JP2013107841A - Cyclic compound, manufacturing method for the same, radiation-sensitive composition and method for forming resist pattern - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a cyclic compound represented by a specific chemical structure useful as an acid-amplified non-polymer resist material, a radiation-sensitive composition comprising the same, and a method for forming a resist pattern using the radiation-sensitive composition.SOLUTION: The compound is represented by formula (1) and has a molecular weight of 500-5,000. In the formula, R's are each independently a hydrogen atom, hydroxy group, alkyl group, hydroxyalkyl group, cyclohexylphenyl group, alkylphenyl group or the like.

Description

  The present invention relates to a cyclic compound represented by a specific chemical structural formula, useful as an acid-amplified non-polymeric resist material, a radiation-sensitive composition containing the same, and a resist pattern forming method using the composition.

  Conventional general resist materials are polymer materials capable of forming an amorphous thin film. For example, a resist thin film prepared by applying a solution of a polymer resist material such as polymethyl methacrylate, polyhydroxystyrene having an acid-dissociable reactive group or polyalkyl methacrylate on a substrate, ultraviolet rays, far ultraviolet rays, electron beams, extreme A line pattern of about 45 to 100 nm is formed by irradiating with ultraviolet rays (EUV), X-rays or the like.

  However, since the polymer resist has a large molecular weight of about 10,000 to 100,000 and a wide molecular weight distribution, the lithography using the polymer resist causes roughness on the surface of the fine pattern, making it difficult to control the pattern dimensions. , Yield decreases. Therefore, there is a limit to miniaturization in conventional lithography using a polymer resist material. In order to produce a finer pattern, various low molecular weight resist materials have been proposed.

  For example, an alkali developing negative radiation-sensitive composition (see Patent Document 1 and Patent Document 2) using a low-molecular-weight polynuclear polyphenol compound as a main component has been proposed. There is a drawback that the shape of the resist pattern to be obtained becomes worse.

  As candidates for low molecular weight resist materials, alkali-developable negative radiation-sensitive compositions (see Patent Documents 3 to 4 and Non-Patent Document 1) using a low molecular weight cyclic polyphenol compound as a main component have been proposed. Since these low molecular weight cyclic polyphenol compounds have a low molecular weight, it is expected to provide a resist pattern having a small molecular size, high resolution, and low roughness. Further, the low molecular weight cyclic polyphenol compound has a rigid cyclic structure in its skeleton, and thus provides high heat resistance despite its low molecular weight.

  However, currently known low molecular weight cyclic polyphenol compounds have problems such as low solubility in safety solvents used in semiconductor manufacturing processes, low sensitivity, and poor resist pattern shape. Improvement of polyphenol compounds is desired.

JP 2005-326838 A JP 2008-145539 A JP 2009-173623 A WO2011 / 024916 International publication pamphlet

T.A. Nakayama, M .; Nomura, K .; Haga, M .; Ueda: Bull. Chem. Soc. Jpn. 71, 2979 (1998)

  An object of the present invention is to provide a cyclic compound having high solubility in a safe solvent, high sensitivity, low roughness, and good resist pattern shape, a method for producing the same, a radiation-sensitive composition containing the same, and the radiation sensitivity It is providing the resist pattern formation method using a composition.

  As a result of intensive studies to solve the above problems, the present inventors have found that a cyclic compound having a specific structure has high solubility in a safe solvent, high sensitivity, low roughness, and a good resist pattern shape. The present invention has been reached.

式（１）中、Ｒ^０は、それぞれ独立して、水素原子、水酸基、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数７〜３０のアラルキル基、置換若しくは無置換の炭素数１〜２０のアルコキシ基、置換若しくは無置換の炭素数０〜２０のアミノ基、置換若しくは無置換の炭素数２〜２０のアルケニル基、置換若しくは無置換の炭素数１〜２０のアシル基、置換若しくは無置換の炭素数２〜２０のアルコキシカルボニル基、置換若しくは無置換の炭素数１〜２０のアルキロイルオキシ基、置換若しくは無置換の炭素数７〜３０のアリーロイルオキシ基、置換若しくは無置換の炭素数１〜２０のアルキルシリル基、又はこれらの基と二価の基（置換若しくは無置換のアルキレン基、置換若しくは無置換のアリーレン基及びエーテル基からなる群より選択される１以上の基）が結合した基であり、
前記Ｒ^０の少なくとも１つが炭素数２〜５のアルコキシメチル基又はヒドロキシメチル基を含む一価の基である。
２．前記化合物が、式（２）で示されることを特徴とする前項１記載の環状化合物。

式（２）中、Ｒ^１は、それぞれ独立して、水素原子、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数１〜２０のアルキルシリル基又は置換若しくは無置換の炭素数２〜２０のアルケニル基であり、
Ｒ^２は、それぞれ独立して、水素原子、シアノ基、ニトロ基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数７〜３０のアラルキル基、置換若しくは無置換の炭素数１〜２０のアルコキシ基、置換若しくは無置換の炭素数２〜２０のアルケニル基、置換若しくは無置換の炭素数１〜２０のアシル基、置換若しくは無置換の炭素数２〜２０のアルコキシカルボニル基、置換若しくは無置換の炭素数１〜２０のアルキロイルオキシ基、置換若しくは無置換の炭素数７〜３０のアリーロイルオキシ基又は置換若しくは無置換の炭素数１〜２０のアルキルシリル基であり、
Ｒ’は、それぞれ独立して、水素原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基又は下記式（３）

で表わされる基であり、Ｒ^４は、それぞれ独立して、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数１〜２０のアルコキシ基又は置換若しくは無置換の炭素数１〜２０のアルキルシリル基であり、ｐは０〜５の整数であり、
前記Ｒ^２の少なくとも１つが炭素数２〜５のアルコキシメチル基又はヒドロキシメチル基である。
３．前記化合物が、式（４）で示される前項２記載の環状化合物。

式（４）中、Ｒ^３は水素原子又は炭素数１〜４のアルキル基であり、Ｒ^１、Ｒ^４は前記と同じであり、ｐは０〜５の整数である。
４．前記化合物が、式（５）で示される前項３記載の環状化合物。

式（５）中、Ｒ^１、Ｒ^３、Ｒ^４、ｐは前記と同じである。
５．前項１〜４のいずれか１項に記載の環状化合物を製造する方法であって、１種以上のアルデヒド性化合物（Ａ１）からなる化合物と１種以上のフェノール性化合物（Ａ２）からなる化合物とを縮合反応させて環状化合物（Ａ）を得る工程と、該環状化合物（Ａ）とホルムアルデヒドとを反応させる工程を備え、前記Ｒ^０の少なくとも１つがヒドロキシメチル基を含む一価の基である環状化合物（Ｂ）を得ることを特徴とする環状化合物の製造方法。
６．さらに、前記環状化合物（Ｂ）と炭素数１〜４の飽和脂肪族アルコール（Ａ３）とを反応させる工程を備え、前記Ｒ^０の少なくともひとつが炭素数２〜５のアルコキシメチル基を含む一価の基である環状化合物（Ｃ）を得ることを特徴とする前項５に記載の環状化合物の製造方法。
７．前記アルデヒド性化合物（Ａ１）は、１〜４個のホルミル基を有する一価の基を含む炭素数が１〜５９の化合物であり、前記フェノール性化合物（Ａ２）は、１〜３個のフェノール性水酸基を有する炭素数６〜１５の化合物であることを特徴とする前項５又は６に記載の環状化合物の製造方法。
８．前項１〜４のいずれか１項に記載の環状化合物及び溶媒を含むことを特徴とする感放射線性組成物。
９．前記組成物の固形成分が１~８０重量％であることを特徴とする前項８に記載の感放射線性組成物。
１０．前記固形成分の全重量に占める前記環状化合物の割合が５０〜９９．９９９重量％であることを特徴とする前項９に記載の感放射線性組成物。
１１．可視光線、紫外線、エキシマレーザー、電子線、極端紫外線（ＥＵＶ）、Ｘ線及びイオンビームからなる群から選ばれるいずれかの放射線の照射により直接的又は間接的に酸を発生する酸発生剤（Ｃ）をさらに含むことを特徴とする前項８〜１０のいずれか１項に記載の感放射線性組成物。
１２．酸架橋剤（Ｇ）をさらに含むことを特徴とする前項８〜１１のいずれか１項に記載の感放射線性組成物。
１３．酸拡散制御剤（Ｅ）をさらに含むことを特徴とする前項８〜１２のいずれか１項に記載の感放射線性組成物。
１４．前記固形成分が、環状化合物／酸発生剤（Ｃ）／酸架橋剤（Ｇ）／酸拡散制御剤（Ｅ）／任意成分（Ｆ））を、固形成分基準の重量％で、５０〜９９．４／０．００１〜４９／０．５〜４９／０．００１〜４９／０〜４９含有することを特徴とする前項１３に記載の感放射線性組成物。
１５．スピンコートによりアモルファス膜を形成することを特徴とする前項８〜１４のいずれか１項に記載の感放射線性組成物。
１６．前記アモルファス膜の２３℃における現像液に対する溶解速度が、１０Å／ｓｅｃ以上であることを特徴とする前項１５に記載の感放射線性組成物。
１７．ＫｒＦエキシマレーザー、極端紫外線、電子線又はＸ線を照射した後の前記アモルファス膜、又は２０〜２５０℃で加熱した後の前記アモルファス膜の、現像液に対する溶解速度が５Å／ｓｅｃ以下であることを特徴とする前項１６記載の感放射線性組成物。
１８．前項８〜１７のいずれか１項に記載の感放射線性組成物を、基板上に塗布してレジスト膜を形成する工程と、該レジスト膜を露光する工程と、該露光したレジスト膜を現像する工程とを備えることを特徴とするレジストパターン形成方法。 That is, the present invention is as follows.
1. A cyclic compound represented by formula (1) having a molecular weight of 500 to 5,000.

In formula (1), each R ⁰ independently represents a hydrogen atom, a hydroxyl group, a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic carbonization having 1 to 20 carbon atoms. A hydrogen group, a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted carbon number 6 to 20 Aryl group, substituted or unsubstituted aralkyl group having 7 to 30 carbon atoms, substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, substituted or unsubstituted amino group having 0 to 20 carbon atoms, substituted or unsubstituted An alkenyl group having 2 to 20 carbon atoms, a substituted or unsubstituted acyl group having 1 to 20 carbon atoms, a substituted or unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, a substituted or unsubstituted carbon group having 1 to 20 carbon atoms. A A rukyloyloxy group, a substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms, a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, or a divalent group thereof (substituted or unsubstituted alkylene) A group, one or more groups selected from the group consisting of a group, a substituted or unsubstituted arylene group and an ether group),
At least one of R ⁰ is a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group.
2. 2. The cyclic compound according to item 1 above, wherein the compound is represented by formula (2).

In formula (2), each R ¹ independently represents a hydrogen atom, a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms. A substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms A group, a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, or a substituted or unsubstituted alkenyl group having 2 to 20 carbon atoms,
Each R ² independently represents a hydrogen atom, a cyano group, a nitro group, a halogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted or unsubstituted carbon number of 3 to 3; 20 branched aliphatic hydrocarbon groups, substituted or unsubstituted cyclic aliphatic hydrocarbon groups having 3 to 20 carbon atoms, substituted or unsubstituted aryl groups having 6 to 20 carbon atoms, substituted or unsubstituted 7 carbon atoms -30 aralkyl group, substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, substituted or unsubstituted alkenyl group having 2 to 20 carbon atoms, substituted or unsubstituted acyl group having 1 to 20 carbon atoms, substituted or An unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, a substituted or unsubstituted alkyloyloxy group having 1 to 20 carbon atoms, and a substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms Or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms,
R ′ each independently represents a hydrogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, or a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms. A substituted or unsubstituted C3-C20 cyclic aliphatic hydrocarbon group or the following formula (3)

Each of R ⁴ independently represents a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted straight-chain aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted group Or an unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms, A substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, p is an integer of 0 to 5;
At least one of R ² is an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group.
3. The cyclic compound according to item 2, wherein the compound is represented by formula (4).

In Formula (4), R ³ is a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, R ¹ and R ⁴ are the same as described above, and p is an integer of 0 to 5.
4). 4. The cyclic compound according to item 3, wherein the compound is represented by formula (5).

In formula (5), R ¹ , R ³ , R ⁴ , and p are the same as described above.
5. 5. A method for producing the cyclic compound according to any one of items 1 to 4, wherein the compound comprises one or more aldehyde compounds (A1) and one or more phenol compounds (A2). A cyclic compound (A) is obtained by a condensation reaction, and the cyclic compound (A) is reacted with formaldehyde, wherein at least one of R ⁰ is a monovalent group containing a hydroxymethyl group A method for producing a cyclic compound, wherein the compound (B) is obtained.
6). And a step of reacting the cyclic compound (B) with a saturated aliphatic alcohol having 1 to 4 carbon atoms (A3), wherein at least one of R ⁰ contains a C ² to C 5 alkoxymethyl group. 6. The method for producing a cyclic compound as described in 5 above, wherein the cyclic compound (C) is a group.
7). The aldehyde compound (A1) is a compound having 1 to 59 carbon atoms including a monovalent group having 1 to 4 formyl groups, and the phenolic compound (A2) is 1 to 3 phenols. 7. The method for producing a cyclic compound according to 5 or 6 above, wherein the compound is a compound having 6 to 15 carbon atoms having a functional hydroxyl group.
8). 5. A radiation-sensitive composition comprising the cyclic compound according to any one of items 1 to 4 and a solvent.
9. 9. The radiation-sensitive composition according to item 8, wherein the solid component is 1 to 80% by weight.
10. 10. The radiation-sensitive composition according to item 9, wherein the ratio of the cyclic compound to the total weight of the solid component is 50 to 99.999% by weight.
11. Acid generator (C) that generates acid directly or indirectly by irradiation with any radiation selected from the group consisting of visible light, ultraviolet light, excimer laser, electron beam, extreme ultraviolet light (EUV), X-ray and ion beam The radiation-sensitive composition according to any one of items 8 to 10, further comprising:
12 The radiation-sensitive composition according to any one of items 8 to 11, further comprising an acid crosslinking agent (G).
13. The radiation-sensitive composition according to any one of items 8 to 12, further comprising an acid diffusion controller (E).
14 The solid component is cyclic compound / acid generator (C) / acid cross-linking agent (G) / acid diffusion controller (E) / optional component (F)) in a weight percentage based on the solid component of 50 to 99.99. The radiation-sensitive composition according to item 13 above, containing 4 / 0.001 to 49 / 0.5 to 49 / 0.001 to 49/0 to 49.
15. 15. The radiation sensitive composition according to any one of items 8 to 14, wherein an amorphous film is formed by spin coating.
16. 16. The radiation-sensitive composition according to item 15 above, wherein the dissolution rate of the amorphous film in a developing solution at 23 ° C. is 10 Å / sec or more.
17. The dissolution rate of the amorphous film after irradiation with KrF excimer laser, extreme ultraviolet light, electron beam or X-ray, or the amorphous film after heating at 20 to 250 ° C. is 5 Å / sec or less. 17. The radiation sensitive composition according to item 16 above.
18. The step of applying the radiation-sensitive composition according to any one of items 8 to 17 on a substrate to form a resist film, the step of exposing the resist film, and developing the exposed resist film And a step of forming a resist pattern.

  INDUSTRIAL APPLICABILITY According to the present invention, a cyclic compound having high solubility in a safe solvent, high sensitivity, low roughness, and good resist pattern shape, a method for producing the same, a radiation-sensitive composition containing the same, and the radiation-sensitive composition It is possible to provide a resist pattern forming method using an object.

Hereinafter, the present invention will be described in detail.
(Cyclic compound and production method thereof)
The present invention relates to a cyclic compound useful as a resist material and a method for producing the same.
The cyclic compound of the present invention is represented by the following formula (1).

式（１）中、Ｒ^０は、それぞれ独立して、水素原子、水酸基、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数７〜３０のアラルキル基、置換若しくは無置換の炭素数１〜２０のアルコキシ基、置換若しくは無置換の炭素数０〜２０のアミノ基、置換若しくは無置換の炭素数２〜２０のアルケニル基、置換若しくは無置換の炭素数１〜２０のアシル基、置換若しくは無置換の炭素数２〜２０のアルコキシカルボニル基、置換若しくは無置換の炭素数１〜２０のアルキロイルオキシ基、置換若しくは無置換の炭素数７〜３０のアリーロイルオキシ基、置換若しくは無置換の炭素数１〜２０のアルキルシリル基、又はこれらの基と二価の基（置換若しくは無置換のアルキレン基、置換若しくは無置換のアリーレン基及びエーテル基からなる群より選択される１以上の基）が結合した基であり、Ｒ^０の少なくともひとつが、炭素数２〜５のアルコキシメチル基又はヒドロキシメチル基を含む一価の基である。

In formula (1), each R ⁰ independently represents a hydrogen atom, a hydroxyl group, a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic carbonization having 1 to 20 carbon atoms. A hydrogen group, a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted carbon number 6 to 20 Aryl group, substituted or unsubstituted aralkyl group having 7 to 30 carbon atoms, substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, substituted or unsubstituted amino group having 0 to 20 carbon atoms, substituted or unsubstituted An alkenyl group having 2 to 20 carbon atoms, a substituted or unsubstituted acyl group having 1 to 20 carbon atoms, a substituted or unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, a substituted or unsubstituted carbon group having 1 to 20 carbon atoms. A A rukyloyloxy group, a substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms, a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, or a divalent group thereof (substituted or unsubstituted alkylene) Group, one or more groups selected from the group consisting of a substituted or unsubstituted arylene group and an ether group), and at least one of R ⁰ is an alkoxymethyl group having 2 to 5 carbon atoms or hydroxymethyl A monovalent group containing a group.

