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) A method for producing a resist pattern, comprising a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating.

  According to the resist composition of the present invention, a resist pattern can be produced with an excellent focus margin (DOF).

In this specification, "(meth) acrylic monomer" means at least one monomer having the structure of "CH ₂ = CH-CO-" or _{"CH 2 = C (CH 3)} -CO- " To do. Similarly, “(meth) acrylate” and “(meth) acrylic acid” mean “at least one of acrylate and methacrylate” and “at least one of acrylic acid and methacrylic acid”, respectively.

<Resist composition>
The resist composition of the present invention comprises:
(A) a resin having an acid labile group (hereinafter sometimes referred to as “resin (A)”),
(B) an acid generator represented by formula (II) (hereinafter sometimes referred to as “acid generator (II)”) and (D) a compound represented by formula (I) (hereinafter “compound (I)”). In some cases).
It is preferable that the resist composition of the present invention further contains a solvent (E).

<Resin (A)>
The resin (A) is a resin having an acid labile group. The resin having an acid labile group is derived from one or more monomers having an acid labile group (hereinafter sometimes referred to as “acid labile monomer (a1)”).
Moreover, as long as the resin (A) has the acid labile group described above, the resin (A) may contain a structural unit derived from an acid-stable monomer described later, a structural unit derived from a monomer known in the art, and the like.

<Monomer (a1) having acid labile group>
The monomer (a1) having an acid labile group is a monomer having at least an acid labile group. Examples of the acid labile group include a group represented by the formula (1) and a group represented by the formula (2).

［式（１）中、Ｒ^a1〜Ｒ^a3は、それぞれ独立に、炭素数１〜８のアルキル基又は炭素数３〜２０の脂環式炭化水素基を表すか、Ｒ^a1及びＲ^a2は互いに結合して炭素数２〜２０の２価の炭化水素基を形成する。＊は結合手を表す。］

［式（２）中、Ｒ^a1'及びＲ^a2'は、それぞれ独立に、水素原子又は炭素数１〜１２の炭化水素基を表し、Ｒ^a3'は、炭素数１〜２０の炭化水素基を表すか、Ｒ^a2'及びＲ^a3'は互いに結合して炭素数２〜２０の２価の炭化水素基を形成し、該炭化水素基及び該２価の炭化水素基に含まれる−ＣＨ_２−は、−Ｏ―又は―Ｓ−で置き換わってもよい。］

In Expression (1), R ^a1 ~R ^a3 each independently represent a cycloaliphatic hydrocarbon radical of the alkyl group or 3 to 20 carbon atoms having 1 to 8 carbon atoms, R ^a1 and R ^a2 are each Bonding to form a divalent hydrocarbon group having 2 to 20 carbon atoms. * Represents a bond. ]

[In Formula (2), R ^{a1 ′} and R ^{a2 ′} each independently represent a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and R ^{a3 ′} represents a hydrocarbon group having 1 to 20 carbon atoms. R ^{a2 ′} and R ^{a3 ′} are bonded to each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms, and —CH ₂ — contained in the hydrocarbon group and the divalent hydrocarbon group. May be replaced by -O- or -S-. ]

アルキル基で置換された脂環式炭化水素基としては、例えば、メチルシクロヘキシル基、ジメチルシクロへキシル基、メチルノルボルニル基等が挙げられる。
式（１）においては、Ｒ^a1〜Ｒ^a3の脂環式炭化水素基は、好ましくは炭素数３〜１６である。 ^Examples of the alkyl group represented by R ^{a1 to} R ^a3 include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, and an octyl group.
The alicyclic hydrocarbon group may be monocyclic or polycyclic, and the hydrogen atom contained in the alicyclic hydrocarbon group may be substituted with an alkyl group. In this case, the carbon number of the alicyclic hydrocarbon group is 20 or less including the carbon number of the alkyl group.
Examples of the monocyclic alicyclic hydrocarbon group include cycloalkyl groups such as a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the polycyclic alicyclic hydrocarbon group include a decahydronaphthyl group, an adamantyl group, a norbornyl group, and the following groups (* represents a bond).

Examples of the alicyclic hydrocarbon group substituted with an alkyl group include a methylcyclohexyl group, a dimethylcyclohexyl group, and a methylnorbornyl group.
In Formula (1), the alicyclic hydrocarbon group of R ^{a1 to} R ^a3 preferably has 3 to 16 carbon atoms.

Examples of —C (R ^a1 ) (R ^a2 ) (R ^a3 ) in the case where R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group include the following groups. The divalent hydrocarbon group preferably has 3 to 12 carbon atoms. * Represents a bond with -O-.

Examples of the acid labile group represented by the formula (1) include a 1,1-dialkylalkoxycarbonyl group (in the formula (1), R ^{a1 to} R ^a3 are alkyl groups, preferably tert- Butoxycarbonyl group), 2-alkyladamantan-2-yloxycarbonyl group (in the formula (1), R ^a1 , R ^a2 and a carbon atom form an adamantyl group, and R ^a3 is an alkyl group) and 1- (Adamantan-1-yl) -1-alkylalkoxycarbonyl group (in the formula (1), R ^a1 and R ^a2 are alkyl groups, and R ^a3 is an adamantyl group).

Examples of the hydrocarbon group for R ^{a1 ′ to} R ^{a3 ′} include an alkyl group, an alicyclic hydrocarbon group, and an aromatic hydrocarbon group.
Examples of the alkyl group and alicyclic hydrocarbon group are the same as those described above.
Aromatic hydrocarbon groups include phenyl, naphthyl, anthryl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, cumenyl, mesityl, biphenyl Groups, phenanthryl groups, 2,6-diethylphenyl groups, aryl groups such as 2-methyl-6-ethylphenyl, and the like.
Examples of the divalent hydrocarbon group formed by combining R ^{a2 ′} and R ^{a3 ′} include a divalent aliphatic hydrocarbon group.
In Formula (2), it is preferable that at least one of R ^{a1 ′} and R ^{a2 ′} is a hydrogen atom.
Specific examples of the group represented by the formula (2) include the following groups. * Represents a bond.

  The acid labile monomer (a1) is preferably a monomer having an acid labile group and an ethylenically unsaturated bond, more preferably a (meth) acrylic monomer having an acid labile group.

  Among the (meth) acrylic monomers having an acid labile group, those having an alicyclic hydrocarbon group having 5 to 20 carbon atoms are preferable. If a resin obtained by polymerizing an acid labile monomer (a1) having a bulky structure such as an alicyclic hydrocarbon group is used, the resolution of the resist pattern can be improved.

  The (meth) acrylic monomer having an acid labile group and an alicyclic hydrocarbon group is preferably a monomer for deriving a structural unit represented by formula (a1-1) or represented by formula (a1-2). And a monomer that induces a structural unit. These may be used alone or in combination of two or more. In this specification, the structural unit represented by the formula (a1-1) and the structural unit represented by the formula (a1-2) are represented by the structural unit (a1-1) and the structural unit (a1-2), respectively. The monomer that derives the structural unit (a1-1) and the monomer that derives the structural unit (a1-2) may be referred to as a monomer (a1-1) and a monomer (a1-2), respectively.

［式（ａ１−１）及び式（ａ１−２）中、
Ｌ^a1及びＬ^a2は、それぞれ独立に、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k1−ＣＯ−Ｏ−を表し、ｋ１は１〜７の整数を表し、＊は−ＣＯ−との結合手を表す。
Ｒ^a4及びＲ^a5は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a6及びＲ^a7は、それぞれ独立に、炭素数１〜８のアルキル基又は炭素数３〜１０の脂環式炭化水素基を表す。
ｍ１は０〜１４の整数を表す。
ｎ１は０〜１０の整数を表す。
ｎ１’は０〜３の整数を表す。］

[In Formula (a1-1) and Formula (a1-2),
L ^a1 and L ^a2 each independently represent —O— or ^* —O— (CH ₂ ) _k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bond to —CO—. Represents a hand.
R ^a4 and R ^a5 each independently represent a hydrogen atom or a methyl group.
R ^a6 and R ^a7 each independently represent an alkyl group having 1 to 8 carbon atoms or an alicyclic hydrocarbon group having 3 to 10 carbon atoms.
m1 represents the integer of 0-14.
n1 represents an integer of 0 to 10.
n1 ′ represents an integer of 0 to 3. ]

L ^a1 and L ^a2 are preferably —O— or ^* —O— (CH ₂ ) _k1 —CO—O—, more preferably —O—. k1 is preferably an integer of 1 to 4, more preferably 1.
R ^a4 and R ^a5 are preferably methyl groups.
^Examples of the alkyl group for R ^a6 and R ^a7 include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, and an octyl group. The alkyl group for R ^a6 and R ^a7 preferably has 6 or less carbon atoms.
The alicyclic hydrocarbon group for R ^a6 and R ^a7 may be monocyclic or polycyclic, and the hydrogen atom contained in the alicyclic hydrocarbon group may be substituted with an alkyl group. . In this case, the carbon number of the alicyclic hydrocarbon group is 10 or less including the carbon number of the alkyl group. Specific examples include the same groups as the alicyclic hydrocarbon groups represented by R ^{a1 to} R ^{a3 in} the formula (1).
The alicyclic hydrocarbon group preferably has 8 or less carbon atoms, more preferably 6 or less.
m1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 ′ is preferably 0 or 1.

As a monomer (a1-1), the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned, for example. Monomers respectively represented by formula (a1-1-1) to formula (a1-1-8) are preferred, and monomers represented by formula (a1-1-1) to formula (a1-1-4) are preferred. More preferred.

Examples of the monomer (a1-2) include 1-ethylcyclopentan-1-yl (meth) acrylate, 1-ethylcyclohexane-1-yl (meth) acrylate, and 1-ethylcycloheptan-1-yl (meth). Examples include acrylate, 1-methylcyclopentan-1-yl (meth) acrylate, and 1-isopropylcyclopentan-1-yl (meth) acrylate. Monomers respectively represented by formula (a1-2-1) to formula (a1-2-12) are preferred, and are represented by formula (a1-2-3), formula (a1-2-4), and formula (a1-2-2). 9) and monomers represented by formula (a1-2-10) are more preferable, and monomers represented by formula (a1-2-3) and formula (a1-2-9) are more preferable.

  When the resin (A) contains the structural unit (a1-1) and / or the structural unit (a1-2), the total content thereof is usually 10 to 95 mol with respect to all the structural units of the resin (A). %, Preferably 15 to 90 mol%, more preferably 20 to 85 mol%.

式（ａ１−５）中、
Ｒ^３１は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ｌ^１〜Ｌ^３は、酸素原子、硫黄原子又は^＊−Ｏ−（ＣＨ₂）_k1−ＣＯ−Ｏ−で表される基を表す。ここで、ｋ１は１〜７の整数を表し、＊はカルボニル基（−ＣＯ−）との結合手である。
Ｚ^１は、単結合又は炭素数１〜６のアルカンジイル基であり、該アルカンジイル基中に含まれるメチレン基は、オキシ基又はカルボニル基に置き換わっていてもよい。
ｓ１及びｓ１’は、それぞれ独立して、０〜４の整数を表す。 As another acid labile monomer (a1), for example, a monomer represented by formula (a1-5) which is a (meth) acrylic monomer having an acid labile group (hereinafter referred to as “monomer (a1-5)”) May be used).

In formula (a1-5),
R ³¹ represents a C 1-6 alkyl group which may have a halogen atom, a hydrogen atom or a halogen atom.
L ^{1 to} L ³ represent an oxygen atom, a sulfur atom, or a group represented by ^* —O— (CH ₂ ) _k1 —CO—O—. Here, k1 represents an integer of 1 to 7, and * is a bond with a carbonyl group (—CO—).
Z ¹ is a single bond or an alkanediyl group having 1 to 6 carbon atoms, and the methylene group contained in the alkanediyl group may be replaced with an oxy group or a carbonyl group.
s1 and s1 ′ each independently represents an integer of 0 to 4.

In formula (a1-5), R ³¹ is preferably a hydrogen atom, a methyl group, or a trifluoromethyl group.
L ¹ is preferably an oxygen atom.
One of L ² and L ³ is preferably an oxygen atom and the other is a sulfur atom.
s1 is preferably 1.
s1 ′ is preferably an integer of 0 to 2.
Z ¹ is preferably a single bond or —CH ₂ —CO—O—.

Examples of the monomer (a1-5) include the following monomers.

  When the resin (A) has a structural unit derived from the monomer (a1-5), the content thereof is preferably in the range of 1 to 50 mol% with respect to all the structural units of the resin (A). The range of 45 mol% is more preferable, and the range of 5 to 40 mol% is more preferable.

<Acid stable monomer>
As an acid stable monomer, Preferably, the monomer which has a hydroxyl group or a lactone ring is mentioned. Acid stable monomer having a hydroxy group (hereinafter sometimes referred to as “acid stable monomer having a hydroxy group (a2)”) or acid stable monomer having a lactone ring (hereinafter referred to as “acid stable monomer having a lactone ring (a3)”) If a resin having a structural unit derived from (sometimes) is used, the resolution of the resist pattern and the adhesion to the substrate can be improved.

