JP2013132502A5 - - Google Patents

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JP2013132502A5
JP2013132502A5 JP2011286296A JP2011286296A JP2013132502A5 JP 2013132502 A5 JP2013132502 A5 JP 2013132502A5 JP 2011286296 A JP2011286296 A JP 2011286296A JP 2011286296 A JP2011286296 A JP 2011286296A JP 2013132502 A5 JP2013132502 A5 JP 2013132502A5
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fundus
examination
presentation
target
inspection
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JP2011286296A
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JP2013132502A (en
JP5953740B2 (en
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Description

撮影された患者眼の眼底画像が表示される表示部と、眼底に検査視標を投影するための視標呈示部を備える視標呈示光学系と、前記患者眼の眼底を撮像するための撮像素子を備える眼底観察光学系と、を備える眼底検査装置において、前記表示部に表示される所定の前記眼底画像を基準画像とし,該基準画像に対する前記検査視標の呈示位置及び呈示領域を定めるための検査条件設定手段と、該検査条件設定手段で設定された前記検査視標の呈示位置又は呈示領域を変更するための検査条件変更手段と、該検査条件変更手段にて設定された前記検査視標の呈示条件に基づき前記視標呈示部を駆動制御する制御手段と、を備えることを特徴とする
A display unit for displaying a photographed fundus image of a patient's eye, a visual target presenting optical system including a visual target presenting unit for projecting a test visual target on the fundus, and an image for imaging the fundus of the patient's eye A fundus inspection apparatus including a fundus observation optical system including an element for defining a predetermined position of the fundus image displayed on the display unit as a reference image and determining a display position and a display area of the inspection target with respect to the reference image Inspection condition setting means, inspection condition changing means for changing a presentation position or a presentation area of the inspection visual target set by the inspection condition setting means, and the inspection visual set by the inspection condition changing means Control means for driving and controlling the target presentation unit based on a target presentation condition .

Claims (3)

撮影された患者眼の眼底画像が表示される表示部と、
眼底に検査視標を投影するための視標呈示部を備える視標呈示光学系と、
前記患者眼の眼底を撮像するための撮像素子を備える眼底観察光学系と、
を備える眼底検査装置において、
前記表示部に表示される所定の前記眼底画像を基準画像とし,該基準画像に対する前記検査視標の呈示位置及び呈示領域を定めるための検査条件設定手段と、
該検査条件設定手段で設定された前記検査視標の呈示位置又は呈示領域を変更するための検査条件変更手段と、
該検査条件変更手段にて設定された前記検査視標の呈示条件に基づき前記視標呈示部を駆動制御する制御手段と、
を備えることを特徴とする眼底検査装置。
A display unit for displaying a fundus image of the photographed patient's eye;
An optotype presenting optical system including an optotype presenting unit for projecting an examination target on the fundus;
A fundus oculi observation optical system comprising an image sensor for imaging the fundus of the patient's eye;
A fundus examination apparatus comprising:
A predetermined condition of the fundus image displayed on the display unit as a reference image, and an examination condition setting means for determining a presentation position and a presentation area of the examination target with respect to the reference image;
Examination condition changing means for changing the presentation position or the presentation area of the examination optotype set by the examination condition setting means;
Control means for driving and controlling the target presentation unit based on the test target presentation conditions set by the test condition changing means;
A fundus examination apparatus comprising:
請求項1の眼底検査装置において、
前記検査条件変更手段による前記検査視標の呈示位置及び呈示領域の変更は、前記表示部に表示された前記基準画像上での前記検査視標の移動,拡大縮小,複製,及び削除のうちの少なくとも一つであり、
前記制御手段は前記検査条件変更手段による変更により設定された前記検査視標の呈示位置及び呈示領域に基づき,眼底に対する検査視標の呈示位置を決定することを特徴とする眼底検査装置。
The fundus examination apparatus according to claim 1.
The inspection target presentation position and the presentation area change by the inspection condition changing means are the movement, enlargement / reduction, duplication, and deletion of the inspection target on the reference image displayed on the display unit. At least one,
The fundus examination apparatus according to claim 1, wherein the control unit determines a presentation position of the examination target with respect to the fundus based on the presentation position and the presentation area of the examination target set by the change by the examination condition changing unit .
請求項1または2の眼底検査装置において、
前記検査条件設定手段による前記検査視標の呈示領域の設定時に前記表示部に表示される前記眼底画像と前記撮像素子で撮像される眼底観察像との対応付けを行うための座標変換手段を備え、
前記制御手段は前記座標変換手段による座標変換に基づき前記検査視標の呈示位置を決定することを特徴とする眼底検査装置。
The fundus examination apparatus according to claim 1 or 2 ,
Coordinate conversion means for associating the fundus image displayed on the display unit with the fundus observation image picked up by the image sensor when the inspection target presenting area is set by the inspection condition setting means ,
The fundus examination apparatus characterized in that the control means determines a presentation position of the examination optotype based on coordinate transformation by the coordinate transformation means .
JP2011286296A 2011-12-27 2011-12-27 Fundus examination device Active JP5953740B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011286296A JP5953740B2 (en) 2011-12-27 2011-12-27 Fundus examination device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011286296A JP5953740B2 (en) 2011-12-27 2011-12-27 Fundus examination device

Publications (3)

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JP2013132502A JP2013132502A (en) 2013-07-08
JP2013132502A5 true JP2013132502A5 (en) 2015-02-19
JP5953740B2 JP5953740B2 (en) 2016-07-20

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6474740B2 (en) * 2014-02-12 2019-02-27 興和株式会社 Perimeter
EP3106082B1 (en) * 2014-02-12 2020-04-22 Kowa Company, Ltd. Perimeter
JP5956518B2 (en) * 2014-07-17 2016-07-27 国立大学法人東北大学 Ophthalmic analysis device and ophthalmic imaging device
JP6888403B2 (en) * 2017-05-01 2021-06-16 株式会社ニデック Visual function test device
JP7024240B2 (en) * 2017-07-27 2022-02-24 株式会社ニデック Ophthalmic system and ophthalmic system control program
KR101984995B1 (en) * 2018-07-20 2019-05-31 주식회사 아이피아 Artificial intelligence visual field alalysis method and apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0654804A (en) * 1992-08-05 1994-03-01 Canon Inc Perimeter
JP2000262472A (en) * 1999-03-19 2000-09-26 Kowa Co Perimeter
US20030157464A1 (en) * 2002-02-20 2003-08-21 Cesare Tanassi Instrument for eye examination and method
JP2005102946A (en) * 2003-09-30 2005-04-21 Nidek Co Ltd Perimeter
JP4896621B2 (en) * 2006-08-09 2012-03-14 興和株式会社 Perimeter

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