By making at least one of R ⁰ a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group, radiation such as electron beams, extreme ultraviolet rays (EUV), X-rays, visible rays, ultraviolet rays As a result of acid generation from an acid generator directly or indirectly by irradiation with any radiation selected from the group consisting of excimer laser, electron beam, extreme ultraviolet (EUV), X-ray and ion beam, a crosslinking reaction Progresses. As a result, the sensitivity of the resist using the cyclic compound of the present invention can be increased. In particular, in extreme ultraviolet (EUV) lithography, it is considered essential to increase the sensitivity of the resist in order to improve the productivity of semiconductor devices, and the cyclic compound of the present invention is extremely useful.

  In this specification, unless otherwise defined, “substituted” means that one or more hydrogen atoms in the functional group are a halogen atom, a hydroxyl group, a cyano group, a nitro group, a heterocyclic group, or a carbon number of 1-20. Linear aliphatic hydrocarbon group, branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, aryl group having 6 to 20 carbon atoms, and 7 to 7 carbon atoms 30 aralkyl groups, C1-20 alkoxy groups, C0-20 amino groups, C2-20 alkenyl groups, C1-20 acyl groups, C2-20 alkoxycarbonyl groups , An alkylyl group having 1 to 20 carbon atoms, an aryloyloxy group having 7 to 30 carbon atoms, or an alkylsilyl group having 1 to 20 carbon atoms.

An unsubstituted C1-C20 linear aliphatic hydrocarbon group is, for example, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, an octyl group, a decyl group, a dodecyl group, or a hexadecyl group. Group, octadecyl group and the like.
The substituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms includes, for example, a fluoromethyl group, a 2-hydroxyethyl group, and 3 in addition to the above-described alkoxymethyl group or hydroxymethyl group having 2 to 5 carbon atoms. -A cyanopropyl group, a 20-nitrooctadecyl group, etc. are mentioned.

Examples of the unsubstituted aliphatic hydrocarbon group having 3 to 20 carbon atoms include isopropyl group, isobutyl group, tertiary butyl group, neopentyl group, 2-hexyl group, 2-octyl group, 2-decyl group, 2-dodecyl group, 2-hexadecyl group, 2-octadecyl group and the like can be mentioned.
Examples of the substituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms include 1-fluoroisopropyl group and 1-hydroxy-2-octadecyl group.

The unsubstituted C3-C20 cyclic aliphatic hydrocarbon group is, for example, a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cyclooctyl group, a cyclodecyl group, a cyclododecyl group, a cyclohexadecyl group, a cyclo An octadecyl group etc. are mentioned.
Examples of the substituted C3-C20 cyclic aliphatic hydrocarbon group include a 2-fluorocyclopropyl group and a 4-cyanocyclohexyl group.

Examples of the unsubstituted aryl group having 6 to 20 carbon atoms include a phenyl group and a naphthyl group.
Examples of the substituted aryl group having 6 to 20 carbon atoms include 4-methylphenyl group and 6-fluoronaphthyl group.

Examples of the unsubstituted aralkyl group having 7 to 30 carbon atoms include a methylphenyl group, an ethylphenyl group, a methylnaphthyl group, and a dimethylnaphthyl group.
Examples of the substituted aralkyl group having 7 to 30 carbon atoms include a 4-fluoro-3-methylphenyl group.

Examples of the unsubstituted C1-C20 alkoxy group include, for example, methoxy group, ethoxy group, propoxy group, butoxy group, pentyloxy group, hexyloxy group, octyloxy group, decyloxy group, dodecyloxy group, hexadecyloxy group Group, octadecyloxy group and the like.
Examples of the substituted alkoxy group having 1 to 20 carbon atoms include a chloromethoxy group and a bromoethoxy group.

Examples of the unsubstituted amino group having 0 to 20 carbon atoms include an amino group, a methylamino group, a dimethylamino group, an ethylamino group, a diethylamino group, a dipropylamino group, and a dibutylamino group.
Examples of the substituted amino group having 0 to 20 carbon atoms include a chloromethylamino group and a dibromomethylamino group.

Examples of the unsubstituted alkenyl group having 2 to 20 carbon atoms include vinyl group, propynyl group, butynyl group, pentynyl group, hexynyl group, octynyl group, decynyl group, dodecynyl group, hexadecynyl group, and octadecynyl group.
Examples of the substituted alkenyl group having 2 to 20 carbon atoms include a chloropropynyl group.

Examples of the unsubstituted acyl group having 1 to 20 carbon atoms include formyl group, acetyl group, propanoyl group, butanoyl group, pentanoyl group, hexanoyl group, octanoyl group, decanoyl group, dodecanoyl group, hexadecanoyl group, and benzoyl group. Etc.
Examples of the substituted acyl group having 1 to 20 carbon atoms include a chloroacetyl group.

Examples of the unsubstituted C2-C20 alkoxycarbonyl group include, for example, methoxycarbonyl group, ethoxycarbonyl group, propoxycarbonyl group, butoxycarbonyl group, pentyloxycarbonyl group, hexyloxycarbonyl group, octyloxycarbonyl group, decyloxy A carbonyl group, a dodecyloxycarbonyl group, a hexadecyloxycarbonyl group, etc. are mentioned.
Examples of the substituted C2-C20 alkoxycarbonyl group include a chloromethoxycarbonyl group.

Examples of the unsubstituted alkyloyloxy group having 1 to 20 carbon atoms include methoxycarbonyloxy group, ethoxycarbonyloxy group, propoxycarbonyloxy group, butoxycarbonyloxy group, pentyloxycarbonyloxy group, hexyloxycarbonyloxy group, Examples include octyloxycarbonyloxy group, decyloxycarbonyloxy group, dodecyloxycarbonyloxy group, hexadecyloxycarbonyloxy group and the like.
Examples of the substituted alkyloyloxy group having 1 to 20 carbon atoms include a chloromethoxycarbonyloxy group.

Examples of the unsubstituted aryloyloxy group having 7 to 30 carbon atoms include a benzoyloxy group and a naphthylcarbonyloxy group.
Examples of the substituted aryloyloxy group having 7 to 30 carbon atoms include a chlorobenzoyloxy group.

Examples of the unsubstituted alkylsilyl group having 1 to 20 carbon atoms include methylsilyl group, ethylsilyl group, propylsilyl group, butylsilyl group, pentylsilyl group, hexylsilyl group, octylsilyl group, decylsilyl group, dodecylsilyl group, hexa A decylsilyl group, an octadecylsilyl group, etc. are mentioned.
Examples of the substituted alkylsilyl group having 1 to 20 carbon atoms include a chloromethylsilyl group.

  Examples of the monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group include, for example, an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group, an alkoxymethyl group having 2 to 5 carbon atoms, or a hydroxymethyl group. C1-C6 linear aliphatic hydrocarbon group substituted by a group, C3-C6 branched aliphatic hydrocarbon group substituted by a C2-C5 alkoxymethyl group or hydroxymethyl group , A C3-C6 cyclic aliphatic hydrocarbon group substituted with a C2-C5 alkoxymethyl group or hydroxymethyl group, or a carbon substituted with a C2-C5 alkoxymethyl group or hydroxymethyl group The aryl group of number 6 is mentioned.

  The cyclic compound of the formula (1) is preferably a compound represented by the formula (2).

式（２）中、Ｒ^１は、それぞれ独立して、水素原子、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、炭素数１〜２０のアルキルシリル基又は置換若しくは無置換の炭素数２〜２０のアルケニル基であり、Ｒ^２は、それぞれ独立して、水素原子、シアノ基、ニトロ基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数７〜３０のアラルキル基、置換若しくは無置換の炭素数１〜２０のアルコキシ基、置換若しくは無置換の炭素数２〜２０のアルケニル基、置換若しくは無置換の炭素数１〜２０のアシル基、置換若しくは無置換の炭素数２〜２０のアルコキシカルボニル基、置換若しくは無置換の炭素数１〜２０のアルキロイルオキシ基、置換若しくは無置換の炭素数７〜３０のアリーロイルオキシ基又は置換若しくは無置換の炭素数１〜２０のアルキルシリル基であり、Ｒ’は、それぞれ独立して、水素原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基又は下記式（３）

で表わされる基であり、Ｒ^４は、それぞれ独立して、シアノ基、ニトロ基、複素環基、ハロゲン原子、置換若しくは無置換の炭素数１〜２０の直鎖状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の分岐状脂肪族炭化水素基、置換若しくは無置換の炭素数３〜２０の環状脂肪族炭化水素基、置換若しくは無置換の炭素数６〜２０のアリール基、置換若しくは無置換の炭素数１〜２０のアルコキシ基又は置換若しくは無置換の炭素数１〜２０のアルキルシリル基であり、ｐは０〜５の整数であり、
前記Ｒ^２の少なくとも１つが炭素数２〜５のアルコキシメチル基又はヒドロキシメチル基である。

In formula (2), each R ¹ independently represents a hydrogen atom, a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms. A substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms Group, an alkylsilyl group having 1 to 20 carbon atoms, or a substituted or unsubstituted alkenyl group having 2 to 20 carbon atoms, and each R ² independently represents a hydrogen atom, a cyano group, a nitro group, a halogen atom, or a substituted group. Or an unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, and a substituted or unsubstituted cyclic group having 3 to 20 carbon atoms. Aliphatic hydrocarbon group, substituted Or an unsubstituted aryl group having 6 to 20 carbon atoms, a substituted or unsubstituted aralkyl group having 7 to 30 carbon atoms, a substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, a substituted or unsubstituted carbon number 2 -20 alkenyl group, substituted or unsubstituted acyl group having 1 to 20 carbon atoms, substituted or unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, substituted or unsubstituted alkyloyloxy group having 1 to 20 carbon atoms A substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, and R ′ is independently a hydrogen atom, substituted or unsubstituted A linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted carbon group having 3 to 20 carbon atoms Jo aliphatic hydrocarbon group or the following formula (3)

Each of R ⁴ independently represents a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted straight-chain aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted group Or an unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms, A substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, p is an integer of 0 to 5;
At least one of R ² is an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group.

  In addition, the compound represented by the formula (2) is more preferably a compound represented by the formula (4).

式（４）中、Ｒ^３は水素原子又は炭素数１〜４のアルキル基であり、Ｒ^１、Ｒ^４、ｐは前記と同じである。

In formula (4), R ³ is a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, and R ¹ , R ⁴ and p are the same as described above.

  Further, the compound represented by the formula (4) is more preferably a compound represented by the formula (5).

式（５）中、Ｒ^１、Ｒ^３、Ｒ^４、ｐは前記と同じである。

In formula (5), R ¹ , R ³ , R ⁴ , and p are the same as described above.

式（６）中、Ｒ^３、Ｒ^４、ｐは前記と同じである。 More preferably, the compound represented by the formula (4) is a compound represented by the formula (6).

In formula (6), R ³ , R ⁴ and p are the same as described above.

式（７）中、Ｒ^３、Ｒ^４、ｐは前記と同じである。 It is particularly preferable that the compound represented by the formula (5) or the formula (6) is a compound represented by the formula (7).

In formula (7), R ³ , R ⁴ and p are the same as described above.

  The compound represented by the formula (7) has high solubility in a safe solvent, high sensitivity, low roughness, and can form a resist pattern with a good shape.

  The molecular weight of the cyclic compound represented by the above formula (1) is 500 to 5000, preferably 800 to 2000, more preferably 1000 to 2000. By setting it as the said range, when forming a resist, resolution can be improved, maintaining required film formability.

  The cyclic compound in the present invention can take a cis form and a trans form, but may have any structure or mixture. When used as a resist component of a radiation-sensitive composition, it is preferable to use only one of a cis isomer and a trans isomer because the uniformity of the components in the resist film is high. A method for obtaining a cyclic compound consisting of only one of a cis isomer and a trans isomer can be performed by a known method such as separation by column chromatography or preparative liquid chromatography or optimization of a reaction solvent and a reaction temperature during production.

Among the cyclic compounds represented by the formula (1), the cyclic compound (B) in which at least one of the R ⁰ is a monovalent group containing a hydroxymethyl group is composed of one or more aldehyde compounds (A1). According to a production method, comprising a step of condensing a compound and a compound comprising one or more phenolic compounds (A2) to obtain a cyclic compound (A), and a step of reacting the cyclic compound (A) with formaldehyde can get.

  Preferably, the aldehyde compound (A1) is a compound having 1 to 59 carbon atoms having a monovalent group containing 1 to 4 formyl groups, and the phenolic compound (A2) is 1 to 3 carbon atoms. It is a C6-C15 compound which has a phenolic hydroxyl group.

The aldehyde compound (A1) has 1 to 59 carbon atoms, has 1 to 4 formyl groups, and is selected from an aromatic aldehyde compound (A1A) and an aliphatic aldehyde compound (A1B).
The aromatic aldehyde compound (A1A) is preferably a benzaldehyde compound having 7 to 24 carbon atoms, such as benzaldehyde, methylbenzaldehyde, dimethylbenzaldehyde, ethylbenzaldehyde, propylbenzaldehyde, butylbenzaldehyde, ethylmethylbenzaldehyde, isopropylmethylbenzaldehyde, Diethylbenzaldehyde, anisaldehyde, naphthaldehyde, anthraldehyde, cyclopropylbenzaldehyde, cyclobutylbenzaldehyde, cyclopentylbenzaldehyde, cyclohexylbenzaldehyde, phenylbenzaldehyde, naphthylbenzaldehyde, adamantylbenzaldehyde, norbornylbenzaldehyde, lactylbenzaldehyde, isopropyl Examples include benzaldehyde, normal propyl benzaldehyde, bromobenzaldehyde, dimethylaminobenzaldehyde, hydroxybenzaldehyde, dihydroxybenzaldehyde, trihydroxybenzaldehyde, isopropyl benzaldehyde, normal propyl benzaldehyde, cyclohexyl benzaldehyde, and phenyl benzaldehyde are preferable, and cyclohexyl benzaldehyde and 4-isopropyl benzaldehyde are preferable. More preferred. The aromatic aldehyde compound (A1A) may have a linear or branched alkyl group having 1 to 4 carbon atoms, a cyano group, a hydroxyl group, a halogen or the like as long as the effects of the present invention are not impaired. The aromatic aldehyde compound (A1A) may be used alone or in combination of two or more.

  The aliphatic aldehyde compound (A1B) is preferably a compound having 1 to 24 carbon atoms, for example, methanal, etanal, propanal, isopropanal, butanal, isobutanal, t-butanal, pentanal, isopentanal, neopentanal. Narnal, hexanal, isohexanal, octanal, decanal, dodecanal, undecenal, cyclopropanecarboxaldehyde, cyclobutanecarboxaldehyde, cyclohexanecarboxaldehyde, etc., isobutanal, t-butanal, pentanal, isopentanal, neopentanal, hexanal, Isohexanal, octanal, decanal, dodecanal, cyclopropanecarboxaldehyde, cyclobutanecarboxaldehyde, Cyclohexane carboxaldehyde is preferred, octanal, decanal, dodecanal, cyclohexane carboxaldehyde more preferable. The aliphatic aldehyde compound (A1B) may have a cyano group, a hydroxyl group, a halogen or the like as long as the effects of the present invention are not impaired. The aliphatic aldehyde compound (A1B) may be used alone or in combination of two or more.

  The number of carbon atoms of the phenolic compound (A2) is preferably 6 to 15, and preferably 1 to 3 phenolic hydroxyl groups. Examples of the phenolic compound (A2) include phenol, catechol, resorcinol, hydroquinone, pyrogallol and the like, resorcinol and pyrogallol are preferred, and resorcinol is more preferred. The phenolic compound (A2) may have a linear or branched alkyl group having 1 to 4 carbon atoms, a cyano group, a hydroxyl group, a halogen or the like as long as the effects of the present invention are not impaired. You may use a phenolic compound (A2) individually or in combination of 2 or more types.

  It is preferable that carbon number of a phenolic compound (A2) is 6-15, and it is preferable to have 1-3 phenolic hydroxyl groups. Examples of the phenolic compound (A2) include phenol, catechol, resorcinol, hydroquinone, pyrogallol, 3-methoxyphenol, 3-ethoxyphenol, 3-cyclohexyloxyphenol, 1,3-dimethoxybenzene, 1,3-diethoxy. Benzene, 1,3-dicyclohexyloxybenzene and the like, resorcinol, pyrogallol, 3-methoxyphenol, 3-ethoxyphenol, 3-cyclohexyloxyphenol, 1,3-dimethoxybenzene, 1,3-diethoxybenzene, 1,3-dicyclohexyloxybenzene is preferred, and resorcinol is more preferred. The phenolic compound (A2) may have a linear or branched alkyl group having 1 to 4 carbon atoms, a cyano group, a hydroxyl group, a halogen or the like as long as the effects of the present invention are not impaired. You may use a phenolic compound (A2) individually or in combination of 2 or more types.

Among the cyclic compounds represented by the above formula (1), the cyclic compound (B) in which at least one of R ⁰ is a monovalent group containing a hydroxymethyl group is an acid in an organic solvent such as methanol or ethanol. In the presence of a catalyst (hydrochloric acid, sulfuric acid, paratoluenesulfonic acid, etc.), 0.1 to 10 moles of phenolic compound (A2) is 0.5 to 40 to 150 ° C. with respect to 1 mole of aldehyde compound (A1). React for about 20 hours. Subsequently, filtration, washing with alcohols such as methanol, washing with water, separation by filtration, and drying are performed to obtain a cyclic compound (A) having a molecular weight of 500 to 5000. A cyclic compound can also be obtained by using a basic catalyst (such as sodium hydroxide, barium hydroxide or 1,8-diazabicyclo [5.4.0] undecene-7) instead of the acid catalyst and reacting in the same manner. It is done. Further, the cyclic compound of the present invention can also be produced by converting the aldehyde compound (A1) into a dihalide with hydrogen halide or halogen gas, and reacting the isolated dihalide with the phenolic compound (A2).