<Acid-stable monomer having a hydroxy group (a2)>
When the resist composition is used for KrF excimer laser exposure (248 nm), high energy beam exposure such as electron beam or EUV light, the acid-stable monomer (a2) having a hydroxy group is preferably a phenolic hydroxy which is a hydroxystyrene. An acid-stable monomer having a group is used. When using short-wavelength ArF excimer laser exposure (193 nm) or the like, the acid-stable monomer (a2) having a hydroxy group is preferably an acid-stable monomer having a hydroxyadamantyl group represented by the formula (a2-1). use. The acid-stable monomer (a2) having a hydroxy group may be used alone or in combination of two or more.

式（ａ２−１）中、
Ｌ^a3は、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k2−ＣＯ−Ｏ−を表し、
ｋ２は１〜７の整数を表す。＊は−ＣＯ−との結合手を表す。
Ｒ^a14は、水素原子又はメチル基を表す。
Ｒ^a15及びＲ^a16は、それぞれ独立に、水素原子、メチル基又はヒドロキシ基を表す。
ｏ１は、０〜１０の整数を表す。 Examples of the acid stable monomer having a hydroxyadamantyl group include a monomer represented by the formula (a2-1).

In formula (a2-1),
L ^a3 represents —O— or ^* —O— (CH ₂ ) _k2 —CO—O—,
k2 represents an integer of 1 to 7. * Represents a bond with -CO-.
R ^a14 represents a hydrogen atom or a methyl group.
R ^a15 and R ^a16 each independently represent a hydrogen atom, a methyl group or a hydroxy group.
o1 represents an integer of 0 to 10.

In the formula (a2-1), L ^a3 is preferably, -O -, - O- (CH 2) f1 -CO-O- and is (wherein f1 is an integer from 1 to 4), more preferably Is —O—.
R ^a14 is preferably a methyl group.
R ^a15 is preferably a hydrogen atom.
R ^a16 is preferably a hydrogen atom or a hydroxy group.
o1 is preferably an integer of 0 to 3, more preferably 0 or 1.

As an acid stable monomer (a2-1) which has a hydroxyadamantyl group, the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned, for example. Monomers represented by formula (a2-1-1) to formula (a2-1-6) are preferred, and monomers represented by formula (a2-1-1) to formula (a2-1-4) are more preferred. The monomer represented by formula (a2-1-1) or formula (a2-1-3) is more preferable.

  When the resin (A) includes a structural unit derived from the monomer represented by the formula (a2-1), the content is usually 1 to 45 mol% with respect to all the structural units of the resin (A). The amount is preferably 1 to 40 mol%, more preferably 2 to 35 mol%, and still more preferably 2 to 20 mol%.

<Acid-stable monomer having a lactone ring (a3)>
The lactone ring possessed by the acid stable monomer (a3) may be, for example, a monocycle such as a β-propiolactone ring, γ-butyrolactone ring, or δ-valerolactone ring, and a monocyclic lactone ring and other rings The condensed ring may be used. Among these lactone rings, a γ-butyrolactone ring or a condensed ring of γ-butyrolactone ring and another ring is preferable.

  The acid-stable monomer (a3) having a lactone ring is preferably represented by the formula (a3-1), the formula (a3-2) or the formula (a3-3). These 1 type may be used independently and may use 2 or more types together.

式（ａ３−１）〜式（ａ３−３）中、
Ｌ^a4〜Ｌ^a6は、それぞれ独立に、−Ｏ−又は^＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−を表す。
ｋ３は１〜７の整数を表す。＊は−ＣＯ−との結合手を表す。
Ｒ^a18〜Ｒ^a20は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a21は、炭素数１〜４のアルキル基を表す。
ｐ１は０〜５の整数を表す。
Ｒ^a22及びＲ^a23は、それぞれ独立に、カルボキシ基、シアノ基又は炭素数１〜４のアルキル基を表す。
ｑ１及びｒ１は、それぞれ独立に０〜３の整数を表す。ｐ１が２以上のとき、複数のＲ^a21は同一又は相異なり、ｑ１が２以上のとき、複数のＲ^a22は同一又は相異なり、ｒ１が２以上のとき、複数のＲ^a23は、同一又は相異なる。

In formula (a3-1) to formula (a3-3),
L ^{a4 to} L ^a6 each independently represent —O— or ^* —O— (CH ₂ ) _k3 —CO—O—.
k3 represents an integer of 1 to 7. * Represents a bond with -CO-.
R ^{a18 to} R ^a20 each independently represents a hydrogen atom or a methyl group.
R ^a21 represents an alkyl group having 1 to 4 carbon atoms.
p1 represents an integer of 0 to 5.
R ^a22 and R ^a23 each independently represent a carboxy group, a cyano group, or an alkyl group having 1 to 4 carbon atoms.
q1 and r1 each independently represents an integer of 0 to 3. When p1 is 2 or more, a plurality of R ^a21 are the same or different, when q1 is 2 or more, a plurality of R ^a22 are the same or different, and when r1 is 2 or more, a plurality of R ^a23 are the same or different Different.

^Examples of the alkyl group represented by R ^{a21 to} R ^a23 include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, a tert-butyl group, and a sec-butyl group.

In formula (a3-1) to formula (a3-3), L ^{a4 to} L ^a6 are preferably each independently —O— or ^* —O— (CH ₂ ) _k3 —CO—O—, More preferably, it is -O-. k3 is preferably an integer of 1 to 4, more preferably 1.
R ^{a18 to} R ^a21 are preferably methyl groups.
R ^a22 and R ^a23 are each independently preferably a carboxy group, a cyano group or a methyl group.
p1 to r1 are each independently preferably 0 to 2, more preferably 0 or 1.

  Examples of the acid-stable monomer (a3) having a lactone ring include monomers described in JP 2010-204646 A. Formula (a3-1-1) to Formula (a3-1-4), Formula (a3-2-1) to Formula (a3-2-4), Formula (a3-3-1) to Formula (a3-3) -4) is preferable, and each of the monomers represented by formula (a3-1-1), formula (a3-1-2), formula (a3-2-3), and formula (a3-2-4) The monomer represented by Formula (a3-1-1) or Formula (a3-2-3) is more preferable.

  When the resin (A) includes a structural unit derived from the acid-stable monomer (a3) having a lactone ring, the content is usually 5 to 70 mol% with respect to all the structural units of the resin (A), Preferably it is 10-65 mol%, More preferably, it is 10-60 mol%.

When the resin (A) is a copolymer of an acid labile monomer (a1) and an acid stable monomer, the structural unit derived from the acid labile monomer (a1) is based on 100 mol% of all structural units. Preferably it is 10-80 mol%, More preferably, it is 20-60 mol%.
The content of the structural unit derived from the monomer having an adamantyl group (particularly the structural unit represented by the formula (a1-1)) is preferably relative to the total amount of structural units derived from the acid labile monomer (a1). 15 mol% or more. When the ratio of the structural unit having an adamantyl group is increased, the dry etching resistance of the resist pattern is improved.

  The resin (A) is preferably a copolymer of an acid labile monomer (a1) and an acid stable monomer. In this copolymer, the monomer (a1) is more preferably a monomer that induces a structural unit represented by the formula (a1-1) and a monomer that induces a structural unit represented by the formula (a1-2) (preferably Is a monomer for deriving at least one of cyclohexyl group and cyclopentyl group), more preferably a structural unit represented by the formula (a1-1). The acid stable monomer is preferably an acid stable monomer (a2) having a hydroxy group and / or an acid stable monomer (a3) having a lactone ring. The acid-stable monomer (a2) having a hydroxy group is preferably an acid-stable monomer (a2-1) having a hydroxyadamantyl group, and the acid-stable monomer (a3) having a lactone ring is more preferably a γ-butyrolactone ring. The acid-stable monomer (a3-1) and the acid-stable monomer (a3-2) having a condensed ring of a γ-butyrolactone ring and a norbornane ring.

Each structural unit constituting the resin (A) may be used alone or in combination of two or more, and is produced by a known polymerization method (for example, radical polymerization method) using a monomer that derives these structural units. can do.
The weight average molecular weight of the resin (A) is preferably 2,500 or more (more preferably 3,000 or more, more preferably 4,000 or more), 50,000 or less (more preferably 30,000 or less, and further preferably 15,000 or less).

As the resin of the resist composition of the present invention, a resin other than the resin (A) described above, for example, a structural unit derived from an acid stable monomer without containing a structural unit derived from the acid labile monomer (a1) described above. In addition, a resin composed of a structural unit derived from a known monomer used in the field may be contained.
In the resist composition of the present invention, the resin content is preferably 80% by mass or more and 99% by mass or less in the solid content of the resist composition. In the present specification, the “solid content in the composition” means the total of resist composition components excluding the solvent (E) described later. The solid content in the composition and the resin content relative thereto can be measured, for example, by a known analytical means such as liquid chromatography or gas chromatography.

［式（ＩＩ）中、
Ｒ^ｂ１及びＲ^ｂ２は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^ｂ１は、炭素数１〜１７の２価の飽和炭化水素基を表し、該２価の飽和炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
環Ｗ^ｂ１は、炭素数２〜３６の複素環を表す。
Ｒ^ｂ３は、水素原子又は炭素数１〜１２の炭化水素基を表し、該炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
Ｒ^ｂ４は、炭素数１〜６の炭化水素基を表し、該炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
ｓは、０〜６の整数を表し、ｓが２以上の場合、複数のＲ^ｂ４は同一又は相異なる。
Ｚ１^＋は、有機カチオンを表す。］
式（ＩＩ）において、正電荷を有するＺ^１＋で示される有機カチオンを除去してなる負電荷を有するものを「スルホン酸アニオン」ということがある。 <Acid generator (II)>
The acid generator (II) contained in the resist composition of the present invention contains a salt represented by the formula (II).

[In the formula (II),
R ^b1 and R ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and —CH ₂ — contained in the divalent saturated hydrocarbon group may be replaced by —O— or —CO—. .
Ring ^{W b1} represents a heterocycle of the C 2 to C 36.
R ^b3 represents a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
R ^b4 represents a hydrocarbon group having 1 to 6 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
s represents an integer of 0 to 6, and when s is 2 or more, the plurality of R ^b4 are the same or different.
Z1 ⁺ represents an organic cation. ]
In the formula (II), a compound having a negative charge obtained by removing an organic cation represented by Z ¹⁺ having a positive charge may be referred to as a “sulfonate anion”.

Examples of the perfluoroalkyl group for R ^b1 and R ^b2 include trifluoromethyl group, perfluoroethyl group, perfluoropropyl group, perfluoroisopropyl group, perfluorobutyl group, perfluorosec-butyl group, perfluorotert-butyl group, perfluoropentyl group. And perfluorohexyl group.

Examples of the divalent saturated hydrocarbon group for L ^b1 include a linear alkanediyl group, a branched alkanediyl group, a monocyclic or polycyclic divalent alicyclic saturated hydrocarbon group, and these A combination of two or more of the groups may be used.
Specifically, methylene group, ethylene group, propane-1,3-diyl group, propane-1,2-diyl group, butane-1,4-diyl group, pentane-1,5-diyl group, hexane-1 , 6-diyl group, heptane-1,7-diyl group, octane-1,8-diyl group, nonane-1,9-diyl group, decane-1,10-diyl group, undecane-1,11-diyl group , Dodecane-1,12-diyl group, tridecane-1,13-diyl group, tetradecane-1,14-diyl group, pentadecane-1,15-diyl group, hexadecane-1,16-diyl group, heptadecane-1, Linear alkanediyl groups such as 17-diyl group, ethane-1,1-diyl group, propane-1,1-diyl group, propane-2,2-diyl group;
An alkyl group (particularly an alkyl group having 1 to 4 carbon atoms, such as a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, a sec-butyl group, a tert-butyl group); For example, butane-1,3-diyl group, 2-methylpropane-1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1,4-diyl A branched alkanediyl group such as a 2-methylbutane-1,4-diyl group;
Cyclobutane-1,3-diyl group, cyclopentane-1,3-diyl group, cyclohexane-1,2-diyl group, 1-methylcyclohexane-1,2-diyl group, cyclohexane-1,4-diyl group, cyclo A monocyclic alicyclic saturated hydrocarbon group which is a cycloalkanediyl group such as an octane-1,2-diyl group or a cyclooctane-1,5-diyl group;
A polycyclic group such as norbornane-2,3-diyl group, norbornane-1,4-diyl group, norbornane-2,5-diyl group, adamantane-1,5-diyl group, adamantane-2,6-diyl group, etc. An alicyclic saturated hydrocarbon group etc. are mentioned.
The divalent alicyclic hydrocarbon group may be a group obtained by removing any one hydrogen atom from a monovalent alicyclic hydrocarbon group described later.

The heterocyclic ring of the ring W ^b1 may be one containing one or more nitrogen atoms, and may further contain one or more oxygen atoms, one or more sulfur atoms, and the like. The heterocyclic ring may be an aromatic heterocyclic ring, or may have no aromaticity, and may be a monocyclic, polycyclic, condensed ring or bridged ring. .
Examples of the heterocyclic ring include the following rings. However, —CH ₂ — contained in these heterocyclic rings may be replaced by —O— or —CO—. Among these, a ring represented by the formula (W1), a ring represented by the formula (W2), and a ring represented by the formula (W3) are preferable. * Represents a bond to L ^b1 .