Thereafter, in an organic solvent such as methanol and ethanol in the presence of a basic catalyst, 0.1 to 100 mol of formaldehyde is added at 0 to 150 ° C. for 0.5 to 20 hours with respect to 1 mol of the cyclic compound (A). React to a certain extent. Next, the cyclic compound (B) in which at least one of R ⁰ is a monovalent group containing a hydroxymethyl group by solvent concentration, filtration, washing with an alcohol such as methanol, washing with water, separation by filtration, and drying. Is obtained.

Among the cyclic compounds represented by the above formula (1), at least one of R ⁰ is a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms, for example, methanol, ethanol In the presence of a basic catalyst in the presence of a basic catalyst, the saturated compound having 1 to 4 carbon atoms with respect to 1 mol of the cyclic compound (B) in which at least one of R ⁰ is a monovalent group containing a hydroxymethyl group. The aliphatic alcohol (A3) is reacted at 0.1 to 100 mol at 0 to 150 ° C. for about 0.5 to 20 hours. Next, after solvent concentration, filtration, washing with alcohols such as methanol, washing with water, separation by filtration, and drying, at least one of R ⁰ is a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms. A certain cyclic compound (C) is obtained.

  Moreover, since the solubility with respect to the semiconductor safety solvent of the cyclic compound obtained improves, it is more preferable to use 2 or more types of at least one of an aldehyde compound (A1) or a phenolic compound (A2).

  You may refine | purify as needed in order to improve the purity in a cyclic compound, and in order to reduce the amount of residual metals. Further, if the acid catalyst and the co-catalyst remain, generally the storage stability of the radiation-sensitive composition is lowered, and if the basic catalyst remains, the sensitivity of the radiation-sensitive composition is generally lowered. Purification may be performed.

Purification can be performed by a known method as long as the cyclic compound is not denatured, and is not particularly limited. For example, a method of washing with water, a method of washing with an acidic aqueous solution, a method of washing with a basic aqueous solution, or an ion exchange resin. The method of processing, the method of processing by silica gel column chromatography, etc. are mentioned. These purification methods are more preferably performed in combination of two or more.
For acidic aqueous solution, basic aqueous solution, ion exchange resin, and silica gel column chromatography, select the optimal one according to the metal to be removed, the amount and type of acidic compound and basic compound, the type of cyclic compound to be purified, etc. Is possible. For example, as acidic aqueous solution, hydrochloric acid, nitric acid, acetic acid aqueous solution having a concentration of 0.01 to 10 mol / L, aqueous ammonia solution having a concentration of 0.01 to 10 mol / L as basic aqueous solution, cation exchange resin as ion exchange resin, For example, Amberlyst 15J-HG Dry made by Organo can be mentioned.
You may dry after refinement | purification. Drying can be performed by a known method, and is not particularly limited. Examples thereof include vacuum drying and hot air drying under conditions where the cyclic compound is not denatured.

  When the cyclic compound represented by the above formula (1) is used as a radiation-sensitive composition, an amorphous film can be formed by spin coating. Further, it can be applied to a general semiconductor manufacturing process.

  In addition, the cyclic compound according to the present invention is useful as a negative resist material that becomes a compound that is hardly soluble in a developer by irradiation with KrF excimer laser, extreme ultraviolet light, electron beam, or X-ray. By irradiating the cyclic compound with KrF excimer laser, extreme ultraviolet light, electron beam or X-ray, a condensation reaction between the compounds is induced and the compound becomes insoluble in an alkali developer. The resist pattern thus obtained has a very low LER.

  Furthermore, the cyclic compound according to the present invention can be used as a main component of a negative radiation-sensitive composition, and can be added to the radiation-sensitive composition as an additive for improving sensitivity and etching resistance, for example. . In this case, the cyclic compound is used in an amount of 1 to 49.999% by weight based on the total weight of the solid components of the radiation-sensitive composition.

  The glass transition temperature of the cyclic compound of the present invention is preferably 100 ° C. or higher, more preferably 120 ° C. or higher, further preferably 140 ° C. or higher, and particularly preferably 150 ° C. or higher. When the glass transition temperature is within the above range, the semiconductor lithography process has heat resistance capable of maintaining the pattern shape, and performance such as high resolution is improved.

  The calorific value of crystallization obtained by differential scanning calorimetry of the glass transition temperature of the cyclic compound of the present invention is preferably less than 20 J / g. Further, (crystallization temperature) − (glass transition temperature) is preferably 70 ° C. or higher, more preferably 80 ° C. or higher, still more preferably 100 ° C. or higher, and particularly preferably 130 ° C. or higher. When the crystallization heat generation amount is less than 20 J / g, or (crystallization temperature) − (glass transition temperature) is within the above range, it is easy to form an amorphous film by spin-coating the radiation-sensitive composition, In addition, the film formability required for the resist can be maintained for a long time, and the resolution can be improved.

  In the present invention, the crystallization calorific value, the crystallization temperature, and the glass transition temperature can be obtained by differential scanning calorimetry using DSC / TA-50WS manufactured by Shimadzu Corporation. About 10 mg of a sample is put in an aluminum non-sealed container and heated to a melting point or higher at a temperature rising rate of 20 ° C./min in a nitrogen gas stream (50 mL / min). After the rapid cooling, the temperature is raised again to the melting point or higher at a temperature rising rate of 20 ° C./min in a nitrogen gas stream (30 mL / min). Further, after rapid cooling, the temperature is raised again to 400 ° C. at a rate of temperature increase of 20 ° C./min in a nitrogen gas stream (30 mL / min). The temperature at the midpoint of the step difference of the baseline that has changed in a step shape (where the specific heat has changed to half) is the glass transition temperature (Tg), and the temperature of the exothermic peak that appears thereafter is the crystallization temperature. The calorific value is obtained from the area of the region surrounded by the exothermic peak and the baseline, and is defined as the crystallization calorific value.

  The cyclic compound of the present invention preferably has a low sublimation property under normal pressure at 100 ° C. or lower, preferably 120 ° C. or lower, more preferably 130 ° C. or lower, still more preferably 140 ° C. or lower, particularly preferably 150 ° C. or lower. Here, the low sublimation property means that in thermogravimetric analysis, the weight loss when held at a predetermined temperature for 10 minutes is 10%, preferably 5%, more preferably 3%, still more preferably 1%, particularly preferably. It shows that it is 0.1% or less. Since the sublimation property is low, it is possible to prevent exposure apparatus from being contaminated by outgas during exposure. Moreover, a favorable pattern shape can be obtained with low LER.

  The cyclic compound of the present invention preferably has F <3.0 (F represents the total number of atoms / (the total number of carbon atoms−the total number of oxygen atoms)), more preferably F <2.5. is there. By satisfying the above conditions, the dry etching resistance is excellent.

  The cyclic compound of the present invention includes propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monomethyl ether (PGME), cyclohexanone (CHN), cyclopentanone (CPN), 2-heptanone, anisole, butyl acetate, ethyl propionate and lactic acid. A solvent selected from ethyl and having the highest solubility for the cyclic compound is preferably at least 1% by weight, more preferably at least 5% by weight, even more preferably at least 10% by weight, particularly preferably at 23 ° C. Is selected from PGMEA, PGMEA, and CHN, and is a solvent that exhibits the highest solubility for cyclic compounds at 23 ° C., 20 wt% or more, and particularly preferably 20 wt% at 23 ° C. with respect to PGMEA. % Or more dissolve. By satisfying the above conditions, the semiconductor manufacturing process can be used in actual production.

  Nitrogen atoms may be introduced into the cyclic compound of the present invention as long as the effects of the present invention are not impaired. The ratio of the number of nitrogen atoms to the total number of constituent atoms of the cyclic compound is preferably 0.1 to 40%, more preferably 0.1 to 20%, and more preferably 0.1 to 10%. Further preferred is 0.1 to 5%. Within the above range, the line edge roughness of the resulting resist pattern can be reduced. The introduced nitrogen atom is preferably a secondary or tertiary nitrogen atom, and more preferably a tertiary nitrogen atom.

  As long as the effects of the present invention are not impaired, the cyclic compound of the present invention is crosslinked by visible light, ultraviolet light, excimer laser, electron beam, extreme ultraviolet (EUV), X-ray and ion beam irradiation, or a chemical reaction induced thereby. A cross-linking reactive group that causes a reaction may be introduced. The introduction is performed, for example, by reacting a cyclic compound and a crosslinking reactive group introduction reagent in the presence of a base catalyst. Examples of the crosslinking reactive group include a carbon-carbon multiple bond, an epoxy group, an azide group, a halogenated phenyl group, and a chloromethyl group. Examples of the crosslinking reactive group introduction reagent include acids, acid chlorides, acid anhydrides, carboxylic acid derivatives such as dicarbonates and alkyl halides having such a crosslinking reactive group. A radiation-sensitive composition containing a cyclic compound having a crosslinking reactive group is also useful as a non-polymeric radiation-sensitive composition having high resolution, high heat resistance and solvent solubility.

  A non-acid dissociable functional group may be introduced into at least one of the phenolic hydroxyl groups of the cyclic compound as long as the effects of the present invention are not impaired. The non-acid-dissociable functional group refers to a characteristic group that does not cleave in the presence of an acid and does not generate an alkali-soluble group. For example, C1-20 alkyl group, C3-20 cycloalkyl group, C6-20 aryl group, C1-20 alkoxyl group, cyano group, nitro group, hydroxyl group, Examples thereof include a functional group selected from the group consisting of a cyclic group, a halogen, a carboxyl group, a C1-20 alkylsilane, and derivatives thereof.

  A naphthoquinone diazide ester group may be introduced into at least one of the phenolic hydroxyl groups of the cyclic compound as long as the effects of the present invention are not impaired. A cyclic compound having a naphthoquinonediazide ester group introduced into at least one phenolic hydroxyl group can be used as a main component of a negative radiation-sensitive composition as a main component, or as a main component of a positive radiation-sensitive composition. It can be used or added to the radiation sensitive composition as an acid generator or additive.

  As long as the effects of the present invention are not impaired, an acid-generating functional group that generates an acid upon irradiation with radiation may be introduced into at least one of the phenolic hydroxyl groups of the cyclic compound. A cyclic compound in which an acid-generating functional group is introduced into at least one phenolic hydroxyl group can be used as a main component of a negative radiation-sensitive composition by itself as a main component, and a radiation-sensitive composition as an additive. Can be added to.

(Radiation sensitive composition)
The radiation-sensitive composition according to the present invention is characterized by including the cyclic compound represented by the above formula (1) and a solvent. Moreover, it is preferable that the solid component of the radiation-sensitive composition of the present invention is 1 to 80% by weight, and the ratio of the cyclic compound to the total solid component weight is 50 to 99.999% by weight. More preferred.

  The radiation-sensitive composition of the present invention can form an amorphous film by spin coating. The dissolution rate of the amorphous film formed by spin-coating the radiation-sensitive composition of the present invention in a developer at 23 ° C. is preferably 10 Å / sec or more, more preferably 10 to 10000 Å / sec, More preferably, it is 100-1000 kg / sec. It can melt | dissolve in a developing solution as it is 10 tons / sec or more, and can be set as a resist. In addition, when the dissolution rate is 10000 kg / sec or less, the resolution may be improved. This is presumed to be due to the increase in the contrast of the interface between the unexposed portion that dissolves in the developer and the exposed portion that does not dissolve in the developer due to a change in solubility of the cyclic compound before and after exposure. Further, there is an effect of reducing LER and reducing defects.

  The dissolution rate of the amorphous film formed by spin-coating the radiation-sensitive composition of the present invention in a developing solution at 23 ° C. at a portion exposed by radiation such as KrF excimer laser, extreme ultraviolet light, electron beam or X-ray is 5Å. / Sec or less, more preferably 0.05 to 5 Å / sec, and still more preferably 0.0005 to 5 Å / sec. If it is 5 kg / sec or less, it is insoluble in the developer and can be a resist. In addition, when the dissolution rate is 0.0005 kg / sec or more, the resolution may be improved. This is presumed to be because the micro surface portion of the cyclic compound is dissolved and LER is reduced. There is also an effect of reducing defects.

  As described above, the radiation-sensitive composition of the present invention is preferably 1 to 80% by weight of a solid component, more preferably 20 to 99% by weight of a solvent, still more preferably 1 to 50% by weight of a solid component, The solvent is 50 to 99% by weight, particularly preferably 2 to 40% by weight of the solid component and 60 to 98% by weight of the solvent, and most preferably 2 to 10% by weight of the solid component and 90 to 98% by weight of the solvent.

  The amount of the cyclic compound represented by the formula (1) is determined based on the total weight of the solid component (cyclic compound, acid generator (C), acid crosslinking agent (G), acid diffusion controller (E), and other components (F). 50 to 99.4% by weight, preferably 55 to 90% by weight, more preferably 60 to 80% by weight, and particularly preferably 60 to 70% by weight of the total of solid components optionally used, etc. %. When the blending ratio is as described above, high resolution is obtained and the line edge roughness is reduced.

  The radiation-sensitive composition of the present invention can directly or indirectly produce an acid by irradiation with any radiation selected from visible light, ultraviolet light, excimer laser, electron beam, extreme ultraviolet light (EUV), X-ray and ion beam. It is preferable that at least one acid generator (C) to be generated is included. The amount of the acid generator (C) used is preferably 0.001 to 49% by weight, more preferably 1 to 40% by weight, further preferably 3 to 30% by weight, and more preferably 10 to 25% by weight based on the total weight of the solid component. Particularly preferred. By using within the above range, a pattern profile with high sensitivity and low edge roughness can be obtained. In the present invention, the acid generation method is not limited as long as an acid is generated in the system. If excimer laser is used instead of ultraviolet rays such as g-line and i-line, finer processing is possible, and if high-energy rays are used, electron beam, extreme ultraviolet rays, X-rays, ion beam, further fine processing Is possible.

（式（７−１）中、Ｒ^１３は、同一でも異なっていても良く、それぞれ独立に、水素原子、直鎖状、分岐状若しくは環状アルキル基、直鎖状、分岐状若しくは環状アルコキシ基、ヒドロキシル基又はハロゲン原子であり；Ｘ^-は、アルキル基、アリール基、ハロゲン置換アルキル基若しくはハロゲン置換アリール基を有するスルホン酸イオン又はハロゲン化物イオンである。） The acid generator (C) is preferably at least one selected from the group consisting of compounds represented by the following formulas (7-1) to (7-8).

(In formula (7-1), R ¹³ may be the same or different, and each independently represents a hydrogen atom, a linear, branched or cyclic alkyl group, a linear, branched or cyclic alkoxy group, A hydroxyl group or a halogen atom; X ⁻ is a sulfonate ion or a halide ion having an alkyl group, an aryl group, a halogen-substituted alkyl group or a halogen-substituted aryl group.

  The compound represented by the formula (7-1) includes triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium nonafluoro-n-butanesulfonate, diphenyltolylsulfonium nonafluoro-n-butanesulfonate, triphenylsulfonium perfluoro-n-. Octanesulfonate, diphenyl-4-methylphenylsulfonium trifluoromethanesulfonate, di-2,4,6-trimethylphenylsulfonium trifluoromethanesulfonate, diphenyl-4-t-butoxyphenylsulfonium trifluoromethanesulfonate, diphenyl-4-t-butoxyphenyl Sulfonium nonafluoro-n-butanesulfonate, diphenyl-4-hydroxyphenylsulfonium trifluoromethanes Phonate, bis (4-fluorophenyl) -4-hydroxyphenylsulfonium trifluoromethanesulfonate, diphenyl-4-hydroxyphenylsulfonium nonafluoro-n-butanesulfonate, bis (4-hydroxyphenyl) -phenylsulfonium trifluoromethanesulfonate, tri ( 4-methoxyphenyl) sulfonium trifluoromethanesulfonate, tri (4-fluorophenyl) sulfonium trifluoromethanesulfonate, triphenylsulfonium p-toluenesulfonate, triphenylsulfoniumbenzenesulfonate, diphenyl-2,4,6-trimethylphenyl-p-toluene Sulfonate, diphenyl-2,4,6-trimethylphenylsulfonium-2-trifluoromethylben Zensulfonate, diphenyl-2,4,6-trimethylphenylsulfonium-4-trifluoromethylbenzenesulfonate, diphenyl-2,4,6-trimethylphenylsulfonium-2,4-difluorobenzenesulfonate, diphenyl-2,4,6 -Trimethylphenylsulfonium hexafluorobenzenesulfonate, diphenylnaphthylsulfonium trifluoromethanesulfonate, diphenyl-4-hydroxyphenylsulfonium-p-toluenesulfonate, triphenylsulfonium 10-camphorsulfonate, diphenyl-4-hydroxyphenylsulfonium 10-camphorsulfonate and cyclo (1,3-perfluoropropanedisulfone) at least one selected from the group consisting of imidates It is preferable that a class.

（式（７−２）中、Ｒ^１４は、同一でも異なっていても良く、それぞれ独立に、水素原子、直鎖状、分岐状若しくは環状アルキル基、直鎖状、分岐状若しくは環状アルコキシ基、ヒドロキシル基又はハロゲン原子を表す。Ｘ^-は前記と同様である。）

(In formula (7-2), R ¹⁴ may be the same or different, and each independently represents a hydrogen atom, a linear, branched or cyclic alkyl group, a linear, branched or cyclic alkoxy group, Represents a hydroxyl group or a halogen atom, X ⁻ is as defined above.)

  The compound represented by the formula (7-2) includes bis (4-t-butylphenyl) iodonium trifluoromethanesulfonate, bis (4-t-butylphenyl) iodonium nonafluoro-n-butanesulfonate, bis (4-t -Butylphenyl) iodonium perfluoro-n-octanesulfonate, bis (4-t-butylphenyl) iodonium p-toluenesulfonate, bis (4-t-butylphenyl) iodoniumbenzenesulfonate, bis (4-t-butylphenyl) Iodonium-2-trifluoromethylbenzenesulfonate, bis (4-t-butylphenyl) iodonium-4-trifluoromethylbenzenesulfonate, bis (4-t-butylphenyl) iodonium-2,4-difluorobenzenesulfonate, bis ( 4-t Butylphenyl) iodonium hexafluorobenzenesulfonate, bis (4-t-butylphenyl) iodonium 10-camphorsulfonate, diphenyliodonium trifluoromethanesulfonate, diphenyliodonium nonafluoro-n-butanesulfonate, diphenyliodonium perfluoro-n-octanesulfonate, Diphenyliodonium p-toluenesulfonate, diphenyliodoniumbenzenesulfonate, diphenyliodonium10-camphorsulfonate, diphenyliodonium-2-trifluoromethylbenzenesulfonate, diphenyliodonium-4-trifluoromethylbenzenesulfonate, diphenyliodonium-2,4-difluorobenzene Sulfonate, diphenyl Iodonium hexafluorobenzenesulfonate, di (4-trifluoromethylphenyl) iodonium trifluoromethanesulfonate, di (4-trifluoromethylphenyl) iodonium nonafluoro-n-butanesulfonate, di (4-trifluoromethylphenyl) iodonium per From fluoro-n-octanesulfonate, di (4-trifluoromethylphenyl) iodonium p-toluenesulfonate, di (4-trifluoromethylphenyl) iodoniumbenzenesulfonate and di (4-trifluoromethylphenyl) iodonium 10-camphorsulfonate Preferably, at least one selected from the group consisting of:

（式（７−３）中、Ｑはアルキレン基、アリーレン基又はアルコキシレン基であり、Ｒ^１５はアルキル基、アリール基、ハロゲン置換アルキル基又はハロゲン置換アリール基である。）

(In formula (7-3), Q represents an alkylene group, an arylene group or an alkoxylene group, and R ¹⁵ represents an alkyl group, an aryl group, a halogen-substituted alkyl group or a halogen-substituted aryl group.)

  The compound represented by the formula (7-3) includes N- (trifluoromethylsulfonyloxy) succinimide, N- (trifluoromethylsulfonyloxy) phthalimide, N- (trifluoromethylsulfonyloxy) diphenylmaleimide, N- ( Trifluoromethylsulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (trifluoromethylsulfonyloxy) naphthylimide, N- (10-camphorsulfonyloxy) Succinimide, N- (10-camphorsulfonyloxy) phthalimide, N- (10-camphorsulfonyloxy) diphenylmaleimide, N- (10-camphorsulfonyloxy) bicyclo [2.2.1] hept-5-ene-2 , 3-Dicarboximide, N- 10-camphorsulfonyloxy) naphthylimide, N- (n-octanesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (n-octanesulfonyloxy) Naphthylimide, N- (p-toluenesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (p-toluenesulfonyloxy) naphthylimide, N- (2 -Trifluoromethylbenzenesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (2-trifluoromethylbenzenesulfonyloxy) naphthylimide, N- (4 -Trifluoromethylbenzenesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboxy Imido, N- (4-trifluoromethylbenzenesulfonyloxy) naphthylimide, N- (perfluorobenzenesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (Perfluorobenzenesulfonyloxy) naphthylimide, N- (1-naphthalenesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (1-naphthalenesulfonyloxy) Naphthylimide, N- (nonafluoro-n-butanesulfonyloxy) bicyclo [2.2.1] hept-5-ene-2,3-dicarboximide, N- (nonafluoro-n-butanesulfonyloxy) naphthylimide, N- (perfluoro-n-octanesulfonyloxy) bicyclo [2.2.1] hept It is preferably at least one selected from 5-En 2,3-dicarboximide, and N- (perfluoro--n- C1-12alkyl oxy) group consisting naphthylimide.

（式（７−４）中、Ｒ^１６は、同一でも異なっていても良く、それぞれ独立に、任意に置換された直鎖、分岐若しくは環状アルキル基、任意に置換されたアリール基、任意に置換されたヘテロアリール基又は任意に置換されたアラルキル基である。）

(In Formula (7-4), R ¹⁶ may be the same or different, and each independently represents an optionally substituted linear, branched or cyclic alkyl group, an optionally substituted aryl group, and optionally substituted. A heteroaryl group or an optionally substituted aralkyl group.)

  The compound represented by the formula (7-4) is diphenyl disulfone, di (4-methylphenyl) disulfone, dinaphthyl disulfone, di (4-tert-butylphenyl) disulfone, di (4-hydroxyphenyl) disulfone. , Di (3-hydroxynaphthyl) disulfone, di (4-fluorophenyl) disulfone, di (2-fluorophenyl) disulfone and di (4-trifluoromethylphenyl) disulfone It is preferable.

（式（７−５）中、Ｒ^１７は、同一でも異なっていても良く、それぞれ独立に、任意に置換された直鎖、分岐若しくは環状アルキル基、任意に置換されたアリール基、任意に置換されたヘテロアリール基又は任意に置換されたアラルキル基である。）

(In formula (7-5), R ¹⁷ may be the same or different, and each independently represents an optionally substituted linear, branched or cyclic alkyl group, an optionally substituted aryl group, and optionally substituted. A heteroaryl group or an optionally substituted aralkyl group.)

  The compound represented by the formula (7-5) is α- (methylsulfonyloxyimino) -phenylacetonitrile, α- (methylsulfonyloxyimino) -4-methoxyphenylacetonitrile, α- (trifluoromethylsulfonyloxyimino). -Phenylacetonitrile, α- (trifluoromethylsulfonyloxyimino) -4-methoxyphenylacetonitrile, α- (ethylsulfonyloxyimino) -4-methoxyphenylacetonitrile, α- (propylsulfonyloxyimino) -4-methylphenylacetonitrile And at least one selected from the group consisting of α- (methylsulfonyloxyimino) -4-bromophenylacetonitrile.

式（７−６）中、Ｒ^１８は、同一でも異なっていても良く、それぞれ独立に、１以上の塩素原子及び１以上の臭素原子を有するハロゲン化アルキル基である。ハロゲン化アルキル基の炭素原子数は１〜５が好ましい。

In formula (7-6), R ¹⁸ may be the same or different and each independently represents a halogenated alkyl group having one or more chlorine atoms and one or more bromine atoms. The halogenated alkyl group preferably has 1 to 5 carbon atoms.

In formulas (7-7) and (7-8), R ¹⁹ and R ²⁰ are each independently an alkyl group having 1 to 3 carbon atoms such as a methyl group, an ethyl group, an n-propyl group, or an isopropyl group, or cyclopentyl. Group, cycloalkyl group such as cyclohexyl group, alkoxyl group having 1 to 3 carbon atoms such as methoxy group, ethoxy group, propoxy group, or aryl group such as phenyl group, toluyl group, naphthyl group, preferably 6 carbon atoms -10 aryl groups. L ¹⁹ and L ²⁰ are each independently an organic group having a 1,2-naphthoquinonediazide group. Specific examples of the organic group having a 1,2-naphthoquinonediazide group include a 1,2-naphthoquinonediazide-4-sulfonyl group, a 1,2-naphthoquinonediazide-5-sulfonyl group, and a 1,2-naphthoquinonediazide- A 1,2-quinonediazidosulfonyl group such as a 6-sulfonyl group can be mentioned as a preferable one. In particular, 1,2-naphthoquinonediazide-4-sulfonyl group and 1,2-naphthoquinonediazide-5-sulfonyl group are preferable. p is an integer of 1 to 3, q is an integer of 0 to 4, and 1 ≦ p + q ≦ 5. J ¹⁹ is a single bond, a polymethylene group having 1 to 4 carbon atoms, a cycloalkylene group, a phenylene group, a group represented by the following formula (7-7-1), a carbonyl group, an ester group, an amide group or an ether group. Y ¹⁹ is a hydrogen atom, an alkyl group or an aryl group, and X ²⁰ is independently a group represented by the following formula (7-8-1).

（式（７−８−１）中、Ｚ^２２はそれぞれ独立に、アルキル基、シクロアルキル基又はアリール基であり、Ｒ^２２はアルキル基、シクロアルキル基又はアルコキシル基であり、ｒは０〜３の整数である。）

(In the formula (7-8-1), Z ²² each independently represents an alkyl group, a cycloalkyl group or an aryl group, R ²² represents an alkyl group, a cycloalkyl group or an alkoxyl group, and r represents 0-3. Is an integer.)

  Other acid generators include bis (p-toluenesulfonyl) diazomethane, bis (2,4-dimethylphenylsulfonyl) diazomethane, bis (tert-butylsulfonyl) diazomethane, bis (n-butylsulfonyl) diazomethane, bis (isobutylsulfonyl) ) Diazomethane, bis (isopropylsulfonyl) diazomethane, bis (n-propylsulfonyl) diazomethane, bis (cyclohexylsulfonyl) diazomethane, bis (isopropylsulfonyl) diazomethane, 1,3-bis (cyclohexylsulfonylazomethylsulfonyl) propane, 1, 4 -Bis (phenylsulfonylazomethylsulfonyl) butane, 1,6-bis (phenylsulfonylazomethylsulfonyl) hexane, 1,10-bis (cyclohexylsulfonyla) Bissulfonyldiazomethanes such as methylsulfonyl) decane, 2- (4-methoxyphenyl) -4,6- (bistrichloromethyl) -1,3,5-triazine, 2- (4-methoxynaphthyl) -4,6 Halogen-containing triazine derivatives such as-(bistrichloromethyl) -1,3,5-triazine, tris (2,3-dibromopropyl) -1,3,5-triazine, tris (2,3-dibromopropyl) isocyanurate Etc.

Among the acid generators, an acid generator having an aromatic ring is preferable, and an acid generator represented by the formula (7-1) or (7-2) is more preferable. The acid generator having a sulfonate ion having X ^{− in} formula (7-1) or (7-2) having an aryl group or a halogen-substituted aryl group is more preferable, and the acid generator having a sulfonate ion having an aryl group Are particularly preferable, and diphenyltrimethylphenylsulfonium p-toluenesulfonate, triphenylsulfonium p-toluenesulfonate, triphenylsulfonium trifluoromethanesulfonate, and triphenylsulfonium nonafluoromethanesulfonate are particularly preferable. LER can be reduced by using the acid generator.
The acid generator (C) may be used alone or in combination of two or more.

  The radiation-sensitive composition of the present invention preferably contains one or more acid crosslinking agents (G). The acid crosslinking agent (G) is a compound that can crosslink the cyclic compound of the formula (1) within a molecule or between molecules in the presence of an acid generated from the acid generator (C). Examples of such an acid crosslinking agent (G) include compounds having one or more groups (hereinafter referred to as “crosslinkable groups”) capable of crosslinking the cyclic compound of the formula (1).

  Specific examples of such a crosslinkable group include (i) hydroxyalkyl groups such as hydroxy (C1-C6 alkyl group), C1-C6 alkoxy (C1-C6 alkyl group), acetoxy (C1-C6 alkyl group) and the like. Or a group derived therefrom; (ii) a carbonyl group such as formyl group or carboxy (C1-C6 alkyl group) or a group derived therefrom; (iii) dimethylaminomethyl group, diethylaminomethyl group, dimethylolaminomethyl; Groups, nitrogen-containing groups such as diethylolaminomethyl groups, morpholinomethyl groups; (iv) glycidyl group-containing groups such as glycidyl ether groups, glycidyl ester groups, glycidylamino groups; (v) benzyloxymethyl groups, benzoyloxy C1-C6 allyloxy (C1-C6 alkyl group) such as methyl group, C1-C A group derived from an aromatic group such as 6-aralkyloxy (C1-C6 alkyl group); and (vi) a polymerizable multiple bond-containing group such as a vinyl group or isopropenyl group. As the crosslinkable group of the acid crosslinking agent (G) of the present invention, a hydroxyalkyl group, an alkoxyalkyl group, and the like are preferable, and an alkoxymethyl group is particularly preferable.

  Examples of the acid crosslinking agent (G) having a crosslinkable group include (i) a methylol group-containing melamine compound, a methylol group-containing benzoguanamine compound, a methylol group-containing urea compound, a methylol group-containing glycoluril compound, and a methylol group-containing phenol compound. (Ii) alkoxyalkyl group-containing melamine compound, alkoxyalkyl group-containing benzoguanamine compound, alkoxyalkyl group-containing urea compound, alkoxyalkyl group-containing glycoluril compound, alkoxyalkyl group-containing phenolic compound and the like Compound; (iii) Carboxymethyl group-containing melamine compound, Carboxymethyl group-containing benzoguanamine compound, Carboxymethyl group-containing urea compound, Carboxymethyl group-containing grease Carboxymethyl group-containing compounds such as alluryl compounds and carboxymethyl group-containing phenol compounds; (iv) bisphenol A-based epoxy compounds, bisphenol F-based epoxy compounds, bisphenol S-based epoxy compounds, novolac resin-based epoxy compounds, resole resin-based epoxy compounds, Examples thereof include epoxy compounds such as poly (hydroxystyrene) -based epoxy compounds.

  As the acid crosslinking agent (G), compounds having phenolic hydroxyl groups, and compounds and resins imparted with crosslinking properties by introducing the crosslinking groups into acidic functional groups in the alkali-soluble resin can be used. . In this case, the introduction rate of the crosslinkable group is usually 5 to 100 mol%, preferably 10 to 60 mol%, more preferably based on the total acidic functional group in the compound having a phenolic hydroxyl group and the alkali-soluble resin. Is adjusted to 15-40 mol%. Within the above range, the cross-linking reaction occurs sufficiently, and a decrease in the remaining film ratio, a pattern swelling phenomenon, meandering, and the like can be avoided.

  In the radiation-sensitive composition of the present invention, the acid crosslinking agent (G) is preferably an alkoxyalkylated urea compound or a resin thereof, or an alkoxyalkylated glycoluril compound or a resin thereof. Particularly preferred acid crosslinking agents (G) include compounds represented by the following formulas (8-1) to (8-3) and alkoxymethylated melamine compounds (acid crosslinking agent (G1)).

（上記式（８−１）〜（８−３）中、Ｒ^７はそれぞれ独立して、水素原子、アルキル基又はアシル基を表し；Ｒ^８〜Ｒ^１１はそれぞれ独立して、水素原子、水酸基、アルキル基又はアルコキシル基を示し；Ｘ^２は、単結合、メチレン基又は酸素原子を示す。）

(In the above formulas (8-1) to (8-3), R ⁷ each independently represents a hydrogen atom, an alkyl group or an acyl group; R ^{8 to} R ¹¹ each independently represents a hydrogen atom or a hydroxyl group. And represents an alkyl group or an alkoxyl group; X ² represents a single bond, a methylene group or an oxygen atom.)

The alkyl group represented by R ⁷ preferably has 1 to 6 carbon atoms, more preferably 1 to 3 carbon atoms, and examples thereof include a methyl group, an ethyl group, and a propyl group. The acyl group represented by R ⁷ preferably has 2 to 6 carbon atoms, more preferably 2 to 4 carbon atoms, and examples thereof include an acetyl group and a propionyl group. The alkyl group represented by R ^{8 to} R ¹¹ preferably has 1 to 6 carbon atoms, more preferably 1 to 3 carbon atoms, and examples thereof include a methyl group, an ethyl group, and a propyl group. The alkoxyl group represented by R ^{8 to} R ¹¹ preferably has 1 to 6 carbon atoms, more preferably 1 to 3 carbon atoms, and examples thereof include a methoxy group, an ethoxy group, and a propoxy group. X ² is preferably a single bond or a methylene group. R ^{7 to} R ¹¹ and X ² may be substituted with an alkyl group such as a methyl group or an ethyl group, an alkoxy group such as a methoxy group or an ethoxy group, a hydroxyl group, or a halogen atom. The plurality of R ⁷ and R ^{8 to} R ¹¹ may be the same or different.

Specific examples of the compound represented by the formula (8-1) include the compounds shown below.

  Specific examples of the compound represented by the formula (8-2) include, for example, N, N, N, N-tetra (methoxymethyl) glycoluril, N, N, N, N-tetra (ethoxymethyl) glycoluril. N, N, N, N-tetra (n-propoxymethyl) glycoluril, N, N, N, N-tetra (isopropoxymethyl) glycoluril, N, N, N, N-tetra (n-butoxymethyl) ) Glycoluril, N, N, N, N-tetra (t-butoxymethyl) glycoluril, and the like. Among these, N, N, N, N-tetra (methoxymethyl) glycoluril is particularly preferable.

Specific examples of the compound represented by the formula (8-3) include the compounds shown below.