Examples of the hydrocarbon group for R ^b3 and R ^b4 include an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and a group obtained by combining these.
Examples of the aliphatic hydrocarbon group include methyl, ethyl, n-propyl, isopropyl, n-butyl, tert-butyl, 2,2-dimethylethyl, 1-methylpropyl, and 2-methylpropyl. Group, 1,2-dimethylpropyl group, 2,2-dimethylpropyl group, 1-ethylpropyl group, n-pentyl group, 1-methylbutyl group, 2-methylbutyl group, 3-methylbutyl group, n-hexyl group, 1 -Propylbutyl group, pentyl group, 1-methylpentyl group, 1,4-dimethylhexyl group, heptyl group, 1-methylheptyl group, octyl group, methyloctyl group, methylnonyl group, 2-ethylhexyl group, nonyl group, decyl And alkyl groups such as a group, an undecyl group, and a dodecyl group.

脂肪族炭化水素基と脂環式炭化水素基とを組み合わせた基としては、例えば、メチルシクロヘキシル基、ジメチルシクロへキシル基、メチルノルボルニル基等が挙げられる。
芳香族炭化水素基としては、フェニル基、ナフチル基、ｐ−メチルフェニル基、ｐ−エチルフェニル基、ｐ−ｔｅｒｔ−ブチルフェニル基、ｐ−シクロへキシルフェニル基、ｐ−アダマンチルフェニル基、トリル基、キシリル基、クメニル基、メシチル基、ビフェニル基、アントリル基、フェナントリル基、２，６−ジエチルフェニル基、２−メチル−６−エチルフェニル等のアリール基等が挙げられる。 The alicyclic hydrocarbon group may be monocyclic or polycyclic. Examples thereof include monocyclic alicyclic hydrocarbon groups such as cycloalkyl groups (for example, cyclopentyl group, cyclohexyl group, cycloheptyl group, cyclooctyl group). Polycyclic groups such as groups obtained by hydrogenating condensed aromatic hydrocarbon groups (for example, hydronaphthyl groups) and bridged cyclic hydrocarbon groups (for example, adamantyl groups, norbornyl groups, groups represented by the following formulas) Of the alicyclic hydrocarbon group.

Examples of the group obtained by combining an aliphatic hydrocarbon group and an alicyclic hydrocarbon group include a methylcyclohexyl group, a dimethylcyclohexyl group, and a methylnorbornyl group.
As aromatic hydrocarbon group, phenyl group, naphthyl group, p-methylphenyl group, p-ethylphenyl group, p-tert-butylphenyl group, p-cyclohexylphenyl group, p-adamantylphenyl group, tolyl group , Aryl groups such as xylyl group, cumenyl group, mesityl group, biphenyl group, anthryl group, phenanthryl group, 2,6-diethylphenyl group, 2-methyl-6-ethylphenyl, and the like.

In the salt represented by the formula (II), R ^b1 and R ^b2 are each independently preferably a trifluoromethyl group or a fluorine atom, more preferably a fluorine atom.

Examples of the group in which —CH ₂ — in the divalent saturated hydrocarbon group of L ^b1 is replaced by —O— or —CO— include formulas (L1-1) to (L1-6). . In addition, Formula (L1-1)-Formula (L1-6) have described the right and left according to Formula (II), and among two bonds represented by *, C (R ^b1 ) (R ^b2 ) — and on the right side with ring W ^b1 . The same applies to specific examples of the following formulas (L1-1) to (L1-6).

式（Ｌ１−１）〜式（Ｌ１−６）中、
Ｌ^b2は、単結合又は炭素数１〜１５の２価の飽和炭化水素基を表す。
Ｌ^b3は、単結合又は炭素数１〜１２の２価の飽和炭化水素基を表す。
Ｌ^b4は、炭素数１〜１３の２価の飽和炭化水素基を表す。
Ｌ^b5は、炭素数１〜１５の２価の飽和炭化水素基を表す。
Ｌ^b6及びＬ^b7は、それぞれ独立に、炭素数１〜１５の２価の飽和炭化水素基を表す。
Ｌ^b8は、炭素数１〜１４の２価の飽和炭化水素基を表す。
Ｌ^b9は、それぞれ独立に、炭素数１〜１１の２価の飽和炭化水素基を表す。
Ｌ^b10は、炭素数１〜１１の２価の飽和炭化水素基を表す。
なかでも、Ｌ^b1は、好ましくは式（Ｌ１−１）〜式（Ｌ１−４）のいずれか、より好ましくは式（Ｌ１−１）又は式（Ｌ１−２）、さらに好ましくは、式（Ｌ１−１）で表される２価の基であり、より好ましくは、Ｌ^b2が単結合又は炭素数１〜６の飽和炭化水素基、つまり、＊−ＣＯ−Ｏ−（ＣＨ_２）_t−（ｔは０〜６の整数を表す。＊は、−Ｃ（Ｑ^１）（Ｑ^２）−との結合手を表す）であり、さらに好ましくは、Ｌ^b2が単結合又はメチレン基である式（ｂ１−１）で表される２価の基、特に好ましくは、Ｌ^b2が単結合である式（ｂ１−１）で表される２価の基、つまり、＊−ＣＯ−Ｏ−である。

In formula (L1-1) to formula (L1-6),
L ^b2 represents a single bond or a divalent saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^b3 represents a single bond or a divalent saturated hydrocarbon group having 1 to 12 carbon atoms.
L ^b4 represents a divalent saturated hydrocarbon group having 1 to 13 carbon atoms.
L ^b5 represents a divalent saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^b6 and L ^b7 each independently represent a divalent saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^b8 represents a divalent saturated hydrocarbon group having 1 to 14 carbon atoms.
L ^b9 independently represents a divalent saturated hydrocarbon group having 1 to 11 carbon atoms.
L ^b10 represents a divalent saturated hydrocarbon group having 1 to 11 carbon atoms.
Among them, L ^b1 is preferably any one of formula (L1-1) to formula (L1-4), more preferably formula (L1-1) or formula (L1-2), and still more preferably formula (L1). −1), and more preferably, L ^b2 is a single bond or a saturated hydrocarbon group having 1 to 6 carbon atoms, that is, * —CO—O— (CH ₂ ) _t — ( t represents an integer of 0 to 6. * represents a bond to —C (Q ¹ ) (Q ² ) —, and more preferably a formula in which L ^b2 is a single bond or a methylene group ( a divalent group represented by b1-1), particularly preferably a divalent group represented by the formula (b1-1) wherein L ^b2 is a single bond, that is, * —CO—O—.

Examples of the divalent group represented by the formula (L1-1) include the following.

Examples of the divalent group represented by the formula (L1-2) include the following.

Examples of the divalent group represented by the formula (L1-3) include the following.

Examples of the divalent group represented by the formula (L1-4) include the following.

Examples of the divalent group represented by the formula (L1-5) include the following.

Examples of the divalent group represented by the formula (L1-6) include the following.

R ^b3 is preferably a hydrogen atom, a methyl group, an ethyl group or a tert-butoxycarbonyl group, and more preferably a hydrogen atom, a methyl group or a tert-butoxycarbonyl group.
s is preferably 0, but when s is an integer of 1 to 6, R ^b4 is preferably a methyl group, an ethyl group, a methylcarbonyloxy group (acetyloxy group), an ethylcarbonyloxy group, or the like. Can be mentioned.

Examples of the salt represented by the formula (II) include the following compounds.

Examples of Z1 ⁺ include organic onium cations such as organic sulfonium cations, organic iodonium cations, organic ammonium cations, benzothiazolium cations, and organic phosphonium cations. Among these, an organic sulfonium cation and an organic iodonium cation are preferable, and an arylsulfonium cation is more preferable.

Examples of Z1 ⁺ include cations represented by formulas (Z1) to (Z4).

In formula (Z1) to formula (Z4),
Do P ^{a to} P ^c each independently represent an aliphatic hydrocarbon group having 1 to 30 carbon atoms, an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or an aromatic hydrocarbon group having 6 to 36 carbon atoms? , P ^a and P ^b may together form a ring containing a sulfur atom. The hydrogen atom contained in the aliphatic hydrocarbon group is a hydroxy group, an alkoxy group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 12 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms. The hydrogen atom contained in the alicyclic hydrocarbon group may be substituted with a halogen atom, an aliphatic hydrocarbon group having 1 to 18 carbon atoms, an acyl group having 2 to 4 carbon atoms, or a glycidyloxy group. The hydrogen atom contained in the aromatic hydrocarbon group may be a halogen atom, a hydroxy group, an aliphatic hydrocarbon group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or It may be substituted with an alkoxy group having 1 to 12 carbon atoms.

P ⁴ and P ⁵ each independently represent a hydroxy group, an aliphatic hydrocarbon group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms.
P ⁶ and P ⁷ each independently represent an aliphatic hydrocarbon group having 1 to 36 carbon atoms or an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or P ⁶ and P ^{7 taken} together Forms a ring containing a sulfur atom to which.
P ⁸ represents a hydrogen atom, an aliphatic hydrocarbon group having 1 to 36 carbon atoms, an alicyclic hydrocarbon group having 3 to 36 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms.
P ⁹ represents an aliphatic hydrocarbon group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms. The hydrogen atom contained in the aliphatic hydrocarbon group may be substituted with an aromatic hydrocarbon group having 6 to 18 carbon atoms, and the aromatic hydrocarbon group may be an alkoxy group having 1 to 12 carbon atoms or a carbon atom. The alkylcarbonyloxy group of Formula 1-12 may be substituted.
P ⁸ and P ⁹ may be combined to form a ring containing —CH—CO— to which they are attached.

P < ¹⁰ > -P < ¹⁵ > represents a hydroxyl group, a C1-C12 aliphatic hydrocarbon group, or a C1-C12 alkoxy group each independently.
E represents -S- or -O-.
i, j, p, r, x and y each independently represents an integer of 0 to 5;
q represents 0 or 1;
v and w each independently represent an integer of 0 to 4.
When i is 2 or more, the plurality of P ⁴ are the same or different from each other. When j is 2 or more, the plurality of P ⁵ are the same or different from each other. When p is 2 or more, the plurality of P ¹⁰ are the same. Or, when r is 2 or more, a plurality of P ¹¹ are the same or different from each other, when v is 2 or more, a plurality of P ¹² are the same or different from each other, and when w is 2 or more, a plurality of P 11 ¹³ are the same or different from each other. When x is 2 or more, the plurality of P ¹⁴ are the same or different from each other, and when y is 2 or more, the plurality of P ¹⁵ are the same or different from each other.

水素原子が脂肪族炭化水素基で置換された脂環式炭化水素基としては、例えば、メチルシクロヘキシル基、ジメチルシクロへキシル基、メチルノルボルニル基、２−アルキルアダマンタン−２−イル基、メチルノルボルニル基、イソボルニル基等が挙げられる。
芳香族炭化水素基としては、フェニル基、ナフチル基、アントリル基、ｐ−メチルフェニル基、ｐ−ｔｅｒｔ−ブチルフェニル基、ｐ−アダマンチルフェニル基、トリル基、キシリル基、クメニル基、メシチル基、ビフェニル基、フェナントリル基、２，６−ジエチルフェニル基、２−メチル−６−エチルフェニル等のアリール基等が挙げられる。
なお、芳香族炭化水素基に、脂肪族炭化水素基又は脂環式炭化水素基が含まれる場合は、炭素数１〜１８の脂肪族炭化水素基及び炭素数３〜１８の脂環式炭化水素基が好ましい。 Examples of the aliphatic hydrocarbon group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, pentyl group, hexyl group, octyl group and 2-ethylhexyl group. Is mentioned.
Examples of the aliphatic hydrocarbon group in which a hydrogen atom is substituted with an alicyclic hydrocarbon group include a 1- (adamantan-1-yl) alkane-1-yl group.
Examples of the aliphatic hydrocarbon group in which a hydrogen atom is substituted with an aromatic hydrocarbon group include an aralkyl group, and specifically include a benzyl group, a phenethyl group, a phenylpropyl group, a trityl group, a naphthylmethyl group, and a naphthylethyl group. Groups and the like.
The alicyclic hydrocarbon group may be monocyclic or polycyclic. Examples of the monocyclic alicyclic hydrocarbon group include a cyclopentyl group, a cyclohexyl group, a methylcyclohexyl group, and dimethylcyclohexane. Examples thereof include cycloalkyl groups such as a hexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the polycyclic alicyclic hydrocarbon group include decahydronaphthyl group, adamantyl group, norbornyl group, methylnorbornyl group, and the following groups. * Represents a bond with an adamantane ring or a cyclohexane ring.

Examples of the alicyclic hydrocarbon group in which a hydrogen atom is substituted with an aliphatic hydrocarbon group include a methylcyclohexyl group, a dimethylcyclohexyl group, a methylnorbornyl group, a 2-alkyladamantan-2-yl group, and a methyl group. A norbornyl group, an isobornyl group, etc. are mentioned.
Aromatic hydrocarbon groups include phenyl, naphthyl, anthryl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, cumenyl, mesityl, biphenyl Groups, phenanthryl groups, 2,6-diethylphenyl groups, aryl groups such as 2-methyl-6-ethylphenyl, and the like.
When the aromatic hydrocarbon group includes an aliphatic hydrocarbon group or an alicyclic hydrocarbon group, the aliphatic hydrocarbon group having 1 to 18 carbon atoms and the alicyclic hydrocarbon having 3 to 18 carbon atoms Groups are preferred.

As an alkoxy group, a methoxy group, an ethoxy group, an n-propoxy group, an isopropoxy group, an n-butoxy group, a sec-butoxy group, a tert-butoxy group, an n-pentoxy group, an n-hexoxy group, a heptoxy group, an octoxy group , 2-ethylhexoxy group, nonyloxy group, decyloxy group, undecyloxy group, dodecyloxy group and the like.
As an aromatic hydrocarbon group by which the hydrogen atom was substituted by the alkoxy group, 4-methoxyphenyl group etc. are mentioned, for example.
Examples of the halogen atom include fluorine, chlorine, bromine and iodine atoms.
Examples of the acyl group include an acetyl group, a propionyl group, and a butyryl group.
Examples of the alkylcarbonyloxy group include a methylcarbonyloxy group, an ethylcarbonyloxy group, an n-propylcarbonyloxy group, an isopropylcarbonyloxy group, an n-butylcarbonyloxy group, a sec-butylcarbonyloxy group, a tert-butylcarbonyloxy group, Examples thereof include a pentylcarbonyloxy group, a hexylcarbonyloxy group, an octylcarbonyloxy group, and a 2-ethylhexylcarbonyloxy group.

Examples of the ring and the P ^a and P ^b together form a monocyclic, polycyclic, aromatic or non-aromatic, it may be any of the rings of the saturated and unsaturated, sulfur atom In addition, one or more sulfur atoms and / or one or more oxygen atoms, that is, —O—, —S—, or —CO— may be further included. This ring includes a 3-membered ring to a 18-membered ring, preferably a 3-membered ring to a 12-membered ring or a 4- to 18-membered ring.
The ring formed by combining P ⁶ and P ⁷ may be any of monocyclic, polycyclic, aromatic, non-aromatic, saturated and unsaturated rings, and a sulfur atom If it contains one or more, it may further contain one or more sulfur atoms and / or one or more oxygen atoms, that is, —O—, —S—, or —CO—. This ring includes a 3-membered ring to a 12-membered ring, preferably a 3-membered ring to a 7-membered ring.
The ring formed by combining P ⁸ and P ⁹ may be any of monocyclic, polycyclic, aromatic, non-aromatic, saturated and unsaturated, and —CH— As long as it contains CO-, it may further contain one or more sulfur atoms and / or one or more oxygen atoms, that is, -O-, -S-, -CO-. This ring includes a 3-membered ring to a 12-membered ring, preferably a 3-membered ring to a 7-membered ring.

Examples of the ring formed together with the sulfur atom to which P ⁶ and P ⁷ are bonded include, for example, a thiolane-1-ium ring (tetrahydrothiophenium ring), a thian-1-ium ring, and a 1,4-oxathian-4-ium ring. Etc.
Examples of the ring formed with —CH—CO— to which P ⁸ and P ⁹ are bonded include an oxocycloheptane ring, an oxocyclohexane ring, an oxonorbornane ring, and an oxoadamantane ring.

Among the cations represented by the formulas (Z1) to (Z4), the formula (Z1) is preferable, the cation represented by the formula (Z5) is more preferable, and the triphenylsulfonium cation (in the formula (Z5), z1 = z2 = z3 = 0), in diphenyl tolyl sulfonium cation (formula (Z5), a z1 = z2 = 0, z3 = 1, P 3 is a methyl group.) or tri tolyl sulfonium cation (formula (Z5) in Z1 = z2 = z3 = 1 and P ¹ , P ² and P ³ are all methyl groups.

式（Ｚ５）中、
Ｐ^１〜Ｐ^３は、それぞれ独立に、ハロゲン原子、ヒドロキシ基、炭素数１〜１８の脂肪族炭化水素基、炭素数３〜１８の脂環式炭化水素基又は炭素数１〜１２のアルコキシ基を表すか、Ｐ^１〜Ｐ^３から選ばれる２つが一緒になってヘテロ原子を有してもよい環を形成してもよい。
ｚ１、ｚ２及びｚ３は、それぞれ独立に、０〜５の整数を表す。ｚ１、ｚ２及びｚ３のいずれかが２以上のとき、複数のＰ^１、Ｐ^２、Ｐ^３は、それぞれ、同一又は相異なる。

In formula (Z5),
P ^{1 to} P ³ are each independently a halogen atom, a hydroxy group, an aliphatic hydrocarbon group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms. Or two selected from P ^{1 to} P ³ may be combined to form a ring that may have a hetero atom.
z1, z2 and z3 each independently represents an integer of 0 to 5. When any of z1, z2 and z3 is 2 or more, the plurality of P ¹ , P ² and P ³ are the same or different from each other.

The ring formed by combining two selected from P ^{1 to} P ³ may be any of monocyclic, polycyclic, aromatic and non-aromatic rings. As long as it contains the above, it may contain one or more sulfur atoms and / or one or more oxygen atoms.
Aliphatic hydrocarbon group of P ¹ to P ³ is preferably 1 to 12 carbon atoms, alicyclic hydrocarbon group is preferably 4 to 18 carbon atoms.
Among them, each of P ^{1 to} P ³ independently represents a halogen atom (more preferably a fluorine atom), a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms, or P ¹ two selected from to P ³ is represent together -O-, it is preferable to form a ring containing a sulfur atom. z1 to z3 are preferably each independently 0 or 1.

Examples of the cation represented by the formula (Z1) or the formula (Z5) include the following.

The following are mentioned as a specific example of the cation in which the ring containing a sulfur atom was formed among the cations represented by a formula (Z5).

Specific examples of the cation (Z1) include the following.

Specific examples of the cation (Z2) include the following.

Specific examples of the cation (Z3) include the following.

Specific examples of the cation (Z4) include the following.

  The salt represented by the formula (II) is a combination of the above-described sulfonate anion and organic cation. Although the above-mentioned sulfonate anion and organic cation can be arbitrarily combined, the following compounds are preferred. In the following formulae, the definition of the substituent has the same meaning as described above.

Furthermore, the following compounds are more preferable.

溶媒としては、クロロホルム等が挙げられる。
式（ＩＩａ−２）で表される化合物としては、４−ヒドロキシ−１−メチルピペリジン、４−ヒドロキシ−２，２，６，６−テトラメチルピペリジン、トロピン等が挙げられる。
式（ＩＩａ−１）で表される塩は、式（ＩＩａ−３）で表される塩と式（ＩＩａ−４）で表される化合物とを反応させることにより、得ることができる。
式（ＩＩａ−３）で表される塩は、例えば、特開２００８−１３５５１号公報に記載された方法で合成することができる。

The salt represented by the formula (II) can be produced by a method known in the art.
For example, in the salt represented by the formula (II), the salt represented by the formula (IIa) in which L ^b1 is —CO—O— includes the salt represented by the formula (IIa-1) and the formula (IIa— It can manufacture by making the compound represented by 2) react in a solvent. In the following formulas, each symbol represents the same meaning as above unless otherwise noted.

Examples of the solvent include chloroform.
Examples of the compound represented by the formula (IIa-2) include 4-hydroxy-1-methylpiperidine, 4-hydroxy-2,2,6,6-tetramethylpiperidine, tropine and the like.
The salt represented by the formula (IIa-1) can be obtained by reacting the salt represented by the formula (IIa-3) with the compound represented by the formula (IIa-4).
The salt represented by the formula (IIa-3) can be synthesized, for example, by the method described in JP2008-13551A.

  The salt represented by the formula (II) may be used alone or in combination of two or more.

<Acid generator (B)>
The resist composition of the present invention may contain an acid generator other than the acid generator containing the salt represented by the formula (II) described above (hereinafter sometimes referred to as “acid generator (B)”). Good. A known acid generator can be used as the acid generator (B).
The acid generator (B) is classified into a nonionic type and an ionic type, and any of them may be used in the resist composition of the present invention.
Nonionic acid generators include organic halides, sulfonate esters (for example, 2-nitrobenzyl ester, aromatic sulfonate, oxime sulfonate, N-sulfonyloxyimide, N-sulfonyloxyimide, sulfonyloxyketone, diazonaphthoquinone 4). -Sulfonates), sulfones (e.g. disulfone, ketosulfone, sulfonyldiazomethane) and the like. The ionic acid generator is typically an onium salt containing an onium cation (for example, diazonium salt, phosphonium salt, sulfonium salt, iodonium salt). Examples of the anion of the onium salt include a sulfonate anion, a sulfonylimide anion, and a sulfonylmethide anion.

  Examples of the acid generator include JP-A 63-26653, JP-A 55-164824, JP-A 62-69263, JP-A 63-146038, JP-A 63-163452, and JP-A 63-163452. No. 62-153853, JP-A-63-146029, US Pat. No. 3,779,778, US Pat. No. 3,849,137, German Patent No. 3914407, European Patent No. 126,712, etc. It is possible to use a compound that generates an acid by radiation.

［式（Ｂ１）中、
Ｑ^１’及びＱ^２’は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^b1’は、単結合又は２価の炭素数１〜１７の飽和炭化水素基を表し、該２価の飽和炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−又は−ＣＯ−で置き換わっていてもよい。
Ｙ’は、置換基を有していてもよい炭素数１〜１８のアルキル基又は置換基を有していてもよい炭素数３〜１８の脂環式炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれる−ＣＨ_２−は、−Ｏ−、−ＳＯ_２−又は−ＣＯ−で置き換わっていてもよい。
Ｚ⁺は、有機カチオンを表す。］ The acid generator (B) is preferably a fluorine-containing acid generator, more preferably a sulfonate represented by the formula (B1).

[In the formula (B1),
Q ^{1 ′} and Q ^{2 ′} each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^{b1 ′} represents a single bond or a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and —CH ₂ — contained in the divalent saturated hydrocarbon group is replaced by —O— or —CO—. It may be.
Y ′ represents an alkyl group having 1 to 18 carbon atoms which may have a substituent or an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent, and the alkyl group and —CH ₂ — contained in the alicyclic hydrocarbon group may be replaced by —O—, —SO ₂ — or —CO—.
Z ⁺ represents an organic cation. ]

Examples of the perfluoroalkyl group for Q ^{1 ′} and Q ^{2 ′} include the same as the perfluoroalkyl group for R ^b1 and R ^b2 in the above-described formula (II).
Q ^{1 ′} and Q ^{2 ′} are preferably a trifluoromethyl group or a fluorine atom, and more preferably a fluorine atom.

Examples of the divalent saturated hydrocarbon group for L ^{b1 ′} include a linear alkanediyl group, a branched alkanediyl group, or a monocyclic or polycyclic alicyclic saturated hydrocarbon group. Two or more of them may be combined.
Specifically, methylene group, ethylene group, propane-1,3-diyl group, propane-1,2-diyl group, butane-1,4-diyl group, pentane-1,5-diyl group, hexane-1 , 6-diyl group, heptane-1,7-diyl group, octane-1,8-diyl group, nonane-1,9-diyl group, decane-1,10-diyl group, undecane-1,11-diyl group , Dodecane-1,12-diyl group, tridecane-1,13-diyl group, tetradecane-1,14-diyl group, pentadecane-1,15-diyl group, hexadecane-1,16-diyl group, heptadecane-1, Linear alkanediyl groups such as 17-diyl group, ethane-1,1-diyl group, propane-1,1-diyl group and propane-2,2-diyl group;
An alkyl group (particularly an alkyl group having 1 to 4 carbon atoms, such as a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, a sec-butyl group, a tert-butyl group); For example, 1-methylbutane-1,3-diyl group, 2-methylpropane-1,3-diyl group, 2-methylpropane-1,2-diyl group, pentane-1,4 A branched alkanediyl group such as a diyl group or 2-methylbutane-1,4-diyl group;
Monocyclic 2 which is a cycloalkanediyl group such as cyclobutane-1,3-diyl group, cyclopentane-1,3-diyl group, cyclohexane-1,4-diyl group, cyclooctane-1,5-diyl group Valent alicyclic saturated hydrocarbon group;
Polycyclic divalent alicyclic saturated hydrocarbon such as norbornane-1,4-diyl group, norbornane-2,5-diyl group, adamantane-1,5-diyl group, adamantane-2,6-diyl group, etc. Groups and the like.

Examples of the group in which —CH ₂ — contained in the saturated hydrocarbon group of L ^{b1 ′} is replaced by —O— or —CO— include formulas (b1-1 ′) to (b1-7 ′). . In addition, Formula (b1-1 ')-Formula (b1-7') have described the right and left according to Formula (B1), and it is C on the left side among two bonds represented by *, respectively. It binds to (Q ^{1 ′} ) (Q ^{2 ′} ) — and on the right side to —Y ′. The same applies to specific examples of the following formulas (b1-1 ′) to (b1-7 ′).