Specific examples of the alkoxymethylated melamine compound include N, N, N, N, N, N-hexa (methoxymethyl) melamine, N, N, N, N, N, N-hexa (ethoxymethyl) melamine N, N, N, N, N, N-hexa (n-propoxymethyl) melamine, N, N, N, N, N, N-hexa (isopropoxymethyl) melamine, N, N, N, N, Examples thereof include N, N-hexa (n-butoxymethyl) melamine, N, N, N, N, N, N-hexa (t-butoxymethyl) melamine and the like. Among these, N, N, N, N, N, N-hexa (methoxymethyl) melamine is particularly preferable.
The acid cross-linking agent (G1) is obtained by, for example, condensing a urea compound or glycoluril compound and formalin to introduce a methylol group, and then ether with lower alcohols such as methyl alcohol, ethyl alcohol, propyl alcohol, and butyl alcohol. Then, the reaction solution is cooled and the precipitated compound or its resin is recovered. The acid cross-linking agent (G1) can also be obtained as a commercial product such as CYMEL (trade name, manufactured by Mitsui Cyanamid) or Nicalac (manufactured by Sanwa Chemical Co., Ltd.).

  Further, as other particularly preferable acid crosslinking agent (G), the molecule has 1 to 6 benzene rings, and has at least two hydroxyalkyl groups and / or alkoxyalkyl groups in the molecule. And / or a phenol derivative in which an alkoxyalkyl group is bonded to any one of the benzene rings (acid crosslinking agent (G2)). Preferably, the molecular weight is 1500 or less, the molecule has 1 to 6 benzene rings, and the hydroxyalkyl group and / or alkoxyalkyl group has 2 or more in total, and the hydroxyalkyl group and / or alkoxyalkyl group is the benzene. Mention may be made of phenol derivatives formed by bonding to any one or a plurality of benzene rings.

  As a hydroxyalkyl group couple | bonded with a benzene ring, C1-C6 things, such as a hydroxymethyl group, 2-hydroxyethyl group, and 2-hydroxy-1-propyl group, are preferable. As an alkoxyalkyl group couple | bonded with a benzene ring, a C2-C6 thing is preferable. Specifically, methoxymethyl group, ethoxymethyl group, n-propoxymethyl group, isopropoxymethyl group, n-butoxymethyl group, isobutoxymethyl group, sec-butoxymethyl group, t-butoxymethyl group, 2-methoxyethyl Group or 2-methoxy-1-propyl group is preferred.

Among these phenol derivatives, particularly preferable ones are listed below.

In the above formula, L ^{1 to} L ⁸ may be the same or different and each independently represents a hydroxymethyl group, a methoxymethyl group or an ethoxymethyl group. A phenol derivative having a hydroxymethyl group can be obtained by reacting a phenol compound not having a corresponding hydroxymethyl group (a compound in which L ^{1 to} L ⁸ are hydrogen atoms in the above formula) with formaldehyde in the presence of a base catalyst. it can. At this time, in order to prevent resinification or gelation, the reaction temperature is preferably 60 ° C. or lower. Specifically, they can be synthesized by the methods described in JP-A-6-282067, JP-A-7-64285 and the like.
A phenol derivative having an alkoxymethyl group can be obtained by reacting a corresponding phenol derivative having a hydroxymethyl group with an alcohol in the presence of an acid catalyst. At this time, in order to prevent resinification and gelation, the reaction temperature is preferably 100 ° C. or lower. Specifically, it can be synthesized by the method described in EP632003A1 and the like.

  A phenol derivative having a hydroxymethyl group and / or an alkoxymethyl group synthesized in this manner is preferable in terms of stability during storage, but a phenol derivative having an alkoxymethyl group is particularly preferable from the viewpoint of stability during storage. preferable. The acid crosslinking agent (G2) may be used alone or in combination of two or more.

Another particularly preferable acid crosslinking agent (G) is a compound having at least one α-hydroxyisopropyl group (acid crosslinking agent (G3)). The structure is not particularly limited as long as it has an α-hydroxyisopropyl group. In addition, the hydrogen atom of the hydroxyl group in the α-hydroxyisopropyl group is one or more acid dissociable groups (R—COO— group, R—SO ₂ — group, etc., R is a straight chain having 1 to 12 carbon atoms) A hydrocarbon group having 3 to 12 carbon atoms, an alkoxy group having 1 to 12 carbon atoms, a 1-branched alkyl group having 3 to 12 carbon atoms, and an aromatic hydrocarbon group having 6 to 12 carbon atoms (Represents a substituent selected from the group). Examples of the compound having the α-hydroxyisopropyl group include one or two kinds such as a substituted or unsubstituted aromatic compound, diphenyl compound, naphthalene compound, and furan compound containing at least one α-hydroxyisopropyl group. The above is mentioned. Specifically, for example, a compound represented by the following general formula (9-1) (hereinafter referred to as “benzene compound (1)”), a compound represented by the following general formula (9-2) (hereinafter referred to as “benzene compound (1)”). , “Diphenyl compound (2)”), a compound represented by the following general formula (9-3) (hereinafter referred to as “naphthalene compound (3”)), and the following general formula (9-4). And the like (hereinafter referred to as “furan compound (4)”).

In the general formulas (9-1) to (9-4), each A ² independently represents an α-hydroxyisopropyl group or a hydrogen atom, and at least one A ² is an α-hydroxyisopropyl group. In General Formula (9-1), R ⁵¹ is a hydrogen atom, a hydroxyl group, a linear or branched alkylcarbonyl group having 2 to 6 carbon atoms, or a linear or branched group having 2 to 6 carbon atoms. An alkoxycarbonyl group is shown. Furthermore, in the general formula (9-2), R ⁵² represents a single bond, a linear or branched alkylene group having 1 to 5 carbon atoms, —O—, —CO— or —COO—. Moreover, in general formula (9-4), ^R53 and ^R54 show a hydrogen atom or a C1-C6 linear or branched alkyl group mutually independently.

  Specific examples of the benzene compound (1) include α-hydroxyisopropylbenzene, 1,3-bis (α-hydroxyisopropyl) benzene, 1,4-bis (α-hydroxyisopropyl) benzene, and 1,2. , 4-Tris (α-hydroxyisopropyl) benzene, α-hydroxyisopropylbenzenes such as 1,3,5-tris (α-hydroxyisopropyl) benzene; 3-α-hydroxyisopropylphenol, 4-α-hydroxyisopropylphenol , 3,5-bis (α-hydroxyisopropyl) phenol, α-hydroxyisopropylphenols such as 2,4,6-tris (α-hydroxyisopropyl) phenol; 3-α-hydroxyisopropylphenyl methyl ketone, 4-α -Hydroxyisopropyl Nyl methyl ketone, 4-α-hydroxyisopropylphenyl ethyl ketone, 4-α-hydroxyisopropylphenyl n-propyl ketone, 4-α-hydroxyisopropylphenyl isopropyl ketone, 4-α-hydroxyisopropylphenyl n-butyl ketone, 4-α-hydroxyisopropylphenyl · t-butylketone, 4-α-hydroxyisopropylphenyl · n-pentylketone, 3,5-bis (α-hydroxyisopropyl) phenyl · methylketone, 3,5-bis (α-hydroxyisopropyl) ) Α-hydroxyisopropylphenyl alkyl ketones such as phenyl ethyl ketone, 2,4,6-tris (α-hydroxyisopropyl) phenyl methylketone; methyl 3-α-hydroxyisopropylbenzoate , Methyl 4-α-hydroxyisopropyl benzoate, ethyl 4-α-hydroxyisopropyl benzoate, n-propyl 4-α-hydroxyisopropyl benzoate, isopropyl 4-α-hydroxyisopropyl benzoate, 4-α-hydroxyisopropyl benzoate N-butyl acid, t-butyl 4-α-hydroxyisopropylbenzoate, n-pentyl 4-α-hydroxyisopropylbenzoate, methyl 3,5-bis (α-hydroxyisopropyl) benzoate, 3,5-bis ( Alkyl 4-α-hydroxyisopropylbenzoate such as ethyl α-hydroxyisopropyl) benzoate and methyl 2,4,6-tris (α-hydroxyisopropyl) benzoate.

  Specific examples of the diphenyl compound (2) include 3-α-hydroxyisopropylbiphenyl, 4-α-hydroxyisopropylbiphenyl, 3,5-bis (α-hydroxyisopropyl) biphenyl, 3,3 ′. -Bis (α-hydroxyisopropyl) biphenyl, 3,4'-bis (α-hydroxyisopropyl) biphenyl, 4,4'-bis (α-hydroxyisopropyl) biphenyl, 2,4,6-tris (α-hydroxyisopropyl ) Biphenyl, 3,3 ′, 5-tris (α-hydroxyisopropyl) biphenyl, 3,4 ′, 5-tris (α-hydroxyisopropyl) biphenyl, 2,3 ′, 4,6, -tetrakis (α-hydroxy) Isopropyl) biphenyl, 2,4,4 ′, 6, -tetrakis (α-hydroxyisopropyl) (Lopyl) biphenyl, 3,3 ′, 5,5′-tetrakis (α-hydroxyisopropyl) biphenyl, 2,3 ′, 4,5 ′, 6-pentakis (α-hydroxyisopropyl) biphenyl, 2,2 ′, 4 , 4 ′, 6,6′-hexakis (α-hydroxyisopropyl) biphenyl and the like α-hydroxyisopropylbiphenyls; 3-α-hydroxyisopropyldiphenylmethane, 4-α-hydroxyisopropyldiphenylmethane, 1- (4-α-hydroxy) Isopropylphenyl) -2-phenylethane, 1- (4-α-hydroxyisopropylphenyl) -2-phenylpropane, 2- (4-α-hydroxyisopropylphenyl) -2-phenylpropane, 1- (4-α- Hydroxyisopropylphenyl) -3-phenylpropane, 1- ( -Α-hydroxyisopropylphenyl) -4-phenylbutane, 1- (4-α-hydroxyisopropylphenyl) -5-phenylpentane, 3,5-bis (α-hydroxyisopropyldiphenylmethane, 3,3'-bis (α -Hydroxyisopropyl) diphenylmethane, 3,4'-bis (α-hydroxyisopropyl) diphenylmethane, 4,4'-bis (α-hydroxyisopropyl) diphenylmethane, 1,2-bis (4-α-hydroxyisopropylphenyl) ethane, 1,2-bis (4-α-hydroxypropylphenyl) propane, 2,2-bis (4-α-hydroxypropylphenyl) propane, 1,3-bis (4-α-hydroxypropylphenyl) propane, 2, 4,6-Tris (α-hydroxyisopropyl) dipheny Methane, 3,3 ′, 5-tris (α-hydroxyisopropyl) diphenylmethane, 3,4 ′, 5-tris (α-hydroxyisopropyl) diphenylmethane, 2,3 ′, 4,6-tetrakis (α-hydroxyisopropyl) Diphenylmethane, 2,4,4 ′, 6-tetrakis (α-hydroxyisopropyl) diphenylmethane, 3,3 ′, 5,5′-tetrakis (α-hydroxyisopropyl) diphenylmethane, 2,3 ′, 4,5 ′, 6 Α-hydroxyisopropyldiphenylalkanes such as pentakis (α-hydroxyisopropyl) diphenylmethane, 2,2 ′, 4,4 ′, 6,6′-hexakis (α-hydroxyisopropyl) diphenylmethane; 3-α-hydroxyisopropyldiphenyl ether 4-alpha-hydroxyisopropyl Diphenyl ether, 3,5-bis (α-hydroxyisopropyl) diphenyl ether, 3,3′-bis (α-hydroxyisopropyl) diphenyl ether, 3,4′-bis (α-hydroxyisopropyl) diphenyl ether, 4,4′-bis ( α-hydroxyisopropyl) diphenyl ether, 2,4,6-tris (α-hydroxyisopropyl) diphenyl ether, 3,3 ′, 5-tris (α-hydroxyisopropyl) diphenyl ether, 3,4 ′, 5-tris (α-hydroxy) Isopropyl) diphenyl ether, 2,3 ′, 4,6-tetrakis (α-hydroxyisopropyl) diphenyl ether, 2,4,4 ′, 6-tetrakis (α-hydroxyisopropyl) diphenyl ether, 3,3 ′, 5,5′- Tetrakis ( -Hydroxyisopropyl) diphenyl ether, 2,3 ′, 4,5 ′, 6-pentakis (α-hydroxyisopropyl) diphenyl ether, 2,2 ′, 4,4 ′, 6,6′-hexakis (α-hydroxyisopropyl) diphenyl ether Α-hydroxyisopropyl diphenyl ethers such as 3-α-hydroxyisopropyl diphenyl ketone, 4-α-hydroxyisopropyl diphenyl ketone, 3,5-bis (α-hydroxyisopropyl) diphenyl ketone, 3,3′-bis (α- Hydroxyisopropyl) diphenyl ketone, 3,4'-bis (α-hydroxyisopropyl) diphenyl ketone, 4,4′-bis (α-hydroxyisopropyl) diphenyl ketone, 2,4,6-tris (α-hydroxyisopropyl) diphenyl ketone 3,3 ′, 5-tris (α-hydroxyisopropyl) diphenyl ketone, 3,4 ′, 5-tris (α-hydroxyisopropyl) diphenyl ketone, 2,3 ′, 4,6-tetrakis (α-hydroxy) Isopropyl) diphenyl ketone, 2,4,4 ′, 6-tetrakis (α-hydroxyisopropyl) diphenyl ketone, 3,3 ′, 5,5′-tetrakis (α-hydroxyisopropyl) diphenyl ketone, 2,3 ′, 4 , 5 ′, 6-pentakis (α-hydroxyisopropyl) diphenyl ketone, α-hydroxyisopropyl diphenyl ketones such as 2,2 ′, 4,4 ′, 6,6′-hexakis (α-hydroxyisopropyl) diphenyl ketone; 3-α-hydroxyisopropylbenzoate phenyl, 4-α-hydroxyisopropylbenzoate Acid phenyl, benzoic acid 3-α-hydroxyisopropylphenyl, benzoic acid 4-α-hydroxyisopropylphenyl, 3,5-bis (α-hydroxyisopropyl) benzoic acid phenyl, 3-α-hydroxyisopropylbenzoic acid 3-α- Hydroxyisopropylphenyl, 3-α-hydroxyisopropylbenzoate 4-α-hydroxyisopropylphenyl, 4-α-hydroxyisopropylbenzoate 3-α-hydroxyisopropylphenyl, 4-α-hydroxyisopropylbenzoate 4-α-hydroxyisopropyl Phenyl, 3,5-bis (α-hydroxyisopropyl) phenyl benzoate, phenyl 2,4,6-tris (α-hydroxyisopropyl) benzoate, 3,5-bis (α-hydroxyisopropyl) benzoic acid 3-α -Hydroxy Propylphenyl, 3,5-bis (α-hydroxyisopropyl) benzoate 4-α-hydroxyisopropylphenyl, 3-α-hydroxyisopropylbenzoate 3,5-bis (α-hydroxyisopropyl) phenyl, 4-α-hydroxy Isopropyl benzoate 3,5-bis (α-hydroxyisopropyl) phenyl, benzoate 2,4,6-tris (α-hydroxyisopropyl) phenyl, 2,4,6-tris (α-hydroxyisopropyl) benzoate 3- α-hydroxyisopropylphenyl, 2,4,6-tris (α-hydroxyisopropyl) benzoate 4-α-hydroxyisopropylphenyl, 3,5-bis (α-hydroxyisopropyl) benzoate 3,5-bis (α- Hydroxyisopropyl) phenyl, 3-α-hydroxyisopro 2,4,6-Tris (α-hydroxyisopropyl) phenyl 4-benzoate, 2,4,6-tris (α-hydroxyisopropyl) phenyl 4-benzoate, 2,4,6-tris (α -Hydroxyisopropyl) benzoic acid 3,5-bis (α-hydroxyisopropyl) phenyl, 3,5-bis (α-hydroxyisopropyl) benzoic acid 2,4,6-tris (α-hydroxyisopropyl) phenyl, 2,4 , 6-tris (α-hydroxyisopropyl) benzoic acid 2,4,6-tris (α-hydroxyisopropyl) phenyl and the like α-hydroxyisopropylbenzoic acid phenyls and the like.

  Further, specific examples of the naphthalene compound (3) include 1- (α-hydroxyisopropyl) naphthalene, 2- (α-hydroxyisopropyl) naphthalene, 1,3-bis (α-hydroxyisopropyl) naphthalene, 1,4-bis (α-hydroxyisopropyl) naphthalene, 1,5-bis (α-hydroxyisopropyl) naphthalene, 1,6-bis (α-hydroxyisopropyl) naphthalene, 1,7-bis (α-hydroxyisopropyl) Naphthalene, 2,6-bis (α-hydroxyisopropyl) naphthalene, 2,7-bis (α-hydroxyisopropyl) naphthalene, 1,3,5-tris (α-hydroxyisopropyl) naphthalene, 1,3,6-tris (Α-hydroxyisopropyl) naphthalene, 1,3,7-tris (α Hydroxyisopropyl) naphthalene, 1,4,6-tris (α-hydroxyisopropyl) naphthalene, 1,4,7-tris (α-hydroxyisopropyl) naphthalene, 1,3,5,7-tetrakis (α-hydroxyisopropyl) And naphthalene.

  Specific examples of the furan compound (4) include 3- (α-hydroxyisopropyl) furan, 2-methyl-3- (α-hydroxyisopropyl) furan, 2-methyl-4- (α- Hydroxyisopropyl) furan, 2-ethyl-4- (α-hydroxyisopropyl) furan, 2-n-propyl-4- (α-hydroxyisopropyl) furan, 2-isopropyl-4- (α-hydroxyisopropyl) furan, 2 -N-butyl-4- (α-hydroxyisopropyl) furan, 2-t-butyl-4- (α-hydroxyisopropyl) furan, 2-n-pentyl-4- (α-hydroxyisopropyl) furan, 2,5 -Dimethyl-3- (α-hydroxyisopropyl) furan, 2,5-diethyl-3- (α-hydroxyisopropyl) furan 3,4-bis (α-hydroxyisopropyl) furan, 2,5-dimethyl-3,4-bis (α-hydroxyisopropyl) furan, 2,5-diethyl-3,4-bis (α-hydroxyisopropyl) Examples include francs.

  The acid crosslinking agent (G3) is preferably a compound having two or more free α-hydroxyisopropyl groups, the benzene compound (1) having two or more α-hydroxyisopropyl groups, and two or more α-hydroxyisopropyl groups. The diphenyl compound (2) having, and the naphthalene compound (3) having two or more α-hydroxyisopropyl groups are more preferable, α-hydroxyisopropylbiphenyls having two or more α-hydroxyisopropyl groups, α-hydroxy A naphthalene compound (3) having two or more isopropyl groups is particularly preferred.

The acid cross-linking agent (G3) is usually obtained by a method in which an acetyl group-containing compound such as 1,3-diacetylbenzene is reacted with a Grignard reagent such as CH ₃ MgBr to be methylated, and then hydrolyzed. It can be obtained by a method in which an isopropyl group-containing compound such as diisopropylbenzene is oxidized with oxygen or the like to generate a peroxide and then reduced.

  In the present invention, the amount of the acid crosslinking agent (G) used is preferably 0.5 to 49% by weight, more preferably 0.5 to 40% by weight, and still more preferably 1 to 30% by weight, based on the total weight of the solid component. 2 to 20% by weight is particularly preferable. When the blending ratio of the acid crosslinking agent (G) is 0.5% by weight or more, the effect of suppressing the solubility of the resist film in an alkaline developer is improved, the remaining film ratio is decreased, and pattern swelling and meandering are caused. It is preferable because it can be prevented from occurring. On the other hand, when it is 50% by weight or less, it is preferable because a decrease in heat resistance as a resist can be suppressed.

  Further, the blending ratio of at least one compound selected from the acid crosslinking agent (G1), the acid crosslinking agent (G2), and the acid crosslinking agent (G3) in the acid crosslinking agent (G) is not particularly limited. Various ranges can be used depending on the type of substrate used when forming the pattern.

  In the total acid crosslinking agent component, the alkoxymethylated melamine compound and / or the compound represented by (9-1) to (9-3) is 50 to 99% by weight, preferably 60 to 99% by weight, more preferably 70%. It is preferable that it is -98 weight%, More preferably, it is 80-97 weight%. Since the resolution can be improved by setting the alkoxymethylated melamine compound and / or the compounds represented by (9-1) to (9-3) to 50% by weight or more of the total acid crosslinking agent component, 99 It is preferable to set the weight% or less because it is easy to obtain a rectangular cross-sectional shape as the pattern cross-sectional shape.

  In the present invention, an acid diffusion control agent (E) having an action of controlling undesired chemical reaction in an unexposed region by controlling diffusion of an acid generated from an acid generator by irradiation in a resist film. You may mix | blend with a radiation sensitive composition. By using such an acid diffusion controller (E), the storage stability of the radiation-sensitive composition is improved. In addition, the resolution is improved, and a change in the line width of the resist pattern due to fluctuations in the holding time before irradiation and the holding time after irradiation can be suppressed, and the process stability is extremely excellent. Examples of such an acid diffusion controller (E) include radiolytically decomposable basic compounds such as a nitrogen atom-containing basic compound, a basic sulfonium compound, and a basic iodonium compound. The acid diffusion controller (E) can be used alone or in combination of two or more.

  Examples of the acid diffusion controller include nitrogen-containing organic compounds and basic compounds that decompose upon exposure. Examples of the nitrogen-containing organic compound include the following general formula (10):

で表される化合物（以下、「含窒素化合物（Ｉ）」という。）、同一分子内に窒素原子を２個有するジアミノ化合物（以下、「含窒素化合物（ＩＩ）」という。）、窒素原子を３個以上有するポリアミノ化合物や重合体（以下、「含窒素化合物（ＩＩＩ）」という。）、アミド基含有化合物、ウレア化合物、及び含窒素複素環式化合物等を挙げることができる。尚、酸拡散制御剤（Ｅ）は、１種単独で用いてもよく、２種以上を併用してもよい。

(Hereinafter referred to as “nitrogen-containing compound (I)”), a diamino compound having two nitrogen atoms in the same molecule (hereinafter referred to as “nitrogen-containing compound (II)”), and a nitrogen atom. Examples thereof include polyamino compounds and polymers having three or more compounds (hereinafter referred to as “nitrogen-containing compound (III)”), amide group-containing compounds, urea compounds, and nitrogen-containing heterocyclic compounds. In addition, an acid diffusion control agent (E) may be used individually by 1 type, and may use 2 or more types together.

In the general formula (10), R ⁶¹ , R ⁶² and R ⁶³ each independently represent a hydrogen atom, a linear, branched or cyclic alkyl group, an aryl group or an aralkyl group. The alkyl group, aryl group or aralkyl group may be unsubstituted or substituted with a hydroxyl group or the like. Here, examples of the linear, branched or cyclic alkyl group include those having 1 to 15 carbon atoms, preferably 1 to 10 carbon atoms, specifically, methyl group, ethyl group, n- Propyl group, isopropyl group, n-butyl group, isobutyl group, sec-butyl group, t-butyl group, n-pentyl group, neopentyl group, n-hexyl group, texyl group, n-heptyl group, n-octyl group , N-ethylhexyl group, n-nonyl group, n-decyl group and the like. Moreover, as said aryl group, a C6-C12 thing is mentioned, Specifically, a phenyl group, a tolyl group, a xylyl group, a cumenyl group, 1-naphthyl group, etc. are mentioned. Furthermore, examples of the aralkyl group include those having 7 to 19 carbon atoms, preferably 7 to 13 carbon atoms, and specific examples include a benzyl group, an α-methylbenzyl group, a phenethyl group, and a naphthylmethyl group.

  Specific examples of the nitrogen-containing compound (I) include mono-cyclohexane such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, n-decylamine, n-dodecylamine and cyclohexylamine. ) Alkylamines; di-n-butylamine, di-n-pentylamine, di-n-hexylamine, di-n-heptylamine, di-n-octylamine, di-n-nonylamine, di-n-decylamine , Methyl-n-dodecylamine, di-n-dodecylmethyl, cyclohexylmethylamine, dicyclohexylamine and the like di (cyclo) alkylamines; triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n- Pentylamine, tri-n-hexylamine, tri-n-heptylamine, -Tri (cyclo) alkylamines such as n-octylamine, tri-n-nonylamine, tri-n-decylamine, dimethyl-n-dodecylamine, di-n-dodecylmethylamine, dicyclohexylmethylamine, tricyclohexylamine; Alkanolamines such as monoethanolamine, diethanolamine, triethanolamine; aniline, N-methylaniline, N, N-dimethylaniline, 2-methylaniline, 3-methylaniline, 4-methylaniline, 4-nitroaniline, diphenylamine , Aromatic amines such as triphenylamine and 1-naphthylamine.

  Specific examples of the nitrogen-containing compound (II) include ethylenediamine, N, N, N ′, N′-tetramethylethylenediamine, N, N, N ′, N′-tetrakis (2-hydroxypropyl) ethylenediamine, Tetramethylenediamine, hexamethylenediamine, 4,4'-diaminodiphenylmethane, 4,4'-diaminodiphenyl ether, 4,4'-diaminobenzophenone, 4,4'-diaminodiphenylamine, 2,2-bis (4-aminophenyl) ) Propane, 2- (3-aminophenyl) -2- (4-aminophenyl) propane, 2- (4-aminophenyl) -2- (3-hydroxyphenyl) propane, 2- (4-aminophenyl)- 2- (4-Hydroxyphenyl) propane, 1,4-bis [1- (4-aminophenyl) -1-methylethyl] benzene, and 1,3-bis [1- (4-aminophenyl) -1-methylethyl] benzene, and the like.

  Specific examples of the nitrogen-containing compound (III) include polyethyleneimine, polyallylamine, N- (2-dimethylaminoethyl) acrylamide polymer, and the like.

  Specific examples of the amide group-containing compound include formamide, N-methylformamide, N, N-dimethylformamide, acetamide, N-methylacetamide, N, N-dimethylacetamide, propionamide, benzamide, pyrrolidone, N- And methylpyrrolidone.

  Specific examples of the urea compound include urea, methylurea, 1,1-dimethylurea, 1,3-dimethylurea, 1,1,3,3-tetramethylurea, 1,3-diphenylurea, tri- Examples thereof include n-butylthiourea.

  Specific examples of the nitrogen-containing heterocyclic compound include imidazoles such as imidazole, benzimidazole, 4-methylimidazole, 4-methyl-2-phenylimidazole, 2-phenylbenzimidazole; pyridine, 2-methylpyridine. 4-methylpyridine, 2-ethylpyridine, 4-ethylpyridine, 2-phenylpyridine, 4-phenylpyridine, 2-methyl-4-phenylpyridine, nicotine, nicotinic acid, nicotinamide, quinoline, 8-oxyquinoline And pyridines such as acridine; and pyrazine, pyrazole, pyridazine, quinosaline, purine, pyrrolidine, piperidine, morpholine, 4-methylmorpholine, piperazine, 1,4-dimethylpiperazine, 1,4-diazabicyclo [2.2.2. ] Octane etc. It can gel.

で表されるヨードニウム化合物等を挙げることができる。 In addition, examples of the radiolytic basic compound include the following general formula (11-1):

The iodonium compound etc. which are represented by these can be mentioned.

で表されるアニオンを示す。 In the general formulas (11-1) and (11-2), R ⁷¹ , R ⁷² , R ⁷³ , R ⁷⁴ and R ⁷⁵ are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, or 1 carbon atom. -6 alkoxy groups, hydroxyl groups or halogen atoms. Z ⁻ represents HO ⁻ , R—COO ⁻ (wherein R represents an alkyl group having 1 to 6 carbon atoms, an aryl group having 6 to 11 carbon atoms, or an alkaryl group having 7 to 12 carbon atoms) or the following general formula. (11-3):

An anion represented by

  Specific examples of the radiolytic basic compound include, for example, triphenylsulfonium hydroxide, triphenylsulfonium acetate, triphenylsulfonium salicylate, diphenyl-4-hydroxyphenylsulfonium hydroxide, diphenyl-4-hydroxyphenylsulfonium. Acetate, diphenyl-4-hydroxyphenylsulfonium salicylate, bis (4-t-butylphenyl) iodonium hydroxide, bis (4-t-butylphenyl) iodonium acetate, bis (4-t-butylphenyl) iodonium hydroxide Bis (4-t-butylphenyl) iodonium acetate, bis (4-t-butylphenyl) iodonium salicylate, 4-t-butylphenyl 4-hydroxyphenyl iodonium hydroxide, 4-t-butylphenyl-4-hydroxyphenyl iodonium acetate, include 4-t-butylphenyl-4-hydroxyphenyl iodonium salicylate and the like.

  The amount of the acid diffusion controller (E) is preferably 0.001 to 49% by weight, more preferably 0.01 to 10% by weight, still more preferably 0.01 to 5% by weight, based on the total weight of the solid component. 0.01 to 3% by weight is particularly preferable. Within the above range, it is possible to prevent degradation in resolution, pattern shape, dimensional fidelity, and the like. Furthermore, even if the holding time from electron beam irradiation to heating after radiation irradiation becomes longer, the shape of the pattern upper layer portion does not deteriorate. Further, when the blending amount is 10% by weight or less, it is possible to prevent a decrease in sensitivity, developability of an unexposed portion, and the like. Further, by using such an acid diffusion control agent, the storage stability of the radiation-sensitive composition is improved, the resolution is improved, and the holding time before irradiation and the holding time after irradiation are reduced. Changes in the line width of the resist pattern due to fluctuations can be suppressed, and the process stability is extremely excellent.

  The composition of the present invention includes, as necessary, other components (F), a dissolution accelerator, a dissolution controller, a sensitizer, a surfactant, and an organic carboxylic acid as long as the object of the present invention is not impaired. Alternatively, one or more of various additives such as oxo acid of phosphorus or a derivative thereof can be added.

(1) Dissolution Accelerator The low molecular weight dissolution accelerator increases the solubility of the cyclic compound represented by the formula (1) in the developing solution when the solubility in the developer is too low, and increases the dissolution rate of the cyclic compound during development. It is a component having an action of increasing moderately, and can be used within a range not impairing the effects of the present invention. Examples of the dissolution accelerator include low molecular weight phenolic compounds such as bisphenols and tris (hydroxyphenyl) methane. These dissolution promoters can be used alone or in admixture of two or more. The blending amount of the dissolution accelerator is appropriately adjusted according to the kind of the cyclic compound to be used, but is preferably 0 to 49% by weight, more preferably 0 to 5% by weight, and more preferably 0 to 1% by weight based on the total weight of the solid component. Is more preferable, and 0% by weight is particularly preferable.

(2) Dissolution control agent The dissolution control agent acts to control the solubility of the cyclic compound represented by the formula (1) and reduce the dissolution rate during development appropriately when the solubility in the developer is too high. It is a component having As such a dissolution control agent, those that do not chemically change in steps such as baking of resist film, irradiation with radiation, and development are preferable.

Examples of the dissolution control agent include aromatic hydrocarbons such as phenanthrene, anthracene, and acenaphthene; ketones such as acetophenone, benzophenone, and phenylnaphthyl ketone; and sulfones such as methylphenylsulfone, diphenylsulfone, and dinaphthylsulfone. be able to. These dissolution control agents can be used alone or in combination of two or more.
The blending amount of the dissolution control agent is appropriately adjusted according to the type of cyclic compound to be used, but is preferably 0 to 49% by weight, more preferably 0 to 5% by weight, and more preferably 0 to 1% by weight based on the total weight of the solid components. Is more preferable, and 0% by weight is particularly preferable.

(3) Sensitizer The sensitizer absorbs the energy of the irradiated radiation and transmits the energy to the acid generator (C), thereby increasing the amount of acid generated, and resist. It is a component that improves the apparent sensitivity. Examples of such sensitizers include, but are not limited to, benzophenones, biacetyls, pyrenes, phenothiazines, and fluorenes. These sensitizers can be used alone or in combination of two or more. The blending amount of the sensitizer is appropriately adjusted according to the type of the cyclic compound to be used, but is preferably 0 to 49% by weight, more preferably 0 to 5% by weight, and more preferably 0 to 1% by weight based on the total weight of the solid component Is more preferable, and 0% by weight is particularly preferable.

(4) Surfactant The surfactant is a component having an action of improving the coating property and striation of the radiation-sensitive composition of the present invention, the developability of the resist, and the like. Such a surfactant may be anionic, cationic, nonionic or amphoteric. A preferred surfactant is a nonionic surfactant. Nonionic surfactants have better affinity with the solvent used in the production of the radiation-sensitive composition and are more effective. Examples of nonionic surfactants include polyoxyethylene higher alkyl ethers, polyoxyethylene higher alkyl phenyl ethers and higher fatty acid diesters of polyethylene glycol, but are not particularly limited. Commercially available products include the following product names: F-top (manufactured by Gemco), Mega-Fac (manufactured by Dainippon Ink and Chemicals), Florard (manufactured by Sumitomo 3M), Asahi Guard, Surflon (manufactured by Asahi Glass) Examples include Pepol (manufactured by Toho Chemical Industry Co., Ltd.), KP (manufactured by Shin-Etsu Chemical Co., Ltd.), polyflow (manufactured by Kyoeisha Yushi Chemical Co., Ltd.), and the like. The blending amount of the surfactant is appropriately adjusted according to the kind of the cyclic compound to be used, but is preferably 0 to 49% by weight, more preferably 0 to 5% by weight, and more preferably 0 to 1% by weight based on the total weight of the solid component. Is more preferable, and 0% by weight is particularly preferable.

(5) Organic carboxylic acid or phosphorus oxo acid or derivative thereof For the purpose of preventing sensitivity deterioration or improving resist pattern shape, retention stability, etc., organic carboxylic acid or phosphorus oxo acid or derivative thereof as an optional component Can be contained. In addition, it can be used in combination with an acid diffusion controller, or may be used alone. As the organic carboxylic acid, for example, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, salicylic acid and the like are suitable. Phosphorus oxoacids or derivatives thereof include phosphoric acid, phosphoric acid di-n-butyl ester, phosphoric acid diphenyl ester and the like, and derivatives such as phosphonic acid, phosphonic acid dimethyl ester, phosphonic acid di- Derivatives such as n-butyl ester, phenylphosphonic acid, phosphonic acid diphenyl ester, phosphonic acid dibenzyl ester, etc., phosphonic acid or their esters, phosphinic acid, phosphinic acid such as phenylphosphinic acid, and derivatives thereof. Of these, phosphonic acid is particularly preferred.
The organic carboxylic acid or phosphorus oxo acid or derivative thereof may be used alone or in combination of two or more. The amount of the organic carboxylic acid or phosphorus oxo acid or derivative thereof is appropriately adjusted according to the type of cyclic compound used, but is preferably 0 to 49% by weight, preferably 0 to 5% by weight based on the total weight of the solid component. More preferably, 0 to 1% by weight is further preferable, and 0% by weight is particularly preferable.