式（ｂ１−１’）〜式（ｂ１−７’）中、
Ｌ^b2’は、単結合又は炭素数１〜１５の２価の飽和炭化水素基を表す。
Ｌ^b3’は、単結合又は炭素数１〜１２の２価の飽和炭化水素基を表す。
Ｌ^b4’は、炭素数１〜１３の２価の飽和炭化水素基を表す。但しＬ^b3’及びＬ^b4’の炭素数上限は１３である。
Ｌ^b5’は、炭素数１〜１５の２価の飽和炭化水素基を表す。
Ｌ^b6’及びＬ^b7’は、それぞれ独立に、炭素数１〜１５の２価の飽和炭化水素基を表す。但しＬ^b6’及びＬ^b7’の合計炭素数の上限は１６である。
Ｌ^b8’は、炭素数１〜１４の２価の飽和炭化水素基を表す。
Ｌ^b9’及びＬ^b10’は、それぞれ独立に、炭素数１〜１１の２価の飽和炭化水素基を表す。但しＬ^b9’及びＬ^b10’の合計炭素数の上限は１２である。
中でも、Ｌ^b1は、好ましくは式（ｂ１−１’）〜式（ｂ１−４’）のいずれか、より好ましくは式（ｂ１−１’）又は式（ｂ１−２’）、好ましくは式（ｂ１−１’）で表される２価の基であり、より好ましくは、Ｌ^b2’が単結合又は−ＣＨ_２−である式（ｂ１−１’）で表される２価の基である。
Ｌ^b11'及びＬ^b12'は、それぞれ独立に、単結合又は炭素数１〜１４の飽和炭化水素基を表す。但しＬ^b11'及びＬ^b12'の合計炭素数の上限は１４である。

In formula (b1-1 ′) to formula (b1-7 ′),
L ^{b2 ′} represents a single bond or a divalent saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^{b3 ′} represents a single bond or a divalent saturated hydrocarbon group having 1 to 12 carbon atoms.
L ^{b4 ′} represents a divalent saturated hydrocarbon group having 1 to 13 carbon atoms. However, the upper limit of the carbon number of L ^{b3 ′} and L ^{b4 ′} is 13.
L ^{b5 ′} represents a divalent saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^{b6 ′} and L ^{b7 ′} each independently represent a divalent saturated hydrocarbon group having 1 to 15 carbon atoms. However, the upper limit of the total carbon number of L ^{b6 ′} and L ^{b7 ′} is 16.
L ^{b8 ′} represents a divalent saturated hydrocarbon group having 1 to 14 carbon atoms.
L ^{b9 ′} and L ^{b10 ′} each independently represent a divalent saturated hydrocarbon group having 1 to 11 carbon atoms. However, the upper limit of the total carbon number of L ^{b9 ′} and L ^{b10 ′} is 12.
Among them, L ^b1 is preferably any one of the formulas (b1-1 ′) to (b1-4 ′), more preferably the formula (b1-1 ′) or the formula (b1-2 ′), preferably the formula ( b1-1 ′), more preferably a divalent group represented by the formula (b1-1 ′) in which L ^{b2 ′} is a single bond or —CH ₂ —. .
L ^{b11 ′} and L ^{b12 ′} each independently represent a single bond or a saturated hydrocarbon group having 1 to 14 carbon atoms. However, the upper limit of the total carbon number of L ^{b11 ′} and L ^{b12 ′} is 14.

Examples of the divalent group represented by formula (b1-1 ′) to formula (b1-5 ′) and formula (b1-7 ′) include the formula (b1-1) to formula (b1-5) and The thing similar to the bivalent group of a formula (b1-7) is mentioned.
Examples of the divalent group represented by the formula (b1-6 ′) include the following in addition to the divalent group represented by the formula (b1-6).

As the alkyl group for Y ′, methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, n-pentyl group, n-hexyl group, heptyl group, Examples thereof include alkyl groups such as 2-ethylhexyl group, octyl group, nonyl group, decyl group, undecyl group, dodecyl group, and preferably an alkyl group having 1 to 6 carbon atoms.
Examples of the alicyclic hydrocarbon group include groups represented by the following formulas (Y1) to (Y11).
Examples of the group in which —CH ₂ — in the alicyclic hydrocarbon group of Y ′ is replaced by —O—, —SO ₂ — or —CO— include groups represented by formula (Y12) to formula (Y26). Is mentioned.

  Especially, it is preferably a group represented by any one of formulas (Y1) to (Y19), more preferably represented by formula (Y11), formula (Y14), formula (Y15) or formula (Y19). And more preferably a group represented by formula (Y11) or formula (Y14).

Examples of the substituent for the alkyl group of Y ′ and the alicyclic hydrocarbon group include, for example, a halogen atom, a hydroxy group, an oxo group, an alkyl group having 1 to 12 carbon atoms, a hydroxy group-containing alkyl group having 1 to 12 carbon atoms, C3-C16 alicyclic hydrocarbon group, C1-C12 alkoxy group, C6-C18 aromatic hydrocarbon group, C7-C21 aralkyl group, C2-C4 acyl Group, glycidyloxy group or — (CH ₂ ) _j2 —O—CO—R ^b1 group (wherein R ^b1 is an alkyl group having 1 to 16 carbon atoms, an alicyclic hydrocarbon group having 3 to 16 carbon atoms, or Represents an aromatic hydrocarbon group having 6 to 18 carbon atoms, j2 represents an integer of 0 to 4). The alkyl group, alicyclic hydrocarbon group, aromatic hydrocarbon group, aralkyl group, and the like, which are substituents for Y ′, may further have a substituent. Examples of the substituent include an alkyl group, a halogen atom, a hydroxy group, and an oxo group.

Examples of the halogen atom, aromatic hydrocarbon group, aralkyl group, and acyl group are the same as described above.
Examples of the hydroxy group-containing aliphatic hydrocarbon group include a hydroxymethyl group and a hydroxyethyl group.
Examples of the alkoxy group include methoxy group, ethoxy group, n-propoxy group, isopropoxy group, n-butoxy group, sec-butoxy group, tert-butoxy group, n-pentoxy group, n-hexoxy group and the like.
Examples of the aralkyl group include benzyl group, phenethyl group, phenylpropyl group, trityl group, naphthylmethyl group, naphthylethyl group and the like.

Examples of Y ′ include the following.

In addition, when Y ′ is an alkyl group and L ^{b1 ′} is a divalent linear or branched saturated hydrocarbon group having 1 to 17 carbon atoms, the divalent at the bonding position with Y ′. The methylene group of the linear or branched saturated hydrocarbon group is preferably replaced with an oxygen atom or a carbonyl group. In this case, the methylene group constituting the alkyl group of Y ′ is not replaced with an oxygen atom or a carbonyl group.

  Y ′ is preferably an alicyclic hydrocarbon group having 3 to 18 carbon atoms which may have a substituent, and more preferably has a substituent (for example, an oxo group, a hydroxy group, etc.). An adamantyl group, more preferably an adamantyl group, a hydroxyadamantyl group or an oxoadamantyl group.

The sulfonate anion in the salt represented by the formula (B1) is preferably an anion represented by the formula (b1-1-1) to the formula (b1-1-9). In the following formulas, the definitions of the symbols have the same meaning as described above, and R ^b2 and R ^b3 each independently represent an alkyl group having 1 to 4 carbon atoms (preferably a methyl group).
The sulfonate anion in the salt represented by the formula (B1) may be an anion described in JP 2010-204646 A.

Cation Z ⁺ contained in the acid generator (B1) are the same as those for cationic Z1 ⁺ contained in the formula (II) described above.

  The acid generator (B1) is a combination of the above-described sulfonate anion and organic cation. The above-mentioned anion and cation can be arbitrarily combined, and preferably a combination of any one of anion (b1-1) to anion (b1-1-9) with cation (Z5) and anion (b1-1-3) ) To (b1-1-5) and a combination of a cation (Z3).

  The acid generator (B1) is preferably a salt represented by the formula (B1-1) to the formula (B1-20), more preferably an acid generator containing an arylsulfonium cation ( B1-1), Formula (B1-2), Formula (B1-3), Formula (B1-6), Formula (B1-7), Formula (B1-11), Formula (B1-12), Formula (B1) -13), a formula (B1-14), a formula (B1-18), a formula (B1-19), or a formula (B1-20).

When the resist composition of the present invention contains only the acid generator (II) as an acid generator, the content thereof is preferably 1 part by mass or more (more preferably) with respect to 100 parts by mass of the resin (A). 3 parts by mass or more), preferably 40 parts by mass or less (more preferably 35 parts by mass or less).
Further, when the resist composition of the present invention contains the acid generator (B) in addition to the acid generator (II), the total content of the acid generator (II) and the acid generator (B). Is preferably 1 part by mass or more (more preferably 3 parts by mass or more), preferably 40 parts by mass or less (more preferably 35 parts by mass or less) with respect to 100 parts by mass of the resin (A). In this case, the content ratio (mass) of the acid generator (II) and the acid generator (B) is, for example, 5:95 to 95: 5, preferably 10:90 to 90:10, more preferably 15: 85-85: 15.

［式（Ｉ）中、
Ｒ^Ｄ１及びＲ^Ｄ２は、それぞれ独立に、炭素数１〜１２の炭化水素基、炭素数１〜６のアルコキシ基、炭素数２〜７のアシル基、炭素数２〜７のアシルオキシ基、炭素数２〜７のアルコキシカルボニル基、ニトロ基又はハロゲン原子を表す。
ｍ’及びｎ’は、それぞれ独立に、０〜４の整数を表し、ｍ’が２以上の場合、複数のＲ^Ｄ１は同一又は互いに相異なり、ｎ’が２以上の場合、複数のＲ^Ｄ２は同一又は互いに相異なる。］ <Compound represented by formula (I)>
A compound represented by formula (I) (hereinafter sometimes referred to as “compound (I)”) is shown below.

[In the formula (I),
R ^D1 and R ^D2 are each independently a hydrocarbon group having 1 to 12 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 7 carbon atoms, an acyloxy group having 2 to 7 carbon atoms, or a carbon number Represents 2 to 7 alkoxycarbonyl groups, nitro groups or halogen atoms.
m ′ and n ′ each independently represents an integer of 0 to 4. When m ′ is 2 or more, a plurality of R ^D1 are the same or different from each other, and when n ′ is 2 or more, a plurality of R ^D2 Are the same or different from each other. ]

Examples of the hydrocarbon group include an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and a group in which these are combined.
Examples of the aliphatic hydrocarbon group include alkyl groups such as methyl group, ethyl group, propyl group, isopropyl group, butyl group, isobutyl group, t-butyl group, pentyl group, hexyl group, and nonyl group.
The alicyclic hydrocarbon group may be monocyclic or polycyclic, and may be either saturated or unsaturated. Examples thereof include cycloalkyl groups such as cyclopropyl group, cyclobutyl group, cyclopentyl group, cyclohexyl group, cyclononyl group, and cyclododecyl group, norbornyl group, adamantyl group, and the like. In particular, alicyclic hydrocarbons are preferred.
As aromatic hydrocarbon group, phenyl group, 1-naphthyl group, 2-naphthyl group, 2-methylphenyl group, 3-methylphenyl group, 4-methylphenyl group, 4-ethylphenyl group, 4-propylphenyl group 4-isopropylphenyl group, 4-butylphenyl group, 4-t-butylphenyl group, 4-hexylphenyl group, 4-cyclohexylphenyl group, anthryl group, p-adamantylphenyl group, tolyl group, xylyl group, cumenyl group , Aryl groups such as mesityl group, biphenyl group, phenanthryl group, 2,6-diethylphenyl group, 2-methyl-6-ethylphenyl, and the like.
These combinations include alkyl-cycloalkyl groups, cycloalkyl-alkyl groups, aralkyl groups (eg, phenylmethyl group, 1-phenylethyl group, 2-phenylethyl group, 1-phenyl-1-propyl group, 1- Phenyl-2-propyl group, 2-phenyl-2-propyl group, 3-phenyl-1-propyl group, 4-phenyl-1-butyl group, 5-phenyl-1-pentyl group, 6-phenyl-1-hexyl Group) and the like.

Examples of the alkoxy group include a methoxy group, an ethoxy group, a propoxy group, a butoxy group, a pentyloxy group, and a hexyloxy group.
As an alkoxycarbonyl group, the group which the carbonyl group couple | bonded with the said alkoxy group is mentioned, for example.
Examples of the acyl group include an acetyl group, a propionyl group, and a butyryl group.
Examples of the acyloxy group include an acetyloxy group, a propionyloxy group, a butyryloxy group, and an isobutyryloxy group.
Examples of the halogen atom include a fluorine atom, a chlorine atom, and a bromine atom.

R ^D1 and R ^D2 are each independently a hydrocarbon group having 1 to 6 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, an acyl group having 2 to 5 carbon atoms, an acyloxy group having 2 to 5 carbon atoms, or a carbon number It is preferably 2 to 5 alkoxycarbonyl group, nitro group or halogen atom.
m ′ and n ′ are each independently preferably an integer of 0 to 3, more preferably an integer of 0 to 2, still more preferably 0 or 1, and particularly preferably 0.

Examples of compound (I) include the following compounds.

  Compound (I) can be produced by the method described in “Tetrahedron Vol. 45, No. 19, p6281-6296”. Compound (I) may be a commercially available compound.

  The content of compound (I) is preferably about 0.01 to 5% by mass, more preferably about 0.01 to 3% by mass, and particularly preferably 0.01 to 5% by mass in the solid content of the resist composition. About 1% by mass.

<Solvent (E)>
The content of the solvent (E) is, for example, 90% by mass or more in the resist composition, preferably 92% by mass or more, more preferably 94% by mass or more, for example 99.9% by mass or less, preferably 99% by mass or less. It is. The content rate of a solvent (E) can be measured by well-known analysis means, such as a liquid chromatography or a gas chromatography, for example.

  Examples of the solvent (E) include glycol ether esters such as ethyl cellosolve acetate, methyl cellosolve acetate and propylene glycol monomethyl ether acetate; glycol ethers such as propylene glycol monomethyl ether; ethyl lactate, butyl acetate, amyl acetate and And esters such as ethyl pyruvate; ketones such as acetone, methyl isobutyl ketone, 2-heptanone and cyclohexanone; cyclic esters such as γ-butyrolactone; A solvent (E) may contain 1 type independently, and may contain 2 or more types.