(6) The above dissolution control agent, sensitizer, surfactant, and other additives other than organic carboxylic acid or phosphorus oxo acid or derivatives thereof. One or more additives other than the above-mentioned dissolution control agent, sensitizer, and surfactant can be blended as necessary within a range not inhibiting the purpose. Examples of such additives include dyes, pigments, and adhesion aids. For example, it is preferable to add a dye or a pigment because the latent image in the exposed area can be visualized and the influence of halation during exposure can be reduced. In addition, it is preferable to add an adhesion assistant because the adhesion to the substrate can be improved. Furthermore, examples of other additives include an antihalation agent, a storage stabilizer, an antifoaming agent, a shape improving agent, and the like, specifically 4-hydroxy-4′-methylchalcone.

  The total amount of the optional component (F) is preferably 0 to 49% by weight, more preferably 0 to 5% by weight, still more preferably 0 to 1% by weight, and particularly preferably 0% by weight based on the total weight of the solid component.

  Formulation of the radiation-sensitive composition of the present invention (cyclic compound / acid generator (C) / acid crosslinking agent (G) / acid diffusion controller (E) / optional component (F)) is weight% based on solids And preferably 50 to 99.4 / 0.001 to 49 / 0.5 to 49 / 0.001 to 49/0 to 49, more preferably 55 to 90/1 to 40 / 0.5 to 40/0. .01 to 10/0 to 5, more preferably 60 to 80/3 to 30/1 to 30 / 0.01 to 5/0 to 1, particularly preferably 60 to 70/10 to 25/2 to 20/0 .01-3 / 0. The blending ratio of each component is selected from each range so that the sum is 100% by weight. When the above composition is used, the performance such as sensitivity, resolution and developability is excellent.

  The radiation-sensitive composition of the present invention is usually prepared by dissolving each component in a solvent at the time of use to make a uniform solution, and then filtering with a filter having a pore size of about 0.2 μm, if necessary. The

  Examples of the solvent used for preparing the radiation-sensitive composition of the present invention include ethylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, ethylene glycol mono-n-propyl ether acetate, ethylene glycol mono-n- Ethylene glycol monoalkyl ether acetates such as butyl ether acetate; ethylene glycol monoalkyl ethers such as ethylene glycol monomethyl ether and ethylene glycol monoethyl ether; propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol mono-n- Propyl ether acetate, propylene glycol mono-n-butyl ether acetate, etc. Lopylene glycol monoalkyl ether acetates; propylene glycol monoalkyl ethers such as propylene glycol monomethyl ether and propylene glycol monoethyl ether; lactic acid such as methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate, and n-amyl lactate Esters; aliphatic carboxylic acid esters such as methyl acetate, ethyl acetate, n-propyl acetate, n-butyl acetate, n-amyl acetate, n-hexyl acetate, methyl propionate, ethyl propionate; 3-methoxypropionic acid Methyl, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, methyl 3-methoxy-2-methylpropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyrate Other esters such as acetate, butyl 3-methoxy-3-methylpropionate, butyl 3-methoxy-3-methylbutyrate, methyl acetoacetate, methyl pyruvate and ethyl pyruvate; aromatic hydrocarbons such as toluene and xylene Ketones such as 2-heptanone, 3-heptanone, 4-heptanone, cyclopentanone and cyclohexanone; amides such as N, N-dimethylformamide, N-methylacetamide, N, N-dimethylacetamide and N-methylpyrrolidone Lactones such as γ-lactone can be mentioned, but there is no particular limitation. These solvents can be used alone or in combination of two or more.

  The radiation-sensitive composition of the present invention can contain a resin as long as the object of the present invention is not impaired. Examples of the resin include novolak resins, polyvinylphenols, polyacrylic acid, polyvinyl alcohol, styrene-maleic anhydride resins, polymers containing acrylic acid, vinyl alcohol, or vinyl phenol as monomer units, or derivatives thereof. Can be mentioned. The compounding amount of the resin is appropriately adjusted according to the type of the cyclic compound of the formula (1) to be used, but is preferably 30 parts by weight or less, more preferably 10 parts by weight or less, and more preferably 10 parts by weight or less per 100 parts by weight of the cyclic compound. The amount is preferably 5 parts by weight or less, particularly preferably 0 part by weight.

(Method for forming resist pattern)
The present invention includes a step of forming a resist film on a substrate using the radiation-sensitive composition of the present invention, a step of exposing the resist film, and a step of developing the resist film to form a resist pattern. The present invention relates to a resist pattern forming method. The resist pattern of the present invention can also be formed as an upper resist in a multilayer process.

  In order to form a resist pattern, first, a resist film is formed by applying the radiation-sensitive composition of the present invention on a conventionally known substrate by a coating means such as spin coating, cast coating or roll coating. . The conventionally known substrate is not particularly limited, and examples thereof include a substrate for electronic parts and a substrate on which a predetermined wiring pattern is formed. More specifically, a silicon substrate, a metal substrate such as copper, chromium, iron, and aluminum, a glass substrate, and the like can be given. Examples of the wiring pattern material include copper, aluminum, nickel, and gold. If necessary, an inorganic and / or organic film may be provided on the substrate. An inorganic antireflection film (inorganic BARC) is an example of the inorganic film. Examples of the organic film include an organic antireflection film (organic BARC). Surface treatment with hexamethylene disilazane or the like may be performed.

  Next, the coated substrate is heated as necessary. Although heating conditions change with the compounding composition etc. of a radiation sensitive composition, 20-250 degreeC is preferable, More preferably, it is 20-150 degreeC. Heating may improve the adhesion of the resist to the substrate, which is preferable. Next, the resist film is exposed to a desired pattern with any radiation selected from the group consisting of visible light, ultraviolet light, excimer laser, electron beam, extreme ultraviolet light (EUV), X-ray, and ion beam. The exposure conditions and the like are appropriately selected according to the composition of the radiation sensitive composition. In the present invention, in order to stably form a high-precision fine pattern in exposure, heating is preferably performed after irradiation with radiation. Although heating conditions change with the compounding composition etc. of a radiation sensitive composition, 20-250 degreeC is preferable, More preferably, it is 20-150 degreeC.

  Next, the exposed resist film is developed with a developer to form a predetermined resist pattern. As the developer, it is preferable to select a solvent having a solubility parameter (SP value) close to the cyclic compound of the formula (1) to be used, a ketone solvent, an ester solvent, an alcohol solvent, an amide solvent, A polar solvent such as an ether solvent, a hydrocarbon solvent, or an aqueous alkali solution can be used.

  Examples of the ketone solvent include 1-octanone, 2-octanone, 1-nonanone, 2-nonanone, acetone, 4-heptanone, 1-hexanone, 2-hexanone, diisobutyl ketone, cyclohexanone, methylcyclohexanone, phenylacetone, and methyl ethyl ketone. Methyl isobutyl ketone, acetyl acetone, acetonyl acetone, ionone, diacetyl alcohol, acetyl carbinol, acetophenone, methyl naphthyl ketone, isophorone, propylene carbonate, and the like.

  Examples of the ester solvent include methyl acetate, butyl acetate, ethyl acetate, isopropyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, ethyl-3. -Ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, methyl formate, ethyl formate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate and the like can be mentioned.

  Examples of the alcohol solvent include methyl alcohol, ethyl alcohol, n-propyl alcohol, isopropyl alcohol (2-propanol), n-butyl alcohol, sec-butyl alcohol, tert-butyl alcohol, isobutyl alcohol, n-hexyl alcohol, Alcohols such as 4-methyl-2-pentanol, n-heptyl alcohol, n-octyl alcohol, n-decanol, glycol solvents such as ethylene glycol, diethylene glycol, triethylene glycol, ethylene glycol monomethyl ether, propylene glycol monomethyl Ether, ethylene glycol monoethyl ether, propylene glycol monoethyl ether, diethylene glycol monomethyl ether, triethylene Recall monoethyl ether, and triethylene glycol monoethyl ether and methoxymethyl butanol.

  Examples of the ether solvent include dioxane, tetrahydrofuran and the like in addition to the glycol ether solvent.

  Examples of the amide solvent include N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, hexamethylphosphoric triamide, 1,3-dimethyl-2-imidazolidinone and the like. Can be used.

  Examples of the hydrocarbon solvent include aromatic hydrocarbon solvents such as toluene and xylene, and aliphatic hydrocarbon solvents such as pentane, hexane, octane and decane.

  A plurality of the above solvents may be mixed, or may be used by mixing with a solvent other than the above or water within the range having performance. However, in order to fully achieve the effects of the present invention, the water content of the developer as a whole is less than 70% by mass, preferably less than 50% by mass, and more preferably less than 30% by mass. Preferably, it is more preferably less than 10% by mass, and it is particularly preferable that it contains substantially no water. That is, the content of the organic solvent with respect to the developer is 30% by mass to 100% by mass, preferably 50% by mass to 100% by mass, and preferably 70% by mass to 100% by mass with respect to the total amount of the developer. More preferably, it is 90 mass% or less, More preferably, it is 90 mass% or more and 100 mass% or less, It is especially preferable that it is 95 mass% or more and 100 mass% or less.

  Examples of the alkaline aqueous solution include alkaline compounds such as mono-, di- or trialkylamines, mono-, di- or trialkanolamines, heterocyclic amines, tetramethylammonium hydroxide (TMAH), and choline. Can be mentioned.

In particular, the developer is a developer containing at least one solvent selected from ketone solvents, ester solvents, alcohol solvents, amide solvents and ether solvents, such as resist pattern resolution and roughness. It is preferable for improving the resist performance.

  The vapor pressure of the developer is preferably 5 kPa or less, more preferably 3 kPa or less, and particularly preferably 2 kPa or less at 20 ° C. By setting the vapor pressure of the developing solution to 5 kPa or less, evaporation of the developing solution on the substrate or in the developing cup is suppressed, temperature uniformity in the wafer surface is improved, and as a result, dimensional uniformity in the wafer surface is improved. It improves.

  Specific examples having a vapor pressure of 5 kPa or less include 1-octanone, 2-octanone, 1-nonanone, 2-nonanone, 4-heptanone, 2-hexanone, diisobutyl ketone, cyclohexanone, methylcyclohexanone, phenylacetone, methyl Ketone solvents such as isobutyl ketone, butyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, ethyl-3-ethoxypropionate, 3-methoxy Esters such as butyl acetate, 3-methyl-3-methoxybutyl acetate, butyl formate, propyl formate, ethyl lactate, butyl lactate, propyl lactate Agent, n-propyl alcohol, isopropyl alcohol, n-butyl alcohol, sec-butyl alcohol, tert-butyl alcohol, isobutyl alcohol, n-hexyl alcohol, 4-methyl-2-pentanol, n-heptyl alcohol, n-octyl Alcohol solvents such as alcohol and n-decanol, glycol solvents such as ethylene glycol, diethylene glycol and triethylene glycol, ethylene glycol monomethyl ether, propylene glycol monomethyl ether, ethylene glycol monoethyl ether, propylene glycol monoethyl ether, diethylene glycol monomethyl Glycol ether solvents such as ether, triethylene glycol monoethyl ether, methoxymethyl butanol, etc. , Ether solvents such as tetrahydrofuran, N-methyl-2-pyrrolidone, N, N-dimethylacetamide, amide solvents of N, N-dimethylformamide, aromatic hydrocarbon solvents such as toluene and xylene, octane, decane, etc. And aliphatic hydrocarbon solvents.

  Specific examples having a vapor pressure of 2 kPa or less, which is a particularly preferable range, include 1-octanone, 2-octanone, 1-nonanone, 2-nonanone, 4-heptanone, 2-hexanone, diisobutyl ketone, cyclohexanone, and methylcyclohexanone. , Ketone solvents such as phenylacetone, butyl acetate, amyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, ethyl-3-ethoxypropionate, 3- Ester solvents such as methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, ethyl lactate, butyl lactate and propyl lactate, n-butyl alcohol, alcohol solvents such as ec-butyl alcohol, tert-butyl alcohol, isobutyl alcohol, n-hexyl alcohol, 4-methyl-2-pentanol, n-heptyl alcohol, n-octyl alcohol, n-decanol, ethylene glycol, diethylene glycol , Glycol solvents such as triethylene glycol, and glycols such as ethylene glycol monomethyl ether, propylene glycol monomethyl ether, ethylene glycol monoethyl ether, propylene glycol monoethyl ether, diethylene glycol monomethyl ether, triethylene glycol monoethyl ether, methoxymethyl butanol Ether solvents, N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethyl Formamide amide solvents, aromatic hydrocarbon solvents such as xylene, octane, aliphatic hydrocarbon solvents decane.

An appropriate amount of a surfactant can be added to the developer as necessary.
The surfactant is not particularly limited, and for example, ionic or nonionic fluorine-based and / or silicon-based surfactants can be used. Examples of these fluorine and / or silicon surfactants include, for example, JP-A No. 62-36663, JP-A No. 61-226746, JP-A No. 61-226745, JP-A No. 62-170950, JP-A-63-334540, JP-A-7-230165, JP-A-8-62834, JP-A-9-54432, JP-A-9-5988, US Pat. No. 5,405,720, The surfactants described in the specifications of US Pat. Preferably, it is a nonionic surfactant. Although it does not specifically limit as a nonionic surfactant, It is still more preferable to use a fluorochemical surfactant or a silicon-type surfactant.

  The amount of the surfactant used is usually 0.001 to 5% by mass, preferably 0.005 to 2% by mass, and more preferably 0.01 to 0.5% by mass with respect to the total amount of the developer.

  As a developing method, for example, a method in which a substrate is immersed in a tank filled with a developer for a certain period of time (dip method), a method in which the developer is raised on the surface of the substrate by surface tension and is left stationary for a certain time (paddle) Method), a method of spraying the developer on the substrate surface (spray method), a method of continuously applying the developer while scanning the developer application nozzle at a constant speed on a substrate rotating at a constant speed (dynamic dispensing method) ) Etc. can be applied. The time for developing the pattern is not particularly limited, but is preferably 10 seconds to 90 seconds.

  Moreover, you may implement the process of stopping image development, after the process of developing, substituting with another solvent.

Furthermore, it is preferable to include the process of wash | cleaning using the rinse liquid containing an organic solvent after image development.
The rinsing liquid used in the rinsing step after development is not particularly limited as long as the resist pattern cured by crosslinking is not dissolved, and a solution or water containing a general organic solvent can be used. As the rinsing liquid, it is preferable to use a rinsing liquid containing at least one organic solvent selected from hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents and ether solvents. . More preferably, after the development, a cleaning step is performed using a rinse solution containing at least one organic solvent selected from the group consisting of ketone solvents, ester solvents, alcohol solvents, and amide solvents. Even more preferably, after the development, a washing step is performed using a rinse solution containing an alcohol solvent or an ester solvent. Even more preferably, after the development, a washing step using a rinsing solution containing a monohydric alcohol is performed. Particularly preferably, after the development, a washing step is performed using a rinsing liquid containing a monohydric alcohol having 5 or more carbon atoms. The time for rinsing the pattern is not particularly limited, but is preferably 10 seconds to 90 seconds.

Here, examples of the monohydric alcohol used in the rinsing step after development include linear, branched, and cyclic monohydric alcohols. Specifically, 1-butanol, 2-butanol, 3-methyl- 1-butanol, tert-butyl alcohol, 1-pentanol, 2-pentanol, 1-hexanol, 4-methyl-2-pentanol, 1-heptanol, 1-octanol, 2-hexanol, cyclopentanol, 2- Heptanol, 2-octanol, 3-hexanol, 3-heptanol, 3-octanol, 4-octanol and the like can be used, and particularly preferable monohydric alcohols having 5 or more carbon atoms include 1-hexanol, 2-hexanol, 4 -Use methyl-2-pentanol, 1-pentanol, 3-methyl-1-butanol, etc. Rukoto can.
In addition, the said each component may mix multiple, and may mix and use it with organic solvents other than the above.

  The water content in the rinse liquid is preferably 10% by mass or less, more preferably 5% by mass or less, and particularly preferably 3% by mass or less. By setting the water content to 10% by mass or less, better development characteristics can be obtained.

  The vapor pressure of the rinsing liquid used after development is preferably 0.05 kPa or more and 5 kPa or less at 20 ° C., more preferably 0.1 kPa or more and 5 kPa or less, and most preferably 0.12 kPa or more and 3 kPa or less. By setting the vapor pressure of the rinsing liquid to 0.05 kPa or more and 5 kPa or less, the temperature uniformity in the wafer surface is further improved, and the swelling due to the penetration of the rinsing liquid is further suppressed, and the dimensions in the wafer surface are reduced. Uniformity is improved.

  An appropriate amount of a surfactant can be added to the rinse solution.

  In the rinsing step, the developed wafer is cleaned using a rinsing solution containing the organic solvent. The method of the cleaning treatment is not particularly limited. For example, a method of continuously applying the rinse liquid onto the substrate rotating at a constant speed (rotary coating method), or immersing the substrate in a tank filled with the rinse liquid for a certain period of time. A method (dip method), a method of spraying a rinsing liquid on the substrate surface (spray method), and the like can be applied. Among them, a cleaning treatment is performed by a spin coating method, and after cleaning, the substrate is rotated at a speed of 2000 rpm to 4000 rpm. It is preferable to rotate and remove the rinse liquid from the substrate.

  After forming the resist pattern, the pattern wiring board is obtained by etching. The etching can be performed by a known method such as dry etching using plasma gas and wet etching using an alkali solution, a cupric chloride solution, a ferric chloride solution, or the like.

  Plating can be performed after forming the resist pattern. Examples of the plating method include copper plating, solder plating, nickel plating, and gold plating.

  The residual resist pattern after etching can be peeled off with an organic solvent. Examples of the organic solvent include PGMEA (propylene glycol monomethyl ether acetate), PGME (propylene glycol monomethyl ether), EL (ethyl lactate) and the like. Examples of the peeling method include a dipping method and a spray method. In addition, the wiring board on which the resist pattern is formed may be a multilayer wiring board or may have a small diameter through hole.