<Basic compound (hereinafter sometimes referred to as “basic compound (C)”)>
The basic compound (C) is a compound that acts as a quencher.
The basic compound (C) is preferably a basic nitrogen-containing organic compound, and examples thereof include amines and ammonium salts. Examples of amines include aliphatic amines and aromatic amines. Aliphatic amines include primary amines, secondary amines and tertiary amines. The basic compound (C) is preferably a compound represented by the formula (C1) to a compound represented by the formula (C8), more preferably a compound represented by the formula (C1-1). It is done.

［式（Ｃ１）中、Ｒ^c1、Ｒ^c2及びＲ^c3は、それぞれ独立に、水素原子、炭素数１〜６のアルキル基、炭素数５〜１０の脂環式炭化水素基又は炭素数６〜１０の芳香族炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれる水素原子は、ヒドロキシ基、アミノ基又は炭素数１〜６のアルコキシ基で置換されていてもよく、該芳香族炭化水素基に含まれる水素原子は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基で置換されていてもよい。］

[In formula (C1), R ^c1 , R ^c2 and R ^c3 each independently represent a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 5 to 10 carbon atoms, or 6 to 6 carbon atoms. 10 represents an aromatic hydrocarbon group, and the hydrogen atom contained in the alkyl group and the alicyclic hydrocarbon group may be substituted with a hydroxy group, an amino group or an alkoxy group having 1 to 6 carbon atoms, The hydrogen atom contained in the aromatic hydrocarbon group is an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic group having 6 to 10 carbon atoms. It may be substituted with a group hydrocarbon group. ]

［式（Ｃ１−１）中、Ｒ^c2及びＲ^c3は、上記と同じ意味を表す。
Ｒ^c4は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基を表す。
ｍ３は０〜３の整数を表し、ｍ３が２以上のとき、複数のＲ^c4は同一又は相異なる。］

[In Formula (C1-1), R ^c2 and R ^c3 represent the same meaning as described above.
R ^c4 represents an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms.
m3 represents an integer of 0 to 3, and when m3 is 2 or more, the plurality of R ^c4 are the same or different. ]

［式（Ｃ２）、式（Ｃ３）及び式（Ｃ４）中、Ｒ^c5、Ｒ^c6、Ｒ^c7及びＲ^c8は、それぞれ独立に、Ｒ^c1と同じ意味を表す。
Ｒ^c9は、炭素数１〜６のアルキル基、炭素数３〜６の脂環式炭化水素基又は炭素数２〜６のアルカノイル基を表す。
ｎ３は０〜８の整数を表し、ｎ３が２以上のとき、複数のＲ^c9は同一又は相異なる。］

[In Formula (C2), Formula (C3) and Formula (C4), R ^c5 , R ^c6 , R ^c7 and R ^c8 each independently represent the same meaning as R ^c1 .
R ^c9 represents an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 3 to 6 carbon atoms, or an alkanoyl group having 2 to 6 carbon atoms.
n3 represents an integer of 0 to 8, and when n3 is 2 or more, the plurality of R ^c9 are the same or different. ]

［式（Ｃ５）及び式（Ｃ６）中、Ｒ^c10、Ｒ^c11、Ｒ^c12、Ｒ^c13及びＲ^c16は、それぞれ独立に、Ｒ^c1と同じ意味を表す。
Ｒ^c14、Ｒ^c15及びＲ^c17は、それぞれ独立に、Ｒ^c4と同じ意味を表す。
ｏ３及びｐ３は、それぞれ独立に０〜３の整数を表し、ｏ３が２以上であるとき、複数のＲ^c1４は同一又は相異なり、ｐ３が２以上であるとき、複数のＲ^c15は、同一又は相異なる。
Ｌ^c1は、炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

[In Formula (C5) and Formula (C6), R ^c10 , R ^c11 , R ^c12 , R ^c13 and R ^c16 each independently represent the same meaning as R ^c1 .
R ^c14 , R ^c15 and R ^c17 each independently represent the same meaning as R ^c4 .
o3 and p3 each independently represent an integer of 0 to 3, when o3 is 2 or more, the plurality of R ^c14 are the same or different, and when p3 is 2 or more, the plurality of R ^c15 are the same or Different.
L ^c1 represents an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

［式（Ｃ７）及び式（Ｃ８）中、Ｒ^c18、Ｒ^c19及びＲ^c20は、それぞれ独立に、Ｒ^c4と同じ意味を表す。
ｑ３、ｒ３及びｓ３は、それぞれ独立に０〜３の整数を表し、ｑ３が２以上であるとき、複数のＲ^c18は同一又は相異なり、ｒ３が２以上であるとき、複数のＲ^c1９は同一又は相異なり、及びｓ３が２以上であるとき、複数のＲ^c20は同一又は相異なる。
Ｌ^c2は、単結合又は炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

Wherein (C7) and formula ^{(C8), R c18, R} c19 and R ^c20 in each occurrence independently represent the same meaning as R ^c4.
q3, r3 and s3 each independently represents an integer of 0 to 3, and when q3 is 2 or more, the plurality of R ^c18 are the same or different, and when r3 is 2 or more, the plurality of R ^c19 are the same. Or when different and when s3 is 2 or more, the plurality of R ^c20 are the same or different.
L ^c2 represents a single bond or an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

In the formulas (C1) to (C8), examples of the alkyl group, the alicyclic hydrocarbon group, the aromatic hydrocarbon group, the alkoxy group, and the alkanediyl group are the same as those described above.
Examples of the alkanoyl group include acetyl group, 2-methylacetyl group, 2,2-dimethylacetyl group, propionyl group, butyryl group, isobutyryl group, pentanoyl group, and 2,2-dimethylpropionyl group.

  Examples of the compound represented by the formula (C1) include 1-naphthylamine, 2-naphthylamine, aniline, diisopropylaniline, 2-, 3- or 4-methylaniline, 4-nitroaniline, N-methylaniline, N, N- Dimethylaniline, diphenylamine, hexylamine, heptylamine, octylamine, nonylamine, decylamine, dibutylamine, dipentylamine, dihexylamine, diheptylamine, dioctylamine, dinonylamine, didecylamine, triethylamine, trimethylamine, tripropylamine, tributylamine, tri Pentylamine, trihexylamine, triheptylamine, trioctylamine, trinonylamine, tridecylamine, methyldibutylamine, methyldipentylamine, methyl Hexylamine, methyldicyclohexylamine, methyldiheptylamine, methyldioctylamine, methyldinonylamine, methyldidecylamine, ethyldibutylamine, ethyldipentylamine, ethyldihexylamine, ethyldiheptylamine, ethyldioctylamine, ethyldinonyl Amine, ethyldidecylamine, dicyclohexylmethylamine, tris [2- (2-methoxyethoxy) ethyl] amine, triisopropanolamine, ethylenediamine, tetramethylenediamine, hexamethylenediamine, 4,4′-diamino-1,2- Examples include diphenylethane, 4,4′-diamino-3,3′-dimethyldiphenylmethane, 4,4′-diamino-3,3′-diethyldiphenylmethane, and preferably diisopropyl. Piruanirin. Particularly preferred include 2,6-diisopropylaniline.

Examples of the compound represented by the formula (C2) include piperazine.
Examples of the compound represented by the formula (C3) include morpholine.
Examples of the compound represented by the formula (C4) include piperidine and hindered amine compounds having a piperidine skeleton described in JP-A No. 11-52575.
Examples of the compound represented by the formula (C5) include 2,2′-methylenebisaniline.
Examples of the compound represented by the formula (C6) include imidazole and 4-methylimidazole.
Examples of the compound represented by the formula (C7) include pyridine and 4-methylpyridine.
Examples of the compound represented by the formula (C8) include 1,2-di (2-pyridyl) ethane, 1,2-di (4-pyridyl) ethane, 1,2-di (2-pyridyl) ethene, 1, 2-di (4-pyridyl) ethene, 1,3-di (4-pyridyl) propane, 1,2-di (4-pyridyloxy) ethane, di (2-pyridyl) ketone, 4,4′-dipyridyl sulfide 4,4′-dipyridyl disulfide, 2,2′-dipyridylamine, 2,2′-dipiconylamine, bipyridine and the like.

  As ammonium salts, tetramethylammonium hydroxide, tetraisopropylammonium hydroxide, tetrabutylammonium hydroxide, tetrahexylammonium hydroxide, tetraoctylammonium hydroxide, phenyltrimethylammonium hydroxide, 3- (trifluoromethyl) phenyltrimethyl Ammonium hydroxide, tetra-n-butylammonium salicylate, choline and the like can be mentioned.

  The content of the basic compound (C) in the solid content of the resist composition is preferably about 0.01 to 5% by mass, more preferably about 0.01 to 3% by mass, and particularly preferably 0.8. It is about 01 to 1% by mass.

<Other components (hereinafter sometimes referred to as “other components (F)”)>
The resist composition of this invention may contain the other component (F) as needed. The other component (F) is not particularly limited, and additives known in the resist field, such as sensitizers, dissolution inhibitors, surfactants, stabilizers, dyes and the like can be used.

<Preparation of resist composition>
The resist composition of the present invention comprises a resin (A), an acid generator (II) and a compound (I), and a solvent (E), an acid generator (B) and a basic compound (C) used as necessary. And other components (F) can be mixed. The mixing order is arbitrary and is not particularly limited. The temperature at the time of mixing can select an appropriate temperature range from the range of 10-40 degreeC according to the kind etc. of resin, the solubility with respect to solvent (E), such as resin. An appropriate mixing time can be selected from 0.5 to 24 hours depending on the mixing temperature. The mixing means is not particularly limited, and stirring and mixing can be used.
After mixing each component, it is preferable to filter using a filter having a pore size of about 0.003 to 0.2 μm.

<Method for producing resist pattern>
The method for producing a resist pattern of the present invention comprises:
(1) The process of apply | coating the resist composition of this invention on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) A step of heating the composition layer after exposure and (5) a step of developing the composition layer after heating.

  Application of the resist composition onto the substrate can be performed by a commonly used apparatus such as a spin coater.

By drying the composition after coating, the solvent is removed and a composition layer is formed. Drying is performed, for example, by evaporating the solvent using a heating device such as a hot plate (so-called pre-baking) or using a decompression device to form a composition layer from which the solvent has been removed. The temperature in this case is preferably about 50 to 200 ° C., for example. The pressure is preferably about 1 to 1.0 × 10 ⁵ Pa.

The obtained composition layer is usually exposed using an exposure machine. The exposure machine may be an immersion exposure machine. At this time, exposure is usually performed through a mask corresponding to a required pattern. Exposure light sources include those that emit laser light in the ultraviolet region such as KrF excimer laser (wavelength 248 nm), ArF excimer laser (wavelength 193 nm), F ₂ excimer laser (wavelength 157 nm), solid-state laser light source (YAG or semiconductor laser) Etc.) Using various lasers such as those that convert wavelength of laser light from the laser and emit harmonic laser light in the far-ultraviolet region or vacuum ultraviolet region, those that irradiate electron beams or extreme ultraviolet light (EUV), etc. Can do.

The composition layer after exposure is subjected to heat treatment (so-called post-exposure baking) in order to promote the deprotection group reaction. As heating temperature, it is about 50-200 degreeC normally, Preferably it is about 70-150 degreeC.
The heated composition layer is usually developed using a developer using a developing device. Examples of the developing method include a dipping method, a paddle method, a spray method, and a dynamic dispensing method. The development temperature is preferably 5 to 60 ° C., for example, and the development time is preferably 5 to 300 seconds, for example.
The composition layer after heating is usually developed using a developer containing butyl acetate or 2-heptanone using a developing device.

When producing a positive resist pattern from the resist composition of the present invention, an alkaline developer is used as the developer. The alkaline developer may be various alkaline aqueous solutions used in this field. Examples thereof include an aqueous solution of tetramethylammonium hydroxide and (2-hydroxyethyl) trimethylammonium hydroxide (commonly called choline). The alkali developer may contain a surfactant.
It is preferable to wash the resist pattern with ultrapure water after development, and then remove the water remaining on the substrate and the pattern.

In the case of producing a negative resist pattern from the resist composition of the present invention, a developer containing an organic solvent as a developer (hereinafter sometimes referred to as “organic developer”) is used.
Organic solvents contained in the organic developer include ketone solvents such as 2-hexanone and 2-heptanone; glycol ether ester solvents such as propylene glycol monomethyl ether acetate; ester solvents such as butyl acetate; glycols such as propylene glycol monomethyl ether Examples include ether solvents; amide solvents such as N, N-dimethylacetamide; aromatic hydrocarbon solvents such as anisole.
In the organic developer, the content of the organic solvent is preferably 90% by mass or more and 100% by mass or less, more preferably 95% by mass or more and 100% by mass or less, and still more preferably only the organic solvent.
Among them, the organic developer is preferably a developer containing butyl acetate and / or 2-heptanone. In the organic developer, the total content of butyl acetate and 2-heptanone is preferably 50% by mass to 100% by mass, more preferably 90% by mass to 100% by mass, and substantially butyl acetate and / or 2 -More preferred is heptanone alone.
The organic developer may contain a surfactant. The organic developer may contain a trace amount of water.
At the time of development, the development may be stopped by substituting a solvent of a different type from the organic developer.

It is preferable to wash the developed resist pattern with a rinse solution. The rinsing liquid is not particularly limited as long as it does not dissolve the resist pattern, and a solution containing a general organic solvent can be used, and an alcohol solvent or an ester solvent is preferable.
After the cleaning, it is preferable to remove the rinse solution remaining on the substrate and the pattern.

<Application>
The resist composition of the present invention is a resist composition for KrF excimer laser exposure, a resist composition for ArF excimer laser exposure, a resist composition for electron beam (EB) exposure, or a resist composition for EUV exposure, particularly a liquid. It is suitable as a resist composition for immersion exposure and useful for fine processing of semiconductors.

The present invention will be described more specifically with reference to examples. In the examples, “%” and “parts” representing the content or amount used are based on mass unless otherwise specified.
The structure of the compound was confirmed by MASS (LC: Agilent 1100 type, MASS: Agilent LC / MSD type or LC / MSD TOF type).
The composition ratio of the resin (A) (copolymerization ratio of the structural unit derived from each monomer used for the production of the resin (A) to the resin (A)) is determined by liquid chromatography using the amount of unreacted monomer in the reaction solution after the completion of polymerization. The measurement was performed using a graph, and the amount of monomer used for the polymerization was determined from the obtained results. The weight average molecular weight is a value determined by gel permeation chromatography. The analysis conditions for gel permeation chromatography are as follows.
Apparatus: HLC-8120GPC type (manufactured by Tosoh Corporation)
Column: TSKgel Multipore HXL-M x 3 + guardcolumn (manufactured by Tosoh Corporation)
Eluent: Tetrahydrofuran Flow rate: 1.0 mL / min
Detector: RI detector Column temperature: 40 ° C
Injection volume: 100 μl
Molecular weight standard: Standard polystyrene (manufactured by Tosoh Corporation)

式（ＩＩ−１−１）で表される塩を、特開２００８−１２７３６７号公報に記載された方法で合成した。
式（ＩＩ−１−１）で表される塩１０．００部及びアセトニトリル６０．００部を仕込み、４０℃で３０分間攪拌し、式（ＩＩ−１−２）で表される化合物４．４４部を仕込み、５０℃で１時間攪拌することにより、式（ＩＩ−１−３）で表される化合物を含む溶液を得た。得られた式（ＩＩ−１−３）で表される化合物を含む溶液に、式（ＩＩ−１−４）で表される化合物２．６３部を仕込み、２３℃で１時間攪拌した。得られた反応マスに、クロロホルム８０部及びイオン交換水３０部を仕込み、攪拌、分液を行った。水洗を５回行った。得られた有機層に活性炭１．００部を仕込み、２３℃で３０分間攪拌し、ろ過した。ろ液を濃縮し、得られた濃縮物に、アセトニトリル２５部を添加して溶解し、濃縮した。得られた残渣にｔｅｒｔ−ブチルメチルエーテル３０部を加えて攪拌し、３０分間攪拌し、ろ過することにより、式（ＩＩ−１）で表される塩４．４８部を得た。 Synthesis Example 1: Synthesis of salt represented by formula (II-1)

A salt represented by the formula (II-1-1) was synthesized by the method described in JP 2008-127367 A.
10.00 parts of a salt represented by the formula (II-1-1) and 60.00 parts of acetonitrile were charged, stirred at 40 ° C. for 30 minutes, and a compound 4.44 represented by the formula (II-1-2). A solution containing a compound represented by the formula (II-1-3) was obtained by charging 1 part and stirring at 50 ° C. for 1 hour. To the obtained solution containing the compound represented by the formula (II-1-3), 2.63 parts of the compound represented by the formula (II-1-4) was charged and stirred at 23 ° C. for 1 hour. The obtained reaction mass was charged with 80 parts of chloroform and 30 parts of ion-exchanged water, and stirred and separated. Water washing was performed 5 times. The obtained organic layer was charged with 1.00 parts of activated carbon, stirred at 23 ° C. for 30 minutes, and filtered. The filtrate was concentrated, and 25 parts of acetonitrile was added to the resulting concentrate to dissolve and concentrate. To the obtained residue, 30 parts of tert-butyl methyl ether was added, stirred, stirred for 30 minutes, and filtered to obtain 4.48 parts of the salt represented by the formula (II-1).

Identification of the salt represented by the formula (II-1);
MS (ESI (+) Spectrum): M ⁺ 263.1
MS (ESI (-) Spectrum): M ^- 272.0

式（ＩＩ−２−１）で表される塩を、特開２００８−１２７３６７号公報に記載された方法で合成した。
式（ＩＩ−２−１）で表される塩１０．００部及びアセトニトリル６０．００部を仕込み、４０℃で３０分間攪拌し、式（ＩＩ−２−２）で表される化合物４．４４部を仕込み、５０℃で１時間攪拌することにより、式（ＩＩ−２−３）で表される化合物を含む溶液を得た。得られた式（ＩＩ−２−３）で表される化合物を含む溶液に、式（ＩＩ−２−４）で表される化合物３．２２部を仕込み、２３℃で１時間攪拌した。得られた反応マスに、クロロホルム８０部及びイオン交換水３０部を仕込み、攪拌、分液を行った。水洗を５回行った。得られた有機層に活性炭１．００部を仕込み、２３℃で３０分間攪拌し、ろ過した。ろ液を濃縮し、得られた濃縮物に、アセトニトリル３０部を添加して溶解し、濃縮した。得られた残渣にｔｅｒｔ−ブチルメチルエーテル５０部を加えて攪拌し、３０分間攪拌し、ろ過することにより、式（ＩＩ−２）で表される塩７．７９部を得た。 Synthesis Example 2: Synthesis of salt represented by formula (II-2)

A salt represented by the formula (II-2-1) was synthesized by the method described in JP 2008-127367 A.
10.00 parts of a salt represented by the formula (II-2-1) and 60.00 parts of acetonitrile were charged and stirred at 40 ° C. for 30 minutes to give a compound 4.44 represented by the formula (II-2-2). A solution containing a compound represented by the formula (II-2-3) was obtained by stirring 1 part at 50 ° C. for 1 hour. To the obtained solution containing the compound represented by the formula (II-2-3), 3.22 parts of the compound represented by the formula (II-2-4) was charged and stirred at 23 ° C. for 1 hour. The obtained reaction mass was charged with 80 parts of chloroform and 30 parts of ion-exchanged water, and stirred and separated. Water washing was performed 5 times. The obtained organic layer was charged with 1.00 parts of activated carbon, stirred at 23 ° C. for 30 minutes, and filtered. The filtrate was concentrated, and the resulting concentrate was dissolved by adding 30 parts of acetonitrile and concentrated. To the obtained residue, 50 parts of tert-butyl methyl ether was added and stirred, stirred for 30 minutes, and filtered to obtain 7.79 parts of the salt represented by the formula (II-2).

Identification of a salt represented by formula (II-2);
MS (ESI (+) Spectrum): M ⁺ 263.1
MS (ESI (-) Spectrum): M ^- 298.1

式（ＩＩ−３−１）で表される化合物５０．００部及びテトラヒドロフラン２５０部を、反応器中に仕込み、３０℃で３０分間攪拌し、トリメチルシリルクロリド５０．２３部を滴下した。得られた混合液を０℃まで冷却し、式（ＩＩ−３−２）で表される化合物（純度３２％ 東京化成製）１５７．２０部を３０分かけて滴下した。さらに、これを２３℃まで昇温し、同温度で１時間攪拌した。得られた反応混合物に、１Ｎ塩酸１２５部を仕込み、攪拌・静置し、分液することで水層を回収した。回収された水層に、ｔｅｒｔ−ブチルメチルエーテル１２５部を加えて攪拌・静置し、分液することで水層を回収した。回収された水層に、クロロホルム１２５部を加えて攪拌・静置し、分液することで有機層を回収した。回収された有機層をろ過し、得られたろ液を濃縮した。濃縮残渣に、アセトニトリル２８．３３部及びｔｅｒｔ−ブチルメチルエーテル３５４．１５部を仕込み、２３℃で３０分間攪拌し、析出した結晶をろ過することにより、式（ＩＩ−３−３）で表される化合物５３．００部を得た。

式（ＩＩ−３−４）で表される化合物１３．１２部及びクロロホルム７３．８６部を、反応器中に仕込み、３０℃で３０分間攪拌し、式（ＩＩ−３−３）で表される塩２０．７１部及びイオン交換水６２．２７部を添加した。次いで、３５％塩酸６．９０部を滴下し、２３℃で１２時間攪拌した。得られた反応混合物に、２８％アンモニア水１２．００部を滴下し、これを分液することで有機層を回収した。回収された有機層に、イオン交換水５０部を仕込み、攪拌、静置及び分液といった水洗操作を計５回行った。得られた有機層に活性炭２．００部を仕込み、２３℃で３０分間攪拌し、ろ過した。ろ液を濃縮し、得られた濃縮物に、アセトニトリル３０部及びｔｅｒｔ−ブチルメチルエーテル１５０部を加えて攪拌し、ろ過して、式（ＩＩ−３−５）で表される塩１４．２８部を得た。 Synthesis Example 3: Synthesis of salt represented by formula (II-3)

50.00 parts of the compound represented by the formula (II-3-1) and 250 parts of tetrahydrofuran were charged into a reactor, stirred at 30 ° C. for 30 minutes, and 50.23 parts of trimethylsilyl chloride was added dropwise. The obtained mixed liquid was cooled to 0 ° C., and 157.20 parts of a compound represented by the formula (II-3-2) (purity: 32%, manufactured by Tokyo Chemical Industry Co., Ltd.) was added dropwise over 30 minutes. Furthermore, this was heated up to 23 degreeC and stirred at the same temperature for 1 hour. To the resulting reaction mixture, 125 parts of 1N hydrochloric acid was charged, stirred and allowed to stand, and separated to recover the aqueous layer. To the recovered aqueous layer, 125 parts of tert-butyl methyl ether was added, stirred and allowed to stand, and the aqueous layer was recovered by liquid separation. To the recovered aqueous layer, 125 parts of chloroform was added, stirred and allowed to stand, and separated to recover the organic layer. The collected organic layer was filtered, and the obtained filtrate was concentrated. The concentrated residue was charged with 28.33 parts of acetonitrile and 354.15 parts of tert-butyl methyl ether, stirred at 23 ° C. for 30 minutes, and the precipitated crystals were filtered, thereby being represented by the formula (II-3-3). Compound 53.00 parts was obtained.

13.12 parts of a compound represented by the formula (II-3-4) and 73.86 parts of chloroform were charged into a reactor, stirred at 30 ° C. for 30 minutes, and represented by the formula (II-3-3). 200.71 parts of salt and 62.27 parts of ion-exchanged water were added. Subsequently, 6.90 parts of 35% hydrochloric acid was added dropwise and stirred at 23 ° C. for 12 hours. To the resulting reaction mixture, 12.00 parts of 28% aqueous ammonia was added dropwise, and this was separated to recover the organic layer. The recovered organic layer was charged with 50 parts of ion-exchanged water and subjected to a total of five washing operations such as stirring, standing and liquid separation. The obtained organic layer was charged with 2.00 parts of activated carbon, stirred at 23 ° C. for 30 minutes, and filtered. The filtrate was concentrated, 30 parts of acetonitrile and 150 parts of tert-butyl methyl ether were added to the resulting concentrate, the mixture was stirred, filtered, and the salt 14.28 represented by the formula (II-3-5). Got a part.

  10.32 parts of a salt represented by the formula (II-3-5) and 61.91 parts of acetonitrile were charged, stirred at 40 ° C. for 30 minutes, and a compound 4.44 represented by the formula (II-3-6). Prepared the department. By stirring this at 50 degreeC for 1 hour, the solution containing the compound represented by Formula (II-3-7) was obtained. In a solution containing the compound represented by the formula (II-3-7) thus obtained, 2.63 parts of the compound represented by the formula (II-3-8) was charged and stirred at 23 ° C. for 1 hour. To the obtained reaction mass, 100 parts of chloroform and 50 parts of ion-exchanged water were added, and the mixture was stirred and separated. Water washing was performed 5 times. The obtained organic layer was charged with 1.00 parts of activated carbon, stirred at 23 ° C. for 30 minutes, and filtered. The filtrate was concentrated, and the resulting concentrate was dissolved by adding 30 parts of acetonitrile and concentrated. To the obtained residue, 30 parts of tert-butyl methyl ether was added and stirred, stirred for 30 minutes, and filtered to obtain 10.81 parts of the salt represented by the formula (II-3).