  The wiring board obtained by the present invention can also be formed by a method of depositing a metal in vacuum after forming a resist pattern and then dissolving the resist pattern with a solution, that is, a lift-off method.

Hereinafter, the embodiment of the present invention will be described more specifically with reference to examples. However, the present invention is not limited to these examples. In the following synthesis examples and comparative examples, the structures of the compounds were confirmed by ¹ H-NMR measurement.

(Synthesis Example 1) Synthesis of CR-1A A well-dried, nitrogen-substituted dropping funnel, Jim Roth condenser, thermometer, and four-necked flask (1000 mL) equipped with a stirring blade were placed under a nitrogen stream in the Kanto region. Chemical company resorcinol (22 g, 0.2 mol), 4-isopropylbenzaldehyde (29.6 g, 0.2 mol) and dehydrated ethanol (200 mL) were added to prepare an ethanol solution. This solution was heated to 85 ° C. with a mantle heater while stirring. Next, 75 mL of concentrated hydrochloric acid (35%) was added dropwise over 30 minutes using a dropping funnel, followed by stirring at 85 ° C. for 3 hours. After the completion of the reaction, the mixture was allowed to cool and allowed to reach room temperature, and then cooled in an ice bath. After standing for 1 hour, pale yellow crude crystals were formed and filtered off. The crude crystals were washed twice with 500 mL of methanol, filtered and dried in vacuo to obtain 45.6 g of a compound. As a result of LC-MS analysis, this compound showed a molecular weight of 960 for the target compound. Moreover, the chemical shift value (δppm, TMS standard) of ¹ H-NMR in a heavy dimethyl sulfoxide solvent is 1.1 to 1.2 (m, 24H), 2.6 to 2.7 (m, 4H), 5 0.5 (s, 4H), 6.0 to 6.8 (m, 24H), and 8.4 to 8.5 (d, 8H). The compound obtained from these results was identified as the objective compound (CR-1A).

(Synthesis Example 2) Synthesis of CR-2A In an autoclave with an electromagnetic stirrer with an internal volume of 500 ml (manufactured by SUS316L) capable of controlling the temperature, 74.3 g (3.71 mol) of anhydrous HF and 50.5 g of BF ₃ (0.744) Mol), the contents were stirred, and the pressure was increased to 2 MPa with carbon monoxide while the liquid temperature was kept at -30 ° C. Thereafter, a raw material in which 57.0 g (0.248 mol) of 4-cyclohexylbenzene and 50.0 g of n-heptane were mixed was supplied for 1 hour while maintaining the pressure at 2 MPa and the liquid temperature at −30 ° C. Thereafter, the contents were collected in ice, diluted with benzene, and neutralized, and the oil layer obtained was analyzed by gas chromatography to obtain a reaction result. 4-cyclohexyl) benzene conversion rate 100 %, 4-cyclohexylbenzaldehyde selectivity was 97.3%.
The target component was isolated by simple distillation and analyzed by GC-MS. As a result, the molecular weight 188 of the target 4-cyclohexylbenzaldehyde (hereinafter referred to as CHBAL) was shown. Moreover, the chemical shift value (δppm, TMS standard) of ¹ H-NMR in deuterated chloroform solvent is 1.0 to 1.6 (m, 10H), 2.6 (m, 1H), 7.4 (d , 2H), 7.8 (d, 2H), 10.0 (s, 1H).

Under a nitrogen stream, resorcinol (22 g, 0.2 mol) manufactured by Kanto Chemical Co., Ltd. was placed in a four-necked flask (1000 ml) equipped with a well-dried dropping funnel substituted with nitrogen, Jim Roth condenser, thermometer, and stirring blade. ), 4-cyclohexylbenzaldehyde (46.0 g, 0.2 mol) and dehydrated ethanol (200 ml) were added to prepare an ethanol solution. This solution was heated to 85 ° C. with a mantle heater while stirring. Next, 75 ml of concentrated hydrochloric acid (35%) was added dropwise over 30 minutes using a dropping funnel, and then stirred at 85 ° C. for 3 hours. After the completion of the reaction, the mixture was allowed to cool and allowed to reach room temperature, and then cooled in an ice bath. After standing for 1 hour, pale yellow target crude crystals were produced, which were filtered off. The crude crystals were washed twice with 500 ml of methanol, filtered and dried under vacuum to obtain 50 g of a product (hereinafter referred to as CR-1A).
As a result of analysis by LC-MS, the structure of this product showed a molecular weight of 1121. The chemical shift value (δ ppm, TMS standard) of ¹ H-NMR in deuterated chloroform solvent is 0.8 to 1.9 (m, 44H), 5.5, 5.6 (d, 4H), 6. It was 0-6.8 (m, 24H), 8.4, 8.5 (m, 8H).
From these results, the obtained product was identified as the target compound (CR-2A).

(Synthesis Example 1) Synthesis of CR-1 (Cyclic Compound) A four-necked flask (1000 mL) equipped with a sufficiently dried, nitrogen-substituted dropping funnel, Jim Roth condenser, thermometer, stirring blade, and nitrogen Under a stream of air, 19.2 g (20 mmol) of CR-1A was added to 120 mL of distilled water to which 12 g (300 mmol) of sodium hydroxide was added, followed by addition of 25.7 g (300 mmol) of 35 wt% aqueous formaldehyde solution at 50 ° C. The reaction was performed for 8 hours.
After the reaction, 150 mL of ethyl acetate was added, and the organic phase was washed with 100 mL of 1N HCl, washed with water, washed with brine, and dried. After concentration by evaporation, 2.0 g of compound was obtained after column purification and drying.
As a result of analyzing this compound by LC-MS, the molecular weight of the target product was 1080. The chemical shift value (δppm, TMS standard) of ¹ H-NMR in the heavy dimethyl sulfoxide solvent of the obtained product is 1.1 to 1.2 (m, 24H), 2.6 to 2.7. (M, 4H), 4.4 to 4.5 (s, 12H), 5.5 (s, 4H), 6.0 to 6.8 (m, 20H), 8.4 to 8.5 (d , 8H).
The compound obtained from these results was identified as the objective compound (CR-1).

Synthesis Example 2 Synthesis of CR-2 (Cyclic Compound) Synthesis was performed in the same manner as in Synthesis Example 1 except that CR-1A was replaced with CR-2A (11.2 g, 10 mmol), and 2.0 g of compound was obtained. Obtained. As a result of LC-MS analysis, this compound showed a molecular weight of 1240. The chemical shift value (δppm, TMS standard) of ¹ H-NMR in deuterated dimethyl sulfoxide solvent is 0.8 to 1.9 (m, 44H), 4.4 to 4.5 (s, 12H), 5 It was 5.5 to 5.6 (d, 4H), 5.7 (s, 4H), 6.0 to 6.8 (m, 28H), and 8.4 to 8.5 (m, 4H).
The compound obtained from these results was identified as the objective compound (CR-2).

<Examples 1-2 and Comparative Examples 1-2>
Example 1 using Synthetic Example 1 as Example 1, Example 2 using Synthetic Example 2, Example 2 using Synthetic Example 1 as Comparative Example 1, Example using Synthetic Example 2 as Comparative Example 2 The following tests were conducted.

(1) Compound Safety Solvent Solubility Test About the compounds obtained in each of the synthesis examples and synthesis examples described above, the amount of the compound dissolved in propylene glycol monomethyl ether (PGME) and cyclohexanone (CHN) was evaluated. The results are shown in Table 1.
A: 5.0 wt% ≦ dissolved amount B: 3.0 wt% ≦ dissolved amount <5.0 wt%
C: Dissolved amount <3.0 wt%

(2) Patterning test After preparing each component according to Table 1 and making it a uniform solution, it filtered with the membrane filter made from Teflon with a hole diameter of 0.1 micrometer, and prepared the radiation sensitive composition.

Among the above components, the following were used for the acid generator (C), the acid crosslinking agent (G), the acid diffusion controller (E), and the solvent.
Acid generator (C)
P-1: Triphenylbenzenesulfonium trifluoromethanesulfonate (Midori Chemical Co., Ltd.)
Acid crosslinking agent (G)
C-1: Nikarac MW-100LM (Sanwa Chemical Co., Ltd.)
Acid diffusion controller (E)
Q-1: Trioctylamine (Tokyo Chemical Industry Co., Ltd.)
Solvent S-1: Propylene glycol monomethyl ether (Tokyo Chemical Industry Co., Ltd.)

Each prepared resist composition was evaluated according to the following procedure.
After spin-coating a resist on a clean silicon wafer, pre-exposure baking (PB) was performed in an oven at 110 ° C. to form a resist film having a thickness of 60 nm. The resist film was irradiated with an electron beam of 1: 1 line and space setting at intervals of 50 nm, 40 nm, and 30 nm using an electron beam drawing apparatus (ELS-7500, manufactured by Elionix Co., Ltd.). After irradiation, each was heated at a predetermined temperature for 90 seconds, the resists of Examples 1 and 2 were immersed in a propylene glycol monomethyl ether acetate developer for 30 seconds, and the resists of Comparative Examples 1 and 2 were immersed in a 2.38 wt% TMAH aqueous solution. And developed. Thereafter, it was washed with ultrapure water for 30 seconds and dried to form a negative resist pattern.

The obtained line and space was observed with a scanning electron microscope (S-4800, manufactured by Hitachi High-Technology Corporation). The resolution of the pattern was the minimum line width of the formed pattern. The pattern shape was good if it was rectangular. The line edge roughness was good when the pattern irregularities were less than 5 nm. Further to the dose at that time a (μC / cm ²⁾ and sensitivity, was considered good than 150μC / cm ^2.
The formed pattern is evaluated according to the following criteria, and the evaluation results are shown in Table 1.
A: A good resist pattern with a resolution of 30 nm can be obtained with good sensitivity.
Δ: A good resist pattern with a resolution of 40 nm can be obtained with good sensitivity.
X: A good resist pattern with a resolution of 40 nm can be obtained with poor sensitivity.

  As a result of the safety solvent solubility test of the compound, the amount of dissolution in CHN was larger for Examples 1 and 2 using the CR-1 and CR-2 compounds than in Comparative Example 1 using CR-1A, It was found to show good results. On the other hand, for Comparative Example 2 using CR-2A, it was found that the same amount of dissolution as in each Example was obtained.

As a result of the patterning test, it was found that with respect to the radiation-sensitive composition of Example 1, a good resist pattern with a resolution of 30 nm can be obtained with excellent sensitivity. Moreover, about the radiation sensitive composition of Example 2, it turned out that the favorable resist pattern of 30 nm of resolution is obtained with favorable sensitivity. Moreover, it was found that the roughness of the pattern was small and the shape was good.
On the other hand, the resist of Comparative Example 1 was able to obtain a good resist pattern with a resolution of 40 nm with poor sensitivity, but 30 nm was not obtained. The resist of Comparative Example 2 was able to obtain a good resist pattern with a resolution of 40 nm with good sensitivity, but 30 nm was not obtained.

  As described above, the radiation-sensitive composition containing the cyclic compound of the present invention can form a resist pattern having a high sensitivity, a low roughness, and a good shape as compared with a composition containing a comparative compound. As long as the above-described requirements of the present invention are satisfied, compounds other than those described in the examples also show the same effect.

The present invention relates to a cyclic compound represented by a specific chemical structural formula useful as an acid amplification type non-polymer resist material, a radiation sensitive composition containing the same, and a resist pattern forming method using the radiation sensitive composition. Preferably used.

Claims (18)

A cyclic compound represented by formula (1) having a molecular weight of 500 to 5,000.

In the formula (1), each R ⁰ is independently a hydrogen atom, a hydroxyl group, a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic carbonization having 1 to 20 carbon atoms. A hydrogen group, a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted carbon number 6 to 20 Aryl group, substituted or unsubstituted aralkyl group having 7 to 30 carbon atoms, substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, substituted or unsubstituted amino group having 0 to 20 carbon atoms, substituted or unsubstituted An alkenyl group having 2 to 20 carbon atoms, a substituted or unsubstituted acyl group having 1 to 20 carbon atoms, a substituted or unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, a substituted or unsubstituted 1 to 20 carbon atoms. A A rukyloyloxy group, a substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms, a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, or a divalent group thereof (substituted or unsubstituted alkylene) A group, one or more groups selected from the group consisting of a substituted or unsubstituted arylene group and an ether group),
At least one of R ⁰ is a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group. The said compound is shown by Formula (2), The cyclic compound of Claim 1 characterized by the above-mentioned.

In formula (2), each R ¹ independently represents a hydrogen atom, a cyano group, a nitro group, a heterocyclic group, a halogen atom, or a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms. A substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms A group, a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, or a substituted or unsubstituted alkenyl group having 2 to 20 carbon atoms,
Each R ² independently represents a hydrogen atom, a cyano group, a nitro group, a halogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted or unsubstituted carbon number of 3 to 3; 20 branched aliphatic hydrocarbon groups, substituted or unsubstituted cyclic aliphatic hydrocarbon groups having 3 to 20 carbon atoms, substituted or unsubstituted aryl groups having 6 to 20 carbon atoms, substituted or unsubstituted 7 carbon atoms -30 aralkyl group, substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms, substituted or unsubstituted alkenyl group having 2 to 20 carbon atoms, substituted or unsubstituted acyl group having 1 to 20 carbon atoms, substituted or An unsubstituted alkoxycarbonyl group having 2 to 20 carbon atoms, a substituted or unsubstituted alkyloyloxy group having 1 to 20 carbon atoms, and a substituted or unsubstituted aryloyloxy group having 7 to 30 carbon atoms Or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms,
R ′ each independently represents a hydrogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, or a substituted or unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms. , A substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, or the following formula (3)

Each of R ⁴ independently represents a cyano group, a nitro group, a heterocyclic group, a halogen atom, a substituted or unsubstituted linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a substituted group Or an unsubstituted branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted cyclic aliphatic hydrocarbon group having 3 to 20 carbon atoms, a substituted or unsubstituted aryl group having 6 to 20 carbon atoms, A substituted or unsubstituted alkoxy group having 1 to 20 carbon atoms or a substituted or unsubstituted alkylsilyl group having 1 to 20 carbon atoms, p is an integer of 0 to 5;
At least one of R ² is an alkoxymethyl group having 2 to 5 carbon atoms or a hydroxymethyl group. The cyclic compound according to claim 2, wherein the compound is represented by the formula (4).

In formula (4), R ³ is a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, and R ¹ , R ⁴ and p are the same as described above. The cyclic compound according to claim 3, wherein the compound is represented by formula (5).

In formula (5), R ¹ , R ³ , R ⁴ , and p are the same as described above. A method for producing the cyclic compound according to any one of claims 1 to 4,
A step of subjecting a compound comprising one or more aldehyde compounds (A1) and a compound comprising one or more phenolic compounds (A2) to obtain a cyclic compound (A);
A step of reacting the cyclic compound (A) with formaldehyde,
A process for producing a cyclic compound, wherein a cyclic compound (B) wherein at least one of R ⁰ is a monovalent group containing a hydroxymethyl group is obtained. And a step of reacting the cyclic compound (B) with a saturated aliphatic alcohol having 1 to 4 carbon atoms (A3),
The method for producing a cyclic compound according to claim 5, wherein a cyclic compound (C) in which at least one of R ⁰ is a monovalent group containing an alkoxymethyl group having 2 to 5 carbon atoms is obtained.   The aldehyde compound (A1) is a compound having 1 to 59 carbon atoms including a monovalent group having 1 to 4 formyl groups, and the phenolic compound (A2) is 1 to 3 phenols. The method for producing a cyclic compound according to claim 5, wherein the compound is a compound having 6 to 15 carbon atoms having a functional hydroxyl group.   A radiation-sensitive composition comprising the cyclic compound according to any one of claims 1 to 4 and a solvent.   The radiation-sensitive composition according to claim 8, wherein a solid component of the composition is 1 to 80% by weight.   The ratio of the said cyclic compound to the total weight of the said solid component is 50-99.999 weight%, The radiation sensitive composition of Claim 9 characterized by the above-mentioned.   Acid generator (C) that generates acid directly or indirectly by irradiation with any radiation selected from the group consisting of visible light, ultraviolet light, excimer laser, electron beam, extreme ultraviolet light (EUV), X-ray and ion beam The radiation-sensitive composition according to any one of claims 8 to 10, further comprising:   The radiation-sensitive composition according to any one of claims 8 to 11, further comprising an acid crosslinking agent (G).   The radiation-sensitive composition according to any one of claims 8 to 12, further comprising an acid diffusion controller (E).   The solid component is cyclic compound / acid generator (C) / acid cross-linking agent (G) / acid diffusion controller (E) / optional component (F)) in a weight percentage based on the solid component of 50 to 99.99. It contains 4 / 0.001-49 / 0.5-49 / 0.001-49 / 0-49, The radiation sensitive composition of Claim 13 characterized by the above-mentioned.   The radiation-sensitive composition according to claim 8, wherein an amorphous film is formed by spin coating.   The radiation-sensitive composition according to claim 15, wherein the dissolution rate of the amorphous film in a developer at 23 ° C is 10 Å / sec or more.   The dissolution rate of the amorphous film after irradiation with KrF excimer laser, extreme ultraviolet light, electron beam or X-ray, or the amorphous film after heating at 20 to 250 ° C. is 5 Å / sec or less. The radiation-sensitive composition according to claim 16. Applying the radiation-sensitive composition according to any one of claims 8 to 17 on a substrate to form a resist film;
Exposing the resist film;
And a step of developing the exposed resist film.