Identification of a salt represented by formula (II-3);
MS (ESI (+) Spectrum): M ⁺ 277.1
MS (ESI (-) Spectrum): M ^- 272.0

式（Ｂ１−５−ａ）で表される塩５０．４９部及びクロロホルム２５２．４４部を反応器に仕込み、２３℃で３０分間攪拌した後、式（Ｂ１−５−ｂ）で表される化合物１６．２７部を滴下し、２３℃で１時間攪拌することにより、式（Ｂ１−５−ｃ）で表される塩を含む溶液を得た。得られた式（Ｂ１−５−ｃ）で表される塩を含む溶液に、式（Ｂ１−５−ｄ）で表される塩４８．８０部及びイオン交換水８４．１５部を添加し、２３℃で１２時間攪拌した。得られた反応液が２層に分離していたので、クロロホルム層を分液して取り出し、更に、該クロロホルム層にイオン交換水８４．１５部を添加し、水洗した。この操作を５回繰り返した。得られたクロロホルム層に、活性炭３．８８部を添加攪拌し、ろ過した。回収されたろ液を濃縮し、得られた残渣に、アセトニトリル１２５．８７部を添加攪拌し、濃縮した。得られた残渣に、アセトニトリル２０．６２部及びｔｅｒｔ−ブチルメチルエーテル３０９．３０部を加えて２３℃で３０分間攪拌し、上澄み液を除去し、濃縮した。得られた残渣に、ｎ−ヘプタン２００部を添加、２３℃で３０分間攪拌し、ろ過することにより、式（Ｂ１−５）で表される塩６１．５４部を得た。
ＭＡＳＳ（ＥＳＩ（＋）Ｓｐｅｃｔｒｕｍ）：Ｍ^＋ ３７５．２
ＭＡＳＳ（ＥＳＩ（−）Ｓｐｅｃｔｒｕｍ）：Ｍ⁻ ３３９．１ Synthesis Example 4: Synthesis of salt represented by formula (B1-5)

50.49 parts of the salt represented by the formula (B1-5-a) and 252.44 parts of chloroform are charged into a reactor, stirred at 23 ° C. for 30 minutes, and then represented by the formula (B1-5-b). 16.27 parts of the compound was added dropwise and stirred at 23 ° C. for 1 hour to obtain a solution containing a salt represented by the formula (B1-5-c). To the obtained solution containing the salt represented by the formula (B1-5-c), 48.80 parts of the salt represented by the formula (B1-5-d) and 84.15 parts of ion-exchanged water are added, The mixture was stirred at 23 ° C. for 12 hours. Since the resulting reaction solution was separated into two layers, the chloroform layer was separated and removed, and 84.15 parts of ion-exchanged water was further added to the chloroform layer and washed with water. This operation was repeated 5 times. To the obtained chloroform layer, 3.88 parts of activated carbon was added and stirred, followed by filtration. The collected filtrate was concentrated, and 125.87 parts of acetonitrile was added to the resulting residue, and the mixture was stirred and concentrated. To the obtained residue, 20.62 parts of acetonitrile and 309.30 parts of tert-butyl methyl ether were added and stirred at 23 ° C. for 30 minutes, and the supernatant was removed and concentrated. To the obtained residue, 200 parts of n-heptane was added, stirred at 23 ° C. for 30 minutes, and filtered to obtain 61.54 parts of the salt represented by the formula (B1-5).
MASS (ESI (+) Spectrum): M ⁺ 375.2
MASS (ESI (−) Spectrum): M ^- 339.1

Resin synthesis Monomers used in resin synthesis are shown below.

[Synthesis of Resin A1]
Monomer (D), monomer (E), monomer (B), monomer (F), and monomer (C) are in a molar ratio [monomer (D): monomer (E): monomer (B): monomer (F): Monomer (C)] was mixed at 30: 14: 6: 20: 30, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 7.0. × give 10 ³ of copolymer in 60% yield. This copolymer has the following structural units, and is designated as resin A1.

[Synthesis of Resin A2]
Monomer (D), monomer (G), monomer (B), monomer (F), and monomer (C) are in a molar ratio [monomer (D): monomer (G): monomer (B): monomer (F): Monomer (C)] was mixed at 30: 14: 6: 20: 30, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 7.4. × give 10 ³ of copolymer in 62% yield. This copolymer has the following structural units and is designated as resin A2.

[Synthesis of Resin A3]
Monomer (A), monomer (B) and monomer (C) are mixed so that the molar ratio [monomer (A): monomer (B): monomer (C)] is 50:25:25, , 1.5 mass times dioxane was mixed with respect to the total mass of all monomers. To the obtained mixture, azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) were added as initiators in proportions of 1 mol% and 3 mol%, respectively, with respect to the total number of moles of all monomers. Then, this was heated at 80 ° C. for about 8 hours to carry out polymerization. Thereafter, the polymerization reaction solution was poured into a large amount of a mixed solvent of methanol and water (mass ratio methanol: water = 4: 1) to precipitate the resin. This resin is filtered and collected, dissolved again in dioxane, poured into a large amount of methanol / water mixed solvent to precipitate the resin, and the precipitated resin is filtered and collected three times for reprecipitation. Purification gave a copolymer having a weight average molecular weight of about 9.2 × 10 ³ in a yield of 60%. This copolymer has structural units derived from the following monomers respectively derived from the monomer (A), the monomer (B), and the monomer (C), and this is referred to as a resin A3.

[Synthesis of Resin A4]
Monomer (D), monomer (H), monomer (B), monomer (F) and monomer (C) are in a molar ratio [monomer (D): monomer (H): monomer (B): monomer (F): Monomer (C)] was mixed at 30: 14: 6: 20: 30, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The resin obtained was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 8.2. × give 10 ³ of the copolymer at 68% yield. This copolymer has the following structural units and is designated as resin A4.

[Synthesis of Resin A5]
Monomer (D), monomer (H), monomer (I), monomer (F) and monomer (C) are in a molar ratio [monomer (D): monomer (H): monomer (I): monomer (F): The monomer (C)] was mixed so as to be 35: 15: 3: 27: 20, and 1.5 mass times dioxane of the total monomer amount was added to obtain a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 7.9. × give 10 ³ of copolymer in 73% yield. This copolymer has the following structural units and is designated as resin A5.

[Synthesis of Resin A6]
Monomer (D), monomer (H), monomer (I), monomer (F) and monomer (C) are in a molar ratio [monomer (D): monomer (H): monomer (I): monomer (F): Monomer (C)] was mixed so as to be 45: 14: 2.5: 22: 16.5, and propylene glycol monomethyl ether acetate of 1.5 mass times the total monomer amount was added to obtain a solution. To this solution, azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added in an amount of 0.95 mol% and 2.85 mol%, respectively, based on the total monomer amount, and these were added at 73 ° C. Heated for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / ion-exchanged water = 4/1 mixing solution to precipitate a resin, which was filtered to obtain a copolymer having a weight average molecular weight of 7.8 × 10 ^3. The yield was 73%. This copolymer has the following structural units and is designated as resin A6.

<Preparation of resist composition>
The components shown in the following table were dissolved in the following solvents in the parts by mass shown in Table 1, and further filtered through a fluororesin filter having a pore diameter of 0.2 μm to prepare a resist composition.

<Resin>
A1 to A5: Resins A1 to A5 synthesized by resin synthesis

ＩＩ−２：

ＩＩ−３：

Ｂ１−３：特開２０１０−１５２３４１号公報の実施例に従って合成

Ｂ１−５：

Ｂ２：特開２００７−１６１７０７号公報の実施例に従って合成

<Acid generator>
II-1:

II-2:

II-3:

B1-3: synthesized according to the example of JP 2010-152341 A

B1-5:

B2: synthesized according to the example of JP2007-161707A

<Basic compound: Quencher>
C1: 2,6-diisopropylaniline (manufactured by Tokyo Chemical Industry Co., Ltd.)
<Compound represented by formula (I)>
D1: (Tokyo Chemical Industry Co., Ltd.)

<Solvent>
Propylene glycol monomethyl ether acetate 265.0 parts Propylene glycol monomethyl ether 20.0 parts 2-heptanone 20.0 parts γ-butyrolactone 3.5 parts

<Manufacture of resist pattern>
An organic antireflective coating composition (ARC-29; manufactured by Nissan Chemical Co., Ltd.) is applied to a silicon wafer and baked at 205 ° C. for 60 seconds to form an organic antireflective coating having a thickness of 78 nm. Formed. Next, the above resist composition was spin-coated on this organic antireflection film so that the film thickness after drying was 85 nm. The silicon wafer coated with the resist composition was pre-baked on a direct hot plate at a temperature described in the “PB” column of Table 1 for 60 seconds to form a composition layer. ArF excimer stepper for immersion exposure (XT: 1900 Gi; manufactured by ASML, NA = 1.35, 3/4 Annular XY polarized light) on a silicon wafer on which the composition layer is formed, and a contact hole pattern (hole pitch 100 nm) Using a mask for forming a hole diameter of 70 nm), the exposure amount was changed stepwise to perform exposure. Note that ultrapure water was used as the immersion medium.
After the exposure, the silicon wafer was post-exposure baked on a hot plate at a temperature described in the “PEB” column of Table 1 for 60 seconds. Next, this silicon wafer was subjected to paddle development for 60 seconds with a 2.38% tetramethylammonium hydroxide aqueous solution to obtain a resist pattern.

  In each resist pattern, an exposure amount at which the hole diameter of a pattern formed with a mask having a hole diameter of 70 nm is 55 nm is defined as effective sensitivity.

<Focus margin evaluation (DOF)>
In the effective sensitivity, the resist pattern is formed by changing the focus stepwise. The focus range in which the hole diameter of the obtained resist pattern is 55 nm ± 5% (52.5 to 57.7 nm) is defined as DOF. Evaluation was made at 4 levels. In other words, those having a DOF of 0.20 μm or more are indicated with “◎”,
“○” indicates that the thickness is 0.12 μm or more and less than 0.20 μm,
What was less than 0.12 micrometer was made into "x".
The results are shown in Table 2. In Table 2, the numbers in parentheses indicate DOF values (μm).

<Preparation of resist composition>
Each of the components shown below was dissolved in the following solvent in parts by mass shown in Table 3, and further filtered through a fluororesin filter having a pore diameter of 0.2 μm to prepare a resist composition.

<Manufacture of negative resist pattern>
An organic antireflective coating composition (ARC-29; manufactured by Nissan Chemical Co., Ltd.) is applied to a silicon wafer and baked at 205 ° C. for 60 seconds to form an organic reflective film having a thickness of 78 nm on the wafer. A prevention film was formed. Next, on the organic antireflection film, the above resist composition was applied (spin coated) so that the film thickness after drying was 85 nm. After coating, the silicon wafer was pre-baked on a direct hot plate for 60 seconds at the temperature described in the “PB” column of Table 3 to form a composition layer. ArF excimer stepper for immersion exposure (XT: 1900 Gi; manufactured by ASML, NA = 1.35, 3/4 Annular XY polarized light) on a silicon wafer on which the composition layer is formed, and a contact hole pattern (hole pitch 90 nm) Using a mask for forming a hole diameter of 55 nm), the exposure amount was changed stepwise. Note that ultrapure water was used as the immersion medium.
After the exposure, post-exposure baking was performed for 60 seconds on the hot plate at the temperature described in the “PEB” column of Table 3. Next, the composition layer on the silicon wafer is developed by using a butyl acetate (manufactured by Tokyo Chemical Industry Co., Ltd.) as a developing solution by a dynamic dispensing method at 23 ° C. for 20 seconds, thereby forming a negative resist pattern. Manufactured.

  In the resist pattern obtained after development, the exposure amount at which the hole diameter formed using the mask was 45 nm was defined as the effective sensitivity.

<Focus margin evaluation (DOF)>
A negative resist pattern was manufactured in the same manner as described above except that the exposure was performed while changing the focus stepwise in terms of effective sensitivity. In the obtained resist pattern, the focus range in which the hole diameter width is 45 nm ± 5% (42.7 to 47.3 nm) was defined as DOF, and the following evaluation was performed. In other words, “○” indicates that the DOF is 0.10 μm or more,
What was less than 0.10 micrometer was made into "x".
The results are shown in Table 4.

  According to the resist composition of the present invention, a resist pattern can be obtained with an excellent focus margin (DOF).

Claims (4)

(A) a resin having an acid labile group,
(B) A resist composition containing an acid generator represented by formula (II) and (D) a compound represented by formula (I).

[In the formula (I),
R ^D1 and R ^D2 are each independently a hydrocarbon group having 1 to 12 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 7 carbon atoms, an acyloxy group having 2 to 7 carbon atoms, or a carbon number Represents 2 to 7 alkoxycarbonyl groups, nitro groups or halogen atoms.
m ′ and n ′ each independently represents an integer of 0 to 4. When m ′ is 2 or more, a plurality of R ^D1 are the same or different from each other, and when n ′ is 2 or more, a plurality of R ^D2 Are the same or different from each other. ]

[In the formula (II),
R ^b1 and R ^b2 each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ^b1 represents a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and —CH ₂ — contained in the divalent saturated hydrocarbon group may be replaced by —O— or —CO—. .
Ring ^{W b1} represents a heterocycle of the C 2 to C 36.
R ^b3 represents a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
R ^b4 represents a hydrocarbon group having 1 to 6 carbon atoms, and —CH ₂ — contained in the hydrocarbon group may be replaced by —O— or —CO—.
s represents an integer of 0 to 6, and when s is 2 or more, the plurality of R ^b4 are the same or different.
Z1 ⁺ represents an organic cation. ] The resist composition according to claim 1, wherein L ^b1 is a group represented by the formula (L1-1).

[In Formula (L1-1), L ^b2 represents a single bond or a divalent saturated hydrocarbon group having 1 to 15 carbon atoms. * Represents a bond with —C (R ^b1 ) (R ^b2 ) —. ]   Furthermore, the resist composition of Claim 1 or 2 containing a solvent. (1) The process of apply | coating the resist composition in any one of Claims 1-3 on a board | substrate,
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
(4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating,
A method for producing a resist pattern including: